Semiconductor photo-electron-emitting device

Abstract: This invention relates to a semiconductor photo-electron-emitting device for emitting photoelectron excited from the valence band to the conduction band by incident photons on the semiconductor layer (11). The device includes a Schottky electrode (13) formed on the emitting surface (14) on a surface of the semiconductor layer (15), and a conductor layer (12) formed on a surface opposite to the emitting surface. A set bias voltage (VB) is applied between the Schottky electrode (13) and the conductor layer (12) to accelerate photoelectron generated by the excitation by incident photons to the emitting surface and to transfer the accelerated photoelectron from an energy band of a smaller effective mass to an energy band of a larger effective mass.

Description: Background of the Invention [Field of the Invention] This invention relates to a semiconductor photo-electron-emitting device which is a photodetecting device having sensitivity to the light in long wavelength. [Related Background Art] In applying an electric field to a semiconductor photo-electron-emitting device from the outside to accelerate photoelectron generated by the excitation by incident photons, generally an electrode having Schottky junction is formed on the semiconductor layer, and a bias voltage is supplied by the electrode to apply an electric field thereto. The conventional photo-electron-emitting devices using semiconductors use this electron transfer effect. An example which does not use the electron transfer effect is Japanese Patent Laid-Open Publication No. 254323/1990. The electron transferred semiconductor photo-electron-emitting device this invention relates to uses the above-described electron transfer effect. An electron transferred photo-electron-emitting device is disclosed by, e.g., R.L. Bell U.S. Patent No. 3,958,143. In the R.L. Bell U.S. patent a Schottky electrode is prepared by forming an Ag thin film by vacuum evaporation on a III-V group compound semiconductor, and supplying a bias voltage from the electrode to apply an electric field to the semiconductor layer so that photoelectron are accelerated. Such electron transferred photo-electron-emitting devices have structures exemplified below. Incident photons hν are absorbed to generate photoelectron by the excitation. An ohmic electrode is formed on one side of a semiconductor layer, on the other side thereof a Schottky electrode being formed of an Ag thin film in the shape of an island, and a Cs₂O layer is formed on the Schottky electrode. A bias voltage is applied between the Schottky electrode and the ohmic electrode to apply an electric field to the semiconductor layer, and photoelectron generated in the semiconductor layer by the excitation are accelerated. The accelerated photoelectron are transferred from a Γ-valley of the conduction band to a higher-energy L-valley by electron transfer effect (the so-called Gun effect) before they arrive at the emitting surface, and then are emitted into vacuum. But in a photoelectronic conversion device having the above-described photoelectron emitting surface, especially the so-called reflecting photo-electron-emitting device, which admits incident photons on the side of the emitting surface, the incident photons hν are absorbed by the Schottky electrode formed on the emitting surface without arriving at the semiconductor layer. This results in much deterioration of the photoelectronic conversion efficiency. In view of this, in the conventional electron transferred semiconductor photo-electron-emitting device, to cause incident photons hν to be efficiently absorbed, the Schottky electrode is formed of an about 100 Å-thickness thin film. It is known that in evaporating a metal on a semiconductor layer in a thickness of about 100 Å, the metal is distributed not in a layer, but in shapes of islands. In the above-described electron transferred semiconductor photo-electron-emitting device, the Schottky electrode is in the form of islands. Photoelectron generated by the excitation by incident photons hν pass through the island-shaped electrode or between islands of the electrode to be emitted into vacuum through the Cs₂O layer. Thus, an emission probability of the photoelectron much depends on a film thickness of the Schottky electrode, and a gap between the islands of the electrodes. Their control is very difficult. Furthermore, a gap between the islands of the electrodes much depends on the heat treatment following the evaporation, and degassing and cleaning at high temperatures are impossible. Eventually its performance as