DURABLE PLASMA TREATMENT APPARATUS AND METHOD

Abstract: A method and apparatus for treating a work surface, wherein there is provided a chamber having a longitudinal axis and longitudinally extending electrically conductive sidewalls, at least one sidewall having at least one longitudinally extending gap that interrupts a current path through the sidewalls transverse to the longitudinal axis, and wherein the chamber is sealed to allow pressure inside the chamber to be controlled. Also provided is an axially-extending array of current-carrying conductors which at least partially encircle the chamber, are transverse to the longitudinal axis, and establish a magnetic field parallel to the longitudinal axis of the chamber, and a power supply connected to the conductor array and adapted to provide high-frequency current in the conductors to magnetically induce ionization of the gaseous material in the chamber and form a plasma sheath that surrounds and extends along the longitudinal axis and conforms to the sidewalls of the chamber, and wherein the work surface is exposed to the plasma sheath and extends in the direction of the longitudinal axis.

Description: DURABLE PLASMA TREATMENT APPARATUS AND METHOD Field of the Invention The instant invention relates to apparatus and methods for generating intense plasmas useful in chemical vapor deposition, etching and other operations. In one important embodiment, the invention relates to a vapor deposition system in which a plasma is used to deposit large-area diamond films. Background of the Invention Prior art chemical vapor deposition (CVD) processes for the production of diamond films include DC torch, microwave, hot filament and rf plasma techniques. Generally, the prior art techniques deposit diamond over a rather small area and/or at slow deposition rates, with the result that film costs have been high. A recent patent application (U.S. Serial No. 08/361,667, filed December 22, 1994) teaches a novel method and apparatus for the generation of a large-area high-frequency induction plasma and for the presentation to that plasma of a large- area work surface onto which diamond can be deposited in large areas and at reasonably fast rates. The diamond is deposited in a chamber which is encircled by high frequency current on paths that are substantially transverse to, and arrayed along, the axis of the chamber. A plasma sheath generated within the chamber surrounds and extends along the axis of the chamber and conforms to the sidewalls of the chamber. A work surface also extends along the axis of die chamber and is exposed to the plasma sheatii, preferably at the outer boundary of the plasma sheath along the chamber sidewalls. In a specific method and apparatus disclosed in the recent patent application, the chamber comprises dielectric walls (for example, made from quartz) to allow penetration of magnetic and electric fields into the chamber. The present invention extends the benefits realized from the earlier invention by providing a chamber structure (for example, made from metal) that is highly durable, even at elevated temperatures developed during operation of the system at a high power level. Summary of the Invention In brief summary, apparatus of the invention generally comprises: a chamber having a longitudinal axis and longitudinally extending electrically conductive sidewalls, e.g., made from a metal such as copper or aluminum; at least one sidewall has at least one longitudinally extending gap that interrupts a current path through the sidewalls transverse to the longitudinal axis; enclosure means sealing the chamber to allow pressure inside the chamber to be controlled; means for providing a gas in the chamber; an axially extending array of current-carrying conductor paths that at least paπially encircle the chamber, are transverse to the longitudinal axis, and establish a magnetic field within the chamber parallel to the longitudinal axis of the chamber; a power supply connected to the conductor array and adapted to provide high frequency current in the conductor paths to magnetically induce ionization of the gaseous material in the chamber and form a plasma sheath that surrounds and extends along the longitudinal axis and conforms to the sidewalls of the chamber; and a work surface that extends in the direction of Λe longitudinal axis. Preferably, for operations in which a high temperature is desired in the plasma chamber, the work surface is contacted by means for conducting heat away from the work surface; e.g., a thermally conductive layer is disposed between the work surface and the chamber sidewalls, which are generally metal; and hollow conduits are formed in the sidewalls for circulation of a gaseous or liquid coolant. In preferred chambers, the sidewalls have a plurality of longitudinally extending gaps, so that portions or all of the sidewalls in effect comprise closely spaced highly conductive metal bars that extend along the longitudinal axis over at least a substantial part of the length of the chamber. Such a multi-gap structure niinimizes the magnitude of the voltage developed across individual gaps, thereby minimizing any tendency for arcing across the gaps. The chamber preferably has at least one large-area planar sidewall, and the plasma sheath extends over the sidewall, parallel to the sidewall. The current-carrying conductor paths preferably are electrically connected in parallel to minimize impedance in the circuit, thereby maximizing the applied current in the conductors, and in turn maximizing the magnetic field in the chamber. To further achieve low impedance, at least part of the individual conductor paths are generally comprised of wide conductive straps or large- diameter high-conductivity rods, which preferably are tubular to allow cooling of the conductors. In using the described apparatus, the work surface is exposed to the plasma sheath, preferably at the outer boundary of the plasma sheath adjacent and generally parallel to the chamber sidewall. To prepare diamond film, the gaseous material introduced into the chamber comprises diamond-precursor ingredients such as a mixture of vapors of water and alcohol or hydrogen and metiiane. Diamond film is deposited in the reactor at high volumetric production rates per unit of power input. Brief Description of the Drawings Fig. 1 is a perspective view, wkh parts broken away, of an enclosure and chamber useful in the present invention. Fig. 2 is an overall perspective view of the enclosure in Fig. 1. Fig. 3 is a sectional view along lines 3-3 in Fig. 2. Fig. 4 is a sectional view along the lines 4-4 of Fig. 2. Fig. 5 is an enlarged sectional view of one part of the enclosure of Figs. 1- 4. Fig. 6 is a perspective view of an axially extending array of current- carrying conductors, together with a diagram of a power supply useful in the invention. Fig. 7 is a perspective view, partially in section, showing another form of axially extending array of current-carrying conductor paths, i.e., a conductor strap, disposed in place, encircling a chamber. Fig. 8 is a perspective view, partially in section, showing portions of an alternative enclosure and chamber for use in the invention. Fig. 9 is a perspective view of portions of another alternative enclosure and chamber for use in the invention. Fig. 10 is a schematic plan view of other arrays of current-carrying conductors. Fig. 11 is a diagram of another power supply useful in the present invention. Fig. 12 is a perspective and exploded view of another alternative chamber for use in the invention. Fig. 13 is a sectional, schematic view of another alternative enclosure and chamber for use in die invention. Detailed Description of the Invention Figures 1-5 show an illustrative enclosure 10 for use in the present invention. The enclosure 10 comprises a chamber 11 and enclosure means 12 for sealing the chamber. The chamber 11 comprises upper and lower sidewalls 14 and 15 and shorter vertical sidewalls 16 and 17 connecting the upper and lower sidewalls. A longitudinal axis 18 extends through the chamber parallel to d e desired direction of the applied magnetic field in die chamber. The sidewalls 14-17 of the chamber 11 comprise individual closely spaced bars 20 assembled and held togetiier, for example, by insertion into sockets 21 in chamber end plates 22 and 23 (see Figures 2 and 4) and by brazing of the bars to die socket walls. The bars 20 are preferably planar on at least dieir inner sidewall, and preferably are rectangular in cross-section, so as to establish a more continuous and planar inner sidewall surface and allow close spacing between d e bars. Gaps or slots 19 lie between the bars. Advantageously, cylindrical bores 24 are formed in the bars, and a liquid coolant, generally water, can be passed dirough d e bores 24 to cool the bars. The illustrated chamber is formed as two chamber halves (a base plate and a rectangular domed structure resting on the base plate) which can be conveniendy separated for access to die interior of the chamber. The end plates 22 and 23 are divided in two, having lower portions 22a and 23a and upper portions 22b and 23b (see Figs. 2 and 4). The bars 20 forming the lower sidewall 15 engage in sockets 21 of lower portions 22a and 23a, and together, die bars 20 of the lower sidewall 15 and me end plates 22a and 23a form a lower base plate for the chamber. The remaining bars, comprising the domed top half of me chamber, engage in sockets 21 of upper portions 22b and 23b. The assembled base plate is grooved around its outer perimeter to receive an O-ring 25 against which the lower edge of the domed top half of me chamber is pressed and held by a fixture (not shown). Instead of being formed from individual bars, the sidewalls of the chamber can comprise plates formed or cut wim a plurality of gaps or slots extending over a substantial portion of me leng of me plates so as to in