COMPOSITION OF MATTER TAILORING: SYSTEM I

Abstract: A composition of matter includes a changed underlying electronic structure of a mass or matter containing a "p", "d" and/or "f" atomic orbital. The structural change is accompanied by changes in energy or mass or both.

Description: COMPOSITION OF MATTER TAILORING: SYSTEM I RELATED APPLICATION This application is a continuation of and claims priority to 09/416,720, filed October 13, 1999, the entire teachings of which are incorporated herein by reference. SUMMARY OF THE INVENTION All matter has structure. The structure of known matter emanates from the structure of the elements of the periodic table. It is the underlying structure of the elements and the new structures that arise as a consequence of their combination that define the electronic state and character of matter, mass, and energy. It is this state or structure - which can occur in many forms, at many levels - that creates the properties identified and associated with known elements and the matter that results from their combination and arrangement (e.g., the known elements, molecules, and matter). This invention describes a new composition of matter: one created by changing the underlying electronic structure of any mass or matter containing a 'p', 'd', and/or 'f atomic orbital (AO). The change (or changes) in electronic structure that creates the new composition of matter may occur anywhere within the defining matter. Changes that induce the formation of a new composition of matter are accompanied by change(s) in energy or mass or both, in any form or in any character. These changes can be controlled to be transient, fixed, or permanently adjustable; they may propagate into the subatomic core and then out to the bulk, or propagate directly from any stable moiety, particle, or energy level comprising the bulk (e.g., a subatomic particle or energy form, molecular force or molecular energy form) out to the bulk. The function/variable that links of all energy forms along all dimensions of energy is defined a "zurn". A change or shift in the electronic state characterizing known matter is referred to, and defined, as an "isozurn" of that matter. The isozurn's variable value reflects the character and manner in which energy forms are linked (along all dimensions of energy). For example, a shift/change in the electronic state of an element is referred to as an isozurn of that element ( lsozu Element). Similarly, since the configuration of matter can mix energy forms, a new electronic state of matter is referred to as an isozurn of the specified matter configuration ( IS0Zurn Matter). Note that the definition (and hence its application) of an isozurn is recursive reflecting the recursive construction of matter (e.g., .sozum-10 matter _ 1 0 ig bui j t fr()m ιso Z um-9 matter _ Q which ig j^ frQm '^-8^^. g which is built from 1S0zum - ' matter- 1). The present invention has many advantages. Modification of a species zurn function creates new compositions of matter. Proper and correct modification of a species zurn function induces controlled physical property change (e.g., conductivity, density, modulus, corrosion resistance, elasticity, etc.) in the new composition of matter. Examples of composition of matter tailoring for physical property enhancement include, but are not limited to, (1) mechanical property modification (e.g., density, toughness, hardness, modulus) for enhanced metal and/or material performance, (2) chemical property modification (e.g., catalytic performance, corrosion resistance) for enhanced chemical activity and/or resistance, (3) electronic property modification (e.g., conductance, inductance, phase angle) such as resistivity modification for enhanced conductance. A species zurn function exists along a continuum enabling physical properties associated with the new composition of matter to be adjustable along a continuum. The affect of the zurn is adjustable and tailorable along the time dimension. Consequently, property change can be tailored/controlled to be permanent (i.e., unalterable and invariant); adjustable (i.e., alterable and invariant at the rest value), or; (3) transient (i.e., alterable and variant) - note a transient change to property- 1 (or property set-1) can induce a permanent, adjustable, or transient change in property-2 (or property set-2). BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 A shows magnetic force microscopy image of