Analog signal input circuitry with an analog-to-digital converter in a semiconductor device

Abstract: The analog signal input circuit comprises an analog-to-digital circuit and a conversion error measuring circuit. The conversion error measuring circuit comprises the following elements. A first switching device 13 is provided between an analog signal input terminal 5 and the sample/hold circuit 10 for disconnecting the analog-to-digital circuit from the analog signal input terminal 5 in a measurement operation for measuring a conversion error value. A reference voltage generation circuit 15, 22 is provided to be connected via a second switching device 14 to between the first switching device 13 and the sample/hold circuit 10. The correction reference voltage generation circuit 15, 22 generates a correction reference voltage in relation to the A/D conversion reference voltage. The second switching device 14 is operated to connect the analog-to-digital circuit to the correction reference voltage generation circuit in the measurement operation for measuring the conversion error value. A conversion error value memory 12 is provided for storing a conversion error value defined as a difference between the correction reference voltage and the A/D conversion reference voltage.

Description: The present invention relates to an analog signal input circuitry with an analog-to-digital converter in a semiconductor device. A conventional analog signal input circuit in a microcomputer 21 will be described with reference to FIG. 1. The conventional analog signal input circuit has an analog-to-digital converter for converting analog signals having been externally inputted into digital signals for subsequent digital signal processing by the microcomputer 21. FIG. 1 illustrates partially the microcomputer 21, for example, the conventional analog signal input circuit. The conventional analog signal input circuit is connected to a power voltage Vdd terminal 2, a Vref terminal 3, a Vss terminal 4 and an analog signal input terminal 5. The conventional analog signal input circuit is also connected to a data bus 20 of the microcomputer 21. The conventional analog signal input circuit comprises the following elements. An external resistor 1 having a resistance R1 is provided .to connect the power Vdd terminal 2 to the Vref terminal 3. A. resistor string 6 is provided to connect the Vref terminal 3 to the Vss terminal 4. The Vss terminal is grounded. A multiplexer 7 is connected to the resistor string 6. A sample/hold circuit 10 is provided to be connected to the analog signal input terminal 5. The sample/hold circuit 10 has an input side and an output side. The sample/hold circuit 10 comprises a switch 16 connecting the input and output sides and a capacitor 17 provided between the output side and the ground. A comparator 9 has two input terminals and an output terminal. The comparator 9 is biased by a voltage Vdd. The two input terminals are connected to the multiplexer 7 and the output side of the sample/hold circuit 10 respectively and an output terminal. A successive comparison register 11 has an input side which is connected to the output side of the comparator 9 and an output side. A translation register 12 is provided to be connected via a data bus to the output side of the successive comparison register 11 for receiving data from the successive comparison register 11. The translation register 12 is provided to be connected to a data bus 20. A decoder 8 is provided which has an input side and an output side. The input side of the decoder 8 is connected to the output side of the successive comparison register 11 for receiving data from the successive comparison register 11. The input side of the decoder 8 is connected to the multiplexer 7 so that the multiplexer 7 receives data from the decoder 8. A power voltage Vdd is supplied from exterior to the power voltage Vdd terminal 2, whilst the Vss terminal has the ground potential. As described above, the external resistor 1 is provided between the power voltage terminal Vdd 2 and the Vref terminal 3 and further the resistor string 6 is provided between the Vref terminal 3 and the Vss terminal having the ground potential. The power voltage Vdd is divided by the external resistor 1 and the resistor string 6 into the reference voltage Vref which appears on the Vref terminal 3. Assuming that the resistor string 6 has a resistance Ri and the external resistor 1 has a resistance Rl, the reference voltage Vref, into which the power voltage Vdd is divided with both the external resistor 1 and the resistor string 6, is represented by the following equation. Vref = Vdd{Ri/(Ri+Rl)} The reference voltage Vref is used as an input reference voltage, with reference to which an analog input signal is inputted via the analog signal input terminal 5 into the analog-to-digital converter. The sample/hold circuit 10 receives and holds the analog input signals inputted via the analog input terminal 5. The multiplexer 7 selects the level of voltage divided by the resistor string 6. The comperator 9 compares an output voltage fetched from the multiplexer 7 with an output voltage fetched