A MEM GYROSCOPE AND A METHOD OF MAKING SAME

Abstract: A method of making a micro electro-mechanical gyroscope. A cantilevered beam structure, firstportions of side drive electrodes and a mating structure are defined on a first substrate or wafer;and at least one contact structure, second portions of the side drive electrodes and a matingstructure are defined on a second substrate or wafer, the mating structure on the second substrateor wafer being of a complementary shape to the mating structure on the first substrate or waferand the first and second portions of the side drive electrodes being of a complementary shape to each other. A bonding layer, preferably a eutectic bonding layer, is provided on at least one of the mating structures and one or the first and second portions of the side drive electrodes. The matingstructure of the first substrate is moved into a confronting relationship with the mating structureof the second substrate or wafer. Pressure is applied between the two substrates so as to cause a bond to occur between the two mating structures at the bonding or eutectic layer and alsobetween the first and second portions of the side drive electrodes to cause a bond to occurtherebetween. Then the first substrate or wafer is removed to free the cantilevered beam structurefor movement relative to the second substrate or wafer. The bonds are preferably eutectic bonds.

Description: A MEM Gyroscope and a Method of Making Same Technical Field The present disclosure relates to micro electro-mechanical (MEM) gyroscopes using dual wafers which are bonded together preferably eutectically. The disclosure also relates to a single crystal, dual wafer, tunneling gyroscope and a method of making same. Background The present disclosure provides a new process of fabricating a single crystal silicon MEM gyroscopes using low-cost bulk micromachining techniques while providing the advantages of surface micromachining. The prior art, in terms of surface micromachining, uses e- beam evaporated metal that is patterned on a silicon dioxide (SiO 2 ) layer to form the control, self- test, and tip electrodes of a tunneling MEM sensor. A cantilevered beam is then formed over the electrodes using a sacrificial resist layer, a plating seed layer, a resist mold, and metal electroplating. Finally, the sacrificial layer is removed using a series of chemical etchants. The prior art for bulk micromachining has utilized either mechanical pins and/or epoxy for the assembly of multi-Si wafer stacks, a multi-Si wafer stack using metal-to-metal bonding and an active sandwiched membrane of silicon nitride and metal, or a dissolved wafer process on quartz substrates (Si-on-quartz) using anodic bonding. None of these bulk micromachining processes allow one to fabricate a single crystal Si cantilever (with no deposited layers over broad areas on the beam which can produce thermally mismatched expansion coefficients) above a set of tunneling electrodes on a Si substrate and also electrically connect the cantilever to pads located on the substrate. The fabrication techniques described herein provide these capabilities in addition to providing a low temperature process so that CMOS circuitry can be fabricated in the Si substrate before the MEMS sensors are added. Finally, the use of single crystal Si for the cantilever provides for improved process reproductibility for controlling the stress and device geometry. MEM gyroscopes may be used in various military, navigation, automotive, and space applications. Space applications include satellite stabilization in which MEM technology can significantly reduce the cost, power, and weight of the presently used gyroscopic systems. Automotive air bag deployment, ride control, and anti-lock brake systems provide other applications for MEM gyroscopes and/or sensor. Military applications include low drift gyros. Brief Description of the Invention Generally speaking, the present invention provides a method of making a micro electro¬ mechanical (MEM) gyroscope wherein a cantilevered beam structure and a mating structure are defined on a first substrate or wafer and at least one contact structure and a mating structure are defined on a second substrate or wafer. The mating structure on the second substrate or wafer is of a complementary shape to the mating structures on the first substrate or wafer. A bonding or eutectic layer is provided on at least one of the mating structures and the mating structure are moved into a confronting relationship with each other. Pressure is then applied between the two substrates and heat may also be applied so as to cause a bond to occur between the two mating structures at the bonding or eutectic layer. Then the first substrate or wafer is removed to free the cantilevered beam structure for movement relative to the second substrate or wafer. The bonding or eutectic layer also provides a convenient electrical path to the cantilevered beam for making a circuit with the contact formed on the cantilevered beam. In another aspect, the present invention provides an assembly or assemblies for making a single crystal silicon MEM sensor therefrom. A first substrate or wafer is provided upon which is defined a beam structure and a mating structure. A second substrate or wafer is provided upon which is defined at least one contact structure and a mating structure, the mating structure on the second substrate or wafer being of a complementary shape to the mating structure on the first substrate or wafer. A pressure and heat sensitive bonding layer is disposed on at least one of the mating structures for bonding the mating structure defined on the first substrate or wafer with the mating structure on the second substrate in response to the application of pressure and