ULTRA-SENSITIVE DETECTION OF CONTAMINANTS IN GAS VIA INTRACAVITY LASER SPECTROSCOPY (ILS)

Abstract: Contaminants in gases such as corrosives are detected optically at concentrations below 1 part-per-million (ppm) and extending to a level below 1 part-per-trillion (ppb) by using intracavity laser spectroscopy (ILS) techniques. A laser (500), the ILS laser (500), is employed as a detector (10). The ILS laser (500) comprises a gain medium (507) contained in a laser cavity (5). A gas sample containing gaseous contaminant species is contained within a gas sample cell (406) which is placed inside the laser cavity (5) and on one side of the gain medium (406). In the case where gaseous species are to be detected in corrosive gas, the corrosive gas is prevented from reacting with the components of the ILS laser (500). The output signal from the ILS laser (500) is detected and analyzed to identify the gaseous species (via its spectral signature). The concentration of the gaseous species can be determined from the spectral signature as well.

Description: ULTRA-SENSITIVE DETECTION OF CONTAMINANTS IN GAS VTA INTRACAVITY LASER SPECTROSCOPY (ILS) TECHNICAL FIELD This invenuon relates, generally . to the detection of contaminants in gases, and more particularly, to the high sensitivitv detection of gaseous molecules, atoms, radicals, and/or ions by laser techmques generally termed lntracavity laser spectroscopy (ILS) BACKGROUND OF THE INVENTION In the preparation of high quality semiconductor material (e g , silicon films) for use in the microelec¬ tronics industry, it is well known that contaminants must be controlled Failure to control contaminants, as is also well known and appreciated, can result in the loss of significant resources as the resultant products are typicalh not useful for their intended purposes Generally, the starting matenals in the fabπcauon of silicon films consist essentially of gases, typi- cally denoted either "bulk" (e g , nitrogen or argon) or "specialty" (e g , hydrogen chloπde, hydrogen bromide, boron trichloride) The successful operauon of a fabπcation facility designed to prepare semiconductor maten¬ als depends directly on the punty of the starting gases, as well as the gas handling capabilities available to pre¬ serve gas punty dunng the delivery ofthe gases to the process chamber and while matenal processing is taking place Suitable control of the punty of such starting gases (I e . monitoring and inhibiting high levels of con- taπunants as mav be contained in the gases) is essenual Many molecular, atomic, radical, and ionic species are present in the bulk and specialty gases used in the preparation (e g , chemical vapor deposition or "CVD") and processing (doping and etching) of semiconductor matenals that can be viewed as "contaminants " Such contaminants can degrade either the qualitv of the fabπ- cated semiconductor matenal or the efficiency with which the semiconductor matenal is prepared The first step in controlling and/or eliminating these contaminants is their detection in the bulk and specialty gases used as starting matenals While this is generally recognized, heretofore practiced methods are generally inadequate This is due. in large part, to the situation created by seemingly ever increasing competi¬ tive industry standards which have developed Specifically, as the size of microelectronic devices has decreased while performance specifications have been intensified, the requirements for gas punty (1 e . absence of πucro- contaminauon) has increased Against this backdrop, it will likely be clear that several measurement cπteπa are important to detec¬ tor effectiveness (1) absolute detection sensiUvity usually stated as parts-per-total number of gas molecules m the sample (e g , parts-per-πulhon or number of contaminant molecules per IO *6 background molecules), (2) species selecuvity or the capability to measure the concentration of one species in the presence of other species, (3) rapidity of measurements to obtain a desired signal to noise ratio. (4) capability of monitonng contaminants in both non-reactive and reacuve gases, and (5) lineaπty and dynamic range of gas concentrations that can be measured The current state-of-the-art devices for contaminant detection (e , water) encompass a vanety of measurement techmques For example, current state-of-the-art devices for water vapor detection utilize con¬ ductivity and electrochemical, direct absoφtion spectroscopy. and atmosphenc pressure ionization mass spec- troscopy (APIMS) measurement techniques Each of these methods, however, fails to adequatelv address these requirements In particular, direct absoφtion spectroscopy generallv relates to the passing of light through the sam¬ ple from an external source and measuπng the reducuon m light intensity caused by molecular, atomic, radi¬ cal, and/or ionic absoφtion in the sample Detection sensitivity depends directly on the subtraction of two large numbers (light intensity from the external source before it passes through the sample and its intensity after it exits the sample) This limits the detection sensitivitv to the extent that direct absoφtion is generally consid¬ ered a low sensitivity methodology In the context of the present invention, laser technology, specifically lntracavitv laser spectroscopy (ILS), is disclosed as being used as a detector (sensor) to detect gaseous species (contaminants) at very high sensitivity levels In connection with this application, laser technology offers distinct advantages to gaseous species (contaminant) detection over known methods and, particularly, to water vapor detection In convenuonal applications of lasers to the detection of gaseous species (contaminants), laser pro¬ duced radiauon is used to excite the gas sample external to the laser m order to produce a secondary signal (e g , ionization or fluorescence) Alternatively, the intensity of the laser after it passes through a gas sample. normalized to its imtial intensity, can be measured (I e . absoφtion) Some twenty years ago, another detection methodology, lntracavitv laser spectroscopy, was first ex¬ plored in which the laser itself is used as a detector, see, e g , G Atkinson. A Laufer, M Kurylo, "DetecUon of Free Radicals by an Intracavity Dye Laser Technique." 59 Journal Of Chemical Physics. July 1. 1973 Intracavity laser spectroscopy (ILS) combines the advantages of convenuonal absoφtion spectroscopy with the high detection sensiUvity normally associated with other laser techniques such as laser-induced fluo¬ rescence (LIF) and multiphoton ionization (MPl) spectroscopy ILS is based on the intracavity losses associated with absoφtion in gaseous species (e g , atoms, molecules, radicals, or ions) found within the optical resonator cavity of a multimode. homogeneously broadened laser These intracavity absoφtion losses compete via the normal mode dynamics of a multimode laser with the ga generated in the laser medium (1 e . gam medium) Traditionally, ILS research has been dominated by the use of dve lasers because their multimode properties fulfill the conditions required for effective mode competition and their wide tunabihty provides spectral access to many different gaseous species Some ILS expeπments have been performed with multimode. tunable sohd- state laser media such as color centers and Ti Sapphire, see. e , D Gilmore, P Cvyin. G Atkinson. "Intracavity Absoφtion Spectroscopy With a Titanium Sapphire Laser." Optics Communications 77 (1990) 385-89 ILS has also been successfully used to detect both stable and transient species under expeπmental conditions where the need for high detection sensitivity had previouslv excluded absoφtion spectroscopy as a method of choice For example. ILS has been utilized to examine gaseous samples in environments such as cryogenically cooled chambers, plasma discharges, photolytic and pyrolytic decompositions, and supersonic jet expansions ILS has been further used to obtain quantitative absoφtion information (e g , line strengths and colhsional broadening coefficients) through the analysis of absoφtion hneshapes Some of these are descnbed in G Atkinson, "lntracavitv Laser Spectroscopv," SPIE Conf . Soc Opt Eng 1637 (1992) Pπor art methods of performing ILS. however, while suitable for use in laboratory settings, are unac¬ ceptable for commercial settings The constraints of commercial reality, as bneflv noted above, essentially dic¬ tate that such a detector be conveniently sized, relatively inexpensive, and reliable Laboratory models fail to fully meet these requirements Additionally, in the commercial setting for which ILS detection can be applied the gas sample may be contained in an environment which is not ideal In particular, for industrial processes, the gas sample is com¬ monly contained in corrosive gas For example, in the manufacture of semiconductor components, the ability to detect the presence of a contaminant (such as water vapor) in the presence of a corrosive gas (such as hydrogen chloπde) would be particularly useful A laboratory demonstration of the feasibility of using ILS techniques for detecting small quantities of water vapor in a mtrogen atmosphere with a Cr 4τ YAG laser is descnbed in D Gilmore. P Cvyin. G Atkin¬ son. "Intracavity Laser Spectroscopy in the 1 38-1 55 μm Spectral Region Using a Multimode Cr τ YAG La¬ ser," Optics Commumcations 103 (1993) 370-74 The expenmental apparatus utilized was satisfactory for demonstration of operational characteπstics, but undesirable for implementation in a commercial application as contemplated by the present invention, e g , for the detection of water vapor in a corrosive gas such as hy- drogen chloπde (HCl) In accordance with vanous aspects of the present invention, the present mvention provides a user friendly, l e . comparatively simple, detection system, having the advantages of direct absoφtion techniques but with dramatically increased detection sensitivities, capable of detecting gaseous species in reactive and non-reactive samples, in particular, in corrosive samples, at a commercially viable cost In this regard, the pre- sent invention addresses the long felt need for a method and apparatus for the high sensitivity detection of contaminants in reactive and non-reactive samples, and in particular, in corrosive gas systems in commercial settings SUMMARY OF THE INVENTION In accordance with the present invention a gas detection system for detecting the presence of gaseous species m a gas sample is provided The detection system compnses (a) a laser cavity, (b) an ion-doped crystal therein, (c) a pumping laser located outside the laser cavity which has an output which optically ex- cites the ion-doped crystal, thereby producing an output beam which exits the laser cavity, and (d) a container for containing the gas sample in the laser cavity, the output beam of the ion- doped crystal passing through the gas sample pnor to exiting the laser cavity Additionally, a method is provided for detecting the presence of gaseous species in a gas sample con¬ taimng corrosive gas The method compnses (a) selecting a spectral region wherein (l) the gaseous species has at least one absoφtion feature and (n) the corrosive gas has essentially no absoφtion features. (b) providing a laser compnsmg a laser cavity and a gain medium which resides therein, the gain medium outputting light having a wavelength distnbuuon at least a portion of which is in the selected spectral region, (c) providing a gas sample cell having windows which are transparent to light in the selected spectral region such that a beam of light can pass through the gas sample cell, (d) inserting the gas sample cell in the laser such that output light from the gam medium passes through the gas sample pnor to exiting the laser cavity, (e) inserting the gas sample contaimng the conosive gas in the gas sample cell such that out- put light from the gain medium passes through the gas sample, the gas sample sealed within the gas sample cell such that the corrosive gas does not react with the laser, and (f) directing the output beam of the gain medium after exiting the laser cavity to a detector assembly for determining the presence and/or concentration of the gaseous species in the gas sample The ILS gas detection