from the sample/hold circuit 10 to thereby provide digital signals obtained by the analog-to-digital conversion. The successive comparison register 11 stores the results of the comparison by the comperator 9 between the output voltage fetched from the multiplexer 7 and the output voltage fetched from the sample/hold circuit 10. The decoder 8 fetches and decodes the digital signals obtained by the analog-to-digital conversion as the results of the comparison for subsequent supplying the multiplexer 7 with a divisional voltage selection information in accordance with which the multiplexer 7 selects the level of voltage divided by the resistor string 6. The translation register 12 stores the digital signals obtained by the analog-to-digital conversion as the results of the comparison. The digital data stored in the translation register 12 is then transmitted via the bus 20 to a central processing unit not illustrated in FIG. 1 but accommodated in the microcomputer 21 so that the central processing unit reads out the digital data fetched from the translation register 12. In this case, the analog-to-digital conversion was carried out in accordance with the successive comparison system so that the divided voltage outputted from the resistor string 6 is selected in accordance with the weight n-bit digital values. For example, Vref/2, either Vref/4 or 3Vref/4, either Vref/8, 3Vref/8, 5Vref/8, 7Vref/8, ---- {(2m+1)Vref/2 n }(m=0,1,2-, 2 n-1 ) which appear on the resistor string 6 are selected by the multiplexer 7 in accordance with the results of the comparison stored in the successive comparison register 11 for subsequent output of the selected voltage levels from the multiplexer 7. The selected voltage levels is then transmitted into the comperator 9 so that the comperator 9 executes the successive comparisons of the selected voltage levels with the voltage levels of the analog signals fetched from the sample/hold circuit 10. The results of the above successive comparisons are then transmitted into the successive comparison register 11 for storing the transmitted results of the successive comparisons in the successive comparison register 11 sequentially from a most significant bit of the successive comparison register 11. In the manner described above, the analog-to-digital conversion is carried out. Thereafter, the digital data are inputted into the translation register 12 to be stored therein. In the Japanese laid-open patent application No. 61-245065, it is disclosed that when an analog signal is inputted, a corrected value obtained in the input of a reference signal was previously stored, so that the corrected value can be used as an input reference voltage to conduct the analog-to-digital conversion. The above conventional analog signal input circuitry has the following disadvantages. As described above, the input reference voltage Vref is defined by a ratio in resistance value of the external resistor 1 to the resistor string 6. In view of the actual manufacturing technique, however, it is difficult to obtain the accurate predetermined resistance values of the external resistor 1 and the resistor string 6 without any variation. It is also hard to suppress any variation in resistance value of the external resistor 1 and the resistor string 6 due to a difference in temperature coefficient thereof. If the input reference voltage has any erroneous variation in voltage, then any conversion error may be generated in the converted digital value from the analog input voltage. Even if there is no difference in resistance value between the external resistor 1 and the resistor string 6, a voltage variation of the power voltage Vdd causes any error in performance of the analog-to-digital conversion with reference to analog input signals. It is also difficult to compensate this error in performance of the analog-to-digital conversion. In order to reduce the current consumption at the input reference voltage terminal Vref 3, it was proposed to use, in place of the external resistor 1, a switching device such as MOS transistor. However, the MOS transistor has an ON-resistance which causes a voltage drop of the input reference voltage Vref. This voltage drop of the input reference voltage Vref causes any error in performance of the analog-to-digital conversion. It is difficult to compensate this error in performance of the analog-to-digital conversion. In this case, it is necessary to compensate variations of circuit elements used for an amplifier for amplifying the input signal voltages. For this reason, it is necessary to store the correction value in the circuit. Although it is also necessary to measure the variation in the input reference voltage of the analog-to-digital converter circuit, it is difficult to measure the variation in the input reference voltage. In the above circumstances, it had been required to develop a novel analog-to-digital conversion circuitry free from the above disadvantages and problems. In addition, K. Lacanette examines in an article in ELECTRONIC ENGINEERING, Vol. 67, No. 819, March 1995, pages 53 to 54, 56, 58, 60, London, GB, entitled "Designing 3V and 5V analogue