PARTICLE COUNTER EMPLOYING A SOLID-STATE LASER WITH AN INTRA-CAVITY VIEW VOLUME

Abstract: A particle detector (10) employs a laser having a solid-state lasing medium (18), such as an Nd: YAD crystal, and includes an intra-cavity view volume (26). The resonant cavity (12) is defined by two mirrors (42, 48) with the laser medium (18) between them. The view volume (26) is positioned in the light path (24) to introduce particles (27) into the resonant cavity so that light impinging thereupon produces scattered light. A detector (28) is disposed to sense light scattered from the particles (27). A displaying device, such as a pulse height analyzer (30), receives the signals produced by the detector to display the intensity of the light sensed. A harmonic generator (50; 68) can be disposed within the light path (24) to shorten the wavelength of light impinging upon the particles (27), making the detector more sensitive to particles of sub-micron size.

Description: Description Particle Counter Employing a Solid-state Laser With an Intracavity View Volume Technical Field The present invention pertains to the field of particle counters. Specifically, the present invention pertains to an optical instrument for counting particles in a fluid stream. Background Art Typically, particle detectors employ laser devices producing a beam of coherent light that is directed to impinge upon a sample of particles. Particle detection is achieved either by sensing light scattered by a particle, e.g. U.S. Pat. No. 5,085,500 to Blesener et al., or by detecting extinction of light, e.g. U.S. Pat. No. 5,121,988 to Blesener et al. U.S. Pat. No. 5,317,447 to Baird et al. discloses, in pertinent part, a solid-state laser having a Cr.LiCAIF crystal pumped from one end by an array of tunable semiconductor laser diodes. Tilted birefringent plates are positioned within the solid-state resonator cavity to control the spectral bandwidth and wavelength output. A periodically seg¬ mented domain-inverted KTP waveguide is disposed outside of the resonant cavity, in the path of the output beam, to shorten the wavelength of the beam passing there¬ through. Despite the recent advances in solid-state laser technology, it has not been applied to particle detectors. Particle detectors have been used for a variety of purposes to detect the presence and/or size of par¬ ticles in various fluids, including air and other gases, as well as liquids, such as water, hydraulic oils and lubricants. They have proved particularly useful to control contamination in many industrial environments. For example, particulate contamination can cause hydraulic equipment and the like to fail due to excessive accumulation of particles in the hydraulic fluid. Even though filters are used in such equipment to continuously remove particles, the filters may become clogged and may rupture due to excess pressure build-up across the filter membrane. Also, microelectronic fabrication requires a "clean room" in which particulate contaminants, e.g., dust, are filtered from an atmosphere of a room. The filters used in "clean rooms" are also subject to clogging and compromise, resulting in particulate matter entering a "clean room" atmosphere in great quantities. Failure to provide a "clean room" results in particulate contamination of the devices during fabrication, which reduces yield. Particle detectors are thus used in such environments to detect particles in specified size classes and report the cleanliness level of the fluid according to categories specified by industry standards. A significant amount of research has been performed using open cavity gas lasers in particle detection systems and is discussed by R. G. Knollenberg and B. Schuster in "Detection and Sizing of Small Particles in an Open Cavity Gas Laser", Applied Optics, Volume 11, Number 7, November 1972, pages 1515-1520. Sub-micron particle sizing devices utilizing light scat- tering in an open cavity laser device is described by R. G. Knollenberg and R. E. Leur in "Open Cavity Laser 'Active' Scattering Particle Spectrometry from 0.05 to 5 Microns", Fine Particles. Aerosol, Generation Measure¬ ment, Sampling and Analysis, Editor Benjamin Y.H. Liu, Academic Press, May 1 975, pages 669,696. However, the susceptibility of t open cavity gas lasers to con¬ tamination has made nern require more frequent servicing to clean the laser optics, leading to the development of the external cavity gas laser. U.S. Pat. No. 4,594,715 to Knollenberg dis¬ closes an external cavity gas laser for use as a particle detector that includes first, second and third spaced mirrors. The first and second mirrors define an active resonant cavity of a gas laser, and the second and third mirrors define a second cavity. The second cavity ranges between being passive and being closely coupled as part of the active cavity, depending on the phase of the light returned from the third mirror to the second mirror. In the limiting case where the second cavity is not resonant, a large field does not build up in the passive cavity, because that cavity is off resonance for the wavelength of the active cavity. In the latter case, the second mirror, ignoring scattering and absorption losses in its coating and substrate, becomes transparent to light recirculating in the external cavity formed by the first and third mirrors, thus