Bipolar transistor and a method of manufacturing the same

Abstract: The present invention realizes a manufacturing method of bipolar transistor allowing to omit a photolithographic process of the emitter electrode polysilicon and to measure the characteristics of the transistor before forming metal electrodes. The present invention discloses a diffusion check transistor within a wafer for massproducing the bipolar transistor having the same structure and the same electrical characteristics. The diffusion check transistor has collector probe opening 201 of a size which allows a probe needle to contact to the collector electrode in the insulated region for measurement, emitter opening 301 of a size which allows the probe needle to contact to emitter electrode positioned in the region which adjoins to the preceding region beyond the insulation wall, a trench to bridge between emitter opening 301 and emitter region 13, burying emitter electrode polysilicon in the trench to connect them electrically, and base opening 401 of a size of said opening 301 in an adjoining region. So that the diffusion transistor allows to measure the diffusivity of the transistor before forming the metal electrodes.

Description: BACKGROUND OF THE INVENTION 1. Field of the Invention: The present invention relates to a method of manufacturing a semiconductor device, particularly to a method of manufacturing a bipolar transistor. 2. Description of the Related Arts: Fig. 1 shows a conventional transistor in which an emitter region is formed by diffusing impurities from polysilicon. This silicon bipolar transistor of a polysilicon emitter structure has an advantage to increase current amplification factor thus occupying the mainstream of the present transistor market. Now a conventional semiconductor device and a method of manufacturing the same will be described with reference to the attached drawings. Also, we refer to the material (David J. Roulston, "Bipolar Semiconductor Devices", McGraw-Hill, page 343-345, 1990). Fig.1(a) shows a section of an example of a first conventional semiconductor device. Fig. 1 shows sectional views of a process a transistor serially in accordance with a manufacturing method called as Super Self-aligned process Technology (SST) developed by Sakai et. al. of NTT Corp. In this process, in order, an emitter opening is formed, no-additive polysilicon is deposited all over a wafer, arsenic is added to polysilicon by an ion implantation method, N+ type polysilicon is provided remaining in the region within a fixed distance from the emitter opening being processed by means of photolithography and dry etching. Furthermore, heat-treatment is applied to diffuse arsenic from polysilicon to single crystal silicon, thereby finally producing an emitter. A second conventional technique will be described with reference to a bipolar transistor of which an intrinsic base layer is formed by an epitaxial growth method. Then, a second conventional semiconductor device and a method of manufacturing the same will be described referring to the material: Sato, et. al., "A self-aligned selective MBE technology for high performance bipolar transistor", International Electron Device Meeting (IEDM), 1990, pp.607 - 610. Fig. 2 shows a section of an example of a second conventional semiconductor device. On P - type silicon substrate 1, there is formed N + type buried layer 2, and further on which N - type silicon epitaxial layer 3 is provided having LOCOS oxide film 14 for device separation and N + type collector draw out region 15 formed therein. Through the above process, silicon base 100 is composed. Subsequently, the surface of silicon base 100 is covered with silicon oxide film 6. In silicon oxide film 6, there are provided opening 101 for preparing a base by exposing a part of silicon collector layer 3 which constitutes a collector region and opening 102 for exposing collector draw out region 15. On silicon oxide film 6, P + type base electrode polysilicon film 7 is selectively formed, being horizontally pushed out into opening 101 from an edge of the opening. P type polysilicon layer 10 is formed from the under surface of this pushed out portion toward silicon collector layer 3 which constitutes the collector region. While, on the exposed portion of silicon collector layer 3, P type base region 9 is formed with single crystal silicon produced through a selective epitaxial growth process. These polysilicon layer 10 and P type base region 9 contact with each other. In opening 102, N type polysilicon layer 21 is formed contacting with collector draw out region 15. P type base region 9 with the exception of an emitter forming portion, polysilicon layers 7 and 10 are covered with silicon nitride film 8 and silicon oxide film 11, respectively. On the exposed part of P type base region 9, N type emitter region 16 is formed with single