heat therebetween. In operation, a Coriolis force is produced normal to the plane of the device by oscillating the beam laterally across the substrate. The side drive electrodes are preferably fabricated with the cantilevered beam on the first substrate and are bonded to the second substrate at the same time that the cantilevered beam is attached. This provides for high alignment accuracy between the cantilevered beam and the side electrodes. Brief Description of the Figures Figures 1A through 6 A depict the fabrication of a first embodiment of the cantilevered beam forming portion of a MEM gyroscope; Figures IB through 6B correspond to Figures 1 A - 6A, but show the cantilevered beam forming portion, during its various stages of fabrication, in plan view: Figures 7 A through 11A show, in cross section view, the fabrication of the base portion of the gyroscope; Figures 7B through 1 IB correspond to Figures 7A - 9A but show the fabrication process for the base portion in plan view; Figures 12 and 13 show the cantilevered beam forming portion and the base portion being aligned with each other and being bonded together preferably by eutectic bonding; and Figures 14A and 15 show the completed MEM gyroscope in cross sectional view, Figure 15 being enlarged compared to Figure 14A; ■ Figure 14B shows the completed MEM gyroscope in plan view; Figures 16 and 17 show a modification of the cantilevered beam forming portion wherein the beam is formed on an etch stop layer and also shown the base portion being aligned therewith and being bonded thereto preferably by eutectic bonding; Figures 18A and 18b show the completed MEM gyroscope in cross sectional view and plan views; and Figure 19 shows a modification wherein a relatively small ribbon conductor is provided on the cantilevered beam. Detailed Description Several embodiments of the invention will be described with respect to the aforementioned figures. The first embodiment will be described with reference to Figures 1 A through 15. A second embodiment will be discussed with reference to Figures 16 through 18B. Further modifications are described thereafter. The MEM gyroscope shown in the accompanying figures is not drawn to scale, but rather are drawn to depict the relevant structures for those skilled in this art. Those skilled in this art realize that these devices, while mechanical in nature, are very small and are typically manufactured using generally the same type of technology used to produce semiconductor devices. Thus a thousand or more devices might well be manufactured at one time on a silicon wafer. To gain an appreciation of the small scale of these devices, the reader may wish to turn to Figure 15 which includes size information for the first embodiment of a MEM gyroscope utilizing the present invention. The figure numbers with the letter 'A' appended thereto are section views taken as indicated in the associated figure numbers with the letter 'B' appended thereto, but generally speaking only those structures which occur at and immediately adjacent the section are shown and not structures which are well behind the section. For example, in Figure 2A, the portion of the mask 14 which forms the upper arm of the letter E shaped structure seen in Figure 2B does not appear in Figure 2A since it is located spaced from the plane where the section is taken; however, the opening 14-3 behind the section line which is used to help define one of the two side drive electrodes of the gyroscope is shown. The section views are thus drawn for ease of illustration. Turning to Figure 1 A and IB, a starting wafer for the fabrication of the cantilever is depicted. The starting wafer includes a wafer of bulk n-type silicon (Si) 10 upon which is formed a thin layer of doped p-type silicon 12. The silicon wafer 10 is preferably of a single crystalline structure having a <100> crystalline orientation. The p-type silicon layer 12 is preferably grown as an epitaxial layer on silicon wafer 10. The layer 12 preferably has a thickness of in the range of 1 to 20 micrometers (μm), but can have a thickness anywhere in the range of 0.1 μm to 800 μm. Generally speaking, the longer the cantilevered beam is the thicker the beam is. Since layer 12 will eventually form the cantilevered beam, the thickness of layer 12 is selected to suit the length of the beam to be formed. Layer 12 in this embodiment is with Boron such that its resistivity is reduced to less than 0.05 Ω-cm and is preferably doped to drop its resistivity to the range of 0.01 to 0.05 Ω-cm. The resistivity of the bulk silicon wafer or substrate 10 is preferably about 10 Ω-cm. Boron is a relatively small atom compared to silicon, and therefore including it as a dopant at the levels needed (10 20 ) in order to reduce the resistivity of the layer 12 tends to induce stress which is preferably compensated for by also doping, at a similar concentration level, a non-impurity atom having a larger atom size, such as germanium. Germanium is considered a non-impurity since it neither contributes nor removes any electron carriers in the resulting material. Layer 12 shown in Figures 1 A and IB is patterned using well known photolithographic techniques to form a mask layer 14, patterned as shown, preferably to assume the shape of a capital letter 'E', with mesas 14-3, which will be used to help define side drive electrodes for the gyroscope. While the shape of the capital letter 'E' is preferred, other shapes can be used. In this embodiment, the outer peripheral portion of the E-shape will form a mating and supporting structure which will be used to join the cantilever portion of the sensor to the base portion and to support the cantilevered beam above the base portion. After the mask layer 14 has been patterned as shown in