destabilizing the original cavity modes of the resonator formed by the first and second mirrors. In this case, even a small amount of absorption or scattering in the coating or substrate of the second mirror will result in the resonator formed by the first and third mirrors to have low net gain. This is because the inherent low gain of many types of gas lasers renders them particularly sensitive to intracavity loss. To address these issues, Knollenberg describes a method to modulate the external cavity along the laser axis, thereby creating a broad, Doppler induced, incoherent spectrum. This reduces the Q value of that cavity, because the nominal Q, as calculated from standard Fabry-Perot formulas, depends, for buildup of optical power, on having a resonance wavelength as opposed to a broad spectrum. It is an object, therefore, of the present invention to provide a particle detector having increased sensitivity to detecting aerosol particles of sub-micron size. It is a further object of the present invention to provide a laser source for a particle detector that is less sensitive to optical loss caused by detection of aerosol particulates. Summary of the Invention These objects have been achieved by providing a solid-state lasing medium, such as an Nd.YAG crystal, disposed in a resonant cavity that includes an intra- cavity view volume. The resonant cavity is defined by two spaced apart mirrors, with the lasing medium posi¬ tioned between them, defining a light path. A pump source is optically coupled to drive the laser medium to produce coherent light having a first wavelength. The view volume is positioned in the beam path, between the first mirror and the lasing medium, to introduce par¬ ticles into the resonant cavity so that light impinging thereupon produces scattered light. A detector is disposed to sense light scattered from the view volume and produces signals proportional to the light sensed. A displaying device, such as a pulse height analyzer, is in electrical communication to receive the signals produced by the detector to quantitatively display the intensity of the light sensed. In an alternate embodiment, a harmonic generator is disposed within the resonant cavity. The harmonic generator is disposed between the lasing medium and the view volume and shortens the wavelength of the light produced by the lasing medium that passes therethrough. In another embodiment, the view volume is disposed in a second separate cavity unidirectionally optically coupled to the resonant cavity. A harmonic generator is disposed in the resonant cavity to produce light having a second wavelength by shortening the wavelength of the light produced by the lasing medium. One of the mirrors forming the resonant cavity functions as a wavelength separator by reflecting light at the lasing wavelength while being transmissive with respect to light at the second wavelength. In this fashion, the second cavity includes light having only the second wavelength. In still another embodiment, three cavities are formed. The resonant cavity is optically coupled to a second cavity as described above. Disposed in the second cavity, however, is a second harmonic generator to produce light having a third wavelength by shortening light having the second wavelength. The second cavity is unidirectionally optically coupled to a third separate cavity, where the view volume is disposed. A second wavelength separator partitions the second and third cavity. The second wavelength separator is a mirror reflecting light having the second wavelength while being transmissive to light having the third wavelength. In this fashion, the third cavity includes light having only the third wavelength. Brief Description of the Drawings Fig. 1 shows a simplified plan view of the present invention. Fig. 2 shows a partial cross-sectional view of the view volume shown in Fig. 1 taken across lines 2-2. Fig. 3 shows a simplified plan view of the present invention in accord with a first alternate embodiment. Fig. 4 shows a simplified plan view of the present invention in accord with a second alternate embodiment. Fig. 5 shows a simplified plan view of the present invention in accord with a third alternate embodiment. Best Mode for Carrying Out the Invention Fig. 1 shows a particle detector 10 in accord with the present invention, including a resonant cavity 12 defined by two spaced apart mirrors 14 and 16. A lasing medium 18 is positioned within the resonant cavity 12, between mirrors 14 and 16. A pump source 20 is optically coupled to drive the lasing medium 18 to produce coherent light 22 that propagates along a beam path 24, defined by the lasing medium 18. A view volume 26, defined by injector ports (not shown), is positioned in beam path 24 between mirror 16 and lasing medium 18. The injector ports introduce particles into view volume 26 so that light impinging upon particles in view volume 26 produces scattered light. A detector 28 is disposed to sense light scattered from view volume 26 and produces signals proportional to the light sensed. Typically, the detector is positioned to sense light scattered in a direction substantially perpendicular to both light path 24 and the longitudinal axis of view volume 26. A displaying device 30, such as a pulse height analyzer, is in electrical communication to receive the signals produced