crystal silicon. Aluminum based emitter electrode 18b, base electrode 18a and collector electrode 18c contact emitter polysilicon 17, polysilicon layer 7 and polysilicon layer 8, respectively. This second conventional technique is the same as the first conventional technique in that emitter polysilicon is processed by the photolithographic process and the etching process. With the first and the second conventional semiconductor devices (wherein emitter polysilicon is processed by patterning) and the method of manufacturing thereof, N + type polysilicon is deposited all over the silicon substrate as an emitter electrode, then photoresist is applied on the polysilicon layer and polysilicon patterning is performed through dry etching, thereby producing, as a result, a level difference of the thickness of emitter polysilicon layer directly above the emitter layer. However, when a minute dimension is processed in the above case through patterning in the photolithographic process, it is more difficult compared to the case with a flat surface because of unevenness of the surface. In other words, for processing a minute dimension, although the light of a short wavelength is advantageous, at the same time it has a disadvantage of narrow margin of focus, and hence the more the unevenness of the surface increases, the more it becomes unsuitable for the case with the minute dimension. Thus, as a method with which a level difference directly above the emitter portion is controlled to a small value, there is a method to take a structure in which emitter polysilicon exists only in the emitter opening (hereinafter this structure is called as plug structure). This method can be realized in two ways. There is a first method for forming the plug structure in which emitter polysilicon is deposited and then etched back by a dry etching method. Since this method allows to save a photolithographic process for patterning emitter polysilicon, it is effective economically. However, according to this method, since polysilicon deposited on a large opening is completely removed by etching back operation, it can not check the characteristics of the emitter polysilicon. There is a second method for forming the plug structure in which polysilicon is deposited by a selective crystal growth method and then adding arsenic to the deposited polysilicon by means of the ion implantation method to form emitter polysilicon layer. With this forming method, since polysilicon is formed only in the opening on the intrinsic base, the level difference as above is not produced in the emitter polysilicon layer. However, with this method, the emitter dimension of a transistor, as a product, to be used in a circuit is on the level of several µ m, whereas the emitter dimension of the diffusion check transistor which is used in the manufacturing stage for checking characteristics is required to be approximately 100 µm square, and characteristics of both transistors do not always coincide with each other. The reason is that when the emitter dimension becomes large, in the inside of the minute opening, arsenic to be supplied by ion implantation is not sufficiently added to the bottom part of polysilicon, resulting in that the diffusion state of emitter impurities (here: arsenic) varies depending upon the size of the opening. High performance bipolar transistors of these days have base junction depth X JB and emitter junction depth X JE which are made very shallow for realizing high speed characteristic of the transistor. For example, according to IEEE International Electron Devices Meeting (IEDM), 1989, pp.221 - 224, the base depth is reported as 0.09 µm. As a normal method for forming the emitter, then emitter region is formed by making N type impurities such as arsenic or phosphorus diffuse from the surface of the emitter polysilicon into the single crystal base region by applying heat-treatment to the emitter polysilicon (hereinafter called as "emitter push in"). This diffusion is largely influenced according to the condition of the interface between the single crystal base and the emitter polysilicon. In other words, prior to deposition of polysilicon, a natural oxide film of approximately 10 angstrom 1nm = 10 augstrom in thickness resides on the surface of the single crystal base. This natural oxide film has dispersed thickness per wafer and poor thickness uniformity in the same wafer. Therefore, the emitter push in process is applied being arranged such that, a piece of transistor is processed by emitter push in operation as trial and its characteristics is measured (hereinafter a transistor to be measured is called as "diffusion check transistor"), and according to the measurement result, the remaining wafers in the same lot are processed by the emitter push in operation. However, if the emitter is formed in the region of a size in which probing can