METHOD AND APPARATUS FOR PROVIDING A SUBSTRATE WITH VISCOUS MEDIUM AND USE OF JETTING MEANS FOR THE CORRECTION OF APPLICATION ERRORS

Abstract: Solder paste application, inspection and correction. Following or during application of solder paste on a substrate, the result thereof is inspected and any detected errors are registered. Following an evaluation as to whether correction of these errors is required and if it would be worthwhile, the errors are corrected. The correction involves removing solder paste from locations where so required, and jetting of additional solder paste to locations where so required.

Description: Method and apparatus for providing a substrate with viscous medium and use of jetting means for the correction of application errors. Technical field of the invention The present invention generally relates to the field of providing substrates with viscous medium. More specifically, the invention relates to a method of providing 5 a substrate with viscous medium, a corresponding apparatus, an apparatus for correcting application errors in connection with the application of viscous medium on a substrate, and use of jetting means for said correcting. 10 Background of the invention In the field of electronics production, it is well known that possible sources of errors are the electronic circuit boards . Mainly, these errors originate from the application of viscous medium, e.g. solder paste, prior 15 to the mounting of components on the board. Over the years, a number of different techniques have been proposed for detecting errors resulting from solder paste application. Originally, this detection was performed manually. Lately, however, the use of cameras in combina- 20 tion with image processing have become the preferred choice for detecting said errors. An example of this can be found in the International Patent Publication WO 00/42381, which discloses a method and a device for contactless inspection of objects on a substrate. 25 When errors resulting from the application of solder paste have been detected, and preferably identified, appropriate action must ensue. Traditionally, a board containing errors as a result of the application of solder paste is simply taken out of the process . The removed 30 board can then be discarded or, commonly, cleaned and subsequently reinstated at the beginning of the process. Recently, the results of the solder paste application, i.e. critical parameters thereof, are monitored and errors are identified, and the monitored parameters are fed back so that appropriate measures can be taken. This is common in state-of-the-art screen printing applications. This feedback can, in the simplest case, be a warning message when a parameter has crossed a certain pre- set limit. The operator can then decide which actions to take. On the other hand, an advanced system could incorporate artificial intelligence to adjust application parameters such as, in the case of screen printing, squeegee pressure, speed and angle, amount of paste on the stencil, cleaning interval, etc. Thus, critical process parameters can be monitored and adjusted so that the application errors can be reduced. However, the specific board containing the detected errors is dealt with in the traditional manner described above, i.e. the faulty board is removed from the entire process. When using conventional dispensing, i.e. contact dispensing, as opposed to screen printing for the application of solder paste, dispensing heads with integrated measurement capabilities, for measuring the result of the application of solder paste, are known within the art. The measured parameters can be fed back for process control in order to reduce future errors. Since the integrated measurement capabilities can measure the solder paste application of a single dot, e.g. immediately fol- lowing the dispensing of said dot, process parameters can be altered for the subsequent dispensing of dots on the same