AN IMAGING MMETHOD AND APPARATUS FOR THE NON-DESTRUCTIE ANALYSIS OF PAINTINGS AND MONUMENTS

Abstract: This invention refers to an imaging method and apparatus capable of performing non-destructive, in situ analysis of art-objects. The invention relays on the comparison of diffuse reflectance and/or fluorescence spectra (intensity vs. wavelength), of painting material models of known composition, with the intensities emitted and captured at the same wavelengths and for any spatial point of the art-object of unknown composition. This composition, performed for any spatial point of the area of interest, improves notably the diagnostic information and enables the analysis of heterogeneous art-objects.

Description: An Imaging Method and apparatus for the non-destructive analysis of paintings and monuments Background Technical analysis of paintings targets the detection of retouching, pentimenti, underdrawings and the identification of original and added material (e.g. pigments, binding media, coatings, retouching). This information is essential for dating and authentication of the artwork and contributes significantly to our understanding of art objects. In addition, it facilitates the evaluation of the physical condition (deterioration, interventions) and directs conservation decisions. Traditionally, the analysis of paintings has been restricted to invasive investigations and is carried out ex situ. This approach has the drawback of being harmful to the painting — as it requires samples to be taken — and provides only spot specific information that is not necessarily representative of the object in its context. Consequently the development of non-invasive techniques that can be used in situ and provide global information will enjoy a great impact. Over the last two decades there have been substantial advances made in the application of modern scientific techniques to the chemical and structural analysis of works of art. However there is still room for improvement as the analysis of artworks is generally a very complex and demanding problem. A very important issue in this respect is the development and use of non-destructive analytical techniques, which can be applied in situ. In response to the demand for non-destructive analytical devices in the art conservation field, a variety of imaging and spectroscopic techniques have been developed and used for the in situ examination of artwork materials. Film photography has been extensively used to capture artwork images in the visible, near ultraviolet (NUV) and near infrared (NIR) part of the spectrum. A variety of different imaging devices have also been used, ranging from film to analog (video) and digital cameras. Moreover, different cameras with spectral sensitivities restricted either to the visible or to the near infrared (NIR) part of the spectrum have been used in order to obtain diagnostic information for the artwork under analysis. In particular, imaging in the near infrared enables the visualization of underdrawings, relaying on the phenomenon that in general the overlaying pigments become transparent in this wavelength range. Broadband fluorescence photography provides information for the condition of coatings (such as varnishes) and enables the localization of previous restoration interventions. A variety of light dispersion spectroscopic techniques have also been used in situ and ex situ for the identification of painting materials. Materials with the same color appearance, determined by the similar diffuse reflectance spectra in the visible, may have different spectral pattern outside the visible part of the spectrum. Compositional alterations associated with the material deterioration can be recorded by measuring absorption, fluorescence, or (elastic, non-elastic) scattering signals, providing quantitative diagnostic information. Fluorescence and diffuse reflectance spectra are in general broad in the visible and the NIR part of the spectrum due to the complicated nature of the artwork material and due to light-material interaction mechanisms that are involved in these phenomena. Owing to this fact, these spectroscopic techniques are suitable for detecting in situ chemical and structural alterations and for the differentiation of pigments with the same color appearance but different chemical composition. Raman and FTIR spectroscopy provide improved, molecular-specific diagnostic information, since the acquired spectra contain fingerprint information for a specific point area of the artwork material under analysis. Until now the use of these techniques have been restricted to the experimental-ex situ analysis of material