system of the present invention preferably compnses a pumping laser used to provide the optical excitement reqmred to operate the ILS laser, a multimode ILS laser operated over the wavelength region in which the species of interest absorbs, a gas sample cell placed withm the optical resona¬ tor cavity of the ILS laser which may contain a corrosive gas, a wavelength dispersive spectrometer capable of spectrally resolving the output of the ILS laser, a detector capable of measunng the wavelength-resolved in¬ tensity of the ILS laser output, and an electronic circuit which can read the signal from the detector and con- vert it into electromc signal that can be processed by a computer The ILS gas detection system may also in¬ clude a chopping, pulsing, or modulating device designed to penodically interrupt the intensity of the pumping laser beam and the output from the ILS laser In accordance with vanous aspects of the present invention, contaminants are detected optically at concentrations below 1 part-per-billion (ppb) and extending to a level below 1 part-per-tillion (ppt) by using ILS techmques In corrosive gases, concentrations below 1 part-per-million (ppm) and extending to a level be¬ low 1 ppb can be detected For detecting water vapor in HCl, a solid-state laser with an ion-doped crystal me- dnim and operating in the 1300 nm to 1500 nm spectral region preferably serves as the detector A gas sample containing gaseous contaminant species (e g , water vapor) and coπosive gas (e g , HCl) is placed inside the optical resonator cavity of the laser (between reflective surfaces or minors) and on one side of the active me¬ dium Laser media having Cr 4+ YAG and Cr 4+ LuAG are descnbed here but other gam mediums such as other ion-doped crystals having multiple longitudinal and transverse cavitv modes can be used as well Alternative lasers systems mav be employed as well For example, a diode laser pumped solid state laser with an ion-doped crystal medium mav be optically configured to provide ILS detection BRIEF DESCRIPTION OF THE DRAWINGS Preferred exemplary embodiments of the present invention will be hereinafter descnbed in conjunc¬ tion with the appended drawing figures wherein like designations denote like elements The dra ings refeπed to in this descnption should be understood as not being drawn to scale except if specifically noted FIGS IA and IB are schematic block diagrams of a contaminant detector svstem m accordance with the present invention. FIG IA shows the basic configuration while FIG IB shows that configuration as em- bodied in an exemplary embodiment shown in FIG 2 FIG 2 is a more detailed schematic perspective view of the exemplary embodiment of a contaminant detector system in accordance with the present invention, FIGS 3A-3C include schematic representations of simple laser devices and accompanying graphical spectral outputs (intensity versus wavelength) obtainable from such devices, FIG 4 is a schematic perspective view of an ILS chamber including the chamber components depicted in FIG 2. some ofthe components shown in partially broken awav fashion FIG 5 is a perspective view of an exemplarv ILS laser cnstal holder and heat sink useful in connec¬ tion with the contaminant detector svstem shown in FIG 2, FIG 6 is an enlarged perspective view of an exemplarv embodiment of a beam shaping assembly m- eluding a chopper element which mav be advantageously used in connection with the contaminant detector system shown in FIG 2, FIG 7 depicts plots showing exemplarv water absoφtion spectra in N 2 and HCl gases over the wave¬ lengths of 1433-1440 nanometers FIG 8 depicts plots showing ILS water absoφtion in N ^ and HCl gases over the wavelengths of 1420- 1434 nanometers, FIG 9 depicts a plot showing water absoφtion intensity versus water concentration as determined by permeation tube/volume expansion techmques, and FIG 10 depicts a plot showing water absoφϋon intensity versus water concentration in the 1420-1430 nm region as determined by an in-line purifier DESCRIPTION OF THE PREFERRED EMBODIMENTS Reference is now made in detail to a specific embodiment of the present invention, which illustrates the best mode presently contemplated by the inventors for practicing the invention Alternative embodiments are also bπefly descnbed as applicable As previously bnefly noted, the subject matter of the present invention is particularly well suited for use in connection with the manufacmre of semiconductor components, and thus, a preferred exemplary em¬ bodiment ofthe present invention will be descnbed in that context It should be recognized, however, that such descπption is not intended as a limitation on the use or applicability of the subject invention, but rather is set forth to merely fully descnbe a preferred exemplary embodiment thereof In this regard, the present invention is particularly suited for detection of contaminants Contaminants as used herein refers to molecular, atomic, radical, and ionic species such as may be present in gaseous mate¬ nals, such as in the gaseous matenals which are used in the fabncation of silicon films, I e , inlet lines Alter¬ natively, the term contaminant may also refer to the gaseous mateπal itself, such as. for example when the de¬ tector of the present invention is used to determine if a line (e g , HCl line) has been sufficiently purged of the gaseous matenal In accordance with a prefened embodiment of the present invention and with momentary reference to FIG IA, a gas (contaminant) detection system 10 suitably compnses a pumping laser system A, an ILS laser and associated chamber B, a specttometer C. and a detector with associated electronics (e g . computer, digital electronics, etc ) D More particularly, and with reference to FIGS IB and 2, pumping laser system A suitably compnses a pumping laser 100, a beam shaping optics assembly 200 and a beam modulation assembly 300, laser and chamber B suitably compnses a chamber assembly 400 and an ILS laser 500. spectrometer C suitably compnses a spectrometer assembly 600. and. detector D suitably compnses a detector assembly 700 and a computer system 800 As will be descnbed more fully herein, gas detection system 10 advantageously detects gaseous species (contaminants) which are suitably contained in a gas sample In general, pumping laser dπver system A pumps ILS laser 500, preferably at or near the threshold level such that a laser beam passes through the gas sample thereby enabling the spectrum of the gas sample to be obtained This spectrum is suitably de¬ tected through use of detector/computer system D which, upon manipulation, enables the reliable and accurate determination of the presence and concentration at high sensitivity levels of gaseous species (contaminants) which may be contained within the gas sample With reference to FIGS 3A-3C. and in order to more fully explain the scientific pnnciples utilized in accordance with a preferred embodiment of the present invention, the general pnnciples of intracavity laser spectroscopy (ILS) are illustratively shown As is known, in its simplest terms, a laser can be descnbed as contaimng a gain medium, in which optical gain is produced, and a resonator, compnsed of optical elements such as mirrors Optical losses may appear m both the gain medium and the optical elements compnsmg the laser cavity (e g , the resonator) With particular reference to FIG 3 A. a laser device in its simplest form can be schematically illustrated as including a gain medium IA around which respective mirrors 2A and 3A are placed to form a laser cavity 5 Mirrors 2A and 3A are typically coated to have high reflectivity surfaces over a broad spectral range For example, the mirror coating on mirror 2A may be totally reflective, while the mirror coating on mirror 3 A may be partially reflective thereby permitting some light to escape from the laser cavity 5 The spatial region between the reflective surfaces of minors 2 A and 3 A in which the gain medium IA is placed defines the laser resonator or cavity, and in the context of the present invention relates to the so-called "intracavity region " The intensity (I) of the laser output may be determined both by the wavelength region over which the gain medium IA operates (λ) and the reflectivity of the resonator elements (e g , mirrors 2A and 3 A) Nor¬ mally this output is broad and without shaφ, distinctive spectral features, as is shown in the plot of I versus wavelength (λ) provided in Graph 3 A of FIG 3 A By selecting different optical elements to form the laser cavity 5. the spectral output of the laser can be altered or "tuned " For example, and with particular reference to FIG 3B. a tuned resonator cavity may include a diffraction grating 2B which replaces the highly reflective mirror 2 A shown in FIG 3 A As shown, the laser device therefore includes diffraction grating 2B, minor 3B, and a gain medium IB positioned therebetween In general, the result in spectral output from this tuned laser will be narrowed and appear as wavelengths withm the ongmal spectral output of the laser defined by the gained medium IA and the mirrors 2 A and 3 A (FIG IOA) For example, a schematic plot of intensity (I) versus wavelength (λ) illustrating a nanowed output is depicted m Graph 3B The laser output can also be altered by placing gaseous molecules, atoms, radicals, and/or ions in ei¬ ther their ground or excited states inside the optical resonator (e g . cavity) With reference to FIG 3C, a laser so configured may include a highly reflective minor 2C, a partially reflective mirror 3C with a gain medium IC, and an intracavity absorber 4 placed therebetween In this case, lntracavitv absorber 4 may compnse such gaseous species (e g , the sample containing contaminants) The effect of the mtracav ity gaseous species on the laser output can be observed For example, a plot of I versus λ for such a device is shown in Graph 3C Graph 3C compnses an absoφtion spectrum of the gaseous species contained within intracavity absorber 4 The dis¬ tinct absoφtion features illustrated in Graph 3C aπse from the intracavity species losses against which the la¬ ser gain must compete Thus, the absoφtion spectrum ofthe intracavity species mav appear in the spectral output of the laser In particular, the laser output intensity (I) at wavelengths where the stronger intracavity absoφtion feamres compete effectively against the gain properties of the resonator are more reduced As a result, as illustrated, instead of a relatively smooth continuous output, such as shown in Graph 3 A. a structured laser output such as shown in Graph 3C may be observed The decreases in intensity (I), as shown in Graph 3C. are due to absoφ- tion by the gaseous intracavity species. 