Semiconductor memory with built-in parallel bit test mode

Abstract: Disclosed is a semiconductor memory with a built-in parallel bit test mode, which has a special test mode for pre-die sort that can output redundancy data and perform a parallel test on a plurality of bits for each cell array. The semiconductor memory comprises a memory circuit including memory cell arrays (11) formed on a semiconductor chip area and laid out as a plurality of blocks, the memory circuit having a redundancy function for allowing each memory cell array to be saved independently by spare rows (112) or spare columns (113), a first test circuit, provided in the memory circuit, for writing the same data to a plurality of bits of memory cells in the memory circuit and simultaneously reading the data from the plurality of bits to determine whether or not each piece of the simultaneously read data matches with each other to thereby perform a parallel test on a plurality of bits in a first parallel bit test mode specified when the semiconductor chip area is sealed in a package or is in a wafer state, and a second test circuit, provided in the memory circuit, for performing a parallel test on a plurality of bits of memory cells in the memory circuit with a degree of reduction of bits, less than a reduced number of bits of data read in the first parallel bit test mode, in a second parallel bit test mode specified when the semiconductor chip area is in a wafer state. Those bits reduced in the second parallel bit test mode are included in a unit of redundancy replacement.

Description: The present invention relates to a semiconductor memory and, more particularly, to a semiconductor memory with a built-in parallel bit test mode. Recent dynamic semiconductor memories (DRAMs) have a parallel bit test mode for performing a parallel test of a plurality of bits in order to shorten the test time. This parallel bit test mode is to access a plurality of bits of a DRAM even with a x1 bit structure, instead of performing writing/reading one bit at a time to test the memory function bit by bit, or to access more bits than the number of inputs/outputs (I/O) for a DRAM with a multi-bit structure, thereby testing the functions of many bits simultaneously. That is, this test mode simultaneously writes the same data in n-bit memory cells, simultaneously reads the n-bit data in read mode to determine if each piece of data matches with each other, and outputs "1" or "0" in accordance with the matched/unmatched result. This parallel bit test mode can reduce the number of cycles to access all the bits to 1/n (n: the number of bits) and can significantly shorten the test time. An 8-bit parallel bit test mode that was standardized in JEDEC (Joint Electron Device Engineering Council) has been implemented in a 4M DRAM with a structure of 4M words × 1 bit to which the parallel bit test mode was introduced first. As the degree of the integration of DRAMs was increased, the number of bits to be simultaneously tested in parallel bit test mode was also increased to minimize an increase in test time. It is the current tendency of the individual makers to implement a 16-bit parallel mode in 16M DRAMs with a structure of 16M words × 1 bit and implement a 32-bit parallel mode in 64M DRAMs. In discriminating the test result of a DRAM having a structure of 64M words x 1 bit, for example, 32-bit data is read simultaneously, the discrimination result is output to the output pad, and "1" is output if 32 bits are all "0" or "1", or "0" is output if 32 bits contain both "0" and "1." This discrimination method can ensure a 32-bit parallel test for checking if the writing/reading of cells can be performed correctly, thus greatly shortening the test time. For devices with a multi-bit structure, which have an output pad as wide as the bit width, it is typical to employ a method for collectively outputting the results of the test for the entire to-be-tested bits to specific I/O terminals, as mentioned above, not outputting the results of discrimination on the properness/defectiveness of a subset of cells of a cell array to the individual I/O terminals. For a test of a DRAM having a structure of 16M words × 4 bits, for example, there is not yet an established method. It is however typical to use a method of writing the same data to 32 bits from a specific terminal (e.g., I/OO) in four I/O terminals and outputting the discrimination results to that specific terminal, not outputting the results of a reduced number of 8 bits in four 16M cell arrays separately to the associated I/O terminals. This system of outputting the test results for DRAMs with a multi-bit structure is tended to be employed not only to devices with a structure of n words × 4 bits (n: an integer), but also to devices having a wider bit structure, such as n words × 8 bits or n words × 16 bits. The following is the reason why the results of discrimination on the properness/defectiveness of a subset of cells of a cell array are not output to the individual I/O terminals as mentioned above. Assuming that the number of 32 bits is reduced in a DRAM with a structure of 4M