effect subdivide me plates into a plurality of bars or bar-like elements, which extend in die direction of me longitudinal axis 18. The bars 20 should comprise a conductive metal and also be mechanically strong. The preferred metal is copper, but silver, aluminum or brass could also be used. Almost any mechanically durable and formable material could be used, including carbon steel and stainless steel, especially if mey are silver- or copper- plated to provide high conductivity around their circumference. The enclosure means 12 of the illustrative enclosure 10 comprises dielectric plate 26 on the top of me chamber, dielectric plate 27 on the bottom of me chamber, and dielectric plates 28 on each of me two vertical sides of me chamber. The previously mentioned chamber endplates 22 and 23 also have an enclosing function. Holes 29 are formed in me end plates to allow introduction of a coolant to me bores 24. A dielectric material such as quartz or tempered glass can be used for me sideplates 26-28 to allow penetration of a magnetic field into die chamber. The endplates can also be dielectric, but typically are metal to allow convenient machining of the sockets 21 and holes 29, and to better achieve mechanically strong attachment to me bars inserted into me sockets 21. Structure for introduction and evacuation of gas is also included in the endplates in the illustrated chamber 11. As shown in Figs. 2 and 4, a mbe 30 is fused to the endplate 22 and serves as an outlet port; and a be 31 is mounted in e endplate 23 to serve as an inlet port. Tube 31 extends toward me center of the chamber 11, and in diis illustrative case, as shown in Fig. 4, circular openings 32 near the end of me inlet mbe 31 assist gas to be distributed more uniformly in me chamber and mereby contribute to a more uniform treatment or deposit on a work surface in me chamber. Alternatively to the illustrated arrangement, outlet mbe 30 and inlet mbe 31 may be coaxially mounted in me same endplate. Also, gas can be introduced and/or evacuated through a plurality of ports arranged to increase uniformity of gas distribution in the chamber. Gas can be introduced through ports in the side plates as well as or instead of in the end plates. Altiiough the gaseous material acted on by the plasma generally enters me chamber as a gas, a solid or liquid diat sublimes or vaporizes once it is in the chamber may also be used. The tubes can be water-cooled when diey extend into the central plasma region to protect them from the high heat flux produced by an intense plasma. Chambers used in the invention may have a variety of shapes, but preferably have at least one extensive substantially planar surface which serves as a work surface or supports a work surface. In die chamber 11, the upper and lower sidewalls provide planar work or work-support surfaces, as do, to a lesser extent, the vertical sidewalls. The planar surface is interrupted by the gaps or slots, and could be configured, e.g., with a network of ridges on me interior surface of the bars. Such configured or interrupted surfaces are regarded as planar herein, since me length and widtii of the surfaces are far greater than any diickness or height dimension. The larger the planar surface, me larger me area of a planar film that can be deposited or me larger the planar surface that can be treated. The planar surface is preferably at least 100 cm 2 in area and more preferably 500 or 1000 cm 2 or larger, e.g., 1 or 2 m 2 in area or larger. Surfaces being treated or on which a deposit is being made need not be parallel to the longi dinal axis, as when, for example, diamond is deposited on an array of cutting tools. A chamber that is rectangular, as in e case of chamber 11, is preferred for some applications, because a large-area planar film can be deposited on bom the large-area sidewalls 14 and 15 of me chamber. Deposits also occur on the shorter sidewalls 16 and 17, but less effectively as will be subsequently discussed. "Sidewalls" refers to walls that extend in me direction of me longitudinal axis (ti ough they may at the same time extend toward me longitudinal axis, as in the case of slanted end-portions used for some chambers). The sidewalls surround me longitudinal axis in that diey form at least part of the lateral portions of the chamber through which the longitudinal axis extends; typically die sidewalls are parallel to and spaced from the longitudinal axis, though in some constructions, e.g., in the case of slanting end-portions, uiey may intersect the longitudinal axis at some point. The size of an enclosure or chamber useful in the invention is limited only by me mechanical integrity necessary to widistand the atmospheric pressure applied to die outside of die enclosure or chamber and a need for me chamber to be substantially shorter uian die characteristic wavelength at the operating frequency. At 10 Mhz, the characteristic wave lengtfi is about 30 meters. The aspect ratio, i.e., the ratio of the widd to me height of the chamber preferably is at least about 2:1, more preferably at least about 5:1, most preferably about 10:1 or larger. The enclosure is preferably capable of maintaining an internal pressure of less uian about 100 Torr, more preferably less than about 10 Torr, most preferably about one Torr or less. Means for controlling die pressure in the enclosure, not shown, can include, for example, butterfly control valves, mass flow controllers, and vacuum pumps, and a pressure measuring device, such as a capacitance manometer, all of which is well known to tiiose skilled in the art. A water jacket or oϋier cooling means, not shown, may be included, around die exterior of the enclosure, for example to cool dielectric plates diat enclose or seal die chamber. Fig. 5 is an enlarged view of part of die sidewall 15 of the chamber 11, including one illustrative work surface arrangement in die chamber. Because liquid coolant cools the sidewalls, it is preferred in many uses of apparatus of die invention to separate the work surface from the cooled sidewall, and such means are illustrated in Fig. 5. In diis illustrative case, individual quartz plates 34 are adhered to ie inner surface of individual bars 20 by an adhesive tape 35. A work surface such as a silicon wafer 36 is disposed on die plate 34. The wafer 36 faces die plasma; and die work surface on die wafer is desirably quite hot, e.g. 800°C or more for diamond deposition (temperatures ranging between 700 and 900 °C, most preferably 800-850°C, are considered optimum for diamond deposition). The wafer body and quartz plate in part insulate the work surface of the wafer from die bar, which may be at a temperature of 50°C, for example. To maintain die work surface of the wafer or other work surface structure at a desired temperature, it may be desired to conduct some heat from the work surface to die bar, and diis has been done effectively with an adhesive tape 35 diat is diermally conductive. Akhough die plate 34 is shown as having a width coextensive widi die wid i of the electrically conductive bar 20, in fact, die plate can extend over two or more of the bars and diereby cover die gaps or slots 19. Similarly the wafer can be wider dian die widdi of die bar 20. In fact, a quartz plate or wafer can cover the whole extent of d e sidewall provided it does not, through contact, provide an electrical connection between any two bars. FIG. 6 shows an illustrative power applicator 38, or antenna, which generally encircles or surrounds an enclosure such as die enclosure 10 and applies plasma-generating power to die gaseous contents of the chamber 11. The applicator comprises current-carrying conductors 39, resonated by a capacitor bank comprising capacitors 40. There may or may not be one capacitor for each conductor 39, depending on die total capacitance needed and me power level to be applied. In combination, an individual conductor 39 and die capacitor bank to which it is connected form a conductor loop, and die individual conductor loops are electrically connected in parallel through bus bars 41 and 42. The applicator 38 is shown separately from a chamber for convenience, but the chamber generally lies witiiin die conductor loops, wi i the longimdinal axis of die chamber substantially perpendicular to die plane of die individual conductor loops. The "U" - shape for conductors 39 is desirable for enclosing chambers that are more wide tiian high, as useful for large-area planar depositions. The conductors are desirably of a large diameter so as to minimize impedance. To carry out die invention, current flow is induced in die plasma gas, producing heating, ionization, and dissociation of die gas. The magnimde of die current flow in the plasma gas is proportional to the current flow in die current-carrying conductors. For any current-carrying conductor, d ere is an impedance to alternating current flow which increases widi die resistance of die chosen conductor and which increases widi ωL, where ω is equal to 2 π f and "f" is the operating frequency, and L is the inductance. To maximize current flow for any given applied voltage level requires that high conductivity materials be chosen and diat the inductance of the current-carrying conductors be kept low. Such a condition is achieved in die apparatus shown in Figure 6 where large-diameter conductors are used, and the conductors are arranged as individual loops electrically connected in parallel and arrayed along die longimdinal axis of the chamber. The conductors are preferably formed from high conductivity metals (e.g., silver, copper, aluminum, or brass) to reduce power loss. As a practical matter, copper or silver-plated copper is generally used, but silver-plated brass or aluminum can also be used. Conductors in a tubular form, i.e., with an internal conduit, are desirable to allow cooling fluid to circulate witiiin d e conductors. Tubes having a diameter as small