1 e . the more intense the absoφtion feamres. the larger the decrease in the laser output intensity In accordance with the present invention, the absoφtion spectrum obtained by intra¬ cavity laser measurements in which an intracavity absorber is employed can be utilized for the high sensitivity detection of such gaseous species It has been found that each gaseous species can be uniquely identified by its respective absoφtion spectrum (signature) and thus can be used to confidently identify such gaseous species (contaminant) The present inventor has found that the appearance ofthe absorbing species (gaseous elements) within the laser resonator before and/or dunng the competition between gain and losses which naturally occur as the laser system approaches threshold give πse to enhanced detection sensitivity through use of ILS In view of the fact that the losses associated with the intracavity absorber become part of the competition between the gain and losses within the laser, even a small absorbance associated either with a weak absoφtion transition and/or an extremely small absorber concentration is amplified dramatically dunng the ga /loss competition As a re¬ sult, such competition clearly appears in the output of the ILS signal (see Graph 3C) Thus, using these pnn- ciples, ILS can be utilized to detect both weak absoφtion and/or extremely small absorber concentrations ILS detection differs significantly from other spectroscopy methods which employ lasers As descnbed above, the ouφut of a laser used for spectroscopy typically excites in a gaseous species, a secondary phenomena which is then monitored Alternatively, output of a laser may be passed through a gaseous species and the ab¬ soφtion of selected wavelengths in the output of the laser provides means for characteπzing the gas In either case, the operation ofthe laser is separate from and unaffected bv the gaseous species being measured With ILS detection, however, the operation of the laser is directlv effected bv the gaseous species In this manner, the ILS laser 500 itself acts as a detector In particular, the output from the ILS laser 500 as it ex¬ its the laser cavity 5 contains spectroscopic information about the gaseous species This mode of operation is unique to ILS detection and the ILS laser 500 Accordingly, ILS lasers 500 are distinctly different from conventional lasers and possess operational charactenstics which are not typical of conventional lasers For example, absorbing species which produce loss are intentionally introduced into the laser cavity 5 of ILS lasers 500 These absorbing species effect the opera¬ tion ofthe ILS laser 500 and alter its output Also, unlike lasers employed in conventional applications. ILS lasers 500 operate above but close to threshold (e g , within 10% of threshold power) However, operating near threshold often causes the output of the ILS laser 500 to be unstable Accordingly, additional techniques directed to stabilizing the output of the ILS laser 500 may be required In contrast, conventional lasers typically operate well above threshold to maximize output Maximiz¬ ing output, however, is not the objective of ILS lasers 500 Consequently, laser media which are inefficient and or do not produce high output power may be employed for ILS detection when such laser media are unfa¬ vorable for most other laser applications The purpose of the ILS laser 500 is not to produce light, but to monitor loss within the laser cavity 5 As descnbed above, mode competition inside the laser cavity 5 enables such loss within the ILS laser 500 to be detected with enhanced sensitivity Since ILS detection possesses increased sensitivity beyond conventional optical spectroscopy tech- mques, interferences from background gases having both weak absoφtion and/or extremely small absorber concentrations may be significant, even if such interferences are negligible with conventional spectroscopy techmques The detection of gases via ILS can be achieved by using a vanety of laser systems (As used herein, the laser system includes both the ILS laser 500 and the pump laser 100 ) These laser systems each share sev¬ eral common properties which are required for extremely high detection sensitivity Pπor art has identified three such properties First, the laser systems exhibit multimode operation near the energy threshold for lasing Second, the laser systems possess an operational wavelength bandwidth that is substantially broad relative to the absoφtion features of the gaseous species or contaminants (i e , molecules, atoms, radicals, and/or ions) being momtored Third, the laser systems maintain stable intensity and wavelength It will be appreciated that a vaπety of ILS laser systems having different physical and optical charac¬ tenstics meet these above-listed cnteπa for extremely high detection sensitivity The different physical and op- tical characteπstics of the laser systems may also provide distinct advantages such as with regard to the ex- peπmental conditions (e g., data acquisition times) under which ILS measurements are made Additionally, these different physical and optical charactenstics may influence one or more of the following ( 1) the gaseous species or contaminant (I e , molecules, atoms, radicals, and/or ions) that can be detected. (2) the respective concentrations of each gaseous species that can be determined, and (3) the practical types of samples to which detection can be applied E.xamples of the latter include the total pressure of the sample, the sample size, and the environment which the sample is contained Aga st the backdrop of these general pnnciples. in the context of the present invention, the present inventors have devised a commercially viable contaminant sensor system 10 which provides enhanced detec¬ tion of contaminants in gaseous samples which may contain corrosive gases (I e , gases which react with the components compnsing the ILS laser 500) With reference now to FIGS 1 A and 2. and in accordance with a preferred exemplary embodiment of the present invention, a gas detection svstem 10 suitably includes laser dnver 100 and an ILS chamber assem¬ bly 400 in which ILS laser 500 is contained Spectrometer assembly 600 and a detector/computer system 700. 800 are suitably optically connected to the output from ILS laser 500 whereat the absoφtion spectrum is suita- bly manipulated thus enabling the high sensitivity detection of the presence and/or concentration of gaseous species (contaminants) The ILS laser 500 operates in a wavelength region or spectral region suitable for detection of the contaminant contamed within the gas sample (e g , water vapor) Within this spectral region a signature ab¬ soφtion spectrum can be obtained Since gas phase spectroscopy has been studied extensively, a large and di- rectly useful literature exists which shows how gaseous species can be uniquely identified It will be appreciated that ILS detection can be used to monitor one gaseous species (e g , water vapor) m the presence of corrosive gas (e g , hydrogen chlonde) by selecting the appropnate spectral window within which to measure absoφtion In particular, a spectral region must be determined wherein (l) the contaminant or gaseous species has at least one absoφtion feamre and (n) the conosive gas has essentially no interfeπng absoφtion feamres By interfeπng absoφtion feamres is meant absoφtion features which overlap the absoφ¬ tion feature used to identify the gaseous species thereby causing the detection selectivity between the gaseous species and the corrosive gas to be compromised Many such spectral windows (where the corrosive gas has no absoφtion or very weak absoφϋon) exist within the absoφtion regions of a gaseous species Since absoφtion by the corrosive gas is extremely weak (if measurable) within these spectral windows. ILS sensors 100 operat¬ ing at these wavelengths can be used to detect the gaseous species ithout interference Finding a wavelength region where such a spectral wmdow exists (m order to avoid mterfenng spectroscopic signals) may require significant efforts In particular, the enhanced detection sensitivity of ILS detection for measuπng absoφtion in gases means that even interferences from background gases having weak absoφtion and/or extremely small absorber concentrations may be significant, even if such interferences are negligible with conventional spec¬ troscopy techmques Additionally, operation of an ILS laser 500 in a specific spectral region where a particular spectral signature exist may also require considerable effort Nevertheless, umque spectroscopic identification of a specific gas species can be routinely expected Thus, selectivity in the gaseous species detected can be achieved The existence of these spectral windows, however, may be evident only at high spectral resolution Consequently, sufficient spectral resolution may be reqmred to separate absoφtion features that appear near each other It will be further appreciated that the wavelength position and width of a specific spectral window de¬ pends directly on the specific gaseous species and the specific corrosive gas For example, for detection of wa- ter vapor in hydrogen chloπde (HCl). a spectral region mav be selected from the wavelength region between about 1420 and 1434 nanometers (nm) Alternatively, a spectral region may be selected from the wavelength region between about 1433 and 1440 nanometers Accordingly, the ILS laser 500 must output light having a wavelength distnbuuon at least a portion of which is in the selected spectral region In order to dπve ILS laser 500. gas detection system 10 requires a pumping source which delivers ra¬ diation of sufficient power and within a suitable wavelength region so as to optically excite the ILS laser at or slightly above its threshold In this regard, it is important that ILS laser 500 operate such that the gain in the laser medium exceeds the overall optical losses, including those associated with the ga medium, mirrors, and non-mirror intracavity optical elements, as well as the absoφtion of any gaseous species within the optical resonator cavity Moreover, preferably laser 500 operates with multiple longitudinal modes, l e . over a broad wavelength region Typically, a desirable bandwidth over which laser action occurs is between about 2 nm and about 15 nm While ILS laser 500 can also operate with more than one transverse resonator mode, such is not necessary In accordance with a preferred exemplary embodiment of the present invention, the laser dnver compnses an optical pumping laser 100 Suitably, the optical parameters (e g , average power density, peak power density, divergence and beam diameter) of pumping laser 100 advantageously match the optical re¬ quirements of ILS laser 500 As will be appreciated, to do so it is necessary to determine how many photons can be delivered within a specific volume and at a given distance from the pumping laser 100 over a particular penod of time In general, in accordance with the present invention, such determinations are made in accor¬ dance with known theoretical and quantitative equations such that the pumping laser 100 is suitably selected to advantageously match the optical characteπstics of ELS laser 500 While other dnvers may be utilized in the context of the present invention, preferably, a pumping la¬ ser 100 is selected on the basis of its operational wavelength and on its optical parameters in a manner such that it can alone be used to excite ILS laser 500 As will be descnbed in greater detail hereinbelow, in cases where pumping laser 100 is not effective alone to dπve (e g., pump) ILS laser 500. beam modification optics, such as beam shaping assembly 200, can be utilized However, in those cases where the radiation emanating from laser 100 suitably matches the pumping requirements (e g . mode volume) of the ILS gain medium con¬ tained within ILS laser 500, such beam modification optics are unnecessary In accordance with one exemplary embodiment of the present invention, pumping laser 100 compnses a laser operating at a wavelength, λ-,, (which is this case is a solid state crystal laser, I e , a Nd YAG, operating at approximately 1064 nm having an output power greater than about 2 8 watts with a TEMoo transverse mode structure) Suitably, a beam E propagating from pumping laser 100 has a linear polaπzation and is rotatable perpendicular to the plane of propagation Preferably, the divergence of the output beam (beam E) from pumping laser 100 is on the order of less than 0 5 mrad and evidences a beam diameter on the order of less than 5 mm A particularly preferred pumping laser 100 is model T20-1054C from Spectra Physics of Mountain View. CA As will be explained more fully hereinbelow, use of such a pump laser 100 typically requires use of beam shaping optics assembly 200 It should be appreciated that dπver 100 mav compnse anv suitable optical pumping source, either co- herent or incoherent, continuous or pulsed, that w ll suitably excite ILS laser 500 As a result, even in accor¬ dance with the previously recited preferred embodiment, pumping source 100 operates in a conventional man¬ ner and emits radiation over a desired frequency band and having a desired bandwidth For example, pumping laser 100 may compnse a diode laser Use of a diode laser as a pump laser 100. however, typically requires use of a beam shaping optics assembly 200 With continued reference to FIG 2, ILS laser 500, in the simplest case compnses an optical resonator cavity defined by the entire optical path length between respective mirrors 501. 503. 505 However, in those cases where system 10 is used to detect gases (contaminants) within the sample which do not chemically react with the components of the laser itself (e g , gain medium or crystal, mirrors. mechanical mounting, and the like), the resonator cavity can be defined by the region between mirrors 501, 503, and 505 In such a case, the gas sample region (I e . the region where the gas sample resides) compnses the region between minors 501, 503. 