Method of read operation of nonvolatile semiconductor memory and nonvolatile semiconductor memory

Abstract: Nonvolatile semiconductor memory has a memory cell array (10) in which memory cell currents (IMC) flowing through memory cells (MC1,2) of the memory cell array (10) in reading data are compared with reference currents (IREF1,2) that are set in accordance with the wiring widths of word lines (WL1,2) connected to these memory cells (MC1,2). The logic levels of data retained in the memory cells (MC1,2) are detected depending on whether the memory cell currents (IMC) are larger or smaller than the reference currents (IREF1,2). Setting a plurality of reference currents (IREF1,2) for every wiring width of word lines allows the reference currents (IREF1,2) to be set at optimum values for each memory cell (MC1,2) having different gate widths. Since the reference currents (IREF1,2) are set according to the characteristic of memory cells (MC1,2), read margins improve for enhanced reliability in read operations.

Description: The present invention relates to a read operation technique for reading data held in a nonvolatile semiconductor memory. Nonvolatile semiconductor memories such as a flash memory store data by having electrons injected into the insulators of their memory cells for changes in threshold voltage. The memory cells rise in threshold voltage when their insulators contain electrons, and fall when the insulators contain no electron. When the memory cells of a flash memory are to store binary data, a state of high threshold voltage where no current flows through the memory cells in read operations is the state where "data 0" is written ("0 state"). A state of low threshold voltage where currents flow through the memory cells in read operations is the state where "data 1" is written ("1 state"). The "0 state" and the "1 state" are detected by comparing the currents flowing through the memory cells in read operations (memory cell current) with a reference current. Nonvolatile semiconductor memories of this type are ever growing in memory capacity (memory density) year by year. As a technique for increasing the memory density, level multiplication has been proposed of memory cells. To store multileveled data into each single memory cell, however, the amount of electrons to be injected into the memory cell must be precisely adjusted to secure read margins. In general, it is difficult to adjust the amount of injection of electrons precisely. In the case of storing multileveled data into memory cells by using this technique, small variations in the semiconductor processes can easily cause a drop in yield. Moreover, to store multileveled data into the memory cells, a plurality of reference currents are required for the sake of detecting the logical values of the data. In the meantime, techniques in which the integration level of memory cells is raised by raising the integration level of word lines to heighten storage density have been disclosed in Japanese Unexamined Patent Application Publication No. Hei 2-231772 and so on. The preamble of each independent claim is based on this publication. Fig. 1 shows the cell structure of a memory cell array in a nonvolatile semiconductor memory disclosed in this kind of publication. This nonvolatile semiconductor memory is characterized in that second word lines WL2 having a wiring width different from that of first word lines WL1 are arranged in between these first word lines WL1. The first and second word lines WL1 and WL2, lying over memory cells, function as control gates. Formed under the control gates are floating gates which are shown shaded in the diagram. The floating gates are formed on a silicon substrate via an oxide film, in between bit lines BL which are made of a diffusion layer. In the diagram, the sources S and drains D of cell transistors (hereinafter, referred to as first memory cells) are formed at the intersections of the first word lines WL1 and the bit lines BL. Then, the channel regions CH of the first memory cells are formed between the sources S and the drains D. Similarly; the sources S and drains D of cell transistors (hereinafter, referred to as second memory cells) are formed at the intersections of the second word lines WL2 and the bit lines BL. The channel regions CH of the second memory cells are formed between the sources S and the drains D. In this nonvolatile semiconductor memory, after the first word lines WL1 and the floating gates corresponding to these word lines WL1 are formed, the second word lines WL2 and the floating gates corresponding to these second word lines WL2 are formed in the gaps between the first word lines WL1. On that account, the gate width W2 of the second memory cells MC2 becomes smaller than the gate width W1 of the first memory cells MC1. As for the channel lengths (the intervals between the sources S and drains D), the first memory cells MC1 and the second memory cells MC2 are identical to each other. Fig. 2 shows an equivalent circuit of the memory cell array shown in Fig. 1. A plurality of first memory cells MC1 are connected in series along the first word lines WL1. The sources S and drains S (data input/output nodes) of adjoining memory cells MC1 are connected to respective common bit lines BL A plurality of second memory cells MC2 are connected in series along-the second word lines WL2. The sources S and drains D (data input/output nodes) of adjoining memory cells MC2 are connected to common bit lines BL. This kind of memory cell array is generally referred to as a memory cell array of virtual