PRETREATMENT SOLUTION FOR ELECTROLESS PLATING, ELECTROLESS PLATING BATH AND ELECTROLESS PLATING METHOD

Abstract: As an electroless plating technique capable of surely promoting the plating reaction without Pd substitution reaction and fastening the plating deposition, there are proposed an electroless plating method of subjecting a primary plated film (or metal film) formed on a substrate to a secondary plating (or electroless plating), characterized in that the secondary plating is carried out after a surface potential of the primary plated film is adjusted so as to be more base than such a most base surface potential that a surface current density of the primary plated film is zero in an electroless plating solution for the secondary plating, and a pretreating solution for electroless plating containing pH adjusting agent, reducing agent and complexing agent and an electroless plating bath suitable for use in this method.

Description: TECHNICAL FIELD This invention relates to the use of a pretreating solution for electroless plating, and more particularly to the use of a pretreating solution for electroless plating effective in the formation of a conductor pattern in the production of a printed circuit board. BACKGROUND ART As a technique for the production of a printed circuit board, there has widely been known the so-called additive process of forming a conductor pattern on a substrate through electroless copper plating treatment. In this process, there is generally adopted a method, in which a catalyst nucleus is applied to an insulating substrate and an electroless plated thin film (primary plating) is directly formed thereon and then an electroless plated thick film (secondary plating) is formed on the plated metal surface, as the electroless plating treatment for the formation of the conductor pattern. In such an electroless plating treatment, the primary plated film first deposits around the catalyst nucleus applied onto the surface of the insulating substrate and the deposition of the secondary plated film proceeds on the metal constituting the primary plated film after the formation of the primary plated film layer. Therefore, different properties are required in the primary plating and the secondary plating. That is, when the plated film is deposited around the catalyst nucleus formed on the surface of the insulating substrate as in the primary plating, it is required that the deposited particles are fine and the thickness of the plated film is uniform. When the plated film is deposited on the metal constituting the primary plated film as a nucleus as in the secondary plating, it is required to fasten the deposition rate from a viewpoint of the productivity. Particularly, the usual electroless plating treatment uses a plating solution containing ethylenediamine tetraacetate (hereinafter abbreviated as EDTA) as a complexing agent and is slow in the deposition rate, so that it is strongly demanded to fasten the deposition rate as the secondary plating. On the other hand, JP-A-1-168871 or JP-A-2-30770 has proposed an electroless playing solution containing triethanol amine (hereinafter abbreviated as TEA) as a complexing agent as a means for fastening the deposition rate. However, the electroless plating solution containing TEA as the complexing agent can be used in the primary plating to be conducted after the application of catalyst nucleus such as Pd or the like without problems, but when such a solution is used in the secondary plating for depositing the metal constituting the primary plated film as a nucleus, the initial plating deposition is very poor and there are problems such as undeposition, reaction stop and the like. In order to solve the problem in the secondary plating, there have hitherto been proposed a method of improving the bath reactivity by increasing a concentration of a reducing agent such as formaldehyde (HCHO) or the like added to the electroless plating solution containing TEA as a complexing agent (not less than 3 ml/l (0.037 mol/l)). In this method, however, the reducing agent strongly reduces copper ions in the plating solution to cause the deposition of unnecessary metallic copper, so that there are troubles such as occurrence of nodule and decomposition of the plating solution. Furthermore, there is a method in which the catalyst nucleus such as Pd or the like is applied onto the plated film formed by the primary plating and subjected to the secondary plating as another means for solving the problem in the secondary plating. In this method, however, the cost undesirably increases, and also it is difficult to apply and fix the Pd catalyst nucleus to the metal film different from the insulating substrate and hence there is a problem being apt to cause abnormal deposition due to drop-off of Pd catalyst nucleus. On the contrary, there have hitherto been proposed the following pretreating solutions for electroless plating: 1 ○ a pretreating solution having a chemical copper plating composition other than copper complexing agent and copper compound (JP-A-63-129692); 2 ○ a pretreating solution for electroless plating consisting of alkali hydroxide, metal complexing agent and alkali metal halogenide (JP-A-2-30768); and 3 ○ a pretreating solution for electroless plating consisting of acid, metal complexing agent and reducing agent (JP-A-2-30769). However, these pretreating solutions are solutions for depositing the plated film onto the insulating surface, but are not solution for depositing the secondary plated film onto the surface of the primary plated film and hence they are not to fasten the initial deposition rate in the secondary plating. As mentioned above, it is difficult to improve the initial deposition of the secondary plating without any troubles in the above conventional technique, so that there is no practical method of fastening the deposition rate of the secondary plating. It is an object of the invention to solve the aforementioned problems of the conventional technique and to provide a technique for electroless plating treatment capable of improving the initial deposition of the secondary plating without any troubles. It is another object of the invention to fasten the plating deposition rate in the secondary plating. DISCLOSURE OF THE INVENTION The inventors have made various studies for realizing the above objects and found that a cause of degrading the initial deposition of the secondary plating is due to the surface potential of the primary plated film. That is, according to the conventional technique, the surface potential of the primary plated film at the time of conducting the secondary plating is more noble than the surface potential depositing the secondary plated film (hybrid potential of plating reaction), so that a surface potential that a surface current density is 0 (metastable state) is existent between the surface potential of the primary plated film and the hybrid potential thereof in the secondary plating solution. Therefore, it has been found that the surface potential of the primary plated film is not shifted to the potential of depositing the secondary plated film and hence the initial deposition of the secondary plated film is degraded. The inventors have made further studies based on the above knowledge and found out that the initial deposition of the secondary plating can be improved by adjusting the surface potential of the primary plated film with a pretreatment and as a result, the invention has been accomplished. That is, the above object is realized by conducting the secondary plating after the surface potential of the primary plated film at the time of conducting the secondary plating is made more negative than hybrid potential by the pretreatment, which is entirely reverse to the conventional technique. And also, it has been found that the similar action and effect are obtained even in the secondary plating solution containing a complexing agent other than TEA. The present invention is directed to the use of an alkaline solution in a pretreating process for electroless plating in order to adjust the surface potential of a primary film plated on a substrate prior to plating a second layer on said primary film, said alkaline solution consisting essentially of a basic compound, a reducing agent and a complexing agent, with the proviso that said alkaline solution is not a plating solution. Preferred embodiments are set forth in the attached claims. The term "primary plating" used herein means a treatment for depositing a plated film on a catalyst nucleus for plating. In general, the plated film is thinner than that of the secondary plating. The term "secondary plating" used herein means a treatment for further depositing a plated film on the primary plated film or after a treatment such as plating or the like is made on the primary plated film. In general, the plated film is thicker than that of the primary plating. Further, the term "basic compound" used herein means an agent for adjusting the pH to an extent that the reducing ability of the reducing agent is not damaged, and includes, for example, a strong alkali such as KOH, NaOH, Ca(OH) 2 , NH 4 OH or the like. Moreover, it is desirable that the secondary plating solution consists essentially of a basic compound, the reducing agent, copper ions and a complexing agent. Among them, the basic compound is the strong alkali such as KOH, NaOH, Ca(OH) 2 , NH 4 OH or the like, and has preferably a concentration of 0.1-0.5 mol/l. When the concentration of the basic compound is less than 0.1 mol/l, the reducing force of the reducing agent lowers, while when it exceeds 0.5 mol/l, the secondary plating bath decomposes to erode the resist for plating (insulating resin). The reducing agent is at least one selected from aldehydes, hypophosphites, hydrogen borates and hydrazine, and has preferably a concentration of 0.02∼0.08 mol/l. When the concentration of the reducing agent is less than 0.02 mol/l, the plating reaction stops, while when it exceeds 0.08 mol/l, the secondary plating bath decomposes. The copper compound is at least one selected from CuSO 4 · 5H 2 O, CuO, CuCl 2 and Cu(NO 3 ) 2 , and has preferably