Superconducting device having an extremely thin superconducting channel formed of oxide superconductor material and method for manufacturing the same

Abstract: A superconducting device which comprises a substrate (10), an extremely thin superconducting channel (20) formed of an oxide superconductor thin film (2) on the principal surface of the substrate (10). The superconducting device comprises a superconducting source electrode (3) and a superconducting drain electrode (4) of a relatively thick thickness which are formed of the oxide superconductor on the superconducting channel (20) separated from each other but electrically connected through the superconducting channel, so that a superconducting current can flow through the superconducting channel (20) between the superconducting source electrode (3) and the superconducting drain electrode (4). The superconducting device also comprises a gate electrode (5) through a gate insulator (9) on the superconducting channel (20) for controlling the superconducting current flowing through the superconducting channel. The superconducting device further comprises an oxide layer or oxide layers (6) having an extremely thin thickness between the superconducting channel (20) and the gate insulator (9) and/or between the superconducting channel (20) and the substrate (10), which are formed of an oxide which improves at most surface / interface of the oxide superconductor thin film which constitutes the superconducting channel.

Description: Field of the invention The present invention relates to a superconducting device and a method for manufacturing the same, and more specifically to a superconducting device having an extremely thin superconducting channel formed of oxide superconductor material, and a method for manufacturing the same. Description of related art Devices which utilize superconducting phenomena operate rapidly with low power consumption so that they have higher performance than conventional semiconductor devices. Particularly, by using an oxide superconducting material which has been recently advanced in study, it is possible to produce a superconducting device which operates at relatively high temperature. Josephson device is one of well-known superconducting devices. However, since Josephson device is a two-terminal device, a logic gate which utilizes Josephson devices becomes complicated. Therefore, three-terminal superconducting devices are more practical. Typical three-terminal superconducting devices include two types of super-FET (field effect transistor). The first type of the super-FET includes a semiconductor channel, and a superconductor source electrode and a superconductor drain electrode which are formed closely to each other on both side of the semiconductor channel. A portion of the semiconductor layer between the superconductor source electrode and the superconductor drain electrode has a greatly recessed or undercut rear surface so as to have a reduced thickness. In addition, a gate electrode is formed through a gate insulator layer on the portion of the recessed or undercut rear surface of the semiconductor layer between the superconductor source electrode and the superconductor drain electrode. A superconducting current flows through the semiconductor layer (channel) between the superconductor source electrode and the superconductor drain electrode due to a superconducting proximity effect, and is controlled by an applied gate voltage. This type of the super-FET operates at a higher speed with a low power consumption. The second type of the super-FET includes a channel of a superconductor formed between a source electrode and a drain electrode, so that a current flowing through the superconducting channel is controlled by a voltage applied to a gate formed above the superconducting channel. Both of the super-FETs mentioned above are voltage controlled devices which are capable of isolating output signal from input one and of having a well defined gain. However, since the first type of the super-FET utilizes the superconducting proximity effect, the superconductor source electrode and the superconductor drain electrode have to be positioned within a distance of a few times the coherence length of the superconductor materials of the superconductor source electrode and the superconductor drain electrode. In particular, since an oxide superconductor has a short coherence length, a distance between the superconductor source electrode and the superconductor drain electrode has to be made less than about a few ten nanometers, if the superconductor source electrode and the superconductor drain electrode are formed of the oxide superconductor material. However, it is very difficult to conduct a fine processing such as a fine pattern etching, so as to satisfy the very short separation distance mentioned above. On the other hand, the super-FET having the superconducting channel has a large current capability, and the fine processing which is required to product the first type of the super-FET is not needed to product this type of super-FET. In order to obtain a complete ON/OFF operation, both of the superconducting channel and the gate insulating layer should have an extremely thin thickness. For example, the