X-ray detector and examination system

Abstract: An X-ray detector (6-1,6-2) has a transmission type intensifying screen (10) provided on the X-ray incident area (8a) of the detector body and a reflection type intensifying screen (11) provided on the inner wall surface of the detector body except for the X-ray incident area. Visible rays (a) from the transmission type intensifying screen (10) and (b) from the reflection type intensifying screen (11) are detected by a photomultiplier (12) installed in the detector body. The screens use the same or different fluorescent materials such as Gd₂O₂S:Tb; Gd₂O₂S:Tb, Ce; Gd₂O₂S:Tb, Yb; Gd₂O₂S: Pr; BaFC1:Eu; BaFBr:Eu; La₂O₂S:Tb; La₂O₂S:Tb, Ce; La₂O₂S:Tb, Yb; La₂O₂S:Pr; Y₂O₂S:Tb; Y₂O₂S:Tb,Ce; Y₂O₂S:Tb, Yb; and Y₂O₂S:Pr. The X-ray examination system utilizing such a detector is particularly suited for image identification from baggage in an airport, using Compton scattering X-rays.

Description: The present invention relates to an X-ray detector and an X-ray examination system to examine baggage, etc., using the X-ray detector. In general, prior to bringing baggage onto a commercial aircraft, the baggage is subject to an examination in order to secure safe operation of airplanes. A transmitted X-ray examination system in which X-rays are transmitted through the baggage, is well-known for carrying out such baggage examination. By this transmission X-ray examination system, metallic products, such as metallic guns, edged tools, etc., can be relatively easily detected. However, such substances composed mainly of elements with small atomic numbers, such as plastic explosives, drugs, etc., are not readily detected by the transmission X-ray examination system described above because X-rays pass through such substances with relative ease. In view of this deficiency of the transmission X-ray system, the development of an examination system using the Compton scattering X-rays was undertaken. As known in the art, Compton scattering X-rays are X-rays reflected from substances including elements having smaller atomic numbers. Therefore, when baggage, etc., is examined using Compton scattering X-rays, it becomes possible to detect plastic explosives, drugs, etc. In general, the X-ray examination system using transmitted X-rays or Compton scattering X-rays described above has a structure in which transmitted X-rays or Compton scattering X-rays are guided to an X-ray detector. Detected X-rays are converted into visible rays using a fluorescent material, and the intensity of these visible rays is detected by a photomultiplier. Then an item of baggage is examined by imaging according to the intensity. The X-ray detector described above ordinarily uses a photomultiplier that has a peak of its spectral sensitivity characteristic at approximately 400 nm. Therefore, a fluorescent material such as LaOBr:Tb, LaOBr:Tm, etc., is used to convert X-rays into visible rays, since such materials have a peak of luminous wavelength at around 400 nm. The luminous wavelength characteristic of LaOBr:Tm fluorescent material is shown in Figure 1. The X-ray detector using a fluorescent material such as LaOBr:Tb, LaOBr:Tm, etc., has a disadvantage that the Compton scattering X-ray cannot be detected with sufficient sensitivity. Therefore, in a conventional Compton scattering X-ray examination system, the intensity of X-rays to be applied is increased to a level where sufficient examining accuracy can be obtained, and a clear examination image is obtained. However, in an X-ray examination system that is installed in a public place such as an airport baggage examination system, the increase of the intensity of X-rays to be applied leads to large sizing of the system and an increased risk of exposing humans to X-rays. EP-A-0 299 409 discloses radiographic intensifying screens including a support and a fluorescent layer formed thereon which is based on terbium-activated rare earth oxysulphide phosphors. EP-A-0 029 963 discloses radiation image storage panels based on phosphors of a type including rare earth element-activated complex halides. The present invention has been made to overcome problems described above and has as an object to provide an X-ray detector which provides sufficient detection sensitivity by X-rays of relatively low intensity. It is another object of the present invention to provide an X-ray examination system that is small in size, which minimizes the danger of exposing humans to X-rays, and which provides a clear examination image. To achieve the objects and in accordance with the purpose of the invention, as embodied and broadly described herein, there is provided an X-ray detector for detecting X-rays. The detector comprises a housing, a fluorescent generating means and a photoelectric conversion means. The fluorescent generating means and the photoelectric conversion means are mounted in the housing. The photoelectric conversion means measures the fluorescent output from the fluorescent generating means generated in response to X-rays. The fluorescent generating means includes at least one fluorescent material defined by the formula (i) A₂O₂S:D wherein A is at least one element selected from Gd, La and Y, D is at least one element selected from Tb and Pr, or, D is at least one element selected from Tb and Pr, and at least one element selected from Ce and Yb, and/or at least one fluorescent material defined by the formula (ii) BaFX:E wherein X is at least one element selected from C1 and Br, E is an element of