natural copper. Figure IB shows magnetic force microscopy image of tailored copper. Figure 2A shows magnetic force microscopy image of tailored copper. Figure 2B shows scanning tunneling microscopy image of tailored copper. Figure 3 A shows X-ray emission spectrometry image of natural copper. Figure 3B shows X-ray emission spectrometry image of tailored copper. Figure 4 A shows X-ray emission spectrometry image of natural copper. Figure 4B shows X-ray emission spectrometry image of tailored copper. Figure 5 A shows X-ray emission spectrometry plot of tailored copper. Figure 5B shows a magnetic force microscopy image of tailored copper. Figure 6A shows a plot of an X-ray fluorescence spectrometry comparison of tailored copper and natural copper with spin. Figure 6B shows a plot of an X-ray fluorescence spectrometry comparison of tailored copper and natural copper with no spin. Figure 7 A shows a plot of an X-ray fluorescence spectrometry in relation to the direction of the scan. Figure 7B shows a sample geometry. Figure 8 shows a plot of a change in capacitance and voltage decay for a tailored element. Figure 9 shows a plot of a change in voltage gradients for a tailored element. Figure 10 shows a plot of voltage accumulation during an experiment. Figure 11 shows a plot of the observed voltage of a tailored copper-nickel alloy. Figure 12 shows a plot of the observed voltage of a tailored element. Figure 13 shows a plot of a positive voltage signature and positive capacitance decay of a tailored element. Figure 14 shows a plot of a voltage decay profile of a tailored element. Figure 15 shows a plot of a neutral decay in voltage and capacitance. Figure 16 shows a plot of a voltage over time indicating that atomic orientation can be changed. Figure 17 shows a plot of the voltage over time of a tailored element under pressure. Figures 18A, 18B, 18C, 19A, 19B, and 19C show scanning election microscopy images of tailored copper. Figures 20A, 20B, 21A and 21B show scanning election microscopy images of tailored nickel. Figures 22A, 22B, 22C, 22D, and 22E show images of atomic force microscopy and magnetic force microscopy of tailored copper from an axial analysis. Figure 22F shows X-ray emission spectrometry plot of tailored copper. Figures 23 A, 23B, 23C, 23D, and 23E show images of atomic force microscopy and magnetic force microscopy of tailored copper from a radical analysis. Figure 23F shows X-ray emission spectrometry plot of tailored copper. Figures 24 A, 24B, and 24C show images of induced magnetism of nonmagnetic copper. Figure 25 shows a plot of electrical susceptance for tailored compositions in comparison to the compositions in its natural state. The foregoing and other objects, features and advantages of the invention will be apparent from the following more particular description of preferred embodiments of the invention, as illustrated in the accompanying drawings in which like reference characters refer to the same parts throughout the different views. The drawings are not necessarily to scale, emphasis instead being placed upon illustrating the principles of the invention. Definitions of Acronyms AO - Atomic Orbital SEM - Scanning electron microscopy TEM - Tunneling Electron Microscopy STM - Scanning Tunneling Microscopy AFM - Atomic Force Microscopy LFM - Lateral Force Microscopy MFM - Magnetic Force Microscopy XES - X-ray Emission Spectrometry XRF - X-ray Fluorescence Spectrometry DETAILED DESCRIPTION OF THE INVENTION This invention identifies a new composition of matter for mass and/or matter comprised of 'p', 'd', and/or 'f atomic orbitals. This change in electronic structure comprises or manifests itself in a change in energy, mass, electronic properties, physical properties, and the like. The electronic change can be controlled to be transient, fixed, or adjustable (temporarily permanent) and typically manifests itself in a change in properties (e.g., mechanical, electrical, chemical, thermal, engineering, physical) and/or structural character (e.g., alignment, orientation, order, anisotropy, and the like). Changes in electronic structure can be direct or indirect. Electromagnetic chemistry is the science that affects the transfer and circulation of energy in many forms when induced by changes in electromagnetic energy. The theory of Electrodynamics of Moving Bodies (Einstein, 1905), mandates that when the electrodynamic components of the material are manipulated, changes