ground type. Fig. 3 shows an overview of the read operations of data retained in the memory cells of the nonvolatile semiconductor memory described above. To read data from a first memory cell MC1, the first word line connected to this memory cell MC1 is supplied with a read voltage of, e.g., 2.5 V. The bit lines BL connected to the source and drain of the first memory cell are supplied with 0 V and 5 V. When the first memory cell MC1 is in the "0 state", the memory cell turns off due to its high threshold voltage, so that no memory cell current flows between the bit lines BL When the first memory cell MC1 is in the "1 state", the memory cell turns on due to its low threshold voltage, so that a memory cell current flows between the bit lines BL Similarly, to read data from a second memory cell MC2, a read voltage of 2.5 V is supplied to a second word line WL2, and 0V and 5V are supplied to bit lines BL on both sides of the second memory cell MC2. When the second memory cell MC2 is in the "0 state", no memory cell current flows. When the second memory cell MC2 is in the "1 state", a memory cell current flows. Then, the memory cell current is compared with a reference current IREF to detect whether the "0 state" or the "1 state" the memory cell MC1 (or MC2) retains. Nevertheless, as described above, the gate width W1 of the first memory cells MC1 is different from the gate width W2 of the second memory cells MC2. The values of the memory cell currents at the turning-on of the cell transistors of the memory cells MC1 and MC2 depend on the ratios W/L between the gate widths W and channel lengths L of the cell transistors. Accordingly, in "1 state" read, the memory cell current of the second memory cells MC2 become smaller than that of the first memory cells MC1. The reference current IREF needs to be set at between the maximum value and the minimum value of the memory cell currents. This requires that the reference current IREF be set in accordance with the second memory cells MC2 which have a smaller memory cell current in the "1 state". As a result, in the first memory cells MC1, the "0 state" read margin M0 becomes smaller than the "1 state" read margin M1 with a problem of lower reliability. Conventionally, there has not been proposed any reliable technique for reading data retained in the memory cells of a nonvolatile semiconductor memory that has a plurality of word lines of different wiring widths (gate widths). It is desirable to provide a nonvolatile semiconductor memory having a plurality of word lines of different wiring widths in which data retained in the memory cells is read with reliability. It is also desirable to provide a nonvolatile semiconductor memory of virtual ground type in which data retained in the memory cells is read with reliability. According to a first aspect of the present invention there is provided a method for reading data retained in a nonvolatile semiconductor memory, the memory having first nonvolatile memory cells connected to a first word line and second nonvolatile memory cells connected to a second word line, said first word line having a first wiring width at each of the connected first memory cells and said second word line having a second wiring width, different from said first wiring width, at each of the connected second memory cells, the method comprising the step of: in reading data from one of said memory cells, comparing a memory cell current flowing through the memory cell concerned with a reference current and using the comparison result to detect a logic level of the data retained in the memory cell concerned; characterised in that: in reading data from one of said first memory cells, the memory cell current is compared with a first reference current and in reading data from one of said second memory cells, the memory cell current is compared with a second reference current, different from said first reference current. In such a method, memory cell currents flowing through memory cells during data readout are compared with reference currents that are set in accordance with the wiring widths of word lines connected to the memory cells. Then, depending on whether larger or smaller the memory cell currents are than the reference currents, the logic levels of data retained in the memory cells are detected. The word lines also function as control gates of the cell transistors of the memory cells. That is, the wiring widths of the word lines correspond to the gate widths of the cell transistors so that the greater the wiring widths of the word lines are, the lower the ON resistances of the cell transistors become. As a result, the values of the memory cell curernts that flow in read operations vary with the wiring widths of the word lines. Setting the reference currents according to the wiring widths of the word lines allows the reference currents to be set at optimum values for the respective memory cells having different gate widths from each other. For example, when the memory cells are to store binary data, the reference currents for the memory cells having different gate widths are set to the respective middle values between the memory cell currents that flow in reading "logic 1" and the memory cell currents that flow in reading "logic 0". Since the reference currents are set in accordance with the characteristic of memory cells, it is possible to improve the read margins for enhanced reliability in read operations. According to a second aspect of the present invention there is provided a nonvolatile semiconductor memory comprising: a plurality of first