Write test method for pit edge recording method and optical information recording/reproducing apparatus utilizing the same test method

Abstract: A write test method for use in a recording process for recording information is effected by such that the power of a laser light is modulated to form a high-temperature state and a low-temperature state on a recording medium. First, a predetermined signal is recorded on the recording medium while varying the power level of the laser light. The information recorded on the recording medium is reproduced to detect the power level of the laser light, immediately before formation of the high-temperature state, based on the amplitude of a reproduced signal. The power levels of the laser light for forming the low-temperature state and for forming the high-temperature state are determined on the basis of the detected power level.

Description: The present invention relates to a write test method suitable for a pit edge recording method, and also to an optical information recording/reproducing apparatus utilizing the above-mentioned write test method. Among the apparatus for recording or reproducing information by irradiating an information recording medium with a light beam, there have been known, for example, an exclusive reproducing apparatus for reproduction of information from a recording medium exclusive for reproduction, on which information is recorded in advance, a write once read many type apparatus for recording an information bit by forming an aperture in a recording film with heat, an apparatus for varying the crystalline state of a medium and recording information by the difference in the reflectivity, and a re-writable apparatus for recording an information bit by varying the direction of magnetization of a vertical magnetization film. Among such apparatus, Fig. 1 shows the configuration of a re-writable magnetooptical disk apparatus utilizing a light modulation overwrite method. In Fig. 1, a magnetooptical disk 1, constituting an information recording medium, bears a magnetic film 2 on a transparent substrate composed for example of glass or plastics. The magnetooptical disk 1 is mounted on the rotary shaft of a spindle motor 3 and is rotated thereby at a predetermined speed. An optical head 4 is positioned below the magnetooptical disk 1, and a bias magnet 13 is provided thereabove, in opposed relationship to the optical head 4. Inside the optical head 4 a semiconductor laser 5 is provided as a light source for reproducing the recorded information, and a light beam emitted therefrom is converted into a parallel light beam by a collimating lens 6 and enters an objective lens 8 through a polarizing beam splitter 7. The light beam thus introduced is condenced by the objective lens 8 into a small light spot onto the magnetic film 2 of the magnetooptical disk 1. In case of information recording, the light beam from the semiconductor laser 5 is modulated according to the information signal and irradiates an information track on the magnetooptical disk 1. At the same time a magnetic field of a fixed direction is applied by the bias magnet 13 to the magnetooptical disk 1, and the information is serially recorded by the cooperation of the magnetic field application and the modulated light beam irradiation. On the other hand, the light beam irradiating the magnetooptical disk 1 is reflected by the surface thereof. Thus reflected light enters the polarizing beam splitter 7 again through the objective lens 8, and reflected by the polarizing plane of the beam splitter 7 toward a beam splitter 9, thereby being separated from the incident light from the semiconductor laser 5. In the beam splitter 9, the entering light beam is split into two light beams, one of which is received by a photosensor 11 through a sensor lens 10. The signal therefrom is supplied to an AT•AF (auto-tracking/auto-focusing control) circuit 12, which in response generates a tracking error signal and a focus error signal. Based on these signals, an objective lens actuator 14 is driven to displace the objective lens 8 in the tracking direction and in the focusing direction, thereby achieving tracking control and focus control. On the other hand, in case of reproducing the information recorded on the magnetooptical disk 1, the light beam from the semiconductor laser 5 is set at a reproducing power of a level incapable of recording, and the recorded information is reproduced by scanning the desired track with such reproducing light beam. The reproducing light beam, reflected from the disk surface, travels through the objective lens 8, the polarizing beam splitter 7, the beam splitter 9 and a sensor lens 15 and is received by a photosensor 16. The signal therefrom is supplied to an unrepresented signal processing circuit for predetermined signal processing, whereby the recorded information is reproduced. Also at the reproduction of information, the reflected light of the reproducing light beam is received by the photosensor 11, and, based on the signal therefrom, the AT•AF circuit 12 effects tracking control and focus control. In the following there will be explained the recording process of the light modulation overwrite method in the apparatus shown in Fig. 1. This light modulation overwrite method is described detailedly for example in the Japanese Patent Laid-open Application No. 63-239637. The magnetic film 2 of the magnetooptical disk 1 is composed of a first magnetic layer and a second magnetic layer which are exchange coupled. The coercive force of the first magnetic layer at room temperature is selected larger than that of the second magnetic layer, and the Curie temperature of the first magnetic layer is selected lower than that of the second magnetic layer. In case of information recording on the disk 1, the second magnetic layer of the higher Curie temperature is at first initialized into a direction, and overwriting is achieved by intensity modulation of the laser beam from the optical head 4. The laser beam has mutually different first and second laser powers. The first laser power level PL is to heat the disk 1 to the Curie temperature of the first magnetic layer (to form a lower temperature level state), while the second laser power level PH is to heat the disk 1 to the Curie temperature of the second magnetic layer (to form a higher temperature level state). More specifically, the laser beam is modulated between two power levels according to the information. Under the irradiation with the first laser power PL, the magnetization disappears only in the first magnetic layer with the lower Curie temperature, and the magnetization appearing in the irradiated area in the succeeding cooling process is oriented in a stable direction with respect to the initialized second magnetic layer of the higher Curie temperature, by the exchange coupling therewith. Under the irradiation with the second laser power PH, the magnetization in the irradiated area disappears in the first and second magnetic layers, and the magnetization of the second magnetic layer, appearing in the succeeding cooling process, is oriented in the direction of the bias magnetic field. Also the magnetization of the first magnetic layer is oriented in a stable direction with respect to the magnetization of the second magnetic layer, by the exchange coupling therewith, whereby the information recording is achieved. In this manner, by selecting the first and second laser powers according to information, the recording thereof can be attained by orienting the magnetization of the first magnetic layer in the direction of initialization under the first laser power and in the direction of the bias magnetic field under the second laser power. In such recording operation with such two laser levels, overwriting is made possible regardless of the magnetization state of the first magnetic layer prior to the recording operation. The magnetooptical disk apparatus shown in Fig. 1 employs the light modulation overwriting method as explained above, and is capable of information recording without erasure of the prior information. Also in recent years, there is principally employed so-called bit edge recording, giving information to both edges of each recorded bit, for increasing the information density. For such high-speed and high-density information recording, it is necessary to record each information bit in accurate and stable manner, but the recording powers are subject to fluctuation due to the variation in the temperature in the apparatus or the smear on the objective lens or the disk. For this reason, in the conventional technology, the recorded bit varies according to the variation of the recording powers, and is incapable of sufficiently achieving high-speed or high-density recording. JP-A-5274738 and the corresponding Patent Abstracts of Japan, Volume 18, No. 57 (P-1684) discloses a write test method for use in a magneto-optical optical modulation overwriting apparatus. The high and low level laser powers are varied and test signals measured for minimum and maximum length signals. The stable recording temperature region of the medium is thereby determined, and used to determine the optimum laser recording powers. The preamble of claim 1 is based on this document. US-A-5345434 discloses an optical recording method using pit edge recording in which the laser powers are controlled in order to reduce mark length variation due to thermal interference. JP-A-1204240 and the corresponding Patent Abstracts of Japan, Volume 13, No. 505 (P-959) discloses a test method for an optical recording method for effecting information recording on a write only recording medium. The optimum value of the single intensity recording light beam is determined by increasing the intensity of a test light beam until the reproduction signal exceeds a reference level. JP-A-6208740 and the corresponding Patent Abstracts of Japan, Volume 18, No. 574 (P-1821) discloses a magneto-optical recording method using at least four different levels of laser power in which the laser power is controlled in dependence on the environmental temperature. In consideration of the foregoing, the object of the present invention is to provide a write test method enabling exact recording of a recorded bit irrespective of variation in the temperature within the apparatus or of the smear in the objective lens or the recording medium, and an optical information recording/reproducing apparatus utilizing such write test method. According to a first aspect of the present invention, there is provided a write test method for use in a recording process for recording information on a recording medium by modulating light from a laser into a plurality of recording power levels and a reproducing power level lower than the recording power levels, comprising the steps of: determining the relationship between the amplitudes of reproduction signals reproduced from information recorded on the recording medium and the recording power levels used to record the information; and setting the recording power levels of the laser light on the basis of said relationship, the method being characterized in that: said setting step includes the steps of: determining the intensity of a threshold value of the recording power level at which the amplitudes of the corresponding reproduction signals abruptly increase; and determining the values of