A noise measurement for optical amplifier and a system therefor

Abstract: A method and a system for measuring a noise figure of an optical amplifier (1), independently detects two different output powers generated from the optical amplifier (1) under measurement for determining the noise figure. The generation of the first output power is in synchronization with a space period of an input optical pulsed signal, while the generation of the second one is in synchronization with the mark period of the input optical pulsed signal. The optical pulsed signal is an intensity-modulated signal given at a repetition rate of sufficiently shorter than a life time of carriers or a life time of ions in a metastable level of the optical amplifier under measurement.

Description: The present invention relates to a method of directly measuring a noise emitted from an optical amplifier and a system used for performing the noise figure measurement. Heretofore, optical amplifiers and optical amplifier systems using thereof have been studied and developed in the field of optical communications. The optical amplifiers are responsible for directly amplifying optical signals, in which two types thereof, optical fiber amplifiers and semiconductor laser amplifiers, have been known. The semiconductor laser amplifiers take advantage of optical amplification phenomena in the semiconductor lasers. It is well known that there are several types of the optical fiber amplifiers, for example a type of such as a fiber amplifier using the properties of non-linearity of a silica fiber and a type of such as a rare earth doped fiber amplifier. The rare earth doped fiber amplifier comprises an optical fiber having a core material doped with a rare earth such as erbium (Er) and neodymium (Nd). An operation of this kind of amplifier is based on the fact that the output power is the stimulated emission by - an input signal light from rare earth ions at high energy level. In this case, particularly, the Er-doped fiber amplifiers have been now in the stage for a practical application in the field of optical communications because of, for example gain band can be obtained at 1.53-1.56 µm and the development of high-performance semiconductor lasers to be employed as optical sources for EDFA pumping. Fig. 1 shows an energy level diagram for explaining the optical amplification phenomena of the Er-doped fiber amplifier. When an optical amplification medium (i.e., an Er-doped optical fiber) receives energies from an optical source (i.e., a semiconductor laser) for the pumping, ions in a core of the fiber are pumped from a ground state to a pump level. Then the ions are transited downwardly from the pump level to a metastable level without optical emission. The population of atoms in the metastable level increases and exceeds the number in the ground state (it is called population inversion). Then optical emission can be occurred when the ions in the metastable level are transited to the ground state. In this case, there are two types of downward transitions occurred: an stimulated-emission step in which the transition of ions is induced by an input light; and a spontaneous-emission (SE) step in which the transition of ions is spontaneously occurred without an input light. The stimulated emission step corresponds to the optical amplification. The stimulated emission enables the high-speed transition of ions and optical amplification at a band width of 1 THz (terahertz) or more. Because the now highest transmission speed of signal light is of 2.4 Gbit/sec. in commercial optical communications, the stimulated emission offers the hope of amplifying a higher-speed signal light. In the case of the spontaneous emission, on the other hand, a lower-speed atom transition can be occurred, compared with that of the stimulated emission. The mean life of spontaneous emission (i.e., the mean life of ions) is in the range of several milliseconds to several ten milliseconds for the Er-doped optical fiber. The spontaneous emission light (hereinafter, referred as to SE light) is amplified in the Er-doped optical fiber and outputted as an amplified spontaneous emission (hereinafter, referred as to ASE) optical power. The setup of the conventional optical amplifier will be explained first with reference to Figs. 2A and 2B for a more detailed explanation. Fig. 2A is a schematic block diagram of an optical amplifier comprising a rare earth doped optical fiber 221, while Fig. 2B is a schematic block diagram of an optical amplifier comprising a semiconductor optical amplification element 222. In these figures, the measurement setup is constituted so as to place the optical amplification medium 221 or 222 between optical isolators 223, 224 to solve the problem of causing unstable amplification. That is, an optical amplification medium 221 or 222 amplifies an input light in both directions. It means that the amplified signal light 225 and the ASE light 226 are reflected by the optical components in front and behind of the OA medium 221 or 222, so that the OA medium 221 or 222 is oscillated by these lights, resulting in unstable amplification. Therefore, the optical amplifier is placed between optical isolators 223, 224 to keep stable amplification. The optical amplifiers shown in Figs. 2A and 2B also comprise an optical band-pass filter (BPF) 227 just before an output port of the optical amplifier for removing an undesired ASE optical power having the wavelength different from that of the signal light. If the amplified signal light is much larger than the ASE light, the BPF 227 may be omitted. Furthermore, the optical amplifier described above should be evaluated for its performance. In general, noise figure (NF) is one of the important parameters to evaluate the amplifier's performance. The NF parameter can be written as: NF = P ASE hνGB 0 + 1 G wherein P ASE is the ASE optical power of an optical wave form emitted from the optical amplifier, B O is the optical bandwidth of a measurement device for measuring the P ASE level, G is the gain of the optical amplifier under measurement, h is Planck's constant, and υ is the optical frequency of the signal light. The second term in (1) can be neglected for high gain amplifier evaluation for simplicity. The noise figure measurement described above enables one to judge the performance (i.e., failure, performance degradation, and so on) of the optical amplifiers and also to compare their performances. Therefore, a simple and reliable system for measuring the noise figure with a high-accuracy has been demanded. However, it is impossible to directly obtain the P ASE level to be used as a constant in the equation (1) for determining the NF because of the reasons described bellow. Referring to the attached figures for understanding the problems of the conventional NF measurement method, Fig. 3 shows an inside of the optical amplification medium (hereinafter, referred as OA medium) 221 or 222 of the optical amplifier while Fig. 4 shows variations in gain (GF) and nose figure (NF) against an input optical power level in the typical optical amplifier. The input light passing through the optical amplifier is amplified in the OA medium. In this case, an ASE light generated from the medium can be transmitted in both directions (i.e., forward and backward directions) toward an input port and an output port of the amplifier. In the case of the optical amplifier having the optical isolator, the isolator blocks the ASE light directing to the backward direction. The ASE optical power required for determining the NF is a part of the ASE light directing to the forward direction and it must be of having a wavelength corresponding to that of the input light. The optical power can be generated from the optical amplifier as a sum of the amplified input light which is amplified in the OA medium and the ASE light directing to the forward direction. Therefore, it is necessary to separate the amplified input light and the ASE light and to perform their measurements independently. In recent years, several NF measurement methods have been proposed, for example, an optical spectrum analyzer method (OSA method), an electric test method (S. Nishi & M. Saruwatari, "Comparison of Noise Figure Measurement Methods for Erbium doped Fiber Amplifiers", ECOC'93 Tu3, 