circuits in the mixed signal world", devices such as amplifiers, voltage references and ADCs usable in analogue signal paths of mixed, single voltage systems. An offset and gain calibration scheme referred to includes an A/D converter circuit and a conversion error measuring circuit, the latter comprising a first switching device arranged to disconnect the A/D converter circuit from an analogue signal input terminal only when a measurement operation is carried out for measuring a conversion error value, a second switching device connected to an intermediate point between the first switching device and the A/D converter circuit, a correction reference voltage generation circuit arranged to generate a correction reference voltage, and a conversion result memory provided for storing a conversion result of the correction reference voltage. In view of the above, it is an object of the present invention to provide a novel analog-to-digital conversion circuitry free from the above disadvantages and problems. It is a further object of the present invention to provide a novel analog-to-digital conversion circuitry which is capable of compensating variations in the converted digital values. According to the invention, these objects are accomplished by an analog signal input circuitry as defined in claim 1. Advantageous further developments of the invention are subject of the accompanying dependent claims. Briefly described, an analog signal input circuitry having an analog-to-digital converter circuit and a conversion error measuring circuit are provided. The analog signal input circuit is connected to a power voltage Vdd terminal, a Vref terminal, a Vss terminal and an analog signal input terminal. The analog signal input circuit is also connected to a data bus of the microcomputer. The analog signal input circuit comprises the following elements. An external resistor having a resistance is provided to connect the power Vdd terminal to the Vref terminal. A resistor string is provided to connect the Vref terminal to the Vss terminal. The Vss terminal is grounded. A multiplexer is connected to the resistor string. A sample/hold circuit is provided to be connected to the analog signal input terminal. The sample/hold circuit has an input side and an output side. The sample/hold circuit comprises a switch connecting the input and output sides and a capacitor provided between the output side and the ground. A comparator has two input terminals and an output terminal. The comparator is biased by a voltage Vdd. The two input terminals are connected to the multiplexer and the output side of the sample/hold circuit respectively and an output terminal. A successive comparison register has an input side which is connected to the output side of the comparator and an output side. A translation register is provided to be connected via a data bus to the output side of the successive comparison register for receiving data from the successive comparison register. The translation register is provided to be connected to a data bus. A decoder is provided which has an input side and an output side. The input side of the decoder is connected to the output side of the successive comparison register for receiving data from the successive comparison register. The input side of the decoder is connected to the multiplexer so that the multiplexer receive data from the decoder. The conversion error measuring circuit comprises the following elements. A first switching device is provided between an analog signal input terminal and the sample/hold circuit for disconnecting the analog-to-digital circuit from the analog signal input terminal in a measurement operation for measuring a conversion error value. A reference voltage generation circuit is provided to be connected via a second switching device to between the first switching device and the sample/hold circuit. The correction reference voltage generation circuit generates a correction reference voltage in relation to the A/D conversion reference voltage. The second switching device is operated to connect the analog-to-digital circuit to the correction reference voltage generation circuit in the measurement operation for measuring the conversion error value. A conversion error value memory is provided for storing a conversion error value defined as a difference between the correction reference voltage and the A/D conversion reference voltage. The conversion error value is used as a base on which the correction coefficient is calculated by an arithmetic circuit included in a semiconductor device so that a correction value is obtained by the product of the calculated correction coefficient and the digital value into which the analog signal has been converted. The above correction reference voltage generation circuit may comprise first and second resistors connected in series between a power supply line and a ground line, wherein an intermediate point between the first and second resistors is electrically connected to the second switching device. Alternatively, the above correction reference voltage generation circuit may comprise a first resistor and a Zener diode, both of which are