each of the plurality of recording power levels, using the threshold recording power level as a reference value. According to a further aspect of the present invention, there is provided a recording method for optically recording information on a recoring medium including a write test method according to the first aspect of the present invention. There is also provided an apparatus for performing a write test method according to the first aspect of the present invention and a recording apparatus including such an apparatus for performing a write test method. The foregoing and other objects of the present invention, and the features thereof, will become fully apparent from the following description of embodiments of the invention, which are described by way of example only. Fig. 1 is a schematic view of a conventional magnetooptical disk apparatus; Fig. 2 is a view showing the configuration of an embodiment of the optical information recording/reproducing apparatus of an embodiment of the present invention; Fig. 3 is a chart showing a laser turn-on wave form for recording a 4T pattern in a first embodiment; Figs. 4 to 6 are flow charts showing a first embodiment of the write test method of the present invention; Fig. 7 is a chart showing the method for determining a laser power PHth immediately before the start of a high-temperature level state; Fig. 8 is a chart showing a reproduced signal of an 8T-continuous/2T-continuous pattern employed in the write test method of the embodiment of the present invention; Fig. 9 is a chart showing the relationship between the radial position (linear velocity) of the disk and the recording power; Fig. 10 is a chart showing another method for determining a power level PH2 for forming the high-temperature level state; Figs. 11A and 11B are views showing the principle of determination of PH in Fig. 10; Figs. 12A to 12C are charts showing other examples of the laser turn-on wave form of 4T pattern; Figs. 13A to 13C are charts showing a recorded pattern and corresponding laser control signals, showing comparison of DC turn-on and pulsed turn-on of the laser in space areas; Fig. 14 is a chart showing the laser turn-on wave form for recording a 4T pattern in a second embodiment; Figs. 15A to 15C are charts showing a recorded pattern and corresponding laser turn-on wave forms in the second embodiment; Fig. 16 is a flow chart of the second embodiment of the write test method of the present invention; Fig. 17 is a chart showing the relationship between the thermal diffusion constant and PH1 and PH2; Fig. 18 is a chart showing the relationship between a slice level difference ΔSL of the reproduced signals of an 8T continuous pattern and a 2T continuous pattern, and PH1; Figs. 19A to 19C are charts showing reproduced signals of an 8T continuous/2T continuous pattern for different PH1 and PH2 values; Fig. 20 is a chart showing the result of confirmation of the write test; Fig. 21 is a chart showing another example of the laser turn-on wave form of the 4T pattern; Fig. 22 is a view showing the configuration of a third embodiment of the optical information recording/reproducing apparatus of the present invention; Fig. 23 is a chart showing a laser turn-on wave form for recording the 4T pattern in the third embodiment; Figs. 24A to 24C are charts showing a recorded pattern and corresponding laser turn-on wave forms in the third embodiment; Figs. 25 and 26 are flow charts showing the third embodiment of the write test method of the present invention; Fig. 27 is a chart showing the relationship between a power level PH1 for forming the high-temperature level state and a difference ΔSL in the middle value of the peak and the bottom in the amplitude between the 2T and 8T reproduced signals; Figs. 28A to 28C are wave form charts showing reproduced signals of an 8T-continuous/2T-continuous pattern for different PH1 values; Fig. 29 is a chart showing the relationship between the power level PH2 for forming the high-temperature level state and the difference between the positive and negative amplitudes in the 2T-8T differentiated reproduced signal; Figs. 30A to 30C are wave form charts showing reproduced signals of the 8T continuous pattern and corresponding differential signals for different PH2 values; and Fig. 31 is a chart showing the result of confirmation of PH1 and PH2. [First embodiment] Now the present invention will be clarified in detail by preferred embodiments thereof shown in the attached drawings. Fig. 2 is a view showing the configuration of an embodiment of the optical information recording/reproducing apparatus of the present invention, wherein components same as those in the conventional apparatus shown in Fig. 1 are represented by same numerals and will not be explained further. More specifically, the magnetooptical disk 1, the magnetic film 2, the spindle motor 3 and the AT•AF circuit 12 in Fig. 2 are same as those in Fig. 1. Also the optical head 4 is composed of the semiconductor laser 5, the collimating lens 6, the objective lens 8, the polarizing beam splitters 7, 9, the sensor lenses 10, 15, the photosensors 11, 16 and the objective lens actuator 14 in the same manner as in the optical head 4 in Fig. 1. The optical head 4 is rendered movable, by an unrepresented mechanism, in the radial direction of the magnetooptical disk 1, for access to a desired information track thereof. In the present embodiment, for detecting the amplitude of the reproduced signal obtained in the photosensor 16, there is provided an amplitude detection circuit 17, which serves to detect the amplitude of the reproduced signal, for detecting the power PHth immediately before the start of a high-temperature process of the magnetooptical disk 1, prior to the write test as will be explained later in more details. The amplitude of the reproduced signal is fetched in a CPU 18, through an A/D converter therein. An asymmetry detection circuit 19 serves to detect the asymmetry in the reproduced signals of two recording bits of different lengths, at the write test as will be explained later. Inside the asymmetry detection circuit 19 there is provided an automatic slice level tracing circuit for detecting the peak and bottom values of the reproduced signal and taking the middle value thereof always as the slice level. It detects the middle values (slice levels) of the reproduced signals of pre-determined long and short marks and releases the difference of these middle values as the asymmetry. The output of the asymmetry detection circuit 19 is also fetched by the A/D converter into the CPU 18. The CPU 18 is a processor constituting the main control unit of the present optical information recording/reproducing apparatus, and serves to control the information recording and reproducing operations by controlling the AT•AF circuit 12, a drive circuit (not shown) for the bias magnet 13, a drive circuit (not shown) for the spindle motor 3, a drive circuit 20 for the semi-conductor laser 5. Also when the magnetooptical disk 1 is exchanged, the CPU 18 effects write test by controlling various unit, thereby setting the recording power of the semiconductor laser 5 at an optimum level as will be explained later in more details. Fig. 3 is a chart showing the turn-on wave form of the semiconductor laser 5 of the present invention, as an example, in case of recording a 4T pattern. Referring to Fig. 3, PL indicates a power level for forming a low-temperature level state (for erasure) in the recording layer of the magnetooptical disk, while PH1 and PH2 are power levels for forming a high-temperature level state (for recording), and Pr is a constant reproducing power level. In the present embodiment, the recording power of the semiconductor laser 5 is controlled at four levels of PL, PH1, PH2 and Pr, and the values PL, PH1 and PH2 are set at optimum levels by the write test. The write test method of the present embodiment will be explained in detail in the following, with reference to Figs. 4, 5 and 6. The write test of the present embodiment consists principally of the following three steps: (1) The laser power PHth immediately before the formation of the high-temperature level state is determined for determining the laser power level PL for forming the low-temperature level state; (2) The ratio of the laser power levels PH1 and PH2 for forming the high-temperature level state is determined; and (3) The absolute values of PH1 and PH2 are determined by varying the recording power, while maintaining a constant ratio between PH1 and PH2. At first there will be explained the step (1) for determining the laser power level PL. Referring to Fig. 4, in case of the write test, the CPU 18 instructs to move the optical head 4 to a predetermined write test area of the magnetooptical disk 1 (S1). Then the CPU 18 controls the drive circuit for the bias magnet 13 and the semiconductor laser driving circuit 20, thereby applying an erasing bias magnetic field to the write test area and scanning the write test area with an erasing light beam to erase the write test area (S2). After the erasure, the CPU 18 sets an initial value Pw for the recording power of the semiconductor laser 5, for example by taking PL recorded in a control track of the magnetooptical disk 1. After the setting of the initial value of the recording power, the CPU 18 instructs to record an 8T continuous pattern in the write test area with the power of such initial value (S4), and subsequently reproduces thus recorded 8T continuous pattern for detecting the amplitude level of the reproduced signal (S5), by means of the amplitude detection circuit 17. The obtained amplitude level is fetched into the CPU 18 by the A/D converter therein, and stored in an internal memory (S5). After the recording and reproduction with the initial value, the CPU 18 instructs to increase the recording power by adding ΔPw to the recording power Pw (S6), then records the 8T continuous pattern with thus increased recording power in the write test area (S4), reproduces the recorded signal and detects and stores the amplitude level of the reproduced signal (S5). By repeating the steps S4 to S6 with stepwise increases of the recording power to a predetermined recording power level, there can be determined the relationship between the recording power and the amplitude of the reproduced signals shown in Fig. 7. The predetermined recording power can be, for example, twice of PH with which recording is effected on the control track of the magnetooptical disk. As shown in Fig. 7, the amplitude of the reproduced signal remains almost zero while the recording power is low, and rises steeply from a certain recording power, which corresponds to the desired laser power PHth immediately before the formation of the high-temperature level state. The above-mentioned PHth immediately before the formation of the high-temperature level state, shown in Fig. 7, varies according to the temperature, depending on the characteristics of the medium. The present invention is based on this property and determines PL, PH1 and PH2 based on PHth, thereby setting the recording power corresponding to the variation in temperature. The CPU 18 determines PHth from the data of the recording power and the reproduced signal amplitude stored in the memory and stores PHth in the memory (S7). In this manner the step (1) for determining PHth is completed. The