nonvolatile memory cells, each said first memory cell having a first control gate, and a plurality of second nonvolatile memory cells, each said second memory cell having a second control gate; a first word line connected to said first control gate of each of said plurality of first memory cells, the first word line having a first wiring width at each said first control gate; a second word line connected to said second control gate of each of said plurality of second memory cells, the second word line having a second wiring width, different from said first wiring width, at each said second control gate; and sense amplifier means operable, in reading data from one of said memory cells, to compare a memory cell current flowing through the memory cell concerned with a reference current and to use the comparison result to detect a logic level of the data retained in the memory cell concerned; characterised in that: said sense amplifier means is operable, in reading data from one of said first memory cells, to compare the memory cell current with a first reference current and in reading data from one of said second memory cells, to compare the memory cell current with a second reference current, different from said first reference current. Such a nonvolatile semiconductor memory has, for example, a plurality of first word lines arranged with intervals and a plurality of second word lines arranged in the respective intervals of these first word lines. The wiring width of the first word lines and the wiring width of the second word lines are different from each other. First memory cells are connected to the first word lines. Second memory cells are connected to the second word lines. The first and second memory cells have, for example, a floating gate for storing electric charge or a trap gate for trapping electric charge. Then, in reading data from the first memory cell, a memory cell current flowing through this first memory cell is compared with the first reference current to detect the logic level of data retained in the first memory cell. In reading data from the second memory cell, a memory cell current flowing through this second memory cell is compared with the second reference current different from the first reference current to detect the logic level of data retained in the second memory cell. Reference will now be made, by way of example, to the accompanying drawings, in which: Fig. 1 is a structure diagram of a memory cell array of a conventional nonvolatile semiconductor memory; Fig. 2 is an equivalent circuit diagram of Fig. 1; Fig. 3 is an explanatory diagram showing the relationship between the memory cell currents and the reference current in read operations of the conventional nonvolatile semiconductor memory; Fig. 4 is a block diagram showing a nonvolatile semiconductor memory according to a first embodiment; Fig. 5 is an explanatory diagram showing write conditions, full chip erase conditions, and read conditions of data in the first embodiment; Fig. 6 is an explanatory diagram showing the relationship between the memory cell currents and the reference currents in read operations of the first embodiment; Fig. 7 is a block diagram showing a nonvolatile semiconductor memory according to a second embodiment; Fig. 8 is a cell structure diagram showing the details of the memory cell array of Fig. 7; Fig. 9 is an explanatory diagram showing write conditions, full chip erase conditions, and read conditions of data in the second embodiment; Hereinafter, embodiments of the present invention will be described with reference to the drawings. Fig. 4 shows a first embodiment of the method of read operation of a nonvolatile semiconductor memory and the nonvolatile semiconductor memory in the present invention. This nonvolatile semiconductor memory is formed as a flash memory on a silicon substrate by using CMOS processes. The flash memory has a memory cell array 10, a row decoder 12, a column decoder 14, a sense amplifier 16, and a reference current generator 18, along with not-shown input/output circuits, control circuits, and so on. The memory cell array 10 is composed of a plurality of first and second memory cells MC1 and MC2 each having a floating gate. The control gates of the first memory cells MC1 are connected to first word lines WL1. The control gates of the second memory cells MC2 are connected to second word lines WL2. More specifically, a plurality of first word lines WL1 is arranged apart from each other. Second word lines WL2 are arranged in the respective gaps between these first word lines WL1. The wiring width of the second word lines WL2 is set at one half that of the firsrword lines WL1. The wiring widths of the first and second word lines WL1 and WL2 correspond to the gate widths of the cell transistors of the first and second memory cells MC1 and MC2. These cell transistors are identical in channel length and have the same impurity concentration at their channel regions. Therefore, the second memory cells MC2 have an ON resistance twice that of the first memory cells MC1. That is, the ON current of the second memory cells MC2 falls to one half that of the first memory cells MC1. - The plurality of first memory cells MC1 connected to the first word lines WL1 are connected in series. That is, the data input/output nodes (the sources and drains of the cell transistors) of adjoining first memory cells MC1 are connected to each other. Similarly, the plurality of second memory cells MC2 connected to the second word lines WL2 are connected in series. That is, the data input/output nodes (the