Method for eliminating process antenna effect

Abstract: A multi-level conductive interconnection for an integrated circuit is formed in a silicon substrate, wherein there are large contact pad areas at the periphery of the interconnection. A patterned layer of a conductive polysilicon is formed on the substrate to act as a first conductive contact to the integrated circuit. An insulating layer is formed over the polysilicon layer, and openings to the polysilicon layer are formed through the insulating layer. A first layer of metal is formed on the insulator such that the metal electrically connects to the polysilicon through the openings. The large contact pad areas are formed with the first layer of metal. The first metal is patterned to form an electrical break in the first metal interconnection, between the large contact pad areas and the integrated circuit. This break prevents electrical damage to the integrated circuit due to charge build-up during subsequent processing in a plasma environment. A second insulating layer is formed and patterned to provide openings for vias to the first metal layer. A second layer of metal is formed over the large contact pad area and over the electrical break such that the second metal electrically connects to the first metal, via direct contact to the first metal at the large contact pad area, and through the openings in the second insulator to the first metal interconnection. Finally, a passivation layer is formed over the second metal layer.

Description: The present invention relates to the manufacture of highly dense integrated circuits, and more particularly to the elimination of electrostatic charge build-up at the device during manufacture during, for example, plasma etching or the like process steps. In the manufacture of highly dense integrated circuits using Metal Oxide Semiconductor (MOS) technology with multiple metal layers, electrical charge may build up at the device gate oxide during plasma processing. The charge accumulates on floating polysilicon and metal layers electrically connected to the gate oxide. Interconnection metal lines act as an "antenna", amplifying the charging effect and leading to trapped charges at the gate oxide. These trapped charges can cause yield loss and reliability failures. Workers in the field have verified this problem experimentally. It has been found that the double metal layer technologies worsen the effect by the ratio of the antenna area to the gate oxide area. The worst degradation of gate oxide occurs during oxynitride deposition. However other plasma processing is also believed to lead to trapped charges at the gate oxide. Referring now to Figs. 1A and 1B, there are shown schematic diagrams of a prior process for connecting a large contact pad with an active MOS device by using a metal layer, which could lead to device damage due to the antenna effect. As can be seen in Fig. 1A, in the manufacture of MOS semiconductor devices, a large contact pad area 10 (of typical size 100 by 100 micrometers, and more than about 30 by 30 micrometers) is electrically connected by vias 12 to a polysilicon interconnection 14. The pad area 10 in a double metal process would consist of two layers 24 and 26 of metal, as shown in Fig. 1B. The upper metal layer or metal II, 26 is connected through an insulating layer 28 to the lower metal layer, or metal I, 24 by a large via 25 which generally has a size less than 5 micrometers smaller than the large contact pad area 10. The polysilicon interconnection 14 is connected by vias 16 in an insulating layer to metal interconnection 18. This metal interconnection 18 is connected by vias 17 to polysilicon 20 and thence to active devices 22. There is a direct electrical connection between all elements, and charge accumulated during plasma processing on the polysilicon and large metal areas can lead to damage to the devices due to trapped charges. More specifically, charge will be induced and accumulated on the exposed lower metal layer 24 through the large via 25 in the pre-sputter etching step before the upper metal layer 26 is sputtered. The induced charge can lead to damage to the devices 22 via the direct electrical connection path comprising the lower metal layer 24, the polysilicon interconnection 14, the metal interconnection 18 and the polysilicon 20. In addition, the greater the size of the large via 25, the greater the amount of the charge induced and accumulated. It is common in the manufacture of integrated circuits today to use plasma etching, plasma enhanced chemical vapor deposition, and sputtering technologies. See VLSI Technology, S. M. Sze., Chapter 5 - Reactive Plasma Etching pages 184-189, Chapter 6 - Dielectric and Polysilicon Film Deposition pages 235-238, Chapter 9 - Metallization pages 386-391, published by McGraw-Hill International Editions 1988 in Singapore. A plasma is a collection of charged particles, including electrons and positive and negative ions, and it is these charged particles that collect along the conductive surfaces during plasma processing, and may produce the trapped charges damaging the gate oxide. It is a primary object of the present invention to provide a method for eliminating the antenna effect of accumulated electrical charge on floating polysilicon and metal interconnections connected to the gate oxide, without additional process steps. This is accomplished by isolating the polysilicon and metal interconnections from the gate oxide during plasma processing. EP 0 490 506 describes a semiconductor device having an interconnection structure comprising an insulating layer and a metal interconnection layer wherein a part of the metal interconnection layer is formed as a bonding pad portion. The bonding pad portion is disposed in a hall formed in the insulating layer and a part of the metal interconnection layer is spaced from the bonding pad portion and covers the side of the hall. GB-A-2 174 543 describes a package containing a semiconductor or integrated circuit chip having enlarged electrodes for soldering to bent electrically conductive leads so as to improve the reliability of the electrical connection. In Symp. VLSI Tech May 89, p73-74, Shone et al describe techniques for eliminating gate oxide charging. These techniques include subjecting the wafers to longer alloy cycles, depositing a thin dielectric layer on the wafers before oxynitride deposition, and attaching a substrate diode to the antenna. There is no suggestion to reduce gate oxide charging by isolating the interconnections from the gate oxide during processing. Moreover there is no disclosure of contact pads at the device periphery. In accordance with the present invention there is provided a method of subjecting an MOS integrated circuit, having large first metal regions on its surfaces which are electrically connected to the device structures, to a plasma process, said method comprising the following sequence of steps : (a) forming an electrical discontinuity in the connection between the large first metal regions and the device structures thereby electrically isolating the large first metal regions from the device structures; (b) placing the integrated circuit in a chamber for accomplishing the plasma process; (c) subjecting the integrated circuit to a plasma process wherein the discontinuity between the large first metal regions and the device structures prevents damage to the device structures; (d) removing the integrated circuit from the chamber; and (e) electrically re-connecting