present embodiment employs (1-7) codes for the modulation of the recorded information, and the longest pit 8T in this code system is used for the detection of the reproduced signal amplitude. In the following there will be explained the step (2) for determining the ratio of the laser power levels PH1 and PH2 for forming the high-temperature level state, with reference to Fig. 4. At first the CPU 18 instructs to set the laser power level PL for forming the low-temperature level state as PL = α × PHth (S8), utilizing the value PHth determined in advance, wherein α is defined by PLmin/PHth < α < 1.0. In this manner the value PL is determined. Then the CPU 18 instructs to set the laser power level PH1 for forming the high-temperature level state as PH1 = PHth (S9), and records an 8T-continuous/2T-continuous pattern in the write test area of the magnetooptical disk 1 under a condition PH1 = PH2 (S10). Thus the recording conditions in this state are PL = α × PHth and PH1 = PH2 = PHth, wherein PL is the value obtained previously. After the recording of the 8T-continuous/2T-continuous pattern, the CPU 18 instructs to reproduce this pattern by controlling various units and detects the slice level SL(8T) of the reproduced signal of the 8T pattern and that SL(2T) of the reproduced signal of the 2T pattern (S11). More specifically, the asymmetry detection circuit 19 detects the middle values of the peak and bottom values of the reproduced signals of the 8T continuous pattern and the 2T continuous pattern, then detects the difference ΔSL between the slice level SL(8T) of the reproduced signal of the 8T continuous pattern and that SL(2T) of the reproduced signal of the 2T continuous pattern (S12), and the CPU 18 discriminates whether ΔSL is 0 (S13). If not, the CPU 18 adds ΔPH1 to PH1 and again effects recording of the 8T-continuous/2T-continuous pattern in the write test area (S10), similarly reproducing the recorded signal and detecting the 8T slice level and the 2T slice level (S11), detecting the difference ΔSL of the two slice levels (S12) and discriminating whether ΔSL is equal to zero (S13). In this manner the CPU 18 repeats the steps S10 to S14 by stepwise increasing PH1 by ΔPH1 and stores the value of PH1 when ΔSL reaches zero. As explained in the foregoing, the present embodiment employs the (1-7) codes, and the 8T signal constituting the longest bit and the 2T signal constituting the shortest signal are recorded, and there is detected the difference ΔSL between the slice levels (middle values of the peak and bottom values) of the two reproduced signals from such longest and shortest bits. Then there is discriminated whether ΔSL is equal to zero, and the value of PH1 is stored in the memory when it reaches zero, as will be explained in the following. Fig. 8 shows the reproduced signal of the 8T-continuous/2T-continuous pattern. In this signal, the 8T reproduced signal corresponding to the longest bit is saturated as shown in Fig. 8, and, in this state, the middle value (slice level) of the peak and the bottom can be regarded as zero. Thus, the value of PH1 is varied so as to record 2T with the exact length, while taking 8T as the reference, and the value of PH1 is detected when ΔSL becomes zero. Since the slice level of the reproduced signal of 8T can be regarded as zero, that of the 2T reproduced signal can also be regarded as zero if the difference ΔSL between the slice levels of the 8T and 2T reproduced signals is zero. This means that the 2T bit can be recorded with the exact length, so that the PH1 in this state corresponds to the power level required for exact recording of the shortest bit 2T. Then the CPU 18 sets thus obtained PH1 as PH1' and determines the PH2 matching thereto, in a sequence starting from a step S14 in Fig. 5. At first the CPU 18 sets PH1 - PH1' as mentioned above and also sets the initial value of PH2 as PH2 = 0.8 × PH1' (S14). PL is the value obtained previously. Then the CPU 18 controls the various units with these recording conditions to record an 8T-continuous/2T-continuous pattern in the write test area (S15), and reproduces the recorded pattern to detect the slice level SL(8T)' of the reproduced signal of the 8T continuous pattern and that SL(2T)' of the reproduced signal of the 2T continuous pattern (S16), which are detected by the asymmetry detection circuit 19 and fetched in the CPU 18. Then the asymmetry detection circuit 19 detects the difference ΔSL' between the slice levels SL(2T)' and SL(8T)' (S17), and the CPU 18 discriminates whether the obtained ΔSL' is equal to zero (S18). If not, the CPU 18 adds ΔPH2 to PH2 and effects again recording of the 8T-continuous/2T-continuous pattern in the write test area (S19), reproduction of the recorded pattern to detect the 8T slice level SL(8T)' and the 2T slice level SL(2T)' (S16), detection of the difference ΔSL' of these two slice levels (S17) and discrimination whether ΔSL' is equal to zero (S18). In this manner the CPU 18 repeats the steps S15 to S19 by stepwise increasing PH2 by ΔPH2 and stores the value of PH2, as PH2', when ΔSL' becomes zero (S20). Then the CPU 18 calculates a ratio β of thus obtained PH2' and PH1' previously stored in the memory (β = PH2'/PH1') (S21). In this manner there is completed the step (2) for determining the ratio of PH2 and PH1. In the flow chart shown in Fig. 5, as explained in the foregoing, the value of PH2 is varied and is determined when the difference ΔSL' between the slice levels of the 8T and 2T reproduced signals becomes zero, in the following manner. In this case there is determined the power level PH2 capable of recording the longest bit 8T with the exact length, while taking 2T as the reference. As the value of PH1 has already been determined for recording the shortest 2T bit with the exact length, there is now determined the value of PH2 when the difference ΔSL' of the slice levels of the 8T and 2T reproduced signals becomes zero, by varying PH2. When ΔSL' becomes zero, the slice level of the 8T reproduced signal can be regarded as zero. This means that the 8T bit can be recorded with the exact length, so that the PH2 in this state corresponds to the power level capable of exactly recording the longest 8T bit. Finally there will be explained the step (3) for determining the absolute values of PH1 and PH2 by varying the recording power while maintaining a constant ratio between PH1 and PH2, with reference to a sequence starting from a step S22 in Fig. 6, following the step S21 in Fig. 5. At first the CPU 18 sets PH1 = PHth and PH2 = β × PH1 as the initial values of PH1 and PH2 (S22), wherein PHth and β are obtained respectively in S7 in Fig. 4 and S21 in Fig. 5, and PL is the previously obtained value. Then the CPU 18 instructs to record an 8T-continuous/2T-continuous pattern in the write test area of the magnetooptical disk 1 by controlling the various units under the above-mentioned initial values (S23), then reproduces the recorded pattern and detects the slice level SL(8T)' of the reproduced signal of the 8T continuous pattern and that SL(2T)'' of the reproduced signal of the 2T continuous pattern (S24), by means of the asymmetry detection circuit 19. Subsequently the asymmetry detection circuit 19 detects the difference ΔSL' of the obtained slice levels SL(2T)'' and SL(8T)'' (S25), and the CPU 18 discriminates whether the difference ΔSL'' is equal to zero (S26). If not, the CPU 18 sets PH1 = PH1 + ΔPH1 and PH2 = β × PH1, thereby renewing the recording power while maintaining a constant ratio between PH1 and PH2 (S27). Then the CPU 18 instructs to effect recording of the 8T-continuous/2T-continuous pattern again in the write test area under thus renewed recording conditions (S23), then reproduction of the recorded pattern and detection of the slice levels of the 8T-continuous pattern and the 2T-continuous pattern (S24), detection of the difference ΔSL'' of these two slice levels (S25) and discrimination whether ΔSL'' is zero (S26). In this manner the CPU 18 repeats the steps S23 to S27 by stepwise increasing the recording power while maintaining a constant ratio between PH1 and PH2, and determines PH1 and PH2 as the desired values when ΔSL'' reaches zero. The optimum power levels of PH1 and PH2 are determined through the foregoing sequences and the write test is thus completed. As explained in the foregoing, also in the determination of the absolute values of PH1 and PH2, 2T and 8T bits are recorded and the values of PH1 and PH2 are determined as the optimum power levels when the difference ΔSL'' of the slice levels of the 2T and 8T reproduced signals becomes zero. This is based on the aforementioned principle that, if the difference ΔSL'' between the slice levels of the reproduced signals of the longest bit 8T and the shortest bit 2T is zero, the slice levels of the 8T and 2T reproduced signals are both zero so that both bits can be recorded with exact lengths. Consequently the values of PH1 and PH2 in this state correspond to the power levels capable of respectively recording exactly the shortest bit 2T and the longest bit 8T. In case the linear velocity varies according to the radial recording position of the disk, as in the CAV system, it is necessary to accordingly vary the recording power of the semiconductor laser. Fig. 9 shows the relationship between the radial recording position (linear velocity) of the disk and the recording power, which are proportionally correlated. In such case, therefore, the write test explained in the foregoing in relation to Figs. 4 to 6 is to be conducted at the internal, intermediate and external positions of the disk, and the values of PL1, PH1 and PH2 obtained in respective positions are stored in a memory and are used to vary the actual PL1, PH1 and PH2 values by linear approximation according to the radial position of the disk. Also the write test explained above may be conducted at every exchange of a disk, or prior to each information recording, or periodically at every predetermined interval. In the following there will be explained another embodiment of the present invention, which is same as the foregoing write test method in the steps (1) and (3) but is different in the step (2) for determining PH2. More specifically, in the present embodiment, the PH2 is determined in the following manner after the determination of PL1 and PH1 as explained in Fig. 4. In more details, the PH1 obtained in the sequence of Fig. 4 is taken as PH1' while the initial value of PH2 is taken as PH2 = 0.8 × PH1' (PL being taken as the previously obtained value), and 6T and 8T signals are recorded in the write test area of the magnetooptical disk with such recording powers. After the recording, the CPU 18 instructs to reproduce the recorded signals and detects the amplitudes of the 6T and 8T reproduced signals, by means of the amplitude detection circuit 17, and stores the results of detection in the memory in the CPU 18. The CPU 18 instructs to repeatedly perform the recording of the 6T and 8T signals and amplitude detection of the reproduced signals by varying the recording powers while maintaining a constant ratio between PH1 and PH2, and stores the amplitude data of the 6T and 8T reproduced signals in the memory, as a function of PH2. Fig. 10 shows such amplitude data of 6T and 8T reproduced signals as a function of PH2. As will be apparent from Fig. 10, the amplitudes of