Eu or E is an element of Eu and at least one element selected from Ce and Yb. Also in accordance with the present invention there is provided an X-ray examination system comprising the X-ray detector described above. In order that the invention may be illustrated, more easily understood and readily carried into effect, embodiments thereof will now be described purely by way of non-limiting examples, with reference to the accompanying drawings, and in which: Fig. 1 represents luminous wavelength characteristics of a conventional fluorescent material (LaOBr:Tm); Fig. 2 represents luminous wavelength characteristics of Gd₂O₂S:Tb and Gd₂O₂S:Tb, Ce; Fig. 3 represents luminous wavelength characteristics of Gd₂O₂S:Pr; Fig. 4 represents luminous wavelength characteristics of BaFC1:Eu; Fig. 5 represents luminous wavelength characteristics of BaFBr:Eu; Fig. 6 illustrates schematically the construction of an X-ray examination system according to the present invention; Fig. 7 is a cross-section of an intensifying screen useful in embodiments of the present invention; Fig. 8 is a cross-section of an X-ray detector according to the present invention; Fig. 9 represents a relationship between the amount of fluorescent material coating on intensifying screens and relative light output; Fig. 10 represents a relationship between the total coating amount of fluorescent materials on the incident side intensifying screen and the reflection side intensifying screen in an embodiment of the present invention; and Fig. 11 represents relative optical output of preferred fluorescent materials. The fluorescent generating means of the X-ray detector and the X-ray examination system of the present invention use at least one kind of fluorescent material expressed by formula (i): A₂O₂S:D wherein A is at least one element selected from Gd, La and Y, D is at least one element selected from Tb and Pr, or, D is at least one element selected from Tb and Pr, and at least one element selected from Ce and Yb; and/or at least one kind of fluorescent material defined by formula (ii): BaFX:E wherein X is at least one element selected from Cl and Br, and E is Eu or Eu and at least one of Ce and Yb. More particularly, the fluorescent material preferred for use in accordance with the present invention include at least one material from the following: Gd₂O₂S:Tb; Gd₂O₂S:Tb, Ce; Gd₂O₂S:Tb, Yb; Gd₂O₂S:Pr; BaFCl:Eu; BaFBr:Eu; La₂O₂S:Tb; La₂O₂S:Tb, Ce; La₂O₂S:Tb, Yb; La₂O₂S:Pr; Y₂O₂S:Tb; Y₂O₂S:Tb, Ce; Y₂O₂S:Tb, Yb; and Y₂O₂S:Pr. The elements Ce and Yb can be used as activators which have an effect of shortening the afterglow time. As used herein, afterglow time is the time required for the intensity of luminous light to decrease to 1/10 its initial value. Tb activated fluorescent material has a longer afterglow time than Pr activated fluorescent material. Therefore activators of Ce and Yb are more effective than the Tb activated fluorescent materials to shorten the afterglow time. The amount of the activators of Ce and Yb is preferably in the ratio of 0.001 wt% to 10 wt% for the total amount of activators. Representative luminous wavelength characteristics of the fluorescent materials Gd₂O₂S:Tb and Gd₂O₂S:Tb, Ce are shown in Fig. 2. The luminous wavelength characteristics of Gd₂O₂S:Pr, BaFCl:Eu and BaFBr:Eu are shown in Figures 3, 4 and 5, respectively. The fluorescent materials described above have a very high luminous efficiency to convert X-rays into visible light over a range of luminous wavelengths, although the peak of the luminous wavelength is positioned away from 400 nm. Thus, even when a photomultiplier having a sensitivity peak of around 400 nm is used, the Compton scattering X-ray or transmitted X-ray detection sensitivity can be promoted substantially. Further, as shown in Figures 2 through 5, as the afterglow of the fluorescent materials described above can be as small as less than 1.0 msec., the detection speed can be increased when X-rays are detected successively. By constructing an X-ray examination system using such an X-ray detector, the quality of the examination picture can be improved substantially, the examination accuracy can be improved, and the processing capacity also can be improved. Embodiment 1 Figure 6 is a schematic diagram showing the construction of an embodiment of the X-ray examination system of the present invention applied to an airport baggage examination system. An X-ray tube 1 is used as an X-ray irradiation means. X-ray A emitted from the X-ray tube 1 is collimated to a slit shape in a specified width by a linear collimator 2 to provide a collimated X-ray B. The collimated X-ray B is further converted to a pencil beam C, which repeatedly performs a linear motion, by a rotary collimator 3 having multiple slits provided in radial directions. The pencil beam C is emitted to scan an article to be examined, e.g., baggage 5, which is moving along a conveyer 4. Further, the baggage 5 is moved at a speed corresponding to the detection sensitivity of the X-ray. The X-ray reflected by the baggage 5, that is, the Compton scattering X-ray D, is detected by a scattering X-ray detector 6 consisting of detectors 6-1 and 6-2. A transmitted X-ray E is detected by a transmitted X-ray detector 7. The intensity values of the Compton scattering X-ray D and the transmitted X-ray E are measured and according to the intensities of these X-rays, the inside status of the baggage 5 is imaged as a picture on a display unit such as a CRT (not shown). Thus, the inside