1993), Polarization test method (J. Aspen, J.F. Federici, B.M. Nyman, D.L. Wilson, & D.S. Shenk, "Accurate noise figure measurements of erbium-doped fiber amplifiers in saturation conditions", OFV'92 ThE1, 1991), and Pulse test method. The conventional NF measurement methods will be explained with reference to Figs. 5-8. Fig. 5 is a schematic block diagram of a NF measurement system for explaining an example of the conventional methods (the OSA method). According to the method, a laser beam from LD light source 51 passes through an optical amplifier (OA) 52 under measurement to generate an output to be observed by an optical spectrum analyzer 53. Though the laser beam is of a single wavelength, the output is generated as a sum of an amplified input light and an ASE light of over wide wavelength. An optical power of the ASE light (P ASE ) can be estimated from spectra of the output. That is, the method includes the steps of: (i) overlapping two output spectra: an output spectrum of the OA under measurement at a switch-off period in which the OA does not receive the input light; and an input spectrum of the laser beam at a switch-on period in which the OA receives the input light; and (ii) estimating a level of the P ASE that has a wavelength corresponding with that of the laser beam. As the P ASE level cannot be measured directly, the results tend to be varied with each observer. In this case, for example, it is necessary to use a computing machine or the like for fitting one spectrum with another to estimate the P ASE level of each optical amplifier under a series of automatically measurements on a large scale. Fig. 6 is a schematic block diagram of a NF measurement system for explaining a second preferred embodiment of the conventional methods (Polarization test method). According to the method, a polarization controller 54 and a polarizer 55 are arranged between an optical amplifier (OA) 52 under measurement and an optical spectrum analyzer 53. In this arrangement, a laser beam from LD light source 51 passes through the OA 52 to generate an output to be observed by an optical spectrum analyzer 53 in the same manner as that of the OSA test method (Fig. 5). In this method, furthermore, the polarization controller 54 must be regulated so as to make a single polarized light condition of the amplified laser light to intersect perpendicular to a transmission characteristic of the polarizer 55. That is, the regulation should be performed so as to minimize a level of the laser light power amplified by the optical spectrum analyzer 53. If the polarized light condition is of a single one and intersects perpendicular to the transmission characteristic of the polarizer 55, the amplified laser light can be prevented. However the ASE light is not polarized, so that its output level can be reduced to half by passing through the polarizer 55. Ideally, the optical spectrum analyzer 53 should only observes the spectrum excepting the amplified laser light to determine the P ASE level from the result of measuring the optical power of a wavelength corresponding with that of the laser beam. The second preferred embodiment demands skill in the operator because it is hard to regulate the polarization controller 54. Therefore, it should not be applied in the NF measurements at a stage of the manufacturing process for each of the optical fibers which are mass-produced. To solve this problem, there is an idea of employing a control means for automatically adjusting the polarization. However, it cannot be fit to the NF measurements in practical because it increases in complexity. On the other hand, the pulse test method utilizes a fact that a time constant of the Er-doped optical fiber is relatively long. The method includes the steps of providing a pulsed light into the OA and measuring a each level of an amplified spontaneous emission (ASE) light and a signal light by means of an OE converter having time windows. In accordance with the pulse test method, in general, a system configuration for the measurement can be simplified in spite of performing the measurement quickly with a high accuracy. Further the pulse test method has some peculiarities, for example it is not susceptible to a polarization hall burning, a single polarization, and a broad width of optical source spectrum. Furthermore, the conventional pulse test method will be explained in detail with reference to the attached drawings. Fig. 7 is a schematic block diagram of the setup for the conventional pulse test method and Fig. 8 is a wave form of optical surge (see references: D. M. Baney and J. Dupre, "Pulsed-source technique for optical amplifier noise figure measurement", ECOC'92, p509, 1992; and Klar and W. E. Heinlein, "Noise figure measurement of erbium-doped fibers amplifiers with a pulsed signal source", Technical Digest of 2nd optical fibers measurement conference, pp. 105-108, 1993 (Torino)). In this method, a rectangular on-off input signal is subjected to a low-speed modulation so as have a switching frequency of about 100 Hz, which is sufficiently lower than an extinction time constant of the optical amplifier. At the moment of switching the signal input off, the ASE level at the output port of the OA remains at the stationary state corresponding to the level observed in the period of the switching on. Therefore, it is possible to calculate the signal light power and ASE optical power (P ASE ) independently. However the conventional pulse test method causes the following troubles. That is, if the switching-off period is not sufficiently short (i.e., switching delay), as shown in Fig. 7, the ASE light can be recovered to some extent before the input signal level disappears perfectly. Therefore it complies to estimate the P ASE level from an over-responded wave of the ASE light. As shown in Fig. 8, furthermore, there is a sudden increase as a peak output (i.e., optical surge) in a risen-up portion of a pulse of the output light . In this case, a magnitude of the peak output is depended on the input power and the linear gain, so that it may be in the order of several watts. Consequently, a part of the optical amplifier may be damaged by the peak output. Document JP-A-5 257177 describes a measurement system for noise characteristic of optical amplifier. In a NF measurement as defined therein, the provision of "H" (high) level and "L" (low) level is for the purpose of reducing the influence of a relative intensity noise when an average value of the optical power is large. When an average value of the optical power is small, a noise measurement to a beat noise limitation is permitted. An object of the present invention is to provide a NF measurement method for readily determining noise figure with a high accuracy by directly measuring a correct ASE power level of an optical amplifier under measurement without causing any trouble of optical surge generation. This object is achieved, for example, by a method of measuring a noise figure of an optical amplifier according to claim 1 and by a measurement system according to claim 18. Advantageous further developments are as set out in the respective dependent claims. The above and other objects, effects, features and advantages of the present invention will become more apparent from the following description of embodiments thereof taken in conjunction with the accompanying drawings. Fig. 1 is an energy level diagram for explaining a principle of an optical amplification in the Er-doped fiber amplifier; Fig. 2A is a schematic block diagram of the setup for a NF measurement method for a rare earth doped optical fiber amplifier; Fig. 2B is a schematic block diagram of the setup for a NF measurement for a semiconductor laser optical amplification element; Fig. 3 is a schematic representation of an inside of the optical amplification medium for explaining a transmission of an optical pulsed signal passing through the medium; Fig. 4 is a graphical representation of the relationship between an input optical power level and variations in gain and NF; Fig. 5 is a schematic block diagram with a wave form for explaining the setup for a first preferred embodiment of the conventional NF measurement methods; Fig. 6 is a schematic block diagram for explaining the setup for a first example of the conventional NF measurement