by detector 28 to quantitatively display the intensity of the light sensed. Although any lasing medium may be employed, preferably lasing medium 18 has a crystalline structure that has been embedded with a light emitting species, for example Nd:YAG, Nd.YLF or Cr.LiCAF. The pump source desired is dependent upon the lasing medium employed. Preferably, an optical pump source is employed that is capable of emitting light having a wavelength matching the absorption wavelength of the light emitting species in lasing medium 18. It is preferred, however, that pump source 20 is a semiconductor laser diode in electrical communication with a power supply 32 to supply the requisite current to produce coherent light 34. Beam shaping optics 36 are disposed in the path of coherent light 34, between mirror 14 and pump source 20, to produce a pump :>eam 38. Mirror 14 is transmissive with respect to the wavelength of pump beam 38, but preferably has an anti-reflective coating 40 disposed on a surface facing optics 36 to suppress reflection of the same. Preferably, coating 40 suppresses reflection of light having a wavelength approximating the absorption wavelength of lasing medium 18. A dichroic coating 42 is disposed on a surface of mirror 14, opposing coating 40. Coating 42 exhibits the same properties as coating 40, with respect to beam 38. In this fashion, coatings 40 and 42 provide mirror 14 with highly transmissive surfaces through which a maximum intensity of pump beam 38 may pass. In addition, an end of medium 18 facing mirror 14 includes a coating 44 which suppresses reflection of light having a wavelength approximating the emission wavelength, as well as light having a wavelength approximating the absorption wavelength of lasing medium 18. An end of medium 18, in opposing relation to coating 44, includes a coating 46 which also suppresses reflec¬ tion of light having a wavelength approximating the emission wavelength, in this fashion, coatings 44 and 46 provide a highly transmissive surface through which a maximum intensity of beam 22 may pass. The opposed ends of resonant cavity 12 is formed by coating 42 and coating 48, with coating 48 being disposed on mirror 16. Coatings 42 and 48 both provide optical properties to reflect all light having a wavelength approximating the wavelength of the light produced by lasing medium 18. In this manner, beam 22's egression from resonant cavity 12 is completely blocked, thereby unidirectionally coupling cavity 12 with the pump source. Referring also to Fig. 2, particles 27 are introduced into view volume 26 via injector ports 29 so that light impinges on them. The particles scatter light, and a photo-detector 28, in optical communication with view volume 26, detects the scattered light. Detector 28 produces signals proportional to the light sensed. Pulse height analyzer 30 receives the signals and quantitatively displays the intensity of the light sensed. Negligible cavity losses result from the scat¬ tering of light by the particles due to their small size. An advantage with preventing light 22 from exiting resonant cavity 12 is that this provides a greater amount of optical energy to produce lasing action in lasing medium 18. This makes the particle detector less sensitive to optical loss caused from the scattering of light by particles present in view volume 26. This structure augments the inherent insensitivity of a solid- state laser to optical loss typically caused by intra- cavity optical surfaces, resulting in an improved signal- to-noise ratio for detecting particles of sub-micron size. The amount of light scattered from a particle having a diameter less than the wavelength of light impinging upon it is defined as follows: D7λ« where D is the particle diameter and λ is the wavelength of the scattered light. Therefore, to increase the amount of light scattered for a particle of a given size, it is desirable to decrease the wavelength λ of the light impinging thereupon. This is particularly useful to increase the resolution of the particle detector by making it more sensitive to particles of very small size. Decreasing the wavelength of light also facilitates characterizing the morphology of larger particles. Fig. 3 shows an alternate embodiment of the present invention taking advantage of the aforementioned concepts. To shorten the wavelength of the light 22 emitted from lasing medium 18, a crystal harmonic genera¬ tor 50 is disposed in light path 24, between mirror 116 and lasing medium 18. Dichroic coating 52 and coating 54 are present on opposite ends of the harmonic generator 50, providing highly transmissive surfaces through which light 22 may pass, as discussed above with respect to coatings 44 and 46. Typically, the crystal harmonic generator 50 is a frequency doubling crystal that shortens the wavelength of light 22 by 50%, producing light 56. Coating 52 also includes optical properties to reflect all light having a wavelength approximating 50% of the lasing wavelength. This effectively optically decouples light 56 from lasing medium 18 by preventing light 56 from passing through the same. In addition, coating 54 has optical properties to suppress reflec¬ tivity of light having a wavelength approximating 50% of the lasing wavelength. A coating 148 is disposed on mirror 116 having optical properties to reflect light having