samples, mainly due to the required complicated instrumentation. Laser Induced Breakdown Spectroscopy (LIBS) is a novel promising technique for in situ analysis, it requires however laser ablation of a spot area and the subsequent spectroscopic analysis of the created plume. For this reason this technique is considered as minimally invasive and in several cases (e.g. fragile and thin material) it is not applicable. Apart from the above mentioned, the common problem that restricts seriously the applicability of conventional spectroscopic methods to the in situ analysis of artwork is that they provide point information, which is inadequate in cases where complicated materials, characterized by a high spatial variability of their contextual features are examined. Moreover the point area under analysis has to be determined by the user, which in several cases is not capable of detecting and focussing his attention in artwork areas that are subjected to alterations. This results in a reduction of the accuracy of these methods due to probing errors. Summarizing the above mentioned, conventional spectrometers provide a large amount of spectroscopic (analytical) information about one localized site of the object, whereas conventional broadband imaging provides a modest amount of spectral information (resolution), but for a significant area of the object. In the field of art conservation, there are applications reported where cameras sensitive in the visible and in the NIR are filtered with optical filters, thus enabling the selection of the imaging center wavelength with the aid of a filter tuning mechanism. In the visible part of the spectrum these cameras are used for accurate color reproduction, while in the NIR part of the spectrum filter tuning enables the determination of the appropriate imaging band, at which the maximum imaging information for the underlying features is obtained. Based on the above mentioned it reasonable to suggest that the combination of the advantages of both imaging and spectroscopy will constitute a significant step forward in non destructive analysis and documentation of art-objects and monuments. Although Raman, FTIR and LIBS spectroscopies provide improved analytical information it is very difficult, or in the LIBS case impossible, to operate in imaging mode. In contrast, there is not any fundamental or technological restriction for the development of imaging systems capable of capturing diffuse reflectance and/or fluorescence spectroscopic information for the entire surface under examination. Of course, as mentioned above, these techniques suffer from the main drawback that the captured spectra contain pure information for painting material identification. This invention refers to an imaging method and apparatus capable of performing non-destructive, in situ analysis of art-objects. The method relays on the comparison of diffuse reflectance and/or fluorescence spectra (intensity vs. wavelength), of painting material models of known composition, with the intensities emitted and captured at the same wavelengths and for any spatial point of the art-object of unknown composition. This comparison, performed for any spatial point of the area of interest, improves notably the diagnostic information and enables the analysis of heterogeneous art-objects. DESCRIPTION OF THE INVENTION The present invention refers to an imaging method and apparatus for the non-destructive technical analysis of artistic and/or historic value (paintings, monuments etc) of unknown structure and composition hereunder described with the term "object". Key points are: Determination of the diffuse reflectance and/or of the fluorescence spectral differences of all the possible groups of object material samples that demonstrate the same or of similar color characteristics but of different chemical composition. Spectra are captured and analyzed in a wide spectral range and for a variety of light excitation and response capturing wavelengths. Determination of the optimum excitation-capturing spectral band combinations for the differentiation between groups of object material samples with the same or similar color characteristics. Imaging of the area of interest of the original object under analysis at the predetermined optimum combinations of excitation - image capturing wavelength band(s), for the specific material group under consideration. From these data, the spectral distribution of the light intensities, expressed by the object, can be calculated as a function of spatial location, which subsequently can be compared with the captured spectra of the object material models. Although the original