METHOD FOR EXPOSING A SEMICONDUCTOR WAFER

Abstract: A method for exposing a semiconductor wafer is provided, which provides a compensation of the effects of process inhomogeneities, e.g. in semiconductor etching or deposition processes, by adjusting sets of exposure parameters (30), preferably dose and focus, of an exposure tool for any exposure field (21) individually across a semiconductor wafer (10).

Description: Description Method for exposing a semiconductor wafer This invention relates to a method for exposing a semiconductor wafer. In semiconductor wafer manufacturing the maintenance of homogeneous process conditions plays an important role for guar- anteeing a high wafer output yield and for reducing the amount of time spent in rework. With the advance to larger wafer sizes process-dependent inhomogeneities during, e.g., developing, etching, oxidation or cleaning processes can become particularly prominent in the case of wafers having di- ameters of 300 millimeters or larger and may result in the non-uniformity of length scales such as linewidths, layer thicknesses or pattern quality across the wafer field. Commonly all process parameters, e.g. etch parameters, are adjusted, such that a maximum number of uniformity measurements fall just within given tolerance ranges or a decreased chip yield is even accepted. A related problem, e.g., arises from inhomogeneities in layer thicknesses of plasmaoxide (Si0 2 ) and plasmanitride (Si 3 N) double layers after the final passivation process of wafer manufacturing. These layers are produced in a plasma enhanced chemical vapor deposition process (PECVD) and serve for impeding the penetration of water or contaminating materials to the metal lines just beneath. If many process steps are to be performed as in the case of memory or logic products a complex surface structure can emerge prior to passivation resulting in an inevitable thickness fluctuation after passivation. The deposition process can introduce smooth large scale variations, i.e. a decrease of thickness, from the center of the wafer to the outer edge due to the inhomogeneities in the plasma deposition. After depositing the passivation layers, the surface is then coated with imid resist in order to be exposed to light through a patterned mask. The pattern is commonly designed, such that fuses, which are to be laser- cutted after testing in order to cut-off redundancies are exposed to light. Having a resist, the imid is developed and hard-baked, and the passivation layer beneath can be etched away, the fuses then being accessible by an external laser spot . The light emerging from the exposure tool, e.g. a wafer stepper, penetrates through the imid layer and is reflected by the underlying passivation layer with a reflectivity, e.g., of up to 20 %. Unfortunately, the reflectivity varies strongly with the passivation layer thickness caused by interference of light reflected at different layer boundaries. Consequently, the center-edge variation of passivation layer thicknesses due to deposition process inhomogeneities result in resist residues in the fuses at the outer wafer edge. Thus, these fuses are not accessible by an external laser spot . The problem can be cured by reworking the wafers in concern, thereby performing an additional etch process in order to re- move the resist residues, but the same etch process may affect other layers as well, which results in degradation. Moreover, rework prolongs the total cycle time of wafers and consumes expensive machine and operator resources . In any case will the wafer yield be decreased due to the decreased process quality. Therefore, the primary objective of the present invention is to provide a method, which reduces the amount of a rework due to process inhomogeneities and increases the yield in semi- conductor manufacturing processes. The problem is solved by a method for exposing a semiconductor wafer by adjusting exposure parameters of an exposure tool and projecting a pattern into an matrix arrangement of exposure fields on said semiconductor wafer, comprising a first step, where said matrix arrangement of exposure fields is divided into at least two areas, each of said areas being provided with a different set of exposure parameters comprising dose and focus of an exposure tool, and a second step, where each exposure field is exposed using the set of expo- sure parameter, which is attached to the area associated to the exposure field. Using the method according to the present invention the aforementioned chemical or physical process inhomogeneities can advantageously be compensated within the lithographic step without the need for changing the process itself. This is accomplished by varying the exposure parameters of an exposure tool between the different exposure steps of one wafer, where the pattern is projected stepwise onto the expo- sure fields of the wafer. A locally acting inhomogeneity in a process other than the lithographic step itself can be outweighed by the change of the exposure parameter for the local exposure, if both features, the efficiency of the process and a change in exposure act similarly, or counteract, on the same measurable output quantity, like critical dimension etc. The common matrix arrangement of exposure fields is divided into a number of areas, which are treated differently in the choice of exposure parameters, instead of using just one set of parameters for all exposure steps of a wafer. The size and the