the large first metal regions to the device structures by means of another metal layer. In a particularly preferred embodiment the method is used in a method of forming a multi-level conductive interconnection for an integrated circuit in a silicon substrate wherein the large first metal regions are in the form of large contact pad areas at the periphery of the interconnection. This forming method comprises: forming a patterned layer of a conductive polysilicon on the silicon substrate to act as a first conductive contact to the integrated circuit; forming an insulating layer over the polysilicon layer; forming openings to the polysilicon layer through the insulating layer; forming a layer of metal on the insulating layer such that the metal layer electrically connects to the polysilicon through the openings; forming the large contact pad areas with the said metal layer; patterning the metal layer to form the electrical discontinuity therein which electrically isolates the large contact pad areas and the integrated circuit to prevent charge build-up during subsequent processing; further processing in a plasma environment that would normally produce electrical charge build-up at the gate oxide of the integrated circuit, but wherein the electrical discontinuity prevents the charge build-up; forming and patterning another insulating layer to form openings for vias to the metal layer; forming another layer of metal over the large contact pad areas and over the electrical discontinuity such that said another metal layer electrically connects to the first metal layer, via direct contact to said metal layer at the large contact pad areas and through the openings in said another insulating layer to the first metal interconnection, thereby electrically re-connecting the large contact pad areas and the integrated circuit; and forming a passivation layer over said another metal layer. In accordance with one aspect of the present invention, the processing in the plasma environment is plasma enhanced chemical vapor deposition, plasma etching, or sputter etch. The size of the large contact pad areas is preferably greater than about 30 x 30 micrometers, and preferably the large contact pad areas are located at the periphery of the integrated circuit. In accordance with another embodiment of the present invention, the method further comprises the steps of patterning said another metal layer at the electrical discontinuity to form a second electrical discontinuity; further processing in a plasma environment that would normally produce an electrical charge build-up at the gate oxide of the integrated circuit, but wherein the second electrical discontinuity prevents the charge build-up; forming and patterning a further insulating layer to form openings for vias to said another metal layer; forming a further layer of metal over the large contact pad areas and over the second electrical discontinuity such that the further metal layer electrically connects to said another metal layer, via direct contact to said another metal layer at the large contact pad areas and through the openings in said further insulating layer thereby electrically re-connecting the large contact pad areas and the integrated circuit; and forming the passivation layer over said further metal layer. Additional metal layers may be added in a similar way. For a better understanding of the invention and to show how the same may be carried into effect, reference will now be made, by way of example to the accompanying drawings in which:- Figs. 1A and 1B illustrate a prior process for connecting a large contact pad with an active MOS device by using a metal layer which could lead to device damage due to the antenna effect, Figs. 2A through 2C illustrate the process of the present invention for eliminating the antenna effect in a double metal structure by using an electrical discontinuity in the first metal layer, and Fig. 3 illustrates a further embodiment of the present invention for a triple metal structure. Referring now to Fig. 2A, there is shown the preferred embodiment of the present invention. After a first metal, metal I, has been deposited in areas 10 and 18, an electrical discontinuity 30 is patterned in the metal I interconnection. Any charge accumulated during subsequent plasma processing steps on the pad side of the electrical discontinuity 30, particularly on the large pad area 10, will not affect the devices 22. Referring now to Fig. 2B, a second metal layer, metal II, has been added to areas 10 and 30 and to form connection 40 through vias 58 to close the electrical discontinuity 30. This is done by a small mask change in the via and metal II mask used for lithography, etching, and patterning of the via and metal II layer. The second metal layer connection 40 is connected through an insulating layer and vias 58 to re-establish the electrical connection between the large pad area 10 and devices 22, after plasma processing has been completed. Referring now to Fig. 2C, there is shown a cross-sectional representation of the electrical discontinuity and re-connection. Field oxide (FOX) 52 was thermally grown on substrate 50, and polysilicon 14 was deposited and patterned on the field oxide 52. Vias 16 were opened through insulating layer 54, typically by wet or dry etching, and a first metal layer 18 was deposited such that it connected through vias 16 to polysilicon 14. Electrical discontinuity 30 was then patterned by conventional lithography and etching in the first metal layer 18 to break the electrical connection between the pad area 10 and devices 22. Subsequent plasma processing steps were then effected without accumulating charge and causing the antenna effect. Vias 58 were patterned through insulating layer 56, and a second metal layer 40 was deposited to re-connect the first metal layer 18 and re-establish the electrical connection from the pad area 10 to devices 22. Finally. a passivation layer 60 was deposited on the second layer metal 40. Referring now to Fig. 3, there is shown a cross-sectional representation of an electrical break in two levels of metal for a three-level metal technology. Field oxide 52 was thermally grown on substrate 50, and polysilicon 14 was patterned by conventional lithography and etching on the field oxide 52. Vias 16 were patterned by lithography and etching through insulating layer 54, and first metal layer 18 was deposited and patterned by conventional lithography and etching such that it connected through vias 16 to polysilicon 14. Electrical discontinuity 30 was patterned in the first metal layer 18 to break the connection between the pad area 10 and devices 22. Subsequent plasma processing steps were then effected without accumulating charge and causing the antenna effect. Vias 58 were patterned through insulating layer 56, and a second metal layer 40 was deposited to re-connect the first metal layer 18. Electrical discontinuity 100 was further patterned by lithography and etching in the second metal layer 40 to maintain isolation between the pad area 10 and devices 22. Further plasma processing steps were then effected without accumulating charge and causing the antenna effect. Vias 102 were patterned by lithography and etching through insulating layer 104, and a third metal layer 106 was deposited and patterned to re-connect the second metal layer 40 and re-establish the electrical connection from the pad area 10 to devices 22. Finally, a passivation layer 108 was deposited on the third metal layer 106.