connected in series between a power supply line and a ground line, wherein the first resistor is connected to the power supply line and the Zener diode is connected to the ground line. An intermediate point between the first resistor and the Zener diode is electrically connected to the second switching device. Preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. FIG. is a circuit diagram illustrative of the conventional analog signal input circuit in a microcomputer. FIG. 2 is a circuit diagram illustrative of a novel analog signal input circuit in a microcomputer in a first embodiment according to the present invention. FIG. 3 is a diagram illustrative of operation cycles of a novel analog signal input circuit in a microcomputer in a first embodiment according to the present invention. FIG. 4 is a diagram illustrative of a property in an A/D conversion of a novel analog signal input circuit in a microcomputer in a first embodiment according to the present invention. FIG. 5 is a flow chart illustrative of processes for correction of a conversion error by novel analog signal input circuit in a microcomputer in a first embodiment according to the present invention. FIG. 6 is a circuit diagram illustrative of a novel analog signal input circuit in a microcomputer in a second embodiment according to the present invention. A first embodiment according to the present invention will be described with reference to FIG. 2. The novel analog signal input circuit has an analog-to-digital converter and a conversion error measuring circuit FIG. 2 illustrates partially the microcomputer 21, for example, the conventional analog signal input circuit. The conventional analog signal input circuit is connected to a power voltage Vdd terminal 2, a Vref terminal 3, a Vss terminal 4 and an analog signal input terminal 5. The conventional analog signal input circuit is also connected to a data bus 20 of the microcomputer 21. The conventional analog signal input circuit comprises the following elements. An external resistor 1 having a resistance R1 is provided to connect the power Vdd terminal 2 to the Vref terminal 3. A resistor string 6 is provided to connect the Vref terminal 3 to the Vss terminal 4. The Vss terminal is grounded. A multiplexer 7 is connected to the resistor string 6. A sample/hold circuit 10 is provided to be connected to the analog signal input terminal 5. The sample/hold circuit 10 has an input side and an output side. The sample/hold circuit 10 comprises a switch 16 connecting the input and output sides and a capacitor provided between the output side and the ground. A comparator 9 has two input terminals and an output terminal. The comparator 9 is biased by a voltage Vdd. The two input terminals are connected to the multiplexer 10 and the output side of the sample/hold circuit 10 respectively and an output terminal. A successive comparison register 11 has an input side which is connected to the output side of the comparator 9 and an output side. A translation register 12 is provided to be connected via a data bus to the output side of the successive comparison register 11 for receiving data from the successive comparison register 11. The translation register 12 is provided to be connected to a data bus 20. A decoder 8 is provided which has an input side and an output side. The input side of the decoder 8 is connected to the output side of the successive comparison register 11 for receiving data from the successive comparison register 11. The input side of the decoder 8 is connected to the multiplexer 7 so that the multiplexer 7 receive data from the decoder 8. The conversion error measuring circuit comprises the following elements. A first switching device 13 is provided between an analog signal input terminal 5 and the sample/hold circuit 10. The first switching device 13 is operated to disconnect the analog-to-digital circuit from the analog signal input terminal in a measurement operation for measuring a conversion error value. A reference voltage generation circuit 15 is provided to be connected via a second switching device 14 to between the first switching device 13 and the sample/hold circuit 10. The correction reference voltage generation circuit 15 generates a correction reference voltage in relation to the A/D conversion reference voltage. The second switching device 14 is operated to connect the analog-to-digital circuit to the correction reference voltage generation circuit 15 in the measurement operation for measuring the conversion error value. The conversion error value is used as a base on which the correction coefficient is calculated by an arithmetic circuit included in a semiconductor device so that a correction value is obtained by the product of the calculated correction coefficient and the digital value into which the analog signal has been converted. The above correction reference voltage generation circuit 15 may comprise first and second resistors 18 and 19 connected in series between a power supply line Vdd and a ground line, wherein an intermediate point between the first and second resistors 18 and 19 is electrically connected to the second switching device 