Figures 2 A and 2B, the wafer is subjected to a plasma etch in order to etch through the exposed thin layer of p-type doped silicon 12 and also to over etch into the silicon wafer 10 by a distance of approximately 500 A. This etching step defines the outer peripheral portion of the E-shape in layer 12, a cantilevered beam having a thick portion 12-2 and a thin elongated portion 12-5 (see Figure 4B) as well as portions 12-3 of the side drive electrodes. The mask 14 shown in Figures 2A and 2B is then removed and another photoresist layer 16 is applied, which is patterned as shown in Figures 3 A and 3B by providing two openings therein 16-1, 16-2 plus two openings labeled 16-3 which align with the two small portions 12-3 of layer 12 which remain due to the aforementioned etching step. Opening 16-1 basically follows the outer perimeter of the 'E' shape of the underlying thin layer of p-type silicon 12 while opening 16-2 is disposed at or adjacent an end of the thick portion 12-2 (Figure 4B) of the interior leg of the 'E'-shaped p-type silicon layer 12. The interior leg 12-2, 12-5 will become to the cantilevered beam. Layers of Ti/Pt/Au are next deposited over mask 16 and through openings 16-1, 16-2 and 16-3 to form a post contact 18-1 , a tunnelling tip contact 18-2 and two side drive electrode contacts 18-3. The Ti Pt/Au layers preferably have a total thickness of about 2000 A. The individual layers of Ti and Pt may have thicknesses in the ranges of 100-200 A and 1000-2000 A, respectively. After removal of the photoresist 16, the wafer is subjected to a sintering step at approximately 520°C to form an ohmic Ti-Si juncture between contacts 18-1 and 18-2 and the underlying layer 12. As will be seen with reference to Figure 19, the sintering step can be eliminated if a metal layer, for example, is used to connect contacts 18-1, 18-2 and 18-3. As another alternative, which does rely on the aforementioned sintering step occurring, post contact 18-1 may be formed by layers of Ti and Au (i.e without Pt), which would involve an additional masking step to eliminate the Pt layer from post contact 18-1. However, in this alternative, the sintering would cause Si to migrate into the Au to form an Au/Si eutectic at the exposed portion of post contact 18-1 shown in Figures 4A and 4B. As a further alternative, the exposed portion of the post contact 18-1 shown in Figures 4A and 4B could simply be deposited as Au/Si eutectic, in which case the Pt layer in the post contact 18-1 could be optionally included. Post contact 18-1 may be eliminated if the subsequently described bonding between the cantileyered beam forming portion 2 and the base portion 4 occurs non-eutectically. As a result, the exposed portion of the post contact 18-1 and the exposed portions 18-3 of the side drive electrodes 12-2, 18-3 shown in Figures 4A and 4B are formed preferably either by Au or by Au/Si. When the cantilevered beam forming portion 2 and the base portion 4 are mated as shown and described with reference to Figures 12 and 13 (and with reference to Figures 16 and 17 for a second embodiment) , one of the exposed mating surfaces is preferably a Au Si eutectic while the other is preferably Au. Thus, exposed mating surfaces 18-1, 18-3 can preferably be either Au and Au/Si if the exposed mating surface on the base portion 4 is the other material, i.e., preferably either Au/Si or Au so that a layer of Au/Si confronts a layer of Au. The structures shown in Figures 4A and 4B are then covered with a layer of photoresist 20 which, as shown in Figure 5A, is patterned as shown in Figure 5A and 5B, with a opening 20-2 therein over tunnelling tip contact 18-1. Those skilled in the art will appreciate that the size of the openings 16-1, 16-2, 16-3 and 20-2 are not drawn to scale on the figures and that openings 16-2 and 20-2 would tend to be significantly smaller than would be openings 16-1 and 16-3-1. As such, when a rather thick layer of Au 26, preferably having a thickness of about 15,000 A, is deposited on the wafer, it basically clogs opening 20-2 (see Fig. 5A). Those skilled in the art will appreciate that there is fill-in at the sides of a mask when a layer such as Au layer 26 is deposited because of an increasing overhang which occurs at the edges of opening 20-2 as the deposition process proceeds. Since opening 20-2 is rather narrow, the deposited Au 26, as shown at numeral 26-2, assumes a pyramidal-like or conical-like shape as the opening is clogged with Au. The thickness of the deposition of Au layer 26 is sufficiently thick to assure that layer 26 will close across the top of opening 20-2 during the deposition process and so that structure 26-2 assumes its pointed configuration. The photoresist 20 is then dissolved lifting off the layer 26 formed thereon and leaving the structures depicted by Figures 6 A and 6B. The fabrication of the base portion 4 of this embodiment of the MEM gyroscope will now be described with reference to Figures 7 A through 1 IB. Turning to Figures 7 A and 7B, a wafer 30 of silicon is shown upon which a layer of photoresist has been deposited and patterned (i) to assume preferably the outerperipheral shape of a capital letter 'E' 50-1 complementary to the outer peripheral shape of patterned mask layer 14 (Figure 2B) and (ii) to define mesas 50-3 complementary to the size, shape and location of the first portions 12-3, 18-3 of the side drive electrode formed on the cantilevered beam forming portion 2. The exposed silicon is then subjected to an etch, etching it back approximately 20,000 A, to define a protruding portion 30-1 of wafer 30 under the patterned mask 50-1 of the photoresist and protruding portions 30-3 under mesas 50-3. The photoresist mask 50 is then removed and wafer 30 is oxidized to form layers