words × 16 bits and the result is output to the individual I/O terminals, the result of the reduced number of only two bits is output to each I/O terminal and the probability of the aforementioned erroneous discrimination increases. For a DRAM having a structure of 16M words × 4 bits, the aforementioned problem hardly occurs even with the use of the mentioned method that outputs the results of discrimination on the properness/defectiveness of a subset of cells of a cell array to the individual I/O terminals. As described above, while the parallel bit test mode can significantly reduce the test time, the conventional parallel bit test mode, when adapted for use in DRAMs with a multi-bit structure, would raise the following problem. FIG. 1 shows an example of the test procedures for DRAMs before delivery. In general, a DRAM is provided with spare rows and/or columns. If there is a defective row or column, the defective row or column is replaced with the associated spare row or column to save the DRAM and prevent it from being rejected as a defective device. In this case, a test is conducted on the device in a wafer state to determine if there are any defective memory cells after the wafer process is completed (the test in this stage is called "pre-die sort test"), and defective bits of the memory cells are memorized. The addresses of the finally established defective bits or the address of the finally established defective row or column is programmed in the associated spare row or column by the fuse blow or laser blow scheme, so that when the defective row or column is accessed, the associated spare row or column is actually accessed instead. Thereafter, a final-die sort test to check if the defective row or column has been replaced accurately is performed, and when the test result is satisfactory, this device will be sealed in a package. These test modes are disclosed in GB-A- 2 266 381. The conventional parallel bit test mode cannot be used in the above pre-die sort for the following reason. For a DRAM having a structure of 16M words 4 4 bits, as the number of 32 bits is reduced and the result is output, it is not possible to determine which cell is in error, thus making it impossible to program the address of the defective row or column later. In the conventional pre-die sort, therefore, a test should be conducted in the normal mode of accessing the memory cells bit by bit, and inevitably takes a significant time. Of course, the redundancy system of saving the entire 32 bits to be simultaneously tested can obtain redundancy data even when the pre-die sort is executed in test mode. With the conventional cell array structure, however, such a redundancy system of saving the entire 32 bits to be simultaneously tested is not generally employed, but a redundancy is generally provided independently for each 16M cell array instead. In the latter case, the number of bits is too reduced in the 32-bit parallel test and redundancy data cannot be obtained in test mode. While FIG. 1 shows an example of performing the burn-in on a packaged device after assembling, the burn-in may be carried out on a device in a wafer state. According to the conventional semiconductor memories, as described above, the parallel bit test mode cannot be used to obtain redundancy data at the time of performing the pre-die sort, and this redundancy data is obtained by conducting the test in normal mode, thus requiring a significant time for the pre-die sort. IEEE Journal of Solid-State Circuits, vol. 24, no. 1, Feb. 1989, pages 43-49, features of which are included in the preamble of claim 1, discloses a semiconductor memory with a built-in parallel test mode. Especially, there is disclosed a memory circuit including memory cell arrays formed on a chip area and laid out as a plurality of blocks, the memory circuit having a redundancy function for allowing each memory cell array to be saved independently by spare rows or spare columns. In IEEE Journal of Solid-State Circuits, vol. 24, no. 1, Feb. 1989, pages 43-49, as well as in EP-A-0 143 624, there is further disclosed a first test circuit, provided in said memory circuit, for writing the same data tc a plurality of bits of memory cells in said memory circuit and simultaneously reading said data from said plurality of bits to determine whether or not each piece of said simultaneously read data matches with each other to thereby perform a parallel test on a plurality of bits in a first parallel bit test mode specified when said semiconductor chip area is sealed in a package or is in a wafer state. A problem with the test mode in the prior art is that occurring errors cannot exactly be located, since the test outputs of several banks are combined to one single output signal. This leads to difficulties when deciding which row or column has to be replaced by a spare part. According to the present invention, this problem is solved by a semiconductor memory as defined in claim 1. The dependent claims show advantageous further developments of the semiconductor memory of claim 1. Suppose that the second parallel test mode (a special test mode for pre-die