Method and device for designing layout of milliwave or microwave integrated circuit

Abstract: A method of layout designing a milliwave or a microwave IC using a CAD system includes a step of displaying each of a plurality of kinds of concentrated constant circuit elements and distributed constant transmission lines of an IC chip to be designed on a CRT display (16) with a drawing object closed on the plane, which area and dimension represent electrical data, a step of connecting the drawing objects on the CRT display (16) by overlapping edges with each other and producing a virtual IC, a step of optimizing the layout of the virtual IC by changing the areas, dimensions, or arrangement of the respective drawing objects of the virtual IC so that the entire area of the virtual IC is as minimum as possible and the electrical characteristics of the virtual IC are desired ones, and a step of producing a mask pattern for IC production by logical operation between the drawing objects of the layout data of the virtual IC by utilizing the virtual IC which comprises collections of the drawing objects closed on the plane. Therefore, the data for optimizing layout of the IC comprises only the data required for electrical design of the integrated circuit to be designed, a memory required for executing a circuit simulation for optimizing the electrical characteristics is reduced, and the processing speed of the circuit simulation is reduced.

Description: The present invention relates to a method of, and an apparatus for, generating data defining a set of mask patterns for use in the manufacture of a millimetre-wave semiconductor integrated circuit (hereinafter referred to as milliwave IC) or a microwave semiconductor integrated circuit (hereinafter referred to as microwave IC). It also concerns methods of producing a set of masks or reticles, and of producing such integrated circuits. Conventionally, layout design of a milliwave or microwave IC using a computer aided design (CAD) system has been carried out as follows: storing circuit element data required for making a desired IC in a data base, determining a margin for alignment on the basis of a mask alignment precision and a processing precision in a transcribing step of an IC production process as a design rule employing a data format for producing a specific mask pattern (for example, CALMA GDSII format), and producing data for each mask pattern corresponding to each transcribing step with manual operation by a circuit designer on the basis of each respective design rule. Here, the mask pattern is a pattern corresponding to each transcribing step, which is drawn on a mask or a reticle employed in the IC production process. However, the mask pattern data is necessary as many times as there are transcribing steps in the IC production process. As described above, since the circuit designer must produce a mask pattern for each transcribing step considering each design rule in the process, skill is required for inputting and editing the data in producing each mask pattern, and further each mask pattern must be modified whenever the IC production process is changed, whereby such work requires much effort and time. Then, recently, as a method for reducing data inputting work by manual operation, a method for designing layout of a monolithic microwave IC (hereinafter referred to as MMIC) by a CAD system using a software on the market (for example, Academy of Eesof, MDS of HP, Microwave Musician of Cadence, Serenade of Compact Software), which can automatically generate a mask pattern of each circuit element from a circuit diagram of an IC to be designed, has been examined. Figure 18 is a flowchart illustrating this method of layout design. In this method of layout design, as shown in this flowchart, first, a mask pattern of each circuit element of an MMIC to be designed is automatically generated on a cathode ray tube (CRT) display from a circuit diagram of the MMIC, and the automatically generated mask patterns of the respective circuit elements are connected with each other, obtaining a diagram of a mask pattern of the whole MMIC. Then, the mask patterns for connecting part are input according to the connecting methods between the circuit elements to be connected, and the mask pattern of the whole MMIC is edited by, for example, leaving a space between the mask patterns of the respective circuit elements generated in the respective transcribing steps according to the design rule of the production process. Electrical parameters are extracted from the mask pattern of the whole MMIC after editing, and a circuit simulation is executed. When desired electrical characteristics are obtained, the operation is completed. When desired electrical characteristics are not obtained, further by changing the size and the configuration of the mask patterns for the connecting part and re-editing the mask pattern of the whole MMIC, the layout of the mask pattern of the whole MMIC is optimized. Here, in the above-described