in the energy levels within the atomic orbitals must be induced. These changes in the atomic orbitals are the vehicles by which changes in the (material) properties, both the magnitude and/or the orientation, can occur. Alignment of the electrodynamic component induces affects that may result in significant changes in the underlying material species: (1) alignment of atoms with the resulting directionality of physical properties; (2) alignment of energy levels and the capability to produce harmonics, may establish physical properties conducive for energy transfer; (3) alignment of the electrodynamic component include the opening of pathways for free electron flow, and; (4) alignment of electrodynamic field phase orientation. The conservation of energy requires that all mass — independent of magnitude and/or configuration ~ has an isozurn value, as must any energy form of different character and/or dimension. Adjustment/manipulation of the zurn invoking a change in the isozurn value different than its naturally occurring value, accounting for the contribution of its rest state value, modifies the electronic structure that defines the natural state. A change in the isozurn value to a value different than that which specifies the natural state denotes a change in the underlying electronic state of the specified species. A new composition of matter, created by altering and/or changing the zurn's natural function, can manifest itself as a transient, adjustable, or permanent change in energy, mass, and/or associated properties broadly defined. Property change be exhibited as or comprise a change in: (1) structural atomic character (e.g., XES/XRF peak creation, peak fluidity, peak intensity, peak centroid, peak profile as a function of material/sample orientation, atomic energy level(s), and TEM, STM, MFM scans); (2) electronic character (e.g., electron electromagnetic interactions, electromagnetic field position/orientation, energy gradients, Hall effect, voltage, capacitance, voltage decay rate, voltage gradient, voltage signature including slope of decay and/or change of slope decay, voltage magnitude, voltage orientation); (3) structural molecular/atomic character (e.g, SEM, TEM, STM, AFM, LFM, and MFM scans, optical microscopy images, and structural orientation, ordering, long range alignment/ordering, anisotropy); (4) physical constants (e.g., color, crystalline form, specific rotation, emissivity, melting point, boiling point, density, refractive index, solubility, hardness, surface tension, dielectric, magnetic susceptibility, coefficient of friction, x-ray wavelengths); (5) physical properties (e.g., mechanical, chemical, electrical, thermal, engineering, and the like); and, (6) any change that differentiates naturally occurring materials from tailored materials created by inducing a change in matter (i.e., a new composition of matter). A change in property value, that departs from the property value specifying its naturally occurring state, denotes a change in the isozurn value of that state. A change in the isozurn value is typically first noted at the subatomic, atomic, or molecular level. The complexity of energy interactions however often impedes single variable isolation. In these cases, a change in the electronic state of the specified species typically manifests itself as a change in a property value(s) from the naturally occurring state (e.g., the unaltered entropic driven ground state). Typical changes denoting a change in property value, that departs from the property value specifying its naturally occurring state, dictating a change in the isozurn value of that state are exhibited and described below. Changes are classified according to: (1) structural atomic character; (2) electronic character; (3) structural molecular/atomic character; (4) physical constants; (5) physical properties; and, (6) any change that differentiates naturally occurring materials from tailored materials created by inducing a change in matter (i.e., a new composition of matter) are described individually below. 