the wavelengths associated with beam 22 and light 56. in this fashion, light 56 is reflected between coatings 52 and 148. This increases the effective length of crystal generator 50, which establishes a mode to maximize the optical energy from the same. Fig. 4 is an alternate embodiment of the invention shown in Fig. 3 wherein a third mirror 58, having opposed major surfaces, is disposed between view volume 26 and harmonic generator 50. Third mirror 58 functions as a wavelength separator. To that end, the opposed surfaces of mirror 58 are coated with an anti- reflective coatings 60 which suppresses reflectivity of light having a wavelength approximating 50% of the lasing wavelength. Dichroic coating 60 also reflects light having a wavelength approximating the lasing wavelength of the light produced by the lasing medium 18. Coating 62 is disposed on a surface of mirror 58, facing mirror 248, and is highly reflective at approximately 50% of the lasing wavelength. The surface of mirror 248, facing mirror 58, includes a coating 216 which is highly reflec¬ tive to light approximating 50% of the lasing wavelength. In this fashion, a second cavity 64 is defined between mirrors 58 and 248, which is optically coupled to the remaining cavities in a unidirectional manner so that only light having a wavelength approximating 50% of the wavelength of the light produced by the lasing medium 18 is present therein. Thus, second cavity 64 allows detection of particles having a very small size, for the reasons discussed above with respect to Figs. 1 and 2. To further enhance the performance of the detector, an active length stabilization system may be employed. This would allow stabilization of the length of external cavities, such as cavity 64, to simultaneously promote high circulating power, while minimizing transmission of light therefrom. In addition, mode matching optics, such as lenses, may be disposed to optically couple cavity 64 with the active cavity. Fig. 5 shows a third alternate embodiment of the invention substantially similar to the embodiment shown in Fig. 4 with the addition of a fourth mirror 66 and a second harmonic generator 68, both of which are disposed in beam path 24. Fourth mirror 66 is disposed between view volume 26 and third mirror 58. Generator 68 is disposed between third 58 and fourth 66 mirrors to shorten the wavelength of the light emitted from harmonic generator 50. In this fashion, light 74, having a wavelength approximating 25% of the lasing wavelength, is produced. On a surface of generator 68, facing mirror 58, is a dichroic coating 76. Coating 76 is highly reflective to light 74 and suppresses reflection of light 56, effectively optically decoupling light 74 from generator 50 and medium 18 to provide the benefits discussed above with respect to Fig. 3. On a surface of generator 68, opposing coating 76, is a coating 78 which suppresses reflection of light 56 and 74. A dichroic coating 70 is disposed on the surface of mirror 66, facing generator 68. Coating 70 is highly reflective to light 56 and suppresses the reflection of light 74. Having light 54 reflected back into generator 68 by coating 70 establishes a mode to maximize the optical energy from generator 68. On the surface of mirror 66, opposing coating 70, is a coating 72 that also suppresses reflection of light 74. in this fashion, coatings 70 and 72 provide mirror 66 with two highly transmissive surfaces through which light 74 may propagate. A coating 316 is disposed on a surface of mirror 348, facing coating 72. Coatings 316 and 72 are both highly reflective of light having a wavelength 25% of the lasing wavelength. Coatings 76 and 70 function to increase the effective length of second harmonic generator 68. Mirror 66 and 348 define a third cavity 80 coupled to the remaining cavities of the system so that only light having a wavelength 25% of the lasing wavelength is present therein. In this fashion, third cavity 80 allows detection of particles on the order of .04 micron, for the reasons discussed above with respect to the second cavity shown in Figs. 1 and 2. The comparative wavelengths obtained using the aforementioned particle detectors is as follows: Characteristic Wavelength Lasing Medium Embodiment ( um ) In the View Volume Nd:YAG Fig. 1 1 . 064 Nd:YAG Fig . 4 0 . 532 Nd:YAG Fig. 5 0 .266 Nd:YLF Fig. 1 1 . 047 Nd:YLF Fig. 4 0 .524 Nd:YLF Fig. 5 0 .262 Cr:LiCAF Fig. 1 0 . 770 Cr:LiCAF Fig. 4 0 . 385 Ignoring relative photo-detector spectral response and for equal intensity illuminating the par¬ ticle, the diameter of the particle that can be detected using shorter wavelength radiation expressed in terms of the diameter that can be detected using longer wavelength radiation is given by: ( λshort \ /3 D ' Λ 2 short λ λ longλ long where λ short is the short wavelength of light compared to λ long , D Bhortλ is the diameter of a particle measured using the short wavelength of light, and D longλ is the diameter of a particle measured using the long wavelength of light. The Nd:YLF lasing medium and a quadrupled wave¬ length from a fourth harmonic generator crystal will produce a wavelength of 262 nm. The HeNe laser wave¬ length is 632.8 nm. In the above equation, the sensi¬ tivity gained from the difference in wavelength alone would allow one to see 0.055 μm particles instead of 0.1 μm particles.