flow, after producing the diagram of the mask pattern of the whole MMIC, the mask patterns for connecting part are input according to the connecting methods between the respective circuit elements to be connected, because conductor layers having terminals used for connection are different every circuit element such as FET, MIM capacitor, and airbridge of the MMIC, and the connecting methods are different according to kinds of the circuit elements to be connected. After inputting the mask patterns for connecting part, the electrical parameters are extracted and a circuit simulation is executed, because it is necessary to adjust the electrical parameters of the whole MMIC considering the mask patterns for connecting part, since the size and the configuration of the connecting parts between the circuit elements influence electrical characteristics such as reflection, loss and phase in the milliwave or microwave IC. The conventional method for designing layout of the MMIC includes the above-described steps. Therefore, the data of the automatically generated mask pattern for every circuit element includes a pattern portion based on the design rules of the production process, i.e., electrically meaningless excessive data. In order to extract the electrical parameters and execute a circuit simulation as described above, a memory of a large capacity over 10MB is required. As a result, not only the design device itself (CAD system) is more expensive but also its processing speed is slower, lengthening the times for optimizing the layout. Especially, when a change in the production process is required, the new mask pattern on the basis of the design rule defined by the changed production process must be produced and input, and after editing the mask pattern of the whole MMIC, electrical parameters must be extracted and a circuit simulation must be executed again, further unfavorably lengthening the times for optimizing the layout. It is required to produce the mask patterns of the respective circuit elements as many as transcribing steps necessary for forming the respective circuit elements in the IC production process. In addition, when the IC production process is changed as described above, the new mask pattern must be formed in every changed transcribing step, resulting in high costs in developing and maintaining the CAD program. In the conventional CAD system, the terminal of the mask pattern of the circuit element is defined by a point, and the circuit elements are electrically connected by points. Therefore, for example, when a center point of a line width of a microstrip line (mask pattern for microstrip line) is determined as a connecting point, as shown in Figure 19(a), two mask patterns for microstrip line 2d and 2e extending in the same direction and having different widths with each other cannot be connected smoothly. And, as shown in Figure 19(b), in connecting perpendicularly two mask patterns for microstrip line 2f and 2g, the mask patterns overlap each other in the vicinity of the connecting point, or a vacancy is unfavorably formed in the vicinity of the connecting point. When such a discontinuous portion where the mask patterns are not smoothly connected is present, a microwave is reflected by this portion or a radiation loss is increased. As a result, the mask patterns must be modified on the CRT display, which is a troublesome operation. The above-described problems occur in designing layout of not only the microwave IC but also the milliwave IC. US Patent 5 031 111 and ALTA FREQUENZA, JAN. 1989, Milano, Italy, pages 39-44 GANNINI ET AL: "CAD FACILITIES FOR GaAs mmic MASK DESIGN and Generation" describe an automated method for designing microwave and milliwave integrated circuits making use of a library of microcell circuit designs. Embodiments of the present invention, which is defined in the appended claims, provide a method and apparatus for designing the layout of a milliwave IC or a microwave IC in which data for optimizing the layout can be constituted with the minimum amount of data necessary for electrical design of the IC and its processing speed is accelerated without requiring an expensive memory. Also the burden on a circuit designer is reduced due to simplification of the design work. In the preferred embodiment of the present invention, data for optimizing the layout of the IC to be designed comprises only the data required for electrical design of the IC to be designed, consequently memory storage of data required for executing a circuit simulation for optimizing the electrical characteristics is reduced relative to the conventional method, and the processing speed of the circuit simulation is reduced. And, the designing the layout and the generating the mask patterns are completely separated, whereby it is not necessary to perform the work for obtaining the layout data whenever the production process is changed, differently from the conventional method. Further, the layout design is performed without depending on an IC production process, and even if the IC production process, i.e., a producing apparatus and production environments are changed, a mask pattern for IC production is produced instantaneously in accordance with design rules of the changed IC production process. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a flowchart showing a designing process in a method for layout design in accordance with the present invention; Figure 2 is a block diagram showing a device for layout design in accordance with the present invention; Figure 3 is an equivalent circuit diagram illustrating a microwave IC designed by the device for layout design in accordance with the present invention; Figure 4 is a table showing drawing objects representing circuit elements of a microwave IC and connecting examples of the drawing objects which are shown on a CRT display of the device for layout design of Figure 2; Figures 5(a) and 5(b) are diagrams respectively illustrating a connecting example of two drawing objects for microstrip line having different widths, and a connecting example of two drawing objects for microstrip line extending in the perpendicular direction with each other, which are shown on the CRT display of the device for layout design of Figure 2; Figure 6 is a diagram illustrating a layout pattern of a virtual IC comprising the collections of drawing objects representing the circuit elements of the microwave IC shown on the CRT display of the device for layout design of Figure 2; Figure 7 is a diagram illustrating a mask pattern for producing an IC obtained by logical operation between drawing objects of layout data of the virtual IC of Figure 6; Figures 8(a) and 8(b) are enlarged views showing a connecting part between an MIM capacitor and a microstrip line in the virtual IC of Figure 6 and the mask pattern of Figure 7; Figure 9 is a diagram illustrating a mask pattern for a step of FET ion implantation; Figure 10 is a diagram illustrating a mask pattern for a step of forming FET ohmic electrodes; Figure 11 is a diagram illustrating a mask pattern for a step of forming an FET gate electrode; Figure 12 is a diagram illustrating a mask pattern for a step of forming MIM capacitor lower electrodes; Figure 13 is a diagram illustrating a mask pattern for a step of forming first contact holes; Figure 14 is a diagram illustrating a mask pattern for a step of forming MIM capacitor upper electrodes and wiring metals; Figure 15 is a diagram illustrating a mask pattern for a step of forming second contact holes (for connecting an airbridge metal and the wiring metal); Figure 16 is a diagram illustrating a mask pattern for a step of forming airbridge metals; Figure 17 is a diagram illustrating a mask pattern for a step of forming via-holes; Figure 18 is a flowchart showing a design process in the prior art method of layout design; and Figures 19(a) and 19(b) are diagrams respectively illustrating a connecting example of two mask patterns for microstrip line having different widths and a connecting example of two mask patterns for microstrip line extending in the perpendicular directions with each other, which are shown on a CRT display of the prior art device for layout design. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT Figure 2 is a block diagram showing a hardware constitution of a CAD system in accordance with the present invention. This computer aided layout design system comprises a central processing unit (CPU) 10, a data input/output system 20 for storing the data required for layout designing an integrated circuit (IC) and inputting/outputting data, an image display unit 30 for converting the data from the CPU 10 into image information and displaying it on a CRT display, and a data file storage device 40 for storing a data file produced in the CPU 10. Here, the data input/output system 20 comprises an input device 13 comprising a keyboard, a mouse and the like for inputting the data, orders and design signals required when a circuit designer designs the layout of the IC, a disk device 12 storing the drawing data for displaying the respective circuit elements of the microwave IC, i.e., lumped circuit elements such as FET and MIM capacitor, and distributed constant transmission lines such as microstrip line with drawing objects closed on the plane for every element on the CRT display 16, a printer 14 for outputting the data stored in the disk device 12 or the image displayed on the CRT display 16 of the image display unit 30 at need, and a main storage 11 for memorizing control programs for the input device 13, the disk device 12, the printer 14 and the like. The central processing unit 10 comprises means for controlling image display 10a for receiving the design signals from the circuit designer, decoding the signals and changing the size, the configuration and the arrangement of the drawing objects displayed on the CRT display 16 according to the design signals, means for producing a layout data file 10b of a virtual IC produced on