the photo-electron-emitting surface is much deteriorated. Thus, film thickness of the Schottky electrode of a thin film and the gaps between the islands of the electrode strongly influence the optical transmission of incident photons h v , and the emission probability of photoelectron into vacuum, which are generated by the excitation by the incident photons h v . It is difficult to fabricate a stable Schottky electrode with high reproductivity, and the conventional electron transferred semiconductor photo-electron-emitting devices have not been put to practical uses. EP 0259878 discloses an electron emission element comprising a P-type semiconductor substrate having a conductor layer provided on one side and spaced apart electrodes provided on the other side. A bias voltage is applied between the conductor layer and the electrodes to promote electron emission in response to incident light. It would be desirable to provide a semiconductor photo-electron-emitting device including a stable and heat-resistant Schottky electrode formed with high reproductivity which has improved transmission of incident photons and emission probability of the photons into vacuum, whereby photodetection with high sensitivity can be realized. Summary of the Invention This invention relates to a semiconductor photo-electron-emitting device for accelerating, by applying an electric field, photoelectrons excited from the valence band of the semiconductor layer to the conduction band thereof by incident photons, and transferring the photoelectrons to the emitting surface, whereby the photoelectrons are emitted into vacuum, the semiconductor photo-electron-emitting device including an electrode in a required shape for applying a bias voltage. There is thus provided a semiconductor device for emitting electrons excited from a valence band to a conduction band by incident photons, comprising: a semiconductor layer; an electrode provided on the emitting surface of said semiconductor layer in a pattern which exposes the emitting surface in a substantially uniform manner; and a conductor layer provided on a side of the semiconductor layer opposite to the emitting surface, a bias voltage being applied between the electrode and conductor layer, so that excited electrons are transferred to the emitting surface, characterised in that said emitting surface of said semiconductor layer has concavities and convexities formed therein, said electrode being formed on said convexities. Patterning an electrode improves its reproductivity. At the same time, the optical transmission of incident photons on the semiconductor layer, and the emission probability of the photoelectron into vacuum is improved. Furthermore, the electrode can have a sufficient thickness, and a surface resistance of the electron emitting surface can be much lowered. Good linear outputs can be obtained from low illuminance to high illuminance. Temperature characteristics of the electrode can be improved. The electron emitting surface of the electrode after formed can be chemically etched for cleaning the surface. A width of the electrodes can be decreased to much reduce dark current. The present invention will become more fully understood from the detailed description given herein below and the accompanying drawings which are given by way of illustration only, and thus are not to be considered as limiting the present invention. Further scope of applicability of the present invention will become apparent from the detailed description given hereinafter. However it should be understood that the detailed description and specific examples, while indicating preferred embodiments of the invention, are given by way of illustration only, since various changes and modification within the spirit and scope of the invention will become apparent to those skilled in the art from this detailed description. Brief Description of the Drawings FIG. 1 is a sectional view of a semiconductor photo-electron-emitting device shown to explain the invention; FIG. 2 is a view of an energy band of the electron transferred semiconductor photo-electron-emitting device of figure 1 in operation; FIG. 3 is a view of an electron transfer effect in GaAs; FIG. 4 is a view of photo-electron-emitting spectral sensitivity characteristic when a bias voltage is varied; FIG. 5 is a sectional view of the semiconductor photo-electron-emitting device according to a first embodiment of this invention for explaining the structure; FIG. 6 is a sectional view of the semiconductor photo-electron-emitting device according to a second embodiment of this invention; FIG. 7 is a sectional