board. Thereby, small errors can be detected and process parameters adjusted so that, in the best case, major errors requiring the board to be removed from the process, can be avoided. Summary of the invention Thus, an object of the present invention is to provide a solution to the above-mentioned problems and to provide an improved production efficiency. This and other objects are achieved according to the present invention by providing apparatus and a method having the features defined in the independent claims . Preferred embodiments are defined in the dependent claims . In general terms, the invention is based on the in- sight of the advantageous results that can be obtained by using correction measures in relation to the application of viscous medium on a substrate. According to a first aspect of the invention, there is provided a method of providing a substrate with vis- cous medium, comprising the steps of applying said viscous medium onto the substrate, inspecting the results of said application, determining errors of the application based on said inspection, and correcting at least some of said errors . According to a second aspect of the invention there is provided a system or an apparatus for providing a substrate with a viscous medium, comprising application means for applying the viscous medium onto the substrate, inspection means for inspecting the results of said ap- plication, processing means for determining application errors based on said inspection, and correction means for correcting at least some of said errors. According to a third aspect of the invention there is provided an apparatus for correcting application er- rors in connection with application of a viscous medium on a substrate, said apparatus comprising processing means adapted to receive information of said errors in the application of said viscous medium, and correction means for correcting at least some of said errors based on said information. According to a fourth aspect of the present invention there is provided the use of jetting means for the correction of application errors in regard to viscous medium provided on a substrate . For the purposes of this application, it is to be noted that the term "viscous medium" should be interpreted as solder paste, flux, adhesive, conductive adhe- sive, or any other kind of medium used for fastening components on a substrate, or resistive paste; and that the term "substrate" should be interpreted as a printed circuit board (PCB) , a substrate for ball grid arrays (BGA) , chip scale packages (CSP) , quad flat packages (QFP) , and flip-chips or the like. It is also to be noted that the term "jetting" should be interpreted as a non-contact dispensing process that utilises a fluid jet to form and shoot droplets of a viscous medium from a jet nozzle onto a substrate, as compared to a contact dispensing process, such as "fluid wetting", which is the act of the viscous medium leaving the dispense tip, contacting and clinging to the substrate and remaining on the substrate as the dispense tip pulls away. Preferably, use is made of jetting and/or removing means for the correction of errors resulting from the application of a viscous medium on a substrate. Said correction is performed after the application of said viscous medium, but prior to any soldering thereof. Prefera- bly, said correction is also performed prior to the mounting of components, at the locations on the substrate where correction is required. It must, however, be noted that the correction of said errors can be performed after mounting of components at other locations on the sub- strate. This is for instance the case when mounting components on both sides of a substrate. Then, correction of errors according to the present application can be performed at one side after components have been mounted and attached to the other side of the substrate. Thus, the correction of viscous medium applied on a substrate according