the CRT display 16 by the image display controlling means 10a, means for executing a circuit simulation 10d of the virtual IC produced on the CRT display 16 by the image display controlling means 10a, and means for producing a mask pattern 10c for IC production by logical operation between drawing objects of the layout data of the virtual IC. The image display unit 30 comprises an image data conversion device 15 for converting the data from the data input/output system 20 and the CPU 10 into image data, and the CRT display 16 for displaying images. A layout data file produced in the layout data file producing means 10b is stored in the data file storage device 40, and data for logical operation, which is produced on the basis of the design rule in the actual production process for specifying the logical operation in the mask pattern producing means 10c, is memorized in the disk device 12. On the other hand, Figure 3 is a circuit diagram illustrating a microwave IC of which layout is designed by this CAD system. In the figure, reference numeral 2 designates a microstrip line, numeral 3 designates an MIM capacitor, numeral 6 designates a via-hole, numeral 7 designates a bonding pad, and numeral 8 designates an FET. A process of layout designing the microwave IC of Figure 3 is described with reference to the flowchart of Figure 1. First, while looking at the circuit diagram of the microwave IC of Figure 3, when a designer inputs signals for specifying the respective circuit elements of the microwave IC of Figure 3 and the coordinate data for displaying the circuit elements in a predetermined portion on the CRT display 16 from the input device 13, the drawing data representing the circuit elements respectively corresponding to the circuit elements of the microwave IC is read from the drawing data specifying a plurality of kinds of lumped circuit elements and distributed constant transmission lines, which are stored in the disk device 12, and the drawing data is displayed as a drawing object on the CRT display 16 of the image display unit 30 (step S1). Figure 4 is a table of drawing objects representing the drawing data of the circuit elements stored in the disk device 12, which are displayed on the CRT display 16. As shown in this figure, the lumped circuit element such as resistor, FET, MIM capacitor, via-hole, bonding pad, and airbridge is displayed with a drawing object closed on the plane, comprising a rectangle or a combination of a rectangle and a circle, on the CRT display 16. Here, the configurations and dimensions of the respective drawing objects represent electrical data of the respective circuit elements. The drawing objects are represented by enlarging the actual dimensions of the circuit elements with the same ratio, so that a wave propagation distance and isolation between the circuit elements can be visually monitored. For instance, an explanation will be given with taking an MIM capacitor as an example. Since the capacitance of the MIM capacitor is assigned in the circuit diagram of Figure 3, the area of the capacitor having this assigned capacitance is determined, and the capacitor is represented by a rectangle corresponding to the area. At this stage, however, since the aspect ratio of the rectangle is not determined, the capacitor is represented by a square as far as the ratio is not assigned. In the distributed constant line such as microstrip line, since a line impedance and an electrical length are determined at a point of time of designing the circuits, a line width is determined from the line impedance and a physical length is determined from the electrical length, representing the capacitor with a drawing object closed on the plane. Here, the respective drawing objects are coded with color on the CRT display. Further, as shown in Figure 4, at the same time, a rectangular connecting part is represented on the side part of the circuit elements, which shows a connecting margin between the different circuit elements in the actual production process. This connecting part is represented with a rectangle smaller than a drawing object specifying the circuit element. In the figure, a rectangle with X and a rectangle with are connected with different conductor layers of the circuit element. Secondly, when the designer inputs the design signals (connecting orders) from the input device 13 on the basis of the circuit diagram of the microwave IC of Figure 3, the image display controlling means 10a decodes these design signals, moves the drawing objects displayed on the CRT display 16 according to the design signals, as shown in the connecting examples of Figure 4, overlaps the edges of the respective drawing objects to be connected, and produces a virtual IC comprising the collections of the drawing objects closed on the plane (step S2). Here, when it is difficult to connect the circuit elements, since the configurations and the dimensions of the drawing objects representing lumped circuit elements such as FET and MIM capacitor