be made (for example, 80 µ m 2 or more) according to the above described conventional method for selectively forming emitter polysilicon, measurement can be made in the region for monitoring the emitter push in state. But, the emitter dimension of transistors which are actually used as products in the circuit is 1 µ m or less, whereas the emitter dimension of the transistor to be monitored is several tens µ m, and hence diffusion states of emitter impurities are different from each other. Therefore, it is difficult to estimate data of the transistor which is used in the actual circuit by measuring the diffusion check transistor. The reason of the difference in characteristics of both transistors is unknown in strictly speaking, but it is estimated that the diffusion depth becomes different because of the different occurrence state of the stress which may be caused by the difference between the thermal expansion coefficients of the insulation film surrounding emitter polysilicon (for example, silicon nitride film or silicon oxide film) and polysilicon. Accordingly, it is necessary to check the diffusion condition of the transistor which has the emitter of the same size as that of the transistor to be used in the circuit. However, also in this case, a problem occurs as follows. That is, a first problem is that it is impossible to measure transistor characteristics on the way of a process flow. The reason of that is, with a transistor of the conventional structure, without applying patterning to emitter polysilicon according to a combination of a photolithographic process and a dry etching method, it is impossible to form an electrode pad of a dimension which can be probed (for example, 100 µ m 2 or more) from the emitter of the transistor having the minute (a dimension of about 1 µ m) emitter. SUMMARY OF THE INVENTION An object of the present invention is to provide an improved transistor having a structure which allows to measure the characteristics of the transistors on manufacturing, at a stage immediately after the emitter push process. The transistors are bipolar transistors having a structure whose emitter polysilicon is buried in a form of a plug inside the emitter of a minute dimension. A method of manufacturing a semiconductor device according to the present invention is defined in claim 1. According to the present invention, a trench of a size similar with the dimension of the emitter is formed in the insulation film, extending conductivity of emitter to the outside by burying the trench with poly silicon, and this extended portion is connected to N type single crystal silicon region of a large size which is electrically separated from a collector, thereby a diffusion check transistor is formed without having a photolithographic process. Since this method can omit the photolithographic process for processing emitter polysilicon, the low process cost is realized and flatness of the upper surface of the emitter is improved, thereby promoting the miniaturizing of the wiring in the semiconductor. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 (a) to Fig.1(e) are longitudinal sections which show a manufacturing process of the semiconductor device according to the conventional technique. Fig. 2 is a section of the semiconductor device according to the conventional technique. Fig. 3(a) is a longitudinal section of a first embodiment of a diffusion check transistor for measurement use which is employed in a semiconductor device manufacturing method of the present invention, and Fig. 3(b) is a plan thereof. Fig. 4(a) is a longitudinal section of a semiconductor device formed in accordance with the present invention to be used within an actual circuit, and Fig. 2(b) is a plan thereof. Fig. 5 (a) is a longitudinal section of a primary process for manufacturing the diffusion check transistor of the first embodiment and shows the result of the process until base electrode polysilicon 7 and silicon nitride film 8 are formed, and (b) is a longitudinal section of the same having miniaturized size for use in a circuit. Fig. 6 (a) is a longitudinal section of the diffusion check transistor shown in Fig. 3 in a process in which a photoresist is processed by patterning, opening 101 is prepared and an unnecessary part of silicon nitride film 8 is removed, and Fig.6 (b) is a longitudinal section of the same having miniaturized size for use in an actual circuit . Fig. 7 is a longitudinal section of the diffusion check transistor shown in Fig. 3 in a process for manufacturing in which the photoresist is removed, and an unnecessary part of base electrode polysilicon 7 is removed, and (b) is a longitudinal section of the same having miniaturized size for use in an actual circuit. Fig. 8 is a longitudinal section of the diffusion check transistor in a process at the result of the process until a side covering of base