materials under analysis are typically complicated and heterogeneous, this comparison can provide valuable information for the in situ, nondestructive identification and mapping of original materials of unknown structural and compositional characteristics. This is supported by the fact that in each historical period, the artists used a few different painting materials i.e. 5 reds or 10 greens of different chemical composition, which can in general differentiated and identified by comparing reflectance and fluorescence spectral data. Fig. 1 illustrates graphically the basic concept of the method. The light source (LS) emits photons with energies ranging from ultraviolet to infrared. The light source (LS) is used to illuminate either the original object of artistic and/or historic value (paintings, monuments etc) of unknown structure and composition (UO) or object material models (replicas) of known structure and composition (OMM). Narrow band illumination (NBI) of both original object and object material models can be obtained with the aid of a variety of methods including lasers, single or arrays of light emission diodes (LEDs). It can also be obtained by filtering a broad band light source (LS) with a single of with a plurality of optical filters that transmit different spectral bands (F). In case of multiple filters, the illumination wavelength band can be tuned with the aid of a filter interchanging mechanism. A variety of object material models (OMM) can be constructed following the techniques used from the artists in each historical period. These models include pure painting materials as well as combinations of pigments, binding media, coatings etc. Object material models (OMM) are excited with a broad band or a narrow band light source and their response to the incident light is recorded in a wide spectral range from ultraviolet to near infrared. Measurements are performed after appropriate calibration against standard samples. The measured data can be classified according several criteria such us material coloring, historic period, artist's style, etc. For each particular group of (OMM) with the same color appearance but with different chemical composition, optimum material illumination and response wavelength band(s) are determined at which the maximum spectral differentiation is obtained. In order to improve the optical information for the differentiation, ratios of intensities captured at different wavelengths are also considered and compared. The original object of unknown composition (UO) can also be optically excited with any of the above mentioned illumination modes, broad band (BBI) or narrow band (NBI) and the object's response to this excitation is recorded with the aid of a two-dimensional optical detector. Single broad and narrow band image of a plurality of narrow band images can be captured at different wavelength bands simultaneously or in a time succession and for a wide spectral band ranging from ultraviolet to the mid- infrared. During the examination of an original object of unknown compositional and structural characteristics, the area of interest is optically excited and its response (diffuse reflectance and/or fluorescence) is captured at spectral bands at which maximum diagnostic information is obtained for the identification of the materials used to develop this area. The selection of optimum imaging bands, conditions and modes (diffuse reflectance, fluorescence) is based on the spectral information captured from object material models with the same color characteristics with the area under analysis. The intensities of image points with the same spatial registration P(x,y) versus the image capturing wavelengths Iλi, lλ 2 , Iλ 3 ... Iλ v form the spectral image intensity distribution (SIID) for the point P(x,y). The (SIID) can be calculated for any spatial point or group of points. This distribution could be a full spectrum depending on the spectral resolution of the image capturing and acquisition apparatus employed. Comparison of (SIID) with the spectra that correspond to the object material models (SAMM) with similar macroscopic and other characteristics, including color historical data, construction techniques etc. enable the identification of the unknown material at any spatial location of the examined area. 5 Figure 2 illustrates a block diagram of the imaging apparatus for the non-destructive analysis of paintings and monuments. The art object (AO) is illuminated by a light source (LS) which emits photons with wavelengths ranging from ultraviolet through infrared. When narrow band illumination is required, the emitted light passes through light 10 source