Judul: Kajian Overdispersi pada Regresi Poisson Berdasarkan Model Generalized Poisson
Abstrak: Generalized Poisson (GP) model is one model that can be used to overcame overdispersion in Poisson data. Detection of overdispersion in simulation data used score test, SSR-LRT test, and Wald test. Simulation data was generated based on the GP distribution. Goodness of fit of GP models in this study were analyzed by using the Root Mean Square Error (RMSE) and Akaike Information Criteria (AIC). In addition to the simulation data , this study also used applied case study data which malnutrition data in West Lombok. The results showed that the applied case study used indicated overdispersion at 5% significance level and the percentage of families living in slum area have impact on the spread of malnutrition in West Lombok. The simulation data showed that power of test of score test is more better than the other test, so that score test is consider as the most appropriate test in detecting overdispersion.
Keyword: Wald test., SSR-LRT test, score test, power of test, Generalized Poisson

Judul: Kajian Pengaruh Overdispersi Dalam Regresi Poisson
Abstrak: Data jumlah (count data) yang diasumsikan menyebar Poisson dapat dianalisis dengan regresi Poisson. Terkadang dalam suatu penelitian seriDg ditemukan permasalahan keragaman data yang Icbih hesar dari nilai tengahnya. hal ini mcrupakan penyimpangan dari asumsi sebaran Poisson. Fenomena ini discbut deoa;1n overdispcrsi. Jika data jumlah yang teroverdispersi dianalisis dengan regresi Poisson maka galat baku penduga koefisien regresi akan lebih keeil dari nilai sebenamya (underestjmate). Hal ini akan mengakibatkan uji keberartian peubah bebasnya menjadi tidak benar. Pendekatan Idasik yang sering digunakan untuk mengatasi, data jumlah yang teroverdispersi adalah regresi binomial negatif. Kajian pengaruh overdispersi dalam regresi 1!oissori';.kaJi ini ,menunjukkan bahwa data yang mengandung overdispersi tidak dapat dianalisis ~gan regre"$i poisson. K.arena ga1at baku penduga koefisien regresi yang dihasilkan nilainya lebih keeU dari nHai sebenamya (underestimate). Tampilan data dengan nilai kesalahan mutlak (absolute error)dapat meriunjukkan bal itu. Regresi binomial negatif secara teori mengandung parameter dispersi. Besamya overdispersi dapat diduga dengan regresi binomial negatif dan hasil dugaan tersebut juga digunakan dalam mCLlduga galat baku peubah bebasnya. Oleh karena itu, plat baku ylUlg diperoleh merupakan galat baku yang mendekati nilai sebenamya. Kajian ini menunjukkan hal itu, yakni galat baku penduga koefisien regresi mendekati nilai sebenamya Dengau demikian pengujian
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Judul: Elektrodeposisi Film Tipis Semikonduktor Cu2ZnSnS4 (CZTS) pada Substrat Kaca ITO
Abstrak: Semiconductor Cu2ZnSnS4 (CZTS) thin film that can be used as absorber layers on solar cell module was made via electrodeposition method. CZTS thin film was electrodeposited on the surface of a silicate glass coated with a thin layer of indium tin oxide (ITO). Deposition process was done using potentiostatic mode at room temperature with a potential of 1.05 V for 30, 45, and 60 minutes, followed with annealing the film at 2 different temperatures, 500 ºC using furnace and 180 ºC using hot plate, both treatments for 45 minutes in N2/H2S atmosphere. The X-ray difractograms were analyzed using Match 2 program and showed that the CZTS thin films had kesterit crystalline structure, with a low percentage of CZTS phase. The thin film also contained secondary phases such as Cu2S, ZnS, and SnS. The obtained CZTS thin films had a thickness between 1.039 and 1.676 μm. Absorption study showed that the band gap energy of CZTS thin films which was annealed using furnace ranged from 1.50 to 1.52 eV, whereas that annealed using the hot plate was not observed. The band gap energy value showed that CZTS thin films can be used as sunlight absorber layers on solar cell. The formation of CZTS crystal film on this investigation was effectively performed using furnace annealing process at a temperature of 500 ºC with deposition time of 45 minutes.
Keyword: Thin film, Electrodeposition, Cu2ZnSnS4