view of the semiconductor photo-electron-emitting device according to a third embodiment of this invention; FIG. 8 is a perspective view of an embodiment of this invention using a mesh-patterned electrode; FIG. 9 is a view of a stripe-patterned electrode; FIG. 10 is a conical circles-patterned electrode; FIG. 11 is a sectional view of a side-on photomultiplier using the semiconductor photo-electron-emitting device according to one embodiment of this invention; FIG. 12 is a sectional view of a head-on photomultiplier using the semiconductor photo-electron-emitting device according to one embodiment of this invention; and FIG. 13 is a sectional view of an image intensifier using the semiconductor photo-electron-emitting device according to one embodiment of this invention. Description of the Preferred Embodiments The semiconductor photo-electron-emitting device according to embodiments of this invention will be explained below. The embodiments will be explained by means of electron transferred semiconductor photo-electron-emitting devices of CsO/Al/InP or others. But this invention is not limited to the embodiments and is applicable to e.g., the material disclosed in U.S. Patent No. 3,958,143. FIG. 1 is a sectional view of an electron transferred semiconductor photo-electron-emitting device which does not form part of the invention, shown to help explain the invention. An ohmic electrode 12 is formed on the surface of one side of a p-InP semiconductor layer 11 formed by vacuum evaporating AuGe. On the other side of the InP semiconductor layer there is formed a Schottky electrode 13. Schottky electrode 13 is formed by vacuum evaporating Al in a film thickness of about 2000 Å, and then photolithograhing the Al film into a mesh pattern of a 10 µm-width and a 150 µm-interval. It is preferable that the interval of the mesh pattern of the Schottky electrode 13 is as small as possible so as to increase an electron escape probability. An optimum value of the pattern interval is available based on an emission probability of photoelectron into vacuum, and a probability of generation of the Gun effect (Γ to L transfer) by an applied electric field. The optimum value is about 10 µm at a bias voltage of 5 V. The film thickness of Al of the Schottky electrode 13 can be any desired thickness as long as the Schottky electrode 13 has a layer structure of about 100 Å or more thickness and can have a sufficient electric conductivity. To make the electron transferred semiconductor photo-electron-emitting device of such structure operative, the ohmic electrode 12 of AuGe is fixed to an matal plate by In, and an Au wire for applying a bias voltage VB is led from the Schottky electrode 13. To install this device in vacuum, the device is evacuated into a high vacuum of about 10⁻¹⁰ Torr. Then the device is heated up to about 400 °C for degassing and cleaning. Following this, to lower an effective vacuum level, a trace of Cs and a trace of O₂ are deposited on the emitting surface 15, and a Cs₂O layer 14 is formed. FIG. 2 shows an energy band obtained when a bias voltage V B is applied to the thus-formed electron transferred semiconductor photo-electron-emitting device to operate the device. In FIG. 2, CB represents a conduction band, VB represents a valence band, FL indicates a Fermi level, and V.L. represents a vacuum level. Photoelectron are generated in the semiconductor by photons entering through the openings among the Schottky electrode 13 in a mesh pattern on the emitting surface 15. The excited photoelectron are accelerated by an electric field formed by the application of a bias voltage to the Schottky electrode 13 and transfer from a Γ valley of the conduction band to a L valley thereof, and arrive at the emitting surface 15. The photoelectron which have arrived at the emitting surface 15 pass between the Schottky electrode 13 and emitted into vacuum through the Cs₂O layer 4. The electron transfer effect involved in this invention means that electrons accelerated by an electric field are transferred from a smaller effective mass energy band to a larger effective mass energy band. This electron transfer effect is the so-called Gun effect, which J. B. Gun, IBM experimentally found in GaAs and InP in 1963. This effect will be explained below by means of InP. As shown in FIG. 3, the energy band of InP has two valleys in the conduction bands. The valley nearest to the valence band is at [000] of wave number vector (K) space, i.e., point Γ. The effective mass of electrons at the point is as small as m₁*=0.077 m₀ . The mobility at 300 K is as large as above 6000 cm²/V·s. At [111] in the K space, i.e., a point L there is a second valley having a higher energy by 0.36 eV than that at the point Γ. The effective mass at the point X is as large as m₂*=1.2 m₀ , and the mobility is as small as 100 cm²/V·s. In a weak electric field most electrons are in the lower band, but as the electric field becomes stronger to exceed a certain threshold electric field E th (about 3.2 kV/cm for InP), electrons begin to be transferred to the upper band due to the energy applied by the electric field. These electrons of higher energy are emitted into vacuum with higher probability, and resultantly a photo-electron-emitting device of higher sensitivity can be realized. FIG. 4 shows one example of Inp photo-electron-emitting spectral sensitivity characteristics obtained at room temperature when a bias voltage V B applied to the Schottky electrode 13 was varied. In FIG. 4 wavelengths [nm] of light are taken on the horizontal axis, and radiation sensitivities [mA/W] are taken on the vertical axis. The solid line characteristic curve 21 indicates a spectral sensitivity characteristic at a bias voltage V B of 0 [V], the one-dot line characteristic curve 22 indicates a spectral sensitivity characteristic at a bias voltage V B of 1 [V], the two-dot line characteristic curve 23 indicates a spectral sensitivity characteristic at a bias voltage V B of 2 [V], and the dot-line characteristic curve 24 indicates a spectral sensitivity characteristic at a bias voltage V B of 4 [V]. It is seen from FIG. 4 that photoemission increases as a bias voltage V B is increased. FIGs. 5, 6 and 7 are sectional views of electron transferred semiconductor photo-electron-emitting devices according to first, second and third embodiments of the invention. FIG. 8 is a perspective view of the surface structure of the photo-electron-emitting device of FIG. 5 with a part shown in a section. In each embodiment, a p-semiconductor layer 31, 41, 51 has one surface formed in concavities and convexties, and a Schottky electrode 33, 43, 53 is formed on the top of each of the convexties. The concavities and the convexties on the surface of the semiconductor layer 31, 41, 51 are formed by chemical etching with the Schottky electrode 33, 43, 53 in a mesh pattern as a mask, In forming a mesh electrode pattern, a suitable plane direction is selected, and the anisotropy of etching is used, whereby the three kinds of concavities and convexties as shown can be formed. Subsequently, a Cs₂O layer 34, 44, 54 is formed on the emitting surface 35, 45, 55 in the same way as in the first embodiment. On the other surface of the semiconductor layer 31, 41, 51 an ohmic electrode 32, 42, 52 is formed. It is general that the electron velocity in a semiconductor is limited to below 10⁷ cm/s at the room temperature due to various dispersions. In the semiconductor photo-electron-emitting device of FIG. 1 most of the photoelectron generated by the excitation by incident photons are absorbed by the Schottky electrode 13, and few of the photoelectron can be emitted into vacuum. However, in each of the first, second and third embodiments the invention shown in FIGs. 5, 6 and 7, because the Schottky electrode is formed on the tops of convexities on the surface of the semiconductor layer, the velocity of the electrons is not limited to 10⁷ cm/s and almost reaches the light velocity of 3 x 10¹⁰ cm/s. Accordingly the probability of the photoelectron being absorbed by the Schottky electrode is decreased, their emission probability into vacuum being increased, and the photosensitivity is increased. In an actually prepared semiconductor photo-electron-emitting device having 1 µm-concavities and convexties, and Schottky electrode located on the tops of the convexities, the emission probability of photoelectron into vacuum was about twice, and the photosensitivity was increased about twice. The above-described embodiments are the so-called reflecting photo-electron-emitting device in which incident photons hv are incident on the emitting surfaces 35, 45, 55, but this invention is not limited to that type. That is, in the so-called transmitting photo-electron-emitting device in which incident photons hv are incident on the side opposite to the emitting surface as well, the ohmic electrode 32, 42, 52 is formed in a thin film or formed in a pattern to increase a transmission of the incident photons hν, whereby the transmitting photo-electron-emitting device can operate and produce the same advantageous effects as the above-described embodiments. The above-described embodiments are electron transferred semiconductor photo-electron-emitting