Claims: A method of subjecting an MOS integrated circuit, having large first metal regions (10) on its surfaces which are electrically connected to the device structures (22), to a plasma process, said method comprising the following sequence of steps : (a) forming an electrical discontinuity (30) (100) in the connection (18) (40) between the large first metal regions and the device structures thereby electrically isolating the large first metal regions from the device structures; (b) placing the integrated circuit in a chamber for accomplishing the plasma process; (c) subjecting the integrated circuit to a plasma process wherein the discontinuity between the large first metal regions and the device structures prevents damage to the device structures; (d) removing the integrated circuit from the chamber; and (e) electrically re-connecting the large first metal regions to the device structures by means of another metal layer (40)(106). The method as claimed in claim 1, wherein the size of the large first metal regions is greater than about 30 x 30 micrometers. The method as claimed in claim 1 or 2, wherein another metal layer and the first metal regions are separated by an insulating material (56)(104), through which vias (58)(102) are formed to re-connect the large first metal regions to the device structures. The method as claimed in claim 1, 2 or 3, wherein the large first metal regions constitute pads located at the periphery of the integrated circuit. A method of forming a multi-level conductive interconnection utilising the method of claim 4, which interconnection forming method comprises: forming a patterned layer of conductive polysilicon (14) on a silicon substrate (50) to act as a first conductive contact to the integrated circuit; forming an insulating layer (54) over the polysilicon layer; forming openings to the polysilicon layer through the insulating layer; forming a layer (18) of metal on the insulating layer such that the metal layer electrically connects to the polysilicon through the openings; forming said large contact pad areas with said metal layer; patterning the metal layer to form the electrical discontinuity (30) therein which electrically isolates the large contact pad areas and the integrated circuit to prevent charge build-up during subsequent processing; further processing in a plasma environment that would normally produce electrical charge build-up at the gate oxide of the integrated circuit, but wherein the electrical discontinuity prevents the charge build-up; forming and patterning another insulating layer (56) to form openings for said vias (58) to the metal layer; forming another layer (40) of metal over the large contact pad areas and over the electrical discontinuity such that said another metal layer electrically connects to the first metal layer, via direct contact to said metal layer at the large contact pad areas and through the openings in said another insulating layer thereby electrically re-connecting the large contact pad areas and the integrated circuit; and forming a passivation layer (60) over said another metal layer. The method as claimed in claim 5, wherein the processing in a plasma environment is plasma enhanced chemical vapor deposition. The method as claimed in claim 5, wherein the processing in a plasma environment is plasma etching. The method as claimed in claim 7, wherein the plasma etching is a sputter etch. The method as claimed in any of claims 5 to 8, wherein said another metal layer is patterned to form a second electrical discontinuity (100) between the large contact pad areas and the integrated circuit; further processing in a plasma environment that would normally produce an electrical charge build-up at the gate oxide of the integrated circuit, but wherein the second electrical discontinuity prevents the charge build up; forming and patterning a further insulating layer (104) to form openings for via (102) to said another metal layer; forming a further layer (106) of metal over the large contact pad areas and over the second electrical discontinuity such that said further metal layer electrically connects to said another metal layer, via direct contact to said another metal layer at the large contact pad areas and through the openings in said further insulating layer thereby electrically re-connecting the large contact pad areas and the integrated circuit; and forming the passivation layer over said further metal layer.

Inventors: HSU BILL, KO JOE, HSU, BILL, KO, JOE
Applicants: UNITED MICROELECTRONICS CORP, UNITED MICROELECTRONICS CORPORATION
Application year: 1994
Main classification: H01L27
IPC codes: H01L27