are not changed because they are determined on the basis of the electrical data of the elements, the elements are connected by bending the drawing object representing the distributed constant line such as microstrip line. When the lengths of the edges of the drawing objects to be connected are different, for example, as shown in Figure 5(a), connection of drawing objects representing two microstrip lines which extend in the same direction and have different line widths with each other, is performed by displaying a trapezoidal drawing object representing a microstrip line 2c between two microstrip lines 2d and 2e having different line widths and by connecting these two drawing objects through this trapezoidal drawing object. And, as shown in Figure 5(b), connection of drawing objects representing two microstrip lines perpendicularly extending with each other is performed by displaying an L-shaped drawing object representing a microstrip line 2h between the drawing objects representing two microstrip lines 2f and 2g perpendicularly extending with each other and by connecting these two drawing objects through this L-shaped drawing object. Thirdly, when the designer inputs the order signals for executing a circuit simulation from the input device 13, the circuit simulation executing means 10d executes a circuit simulation of the virtual IC (layout pattern) (step S3). Next, when the designer inputs the design signals for changing the dimension and the configuration of the drawing objects corresponding to the circuit elements displayed on the CRT display 16 from the input device 13, according to the simulation results displayed on the CRT display 16, so that electrical parameters of the respective circuit elements, for example, a line length of the microstrip line, a capacitance of the MIM capacitor and the like, have a desired value, the image display controlling means 10a decodes these design signals, changes the dimension of each drawing object corresponding to each circuit element according to the design signals, and re-displays the changed virtual IC on the CRT display 16 (step S4). Then, when the designer, looking at the CRT display 16, inputs design signals for changing the arrangement of the drawing objects corresponding to the lumped circuit elements such as FET and capacitor, and a manner for bending the drawing objects corresponding to the distributed constant lines such as microstrip line from the input device 13, so that the area of the chip is minimum, and the arrangement of the input and output pads matches the specification, without basically changing the connecting constitution of the virtual IC obtained at the step S4, the image display controlling means 10a decodes the design signals, changes the arrangement and the configurations of the drawing objects according to the design signals, and optimizes the layout of the virtual IC (step S5). Next, when the designer inputs the order signals for executing a circuit simulation from the input device 13, the circuit simulation executing means 10d divides the drawing object of each circuit element of the virtual IC into smaller patches, extracts the electrical parameters by calculating electro-magnetic coupling between the patches on the basis of the electro-magnetic field analysis theory, and executes a circuit simulation using the extracted parameters (steps S6 and S7). Then, if the simulation result is a desired value (step S8), the designer inputs the orders for producing a layout data file from the input device 13. The layout data file producing means 10b receiving the orders, produces a data file from the layout data of the virtual IC which layout is optimized, and stores the produced data file in the data file storage device 40. When the simulation result is not a desired value, the above-described steps S5 to S7 are repeated, and a layout data file is produced at the time when the simulation result is a desired value (step S9). Figure 6 shows a virtual IC in which the layout displayed on the CRT display 16 is optimized. In the figure, the same reference numerals as those of Figure 3 designate the drawing objects corresponding to the circuit elements explained in Figure 3. Reference numeral 1 designates an IC chip, numeral 4 designates a drawing object representing a connecting part of an MIM capacitor lower electrode, numeral 5 designates a drawing object representing a connecting part of an MIM capacitor upper electrode, numeral 8 designates a drawing object representing an FET and numeral 9 designates a drawing object representing a connecting part of an FET. In addition, when the designer inputs the orders for producing a mask pattern from the input device 13, the mask pattern producing means 10c receives the order signals, reads the layout data for displaying the virtual IC of Figure 6 from the data file storage device 40, reads processing data produced on the basis of the design rule in the actual production process, i.e., a producing apparatus and production environments