a concentration of 0.01∼0.05 mol/l. When the concentration of the copper ions is less than 0.01 mol/l, the rate of the secondary plating reaction lowers, while when it exceeds 0.05 mol/l, the plating reaction stops. The complexing agent is a trialkanol monoamine and is preferable to have a concentration of 0.02∼0.10 mol/l. When the concentration of the complexing agent is less than 0.02 mol/l, copper is changed into copper oxide or copper hydroxide to cause the bath decomposition, while when it exceeds 0.10 mol/l, the cost undesirably increases. BRIEF DESCRIPTION OF THE DRAWINGS The invention will be described with reference to the accompanying drawings, wherein: Fig. 1 is a graph showing polarization results measured on a substrate subjected to a primary plating in various solutions; Fig. 2 is a flow sheet showing the production of an embodiment of the printed circuit board applied to the invention; Fig. 3 is a flow sheet showing the production of an embodiment of the other printed circuit board applied to the invention; Fig. 4 is a flow sheet showing the production of an embodiment of the decorative board applied to the invention; and Figs. 5(a) and (b) are microphotographs showing conductor patterns of Example and Comparative Example. In these figures, numeral 1 is a substrate, numeral 2 a conductor circuit, numeral 3 an adhesive layer (interlaminar insulating resin layer), numeral 4 an opening for the formation of viahole, numeral 5 a resist for plating, numeral 6 a primary plated layer (electroless plated nickel layer), numeral 7 a pretreating solution, numeral 8 a secondary plated layer (electroless plated copper layer, plated nickel layer), numeral 9 a copper foil (copper), numeral 10 a solder layer, and numeral 11 a resin impregnated paper. BEST MODE FOR CARRYING OUT THE INVENTION The details of attaining the invention by the inventors are explained with reference to Fig. 1 below. Fig. 1 is a graph showing polarization results of the primary plated film measured at 62°C in various solutions. In this graph, an ordinate is a current density (mA/cm 2 ) of a substrate surface or a primary plated layer surface as an underground layer, and an abscissa is a potential thereof (V vs. SCE (Saturated Calomel Electrode); relative potential to saturated calomel standard electrode). In the abscissa, the potential becomes noble toward the positive direction, while the potential becomes base toward the negative direction. A polarization curve C1 shows data in an electroless copper plating solution for a secondary plating containing TEA as a complexing agent, concretely an electroless copper plating solution containing 4 g/l (0.0159 mol/l) of CuSO 4 · 5H 2 O as a deposition metal, 22.5 g/l (0.15 mol/l) of TEA as a complexing agent, 11 g/l (0.275 mol/l) of NaOH as a basic compound, 4 ml/l (0.049 mol/l) of HCHO as a reducing agent and small amounts of stabilizer and the like (hereinafter referred to as TEA bath simply), and a polarization curve C2 shows data in a solution obtained by removing only CuSO 4 · 5H 2 O from the above TEA bath (hereinafter referred to as copper ion free TEA bath, which is a pretreating solution used according to the invention), and a polarization curve C3 shows data in a solution obtained by removing only HCHO from the above TEA bath (hereinafter referred to as reducing agent free TEA bath). In the polarization curve C1, a hybrid potential P1 (potential that current density is 0 mA/cm 2 ) corresponding to reaction potential of electroless copper plating is observed at about -0.78V (-0.65V ∼ -0.85V), while an oxidizing peak of HCHO is observed at -0.78V ∼ -0.58V and a deposition peak of copper is observed at -0.75 ∼ -1.30V. Particularly, the oxidation potential width of HCHO in the TEA solution is narrow as compared with that of EDTA solution, and a reducing reaction peak of dissolved oxygen or the like is appeared at -0.58V ∼ -0.53V. Moreover, in the polarization curve C1, P1 (-0.78V), P4 (-0.58V) and P5 (-0.53V) are measured as a surface potential at a metastable state that the surface current density of the primary plated film is 0. The polarization curve C2 is an oxidation polarization curve of HCHO in the TEA bath, from which it is apparent that the oxidation potential region of HCHO is -0.50V ∼ -1.05V and the reducing reaction through HCHO is caused at this potential region. Moreover, in the curve C2, P2 (-1.05V) is measured as a surface potential at a metastable state that the surface current density of the primary plated film is 0. The polarization curve C3 is a reducing polarization curve of Cu in the TEA bath, in which the reducing reaction peak of copper appears in a potential direction more base than about -0.68V. Moreover, in the curve C3, P3 (-0.45V) is measured as a surface potential at a metastable state that the surface current density of the primary plated film is 0. From the above results of polarization measured, it has been found that the cause on bad initial deposition of the secondary plated film lies in the following point. That is, when the substrate subjected to the primary plating is subjected to the secondary plating with the TEA bath indicating the behavior as the polarization curve C1, the potential of the primary plated film surface is in a direction somewhat noble than the hybrid potential P1 of the plating reaction at a time of charging into the TEA bath (e.g. a potential of about -0.5V ∼ 0V), but is shifted in a base direction after the introduction of the substrate. According to the polarization curve C1 in the TEA bath, however, the surface potentials P4, P5 of another metastable state are existent in a direction more noble than the hybrid potential P1 corresponding to the plating reaction potential, so that it has been confirmed that when the potential of the primary plated film surface is shifted into the base direction, the potential shift is stopped in the vicinity of the surface potentials P4, P5 and hence the plating reaction is not progressed. In the secondary plating in the TEA bath according to the conventional technique, therefore, the shift block of the potential near to the surface potentials P4, P5 is overcome by conducting Pd-substitution treatment prior to the secondary plating. The Pd substitution treatment acts to move the polarization curve C1 toward the positive direction of the ordinate as a while and hence the above two surface potentials P4, P5 are disappeared, whereby the shift block of the potential near to P4, P5 can be overcome to proceed the plating reaction. The inventors have examined the surface potential of the primary plated film in the above various solutions and confirmed that the surface potential P2 of the primary plated film in the copper ion free TEA bath shifts in a direction more base than the hybrid potential P1 of the plating reaction as shown in the polarization curve C2. As a result, the inventors have found out that the secondary plating reaction is progressed without the Pd substitution treatment when the pretreatment with the copper ion free TEA bath is carried out instead of the Pd substitution treatment, and the invention has been accomplished. That is, when the surface of the primary plated film is subjected to the pretreatment with the pretreating solution for electroless plating used according to the invention, the potential of the primary plated film surface being in the direction noble than the hybrid potential of the plating reaction is largely shifted in a direction more base than the hybrid potential (according to Fig. 1, the potential of about -0.5V ∼ 0 V shifts to a potential of about -1.10V ∼ -0.90V). Then, when the substrate provided with the primary plated film is charged into the electroless plating solution for the secondary plating, the potential shifts to the noble direction and finally falls in the hybrid potential of the plating reaction (according to Fig. 1, the potential of about -1.10V ∼ -0.90V shifts to -0.75V ∼ -0.80V). As a result, the secondary plating reaction smoothly proceeds and hence copper plated film is surely deposited on the primary plated film without causing troubles such as undeposition, nodule and the like. Therefore, the Pd substitution treatment, which has hitherto been required, is useless. (1) As an electroless plating treatment technique capable of improving the initial deposition of the secondary plated film without any troubles, the inventors propose an electroless plating method of subjecting a substrate to a primary plating and further a secondary plating, characterized in that the secondary plating is carried out after a surface potential of a primary plated film formed on the substrate through the primary plating is adjusted so as to be more base than such a most base surface potential that a surface current density of the primary plated film is zero in an electroless plating solution for the secondary plating. In general, the surface potential (natural potential) of the primary plated film in the plating solution is noble than the hybrid potential of the electroless plating reaction due to the presence of a surface oxide film. This hybrid potential is such a most base surface potential that the surface current density of the primary plated film on the substrate is 0 in the electroless plating solution for the secondary plating.In the conventional secondary plating, therefore, the substrate subjected to the primary plating is immersed in the electroless plating solution such as EDTA solution or the like to shift the surface potential of the primary plated film on the substrate in a base direction up to the hybrid potential of the plating deposition, whereby the plating deposition is created.However, when the secondary plating solution is an electroless copper plating solution consisting essentially of a basic compound, a reducing agent, copper ions and trialkanol amine, the surface potential of metastable state that the surface current density of the primary plated film is 0 in the secondary plating solution is frequently existent between the hybrid potential of the plating deposition and the surface potential of the primary plated film. For example, as seen from the polarization