spectral filtering element(s) (LSSFE), which enables the selection and the tune of the of the center wavelength. The light re- emitted by the object is collected by a lens (L) or a microscope, passes through the imaging spectral filtering elements (ISFE) and the optical aperture (OA) and the formed image of the object is recorded by one or 15 more imaging detectors (ID1 ), (ID2). The light source spectral filtering element(s) (LSSFE) and the imaging spectral filtering elements (ISFE) may comprise a rotating band pass filter wheel, which enables the selection of the illumination and/or the imaging center wavelength. The rotation of the filter wheel and therefore the selection of the illumination 0 and/or the imaging center wavelength can be controlled with the aid of controlling electronics (CE). The apparatus embodies more than one interchangeable optical detectors (ID1), (ID2) with different spectral sensitivities in cases that extended spectral sensitivity is required. This extension enables the direct comparative imaging of the object in a wide ?5 spectral range such as from 200nm through 2500nm, something untenable with a single detector. Imaging in a wide spectral range and trough the same optical aperture is very informative since it enables the selective imaging of the various layers of the object and the determination of spectral bands at which object materials with the same » 0 color appearance are differentiated. The optical detectors can be interchanged behind the optical aperture (OA) with the aid of sliding mechanism, on which the detectors have been affixed. Another method employs a rotating mirror (RM), which deflects the optical rays and direct them onto the one or the other detector. The rotation of the mirror or the linear movement of the detectors can also be controlled with the aid of controlling electronics. The recorded by the detectors images are converted to electrical signals, which are transferred with the aid of read- out electronics (ROE) and amplified, modulated and digitized with the aid of the camera signal processing unit (CSPU). Both camera signal processing unit (CSPU) and controlling electronics (CE) can be interfaced with a personal computer (PC). The embodied to the apparatus hardware and software enables the selection of the imaging mode and the image calibration, capturing, acquisition processing and analysis. With the aid of software means, the stored diffuse reflectance and/or fluorescence images of the area under analysis can be automatically compared with the previously stored spectral data of the object material models, thus facilitating the non destructive identification of the unknown materials of the object. References 1. "Art, Archaeology and Analytical Chemistry, A. L. Beilby, J. Chem. Educ. 69, 437, (1992). 2. "Analytical Techniques in Art and Archaeology, P. Mirti, Ann. Chim. 79, 455, (1989). 3. "Imaging to rescue art and science artifacts in the field", B. Mazor, Advanced Imaging, 38-41 , (1993). 4. "Optische Methoden der Schadenserfassung", Forschungsprojekt Wandmalerei-Schaden, T. Trapp, Arbeitshefte zur Denkmalpflege in Niedersachsen, 11 , Hannover, 45-48, (1994). 5. E. Walmsley, C. Fletcher, J. Delaney, 'Evaluation of system performance of near-infrared imaging devices', Studies in Conservation 37 (1992) 120-131. 6. J.R.J. van Asperen de Boer, 'Reflectography of paintings using an infrared vidicon television system', Studies in Conservation 14 (1969) 96-118; J.R.J. van Asperen de Boer, 'Infrared, reflectography', thesis University of Amsterdam (1970). 7. J. Cupitt, K. Martinez, D. Saunders, 'A methodology for art reproduction in colour: The MARC project', Computers and the History of Art 6 (1996) 1-19; D. Saunders, J. Cupitt, 'Image processing at the National Gallery: The VASARI project', National Gallery Technical Bulletin 14 (1993) 72-85. 8. D. Saunders, H. Chahine, J. Cupitt, 'Long-term colour change measurement: some results after twenty years', National Gallery Technical Bulletin 17 (1996) 81-90. 9. "Erscheinungsbild-Analyse, Micro-Monitoring, Schadensdynamik" H. P. Autenrieth and P. Turek, Forschungsprojekt Wandmalerei- Schaden, , Arbeitshefte zur Denkmalpflege Niedersachsen, 11 , Hannover, 49-53, (1994). 10. "Monitoring solar radiation on painted architectural surfaces: and investigation into using a CCD camera system", R. Gowing, unpublished diploma dissertation, Conservation of Wall Painting Department, Courtauld Institute of Art, University of London, (1997). 11."Elucidating reflectograms by super-imposing infra-red and colour images", D. Saunders and J. Cupitt, National Gallery Technical Bulletin, ^, 61-65, (1995).