14. The first and second resistors 18 and 19 have first and second resistance values r1 and r2 respectively. An operation for measuring the conversion error will be described, but assuming that the resistance Rl of the external resistor 1 is the same as the resistance Ri of the resistor string 6 and that the second resistance r2 of the second resistor 19 is three times smaller than the first resistance r1 of the first resistor 18. If the external resistor 1 and the resistor string 6 have no variation and Rl=Ri, then the input reference voltage Vref is Vdd/2. In this case, it is assumed that the sample/hold circuit 10 has a voltage of Vdd/2 and also that a digital value corresponding to a full scale value "d" is stored in the translation resistor 12 as a result of the analog-to-digital conversion. In a reference voltage signal conversion cycle 101 illustrated in FIG. 3, a reference voltage of Vdd/4 is inputted into the sample hold circuit 10. Thus, a digital value d/2 is stored in the translation register 12 after the reference voltage conversion. By contrast, if the external resistance 1 has a variation of Δ Rl and the resistor string 6 has a variation of Δ Ri, the input reference voltage Vref is generated with a variation "k". Vref = Vdd x (Ri + Δ Ri) / (Ri + Rl + Δ Ri + Δ Rl) k = Vdd x {(Ri + Δ Ri) / (Ri + Rl+ Δ Ri + Δ Rl)-1/2} When the reference voltage Vdd/4 is subjected to the analog-to-digital conversion, the variation "k" generates a conversion error "dk" represented by the following formula. dk = d/2 - d0 = d/2 - (Vdd/4)d/(Vdd/2 + k) = d/2 - (d/4)( Ri + Rl + Δ Ri + Δ Rl)/(Ri + Δ Ri) where d0 is the result of the conversion of the reference voltage Vdd/4. After the reference voltage conversion, the digital value d0 is stored in the translation resistor 12. As illustrated in FIG. 3, in a correction coefficient calculation cycle 102, The digital value d0 stored in the translation resistor 12 as the result of the analog-to-digital conversion is then transmitted via the data bus 20 to a central processing unit of the microcomputer 21. The correction coefficient (h=d0/(d/2)) is calculated by the arithmetic circuit in the central processing unit. Every time after the analog input conversion cycles 103 and 104 have been completed, the operations enter into the corresponding correction value calculation cycles. In the correction value calculation cycle, the A/D-converted value "dn" prior to the correction is stored in the translation register 12. The A/D-converted value "dn" is transmitted via the data bus 20 to the central processing unit of the microcomputer 21 for read out operation. The arithmetic circuit in the central processing unit calculates the correction value dn' by calculating the product of dn x h. As a result, the conversion error can be corrected. In the analog input conversion cycles 103 and 104, the first switching device 13 is in the ON-state, whilst the second switching device 14 is in the OFF-state so that the analog signal inputted in the analog signal input terminal 5 is then transmitted to the sample/hold circuit 10. In FIG. 4, the real line 201 represents an ideal A/D conversion property when Rl=Ri. The real line 202 represents an actual A/D conversion property when Rl Ri have variations. The real line 203 represents an ideal A/D conversion property when the reference voltage is Vdd/4. The real line 204 represents an actual A/D conversion property when the reference voltage is Vdd/4. In FIG. 5, the correction procedures are illustrated. In a step 301, the reference voltage is converted into the value d0. In a step 302, the correction coefficient h is calculated. In a step 303, analog signal inputted is converted into the value dn. In a step 304, the correction value of the value dn is calculated. The steps 303 and 304 are repeated. The correction reference voltage generation circuit 15 generates the correction reference voltage which is defined by the ratio in resistance of the first resistor 18 and the second register 19. If the correction reference voltage generation circuit 15 having the first and second registers 18 and 19 is formed on a common semiconductor substrate on which the analog-to-digital circuit is formed, then the ratio in resistance of the first resistor 18 and the second register 19 remains unchanged even when there exist variations in resistance of the first and second registers 18 and 19, for example, due to variation in temperature. The correction reference voltage generation circuit 15 remains available in a wide temperature range. It is possible to correct the A/D conversion error generated due to variation in voltage of the power supply or a drop of the input reference voltage. In accordance with the present invention, as described above, the correction reference voltage generation circuit is provided to correct the A/D conversion error. A second embodiment according to the present invention will be described with reference to FIG. 6. The novel analog signal input circuit has an analog-to-digital converter and a conversion error measuring circuit. FIG. 6 illustrates partially the microcomputer 21, for example, the conventional analog signal