curve C1 of Fig. 1 showing a relationship between the surface potential and surface current density of the primary plated film in the secondary plating solution, the polarization curve C1 has surface potentials P4, P5 of such a metastable state that the surface current density is 0 in the secondary plating solution. Therefore, the surface potential of the primary plated film is converged into this potential of metastable state, and hence it is not shifted to the hybrid potential of the plating deposition and the deposition of the plating is not caused.Now, the inventors propose a method capable of causing the plating deposition without applying a catalyst such as Pd cr the like by shifting the surface potential from base direction to noble direction, which is different from the conventional technique of shifting from noble direction to base direction, as an electroless plating technique capable of solving the above problem.That is, when the secondary plating is carried out after the surface potential of the primary plated film formed on the substrate is shifted to a direction more base than such a most base surface potential that the surface current density of the primary plated film is 0 in the secondary plating solution or so-called hybrid potential of plated film deposition reaction, the surface potential of the metastable state is not existent in a direction more base than the hybrid potential of plated film deposition reaction, so that the plating deposition reaction is caused without converging the surface potential into the metastable state. (2) In the electroless plating method, the substrate provided with the primary plated film is immersed in the pretreating solution, or the pretreating solution is sprayed onto the substrate in order to make the surface potential of the primary plated film more base than the hybrid potential of the deposition of the secondary plated film. The inventors propose the use of a pretreating solution for electroless plating consisting essentially of a basic compound, a reducing agent and a complexing agent as the pretreating solution for the electroless plating, and propose an electroless plating method of subjecting a substrate to a primary plating and further a secondary plating, characterized in that the secondary plating is carried out after a pretreatment with a pretreating solution for electroless plating consisting essentially of a basic compound, a reducing agent and a complexing agent as the electroless plating method using such a pretreating solution.In general, the surface of the primary plated film forms a thin oxide film based on the reaction with oxygen in air or in the washing with water, so that the surface potential is a surface potential of the metal oxide. In case of Fig. 1, for example, the surface potential of the primary plated film is about -0.5V ∼ 0V when the saturated calomel electrode is used as a standard electrode. That is, the surface potential of the primary plated film is noble than the hybrid potential of the electroless plating reaction owing to the presence of the oxide film.Therefore, the complexing agent is used as a constitutional element of the pretreating solution for eluting the metal ions of the metal oxide into the solution as a metal complex through coordinate bonds under basic plating conditions, whereby a pure metal surface having no oxide film is exposed on the surface of the primary plated film. Particularly, the metal oxide of Ni, Cu or the like does not elute metal ions of the metal oxide only under basic conditions, so that the complexing agent is coexistent.In order to shift the surface potential of the primary plated film exposed into a base direction through its reducing ability, the reducing agent is used as a constitutional element of the pretreating solution. That is, the surface potential of the primary plated film can be shifted into a more base direction by organically acting the reducing agent.In order to maintain the reducing ability of the reducing agent, the pH of the solution is adjusted to a given range (basic condition) by using the basic compound as a constitutional element of the pretreating solution.In the pretreating solution used according to the invention, the basic compound is desirable a hydroxide such as NH 4 OH, metal hydroxide and the like. Particularly, sodium hydroxide (NaOH), lithium hydroxide (LiOH), potassium hydroxide (KOH), calcium hydroxide (Ca(OH) 2 ) and the like are desirable.The content of the basic compound is favorable to be 0.1∼0.4 mol/l. Particularly, NaOH is desirable to be 5∼15 g/l (0.125∼0.375 mol/l)(pH=12). When the content of the basic compound is too low, the reducing force of HCHO lowers, while when it is too high, the insulating resin of the substrate is attacked.As the reducing agent constituting the pretreating solution, there are hypophosphites such as NaH 2 PO 2 , KH 2 PO 2 and the like, hydrogen borates such as NaBH 4 , KBH 4 and the like, and hydrazine in addition to aldehyde. Moreover, HCHO and CH 3 CHO are most favorable for copper.The content of the reducing agent is favorable to be 0.02∼0.25 mol/l. Particularly, HCHO is desirable to be 2∼20 ml/l (0.0247∼0.247 mol/l). When it is less than 2 ml/l (0.0247 mol/l), the reducing force is weak, while when it exceeds 20 ml/l (0.247 mol/l), the decomposition of the secondary plating solution and the degradation of operation environment are caused.When HCHO is used as the reducing agent, it is desirable that NaOH being a strong alkali is used as the basic compound for preventing pH to not more than 9 (preferably maintaining a pH of about 12).That is, it is preferable to adjust the pH to a range of 12∼13. Because, when the pH is less than 12, the reducing force of HCHO lowers, while when the pH exceeds 13, the adhesive for electroless plating and the resist for plating are attacked.In the pretreating solution used according to the invention, the complexing agent is desirable to be at least one selected from carboxylic acid, carboxylate, tertiary amine, dioxime, dithizone, hydroxyquinoline, β-diketone and aminoacetic acid. These complexing agents are easy to form a complex with metal ions, particularly copper ions and is possible to very easily remove the thin film of the metal oxide from the surface of the primary plated film to easily shift the surface potential into a base direction.Moreover, the aminoacetic acid means a compound having an amino group and a carboxyl group, and concretely includes amino acids.As the carboxylic acid and carboxylate, there are desirable polyvalent carboxylic acids, polyvalent carboxylates, hydroxycarboxylic acids and hydroxycarboxylates. Concretely, there are tartaric acid (which is a polyvalent carboxylic acid and at the same time a hydroxycarboxylic acid), phthalic acid, maleic acid, succinic acid, fumaric acid (they are dicarboxylic acids), salicylic acid, malic acid, citric acid (they are hydroxycarboxylic acids), and salts thereof. They are possible to easily remove the metal oxide and stably use the pretreating solution for a long period of time. In addition to these polyvalent carboxylic acids, aromatic carboxylic acids such a benzoic acid and the like and salts thereof may be used.The term "polyvalent carboxylic acid" used herein means a carboxylic acid having plural carboxyl groups, and the term "hydroxycarboxylic acid" means a carboxylic acid having hydroxyl group and carboxyl group and generally indicates "hydroxy acid" and "oxo acid". Further, the term "aromatic carboxylic acid" means a compound having a carboxyl group bonded to an aromatic ring such as benzene ring, naphthalene ring or the like.As the tertiary amine, use may be made of ethylene diamine tetraacetate, trialkanol monoamine, nitorilo triacetate and the like. Such a complexing agent is strong in the complexing force to the metal ions and excellent in the removing force of oxide film from the surface of the primary plated film. Particularly, triethanolamine (TEA), triethanol, triisopanolamine are desirable as the trialkanolamine. These amines are also used as a complexing agent in the secondary plating solution as a high-speed plating, so that the secondary plating reaction is not obstructed even when it is used in the pretreating solution.As the dioxime, mention may be made of dimethyl glyoxime, benzyl diglyoxime, 1,2-cyclohexane diondiglyoxime and the like. Further, the hydroxyquinoline includes oxine, and the β-diketone includes acetylacetone, and the aminoacetic acid includes amino acids such as glycine and the like.The content of the complexing agent is preferable to be 0.005∼0.07 mol/l. Particularly, TEA is desirable to be 1∼10 g/l (0.007∼0.07 mol/l). When it is less than 1 g/l (0.007 mol/l), the ability of removing the oxide film lowers, while when it exceeds 10 g/l (0.07 mol/l), the amount of TEA used becomes larger and the cost is undesirably high. Moreover, tartarate of 5∼30 g/l (0.0224∼0.135 mol/l) may be used instead of TEA: 1∼10 g/l (0.007∼0.07 mol/l).In the pretreating solution used according to the invention, the metal ions to be coordinated with the complexing agent are less, which is entirely different from the electroless plating solution, so that the complexing agent is apt to be reacted with the coexisting reducing agent and particularly bonds with the aldehyde such as formaldehyde. Therefore, a stabilizer is not always required in the pretreating solution used according to the invention, but is desirable to be added for preventing the reaction between the reducing agent and the complexing agent to stabilize the pretreating solution.As the stabilizer, there are an oxidizing agent, an organic acid and a salt thereof. Concretely, it is desirable to use oxygen, ozone, hydrogen peroxide, carboxylic acid such as formic acid and acetic acid and a salt thereof. These stabilizers are relatively weak in the reactivity with the reducing agent and do not badly affect the pretreating solution. Moreover, oxygen or ozone is supplied to the solution by bubbling a gas.The content of the stabilizer is desirable to be 1∼30 ppm as dissolved oxygen or 1∼5 g/l (0.005-0.025 mol/l) as an amount of monocarboxylic acid. When the content