as about 0.5 to 1 cm are useful for low-power applications, and as large as about 2.5 cm (one inch) or higher for high-power applications. A bus bar, not shown, may be connected across the midpoint of die array along d e lengtii 39a of d e conductors 39 and connected to ground, tiiereby establishing a symmetrical voltage about a ground reference, should ύϋs be desired. A ground connection may be provided to reference any part of d e applicator to ground as well known in die art to achieve either symmetrical or asymmetrical voltages about a ground reference. The conductor loops are transverse to die longimdinal axis of the chamber. In Figure 6, die planes of d e conductor loops are perpendicular to die longimdinal axis and evenly spaced. In odier configurations the conductors can be spaced irregularly as shown in FIG. 10(b) and (c), e.g., to achieve desired plasma configurations and intensities. Chevron configurations as shown in FIG. 10(e) or combinations of parallel and chevron configurations as shown in FIG. 10(d), can be used. Also multiple current-carrying conductors, widi one conductor loop overlying or surrounding anotiier as shown in FIG. 10(f), may be used. Series- wound coils such as helical coils, preferably wound as a rectangular or square helix, may also be used. The higher inductance of such series-wound coils may limit the current flow in current-carrying conductors and thereby restrict die maximum value of transferred power; but odierwise such coils would be useful at power levels below the maximum. Solid elements such as low-resistivity metal strapping, preferably 0.5 cm or 1 cm wide and more preferably 2 to 5 cm wide or wider, can also be used, as illustrated in Figure 7. The apparatus of Figure 7 includes a chamber as picmred in Figure 2, and a power applicator in die form of a single, U-shaped strap- conductor 39' disposed around die chamber. A bank of capacitors 40' is electrically connected between die open ends of die U-shaped strap, and power is supplied dirough leads connected to die ends of die strap in the manner picmred in Figures 6 and 10. The strap 39' encircling d e chamber has an axial dimension, and provides an axially extending array of current patiis around die chamber. Straps advantageously provide a low impedance, leading to higher current flow for equivalent applied voltage and power. The impedance of die applicator should preferably be matched to die impedance of me rf power supply. A single strap encircling die chamber and having a widdi as great or greater tiian the lengtii of die desired plasma along die longimdinal axis of die chamber is quite effective in achieving good power transfer to die plasma. The strap enables the redistribution of current along d e longimdinal axis of me chamber, to achieve more uniformity of current distribution. Also, die single-strap conductor provides a magnetic field tiiat is axially more uniform than readily achieved widi multiple-turn coils. Cooling can be provided by gun-drilled internal passages or by fins or cooling tubes welded to die strapping, but is not needed when die strap remains sufficiently cool during use, e.g., because of die large surface area of die strap. The current-carrying conductors of die power applicator may be embedded in, or lie against, the surface of an enclosure or chamber having sufficient electrical insulation to separate the conductor of die power applicator from the conductive sidewalls of die plasma chamber. Preferably the current-carrying conductors are free-standing and spaced from the enclosure, which permits easy placement and removal of the enclosure witiiin me applicator. Such an arrangement permits an applicator to be conveniently used sequentially widi multiple enclosures. When the current-carrying conductors are spaced from the enclosure, tiiey preferably are witiiin about 1 cm(l/2 w ), more preferably within about 0.25 cm (1/10"), from the outer chamber wall and configured to die shape of d e chamber. Although it is preferred tiiat d e conductor loops completely encircle the chamber, the invention may also be practiced widi conductors that partially encircle or pass through the container, e.g., with the lengtii 39a of die conductors 39 passing through the center of die chamber (electrically insulated from the electrically conductive chamber sidewalls and surrounded by seals to maintain control of pressure) and perpendicular to die longimdinal axis of die chamber. A plasma sheath will be generated witiiin the chamber between the conductors and die sidewalls of die chamber that lie witiiin the conductor loop. High-frequency current in the applicator produces a high-frequency magnetic field that extends tiirough the chamber parallel to the longimdinal axis. The magnetic field induces a current in die conductive bars, which flows around die circumference of each bar transverse to the longimdinal axis of d e bar, as shown by die arrows 44 in Figs. 3 and 5. The currents flowing in the conductive bars serve to screen die magnetic field from die interior of the bars, but the gaps or slots allow the applied magnetic field to penetrate into the interior of the chamber. The currents flowing in the conductive bars also establish a magnetic field component in the chamber volume. The net of these effects results in a field pattern in the chamber modified so tiiat it appears to come from an applicator that is closer to the chamber by a distance approximately equal to die thickness of the bars, and this improves the uniformity of the plasma (this is the so-called flux concentrating effect). The chamber sidewalls serve to shape and confine die plasma generated. Witiiin the chamber 11 the magnetic field is uniform and intense in comparison to the magnetic field generated outside d e applicator and outside d e chamber 11. Notwidistanding that the sidewalls are electrically conductive, a plasma is generated by d e magnetic field and is bounded by die sidewalls. The applicator should have a widdi sufficient to cover a substantial portion of the length of the chamber so as to generate a plasma over a substantial part of the length of the chamber. Similarly, the longimdinally extending gap or gaps should extend over the length of die chamber to contribute to formation of a plasma-generating magnetic field extending over a substantial part of the length of die chamber. Generally the applicator will have a widdi equal to at least 50 percent of the length of die longimdinally extending gap(s), and preferably at least 65 percent or 75 percent of the length of the gap(s). On the other hand, electric power that is dissipated by heating end walls (e.g., 22 and 23) that connect the electrically conductive bars is generally wasted, and therefore there is generally no benefit with chambers as illustrated in Figures 1-5 for the applicator to have a widdi greater tiian 90 percent of the length of die longimdinally extending gap(s). The plasma generated generally has a length somewhat less than the width of the applicator. If the end plates are made of a dielectric material and the gap(s) extend to the end plates, or in die case of the "picture frame" construction of Figure 9, where the gaps extend through die end of the chamber, the applicator can extend die full length of the gaps and d e magnetic field lines can enter and leave the applicator through the gaps. In this case the whole area of the chamber walls can be used for treatment or deposition. Fig. 8 shows an alternative chamber 46, which is also useful in die invention. The chamber 46 comprises sidewalls 47, 48, 49 and 50 which, except for a single longimdinally extending gap or slot 51, are continuous (e.g., made of plates fused togedier where joined; or extruded or cast as a unitary piece). When disposed in die magnetic field produced by an array of conductor loops such as die array of conductor loops shown in Fig. 6, a current 52 is induced in the sidewalls. As seen, the current 52 travels around die outer perimeter of the sidewalls, and because die slot 51 interrupts the current patii, die current returns on die inner surface of die chamber to form a continuous closed-loop current path. The current along die inner surfaces of the sidewalls develops a magnetic field in the interior of the chamber, and the field is generally the same as the field that would have been developed by d e array of conductor loops if the metal conductive chamber 46 were replaced by a dielectric chamber. To assure against dielectric breakdown across the gap 51, an electrical insulator, such as Teflon or quartz, may be disposed within the gap. Also, enclosure means to seal the gap, such as a glass plate adhered to die outside of the sidewall 50 and end plates to close die ends of die chamber, allows pressure to be controlled witiiin the chamber. In other embodiments, two or more gaps or slots may be used in die sidewalls. The multi-gapped chamber of Figs. 1-5 is preferred, especially for high-power applications. The multiplicity of gaps divides die voltage between die gaps and hence reduces die possibility of undesirable arcing across d e gaps. Such arcing is a particular concern for high power levels, where d e voltage across a gap can be large. The widdi of die gaps or slots is desirably kept small to minimize exposure of the dielectric enclosure plates (e.g., 26, 27 and 28). Preferably, the gaps or slots are less tiian 20 millimeters wide, and more preferably are about 1 to 5 millimeters wide. The gaps may be filled widi electrical insulation or may be unfilled. Enclosure means in the form of plates covering and sealing the slots are convenient and effective, and provide a compact structure. A tempered glass plate is desirable because of its dielectric character, allowing magnetic field from me applicator to penetrate into the chamber. Because of the cooled nature of the sidewalls of die chamber, and die narrow span of die slots, lower-temperature- resistant