Claims: CLAI S 1. An Imaging method for non-destructive analysis of paintings and monuments, hereunder described with the term "object" comprising: a) Exposing the object to a polychromatic light beam, which includes wavelengths ranging from the ultraviolet through the mid-infrared part of the spectrum. b) Generating a broad band image of the object in response to the incident light beam, which image is consisted from photons with wavelengths laying within the spectral sensitivity limits of ultraviolet, visible, near- and mid- infrared detectors and imaging photon energy converters, used for object's image capturing; c) Generating a plurality of narrow band images corresponding to the broad band image of the object and comprising the intensity of said broad band image captured in the narrow bands of shorter than the detector's sensitivity spectral range; where for any spatial location of the examined area, the light intensities expressed by the materials constituting the object in narrow spectral bands in response to the incident light beam, are compared with the light intensities expressed by object material models at the same narrow spectral bands and under the same illumination and imaging conditions, thus enabling the determination and mapping of compositional characteristics of the materials used to create the object. 2. The method of claim 1 where the step of exposing the object to a light beam comprises exposing the object to one or to a plurality of narrow band light beams of different center wavelengths, in time succession and where the step of generating narrow band images comprises one or a plurality of narrow band images of the same or of longer center wavelengths than the center wavelength of the illuminating narrow band light beam. 3. The method of claim 1 where the step of generating a plurality of narrow band images comprises generating narrow band images by tuning the center wavelength of the captured narrow band image, across the optical spectrum from the ultraviolet through the near- infrared part of the spectrum in time succession, thus enabling the selective imaging, comparison, compositional and structural analysis of the different layers of the painting from the surface coating through the background respectively. 4. The method of claims 1 ,2, where each one of the generated reflectance and/or fluorescence images include both the object area under analysis and appropriate object material model(s), of the same or of similar color appearance but with different compositional characteristics, thus enabling the direct comparison of the intensities expressed from original and model materials, thus assisting the identification of the object material under analysis. 5. The method of claims 1 ,2 where the spatial and the spectral distribution of reflectance and/or fluorescence intensities derived from the captured narrow band images of the object area under analysis, are compared, in one or more spatial locations of the area under analysis, with the previously measured reflectance and/or fluorescence spectra of appropriate object material models, thus assisting the identification of the object material under analysis. 6. An Imaging apparatus for non-destructive analysis of paintings and monuments, hereunder described with term "object" comprising: a) Light source means for the illumination of the object b) Optical imaging means for collecting the light expressed by the object's area under analysis in response to the illumination and for forming the image of this area. c) Detector means for recording the light intensity expressed by the object as a function of location. d) means for selecting the illumination and imaging center wavelength e) means for image display and storage f) Control means for controlling the illumination and imaging wavelength and the image calibration and acquisition parameters g) Software means for apparatus calibration and data analysis where, a plurality of reflectance and/or fluorescence color and/ black and white images of the object's area under analysis are captured through the same optical aperture at different spectral bands within a wide spectral range including ultraviolet through mid-infrared and from the stored images the reflectance and/or fluorescence intensity spectral distribution for one or for a plurality of spatial points of the object's area under analysis is calculated and compared automatically or semi- automatically with the reflectance and/or fluorescence characteristics of object material models, thus assisting the non destructive identification, mapping and analysis of compositional and structural features of the object. 7. The method and the apparatus of claims 1 ,2,3,6 where the step of generating a plurality of narrow band images and of selecting the center imaging wavelength respectively, comprises passing the optical rays that form the broad band image, through a plurality of optical filters in timed succession with the aid of a filter selection mechanism. 8. The method and the apparatus of claims 1 ,2,3,6, where the step of generating a plurality of narrow band images comprises passing the optical rays, which constitute the broad band image, through image splitting optical elements and filtering the generated multiple images of the same area of the object's area so that images captured at different spectral bands are generated, displayed, inspected and stored simultaneously. 