sort) is performed by supplying a signal to a pad on a wafer at the time the pre-die sort test is conducted. In this special test mode for pre-die sort, data reduction by the units of redundancy replacement as carried out in normal test mode is not performed, so that redundancy data can be obtained by outputting the result of error detection for each redundancy for each of a plurality of cell arrays of a semiconductor memory to an associated one of pads. That is, the test can be performed on many bits by invoking the special test mode for pre-die sort in a wafer state, thus considerably shortening the time for the pre-die sort. This invention can be more fully understood from the following detailed description when taken in conjunction with the accompanying drawings, in which: FIG. 1 is a flowchart exemplifying conventional test procedures for DRAMs before delivery; FIG. 2 is a diagram illustrating the cell array structure of a 64M DRAM having a structure of 64M words × 1 bit, which is a semiconductor memory with a built-in parallel bit test mode according to one embodiment of the present invention; FIG. 3 is a detailed circuit diagram showing one of the 16M arrays in FIG. 2; FIG. 4 is a detailed circuit diagram showing DQ buffers and DQ lines associated with one set of 1M blocks in FIG. 3; FIG. 5 is a circuit diagram showing in enlargement a part of a 1M block of n = 2 and L in FIG. 4; FIG. 6 is a circuit diagram showing one example of a switch circuit which allows data to be coupled to the DQ buffers shared by the right and left 1M blocks in FIG. 4; FIG. 7 is a diagram showing an example of the DQ buffer in FIG. 4; FIG. 8 is an operational waveform diagram exemplifying control signals for the DQ buffer in FIG. 7; FIG. 9 is a circuit diagram showing one example of a read multiplexer in FIG. 2; FIGS. 10A and 10B are diagrams respectively showing an example of a circuit for outputting RD and /RD signals upon reception of RNAND and /RNAND signals in FIG. 9, and a truth table; FIG. 11 is a circuit diagram showing one example of an output buffer circuit for outputting Dout upon reception of RD and /RD signals from the circuit in FIG. 10; FIG. 12 is a circuit diagram showing one example of a circuit for outputting RDi and /RDi signals upon reception of TRDi and /TRDi signals from the read multiplexer in FIG. 9; FIG. 13 is a circuit diagram showing one example of an output buffer circuit for outputting a DSTi signal upon reception of RDi and /RDi signals from the circuit in FIG. 12; FIG. 14 is a circuit diagram exemplifying a generator for generating SIMTEST, NORMAL and /RDTEST signals in FIGS. 10 and 11; and FIG. 15 is a diagram showing one example of the redundancy structure for a DRAM having a structure of 64M words × 1 bit according to this embodiment. One embodiment of the present invention will now be described in detail referring to the accompanying drawings. A semiconductor memory with a built-in parallel bit test mode to which the present invention is applied, comprises memory cell arrays formed on a semiconductor chip area and each laid out as a plurality of blocks; a memory circuit having a redundancy function for allowing each memory cell array to be saved by spare rows or spare columns; a first test circuit provided in the memory circuit, and a second test circuit also provided in the memory circuit. The first test circuit writes the same data to a plurality of bits of memory cells in the memory circuit and simultaneously reads the data from the plurality of bits to determine whether or not each piece of the simultaneously read data matches with each other to thereby perform a parallel test on a plurality of bits in a first parallel bit test mode, which is specified when the semiconductor chip area is sealed in a package or is in a wafer state. The second test circuit performs a parallel test on a plurality of bits of memory cells in the memory circuit with a degree of reduction of the number of bits, less than a reduced number of bits of data read in the first parallel bit test mode, in a second parallel bit test mode, which is specified when the semiconductor chip area is in a wafer state. Those bits, the number of which is reduced in the second parallel bit test mode, are included in a unit of redundancy replacement. The second parallel bit test mode is a special test mode for pre-die sort, which is performed at the time of conducting the pre-die sort test in a wafer state where the addresses of defective bits should be replaced with redundancy bits after discrimination. Although this special test mode for pre-die sort can be incorporated in devices with a multi-bit structure, the following will discuss the case where this test mode is incorporated in a device having a 1-bit structure. FIG. 2 illustrates the cell array structure of a 64M DRAM having a structure of 64M words x 1 bit, which is a semiconductor memory with a built-in parallel bit test mode according to one embodiment of the present invention. A 64M bit cell array (64M array) formed on the chip area is separated to four 16M bit array (16M array) 11, with a row decoder 12 arranged in