dielectric materials can be used such as a tempered glass or polycarbonate. Other useful enclosure means include a self-supporting housing totally surrounding die plasma chamber, which may also enclose the power applicator. Another alternative enclosure 53 is shown in Fig. 9. The enclosure 53 comprises a stack of sidewall elements 54, each of which comprises four bars connected together like a picture frame, i.e., so as to describe the four sides of a rectangle and surround an interior space. Endplates 55 and 56 are at die ends of die stack. The elements 54 are stacked in close spacing with one another, separated by 0-rings (not shown) having a rectangular shape that generally matches e rectangular shape of the elements 54. The stack is held in compression by connectors (not shown) that pass tiirough the endplates and elements 54, or tiiat alternatively engage die endplates in a clamping type means. Bores 54a are provided in die bars of die elements 54 for circulation of a coolant. The enclosure 53 is disposed witiiin the conductor array of an applicator as shown in Fig. 6, with me longimdinal axis 18 of the enclosure transverse to the conductor loops of die applicator. Enclosure means such as a dielectric plate 57 at the bottom of the array and another dielectric plate (not shown) at the top of the array allow pressure to be controlled in the chamber, and inlet and outlet means to introduce and remove gases can be provided in the manner shown in Figure 2. Charged species exist witiiin the gaseous contents of the chamber, initiated for example by the electric field penetrating through die gaps 19 into the chamber, or by an ion-producing device disposed witiiin the chamber, or by application of a sufficiently great magnetic field to die chamber. A useful ion-producing device, for example, may comprise a sharply pointed conductive rod made, for example, from mngsten disposed witiiin the chamber and connected to a voltage source of 100 volts or more. The charged species existing or generated in die chamber respond to die high-frequency magnetic field induced witiiin the chamber such that a current loop transverse to the longimdinal axis of the chamber is induced witiiin the gaseous material. The induced current loop forms near the radially outermost boundary of die chamber and is of lesser magnimde die greater its distance from die chamber wall (as understood in die an, die induced plasma currents are oriented so tiiat tiieir associated magnetic fields partially reduce die magnetic field produced by die current-carrying means, which is a progressively greater effect the greater the distance from the chamber wall). Work done by the induced plasma-current loop intensifies the ionization and dissociation of the gaseous species, producing an intense plasma sheath that conforms to the interior of the chamber wall. This plasma sheath extends in the axial direction of die chamber, because of die axially- extending nature of the power applicator, and because of die low pressures typically existing in die chamber. The plasma covers the sidewalls of the chamber inside of the applicator bounds, but is of lesser effect in the vicinity of the axial ends of die applicator. At planar chamber sidewalls a rati er planar plasma sheath parallel to the chamber wall is formed, and at curved chamber sidewalls a plasma sheath that follows the curved surface is formed. The plasma expands to maximize die ratio between its cross-sectional area and die length of its perimeter. Once formed, die induced current loop becomes the dominant mechanism by which the applied high-frequency power is transferred to the plasma. Increased power can be applied to cause increased dissociation and ionization. The condition in which an intense plasma is formed by die induced current loop is termed magnetically induced ionization. When a plasma is initiated solely by a magnetically induced electric field, there is generally no visible luminosity prior to die onset of magnetically induced ionization. Once induced, there is often a visible difference in luminosity from the upper and lower sidewalls of the chamber 11 toward the center of the chamber. FIG. 3 is a sectional view through the chamber 11 taken during operation of the apparams. The dots in die drawing represent die magnetically induced plasma within the chamber (actually the plasma is observed by its visible luminosity). As seen, the plasma is generally more intense or dense at its outer boundary adjacent die upper and lower chamber sidewalls, 14 and 15, and gradually declines in intensity die greater its distance from those sidewalls. ("Outer boundary" refers to die edges of die plasma sheath furthest from the center of the chamber, i.e., the edge adjacent die chamber sidewall.) The plasma density near perimeter regions of the upper and lower sidewalls (i.e., near the vertical sidewalls 16 and 17 or at the longimdinal ends of die chamber) is not as great as over more central regions of the upper and lower sidewalls 14 and 15 (if die vertical sidewalls were larger in area, the plasma density near them would also be greater; and in some embodiments the vertical sidewalls are larger and the upper and lower sidewalls are smaller). The lower plasma density near the vertical sidewalls makes them less useful for diamond deposition or other operations; while the densely packed magnetic flux lines near the upper and lower sidewalls of die chamber are very effective. For this reason, chambers having two large-area sidewalls separated by a narrow spacing are preferred for many embodiments of the invention. At some distance from the sidewalls, die plasma intensity may decline to an extent that there is hardly any visible luminosity. Plasma intensities of 10 12 electrons per cubic centimeter have been reported in die literature for magnetically induced ionizations, in contrast to electron densities of 10 10 electrons per cubic centimeter reported for plasmas generated through so-called capacitive coupling; the latter occurs, for example, when an electric field (as opposed to a magnetically induced electric field) penetrates into the chamber of an apparams of the invention and acts on die neutral gaseous contents of die chamber, e.g., during plasma initiation prior to achieving magnetically induced ionization. As can be seen from Figure 3, when gases are introduced into the chamber through a central inlet mbe, they first diffuse tiirough the relatively lower-density plasma to d e higher-density plasma sheath. Such a path for the gas is considered advantageous, for example, to facilitate formation of carbon monoxide when vaporized water/alcohol mixtures are used, as shown in earlier patent applications 07/787,891, filed November 5, 1991; 08/861,291, filed May 14, 1993; and 08/151,184, filed November 12, 1993. These patent applications, and a published PCT counterpart (WO 93/08927, published May 13, 1993) are hereby incorporated by reference. The intense plasma has many benefits. For example, it produces rapid dissociation of diamond-precursor gaseous feedstocks so as to allow rapid deposition of diamond films. The conformance and proximity of the plasma sheath to the chamber wall, where diamond deposition occurs, is advantageous because dissociated diamond-forming species need travel only a short distance to contact the work surface. The high temperatures and high electron density produced in an intense plasma can be also used in otiier ways, such as to clean surfaces, etch surfaces, to incinerate waste materials or to deposit non-diamond materials. The intense plasma of the invention can generally be exploited for many other plasma processes typically operating at a scale smaller than possible dirough the invention, or operating at plasma densities smaller than those achieved through the inventions. As previously noted, die sidewalls of die chamber can be used as a work surface, or a work surface can be supported on and generally conforms to the chamber sidewalls. Thus, die work surface is preferably disposed at and conforms to die radially outermost boundary of the plasma sheath (i.e., adjacent the sidewalls), where die plasma sheath is most intense and active; and die generally extensive work surface, which is typically planar but which may be curvilinear, is acted upon by the plasma sheath at this high intensity over a large percentage of the work surface. Large-area films can be deposited, or large-area surfaces cleaned, etched, etc. Work surfaces can also be located at otiier places in the plasma sheath, though they generally extend in die direction of the longimdinal axis (i.e., at least a major portion of the work surface extends in the direction of die longimdinal axis and preferably is parallel to the longimdinal axis) and preferably have a shape conforming to the contour of the plasma sheath. The power supply to die applicator generally may be any type known to those skilled in the art. The desired power level varies widi the pressure in the chamber and die ionization potential of the gas in the chamber; the type of deposition, etching, or cleaning, or other operation to be carried out; die rate of diroughput desired; die temperature ranges appropriate for materials and substrates being used, etc. The needed power to induce ionization can readily be determined in many cases from reported relationships between power level, pressure, and desired gases; and simple experimentation along generally understood principles can be used for nonreported materials or to further define die needed and preferred conditions. For diamond deposition using water-ethanol mixtures, power levels of about 7 watts or more per square centimeter have been sufficient to deposit diamond at a rate of about lμm/hr. (Power density is calculated by dividing the power dissipated in the chamber by the area of the longimdinally extending sidewalls of die chamber; the power dissipated in d e