superconducting channel formed of an oxide superconductor material should have a thickness of less than five nanometers, namely about four or five unitcells and the gate insulating layer should have a thickness more than ten nanometers which is sufficient to prevent a tunnel current. However, one or two unitcells of the both side of the extremely thin superconducting channel formed of the oxide superconductor may not behave as a superconductor. Therefore, the substantial thickness of the superconducting channel becomes thinner than the physical thickness, which in turn the superconducting current through the superconducting channel is reduced than expected. The surface region of the superconducting channel is constituted of irregular lattices which are produced by the surface instability of the oxide superconductor thin film. After the gate insulating layer is deposited on the oxide superconductor thin film, the irregular lattices are maintained or enhanced. Therefore, the surface region of the superconducting channel may not behave as a superconductor. The lattice order and stoichiometry of the bottom region of the superconducting channel are distorted because of the thermal expansion discrepancy between the oxide superconductor thin film and the substrate. The oxide superconductor thin film is deposited at a temperature not lower than 500°C so that the lower portion of the oxide superconductor thin film is under stress of the thermal expansion discrepancy between the oxide superconductor thin film and the substrate when it is cooled down to the room temperature. Additionally, while the oxide superconductor thin film is deposited, constituent atoms of the substrate may defuse into the oxide superconductor thin film so that the lower portion of the oxide superconductor thin film is degraded. Furthermore, the baned of Cu-O planes at most surface of oxide superconductor layers help to generate the non-superconducting regions. Therefore, if the superconducting channel is composed of an oxide superconductor thin film having a thickness of about four or five unitcells, superconducting current may flow in a layer having a thickness of only one or two unitcells of the oxide superconductor channels. The document EP-A-0 354 804 discloses a superconducting device according to the preamble of claim 1. Summary of the Invention Accordingly, it is an object of the present invention to provide an FET type superconducting device having a superconducting region constituted of an extremely thin oxide superconductor film, which have overcome the above mentioned defects of the conventional ones. Another object of the present invention is to provide a method for manufacturing an FET type superconducting device which have overcome the above mentioned defects of the conventional ones. The above and other objects of the present invention are achieved in accordance with the present invention by a superconducting device as set forth in claim 1. The superconducting device in accordance with the present invention may comprise the oxide layer either between the superconducting channel and the gate insulator or between the superconducting channel and the substrate. Of course the superconducting device in accordance with the present invention may comprise both of the oxide layers between the superconducting channel and the gate insulator and between the superconducting channel and the substrate. Preferably, the oxide layer between the superconducting channel and the substrate is formed of a c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film and the oxide layer between the superconducting channel and the gate insulator is formed of a c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film, an SrO x thin film, a BaO x thin film, a KO x thin film or a PbO x thin film. These oxide compensate for crystalline incompleteness of both on an upper surface and on a bottom surface of an oxide superconductor thin film. Especially, when the superconducting channel is formed of a c -axis orientated oxide superconductor thin film, the oxide layer formed of a c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film is favorable. Since the c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film has an almost same crystal lattice structure as that of a c -axis orientated oxide superconductor thin film. Therefore, lattice order on the upper or the bottom surfaces of the extremely thin oxide superconductor film which forms the superconducting channel of the superconducting device in accordance with the present invention can be complete enough to conduct the superconducting current even at the near interface region of the channel. Namely, cross-sectional area of the superconducting channel of the superconducting device in accordance with the present invention is substantially larger than that of a conventional superconducting device. With this, the superconducting device in accordance with the present invention has a larger current capability than a conventional one. In case of the superconducting device in accordance with the present invention which includes both of the oxide layers between the superconducting channel and the gate insulator and between the superconducting channel and the substrate, the superconducting