to the present invention must not be mistaken for the known correction of soldered connections, which is performed late in the component mounting cycle after the mounting of components and hardening of the viscous medium, i.e. reflow of solder paste, used for mechanically and electrically connecting the component to the substrate. An advantage of correcting errors prior to m Mi S3 ) μ- S3 ) TJ <! P TJ φ 3 rr μ- Φ TJ Pi 0 S» m P 3 μ- (X! Φ rt Φ μ- μ- 0 P P PJ • 3 P μ- H 03 P J tr Φ S» Ω 03 0 rf Hj Φ rr i 4 tr Φ 3 Φ Ω rf s Ω Ω 0 0 Hi 0 Hi HJ Hj ii φ Φ Ω s; Ω rt μ- rr rf 3 03 tr μ- tr S3 ) P S» 13 m Φ S3 ) 13- S3 ) TJ ro P H HS φ Φ Pi φ rt Φ rt J μ- Φ Φ iQ t 3 3 rt μ- Φ 0 S3 ) S3 ) φ P rt i μ- P J 10 TJ b-> μ- Ω S3 ) rr μ- 0 3 • H f P 03 - rt tr Φ S3 ) TJ TJ μ- Ω S3 ) rt σi μ- 0 3 O Hi < μ- 03 Ω 0 3 03 3 φ - μ- 3 3 S3 ) rt S3 ) single location can be immediately inspected, e.g. dot by dot, or deposit by deposit, and the results can both be fed back for adjustment of dispensing or jetting parameters, or can be immediately transferred to means for cor- recting any detected errors. According to an alternative embodiment, the inspection is performed following the completion of the application of viscous medium on the entire substrate. Then, and as described above, the inspection could involve inspecting the entire substrate, all locations on the substrate where viscous medium is to be applied, or predetermined specific locations on the substrate. According to the present invention, the correction of determined errors on a substrate is performed by the use of jetting for applying additional viscous medium. Not only is jetting faster, jetting is also more accurate and more flexible in comparison with conventional dispensing. The use of conventional dispensing often provide a bottle neck that increases the cycle time in the over- all component mounting process, as compared to the use of jetting. It has also been found that it is possible to achieve smaller dots when using jetting than when using conventional dispensing. Further, by using jetting, it is possible to apply dots of viscous medium having differing heights, which is difficult when using screen printing. However, at positions where it has been determined that there has been applied too much viscous medium, the surplus viscous medium must be removed. This is performed according to an embodiment of the invention by the provi- sion of removing means capable of removing viscous medium from a specific location on the board. Said removal is preferably performed through suction of the viscous medium, preferably in combination with heating the viscous medium prior to the suction thereof. Due to the charac- teristics of the viscous medium, e.g. solder paste, the remains on the substrate of viscous medium at a location at which removal of the viscous medium has been performed is generally minute. But, there may be some flux remains left at said locations. However, this is not a problem due to the fact that where cleaning of the substrate is performed following the soldering of components, in order to get rid of deleterious flux that is used when mounting the components, said flux remains will be removed during said cleaning; and in cases where it is not necessary to remove flux following said soldering, the flux remains will not be a problem. Thus, additional cleaning of the substrate following the removal of surplus viscous medium will not be necessary. The combination of jetting means and removing means for correcting errors on a substrate provided with viscous medium enables correction of all types of applica- tion errors. These errors may for instance include having applied a surplus of viscous medium or insufficient viscous medium at a given position. Furthermore, the errors may for instance include applying viscous medium at incorrect positions, applying viscous medium where the result of the viscous medium application is misaligned, applying