the 6T and 8T reproduced signals are mutually same for a lower range of PH2, but becomes mutually different from a certain value of PH2. The CPU 18 determines the power as PH2' when these two amplitudes start to become different. Such difference in the amplitude of the reproduced signal depending on the bit length is induced by a phenomenon that the recorded bit becomes a tear drop shape with the increase of PH2, more conspicuously with the increase in the length of the recorded bit. Stated differently, when the value of PH2 is optimum, the 6T and 8T recorded bits assume ideal forms as shown in Fig. 11A, so that the 6T and 8T reproduced signals have a same amplitude. On the other hand, when PH2 becomes larger than the optimum value, the 6T and 8T recorded bits become tear drop shape as shown in Fig. 11B, so that the 6T and 8T reproduced signals have different amplitudes. Consequently a PH2 value where the reproduced signals start to show difference in amplitude is identified as the optimum value. After the determination of the optimum PH2 value in this manner, there is determined the ratio to the previously determined PH1' (β = PH2'/PH1') by the sequence starting from the step S20 in Fig. 5, and then the values of PL, PH1 and PH2 are determined by the sequence shown in Fig. 6. Also in the present embodiment, in case of the CAV process, the write tests are conducted in the inner, intermediate and outer positions of the disk to store the PL1, PH1 and PH2 values obtained in respective positions in a memory, and the optimum recording powers corresponding to the radial recording position are determined, based on thus stored data. In the foregoing embodiments, the laser turn-on wave form as shown in Fig. 3 is employed, but such wave form is not limitative and there may be employed, for example for recording the 4T pattern as in Fig. 3, a wave form as shown in Fig. 12A, 12B or 12C. Furthermore, the present invention is applicable also in case the low-temperature level state is generated by pulsed turn-on of the laser. Fig. 13A shows a pattern to be recorded, while Figs. 13B and 13C show corresponding laser turn-on wave forms, respective in case the low-temperature level state (space area) is generated by DC turn-on and by pulsed turn-on. In the foregoing embodiments, the laser is DC turned on in the space area as shown in Fig. 13B, but the present invention is applicable also in case it is turned on in pulsed manner as shown in Fig. 13C. In such case, however, it is to be noted, in the determination of PL level from the PHth value where the high-temperature process is started according to the equation PL = α' × PHth, that α' has to be so selected as to satisfy α' > 1.0 in contrast to the foregoing embodiments. Such formation of the low-temperature level state by the pulsed turn-on of the laser provides an advantage of improving the accuracy of laser power control for the low-temperature level state. Also in the foregoing embodiments, the PHth immediately before the formation of the high-temperature level state is determined by recording an 8T continuous pattern and obtaining a recording power where the amplitude of the reproduced signal starts to increase, but the mark portion of the 8T continuous signal in the test pattern may also be recorded by pulsed turn-on of a length of T/2. In such case the PL level is determined from PHth by an equation PL = γ × PHth, wherein γ < 1.0. Also in the foregoing embodiments there has been explained a write test controlled by four values PL, PH1, PH2 and Pr, but the present invention is not limited to such case and is applicable also, for example, to a case controlled by three values PL, PH and Pr. In such three-value controlled case, the write test is conducted in the following manner. At first steps S1 to S8 in Fig. 4 are executed in the same manner as in the four-value control to detect PHth, according to which PL is set. Then, since the high-temperature level state (for recording) in the three-value control is solely determined by the power level PH, the step S9 in Fig. 4 sets PH = PHth, and the step S10 records the 8T-continuous/2T-continuous pattern with thus set power level PH. Subsequently the step S11 reproduces the recorded pattern and detects the slice levels of the 8T and 2T reproduced signals, then the step S12 detects the difference ΔSL of the slice levels of the 8T and 2T signals, and the step S13 discriminates whether ΔSL is zero. If not, the step S14 renews the recording power by adding ΔPH to PH and again effects recording of the 8T-continuous/2T-continuous pattern, detection of the slice levels of the reproduced signals, detection of the difference ΔSL of the slice levels and discrimination whether ΔSL is zero. The sequence of the steps S10 to S14 is thus repeated, and the PH when ΔSL reaches zero is determined as the optimum power level. Thus the optimum values of PL and PH are determined, and the write test for three-value control case is completed. In this manner the present invention is applicable also to the write test with three-value control. [Second embodiment] In the following there will be given a detailed explanation on a second embodiment of the present invention. The configuration of the optical information recording/reproducing apparatus constituting the second embodiment will not be explained as it is same as in the configuration shown in Fig. 2. Fig. 14 is a chart showing the turn-on wave form of the semiconductor laser 5 of the present embodiment, for example, in case of recording a 4T pattern, wherein PL is a power level for forming a lower-temperature level state (for erasure) in the magnetic film 2 of the magnetooptical disk 1, PH1 and PH2 are power levels for forming a high-temperature level state (for recording), and Pr is a constant reproducing power. The reproducing power Pr is same as the bottom recording power Pb, which is provided for a period Tfb (0.5T) before PH1 and for a period Trb (1.0T) after PH2. Tfb and Trb are respectively called a front cooling gap and a rear cooling gap. The PH1 is provided for a period of Th1 (1.5T). The PH2 effects pulsed turn-on at an interval of 0.5T, with a cycle time Tp (1.0T) and a turn-on time Th2 (0.5T). In the present embodiment, the recording power of the semiconductor laser 5 is controlled with four values PL, PH1, PH2 and Pr as shown in Fig. 14, and PL, PH1 and PH2 are set at optimum values by the write test. Figs. 15A to 15C show the correspondence between the recorded pattern and the laser turn-on wave forms. Fig. 15A shows the recorded pattern while Fig. 15B shows the corresponding laser turn-on wave form. In the present embodiment, in recording the space area of the recorded pattern, the semiconductor laser 5 is DC turned on as shown in Fig. 15B. A 4T mark is recorded with the laser turn-on wave form as shown in Fig. 14, while a 2T mark is recorded with a wave form consisting solely of PH1 as shown in Fig. 15B. A 3T mark is recorded, as shown in Fig. 15B, by the combination of a PH1 wave form same as that for recording a 2T or 4T mark and a PH2 pulse. Though not shown in Fig. 15B, a 5T mark is recorded with a PH1 wave form and three PH2 pulses. Similarly the number of PH2 pulses increases to 4, 5 or 6 respectively for a 6T, 7T or 8T mark. Such laser turn-on at first with PH1 followed by pulsed turn-on with PH2 is to maintain the recording medium at a predetermined temperature, and to prevent excessive heating. Also such control of PH1 and PH2 can suppress fluctuation in the bit edge. Consequently such control method for the laser beam can be advantageously used in the aforementioned bit edge recording, in which information is given to the edge position of each bit. As explained in the foregoing, the space area is recorded with DC turn-on with the power PL. The present embodiment employs the (1-7) codes as explained before, in which the shortest and longest bits are respectively 2T and 8T. Fig. 15C shows a laser turn-on wave form in case the pulsed turn-on is used for the space area, as will be explained later in more details. In the following there will be explained the write test method of the present embodiment. At first there will be explained the relation of the recording power levels PL, PH1 and PH2 in the multivalue control of the semiconductor laser 5 explained in relation to Fig. 14. The temperature change in the medium by laser irradiation can be approximately represented by the following equations: Temperature change at heating = P 0 × (1-exp - T 0 /τ ) Temperature change at cooling = P 0 × exp - T 0 /τ wherein τ is a thermal diffusion constant characterized by the thermal characteristics and linear velocity of the recording medium, P 0 is the laser power level, and T 0 is the laser turn-on time. The foregoing equations (1) and (2) representing the heating and cooling processes lead to the following equation of heat isolation: (PL-Pb) × (1-exp -Ts/τ ) = (PH1-Pb) × (1-exp -Th1/τ ) × (exp -Trb/τ ) wherein Th1 is the duration of PH1 as shown in Fig. 14, Trb is the duration of Pr after PH2, and Pr is the bottom value of the laser power at recording. Ts is the sum of the durations of cooling gaps Tfb, Trb and the duration Thl of PH1 as shown in Fig. 14, namely: Ts = Tfb+Th1+Trb The foregoing equation (3), representing the relationship between PL and PH1, is based on the following fact, to be explained by the laser turn-on wave form for the 2T pattern shown in Fig. 15B. Referring to Fig. 15B, the temperature of the recording medium after the durations of 0.5T of front cooling gap, 1.5T of PH1 and 1.0T of rear cooling gap has to be same as that of the recording medium if the power is maintained at PL throughout these durations. This requirement can be translated into the equation (3) representing the relationship between PL and PH1. Also from the equations (1) and (2), there can be derived a multi-pulse relation, representing the relationship between PH1 and PH2, as follows: (PH1-PL) × (1-exp -Th1/τ ) (1-exp -Tp/τ ) = (PH2-PL) × (1-e -Th2/τ ) wherein Th1 is the duration of PH1 as shown in Fig. 14, TP is the cycle time of the pulse of PH2, and Th2 is the duration of the pulse of PH2. The foregoing equation (5), representing the relationship between PH1 and PH2, is based on the following fact, to be explained by the laser turn-on wave form for the 3T pattern shown in Fig. 15B. The temperature of the medium after the duration of 1.5T of PH1 has to be same as that of the medium after the durations of 1.5T of PH1, 0.5T at the PL level and 0.5T of PH2. This requirement can be translated into the equation (5), representing the relationship between PH1 and PH2. This embodiment, as will be explained later in more details, is to calculate PH1 and PH2 by the equations (3) and (5) at the write test, and to effect test recording on the disk 1 with thus calculated values, thereby adjusting PH1 and PH2 to optimum values. Now the details of the write test method of the present embodiment will be explained with reference to a flow chart in Fig. 16. This write test is executed when the magneto-optical disk 1 is set on the apparatus shown in Fig. 2, namely when the disk 1 is exchanged. The write test of the present embodiment is principally composed of the following two steps: (1) for detecting the laser power level PHth immediately before the formation of the high-temperature level state, in order to determine the laser