current flows across the entire cross section of the superconducting thin film. For this purpose, the oxide layers are preferably composed of high crystallinity in which one to five unitcells of crystalline lattices are stacked. The oxide layer which is composed of the incomplete crystal lattices does not have the effect. However, if the oxide layer between the superconducting channel and the gate insulator is too thick, it is difficult to control the superconducting current by applying a voltage to the gate electrode. Since the gate insulator is formed of SrTiO₃, MgO, etc., it is difficult to form the gate insulator having a relatively thin thickness. Therefore, the oxide layer between the superconducting channel and the gate insulator may not be formed too thick. In this connection, SrO x , BaO x , KO x and PbO x are favorable, since they have smaller lattice parameters than Pr₁Ba₂Cu₃O 7-ε . In the superconducting device in accordance with the present invention, the oxide layer between the superconducting channel and the substrate absorbs the stress which is generated by thermal expansion coefficient discrepancy between the superconducting channel and the substrate. Substrate constituent atoms diffusion is also confined in the oxide layer between the superconducting channel and the substrate so that the superconducting channel is prevented from losing superconductivity. For these purpose, the oxide layer between the superconducting channel and the substrate preferably has a thickness almost same as that of superconducting channel. The oxide layer formed of a c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film is favorable, since a Pr₁Ba₂Cu₃O 7-ε crystal lattice tends to be deformed along a -axis of the crystal lattice. In a preferred embodiment, the oxide superconductor is formed of high-T c (high critical temperature) oxide superconductor, particularly, formed of a high-T c copper-oxide type compound oxide superconductor for example a Y-Ba-Cu-O compound oxide superconductor material, a Bi-Sr-Ca-Cu-O compound oxide superconductor material, and a Tl-Ba-Ca-Cu-O compound oxide superconductor material. In addition, the substrate can be formed of an insulating substrate, preferably an oxide single crystalline substrate such as MgO, SrTiO₃, CdNdAlO₄, etc. These substrate materials are very effective in forming or growing a crystalline film having a high degree of crystalline orientation. However, the superconducting device can be formed on a semiconductor substrate if an appropriate buffer layer is deposited thereon. For example, the buffer layer on the semiconductor substrate can be formed of a double-layer coating formed of a MgAlO₄ layer and a BaTiO₃ layer if silicon is used as a substrate. Preferably, the superconducting channel is formed of a c -axis orientated oxide superconductor thin film and the superconducting source electrode and the superconducting drain electrode are formed of a -axis orientated oxide superconductor thin films. According to the method of the present invention as set forth in claim 15, the oxide layer or layers and the superconducting channel are continuously formed by MBE. With this, the oxide layer or layers and the superconducting channel are of high crystallinity and interfaces are formed sharply. In order to form the oxide layer or layers and the superconducting channel continuously, all of the necessary molecular beam sources are prepared, at the beginning. Thin films which compose the oxide layer or layers and the superconducting channel are continuously deposited by exchanging the molecular beam sources. In order to exchange molecular beam sources accurately and in order to form the thin films having precisely determined thickness, the thin film surfaces are preferably monitored by RHEED (respective high energy electron diffraction), while the thin films are deposited. The above and other objects, features and advantages of the present invention will be apparent from the following description of preferred embodiments of the invention with reference to the accompanying drawings. Brief Description of the drawings Figures 1A to 1E are diagraminatic sectional views for illustrating a first embodiment of the process in accordance with the present invention for manufacturing the super-FET; Figures 2A to 2D are diagrammatic sectional views for illustrating a second embodiment of the process in accordance with the present invention for manufacturing the super-FET; and Figures 3A to 3F are diagrammatic sectional views for illustrating a third embodiment of the process in accordance with the present invention for manufacturing the super-FET. Description of the Preferred embodiments Referring to Figures 1A to 1E, the process in accordance with the present invention for manufacturing the super-FET will be described. As shown in Figure 1A, a c -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 having a thickness on the order of about 5 nanometers is deposited on a principal surface of a MgO (100) single crystalline substrate 10, by an MBE. While the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is growing, the surface morphology of the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is monitored by RHEED so that the atomic layers which