chamber can be measured, or it can be calculated widi ratiier good accuracy by multiplying the initial applied dc power by die efficiency of die applicator, which for an applicator of the type illustrated is generally on die order of 65 percent). Higher power densities, which increase the rates at which the atomic hydrogen and carbon radicals are generated can be used to increase the rate of diamond deposition or other operation. Power densities of 20, 50, or 100 W/cm 2 or more are contemplated for different needs and circumstances. While not rigorous, diamond-forming feedstocks such as hydrogen-methane mixtures generally require higher power densities than water- ethanol mixtures. At gas pressures less than 0.05 Torr, magnetically induced ionization is generally achieved widi power densities of two or three watts per square centimeter of chamber sidewall . RF power supply units are commercially available, for example, from Lepel Corporation (e.g., Model NO. T-40-3-DF4-TL). Schematic diagrams of other useful rf power supplies are shown in FIGS. 6 and 11. FIG. 6 shows a rf power supply 60 which provides variable coupling control. The rf power supply comprises a high voltage variable DC power source 61 connected through rf choke coil 62 to the plate of vacuum mbe 63. The switching on and off converts die dc supply energy to high-frequency energy. Vacuum tube 63 is connected to grid complex-impedance circuit 64 and primary tank coil 65, which has variable tank capacitance. Primary tank coil 65 and coupling-link coil 66 comprise the matching network. The coupling-link coil 66 is connected between die bus bars 41 and 42, which are connected to die conductor loops 39 and capacitor bank 40. FIG. 11 diagrams another rf power supply having a direct coupled circuit 74. The circuit comprises a transformer 75 from which an auxiliary source 76 supplies source energy to the oscillator filament. Inductor 77 and capacitor 78 form a decoupling circuit through which dc energy is supplied. Meter 80, resistor 81, rf choke inductor 82, variable capacitor 83, and inductor 84 comprise a grid circuit complex impedance. Vacuum mbe 85 switches the dc energy to high frequency energy, generates the rf current, and is connected to die capacitors 40 and current-carrying conductors 39 through bus bars such as 41 and 42 in FIG. 6. The connection 86 to ground affords a dc return pati from the vacuum mbe to the power supply. The power supply provides a high- frequency current to the applicator, by which is meant herein a frequency between about 60 Hz and 100 MHz, where induction-coupled plasmas have been operated using otiier applicators and applicator geometries. The power supply preferably operates at about 0.5 to 20 MHz, more preferably at about 4 to 15 MHz. Such frequencies are within the band commonly referred to as radio frequency. Government regulators have allotted 13.56 MHz for industrial uses, and tiiat is a suitable frequency for use in the invention. Power supplies operating at kilohertz ranges (e.g., 400 kHJ have also been used advantageously. Further variations of enclosures and chambers useful in the invention and illustrated in Figures 12 and 13. The chamber 90 picmred in Figure 12 comprises a top plate or sidewall 91 in which slots 92 have been cut or machined, a similar bottom plate or sidewall 93, and a collar 94 that separates the top and bottom sidewalls 91 and 93. The collar 94 can be machined from a single plate, with the side portions 94a and 94b serving as vertical sidewalls and die portions 94c and 94d serving as endwalls for die chamber 90. The portion of the collar 94 removed becomes the interior space 95 of the chamber where a plasma is generated and work performed. As seen, there are no gaps in the vertical sidewalls 94a and 94b. Bores (not shown) are drilled in the sidewalls 91 and 93 between the slots 92 for cooling water, and headers 96 are mounted on the sidewalls to distribute die water to the bores. Plugs 97 closing the ends of the bores are shown in Figure 12. Bores 98 are also formed in die sidewalls 94a and 94b; and a multitude of holes (not shown) are formed between these bores and die interior of the chamber over the length of the sidewalls 94a and 94b; reactant gases are introduced into die chamber through these holes in a direction transverse to the longimdinal axis of the chamber. Exhaust gases leave the chamber from holes 99 at the ends of die chamber through endwalls 94c and 94d. Dielectric plates (not shown) are disposed over d e outside of the sidewalls 91 and 93 to seal the chamber. The plates engage 0-rings 101 resting in grooves in the sidewalls 91 and 93. The sidewalls 91 and 93 are mounted tiirough sliders 102 carried on a rod 103 to an X-hinged apparams 104, which is pivotally centrally mounted on the collar 94. Widi this apparams, the chamber can be readily opened and closed to provide access to die chamber interior. 0-rings 105 in the collar engage the sidewalls 91 and 93 when die chamber is closed to provide a seal at the point of closure. Figure 13 shows anodier enclosure 110 of the invention incorporating chamber 111 similar to the chamber 46 show in Figure 8. In this embodiment however, the enclosure means comprises an outer container, e.g., a metal box 112 that totally encloses the chamber 111. A vacuum is maintained in die whole of die container 112, and conductors 113 are introduced tiirough rings 114 tiiat insulate the conductors from the metal wall of the container 112 and maintain the vacuum seal. Capacitors 115 resonate the system. The conductors 113 can be joined to die rear wall 115 of the container so the circuit is completed through the wall 116. Plasma is generated witiiin the chamber 111 and extends along die longimdinal axis of the chamber, which is perpendicular to die page of the drawing. Instead of die container 111, plates corresponding to die top and bottom walls Ilia and 111b could be used alone. Various feed stocks may be supplied to d e chamber depending on die function to be performed, for example, deposition of diamond or other materials, etching, cleaning, or pyrolysis. The feedstock is generally gaseous, or vaporizes to a gaseous form upon introduction into die chamber. Suitable diamond-forming feedstock gases include a mixture of alcohol and water. Alcohols suitable for use in the invention include methanol, ethanol, and isopropanol. Ethanol is a particularly preferred alcohol. The ratio of alcohol to water is preferably in the range of about 1:1.5 to 4:1, more preferably in the range of about 1:1 to 2:1, most preferably 1:1 to 1.2:1. Diamond films may be deposited onto substrates and removed to provide a self-sustaining film useful for a wide variety of purposes. Such films can be advantageously used as a heat sink or thermal spreader (owing to the combination of high thermal conductivity and high electrical insulation value for the films) in various electronic devices. Diamond films can also be used in electronic devices as field emitters, e.g., for flat panel displays or cold catiiodes. Diamond films can also be permanently deposited on a variety of substrates such as cutting tools (e.g., sharp-pointed or sharp-edged metal pieces) or abrasive products such as abrasive sheets or wheels. For depositing films other than diamond, silane-containing feedstocks can be used wid oxygen for SiO 2 deposition, widi nitrogen for Si 3 N 4 deposition, and with methane for SiC deposition; or proportionate mixtures can be used for various silicon alloys. For etching or priming, i.e., removal of surface material, the gas choice is highly dependent on die surface to be etched. For silicon surfaces, molecular H 2 can be used as well as CF 4 /0 2 mixtures. For polymeric surfaces, oxygen-rich gases such as 0 2 , H 2 0, N 2 0 or H 2 0 2 can be used. For cleaning of substrate surfaces to remove residual carbon, oil, or adhesive, oxygen-based feedstocks such as 0 2 , H 2 0, N 2 0 or H 2 0 2 are suitable. When the apparams of the current invention is used for hazardous waste destruction, the hazardous material must present itself in vapor form or be entrained in a process gas stream. For example, destruction of trichloroetiiylene can be performed by entraining the liquid in a gas stream containing 0 2 and H 2 . The resultant gas stream contains CO, HC1, and H 2 0. The HC1 and H 2 0 is condensed from the gas stream and neutralized, and die CO is burnt to C0 2 . Example 1 A polycrystalline diamond film was produced using a chamber as generally shown in Figs. 1-5 and an applicator generally as shown in Fig. 6. The chamber comprised thirty two copper bars assembled into the general configuration shown in Fig.1 , but arranged as two chamber halves (a base plate and a rectangular domed strucmre resting on the base plate) which can be conveniently separated for access to die interior of the chamber. The copper bars 20 forming the lower sidewall 15 were silver-soldered at each end into sockets 21 of copper plates 22a and 23a that form the lower portion of die end plates 22 and 23 (see Fig. 2, where die end plate 22 is picmred). Togetiier, the bars 20 of the lower sidewall 15 and die end plates 22a and 23a formed die lower base plate for die chamber. The remaining bars, which comprised die domed top half of the chamber, engaged in die sockets 21 of aluminum plates that formed die large remaining part 22b and 23b of die end plates 22 and 23; die bars were inserted into the sockets 21. The assembled base plate was grooved around its outer perimeter to receive an O-ring against which the lower edge of the domed top half of die chamber was pressed and held by a fixture (not shown). Viewing ports 88 covered witih a tempered glass were included to allow observance of the inside of die chamber during operation. The copper bars were square in cross section and had a size of approximately 1.25 inch (3.175 cm) on a side. The gap between the bars was about 1/16 inch (1.6 mm) in width. Each bar had a 3/8-inch-diameter (9.5 mm) cylindrical bore drilled in it for circulation of coolant. Overall the chamber had a flat shape, with a width of 17 inches (43 cm), a length of 30 inches (76 cm), and a height of 6.5 inches (16.5 cm). The interior of the chamber had a widdi of 14.5 inches (37 cm), a length of 26 inches (66 cm), and a height of 4.0 inches (10 cm). A one-half-inch-thick (1.27 cm) sheet of tempered glass was adhered over d e outside of each of the upper and lower sidewalls and the vertical sidewalls of the chamber. The described flat chamber lay within the array of U-shaped conductors. The power applicator consisted of a series of ten one-inch-diameter copper tubes which had been silver plated on their exterior surface. The tubes were electrically connected in parallel and had an elongated "U" shape, widi a capacitor bank electrically connected between die open ends of die "U." Each U-shaped mbe had a 24-inch-long (61 cm) top leg extending across the chamber from the top of the capacitor bank, a 10-inch-long (25 cm) vertical leg, and a 24-inch-long (61 cm) bottom leg lying underneath the described flat chamber and connecting to die bottom side of the capacitor bank. The applicator was centered around and over die chamber. The applicator array had a lengti along the longimdinal axis of the chamber of 12 inches (30 cm), so the array covered only die middle portion of the 30-inch (76 cm) length of the chamber. The longimdinal gaps between die bars were about 24 inches (61 cm) long. In an arrangement as described, a plasma is formed tiiat visibly extends over about 9-10 inches (23-25 cm) of the middle lengtii of the chamber. To provide a diermal stage upon which diamond could be produced, fused silica plates (34 in Fig. 5) which were 25- mm x 25- mm x 3.125 mm in dimension were adhered to d e copper bars using a thermally conductive adhesive tape (35) (3M Tape No. 9885). The fused silica plates were placed on the inside of d e upper sidewall, on die vertical sidewalls, and lower sidewall over a central region of die chamber extending about 25 cm along the longimdinal axis of he chamber. The fused silica plates provided a diermal impedance between die plasma and the relatively cold copper bars, which had cooling water circulating tiirough the channels totaling 47 liters per minute for the chamber. In addition, on the lower sidewalls only, 25 mm x 25 mm x 0.25 mm silicon wafers (36) were placed on top of me fused silica plates. The system was evacuated, and a gas vapor stream comprising 6 seem water vapor and 20 seem ethanol vapor was admitted to die system. An induction plasma was initiated at 0.366 Torr using a dc input power of 10 kw. The pressure and power were ramped to 0.706 Torr and 24 kW, respectively, and the water vapor flow rate was increased to 12 seem. Calorimetry on the cooling water showed the rf input power to the system to be about 16 kW. The plasma was extinguished momentarily to visually inspect the black body emission from the silicon wafers; this showed d e central region to be at about 750°C. The temperature of die copper tubes was measured at about 50°C and the fused silica plate exterior surface was calculated from the heat flux to be about 400°C. Diamond deposition was then continued for 1.5 hours, at which time the plasma was ended, the system vented, and four silicon wafers removed. The samples examined showed diamond nucleation and growth. Four additional silicon wafers were introduced in d e place of those removed, and die system re-started. The water vapor stream was increased to 17 seem, and diamond growth continued under die following conditions for 4.25 hours. H 2 O 17 seem C^O 20 seem plate voltage: 9.37 kV plate current: 2.670 A grid current: 0.342 A DC input power: 25 kW dissipated power: 17.5 kW frequency: 7.819 MHz Upon plasma termination, the samples were removed from die system and examined by SEM and Raman spectroscopy. An area about 20 cm long and 30 cm wide over die base plate showed faceted diamond crystals. The central region of this area showed larger crystal size than perimeter regions (i.e., at the extreme longimdinal ends of die area of the plasma, at the edges of which the plasma was reduced or non existent, and at die sides near die vertical sidewalls) indicating a higher growth rate in the center. Raman analysis showed a distinct 1332 cm 1 peak for material from the central plasma region while material near the perimeter region was of poorer quality. Growth rates were observed to vary between 1.3 μm/hr. in die center to 0.4 μm/hr in the perimeter region. Example 2 Apparams similar to that described in Example 1 was used to prepare polycrystalline diamond films. Silicon wafers were placed on top of the fused silica plates adhered to die copper bars of the lower sidewall. The system was evacuated and a mixed flow of water vapor and ethanol vapor was used to purge die system for about 15 minutes. A 12 kW dc-input power plasma was initiated witii a gas flow of 6 seem water vapor and 20 seem etiianol vapor. The dc-input power and pressure were ramped to 25 kW and 0.708 Torr, respectively. After 15 minutes, the water vapor flow was increased to 17 seem. The plasma was momentarily extinguished to check die temperature of die silicon wafers, which was found to be about 750-800°C. The growth conditions were re-established with the following conditions. H 2 O 17 seem CjHgO 20 seem plate voltage: 9.35 kV plate current: 2.63 A grid current: 0.34 A DC input power: 29.6 kW dissipated power: 18.0 kW frequency: 7.799 MHz Upon plasma termination, samples were removed from the system. The thickest regions showed 300 μm of diamond growth on the silicon wafers. A micrometer was used to measure the film thickness. SEM micrographs showed excellent faceting and very large crystallites (about 70-100 μm in diameter). Raman analysis showed die films to have a very sharp 1332 cm "1 line with FWHM 2.5cm 1 , but it also showed some non-diamond components. Some regions of the lower sidewall did not produce high quality diamond. In those areas, spherical graphitic deposits developed into macroscopic graphitic balls. However, diamond growtii directly on die fused silica plates attached to die upper sidewall showed high quality growth over nearly the entire area (an area 20 x 35 cm covered by die fused silica tiles). Examples 3 and 4 Diamond film was prepared using an enclosure as picmred in Figure 12, widi eitiier a parallel-conductor applicator as picmred in Figure 6 (Example 3) or a strap applicator as picmred in Figure 7 (Example 4). The chamber 90 of the enclosure consisted of two aluminum plates (91 and 93) (6061 aluminum) mating against an aluminum collar 94 as shown in Figure 12. The top and bottom plates 91 and 93 were 17 inches by 35 inches in area and one inch thick. Fifteen slots were formed in die plates by water-jet cutting, each slot being 0.05 inch wide and 30 inches long, and separated (center-to-center) by 1.063 inch. Fourteen 0.5-inch- diameter gun-drilled bores widi a spacing of 1.063 inch were provided for cooling water. The aluminum collar 94 was fabricated from three-inch-thick aluminum plate, 17 inches by 35 inches in area. The center portion of the plate was removed, leaving walls 94a and 94b one inch tiiick and walls 94c and 94d 1.5 inch thick. Two bores one-inch in diameter were then drilled tiirough each of the sidewalls 94a and 94b, and a multitude of 0.03-inch-diameter holes were formed along the length of the walls 94a and 94b from those bores to the interior of the chamber 95. The exhaust gas ports were 0.625-diameter-inch in diameter. Four 0.625 inch- windows were mounted in each of die walls 94c and 94d to enable viewing of the plasma. Vacuum sealing of the slots was accomplished by means of polyediermide dielectric plates (17 inches by 30 inches in area and one-inch tiiick) sealing against die 0-rings 101 along the outer periphery of the top and bottom sidewalls 91 and 93. Vacuum sealing between the collar and die top and bottom sidewalls was accomplished tiirough 0-rings 105 capmred in grooves machined in the aluminum collar. For the parallel-conductor applicator as picmred in Figure 6, the conductors 39 comprised 0.5-inch-diameter-soft copper mbing. Twelve conductors spaced 1.5 inch apart were used. The ends of the 12 conductors were attached to water- cooled headers by means of mbe fittings. The flat-strap applicator was formed from 0.125-inch-thick, 18-inch-wide- inch-wide, electronic-grade copper plate, bent in a "U"-shape, with the legs of the "U" each 19 inches in length and the connecting base of the "U" 6.5 inches in length. The power supply was a conventional megacycle induction heating power supply manufactured by Lepel Corporation (T-40-DF). The tank circuit of this power supply was modified to have a capacitance of 1800 pF (four 450 pF vacuum capacitors). The tap setting of the internal inductor was set to zero and die output terminals were directly connected to a bus bar for die parallel-conductor applicator or to die flat-strap applicator itself. The entire tank inductance is dierefore that of die applicator (barring die inductances of the connections). The apparams was operated in bom examples with a water- vapor flow rate of 15.6 seem, and an edianol-vapor flow rate of 19.2 seem, and die pressure inside the chamber was maintained at 3.60 mTorr. The oscillator and power coupling parameters were as follows: Parallel-Conductor Flat-Strap Applicator Applicator DC Plate Voltage 10 kV 9 kV Plate Current 4.0 A 5.9 A RF Coil Voltage 15 kV 10 kV Frequency 3.998 MHz 4.643 MHz DC Plate Power 45 kW 53.1 kW Dissipated Power 18.5 kW 22.8 kW Deposition Area 8" x 14" 12" x 14" Max. Operating Pressu re 450 mTorr > 850 mTorr Diamond was deposited over an area 8 inches by 14 inches in the parallel- conductor applicator and over an area 12 inches by 14 inches in d e flat-strap applicator.