PL for forming the low-temperature level state on the magnetooptical disk 1; and (2) for determining the values of PH1 and PH2 for forming the high-temperature level state on the magnetooptical disk 1, according to the foregoing equations (3) and (5). At first there will be explained the step (1) for determining PHth, and the laser power level PL. Referring to Fig. 16, in case of the write test, the CPU 18 instruct to move the optical heat 4 to a predetermined write test area of the magnetooptical disk 1 (S1). Then the CPU 18 controls the drive circuit (not shown) for the bias magnet 13 and the semiconductor laser driving circuit 20, thereby applying an erasing bias magnetic field to the write test area and scanning the write test area with an erasing light beam to erase the write test area (S2). After the erasure, the CPU 18 sets an initial value Pw for the recording power of the semiconductor laser 5 (S3), for example by taking PL with which recording is performed in a control track of the magnetooptical disk 1. After the setting of the initial value of the recording power, the CPU 18 control the various units to record an 8T continuous pattern in the write test area with the power of such initial value (S4), and subsequently reproduces thus recorded 8T continuous pattern for detecting the amplitude level of the reproduced signal (S5), by means of the amplitude detection circuit 17. The obtained amplitude level is fetched into the CPU 18 by the A/D converter therein, and stored in an internal memory (S5). After such recording and reproduction with the initial value, the CPU 18 increases the recording power by adding ΔPw to the recording power Pw (S6), then records the 8T continuous pattern with thus increased recording power in the write test area (S4), reproduces the recorded signal and detects and stores the amplitude level of the reproduced signal (S5). By repeating the steps S4 to S6 with stepwise increases of the recording power to a predetermined recording power level, there can be determined the relationship between the recording power and the amplitude of the reproduced signal as shown in Fig. 7. The predetermined recording power can be, for example, twice of PH with which recording is effected on the control track of the magnetooptical disk 1. The above-mentioned PHth immediately before the formation of the high-temperature level state varies according to the temperature, depending on the characteristics of the medium. The present invention is based on this property and determines PL, PH1 and PH2 based on PHth, thereby setting the recording power corresponding to the variation in temperature. The CPU 18 determines PHth from the data of the recording power and the reproduced signal amplitude stored in the memory and stores PHth in the memory (S7). In this manner the step (1) for determining PHth is completed. The present embodiment employs (1-7) codes for modulating information to be recorded, and the longest bit 8T in this code system is used for the detection of the reproduced signal amplitude. In the following there will be explained the step (2) for determining the laser power levels PH1 and PH2 for forming the high-temperature level state, from the equations (3) and (5), again with reference to Fig. 16. At first the CPU 18 instructs to set the laser power level PL for forming the low-temperature level state as PL = α × PHth (S8), utilizing the PHth determined in advance, wherein α is defined by PLmin/PHth < α < 1.0. In this manner the value of PL is determined. Then, for calculating the laser power level for forming the high-temperature level state, the CPU 18 sets the initial value of the thermal diffusion constant τ as about T (S9). This value can be selected in arbitrary manner and employs, in this example, the cycle time T of the basic clock of the recording signal. Then the CPU 18 calculates PH1 and PH2 from the equations (3) and (5), based on the value τ (S10). Fig. 17 shows the relationship between PH1, PH2 and the thermal diffusion constant τ, wherein PH1 represented by black circles and PH2 represented by white circles decrease with the increase in the thermal diffusion constant τ. The CPU 18 instructs to record an 8T-continuous/2T-continuous pattern in the write test area of the magnetooptical disk 1 with thus calculated PH1 and PH2, wherein PL is the value obtained previously (S11). After the recording of the 8T-continuous/2T-continuous pattern, the CPU 18 instructs to reproduce this pattern by controlling various units and detects the slice level SL(8T) of the reproduced signal of the 8T pattern and that SL(2T) of the reproduced signal of the 2T pattern (S12). More specifically, the asymmetry detection circuit 19 detects the middle values of the peak and bottom values of the reproduced signals of the 8T continuous pattern and the 2T continuous pattern, then detects the difference ΔSL between the slice level SL(8T) of the reproduced signal of the 8T continuous pattern and that SL(2T) of the reproduced signal of the 2T continuous pattern (S13), and the obtained ΔSL is fetched in the CPU 18 and stored in the memory (S14). Then the CPU 18 adds Δτ to τ (S15), and effects again calculation of PH1 and PH2 by substituting thus increased value in the equations (3) and (5) (S10), recording of the 8T/2T continuous pattern with thus obtained PH1 and PH2 values (S11), detection of the slice levels of the reproduced signals (S12), detection of ΔSL (S13) and storage thereof (S14). The CPU 18 repeats the steps S10 to S14 with stepwise increase of τ by Δτ until a predetermined value of τ, with detection, each time, of the difference ΔSL between the slice level SL(8T) of the reproduced signal of the 8T continuous pattern and that SL(2T) of the reproduced signal of the 2T continuous pattern, whereby there can be obtained data as shown in Fig. 18. Fig. 18 shows the relationship between ΔSL and PH1, and were obtained by calculating PH1 and PH2 from the equations (3) and (5) with different values of τ, then recording the 8T/2T continuous pattern with thus obtained values and measuring the difference ΔSL between the slice levels of the 8T and 2T reproduced signals. Though not illustrated, similar data can also be obtained for PH2. Based on these results, the optimum values of PH1 and PH2 can be determined from the value of τ when ΔSL (=SL(8T) - SL(2T)) becomes zero. In this manner the optimum values of PL, PH1 and PH2 are determined (S18) and the write test is completed. The multi-level recording powers of the semiconductor laser 5 are set respectively to the optimum values obtained in the write test, and the information recording is thereafter conducted with such optimum recording powers. As explained in the foregoing, the present embodiment employs the (1-7) codes and detects the difference ΔSL between the slice levels (middle values between the peak and bottom values) of the two reproduced signals of the longest and shortest bits. Figs. 19A to 19C illustrate the reproduced signals of the 8T-continuous/2T-continuous pattern for different values of PH1 and PH2. Fig. 19A shows a reproduced signal wave form in case PH1 and PH2 are lower than the optimum values, wherein the 2T continuous pattern assumes a level lower than that of the 8T continuous pattern. In this case there is generated a difference between the slice levels of the two patterns, as shown in Fig. 19A. Fig. 19B shows a reproduced signal wave form in case PH1 and PH2 are at the optimum levels, wherein the slice levels of the two patterns are mutually equal. Fig. 19C shows a reproduced signal wave form in case PH1 and PH2 are higher than the optimum levels, wherein the 2T continuous pattern assumes a higher level than that of the 8T continuous pattern. Consequently, in this case, there is generated a difference between the slice levels of the two patterns, as shown in Fig. 19C. As shown in Fig. 19A to 19C, the reproduced signal of the longest 8T bit is in the saturated state, and, in this state, the middle value of the peak and bottom values, or the slice level, of the 8T reproduced signal can be regarded as 0. Thus, if the slice level of the 8T reproduced signal coincides with that of the 2T reproduced signal as shown in Fig. 19B, i.e. if ΔSL is 0, both the 2T bit and the 8T bit can be considered as recorded with respectively exact lengths. Consequently PH1 and PH2 calculated with τ when the condition ΔSL = 0 is satisfied become the optimum power levels PHlopt, PH2opt. The present inventors have conducted following experiment for confirming whether the PH1 and PH2, obtained in the write test explained above, are in fact the optimum recording powers. Random (1-7)-modulated signals of a maximum frequency of 5.90 MHz (T = 42,37 ns) were recorded on the magnetooptical disk 1 with a linear velocity of 2.56 m/s (revolution 3000 rpm and radial recording position 40.0 mm) with different values of PH1 and PH2, and jitter was measured at the upshift and down-shift edges of the reproduced signal. The larger one of the jitters on both edges was picked and plotted to provide results shown in Fig. 20. The recording power PHth immediately before the formation of the high-temperature level state was 4.0 mW, on which PL was selected as 3.6 mW, with α = 0.9. Fig. 20 is a map showing the level of jitter as functions of PH1 and PH2, represented respectively in the abscissa and in the ordinate. In Fig. 20, the jitter of the reproduced signal is classified into six levels, with a best level in a range of 2.50 to 2.60 ns and a worst level in a range of 3.00 to 3.10 ns. The plotting of jitter as functions of PH1 and PH2 in the form of Fig. 20 allows to evaluate PH1 and PH2 by the level of the jitter. More specifically, in Fig. 20, the jitter is smallest in the center of the contour lines and becomes larger at the outer contours. Consequently, in Fig. 20, a position marked with × at the center of contours indicates the recording conditions with smallest jitter, corresponding to 6.6 mW for PH1 and 6.6 mW for PH2. On the other hand, a position marked with a black circle indicates PH1 and PH2 obtained by the above-explained write test. As shown in Fig. 18, PH1 is 6.5 mW when ΔSL becomes zero, and PH2 is similarly 6.5 mW when ΔSL becomes zero though it is not illustrated. As shown in Fig. 20, the position of mark ×, representing the experimentally confirmed optimum conditions of PH1 and PH2 providing the smallest jitter, substantially coincides with the position of the black circle, representing the optimum recording conditions obtained according to the present invention. This fact indicates that the write test method of the present invention allows exact recording of the bits with minimized jitter in the reproduced signal, thus confirming that the recording powers in the multi-value control are appropriately adjusted. The recording power need not be varied if the linear velocity of the disk 1 is constant regardless of the recording position, but it has to be adjusted if the linear velocity of the disk 1 varies depending on the radial recording position, as in the case of CAV process. As shown in Fig. 9, a substantially linear relationship stands between the linear velocity and the recording power. Consequently, in such case, the write test explained in Fig. 16 is to be conducted, for example in the inner, intermediate and outer positions of the disk 1, and the values of PL, PH1 and