sources and drains of the cell transistors) of adjoining second memory cells MC2 are connected to each other. A plurality of bit lines BL are arranged orthogonally to the first and second word lines WL1 and WL2. The bit lines BL are connected to the data input/output nodes of the first and second memory cells MC1 and MC2. Thus, the memory cell array 10 of the present embodiment has a plurality of memory cell rows in which the memory cells MC1 (or MC2) are arranged in series. The data input/output nodes of the individual memory cells in these memory cell rows are connected to each other via the bit lines BL That is, the memory cell array 10 has a structure of so-called virtual ground type. The memory cell array 10 has the same sectional structure as in Fig. 1 described above. The row decoder 12 activates either of predetermined first and second word lines WL1, WL2 in accordance with a row address which is supplied from the exterior of the chip. The column decoder 14 supplies a high voltage and a low voltage to the bit lines BL on both sides of predetermined memory cells so as to select these memory cells in accordance with a column address which is supplied from the exterior of the chip. The sense amplifier 16 compares a memory cell current IMC1 (or IMC2) that flows a memory cell MC1 (or MC2) selected by the column decoder 14 and is transmitted through bit lines BL, with a reference current IREF1 (or IREF2). The sense amplifier 16 thereby detects the logic level of data retained in the memory cell. The reference current generator 18 generates the reference currents IREF1 and IREF2, and supplies either of them to the sense amplifier 16. As will be described later, the reference current IREF1 is larger than the reference current IREF2. Fig. 5 shows write conditions, full chip erase conditions, and read conditions of data in the first embodiment. The write and read conditions will be described, by way of example, for the case of writing and reading data to/from the first and second memory cells MC1 and MC2 that are marked with an circle in Fig. 4. In a write operation (selective write), a pair of bit lines BL2 and BL3 on both sides of the first memory cell MC1 (or second memory cell MC2) to which data is written are supplied with 8 V and 0 V, respectively. The bit line BL1 next to the bit line BL2 is supplied with 8 V. The bit line BL4 next to-the bit line BL3 is supplied with 0 V. The first word line WL11 (or second word line WL21) connected to the memory cell MC1 (or MC2) to which data is written is supplied with 12 V while the other word lines are grounded. As a result, hot electrons are injected into the floating gate of the memory cell MC1 (or MC2) from the substrate, raising the threshold of the memory cell. It follows that the memory cell enters the "0 state" where "data 0" is written. In a full chip erase, all the bit lines BL are supplied with 15 V, and all the first and second word lines WL11, WL12, ..., WL21, WL22, ... are deselected (0 V). The electrons stored in the floating gates are emitted to the substrate in the form of tunnel currents, so that all the memory cells MC1 and MC2 enter the "1 state" with a low threshold voltage. In a read operation, a pair of bit lines BL2 and BL3 on both sides of the first memory cell MC1 (or second memory cell MC2) from which data is read are supplied with 2 V and 0 V, respectively. The bit line BL1 next to the bit line BL2 is supplied with 2 V. The bit line BL4 next to the bit line BL3 is supplied with 0 V. The first word line WL11 (or second word line WL21) connected to the memory cell MC1 (or MC2) from which data is read is supplied with 2.5 V. When the memory cell MC1 (or MC2) is in the "1 state", the cell transistor has a low threshold voltage. Therefore, the memory cell current IMC1 (or IMC2) flows between the bit lines BL2 and BL3. As mentioned above, the gate width of the control gates of the second memory cells MC2 (the wiring width of the second word lines WL2) is smaller than the gate width of the control gates of the first memory cells MC1 (the wiring width of the first word lines WL1). On this account, the memory cell current IMC2 flowing through the second memory cell MC2 becomes smaller than the memory cell current IMC1 flowing through the first memory cell MC1. When the memory cell MC1 (or MC2) is in the "0 state", the cell transistor has a high threshold voltage. Therefore, no memory cell current IMC1 (or IMC2) flows between the bit lines BL2 and BL3. To read data retained in the first memory cell MC1, the sense amplifier 16 compares the memory cell current IMC1 with the first reference current IREF1. The data retained in the first memory cell MC1 is decided to be in the "1 state" when the memory cell current IMC1 is larger than the first reference current IREF1, and decided to be in the "0 state" when the current is smaller than the first reference current IREF1. That is, the logic level of the data retained in the first memory cell MC1 is detected. To read data retained in the second memory cell MC2, the sense amplifier 16 compares the memory cell current IMC2 with the second reference current IREF2. The data retained in the second memory cell MC2 (the state of write of the memory cell) is decided to be in the "1 state" when the memory cell current IMC2 is larger than the second reference current IREF2, and decided to be in the "0 state" when the current is smaller than the second reference current IREF2. That is, the logic level of the data retained in the second memory cell MC2 is detected. Fig. 6 shows the relationship between the