of the baggage 5 is examined according to the picture. The substances composed mainly of elements with small atomic numbers such as plastics are detected by the Compton scattering X-ray D, and the metallic products etc. are detected by the transmitted X-ray E. Other detectors to detect the scattering X-ray D can be arranged in the position of over the baggage or around the baggage (not shown). These structures are useful to examine the baggage in detail. The scattering X-ray detector 6 has a construction illustrated in Fig. 7 and described more fully below. The transmitted X-ray detector 7 has a construction similar to that of the scattering X-ray detector 6. However, a separate illustration of transmitted X-ray detector 7 is not provided. With reference to Figure 7, two scattering X-ray detectors 6-1 and 6-2 are arranged so as to form a clearance for passing the pencil beam shaped X-ray O therebetween. Each of the scattering X-ray detectors 6-1 and 6-2 has a cabinet shape detector body 8 of which one side is pitched. An X-ray incident surface 8a of the detector body 8 confronts the baggage 5, which is the article to be examined. The X-ray incident surface 8a is formed using a material which transmits X-rays, such as a resin, etc. Other parts of the detector body 8, except for the X-ray incident surface 8a, are composed of aluminum, etc. in order to maintain the strength of the detector body 8. Further, the outer surface of the detector body 8, except the X-ray incident surface 8a, is covered by an X-ray shielding material 9 such as lead, etc. Material 9 is provided to eliminate the effect of X-rays coming from the outside of the detector. On the inside wall surface of the X-ray incident surface 8a, a transmission type intensifying screen 10 with its luminous surface directed toward the inside of the detector body 8 is mounted as a transmission type flurorescent generating means. A reflection type intensifying screen 11 is provided on the remaining inner wall surface of the detector body 8, i.e., except on the inner wall surface of the X-ray incident surface 8a, as a reflection type fluorescent generating means. A photomultiplier 12 is provided on a side 8b of the detector body 8, which is perpendicular to the X-ray incident surface 8a, as a photoelectric conversion means. A photomultiplier having a peak light receiving sensitivity at approximately 400 nm, for example, a model no. R-1037 photomultiplier manufactured by Hamamatsu Photonix Co., is used as the photomultiplier 12. The operation of scattering X-ray detector (6-1,6-2) is described next with respect to Fig. 7. A Compton scattering X-ray D₁ is incident on the transmission type intensifying screen 10 provided on the inner wall surface of the X-ray incident surface 8a and a corresponding visible ray "a" generated by the fluorescent material of screen 10 is emitted to the inside of the detector body 8 from the transmission type intensifying screen 10. Similarly, a Compton scattering X-ray D₂ transmitted through the X-ray incident surface 8a is applied to the reflection type intensifying screen 11 and the visible ray "b" is emitted to the inside of the detector body 8. These visible rays "a" and "b" are detected by the photomultiplier 12 and the intensity of the incident Compton scattering X-ray is obtained by measuring the total intensity of the visible rays "a" and "b". The principle of detection by the Compton scattering X-ray is described next. X-rays having an energy E₀ and an intensity I₀ are attenuated by passing through an absorber, such as a piece of baggage, having a thickness t. The intensity I of the X-rays after attenuation by the absorber is given by the following equation (1): I = I₀ e -µt In equation (1), µ is a coefficient (unit: cm⁻¹) specific to the substance and is referred to as a linear absorption coefficient. The coefficient µ represents a ratio of damping while X-rays of energy E₀ advance 1 cm. Coefficient µ is larger for substances having larger atomic numbers and can be decomposed as shown below. µ = τ + σ T + σ c + k In equation (2), τ is an absorption coefficient by the photoelectric effect, σ T is a scattering coefficient by Thompson scattering, σ c is the scattering coefficient by Compton scattering, and k is an absorption coefficient by the electron pair creation. Further, when an X-ray of intensity I₀ and energy E₁ is penetrated from the surface of an absorber into a position at the depth x, an intensity I₁ of the X-ray at the x position is obtained from the following equation (3): I₁ = I₀ e -µx In equation (3), µ is the above-described linear absorption coefficient of the X-ray of energy E₁. An intensity I₂ of the Compton scattering X-ray that is generated at the x position and which scatters in an angular direction against the incident direction of the X-ray is obtained from the following equation (4): I₂ = a σ c I₁ In equation (4), a is a proportional constant. The intensity I₃ of the generated Compton scattering X-ray coming from the surface of the absorbed is expressed by the following equation (5) as a function of the distance bx from its generating point within the absorber to the surface of the absorber, where b = 1/cosϑ, and where ϑ is an angle between the Compton scattering X-ray and a normal to the surface of the absorber. I₃ = I₂ e -µ′bx In equation (5), µ′ is the linear absorption coefficient of the scattering X-ray. Accordingly, the intensity I₃ of the Compton scattering X-ray is expressed by the following equation (6) derived from