505 (excluding the laser crvstal 507) However, for gas samples containing conosive gases, I e , gases which chemically react with one or more of the laser components, it is desirable to separate the gas sample region from such components (e g , gam medium, mirrors, etc ) In accordance with a prefened embodiment of the present invention, a separate sample system 400 A may be advantageously utilized to isolate the sample from the laser components With reference to FIGS 2 and 4. in accordance with this prefened aspect of the present invention, sample system 400A preferably compnses a gas sample cell body 406 suitably maintained withm a gas sample cell holder 407 Respective cell windows 404 and 405 are suitably mounted on the distal ends of gas sample cell body 406 and provide optical access to the sample withm the cell bodv Windows 404 and 405 also suitably seal cell body 406 As will be discussed in greater detail below the region in which system 400A is suitably placed is astigmatically compensated Given this astigmatic compensation, windows 404 and 405 are not "active" optical elements which significantly alter or perturb the output the ELS laser beam except with respect to transmission An inlet conduit 408 and an outlet conduit 409 are operatively connected to gas cell body 406 With reference to FIG 4. couplings 408 and 409 are advantageously employed to ensure efficient and effective passage of a gas sample into and out of gas (contaminant) sample cell system 400A Accordingly, the gas detection system 10 of the present invention can continuously monitor a flowing gas at vaπable pressures including high pressure. In particular, the use of the gas sample cell body 406 advantageously enables the op- eration of the ILS laser 500 when measunng gases having a pressure which is different (l e , higher or lower) than atmospheπc pressure or the pressure for which the ILS laser was designed to lase Without such a gas sample cell body 406. lasing would be difficult to achieve when momtonng a gas sample having a different pressure from the pressure at which the ILS laser 500 was aligned Thus, the gas sample cell body 406 allows stable operation of the ILS laser 500 for a gas sample having a pressure in excess of atmospheπc pressure or the pressure which the ILS laser was design to lase Altematively. the gas sample may have a pressure less than atmosphenc pressure or the pressure which the ILS laser 500 was design to lase (e.g , when a vacuum exists in the gas sample cell body 406) Additionally, the gas sample cell body 406 enables stable operation of the ILS laser 500 for a gas sample having a pressure which fluctuates Smtably. cell body 406 compnses a stainless steel body having dimensions suitably m the range of 10 to 90 millimeters (mm) In accordance with a particularly prefened aspect of the present invenuon. sample system 400A defines an opening (I e . the opening in body 406) having a diameter on the order of about one- eighth of an inch Preferably, the opening in body 406 is symmetπcally the center of gas sample cell body 406 Preferably, the diameter of the opening in cell body 406 is suitably selected to be significantly larger than the diameter of the incoming beam such that optical alignment of gas sample system 400A may be easily ob- tamed The thickness of windows 404. 405 is suitably selected to avoid interferometnc effects which may inter¬ fere with the quality ofthe ELS absoφtion spectrum obtained through operation of the gas detection system 10 In accordance with this aspect, the mateπal used in forming windows 404. 405 is optimally chosen to mini¬ mize absoφtion losses in the region over which ILS laser 500 operates, such as in the range of 1350 to 1550 nanometers (nm) For example, windows 404. 405 may be formed from an optically compatible mateπal. such as Infrasil™ available from Research Electro Optics of Boulder. CO. that is highly polished Windows 404, 405 are suitably onented at Brewster's angle so as to further minimize reflective losses from the window sur¬ faces As so configured, gas sample cell 406 suitably permits beam H to pass through the gaseous sample to be analyzed Couplers 408, 409 with attached tubing are smtably selected to provide easy adjustment such as may be required to realign and/or align windows 404, 405 withm ILS laser 500 without significantly altenng the threshold pumping conditions The resonator cavity, in the case where system 400A is employed, is suita¬ bly defined by the physical length between mirrors 501, 503. 505 (including the laser crystal 507 and including the region between windows 404, 405 as well as windows 404 and 405 themselves that compnse the sample system 400 A) However, in such cases where the sample does not chemically react with the laser components, the sample cell may nominally be defined by the physical region between mirrors 501, 503. and 505, respec¬ tively, (excluding laser crystal 507) It will be appreciated that it is necessary that any gases (contaminants) within chamber 400 that are to be detected are smtably removed or eliminated such that the absoφtion spectrum of the sample obtained through use of the gas detection system 10 is accurate as to the amount or presence of those gases (contaminants) within the gas sample contained within system 400A In accordance with a preferred aspect of the present invention, chamber 400 advantageously evidences a sealed container which can be either purged of gas(es) (contamιnant(s)) to be detected, or evacuated to remove gas(es) (contaπunant(s)) to be detected, or in which the level of gas(es) (contaπunant(s)) can otherwise be reduced below the level to be detected in the sample system 400A Continuous removal of the contammants can be achieve, for example, by gettenng, as descnbed more fully below Refening to FIGS 2 and 4. in accordance with a prefeπed embodiment of the present invention, ELS chamber 400 (excluding the sample system 400 A) suitably compnses a container base 401 and attachable top 410 Respective windows 402. 403 are smtably positioned in the walls of body 401 in a suitable manner and position relative to the optical resonator cavity defined therewithin Container base 401 and top 410 suitably compnse stainless steel or aluminum Top 410 is advantageously secured to body 401 in accordance with any conventional techmque suitable to permit evacuation, purging and or further removal of contaminants there¬ within For example, a gasket 410A or other suitable means together with sealing devices (e g , mechanical assists, metal seals, adhesives, and the like all not shown) may be employed for such purposes Desirably, base 401 and top 410 are effectively sealed pnor to delivery to a user in a relatively tamper-proof manner For the purpose of purging or evacuating chamber 400. an inlet 411 for vacuum pumping and/or purging as well as an outlet 412 for vacuum pumping and/or purging are provided Windows 402, 403 are suitably disposed in the walls of container 401. thereby providing optical ac¬ cess to ILS chamber 400 Preferably . window 402 is suitably provided with an antireflective ( AR) coating on the order of about 1000 to 1100 nm, and optimally about 1064 nm On the other hand, window 403 preferably compnses an optical window without an AR coating Window 402 is suitably designed to provide for maxi- mum transmission at the wavelength λ-. in this case. 1064 nm Similarly, window 403 is suitably designed to provide maximum transmission over the operational wavelength region of the ILS laser 500 (e g . 1350 nm to about 1550 nm) More particularly, reducing gases (contaminants) in chamber 400 (excluding sample system 400 A) to an acceptable level may suitably compnse purging or evacuating sealable container 401 with top 410 such that the level of gases (contaminants) is below that to be detected in the gas sample within the sample system It will be appreciated that the loss contnbuted by the gases in the chamber 400 will be comparable to loss con¬ tributed by the gases in the gas sample cell body 406 when the ratio between (1) the concentration of gases in the chamber and (2) the concentration of gases m the gas sample cell body is equal to the ratio between (1) the length of the cavity (I e . between miπor 501 and miπor 505) and (2) the length that the ILS laser beam trav- erses in the cell body In such cases where the contaminant compnses water vapor, it is necessary that water levels in cham¬ ber 400 be reduced below those which are contained within the sample In accordance with the present inven¬ tion, detection levels of less than 10 ppt (1 ppb in coπosive gas) are obtainable While any now known or hereafter devised method for removing contaminants (e g , water) from chamber 400 (excluding the sample system 400 A) can be practiced withm the context of the present invention, preferably, chamber 400 is appro¬ pπately sealed and inert gases, such as mtrogen are pumped therem In some instances, it may be necessary to further evacuate the chamber 400 so as to create a vacuum which removes substantially all contammants con- tamed therein Also, it may be useful to heat the chamber 400 while evacuating Application of such heating or "baking" will enable a higher level of vacuum to be achieved if the chamber 400 is subsequently cooled while continually being evacuated In accordance with yet a further aspect of the present invention, a getter (not shown) may be advantageously employed with chamber 400 to provide even further elimination of water within the chamber As will be appreciated by those skilled in the art. a getter (e g , a molecular sponge) hav- g the capacity for continuously absorbing water may be utilized to reduce the level of water (contaminants) below the water concentration that is to be detected in the gas sample cell 406 (e g , less than 10 ppt) The gas sample is suitably communicated to system 400A by connecting a gas line to connectors 408, 409 and feeding the gas into sample system 400A As bπefly mentioned above. ILS sensor 500 suitably optically detects gaseous species (contaminants, e g , water vapor) contained m a gas sample placed within chamber 400 In accordance with the present inven¬ tion, ILS laser 500 suitably compnses a crystal (gain medium) 507 mounted in a crystal holder 508 Crystal 507 is suitably mounted m crystal holder 508 such that crystal 507 also is optimally placed with reference to the incoming beam As previously mentioned, the incoming beam is suitably shaped either by operation of pump 100 or through use of beam shaping assembly 200 such that incoming beam F suitably matches the mode volume ofthe ILS gain medium (e g , crystal 507) In general. ILS laser 500 is suitably configured such that the laser beam in the intracavity region is substantially parallel (l e , astigmatically compensated) in the region where the beam is directed to the gas sample, e g , as contained within system 400A While a vanetv of optical configurations may be employed for this purpose, these miπor configurations have been found to be particularly advantageous Such a configura- tion permits the accurate astigmatic compensation of the ILS laser beam thus permitting simultaneous meeting of the optical conditions necessary to pump ILS laser 500 at the lasing threshold and generation of a laser beam which is substantially parallel as it is directed to the gas sample, such as contamed withm system 400A In accordance with this aspect of the present invention, respective nuπors 501, 505 and a folding mir¬ ror 503 are smtably employed for this purpose Miπor 501 preferably compnses an optical miπor having an AR coating optimally centered about λ p , e g , between about 1000 and 1100 nm, optimally 1064 nm Miπor 501 also has a coating that effectively provides on the order of about 99 8% to about 100% reflectivity in the desired spectral region of operation of the ILS laser 500 (e g , about 1350 to about 1550 nm) Suitably, miπor 501 compnses a concave miπor For example, miπor 501 may have a radius of curvature (ROC) of about 10 centimeters (cm) and a diameter on the order of about 1 0 to about 1 30 cm Preferably, miπor 503 compnses a folding miπor which is configured similarly to miπor 501 and has a similar reflection coating In accordance with a prefeπed aspect of the present invention, miπor 503 has a coating suitable to achieve reflectivity of about 99 8% to about 100% over the desired spectral region (e g , about 1350 to 1550 nm) Preferably, miπor 505 compnses a flat miπor (ROC » ∞) With reference to FIG 2. one side of mir¬ ror 505. the side facing miπor 503 is advantageously provided with a reflective coating in the desired spectral region for lasing of the ILS laser 500, e g , between 1350 and about 1550 nm The other side 505B of miπor 505 is smtably uncoated Preferably surfaces of miπor 505 are suitably wedged one against the other at an angle on the order of about 0 5 to about 3 0 degrees, optimally about 1 0 degree The present inventors have found that wedging such surfaces in this manner tend to minimize undesirable reflections which may lead to interference effects Mounts 502, 504. and 506 enable mechanical adjustment to optically align the ILS cavity within chamber 400 For example, the present inventors have found that the efficiency of the ILS laser 500 is opti- mized for a laser configuration in which miπors 501 and 505 are aligned for a beam incident angle of about 0° and miπor 503 is aligned for a beam incident angle of about 12 5° Through the appropnate design, placement, and configuration of miπors 501. 