memory cell currents IMC1, IMC2 and the reference currents IREF1, IREF2 in read operations. As described above, the memory cell currents IMC1 and IMC2 are compared with the first reference current IREF1 in reading data from a first memory cell MC1 (the left in the diagram) and with the second reference current IREF2 in reading data from a second memory cell MC2 (the right in the diagram), respectively. The first reference current IREF1 is set at the middle of the memory cell current IMC1 of the first memory cells MC1 in the "1 state" and the memory cell current IMC1 of the first memory cells MC1 in the "0 state". The second reference current IREF2 is set at the middle of the memory cell current IMC2 of the second memory cells MC2 in the "1 state" and the memory cell current IMC2 of the second memory cells MC2 in the "0 state". Accordingly, in the flash memory in which a plurality of word lines WL1 and WL2 are arranged with different wiring widths (the gate widths of the control gates of the cell transistors), the reference currents IREF1 and IREF2 set in accordance with the wiring widths of the word lines WL1 and WL2 are respectively compared with the memory cell currents IMC1 and IMC2 in read operations, so that the "1 state" and "0 state" read margins always coincide with each other irrespective of the magnitudes of the memory cell currents IMC1 and IMC2 which depend on the wiring widths of the word lines WL1 and WL2. As has been described, in the present embodiment, the memory cell currents IMC1 and IMC2 flowing through the first and second memory cells MC1 and MC2 in reading data are compared with the reference currents IREF1 and IREF2 corresponding to the wiring widths of the first and second word lines WL1 and WL2, respectively. Thus, the reference currents IREF1 and IREF2 can be set at respective optimum values (the values at the middles of the "1 state" and "0 state" memory cell currents IMC) for the memory cells MC1 and MC2 having different gate widths. That is, since the optimum reference currents IREF1 and IREF2 can be set by the characteristics of the memory cells MC1 and MC2, the read margins can be improved for enhanced reliability in read operations. In particular, the present invention offers a high effect when applied to a nonvolatile semiconductor memory in which element integration level is improved by arranging word lines having a narrower wiring width in the intervals of another word lines. The application of the present invention requires no change to conventional floating gate type memory cell arrays. Since the present invention can be applied with a modification to the peripheral circuitry alone, it is possible to reduce the design period of the nonvolatile semiconductor memory. Fig. 7 shows a second embodiment of the method of read operation of a nonvolatile semiconductor memory and the nonvolatile semiconductor memory in the present invention. The same circuits and signals as those described in the first embodiment will be designated by identical reference numbers or symbols. Detailed description thereof will be omitted here. This nonvolatile semiconductor memory is formed as a flash memory on a silicon substrate by using CMOS processes. The flash memory has a memory cell array 20, a row decoder 12, a column decoder 14, a sense amplifier 16, and a reference current generator 18, along with not-shown input/output circuits, control circuits, and so on. The memory cell array 10 is composed of a plurality of first and second memory cells MC1 and MC2 each having a trap gate TG. Carriers trapped in a trap gate TG do not move within the trap gate TG. This can be utilized to change the threshold voltages of the cell transistors locally. Therefore, the memory cells MC1 and MC2 of the present embodiment can retain binary data on both the source and drain sides of the channel regions of their trap gates TG. That is, a single memory cell can store multileveled data (of four levels, in this example). In the diagram, the two rectangular regions shown in a memory cell MC1, MC2 retain binary data each. The outlined rectangles show a state where no carrier is trapped (the "1 state" with a low threshold voltage). The filled rectangles show a state where carriers are trapped (the "0 state" with a high threshold voltage). The control gates of the first memory cells MC1 are connected to first word lines WL1. The control gates of the second memory cells MC2 are connected to second word lines WL2 which have a wiring width narrower than that of the first word lines. The plurality of first memory cells MC1 connected to the first word lines WL1 are connected in series. That is, the data input/output nodes (the sources and drains of the cell transistors) of adjoining first memory cells MC1 are connected to each other. Similarly, the plurality of second memory cells MC2 connected to the second word lines WL2 are connected in series. That is, the data input/output nodes (the sources and drains of the cell transistors) of adjoining second memory cells MC2 are connected to each other. A plurality of bit lines BL are arranged orthogonally to the first and second word lines WL1 and WL2. The bit lines BL are connected to the data input/output nodes of the first and second memory cells MC1 and MC2. The flash memory of the present embodiment is identical to that of the first embodiment except for the cell structure of the first and second memory cells MC1 and MC2 and for not-shown control circuits. Fig. 8 shows the cell structure of the memory cell array 20 of Fig. 7. In this flash memory, trap gates TG made of an