extent of the areas depend on what kind of inhomogeneity is to be compensated. Preferably, the geometries of the process inhomogeneities are reflected in the form of the areas. Typically used forms will be stripes extending across the wa- fer in parallel, which are orientated orthogonally to a gradient of some quantity on the wafer, that has to be compensated, or concentric circles reflecting processes acting in- sufficiently at the wafer edges. Thus, the method can advantageously be adapted to any dimension of process inhomogeneity. As an example, a lithographic lead can be inserted to compensate for local variations of etch processes on the wafer, by, e.g., increasing the dose for the corresponding exposure fields with an inefficient etch process. In the case of projecting a chrome bar from a reticle to the wafer and using a positive resist an increased dose results in smaller linewidths, thereby compensating the weak etching of line profiles in an inefficient etch process at the outer wafer edges, and vice versa. Also the focus or any other adjustable parameter of a lithographic tool can be varied in order to compensate for problems occurring in the processes other than lithography. The determination of the areas and their exposure parameters can be performed either by a simulation of the whole process, where a compensation has to be applied, or a first test wafer can be started, where in neighbouring columns or rows of the exposure field matrix the exposure parameters are slightly varied, and - after processing - are analyzed. An external input of area and exposure parameter treatment is possible, such as a readjusting input by a control measurement in a closed loop control circuit. Since even in the prior art case a determination of exposure parameters is also performed by starting a test wafer, few additional efforts have to be spent in determining the areas and their exposure parameters . Thus, wafer eyeletime is saved while additional setup time for the exposure tool is negligible. The detail of desired compensation on the wafer field can be raised up to the resolution of one exposure field, i.e. one area is equal to one exposure field. In the case e-beam- or ion-projection beam writers one exposure field corresponds to just one address grid point covering just a few nanometers in diameter. Once the areas and their exposure parameters are known, the desired mask pattern is projected onto the wafer step by step into the exposure fields of the matrix structure with each exposure step being conducted with that exposure parameters, which priorily have been attached to the area corresponding to the exposure field, which is currently exposed. So if a relation between process efficiency and exposure parameter compensation is available, systematic variations on the wafer such as center-edge variations across the wafer, which usually result in linewidth gradients, defect density gradients and increased resist residue occurrences in outer edge areas of the wafer, can be compensated, thus increasing the wafer yield and decreasing the amount of rework. Another advantage resides in an exposure after a final passivation process. If the method according to the present inven- tion is applied to wafers after this process, using a dose in the central parts of the wafer as in prior art case and using an increased dose in the outer edge areas of the wafer, the decreased illumination of the imid layer in the outer edge parts due to the decreased reflectivity of the underlying passivation layer consisting of plasmaoxide and plasmani- tride, can be compensated by the higher intensity due to the higher dose. Thus, any exposed region across the wafer receives the same intensity of exposure light. Therefore, no resist residue remains on the wafer surface, especially in fuses, and the wafer yield is advantageously increased. A further advantageous aspect considers the mass-production of semiconductor wafers . Once the areas and the exposure parameter, which determined to compensate process inhomogenei- ties, are known, they can be held constant for all subsequent semiconductor wafer receiving the same pattern, and which run through the same process. No additional setup or parameter determination is necessary, thus saving time while still increasing the wafer yield. A further aspect considers the concept of areas. Usually, the matrix of exposure fields to be projected onto the wafer can be visualized by a so-called litho-shot map. For the purpose of simplicity exposure fields that would have individual exposure parameter settings in order to achieve an optimal output quality, are combined into areas. The process windows of each exposure field are used, defined as a combination of exposure parameter ranges that guarantee a high quality output, to group together those exposure fields, which comprise overlapping process windows . The resulting areas then comprise exposure parameters, which are still positioned within the process window of any exposure field that belongs to the considered area. The advantage of this concept is, that this litho-shot map reflecting the matrix of exposure fields and showing the areas still provide high quality and can quickly be reused and refined for the next wafer lot . According to the present invention any geometrical structure of these areas can be implemented. Another advantageous aspect considers the application of the present invention to future generation lithography tools for exposing