constitute the Y₁Ba₂Cu₃O 7-δ crystals are accurately stacked layer by layer or unit by unit. The c -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is composed of a c -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor crystalline layer in which five unit-cells of the crystalline lattices are stacked. A condition of forming the c -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 by MBE is as follows: Molecular beam source Y: 1250°C Ba: 600°C Cu: 1040°C Pressure 1.33·10⁻⁵ hPa (1 × 10⁻⁵ Torr) Temperature of the substrate 700°C Then, the Y molecular beam source is switched to a Pr molecular beam source so that an oxide layer 6 composed of c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film having a thickness of about 1.2 nanometer is continuously formed on the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2, as shown in Figure 1B. The c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film is composed of a c -axis orientated Pr₁Ba₂Cu₃O 7-ε crystalline layer in which crystalline lattices are disposed to constitute one unitcell layer. A condition of forming the c -axis orientated Pr₁Ba₂Cu₃O 7-ε oxide thin film by MBE is as follows: Molecular beam source Pr: 1225°C Ba: 600°C Cu: 1040°C Pressure 1.33·10⁻⁵ hPa (1 × 10⁻⁵ Torr) Temperature of the substrate 700°C As shown in Figure 1C, a gate insulator 9 and a gate electrode 5 are formed on a center portion of the oxide layer 6. The gate insulator 9 is formed of SrTiO₃ and has a thickness of 10 nanometers. The gate insulator is formed by etching a SrTiO₃ thin film which is deposited by a sputtering process. The gate electrode 5 is formed of Au by a vacuum evaporation. Thereafter, as shown in Figure 1D, the oxide layer 6 is selectively etched so as to remove all of the oxide layer excluding a center portion by means of an anisotropic etching, so that the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 are exposed at the etched portion. This etching process is carried out by a reactive ion etching process or an ion milling using An-ions. Finally, as shown in Figure 1E, a superconducting source electrode 3 and a superconducting drain electrode 4 of an a -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film are formed on the exposed portions of the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 at both sides of the oxide layer 6, respectively. An a -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film can be formed by an MBE process which is carried out under a condition that the substrate temperature is not higher than 650°C. An MBE condition under which the superconducting source electrode 3 and the superconducting drain electrode 4 are formed is as follows: Molecular beam source Y: 1250°C Ba: 600°C Cu: 1040°C Pressure 1.33·10⁻⁵ hPa (1 × 10⁻⁵ Torr) Temperature of the substrate 640°C A metal source electrode and a metal drain electrode may be formed on the superconducting source electrode 3 and the superconducting drain electrode 4 respectively, if necessary. With this, the super-FET in accordance with the present invention is completed. The above mentioned super-FET manufactured in accordance with the first embodiment of the method of the present invention has a superconducting channel of which the superconducting current flows in a layer having a thickness of at least three unitcells of Y₁Ba₂Cu₃O 7-δ oxide superconductor crystal lattices from the upper surface. Therefore, the substantial cross-sectional area of the superconducting channel of the super-FET is lager than that of a conventional super-FET. By this, the current capability of the super-FET can be improved. Required voltage which is applied to the gate electrode in order to shunt the superconducting channel of the super-FET is 20 volts, which is little higher than that of a conventional super-FET. Since the oxide layer 6 is continuously formed on the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2, the surface of the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is not degraded so that the interface between the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 and the oxide layer 6 is formed sharply. Accordingly, the super-FET has a stable performance and large current capability. Other super-FETs in accordance with the present invention, of which the oxide layers are composed of SrO x , BaO x , KO x or PbO x instead of Pr₁Ba₂Cu₃O 7-ε are manufactured by a similar process as mentioned above. Since crystal unit sizes of these oxide are smaller than that of Pr₁Ba₂Cu₃O 7-ε, the oxide layer 6 can be formed thinner so that the applied voltage which is required to shunt the channel can be lowered. These super-FETs are manufactured by almost same method as the above mentioned method. Therefore, the difference will be described in the following. When the super-FET which utilizes SrO x for the oxide layer 6 is manufactured, in order to form the oxide layer 6, the Y molecular beam source, the Ba molecular beam source and the Cu molecular beam source are shut and the Sr molecular beam source is opened in the process shown in Figure 1B. Similar operations are carried out in case of the super-FETs utilizing KO x or PbO x for the oxide layer 6. In case of BaO x , the Y molecular beam source and the Cu molecular beam source are shut