insulator, capable of trapping carriers are formed in between the first word lines WL1 (or second word lines WL2), which also function as the control gates, and the channel regions CH of the silicon substrate. The trap gates TG have a three-layer structure containing a silicon nitride film sandwiched between silicon oxide films (ONO film). The trap gates TG need not be separated between adjoining memory cells because of no movement of carriers trapped. Therefore, as shown in the B-B' cross section and the C-C' cross section, the trap gates TG are formed to extend in the horizontal direction of the diagram along with the first and second word lines WL1 and WL2. As shown in the A-A' cross section, side walls SW are made of an insulator in between the first word lines WL1 and the second word lines WL2. The control gates of the first memory cells MC1 are connected to first word lines WL1. The control gates of the second memory cells MC2 are connected to second word lines WL2 which have a wiring width narrower than that of the first word lines. The bit lines BL are formed of a diffusion layer as in the first embodiment. Then, the sources S and drains D of the first and second memory cells MC1, MC2 (cell transistors) are formed at the intersections of the first word lines WL1 and the bit lines BL. The channel regions CH are formed in between the sources S and the drains D. The following will provide an overview of a method for fabricating the memory cell described above. Initially, a stripe pattern extending in the bit-line direction is formed at regions where not to form bit lines BL. Using this stripe pattern as a mask, the silicon substrate is selectively implanted with ions to form the bit lines BL Then, using the stripe pattern as a mask, the silicon substrate is selectively oxidized to form a field oxide film (LOCOS film). Next, a stripe pattern (regions corresponding to the first word lines WL1) extending in the word-line direction is formed of, for example, a silicon nitride film or the like. The width and intervals of this stripe pattern are made to a minimum processing size. Next, a silicon oxide film is deposited all over the silicon substrate so as to cover the stripe pattern. Subsequently, the silicon oxide film is etched so that the silicon oxide film is left exclusively on both sides of each stripe of the pattern. That is, side walls SW are formed on both sides of each stripe of the pattern. Thereafter, the stripe pattern is removed so that only the side walls SW are left on the silicon substrate. Next, an ONO film (trap gates TG) is formed all over the silicon substrate. Then, polycrystalline silicon (the material of the first and second word lines WL1 and WL2) is deposited all over the silicon substrate. Subsequently, etch-back is performed to remove the upper parts of the polycrystalline silicon and the side walls SW, so that the polycrystalline is left in between the side walls SW. That is, the first and second word lines WL1 and WL2 are formed alternately in between the side walls SW. In this way, the first and second word lines WL1 and WL2 are formed in a self-aligning fashion under the stripe pattern extending in the word-line direction. Given that the minimum processing size is 0.4 µm and the width of the side walls is 0.1 µm, the wiring width W1 of the first word lines WL1 (= the gate width W1 of the control gates of the first memory cells MC1) and the wiring width W2 of the second word lines WL2 (= the gate width W2 of the control gates of the second memory cells MC2) are 0.4 µm and 0.2 µm, respectively. The cell transistors of these memory cells MC1 and MC2 are identical in channel length and have the same impurity concentration at their channel regions. Therefore, the ON current of the second memory cells MC2 falls to one half that of the first memory cells MC1. Since the second word lines WL2 are formed via the side walls in between the first word lines WL1 which are arranged at the minimum processing size, the number of word lines per unit area doubles without a change to the layout design rules. Fig. 9 shows write conditions, full chip erase conditions, and read conditions of data in the second embodiment. The write and read conditions will be described for the case of writing and reading data to/from the right bit of the first memory cell MC1 or the second memory cell MC2 that are marked with an circle in Fig. 7. In a write operation (selective write), when electrons are to be injected into the right side of the trap gate TG shown in Fig. 7, a pair of bit lines BL2 and BL3 on both sides of the memory cell MC1 (or MC2) are supplied with 0 V and 6 V, respectively. The bit line BL1 next to the bit line BL2 is supplied with 0 V. The bit line BL4 next to the bit line BL3 is supplied with 6 V. The word line WL11 (or WL21) connected to the memory cell MC1 (or MC2) to which data is written is supplied with 12 V. As a result, the channel of the memory cell comes into conduction, so that hot electrons are locally injected into a position on the side of bit line BL3 in the trap gate TG. The hot electrons being trapped raise the threshold voltage of the memory cell MC1 (or MC2) at the right side in Fig. 7. The memory cell MC1 (or MC2) enters a "10 state" in which "data 1" is written in the left and "data 0" in the right (for example, "10" in binary). Incidentally, to inject hot electrons into the left sides of the trap gates of the memory cells shown in Fig. 7, the bit lines BL1, BL2 and the bit lines BL3, BL4 are supplied contrary to the foregoing, or with 6 V and 0 V, respectively. In a