a semiconductor wafer. While, e.g., dose and focus exposure parameters can easily be varied between the exposure steps of optical, extended ultraviolet or x-ray lithography tools, the same is valid if the pattern is written onto the wafer by any kind of beam, i.e. ion-, electron-, x-ray-beam, etc. In this case there is even the possibility that the respective beam dose can be varied within one exposure step, just depending on the coordinates, that are currently spotted by the beam. The compensation of process inhomogeneities can be particularly advantageous therein. A further advantageous aspect according to the present invention is the use of predefined geometrical forms of the aforementioned areas. The preferred application of the present invention is the compensation of center-edge variations of pro- cess parameters across the wafers. Using a central area, e.g., comprising all exposure fields up to a radius, which can be varied, and combining the remaining outer exposure fields into an outer edge area having an annular form, the variations can be compensated to first order. Since the ge- ometry of the process inhomogeneity is fully reflected in these areas and just the exposure fields in the border of the central area given by the radius are to be investigated, the procedure of determining areas and the exposure parameters becomes even more efficient and time saving. A further aspect according to the present invention deals with the problems of 300 millimeter or larger wafer technology. Since with larger wafer sizes process inhomogeneities become particularly prominent, the method according to the present invention significantly reduces the amount of rework and increases the wafer yield. An embodiment of the invention is now described with reference to the drawings . In the drawings : Figure 1 shows sets of fuses on a memory chip, partly being covered by resist residue. Figure 2 displays the reflectivity in percent of the passi- vation layer as a function of plasmanitride (Si 3 N 4 ) layer thickness (x-axis) and plasmaoxide (Si0 2 ) layer thickness (y-axis) . Figure 3 shows a litho-shot map of a wafer with the exposure field matrix being divided into two areas for selective exposure. Figure 4 shows an evaluation of sets of exposure parameters, dose and focus, for two areas displayed in fig. 3, an inner circle area (a) , and an outer edge area (b) . Figure 5 displays the configuration flow of a Canon i5L wafer stepper prior to starting the wafer exposure. Figure 6 displays the quality of fuses of neighbouring expo- sure fields at the border of the two areas shown in fig. 3, an outer edge area exposure field (a), and an inner circle area exposure field (b) . Figure 7 shows the amount of rework in a test production from January to June 2000 with an arrow indicating the start of the new process according to this inven ion. An embodiment of the method according to the present inven- tion will now be described with respect to the aforementioned problem of reflectivity variation across the wafer. Figure 1 displays a scanning electron microscope image of two horizontal bars on a memory chip of an exposed wafer containing a plurality of fuses 80, which are visible as short vertical lines inside the bars. The chip displayed in figure 1 is positioned in an exposure field at the outer edge of the wafer, where the method of this invention has not yet been applied, and for the exposure those exposure parameters had been chosen that provide high quality output in the central wafer field. Due to the aforementioned process variations across the wafer, resist residues remain on the wafer surface after developing and cleaning, which cover several fuses 80' being poorly visible on the left-hand side of figure 1. The cause for this variations may easily be found in the strong dependence of reflectivity on the thickness of plas- manitride and plasmaoxide layers, which constitute a passiva- φ 0 A H- 3 φ a rr SD Ω 0 H- a p j rt H- 0 a o Hi H u> o o 3 C-l 3 Hi 0 H Q- 0 ϋl φ SD a QA 1 LΠ ^ LΠ ■ ?= 3 for focus are chosen to expose exposure fields 21 in the inner circle area 20'. Having varied the dose parameter of the exposure fields 21 inside the outer edge area 20, a process window can be identified as well, which is shown in figure 4 (b) . Here, the same focus parameter has been chosen as in the case of the inner circle area 20', since in this case there is less dependence on the location on the wafer. The microscope measurement of this first test wafer reveals for the outer edge area 20 an optimal dose of 1625 mJ/m 2 . Advantageously, this detailed identification of the process windows will only be carried out for wafer stepper set-ups, while for routine use the area maps and the exposure parameters dose and focus derived as mentioned can be used as de- faults, and optimization can be achieved by investigating just a few single exposure fields along the border of both areas 20, 20', as indicated by the arrows in figure 3. With modern wafer steppers it has become possible to indi- vidually select exposure fields 21 and to change the focus or dose parameters, as can be seen in figure 5. There, a program menu is provided that allows to configure the aforementioned facilities, which commonly has only been utilized for wafer stepper initializations. In determining the area map and the set of exposure parameters a test can be perfomed by comparing the images of fuses with neighbouring exposure fields 21, which belong to