is less than the lower limit, the effect as the stabilizer is not obtained, while when it exceeds the upper limit, the ability of the reducing agent is degraded.The pretreating temperature is desirable to be 30°C ∼55°C. As the pretreating temperature becomes higher, the secondary plating reaction is easily started. However, when the pretreating temperature is higher than 60°C, the operation becomes difficult.The pretreating time is desirable to be 1∼10 minutes. When the treating time is less than 1 minute, the sufficient potential shift is not obtained, while when it exceeds 10 minutes, the operation efficiency lowers.As to the pretreating solution used according to the invention, the relationship between the surface potential and the surface current density in the primary plated film is measured to obtain a graph as shown in C2 of Fig. 1. In this figure, P2 is a surface potential at a state of reducing to a metal surface having no oxide film, which is more base than the hybrid potential of the deposition of secondary plated film.Therefore, after the surface potential of the primary plated film is adjusted to the above state by the pretreating solution used according to the invention, when the substrate is charged into the secondary plating solution, the surface potential shifts from base direction to noble direction to cause the plating deposition reaction without converging the surface potential into the metastable state because the surface potential of metastable state is not existent in a direction more base than hybrid potential of the plated film deposition. (3) As an electroless plating device capable of advantageously carrying out the above electroless plating method, the invention proposes an electroless plating device comprising a tank containing the above pretreating solution for electroless plating, and a further tank containing an electroless plating solution consisting essentially of a basic compound, a reducing agent, metal ions and a complexing agent . As previously mentioned, according to the invention, the surface potential of the primary plated film can be shifted to a base direction by immersing in the pretreating solution or spraying the pretreating solution. However, when the primary plated film is washed with water or dried after the above pretreatment, the oxide film is formed on the primary plated film and finally the surface potential of the primary plated film is again shifted to a noble direction and hence the surface potential of the primary plated film becomes noble than the hybrid potential of plating deposition at the time of charging into the secondary plating solution. Therefore, it is necessary that the primary plated film after the pretreatment is covered with the pretreating solution up to the time of charging into the secondary plating solution.That is, it is necessary that the substrate taken out from the tank of the pretreating solution for the adjustment of surface potential is rapidly immersed in the secondary plating solution, so that the electroless plating device comprises a tank containing the pretreating solution consisting essentially of a basic compound, a reducing agent and a complexing agent, and a further tank containing an electroless copper plating solution consisting essentially of a basic compound, a reducing agent, metal ions and a complexing agent .Moreover, each element constituting the secondary plating solution in the electroless plating device has an action similar to that of the usual plating solution. That is, the basic compound constituting the secondary plating solution maintains the plating solution at basic conditions to hold the reducing ability of the reducing agent. Under such conditions, metal forms hydroxide as precipitates, so that the metal complex is formed by the complexing agent to dissolve into the plating solution. Further, the reducing agent constituting the secondary plating solution itself supply electron to create the reducing reaction of metal ions according to the following reaction formula: M +m + me - → M 0 (4) According to the invention, the substrate provided with the primary plated film is immersed in the pretreating solution or sprayed with the pretreating solution, and thereafter immersed in the secondary plating solution without washing and drying as it is. In the electroless plating method using the above electroless plating solution, therefore, the basic compound, the reducing agent and the complexing agent in the pretreating solution are incorporated into the secondary plating solution. For this end, it is desirable that at least one of the basic compound, the reducing agent and the complexing agent is the same between the pretreating solution and the electroless plating solution in order to prevent the composition change of the plating solution and the decomposition or sub-reaction of the plating solution. (5) The aforementioned pretreating solution for electroless plating, electroless plating bath and electroless plating method are most suitable when the electroless copper plating solution consisting essentially of a basic compound, a reducing agent, copper ions and trialkanol monoamine is used as the secondary plating solution. For example, the electroless plating using TEA as a complexing agent can realize a high-speed plating of about 30 times as compared with the electroless plating using EDTA as a complexing agent (see JP-A-1-168871). However, according to the inventors' tests, it is necessary to control the concentration of the reducing agent to about ± 0.5 ml /l (0.006 mol/l) and it is required to conduct the control of impurity because the presence of impurities in the plating solution lowers the reducing force to cause undeposition, so that it can not be said that they are practical from a viewpoint of the cost. The control limitation of the reducing agent and the decrease of the reducing force due to the presence of the impurity result from the metastable state of the primary plated film having a potential noble than the hybrid potential.According to the invention, the problem of undeposition is solved by controlling only the upper limit of the reducing agent and also the control of the impurity is not required, so that the high speed of plating deposition can surely be attained. (6) When the electroless copper plating solution consisting essentially of a basic compound, a reducing agent, copper ions and TEA is used as the secondary plating solution, the polarization curve C1 of the graph shown in Fig. 1 is a relationship between the surface potential and surface current density in the primary plated film. As seen from the polarization curve C1, when the electroless copper plating solution is used a the secondary plating solution, it is necessary that the surface potential of the primary plated film is made further base than -0.8V to the saturated calomel standard electrode by the pretreatment. Further, it is desirable that the surface potential of the primary plated film is noble than -1.2V to the saturated calomel standard electrode . That is, the surface potential of the primary plated film is desirable to be -1.2V ∼ -0.8V to the saturated calomel standard electrode. Because, it is very difficult to make the surface potential more base than -1.2V by chemical reducing method using formaldehyde or the like, and also when the surface potential is made base than -1.2V, it is equal to an electrolysis potential of water to bring about the occurrence of hydrogen and the solution composition is undesirably changed.By such an adjustment of surface potential, the surface potential of the primary plated film can be made base than the hybrid potential of the deposition reaction of the secondary plated film to solve problems such as undeposition and the like.The aforementioned pretreating solution for electroless plating, electroless plating bath and electroless plating method can be applied to various plating techniques but also are particularly advantageous to be applied to the production method of printed circuit boards.The production of the printed circuit board will be described below.The production of the printed circuit board using the invention lies in a method of producing a printed circuit board by forming an adhesive layer for electroless plating on a substrate, applying a catalyst nucleus thereto, subjecting to a primary plating and subjecting to a secondary plating to form a conductor layer, characterized in that a primary plated film is treated with a pretreating solution for electroless plating consisting essentially of a basic compound, a reducing agent and a complexing agent to shift a surface potential of the primary plated film in a direction base than a hybrid potential of plating reaction and then the secondary plating is conducted . This method will be described in detail below. A. An adhesive layer is formed on a surface of a substrate such as glass epoxy substrate, polyimide substrate, ceramic substrate, metal substrate or the like according to usual manner, and then the surface of the adhesive layer is roughened with an acid or an oxidizing agent according to usual manner, and thereafter a catalyst is applied and fixed onto the roughened surface of the adhesive layer. The adhesive is desirable to be formed by dispersing heat-resistant resin powder into the aforementioned resin matrix.As the heat-resistant resin powder, use may be made of various shapes such as particles, hollow particles, ground pieces and the like. In case of particles, it is desirable to select from 1 ○ particles having an average particle size of not more than 10 µm, 2 ○ aggregated particles having an average particle size of 2∼10 µm by aggregating heat-resistant resin powder having an average particle size of not more than 2 µm, 3 ○ a mixture of heat-resistant resin powder having an average particle size of 2∼10 µm and heat-resistant resin powder having an average particle size of not more than 2 µm and 4 ○ false particles formed by adhering at least one of heat-resistant resin powder having an average particle size of not more than 2 µm and inorganic powder having an average particle size of not more than 2 µm to surfaces of