PH2 obtained in respective positions are stored in a memory and are used to vary the values of PL, PH1 and PH2 by linear approximation, depending on the radial position on the disk 1. Also in the foregoing explanation, it is assumed that the write test is conducted at each exchange of the disk 1, but it may also be conducted prior to each information recording, or periodically at a predetermined interval even after the disk 1 is loaded. Also in the foregoing embodiment, the laser is assumed to be turned on with the wave form shown in Fig. 14, but the present invention is not limited to such wave form and may employ a turn-on wave form as shown in Fig. 21, which is for similarly recording a 4T pattern as in the wave form in Fig. 14, but is different in that Tfb is 0. The present invention is applicable also in this case, but it is to be noted that the equation of heat isolation assumes the following form, because of the absence of the cooling gap at the front edge as shown in Fig. 21: (PL-Pb) × (1-exp -Ts/τ ) = (PH1-Pb) × (1-exp -Th1/τ ) (exp -Trb/τ ) wherein Ts = Th1 + Trb Also in the foregoing embodiment, it is assumed that the laser is DC turned on in the space area as shown in Fig. 15B, but the present invention is applicable also in case pulsed turn-on is used in the space area as shown in Fig. 15C. In such case, however, in the determination of PL level from the PHth immediately before the formation of the high-temperature level state by PL = α' × PHth, a condition α' > 1.0 is employed in contrast to the foregoing embodiment. Such formation of the low-temperature level state by the pulsed turn-on provides an advantage of improving the precision of the laser power control for the low-temperature level. Also in the foregoing embodiment, the PHth immediately before the formation of the high-temperature level state is determined by recording an 8T continuous pattern and finding a recording power where the amplitude of the reproduced signal starts to increase, but the mark portion of the 8T continuous signal in the test pattern may also be recorded by pulsed turn-on of a length of T/2. In such case the PL level is determined from PHth by an equation PL = β × PHth, where coefficient β satisfies β < 1.0. Also the foregoing embodiment has been explained by the (1-7)-modulation process, but the present invention is naturally applicable to other modulating methods. [Third embodiment] In the following there will be given a detailed explanation on a third embodiment of the present invention, with reference to the attached drawings. Fig. 22 shows an optical information recording/reproducing apparatus constituting a third embodiment of the present invention, wherein components same as those in the foregoing embodiments are represented by same numerals and will not be explained further. In comparison with the configuration of the foregoing embodiments, that shown in Fig. 22 is additionally provided with a differentiating circuit 21 for differentiating the reproduced signal and a differential signal amplitude detection circuit 22 for detecting the positive and negative amplitudes of the signal differentiated by the differentiating circuit 21. The amplitudes detected by the differential signal amplitude detection circuit 22 are also used for regulating the power level of the semiconductor laser 5. Fig. 23 is a chart showing the turn-on wave form of the semiconductor laser 5 of the present embodiment, for example in case of recording a 4T pattern, wherein PL is a power level for forming a low-temperature level state (for erasure) in the magnetic film 2 of the magnetooptical disk 1, PH1 and PH2 are power levels for forming a high-temperature level state (for recording), and Pr is a constant reproducing power. The reproducing power Pr is same as the bottom recording power Pb, which is provided for a period of 0.5T before PH1 and for a period of 1.0T after PH2. They are respectively called a front cooling gap and a rear cooling gap. The PH1 is provided for a period of 1.5T, while PH2 effects pulsed turn-on with an interval of 0.5T. In the present embodiment, the recording power of the semiconductor laser 5 is controlled with four values PL, PH1, PH2 and Pr as shown in Fig. 23, and PL, PH1 and PH2 are set at optimum values by the write test. Figs. 24A to 24C show the correspondence between the recorded pattern and the laser turn-on wave forms. Fig. 24A shows the recorded pattern while Fig. 24B shows the corresponding laser turn-on wave form. In the present embodiment, in recording the space area of the recorded pattern, the semiconductor laser 5 is DC turned on as shown in Fig. 24B. A 4T mark is recorded with the laser turn-on wave form as shown in Fig. 23, while a 2T mark is recorded with a wave form consisting solely of PH1 as shown in Fig. 24B. A 3T mark is recorded, as shown in Fig. 24B, by the combination of a PH1 wave form same as that for recording a 2T or 4T mark and a PH2 pulse. Though not shown in Fig. 24B, a 5T mark is recorded with a PH1 wave form and three PH2 pulses. Similarly the number of PH2 pulses increases to 4, 5 or 6 respectively for a 6T, 7T or 8T mark. Such laser turn-on method at first with PH1 followed by pulsed turn-on with PH2 is to maintain the recording medium at a predetermined temperature, and to prevent excessive heating. Also such control method of PH1 and PH2 can suppress fluctuation in the bit edge. Consequently such control method for the laser beam can be advantageously used in the aforementioned pit edge recording, in which information is given to the edge position of each bit. As explained in the foregoing, the space area is recorded with DC turn-on with the power PL. The present embodiment employs the (1-7) codes as explained before, in which the shortest and longest bits are respectively 2T and 8T. Fig. 24C shows a laser turn-on wave form in case the pulsed turn-on is used for the space area, as will be explained later in more details. In the following there will be explained an example of the write test to be used in the apparatus shown in Fig. 22, with reference to Figs. 25 and 26. This write test is to be conducted when the magnetooptical disk 1 is set on the apparatus shown in Fig. 22, namely at the time of exchange of the disk. The write test of the present embodiment consists principally of the following three steps: (1) The laser power PHth immediately before the formation of the high-temperature level state is detected, for determining the laser power level PL for forming the low-temperature level state (for erasure) on the magnetooptical disk 1; (2) The laser power level PH1, for forming the high-temperature level state (for recording) on the magnetooptical disk 1, is determined; and (3) Another laser power level PH2, for forming the high-temperature level state on the magnetooptical disk 1, is determined. At first there will be explained the step (1) for determining the laser power level PL. Referring to Fig. 25, in case of the write test, the CPU 18 instructs to move the optical head 4 to a predetermined write test area of the magnetooptical disk 1 (S1). Then the CPU 18 controls the drive circuit for the bias magnet 13 and the semiconductor laser driving circuit 20, thereby applying an erasing bias magnetic field to the write test area and scanning the write test area with an erasing light beam to erase the write test area (S2). After the erasure, the CPU 18 sets an initial value Pw for the recording power of the semiconductor laser 5, for example by taking PL with which recording is effected in a control track of the magnetooptical disk 1. After the setting of the initial value of the recording power, the CPU 18 instructs to record an 8T continuous pattern in the write test area with the power of such initial value (S4), and subsequently reproduces thus recorded 8T continuous pattern for detecting the amplitude level of the reproduced signal (S5), by means of the amplitude detection circuit 17. The obtained amplitude level is fetched into the CPU 18 by the A/D converter therein, and stored in an internal memory (S5). After the recording and reproduction with the initial value, the CPU 18 instructs to increase the recording power by adding ΔPw to the recording power Pw (S6), then the 8T continuous pattern is again recorded with thus increased recording power in the write test area (S4), the recorded signal is reproduced to detect and store the amplitude level of the reproduced signal (S5). By repeating the steps S4 to S6 with stepwise increases of the recording power to a predetermined recording power level, there can be determined the relationship between the recording power and the amplitude of the reproduced signal, similar to that shown in Fig. 7. The predetermined recording power can be, for example, twice of PH with which recording is effected on the control track of the megnetooptical disk. The above-mentioned PHth immediately before the formation of the high-temperature level state varies according to the temperature, depending on the characteristics of the medium. The present invention is based on this property and effects detection of PHth immediately before the formation of the high-temperature level state and determination of PL, PH1 and PH2 based thereon, thereby setting the recording power corresponding to the temperature variation. The CPU 18 determines PHth from the data of the recording power and the reproduced signal amplitude stored in the memory and stores PHth in the memory (S7). In this manner the step (1) for determining PHth is completed. The present embodiment employs (1-7) codes for the modulation of the recording information, and the longest bit 8T in this code system is used for the detection of the reproduced signal amplitude. In the following there will be explained the step (2) for determining the laser power level PH1 for forming the high-temperature level state, again referring to Fig. 25. At first the CPU 18 calculates the laser power level PL for forming the low-temperature level state, utilizing the previously determined PHth, according to an equation PL = α × PHth (S8), wherein a coefficient α is defined by PLmin/PHth < α < 1.0. In this manner the value PL is determined. Then the CPU 18 sets the initial value of the laser power level PH1 for forming the high-temperature level state as PH1 = PHth (S9), and records an 8T-continuous/2T-continuous pattern in the write test area of the magnetooptical disk 1 under a condition PH1 = PH2 (S10). Thus the recording conditions in this state are PL = α × PHth and PH1 = PH2 = PHth, wherein PL is the value obtained previously. As explained in the foregoing, 8T and 2T are respectively longest and shortest bits in the (1-7) code system. After the recording of the 8T-continuous/2T-continuous pattern, the CPU instructs to reproduce this pattern by controlling various units and detects the slice level SL(8T) of the reproduced signal of the 8T pattern and that SL(2T) of the reproduced signal of the 2T pattern (S11). More specifically, the asymmetry detection circuit 19 detects the middle values of the peak and bottom values of the reproduced signals of the 8T continuous pattern and the 2T continuous pattern, then detects the difference ΔSL between the slice level SL(8T) of the reproduced signal of the 8T continuous pattern and that SL(2T) of the reproduced signal of the 2T continuous pattern (S12), and the CPU 18 stores