1. Structural Atomic Character Figure 1A shows non-contact, magnetic force microscopy image of natural copper - the control standard -, and Figure IB shows a new composition of matter: tailored copper; as is evidenced in the altered and aligned electromagnetic network. Figure 2 A shows a non-contact, magnetic force microscopy (MFM), and Figure 2B shows a scanning tunneling microscopy (STM) scan. Individually- and from differing vantage points - these scans show with clarity the outline of the changed electromagnetic energy network. The MFM scan shows the radial trace while the STM scan shows the axial trace. XES analysis of the control standard compared to the atomically altered (i.e., tailored) state are shown in Figures 3A, 3B, 4A and 4B. Tailored copper in the axial direction exhibits similar composition to natural copper (i.e., 3 99.995% wt ), but radial scans exhibit new peaks in the region close to naturally occurring S, Cl, and K. The absence of detectable levels of these constituents in the axial direction excludes natural contamination. The shifting centroid of the observed peaks from the natural species (i.e., S, Cl, K) confirm electronic change in the atomic state of the base element; as does the non-contact MFM void scan (Figures 5 A and 5B). Conventional chemical analysis performed using a LECO (IR) analyzer confirmed the absence of sulfur at XES lower detection limits. LECO analysis confirmed sulfur concentration at 7.8 ppm; collaborating this analysis was the manufacture's batch product analysis at 7.0 ppm S. Figure 5 A compares the XES radial scan of tailored copper to that of a void space within the same material. The dramatic change in signal count/intensity - a consequence of an underlying change in atomic character — is confirmed independently by non-contact MFM of the void space (Figure 5B). MFM evidence highlights the structure and its changed orientation and alignment compared to the a control MFM (Figure 1 A). High precision XRF imaging of the tailored copper's K α line in the vicinity of natural sulfur's K α line highlights that the electronic structure change has shifted the two theta degree position compared to natural copper (Figures 6 A and 6B). Figure 7A shows an increase in signal intensity dependent upon which side the scan was taken and a shifting K α centroid. These data predict the anisotropicity latter identified in the tailored sample as does the MFM scans (Figures 1 A, IB, 5A and 5B). 2. Electronic Character Manipulation of the electrodynamic components affecting the tailored orientation of a mass's electromagnetic field can enable the observance of a Hall voltage (N H ). Proper manipulation of the electrodynamic components enables intensification of electromagnetic field affording charge concentration on the surface of the atoms within the bulk as opposed to the bulk surface of the bath. Observations reflecting field repositioning may include changing capacitance and voltage decay rate (Figure 8) or voltage gradients (Figure 9) within a conducting bulk media. Under different conditions, using a different metal system, a voltage of approximately 1 Ndc was accumulated over about one hour. Figure 10 shows that voltage accumulation was continuously and steadily accumulated during the experiment; voltage accumulation correlated with chemical addition. Figure 11 shows the V H observed in a copper-nickel alloy. Voltage decay exhibited two distinct decay rates, indicative of two controlling mechanisms. A positive voltage signature with a positive capacitance decay (i.e., capacitance accumulation) is shown in Figure 12. Control and manipulation of the charge signature (e.g., V H profile, capacitance slope, voltage slope) provides direct evidence of the alteration, manipulation, and tailoring of the underlying electronic state. Figure 13 shows a positive voltage signature and a positive capacitance decay. Additionally, the voltage decay profile has changed: one profile has a negative slope while the other has a neutral slope. Further change in the electronic structure enables the slope of the second voltage decay profile to become positive (Figure 14); note also the change in slope of capacitance decay. The metal system shown in Figure 15 has an electronic structure change that enable a nearly neutral decay in voltage and capacitance. Measurements were repeated four times. Figure 16 shows that the voltage can actually go negative, indicating that the orientation can also be manipulated. Figure 17 shows the phenomena can be observed under pressure. Table 1 is an XRF Uniquant analysis that shows a multiplicity of energetically contiguous X-ray atomic energy levels. One energetically contiguous series is represented by Sm, Eu, Gd, Tb; the other is represented by P, S, So (i.e., sulfur as an oxide), Cl, and Ar. Table 2 is an XRF Uniquant