association with one end side of each 16M array in the row direction (on the center side of the chip area) and a column decoder 13 arranged at one end of each 16M array in the column direction (the center side of the chip area). Each 16M array 11 is separated to 16 1M cell array blocks (1M blocks) 111. Eight pairs of data read/write lines (RWD lines) are formed in association with and in the vicinity of each 16M array 11. The reading system of the DRAM in FIG. 2 will be described in detail first. Eight pairs of RWD lines corresponding to each 16M array 11 are connected to a read multiplexer 14. FIG. 3 presents detailed illustration of one of the 16M arrays in FIG. 2, and column select buffers (DQ buffers) and eight pairs of RWD lines associated with that 16M array. FIG. 4 presents detailed illustration of the DQ buffers 21 and data lines (DQ lines) associated with the portion indicated by the broken line in FIG. 3 (e.g., blocks L and R of n =2). As shown in FIG. 3, there are eight sets of 1M blocks 111, each set consisting of two adjoining right and left blocks, in a 16M array. For the sake of convenience, the individual 1M blocks 111 are given set numbers n (0-7) and block numbers m (1-16), symbol L indicating the left block in each set and symbol R indicating the right block in each set. As shown in FIG. 3, each block 111 is provided with four DQ buffers 21 and eight pairs of RWDi lines (i=0-7) are commonly provided in the vicinity of each block 111. As shown in FIG. 4, four pairs of data lines (DQ lines) run on both sides of the 16M array 11, i.e., outside the outermost block 111 (not shown) of each 16M array and between the individual blocks 111. As shown in FIG. 4, four pairs of DQ0i, /DQ0i lines to DQ3i, /DQ3i lines located on both sides of each block are connected to four DQ buffers 21 of the associated block as described later. /DQ0i denotes a complementary logic level of DQ0i, and /DQ3i denotes a complementary logic level of DQ3i. The same is applied to every signal described hereinafter. As shown in FIG. 3, four DQ buffers 21 corresponding to the block L in each block set are connected to four pairs of RWD0, /RWD0 lines to RWD3, /RWD3 lines and four DQ buffers 21 corresponding to the block R in each block set are connected to the remaining four pairs of RWD4, /RWD4 lines to RWD7, /RWD7 lines. When the block L of n = 2 is enabled, data is read on a total of eight pairs of DQ lines on both sides of this block. Those pieces of data are input to the eight DQ buffers 21 corresponding to blocks L and R of n = 2, are amplified there and are then selectively output to eight pairs of the RWD0 line to the RWD7 line. In this case, DQ04 to DQ34 lines and /DQ04 to /DQ34 lines are input to the four DQ buffers 21 corresponding to the block L of n = 2 and DQ05 to DQ35 lines and /DQ05 to /DQ35 lines are input to the four DQ buffers 21 corresponding to the block R of n = 2. When the block R of n = 2 is enabled, on the other hand, likewise, data is read on a total of eight pairs of DQ lines on both sides of this block. Those pieces of data are input to the eight DQ buffers 21 corresponding to blocks L and R of n = 2, are amplified there and are then selectively output to eight pairs of the RWD0 line to the RWD7 line. In this case, DQ05 to DQ35 lines and /DQ05 to /DQ35 lines are input to the four DQ buffers 21 corresponding to the block L of n = 2 while DQ06 to DQ36 lines and /DQ06 to /DQ36 lines are input to the four DQ buffers 21 corresponding to the block R of n = 2. As two adjoining blocks R and L in each block set are not simultaneously enabled, the same DQ buffers can be shared by the right and left blocks as mentioned above. Although the above description has been given with reference to the case where the blocks with the set number n = 2 are enabled, the same applies to the case where another set of blocks are enabled. That is, pieces of data, read on a total of eight pairs of DQ lines, four pairs on each side of the enabled block, are input to a total of eight DQ buffers 21, four corresponding to each block L or R of that set, and are amplified there. FIG. 5 shows in enlargement a part of the block L of n = 2 in FIG. 4. In this diagram, BL and /BL indicate eight pairs of bit lines (16 bit lines), WL indicates four word lines, and MC indicate individual memory cells for 32 bits. Each memory cell MC comprises one MOS transistor and one capacitor, and is provided in the vicinity of where the bit line BL or /BL crosses the word line W. Connected to each bit line pair BL and /BL (called a "column") is a sense amplifier/bit-line precharger 41, which includes a signal amplifier and a circuit for fixing the bit line pair to a predetermined potential before amplification. The circuits 41 are alternately arranged on the left and right sides of the block for every two pairs of bit lines BL and /BL. A total of eight pairs of DQ lines, formed of four pairs on each side of the block, are connected to eight pairs of bit lines BL and /BL via NMOS transistors (column select gates and DQ gates) 42 to the gates of which column select lines CSL are input. This structure allows data of