electrode polysilicon 7 and silicon nitride film of the bottom of the opening are removed, and Fig.8 (b) is a longitudinal section of the same having miniaturized size for use in an actual circuit. Fig. 9 (a) is a longitudinal section of the diffusion check transistor in a manufacturing process in which opening 101 is completed by removing a corresponding part of the silicon oxide film, and (b) is a longitudinal section of the same having miniaturized size for use in an actual circuit. Fig. 10 is a longitudinal section of the diffusion check transistor in a process for manufacturing showing the result of completion of base electrode polysilicon 7 and polysilicon 10, and formation of a side wall of silicon oxide film 11, and (b) is a longitudinal section of the same having miniaturized size for use in an actual circuit. Fig. 11 is a longitudinal section of the diffusion check transistor shown in Fig. 1 in a process for manufacturing openings 201 and 301, and Fig.11 (b) is a plan thereof. Fig. 12 is a longitudinal section of the first embodiment shown in Fig. 3 in the primary process for manufacturing opening 202 in the product. Fig. 13 is a longitudinal section of the diffusion check transistor shown in Fig. 3 in a process showing the result of deposition of the N + type polysilicon 12 and Fig.13 (b) is a longitudinal section of the same having miniaturized size for use in an actual circuit. Fig. 14 shows a sectional view of a second embodiment of the diffusion check transistor to be used in the manufacturing method of the semiconductor device of the present invention. Fig. 15 shows a sectional view of a third embodiment of the diffusion check transistor to be used in the manufacturing method of the semiconductor device of the present invention. Fig. 16 shows a sectional view of a fourth embodiment of the diffusion check transistor to be used in the manufacturing method of the semiconductor device of the present invention. DESCRIPTION OF THE PREFERRED EMBODIMENT A first embodiment of the present invention will be described with reference to the drawings. In the present embodiment, although it is described with reference to an npn type bipolar transistor, it goes without saying that the present invention can also be applied to a pnp type bipolar transistor. Fig. 3(a) shows a longitudinal section of the first embodiment of a diffusion check transistor which is used in manufacturing a semiconductor device of the present invention, and Fig. 3(b) is a plan thereof. In other words, they are the longitudinal section and the plan of the diffusion check transistor for monitoring emitter push-in operation. Fig. 4(a) is a longitudinal section of a transistor to be used in a circuit as a product having an emitter of a minute dimension, and Fig. 4(b) is a plan thereof. In Fig. 3(a), on P - type silicon substrate 1 having resistivity of 10 to 15 Ωcm, N + type buried layer 2 and further thereon N - type silicon epitaxial layer 3 which is denoted as silicon collector layer 3 1 , 3 2 are formed. Insulation laying trench 5 for device separation is then formed having P + type buried layer 4 for channel stopper use formed beneath thereof. The surface of N - type silicon epitaxial layer 3 is covered with silicon oxide film 6. In silicon oxide film 6, there are formed opening 101 for forming a base by exposing a part of silicon collector layer 3 1 which constitutes a collector region and opening 201 which reaches buried layer 2 for forming a collector drawer (hereinafter called as collector opening). In this figure, a lateral dimension of collector opening 201 is made sufficiently large to a degree which allows to probe for monitoring (for example, 100 µ m square). P + type base electrode polysilicon film 7 is selectively formed on silicon oxide film 6 and the silicon collector layer which constitutes the collector region inside opening 101. On the other hand, on the exposed portion of silicon collector layer 3 1 , P type single crystal silicon intrinsic base region 9 is formed covering N type single crystal silicon which resides inside opening 101, and P + type polysilicon layer 10 is formed under the bottom surface of P + type base electrode polysilicon 7, where intrinsic base region 9 and P + type polysilicon layer 10 contact with each other. N + type polysilicon layer 12-b is formed on the side of collector opening 201. Emitter electrode N + polysilicon 12-a resides on the side of emitter probe opening 301 (of a size about 100 µ m square, allowing direct probing) provided outside trench 5 in another silicon collector layer 3 2 adjacent to silicon collector layer 3 1 and on intrinsic base 9. In Fig. 3(b), there is further provided another base probe opening 401 (which has a size of about 100 µ m square allowing direct probing). Next, a primary process of the first embodiment of the present invention will be described with