analysis that shows an energetically contiguous series as Al, Si, P, S, So (i.e., sulfur as an oxide), Cl, Ar, K, and Ca. 3. Structural Molecular/ Atomic Character New compositions of matter can be electronically tailored to induce long range ordering/alignment. In one new composition of matter, long range ordering was induced in oxygen- free high conductivity (OFHC) copper. SEM imaging of the material verifies the degree and extent of long range ordering achieved (Figures 18A, 18B, 18C, 19A, 19B, and 19C). Under similar electronic conditions, long range ordering was induced in high purity (> 99.99 °/ 0wt ) nickel. Figures 20A, 20B, 21A, and 21B show the SEM imaging of the tailored nickel material. A comparison of the extent of alignment achieved between pre and post routine highlight an altered electronic state (reflecting a changed isozurn value) between pr Ni and post Ni. Extensive atomic force microscopy and MFM imaging of electronically altered OFHC copper shows views of structural configurations from a different perspective (Figures 22A, 22B, 22C, 22D, 22E, 22F, 23A, 23B, 23C, 23D, 23E and 23F). MFM imaging shows clear pattern repetition and intensity of the tailored sample when compared to the natural copper (i.e., isozurn (natural) ≠ isozurn (tailored)). The tailored copper: a new composition of matter derived from natural copper; exhibited anistropic behavior. 4. Physical Constants In one sequence of new compositions of matter, color changes in OFHC copper were induced. The variation in color over four (4) new matter compositions ranged from black (two intensities) to copper (2 intensities) to gold (one intensity) to silver (one intensity). The alteration of copper's zurn function along the continuum enables the new composition of matter's color to be adjusted along the continuum. In another sequence of new compositions of matter, hardness changes in OFHC copper were induced. The variation in diamond pyramid hardness between different tailored copper samples ranged from about 25 to 90 (or 3 to 9 times higher than natural copper). Hardness change was anisotropic. In another new composition of matter, magnetism was induced in a high purity, non-magnetic metal in its elemental form (Figures 24 A, 24B, and 24C). 5. Physical Properties In one sequence of new compositions of matter, ductility changes were induced in a high purity, ductile metal in its elemental form. The variation in the engineering physical property of ductility ranged from brittle to semi-ductile to ductile to extremely ductile over four (4) new matter compositions. In one new composition of matter, the electrical reactance was increased approximately 3% above that of natural copper over the frequency range of 0 Hz to 100 kHz. In another new composition of matter, electrical susceptance was increased approximately 20% above an alloy of the same chemical composition (i.e., the alloy in its natural state). In another new composition of matter, electrical susceptance was decreased approximately 25% below an alloy of the same chemical composition (i.e., the alloy in its natural state). Electrical susceptance for these new matter compositions compared to the control standard (the material in its natural state) is shown in Figure 25. 6. Additional Differentiations In one sequence of new compositions of matter - all which used the same raw materials, consumables, utilities, and materials of construction - the sum of all known (element) concentrations identified by XRF analysis varied considerably. Variations in XRF Uniquant closure over three (3) new matter compositions were 99.5 °/ 0wt (Table 3), 96.0 % wt (Table 2), and 90.6 °/ 0wt (Table 1). The closure gap between the known elemental structures and the identified elemental structures differentiates naturally occurring materials from materials with tailored electronic structures (i.e., a new composition of matter). These data are representative of the types of change new compositions of matter exhibit when the zurn function of a natural material or natural matter is altered. The data and characterization of potential change: (1) structural atomic character; (2) electronic character; (3) structural molecular/atomic character; (4) physical constants; (5) physical properties; and, (6) any differentiating change between natural moiety and tailored moiety (i.e., a new composition of matter); is not intended to be complete nor exhaustive. It is meant only to suggest the