input circuit. The conventional analog signal input circuit is connected to a power voltage Vdd terminal 2, a Vref terminal 3, a Vss terminal 4 and an analog signal input terminal 5. The conventional analog signal input circuit is also connected to a data bus 20 of the microcomputer 21. The conventional analog signal input circuit comprises the following elements. An external resistor 1 having a resistance Rl is provided to connect the power Vdd terminal 2 to the Vref terminal 3. A resistor string 6 is provided to connect the Vref terminal 3 to the Vss terminal 4. The Vss terminal is grounded. A multiplexer 7 is connected to the resistor string 6. A sample/hold circuit 10 is provided to be connected to the analog signal input terminal 5. The sample/hold circuit 10 has an input side and an output side. The sample/hold circuit 10 comprises a switch 16 connecting the input and output sides and a capacitor provided between the output side and the ground. A comparator 9 has two input terminals and an output terminal. The comparator 9 is biased by a voltage Vdd. The two input terminals are connected to the multiplexer 10 and the output side of the sample/hold circuit 10 respectively and an output terminal. A successive comparison register 11 has an input side which is connected to the output side of the comparator 9 and an output side. A translation register 12 is provided to be connected via a data bus to the output side of the successive comparison register 11 for receiving data from the successive comparison register 11. The translation register 12 is provided to be connected to a data bus 20. A decoder 8 is provided which has an input side and an output side. The input side of the decoder 8 is connected to the output side of the successive comparison register 11 for receiving data from the successive comparison register 11. The input side of the decoder 8 is connected to the multiplexer 7 so that the multiplexer 7 receive data from the decoder 8. The conversion error measuring circuit comprises the following elements. A first switching device 13 is provided between an analog signal input terminal 5 and the sample/hold circuit 10. The first switching device 13 is operated to disconnect the analog-to-digital circuit from the analog signal input terminal in a measurement operation for measuring a conversion error value. A reference voltage generation circuit 22 is provided to be connected via a second switching device 14 to between the first switching device 13 and the sample/hold circuit 10. The correction reference voltage generation circuit 22 generates a correction reference voltage in relation to the A/D conversion reference voltage. The second switching device 14 is operated to connect the analog-to-digital circuit to the correction reference voltage generation circuit 22 in the measurement operation for measuring the conversion error value. The conversion error value is used as a base on which the correction coefficient is calculated by an arithmetic circuit included in a semiconductor device so that a correction value is obtained by the product of the calculated correction coefficient and the digital value into which the analog signal has been converted. The above correction reference voltage generation circuit 22 comprises a first resistor 23 having a resistance r3 and a Zener diode 24, both of which are connected in series between a power supply line Vdd and a ground line, wherein the first resistor 23 is connected to the power supply line and the Zener diode 24 is connected to the ground line. An intermediate point between the first resistor 23 and the Zener diode 24 is electrically connected to the second switching device 14. In the correction reference voltage generation circuit 22, a constant reference voltage Vzd is applied over the Zener diode 24. If the input reference voltage (Vref = Vdd/2) has a variation "k", the A/D converted value dk into which the reference voltage Vzd is A/D-converted is given as follows. dk = {Vzd/(Vdd/2)}d - {Vzd/(Vdd/2 + k)} d where the second term represents the actual A/D converted value of the reference voltage Vzd. The correction coefficient h is calculated from the following formula. h = {Vzd/(Vdd/2 + k)}/{Vzd/(Vdd/2)} In the same manner as in the first embodiment, the A/D conversion error can be corrected. As a modification, the present invention is applicable when the Vref terminal 3 is directly connected to the Vdd terminal without the external resistor 1 or when a MOS transistor is provided between the Vdd terminal and the Vref terminal in place of the external resistor 1. In those cases, even if a voltage drop is generated by the variation of the power voltage or the resistance of the MOS transistor, the reference voltage Vzd of the Zener diode 24 remains unchanged. Assuming that the variation of the power voltage Vdd or the difference of the reference voltage Vref from the power voltage Vdd is Δ Vdd, the A/D conversion error dn and the correction coefficient h represent as follows. dk = (Vzd/Vdd) d - {Vzd/(Vdd+ Δ Vdd)} d h = {Vzd/(Vdd + Δ Vdd)}/(Vzd/Vdd) In the same manner as in the first embodiment, the A/D conversion error can be corrected.