methods; Fig. 7 is a schematic diagram with a wave form chart for explaining the setup for a second example of the conventional NF measurement methods; Fig. 8 is a wave form chart for explaining an optical surge observed in the setup for the conventional pulse test method; Fig. 9 is a schematic block diagram with a wave form chart for explaining the setup for a first preferred embodiment of the NF measurement method in accordance with the present invention; Fig. 10 is a graphical representation for explaining the results in the NF measurement in accordance with the present invention; Fig. 11 is a wave form chart for explaining an amplified input optical signal observed in the NF measurement in accordance with the present invention, in which an optic surge is not found; Fig. 12A is a wave form chart for explaining an variation of the P ASE when a high-speed modulated small signal is inputted in an optical amplifier under measurement; Fig. 12B is a wave form chart for explaining an variation of the P ASE when a high-speed modulated large signal is inputted in an optical amplifier under measurement; Fig. 12C is a wave form chart for explaining an variation of the P ASE when a low-speed modulated small signal is inputted in an optical amplifier under measurement; Fig. 12D is a wave form chart for explaining an variation of the P ASE when a low-speed modulated large signal is inputted in an optical amplifier under measurement; Fig. 13 is a schematic block diagram for explaining the basic setup and a first preferred embodiment of the NF measurement system in accordance with the present invention; Fig. 14 is a wave form chart for explaining each wave form of modulation signal, reversed signal, input light, output light, and ASE light at the first preferred embodiment of the NF measurement system in accordance with the present invention; Fig. 15A is a wave form chart for explaining a output light wave form when the period of actuating an optical switch is longer than that of the space period of the inpute pulse light; Fig. 15B is a wave form chart for explaining a output light wave form when the period of actuating an optical switch is shorter than that of the space period of the input pulse light; Fig. 16 is a schematic block diagram for explaining the basic setup and a second preferred embodiment of the NF measurement system in accordance with the present invention; Fig. 17A is a wave form chart for explaining an output light wave form of the optical switch, in which an amplified input light is leaked into the output light by an incomplete optical switch; Fig. 17B is a wave form chart for explaining the results in a calculation for determining ASE spectrum characteristics in accordance with the NF measurement in accordance with the present invention, in which an amplified input light is leaked into the output light by an incomplete optical switch; Fig. 18 is a schematic block diagram for explaining the basic setup and a third preferred embodiment of the NF measurement system in accordance with the present invention; Fig. 19 is a schematic block diagram for explaining the basic setup and a fourth preferred embodiment of the NF measurement system in accordance with the present invention; Fig. 20 is a schematic block diagram for explaining the basic setup and a fifth preferred embodiment of the NF measurement system in accordance with the present invention; and Fig. 21 is a schematic block diagram for explaining the basic calibration of the NF measurement system in accordance with the present invention. A method of measuring a noise figure performance of an optical amplifier in accordance with the present invention is based on the following phenomena. That is, as explained in the conventional examples described above, an optical spectrum analyzer detects an output from an optical amplifier (OA) as a sum of an amplified intensity-modulated light and an ASE light when an input signal is introduced into the OA. In the case of providing the OA with an input optical signal being subjected to an intensity-modulation by a pulse signal, an amplified intensity-modulated light is composed of two portions: a first portion that includes the input optical signal passing through the OA and corresponds to a duration of switching the input signal on (hereinafter, referred to as a switch-on period); and a second portion that excludes the input signal and corresponds to a duration of switching the input signal off (hereinafter, referred to as a switch-off period). During the switch-off period, the ASE light can be varied in accordance with the metastable level life time. In this invention, therefore, the OA under measurement receives an optical amplified signal given at a repetition rate of sufficiently short time compared with the metastable level life time of the OA, resulting that the ASE light can be continuously observed in spite of during the switch-off period. According to the present invention, the NF measurement method includes the step of detecting an output light generated from the OA under measurement in synchronization with the switch-off period. In this case, a time constant of the metastable level can be depended on the life time of ions in the upper state (see Fig. 1) when the OA under measurement is in the type of using an optical fiber doped with a rare-earth element, or it can be depended on the life time of carriers when the OA under measurement is in the type of using the semiconductor element. Fig. 9 is a schematic block diagram of the setup for performing a NF measurement method as one of the preferred embodiments of the present invention. In this method, firstly a light beam transmitted from an optical source 91 is converted into an optical pulse signal 96 consisting of a train of equally spaced rectangular pulses at a frequency of approximately 1 MHz by means an optical switch (SW1) 92. Then the input signal 96 is introduced into an optical amplifier (OA) 93 under measurement. Secondary, an optical switch (SW2) 94 samples an output light 97 generated from the OA 93. That is, the SW2 94 samples a series of marks shown in a wave form of the output signal to obtain an amplified optical signal power (P AMP ), following that an optical spectrum analyzer 95 determines the P AMP level. These marks are generated in synchronization with intervals of time characterized in that the optical pulse signal 96 is present. In the case of sampling non-marked portions of an output pulse, on the other hand, an amplified spontaneous emission power (P ASE ) level is measured with the optical spectrum analyzer 95. For the optical switches SW1 and SW2, acousto-optical modulators (AOM) are preferably used in the present invention because of their high isolation levels and their high-speed functions. Accordingly, the NF level can be easily determined by the way of measuring the P ASE level of the obtained ASE optical spectrum. As it will be described in latter, furthermore, it is possible to use a narrow band width optical filter and an optical power meter instead of the optical spectrum analyzer for measuring the P ASE level, and also a gain response of the OA can be determined by the way of alternating an driving phase of the optical switches SW1 and SW2. Fig. 10 is a wave form chart showing a fact that the gain and NF levels determined by the NF measurement method (i.e., the novel pulse test method) of the present invention are almost the same as that of the conventional methods (i.e., the electrical test method and the polarization test method). The NF measurement method of the present invention shown in Fig. 9 is different from the conventional one shown in Fig. 7 in the points of: (i) providing the OA under measurement with an optical signal which is modulated by a pulse signal of a short period compared with the life time of carriers or the life time of ions in metastable level of the OA under measurement; and (ii) sampling an output light from the OA under measurement by operating the optical switch so as to synchronize its switching movement with a signal for driving the input modulated light. Consequently, an optical spectrum of the ASE light can be only observed by the optical spectrum analyzer. In other words, this is because that the optical switch only permits the transmission of the output light