503. and 505 beam H is substantially parallel (I e . collimated) in the region between miπors 503 and 505 As a result, sample svstem 400A can be inserted withm the intracavity region without significant deletenous effects in the performance of ILS laser 500 It will be appreciated, however, that the distance between any reflective surfaces (e g , miπors and windows) within the ILS laser 500 must not be such that anv interference occurs inside the ILS laser In¬ terference pattems are produced if the distance between the reflective surfaces equals an integer of number wavelengths comparable to the wavelength at which the ILS laser crvstal 507 operates As descnbed above. ILS laser crystal 507 preferably operates in a wavelength region suitable for de- tection of the contaminants contained within the gas sample (e g , water vapor) over which a signature absoφ¬ tion spectrum can be obtained As previously mentioned, laser crvstal 507 generally exhibits the properties of a multimode laser system It will be appreciated that the mode spacing of output of the laser crystal 507 is re¬ qmred to be small enough to accurately represent the absoφtion feamres of the gas sample Light produced by laser crystal 507 typically has a mode spacing of about 450 megahertz (MHz) to about 550 MHz. preferably about 500 MHz. thus ensunng accurate spectral replication of absoφtion bands While anv crvstal may be utilized in the context of the present invention, a Cr + YAG or Cr *4 lutetium (Lu)AG laser crvstal mav be op¬ timally used in connection with the present invention (e g , for the detection of water vapor in HCl) Moreover, other hosts for the Cr +4 ions may be used and other doped ions into these host crystals may be substituted The present inventors have found that the low gain efficiency of a Cr 4+ system m a garnet host (e , YAG or LuAG) can be operated successfully as a laser using a crvstal that is on the order of about 10 to 30 mm in length and 5 mm in diameter Preferably, the doped concentration is in the range of about 0 10% to 0 30% in such garnet host A particularly prefeπed laser gam medium 507 compnses a Cr 4÷ YAG or Cr 4+ LuAG crystal cut at Brewster's angle to minimize reflective losses More particularly, a Cr 4+ YAG crvstal cut at Brewster's angle (e g , for a crystal refractive index where n is about 1 82 and Θ B is about 61 20) having a crystal length of about 23 to 27 mm at about a 0 15% dopant level has been found to be particularly advantageous in the context of gas detection system 10 in accordance with the present invention Laser crystals 507 cuπently available, while improving in efficiency, have considerable losses associ¬ ated with them The losses translate to heat In accordance with the present invention crystal 507 suitably is mounted in a manner allowing for the effective removal of the heat thus generated in operation It should be appreciated, however, that as the efficiency of laser crystals 507 continue to improve as new crystals are devel¬ oped, the need or requirements on heat removing devices will be reduced and likely, at some point, the losses will be small enough that the need to remove the heat may be eliminated all together However, using crystals 507 presently available, ILS laser system 500 preferably further compnses a heat sink system 500A With continued reference to FIG 2 and additional reference to FIG 5. heat sink system 500A is con¬ nected to mount 508 and crystal 507 (not shown in FIG 5) As shown best in FIG 5. holder 508 preferably compnses a two-part holder smtably aπanged to mechanically hold the laser crystal 507 Heat sink system 500A preferably includes a copper heat sink bndge 510. a theπnal electnc cooler 509. and a thermal electπc sensor 511 Additionally, an electπcal temperamre control interface 512 is provided in the walls of the body 401 ofthe chamber 400 (see FIG 4) Mount 508 together with bndge 510, cooler 509. and sensor 511 serve to properly align crystal 507 with respect to the other optical elements compnsing ILS laser 500, as well as en¬ able control of the thermal properties of the crystal In accordance with the prefeπed aspect of the present invention, heat sink svstem 500A is in direct physical contact with crystal 507 Heat produced bv normal operation of crystal 507 through optical excitation occasioned by beam F is effectively conducted away from crystal 507 thereby maintaining a relatively constant operating crystal temperamre Preferablv. crvstal holder 508 compnses copper/aluminum which is operatively connected to cooler 509 and heat sink bndge 510 Suitably, heat sink 510 compnses a copper heat sink located m body 401 of chamber 400 such that excess heat is conducted away from crystal 507 Sensor 511 measures the temperature of holder 508, cooler 509, bndge 510, and crystal 507 such that optimum operating tempera¬ tures are maintained In accordance ith this aspect of the present invention, thermal management of crystal 507 is obtained, thereby eliminating the need for coolant liquids which may unnecessanly compromise and complicate the operauon ofthe gas detection system 10 ILS laser system 500 is suitably aπanged such that the angle (φ) of the beam exciting crvstal 507 and the reflected beam from miπor 503 is on the order of about 20° to 30° more preferablv from about 23° to 27°. and optimally about 25° This beam (beam H) is directed to the sample svstem 400A Output beam G from ILS laser 500 after passing through sample system 400A is directed to spec¬ trometer assembly 600 Such direction can be obtained, such as shown in FIG 2. through use of a folding mir¬ ror 601 smtably mounted in a miπor mount 602 Miπor 601 preferablv compnses a plane miπor contaimng a coating for high reflectivity m the desired spectral region of operation of the ILS laser 500 (e g , 1350 to 1550 nm) It will be appreciated that the output from the ILS laser 500 can altematively be transmitted via an optical fiber link to a remote site for spectral analysis In particular, beam G can be coupled into an optical fi¬ ber or an optical fiber bundle The output of the ILS laser 500. after having passed through the gaseous species, is thereby earned to the spectrometer assembly 600 which is located at the remote site Under the proper con¬ ditions, it has been demonstrated that such optical fiber transmission does not distort the spectral data With continued reference to FIG 2. spectrometer assembly 600 compnses dispersive gratings de¬ signed to spectrally resolve a coherent beam, in particular, the absoφtion spectrum of the contaminant in the sample to be detected Suitably, the spectral dispersion of the spectrometer 600 is sufficiently large to clearly resolve the absoφtion features of such contaminant, thus enabling the identification of the "signature" of each contaminant and the quantitative determination of the concentration of the contaminant While any now known or hereafter devised spectrometer may be utilized in accordance with the present invention, preferably spectrometer 600 compnses two diffraction grating assemblies 600A and 600B operating in conjunction with an optical beam expanding assembly 600C and a focusing lens assembly 600D Optical beam expanding as¬ sembly 600C preferably compnses lenses 603 and 605 smtably mounted within the gas detection system 10 through use of mounts 604 and 606 Lens 603 preferably compnses a negative lens and lens 605 preferably compnses a collimating lens, each preferably having an AR coating centered about the absoφtion spectrum of the contaminant in the sample to be detected, e g , between about 1000 nm and 1500 nm, optimally 1400 nm Diffraction grating assemblies 600A and 600B suitably compnse respective diffraction gratings 607 and 609 mounted on respective diffraction grating mounts 608 and 610 As will be appreciated, mounts 608, 610 permit tumng and adjustment of diffraction gratings 607, 609 withm spectrometer assembly 600 Focusing lens assembly 600D preferably compnses a lens 611 containing an AR coating at the wave- length at which the ILS laser 500 operates, e g , between about 1000 nm and 1500 nm, optimally 1400 nm The lens 611 focuses the output ofthe spectrometer 600 onto multichannel anay detector 701 The spectral region over which the ILS laser 500 operates is produced by spectrometer assembly 600 and is displaced spatially across a plane where the multichannel anay detector 701 is suitably fixed on a mount 702 An electronic board 703 containing the control and timing electronics required to operate and read lnfor- mation from the multichannel detector 701 is operatively connected thereto As a result, the entire spectrally dispersed absoφtion spectrum of the particular contaminant sought to be identified through use of the gas de¬ tection system 10 can be obtained The positions and relative intensities of the specific absoφtion feamres of the contaminant can be utilized to uniquely identify the detected gas (contaminant) as well as quantitatively determine the amount ofthe gas (contaminant) so detected The detector 701 may compnse, for example, an InGaAs multichannel aπav detector with 256 pixels having 100 μm spacing The light detected by multichannel detector 701 is preferably transduced into elec¬ tromc signals at each detector element (pixel) with signals thereafter transfened to an analog-to-digital (A/D) converter 801 through board 703 Converter 801 is suitably connected through a BNC connector and shielded cable 704 such that the accurate transfer of information is ensured Once the data is so converted, it is sent to a computer 802 which may be suitably programmed to convert the electronic signals into spectral information i.e , spectral signatures identifying a particular gas (contaminant) and concentfation of gases (contaminants) Altematively. the ouφut of the ILS laser 500 having passed through the gaseous species to be moni¬ tored can be directed to a spectrometer assembly 600 having at least one dispersive optical element (e g., dif¬ fraction gratings 607 and 609) therein which can be scanned with respect to wavelength The output of the spectrometer assembly 600 can then be directed to a single channel detector The spectral signature of the gaseous species in the laser cavity 5 is obtained by scanning the dispersive optical element while the light transmitted through the spectrometer assembly 600 passes through an appropnate aperture (e g , slit) placed in front of the single channel detector The intensity of the light transmitted through the spectrometer assembly 600, l e , the output ofthe spectrometer assembly 600, is recorded as the dispersive optical element is scanned With reference now to Figure 2. as previously mentioned, the gas detection system 10 detects the spectrally resolved region over which the ILS laser 500 operates once pumping