equations (3), (4) and (5): I₃ = a σ c I₀ e -(µ+bµ′)x Therefore, the total amount of the Compton scattering X-ray after passing through an absorber having thickness t is provided by the following equations (7) and (8): C = ∫₀ t I₃ dx = ∫₀ t a σ c I₀ e -(µ+bµ′)x dx = a σ c I₀ µ + bµ′ (1 - e -(µ+bµ′)t ) in the case of e -(µ+bµ′)t << 1 C = a σ c I₀ µ + bµ′ Since aIo is a constant value that is independent of atomic number, the intensity of the Compton scattering X-ray varies depending upon a value of σ c /(µ+bµ′) which changes according to substance. The value of the σ c /(µ+bµ′) becomes larger for substances having smaller atomic numbers. Therefore, it is possible to identify a substance composed mainly of an element having a small atomic number, such as plastic products, by detecting the Compton scattering X-rays. As shown in Figure 8, intensifying screens 10 and 11 include a fluorescent material layer 14 formed by coating a slurry of selected fluorescent material(s) mixed with a binder and organic solvent onto a supporting material 13 such as a plastic film or a nonwoven fabric. The amount of fluorescent material to be coated on the above transmission type intensifying screen 10 and the reflection type intensifying screen 11 is preselected for each type of intensifying screen. If an excessive amount of fluorescent material is selected for the incident side of the transmission type intensifying screen 10, light absorption takes place in the fluorescent material layer 14, thereby lowering the fluorescent light output. Further, when an excessive amount of fluorescent material is used, the Compton scattering X-ray is also absorbed, reducing the incident amount to the reflection type intensifying screen 11, so that the total amount of the visible light is decreased. On the reflection type intensifying screen 11, the light output increases with an increase of the amount of coating of fluorescent material, but no additional effect can be obtained even if too much fluorescent material is coated. The light outputs of the transmission type intensifying screen 10 and the reflection type intensifying screen 11 when BaFCl:Eu was used as the fluorescent material are shown in Figure 9. Further, the light outputs are shown as relative light outputs to an light output assumed to be 100, of a conventional fluorescent material (LaOBr:Tm) measured at an X-ray tube voltage 120 kVP using a model no. R-980 photomultiplier manufactured by Hamamatsu Photonix Co., that has a bialkali photoelectric surface. Further, because the total amount of visible light changes depending on the balance with the coating amount of the transmission type intensifying screen 10 and the reflection type intensifying screen 11 as described above, it is desirable to set the total coating amount of fluorescent material by considering the respective coating amounts of the transmission type intensifying screen 10 and the reflection type intensifying screen 11. Figure 10 shows the relation between the total coating amount of combined representative fluorescent materials on the transmission type intensifying screen 10 and the reflection type intensifying screen 11 and the relative light output. In Figure 10, I represents incident side and R represents reflection side. It can be seen that a satisfactory light output is obtained by setting the total coating amount in the range from 80 to 300 mg/cm² although it varies depending on the combination of fluorescent materials. The relative optical outputs of the transmission type intensifying screen 10 and the reflection type intensifying screen 11 manufactured by combining various fluorescent materials in various ways of the present invention are as shown in Tables 1 to 5 and Figure 11. As is clear from Tables 1 to 5 and Figure 11, the light output can be improved more substantially than conventional fluorescent materials when the fluorescent materials of the present invention are used. The substantial improvement of the light output promotes the Compton scattering X-ray detection sensitivity and makes it possible to clearly image the inside of an article to be examined, such as baggage. This also applies to the transmitted X-ray detection sensitivity. It becomes therefore possible to execute more accurate examinations. Further, improvement of the light output makes it possible to lower the capacity of the X-ray tube and an X-ray examination system can be downsized. Additionally, as shown in Figures 2 through 5, as afterglows of the fluorescent materials utilized in accordance with the present invention can be small as below 1.0 msec., the moving speed of the baggage can be accelerated and thereby the processing capacity of an X-ray examination system can be improved substantially. Further, in the above embodiment, an example with the X-ray detector of the present invention applied to a scattering X-ray detector has been explained. When the X-ray detector is used as a transmitted X-ray detector, the same effect can be obtained by constructing the system in accordance with the structure disclosed above. Further, the X-ray examination system of the present invention is not limited to the airport baggage examination system but is useful for other types of examination systems. The present invention has been described with respect to specific embodiments. However, other embodiments based on the principles of the present invention should be obvious to those of ordinary skill in the art. Such embodiments are intended to be covered by the claims.