viscous medium having characteristics deficiencies of some sort, etc. According to an embodiment of the present invention, the correction of errors is performed in a separate ma- chine, i.e. the substrate is forwarded to the correction machine following the determination that correction of the result of viscous medium application is required. According to an alternative embodiment, the correction machine also comprises the inspection means described above. Then, all substrates are forwarded to the correction machine for inspection and possible correction of detected errors. Preferably, the results of said inspection are fed back to the machine for allowing adjustment of application parameters. Said embodiment of having a stand alone correction machine is particularly useful when the initial application of viscous medium is performed by screen printing or contact dispensing. Then, the advantages relating to screen printing and contact dispensing, as recognised by the man skilled in the art and not further described herein, can be combined with the above described advan- tages of correction of errors through jetting. According to an alternative embodiment of the invention, the correction means, i.e. jetting means for correction and removing means, are integrated in the machine for performing the initial application of viscous medium onto the substrate. Thus, the inspection can be performed continuously and any correction of the substrate necessary can be done instantly. Said embodiment of having an integrated machine for both the initial application of viscous medium and the ensuing inspection and correction is particularly useful when the initial application of viscous medium is performed by jetting. Thus, a single jetting means can be utilised for both the initial application and the correction. This would facilitate the construction of the ma- chine and minimise the size of the machine and also would provide a small footprint, i.e. the overall floor space required for the machine. Alternatively, the correction is performed by a separate jetting means not used for the initial application of viscous medium. This would de- crease the overall time required for the application and the possible correction. Generally, a separate machine for the correction, and possibly also for the inspection, would increase line length but decrease the overall cycle time for each sub- strate as compared to an integrated machine as described above incorporating both the initial application of viscous medium and the subsequent or concurrent correction. Further, an integrated machine where the initial application is performed through screen printing or contact dis- pensing would have to overcome a number of constructional difficulties . According to a specific embodiment of the present invention, all errors occurring on a single substrate following the completion of the application of viscous medium, e.g. following screen printing, are jointly ana- lysed and the total amount of corrections needed for the entire substrate is then determined. Thus, it can be determined whether the sum of errors are so great that correction of the errors on the substrate are not worthwhile. Preferably, it has been determined the time re- quired for error correction of each detected error requiring correction, then the overall correction time for the entire substrate is evaluated. If it is found that correction of the errors on the substrate if not worthwhile, the substrate can be removed from the process and cleaned without any corrections being made. Thus, the use of jetting for correcting errors resulting from the application of viscous medium onto a substrate enables not only error prevention, which is known through the feedback of inspection results, but also error correction. This guarantees that a low defect level can be maintained, which in turn results in the main source of failures in the electronics production is overcome, reducing