SINGLE CORNER KIRKPATRICK-BAEZ BEAM CONDITIONING OPTIC ASSEMBLY

Abstract: An X-ray reflecting system comprising a Kirkpatrick-Baez side-by-side optic in a single corner configuration having multi-layer Bragg X-ray reflective surfaces.

Description: SINGLE CORNER KIRKPATRICK-BAEZ BEAM CONDITIONING OPTIC ASSEMBLY " BACKGROUND OF THE INVENTION The present invention relates to an x-ray optic More specifically the present invention relates to an improved Kirkpatπck-Baez optical apparatus to condition, direct, focus, or collimate an x-ray beam There are various applications which utilize conditioned, directed, col mated, or focused x-rays For example, medical radiotherapy systems utilize x-rays to destroy malignant tissue, x-ray diffraction or microdiffraction analysis systems channel x-ray radiation at a sample crystal to generate a diffraction pattern corresponding to its lattice structure, and x-ray fluorescence and spectroscopy systems employ directed x-ray beams In many applications it is desirable to direct a beam in two dimensions To collimate a beam in two dimensions, the traditional Kirkpatπck-Baez optical scheme may be employed Two crossed mirrors arranged in sequential order collimate a divergent x-ray beam along two directions independently With a point source, this sequential order system equipped with two parabolic mirrors will provide a parallel beam With a finite source this system will provide a beam with different divergences in two directions This sequential order system equipped with two elliptical mirrors can give a perfect real point image with a point source at its focal point For a field object, the image will be magnified or demagnified by the system Since the two mirrors are different distances from the object, the magnification will be different for both directions The present invention employs an innovative variation of the Kirkpatπck-Baez system employing a side-by-side scheme and multi-layer Bragg x-ray reflecting surfaces The side-by-side system provides a solution to the problems associated with a sequential system as well as providing other advantages The mirrors in a side-by-side system can be arranged at the most appropriate location for optimized optical performance to increase flux, shortening the time needed for data collection by an x-ray detection device The side-by-side system will suffer less from surface imperfections and is prealigned and bonded to prevent alignment errors The side-by-side optic is also much more compact than that of a sequential scheme enabling it to be used in applications where space is at a premium The performance of a side by side optic can be even further improved by incorporating graded-d multi-layer Bragg x-ray reflectors The multi-layer reflectors have a large reflection angle resulting in higher collection efficiency and provide the ability to select the frequencies of reflected x-rays SUMMARY OF THE INVENTION The present invention is a new type of x-ray optic based upon the Kirkpatπck Baez side-by-side scheme and multi-layer Bragg x-ray reflective surfaces The present invention incorporates graded-d multi-layer Bragg reflectors that are prealigned and bonded together in the Kirkpatπck-Baez scheme The reflectors will provide a large flux density when focused on a small sample and the multi-layer structure will allow the x-ray optic to control the frequency band reflected The x-ray optic will have the ability to reflect x-rays in a broad band, narrow band, or a monochromatic manner An object of the present invention is to increase the flux on a sample Another object of the invention is to decrease the aberration of an x-ray optic Another object of the invention is to create a compact x-ray optic that is easily maneuvered A further object of the invention is to provide an x-ray optic that is easily aligned An even further object of the invention is to provide a narrow band, monochromatic, or frequency selectable polychromatic x-ray beam RRIFF DESCRIPTION OF THE DRAWINGS FIG 1 is a diagrammatic view of a traditional sequentially ordered Kirkpatπck-Baez mirror system, FIG 2 is a diagrammatic view of a side-by-side Kirkpatπck-Baez mirror system, FIGS 3a-3b are diagrammatic views of a side-by-side Kirkpatπck-Baez mirror system illustrating the system's working areas, FIG 4 is a more detailed diagrammatic view of a side-by-side Kirkpatπck- Baez system illustrating x-ray beam paths, FIG 5 is a perspective view of a side-by-side Kirkpatπck-Baez mirror system with aperture assemblies, and FIG 6 is a diagrammatic view of a method of aligning the present invention DFTAILFD DESCRIPTION OF THE PREFERRFD EMBODIMENT FIG 1 is a diagrammatic view of a traditional sequentially ordered Kirkpatπck-Baez