laser 100 causes the ILS laser to operate at or near its threshold level In cases where the optical characteπstics of dnver 100 suitably match those of ILS laser 500, no additional modification of the output of dnver 100 is necessary However, in those cases where the volume of the pumping radiation from dπver 100 that is transfeπed to the gain medium (1 e , crystal 507) does not suitably match the volume that must be optically excited within the gain medium of ILS laser 500, beam modification system 200 can be utilized to facilitate such volume matching In its simplest fonn, beam modification system 200 preferably compnses an optical telescope useful to optimize the radiation delivered to ILS laser 500 by focusing the required photon density into the coπect location and volume of the gain medium of the ILS laser Specifically, beam modification svstem 200 is used to alter the pumping radia¬ tion of dnver 100 to meet the requirements of ILS laser 500 In accordance with the present invention, beam modification system 200 may compnses a beam ex- pandmg telescope Specifically, in such cases where pumping laser 100 compnses the prefeπed Spectra Phys¬ ics diode pumped solid state crystal laser and ILS crystal 507 compnses a Cr 4+ YAG or a Cr 4+ LuAG crystal, beam expansion of the pumping laser output mavbe necessary As shown best in FIG 6. system 200 suitably compnses a senes of lenses and adjustable apertures In particular, a frame 201 is provided which suitably includes respective upstanding walls into which respective vaπable aperture devices 202 and 205 are suitably provided While any appropnate means of varying the aper¬ ture of the opemng into which the output (e g , beam E) of laser 100 enters or exits system 200 may be em¬ ployed, suitably, devices 202 and 205 compnse convenuonal aperture varying devices System 200 also pref¬ erably includes a focusing lens 203 and a collimating lens 204 Preferably, lens 203 compnses a focusing lens and lens 204 preferably compnses a collimating lens both of which have an AR coating at the wavelength, λp, e g . at about 1000 to 1100 nm. optimally about 1064 nm As shown in FIG 6 lenses 203 and 205 are smtably attached to frame 201 to permit their respective alignment withm beam E With continued reference to FIG 2, in some applications, it may be necessary that the incoming beam be appropπately focused into the laser gain medium (e g , ion-doped crystal or glass) 507 within ILS laser 500 In accordance with the prefeπed aspect of the present invention, a focusing lens 206 may be advantageously mounted in a laser lens mount 207 such that the focusing lens is smtably located withm the path of beam F In accordance with a particularly prefeπed aspect of the present invention, focusing lens 206 suitably compnses an optical focusing lens with an AR coating centered about a wavelength λ p , e g , between about 1000 and 1100 nm and optimally 1064 nm coating Focusing lens 206 may be suitably configured to evidence a plano¬ convex or convex-convex configuration As will be appreciated by those skilled in the art, the quality of the quantitative information obtainable through use ofthe gas detection system 10 depends, at least in part, on stable operation of ILS laser 500 In the context of the present invention, the stability of laser 500 depends directly on how reproducibly ILS laser 500 reaches threshold Desirably, pumping laser 100 suitably pumps ILS laser 500 continuously near threshold where its greatest sensitivity may be obtained However, not all dnvers are capable of reliably operating in a continuous fashion In addition, operating continuously tends to require substantial effort to maintain ampli¬ tude and wavelength stability of the ILS laser 500 which may have an adverse impact on cost and thereby pro¬ duce an adverse impact on the commercial viability ofthe gas detection svstem 10 As an alternative to operating ILS laser 500 continuously, and in accordance with a prefeπed em¬ bodiment of the present invention, the ILS laser is operated in a "pulsed mode" or a "chopped mode" As used herein, the terms "pulsed mode" and "chopped mode" refer to processes for reproducibly exposing ILS laser 500 (l e , ion-doped crystal 507) to pumping radiation such that the ILS laser will be switched on and off Chopping coπesponds to causing the pump radiation to alternate between zero intensity and a fixed intensity value at a fixed frequency and over a fixed (often symmetnc) duty cycle In contrast, pulsing coπesponds to causing the pump radiation to alternate between zero intensity and a non-zero intensity (which is not necessar¬ ily fixed) over a duty cycle which may be vaned and which is typically asymmetnc (Altematively, the pump radiation can be modulated such that the intensity of the pump beam does not reach zero intensity but fluctu¬ ates altemately between at least two mtensitv levels which bnngs the ILS laser 500 alternately above and below threshold ) Through operation in the chopped mode or the pulsed mode, stable operation of ILS laser 500 consis¬ tent with the quantitative spectral and concentration measurements mav be obtained in a commercially viable manner Such intensity modulation (e g , interruption) can be achieved utilizing, among other things, a me¬ chanically operated chopper, an acousto-optic modulator, a shutter, and the like Altematively, the output intensity of pump laser 100 may be modulated instead of secondarily chop¬ ping the output beam (beam E) In particular, if the pump laser 100 compnses a diode laser, the electncal power supplied to the diode laser pump laser can be modulated to altemately obtain voltages just above and below that required to cause the ILS laser 500 to lase Consequentlv. the ILS laser 500 will be turned on and off While any now known or hereafter devised manner of producing a chopped mode or a pulsed mode can be utilized in accordance with the present invention, advantageously such modes are obtained through use of modulation assembly 300 In accordance with this aspect of the present invention, beam E is periodically prevented from reach¬ ing ELS laser 500 by a rotating modulator 301 which penodicallv blocks and transmits the pumping laser beam E Specifically, in FIG 6, modulator 301 compnses a mechamcal chopper Mechamcal chopper 301 is suitably placed so that beam E is modulated before reaching ILS laser 500 While modulator 301 may be advanta¬ geously placed before or after beam modification system 200, in accordance with a prefeπed embodiment of the invention, the chopper is suitably placed at the focal point within beam modification system 200 Altema¬ tively, the chopper 301 may be placed in front of the pump laser 100 As best illustrated in FIG 2. chopper 301 is suitably mounted in frame 201 of the beam modification assembly 200 It should be appreciated that chopper 301 could be replaced by any device, e g . mechanical or electro¬ optical, which penodically blocks or modulates the pumping laser beam As previously mentioned, in accor¬ dance with the present invention. the intensity of the pumping radiation emanating from pump laser 100 must only fall below that reqmred to make ILS laser 500 reach threshold and therefore, is not required to reach a zero value It will be further appreciated, however, that the total optical pumping energy (1 e . the integrated intensity) delivered by the pump laser 100 to the ILS laser 500, dunng each peπod of modulation, must remain constant With either the pulsed mode or chopped mode, the output of ILS laser 500 which contains the absoφ¬ tion information, may be peπodically sampled Refening again to FIG. 2, in accordance with a prefeπed em¬ bodiment of the present invention, modulation assembly 300 compnses modulator 301 (provided with appro¬ pnate electronic circuitry) and modulator 304 (also provided with appropriate electronic circuitry) Modulator 301 advantageously modulates the intensity of output beam E from pump laser 100 and lens 203. while modu- lation device 304 smtably modulates the output beam of ILS laser 500 that exits chamber 400. thereby penodi- cally sampling the output of the ILS laser Suitably, modulator 301 alternatively blocks pumping beam E from reaching ILS laser 500 gain medium (e.g , crystal 507), while modulator 304 alternatively blocks ILS laser beam exiting chamber 400 from reaching both spectrometer assembly 600 and detector assembly 700 Smtably. chopper 301 rotates between an open and closed position Chopper 301 is suitably driven by a chopper dnver 303 connected to chopper through use of a suitable electncal connector(s) 302 As dnver 303 causes chopper 301 to rotate to the open position, beam E reaches ILS laser 500, therebv bnngmg ILS laser 500 above threshold for laser activity ILS laser 500 continues to operate until dnver 303 causes chopper 301 to rotate to the closed position, whereupon chopper 301 effectively blocks pumping beam E from reaching ILS laser 500 ILS laser 500 output exiting chamber 400 is suitably directed to modulator 304 In accordance with vanous aspects of the present invention, modulator 304 compnses an acousto-optic modulator It should be ap¬ preciated, however that other available devices, for example, another mechanically operated chopper or even a shutter may be suitably employed for this puφose As discussed above, to extract quantitative infoπnation from the ELS laser 500 exiting beam, modulator 304 peπodically samples the output of the ILS laser which contains the absoφtion data of contaminants (e g , gaseous species) contained in the particular sample (It will be ap¬ preciated that instead of employing modulator 304. detector assembly 700 may be alternativelv switched on and off to peπodically sample the output of ILS laser 500 as will be discussed more fullv below ) While the specific form of modulation is vaπable. use of modulation enables generation of a repro¬ ducible, effective optical path length within ILS laser 500 Stated another way, by varying the generation time (tg), l e.. the time peπod over which intracavity mode competition within ILS laser 500 is permitted to occur, the effective absoφtion path length withm the intracavity resonator can be controlled and selected to achieve optimum quantitative application of the ILS gas detector 10 Advantageously, modulation of the output of the pump laser 100 is advantageouslv synchronized with modulation device 304 such that quantitative infoπnation from ILS laser 500 can be extracted in a time- resolved manner Pump radiation E is effectively delivered to ILS laser 500 intermittently by passing pump beam E through chopper 301 Delivenng radiation intermittently alternatively bπngs ILS laser 500 above threshold and below threshold After the generation time, t g , elapses as ILS laser 500 reaches its threshold, the ILS laser output is deflected by modulator 304 to the entrance of spectrometer assembly 600 and detector as- sembly 700 for detection However. ILS laser 500 ouφut beam G is deflected to spectrometer assembly 600 and detector assembly 700 for only a short time interval determined by the synchronization of modulation devices 301 and 304 The synchronization of modulators 301 and 304 ensures that radiation from ILS laser 500 is sampled over a well-defined time interval (t g ) Synchronization of modulators 301 and 304 may be achieved by several conventional methods such as. for example, through electronic control by a digital circuit (not shown) operated by computer 802 operatively connected to gas detection system 10 Typically, synchronization of modulators 301 and 304 will be suitable to generate generation times (tg) on the order of less than about 300 to 500 microseconds (μsec), more preferably on the order of less than about 10 to 100 μsec, and optimally on the order of less than about 1 μsec Such syn- chromzation results in the modulation assembly 300 allowing the output of the pump laser 100 to pass uninter¬ rupted when modulator 304 is closed The time interval between when the output of the pump laser 100 is not interrupted by the modulation assembly 300 and when modulator 304 opens is determined by t g The generation time. tg. can be vaned without the use of modulator 304 by pulsing the output of the pump laser 100 As descnbed above, pulsing coπesponds to causing