thus obtained ΔSL in the internal memory (S13). After the determination of ΔSL, the CPU 18 adds ΔPH1 to PH1 (S14) and instructs to effect recording of an 8T-continuous/2T-continuous pattern in the write test area again with thus renewed recording power (S10), reproduction of thus recorded pattern and detection of the slice levels of the 2T and 8T continuous patterns (S11), detection of the difference ΔSL thereof (S12) and storage of the difference in the memory (S13). In this manner the CPU 18 instructs to repeat the steps S10 to S14 with stepwise increase of PH1 by ΔPH1, with detection of the difference ΔSL between the slice level SL(8T) of the reproduced signal of the 8T continuous pattern and that SL(2T) of the reproduced signal of the 2T continuous pattern each time, until PH1 reaches a predetermined value. Fig. 27 shows thus obtained relationship between PH1 and ΔSL, wherein the optimum value PHopt is given by the value of PH1 when SL(8T) - SL(2T) becomes zero. Fig. 27 shows actual data, obtained by recording the 2T/8T continuous pattern for different values of PH1 and measuring the resulting ΔSL. In the data shown in Fig. 27, ΔSL became zero when PH1 was 8 mW, so that PHlopt was determined as 8 mW. As explained in the foregoing, the present embodiment employs the (1-7) code system and detects the difference ΔSL between the slice levels (middle values between the peak and bottom values) of the two reproduced signals of the longest 8T and shortest 2T bits. Figs. 28A to 28C illustrate the reproduced signals of the 8T-continuous/2T-continuous pattern for different values of PH1. Fig. 28A shows a reproduced signal wave form in case PH1 is lower than the optimum value, wherein the 2T continuous pattern assumes a level lower than that of the 8T continuous pattern. In this case, therefore, there is generated a difference ΔSL between the slice levels of the two patterns, as shown in Fig. 28A. In contrast Fig. 28B shows a reproduced signal wave form in case PH1 is at the optimum level, wherein slice levels of the two patterns are mutually equal. Fig. 28C shows a reproduced signal wave form in case PH1 is higher than the optimum level, wherein the 2T continuous pattern assumes a higher level than that of the 8T continuous pattern. Consequently, in this case, there is generated a difference ΔSL between the slice levels of the two patterns, as shown in Fig. 28C. As shown in Figs. 28A to 28C, the reproduced signal of the longest 8T bit is in the saturated state, and, in this state, the middle value of the peak and bottom values, or the slice level, of the 8T reproduced signal can be regarded as 0. In the present embodiment, therefore, there is detected PH1 when ΔSL becomes zero, by varying the value of PH1, so as to record the 2T pattern with an exact length, taking 8T pattern as reference. Stated differently, since the slice level of the 8T reproduced signal can be regarded as 0, that of the 2T reproduced signal can also be regarded as 0 if the difference ΔSL between the slice levels of the 8T and 2T reproduced signals is 0. This fact means that the 2T bit can be recorded with an exact length, so that the PH1 value in this state can be obtained as the optimum power level for exactly recording the shortest 2T bit. Finally there will be explained the step (3) for determining the other laser power level PH2 for forming the high-temperature level state, with reference to Fig. 26, of which the step S15 follows the step S13 in Fig. 25. At first, based on the previously obtained results, the CPU 18 instructs to set PH1 at PH1opt, and also to set the initial value of PH2 as 0.8 × PH1opt (S15). Then the CPU 18 instructs to record an 8T continuous pattern in the write test area of the magnetooptical disk 1 under the recording conditions of PL = α × PHth, PH1 = PH1opt and PH2 = 0.8 × PH1opt. Then the CPU 18 instructs to reproduce, by controlling various units, the 8T continuous pattern recorded in the write test area (S17). The differentiating circuit 21 differentiates the obtained reproduced signal (S17), and the differential signal amplitude detection circuit 22 detects the positive amplitude (d/dt(LE)) and the negative amplitude (d/dt(TE)) of the differential signal of the 8T continuous pattern (S18). In this manner the differential signal amplitude detection circuit 22 detect the slopes of the front and rear edges of the differential signal of the 8T continuous pattern. The obtained amplitude values are fetched in the CPU 18 through the A/D converter. The differentiation of the reproduced signal is to detect the level of inclination thereof, as will be explained later. Then the CPU 18 discriminates whether the difference between the positive amplitude (d/dt(LE)) and the negative amplitude (d/dt(TE)) of the differential signal of the 8T continuous pattern, obtained in the differential signal amplitude detection circuit 22 (S19), is zero, and, if not, stores the obtained difference in a memory. Then the CPU 18 adds ΔPH2 to PH2 and again instructs to effect recording of the 8T continuous pattern in the write test area (S16), reproduction and differentiation of the 8T continuous pattern (S17), detection of the positive and negative amplitudes of the differential signal (S18) and discrimination whether the difference thereof is zero (S19). In this manner the CPU 18 instructs to repeat the steps S16 to S19 with stepwise increase of PH2 by ΔPH2, with discrimination each time whether the difference between the positive amplitude (d/dt(LE)) and the negative amplitude (d/dt(TE)) of the differential signal of the 8T continuous pattern is zero. Then, when the step S19 identifies d/dt(LE) - d/dt(TE) = 0, the value of PH2 in this state is determined as the optimum value PH2opt (S21). Fig. 29 shows the change of the difference between the positive and negative amplitudes of the differential signal of the 8T continuous pattern, as a function of PH2. Fig. 29 shows actual data obtained by recording the 8T continuous pattern with different values of PH2 and measuring the difference between the positive and negative amplitudes of the reproduced and differentiated signal. In the example shown in Fig. 29, the difference in the amplitudes became 0 when PH2 = 8.0 mW, so that the optimum power of PH2 was determined as 8.0 mW. In this manner the optimum values for PL, PH1 and PH2 are determined (S22) and the write test is completed. The multi-level recording powers of the semiconductor laser 5 are respectively set at the optimum values obtained in the write test, and the information recording is thereafter conducted with such optimum recording powers. In the present embodiment, as explained in the foregoing, there are detected the amplitudes of the positive and negative sides of the reproduced and differentiated signal of the longest bit (8T), and the optimum value of PH2 is determined according thereto. Figs. 30A to 30C illustrate reproduced signals of the 8T continuous pattern and corresponding differential signals, for different values of PH2. At first, Fig. 30A shows a signal wave form when the PH2 is lower than the optimum value, wherein the reproduced signal of the 8T continuous pattern declines toward the right-hand side. Thus the trailing edge (TE) is less steeper than the leading edge (LE), indicating that an ideally oval bit is not formed. In fact, in this case, there is formed a bit of inverse tear-drop shape. By differentiating this reproduced signal of the 8T continuous pattern, there is obtained a differential wave form as shown in Fig. 30A, in which the positive amplitude d/dt(LE) is larger than the negative amplitude d/dt(TE). Fig. 30B shows a signal wave form when PH2 is equal to the optimum value, wherein the reproduced signal of the 8T continuous pattern is symmetrical in the positive and negative sides. In this case the leading edge LE and the trailing edge TE have a same slope, indicating the formation of an ideally oval bit. By differentiating the reproduced signal of the 8T continuous pattern, there is obtained a differential wave form shown in Fig. 30B, wherein the positive amplitude d/dt(LE) is equal to the negative amplitude d/dt(TE). Fig. 30C shows a signal wave form when PH2 is higher than the optimum value, wherein the reproduced signal of the 8T continuous pattern assumes a right-upward profile. In such case the trailing edge TE is steeper than the leading edge LE, indicating that an ideal oval bit is not formed. In fact there is formed a tear-drop shaped bit in this case. By differentiating such reproduced signal of the 8T continuous pattern, there is obtained a differential wave form as shown in Fig. 30C, in which the positive amplitude d/dt(LE) is smaller than the negative amplitude d/dt(TE). As explained in the foregoing, the slopes of the leading and trailing edges of the reproduced signal are correlated with the shape of bit and allow to estimate whether the bit is recorded in the ideal state. Consequently, in the present embodiment, the recording operation is conducted with different values of PH2 for recording the 8T continuous pattern in an ideal bit shape, and there is detected the recording power PH2opt where the slopes of the leading and trailing edges of the reproduced signal become mutually equal. Stated differently, the optimum value PH2opt is determined by detecting the recording power where the positive amplitude d/dt(LE) and the negative amplitude d/dt(TE) of the reproduced and differentiated signal of the 8T continuous pattern become mutually equal. The present inventors have conducted following experiment for confirming whether the PH1 and PH2, obtained in the write test explained above, are in fact the optimum recording powers. Random (1-7)-modulated signals of maximum frequency of 9.83 MHz were recorded on the magnetooptical disk 1 with a linear velocity of 12.56 m/s (revolution 3000 rpm and radial recording position 40.0 mm) with different values of PH1 and PH2, and jitter was measured at the upshift and downshift edges of the reproduced signal. PHth was 6.0 mW, and PL was set at 5.4 mW, with α = 0.9. The larger one of the jitters on both edges was picked and plotted to provide results shown in Fig. 31, which is a map representing the level of jitter as functions of PH1 and PH2, respective represented in the abscissa and in the ordinate. In Fig. 31, the jitter of the reproduced signal is classified into six levels, with a best level in a range of 1.50 to 1.60 ns and a worst level in a range of 1.80 to 1.85 ns. The plotting of jitter as functions of PH1 and PH2 in the form of Fig. 31 allows to evaluate PH1 and PH2 by the level of the jitter. More specifically, in Fig. 31, the jitter is smallest in the center of the contour lines and becomes larger at the outer contours. Consequently, in Fig. 31, a position marked with × at the center of contours indicates the recording conditions with smallest jitter, corresponding to 8.2 mW for PH1 and 8.05 mW for PH2. On the other hand, a position marked with a black circle indicates PH1 and PH2 obtained by the above-explained write test. As shown in Fig. 27, PH1 is 8.0 mW when ΔSL becomes zero, and, as shown in Fig. 29, PH2 is 8.0 mW when the positive and negative amplitudes of the differential signal become mutually equal, whereby the black circled position in Fig. 31 is derived. As shown in Fig. 31, the position of mark ×, representing the experimentally confirmed optimum