of oxide 52, 54 on its exposed surfaces. The oxide layers are each preferably about 1 μm thick. Of course, the end surfaces shown in Figure 8A are not shown as being oxidized because it is assumed that the pattern shown in Figure 8 A (and the other figures) is only one of a number of repeating patterns occurring across an entire wafer 30. The oxide includes protruding portions 52-1 and 52-3 thereof on protruding portions 30-1 and 30-3 of the wafer 30. Turning to Figures 9A and 9B, a layer of photoresist 56 is applied having (i) an opening therein 56-1 which again assumes the outerperipheral shape of a capital letter Ε', as previously described and (ii) a pair of openings 56-3 to aid in the formation of the second portion of the side electrode on wafer 30. Then, a layer of Ti/Pt/Au 58, preferably having a thickness of 2,000 A, is deposited through openings 56-1, 56-3 followed by the deposition of a layer 60 of an Au/Si eutectic preferably with a 1,000 A thickness. Layers 58-1, 58-3 of Ti/Pt/Au and layers 60-1, 60- 3 of the Au/Si eutectic are thus formed. Layers 58-1 and 60- preferably follow the outerperipheral shape of a capital letter 'E', as can be clearly seen in Figure 9B, while layers 58-3 and 60-3 disposed on the oxided protrusion 52-3 define the second portions of the side drive electrodes. The second portions of the side drive electrodes will be mated with the first portions thereof formed on cantilevered beam forming portion 2 in due course. Of course, if the post contact 18-1 and the side electrode contacts 18-3 (see Figure 4A) are either formed of an Au/Si eutectic or has an Au/Si eutectic disposed thereon, then layers 60, 60-1, 60-3 may be formed of simply Au or simply omitted due to the presence of Au at the exposed layers 58-1 and 58-3. Photoresist layer 56 is then removed and a layer 62 of photoresist is applied and patterned to have (i) openings 62-2, 62-3, 62-4 and 62-6, as shown in Figure 10A, (ii) openings for pads 40-1 through 40-5 and their associated ribbon conductors 42; (iii) an opening for guard ring 44 and its pad, as depicted in Figure 10B. For the ease of illustration, the opening for guard ring 44 is not shown in Figure 10A. A layer 38 of Ti/Pt/Au is then deposited over the patterned photoresist layer 62 and through openings 62-2, 62-3, 62-4 and 62-6 therein forming contacts 38- 2, 38-3, 38-4 and 38-6 and the photoresist 62 is removed to thereby arrive at the structure shown in Figures 11 A and 1 IB. Those contacts are interconnected with their associated pads 40-2 through 44-4 by the aforementioned ribbon conductors 42, which contacts 40 and ribbon conductors 42 are preferably formed at the same time as contacts 38-3, 38-4 and 38-2 are formed. The outerperipheral layers 58-1 and 60-1 are also connected with pad 40-1 by an associated ribbon conductor 42. The protrusion 30-1, which preferably extends approximately 20,000 A high above the adjacent portions of wafer 30', and the relatively thin layers 58-1 and 60-1 form the mating structure for the base portion 4. Contacts 38-6 are preferably triangularly shaped with their hypotenuses confronting each other and positioned such that the hypotenuses will lie under a centerline of the elongated cantilevered beam 12-5 when the cantilevered beam forming portion 2 is joined to the base portion 4. Pad 40-1 is connected to layers 58-1 and 60-1 and provides a pad for a beam bias voltage. Pad 40-2 is connected to tip contact 3 -2 and provides a pad for the tip contact 38-2. Pad 40-3 is connected to contacts 38-3 and provides a pad for the side drive electrodes 38-5, 58-3 and 60-3 (when the two portions 2, 4 are bonded together). Pad 40-4 is connected to contact 38-4 and provides a pad for device testing. Pad 40-5 is connected to contact 38-5 and provides a pad for a pull down voltage. Pads 40-6 are connected to the two side sense contacts 38-6 and provides pads for the side sense contacts 38-6. Turning to Figure 12, the cantilevered beam forming portion 2 is now bonded to base portion 4. As is shown in Figure 12, the two wafers 10 and 30 are brought into a confronting relationship so that their mating structures 18-1, 30-1, 58-1 and 60-1 are in alignment and so the first and second portions of the side drive electrode are in alignment and so that (i) layers 18-1 and 60-1 properly mate with each other and (ii) layers 18-3 and 60-3 properly mate with each other. Pressure and heat (preferably by applying a force of 5,000 N at 400°C between three inch wafers 2, 4 having 1000 sensors disposed thereon) are applied so that eutectic bonding occurs between layers 18-1 and 60-1 and between layers 18-3 and 60-3 as shown in Figure 13. Thereafter, silicon wafer 10 is dissolved so that the MEM sensor structure shown in Figure 14 is obtained. The p-type silicon layer 12 includes a portion 12-2 which serves as the cantilevered beam and another portion which is attached to the base portion 4 through the underlying layers. The gold contact 26-2 is coupled to pad 40-1 by elements 18-2, 12-2, 12-1, 18-1, 60-1, 58-1 and its associated ribbon conductor 42. If the bonding is done non-eutectically, then higher temperatures will be required. Protrusion 30-1 and layers 18-1, 60-1, and 58-1 have preferably assumed the shape of the outerperpherial edge of a capital letter Ε' and therefore the cantilevered beam of the MEM gyroscope is well protected by this physical shape. After performing the bonding, silicon layer 10 is dissolved away to arrive at the resulting MEM sensor shown in Figures 14A and 14B. The silicon can be dissolved with ethylenediamine pyrocatechol (EDP). This leaves only the Boron doped silicon cantilevered beam 12 with its associated contact 26-2 and its supporting or mating structure 18-1 bonded to the base structure 4. Preferable