heat-resistant resin powder having an average particle size of 2∼10 µm. When the average particle size of the resin particle exceeds 10 µm, anchor becomes deeper and hence so-called fine pattern of not more than 100 µm can not be formed. On the other hand, the resin particles of 2 ○∼4 ○can form complicated anchors to improve the peel strength. B. The adhesive layer is exposed to light, developed and subjected to an UV curing and thereafter subjected to a heat treatment to form a resist for plating printed into a given pattern. When a resist for circuit board is used by applying a composition obtained by dispersing heat-resistant powder in a heat-resistant photosensitive resin matrix onto a base film, the heat treatment is carried out after the exposure, development and UV curing to form the resist for plating printed into a given pattern. C. If necessary, after the catalyst is activated by an acid treatment or the like, the primary electroless plating is carried out to form a primary plated thin film of a necessary conductor pattern. D. The substrate provided with the primary plated film is immersed in the aforementioned pretreating solution for electroless plating consisting essentially of a basic compound, a reducing agent and a complexing agent to shift the surface potential of the primary plated film in a direction base than hybrid potential of plating reaction. E. The substrate subjected to the treatment of the above item D is immersed in the secondary plating solution without drying and washing to form a secondary plated thick film. F. In case of the multilayer printed circuit board, the steps A-E are repeated for the multilayer formation. G. A solder resist layer is formed by applying an uncured resin composition of liquid solder resist to the thus obtained circuit board, or by laminating an uncured solder resist film thereon. Then, the solder resist layer is exposed to light, developed and thermoset to form an opening in a part of a metal pad. H. After the metal plated film is filled, the solder body is formed. Moreover, the formation of the solder body is carried out by reflowing a solder paste through screen printing, or by plating the solder and then reflowing it. Another production of the printed circuit board using the invention lies in a method of producing a printed circuit board by subjecting a metal film formed on a substrate to an electroless plating to form a conductor layer, characterized in that the electroless plating is carried out after a pretreatment with a pretreating solution for electroless plating consisting essentially of a basic compound, a reducing agent and a complexing agent . The metal film formed on the substrate may be a conductor pattern or a solid pattern. In case of the solid pattern, the resist for plating is formed and the electroless plating is carried out, and thereafter the resist for plating and the metal film formed thereon are subjected to an etching. The invention will be described in details with reference to the following examples. At first, the invention is explained according to Fig. 2 with respect to an example concretely attaining the electroless copper plating method in the formation of conductor pattern for the printed circuit board. (Example 1) In this example, the electroless plating is concretely carried out according to the following orders. (1) A photosensitive dry film (made by DuPont) is laminated onto a copper-lined glass epoxy laminated plate (made by Toshiba Chemical Co., Ltd.), which is exposed to an ultraviolet ray through a mask film drawn with a given conductor circuit pattern to bake this pattern image on the film. Then, the film is developed with 1,1,1-trichloroethane and copper existent in an unconductor portion is removed by an etching solution of copper chloride, and thereafter the dry film is peeled off with methylene chloride. Thus, there is prepared a circuit board having a first conductor circuit layer 2 comprised of plural conductor patterns on the substrate 1 (see Fig. 2(a)). (2) 70 parts by weight of 25% acrylated product of cresol novolac type epoxy resin (made by Nippon Kayaku Co., Ltd. molecular weight: 2500) dissolved in diethylene glycol dimethyl ether (DMDG) is mixed with 30 parts by weight of polyether sulphone (PES), 4 parts by weight of an imidazole type curing agent (made by Shikoku Kasei Co. Ltd., trade name: 2E4MZ-CN), 10 parts by weight of caprolactone-modified tris(akroxyethyl) isocyanurate (made by Toa Gosei Co. Ltd., trade name: Aronix M325) as a photosensitive monomer, 5 parts by weight of benzophenone (made by Kanto Kagaku Co. Ltd.) as a photoinitiator and 0.5 part by weight of Michelar ketone (made by Kanto Kagaku Co. Ltd.) as a photosensitizer, to which is added 40 parts by weight in total of 20 parts by weight of epxoy resin particles having an average particle size of 5 µm and 20 parts by weight of epoxy resin particles having an average particle size of 0.5 µm. The resulting mixture is added with a proper amount of NMP and stirred in a homodisper stirrer to adjust a viscosity to 2000 mPa·s (cps), which is further kneaded through three rolls to obtain a photosensitive adhesive solution. (3) The photosensitive adhesive solution is applied onto the circuit board of the item (1) through roll coater, which is left to stand at a horizontal state for 20 minutes and dried at 60°C (see Figs. 2(b)(c)). (4) A photomask film printed with black circles of 100 um is closed onto the circuit board subjected to the treatment of the item (3) and exposed to a super-high pressure mercury lamp at 500 mj/cm 2 . This board is developed by spraying DMDG solution to form opening 4 as viaholes of 100 µm on the circuit board. Further, the circuit board is exposed to a super-high pressure mercury lamp at about 3000 mj/cm 2 and heated at 100°C for 1 hour and further at 150°C for 5 hours to form an interlaminar resin adhesive layer 3 of 50 µm in thickness having openings 4 corresponding to the photomask film with an excellent size precision. (5) The circuit board subjected to the treatment of the item (4) is immersed in potassium permanganate (KMnO 4 , 60 g/l (0.38 mol/l)) adjusted to pH= 13 at 70°C for 15 minutes to roughen the surface of the interlaminar insulating resin layer 3, whereby a roughened surface having fine anchors is formed on the surface of the adhesive layer 3. Then, the circuit board is immersed in a neutral solution (made by Shipley) and washed with water (see Fig. 2(d)). (6) The substrate having the roughened surface of the adhesive layer 3 is treated with a treating solution including PdCl 2 · 2H 2 O: 0.2 g/l (0.001 mol/l), SnCl 2 · 2H 2 O: 15 g/l (0.067 mol/l) and HCl: 30 g/l (0.83 mol/l) to apply a catalyst nucleus onto the adhesive layer 3.The treating time is 2 minutes and the treating temperature is 35°C. (7) A photosensitive resist is applied onto the adhesive layer 3 of the circuit board subjected to the treatment of the item (6) at a thickness of 60 µm, which is prebaked, exposed to light and developed to form a resist for plating 5 on the adhesive layer 3. (8) The circuit board subjected to the treatment of the item (7) is immersed in a 10% solution of H 2 SO 4 to activate the catalyst nucleus and thereafter a primary plating is carried out to non-resist forming portions through an electroless nickel plating (see Fig. 2(e)). In this primary plating, an electroless nickel plated layer 6 having a thickness of about 2 µm is formed by using an electroless nickel plating solution having a composition of NiSO 4 · 6H 2 O: 30 g/l (0.113 mol/l), NaPH 2 O 2 · H 2 O: 15 g/l (0.14 mol/l) and NaH 2 C 6 H 5 O 7 : 60 g/l (0.28 mol/l) at a treating temperature of 60°C for a treating time of 60 minutes. Moreover, the plating precipitation rate is 2 µm/hr. (9) The circuit board subjected to the primary plating of the item (8) is washed with water and immersed in a copper ion free TEA bath (see column BEST MODE FOR CARRYING OUT THE INVENTION) as a pretreating solution 7 of the following composition under the following treating conditions, whereby the pretreatment on the surface of the primary plated film 6 is previously conducted (see Fig. 2(f)). [Composition of pretreating solution and treating conditions] Reducing agent (HCHO) 10 ml/l (0.123 mol/l) TEA as a complexing agent 10 g/l (0.067 mol/l) basic compound (NaOH) 10 g/l (0.25 mol/l) (pH=12) Treating temperature 47°C Treating time 6 minutes Moreover, the composition usable as the pretreating solution 7 and proper ranges of the treating conditions are as follows: [Composition of pretreating solution and proper range of treating condition] Reducing agent (e.g. HCHO) 2∼20 ml/l (0.025∼0.25 mol/l) TEA as a complexing agent 1∼10 g/l (0.0067∼0.067 mol/l) basic compound (e.g. NaOH) 5∼15 g/l (0.125 ∼0.375 mol/l) (pH=12) Treating temperature 30∼55°C Treating time 1∼10 minutes (10) After the treatment of the item (9), the circuit board taken out from the pretreating solution 7 is rapidly charged into an electroless copper plating solution for secondary plating without washing with water to conduct the secondary plating. In this secondary plating, an electroless copper plated layer 8 having a thickness of 21 pm is formed by using an electroless copper plating solution having a composition of HCHO: 3.5 ml/l (0.043 mol/l), NaOH: 5 g/l (0.125 mol/l), TEA: 8 g/l (0.054 mol/l), CuSO 4 · 5H 2 0: 4.5 g/l (0.0179 mol/l) and stabilizer: small at a treating temperature of 70°C for a treating time of 3 hours (see Fig. 2(g)). Moreover, the deposition rate is 7 µm/hr. When the thus obtained electroless copper plated layer is visually observed, there is found no undeposition, nodule and the like. Furthermore, there is caused no decomposition of the electroless copper plating solution for the secondary plating. (Example 2) An electroless copper plated layer is formed in the same manner as in Example 1 except that tartrate is used instead of TEA as a complexing agent. (1) The steps of formation of adhesive layer, roughening treatment, application of catalyst nucleus, formation of resist for plating and activation treatment are carried out according to the same procedure as in Example 1. (2) The non-resist forming