9. The method and the apparatus of claims 1 ,2,3,6, where the step of exposing the object to a broad or to a narrow band light beam comprises embodiment of one or more light emission diodes (LEDs) with spectral emissions ranging from ultraviolet through mid-infrared. 10. The apparatus of claim 6 where detector means comprises a CCD or a C-MOS two-dimensional optical sensor, which may be optically coupled with infrared or ultraviolet-to-visible imaging converters thus extending the spectral sensitivity of the apparatus. 11. The apparatus of claim 6 where detector means comprises more than one optical detectors with different spectral sensitivities and a rotating deflection mechanism of the imaging rays, so that the rays of the image of the object that pass through the optical aperture fall at the one or the other detector, depending on the desired imaging spectral band. 12. The apparatus of claim 6 where software means for apparatus calibration comprises calibration of the imaging procedure against standard calibration specimens and software for data analysis comprises embodiments of neural network algorithms and expert system methods for the automatic comparison of the optical and other characteristics including historical and technical data of original object with the ones of object material models facilitating the in situ non destructive analysis of the object. 13. The method and the apparatus of claims 1 through 11 where the step of exposing the object to a light beam comprises exposing the object to a blue-ultraviolet light beam and where the step of generating images comprises blue-ultraviolet reflectance images and/or visible- near infrared fluorescence images of the object, which images are used for the highlighting of surface features such as texture, deposited materials, varnishes, coatings etc, and for the on-line and/or of-line control of methods and procedures, including chemical means and Laser cleaning methods and systems, used to process and/or to remove unwanted surface features and layers of the object. AMENDED CLAIMS [received by the International Bureau on 22 November 2001 (22.11.01); original claims 6 and 13 amended; claim 7 cancelled; new claim 17 added; remaining claims unchanged (5 pages)] 1. An Imaging method for non-destructive analysis of paintings and monuments, hereunder described with the term "object" comprising: a) exposing the object to a polychromatic light beam, which includes wavelengths ranging from the ultraviolet through the mid-infrared part of the spectrum; b) generating a board band image of the object in response to the incident light beam, which image is consisted from photons with wavelengths laying within the spectral sensitivity limits of ultraviolet, visible, near- and mid- infrared detectors and imaging photon energy converters, used for object's image capturing; c) generating a plurality of narrow band images corresponding to the broad band image of the object and comprising the intensity of said broad band image captured in the narrow bands of shorter than the detector's sensitivity spectral range, where for any spatial location of the examined area, the light intensities expressed by the materials constituting the object in narrow spectral bands in response to the incident light beam, are compared with the light intensities expressed by object material models at the same narrow spectral bands and under the same illumination and imaging conditions, thus enabling the determination and mapping of compositional characteristics of the materials used to create the object. 2. The method of claim 1 where the step of exposing the object to a light beam comprises exposing the object to one or to a plurality of narrow band light beams of different center wavelengths, in time succession and where the step of generating narrow band images comprises one or a plurality of narrow band images of the same or of longer center wavelengths than the center wavelength of the illuminating narrow band light beam. 3. The method of claim 1 where the step of generating a plurality of narrow band images comprises generating narrow band images by tuning the center wavelength of the captured narrow band image, across the optical spectrum from the ultraviolet through the near-infrared part of the spectrum in time succession, thus enabling the selective imaging, comparison, compositional and structural analysis of the different layers of the painting from the surface coating through the background respectively. 4. The method of claims 1, 2, where each one of the generated reflectance and/or fluorescence images include both the object area under analysis and appropriate object material model(s), of the same or of similar color appearance but with different compositional characteristics, thus enabling the direct comparison of the intensities expressed from original and model materials, thus assisting the identification of the object material under analysis. 5. The method of claim 1, 2 where the spatial and the spectral distribution of reflectance and/or fluorescence intensities derived from the captured narrow band images of the object area under analysis, are compared, in one or more spatial locations of the area under analysis, with the previously measured reflectance and/or fluorescence spectra of appropriate object material models, thus assisting the identification of the object material under analysis. 