from the disk device 12, performs logical operation between the drawing objects of the layout data on the basis of the processing data, and generates a mask pattern for IC production shown in Figure 7 on the CRT display 16 (steps S10 and S11). Here, a production process of the microwave IC shown in Figure 3 comprises a step of ion implantation of an FET part, a step of forming FET part ohmic electrodes, a step of forming an FET part gate metal, a step of forming MIM capacitor lower electrodes, a step of forming first contact holes, a step of forming MIM capacitor upper electrodes and wiring metals, a step of forming second contact holes, a step of forming airbridge metals, and a step of forming via-holes. The above-described logical operation between the drawing objects is performed corresponding to these respective steps, by oversizing of the drawing objects, logical AND/OR operation between the drawing objects, and the like. Figures 9 to 17 show mask patterns formed by logical operation in the respective steps, and Figure 7 shows a mask pattern including all these mask patterns displayed on the CRT display. The detailed description will be given of the logical operation, taking connecting parts between the MIM capacitor and the microstrip line as an example. Figure 8(a) shows the connecting parts between the MIM capacitor and the microstrip line of the layout data read from the data file storage device 40. Figure 8(b) shows the connecting parts between the MIM capacitor and the microstrip line in a mask pattern for IC production obtained from the layout data. As shown in the figures, a mask pattern 3a of the MIM capacitor upper electrode is produced by copying the MIM capacitor 3 as it is. A mask pattern 3b of the MIM capacitor lower electrode is produced by logical OR operation between the MIM capacitor 3 and the MIM capacitor lower electrode connecting part 4, and further by oversizing of the result of this OR operation. Here, the amount of the oversizing is set by the above-described design rule. A mask pattern 2a of the wiring metal to be a microstrip line on the side of the MIM capacitor lower electrode is produced by logical AND operation between the result of OR operation between the MIM capacitor lower electrode connecting part 4 and the microstrip line 2, and a complementary set of an oversizing of the MIM capacitor. A mask pattern 4a of a contact hole connecting the MIM capacitor lower electrode and the microstrip line is produced by AND operation between the mask pattern 2a of the wiring metal and the mask pattern 3b of the MIM capacitor lower electrode, and further by undersizing of the result of this AND operation. Similarly, the following mask patterns are produced by logical operation between drawing objects: a mask pattern 2b of the microstrip line on the side of the MIM capacitor upper electrode, a mask pattern 5a of the airbridge metal for connecting the MIM capacitor upper electrode to the microstrip line 2, a mask pattern 5b of a contact hole for connecting the airbridge metal to the microstrip line 2, and a mask pattern 5c of a contact hole for connecting the airbridge metal to the MIM capacitor upper electrode. In such a method for designing layout in accordance with the present invention, the circuit elements of the milliwave IC or the microwave IC are displayed on the CRT display 16 with rectangular drawing objects of which area and dimension represent electrical data, the virtual IC is produced by connecting the drawing objects on the CRT display 16, the layout of the virtual IC is optimized so that its electrical characteristics may be equal to those of an IC to be designed, and its area may be minimum, and a mask pattern for IC production is obtained from the layout data of the virtual IC. Therefore, the layout of the IC to be designed is designed only by the data required for electrical design, a memory required for executing a circuit simulation is reduced relative to the conventional method, a device for designing layout is produced with low cost, and the processing speed of a circuit simulation is accelerated, reducing times for design work. Since the mask pattern for IC production is produced by logical operation between drawing objects of the layout data of the virtual IC, differently from the conventional method, it is not necessary to optimize the layout of the mask patterns every time the production process is changed, thereby simplifying the design work. When the drawing objects corresponding to the circuit elements are displayed on the CRT display, the rectangular drawing objects representing connecting margins between the elements in the actual production process are displayed on the side parts of the respective drawing objects at the same time. Therefore, in changing the dimension, the configuration and the arrangement of the drawing objects, the elements to be kept apart are not brought too close to each other, simplifying the design work and increasing design precision. In connecting the drawing