reference to the drawings. Through silicon oxide film of several hundreds angstrom thick (not shown), ion implantation of arsenic is applied on P - type (100) orientation silicon substrate 1 having resistivity of 10 to 15 Ωcm. As implantation conditions, for example, energy 50 KeV to 120 KeV, dose 5E15 to 2E16 cm -2 are considered appropriate. Subsequently, silicon substrate 1 is heat-treated at temperatures of 1000°C to 1150°C for recovery of damages at the time of implantation, activation of arsenic and effectuation of push in operation. In this way, N + buried layer 2 is formed. Then, after finishing removal of all silicon oxide film, N - type silicon epitaxial layer 3 is formed by a normal forming method. In this case, appropriate growth temperatures are 950°C to 1050°C, and SiH 4 or SiH 2 Cl 2 is used as material gas. PH 3 is used as doping gas, and dope of 0.8 µ m to 1.3 µ m in thickness including impurities of 5E15 to 2E16 cm -3 is appropriate. In this way, N - type silicon epitaxial layer 3 is formed on the buried layer. Succeedingly, trench 5 and P + channel stopper 4 are formed for the purpose of device separation. First, a thermal oxide film of 20 nm to 50 nm thick (not shown) is formed on the surface of N - type silicon epitaxial layer 3, then silicon nitride film (not shown) is formed in thickness of 70 nm to 150 nm, further a silicon oxide film 400 nm thick (not shown) is formed. Subsequently, patterning of a photoresist (not shown) is applied through photolithography, and then a part of three layer structure consisting of a silicon oxide film, a silicon nitride film and a silicon oxide film is removed by dry etching. After removing the photoresist, a groove for trench separation which reaches silicon substrate 1 is formed by using the uppermost silicon oxide film as a masking material. Then, by ion implantation of boron with energy 100 KeV, dose 1E13 cm -2 and activation heat-treatment, buried layer 4 for channel stopper use is formed. Following which, insulation (such as polysilicon or silicon oxide film) is deposited as a filler in the inside of the trench. Here, description will be made using BPSG as material to be deposited. After depositing BPSG (not shown) in thickness of about twice the width of the trench (for example, 0.8 µ m to 1.5 µ m, here it will be described for width 1 µ m), heat-treatment (for example, 1000°C, 1 hour) is applied to flatten the surface. Then, going through etching back of the insulation film, removal of silicon nitride film by heated phosphoric acid and removal of silicon oxide film by HF base liquid, the surface of silicon collector layer 3 1 is exposed. Conditions of these etching back operation is selected so that the final surface subjected to etching back operation becomes flat. Then, the surface of silicon collector layer 3 1 is covered with silicon oxide film 6. The preferable film thickness is 50 nm to 200 nm, here it is 100 nm. Subsequently, polysilicon is deposited. As thickness of polysilicon to be deposited, 200 nm to 350 nm is appropriate, and here it is 250 nm. Since this polysilicon is used as base electrode polysilicon in some day, boron is supplied by means of the ion implantation method (for example, 30 KeV, 5E15 to 2E16 cm -2 ) and heat-treatment is performed for activation. Then, after finishing patterning of the photoresist, unnecessary polysilicon is removed by dry etching, thus producing P + type base electrode polysilicon 7. Then, silicon nitride film 8 of about 150 nm thick is deposited by an LPCVD method (thickness of silicon nitride film is appropriately 100 nm to 200 nm). Fig 5(a) and 5(b) are illustrated to a similar size, but their actual lateral dimensions are quite different, that is, a distance between trenches is about 100 µ m in Fig. 5(a), but it is as small as about 10 µ m in Fig. 5(b). This situation is expressed in Fig. 5(a) (a diffusion check transistor for characteristic check) and in Fig. 5(b) (a minute dimension transistor to be processed into a product to be used in a circuit). Next, an opening is formed in photoresist 20 (Fig. 6(a) and (b)) by a normal photolithography at the part where an emitter is formed in future, and then silicon nitride film is removed by the anisotropic dry etching method. This state is shown in Fig. 6(a) (a diffusion check transistor) and Fig. 6(b) (a transistor of a minute dimension to be processed to the product). At this time, although the film thickness of silicon oxide film 6 (Fig. 6(a)) of the part not covered by base electrode polysilicon 7 is somewhat decreased, it does not become a problem as far as silicon collector layer 3 1 is not exposed, and hence drawings are made irrespective of the decrease of the film thickness. Next to the above, the base electrode polysilicon is removed by dry etching and the photoresist is removed. This state is illustrated in Fig. 7(a) (a diffusion check