types of changes that can occur in new matter compositions created by altering the zurn function from its behavior that is associated with the naturally occurring state. EXPERIMENTAL PROCEDURE Definitions + «% wt represents the weight percent above the equilibrium saturation value of the material in its natural state. For example, + l% wt represents l% wt above the saturation value as defined in its natural state. M eqsat represents the equilibrium saturation of V in its natural state. For example, [C] eqsat represents the equilibrium saturation of carbon for the thermodynamic state specified (e.g., T, P, composition) when the composition is in its natural state. Step 1: Any element, material, or composition containing a 'p', 'd', and/or 'f atomic orbital that is capable at least in part to dissolve, absorb, or react with a geometric form agent capable of altering the zurn's function. Step 2: 1. Establish dissolved carbon level at 70%) to 95% of [C] eqsat . 2. Identify temperature set points for 80% and 95% [C] eqsat 3. Sweep the variant energy input between the predetermined set points Sweep Conditions. 7 minutes up. 7 minutes down. Sweep Count. 15 complete cycles (no upper bound). Step 3: 1. Establish flow of argon for dissolved carbon level at 70% to 95% of 2. Identify flow of third body for dissolved carbon level at 70% to 95%> °f [C]eqsat. 3. Sweep the variant energy input between the predetermined set points. Temperature should be maintained above 70% [C] eqsat at all times. Temperature should be maintained below 95%> [C] eqsal at all times . Sweep Conditions. 7 minutes up. 7 minutes down. Sweep Count. 5 complete cycles. Step 4: 1. Raise carbon level to saturation (i.e., [C] e sat ) with continued argon addition. 2. Hold for 60 minutes at saturation (i.e., [C] eqsat ) with continued argon addition. 3. Raise the carbon level to + l%o wt of [C] eqsat with continued argon addition and hold for 5 minutes. 4. Sweep the variant energy input between + 1 % wt and + 3% wt of [C] eqsat . Sweep Conditions. 9 minutes up. 9 minutes down. Sweep Count. 20 complete cycles (i.e., end at "l% wt ). 5. Cease argon addition. 6. Cool to + 4% 0wt . 7. Sweep the variant energy input between + 4%> wt and "7%^ of [C] eqsat . Sweep Conditions. 3 minutes up. 5 minutes down. Sweep Count. 4.5 complete cycles (i.e., end at + 7% wt ). Required Actions. Add argon on the up sweep. Add nitrogen on the down sweep. 8. Sweep the variant energy input between + 8%> wt and + 18% wt of [C] eqsat ; cool to obtain + 8%> wt (with continued gas addition). Sweep Conditions. 15 minutes up. 15 minutes down. Sweep Count. 15.5 complete cycles (i.e., end at + 18%> wt ). Required Actions. Add argon on the up sweep. Add nitrogen on the down sweep. 9. Cease all gas addition. Step 5: 1. Perform one complete sweep of the variant energy input between + 14% wt to + 18% wt of [C] eqsat (ending at τ 18% J and then proceed immediately to a cool down that leads to solidification. 2. Cool down. 3. Solidify. While this invention has been particularly shown and described with references to preferred embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the scope of the invention encompassed by the appended claims. Table 1 ANALYSIS REPORT by ϋniquant Spectrometers conf: Lguration: ARL 8410 Rh 60kV LiF220 LiF420 Gelll TIAP Sample ident = Tailored - 3 Further info = Kappa list = 15-Nov-94 Channel list = 23-Sep- 99 Calculated as : E;lements Spectral impurity data : CAL.209Teflon X-ray path = Vacuum Film type No supporting film Case number = 0 Known Area, %Rest, Diluent/Sample and Mass /Area Eff.Diam. = 25 .00 mm Eff.Area 490.6 mm2 Kno nConc = 0 % Rest 0 % Dil/Sample 0 Viewed Mass = : L8000.00 mg Sample Height = 5 mm < means that the concentration is < 10 ppm <2e means wt% < 2 StdErr. The + in Z+El means involved in Sum=100% Z wt% 3tdΞrr z wt% StdErr Z wt% StdErr SuffiBe .. F 0 0.037 29+Cu 99.58 0.03 51 Sb < 11 Na < 30+Zn <2e 0.006 52 Te < 12 Mg < 31+Ga 0.012 0.003 53 I < 13+A1 0.027 0.012 32 Ge <2e 0.003 55 Cs < 14 Si < 33 As < 56 Ba < 15+P 0.003 0.001 34 Se < SumLa. .Lu 0.15 0.07 16+S 0.038 0.003 35 Br < 72+Hf <2e 0.022 16+So 0.022 0.003 37 Rb < 73+Ta <2e 0.071 17+C1 0.037 0.003 38 Sr < 74 W < 18+Ar 0.017 0.002 39 Y < 75 Re < 19+K <2e 0.0008 40 Zr < 76 Os < 20+Ca 0.0050 0.0008 41 Nb < 77+Ir 0.029 0.008 21 Sc < 42 Mo < 78+Pt 0.017 0.007 22+Ti 0.015 0.001 44 Ru < 79 Au <2e 0.007 23 V < 45 Rh < 80 Hg < 24 Cr < 46 Pd < 81 Tl < 25+Mn 0.006! 