the memory cell MC selected by the word line WL to be amplified by the associated sense amplifier 41 and allows the data selected by a single line CSL to be read on a total of eight pairs of DQ lines on the right and left sides of the block. Although FIG. 5 shows the structure associated with a single line CSL, this structure is actually repeated so that data is coupled to eight pairs of DQ lines for every eight columns for each line CSL. FIG. 6 shows one example of a switch circuit which selectively couples one pair of DQ lines in FIG. 4 to those DQ buffers which are shared by the blocks L and R of n = 2. This switch circuit comprises a plurality of CMOS transfer gates 51 having their gates supplied with complementary signals DQSW and /DQSW. In this diagram, DP02L, /DP02L to DP32L, /DP32L are DQ line pairs connected to the DQ buffers corresponding to the block L of n = 2, and DP02R, /DP02R to DP32R, /DP32R are DQ line pairs connected to the DQ buffers corresponding to the block R of n = 2. FIG. 7 is a circuit diagram showing one example of the DQ buffer in FIG. 4. In this diagram, DPinl and /DPinl (i = 0-3, n = 0-7 and 1 = L, R) are pairs of DQ lines connected to the associated DQ buffers (i = 0-3, n = 0-7 and 1 = L, R). As the structure of the DQ buffer itself is well known, its description will not be given below. Fig. 8 is a timing chart showing an example of the operation of the DQ buffer in FIG. 7. In this diagram, QDRV is a pulse signal which becomes "H" in write mode and QSE is a signal which enables the DQ buffers in read mode. The operation of the DQ buffer itself is well known, it will be described briefly. The row address is obtained at the same time an /RAS (row address strobe) signal is enabled, and then the column address is obtained at the same time a /CAS (column address strobe) signal is enabled, thereby selecting CSL, and the associated data is latched at the enabling timing of a /DFLTC signal. Although, prior to the above operation, CSL corresponding to the column address equal to the row address is selected and the associated data is latched, this is abandoned by the latching of data read out by the enabled /CAS signal (necessary data). The 64M DRAM shown in FIG. 2 is designed in such a way that in the 8K refresh cycle, only one of sixteen 1M blocks 111 is enabled for each 16M array during one cycle, and a total of four 1M blocks (for example, four hatched blocks in FIG. 2) are simultaneously enabled. The same data can be written simultaneously in eight bits in the four blocks 111 or can be read simultaneously therefrom. Therefore, it is possible to simultaneously write the same data in cells with a total of 32 bits, and simultaneously read data from 32 bits. FIG. 9 exemplifies a read multiplexer in FIG. 2. In this diagram, "81" is a PMOS transistor, "82" is an NMOS transistor, "83" are inverters used for latching the state of the node TMRD00 after the signal RWDOO is transferred into TMRDOO by a negative pulse of /DTXR00, "84" is a 2-input NOR gate and "851" and "852" are 4-input NAND gates. Two sets of circuits, each having sixteen PMOS transistors 81, two NMOS transistors 82, four inverters 83 and two 2-input NOR gates 84 connected as illustrated, are provided in association with a single 16M array. TRDj (j = 0-3), the output signals from the first set of circuits in each of four 16M arrays, are input to the first 4-input NAND gates 851 and /TRDj, the output signals from the second set of circuits, are input to the second 4-input NAND gates 852. In each set of circuits above, before data is read in, an MRDEQ signal becomes "H" temporarily to turn on the N channel transistor 82, setting TMRD0j, TMRD1j, /TMRD0j and /TMRD1j, which are input nodes of the 2-input NOR gate 84, to a low level. A description will now be given of the read operation of the read multiplexer in FIG. 9 in normal mode and the reduction of a plurality of bits in parallel bit test mode. At the time of the reading operation of a DRAM with an ordinary xl-bit structure in normal mode, after one block 111 in each of four 16M arrays 11 are enabled and 8-bit data is output on eight pairs of RWD lines, only one of /DTXR00-/DTXR70 signals (e.g., /DTXR00) which is selected by the address becomes a low level. Accordingly, 1-bit data on the RWD line (e.g., RWD00) is selectively sent to TMRD00, TMRD10 and /TMRD00, /TMRD10, and passes through the 2-input NOR gate 84 to become TRD0 and /TRD0 signals. Likewise, data is output on the RWD lines for the other 16M arrays, but since TRDj and /TRDj from the other unselected 16M arrays have a high level, only the data from the selected 16M array passes through the 4-input NAND gates 851 and 852 to become RNAND and /RNAND signals. At the time of the reading operation in parallel bit test mode, since /DTRX00 to /DTRX70 signals all become a low level, TRD0 or /TRD0 becomes a low level if there is any low-level signal among the RWD00 to /RWD70 data. With no error, therefore, if all the RWD lines corresponding to four 16M arrays are at an "H" level, the RNAND signal becomes "L" and /RNAND signal becomes "H," and if all the RWD lines are at an "L" level, the RNAND signal becomes "H" and /RNAND signal becomes "L." If there is an error even in one bit, on the other hand, there are L-level and H-level RWD lines, RNAND signal becomes "H" and /RNAND signal becomes "H." FIGS. 10A and 10B respectively show an example of a circuit for outputting RD and /RD signals upon reception of RNAND and /RNAND signals in FIG. 9, and a truth table for mode indicating signals NORMAL and SIMTEST. In FIG. 10A, the symbols of logic circuits are the same as or similar to those of the logic circuits shown in FIG. 9, and the description of each symbol will not be given. This also applies to the following description. A /TRDENB signal is a sync signal which becomes "L" from "H" after the RNAND and /RNAND data are settled, and is generated by a timer in the chip area. FIG. 11 shows one example of an output buffer circuit for outputting Dout upon reception of RD and /RD signals from the circuit in FIG. 10. In this diagram, ENBL is an output enable signal. The signals DXFR and /DXFR are control signals for the output buffer circuit. FIG. 12 shows one example of a circuit for outputting RDi and /RDi signals upon reception of TRDi and /TRDi signals from the read multiplexer in FIG. 9. In this diagram, "110" is a CMOS clocked inverter supplied with a control input being an output of a NOR-circuit being supplied with the signals /RDTEST and MRDEQ, wherein /RDTEST is a signal which becomes low when users perform the PRE DIE SORT shown in FIG. 1 and pull down the PAD /RDTPAD (130) low as indicated in FIG. 14 and MRDEQ is a signal which temporarily becomes "H" before data is read as mentioned in the foregoing description given with reference to FIG. 9. The CMOS clocked inverter serves for supplying TRDi and /TRDi states into DSTi drivers described in FIG. 13 in the PRE DIE SORT and disabling this path in NORMAL operation mode and general parallel bit test modes other than the PRE DIE SORT test mode. Although FIG. 12 shows only one set of a circuit which receives the i-th TRD and /TRD signals, there are actually four sets of circuits which receive TRDi and /TRDi signals (i = 0, 1, 2, 3) in association with four 16M arrays and the RDi and /RDi signals will be output from the four sets of circuits. FIG. 13 shows one example of an output buffer circuit for outputting a DSTi signal upon reception of RDi and /RDi signals from the circuit in FIG. 12. Although FIG. 13 shows one set of an output buffer circuit, there are actually four sets of output buffer circuits provided for four 16M arrays. The operations of the circuits in FIGS. 10 through 13 will be described below. In normal mode, NORMAL and SIMTEST in FIG. 10 are respectively "H" and "L," and the RNAND and /RNAND signals are inverted by the NOR gate 91 and are as RD and /RD signals, which are then input to the output buffer circuit. In this case, with the selected RWD and /RWD lines respectively being "H" and "L," RNAND = "L" and /RNAND = "H" so that RD = "H" and /RD = "L" and Dout becomes "H", If the selected RWD and /RWD lines are respectively "L" and "A", Dout becomes "L". In a package test (which is executed after the device is sealed in a package and to which the selection test shown in FIG. 1 is also equivalent), on the other hand, NORMAL = "L" and SIMTEST = "H." In this case, with no error, RNAND and /RNAND becomes complementary signals, RD = "H" and /RD = "L" and Dout becomes "1." That is, when 32 RWD lines are all "H" and 32 /RWD lines are all "L," RNAND = "L" and /RNAND = "H" and RD = "H" and /RD = "L." Likewise, when 32 RWD lines are all "L" and 32 /RWD lines are all "H," RNAND = "H" and /RNAND = "L" and RD = "H" and /RD = "L." If there is at least one error (if L-level and H-level lines are mixed in the 32 RWD lines and /RWD lines), on the other hand, RNAND = "H" and /RNAND = "H", RD = "L" and /RD = "H" and Dout becomes "0." If the same written pieces of data (8 × 4 = 32 bits in this example) are all in error and all the pieces of data are inverted, Dout becomes "1" although it is actually an error. In this case, it is erroneously judged that there is no error, but the probability of the occurrence of this event is too small to raise any practical problem. Through the above-described operations, when the same pieces of data are written, it is possible to determined if they are aligned, and with no error, Dout becomes "1" and with at least one error, Dout becomes "0." In the die sort test that is performed in a wafer state, since NORMAL = "L" and SIMTEST = "L," RD is "H" and /RD is "H" so that the PMOS transistors 101 and 102 in FIG. 11 whose gates are supplied with those RD and /RD signals, are turned off. The PMOS transistor 103 and NMOS transistor 104 in the final-stage output driver of the output buffer circuit in FIG. 11 are both turned off, setting Dout in a high impedance state (HiZ). At this time, each pair of four pairs of TRDi and /TRDi signals (i= 0, 1, 2, 3) which correspond to four 16M arrays are respectively input to the circuit in FIG. 12 of the associated 16M array. The discrimination of the matching/non-matching on each result of reading eight bits for each 16M