corresponding to the period of the amplified intensity-modulated light off (i.e., switch-off period). The NF measurement in accordance with the present invention is based on the condition that the amplified spontaneous emission optical power of the output light corresponding to the switch-off period and the ASE optical power (P ASE ) of the output light corresponding to the switch-on period are in the same level. In the case of testing a rare-earth doped optical fiber amplifier (OFA), this condition can be attained by providing the optical amplifier with an optical pulse signal given at a sufficiently short repetition rate compared with the mean life of ions in the metastable level of the OFA under measurement. In the case of testing a semiconductor laser optical amplifier, on the other hand, this condition can be attained by providing the optical amplifier with optical pulse signal given at a sufficiently short repetition rate compared with the mean life of carriers. We are now explaining an ASE optical power (P ASE ) of the optical amplifier (OA) after inputting an intensity-modulation light. In general, a level of the ASE optical power depends on a population inversion of ions in the OA. That is, if an input light is introduced into the OA, the input light is amplified by a stimulated emission and the ions under the population inversion are transited from the metastable level to the ground level. Hence the population inversion can be decreased as to an increase of the strength of light to be introduced into the OA under measurement. That is, a level of the ASE optical power may be varied, depending on whether the OA obtains the input light and whether the input light level is varied. However, if the optical amplifier receives a pulse stream of a constant repetition rate faster than a response time against the light input of the population inversion, the population inversion tends to keep at a constant state because it cannot follow the variation of the input light. A response time against the input light of the population inversion is depended on an amplification medium and is dominated by the life time (τ 2eff ) of ions in the metastable level. In the case of the Er-doped optical fiber amplifier, the life time (τ 2eff ) of ions is in the range of 0.2 to several ten milliseconds. If the Er-doped optical fiber amplifier receives an intensity-modulated light of over several ten kHz, the population inversion cannot follow the variation of input light, resulting that the ASE optical power of the output light corresponding to space period of the amplified intensity-modulated light and the ASE optical power of the output light corresponding to the mark period of the amplified intensity-modulated light are agreed with each other. Fig. 12A shows a variation of the ASE optical power when the small signal light at a high-speed modulation is inputted into the optical amplifier (OA), while Fig. 12B shows a variation of the ASE optical power when the large signal light at a high-speed modulation is inputted into the optical amplifier (OA). In the case of testing the semiconductor optical amplifier, the life time (τ 2eff ) of carriers thereof is in the order of under several nano seconds, so that the intensity- modulated light to be introduced into the OA under measurement should be in the range of over several G (giga) hertz (Hz). Therefore it is preferable that the NF measurement is performed without depending on a level of the input light to be introduced into the OA under measurement. As shown in Figs. 12A and 12B, this kind of condition can be only satisfied by the NF measurement method in accordance with the present invention. In the case of introducing a light of extremely small power into the optical amplifier (OA), only a few ions transit from one state to another by means of an stimulated emission. In this case, the condition of population inversion can be kept at a constant in spite of whether the OA receives the input or not or whether the input is varied or not. Consequently, the ASE optical power of the output light corresponding to the space period of the amplified intensity-modulated light and the ASE optical power of the output light corresponding to the mark period of the amplified intensity-modulated light are agreed with each other. Fig. 12C shows a variation of the P ASE level when the small signal light at a low-speed modulation is inputted into the optical amplifier, while Fig. 12D shows a variation of the ASE optical power when the large signal light at a low-speed modulation is inputted into the optical amplifier. As shown in Fig. 12D, a variation of the P ASE level can be observed when the large signal light at a low-speed modulation is inputted into the optical amplifier. Hereinafter, we will explain concrete examples of the system for measuring noise figures of optical amplifiers, in accordance with the present invention. Fig. 13 is a schematic block diagram of the basic setup for explaining the NF measurement system in accordance with the present invention. The NF measurement system 100 is composed of a source module, an optical sampling module, and an optical spectrum analyzer 5 (or a monitor module). The source module is for providing an input signal 101 into an optical amplifier (Er-doped optical fiber amplifier) (OA) 1 under measurement. In the source module, the input signal 101 is prepared by means of an intensity modulation so as to be modulated as a signal given at a constant repetition rate which is sufficiently shorter than metastable level life time of the OA under measurement. The optical sampling module is responsible for sampling a P AMP level and a P ASE level, independently. The P AMP appears simultaneously with the mark period of switching the optical pulse signal 101, while the P ASE appears simultaneously with the space period of switching the optical pulse signal 101. Further, the optical spectrum analyzer 5 (or the monitor module) is responsible to detect both levels of the signal optical power and the P ASE power. As shown in the figure, the source module comprises an electric-optic converter (hereinafter, referred to as an EO converter) 2 and a modulation signal generator 4. The EO converter 2 is constituted by a semiconductor laser device to be directly modulated by an electric pulse signal (Q) 102 from the modulation signal generator 4. The input signal 101 generated by the EO converter 2 is introduced into an input terminal 1a of the OA under measurement. Alternatively, the EO converter 2 may be composed of: a narrow-band optical source selected from a fixed-wavelength optical source and a wavelength-tunable optical source; and an optical switch, preferably an acousto-optic modulator. The modulation signal generator 4 has two output channels, i.e., a first channel (CH-1) for connecting with the EO converter 2 and a second channel (CH-2) for connecting with an optical switch 3. The optical sampling module comprises the optical switch 3 connected with an output terminal 1b of the OA under measurement. A function of the optical switch 3 is controlled by an electric signal (Q') 103 which is synchronized with the electric pulse signal (Q) 102 generated from the modulation signal generator 4. An output signal 104 from the OA under measurement passes through the optical switch 3 during the period of measuring its power level with a guard timing. Furthermore, the monitor module as shown in a dashed region of Fig. 13 may be used instead of the optical spectrum analyzer 5. For example, the module employs a narrow band wave filter 6 and an optical power meter 7. A NF level of the OA under measurement can be obtained from the following equation (1) by substituting the P ASE level (on a peak power basis). NF = P ASE (peak value) hυGB 0 + 1 G wherein P ASE is the P ASE power level of the optical wavelength outputted from the OA under measurement; Bo is the optical band width of the device for measuring the P ASE level; G is the gain of the OA under measurement, h is the Plank constant; υ is the optical frequency of signal light. For detecting the P AMP power and the P ASE power separately, an optical power detector may be used in the NF measurement system. In this case, the detector is characterized by its transmitted central wavelength which correspond to a central