Claims: An X-ray detector for detecting X-rays, comprising: a detector housing (8); fluorescent generating means (10,11), mounted in the housing (8), for generating a fluorescent output in response to X-rays; photoelectric conversion means (12), mounted in the housing, for measuring the fluorescent output of the fluorescent generating means; wherein the detector is adapted to detect Compton scattering X-rays (D1, D2) and fluorescent generating means includes at least one fluorescent material defined by the formula (i): A₂O₂S:D wherein A is at least one of the following elements: Gd, La and Y, D is at least one of the following elements: Tb and Pr, or, D is at least one of Tb and Pr, and at least one of Ce and Yb, and/or at least one fluorescent material defined by the formula (ii): BaFX:E wherein X is at least one of Cl and Br, E is Eu, or E is Eu and at least one of Ce and Yb. An X-ray detector as claimed in claim 1, wherein said fluorescent material comprises one or more of the following such materials: Gd₂O₂S:Tb; Gd₂O₂S:Tb, Ce; Gd₂O₂S:Pr; BaFC1:Eu; BaFBr:Eu; La₂O₂S:Tb; La₂O₂S:Tb, Ce; La₂O₂S:Pr; Y₂O₂S:Tb; Y₂O₂S:Tb, Yb; Y₂O₂S:Tb, Ce; and Y₂O₂S:Pr. An X-ray detector as claimed in either preceding claim, wherein the fluorescent generating means comprises at least one of a transmission type fluorescent generating means (10) and a reflection type fluorescent generating means (11). An X-ray detector as claimed in any preceding claim, wherein said transmission type (10) and reflection type means (11) are respectively provided with different fluorescent material, and optionally in differing amounts. An X-ray detector as claimed in any preceding claim, wherein the fluorescent generating means (10) comprises an intensifying screen which includes fluorescent material. An X-ray detector as claimed in any preceding claim, wherein the amount of the or each fluorescent material is 80 mg/cm² to 300 mg/cm². An X-ray detector as claimed in any preceding claim, wherein an afterglow time of the or each fluorescent material is 1.0 msec. or less. An X-ray examination system for examining an object, comprising: X-ray irradiation means (1) for irradiating with X-rays (A,B) the objects (5) to be examined; X-ray detecting means as defined in any preceding claim wherein said photoelectric conversion means (12) not only measure the fluorescent output but also provide image signals based on said measured output, said detecting means (6-1,6-2) adapted to detect Compton scattering X-rays from the object (5); and display means for displaying an image of the interior of the object in accordance with the signals generated by the X-ray detecting means. An X-ray examination system as claimed in claim 8, in the form of an airport baggage examination system, and wherein the object is a piece of baggage (5). An X-ray examination system as claimed in claim 8 or 9 further including a detector (7) for transmitted X-rays. An X-ray examination system as claimed in any one of claims 8 to 10, wherein the detector (6-1,6-2) for Compton scattering X-rays is a two-part spaced apart detector, with an X-ray source (1) adapted to intermittently discharge X-rays (A,B) through the space (6) between the two parts (6-1,6-2) of said Compton scattering X-ray detector.

Inventors: SAITO AKIHISA C O INTELLECTUAL, YAGI NORIAKI C O INTELLECTUAL, YOKOTA KAZUTO C O INTELLECTUAL, SAITO, AKIHISA, C/O INTELLECTUAL PROPERTY DIVISION, YAGI, NORIAKI, C/O INTELLECTUAL PROPERTY DIVISION, YOKOTA, KAZUTO, C/O INTELLECTUAL PROPERTY DIVISION
Applicants: TOSHIBA KK, KABUSHIKI KAISHA TOSHIBA
Application year: 1992
Main classification: G01V5
IPC codes: C09K11, G21K4, G01V5