the pump radiation to alternate between zero intensity and a non-zero intensity value over (which is not necessarily fixed) over a duty cycle which may be vaned. thereby bnnging the ILS laser 500 altemately below and above threshold Accordmgly. the ILS laser 500 is mmed off and on The duration over which the ILS laser 500 lases may be vaned by changing the duty cycle of the output of pump laser 100. in particular, the duration over which the pump laser pumps the ILS la¬ ser to threshold Accordingly, the generation time (t g ), l e . the time peπod over which intracavity mode com- petition within ILS laser 500 is permitted to occur, is vaned In this case, the detector assembly 700 remains continuously activated and the output of the ILS laser beam exiting chamber 400 is allowed to continuously reach the spectrometer assembly 600 and the detector assembly As descnbed above, however, the total optical pumping energy or integrated intensity delivered by the pump laser 100 to the ILS laser 500 dunng each penod of modulation must remain constant, even though the duration over which the of the ILS laser outputs light is changed To maintain a constant total optical pumping energy, the intensity level of the pump beam is adjusted with each different peπod of modulation over which tg is to be vaned Accordingly, both the intensity of the pump beam and duration over which the laser diode pump laser 100 pumps the ILS laser 500 to threshold, are a changed to provide different generation times Pulsing the output of the pump laser 100 can be achieved by externally controlling the transmission of the pump beam with a "pulser" Altematively. if the pump laser 100 is a diode laser, the output intensity ofthe diode laser pump laser may be modulated by varying the electπcal power supplied to the diode laser (As de¬ scnbed above, the electπcal power supplied to a diode laser pump laser 100 can be modulated to altemately obtain voltages just above and below that required to cause the ILS laser 500 to lase ) Accordingly, the gas detection system 10 of the present invention may include any of the following configurations each of which enables the generation time to be vaned (1) The ouφut of the pump laser 100 may be chopped with an extemal chopper (e g , chopper 301) and the detector 700 may be continuously activated with transmission of the output from the ILS laser 500 to the detector being controlled by a pulser (e g . modulator 304) to enable peπodically sampling, (2) The output of the pump laser 100 may be chopped with an extemal chopper (e g . chopper 301) and the detector 700 may be pulsed on and off to enable peπodicallv sampling of the output from the ILS laser 500, (3) The ouφut of the pump laser 100 may be pulsed with an extemal pulser and the detector 700 may be continuously activated with the duration of the interaction between the output of the ILS laser 500 and the gaseous species being controlled by the duration ofthe pulses from the pump laser which cause the ILS laser to lase, (4) In the case where the pump laser 100 is a diode laser, the output of the diode laser may be pulsed by varying the electπcal power supplied to the diode laser and the detector 700 mav be continuously activated with the duration of the interaction between the output of the ILS laser 500 and the gaseous species being con¬ trolled by the duration ofthe pulses from the diode laser which cause the ILS laser to lase. (5) In the case where the pump laser 100 is a diode laser, the output of the diode laser may be chopped by varying the electncal power supplied to the diode laser and the detector 700 mav be continuously activated with the transmission of the output from the ILS laser 500 to the detector being controlled by a pulser (e g , modulator 304) to enable peπodicallv sampling, and (6) In the case where the pump laser 100 is a diode laser, the output ofthe diode laser may be chopped by varying the electπcal power supplied to the diode laser and the detector 700 may be pulsed on and off to en¬ able peπodically samplmg ofthe output from the ILS laser 500 In the embodiment of the gas detection system 10 of the present invention descnbed above, the ILS laser 500 has a laser cavity 5 formed from three miπors (I e , miπors 501, 503, and 505) wherein miπor 503 is a folding miπor As descnbed above, this configuration of three nuπors is designed to provide an astigmati- cally compensated or substantially parallel beam in the region between miπors 503 and 505 Alternatively, the gas detection system 10 of the present invention may comprise an ILS laser 500 having a simplified laser cavity 5 In such an altemative embodiment of the present invention, the laser cavity 5 is not designed to provide astigmatic compensation Rather, the laser cavity 5 may be formed between two miπors thereby having a substantially linear configuration which does not provide astigmatic compensation However, the linear cavity design employed by such an altemative embodiment of the present invention en¬ ables a gas detection system 10 to be constructed which is substantially smaller and simpler Consequently, such an embodiment of the gas detection system 10 of the present invention is less expensive to constmct as well as easier to operate than the embodiment descnbed above Additionally, this altemative embodiment of the present invention based on a linear laser cavity can be constructed to be more rugged or mechanically sta¬ ble as is required by many practical applications By "linear laser cavity" is meant a laser cavity 5 that is equivalent to a laser cavity formed between only two miπors In its simplest form, a linear laser cavity compnses a laser cavity 5 formed between a first miπor and a second miπor It will be appreciated that any number of additional miπors which are planar may be included to steer (i e . alter the path) of a beam which travels from the first miπor to the second miπor The inclusion of these additional miπors. however, does not modify the shape of the beam withm the laser cavity 5 (provided that the distance between the first miπor and the second miπor is not changed) Accordingly, the inclusion of additional planar miπors in a laser cavity 5 of a laser does not effect the operation of the laser but merely alters the manner in which the laser is physically configured Consequently, a laser cavity 5 formed between a first miπor and a second miπor. having additional planar miπors therebetween, is equivalent to a laser cavity formed solely between the first miπor and the second miπor. removing the additional planar mir- rors alters neither the shape of the beam nor the operation of the laser The use of such additional planar mir¬ rors, however, may be employed to fit a laser cavity 5 into a package having spatial constraints Thus, there has been disclosed an apparams for detecting the presence and concentration of contami¬ nants in a gas sample containing a coπosive gas by utilizing gas detection system 10 In accordance with a prefeπed embodiment of the present invention, a method for high sensitivity detection is also disclosed herein The method suitably compnses reducing gases (contaminants) m sample chamber 400 to an acceptable level, placing a sample of gas to be detected in sample system 400A. pumping ILS laser 500 at or near threshold, penodically sampling the optical output from ILS laser 500, preferably via modulation assembly 300. measur¬ ing the absoφtion spectmm of the gases (contaminants) withm the sample with spectrometer assembly 600 and detector assembly 700. and analyzing the absoφtion spectmm to identify the gaseous species (contaminants) and determine its concentration withm the sample utilizing computer/software system 800 The method for detecting the presence of a gaseous species in a gas sample containing a coπosive gas requires that a spectral region be selected wherein (l) the gaseous species has at least one absoφtion feamre and (n) the coπosive gas has essentially no interfeπng absoφtion features (As descnbe above, an interfeπng absoφtion feature coπesponds to an absoφtion feature which overlaps the absoφtion feature used for ldentify- mg the gaseous species, such that, detection selectivity between the gaseous species and the coπosive gas is compromised ) In accordance with the method of the present invention, a laser compnsing a laser cavity 5 and a ga medium 507 which outputs light having a wavelength distnbution at least a portion of which is in the selected spectral region, is provided The ILS laser 500 is contained in a sample chamber 400 A gas sample cell 406 having windows 404 and 405 which are transparent to light in the selected spectral region, such that a beam of light can pass through the gas sample cell, is also provided The gas sample cell 406 is inserted m the ILS laser 500 such that output light from the gam medium 507 passes through the gas sample pnor to exiting the laser cavity 5 The gases (contaminants) in sample chamber 400 are reduced to an acceptable level The sample of gas to be detected is placed in the gas sample cell 406 The ILS laser 500 is pumped at or near threshold and the optical output from ILS laser 500 is penodically sampled, preferably via modulation assem- bly 300 The absoφtion spectmm of the gases (contaminants) within the sample is measured with spectrometer 600 and detection assembly 700 The absoφtion spectrum is analyzed to identify the gaseous species (contaminants) and determine its concentration withm the sample utilizing computer/software system 800 More particularly, reducing gases (contaminants) in chamber 400 (excluding the gas sample cell 406) to an acceptable level may suitably compnse purging or evacuating sealable container 401 with top 410 such that the level of gases (contaminants) is below that to be detected in the gas sample within the gas sample cell 406 As discussed previously, other mechanisms for reducing the level of gases (contaminants) may be utilized provided they can reduce the level to an acceptable level Preferably, container base 401 is sealed to top 410 and contaminants contained therein are effectively removed (or reduced to an acceptable level) Desirably, base 401 and top 410 are effectively sealed pnor to delivery to a user in a relatively tamper-proof manner A sample is suitably communicated to gas sample cell 406 by connecting a gas line to connectors 408. 409 and feeding the gas into the gas sample cell (for example, when the sample compnses a coπosive or reac- tive gas). Pumping ILS laser 500 at or near threshold, more particularly, compnses selecting the coπect pump laser 100 power, focusing conditions at laser crystal 507 utilizing beam modification optics 200 and lens 206, and modulation conditions utilizing modulator system 300 The method for detecting gaseous species in accor¬ dance with the present invenuon further compnses driving ILS laser 500 at threshold or near to but above threshold In accordance with the present invention, dnver 100 smtably pumps ILS laser 500 Where neces¬ sary, pumping beam E is suitably shaped by beam shaping assembly 200 to meet the optical requirements of ILS laser 500 Further, where gas detection system 10 is operated in a pulsed or chopped mode, as descnbed above, modulation assembly, and in particular, modulator 301 may penodically inteπupt pump beam E thereby preventing beam E from reaching ILS laser 500 Beam F output from modulator 301 and beam shaping as- sembly 200 is suitably directed to ILS laser 500 In accordance with this method. as beam F enters chamber 400 through window 402 disposed in the wall of sealed container body 401. beam F is suitably directed to ILS laser 500 Additional focusing and direc¬ tion of beam F may suitably be achieved as beam F passes from window 402 to focusing lens 206. where focus¬ ing lens 206 suitably focuses beam F and directs it through miπor 501 Beam F suitably pumps crystal 507 at or near threshold, and the output beam is suitably directed to the gas sample withm the gas sample cell 406, such as by miπors 503 and 505 The exiting beam, contaimng the absoφtion data from the gas (contaminant) sample, then exits gas chamber 400 through window 403 suitably disposed in a wall of sealed container body 401 ELS laser 500 may be operated in a pulsed mode or a chopped