portion of the circuit board after the activation treatment of the item (1) is subjected to a primary plating through an electroless copper-nickel-phosphorus alloy plating. In this primary plating, an electroless copper-nickel-phosphorus alloy plated layer having a thickness of about 2 µm is formed by using an electroless copper-nickel-phosphorus alloy plating solution having a composition of NiSO 4 · 6H 2 O: 20 g/l (0.075 mol/l), CuSO 4 · 5H 2 O: 3 g/l (0.0119 mol/l), NaPH 2 O 2 · H 2 O: 15 g/l (0.142 mol/l) and NaH 2 C 6 H 5 O 7 : 70 g/l (0.327 mol/l) at a treating temperature of 55°C for a treating time of 60 minutes. Moreover, the deposition rate is 2 µm/hr. (3) The circuit board subjected to the primary plating of the item (2) is washed with water and immersed in a pretreating solution containing a tartrate as a complexing agent, a basic compound and a reducing agent according to the following composition (hereinafter referred to as tartaric bath) under the following treating conditions, whereby the pretreatment on the surface of the primary plated film is previously conducted. [Composition of pretreating solution and treating conditions] Reducing agent (HCHO) 15 ml/l (0.185 mol/l) Tartrate as a complexing agent 20 g/l (0.090 mol/l) (K 2 C 4 H 4 O 6 ·H 2 O) basic compound (NaOH) 20 g/l (0.5 mol/l) (pH=12) Treating temperature 50°C Treating time 10 minutes Moreover, the composition usable as the pretreating solution 7 and proper ranges of the treating conditions are as follows: [Composition of pretreating solution and proper range of treating condition] Reducing agent (e.g. HCHO) 2∼20 ml/l (0.025∼0.25 mol/l) Tartrate as a complexing agent 5∼30 g/l (0.022∼0.135 mol/l) basic compound (e.g. NaOH) 5∼15 g/l (0.125∼0.375 mol/l) (pH=12) Treating temperature 30∼55°C Treating time 1∼10 minutes (4) After the treatment of the item (3), the circuit board taken out from the pretreating solution is rapidly charged into an electroless copper plating solution for secondary plating without washing with water to conduct the secondary plating. In this secondary plating, an electroless copper plated layer having a thickness of 20 µm is formed by using an electroless copper plating solution having a composition of HCHO: 12 ml/l (0.148 mol/l), NaOH: 20 g/l (0.50 mol/l), K 2 C 4 H 4 O 6 ·2H 2 O: 80 g/l (0.359 mol/l), CuSO 4 ·5H 2 O: 8 g/l (0.032 mol/l) and stabilizer: small at a treating temperature of 40°C for a treating time of 5 hours. Moreover, the deposition rate is 4 µm/hr. When the thus obtained electroless copper plated layer is visually observed, there is found no undeposition, nodule and the like. Furthermore, there is caused no decomposition of the electroless copper plating solution for the secondary plating. (Example 3) An electroless copper plated layer is formed in the same manner as in Example 1 except that sodium ethylenediamine tetraacetate (EDTA) is used instead of TEA as a complexing agent. (1) The steps of formation of adhesive layer, roughening treatment, application of catalyst nucleus, formation of resist for plating and activation treatment are carried out according to the same procedure as in Example 1. (2) The non-resist forming portion of the circuit board after the activation treatment of the item (1) is subjected to a primary plating through an electroless copper-nickel alloy plating. In this primary plating, an electroless copper-nickel alloy plated layer having a thickness of about 2 µm is formed by using an electroless copper-nickel alloy plating solution having a composition of NiSO 4 · 6H 2 O: 20 g/l (0.076 mol/l), CuSO 4 · 5H 2 O: 3 g/l (0.0119 mol/l), NaPH 2 O 2 · H 2 O: 15 g/l (0.142 mol/l) and NaH 2 C 6 H 5 O 7 : 70 g/l (0.327 mol/l) at a treating temperature of 55°C for a treating time of 60 minutes. Moreover, the deposition rate is 2 µm/hr. (3) The circuit board subjected to the primary plating of the item (2) is washed with water and immersed in a pretreating solution containing EDTA as a complexing agent, a basic compound and a reducing agent according to the following composition (hereinafter referred to as EDTA bath) under the following treating conditions with stirring in air, whereby the pretreatment on the surface of the primary plated film is previously conducted. [Composition of pretreating solution and treating conditions] Reducing agent (HCHO) 10 ml/l (0.123 mol/l) EDTA as a complexing agent 10 g/l (0.067 mol/l) basic compound (NaOH) 5 g/l (0.12 mol/l) (pH=12.5) Treating temperature 50°C Treating time 10 minutes (4) After the treatment of the item (3), the circuit board taken out from the pretreating solution is rapidly charged into an electroless copper plating solution for secondary plating without washing with water to conduct the secondary plating. In this secondary plating, an electroless copper plated layer having a thickness of 21 µm is formed by using an electroless copper plating solution having a composition of HCHO: 3.5 ml/l (0.043 mol/l), NaOH: 5 g/l (0.12 mol/l), TEA: 8 g/l (0.054 mol/l), CuSO 4 · 5H 2 O: 4.5 g/l (0.018 mol/l) and stabilizer: small at a treating temperature of 70°C for a treating time of 3 hours. Moreover, the deposition rate is 7 µm/hr. When the thus obtained electroless copper plated layer is visually observed, there is found no unprecipitation, nodule and the like. Furthermore, there is caused no decomposition of the electroless copper plating solution for the secondary plating. Moreover, the stirring in air is carried out at the pretreatment step, so that the treating solution can be used over a long time without color change. (Example 4) An electroless copper plated layer is formed in the same manner as in Example 1 except that a pretreating solution containing a stabilizer is used. (1) The steps of formation of adhesive layer, roughening treatment, application of catalyst nucleus, formation of resist for plating, activation treatment and electroless nickel plating as a primary plating are carried out according to the same procedure as in Example 1. (2) The circuit board subjected to the primary plating of the item (1) is washed with water and immersed in a pretreating solution containing H 2 O 2 as a stabilizer according to the following composition under the following treating conditions, whereby the pretreatment on the surface of the primary plated film is previously conducted. [Composition of pretreating solution and treating conditions] Reducing agent (HCHO) 20 ml/l (0.25 mol/l) TEA as a complexing agent 8 g/l (0.054 mol/l) basic compound (NaOH) 12 g/l (0.30 mol/l) (pH=12.5) Stabilizer (H 2 O 2 ) 2 ml/l (0.03 mol/l) Treating temperature 55°C Treating time 5 minutes (3) After the treatment of the item (2), the circuit board taken out from the pretreating solution is rapidly charged into an electroless copper plating solution for secondary plating without washing with water to conduct the secondary plating. In this secondary plating, an electroless copper plated layer having a thickness of 18 µm is formed by using an electroless copper plating solution having a composition of HCHO: 1.5 ml/l (0.0185 mol/l), NaOH: 8 g/l (0.20 mol/l), TEA: 8 g/l (0.054 mol/l), CUSO 4 · 5H 2 O: 4 g/l (0.016 mol/l) and stabilizer: small at a treating temperature of 65°C for a treating time of 3 hours. Moreover, the deposition rate is 6 µm/hr. When the thus obtained electroless copper plated layer is visually observed, there is found no undeposition, nodule and the like. Furthermore, H 2 O 2 is included in the pretreating solution as a stabilizer, so that the treating solution can be used over a long time without color change. (Example 5) An electroless copper plated layer is formed in the same manner as in Example 1 except that aminoacetic acid is used instead of TEA as a complexing agent. (1) The steps of formation of adhesive layer, roughening treatment, application of catalyst nucleus, formation of resist for plating, activation treatment and electroless nickel plating as a primary plating are carried out according to the same procedure as in Example 1. (2) The circuit board subjected to the primary plating of the item (1) is washed with water and immersed in a pretreating solution containing aminoacetic acid as a complexing agent according to the following composition under the following treating conditions, whereby the pretreatment on the surface of the primary plated film is previously conducted. [Composition of pretreating solution and treating conditions] Reducing agent (HCHO) 15 ml/l (0.185 mol/l) Aminoacetic acid as a complexing agent 5 g/l (0.033 mol/l) basic compound (NaOH) 14 g/l (0.35 mol/l) Stabilizer small Treating temperature 45°C Treating time 3 minutes (3) After the treatment of the item (2), the circuit board taken out from the pretreating solution is rapidly charged into an electroless copper plating solution for secondary plating without washing with water to conduct the secondary plating. In this secondary plating, an electroless copper plated layer having a thickness of 16 µm is formed by using an electroless copper plating solution having a composition of HCHO: 4 ml/l (0.049 mol/l), NaOH: 10 g/l (0.25 mol/l), TEA: 5 g/l (0.033 mol/l), CuSO 4 · 5H 2 0 : 4 g/l (0.016 mol/l) and stabilizer: small at a treating temperature of 60°C for a treating time of 3 hours. Moreover, the deposition rate is 6 µm/hr. When the thus obtained electroless copper plated layer is visually observed, there is found no undeposition, nodule and the like. (Example 6) An electroless copper plated layer is formed in the same manner as in Example 1 except that benzoic acid is used instead of TEA as a complexing agent. (1) The steps of formation of adhesive layer, roughening treatment, application of catalyst nucleus, formation of resist for plating, activation treatment and electroless nickel plating as a primary plating are carried out according to the same procedure as in Example 1. (2) The circuit board subjected to the primary plating of the item (1) is washed with water and immersed in a pretreating solution containing benzoic acid as a complexing agent according to the following composition under the following treating conditions, whereby the pretreatment on the surface of the primary