Scanning force microscope with integrated optics and cantilever mount and method for operating the same

Abstract: The scanning force microscope includes integrated optics for viewing the optical lever arm, probe and sample to be examined. The scanning force microscope includes an improved mount for the probe, which is magnetically secured to the body of the scanning force microscope, to improve ease of handling and mounting the probe assembly. In one preferred embodiment also includes a base portion with a fluid cell for receiving a sample in a sealed gas or liquid environment.

Description: BACKGROUND OF THE INVENTION Field of the Invention : This invention relates generally to scanning force microscopes, and more particularly concerns a scanning force microscope with an improved optical lever arm and integrated optics for viewing the lever arm and a sample. Description of Related Art : Scanning force microscopes, also known as atomic force microscopes, are useful for imaging objects as small as atoms. The scanning force microscope is closely related to the scanning tunneling microscope and the technique of stylus profilometry, however in a typical scanning force microscope, deflection of a laser beam by a vertical movement of a probe following the contours of a specimen is amplified by a reflective lever arm to which the probe is mounted. The deflection of the laser beam is typically monitored by a photodetector in the optical path of the deflected laser beam, and the sample is mounted on a stage moveable in minute distances in three dimensions so that the sample can be raster scanned while the vertical positioning of the probe relative to the surface of the sample is maintained substantially constant by a feedback loop with the photodetector controlling the vertical positioning of the sample. As the sensitivity of the optical lever arm and probe are crucial to the useful operation of such scanning force microscopes, conventional scanning force microscopes generally include optical lever arms of such small dimensions that the optical lever arms and probe assembly can easily be damaged by contact with a sample or during handling, and the optical lever arms and probe assembly is further difficult to handle and mount in the instrument. It would therefore be desirable to provide an improved mount for the probe, which would be easier to handle and position in the instrument. While a probe can be damaged by too abrupt an approach to a sample before the probe is close enough to the sample to initiate feedback position control, the user typically can not easily view the approach of the lever arm and probe assembly to the surface of the sample to insure precise positioning of the probe. In order to overcome this problem EP-A-0,388,023 describes an atomic force microscope which includes a number of calibration tools to facilitate the initial set up and fine tuning of the microscope. In other arrangements, such as that described in EP-A-0,373,742, optical means of alignement are used. EP-A-0 406 413 describes a scanning tunnel microscope including an optical microscope for observing the distance between the sample surface and the probe tip. However even where an optical microscope is used in conjunction with the scanning force microscope to view the sample, the arrangement of the optical microscope with the scanning force microscope can be inconvenient and clumsy, and can interfere with the operation of the scanning force microscope. It would therefore also be desirable to provide a scanning force microscope with optics integrated into the scanning force microscope for viewing the optical lever arm and probe, particularly as the probe and sample come in contact. It would also be desirable to provide a scanning force microscope with the capability of scanning a sample in contact with a fluid, as such a fluid environment can significantly change scanning conditions and opportunities, and can improve the quality of the image of the sample acquired by the instrument. SUMMARY OF THE INVENTION According to the present invention there is provided a scanning force microscrope for examining surface contours of a specimen, comprising: a stationary body, scanning means for mounting a specimen to be examined by said scanning force microscope, said scanning means being secured to said stationary body and adapted to move said specimen in three degrees of freedom relative to said body ; optical lever arm means including a reflective surface ; probe means secured to said optical lever arm means and including a probe tip adapted to contact and follow the surface contours of the specimen ; laser light source means for producing a focused laser beam directed at and deflected by said optical lever arm means ; and photodetor means for receiving said laser beam deflected by said optical lever arm means and generating an output indicative of the degree of deflection of said laser beam by said optical lever arm means, characterised in that said optical lever arm means is secured to said stationary body, said photodetector means is mounted in said body, said probe means is adapted to contact and follow the surface contours of the specimen with a substantially constant amount of force, and said scanning force microscope further includes means for viewing said optical lever arm means and said probe means adjacent to said surface contours of said specimen, said means for viewing being disposed in said stationary body in fixed relation to said optical lever arm means so as to permit easier