the production costs considerably. This is done without more than a fractional addition of time required for the overall application of viscous medium on a substrate . The above mentioned and other aspects, advantages, and features of the invention will be more fully understood from the following description of exemplifying em- bodiments thereof. Brief description of the drawings Exemplifying embodiments of the invention will be described below with reference to the accompanying draw- ings, in which: Fig. 1 is a block diagram illustrating a typical prior art arrangement for handling errors resulting from application of viscous medium. Figs 2-5 are block diagrams illustrating arrange- ments according to alternative embodiments of the present invention. Figs 6-11 are flow charts illustrating alternative embodiments of the method according to the present invention. Detailed description of preferred embodiments In the block diagrams of Figs 1-5, the thick-lined arrows depict the movement of a substrate through the production line. The dashed boxes simply indicate that the means or apparatus depicted within the box can be incorporated in a single machine. With reference to Figs 2-11, there is illustrated exemplary embodiments of the present invention. As to the means used for applying solder paste, inspecting the re- suits of said application, removing solder paste, and component mounting, use can be made of means which by themselves are known within the art, and the constructional features of which are also known. Therefore, a constructional and functional description of each sepa- rate means has been omitted. With reference to Fig. 1 there is shown a typical prior art arrangement for handling errors resulting from solder paste application. The solid arrows depict the transportation of a substrate through the arrangement. The substrate is first brought to a machine 2 for application of the solder paste. Following the application of solder paste, the substrate is brought to an inspection means 3 where the result of the application is inspected. When the application is performed through contact dis- pensing or jetting, the inspection could take place simultaneously with the application. Then, of course, the application means 2 and the inspection means 3 are incor- porated in a single machine 1. If the inspection shows that the result of the solder paste application is satisfactory, then the substrate is conveyed to a component mounting machine 5. If not, then the substrate is taken out of the production line, either discarded or cleaned in a cleaning machine 4 and reinstated in the production line prior to the application machine 2. There will now be described with reference to Figs 2 and 6, a first embodiment of the present invention for correcting errors resulting from solder paste application. A substrate is first brought to an application and inspection machine 10, incorporating both application means 12 and inspection means 14. A conventional method of application is used and therefore not further de- scribed. As can be seen from the flow chart in Fig. 6, solder paste is applied to the substrate at 102. Then the inspection of the application result commences at 104 by indicating the starting point for the inspection. The solder paste application is inspected for a position N at 106. At 108, it is determined whether an error is detected for position N and, if so, the parameters of the detected error, e.g. size of solder paste dot, dot position, dot shape, etc., is recorded and, possibly, also fed back to the application means at 109. At 110, there is a check whether all positions to be inspected have been inspected. If not, the position parameter N is incremented and the next position is inspected at 106. Following the inspection for all selected positions, the parameters are evaluated at 112 to determine whether correction of the substrate is required. If not, the substrate is transferred at 