wavelength (λ) of the optical pulse signal to be provided into the OA under measurement and also it characterized by its band width of B o . The gain G response of the OA under measurement can be obtained from the following equation (2) where P Input (on a peak power basis) stands for an optical power level of an intensity-modulated light to be provided into the OA under measurement. G ≅ P AMP (peak value) - P ASE (peak value) P Input (peak value) Alternatively, the Gain G can be obtained from the following equation (3): G= P AMP-E P IN-E where P IN-E stands for the component of an intensity-modulation light obtained by converting an optical pulse signal to be provided into the OA under measurement into an electric stage, and P AMP-E stands for the component of an intensity-modulation light obtained by converting an output light of the OA under measurement. By the way, a typical Er-doped optical fiber amplifier has a characteristic noise figure (NF). The NF value varies according to the input light power level as shown in Fig. 4. In the present invention, it is easy to determine the P ASE level from the ASE optical power. The ASE optical power is a part of the output from the Er-doped optical fiber amplifier and corresponds to space period of the intensity-modulated light of over several 10 kHz for the measurement. In the case of testing a semiconductor optical amplifier, on the other hand, an intensity of the input light may be modulated over a few G (giga) Hz because the mean life of carriers (τ 2eff ) is in the range of under a few nanosecond. Then the characteristics of the optical amplifier under measurement can be obtained by determining each NF value at various optical power levels of the intensity-modulated light. <Example 1> In the following description, one of the preferred embodiment of the NF measurement system in accordance with the present invention will be explained in detail, referring to Figs. 13 and 14. Fig. 14 is a wave form chart for explaining each signal wave form for driving the system shown in Fig. 13. The NF measurement system of the present example is, as shown Fig. 13 as already explained in the above description, composed of: electric-optic converter 2 for providing an input light 101 of a constant wavelength λ to an input terminal 1a of an optical amplifier (OA) 1 under measurement; an optical switch 3 to be connected with an output circuit of the OA under measurement to be controlled by an electric signal (Q') 103 in synchronization with an electric pulse signal (Q) 102; a modulation signal generator 4 for outputting the electric signal (Q') 103 to the optical switch 3; and an optical spectrum analyzer 5 for measuring an output 105 produced from the optical switch 3. In this example, the optical switch 3 consists of a single acousto-optic modulator (AOM). In this example, an Er-doped optical fiber amplifier (OFA) 1 is used for the measurement. This optical amplifier 1 has the mean life (τ2 eff ) in the range of 0.2 to several ten milliseconds. Though a modulation frequency of 10 kHz is enough to perform the measurement, the present example takes the frequency of 1 MHz. The modulation signal generator 4 generates optical pulsed signals Q and Q' with a phase difference of 180 o therebetween. The pulsed signal Q is transmitted to the electro-optic converter 2 by way of a first channel (CH1), while the pulsed signal Q' is transmitted to the optical switch 3 by way of a second channel (CH2). The electro-optical converter 2 generates a rectangular on-off input signal 101 with a repetition rate of 1 MHz by directly modulating an optical source (semiconductor laser) in accordance with the output pulsed signal Q transmitted from the modulation signal generator 4. The modulated input light 101 is propagated into the optical amplifier 1 and amplified thereby. Therefore, an output light 104 generated from the optical amplifier 1 at the time of introducing the input light 101 is a sum of the amplified input light and the ASE optical power. After that, the output light 104 is introduced into the optical switch 3. The optical switch 3 is switched on-off by means of the output (i.e., an optical pulsed signal with a 180 o phase shift against the optical pulsed signal Q) Q' provided from the modulation signal generator 4. That is, the optical switch 3 is activated by receiving the optical pulsed signal Q' and inactivated by the disappearance of the optical pulsed signal Q'. Furthermore, there is a phase difference 180 o between the two signals, so that the optical switch 3 only transmits an output part 105 corresponding to the period of without receiving the optical pulsed signal Q, but not transmits an output part corresponding to the period of receiving the optical pulsed signal Q. Therefore, only the ASE light 105 can be appeared from the optical switch 3. An optical spectrum (ASE light) without the amplified signal light can be observed by introducing the output 105 of the optical switch 3 into the optical analyzer 5. Also, an ASE optical power (P ASE ) level can be determined from the resulting optical spectrum. In stead of using the optical spectrum analyzer 5, furthermore, it is possible to use a step of an narrow band width filter 6 and an optical power meter 7 as indicated by a region surrounded by a broken line in Fig. 13 to determine the P ASE level. Furthermore, the P AMP level can be determined by passing a light part corresponding to the amplified optical pulsed signal through the optical switch 3 by means of changing the driving phase of the optical switch 3. Still furthermore, the gain G can be calculated from the P AMP level and the P ASE level. As the modulation signals Q and Q' are 180° out of phase with each other, there is a possibility that the amplified input light leaks into the output of the optical switch 3 when the modulation signals Q and Q' are not perfectly or at least a part of pulses of one signal overlaps upon that of another as shown in Figs. 15A and 15B. In the case that the period of the optical switch on is longer than the emitting period of the input light, as shown in Fig. 15A, a part of the amplified input light is leaked toward the output terminal. In the case that the period of the optical switch on is longer than the space period of the input light by means of setting a guard-time, as shown in Fig. 15B, the amplified input light is not leaked into the output of the optical switch 3 in spite of occurring a little out of synchronization between the signals Q and Q'. Consequently, it is desirable that an operation duty of the optical switch 3 should be set up at a level of less than 50% for determining the ASE light level, exactly. As explained above, the first preferred embodiment takes note of the metastable level life time the optical amplifier. In the first preferred embodiment, the P ASE level can be determined without any influence of the amplified input light because of the following reason. That is, the optical switch selects a part corresponding to the space period of the input signal from the whole output of the optical amplifier that receives the input light modulated with a frequency extremely shorter than the metastable level life time of the optical amplifier. Consequently, the NF level can be easily determined by the system of the first preferred embodiment in accordance with the present invention. <Example 2> Fig. 16 is a schematic view of a second preferred embodiment of the noise figure measurement system in accordance with the present invention. The NF measurement system 100 of the present example has the same constitution as that of the example 1 except the following matters. The system of the present invention comprises an optical source 22 for emitting a continuous light and an optical switch 21 for converting the continuous light into an optical pulsed signal, which are used as the electro-optical converter 20. As in the same as the optical switch 3, the optical switch 21 to be used in the present example consists of an acousto-optic element, preferably a series of the acousto-optic elements arranged in a line. In the NF measurement system of the present example, the optical switch 3 is driven by a modulation signal (Q') 103 which is a 180° out-of-phase signal compared with the input modulated light. In this case, an amplified