Claims: WAHT IS CLAIMED AS NEW AND DESIRED TO BE SECURED BY LETTERS PATENT OF THE UNITED STATES IS: 1. A metiiod for treating a work surface with a plasma, comprising: a) providing a chamber having a longitudinal axis and longimdinally extending electrically conductive sidewalls, at least one sidewall having a longimdinally extending gap that interrupts a current path through the sidewalls transverse to die longimdinal axis; b) providing an axially-extending array of current-carrying conductor paths that at least paπially encircle the chamber and are transverse to die longimdinal axis of the chamber; c) providing a gaseous material in the chamber at a controlled pressure; d) providing high-frequency current in the conductor patiis in a magnimde to magnetically induce ionization of the gaseous material in the chamber and form a plasma sheath that surrounds and extends along die longimdinal axis and conforms to the sidewalls of die chamber; and e) exposing the work surface to the plasma sheath, the work surface extending in die direction of the longimdinal axis. 2. A method of claim 1 in which the current-carrying conductor paths are electrically connected in parallel. 3. A method of claim 1 in which the array of current-carrying conductor patiis extends at least about 50 percent of the length of the longimdinally extending gap. 4. A method of claim 3 in which the array of current-carrying conductor patiis comprises a single conductive strap. 5. A method of claim 1 in which die work surface is parallel to die longimdinal axis of the chamber. 6. A method of claim 1 in which at least one sidewall of die provided chamber is planar, and die induced plasma sheath extends as a planar sheatii parallel to the planar sidewall. 7. A method of claim 6 in which the planar sidewall is at least 1000 cm 2 in area and the plasma sheath extends over at least pan of the planar sidewall. 8. A method of claim 1 in which the chamber sidewalls comprise a plurality of closely spaced longimdinally extending electrically conductive metal bars. 9. A metiiod of claim 1 in which the electrically conductive metal sidewalls are cooled by circulation of a coolant through internal conduits in the sidewalls. 10. A method of claim 1 in which the work surface is separated from a chamber sidewall by means for adjusting die temperature of the work surface. 11. A method of claim 1 in which die plasma sheath comprises elements that form a deposit on die work surface. 12. A method of claim 1 in which the plasma sheath comprises elements that etch the work surface. 13. A method of claim 1 in which die plasma sheath comprises elements that clean the work surface of foreign material coated on die work surface. 14. A method for treating a work surface with a plasma, comprising: a) providing a chamber having a longimdinal axis and sidewalls tiiat surround the longimdinal axis and comprise aligned spaced electrically conductive bars extending along die longimdinal axis, at least one sidewall being planar and at least 100 cm 2 in area; the chamber being sealed by enclosure means so that the pressure can be controlled in he chamber; and b) providing an axially-extending array of current-carrying conductor paths that encircle die chamber, are transverse to the longimdinal axis, and are electrically connected in parallel; c) providing a gaseous material in the chamber; d) providing high-frequency current in die conductor patiis in a magnimde to magnetically induce ionization of die gaseous material in the chamber and form a plasma sheath that surrounds and extends along die longimdinal axis and conforms to the sidewalls of die chamber, a poπion of the plasma sheam extending as a planar sheatii over at least pan of the planar sidewall; and e) exposing the work surface to the plasma sheath at an outer boundary of die plasma sheatii, the work surface extending in the direction of the longimdinal axis and conforming to the plasma sheath. 15. A method of claim 14 in which the array of current-carrying conductor patiis extends between about 50 and 90 percent of the lengtii of the spaces between the electrically conductive bars. 16. A method of claim 15 in which the array of current-carrying conductor patiis comprises a single conductive strap. 17. A method of claim 14 in which the planar sidewall is at least 1000 square centimeters in area. 18. A method of claim 14 in which the chamber comprises two parallel large-area planar sidewalls. 19. A method of claim 14 in which the electrically conductive metal bars are cooled by circulation of a coolant tiirough internal conduits in the bars. 20. A metiiod of claim 14 in which die work surface is separated from a chamber sidewall by means for conducting heat away from the work surface. 21. A method of claim 20 in which the heat-conducting means comprises tiiermally conductive adhesive. 22. A metiiod of claim 14 in which the plasma sheatii comprises elements that form a deposit on the work surface. 23. A method of claim 14 in which die plasma sheatii comprises elements that etch the work surface. 24. A method of claim 14 in which the plasma sheath comprises elements that clean the work surface of foreign material coated on die work surface. 25 . A method for forming diamond film, comprising: a) providing a chamber having a longimdinal axis and longimdinally extending electrically conductive sidewalls, at least one sidewall having a longimdinally extending gap tiiat interrupts a current path through the sidewalls transverse to die longimdinal axis; b) providing an axially-extending array of current-carrying conductor patiis that at least partially encircle the chamber and are transverse to die longimdinal axis of die chamber; c) providing a gaseous diamond-precursor feedstock in die chamber at a controlled pressure; d) providing high-frequency current in the conductor patiis in a magnimde to magnetically induce ionization of the gaseous material in the chamber and form a plasma sheath that surrounds and extends along d e longimdinal axis and conforms to the sidewalls of the chamber; and e) exposing to die plasma sheatii a work surface that extends in die direction of the longimdinal axis and is adapted for diamond film deposition. 26. A method of claim 25 in which the current-carrying conductor patiis are electrically connected in parallel. 27. A method of claim 25 in which the array of current-carrying conductor patiis extends at least about 50 percent of the length of the longimdinally extending gap. 28. A method of claim 27 in which the array of current-carrying conductor patiis comprises a single conductive strap. 29. A metiiod of claim 25 in which at least one sidewall of the chamber is planar, and the plasma sheath extends as a planar sheatii over at least part of the planar sidewall. 30. A method of claim 29 in which the work surface is planar and disposed at die outer boundary of the plasma sheath. 31. A method of claim 29 in which the planar work surface is at least 100 cm 2 in area. 32. A method of claim 25 in which the planar work surface is at least 1000 square centimeters in area. 33. A method of claim 25 in which the chamber sidewalls comprise a plurality of closely spaced longimdinally extending electrically conductive metal bars. 34. A method of claim 25 in which the electrically conductive sidewalls are cooled by circulation of a coolant through internal conduits in the sidewalls. 35. A method of claim 25 in which the work surface is separated from a chamber sidewall by means for conducting heat away from the work surface. 36. Diamond film prepared by die method of claim 25. 37. Electronic device incorporating the diamond film of claim 36. 38. Electronic device incorporating the diamond film of claim 36 as a thermal spreader. 39. Abrasive product incorporating diamond prepared by die method of claim 25. 40. Cutting tool incorporating a diamond film prepared by the method of claim 25. 41. A metiiod for forming diamond film, comprising: a) providing a chamber having a longimdinal axis and sidewalls tiiat surround the longimdinal axis and comprise aligned closely spaced electrically conductive metal bars that extend along the longimdinal axis, at least one sidewall being planar and at least 100 cm 2 in area, and the chamber being sealed by enclosure means so that the pressure can be controlled in the chamber; b) providing an axially-extending array of current-carrying conductor patiis that encircle the chamber, are transverse to the longimdinal axis, and are electrically connected in parallel; c) providing a gaseous diamond precursor material in die chamber; d) providing high-frequency current in the conductor paths in a magmmde to magnetically induce ionization of the gaseous material in the chamber and form a plasma sheath that surrounds and extends along the longimdinal axis and conforms to the sidewalls of die chamber, a portion of the plasma sheath extending as a planar sheath over at least part of the planar sidewall; and e) exposing to d e plasma sheath a work surface that extends in the direction of the longimdinal axis and is disposed at the outer boundary of die plasma sheath. 