conditions of PH1 and PH2 providing the smallest jitter, substantially coincides with the position of the black circle, representing the optimum recording conditions obtained according to the present invention. This fact indicates that the write test method of the present invention allows exact recording of the bits with minimized jitter in the reproduced signal, thus confirming that the recording powers in the multi-level control are appropriately adjusted. The recording power need not be varied if the linear velocity of the disk 1 is constant regardless of the recording position, but it has to be adjusted if the linear velocity of the disk 1 varies depending on the radial recording position, as in the case of CAV process. As shown in Fig. 9, a substantially linear relationship stands between the linear velocity and the recording power. Consequently, in such case, the write test explained in Figs. 25 and 26 is to be conducted, for example in the inner, intermediate and outer positions of the disk 1, and the values of PL, PH1 and PH2 obtained in respective positions are stored in a memory and are used to vary the values of PL, PH1 and PH2 by linear approximation, depending on the radial position on the disk 1. Also in the foregoing explanation, it is assumed that the write test is conducted at each exchange of the disk 1, but it may also be conducted prior to each information recording, or periodically at a predetermined interval even after the disk 1 is loaded. Also in the foregoing embodiment, the laser is assumed to be turned on with the wave form shown in Fig. 23, but the present invention is not limited to such wave form and may employ a turn-on wave form as shown in Fig. 12A, 12B or 12C. Also in the foregoing embodiment, the PHth immediately before the formation of the high-temperature level state is determined by recording an 8T continuous pattern and finding a recording power where the amplitude of the reproduced signal starts to increase, but the mark portion of the 8T continuous signal in the test pattern may also be recorded by pulsed turn-on of a length of T/2. In such case the PL level is determined from PHth by an equation PL = β × PHth, wherein β < 1.0. Also in the foregoing embodiment there has been explained a write test controlled by four values PL, PH1, PH2 and Pr, but the present invention is not limited to such case and is applicable also, for example, to a case controlled by three values PL, PH and Pr (= Pb). In such three-value controlled case, the write test is conducted in the following manner. At first steps S1 to S8 in Fig. 25 are executed in the same manner as in the three-value control to detect PHth, according which PL is set. Then, since the high-temperature level state (for recording) in the three-value control is solely determined by the power level PH, the step S9 in Fig. 25 sets PH - PHth, and the step S10 records the 8T-continuous/2T-continuous pattern with thus set power level PH. Subsequently the step S11 reproduces the recorded pattern and detects the slice levels of the 8T and 2T reproduced signals, then the step S12 detects the difference ΔSL of the slice levels of the 8T and 2T signals, and the step S13 stores the obtained ΔSL in the memory. The steps S10 to S13 are repeated with stepwise increase of PH1 by ΔPH1 until a value of PH reaches a desired one, with detection, each time, of the difference ΔSL between the slice level SL(8T) of the reproduced signal of the 8T continuous patten and that SL(2T) of the reproduced signal of the 2T continuous patten, whereby data as shown in Fig. 27 can be obtained. Based on these data, the optimum power level PHopt can be determined when SL(8T) - SL(2T) becomes zero. In this manner the optimum values of PL and PH are determined, and the write test for three-value control is completed. In this manner that present invention is applicable also to the write test for three-value control. Also the foregoing embodiment has been explained with the (1-7) code system, but the present invention is naturally applicable to other modulation systems.

Claims: A write test method for use in a recording process for recording information on a recording medium by modulating light from a laser into a plurality of recording power levels (PL, PH1, PH2) and a reproducing power level (Pr) lower than the recording power levels, comprising the steps of: determining the relationship between the amplitudes of reproduction signals reproduced from information recorded on the recording medium and the recording power levels (S1-S6) used to record the information; and setting the recording power levels (PL, PH1, PH2) of the laser light on the basis of said relationship, the method being characterized in that: said setting step includes the steps of: determining the intensity of a threshold value of the recording power level (PHth) at which the amplitudes of the corresponding reproduction signals abruptly increase; and determining the values of each of the plurality of recording power levels (PL, PH1, PH2), using the threshold recording power level (PHth) as a reference value. A write test method according to claim 1, wherein the plurality of recording power levels include a value corresponding to a recording power level (PL) for a low-temperature recording process and at least one recording power level (PH1) for a high-temperature recording process, and said step of determining the values of the recording power levels includes the step of: determining the low temperature recording power level (PL) by multiplying the threshold recording power level (PHth) by a predetermined constant (α). A write test method according to claim 1 or 2, wherein said step of determining the values of the plurality of recording power levels (PL, PH1, PH2) includes the steps of: recording recording marks of different lengths on the medium using the threshold power level (PHth) as an initial value of the recording power level; obtaining reproduction signals representative of the recording marks; determining the values of the reproduction signals midway between the maximum and minimum signal values corresponding to each of the recording marks of different lengths, and determining the difference between the midway values; and adjusting the value of the recording power level so as to reduce said difference and using said adjusted value as the determined recording power level (PH1, PH2). A write test method according to claim 3, in which said step of obtaining an adjusted power level is repeated to determine two different recording power levels and the method includes the further steps of: determining the ratio (β) of the two determined recording power levels (PH1, PH2) obtained in the adjusting steps; recording recording marks of different lengths using the two determined power levels (PH1, PH2) as initial volumes of the recording power levels and obtaining reproduction signals representative of the respective marks; detecting the values of the reproduction signals corresponding to each of the recording marks midway between the peak value and the lowest value; detecting the difference between the midway values for recording marks of different lengths; and varying the recording power levels (PH1, PH2) at which said difference tends towards zero whilst keeping said ratio (β) constant to obtain modified determined power levels (PH1, PH2). A method according to claim 4, wherein said step for obtaining the ratio (β) of said determined recording power levels (PH1, PH2) includes the steps of: using the method of claim 3 to determine a first determined recording power level (PH1) and storing the first determined recording power level (PH1); recording recording marks of different lengths with an initial value of the second recording level (PH2) less than the threshold value (PHth) and the first recording power level (PH1) set at the stored recording power level (PH1); reproducing signals representative of the respective recording marks; detecting the values of the reproduction signals midway between the maximum and minimum signal values corresponding to each of the recording marks, and determining the difference between the midway values for the different length recording marks; adjusting the second recording power level (PH2) such that said difference tends towards zero; and calculating the ratio (β) of the first determined recording power level (PH1) and the second determined recording power level (PH2) on the basis of the stored recording power level (PH1) and the adjusted second recording power level (PH2). A write test method according to claim 1 or 2, wherein said determining step includes a step for determining at least one of the plurality of recording power levels (PH1, PH2) of the laser light on the basis of the threshold power level (PHth) and the estimated thermal diffusion coefficients (τ) of the medium. A write test method according to claim 1 or 2, wherein said determining step includes the steps of: recording recording marks of a predetermined length on the medium, using the laser light at the threshold power level (PHth); reproducing respective reproduction signals representative of the recording marks; differentiating the reproduction signal corresponding to each of the recording marks, and detecting the difference between the magnitudes of the differential signals produced by the leading and falling edges of the reproduction signals; adjusting the value of the recording power level such that the difference between the magnitudes of the differential signals from the leading and falling edges of the reproduction signals tends towards zero; and using said adjusted value as the determined recording power level (PH2). A write test method according to any one of the preceding claims, in which the test is performed on different areas on the medium to produce recording power levels suitable for use on each of the different areas. A write test method according to any one of the preceding claims, in which the medium is a magneto-optical recording medium recordable by an optical modulation process. A write test method according to any one of the preceding claims, in which the recording method is a pit edge recording process. A recording method for optically recording information on a recording medium including a write test method according to any one of claims 1 to 10 for determining the recording power levels to be used in the recording method; and recording information on the medium using the predetermined recording power levels. An apparatus for performing a write test method for use in a recording process for recording information on a recording medium (1) by modulating a laser light into a plurality of recording power levels (PL, PH1, PH2) and a reproducing power level (Pr) lower than the recording power levels, comprising: means for performing the method claimed in claims 1 to 10. A recording apparatus including an apparatus for performing a write test method according to claim 12, and means for recording information on a recording medium at the recording power levels determined by the apparatus for performing a write test method.

Inventors: ASHINUMA TAKAAKI, KIMURA SHUNPEI, MIYASHITA AKIRA, SHIRATORI TSUTOMU, ASHINUMA, TAKAAKI, KIMURA, SHUNPEI, MIYASHITA, AKIRA, SHIRATORI, TSUTOMU
Applicants: CANON KK, CANON KABUSHIKI KAISHA
Application year: 1996
Main classification: G11B11
IPC codes: G11B11, G11B7