objects representing the circuit elements on the CRT display, since overlapping the edges of the respective drawing objects is prescribed as a rule, the virtual IC is produced so that the wiring structure may be extremely close to that of the actual IC, increasing design precision. Since an electro-magnetic coupling between the circuit elements of the virtual IC is calculated on the basis of the electro-magnetic field analysis theory, and a circuit simulation is executed considering the electro-magnetic coupling between the circuit elements, the layout of the virtual IC is optimized considering the change of the electrical characteristics after connecting the circuit elements, further increasing design precision. While in the above-described embodiment the drawing objects representing the connecting parts are added to the drawing objects corresponding to the circuit elements to be generated on the CRT display, when producing the drawing objects corresponding to the circuit elements, the connecting part can be represented as a segment of a part of the drawing object corresponding to the circuit element, and thereafter, the connecting part can be represented as a drawing object closed on the plane by logical operation using the drawing objects corresponding to the circuit elements on the CRT display. For example, the connecting part 4 of the MIM capacitor lower electrode illustrated in Figure 8(a) is produced by logical AND operation between the oversizing of the MIM capacitor 3 and the microstrip line 2. While the mask pattern producing means 10c is disposed in the same central processing unit 10 as the other image display controlling means 10a, the circuit simulation executing means 10d and the layout data file producing means 10b in the above-described embodiment, the mask pattern producing means 10c is disposed in a central processing unit of another CAD system, and the virtual IC and the mask pattern for IC production can be respectively produced in the different CAD systems. It will be appreciated that other forms of display device other than a cathode ray tube display may be used. Such alternative forms of display devices may, for example, include liquid crystal displays.

Claims: A method of generating data defining a set of mask patterns (e.g. figs. 9-17) for use in the manufacture of a millimetre-wave or microwave semiconductor integrated circuit, which method is performed by system steps of: selecting (S1), in response to received signals, drawing object data from amongst drawing object data stored in a data storage unit (12), which stored drawing object data defines simplified drawing objects (e.g. fig. 4; fig. 6: 2-7) each closed in a two-dimensional plane, each representing a respective one of various active elements (fig. 3: 2-7), other lumped circuit elements, and distributed constant transmission lines, for constituting millimetre-wave or microwave integrated circuits, the areas and dimensions of the simplified drawing objects being defined to correspond to electrical data of the respective lumped circuit elements and distributed constant transmission lines, the defined dimensions being proportional to respective actual dimensions of the corresponding lumped circuit elements and distributed constant transmission lines; displaying (S1), in response to the selected drawing object data, selected simplified drawing objects (2-9) on a screen (16) of a display unit (30); defining a circuit layout (1) by repositioning and connecting (S2) the selected simplified drawing objects (2-8) displayed on the screen, in response to received signals, so as to correspond to the circuit diagram (e.g. fig.3) of the integrated circuit which is to be manufactured, the connected simplified drawing objects thereamongst having respective edges thereof superposed; accessing (S10), in response to received signals, stored processing data, including design rules information data, for each of the processes that are to be employed in the manufacture of the integrated circuit; and generating (S11) the data defining the set of mask patterns by performing logical operations on the connected simplified drawing objects, using the accessed processing data and data defining the defined circuit layout. A method according to claim 1 in which, between the steps of defining the circuit layout (S2) and accessing the stored processing data (S10), there is executed a circuit simulation (S3,S7) for the defined circuit layout and the areas and the dimensions of the simplified drawing objects are changed (S5) in response to the simulation to obtain desired electrical characteristics for the manufactured integrated circuit to thereby optimise the defined circuit layout. A method according to either of claims 1 or 2 in which, between the steps of defining the circuit layout (S2) and accessing the stored processing data (S10), there is performed a step of changing (S5) the arrangement of the simplified drawing objects representing the lumped circuit elements and the