MECHANICAL SHUTTER FOR PROTECTING AN X-RAY DETECTOR AGAINST HIGH-ENERGY ELECTRON OR X-RAY DAMAGE

Abstract: In an x-ray analysis apparatus a pass-through shutter mechanism enables the semiconductor crystal of an energy dispersive x-ray detector to extend beyond the shutter mechanism for analysis, adjacent to the sample, achieving optimum solid angle collection efficiency. The shutter mechanism provides optimum protection of the semiconductor detector crystal from high energy x-ray or secondary electron events produced in the chambers of electron microscopes, microprobes, x-ray spectrometers, etc.

Description: Mechanical shutter for protecting an x-ray detector against high-energy electron or x-ray damage. BACKGROUND OF THE INVENTION Field of the Invention The invention is in the field of x-ray detector systems as used in x-ray producing instrumentation such as electron microscopes, microprobes, x-ray spectrometers, etc. In particular, the invention relates to a device for improving the solid angle of x-ray collection while still providing uncompromised protection for the x-ray detector crystal under conditions of damaging radiation. Related Art In a system which utilizes an energy dispersive x-ray detector system, such as an electron microscope, a sample is bombarded with an electron beam of up to several hundred thousand electron volts. X-rays and secondary electrons fluoresced by the sample fall incident on the x-ray detector crystal placed in close proximity to the sample. Ideally, the detector needs to be as close as geometrically possible to the sample to obtain the best solid angle of x-ray collection. However, the x-ray detector needs to be protected when excessively high x-ray or secondary electrons are being produced. This occurs, when, for instance, a Transmission Electron Microscope is operating in low magnification mode or when the probe beam is allowed to fall incident on an object which produces high energy x- ray fluorescence. Under these conditions, very high signal currents pass through the detector crystal which causes the electronics in the system to reset at high frequency. This condition may result in detector crystal or electronic component damage. In the past, when the current in the detector was high, a shutter was placed between the detector crystal and the sample. An example of the prior art appears in British patent GB 2192091A. This prior art has the disadvantage of requiring some distance between the sample and the x-ray detector for the shutter mechanism. Having the detector fixed behind a shutter, which opens or closes, significantly compromises the solid angle of x- ray collection during analysis. In US Patent No. 4,450,355, a thin shutter mechanism was controlled by the same magnetic field that controlled the magnification lens. In high magnification, the high magnetic field opens the shutter allowing the detector to measure x-rays from the sample. In low magnification, the shutter remains closed preventing most of the high energy secondary electrons from entering from the detector. This prior art had the disadvantage that there was not sufficient protection of the detector in practice. In particular, when the magnetic field was at some intermediate levels, the shutter stayed open and electrons got to the detector. Also the relatively thin shutter, a fraction of a millimeter of brass, did not adequately stop the very high energy x-rays. Moreover, in order to allow for space for the shutter mechanism in both of the above patents, the detector had to be positioned at too great a distance from the sample to permit optimal detection. SUMMARY OF THE INVENTION The object of the invention is to improve protection of the detector under harmful conditions and reduce the distance between the detector and the sample during analysis. This object is achieved by pushing the detector past the shutter, adjacent to the specimen, for analysis, and retracting the detector behind the shutter, and closing the shutter, in response to a signal indicating damage to the crystal. BRIEF DESCRIPTION OF THE DRAWING The invention will now be described by way of non-limitative example with reference to the following drawings. Fig. 1 shows the invention with the detector head in an analyze position. Fig. 2 shows the invention with the detector head in a retracted position. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Fig. 1 shows the detector head 102 in position for detection. The specimen 103 to be analyzed is located in the microscope chamber of a an electron microscope 104. The specimen 103, upon being bombarded with electrons, emits x-rays which are detected by the detector 105. As shown, during analysis, the detector head 102 is immediately adjacent to the sample 103. Well known circuitry 106 receives electrical signals from the detector 105 and analyzes these signals. A shutter housing 107 and shutter body 108 are also shown in the figure. Fig. 2 shows the shutter in a closed position. When the detector is not in operation, the detector head 102 is retracted and the shutter is in the closed position. To begin analysis, a slide mechanism moves the detector head forward. In the preferred embodiment, the distance between the closed position and the analyze position 102 is 63.5 mm. As the detector head moves, surface A comes into contact with surface B of the shutter trigger 201. This contact results in the shutter trigger 201 moving forward and opening the shutter door via link C. When electrons hit the detector, they cause high current in the detector. The detector head is retracted in response to this high current. A similar high current could be caused by a large number of x-rays coming off the specimen but this similar condition also causes retraction, since analysis of such signals is very difficult and such signals may in some cases also damage the detector crystal. Alternatively, the signals produced by the detector could be analyzed in more detail, for instance using software, to distinguish a characteristic pattern for electrons hitting the detector crystal. The detector could then be retracted in response to that characteristic pattern alone, rather than merely in response to the high current. The shutter door 108 is hinged at the bottom and is closed by extension spring 203, when the detector head passes on retraction. The shutter door is aluminum with a tungsten layer attached. The tungsten layer should be about 1 millimeter thick and should cover the entire opening in front of the detector. Alternatively, instead of tungsten another x- ray absorbing material may be used. The aluminum part of the shutter is intended to stop the high energy electrons, while the tungsten reduces the number of high energy x-rays that can reach the detector crystal.

Claims: CLAIMS: 1. An x-ray analysis apparatus comprising an x-ray detector unit provided with a detector head mechanism for use in the x-ray detector unit comprising: a detector crystal; shutter means for protecting the detector crystal; slide means for pushing the detector crystal through the shutter adjacent to a specimen for analysis of the specimen and for retracting the crystal behind the shutter in response to a signal from the detector crystal indicating possible harm to the crystal; and means, cooperating with the slide means, for closing the shutter means when the detector is retracted and opening the shutter means when the detector crystal is pushed through the shutter means for analysis. 2. The apparatus of claim 1 wherein the shutter comprises an x-ray absorbing material. 3. The apparatus of claim 2 is an aluminum door with a tungsten insert. 4. The apparatus of claim 1 wherein the means for closing the shutter means comprises a spring. 5. The apparatus of claim 1 wherein the means for opening the shutter means comprises a shutter trigger actuated by contact with a body containing the detector. 6. An x-ray detector unit as defined in any of the preceding claims. 7. A detector head mechanism as defined in any of the claims 1-5.

Inventors: BLIONAS COSTAS, GALLAGHER BRIAN WILLIAM, NICOLOSI JOSEPH ANTHONY, QUINN DUNCAN RICHARD, BLIONAS, COSTAS, GALLAGHER, BRIAN, WILLIAM, NICOLOSI, JOSEPH, ANTHONY, QUINN, DUNCAN, RICHARD
Applicants: PHILIPS ELECTRONICS NV, PHILIPS NORDEN AB, PHILIPS ELECTRONICS N.V.
Application year: 1995
Main classification: H01J37
IPC codes: H01J31, H01J37