113 to a component mounting machine 18. However, if correction is required, then the total amount of correction needed is calculated at 114. The result of this calculation is defined as a correction value, which at 116 is compared to a threshold value for determining whether correction of the substrate is worthwhile. That is, if there are vast correction actions re- ω U ) to t H in o in o in O in Hi rt μ- S3) rt μ- TJ CQ 3 μ- TJ SD Φ to 3 μ- μ- Hi μ- 03 03 Hi μ- SD 3 ι-3 03 03 rt Ω tQ 0 00 03 H- 1 μ- 03 0 3 Φ 3 SD TJ 3 o Φ 3 3 μ- 3 Φ tr 0 3 σ φ 0 rr r SD τ 3 h- J Si) • 0 03 h- 1 S3) 03 03 TJ TJ . SD 03 Ω Hj <! 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Hi Hi μ- Mi μ- rt μ- 03 CQ 3 TJ rt Φ Hi SD 3 rr μ- m Pi TJ 3 03 Hi μ- Ω Hi Hj rt Hi 3 s; CQ 0 3 0 μ- μ- S3 ) Φ μ- 0 o 03 Si 0 3 tr φ 3 rt tr μ- rt Φ ϊf 03 Hi μ- S3 ) 3 03 rt 03 Ω rt Ω o 3 Hi rt ϋ 03 Φ rt Ω Hi Ml rt φ μ- S3 ) TJ Φ SD 3 tr . Φ 03 rt μ- o ϊf rt 3 03 3 φ μ- rt φ TJ tr rt 0 Hi tr o Si SD ϋ Φ Hi _ϋ rt tr 3 3 0 Hi Hi Φ μ- I- 1 φ 3 tr rr φ Hi Hi Φ Hi O Φ > 3 Si 03 03 α rt r Φ tr SD Φ Φ 3 S3 ) Hi 0 3 ^ Pi tr 03 Φ Φ Ω Φ 0 ϋ 3 o μ- rt SD μ- tr μ- tr μ- S3 ) Φ Ω S3 ) Φ 03 03 Φ Ω 3 Φ SD TJ M rt 03 3 Φ S3 ) • SD rt φ 3 rt Φ 3 Φ rt rt 3 0 03 3 ϋ rt Ω 0 μ 1 SD $ Hi Φ Ω 3 μ- 3 CQ SD rt Hi 3 μ- φ μ- μ- Hj tr tr Si Φ Hj TJ 03 Φ Hi rt Hi 3 Φ. 3 μ- O Φ Ω 0 μ- 0 tr H Ω tr Hj Si 0 Si ) 0 Ω r Φ Φ 3 Hj Φ fi φ SD μ- Hi φ 03 rt Hi rt ϋ 3 3 rt 3 tr Φ SI ) 3 J l_l. 3 0 μ- ι_ι. in tr Φ Ω CO Λ ω 0 φ SD tr tr μ- Hi Φ (_!- Hj 3 Ω SD TJ φ SD Hj S3 ) SD Φ μ- - 0 Ω μ- σ. 3 3 Ω 3 OO SD Φ 0 φ ϋ 3 0 Φ 3 TJ 3 CQ 0 h- 1 rt l-" Hi _- ■ Hi rt 3 Pi rt Hi • μ- μ- TJ rt 03 C 03 h- 1 Φ 3 Ω Φ Hi rt μ- 0 φ φ Hi μ- rt φ Φ rt μ- rr μ- μ- μ- 03 Hj 0 μ- S3 ) 3 rt SD SD rt 3 03 rt 3 Hi 03 Ω μ- 03 Ω 03 μ- rt tr 3 3 Ω Ml φ 03 H 0 CO TJ μ- rt μ- rt 3 rt μ- CQ μ- tr φ Φ 0 SD 3 0 rt 0 TJ 3 μ- φ φ CQ tr Ω 03 3 3 . Φ α TJ SD ϊf 0 03 ϊf 3 rt o 3 Ω h- 1 r CQ μ- Hi CQ Sl ) Hi 3 TJ 3 0 Ω μ- Hi 0 J Φ 3 ) Φ CO rt μ- P. rr rt Pi μ- Pi 0 Pi 0 φ rt SD 0 03 3 0 tr Hi 3 3 Hi SD 03 TJ 3 o ω 0 0 03 μ- φ 0 3 Φ 3 Φ < 3 rt 03 - rt Hj h- 1 Φ Φ μ- 0 TJ μ- H 3 00 > SD 3 3 μ- 0 Hj 3 Φ Hi Hi μ- Φ SD μ- 0 μ- μ- Hj φ SD S3 ) 10 Hi TJ rt μ- Ω Φ •» TJ Φ Hi 0 h- 1 3 SD 3 ϋ S3 ) TJ 03 Hi rt rt rt 3 Φ - I- 1 3 tr 3 μ- φ o SD SD TJ SD μ- Ω Hi -> TJ 3 TJ φ TJ Φ 3 TJ ϊf μ- ϊf 3 Ω μ- 03 rt 03 μ- O ϋ 3 3 rr rr l- 1 3 10 SD 3 3 SD SD 03 SD SD SD ϋ 03 H" 03 Ά $1 ) 0 Φ 0 rt SD rt Ω 3 rt 03 tr μ- 03 CQ 3 >τ_ 03 Φ 03 3 03 3 03 μ- tr μ- rt 3 3 μ- 3 ISJ TJ Ω S3 ) 0! SD μ- φ 03 Ω μ- rt SD rt ϋ μ- rt 03 rt rt ) Ω 0 10 μ- 03 0 ϋ ^ σ\ Φ O rt - 3 3 ω rt SD IO 03 tr iO Hj 3 φ 03 Φ Φ 3 CO SD ≤ CQ TJ Hi 3 3 Hi Hi μ- Pi 3 σi Ω Φ rt t Φ 03 SD 03 . Hi • ω 0 rt 3 0 0 03 ^ rt rt Ω Hi Hi O ϋ Φ 0 TJ μ- S3 ) rt 0 3 en S3 ) μ- in 03 Hj TJ tr tr SD 0 Φ 3 Φ rt 03 S3 ) Hi 0 Hi 3 Φ σ. Φ SD ι-3 Hj 03 H TJ 03 . > 0 r μ- φ rt SD φ Φ 3 Hi Ω rr ϊf rr Hj ω 3 O Si 03 Pi Hi tr φ 3 Hi TJ φ O 3 s: SD rt rt Ω M 3 3 rt S3 ) Φ Φ SD φ o Hj 03 SD Φ 3 rt ϋ o I-" TJ . o 3 μ- tr rt SD ϋ μ- μ- TJ μ- 3 Hi rt 03 Ω σi μ- CD Φ 3 tr 03 tr rt Hi μ- SD O ϋ 0 Φ μ- 3 3 3 Φ SD O ϋ μ- rt rt • 03 TJ - 3 ϋ ^ SD » φ Hi tr Ω Hj H Hi SD 3 0 03 Hi 1 Hi 3 3 3 ω Φ μ- o h- 1 0 Φ rt SD SD 3 μ> 3 0 o TJ 0 H ι Hi tr rt μ> Hj 3 Hi ' Φ φ ω ω CO O H in o in o in O Ul 03 3 3 03 rt SD SD rt TJ l_l. TJ Hi μ- 03 Ω rt rt Hi 03 0 Ω TJ |P rt 03 U !- ■ rt 3 Hi rt TJ S3 ) Ω 0 Φ S3 ) 3 3 rt ϊf S3 ) φ φ φ 3 tr 3 O o 3" Hi 0 S3 ) 3 tr Ω M" 3 φ 0 Φ Hj Φ Hi Φ rt Ω tr τ ϋ μ- CQ rt Hi Ω μ- 0 0 0 Hj 0 Hi 03 Φ Φ M rt 03 3 Hj Hj 0 03 μ- TJ ϊf ϊf 03 Φ φ. 01 rt rt Mi 0 rt s; 03 rr 3 :> rt Hi rt 3 μ- Φ rt rt Φ 3 Ω μ- <! rt 0 μ- rt Ω I- 1 Φ μ- 0 Hi μ- 3 Φ SD tr Φ 3 ϊf φ Φ rt μ- tr n Hi μ- φ CQ Φ tr in Pi H 3 Hi 0 0 CO μ- 3 Hj α SD I- 1 Ml φ ϋ Φ Ω • 3 Φ 3 SD H] 3 rt 3 03 3 ϋ Φ o t φ SD Hi Hi 03 CQ 3 μ- μ- ^ tr rr SD rt TJ μ- i rt 3 S3 ) tr φ 03 3 co ) φ rt Hi SD > Φ 3 3 φ Φ 3 SD 3 μ- μ- H O rt rt Φ Hi Ω φ ϋ μ- (- ■ 3 Pi • o l-> Φ Ω φ 3 TJ a μ- ϋ CQ 03 rt Hj S3 ) 03 3 <J 3 CQ μ- Si ) μ- Pi 3 ϊf 3 rr Φ o 3 00 0 Ω Si φ Ω 03 0 ^ 0 μ- 3 3 SD μ- Φ 03 Si ) tr < μ- μ- 03 s; 10 μ- rt H φ . μ- Hi rt M 0 tr 0 μ- 3 S3 ) 03 l- 1 rt ^ μ- 0 Φ rt 3 3 3 tr 3 ω Φ 3 0 rt 03 M μ- Hi Hi M ^ Hi ϋ CQ rt μ- rr 03 0 rt μ- l_l. μ- tr <! ^ CQ φ tr Φ 3 Pi O Ω Hi ϊf Φ 3 0 o Si φ Φ • tr rt μ- ? 