and only the Ba molecular beam source is kept open. Conditions of forming the SrO x oxide thin film, BaO x oxide thin film, KO x oxide thin film and PbO x oxide thin film by MBE are as follows: SrO x Molecular beam source Sr: 580°C Pressure 1.33·10⁻⁵ hPa (1 × 10⁻⁵ Torr) Temperature of the substrate 700°C BaO x Molecular beam source Ba: 785°C Pressure 1.33·10⁻⁵ hPa (1 × 10⁻⁵ Torr) Temperature of the substrate 700°C KO x Molecular beam source K: 420°C Pressure 1.33·10⁻⁵ hPa (1 × 10⁻⁵ Torr) Temperature of the substrate 700°C PbO x Molecular beam source Pb: 855°C Pressure 1.33·10⁻⁵ hPa (1 × 10⁻⁵ Torr) Temperature of the substrate 700°C Each of the above mentioned super-FETs in accordance with the present invention has superconducting channel of which the superconducting current flows in a layer having a thickness of at least three unitcells of Y₁Ba₂Cu₃O 7-δ oxide superconductor crystalline lattices from the upper surface. Therefore, the substantial cross-sectional area of the superconducting channels of the super-FETs are lager than that of a conventional super-FET. By this, the current capability of the super-FETs can be improved. Required voltages which are applied to the gate electrodes in order to shunt the superconducting channels of the super-FETs are as follows: SrO x Thickness of the oxide layer 0.52 nanometers, 1unitcell Voltage for closing the gate 12 volts BaO x Thickness of the oxide layer 0.55 nanometers, 1unitcell Voltage for closing the gate 18 volts KO x Thickness of the oxide layer 0.65 nanometers, 1unitcell Voltage for closing the gate 12 volts PbO x Thickness of the oxide layer 0.59 nanometers, 1unitcell Voltage for closing the gate 12 volts Both thickness of the oxide layers and required voltages for closing the gates of these super-FETs are smaller than those of the super-FET which utilizes Pr₁Ba₂Cu₃O 7-ε for the oxide layer 6. Therefore, these super-FETs are operated with lower gate voltages so that required power consumption becomes smaller. Since the oxide layer 6 is formed successively on the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2, the surface of the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is not degraded so that the interface between the Y₁Ba₂Cu₃O 7-ε oxide superconductor thin film 2 and the oxide layer 6 is formed sharply. Accordingly, the super-FET has a stable performance and higher current capability. Referring to Figures 2A to 2D, a second embodiment of the process for manufacturing the superconducting device will be described. As shown in Figure 2A, an oxide layer 16 composed of c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film having a thickness on the order of about 5 nanometers is deposited on a principal surface of a MgO (100) single crystalline substrate 10, by an MBE. While the Pr₁Ba₂Cu₃O 7-ε thin film 16 is growing, the surface morphology of the Y₁Ba₂Cu₃O 7-ε thin film 16 is monitored by RHEED so that the atomic layers which constitute the Pr₁Ba₂Cu₃O₇₋ε crystals are accurately stacked layer by layer or unit by unit. The c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film 16 is composed of a c-axis orientated Pr₁Ba₂Cu₃O 7-ε crystal layer in which five unitcells of the crystalline lattices are stacked. A condition of forming the c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film by MBE is as follows: Molecular beam source Pr: 1225°C Ba: 600°C Cu: 1040°C Pressure 1.33·10⁻⁵ hPa (1 × 10⁻⁵ Torr) Temperature of the substrate 700°C Then, the Pr molecular beam source is exchanged to a Y molecular beam source so that a c -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 having a thickness of about 5 nanometer is continuously formed on the oxide layer 16 of Pr₁Ba₂Cu₃O 7-ε thin film, as shown in Figure 2B. The c -axis orientated Y₁Ba₂Cu₃O 7-δ oxide super conductor thin film 2 is composed of a c -axis orientated Y₁Ba₂Cu₃O 7-δ crystalline layer in which five unitcells of the crystalline lattices are stacked. A condition of forming the c -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 by MDE is as follows: Molecular beam source Y: 1250°C Ba: 600°C Cu: 1040°C Pressure 1.33·10⁻⁵ hPa (1 × 10⁻⁵ Torr) Temperature of the substrate 700°C As shown in Figure 2C, a gate insulator 9 and a gate electrode 5 are formed on a center portion of the c -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2. The gate insulator 9 is formed of SrTiO₃ and has a thickness of 10 nanometers. The gate insulator is formed by etching a SrTiO₃ thin film which is deposited by a sputtering process. The gate electrode 5 is formed of Au by a vacuum evaporation. Finally, as shown in Figure 2D, a superconducting source electrode 3 and a superconducting drain electrode 4 of an a -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film are formed on the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 at both sides of the gate insulator 9 and the gate electrode 5, respectively. An a -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film can be formed by an MBE process which is carried out under a condition that the substrate temperature is not higher than 650°C. An MBE condition under which the superconducting source electrode 3 and the superconducting drain electrode 4 are formed is same as the first embodiment. A metal