configurations of the simplified drawing objects representing the distributed constant transmission lines, to reduce area of the circuit layout on the screen of the display unit while maintaining desired electrical characteristics of the circuit represented, thereby optimising the defined circuit layout. A method according to any of claims 1 to 3 wherein the simplified drawing objects representing the lumped circuit elements have, in part, connection segments each corresponding to an overlap margin of error between connected circuit elements to allow for tolerance in the manufacturing process. A method according to claim 3, depending from claim 2, including a step of calculating (S6) the electromagnetic coupling between circuit elements represented by the simplified drawing objects and executing the circuit simulation for the defined circuit layout based on this calculation; and performing the step of changing (S5) the arrangement of the simplified drawing objects, representing the lumped circuit elements, and the configurations of the simplified drawing objects, representing the distributed constant transmission lines in response to the circuit simulation. A method of producing a set of masks or reticles for use in the manufacture of a millimetre-wave or microwave semiconductor integrated circuit, which method is performed by: generating (S1-S11) data defining a set of mask patterns (e.g., figs. 9-17) for use in the manufacture of the integrated circuit by the method of any of claims 1 to 5; and transcribing the respective mask patterns onto respective mask or reticle blanks using the generated data obtained by said method. A method of manufacturing a millimetre-wave or microwave semiconductor integrated circuit, which method is performed by: producing a set of masks or reticles by the method of claim 6; using said set of masks or reticles in the manufacture of the integrated circuit; and completing said manufacture. A method according to claim 7 wherein: the integrated circuit includes a field effect transistor (FET) active element, MIM capacitors, and distributed constant transmission lines; and mask pattern defining data is generated and respective patterned masks or reticles are produced and used for each of the following steps which are performed in the manufacture of the integrated circuit, namely; a step of ion implantation for FET definition; a step of forming FET ohmic electrodes; a step of forming FET gate metal; a step of forming MIM capacitor lower electrodes; a step of forming first contact holes; a step of forming MIM capacitor upper electrodes and transmission line wiring metals; a step of forming second contact holes; a step of forming airbridge metals, and a step of forming via holes. Apparatus for performing the method of claim 1, comprising: a data storage unit (12) having stored therein drawing object data defining simplified drawing objects (2-8) each closed in a two-dimensional plane, representing a respective one of various active elements (8), other lumped circuit elements (3,6,7), and distributed constant transmission lines (2), for constituting millimetre-wave or microwave integrated circuits, the areas and dimensions of the simplified drawing objects being defined to correspond to electrical data of the respective lumped circuit elements and distributed constant transmission lines, the defined dimensions being proportional to respective actual dimensions of the corresponding lumped circuit elements and distributed constant transmission lines; a screen display control unit (10) adapted for (a) selecting, in response to received signals,, drawing object data from amongst the drawing object data stored in said data storage unit (12), which selected drawing object data is to represent the circuit elements of the integrated circuit that is to be manufactured, and (b) controlling the display of the simplified drawing objects represented by the selected drawing object data on the screen (16) of a display unit (30), including repositioning the displayed drawing objects and connecting displayed drawing objects by superposing respective edges thereof to define the circuit layout; and a mask pattern defining data generating unit (10b), responsive to received signals, adapted for accessing processing data, including design rule information data for each of the processes employed in the manufacture of the integrated circuit, and for generating said mask pattern defining data by performing logical operations on the connected simplified drawing objects using the accessed processing data and data defining the defined circuit layout. Apparatus according to claim 9 further comprising said display unit (30).

Inventors: SASAKI YASHINOBU, TANINO NORIYUKI, SASAKI, YASHINOBU, TANINO, NORIYUKI, SASAKI, YASHINOBU, C/O MITSUBISHI DENKI K.K., TANINO, NORIYUKI, C/O MITSUBISHI DENKI K.K.
Applicants: MITSUBISHI ELECTRIC CORP, MITSUBISHI DENKI KABUSHIKI KAISHA
Application year: 1993
Main classification: G06F17
IPC codes: H01L21, H01L27, G06F17