light for the measurement corresponding to the space period passes through the optical switch 3, while an amplified light for the measurement corresponding to the mark period does not pass through the optical switch 3. If the optical switch permits the transmission of the amplified light corresponding to the mark period because of an incomplete isolation properties of the optical switch 3, there is a possibility that the amplified input light is leaked into the output of the optical switch 3. In this case, an output light wave form of the optical switch 3 can be observed as shown in Fig. 17A. In the figure, the output light wave form includes a wave form of the amplified input light leaked into the output by means of an incomplete isolation properties of the optical switch 3. Therefore, the P ASE level thus obtained has an error within a certain range. If the optical switch isolation for the measurement is not obtained sufficiently, furthermore, the optical power corresponding to the space period of the optical pulsed signal contains the amplified light power, so that P ASE level thus obtained also has an error within a certain range. Fig. 17B shows a measurement example of spectrum characteristics of the P ASE when the optical switch has a leakage of 51 dB. The signal wavelength has an error of about 0.5 dB because of a leakage of the signal light. If it is possible to use the optical spectrum analyzer, therefore, the accuracy of the NF measurement may be improved by estimating the P ASE level at the signal light wavelength by performing the compensation for the ASE optical power measured by the interpolation technique. A leakage characteristic of the typical acousto-optic element takes a value of approximately 50 dB, so that the optical switch having a leakage characteristic of approximately 100 dB can be obtained by simultaneously operating two elements placed in series. As for the optical switches 3 and 21 shown in Fig. 16, consequently, the NF measurement system comprises two acousto-optic elements in series. <Example 3> Fig. 18 is a schematic block diagram of a third preferred embodiment of the noise figure measurement system in accordance with the present invention. The NF measurement system of the present example has the same constitution as that of the example 1 except the following matters. In the system of the present example, a band-pass filter 8 is placed in front of an input side of the optical switch 3. The band-pass filter 8 transmits a band of wavelength λ' which is different from a band of wavelength λ of the optical pulsed signal. However, the both wavelengths λ and λ' are close to each other. If leakage characteristic of the optical switch 3 is insufficient as explained in the second preferred embodiment, an error can be occurred in the P ASE measurement value. In the present example, the band-pass filter 8 having its central wavelength λ' is placed in front of the input terminal of the optical switch 3 so as to keep a lower leakage of the optical pulsed signal. Thus the NF level can be obtained with a precision within the specified limits. That is, a level of the amplified signal to be introduced into the optical switch 3 can be lowered by placing the band-pass filter 8 in the system because of transmitting a band of wavelength λ' different from the wavelength λ of the optical pulsed signal. Consequently, the optical switch, in spite of one having poor properties of the switching, an output signal corresponding to the mark period of the amplified signal pulse cannot be passed because of the above reason. Though a lose of P ASE level is produced by the band-pass filter 8 of central wavelength λ', an initial calibration make possible to compensate for decreases in the P ASE level because of the loss remains invariant. In accordance with the present example, therefore, it is possible to obtain a NF level with a neglectable error by using the band-pass filter. <Example 4> Fig. 19 is a schematic block diagram of a fourth preferred embodiment of the noise figure measurement system in accordance with the present invention. The NF measurement system of the present example has the same constitution as that of the example 1 except the following matters. In this example, an optical amplifier (OA) 1 under measurement is a semiconductor laser amplifier. In general the semiconductor laser amplifier has an extremely shorter metastable level life time compared with that of the rare earth doped fiber amplifier, so that a repetition rate of the optical pulsed signal should be set at 1 GHz or more. That is, a modulation frequency of the optical pulsed signal should be in the order of a few GHz because the mean life of carriers (τ 2eff ) is of a few nano second or less. Hence the NF measurement system can be embodied by using a LiNbO 3 optical switch as an electro-optic converter 12 and an absorb-type optical modulator as an optical switch 13 because of their actuation band width of a few ten G helz (Hz). In this example, therefore, the NF system of the present example comprises the LiNbO 3 optical modulator (i.e., the electro-optical converter) 12 and the absorb-type optical modulator (i.e., the optical switch) 13, and also a light beam with a modulation frequency of 10 GHz is used as a measurement light. In the electro-optic converter 2, an output light (CW light) of the semiconductor laser being oscillated with a constant optical power is driven by a modulation signal (Q) 102 provided from the modulation signal generator 4. That is, the LiNbO 3 optical modulator externally modulates the CW light by the modulation signal Q from its output channel CH-1 to generate an input light 101 with a modulation frequency of 10 GHz. Furthermore, LiNbO 3 optical modulator externally operates the optical switch 13 by another modulation signal Q' through another output channel CH-2. In accordance with the present example, therefore, it is possible to obtain a NF level with a neglectable error by using the band-pass filter, as is the case with the first preferred embodiment. <Example 5> Fig. 20 is a schematic block diagram of a fifth preferred embodiment of the noise figure measurement system in accordance with the present invention. The NF measurement system of the present example has the same constitution as that of the example 1 except the following matters. In this example, that is, a polarization controller 9 and a polarizer 10 are placed between an output side of the optical switch and the optical spectrum analyzer (or the monitor module). These devices are responsible for separating and detecting two different output powers. That is, a first output power is coincident with a polarized plane of the amplified input optical pulsed signal 101 and appeared in synchronization with an mark period of such signal 101, while a second output power is coincident with the polarized plane of the amplified input optical pulsed signal 101 and appeared in synchronization with an space period of the such signal 101. The optical amplifier under measurement is polarization-dependent, so that the NF level corresponding to the polarized plane of the amplified object light portion of the whole output can be determined. Hereinafter, we are going to explain an operation of the NF measurement system of the present example. The electro-optic converter 2 and the optical switch 3 are driven simultaneously with each other by the outputs Q and Q' of the modulation signal generator 4 respectively, and then an amplified input light and an ASE light are generated as the output 104 from the optical switch 3. The polarization controller 9 receives the ASE light from the optical switch 3 so as to maximally modulate its intensity. It is easy to adjust a setting of the polarization controller 9 for obtaining the maximum intensity of the ASE light. However, the minimum one can be hardly obtained. By adjusting the setting of the polarization controller 9, the output light 106 passing through the polarizer 10 is obtained as a sum of the amplified input light and the ASE light coincident with a polarized plane thereof. Therefore, a gain of the optical amplifier under test can be obtained from the P AMP level corresponding to the emitting period of the intensity-modulated input light indicated by the equation (2) by compensating for each