source electrode and a metal drain electrode may be formed on the superconducting source electrode 3 and the superconducting drain electrode 4 respectively, if necessary. With this, the super-FET in accordance with the present invention is completed. The above mentioned super-FET manufactured in accordance with the second embodiment of the method of the present invention has a superconducting channel of which the superconducting current flows in a layer having a thickness of at least three unitcells of Y₁Ba₂Cu₃O 7-δ oxide superconductor crystalline lattices from the bottom surface. Therefore, the substantial cross-sectional area of the superconducting channel of the super-FET is larger than that of a conventional super-FET. By this, the current capability of the super-FET can be improved. Since the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is formed on the oxide layer 16, the stress which is generated by thermal expansion coefficient discrepancy between the Y₁Ba₂Cu₃O 7-δ oxide superconductor and the MgO substrate is absorbed by the oxide layer 16 so that the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is not stressed. Additionally, the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is continuously formed on the oxide layer 16 so that the interface between the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 and the oxide layer 6 is formed sharply. Accordingly, the super-FET has a stable performance and higher current capability. Referring to Figures 3A to 3F, a third embodiment of the process for manufacturing the superconducting device will be described. As shown in Figure 3A, an oxide layer 16 composed of c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film having a thickness on the order of about 5 nanometers is deposited on a principal surface of a MgO (100) single crystalline substrate 10, by an MBE. While the Pr₁Ba₂Cu₃O 7-ε thin film 16 is growing, the surface morphology of the Pr₁Ba₂Cu₃O 7-ε thin film 16 is monitored by RHEED so that the atomic layers which constitute the Pr₁Ba₂Cu₃O 7-ε crystals are accurately stacked layer by layer or unit by unit. The c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film 16 is composed of a c -axis orientated Pr₁Ba₂Cu₃O 7-ε crystal layer in which five unitcells of the crystalline lattices are stacked. A condition of forming the c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film by MBE is same as the second embodiment. Then, the Pr molecular beam source is exchanged to a Y molecular beam source so that a c -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 having a thickness of about 5 nanometer is continuously formed on the oxide layer 16 of Pr₁Ba₂Cu₃O 7-ε thin film, as shown in Figure 3B. The c -axis orientated Y₁Ba₂Cu₃O 7-δ oxide super conductor thin film 2 is composed of a c -axis orientated Y₁Ba₂Cu₃O 7-δ crystalline layer in which five unitcells of the crystalline lattices are stacked. A condition of forming the c -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 by MBE is same as the second embodiment. Thereafter, the Y molecular beam source is exchanged to a Pr molecular beam source again so that an oxide layer 6 composed of c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film having a thickness of about 1.2 nanometer is continuously formed on the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2, as shown in Figure 3C. The c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film is composed of a c -axis orientated Pr₁Ba₂Cu₃O 7-ε crystalline layer in which crystalline lattices are disposed to constitute one unitcell layer. A condition of forming the c -axis orientated Pr₁Ba₂Cu₃O 7-ε oxide thin film by MBE is same as the first embodiment. As shown in Figure 3D, a gate insulator 9 and a gate electrode 5 are formed on a center portion of the oxide layer 6. The gate insulator 9 is formed of SrTiO₃ and has a thickness of 10 nanometers. The gate insulator is formed by etching a SrTiO₃ thin film which is deposited by a sputtering process. The gate electrode 5 is formed of Au by a vacuum evaporation. Thereafter, as shown in Figure 3E, the oxide layer 6 is selectively etched so as to remove all of the oxide layer excluding a center portion by means of an anisotropic etching, so that the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 are exposed at the etched portion. This etching process is carried out by a reactive ion etching process or an ion milling using Ar-ions. Finally, as shown in Figure 3F, a superconducting source electrode 3 and a superconducting drain electrode 4 of an a -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film are formed on the exposed portions of the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 at both sides of the oxide layer 6, respectively. An a -axis orientated Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film can be formed by an MBE process which is carried out under a condition that the substrate temperature is not higher than 650°C. An MBE condition under which the superconducting source electrode 3 and the superconducting drain electrode 4 are formed is same as the first embodiment. A metal source electrode and a metal drain electrode may be formed on the superconducting source electrode 3 and the superconducting