full chip erase, all the bit lines BL are supplied with 6 V, and all the first and second word lines WL1, WL2 are supplied with -5 V. Then, hot holes are injected into the trap gates TG of the cell transistors from the channel regions CH of the substrate. The hot holes injected are neutralized with preinjected hot electrons, so that all the memory cells MC1, MC2 enter a "11 state" with low threshold voltages (for example, "11" in binary). In a read operation, to detect electrons trapped in the right side of the trap gate TG of the memory cell MC1 (or MC2) shown in Fig. 7, the bit line BL2 on the left of the memory cell MC1 (or MC2) is supplied with 2V, and the bit line BL3 on the right is supplied with 0V. The bit line BL1 next to the bit line BL2 is supplied with 2 V. The bit line BL4 next to the bit line BL3 is supplied with 0 V. That is, the memory cell is subjected to an electric field reverse to that of the write operation described above. The first word line WL11 (or second word line WL21) connected to the memory cell MC1 (or MC2) from which data is read is supplied with 3 V. When the right bit of the memory cell MC1 (or MC2) is in the "0 state", the cell transistor has a high threshold voltage and the channel region CH is in a nonconductive state. Therefore, no memory cell current IMC flows between the bit lines BL2 and BL3. When the right bit of the memory cell MC1 (or MC2) is in the "1 state", the cell transistor has a low threshold voltage and the channel region CH is in a conductive state. Therefore, a memory cell current IMC1 (or IMC2) flows between the bit lines BL2 and BL3. To read data retained in the first memory cell MC1, the sense amplifier 16 compares the memory cell current IMC1 with the first reference current IREF1, as in the first embodiment. The data retained in the first memory cell MC1 is decided to be in the "1 state" when the memory cell current IMC1 is larger than the first reference current IREF1, and decided to be in the "0 state"- when the memory cell current IMC1 is smaller than the first reference current IREF1. To read data retained in the second memory cell MC2, the sense amplifier 16 compares the memory cell current IMC2 with the second reference current IREF2, as in the first embodiment. The data retained in the second memory cell MC2 (the state of write of the memory cell) is decided to be in the "1 state" when the memory cell current IMC2 is larger than the second reference current IREF2, and decided to be in the "0 state" when the memory cell current IMC2 is smaller than the second reference current IREF2. Incidentally, to detect electrons trapped in the left sides of the trap gates of the memory cells, the bit lines BL1, BL2 and the bit lines BL3, BL4 are supplied contrary to the foregoing, or with 0 V and 2 V, respectively. That is, an electric field reverse to the foregoing is applied to the cell transistors. As has been described, this embodiment can offer the same effects as those obtained from the foregoing first embodiment. In addition, the present invention is also applicable to a nonvolatile semiconductor memory of trap gate type having the new cell structure as described above. That is, even in the multilevel memory cells of trap gate type, the read margins can be improved for enhanced reliability in read operations as in the memory cells of floating gate type. Incidentally, the foregoing embodiments have dealt with the cases where the wiring width W2 of the second word lines WL2 is set at one half the wiring width W1 of the first word lines WL1 so that the memory cell current of the second memory cells MC2 falls to one half that of the first memory cells MC1. However, the present invention is not limited to such embodiments. The present invention is applicable when a memory cell array has a plurality of word lines having different wiring widths (gate widths of the cell transistors). Besides, the characteristics of the cell transistors come under the narrow channel effect and the reverse narrow channel effect as the elements get finer and the gate widths get narrower. Therefore, the gate widths and the memory cell currents (ON currents) are not necessarily proportional to each other. In such cases, the impurity concentrations of the channel regions CH may be accordingly adjusted by ion implantation or the like, so as to adjust the memory cell currents. In general, the ON currents of the first and second memory cells MC1 and MC2 are more easily adjusted to differ than to coincide. The foregoing embodiments have dealt with the cases where the present invention is applied to a flash memory having a memory cell array in which two types of word lines WL1 and WL2 are arranged with different wiring widths. However, the present invention is not limited to such embodiments. For example, the present invention may be applied to a flash memory having a memory cell array in which three or more types of word lines are arranged with different wiring widths. The foregoing embodiments have dealt with the cases where the present invention is applied to a flash memory. However, the present invention is not limited to such embodiments. The present invention may be applied to nonvolatile semiconductor memories of virtual ground type that are electrically rewritable. The second embodiment has dealt with the case where the memory cell array 20 is composed of the memory cells MC1 and MC2 each having a trap gate TG. However, the present invention is not limited to such an embodiment. For example, the memory cell array may be composed of memory cells each having a floating gate.