transmission loss of the polarization controller 9 and the polarizer 10. In the case of driving the electro-optical converter 2 by the output Q of the modulated signal generator 4 and also driving the optical switch 3 by the output Q' from the same, the amplified input light can be eliminated from the output 106. In this case, consequently, the output is only composed of the ASE light corresponding to the polarized plane of the amplified light. The P ASE level can be also obtained from the ASE light by compensating each transmission loss of polarization controller 9 and polarizer 10. In this way, it is easy to determine the NF level corresponding to the polarized plane of the amplified input light in the optical amplifier that has a dependence on polarization. In general, furthermore, the rare earth doped optical fiber does not depend on a polarization against an amplification to be caused in the optical fiber because it is made of constitute Accordingly, a polarization-independent optical amplifier can be made up from a combination of: polarization-independent components such as an optical isolator and an optical filter; and a rare-earth doped optical fiber. Currently, there has been considerable work devoted to preparing the Er-doped optical amplifier which is one of the polarization-independent amplifiers. In addition, an optical amplifier having a polarization dependence on an amplification phenomena can be made up by using a polarization-dependent optical fiber, such as a PANDA optical fiber, having a core doped with a rare-earth element. In the case of preparing a semiconductor optical amplifier, most of the prepared elements are polarization dependent because it is difficult to uniform a thickness and a width of an active layer for the optical amplification. In these polarization-dependent optical amplifier, therefore, the gain and the output optical power can be varied by the polarized plane of the input light and also the ASE light can be varied by the output polarized plane. Consequently, it is required to measure the gain and the ASE level corresponding to the polarized plane of the amplified measurement light for measuring a NF value of the polarization-dependent optical amplifier. <Example 6> Fig. 21 shows a schematic block diagram of the setup for calibration of the noise figure measurement system in accordance with the present invention for improving the accuracy of the NF measurement when the optical switch shows poor leakage properties. In this example, the calibration setup is in the same as that of the example 2 except that a passive optical component such as an optical fiber cord without emitting the ASE light is used as a device for connecting between an input terminal and an output terminal of the measurement device to perform an initial calibration of the leakage light. According to the present example, the calibration process includes the steps of adjusting a phase of the optical switch for measuring an output optical power P out (time average value) generated from the passive optical component; and re-adjusting the phase of the optical switch in the same manner as that of the ASE light measurement for measuring a leakage power P leakage (time average value) of the signal light power. These results are incorporated into the following equation to determine the leakage characteristic value Iso. Iso ≅ P leakage (time averaged value) P out (time averaged value) Then the ASE optical power with a calibration of the leakage power (P ASE calibrated ) is calculated by the following equation. P calibrated ASE = P ASE (peak value) - Iso • P AMP (peak value) The resulting P ASE calibrated value is used in stead of the P ASE in the equation (1) to make compensation for an effect of the leakage light for determining a noise figure characteristic of the optical amplifier. It will be obvious to those skilled in that art that the above features are not only adapted in the setup of the example 2 but also adapted in that of the other examples. Accordingly, the described invention provides a novel measurement method and a system therefor for determining a noise figure of an optical amplifier with precision in spite of under a series of automatically measurements on a large scale. The obtained results do not tend to be varied with each observer. Therefore, the noise figure can be used as a criterion of assessment for readily determining whether the optical amplifier is failed or not, and also used as a parameter for examining products and their deterioration with time. According to the present invention, furthermore, all of the optical amplifiers to be installed in an optical communication net work can be readily tested, so that it is possible to design the noise performance of the net work including transmission paths and optical switches. A method and a system for measuring a noise figure of an optical amplifier (1), independently detects two different output powers generated from the optical amplifier (1) under measurement for determining the noise figure. The generation of the first output power is in synchronization with a space period of an input optical pulsed signal, while the generation of the second one is in synchronization with the mark period of the input optical pulsed signal. The optical pulsed signal is an intensity-modulated signal given at a repetition rate of sufficiently shorter than a life time of carriers or a life time of ions in a metastable level of the optical amplifier under measurement.

Claims: A method of measuring a noise figure of an optical amplifier (1, 93) characterized by comprising: an optical pulse generating process of generating an optical pulsed signal (96, 101) with a light-off period by modulating an intensity of an input light so as to be given at a repetition rate shorter than a life time of carriers or a life time of ions in a metastable level of an optical amplifier under measurement; a signal providing process of providing said optical pulsed signal into said optical amplifier under measurement, wherein an optical output power (105) of said optical amplifier under measurement in a space period corresponding to said light-off period includes an amplified spontaneous emission power (P ASE ) only; and a measuring process of measuring said optical output power (105) in said space period and detecting a level of said amplified spontaneous emission power (P ASE ). A method of measuring a noise figure of an optical amplifier as claimed in claim 1, characterized in that a value of said noise figure is obtained by an equation of: NF = P ASE (peakvalue) hνGB 0 + 1 G where NF is said noise figure; P ASE on a peak power basis is said output power of said optical amplifier under measurement in synchronization with said space period of said optical pulsed signal; Bo is an optical band width when a level of said P ASE is measured; G is a gain of said optical amplifier; h is Planck's constant; and ν is an optical frequency of said optical pulsed signal. A method of measuring a noise figure of an optical amplifier as claimed in claim 1 or 2, characterized in that further comprising a calibration process of measuring an output of a passive optical component which does not generate an amplified spontaneous emission (ASE), said calibration process includes steps of: providing said optical pulsed signal into said passive optical component; separating and detecting an output power (P leakage ) through said passive optical component under measurement in synchronization with the space period of said optical pulsed signal, and an output power (P OUT ) through said passive optical component under measurement in synchronization with a mark period of said optical pulsed signal; performing a quantitative determination of a leakage characteristic Iso of the measurement system by an equation of Iso ≅ P leakage (time_averaged value) P out (time_ average_ value) ; and calculating P ASE calibrated using an equation of P calibrated ASE = P ASE (peakvalue) - Iso · P AMP (peakvalue) where P AMP is an output power generated from said optical amplifier under measurement in synchronization with the mark period of said optical pulsed signal. A method of measuring a noise figure of an optical amplifier as claimed in claim 1, characterized in that an optical power detector (5, 7, 95) having