plated film is previously conducted. [Composition of pretreating solution and treating conditions] Reducing agent (HCHO) 15 ml/l (0.185 mol/l) Benzoic acid as a complexing agent 10 g/l (0.067 mol/l) basic compound (NaOH) 14 g/l (0.35 mol/l) Stabilizer small Treating temperature 50°C Treating time 3 minutes (3) After the treatment of the item (2), the circuit board taken out from the pretreating solution is rapidly charged into an electroless copper plating solution for secondary plating without washing with water to conduct the secondary plating. In this secondary plating, an electroless copper plated layer having a thickness of 16 µm is formed by using an electroless copper plating solution having a composition of HCHO: 4 ml/l (0.049 mol/l), NaOH: 10 g/l (0.25 mol/l), CuSO 4 · 5H 2 0: 4 g/l (0.016 mol/l) and stabilizer: small at a treating temperature of 60°C for a treating time of 3 hours. Moreover, the deposition rate is 6 µm/hr. When the thus obtained electroless copper plated layer is visually observed, there is found no undeposition, nodule and the like. (Example 7) An electroless copper plated layer is formed in the same manner as in Example 1 except that sodium dihydrogen citrate is used instead of TEA as a complexing agent. (1) The steps of formation of adhesive layer, roughening treatment, application of catalyst nucleus, formation of resist for plating, activation treatment and electroless nickel plating as a primary plating are carried out according to the same procedure as in Example 1. (2) The circuit board subjected to the primary plating of the item (1) is washed with water and immersed in a pretreating solution containing sodium dihydrogen citrate as a complexing agent according to the following composition under the following treating conditions, whereby the pretreatment on the surface of the primary plated film is previously conducted. [Composition of pretreating solution and treating conditions] Reducing agent (HCHO) 10 ml/l (0.123 mol/l) Sodium dihydrogen citrate (NaH 2 C 6 H 5 SO 7 ) as a complexing agent 10 g/l (0.047 mol/l) basic compound (NaOH) .... 11 g/l (0.275 mol/l) Stabilizer small Treating temperature 50°C Treating time 3 minutes (3) After the treatment of the item (2), the circuit board taken out from the pretreating solution is rapidly charged into an electroless copper plating solution for secondary plating without washing with water to conduct the secondary plating. In this secondary plating, an electroless copper plated layer having a thickness of 16 pm is formed by using an electroless copper plating solution having a composition of HCHO: 4 m/l (0.049 mol/l) NaOH: 10 g/l (0.25 mol/l), TEA: 5 g/l (0.335 mol/l), CuSO 4 · 5H 2 0: 4 g/l (0.016 mol/l) and stabilizer: small at a treating temperature of 60°C for a treating time of 3 hours. Moreover, the deposition rate is 6 µm/hr. When the thus obtained electroless copper plated layer is visually observed, there is found no unprecipitation, nodule and the like. (Example 8) An electroless copper plated layer is formed in the same manner as in Example 1 except that dioxime, dithizone, hydroquinoline, β-diketone and nitrilotriacetic acid are used instead of TEA as a complexing agent. Moreover, glyoxime is used as the dioxime, and 8-hydroxyquinoline (oxine) is used as the hydroquinoline, and acetylacetone is used as β-diketone. (1) The steps of formation of adhesive layer, roughening treatment, application of catalyst nucleus, formation of resist for plating, activation treatment and electroless nickel plating as a primary plating are carried out according to the same procedure as in Example 1. (2) The circuit board subjected to the primary plating of the item (1) is washed with water and immersed in a pretreating solution containing the above complexing agents according to the following composition under the following treating conditions, whereby the pretreatment on the surface of the primary plated film is previously conducted. Moreover, the complexing agents other than nitorilotriacetic acid used in this example are hardly soluble in water, so that they are dissolved in an alcohol such as methanol, ethanol and the like or a polar organic solvent such as acetonitrile or the like and then dissolved in an alkali solution dissolving the reducing agent to prepare the pretreating solution of the following composition. [Composition of pretreating solution and treating conditions] Reducing agent (sodium boron hydride) 5 g/l (0.15 mol/l) Complexing agents 5∼10 g/l glyoxime 0.056 mol/l dithizone 0.039 mol/l oxine 0.069 mol/l nitorilotriacetic acid 0.052 mol/l acetylacetone (use of these complexing agents alone) 0.050 mol/l basic compound (NaOH) 14 g/l (0.35 mol/l) Stabilizer small methanol, ethanol or acetonitrile 1 ml/l Treating temperature 45°C Treating time 3 minutes (3) After the treatment of the item (2), the circuit board taken out from the pretreating solution is rapidly charged into an electroless copper plating solution for secondary plating without washing with water to conduct the secondary plating. In this secondary plating, an electroless copper plated layer having a thickness of 16 pm is formed by using an electroless copper plating solution having a composition of HCHO: 4 ml/l (0.049 mol/l), NaOH: 10 g/l (0.25 mol/l), TEA: 5 g/l (0.034 mol/l), CuSO 4 · 5H 2 0: 4 g/l (0.016 mol/l) and stabilizer: small at a treating temperature of 60°C for a treating time of 3 hours. Moreover, the deposition rate is 6 µm/hr. When the thus obtained electroless copper plated layer is visually observed, there is found no undeposition, nodule and the like. (Comparative Example) In this comparative example, the electroless copper plated layer is formed in the same manner as in Example 1 except that the catalyst nucleus is applied without conducting the pretreatment for the surface of the primary plated film. (1) The steps of formation of adhesive layer, roughening treatment, application of catalyst nucleus, formation of resist for plating and activation treatment are carried out according to the same procedure as in Example 1. (2) The non-resist forming portion of the circuit board after the activation treatment of the item (1) is subjected to a primary plating through an electroless copper-nickel alloy plating. In this primary plating, an electroless copper-nickel alloy plated layer having a thickness of about 2 µm is formed by using an electroless copper-nickel alloy plating solution having a composition of NiSO 4 · 6H 2 O: 20 g/l (0.075 mol/l), CuSO 4 · 5H 2 O: 3 g/l (0.012 mol/l), NaPH 2 O 2 · H 2 O: 15 g/l (0.142 mol/l) and NaH 2 C 6 H 5 O 7 : 70 g/l (0.327 mol/l) at a treating temperature of 55°C for a treating time or 60 minutes. Moreover, the plating deposition rate is 2 µm/hr. (3) The circuit board subjected to the primary plating of the item (2) is immersed in an aqueous solution of hydrochloric acid having a Pd concentration of 50 ppm for 5 minutes to apply a Pd catalyst, washed with water and charged into an electroless copper plating solution for a secondary plating to conduct the secondary plating, but the plated film is not deposited. The secondary plating is carried out by using an electroless copper plating solution having a composition of HCHO: 2.0 ml/l (0.025 mol/l), NaOH: 5 g/l (0.12 mol/l), TEA: 8 g/l (0.054 mol/l), CuSO 4 · 5H 2 O: 4.5 g/l (0.0179 mol/l) and stabilizer: small at a treating temperature of 70°C for a treating time of 3 hours. Now, the secondary plating is carried out by changing the electroless copper plating solution to a composition of HCHO: 3.5 ml/l (0.043 mol/l), NaOH: 5 g/l (0.12 mol/l), TEA: 8 g/l (0.054 mol/l), CuSO 4 · 5H 2 O: 4.5 g/l (0.0179 mol/l) and stabilizer: small at a treating temperature of 70°C for a treating time of 3 hours. As a result, the electroless copper plated layer having a thickness of 21µm is formed. When the thus obtained electroless copper plated layer is visually observed, however, there is found nodule in the resist portion for the plating (see Fig. 5). The electroless copper plating method for the formation of another conductor pattern in the printed circuit board will be concretely described according to Fig. 3. (Example 9) (1) A copper-lined glassepoxy laminate (copper: 18 µm, see Fig. 3(a)) is subjected to a black reducing treatment to roughen the surface of the copper foil 9. Then, a photosensitive dry film is laminated thereon and exposed to an ultraviolet ray through a mask film pictured with a desirable conductor circuit pattern to bake an image thereon. Then, it is developed with 1,1,1-trichloroethane (see Fig. 3(b)). (2) The substrate subjected to the treatment of the item (1) is immersed in a copper ion free TEA bath as a pretreating solution of the following composition under the following conditions to previously conduct the pretreatment for the surface of the copper foil 9. [Composition of pretreating solution and treating conditions] Reducing agent (HCHO) 10 ml/l (0.123 mol/l) TEA as a complexing agent 10 g/l (0.67 mol/l) basic compound (NaOH) 10 g/l (0.25 mol/l) (pH=12) Treating temperature 47°C Treating time 6 minutes (3) After the treatment of the item (2), the circuit board taken out from the pretreating solution is rapidly charged into an electroless copper plating solution without washing with water to conduct the plating (see Fig. 3(c)). In this electroless copper plating, an electroless copper plated layer having a thickness of 17 µm is formed by using an electroless copper plating solution having a composition of HCHO: 3.5 ml/l (0.043 mol/l), NaOH: 5 g/l (0.12 mol/l), TEA: 8 g/l (0.054 mol/l), CuSO 4 · 5H 2 0: 4.5 g/l (0.0179 mol/l) and stabilizer: small at a treating temperature of 70°C for a treating time of 3 hours. Moreover, the deposition rate is 7 µm/hr. When the thus obtained electroless copper plated layer is visually observed, there is found no undeposition, nodule and the like. Furthermore, the decomposition of the electroless copper plating solution is not caused. (4) The surface of the electroless copper plated layer formed in the item (3) is subjected to a solder plating (see Fig. 3(d)), and then a resist 5 for plating is removed (see Fig. 3(e)), and further