alignment of one laser beam onto the reflective surface of said optical lever arm means. According to the present invention there is further provided a method of preparing a scanning force microscope for examining surface contours of a specimen in which the scanning force microscope comprises a stationary body, scanning means secured to said stationary body and adapted for movement in three degrees of freedom relative to said body; optical lever arm means secured to said stationary body and including a reflective surface ; probe means secured to said optical lever arm means and including a probe tip, said probe means being adapted to contact and follow the surface contours of the specimen with a substantially constant amount of force; laser light source means for producing a focused laser beam; photodetector means mounted in said body; and means disposed in said stationary body in fixed relation to said optical lever arm means for viewing said optical lever arm means and said probe means adjacent to said surface contours of said specimen, the method comprising the steps of mounting a specimen to be examined by said scanning force microscope to said scanning means; directing said focused laser beam at said reflective surface of said optical lever arm means; viewing said optical lever arm means using said means for viewing; and aligning said laser light source with said optical lever arm means while viewing said optical lever arm means so that said laser beam is deflected by said optical lever arm means and received by said photodetecteor means, said photodetector means being adapted to generate an output indicative of the degree of deflection of said laser beam by said optical lever arm means. The stability and convenience of such integrated optics significantly improve the ability to control the approach of the probe and sample. Additionally, the compact design of the microscope minimizes the effects of thermal expansion and contraction due to thermal gradients or drift in the vicinity of the instrument. The scanning force microscope may further include an improved mount for the probe, which is magnetically secured to the body of the scanning force microscope, to improve ease of handling and mounting the probe assembly. The scanning force microscope may also include a removable base portion which can contain a fluid cell for receiving a sample and a fluid environment. In one preferred embodiment, the means for viewing comprises an accessory objective lens mounted in the body of the microscope, although the means for viewing may alternatively also include a charge couple device or miniature video camera. The optical lever arm means preferably includes a reflective cantilever arm having a free end to which the probe tip is mounted, and the optical lever arm means is preferably magnetically secured to the body. The photodetector means preferably includes a photodetector mounted to the body, and mirror means mounted within the body to deflect the laser beam from the optical lever arm means to the photodetector. Control means are also preferably provided for maintaining the constant force of the probe means against the surface contours of the specimen. The body of the microscope may also include a removable base portion having a chamber for receiving the specimen, and in a preferred alternate embodiment includes a sealed cell for containing the specimen in a selected gas or liquid environment. These and other aspects and advantages of the invention will become apparent from the following detailed description, and the accompanying drawing, which illustrates by way of example the features of the invention. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is an exploded diagrammatic perspective view illustrating the spatial relationships of major elements of a scanning force microscope embodying the invention; Fig. 2 is a top plan view of the scanning force microscope of Figure 1; Fig. 3 is a sectional view of the scanning force microscope of Figure 1 taken along line 3-3 of Fig. 2; Fig. 4 is a sectional view of the scanning force microscope of Figure 1 taken along line 4-4 of Fig. 2; Fig. 5 is an enlarged, exploded view showing the mounting of the optical lever arm assembly of the scanning force microscope of Figure 1; Fig. 6 is an enlarged perspective view of the integral support member, cantilever arm, and probe tip of the optical lever arm assembly of Figure 1; and Fig. 7 is an enlarged, partial sectional view of an alternate embodiment of a scanning force microscope embodying the invention, including a fluid cell in the base of the scanning force microscope. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Scanning force microscopes commonly have such small optical lever arms that the optical lever arm and probe assembly can be easily damaged by mishandling, making them difficult to handle and mount in the instrument. Such microscopes also do not commonly allow the user to view the approach of the lever arm and probe assembly to the surface of the sample to insure precise positioning of the probe. Such microscopes typically also do not include the capability of scanning a sample in a sealed gas or liquid environment, limiting the quality and opportunities for viewing of specimens. As is illustrated in the drawings, there is provided a scanning force microscope 10 having a stationary body 12 including a removable lower base 14 secured to the body by screws or bolts, with a chamber 16 for receiving a specimen 18, which is generally less than 12.7mm (1/2") in diameter and 0.1 to 2mm thick. The body is typically supported by a stationary support (not shown) also supporting a scanning means 22 for mounting of the specimen for examination, raster scanning the specimen in X and Y directions relative to the body, as shown by the arrows, that is, horizontally in two dimensions or degrees of freedom, and for moving the specimen in a vertical or Z dimension or degree of freedom relative to the body, as shown by the arrow, and as will be further explained. The scanning means is thus stationarily mounted with respect to the body of the microscope, and can also be secured to the body, but also includes a piezo tube 22 with a support stage 24 for the specimen at the distal end 26 of piezo tube, which is typically driven in the X, Y and Z dimensions by piezoelectric transducer elements (not shown). The stage also may include a magnet 28, to allow a specimen to be mounted by adhesion onto a small magnetic steel plate which can thus be magnetically secured on the top of the stage, allowing for the convenient interchange of specimens to be examined by the instrument. An optical lever arm 40 is secured to the body, and preferably includes a half washer member 42 of magnetic steel, magnetically secured to a magnetized portion 44 of body. An integral cantilever support member 45 is mounted to a central portion of the half washer member, extending to the open middle portion of the half washer member. A reflective cantilever arm 46 formed in the shape of a triangle from first and second arms 48a, 48b is secured at one end to the free end 47 of the integral cantilever support member and joined together at their free ends 50. The arms of the cantilever arm are typically about 18 microns thick and about 200 microns long, secured to the integral cantilever support member about 120 microns apart, and although the silicon nitride material (available from Park Scientific Instruments) from which the cantilever arm is made is normally considered quite rigid, with these dimensions the cantilever arm bows and flexes as much as 30° in response to the force of the probe tip against the specimen, amplifying the deflection of the laser beam, as will be explained further below. The integral cantilever support member and the reflective cantilever arm are so small that they are most conveniently etched from silicon nitride, although other materials such as silicon which can be etched or lend themselves to fine machining and which can provide a reflective surface, such as are well known to those skilled in the art of manufacturing of integrated circuit chips, may be suitable as well. Attached to the free end 50 of the cantilever arm is a probe means 60 including a distal needle-like probe tip 62 adapted to contact and follow the surface contours of the specimen. The scanning means preferably also includes feedback control means 64 for driving the piezo tube in the vertical dimension as the probe tip traverses the contours of the specimen, to maintain a substantially constant force of the probe means against the surface of the specimen. A laser light source means 70 such as a laser diode with associated optics, is mounted in the upper portion of the body for producing a focused laser beam 72 directed at and deflected by the reflective cantilever arm. One preferred laser diode is a 3 milliwatt laser diode which produces a beam in the 670 nm range, and is commercially available. An opening 73 is provided in the removable base to allow the laser beam to pass through to the cantilever arm. Preferably three or more adjustment screws 74 for adjusting the alignment and aiming of the laser light source are mounted in threaded access ports 76 provided in body. A reflective means such as the planar mirror 80 is preferably mounted in the interior of the body at a distal end of an adjustment screw 82 through threaded access port 84 to reflect the deflected beam 86 to a photodetector 88 mounted to body for receiving the deflected laser beam. The photodetector generates an electrical output signal in response to the deflected laser beam indicative of the degree of deflection of the laser beam by the cantilever arm. The photodetector is mounted to receive the deflected laser beam through photodetector port 94 in the body, and is typically formed as an array of four photosensors 90, in which the top pair 92a is coupled to provide a combined signal, and the bottom pair 92b is coupled to provide a combined signal. The deflected laser beam is typically targeted at a central point between the top and bottom portions of the photodetector, and the combined signals from these portions are processed to generate output signals which can be compared to produce a differential error signal by control means 64. Additionally, the left and right halves of the array of photosensors may be summed for scanning in a frictional force mode. The control means preferably comprises microprocessor means 102 electrically connected to the photodetector means to receive the output signals indicative of deflection of the laser beam from the optical lever arm means, and to generate the error signal indicative of a variance from the constant amount of force of the probe tip against the specimen surface. The control means is electrically connected to an electrical drive means 104 in the scanning means which is responsive to the error signal for raising and lowering the specimen with respect to the probe tip for increasing or decreasing the force of the probe tip against the specimen surface