dimensions for the MEM sensor are given on Figure 15. The beam as preferably has a length of 200 to 300 μm (0.2 to 0.3 mm). Figure 15 is basically identical to Figure 14, but shows the MEM sensor in somewhat more detail and the preferred dimensions of the MEM sensor are also shown on this figure. Instead of using EDP as the etchant, plasma etching can be used if a thin layer 11 of SiO 2 is used, for example, as an etch stop between layer 12 and substrate 10. Figures 16, 17, 18A and 18B are similar to Figures 12, 13 , 14A and 14B, respectively, but differ in that a thin layer of SiO„ is shown being utilized as an etch stop between layer 12 and substrate 10. Such a thin layer 11 of SiO„ can be formed by the implantation of oxygen so that layer 12 retains the same crystalline structure of wafer 10. In this case the layer 12 may be undoped or may be doped with Boron or other dopants. The plasma etch in this case is a two step process. A first etch, which preferentially etches silicon, removes substrate 10 and a second etch, which preferentially etches SiO 2 , removes the etch stop layer 11 to arrive at the structure shown in Figures 18A and 18B. If layer 12 is undoped or nor sufficiently doped to provide proper conductivity (for example, to a level less than 0.05 Ω-cm), then a thin ribbon conductor 18-4 should be affixed to layer 12 as shown in Figure 19 to interconnect contacts 18-1, 18-2 and 18-3. Generally speaking, it is preferred to use the conductivity in the cantilevered beam, by sufficiently doping same, to interconnect contacts 18-1, 18-2 and 18-3 rather than a separate ribbon conductor 18-4 since the existence of a ribbon conductor on the beam 12 may interfere with its freedom of movement in response to acceleration events which a gyroscope should detect. If a ribbon conductor 18-4 is used, then is should be kept as small as practicable in both height and width to minimize its effect on the cantilevered beam. It will be recalled that in the embodiment of Figures 1 A - 15, that after the layer of Ti/Pt/Au 18 was applied forming contacts 18-1, 18-2 and 18-3, they were sintered in order to form an ohmic bond with Boron-doped cantilever 12. It was noted that sintering could be avoided by providing a ribbon conductor between the contacts. The just-described ribbon conductor 18-4 has the advantage of omitting any steps needed to form ohmic contacts with the beam. It can be seen that the Si layer 12 formed on silicon wafer 10 may be (i) doped with Boron or (ii) may be either undoped or doped with other impurities. If doped with Boron, layer 12 is preferably formed by epitaxial growth. If layer 12 is either undoped or doped with other impurities, it is preferably formed by methods other than epitaxial growth on substrate 10 and a thin etch stop layer 11 is then preferably formed between the thin Si layer 12 and the silicon substrate or wafer 10. This configuration is called Silicon On Insulator (SOI) and the techniques for making an SOI structure are well known in the art and therefor are not described in detail herein. The etch stop layer 11, if used, is preferably a layer of SiO having a thickness of about 1 - 2 μm and can then be made, for example, by the implantation of oxygen into the silicon wafer 10 through the exposed surface so as to form the etch stop layer 11 buried below the exposed surface of the silicon wafer 10 and thus also define, at the same time, the thin layer of silicon 12 adjacent the exposed surface. This etch stop layer 11 is used to release the cantilevered beam from wafer 10 by the aforementioned two step plasma etch process. If layer 12 is doped with Boron, it is doped to reduce the resistivity of the epitaxial layer 12 to less than 1 Ω-cm. At that level of Boron doping the epitaxial layer 12 can resist a subsequent EDP etch used to release the cantilevered beam from wafer 10 and thus an etch stop layer is not needed. Preferably, the level of doping in layer 12 reduces the resistivity of layer 12 to less than 0.05 Ω-cm. The structures shown in the drawings has been described in many instances with reference to a capital letter Ε'. However, this shape is not particularly critical, but it is preferred since it provides good mechanical support for the cantilevered structure formed primarily by beam portion of layer 12. Of course, the shape of the supporting and mating structure around cantilever beam 12 can be changed as a matter of design choice and it need not form the perimeter of the capital letter 'E', but can form any convenient shape, including circular, triangular or other shapes as desired. This description includes references to Ti Pt/Au layers. Those skilled in the art will appreciate that this nomenclature refers to a situation where the Ti/Pt/Au layer comprises individual layers of Ti, Pt and Au. The Ti layer promotes adhesion, while the Pt layer acts as a barrier to the diffusion of Si from adjacent layers into the Au. Other adhesion layers such as Cr and/or other diffusion barrier layers such as a Pd could also be used or could alternatively be used. It is often desirable to keep Si from migrating into the Au, if the Au forms a contact, since if Si diffuses into an Au contact it will tend to form SiO„ on the exposed surface and, since SiO 2 is a dielectric, it has deleterious effects on the ability of the Au contact to perform its intended function. As such, a diffusion barrier layer such as Pt and/or Pd is preferably employed between an Au contact and adjacent Si material. However, an embodiment is discussed wherein the diffusion barrier purposefully omitted to form an Au/Si eutectic. The nomenclature Au/Si or Au-Si refers a mixture of Au and Si. The Au and Si can be deposited as separate layers with the understanding that the Si will tend to migrate at elevated