transistor) and Fig. 7(b) (a transistor with a minute dimension to be made to a product). Further, silicon nitride film is deposited in thickness of 50 nm to 100 nm by the LPCVD method. Here, the anisotropic dry etching is again applied to silicon nitride film of the bottom part of the opening to remove it completely. As a result, the side of base electrode polysilicon 7 in the inside of the opening is covered with silicon nitride film 8. This state is illustrated in Fig. 8(a) (a diffusion check transistor) and Fig. 8(b) (a transistor with a minute dimension to be made to a product). Then, silicon oxide film 6 in the bottom of the opening is etched by the HF base etching liquid to expose a part of silicon collector layer 3 1 which constitutes the collector region and thus opening 101 for preparing the base is formed. The dimension of the under surface of the base electrode polysilicon exposed through etching of silicon oxide film 6 is sufficient with a dimension which is smaller than the film thickness of the base electrode polysilicon. For example, 100 nm to 250 nm is appropriate, here it is selected as 200 nm. This state is illustrated in Fig. 9(a) (a diffusion check transistor) and Fig. 9(b) (a transistor with a minute dimension to be made to the product). At this time, with the transistor for diffusion check, as can be seen in Fig. 9(a), opening 101 is formed such that one side of which is positioned on trench 5. Subsequently, an intrinsic base is formed by a selective epitaxial growth method in the same way as in the conventional technique. From viewpoint of growth, such as the LPCVD method or the gas source MBE method is applicable, but here a UHV/CVD method will be employed for description by way of an example. An example of the processing condition is Si 2 H 6 flow rate 3 sccm, temperature 605°C. At this time, P type single crystal silicon base region 9 is formed on the exposed portion of silicon collector 3 1 , as shown in Fig. 10. At the same time, P type polysilicon layer 10 is formed from the under surface of the pushed out part of base electrode polysilicon 7 toward silicon collector layer 3 1 which constitutes the collector region. These base region 9 and polysilicon layer 10 continue their growth until they contact with each other, and the transistor to be made to the product becomes to show opening 104. Succeedingly, deposition of the silicon oxide film by LPCVD and anisotropic dry etching are performed to form a side wall of silicon oxide film 11, thereby reaching a state with which opening 101 is shown in a diffusion transistor and opening 102 is shown in a product. This state is illustrated in Fig. 10(a) (a diffusion check transistor) and Fig. 10(b) (a transistor with a minute dimension to be made to the product). Following which, collector probe opening 201 and emitter probe opening 301 are formed by photolithography and dry etching. At this time, it must be arranged that emitter opening 101 and emitter probe opening 301 at least overlap on trench 5. This reason is that a trench in emitter opening 101 and a trench in emitter probe opening 301, both trenches for receiving N + type polysilicon which are to be buried therein in the later process, are required to be connected with each other. In this case, insulation buried in the trench somewhat sink at the overlapped position. This state is illustrated in Fig. 11(a) (sectional view of the diffusion check transistor), Fig. 11(b) (plan of the transistor with a minute dimension to be made to a product) and Fig. 12 (sectional view of the transistor to be used in a circuit). Further, polysilicon 12 added with N type impurities (for example, phosphorus or arsenic) is deposited by the LPCVD method. Here, phosphorus about 5E20cm-3 is added. The thickness of polysilicon is appropriate when it is in a range of 1.5 times to two times the dimension of emitter opening 101, that is, 600 nm to 1000 nm. Here, it is determined as 8000 nm. This state is illustrated in Fig. 13(a) (a diffusion check transistor) and Fig. 13(b) (a transistor of a minute dimension to be made to the product). Consecutively, etching back of polysilicon is performed, and further base probe opening 401 is formed by the photolithographic process and the dry etching process to expose base electrode polysilicon. Then, through the heat-treatment for emitter push-in, N type emitter region 13 is formed with single crystal silicon in base region 9 enclosed by side walls of silicon oxide film 11. In his way, the diffusion check transistor of the first embodiment shown in Fig. 3(a), (b) is formed. All probe openings 201, 301, 401 of the transistor shown in Fig. 3(a) have large sizes which allow direct probing, and emitter region 13 has a minute dimension such as 1 µ m or less, for example, 0.2 to 0.6 µ m, realizing the dimension same as that in the circuit. Therefor at this stage, the emitter