0 Φ S3 ) φ CQ S3 ) φ Φ O 03 rt Φ μ- o rt 3 0 rt Ω CQ 0 Hi μ- <Q rt Φ Hi φ μ- μ- 3 Hj rt Φ TJ -. a Hi H rt tr 3 Ω . Φ Φ Ti i Hi rt TJ 3 3 3 tr Hi C S3 ) Φ 3 rt TJ 4 S3 ) μ- oo Hj Φ 3 3 ϋ rt μ- Si ) μ- rt μ- φ CQ μ- φ H TJ • μ- (- ■ 03 (- ■ SD SD SD μ- 1 Ω I- 1 SD 0 3 SD Hi 03 rt tr iQ in 3 O tr 3 i H! O SD 3 φ CQ rt TJ 3 o 0 μ- i rt 3 SD rt μ- Hi Φ 0 • o 03 3 φ CQ rt Φ Ω Hj 03 tn μ- 03 μ- Si μ- TJ CQ Hi Ω 03 μ- Φ M 1 rt Φ 3 ^^ < rt H; o Hi 3 tr 0 Pi 0 03 rt 0 rt rt 03 S3 ) <! {-• rt Hi SD μ- oo 3 Hi h- 1 3 Φ Φ Hj Φ Si ) rt ^ HJ Φ € μ- Φ μ- 3 Φ μ- μ- tr Φ rt 3 CD 3 ^ 03 μ- - 1 0 Hj 0 in CQ Hi _- ■ μ- ϊf ^ S3 ) Hi φ S3 ) TJ SD 3 Ω 03 Φ Ω μ- 10 3 SD rt 03 rt rt Hi o Hi tr Hi CO 3 K μ- 03 φ Ω SD <! 03 Φ S3 ) H rt O H" rt rt rt Φ Ω tr φ 03 o O 0 Φ 0 0 Φ iQ Ω 0 TJ φ 03 rt Hj tr rt TJ Φ μ- 3 φ CQ μ- 0 TJ rt 0 03 Φ 3 Hj £ ϋ Hi 0 3 03 S rt Hj TJ M 03 ι ^ 0 ϊf Hj Φ μ- φ <! <! ii Hj tr Hi Ω 3 rt 3 μ- Hi CQ Φ Φ μ- Hi rt o Φ 0 Hi o M μ- φ o l_l- 0 Φ ^d ω 3 Hj 0 Φ tr rt ϊf SD S3 ) rt Pi tr rt I- 1 I- 1 0 Φ μ- Φ CO TJ Hi Φ 3 Hi 03 Hi φ Ml μ- 1 3 Φ £. 0 Φ I- 1 μ- rt tr Φ rt o I- 1 3 Ω Ω Hi TJ 1 0 S3 ) 0 ι_ι. rt 3 CQ CO 03 Ω . Hi Ω ω h- 1 3 3 Hi Si ) μ- - rt SD 0 03 (^ 03 Hi ϊf rt 03 Φ 03 rt rt φ CQ • Hi rt 0 CO Hj . 3 SD 3 μ- rr μ> 03 rt SD ϊf s; 3 ϊf rt O μ- ϊf rt Φ μ- . μ- Hi O H> φ 03 ■ fl CO Ω CQ Hi 03 Φ 0 μ- μ 1 o μ- 03 Φ 3" Φ 0 rt 3 Φ 3" in HJ 0 03 Hi in .P rt μ- CO S3 ) S3 ) 0 SD 3 0 0 o tr φ Pi ≤ μ- ϋ CQ 0 Hj 3 > Φ tr 3 Φ 10 3 r TJ rt Hj rt 3 3 5 > CO 0 1-" S3 ) tr l_l. Hi 3 3 Φ TJ α Φ 03 rt rt Ω 3 μ- TJ • rt 0 f f 03 0 μ- 1 Hi φ 3 Φ φ φ Ml CO Hi 3 Hi 03 H ϋ Hi rt 03 H{ 03 O tr d^ 03 Φ Φ Φ - Hi SD 3 . "< Φ rt SD o SD Φ φ O ϊf 03 3 μ- Φ Φ μ> Φ H μ- SD 3 CQ μ> 3 3 rt 03 3 0 TJ SD 03 rf^ rt 3 rt 3 0 Si in M rr φ. rt TJ 03 Hi tr rt ϋ o φ Ω μ- Mi SD 3 Φ o S3 ) 0 <! Φ 03 3 o f 3 1 μ- 0 Φ Φ 0 tr rt rt 0 Pi 3 μ- 0 SD 03 03 3 o 3 Φ TJ 3 0 Ω CO Ω Φ 03 Φ- 0 03 3 rt Φ rt ϊf 0 tr Φ IQ 3 s; SD rt rt Si rt μ- ϊf 3 0 1 0 φ CO 3 μ- 0 0 tr tr Φ Hi 0 ϋ' rt μ- rt i φ μ- tr tr ) rt 3 Hi in Hi Ω P. o 03 rt Hi Pi φ Pi μ- Φ Ω ^ 3 Φ ϋ 03 μ- in Φ Φ I- 1 rt 03 μ- Hi H Hi 0 • μ- Si ) s Φ Ω 3 3 Ω 0 μ- to Hi μ- SD 3 o μ> Φ o Φ 3 Φ CO Φ 3 0 0 μ- tr rt μ- 0 Φ > SD rt Hi CQ 3 rr 3 3 <! o Ω 3 - ϋ tr Hi Ω 03 TJ *χ] M 3 3 H- 1 Φ Φ 3 3 rt o rt Φ Hj rt SD μ- ϋ 03 Φ 0 Φ 0 rt TJ 0 μ- 0 0 Hj Ω 03 TJ ϊf o μ- Pi Φ tr rt 0 φ 3 S3 ) rr 3 Ω μ- 3 Φ Hj μ- φ 0 3 3 = > rt TJ 3 Hi Φ rt TJ 0 0 Ω I- 1 Φ μ- 3 rt ϋ rt Ω tr TJ 0 rt rt 3 3 O X 3 Φ SD Φ tr SD 03 Φ φ Φ i Ω 3 rt h- 1 <! u ϊf μ- Ω Φ 0 3 3 P Ω & 3 l- 1 <! Φ Hj rt 03 $1 ) i Ω rt o μ- Ω Φ Φ Hi 0 0 3 TJ μ- 03 Ω rt Φ r - i φ SD Hi O α rr μ- Hj 0 03 o rr 0 0 3 Hi Φ Φ CQ rt O μ- μ- TJ rt ■ <_ Hi 03 3 SD h- 1 Si Φ μ- 0 O Hj Hi 3 tr 3 03 03 Hi i 3 φ Φ rt 3 0 03 0 3 - - 3 Φ rt Pi μ- Hi 0 3 o φ 0 Φ TJ ϊf 0 3 μ- S3 ) rt rr 3 TJ J 3 0 tr rt μ- φ rt Hi 3 03 rt tr μ- Hj Φ I- 1 tr tr _ 3 Hi Φ l- 1 TJ Hi rt 3 rt SD 03 Φ 0 Hi μ- O o TJ tr < 03 Φ Φ Hi α 03 o 03 CO φ TJ Si 03 ) φ Hj Φ 0 ϊf 3 ϊf 3 rt Hj 3 0 Hj S3 ) Hi SD 0 Φ μ- rt Φ Φ φ rt 0 ISJ rt φ Hi Hi Φ rt Φ ^ Hj 3 03 3 03 3 03 0 J μ- μ- Hi 1 tr Pi rt μ- 3 tr ^ Φ 1 1 μ- SD ≥; SD ϋ rt Pi Φ 3 φ 03 0 rt φ 0 Ω φ α P. 3 r μ- ϊf 03 Hi 3 tr 1 1 Φ 1 Φ rt CQ Φ CQ Φ 1 Φ 1 1 0 formed at step 509, whereas at step 309 of the method 300, parameters are transmitted to separate correction means. However, as stated above, the correction for a specific position does not necessarily take place immedi- ately following the inspection of that position. Even though the invention has been described above using exemplifying embodiments thereof, alterations, modifications and combinations thereof, as understood by those skilled in the art, may be made within the scope of the invention, which is defined by the accompanying claims.