array is performed separately and the RDi and /RDi signals are output for each 16M array. The RDi and /RDi signals are input to the output buffer circuit (there are actually four sets of the output buffer circuits) in FIG. 13 of the associated 16M array, and finally, DSTi signals (i = 0, 1, 2, 3) are output to four pads as the test results for each 16M array. FIG. 14 shows an example of a generator for generating SIMTEST, NORMAL and /RDTEST signals in FIGS. 10 and 12. At the time of conducting the pre-die sort in a wafer state, the ground potential VSS is applied with the testing probe contacting a pad 130. This pad 130 is pulled up to the source potential VCC by a normally-ON PMOS transistor 131 which has small driving power, /RDTEST becomes a low potential (VSS) if the pad 130 is externally forced to be grounded. At the same time, SIMTEST and NORMAL are both dropped to a low potential. Accordingly, the aforementioned die sort test mode is invoked. At the time of sealing the device in a package, /RDTEST is kept at the pulled-up high level by setting the pad 130 to a floating state, not bonding it, so that the die sort test mode will not be invoked. If the package test mode is invoked by a separate circuit (not shown), however, the PBTEST signal becomes a high level, SIMTEST a high level and NORMAL a low level, so that the conventional 32-bit parallel bit test mode is established. Of course, if the PBTEST is at a low level, the mode remains to the normal access mode. FIG. 15 shows one example of the redundancy structure for a DRAM having a structure of 64M words × 1 bit shown in FIG. 2. In FIG. 15, four 16M arrays 11 are designed to be independently saved by spare rows 112 and/or spare column 113. That is, in each 16M array 11, two spare rows 112 are arranged for each of the left and right blocks 111 with n = 0-7, and one spare column 113 for each 16M array 11. There are two spare rows 112 for each block (that are associated with those cells which are connected to the BLi side of the complementary bit line pair BLi and /BLi in a cell array and those cells which are connected to the /BLi side). A total of four spare rows 112 for the left and right blocks belonging to the same block number n are not actually independent, and are so designed that if there is one defective row in this block, it will be replaced with the four spare rows. This unit of replacement is not limited to this particular type, and the present invention will not be affected at all by another available system. Although the spare column 113 is commonly arranged for sixteen blocks 111 belonging to the same 16M array, it is designed in such a way as to spare a defective column independently for each block. This system is described in detail in Jpn. Pat. Appln. No. 4-64979 KOKAI number 6-28890 filed by the present applicant, so that the detailed description will not be given here. This unit of replacement is not limited to this particular type, and the present invention will not be affected at all by another available system. In the case where the number of the test results for the entire 64M DRAM with the above structure is reduced and output in the pre-die sort test, defect data for each 16M array will not be obtained, making it impossible to replace a defective cell with a redundancy cell. If the number of the test results is reduced for each 16M array and defect data is output for each 16M array, a defective cell can accurately be replaced with a redundancy cell by the fuse blow process, based on that data, as disclosed in the foregoing description of the present invention. Assuming that cells of eight bits circled in FIG. 5 are to be simultaneously tested in the pre-die sort test, replacing data for the spare rows (data for replacing the entire single word line) and replacing data for the spare column (data for replacing a single column select line) can be obtained correctly. Of course, in the case where there is one spare column for the entire 64M bits, redundancy data can be obtained even in 32-bit reducing test mode. But this system is not preferable because it will significantly reduce the redundancy's saving efficiency. While the conventional pre-die sort for DRAMS obtains redundancy data by performing the normal access bit by bit, the pre-die sort for DRAMs to which this invention is applied can shorten the test time to 1/8. As described above, according to the DRAM of this embodiment, the test, when being conducted after the device is sealed in a package, will reduce the number of many bits over the entire chip area and will significantly shorten the test time, and the pre-die sort test in a wafer state will reduce the number of read data in the units of redundancy replacement to obtain redundancy data faster than the prior art, although the test time will not be shortened as done by the test after the device is sealed in a package. As described above, a special test mode for pre-die sort, which is capable of outputting redundancy data and performing a parallel test on a plurality of bits for each cell array, can be incorporated in the semiconductor memory according to this embodiment.