devices, but the embodiments of FIGs. 5 to 8 of the invention having one surface of the semiconductor layers formed in concavities and convexities and having Schottky electrodes formed on the tops of the convexities are not limited to the electron transferred type. That is, this invention is applicable to all the semiconductor photo-electron-emitting devices in which photoelectron excited by incident photons hv from the valence band to the conduction band are accelerated by an electric field to be transferred to the emitting surface to be emitted into vacuum, and can still produce the same advantageous effects as the above-described embodiments. In the above-described embodiments, the Schottky electrodes 33, 43, 53 are in mesh patterns but are not limited to mesh patterns. As long as the Schottky electrode is formed in a pattern which allows the semiconductor layer to be exposed in a uniform distribution, the Schottky electrode may have any pattern, such as a stripe patterns, conical patterns or others. FIG. 9 is a front view of a stripe electrode pattern. FIG. 10 is a front view of a conical electrode pattern. These electrodes 63 are formed of the same material as in the above-described embodiments, and their stripe width and stripe interval are substantially the same as in the above-described embodiments. In the above-described embodiments, the materials of the Schottky electrodes is Al, but is not limited to Al, and can be, e.g., Ag, Au, Pt, Ti, Ni, Cr, W, WSi or their alloys. FIGs. 11, 12 and 13 show electron tubes using the electron transferred semiconductor photo-electron-emitting device (cathode) according to this invention. FIG. 11 is a sectional view of a side-on photomultiplier using the reflecting photo-electron-emitting cathode. FIG. 12 is a sectional view of a head-on photomultiplier using the transmitting photo-electron-emitting cathode. FIG. 13 is a sectional view of an image intensifier tube using the transmitting photo-electron-emitting cathode. In the photomultiplier of FIG. 11, the photo-electron-emitting cathode 72, a plurality of dynodes 73 and an anode 74 are provided inside a vacuum vessel 71. A mesh electrode 75 is provided on the front side of the photo-electron-emitting cathode 72. In the photomultiplier of FIG. 12, the photo-electron-emitting cathode 72 is provided on one end of a vacuum vessel 71, and a condenser electrode 76 is provided inside the vacuum vessel. In any of the photomultipliers, photoelectron (-e) are generated by incident photons hν and multiplied by the dynodes 73 to be detected by the anode 74. In the image intensifier of FIG. 13, the photo-electron-emitting cathode 72 is secured to the front opening of a cylindrical bulb 81, and an output face plate 72 of glass with a fluorescent film 83 applied to the inside surface is secured to the inside surface of a rear opening. A microchannel plate 84 having the electron multiplying function is provided inside the image intensifier tube. This electron tube can augment a feeble light image to an intensified light image. In the case that the photo-electron-emitting cathodes 72 are built in the vacuum vessels as in FIGs. 12 and 13, it is necessary that the photoemittng cathodes 72 per se are atmospheric pressure-resistant. These photo-electron-emitting cathodes are prepared by using a GaAlAs substrate as a support, growing an epitaxial layer as a photosensitive layer on the substrate, and forming a mesh electrode on the top surface of the epitaxial layer. It is needless to say that an InGaAs layer may be epitaxially grown on an InP substrate. As described above, according to this invention, a Schottky electrode for applying a bias voltage are formed in a pattern, whereby the Schottky electrode can be formed stable and heat-resistant with high reproductivity. In comparison with the conventional semiconductor photo-electron-emitting device having thin film Schottky electrode, the semiconductor photoemittng device according to this invention can have increased optical transmission of incident photons on the semiconductor, and increased emission probability of the generated photoelectron into vacuum. Furthermore, the semiconductor photo-electron-emitting device according to this invention can be fabricated with high reproductivity. From the invention thus described, it will be obvious that the invention may be varied in many ways. Such variations are not to be regarded as a departure from the spirit and scope of the invention, and all such modifications as would be obvious to one skilled in the art are intended to be included within the scope of the following claims.