an optical band width of B o and a center wavelength corresponding to a wavelength λ of said optical pulsed signal to be provided into said optical amplifier under measurement, is used for performing steps of: separating and detecting said amplified spontaneous emission power (P ASE ) generated from said optical amplifier under measurement in synchronization with the space period of said optical pulsed signal and an output power (P AMP ) generated from said optical amplifier under measurement in synchronization with a mark period of said optical pulsed signal. A method of measuring a noise figure of an optical amplifier as claimed in claim 2, characterized in that said gain G is obtained from an equation of: G ≅ P AMP (peakvalue) - P ASE (peakvalue) P input (peakvalue) where P AMP is an output power generated from said optical amplifier under measurement in synchronization with the mark period of said optical pulsed signal; and P input is an input optical power of said intensity-modulated light into said optical amplifier. A method of measuring a noise figure of an optical amplifier as claimed in claim 2, characterized in that said gain G is obtained from an equation of: G = P AMP-E P IN-E where P IN-E is a component of intensity modulation obtained by converting said optical pulsed signal into an electrical signal; P AMP-E is a component of intensity modulation obtained by converting an output light of said optical amplifier under measurement. A method of measuring a noise figure of an optical amplifier as claimed in claim 1, characterized in that said optical pulsed signal to be provided into said optical amplifier under measurement is generated from a semiconductor laser (2, 91) driven by an electric pulsed signal. A method of measuring a noise figure of an optical amplifier as claimed in claim 1, characterized in that said optical pulsed signal to be provided into said optical amplifier under measurement is obtained by passing an output light generated from a non-modulation optical source (22, 91) through an optical switch (21, 92) driven by an electric pulse signal. A method of measuring a noise figure of an optical amplifier as claimed in claim 4, characterized in that an optical switch (3, 94) is in the type of being driven by an optical pulsed signal (Q') given at a repetition rate in synchronization with that of the optical pulsed signal to be provided into said optical amplifier under measurement, for separating and detecting said amplified spontaneous emission power (P ASE ) generated from said optical amplifier under measurement in synchronization with the space period of said optical pulsed signal and said output power (P AMP ) generated from said optical amplifier under measurement in synchronization with the mark period of said optical pulsed signal. A method of measuring a noise figure of an optical amplifier as claimed in claim 9, characterized in that an acousto-optic switch is used as said optical switch to be driven by an optical pulsed signal given at a repetition rate in synchronization with that of the optical pulsed signal to be provided into said optical amplifier under measurement. A method of measuring a noise figure of an optical amplifier as claimed in claim 10, characterized in that said acousto-optic switch is composed of a plurality of linked acousto-optic elements in a row. A method of measuring a noise figure of an optical amplifier as claimed in claim 9, characterized in that said optical switch to be driven by an optical pulsed signal given at a repetition rate in synchronization with that of the optical pulsed signal to be provided into said optical amplifier under measurement is controlled so as to be driven in a period for the measurement, and said period for the measurement has a guard timing. A method of measuring a noise figure of an optical amplifier as claimed in claim 9, characterized in that said repetition rate in synchronization with that of the optical pulsed signal provided into said optical amplifier is provided so as to pass through an optical filter having a pass-band width different from said center wavelength λ of said optical pulsed signal to be provided into said optical amplifier under measurement. A method of measuring a noise figure of an optical amplifier as claimed claim 9, characterized in that estimating said amplified spontaneous emission power (P ASE ) at a spectrum of said optical pulsed signal is estimated by performing the interpolation for an ASE optical power measured on a periphery of said spectrum of said optical pulsed signal. A method of measuring a noise figure of an optical amplifier as claimed in claim 1, characterized in that said optical amplifier under measurement is an erbium-doped optical fiber amplifier, and said optical pulsed signal with a modulated intensity has a repetition rate of 10 kHz or more. A method of measuring a noise figure of an optical amplifier as claimed in claim 1, characterized in that said optical amplifier under measurement is a semiconductor laser amplifier, and said optical pulsed signal with a modulated intensity has a repetition rate of 1 GHz or more. A method of measuring a noise figure of an optical amplifier as claimed in claim 1, characterized in that an output light of said optical amplifier under measurement includes an amplified optical pulsed signal having a polarized plane thereof, an output power (P AMP ) including an amplified optical pulsed signal and generated from said optical amplifier under measurement in synchronization with a mark period of said optical pulsed signal is coincident with a polarized plane of said amplified pulsed signal, and said P ASE including an amplified optical pulsed signal and generated from said optical amplifier under measurement in synchronization with the space period of said optical pulsed signal is coincident with a polarized plane of said amplified pulsed signal, where these output powers are independently measured. A measurement system for measuring a noise figure of an optical amplifier (1, 93), characterized by comprising: an input terminal (1a) connecting with an input port of said optical amplifier under measurement; an output terminal (1b) connecting with an output port of said optical amplifier under measurement; a supply means (2, 91) for supplying an optical pulsed signal (96, 101) with a light-off period into said input terminal, said optical pulsed signal is an intensity-modulated signal given at a repetition rate of sufficiently shorter than a life time of carrier or a life time of ions in a metastable level of said optical amplifier under measurement, wherein an optical output power (105) of said optical amplifier under measurement in a space period corresponding to said light-off period includes an amplified spontaneous emission power (P ASE ) only; a detection means (5, 6, 7, 95) for separating and detecting; an amplified spontaneous emission power (P ASE ) generated from said output terminal in synchronization with a space period of said optical pulsed signal; and an output power (P AMP ) generated from said output terminal in synchronization with a mark period of said optical pulsed signal on. A measurement system for measuring a noise figure of an optical amplifier as claimed in claim 18, characterized in that said supply means for supplying an optical pulsed signal into said input terminal, comprises an electro-optic converter to be modulated by an electric pulsed signal, and said detector is connected with an output circuit of said optical amplifier under measurement and comprises an optical switch to be controlled by an electrical signal in synchronization with said electric pulsed signal. A measurement system for measuring a noise figure of an optical amplifier as claimed in claim 18, characterized by further comprising a computing device for computing results of the detection by said detecting means. A method of measuring a noise figure of an optical amplifier as claimed in claim 1, characterized in that said amplified spontaneous emission power (P ASE ) is of peak power basis.

Inventors: AIDA KAZUO, SATO YOSHIAKI, AIDA, KAZUO, SATO, YOSHIAKI
Applicants: NIPPON TELEGRAPH & TELEPHONE, NIPPON TELEGRAPH AND TELEPHONE CORPORATION
Application year: 1995
Main classification: H04B10
IPC codes: H04B10, H01S3, G01M11, H01L21