forming condition is directly measured and when the emitter push-in is insufficient, additional emitter push-in is applied. The surface of the transistor (Fig. 4(a)) is successively covered with the insulation film (for example, silicon oxide film), and on the transistor to be made to the product, contact holes which reach emitter, base and collector electrode polysilicon are formed, then after sputtering aluminum base alloy, photolithography and anisotropic dry etching is applied to produce an emitter electrode, a base electrode and a collector electrode which are all of an aluminum base. Here, improvements of the characteristics promoted by the present invention compared to the conventional technique is described. With a series of the process of the present invention, it has become possible to produce the transistor without having the photolithographic process to be employed in processing the emitter electrode polysilicon, and further it has become possible to confirm the characteristic of the transistor on the way of the diffusion process, the transistor having the emitter of the same size as the emitter of the transistor to be actually used in the circuit. A second embodiment of the present invention will be described with reference to the drawings. Fig. 14 shows a longitudinal section of a diffusion check transistor for use for measure according to the second embodiments of the present invention. Basically, it is the same as the first embodiment and differs only in a base portion. In other words, it is a layered film composed of a base produced by the selective epitaxial growth and a silicon layer for forming an emitter by diffusion in future, the base being P type SiGe alloy (for example, the whole alloy comprises uniform Ge density of 10 %; and in order from the bottom: 100 angstrom layer 1nm = 10 angstrom, no boron added; boron addition region: 400 angstrom layer, boron 7E18 cm -3 ), the silicon layer being of a structure, for example, 200 angstrom, no boron added. This layered film is intrinsic base layer 29. Of course, addition of Ge, boron to multicrystal layer 30 concurrently formed is varied according to the constitution of this layered film. Although the second embodiment has an advantage that it is easy to increase current amplification factor hFE, at the same time it is susceptible to the influence of a leak current from the collector-base junction which may be caused by lattice inconformity, and hence it is important to perform monitoring on the way of the diffusion process as in the present invention. Next, a third embodiment will be shown in Fig. 15. In the present embodiment, the intrinsic base is formed by the diffusion method. In other words, base electrode polysilicon 37 is covered with insulation film (for example, silicon nitride film) 38. Graft base 39 is formed by boron diffused from base electrode polysilicon 37 which contacts silicon collector 3. Intrinsic base 40 is formed by the ion implantation method. Emitter region 42 is formed by diffusion of N type impurities from emitter electrode polysilicon 12 on the intrinsic base within the region enclosed by insulation film (for example, silicon oxide film) 41. Advantages of the present embodiment will be described below. In the first and the second embodiments, parts of the sides of intrinsic base 9 and 29 positioned above trench 5 are covered with insulation film (for example, silicon oxide film) 11. However, if the covering is insufficient, emitter electrode polysilicon 12 contacts the sides of the intrinsic bases, resulting in diffusion of N type impurities generated from the side of the intrinsic bases. Consequently, an emitter region formed on the sides is caused to contact the silicon collector with a risk of the transistor malfunction. On the contrary, in the present embodiment, since ingredients of the base and the emitter are diffused into silicon collector 3 in order, there is no risk of a short circuit to be generated between the emitter region and the silicon collector. A fourth embodiment of the present invention will be described with reference to Fig. 16. In the present embodiment, emitter opening 101 and emitter probe opening 301 are connected by means of two or more trenches. Since the resistance is decreased because of the increased junctions between the two openings, the influence of the voltage drop can be removed to bring the merit for the present embodiment. As described above, according to the present invention, it has become possible to produce the transistor without having the photolithographic process to be employed in processing the emitter electrode polysilicon, and further it has become possible to confirm the characteristic of the transistor on the way of the diffusion process, the transistor having the emitter of the same size as the emitter of the transistor to be actually used in the circuit.