Claims: CLAIMS 1. A method of providing a substrate with viscous medium, comprising the steps of applying the viscous medium onto the substrate, inspecting the results of said application, determining errors of the application based on said inspection, and correcting at least some of said errors. 2. The method as claimed in claim 1, wherein the step of determining errors comprises the step of evaluating all of the determined errors and deciding to what ex- tent the determined errors shall be corrected. 3. The method according to claim 1 or 2 , wherein the step of determining errors further comprises the step of evaluating each of the determined errors and deciding on proper corrective action. 4. The method according to claim 3, wherein the step of determining errors comprises the steps of estimating for each of the determined errors the time required for performing said corrective action, and calculating the overall time required. for corrective action of all determined errors. 5. The method according to any previous claims, wherein said correction comprises jetting of additional viscous medium onto the substrate and/or removing viscous medium from the substrate . 6. The method according to claim 5 , wherein the step of correcting comprises the step of removing viscous medium from positions on the substrate where viscous medium has been unintentionally applied. 7. The method according to claim 5 or 6, wherein the step of correcting comprises the step of removing surplus viscous medium from positions on the substrate where more viscous medium has been applied than intended. 8. The method according to any one of claims 5-7, wherein the step of correcting comprises the step of jetting of additional viscous medium to positions on the substrate where no viscous medium has been applied even though intended. 9. The method according to any one of claims 5-8, wherein the step of correcting comprises the step of jet- ting of additional viscous medium to positions on the substrate where the amount of applied viscous medium is insufficient . 10. The method according to claim 8 or 9, further comprising the steps of inspecting the results of said jetting of additional viscous medium, determining errors of said jetting of additional viscous medium based on said inspection, and correcting at least some of said errors. 11. The method according to any one of the previous claims, wherein the step of applying viscous medium is performed by jetting. 12. The method according to any one of claims 5-10, wherein the step of applying viscous medium is performed by jetting and wherein the application of the viscous medium and the jetting of additional viscous medium is per- formed by the same jetting means. 13. The method according to any one of claims 1-10, wherein the step of applying viscous medium is performed by screen printing. 14. The method according to any one of claims 1-10, wherein the step of applying viscous medium is performed by contact dispensing. 15. The method according to any one of the previous claims, wherein said step of correcting is performed after said step of applying viscous medium has been completed. 16. The method according to any one of the previous claims, wherein said step of inspecting is performed after said step of applying viscous medium has been completed. 17. The method according to any one of the preceding claims, wherein said step of inspecting and said step of correcting are performed simultaneously after said step of applying viscous medium. 18. The method according to any one of claims 1-14, wherein said step of correcting is performed simultaneously with said step of applying viscous medium. 19. The method according to any one of claims 1-15 or 18, wherein said step of inspecting is performed si- multaneously with said step of applying viscous medium. 20. An apparatus for providing a substrate with a viscous medium, comprising application means for applying the viscous medium onto the substrate, inspection means for inspecting the results of said application, processing means for determining application errors based on said inspection, and correction means for correcting at least some of said errors . 21. The apparatus according to claim 20, wherein the processing means comprises evaluating means for evaluating each of the determined errors and deciding to what extent the determined errors shall be corrected. 22. The apparatus according to claim 20 or 21, wherein said correction means comprises jetting means for jetting of additional viscous medium onto the substrate and/or removing means for removing surplus viscous medium from the substrate. 23. The apparatus according to any one of claims 20- 22, wherein said application means is a jetting means. 24. The apparatus according to any one of claims 20- 22, wherein said application means is a jetting means and wherein said application means and said jetting means for jetting of additional viscous medium is the same jetting means . 25. The apparatus according to any one of claims 20- 22, wherein said application means is a screen printing means . 26. The apparatus according to any one of claims 20- 22, wherein said application means is a contact dispensing means . 27. An apparatus for correcting application errors in connection with application of a viscous medium on a substrate, said apparatus comprising processing means adapted to receive information of said errors in the application of said viscous medium, and correction means for correcting at least some of said errors based on said information. 28. The apparatus according to claim 27, further comprising inspection means for inspecting the results of said application, wherein said processing means receives said information from said inspection means. 29. The apparatus according to claim 27 or 28, wherein the processing means comprises evaluating means for evaluating each of the determined errors. 30. The apparatus according to any one of claims 27- 29, wherein said correction means comprises jetting means for jetting of additional viscous medium onto the substrate and/or removing means for removing surplus viscous medium from the substrate 31. Use of jetting means for the correction of application errors in regard to viscous medium provided on a substrate.

Inventors: HOLM WILLIAM, JACOBSSON NILS, HOLM, WILLIAM, JACOBSSON, NILS
Applicants: HOLM WILLIAM, JACOBSSON NILS, MYDATA AUTOMATION AB, HOLM, WILLIAM, JACOBSSON, NILS
Application year: 2001
Main classification: H05K3
IPC codes: B05D1, B05D3, B23K31, B41F15, B41F33, H05K1, H05K3