Claims: Claims 1. A particle counter, comprising: a laser crystal, defining a light path; a pump source optically coupled to drive said laser crystal to produce coherent light having a lasing wavelength; a first mirror and a second mirror, spaced apart from said first mirror, said first and second mirrors defining a resonant cavity, with said laser crystal disposed in said cavity; view volume means, in optical communication with said laser crystal, for introducing particles into said light path to produce scattered light; a detector to sense light scattered from said view volume means and produce signals proportional thereto; and means, coupled to receive said signals, for quantitatively displaying light sensed by said detector. 2. The particle counter as recited in claim 1 wherein said first and second mirrors each has a surface highly reflective with respect to light having said lasing wavelength, with said laser crystal in optical communication with said reflective surface of said first and second mirrors. 3. The particle counter as recited in claim 1 wherein said view volume has a longitudinal axis extending perpendicular to said light path, and said detector is positioned to sense light having said predefined wavelength scattered perpendicular to both said light path and said axis. 4. The particle counter as recited in claim 1 having at least one harmonic generator disposed in said light path. 5. The particle counter as recited in claim 1 further including a second cavity in optical communication with said resonant cavity, and a wavelength selective means, in optical communication with both said resonant and second cavities, for introducing light into said second cavity having a predetermined wavelength and obstructing light having a wavelength differing from said predetermined wavelength. 6. The particle detector as recited in claim 5 wherein said view volume means is disposed in said second cavity and said predetermined wavelength is 50% of said lasing wavelength. 7. The particle counter as recited in claim 5 further including a third cavity in optical communication with both said resonant and said second cavities with said view volume means disposed in said third cavity, and a wavelength selective means, in optical communication with both said second and third cavities, for introducing light having a second predetermined wavelength and obstructing light not having said second predetermined wavelength. 8. The particle counter as recited in claim 1 wherein said laser crystal is an Nd:YAG. 9. A particle counter, comprising: a first mirror and a second mirror, spaced apart from said first mirror, defining a resonant cavity; a lasing medium disposed within said cavity and in optical communication with each of said spaced apart mirrors, said lasing medium defining a light path and including a plurality of elements in a first energy state; a pumping source, optically coupled to said lasing medium, to raise a portion of said plurality of elements to an energy state higher than said first energy state, creating a population inversion among said plurality of elements to produce at least one photon of light having a lasing wavelength, with said first mirror reflecting all light impinging thereon having said lasing wavelength; view volume means, in optical communication, for injecting particles in said light path, with said particles flowing therethrough scattering light; a detector in optical communication with said view volume means and positioned to sense scattered light and produce signals proportional thereto; and means, coupled to receive said signals, for quantitatively displaying light sensed by said detector. 10. The particle counter as recited in claim 9 further including a second cavity in optical communication with said resonant cavity and a first wavelength selective means, in optical communication with both said resonant and second cavities, for introducing light into said second cavity having a predetermined wavelength and obstructing light having said lasing wavelength. 11. The particle counter as recited in claim 10 wherein said second cavity is defined by said first mirror and a third mirror, spaced apart from said first mirror, with said first wavelength selective means including a first harmonic generator disposed in said light path to produce light having a second wavelength and a wavelength selective coating disposed on said first mirror reflective with respect to light having said lasing wavelength and transmissive with respect to light having said predetermined wavelength. 12. The particle detector as recited in claim 11 wherein said view volume means is disposed in said second cavity and said predetermined wavelength is 50% of said lasing wavelength. 13. The particle counter as recited in claim 11 further including a third cavity in optical communication with both said resonant and said second cavities with said view volume means disposed in said third cavity, and a second wavelength selective means, in optical communication with both said second and third cavities, for introducing light having a second predetermined wavelength and obstructing light not having said second predetermined wavelength. 14. The particle counter as recited in claim 13 wherein said third cavity is defined between said third mirror and a fourth mirror, spaced apart from said third mirror, with said second wavelength selective means including a second generator disposed in said second cavity to produce light having a second predetermined wavelength and a wavelength selective coating disposed on said third mirror reflective with respect to light having said second wavelength and transmissive with respect to light having said second predetermined wavelength. 15. The particle detector as recited in claim 14 wherein said second predefined wavelength is 25% of said lasing wavelength with said view volume means disposed in said third cavity. 