mirror system This sequentially ordered mirror system may focus or collimate an x-ray beam in two dimensions by reflecting a divergent x-ray beam along two directions independently The mirrors 12a and 12b are arranged in consecutive order and may be configured with a parabolic or elliptical surface With a point source 10, this sequential order system equipped with two parabolic mirrors will provide a parallel beam With a finite source, this parabolic mirror system will provide a beam with different divergences in two directions When elliptical mirrors are substituted for parabolic mirrors the sequentially ordered system will provide a focused beam and give a perfect real point image with a point source at its focal point For a field object, the image will be magnified or demagnified by the system The magnification will vary with the distances separating the mirrors and the object There are several limitations which greatly affect the performance of the sequential order Kirkpatπck-Baez system There is no way to install both mirrors at the most optimized positions, which results in less flux and a larger aberration Consider a FIG deviation from the ideal curvature Aσof the reflective surface, the deviation of the ray from the theoretical position at the image plan will be equal to 2A ri, where / is the distance between incident point and image plane For a sequential system, the FIG error on the mirror nearer to the object results in a larger deviation When the mirrors are located at different distances from the detector, if both mirrors have the same angular deviation, the aberration from the mirror closest to the source will be larger A sequential order Kirkpatπck-Baez system will have varied amplification because the mirrors are placed at different positions with relation to field object distance Lastly, the alignment hardware for a sequential order Kirkpatπck-Baez mirror is bulky and complicated and the alignment procedures are difficult and time consuming since the adjustments include alignments relative to the beam and the alignments relative to both mirrors A side-by-side Kirkpatπck-Baez system provides a solution to the problems associated with a sequential system as well as providing other advantages In FIG 2 a side-by-side system is shown generally as 16 The reflecting surfaces 18a and 18b are mounted adjacent at a 90 degree angle " The side-by-side system has no distance offset between reflecting surfaces as does the sequential order system, reducing potential aberration problems FIGS 3a-3b are diagrammatic views of a side-by-side Kirkpatπck-Baez mirror system illustrating a first working zone 20a and second working zone 20b upon the mirror surfaces The working zones 20a and 20b are located upon and adjacent to the corner formed by the coupling of the reflective surfaces 18a and 18b FIG 4 is a more detailed diagrammatic view of a side-by-side Kirkpatπck- Baez system illustrating incident and reflected x-ray beam paths Individual x-ray beams 26a and 26b are radiated from x-ray source 10 and may first be examined at the cross section 22 of the x-ray beam The cross section 22 of the beam illustrates the many divergent directions of the x-ray beams exiting the x-ray source 10 Individual x-ray beam 26a is incident upon working zone 20a which lies generally upon the junction of reflective surfaces 18a and 18b Individual x-ray beam 26b is also incident upon working zone 20a The beams 26a and 26b are reflected by working zone 20a and redirected to working zone 20b which also lies generally upon the junction of reflective surfaces 18a and 18b opposite and partially overlapping working zone 20a as shown in FIG 3a and 3b The beams 26a and 26b then exit the system 16 and may be in divergent, collimated or focused form depending upon the shapes of the reflective surfaces 18a and 18b and the form of the x-ray source This configuration is generally known as an single corner configuration Any combination of parabolic or elliptical mirror surfaces for the present invention may be used For example, one reflecting surface may have an elliptical surface and a second reflecting surface may have a parabolic reflecting surface The reflective surfaces in the present invention are configured as multi-layer or graded-d multilayer Bragg x-ray reflective surfaces Bragg structures only reflect x-ray radiation when Bragg's equation is satisfied nλ =2cfeιn(θ) where n = the order of reflection λ = wavelength of the incident radiation d = layer-set spacing of a Bragg structure or the lattice spacing of a crystal angle of incidence Multi-layer or graded-d multi-layered Bragg mirrors are optics with a fixed focal point which utilize their inherent Bragg structure to reflect