42. A method of claim 41 in which me array of current-carrying conductor patiis extends between 50 and 90 percent of the length of the spaces between the electrically conductive bars. 43. A method of claim 42 in which the array of current-carrying conductor paths comprises a single conductive strap. 44. A method of claim 41 in which the planar sidewall is at least 1000 centimeters square in area. 45. A method of claim 41 in which die chamber comprises two parallel large-area planar sidewalls. 46. A method of claim 41 in which the electrically conductive metal bars are cooled by circulation of a coolant through internal conduits in the bars. 47. A method of claim 41 in which the work surface is separated from a chamber sidewall by means for adjusting the temperature of the work surface. 48. A method of claim 47 in which the temperature-adjusting means comprises a thermally conductive adhesive. 49. Diamond film prepared by the method of claim 41. 50. Electronic device incorporating d e diamond film of claim 49 as a field emitter. 51. Electronic device incorporating the diamond film of claim 49 as a thermal spreader. 52. Abrasive product incorporating diamond prepared by the method of claim 41. 53. Cutting tool incorporating a diamond film prepared by the method of claim 41. 54. A plasma treatment apparatus for treating a work surface, comprising: a chamber having a longimdinal axis and longimdinally extending electrically conductive sidewalls, at least one sidewall having at least one longimdinally extending gap tiiat interrupts a current path through the sidewalls transverse to the longimdinal axis; enclosure means for sealing the chamber to allow pressure inside die chamber to be controlled; means for providing a gas in die chamber; an axially-extending array of current-carrying conductors tiiat at least partially encircle the chamber, are transverse to the longimdinal axis, and establish a magnetic field parallel to die longimdinal axis of the chamber; and a power supply connected to d e conductor array and adapted to provide high-frequency current in d e conductors to magnetically induce ionization of the gaseous material in the chamber and form a plasma sheath that surrounds and extends along the longimdinal axis and conforms to the sidewalls of die chamber; wherein said work surface is adapted to extend in the direction of the longimdinal axis. 55. Apparams of claim 54 in which at least one sidewall is an extensive planar wall parallel to die longimdinal axis. 56. Apparams of claim 54 in which the chamber comprises two parallel large-area planar sidewalls. 57. Apparams of claim 54 in which die planar sidewall is at least 100 cm 2 in area. 58. Apparams of claim 54 in which the planar sidewall is at least 1000 square centimeters in area. 59. Apparams of claim 54 in which die chamber sidewalls comprise a plurality of closely spaced longimdinally extending electrically conductive bars. 60. Apparams of claim 54 in which the current-carrying conductors comprise individual conductor loops are electrically connected in parallel. 61. Apparams of claim 54 in which the axially-extending array of current-carrying conductors extends at least about 50 percent of the length of the longimdinally extending gap. 62. Apparams of claim 61 in which die array of current-carrying conductors comprises a single conductive strap. 63. Apparams of claim 54 in which the electrically conductive metal sidewalls include internal conduits and are cooled by circulation of a coolant tiirough the internal conduits in die sidewalls. 64. Apparams of claim 54 in which the work surface is separated from the chamber sidewall by means for adjusting die temperamre of the work surface. 65. Apparams of claim 54 in which die work surface is adapted to receive a deposit. 66. Apparams of claim 65 in which the deposit is a diamond film. 67. Apparams of claim 54 in which the work surface is adapted to be etched or cleaned by die plasma sheath. 68. Apparams for treating a work surface with a plasma, comprising: a) a chamber having a longimdinal axis and sidewalls tiiat surround die longimdinal axis and comprise aligned spaced electrically conductive bars extending along die longimdinal axis, at least one sidewall being planar and at least 100 cm 2 in area, and me bars including internal conduits for circulation of a coolant; b) enclosure means sealing the chamber to allow pressure inside die chamber to be controlled; c) an axially-extending array of current-carrying conductors tiiat encircle the chamber, are substantially transverse to the longimdinal axis, and establish a magnetic field parallel to die longimdinal axis of die chamber; d) means for providing a gaseous material in die chamber; and e) a power supply connected to d e conductor array and adapted to provide high-frequency current in die conductors to magnetically induce ionization of the gaseous material in the chamber and form a plasma sheatii that surrounds and extends along die longimdinal axis and conforms to the sidewalls of die chamber; and said work surface adapted to be mounted adjacent a sidewall of the chamber and to extend in die direction of d e longimdinal axis whereby die induced plasma sheatii will conform to the work surface. 69. Apparams of claim 68 in which the planar sidewall is at least 1000 square centimeters in area. 70. Apparams of claim 68 in which the chamber comprises two parallel large-area planar sidewalls. 71. Apparams of claim 68 in which the work surface is adapted to be separated from a chamber sidewall by means for conducting heat away from the work surface. 72. Apparams of claim 68 in which the current-carrying conductors comprise individual conductor loops electrically connected in parallel. 73. Apparams of claim 68 in which the array of current-carrying conductors extends between 50 and 90 percent of die length of the spaces between the electrically conductive bars. 74. Apparams of claim 73 in which the array of current-carrying conductors comprises a conductive strap. 75. Apparams of claim 68 in which the current-carrying conductors comprise "U"-shaped conductors having capacitors connected between die open ends of the "U". 76. Apparams of claim 68 in which the enclosure means comprises dielectric plates that overlie the electrically conductive bars. 77. Apparams of claim 68 in which the enclosure means comprises elastomeric dielectric gaskets disposed in gaps between the electrically conductive bars. 78. Apparams of claim 68 in which die work surface is adapted to receive a deposit. 79. Apparams of claim 78 in which the deposit is a diamond film. 80. Apparams of claim 68 in which die work surface is adapted to be etched or cleaned by die plasma. 81. A method for destruction of hazardous gaseous material, comprising: a) providing a chamber having a longimdinal axis and longimdinally extending electrically conductive sidewalls, at least one sidewall having a longimdinally extending gap tiiat interrupts a current path tiirough the sidewalls transverse to die longimdinal axis; b) providing an axially-extending array of current-carrying conductor patiis that at least partially encircle the chamber and are transverse to the longimdinal axis of the chamber; c) providing the hazardous gaseous material in the chamber at a controlled pressure; and d) providing high-frequency current in the conductor patiis in a magnimde to magnetically induce ionization of the gaseous material in the chamber and form a plasma sheath that surrounds and extends along the longimdinal axis and conforms to the sidewalls of me chamber in which the hazardous gaseous material is converted to a non-hazardous form. 82. Apparams for destruction of hazardous waste material, comprising: a chamber having a longimdinal axis and longitudinally extending electrically conductive sidewalls, at least one sidewall having at least one longimdinally extending gap that interrupts a current path through the sidewalls transverse to the longimdinal axis; enclosure means sealing the chamber to allow pressure inside die chamber to be controlled; means for providing d e hazardous waste material in die chamber; an axially-extending array of current-carrying conductors tiiat at least partially encircle the chamber, are transverse to the longimdinal axis, and establish a magnetic field parallel to die longimdinal axis of the chamber; and a power supply connected to the conductor array and adapted to provide high-frequency current in the conductors to magnetically induce ionization of d e hazardous waste material in the chamber and form a plasma sheath that surrounds and extends along die longimdinal axis and conforms to the sidewalls of die chamber.

Inventors: BURT JAMES V, DAVID MOSES M, HENDRY ROBERT C, ROBSON ANTHONY E, RUDDER RONALD A, BURT, JAMES, V., DAVID, MOSES, M., HENDRY, ROBERT, C., ROBSON, ANTHONY, E., RUDDER, RONALD, A.
Applicants: BERKELEY SCHOLARS INC, MINNESOTA MINING & MFG, RES TRIANGLE INST, BERKELEY SCHOLARS, INC., MINNESOTA MINING AND MANUFACTURING COMPANY, RESEARCH TRIANGLE INSTITUTE
Application year: 1996
Main classification: C23C
IPC codes: C23C8, C23C16, C30B29, H01J37, H01L21, H05H1