Claims: A semiconductor device for emitting electrons excited from a valence band to a conduction band by incident photons, comprising: a semiconductor layer (31;41;51); an electrode (33;43;53;63) provided on the emitting surface of said semiconductor layer (31;41;51) in a pattern which exposes the emitting surface (35;45;55) in a substantially uniform manner; and a conductor layer (32;42;52) provided on a side of the semiconductor layer (31;41;51) opposite to the emitting surface (35;45;55), a bias voltage (V B ) being applied between the electrode (33;43;53;63) and conductor layer (32;42;52), so that excited electrons are transferred to the emitting surface (35;45;55), characterised in that said emitting surface (35;45;55) of said semiconductor layer (31;41;51) has concavities and convexities formed therein, said electrode (33;43;53;63) being formed on said convexities. A semiconductor device according to claim 1, wherein the accelerated electrons are transferred from an energy band of a smaller effective mass to an energy band of a larger effective mass. A semiconductor device according to claim 1 or claim 2, wherein the semiconductor layer (31;41;51) is formed of a III-V compound semiconductor. A semiconductor device according to any one of the preceding claims, wherein the semiconductor layer (31;41;51) and the electrode (33;43;53;63) are in Schottky contact with each other. A semiconductor device according to any one of the preceding claims, wherein the electrode (33;43;53;63) is formed of Al, Ag, Au, Pt, Ni, Cr, W or WSi, or their alloys. A semiconductor device according to any one of the preceding claims, wherein the electrode (33;43;53;63) is formed in a plane line pattern of a mesh (33), stripes (63) or a conical circle (63). A semiconductor device according to any one of the preceding claims, wherein the electrode (33;43;53;63) has a thickness equal to or larger than 100 Å. A semiconductor device according to any one of the preceding claims, wherein the line width of the electrode is equal to or smaller than 10 µm, and the interval between each line and its adjacent one is equal to or smaller than 100 µm. A semiconductor device according to any of the preceding claims, wherein Cs, Cs₂O, Rb, K, Na, CsF, or other alkali metals or their alloys, or their oxides is applied to the emitting surface (35;45;55). A semiconductor device according to any one of the preceding claims, wherein the conductor layer (32;42;52) is a metal layer which is in ohmic contact with the semiconductor layer (31;41;51). A photomultiplier comprising a vacuum vessel (71) with a light incident window, a semiconductor device (72) according to any one of the preceding claims in said vacuum vessel; and multiplying means (73) for secondary-electron multiplying of emitted electrons, incident photons being incident on an emitting surface of the semiconductor device (72). A semiconductor device according to any one of claims 1 to 9, wherein the conductor layer (32;42;52) is formed of a heavily-doped semiconductor substrate with a wide bandgap heterojuncture to the semiconductor layer (31;41;51). An electron multiplying electron tube comprising in vacuum vessel (81) and a semiconductor device (72) according to claim 12 in said vacuum vessel and multiplying means (84) for multiplying electrons emitted by said semiconductor device (72).

Inventors: ASAKURA NORIO C O HAMAMATSU PH, HIROHATA TORU C O HAMAMATSU PH, IHARA TUNEO C O HAMAMATSU PHOT, KUROYANAGI TOMIHIKO C O HAMAMA, MIZUSHIMA YOSHIHIKO C O HAMAMA, NAKAMURA KIMITSUGU C O HAMAMAT, NEGI YASUHARU C O HAMAMATSU PH, NIGAKI MINORU C O HAMAMATSU PH, SUZUKI TOMOKO C O HAMAMATSU PH, YAMADA MASAMI C O HAMAMATSU PH, ASAKURA,NORIO,C/O HAMAMATSU PHOTONICS K.K., HIROHATA,TORU,C/O HAMAMATSU PHOTONICS K.K., IHARA,TUNEO,C/O HAMAMATSU PHOTONICS K.K., KUROYANAGI,TOMIHIKO,C/O HAMAMATSU PHOTONICS K.K., MIZUSHIMA,YOSHIHIKO,C/O HAMAMATSU PHOTONICS K.K., NAKAMURA,KIMITSUGU,C/O HAMAMATSU PHOTONICS K.K., NEGI,YASUHARU,C/O HAMAMATSU PHOTONICS K.K., NIGAKI,MINORU,C/O HAMAMATSU PHOTONICS K.K., SUZUKI,TOMOKO,C/O HAMAMATSU PHOTONICS K.K., YAMADA,MASAMI,C/O HAMAMATSU PHOTONICS K.K.
Applicants: HAMAMATSU PHOTONICS KK, HAMAMATSU PHOTONICS K.K.
Application year: 1992
Main classification: H01J1
IPC codes: H01J1