different areas 20, 20'. In figure 6 (a) the fuses 80 advanta- geously reveal no resist residues due to being exposed with a higher dose of 1625 mj/m 2 because the exposure field belongs to the outer edge area 20 (row 3, column 11) . The fuses 80 of the neighboring exposure field receiving the conventional dose of 1300 mJ/m 2 , and are as well not covered by -resist residues (row 3, column 12). Thus, the reflectivity variation across the wafer 10 is fully compensated in this transition region between the inner circle area 20' and the outer edge area 20, and no additional area or shifts of the borders between the two areas 20, 20' are necessary. In case the microscope measurement would have revealed any resist residues on one side of the border, the border would have to be shifted into that direction, and it would have to be considered to reduce the radius of the inner circle area and vice versa. If there would be resist residues on fuses 80 on both sides of the border between the two areas 20, 20', a third annular area would have to be established between the two existing areas 20, 20 ' . Having thus found the area maps either by manufacturing a test wafer the second step of the method is performed by using the resulting litho-shot map comprising the areas and their exposure fields with their exposure parameters to expose a plurality of wafers so long as the conditions are the same i.e. the pattern that is to be projected, the tool that is used for depositing the plasmanitride and the plasmaoxide, and the wafer stepper that is used to expose. the wafer. Another advantage is, that since this method is only applied to change the exposure conditions of the exposure tool, there is no influence in resist process, which might otherwise result in the requirement to change the corresponding process conditions. Due to the compensating effect for process inhomogeneities the amount of rework since introduction to a test process environment in a 300 mm 64 M memory wafer manufacturing line since mid-April 2000 has strongly decreased from about 20 % before introduction to about 1 % in June 2000, which can be seen in figure 7. Since the method is not restricted to memory products and 300 mm wafers, the method can advantageously be applied also in the manufacturing of other products having different diame- ters. List of reference numerals 10 semiconductor wafer 20 outer edge area 20' inner circle area 21 exposure field 22 matrix of exposure fields 30 set of exposure parameters 80 fuses 80' fuses covered by resist residues

Claims: Claims : 1. Method for exposing a semiconductor wafer (10) by adjusting exposure parameters of an exposure tool and projecting a pattern into a matrix arrangement of exposure fields (22) on said semiconductor wafer (10) , comprising - a first step, where said matrix arrangement of exposure fields (22) is divided into at least two areas (20, 20')/ each of said areas (20, 20') being provided with a differ- ent set of exposure parameters (30) comprising dose and focus of an exposure tool , and a - a second step, where each exposure field (21) is exposed using the set of exposure parameters (30) , which are attached to the area (20, 20') associated to the exposure field (21), wherein said first and second step are performed on said semiconductor wafer (10) being coated with a resist upon a passivation layer. 2. Method for exposing a semiconductor wafer (10) according to claim 1, c h a r a c t e r i s e d i n t h a t the second step is repeated for a number of semiconductor wafers (10), while the extent and design of said areas (20, 20') as well as the sets of exposure parameters (30) of each of the exposure fields (21) are held constant for all of said semiconductor wafers (10) of said number. 3. Method for exposing a semiconductor wafer (10) according to claim 1 or 2 , c h a r a c t e r i s e d i n t h a t the division into areas (20, 20') according to the first step is performed - first by determining for each of said exposure fields (21) the ranges of the sets of exposure parameters (30) , which enable the exposure to achieve a given quality, - second by associating each of said exposure fields (21) with the area (20, 20'), where all attached sets of exposure parameters (30) are within said ranges of the sets of exposure parameter (30) of said exposure fields (21) . 4. Method for exposing a semiconductor wafer (10) according to anyone of claims 1 to 3 , c h a r a c t e r i s e d i n t h a t the exposure tool is a wafer stepper or scanner, an electron beam, laser beam, ion projection beam or an x-ray lithography tool . 5. Method for exposing a semiconductor wafer (10) according to anyone of claims 1 to 4 , c h a r a c t e r i s e d i n t h a t said areas are a continuous outer edge area (20) and a continuous inner area (20') of said semiconductor wafer (10), and the radius of the circle, which separates inner area exposure fields (21) from outer area exposure fields (21) , can be adjusted. 6. Method for exposing a semiconductor wafer (10) according to anyone of claims 1 to 5 , c h a r a c t e r i s e d i n t h a t said semiconductor wafers (10) have a diameter of at least 300 millimeters.

Inventors: SCHEDEL THORSTEN, SEIDEL TORSTEN, SCHEDEL, THORSTEN, SEIDEL, TORSTEN
Applicants: INFINEON TECHNOLOGIES SC300, SCHEDEL THORSTEN, SEIDEL TORSTEN, INFINEON TECHNOLOGIES SC300 GMBH & CO.KG, SCHEDEL, THORSTEN, SEIDEL, TORSTEN
Application year: 2001
Main classification: G03F7
IPC codes: G03F7, H01L21