temperature into the Au to form an eutectic. However, for ease of manufacturing, the Au/Si eutectic is preferably deposited as a mixture except in those embodiments where the migration of Si into Au is specifically relied upon to form Au/Si. Many different embodiments of a MEM device have been described. Many more embodiments can certainly be envisioned by those skilled in the art based the technology disclosed herein. But in all cases the base structure 4 is united with the cantilevered beam forming structure 2 by applying pressure and preferably also heat, preferably to cause an eutectic bond to occur between the then exposed layers of the two structures 2 and 4. The bonding may instead be done non-eutectically, but then higher temperatures must be used. Since it is usually desirable to reduce and/or eliminate high temperature fabrication processes, the bonding between the two structures 2 and 4 is preferably done eutectically and the eutectic bond preferably occurs between confronting layers of Si and Au/Si. In operation, the side electrodes are used to create a force on the cantilevered beam that then oscillates laterally across the substrate in response thereto. When the gyroscopic sensor is rotated about its axis (i.e. the axis of the cantilevered beam), a Coriolis force is produced normal to the plane of the substrate. This force is detected as an oscillating tunneling current by the control electrodes in a servo loop. The servo loop responds by oscillating the control electrode voltage for force rebalancing operation at the lateral resonant frequency of the cantilevered beam. The side drive electrodes are preferably fabricated with the cantilevered beam on the first substrate and are bonded to the second substrate at the same time that the cantilevered beam is attached. This provides for high alignment accuracy between the cantilevered beam and the side electrodes. Having described the invention with respect to certain preferred embodiments thereof, modification will now suggest itself to those skilled in the art. The invention is not to be limited to the foregoing description, except as required by the appended claims.

Claims: What is claimed is: 1. A method of making a MEM tunneling gyroscope comprising the steps of: defining a cantilevered beam structure on a first substrate or wafer; forming at least one contact structure on a second substrate or wafer; and bonding a layer associated with said mating structure on the first substrate or wafer with a layer associated with the mating structure on the second substrate or wafer. 2. The method of claim 1 wherein the first substrate or wafer comprises first portions of at least two side drive electrodes and a mating structure; the second substrate or wafer comprises; second portions of said at least two side drive electrodes and a mating structure, the mating structure on the second substrate or wafer being of a complementary shape to the mating structure on the first substrate or wafer and the second portions of the side drive electrodes being of a complementary shape to the first portions of the side drive electrodes on the first substrate or wafer, the method further comprising the steps of: positioning the mating structure of the first substrate or wafer into a confronting relationship with the mating structure of the second substrate or wafer; bonding layers associated with said first portions of at least two side drive electrodes on the first substrate or wafer with layers associated with said second portions of at least two side drive electrodes on the second substrate or wafer; and removing at least a portion of the first substrate or wafer to release the cantilevered beam structure. 3. A method of making a MEM tunneling gyroscope as claimed in claim 1 or 2 wherein the second substrate or wafer is formed of silicon, the silicon forming the second substrate or wafer being of a single crystalline structure. 4. A method of making a MEM tunneling gyroscope as claimed in claim 3 wherein the crystalline structure of the silicon is <100>. 5. A method of making a MEM tunneling gyroscope as claimed in claim 4 wherein the silicon is n-type. 6. A method of making a MEM tunneling gyroscope as claimed in claim 1 wherein the first substrate or wafer is formed of silicon. 7. A method of making a MEM tunneling gyroscope as claimed in claim 6 wherein the silicon forming the first substrate or wafer is of a single crystalline structure. 8. A method of making a MEM tunneling gyroscope as claimed in claim 7 wherein the crystalline structure of the silicon in the first substrate or wafer is <100>. 9. A method of making a MEM tunneling gyroscope as claimed in claim 8 wherein the silicon of the first substrate or wafer is n-type. 10. A method of making a MEM tunneling gyroscope as claimed in claim 1 wherein heat is applied together with pressure between the two substrates so as to cause an eutectic bond to occur between the two mating structures and between the first and second portions of the side drive electrodes. 11. A method of making a MEM tunneling gyroscope as claimed in claim 1 or 2 wherein the cantilevered beam structure is formed by: (a) forming an epitaxial layer of silicon on said first substrate or wafer, said epitaxial layer being doped; (b) masking and etching the epitaxial layer of silicon to define a beam structure disposed on said first substrate or wafer; and (c) removing the first substrate or wafer by etching. 12. A method of making a MEM tunneling gyroscope as claimed in claim 11 wherein a contact is formed on an end of said beam structure by depositing a metal through a small opening in a temporary mask layer, the small opening being sufficiently small that the metal being deposited tends to overhang the small opening increasingly as the deposition of the metal proceeds whereby the contact being deposited through the small opening assumes an elongate shape of decreasing cross section as the deposition proceeds. 