16. The particle detector as recited in claim 15 further including a first means for doubling the effective length of said first harmonic generator and a second means for doubling the effective length of said second harmonic generator. 17. A particle counter, comprising: a pair of spaced apart mirrors, defining a resonant cavity; a lasing medium disposed within said cavity and in optical communication with both of said spaced apart mirrors, said lasing medium defining a light path and including a plurality of elements in a first energy state; a pumping source, optically coupled to said lasing medium, to raise a portion of said plurality of elements to an energy state higher than said first energy state, creating a population inversion among said plurality of elements to produce at least one photon of light having a lasing wavelength; view volume means, in optical communication with said cavity, for introducing particles into said light path to produce scattered light, said view volume means having a longitudinal axis extending perpendicular to said light path; a second cavity in optical communication with said resonant cavity and a first wavelength selective means, in optical communication with both said resonant and second cavities, for introducing light into said second cavity having a predetermined wavelength and obstructing light of having said lasing wavelength; a detector in optical communication with said view volume means and positioned to sense scattered light propagating perpendicular to both said light path and said axis and produce signals proportional thereto; and means, coupled to receive said signals, for quantitatively displaying light sensed by said detector. 18. The particle counter as recited in claim 17 wherein said lasing medium is a solid-state laser crystal and said pumping source is a semiconductor laser diode. 19. The particle detector as recited in claim 18 wherein said second cavity is defined by said first mirror and a third mirror, spaced apart from said first mirror, with said first wavelength selective means including a first harmonic generator disposed in said light path to produce light having a second wavelength and a wavelength selective coating disposed on said first mirror reflective with respect to light having said lasing wavelength and transmissive with respect to light having said predetermined wavelength, with said predetermined wavelength being 50% of said lasing wavelength. 20. The particle counter as recited in claim 18 further including a third cavity, defined between said third mirror and a fourth mirror, spaced apart from said third mirror, and a second wavelength selective means, said second wavelength selective means including a second generator disposed in said second cavity to produce light having a second predetermined wavelength and a wavelength selective coating disposed on said third mirror reflective with respect to light having said second wavelength and transmissive with respect to light having said second predetermined wavelength, with said second predefined wavelength being 25% of said lasing wavelength and said view volume means being disposed in said third cavity. AMENDED CLAIMS [received by the International Bureau on 26 November 1996 (26.11.96); original claims 1-20 replaced by amended claims 1-20 (8 pages)] 1. A particle counter having a longitudinal axis, said particle counter comprising: a source of coherent light adapted to direct light having a lasing wavelength along said longitudinal axis; a first mirror and a second mirror, spaced apart from said first mirror, said first and second mirrors defining a resonant cavity, with said longitudinal axis extending therethrough and said source optically coupled to said cavity; a first harmonic generator disposed between said second mirror and said source to receive light having said lasing wavelength, said first harmonic generator adapted to produce, and direct along said longitudinal axis, light having a first harmonic wavelength; view volume means, for introducing particles into said particle counter so as to pass through said longitudinal axis, with light impinging upon said particles producing scattered light, said second mirror being disposed between said first harmonic generator and said view volume means, with a surface of said second mirror including a first coating having optical properties to reflect said lasing wavelength of light impinging thereon while transmitting light having said first harmonic wavelength, whereby light having said first harmonic wavelength travels toward said view volume means; a detector to sense light scattered from said view volume and produce signals proportional thereto; and means, coupled to receive said signals, for quantitatively displaying light sensed by said detector. 2. The particle counter as recited in claim 1 further including a third mirror disposed in said longitudinal axis, with said view volume means being positioned between said second and third mirrors, with a surface of said third mirror including a second coating having optical properties to reflect light having said first harmonic wavelength, whereby a substantial portion of light having said first harmonic wavelength passes through said view volume multiple times. 3. The particle counter as recited in claim 1 further including a third mirror and a second harmonic generator, with said third mirror being disposed between said view volume means and said second mirror, said second harmonic generator being disposed between said second and third mirrors to receive light having said first harmonic wavelength and adapted to produce, and direct along said longitudinal axis, light having a second harmonic wavelength, with said first harmonic wavelength being longer than said second harmonic wavelength. 