Claims: A method for reading data retained in a nonvolatile semiconductor memory, the memory having first nonvolatile memory cells (MC1) connected to a first word line (WL1) and second nonvolatile memory cells (MC2) connected to a second word line (WL2), said first word line having a first wiring width at each of the connected first memory cells and said second word line having a second wiring width, different from said first wiring width, at each of the connected second memory cells, the method comprising the step of: in reading data from one of said memory cells (MC1, MC2), comparing a memory cell current flowing through the memory cell concerned with a reference current (IREF1, IREF2) and using the comparison result to detect a logic level of the data retained in the memory cell concerned; characterised in that : in reading data from one of said first memory cells (MC1), the memory cell current is compared with a first reference current (IREF1) and in reading data from one of said second memory cells (MC2), the memory cell current is compared with a second reference current (IREF2), different from said first reference current (IREF1). The method as claimed in claim 1, wherein: said memory has at least one further word line, the or each said further word line having further nonvolatile memory cells connected thereto and having a wiring width at each of the connected memory cells that is different from each of said first and second wiring widths; and in reading data from one of said further memory cells the memory cell current is compared with a further reference current different from each of said first and second reference currents. A nonvolatile semiconductor memory comprising: a plurality of first nonvolatile memory cells (MC1), each said first memory cell having a first control gate, and a plurality of second nonvolatile memory cells (MC2), each said second memory cell having a second control gate; a first word line (WL1) connected to said first control gate of each of said plurality of first memory cells, the first word line having a first wiring width at each said first control gate; a second word line (WL2) connected to said second control gate of each of said plurality of second memory cells, the second word line having a second wiring width, different from said first wiring width, at each said second control gate; and sense amplifier means (16) operable, in reading data from one of said memory cells (MC1, MC2), to compare a memory cell current flowing through the memory cell concerned with a reference current (IREF1, IREF2) and to use the comparison result to detect a logic level of the data retained in the memory cell concerned; characterised in that : said sense amplifier means (16) is operable, in reading data from one of said first memory cells (MC1), to compare the memory cell current with a first reference current (IREF1) and in reading data from one of said second memory cells (MC2), to compare the memory cell current with a second reference current (IREF2), different from said first reference current (IREF1). The nonvolatile semiconductor memory according to claim 3, wherein: the memory has a plurality of said first and second word lines (WL1 & WL2); said first word lines are arranged with gaps between adjacent first word lines; and said second word lines are arranged in the respective gaps between said first word lines. The nonvolatile semiconductor memory according to claim 3 or 4, wherein: the first memory cells of said plurality of first memory cells are connected in series; the second memory cells of said plurality of second memory cells are connected in series; and interconnected data input/output nodes of adjacent said first memory cells and interconnected data input/output nodes of adjacent said second memory cells are connected to a plurality of bit lines (BL), respectively. The nonvolatile semiconductor memory according to any one of claims 3 to 5, wherein each of said first and second memory cells has a conductive floating gate for storing electric charge. The nonvolatile semiconductor memory according to any one of claims 3 to 6, wherein each of said first and second memory cells has an insulative trap gate for trapping electric charge. The nonvolatile semiconductor memory device according to any one of claims 3 to 7, further comprising: at least one further word line, the or each said further word line being connected to respective control gates of a plurality of further nonvolatile memory cells of the memory and having a wiring width at each connected control gate that is different from each of said first and second wiring widths; wherein said sense amplifier means is further operable, in reading data from one of said further memory cells, to compare the memory cell current with a further reference current that is different from each of said first and second reference currents.

Inventors: IIJIMA MITSUTERU, IIJIMA, MITSUTERU, Iijima, Mitsuteru, Fujitsu Limited
Applicants: FUJITSU LTD, FUJITSU LIMITED
Application year: 2001
Main classification: G11C11
IPC codes: G11C16, G11C11