Claims: A semiconductor memory device with a built-in parallel bit test mode, comprising: memory cells (MC) arranged in memory cell arrays (1) each array comprising a plurality of memory cell blocks (111), said memory cells including redundant memory cells arranged in redundant memory cell groups each for use in replacing defective memory cells; read/write data lines (RWD0, /RWD0 - RWD7, /RWD7) for transferring read/write data from/to said memory cells; a first parallel bit testing circuitry (90) for testing said memory cells by comparing data written to memory cells of a first number of memory cell blocks and data read therefrom; first output means (100) for outputting a test result (DOUT) of said first parallel bit testing circuitry; characterized by further comprising a second parallel bit testing circuitry (108) for testing said memory cells by comparing data written to memory cells of a second number (i = 0, 1, 2, ..) of memory cell blocks and data read therefrom, wherein said first parallel bit testing circuitry (90) tests said memory cells (MC) in a package test and said second parallel bit testing circuitry (108) tests said memory cells (MC) in a die sort test; second output means (112) for outputting separately a respective test result (DSTi, i = 0, 1, 2, ..) of said second parallel bit testing circuitry for each memory cell block; and mode switching means (ENBL) for switching, in correspondence with a respective output signal (SIMTEST, NORMAL, RDTEST) from a generator for determining the modes, between a first mode in which said first output means (100) is enabled and a second mode in which said second output means (112) is enabled. A semiconductor memory according to claim 1, wherein said memory cells (MC) are arranged in m memory cell arrays (1); n pairs of said data read/write lines (RWD0, /RWD0 - RWD7, /RWD7) are provided in common to said memory cell blocks (111) of each of said memory cell arrays; m multiplexers (14) are provided in correspondence to said m memory cell arrays, each for multiplexing data read out of a selected one of memory cell blocks of the corresponding memory cell array; a first logic circuit (851, 852) receives outputs of said multiplexers to perform a logic operation thereon; said first parallel bit testing circuitry (90) is provided in common to said m memory cell arrays, for performing a first parallel bit test (DOUT) on data read out of a first number of selected memory cell blocks of said m memory cell arrays, using an output of said first logic circuit; said first output means (100) outputs a test result (DOUT) of the first parallel bit test; said second parallel bit testing circuitry (108) comprises m second test circuits (108) in correspondence to said m memory cell arrays, each second test circuit performing a second parallel bit test on data read out of a second number of selected memory cell blocks of the corresponding memory cell array, using an output of said m multiplexers, respectively; and said second output means (112) outputs separately a test result (DSTi) of the second parallel bit test. A semiconductor memory device according to claim 2, characterized in that each of said second test circuits (108) tests said memory cells by comparing data written to memory cells of at least one memory cell block (111) of the corresponding memory cell array (1) and data read therefrom. A semiconductor memory device according to any of the preceding claims, characterized in that said first parallel bit testing circuitry (90) tests said memory cells by comparing data written to memory cells of at least one memory cell block in each of said memory cell arrays and data read therefrom.

Inventors: FUJII SHUSO, OHSAWA TAKASHI, FUJII, SHUSO, OHSAWA, TAKASHI, FUJII, SHUSO, C/O INTELLECTUAL PROPERTY DIV., OHSAWA, TAKASHI, C/O INTELLECTUAL PROPERTY DIV.
Applicants: TOSHIBA KK, KABUSHIKI KAISHA TOSHIBA
Application year: 1994
Main classification: G11C29
IPC codes: G11C29, G11C11