4. The particle counter as recited in claim 3 wherein said third mirror includes a third coating disposed on a surface thereof that has optical properties to block light having said first harmonic wavelength, while being transparent to light having said second harmonic wavelength, whereby a substantial portion of light passing through said view volume comprises of light having said second harmonic wavelength. 5. The particle counter as recited in claim 4 further including a fourth mirror disposed in said longitudinal axis, with said view volume means being disposed between said third and fourth mirrors, with a surface of said fourth mirror including a fourth coating, disposed on a surface thereof, that has optical properties to reflect light having said second harmonic wavelength, whereby a substantial portion of light having said second harmonic wavelength passes through said view volume multiple times. 6. The particle counter as recited in claim 2 wherein said first harmonic generator includes a first and second side, with said first side facing said source and said second side facing said second mirror, with a fifth coating, disposed on said first side, having optical properties to reflect light having said first harmonic wavelength, thereby optimizing optical energy egressing therefrom. 7. The particle counter as recited in claim 5 wherein said second harmonic generator includes a first and second side, with said first side facing said second mirror and said second side facing said third mirror, and including a sixth coating, disposed on said first side, having optical properties to reflect light having said second harmonic wavelength, thereby optimizing optical energy egressing from said second harmonic generator. 8. The particle counter as recited in claim 1 wherein said source comprises an Nd:YAG. 9. A particle counter having a longitudinal axis, said particle counter comprising: a source adapted to produce, and direct along said longitudinal axis, coherent light having a lasing wavelength; a first mirror and a second mirror, spaced apart from said first mirror, said first and second mirror defining a resonant cavity, with said longitudinal axis extending therethrough and said source being optically coupled therewith; means, disposed to intercept said coherent light, for generating a desired harmonic wavelength; view volume means for introducing particles into said particle counter to pass through said longitudinal axis, with said generating means optically coupled to direct light having said desired harmonic wavelength toward said view volume means to impinge upon said particles present therein, producing scattered light; means, disposed within said cavity between said source and said view volume means, for reflecting light having a wavelength differing from light having said desired harmonic wavelength while transmitting light having said desired harmonic wavelength; a detector to sense light scattered from said view volume and produce signals proportional thereto; and means, coupled to receive said signals, for quantitatively displaying light sensed by said detector. 10. The particle counter as recited in claim 9 wherein said desired harmonic wavelength has a wavelength measuring 50% of said lasing wavelength. AMFNDEDSHEET(ARTICLE19) 11. The particle counter as recited in claim 9 wherein said desired harmonic wavelength has a wavelength measuring 25% of said lasing wavelength. 12. The particle counter as recited in claim 9 wherein said reflecting means includes a first coating, disposed on a surface of said second mirror, having optical properties to reflect said lasing wavelength of light impinging thereon while transmitting light having said desired wavelength. 13. The particle counter as recited in claim 12 wherein said generating means includes a first harmonic generator disposed between said source and said second mirror to intercept said coherent light having said wavelength, with said first harmonic generator being responsive to said lasing wavelength to produce light having a wavelength measuring 50% of said lasing wavelength. 14. The particle counter as recited in claim 13 further includes a third mirror disposed in said longitudinal axis, with said view volume means being disposed between said second and third mirrors, with a surface of said third mirror including a second optical coating having optical properties to reflect light having said wavelength measuring 50% of said lasing wavelength, whereby a substantial portion of light having said wavelength measuring 50% of said lasing wavelength passes through said view volume means multiple times. 15. The particle counter as recited in claim 13 further including a third mirror and a second harmonic generator, with said third mirror being disposed between said second mirror and said view volume means, and said second harmonic generator being disposed between said second and third mirrors to receive light having said wavelength measuring 50% of said lasing wavelength, said second harmonic generator adapted to produce light having a wavelength measuring 25% of said lasing wavelength. 16. The particle counter as recited in claim 15 further including a fourth mirror disposed in said longitudinal axis, with said view volume means being disposed between said third and fourth mirrors, said reflecting means further including a third coating disposed on a surface of said third mirror, with said third coating having optical properties to reflect light having a wavelength measuring 50% of said lasing wavelength while being transparent to light having a wavelength measuring 25% of said lasing wavelength, whereby a substantial portion of light passing through said view volume has a wavelength measuring 25% of said lasing wavelength. 