narrow band or monochromatic x-ray radiation The bandwidth of the reflected x-ray radiation can be customized by manipulating the optical and multi-layer parameters The d-spacmg of the multi-layer mirror can be tailored in such a way that the Bragg condition is satisfied at every point on the multi-layer mirror The d spacing may be changed laterally or depthwise to control - 3 - the bandpass of the multi-layer mirror The multi-layer mirror has a large reflection angle resulting in higher collection efficiencies for incident x-rays These multi-layered mirrors could increase the flux by more than an order with a fine focus x-ray tube, as compared with total reflection mirrors Multi-layered mirrors, because of their monochromatic output, could also reduce the unwanted characteristic radiation emitted from a sample during diffraction analysis by thousands of times As seen in FIG 5 when employing the single corner optic an x-ray aperture assembly 56 having an aperture 58 may be placed at the entrance area, exit area or both to eliminate coaxial direct x-rays, single bounce x-rays, or scattered x-rays The combination of side-by-side Kirkpatπck-Baez scheme and multi-layer or graded-d multi-layer Bragg x-ray reflective surfaces can provide superior optics for many applications requiring directed, focused, or collimated x-rays FIG 6 is a diagrammatic drawing showing the alignment method of the present invention A Kirkpatπck-Baez mirror to work correctly must have a very specific orientation The present invention utilizes microadjustment hardware to correctly orient a Kirkpatπck-Baez mirror The alignment of the optic can be achieved with five freedoms of adjustments two rotations and three translations The rotating axes for two mirrors should go through the centers of the intersection of the two mirrors, and parallel to the mirrors respectively, as shown in the schematic picture The two translations, which are perpendicular to the optic, FIG 6, should be parallel to the mirror surfaces respectively, (see the bottom of FIG 6) These freedoms allow the adjustments of the incident angles and beam positions It is to be understood that the invention is not limited to the exact construction illustrated and described above, but that various changes and modifications may be made without departing from the spirit and scope of the invention as defined in the following claims - 4 -

Claims: I CLAIM 1 An x-ray directing system comprising a Kirkpatπck-Baez side-by-side optic which redirects x-rays, wherein said Kirkpatπck Baez side-by-side optic has multi-layer Bragg x-ray reflective surfaces 2 The x-ray directing system of claim 1 , wherein said multi-layer Bragg x-ray reflective surfaces have graded-d spacing 3 The x-ray directing system of claim 2 wherein said graded-d spacing is lateral grading 4 The x-ray directing system of claim 2 wherein said graded-d spacing is depth grading 5 The x-ray directing system of claim 1 , wherein said multi-layer Bragg x-ray reflective surfaces have an elliptical surface 6 The x-ray directing system of claim 1 , wherein said multi-layer Bragg x-ray reflective surfaces have a parabolic surface 7 The x-ray directing system of claim 1 , wherein said multi-layer Bragg x-ray reflective surfaces are a parabolic surface and an elliptical surface 8 The x-ray directing system of claim 1 further including at least one x-ray aperture assembly, wherein said assembly occludes a portion of said x-rays 9 An x-ray reflecting system comprising a plurality of x-ray reflectors, wherein said x-ray reflectors are multi-layer Bragg x-ray reflectors; and wherein said x-ray reflectors reflect an incident beam in two directions independently 10 The x-ray directing system of claim 9, wherein said multi-layer Bragg x-ray reflectors have graded-d spacing 1 1 The x-ray directing system of claim 10 wherein said graded-d spacing is lateral grading 12 The x-ray directing system of claim 10 wherein said graded-d spacing is depth grading 13 The x-ray directing system of claim 9, wherein said multi-layer Bragg x-ray reflectors have an elliptical surface 14 The x-ray directing system of claim 9, wherein said multi-layer Bragg x-ray reflectors have a parabolic surface 15 The x-ray directing system of claim 9, wherein said multi-layer Bragg x-ray reflective surfaces are a parabolic surface and an elliptical surface 16 The x-ray reflecting system of claim 9 further including at least one x-ray aperture assembly, wherein said assembly occludes a portion of said x-rays - 6

Inventors: GUTMAN GEORGE, JIANG LICAI, VERMAN BORIS, GUTMAN, GEORGE, JIANG, LICAI, VERMAN, BORIS
Applicants: OSMIC INC, OSMIC, INC.
Application year: 1999
Main classification: G21K1
IPC codes: G02B17, G21K1