the copper foil 9 at the portion of the resist 5 is removed by using an etching solution (copper diamine chloride, copper chloride) (see Fig. 3(f)), and a solder layer 10 formed by the solder plating is peeled off (see Fig. 3(g)), whereby a conductor layer having a thickness of 35 µm is formed. The production of a decorative plate will be concretely described according to Fig. 4. (Example 10) (1) A craft paper having a basis weight of 112 g/m 2 and containing 35% of titanium oxide (white) is impregnated with a melamine resin, which is dried to obtain a resin impregnated paper 11. In this case, the impregnation ratio (impregnation ratio = resin amount / weight of whole resin impregnated paper) is 200%. (2) Five resin impregnated papers 11 obtained in the item (1) and a copper foil 9 of 10 µm are laminated and hot pressed at 150°C under 80 kg/cm 2 for 60 minutes to produce a melamine resin substrate having the copper foil 9 at its surface (see Figs. 4(a)(b)). (3) The copper lined melamine resin substrate is immersed in a pretreating solution of the following composition under the following conditions to previously conduct the pretreatment for the surface of the copper foil 9. [Composition of pretreating solution and treating conditions] Reducing agent (HCHO) 10 ml/l (0.123 mol/l) Sodium dihydrogen citrate as a complexing agent 70 g/l (0.327 mol/l) basic compound (NaOH) 0.25 mol/l (pH=12) Treating temperature 47°C Treating time 6 minutes (4) After the pretreatment of the item (3), the substrate taken out from the pretreating solution is rapidly charged into an electroless nickel plating solution of the following composition without washing and drying to conduct the electroless plating. [Composition of plating solution and treating conditions] Reducing agent (sodium phosphinate) 0.2 mol/l Nickel sulfate as a metal salt (6 crystal water) 0.05mol/l Sodium dihydrogen citrate as a complexing agent 70 mmol/l Plating temperature 60°C pH 10 Treating time 10 hours Thus, a nickel plated layer 8 of a metallic gloss is deposited on the copper lined melamine resin substrate without applying a catalyst, in which the thickness of the plated layer 8 is 20 µm (see Fig. 4(c)). (5) A melamine resin is impregnated into a craft paper having a basis weight of 112 g/m 2 and having an ash content of 0.1% by weight and dried to obtain a resin impregnated paper 11. In this case, the impregnation ratio (impregnation ratio = resin amount / weight of whole resin impregnated paper) is 200%. (6) The resin impregnated paper 11 obtained in the item (5) is laminated onto the nickel plated substrate obtained in the items (1)∼(4), and an embossed stainless sheet is disposed on the surface thereof, which is hot pressed at 150°C under 80 kg/cm 2 for 60 minutes to produce a metallic melamine decorative plate having undulaitons at its surface (see Figs. 4(d)(e)). The thus produced decorative plate has a transparent resin layer being very small in the ash content as an outermost layer and this resin layer is subjected to embossing finish, so that a light reflected on the nickel plated layer is deflected and scattered on the surface to develop a bright effect just like a lens and hence a decorative plate having a high grade and an excellent design can be provided. As mentioned above, the plating reaction can surely be promoted without causing troubles such as undeposition, nodule and the like according to the electroless plating method of the invention carrying out the aforementioned pretreatment. Furthermore, it is possible to surely deposit the electroless copper plated layer on the underground layer (primary plated film, metal film) without conducting the Pd substitution treatment required in the conventional technique. As a result, there are solved various problems resulted from the Pd substitution treatment (high cost, abnormal plating deposition, premature degradation of bath, difficulty of controlling Pd concentration and the like). In the electroless plating method according to the invention, the electroless copper plated layer can be obtained at a shorter time by using TEA bath or tartaric bath having a relatively fast plating precipitation rate as compared with the conventional EDTA bath. In addition, the aforementioned pretreatment can be carried out for a short time of about 1∼10 minutes by merely immersing the substrate into the pretreating solution. Therefore, the method of the invention is excellent in the cost and operability. And also, the secondary plating solution and the pretreating solution in Examples 1, 2 and 4 are the same in the kind of the complexing agent in the solution and are very similar in the solution composition except that copper ions are present or absent as a deposition metal ion (the ratio of the component in both solutions is somewhat different). Therefore, even if the pretreating solution adhered to the surface of the circuit board is introduced into the electroless copper plating solution for the secondary plating, the composition of the electroless copper plating solution is not largely changed. That is, the degradation of the electroless copper plating solution for the secondary plating resulted from the introduction of the pretreating solution can surely be prevented according to the method of the invention. In the above examples, it is possible to take the other modifications as follows: 1 ○ In Example 2, the complexing agent in the pretreating solution and the electroless copper plating solution for the secondary plating may be changed into sodium tartrate. 2 ○ In Examples 1 and 2, after the pretreatment is carried out with the pretreating solution containing TEA as a complexing agent, the secondary plating may be carried out with the electroless copper plating solution containing a tartrate as a complexing agent. Alternatively, after the pretreatment is carried out with the pretreating solution containing a tartrate as a complexing agent, the secondary plating may be carried out with the electroless copper plating solution containing TEA as a complexing agent. That is, the complexing agent in the pretreating solution is not necessarily the same as the complexing agent in the electroless copper plating solution for the secondary plating. 3 ○ As the pretreatment, for example, the spraying method may be adopted in addition to the immersion method described in the examples. 4 ○ Even if a somewhat amount of copper ions is included in the pretreating solution (i.e. slight amount as compared with the usual electroless copper plating solution), there is caused no trouble in the pretreatment. 5 ○ The primary plated layer as an underground layer may be formed, for example, by electroless copper plating solution, electroless cobalt plating solution or the like in addition to the electroless nickel plating solution and electroless copper-nickel plating solution described in the above examples. 6 ○ Although the above examples are described with respect to the electroless copper plating method for the formation of conductor pattern in the printed circuit board and the application to metal-like melamine decorative plate, the invention is not limited to these applications and are applicable to electroless plating for automobile parts, building materials and the like. INDUSTRIAL APPLICABILITY As mentioned above, according to the invention, the plating reaction can surely be promoted without the Pd substitution treatment and is possible to fasten the rate of plating precipitation.

Claims: Use of an alkaline solution in a pretreating process for electroless plating in order to adjust the surface potential of a primary film plated on a substrate prior to plating a second layer on said primary film, said alkaline solution consisting essentially of a basic compound, a reducing agent and a complexing agent, with the proviso that said alkaline solution is not a plating solution. The use of claim 1, wherein the reducing agent is at least one selected from aldehydes, hypophosphites, hydrogen borates and hydrazine. The use of claim 1, wherein the complexing agent is at least one selected from carboxylic acid, carboxylate, tertiary amine, dioxime, dithizone, hydroxyquinoline, β-diketone and aminoacetic acid. The use of claim 1, wherein the complexing agent is at least one selected from polyvalent carboxylic acid, polyvalent carboxylate, aromatic carboxylic acid, aromatic carboxylate, hydroxcarboxylic acid, hydroxycarboxylate, trialkanol monoamine, ethylene diamine tetraacetate, dimethylglyoxime, benzyldiglyoxime, 1,2-cyclohexanedion diglyoxime, oxine, acetylacetone, glycine and nitrilotriacetate. The use of claim 1, wherein the complexing agent is at least one selected from tartaric acid, tartrate and triethanol amine. The use of claim 1, wherein an electroless copper plating solution consisting essentially of a basic compound, a reducing agent, copper ions and trialkanol amine is used as the secondary plating solution. The use of claim 1, wherein said pretreating solution is provided in a first tank, and a second tank of an electroless plating solution consisting essentially of a basic compound, a reducing agent, a metal ion and a complexing agent is provided seperately. The use of claim 7, wherein the pretreating solution for electroless plating is a pretreating solution as defined in any one of claims 2 to 5. The use of claim 7, wherein the pretreating solution and the electroless plating solution are the same in at least one of the basic compound, reducing agent and complexing agent constituting these solutions. The use of claim 7, wherein the electroless plating solution consists essentially of a basic compound, a reducing agent, copper ion and trialkanol amine. The use of claim 1, wherein the surface potential of said primary film is adjusted to be more negative than hybrid potential. The use of claim 6, wherein the surface potential of said primary film is adjusted so as to be more negative than -0.8 V of a saturated calomel electrode as a standard electrode.

Inventors: ASAI MOTOO, YUAN BENZHEN, ASAI, MOTOO, YUAN, BENZHEN
Applicants: IBIDEN CO LTD, IBIDEN CO., LTD.
Application year: 1995
Main classification: C23C18
IPC codes: H05K3, C23C18