13. A method of making a MEM tunneling gyroscope as claimed in claim 11 wherein the epitaxial layer is doped with boron at a sufficient concentration to reduce the resistivity of the epitaxial layer to less than 0.05 Ω-cm. 14. A method of making a MEM tunneling gyroscope as claimed in claim 13 wherein etching accomplished by ethylenediamine pyrocatechol as an etchant. 15. A method of making a MEM tunneling gyroscope as claimed in claim 13 wherein a layer of metal, preferably formed of individual layers of Ti, Pt and Au, is selectively deposited on said epitaxial layer and sintered at an elevated temperature to form first and second ohmic contacts on said epitaxial layer, said second ohmic contact being disposed near a distal end of the beam structure and the first ohmic contact forming the mating structure on the first substrate or wafer. 16. A method of making a MEM tunneling gyroscope as claimed in claim 15 wherein a relatively thick layer of metal is deposited and then sintered on a relatively thin metal layer, a first portion of the relatively thick layer of metal forming the mating structure on the first substrate or wafer and overlying said first ohmic contact and a second portion of the relatively thick layer of metal forming a pointed contact at said second ohmic contact. 17. A method of making a MEM tunneling gyroscope as claimed in claim 16 wherein the relatively thick layer of metal is Ti/Pt/Au. 18. A method of making a MEM tunneling gyroscope as claimed in claim 17 further including forming Ti/Pt/Au contacts on said second substrate or wafer, at least one of said contacts on the second substrate or wafer defining the mating structure on the second substrate or wafer. 19. A method of making a MEM tunneling gyroscope as claimed in claim 18 wherein the bonding occurs eutectically and the layer for producing an eutectic bond is provided by a layer of Au-Si eutectic deposited on the Ti/Pt/Au contact on said second substrate or wafer and/or by a layer of Au-Si eutectic deposited on first portion of the relatively thick layer of Ti/Pt/Au on the first substrate or wafer. 20. A method of making a MEM tunneling gyroscope as claimed in claim 1 wherein said first substrate includes an etch stop layer and wherein the cantilevered beam structure, the first portions of at least two side drive electrodes and the mating structure thereof are disposed adjacent said etch stop layer and wherein the cantilevered beam structure is released by first etching away the first substrate and then by etching away the etch stop layer. 21. A method of making a MEM tunneling gyroscope as claimed in claim 20 wherein the second substrate or wafer is formed of silicon. 22. A method of making a MEM tunneling gyroscope as claimed in claim 21 wherein the silicon forming the second substrate or wafer is of a single crystalline structure. 23. A method of making a MEM tunneling gyroscope as claimed in claim 22 wherein the crystalline structure of the silicon is <100>. 24. A method of making a MEM tunneling gyroscope as claimed in claim 23 wherein the silicon is n-type. 25. A method of making a MEM tunneling gyroscope as claimed in claim 20 wherein the first substrate or wafer is formed of silicon. 26. A method of making a MEM tunneling gyroscope as claimed in claim 25 wherein the silicon forming the first substrate or wafer is of a single crystalline structure. 27. A method of making a MEM tunneling gyroscope as claimed in claim 26 wherein the crystalline structure of the silicon in the first substrate or wafer is <100>. 28. A method of making a MEM tunneling gyroscope as claimed in claim 27 wherein the silicon of the first substrate or wafer is n-type. 29. A method of making a MEM tunneling gyroscope as claimed in claim 20 wherein heat is applied together with pressure between the two substrates so as to cause an eutectic bond to occur between the two mating structures and between the first and second portions of the side drive electrodes. 30. An assembly relating to a MEM gyroscope comprising: (a) a beam structure and a mating structure defined on a first substrate or wafer; (b) at least one contact structure and a mating structure defined on a second substrate or wafer; and (c) a bonding layer disposed on at least one of said mating structures for bonding the mating structure defined on the first substrate or wafer to the mating structure on the second substrate or wafer, the mating structures being joined one to another at said bonding layer. 31. The assembly of claim 30 wherein the assembly is for making a MEM tunneling gyroscope therefrom, the first substrate or wafer also comprising; first portions of side drive electrodes, the contact structure being sense electrodes, and second portions of the side drive electrode on the second substrate or wafer, the mating structure on the second substrate or wafer being of a complementary shape to the mating structure on the first substrate or wafer; and the second portions of the side drive electrodes being of a complementary shape to the first portions of side drive electrodes on the first substrate or wafer, wherein the bonding layer disposed on at least one of said mating structures is also on at least one of said first and second portions of the side drive electrodes for bonding the mating structure defined on the first substrate or wafer to the mating structure on the second substrate or wafer and for bonding said first and second portions of the side drive electrodes together. 