17. A particle counter having a longitudinal axis, said particle counter comprising: a source adapted to produce and direct along said longitudinal axis, coherent light having a lasing wavelength; a first mirror and a second mirror, spaced apart from said first mirror, said first and second mirrors defining a resonant cavity, with said longitudinal axis extending through said cavity and said source being optically coupled thereto; -£b- view volume means for introducing particles into said particle counter so as to pass through said longitudinal axis; means, disposed to intercept said coherent light, for generating a desired harmonic wavelength and directing said desired harmonic wavelength to impinge upon said particles, producing scattered light, while blocking light having a wavelength differing from said desired harmonic wavelength from entering said view volume means, a third mirror disposed in said longitudinal axis, with said view volume means positioned between said second and third mirrors, with said third mirror including a first coating having optical properties to reflect light having said desired harmonic wavelength, whereby a substantial portion of light having said desired harmonic wavelength passes through said view volume multiple times; and means for sensing and quantitatively displaying said scattered light. 18. The particle counter as recited in claim 17 wherein said generating and directing means includes a second coating disposed on a surface of said second mirror and a first harmonic generator disposed between said source and said second mirror to receive said lasing wavelength and produce light having a wavelength measuring 50% of said lasing wavelength, with said second coating having optical properties to reflect light having said lasing wavelength, while transmitting said light having said wavelength measuring 50% of said lasing wavelength, thereby increasing a sensitivity of said particle detector to detect particles of sub-micron size. 19. The particle counter as recited in claim 18 wherein said generating and directing means further includes a fourth mirror and a second harmonic generator, with said fourth mirror being disposed between said second and third mirrors and said second harmonic generator being disposed between said second and fourth mirrors, with said second harmonic generator disposed to receive said light having said wavelength measuring 50% of said lasing wavelength and adapted to produce light having a wavelength measuring 25% of said lasing wavelength, with a third coating disposed on a surface of said fourth mirror having optical properties to reflect said light having said wavelength measuring 50% of said lasing wavelength and while transmitting said light having said wavelength measuring 25% of said lasing wavelength, thereby increasing a sensitivity of said particle detector to detect particles of sub-micron size. 20. The particle counter as recited in claim 19 wherein said first harmonic generator includes a first and second side, with said first side facing said source and said second side facing said second mirror, with a fourth coating disposed on said first side having optical properties to reflect said light having said wavelength measuring 50% of said lasing wavelength, thereby optimizing optical energy egressing therefrom, said second harmonic generator including first and second ends, with said first end facing said second mirror and said second end facing said third mirror, and including a fifth coating disposed on said first end having optical properties to reflect said light having said wavelength measuring 25% of said lasing wavelength, thereby optimizing optical energy egressing from said second harmonic generator. AMENDEDSHEET{ARTICLE1θ) Statement Under PCT Article 19 fl) PCT/US96/09615 The submitted amendment amends claims 1 through 20 in order to distinguish the claimed invention from the cited prior art. Specifically, independent claims 1, 9 and 17 were amended to point out that the particle counter has a source of coherent light which directs light having a lasing wavelength through a harmonic generator to produce light having a wavelength substantially shorter than the lasing wavelength. A mirror is positioned between the harmonic generator and a view volume of the particle counter, with the mirror having disposed thereon, an optical coating to separate light having the lasing wavelength from light produced by the harmonic generator. In this fashion, the mirror reflects having a lasing wavelength, while allowing light produced by the harmonic generator to pass therethrough and impinge on particles present in the view volume. Light impinging upon the particles produce scattered light. The scattered light is then sensed by the detector and quantitatively displayed. This structure greatly increases the sensitivity of the particle detector to particles of submicron size by increasing the amount of light scattered. More particularly, the amount of light scattered from a particle having a diameter less than the wavelength of light impinging upon it is defined as follows: D 6 /λ 4 where D is particle diameter and λ is the wavelength of scattered light. From the foregoing it is evident that increasing the amount of light scattered for a particle of a given size necessitates decreasing the wavelength λ of the light impinging thereupon it. (Page 8, lines 8-18). Further, to remove background noise and otherwise increase the sensitivity of the particle detector to particles of submicron size, it is advantageous to preclude light having an undesired wavelength from impinging upon the same. To that end, the claimed invention includes not only providing a shorter wavelength to impinge upon a particle in a view volume, but also a wavelength separation device to ensure that only the proper wavelength impinges upon the particle. The cited prior art, in combination, does not teach these concepts nor the claimed invention.

Inventors: DE FREEZ RICHARD K, GIRVIN KENNETH L, DE FREEZ, RICHARD, K., GIRVIN, KENNETH, L.
Applicants: MET ONE INC, MET ONE, INC.
Application year: 1996
Main classification: G01N21
IPC codes: G01N15, G01N21