to maintain the substantially constant amount of force of the probe tip against the specimen surface. Means 110 for viewing the probe and adjacent surface contours of the specimen are disposed in accessory port 112 in the body of the microscope as well. An accessory objective optical device 114 or eyepiece is preferably provided in the accessory port to allow a user to view the probe and specimen. Although the accessory objective optical device preferably comprises one or more lenses focusing on the probe tip and cantilever arm, the accessory objective optical device may also include a charge couple device 115 mounted to the body adjacent to the bore and directed to image the probe means through the bore. In one alternate preferred embodiment, the removable base 116 includes a chamber 118 which is dimensioned to receive a sealed cell 120 for containing the specimen. The sealed cell can be provided with a selected gas or liquid environment 122 for the specimen through ports 146a,b provided in the base for fluid transfer to the interior of the sealed fluid cell. The base includes an opening 124 for the optical path of the laser beam, with the opening being covered by an optical window 126, such as a thin pane of glass. The optical lever arm assembly includes the magnetic steel half washer member 128 magnetically secured to the body of the microscope, with the cantilever arm 130 mounted to the half washer member by an integral support member and bearing probe tip 132 extending into the fluid cell. The sample 134 is mounted on the stage 136, which in this embodiment includes an inner membrane seal 138 held in place in the fluid cell by a membrane frame member 142, and an outer O-ring seal 140 sealing the exterior of the fluid cell to the interior of the chamber of the base. The stage is in turn mounted on the lower piezo tube 144 of x,y,z scanning assembly, for raster scanning of the specimen and maintenance of a substantially constant force of the probe on the specimen. It has therefore been demonstrated that the scanning force microscope described provides for an improved mount for the probe of the microscope, which is easier to handle and install in the microscope. The improved mount also permits easier alignment of the laser beam onto the cantilever arm of the optical lever arm. The integrated optics of the microscope permits the user to view the approach of the lever arm and probe assembly to the surface of the sample to insure safe and precise positioning of the probe near the specimen. The scanning force microscope also includes the capability of receiving a sealed fluid cell for scanning a specimen in a fluid environment, which can significantly improve the quality of the image of the specimen produced by the instrument. It will be apparent from the foregoing that while particular embodiments of the invention have been illustrated and described, various modifications can be made without departing from the scope of the invention. Accordingly, it is not intended that the invention be limited, except as by the appended claims.

Claims: A scanning force microscope (10) for examining surface contours of a specimen (18), comprising: a stationary body (12), scanning means (22) for mounting a specimen (18) to be examined by said scanning force microscope (10), said scanning means (22) being secured to said stationary body (12) and adapted to move said specimen (18) in three degrees of freedom relative to said body (12); optical lever arm means (40) including a reflective surface (46); probe means (60) secured to said optical lever arm means (40) and including a probe tip (62) adapted to contact and follow the surface contours of the specimen (18); laser light source means (70) for producing a focused laser beam (72) directed at and deflected by said optical lever arm means (40); and photodetector means (88) for receiving said laser beam (72) deflected by said optical lever arm means (40) and generating an output indicative of the degree of deflection of said laser beam (72) by said optical lever arm means (40), characterised in that said optical lever arm means (40) is secured to said stationary body (12), said photodetector means (88) is mounted in said body (12), said probe means (60) is adapted to contact and follow the surface contours of the specimen (18) with a substantially constant amount of force, and said scanning force microscope (10) further includes means (110) for viewing said optical lever arm means (40) and said probe means (60) adjacent to said surface contours of said specimen (18), said means for viewing (110) being disposed in said stationary body (12) in fixed relation to said optical lever arm means (40) so as to permit easier alignment of the laser beam (72) onto the reflective surface (46) of said optical lever arm means (40). The scanning force microscope (10) of claim 1, wherein said means for viewing (110) comprises an accessory objective lens (114). The scanning force microscope (10) of claim 1, wherein said means for viewing (110) comprises a charge couple device (115). The scanning force microscope (10) of any preceding claim, wherein said optical lever arm means (40) comprises a reflective cantilever arm (46). The scanning force microscope (10) of claim 4, wherein said probe means (60) is mounted to a free end of said cantilever arm (46). The scanning force microscope (10) of any preceding claim, wherein said photodetector means (88) includes a photodetector mounted to said body (12), and further includes mirror means (80) mounted