mode using modulator 304. suitably synchronized to modulator 301. and which penodically samples the output beam from the ILS laser and passes the sampled output thus obtained to spectrometer assembly 600 and detector assembly 700 Altematively. in the case where the pump laser 100 compnses a diode laser, the electncal power supplied to the diode laser pump laser may be modulated and synchronized with modulator 304 Suitably, miπor 601 directs sampled ouφut beam G from ILS laser 500 to spectrometer assembly 600 and detector assembly 700 Altematively, in- stead of using modulator 304, detector assembly 700 may be switch on and off to sample the output from ILS laser 500 The method for detecting gaseous species in accordance with the present invention further compnses analyzing the output beam G sampled from ILS laser 500 Preferably, spectrometer assembly 600 spectrally resolves and detector assembly 700 suitably analyzes beam G from sampled ILS laser 500 Spectrometer as- sembly 600 suitably spectrally disperses beam G from ILS laser 500 through beam expanding assembly 600C, diffraction assemblies 600A. 600B and focusing assembly 600D Spectrally-resolved ILS absoφtion data exit¬ ing spectrometer assembly 600 is suitably displaced spatially to be detected by detector assembly 700 compns¬ mg e.g , multichannel detector 701 It will be appreciated that the gas detection system 10 and method of the present invention can be utilized to obtain the absoφtion spectra for contaminants, such as water vapor, in a coπosive or reactive gas, such as HCl, or a non-coπosive gas, such as N 2 . over a vanety of wavelength regions In particular. FIGS 7 and 8 show that the signatures of a water vapor in each environment (coπosive or non-coπosive) can be ob- tamed through operation of gas detection system 10 Specifically. FIG 7 shows a plot of normalized laser m- tensity/absoφtion vs wavelength for water in HCl (curve 900) and in N 2 (curve 902) over the region of about 1433 to 1440 nm while FIG 8 shows a similar plot of normalized laser intensity/absoφtion vs wavelength for water in HCl (curve 904) and m N 2 (curve 906) over the wavelength region of about 1420 to 1434 nm The spectrum displayed in FIGS 7 and 8 were obtained with the spectrometer assembly 600 and by measunng the output of diode 701 As will be appreciated, each data point illustrated results from a vanety of measurements The data presented in the plots shown in FIGS 7 and 8 demonstrate that water can be successfully detected in hydrogen chlonde using the method of the present invention Additionally, the observation that the water absoφtion spectra are the same, regardless of whether the measurement is made in hydrogen chlonde or mtrogen. demonstrates that there are no spectral interferences from hvdrogen chlonde even though it is present at an extremely high concentration (e g . one atmosphere total pressure) Given the relationship between intensity and concentration, once a charactenstic signature of the contaminant gas. e g . water vapor, is obtained, the concentration of the contaminant contained within the sample can be readily obtained In accordance with the present invention, computer 802 can be suitably pro¬ grammed to inteφret the data and provide an output indicative of the presence and/or concentrauon of the contaminant contained within the sample Representative plots of the water absoφtion intensity versus water concentration in N 2 gas, as obtained through use of the present invention, are shown in FIGS 9 and 10 Water purification for the N 2 gas is based on a permeation device and an in-line purifier for FIGS 9 and 10, respec¬ tively (It will be appreciated that the absoφtion feature(s) found in the spectral signature must be calibrated Since intracavity laser spectroscopy offers increased sensitivity bevond pnor art methods, weak transitions previously not measured may become measurable for the first time with the gas detection system 10 of the pre¬ sent invention In such cases, these weak transitions can be used to identify the spectral signature and certify the presence ofthe gaseous species Such weak transitions can also be calibrated by the gas detection system 10 thereby enabling the concentrauon of the gaseous species to be determined by the intensity of the absoφtion feature(s) coπesponding to these weak transitions ) While the present invention is shown above as applied to obtaining the absoφtion spectra for con¬ taminants, such as water vapor, in a coπosive gas. such as HCl. it will be apparent by those skilled in the art that other suitable contaminants and coπosive or reactive gases may also be employed in the practice of the present invention Examples of coπosive gases suitably employed with the present invention include, but are not limited to. the following N 2 0, NO, N0 2 , HONO, HN0 2 , SO. S0 3 , H 2 S0 4 . CL, CIO, C1 2 0 2 , HOCl. PH 3 . OCS, HI, HF, HBr, BC1 3 , NF 3 BC1 2 , BCI, S0 2 , BF 3 , Br 2 , I 2 , F 2 . 0 3 , AsH 3 , NH 3 . SιH„, B 2 H . HN0 3 , HCN. HNC, H 2 S, COF 2 , and QL X X X , where X is F or Cl and x equals 1 to 4 It is not intended that the coπosive or reactive gases specifically disclosed herein, including those listed above, are to be exhaustive, rather, other cor- rosive or reactive gases may be employed as is suited to the particular use contemplated For example, the cor¬ rosive gas may compnse other coπosive gases employed in the fabncation of semiconductor components Additionally, it will be appreciated that the coπosive gas may compnse a combination of any number of cor¬ rosive gases such as those listed above It will further be appreciated that the gaseous species to be detected may compnse. but is not limited to. one or more of the above listed coπosive gases Those skilled in the art will appreciate that the detection levels available through practice of the pres¬ ent invention generally exceed those which are obtainable through use of conventional devices Moreover, gas detection system 10 can be used in-line and obtain ready, near real-time measurement of the presence and amount of the contaminant contamed in a specific coπosive sample, thus addressing the many disadvantages associated with the use of such conventional devices In particular, the method of the present invention pro¬ vides rapid, m situ water vapor detection withm gas samples containing coπosive gases at detection levels which are not available in pnor art It should be understood that the foregoing descπption relates to prefeπed exemplary embodiments of the invention, and that the invention is not limited to the specific forms shown herein Vanous modifications may be made in the design and aπangement of the elements set forth herein without departing from the scope of the invention as expressed in the appended claims Moreover, the application of gas detection system 10 as well as the location of the ILS gas detector, e g . in a semiconductor fabncation assembly, can vary as may be desired For example, the specific placement of the vanous elements withm the ILS chamber 400 and the gas detection system 10 itself may be modified so long as their configuration and placement suitably enables opti¬ cal excitation of ILS laser 500 in a readily reproducible manner These and other modifications in the design, arrangement, and application of the present invention as now known or hereafter devised by those skilled in the art are contemplated by the amended claims

Claims: CLAIMS What Is Claimed Is 1 A gas detection system (10) for detecting the presence of gaseous species in a gas sample compns¬ (a) a laser cavity (5), (b) an ion-doped crystal (507) therein. (c) a pumping laser (100) located outside said laser cavity (5) which has an output which op- tically excites said ion-doped crystal (507), thereby producing an output beam which exits said laser cavity (5), and (d) a container (400. 406) for containing said gas sample in said laser cavity (5), said output beam of said ion-doped crystal (507) passing through said gas sample pπor to exiting said laser cavity (5) 2 A method for detecting the presence of gaseous species in a gas sample using the gas detection sys¬ tem (10) of Claim 1, said method compnsing the steps of (a) directing the output beam of said pumping laser (100) to said ion-doped crystal (507), and (b) directing said output beam from said ion-doped crvstal (507) after exiting said laser cavity (5) to a detector assembly (700) for determining the presence and/or concentration of gaseous species in said gas sample 3 A method for detecting the presence of gaseous species in a gas sample containing coπosive gas, compnsing the steps of (a) selecting a spectral region wherein (I) said gaseous species has at least one absoφtion feature and (n) said coπosive gas has essentially no interfeπng absoφtion features. (b) providing a laser (500) compnsing a laser cavitv (5) and a gain medium (507) which re¬ sides therein, said gain medium (507) outputting light having a wavelength distnbution at least a portion of which is in said selected spectral region. (c) providing a gas sample cell (406) having windows (404. 405) which are transparent to light in said selected spectral region such that a beam of light can pass through said gas sample cell (406), (d) inserting said gas sample cell (406) in said laser (500) such that light output from said gam medium (507) passes through said gas sample prior to exiting said laser cavity (5), (e) inserting said gas sample containing said coπosive gas in said gas sample cell (406) such that light output from said gain medium (507) passes through said gas sample, said gas sample sealed within said gas sample cell (406) such that said coπosive gas does not react with said laser (500), and (f) directing said light output from said gain medium (507) after exiting said laser cavity (5) to a detector assembly (700) for determining the presence and or concentration of said gaseous species in said gas sample 4 The method of Claim 3 wherein said coπosive gas compnses a gas selected from the group consist¬ ing of HCl. N 2 0, NO, N0 2 , HONO, HN0 2 , SO, S0 3 , H 2 SO„, Cl 2 , CIO, C1 2 0 2> HOCl, PH 3 , OCS. HI, HF, HBr, BC1 3 , NF 3 BC1 2 , BCl. S0 2 , BF 3 , Br 2 , 1 2 , F 2 , 0 3 , AsH 3 . NH 3 , S1H4. B 2 _L,, HN0 3 , HCN. HNC. H 2 S. COF 2 , and CH 4 .-X-, where X is F or Cl and x equals 1 to 4 5 The method of Claim 3 wherein said gaseous species compnses water 6 The method of Claim 4 wherein said selected spectral region is selected from the wavelength region between about 1420 and 1440 nanometers 7 A gas detection system (10) for detecting the presence of gaseous species in a gas sample contain¬ ing coπosive gas using the method of Claim 3, said system (10) compnsing (a) said laser cavity (5), (b) said gain medium (507) which resides therein, said gain medium (507) outputting light having a wavelength distnbution at least a portion of which is in said spectral region, (c) said gas sample cell (406) which is contained in said laser (500). (d) conduits (408. 409) for inserting said gas sample containing said corrosive gas in said gas sample cell (406). and (e) said detector assembly (700) for determining the presence and/or concentration of said gaseous species in said gas sample, said light output from said laser (500) being directed to said detector as¬ sembly (700) 8 The gas detection system (10) of Claim 7 wherein said gam medium (507) is pumped by a pump laser (100) selected from the group consisting of a solid state crvstal laser and a diode laser 9 The gas detection system (10) of Claim 7 wherein said laser cavity (5) is contained within a cham¬ ber (400) configured to be evacuated of said gaseous species to be detected 10 The gas detection system (10) of Claim 7 wherein said gas sample is contained in a region of said laser cavity (5) which is astigmatically compensated to reduce astigmatism in said light output from said gain medium (507)

Inventors: ATKINSON GEORGE H, HINEMAN MAX, KALISKY YEHOSHUA, MEHDIZADEH ESMAIL, WOLPERDINGER MARKUS, ZHANG JIAMIN, ATKINSON, GEORGE, H., HINEMAN, MAX, KALISKY, YEHOSHUA, MEHDIZADEH, ESMAIL, WOLPERDINGER, MARKUS, ZHANG, JIAMIN
Applicants: INNOVATIVE LASERS CORP, INNOVATIVE LASERS CORPORATION
Application year: 1996
Main classification: G01N21
IPC codes: G01N21