32. An assembly for making a MEM tunneling gyroscope as claimed in claim 31 wherein said bonding layer is pressure/heat sensitive to bond said mating structure defined on the first substrate or wafer to said mating structure on the second substrate or wafer and to bond said first and second portions of the side drives together. 33. An assembly as claimed in claim 30 or 31 wherein the first and second substrates or wafers are formed of silicon. 34. An assembly as claimed in claim 33 wherein the silicon forming the first and second substrates or wafers is of a single crystalline structure. 35. An assembly as claimed in claim 34 wherein the crystalline structure of the silicon is <100>. 36. An assembly as claimed in claim 35 wherein the silicon is n-type. 37. An assembly as claimed in claim 31 wherein said first substrate includes a thin etch stop layer and wherein the beam structure, the first portions of side drive electrodes and the mating structure thereof are disposed adjacent said etch stop layer. 38. An assembly as claimed in claim 37 wherein the said beam structure is undoped and wherein a thin elongate ribbon conductor is disposed on said beam structure. 39. An assembly as claimed in claim 38 wherein said beam structure is doped to reduce its resistivity to less than 0.05 Ω-cm. 40. An assembly as claimed in claim 37 wherein the thin etch stop layer is SiO 2 and wherein a pointed contact is disposed on an end of said beam structure. 41. An assembly as claimed in claim 40 wherein the epitaxial layer is doped with Boron at a sufficient concentration to reduce the resistivity of the epitaxial layer to less than 0.05 Ω-cm. 42. An assembly as claimed in claim 41 further including first and second ohmic contacts on said epitaxial layer, said second ohmic contact being disposed near a distal end of the beam structure and said first ohmic contact forming the mating structure on the first substrate or wafer. 43. An assembly as claimed in claim 41 wherein a relatively thick layer of metal is disposed on the first and second ohmic metal contacts , a' first portion of the relatively thick layer of metal being disposed on said first ohmic metal contact and providing the mating structure on the first substrate and a second portion of the relatively thick layer of metal forming a pointed contact on said second ohmic metal contact. 44. An assembly as claimed in claim 43 further including metal contacts disposed on said second substrate or wafer, at least one of said contacts on the second substrate or wafer defining the mating structure on the second substrate or wafer. 45. An assembly as claimed in claim 44 wherein the bonding layer is provided by a layer of Au-Si eutectic disposed on the metal contact on said second substrate and/or by a layer of Au-Si eutectic disposed on the first portion of the relatively thick layer of metal on the first substrate or wafer. 46. An assembly as claimed in claim 41 further including first and second ohmic contacts on said epitaxial layer, said second ohmic contact being disposed near a distal end of the beam structure and said first ohmic contact forming the mating structure on the first substrate. 47. An assembly as claimed in any one of claims 42-46 wherein said first and second ohmic contacts are Ti/Pt/Au contacts. 48. The assembly of claim 30 wherein the assembly is a MEM tunneling gyroscope assembly, and the mating structure on the second substrate or wafer is of a complementary shape to the mating structure on the first substrate or wafer. 49. A MEM tunneling gyroscope assembly as claimed in claim 33 wherein the cantilevered beam structure is formed from an epitaxial layer of silicon on said first substrate or wafer, said epitaxial layer being doped with a dopant. 50. A MEM tunneling gyroscope assembly as claimed in claim 49 wherein the epitaxial layer is doped with Boron at a sufficient concentration to reduce the resistivity of the epitaxial layer to less than less than 0.05 Ω-cm. 51. A MEM tunneling gyroscope assembly as claimed in claims 49 or 50 further including first and second olimic contacts on said epitaxial layer, said second ohmic contact being disposed near a distal end of the beam structure and said first ohmic contact forming the mating structure on the first substrate or wafer. 52. A MEM tunneling gyroscope assembly as claimed in claim 51 wherein a relatively thick layer of metal is disposed on the first and second ohmic contacts, a first portion of the relatively thick layer of metal being disposed on said first ohmic contact and providing the mating structure on the first substrate or wafer and a second portion of the relatively thick layer of metal forming a pointed contact on said second ohmic contact. 53. A MEM tunneling gyroscope assembly as claimed in claim 52 further including metal contacts disposed on said second substrate or wafer, at least one of said contacts on the second substrate or wafer defining the mating structure on the second substrate or wafer. 54. A MEM tunneling gyroscope assembly as claimed in claim 53 wherein the bonding layer is provided by a layer of Au-Si eutectic disposed on the metal contact on said second substrate or wafer and or by a layer of Au-Si eutectic disposed on the first portion of the relatively thick layer of metal on the first substrate or wafer. 55. A MEM tunneling gyroscope assembly as claimed in claim 30 wherein the cantilevered beam structure is formed from said first substrate or wafer with a layer of SiO 2 being provided between said cantilevered beam structure other portions of said first substrate or wafer.

Inventors: CHANG DAVID T, KUBENA RANDALL L, CHANG, DAVID, T., KUBENA, RANDALL, L.
Applicants: CHANG DAVID T, HRL LAB LLC, KUBENA RANDALL L, CHANG, DAVID, T., HRL LABORATORIES, LLC, KUBENA, RANDALL, L.
Application year: 2001
Main classification: B81B
IPC codes: B81B3, B81C1, G01C19, G01P9, G01P15