9 0.0007 47 Ag < 82 Pb < 26+Fe 0.015 0.001 48+Cd 0.004 0.002 83 Bi < 27 Co < 49 In < 90 Th <2e 0.003 28 Ni < 50 Sn < 92 U < ===== Light Elements ===== ===== Noble Elemen'ts ===== ===== Lanthanides 4 Be 44 Ru < 57+La 0.073 0.006 5 B 45 Rh < 58 Ce < 6 C 46 Pd < 59 Pr < 7 N 47 Ag < 60 Nd < 8 O 75 Re < 62+Sm 0.022 0.003 9 F < 76 Os < 63+Eu 0.015 0.002 77+Ir 0.029 0.008 6 +Gd 0.009 0.002 78+Pt 0.017 0.007 65+Tb 0.015 0.002 79 Au <2e 0.007 66 Dy < 67+Ho <2e 0.013 68 Ξr <2e 0.004 69 Tm < 70 Yb <2e 0.005 71+Lu <2e 0.013 Kno nConc= 0 REST ; = 0 D/S= 0 Sum Cone's before normalisation to 100% : I 90.6 % Table 2 ANALYSIS REPORT by Oniquant Spectrometers configuration: ARL 8410 Rh 60kV LiF220 LiF420 Gelll TIAP Sample ident = Tailored Further info Kappa list 15-Nov-94 Channel list = 23-Sep-99 Calculated as Elements Spectral impurity data : CAL.209Teflon X-ray path Vacuum Film type = No supporting film Case number 0 Known Area, %Rest, Diluent/Sample and Mass/Area Eff .Diam. 25.00 mm Eff.Area = 490.6 mm2 KnownConc 0 Rest 0 Dil/Sample 0 Viewed Mass = 18000.00 mg Sample Height = 5 mm < means that the concentration is < 10 ppm <2e means wt% < 2 StdErr. The + in Z+El means involved in Sum=100% z wt% StdErr Z wt% StdErr Z wt% StdErr SumBe.. F 0 0.036 29+Cu 98.62 0.06 51 Sb < 11+Na 0.11 0.02 30+Zn <2e 0.006 52 Te < 12 Mg < 31+Ga 0.007 0.003 53 I < 13+A1 0.44 0.03 32 Ge <2e 0.003 55 Cs < 14+Si 0.107 0.008 33 As < 56 Ba < 15+P 0.004 0.001 34 Se < SumLa. .Lu 0.087 0.072 16+S 0.19 0.01 35 3r < 72+Hf < 16+So 0.12 0.01 37 Rb < 73+Ta <2e 0.071 17+C1 0.17 0.01 38 Sr < 74 W < 18+Ar 0.027 0.002 39 Y < 75 Re < 19+K 0.0065 0.0010 40 Zr < 76 Os < 20+Ca 0.013 0.001 41 Nb < 77 Ir < 21 Sc < 42 Mo < 78+Pt 0.022 0.008 22+Ti 0.015 0.001 44 Ru < 79 Au <2e 0.007 23 V < 45 Rh < 80 Hg < 24 Cr < 46 Pd < 81 Tl < 25 Mr. <2e 0.0006 47 Ag < 82 Pb < 26+Fe 0.044 0.004 48 Cd <2e 0.002 83 Bi < 27 Co < 49 In < 90 Th < 28 Ni < 50 Sn < 92 U < ==== Light Elements ===== === == Noblei Elements ===== ===== Lanthanides 4 Be 44 Ru < 57+La 0.059 0.005 5 B 45 Rh < 58 Ce <2e 0.003 , 6 C 46 Pd < 59 Pr <2e 0.003 7 N 47 Ag < 60 Nd <2e 0.002 8 0 75 Re < 62 Sm <2e 0.003 9 F < 76 Os < 63 Eu < 77 Ir < 64 Gd < 78+Pt 0.022 0.008 65+Tb 0.005 0.002 79 Au <2e 0.007 66 Dy <2e 0.008 67+Ho <2e 0.015 68 Er <2e 0.004 69 Tm < 70 Yb < 71+Lu < KnownConc= 0 REST= 0 D/S= 0 Sum Cone's before normalissation to 100% : 96.0 % Table 3 ANALYSIS 1 REPORT by UniQuant Spectrometers configuration: ARL 8410 Rh 60kV LiF22C ) Li F420i Gelll TIAP Sample ident = Tailored - 1 Further info = Kappa list = 15-Nov-94 Channel . list = 20-Jul- •94 Calculated as : Elements Spectra .1 impurity data : CAL.209T! =flon X-ray path = Vacuum Film type = No suppcirting film Case number 0 Known Area, %Resit, Diluent/Sampl .e and Mass /Area Eff.Diam. 25.00 mm Eff .Area = 490.6 mm2 KnownConc = 0 % Rest 0 % Dil/Ξample 0 Viewed Mass = 18000.00 mg Sample Height = 5 mm < means that thi 3 concentration is < 10 i ppm <2e means that Cone < 2 x StdErr Z wt% StdErr Z t% StdErr Z wt% StdErr SumBe..F 0 0.036 29 Cu 99.84 0.03 51 Sb < 11 Na < 30 Zn < 52 Te < 12 Mg < 31 Ga 0.007 0.003 53 I < 13 Al < 32 Ge <2e 0.002 55 Cs < 14 Si < 33 As < 56 Ba < 15 P < 34 Se < SumLa. .Lu 0.053 0.071 16 S 0.0089 0.0008 35 Br < 72 Hf <2e 0.022 16 So < 37 Rb < 73 Ta < 17 Cl o.oi ' ; ' 0.001 38 Sr < 74 W < 18 Ar < 39 V < 75 Re < 19 K <2e 0.0007 40 Zr < 76 Os < 20 Ca 0.0024 0.0009 41 Nb < 77 Ir 0.040 0.008 21 Sc <2e 0.001 42 Mo 0.005 0.002 78 P < 22 i o.oo; 1 0.001 44 Ru < 79 Au <2e 0.006 23 V < 5 Rh < 80 Hg <2e 0.006 24 Cr < 46 Pd < 81 Tl < 25 Mn < 47 Ag < 82 Pb < 26 Fe < 48 Cd < 83 Bi < 27 Co < 49 In < 90 Th 0.009 0.003 28 Ni < 50 Sn < 92 ϋ < ==== Light Ξlemεmts ===== ™ Noble Element hanides 4 Be 44 Ru < 57 La 0.030 0.006 5 3 45 Rh < 58 Ce < 6 C 46 Pd < 59 Pr < 7 N 47 Ag < 60 Nd < 8 O 75 Re < 62 Sm < 9 F < 76 Os < 63 Eu <2e 0.002 77 Ir 0.040 0.008 64 Gd <2e 0.002 78 Pt < 65 Tb <2e 0.002 79 Au <2e 0.006 66 Dy < 67 Ho <2e 0.015 68 Er 0.014 0.004 69 Tm <2e 0.004 70 Yb < 71 Lu <2e 0.014 KnownConc= 0 REST= 0 D/S= 0 Sum Cone's before normalisation to 100% 99.5 %