Claims: A method of manufacturing a semiconductor device, comprising the steps of: forming a diffusion check bipolar transistor for measuring during a manufacturing process; measuring characteristics of the diffusion check transistor at a predetermined stage of manufacturing; adjusting a depth of an emitter region (13) in an intrinsic base (9) according to the result of the measuring, wherein said step of forming a diffusion check transistor comprises the steps of: forming a buried layer (2) of a first conductive type on a substrate (1) of a second conductive type; forming a single crystal region of a first conductive type on said buried layer (2); forming a device separation trench (5) which extends from a surface of said single crystal region (3 1 , 3 2 ) into the substrate to separate a first single crystal region (3 1 ) for a collector from an adjacent single crystal region (3 2 ); forming a channel stopper (4) made of a second conductive type at the substrate side tip of said device separation trench (5); filling insulator in said device separation trench (5) and flattening a surface of the filled insulator; forming a first insulator film (6) on said first single crystal region (3 1 ); forming a base electrode (7) on said first insulator film (6); insulating a surface of said base electrode (7) by using a second insulator film (8) (i) removing a portion of said first insulator film (6) near said base electrode to expose a portion of said first single crystal region; forming the intrinsic base (9) on or in the exposed portion of said first single crystal region (3 1 ); forming a collector probe opening (201) which is adjoining to the first single crystal region (3 1 ) and extends from said second insulator film (8) to an inside of said buried layer, and an emitter probe opening (301) formed through a thickness of said adjacent single crystal region (3 2 ), wherein said emitter probe opening (301) allows a probing needle to contact at the adjacent single crystal region (3 2 ) which is used as another collector layer; forming first polycrystal silicon walls (12-b, 12-a) of the first conductive type, respectively, on inner walls of the collector probe opening (201) and the emitter probe opening (301); wherein said first polycrystal silicon walls (12-a) on the inner walls of the emitter probe opening extend over the device separation trench and over the emitter (13) region. A method of manufacturing a semiconductor device according to claim 1, wherein said step of forming the diffusion check transistor further includes a step of forming a third opening (401) for probing the base of said diffusion check transistor in the single crystal region, and coating inner walls of said third opening with the first polycrystal silicon (12) of the first conductive type. A method of manufacturing a semiconductor device according to Claim 1 or 2, wherein said step of forming the intrinsic base uses a multilayered film composed of SiGe alloy and Si. A method of manufacturing a semiconductor device according to Claim 2, wherein the steps of forming the inner walls of said first, second and third openings are executed concurrently. A method of manufacturing a semiconductor device according to claim 1, further comprising the skps of: forming a collector as a first single crystal region (3 1 ) of a first conductive type which is electrically insulated from other region by an insulator, an intrinsic base formed as a third single crystal region (9) of a second conductive type which is provided on said first single crystal region (3 1 ), and an emitter formed as a fourth single crystal region (13) of the first conductive type which is provided on the third single crystal region (9), wherein said semiconductor device further including: a fourth opening (202) opened within the first single crystal region (3 1 ) and buried by the first polycrystal silicon of the first conductive type (12). A method of manufacturing a semiconductor device according to Claim 5, wherein the second conductive type third single crystal region (9) is made of a multilayered film composed of SiGe alloy and silicon. A method of manufacturing a semiconductor device according to Claim 5 or 6, wherein first polycrystal silicon (12) which buries said fourth opening (202) and said emitter opening (103) are formed simultaneously.

Inventors: SATO FUMIHIKO, SATO, FUMIHIKO
Applicants: NIPPON ELECTRIC CO, NEC CORPORATION
Application year: 1997
Main classification: H01L29
IPC codes: H01L21, H01L23, H01L29