Claims: An analog signal input circuitry for a semiconductor device having an analog-to-digital converter circuit, said analog signal input circuitry comprising: a reference voltage terminal (3) for providing a reference voltage for the analog-to-digital converter and being connected between an external resistor (R L ) connected to a power supply (V DD ) and a resistor string (R I ) connected to ground; an analog signal input terminal (5) for receiving an analog input signal and for applying the analog input signal to a sample and hold circuit (10); a comparator (9) for comparing an output of said sample and hold circuit (10) to a voltage selectively provided by a multiplexer (7) which selectively divides a voltage from said resistor string (R I ) to thereby convert the analog input signal to a digital output signal, said digital output signal being provided from said comparator (9) to a conversion register (11) and containing a conversion error; a decoder (8) for providing the digital output signal from said conversion register (11) to said multiplexer (7) and to a translation register (12) which provides the digital output signal to a processing unit; a first switching device (13) for disconnecting said analog input terminal (5) from said sample and hold circuit (10) only when a measurement operation is carried out for measuring a conversion error value; a conversion reference voltage generating circuit (15; 22) for providing a conversion error reference voltage when said conversion error value is to be measured, said conversion reference voltage generating circuit (15; 22) comprising a first conversion reference voltage generating element (18; 23) and a second conversion reference voltage generating element (19; 24) connected between the power supply (V DD ) and ground and having an intermediate point at which said conversion error reference voltage is provided; and a second switching device (14) for connecting said conversion reference voltage generating circuit (15; 22) to said sample and hold circuit (10) when the conversion error value is to be measured, wherein a conversion digital output signal corresponding to the conversion error reference voltage is provided as an output from said translation register (12) when the conversion error value is measured; said processing unit determining a conversion error correction coefficient from a comparison of the conversion digital output signal from said translation register (12) to a digital value corresponding to the conversion error reference voltage stored in said processing unit when the conversion error value is to be measured, and further applying said conversion error correction coefficient to the digital output signal from said translation register (12) when the analog input signal is applied to said sample and hold circuit (10) so as to correct said conversion error included in said digital output signal. The analog signal input circuitry as claimed in claim 1, wherein said first correction reference voltage generation element is a first resistor (18) and said second correction reference voltage correction element is a second resistor (19), said first and second resistors (18, 19) being connected in series between said power supply (V DD ) and ground, and said intermediate point between said first and second resistors (18, 19) being electrically connected to said second switching device (14). The analog signal input circuitry as claimed in claim 1, wherein said first correction reference voltage generation element is a resistor (23) and said second correction reference voltage correction element is a Zener diode (24), said resistor (23) and said Zener diode (24) being connected in series between said power supply (V DD ) and ground, and said intermediate point between said resistor (23) and said Zener diode (24) being electrically connected to said second switching device (14).

Inventors: TAKAYAMA SHIGERU, TAKAYAMA, SHIGERU
Applicants: NIPPON ELECTRIC CO, NEC CORPORATION
Application year: 1996
Main classification: H03M1
IPC codes: H03M1