Claims: CLAIMS What is claimed is: 1. A composition of matter that is distinguishable from its naturally occurring state. 2. A composition of Claim 1 wherein its structural atomic character is distinguishable from its naturally occurring state. 3. A composition of Claim 1 wherein its electronic character is distinguishable from its naturally occurring state. 4. A composition of Claim 1 wherein its structural molecular character is distinguishable from its naturally occurring state. 5. A composition of Claim 1 wherein at least one physical constant is distinguishable from the same physical constant in its naturally occurring state. 6. A composition of Claim 1 wherein the X-ray emission spectrum is distinguishable from its naturally occurring state spectrum. 7. A composition of Claim 1 wherein the X-ray spectrum includes peaks that are not present in a naturally occurring material of the same composition and purity. 8. A composition of Claim 1 wherein the centroid of at least one peak in the X-ray spectrum shifts from the value associated with its naturally occurring state. 9. A composition of Claim 1 wherein the composition of matter exhibits long range order. 10. A composition of Claim 1 wherein a distinguishing feature of the composition of matter is a change in anisotropy. 11. A composition of matter wherein at least one physical property is distinguishable from the same physical property in its naturally occurring state. 12. A composition of Claim 11 wherein at least one characterizing physical property is adjustable in value. 13. A composition of Claim 11 wherein at least one characterizing engineering physical property is adjustable along a continuum of values. 14. A composition of Claim 11 wherein at least one physical property is anisotropic. 15. A composition of Claim 11 wherein the composition of matter contains a metal. 16. A composition of Claim 11 wherein the composition of matter is a metal. 17. A composition of Claim 11 wherein the composition of matter includes an alloy. 18. A composition of Claim 11 wherein the composition of matter includes a transition metal. 19. A composition of Claim 11 wherein the composition of matter includes a conducting material. 20. A composition of Claim 11 wherein a distinguishing feature of the composition of matter includes a change in current density (amps/cm 2 ). 21. A composition of Claim 11 wherein a distinguishing feature of the composition of matter includes anisotropic resistivity. 22. A composition of Claim 11 wherein a distinguishing feature of the composition of matter includes a change in resistivity. 23. A composition of Claim 11 wherein a distinguishing feature of the composition of matter includes a change in inductance. 24. A composition of Claim 11 wherein a distinguishing feature of the composition of matter includes a change in reactance. 25. A composition of matter that is capable of supporting an electrical charge that is distinguishable from its naturally occurring state. 26. A composition of Claim 25 wherein the composition of matter is capable of supporting a transient electrical charge that occupies at least one unoccupied atomic orbital. 27. A composition of Claim 25 wherein the composition of matter is capable of supporting a transient electrical charge that occupies at least one lowest unoccupied atomic orbital position. 28. A composition of Claim 25 wherein the composition of matter when in a liquid state is capable of supporting an electrical charge in its interior. 29. A composition of Claim 25 wherein the composition of matter when in a liquid state is capable of supporting an electrical charge at and between the atomic interface(s). 30. A composition of matter where the X-ray fluorescence spectrum is distinguishable from its naturally occurring state spectrum. 31. A composition of matter comprising a 'p', 'd', and/or 'f atomic orbital wherein the composition of matter is distinguishable from its naturally occurring state. 32. A composition of Claim 31 wherein the altered electronic state results in at least one energetically contiguous X-ray atomic energy level compared to the element in its natural state. 33. A composition of Claim 31 wherein the altered electronic state results in a multiplicity of energetically contiguous X-ray atomic energy levels compared to the element in its natural state. 34. A composition of Claim 31 wherein the composition includes novel atomic states as compared to the element in its natural state. 35. A composition of Claim 31 comprised of novel electromagnetic states as compared to the element in its natural state.

Inventors: NAGEL CHRISTOPHER J, NAGEL, CHRISTOPHER, J.
Applicants: ATOMIC ORDERED MATERIALS L L C, NAGEL CHRISTOPHER J, ATOMIC ORDERED MATERIALS, L.L.C., NAGEL, CHRISTOPHER, J.
Application year: 2000
Main classification: B01J19
IPC codes: B01J19