within said body (12) to deflect said laser beam (72) from said optical lever arm means (40) to said photodetector (88). The scanning force microscope (10) of claim 1, wherein said means for viewing (11C) comprises a bore (112) through said body (12) directed at said probe means (60), and an objective optical lens (114) disposed in said bore (112) focused on said probe means (60). The scanning force microscope (10) of claim 1, wherein said means for viewing (110) comprises a bore (112) through said body (12) directed at said probe means (60), and a charge couple device (115) mounted to said body (12) adjacent to said bore (112) and directed to image said probe means (60) through said bore (112). The scanning force microscope (10) of any preceding claim, wherein said scanning means (144) comprises a chamber (118) for receiving said specimen (18). The scanning force microscope (10) of any preceding claim, wherein said optical lever arm means (40) is magnetically secured to said body (12), The scanning force microscope of claim 10, wherein said optical lever arm means (40) comprises a magnetic steel member (42) magnetically secured to a magnetized portion (44) of said body (12), a reflective cantilever arm (46) secured to said magnetic steel member (42), and wherein said probe means (60) is mounted to a free end (50) of said cantilever arm (46). The scanning force microscope (10) of any preceding claim, wherein said scanning means (20) includes control means (64) for maintaining a constant force of said probe means (60) against said surface contours of said specimen (18). The scanning force microscope (10) of claim 12, wherein said control means (64) comprises means (102) connected to said photodetector means (88) for receiving said output signal indicative of deflection of said laser beam (72) from said optical lever arm means (40), means for generating an error signal indicative of a variance from said constant amount of force of said probe tip (62) against said specimen surface, and electrical drive means (104) responsive to said error signal for raising and lowering said specimen (18) with respect to said probe tip (62) for increasing or decreasing the force of said probe tip (62) against said specimen surface to maintain said substantially constant amount of force of said probe tip (62) against said specimen surface. The scanning force microscope (10) of claim 9, wherein said chamber (118) is adapted to receive a sealed cell (120) for containing said specimen (18). The scanning force microscope (10) of claim 14, wherein said sealed cell (120) contains a selected gas or liquid environment (122) for said specimen (18). A method of preparing a scanning force microscope (10) for examining surface contours of a specimen (18) in which the scanning force microscope (10) comprises a stationary body (12), scanning means (22) secured to said stationary body (12) and adapted for movement in three degrees of freedom relative to said body (12) ; optical lever arm means (40) secured to said stationary body (12) and including a reflective surface (46) ; probe means (60) secured to said optical lever arm means (40) and including a probe tip (62), said probe means (60) being adapted to contact and follow the surface contours of the specimen (18) with a substantially constant amount of force; laser light source means (70) for producing a focused laser beam (72); photodetector means (88) mounted in said body (12); and means (110) disposed in said stationary body (12) in fixed relation to said optical lever arm means (40) for viewing said optical lever arm means (40) and said probe means (60) adjacent to said surface contours of said specimen (18), the method comprising the steps of mounting a specimen (18) to be examined by said scanning force microscope to said scanning means (22); directing said focused laser beam (72) at said reflective surface (46) of said optical lever arm means (40); viewing said optical lever arm means (40) using said means for viewing (110); and aligning said laser light source (70) with said optical lever arm means (40) while viewing said optical lever arm means (40) so that said laser beam (72) is deflected by said optical lever arm means (40) and received by said photodetector means (88), said photodetector means (88) being adapted to generate an output indicative of the degree of deflection of said laser beam (72) by said optical lever arm means (40). The method of claim 16 comprising the additional step of bringing the probe tip (62) into contact with a surface of the specimen (18) while viewing said probe tip (62) using said means for viewing (110) so as not to damage the probe tip (62) by too abrupt an approach to the specimen (18). The method of claim 16 or claim 17, wherein the scanning force microscope (10) additionally comprises mirror means (80) mounted to the stationary body (12) and the method further comprises the step of aligning the mirror means (80) so as to reflect the laser beam (72) deflected by said optical lever arm means (40) to said photodetector (88). The method of any of claims 16 to 18, wherein said optical lever arm means (40) additionally comprises a magnetic steel member (42) and the method further comprises the step of magnetically securing said optical lever arm means (40) to said stationary body (12).

Inventors: GAMBLE RONALD C, WEST PAUL E, GAMBLE, RONALD C., WEST, PAUL E.
Applicants: TOPOMETRIX
Application year: 1993
Main classification: G01B7
IPC codes: G01N37, G01B21, H01J37, G01B7, G01B11, B01L7, G01Q10