6. An Imaging apparatus for non-destructive analysis of paintings and monuments, hereunder described with term "object" comprising: a) light source means for the illumination of the object; b) optical imaging means for collecting the light expressed by the object's area under analysis in response to the illumination and for forming the image of this area; c) detector means for recording the light intensity expressed by the object as a function of location; d) means for selecting the illumination and imaging center wavelength; e) means for image display and storage; f) control means for controlling the illumination and imaging wavelength and the image calibration and acquisition parameters; g) software means for controlling the imaging wavelength, the detector's operating characteristics, the calibration and the imaging data analysis and processing, where, a plurality of reflectance and/or fluorescence color and/or black and white images are captured at various spectral bands, which images provide compositional and structural information for assisting the determination of the conservation needs of the object and for the on-line and offline evaluation and control of the restoration tasks. 7. The apparatus of claim 6 wherein the plurality of reflectance and/or fluorescence color and/or black and white images, are captured through the same optical aperture at different spectral bands within a wide spectral range from ultraviolet through mid-infrared. 8. The method and the apparatus of claims 1, 2, 3, 6, 7 where the step of generating a plurality of narrow band images comprises passing the optical rays, which constitute the broad band image, through image splitting optical elements and filtering the generated multiple images of the same area of the object's area so that images captured at different spectral bands are generated, displayed, inspected and stored simultaneously. 9. The apparatus of claims 6, 7 where detector means comprises more than one optical detectors with different spectral sensitivities and a rotating deflection mechanism of the imaging rays, so that the rays of the image of the object that pass through the optical aperture fall at the one or the other detector, depending on the desired imaging spectral band. 10. The apparatus of claim 6, where detector means comprises a CCD or a C-MOS two-dimensional optical sensor, which may be optically coupled with infrared or ultraviolet-to-visible imaging converters thus extending the spectral sensitivity of the apparatus. 11. The method and the apparatus of claims 1, 2, 3, 6, 7 where the step of exposing the object to a broad or to a narrow band light beam comprises embodiment of one or more light emission diodes (LEDs) with spectral emissions ranging from ultraviolet through mid-infrared. 12. The apparatus of claims 6 to 11, where software means for apparatus calibration comprises calibration of the imaging procedure against standard calibration specimens and software for data analysis comprises embodiments of neural network algorithms and expert system methods for the automatic comparison of the optical and other characteristics including historical and technical data of original object with the ones of object material models facilitating the in situ non destructive analysis of the object. 13. The apparatus of claims 6 to 12 where the images are used for identification and highlighting of surface features such as texture, deposited materials, varnishes, coatings etc. 14. The apparatus of claims 6 to 13 wherein the images are used for the determination of laser beam parameters for laser removing of unwanted surface material and for the online and off-line control of object's surface laser ablation procedure. 15. The apparatus of claims 6 to 13 wherein the images are used for the on-line and off-line control of the removal of unwanted surface material, which material is removed using chemical or mechanical means. 16. The apparatus of claims 6 to 13, where the step of exposing the object to a light beam comprises exposing the object to a blue-ultraviolet light beam and where the step of generating images comprises blue-ultraviolet reflectance images and/or visible - near infrared fluorescence images of the object. 17. The apparatus of claims 6 to 13 wherein at least the illumination, detector, optical filters and image display means, are integrated in a head-mounted platform, thus enabling the real time, hands-free inspection in visible and non visible spectral bands, facilitating the on-line control of the surface treatment procedure. STATEMENT UNDER ARTICLE 19 (1) Amendments on claim 6 are based on claim 13 of the application s filed. In addition, part of the claim 6 as filed, has been used for the new claim 7 added. Claim 13 of the application as filed * has been subdivided into the amended dependent claims 13, J 4, 15 and 16. These amendments have no impact on the description and on the drawings. A n w dependent claim 11 was added in order lo cover,anothcr implementation of the system claimed in claim 6. This new claim has no impact on the drawings, since it includes the same components described in the disclosures already made.

Inventors: BALAS KONSTANTINOS, PELECOUDAS DEMETRIOS, BALAS, KONSTANTINOS, PELECOUDAS, DEMETRIOS
Applicants: BALAS KONSTANTINOS, FOUNDATION FOR RES AND TECHNOL, PELECOUDAS DEMETRIOS, BALAS, KONSTANTINOS, FOUNDATION FOR RESEARCH AND TECHNOLOGY-HELLAS, PELECOUDAS, DEMETRIOS
Application year: 2000
Main classification: G01J3
IPC codes: B44D3, G01J3, G01N21