drain electrode 4 respectively, if necessary. With this, the super-FET in accordance with the present invention is completed. The above mentioned super-FET manufactured in accordance with the third embodiment of the method of the present invention has a superconducting channel of which the superconducting current flows across the entire cross section. Therefore, the substantial cross-sectional area of the superconducting channel of the super-FET is lager than that of a conventional super-FET. By this, the current capacity of the super-FET can be improved. Required voltage which is applied to the gate electrode in order to shunt the superconducting channel of the super-FET is 20 volts, which is little higher than that of a conventional super-FET. Since the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is formed on the oxide layer 16, the stress which is generated by the thermal expansion coefficient discrepancy between the Y₁Ba₂Cu₃O 7-δ oxide superconductor and the MgO substrate is absorbed by the oxide layer 16 so that the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is not stressed. Further more, since the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is continuously formed on the oxide layer 16 and the oxide layer 6 is continuously formed on the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2, the upper and bottom surfaces of the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 are not degraded so that the interfaces between the oxide layer 16 and the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 and between the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 and the oxide layer 6 are formed sharply. Accordingly, the super-FET has a stable performance and higher current capability. Other super-FETs in accordance with the present invention, of which the oxide layers are composed of SrO x , BaO x , KO x or PbO x instead of Pr₁Ba₂Cu₃O 7-ε are manufactured by the above mentioned process. Since crystalline unit sizes of these oxide are smaller than that of Pr₁Ba₂Cu₃O 7-ε , the oxide layer 6 can be formed thinner so that the applied voltage which is required to shunt the superconducting channel, can be lowered. These super-FETs are manufactured by almost same method as the above mentioned method. Therefore, the difference will be described in the following. When the super-FET which utilizes SrO x for the oxide layer 6 is manufactured, in order to form the oxide layer 6, the Y molecular beam source, the Ba molecular beam source and the Cu molecular beam source are shut and the Sr molecular beam source is opened in the process shown in Figure 3C. Similar operations are carried out in case of the super-FETs utilizing KO x or PbO x for the oxide layer 6. In case of BaO x , the Y molecular beam source and the Cu molecular beam source are shut and only the Ba molecular beam source is kept open. Conditions of forming the SrO x oxide thin film, BaO x oxide thin film, KO x oxide thin film and PbO x oxide thin film by MBE are same as the first embodiment. Each of the above mentioned super-FETs in accordance with the present invention has a superconducting channel of which the superconducting current flows across the entire cross section. Therefore, the substantial cross-sectional area of the superconducting channels of the super-FETs are lager than that of a conventional super-FET. By this, the current capability of the super-FETs can be improved. Required voltages which are applied to the gate electrodes in order to shunt the superconducting channels of the super-FETs are as follows: SrO x Thickness of the oxide layer 0.52 nanometers, 1unitcell Voltage for closing the gate 12 volts BaO x Thickness of the oxide layer 0.55 nanometers, 1unitcell Voltage for closing the gate 18 volts KO x Thickness of the oxide layer 0.65 nanometers, 1unitcell Voltage for closing the gate 12 volts PbO x Thickness of the oxide layer 0.59 nanometers, 1unitcell Voltage for closing the gate 12 volts Both thickness of the oxide layers arid required voltages for closing the gates of these super-FETs are smaller than those of the super-FET which utilizes Pr₁Ba₂Cu₃O 7-ε for the oxide layer 6. Therefore, these super-FETs are operated with lower gate voltages so that required power consumption becomes smaller. Since the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 is continuously formed on the oxide layer 16 and the oxide layer 6 is continuously formed on the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2, the upper and bottom surfaces of the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 are not degraded so that the interfaces between the oxide layer 16 and the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 and between the Y₁Ba₂Cu₃O 7-δ oxide superconductor thin film 2 and the oxide layer 6 are formed sharply. Accordingly, the super-FET has a stable performance and higher current capability. In the above mentioned embodiments, the oxide superconductor thin film can be formed of not only the Y-Ba-Cu-O compound oxide superconductor material, but also a high-T c (high critical temperature) oxide superconductor material, particularly a high-T c copper-oxide type compound oxide superconductor material, for example a Bi-Sr-Ca-Cu-O compound oxide superconductor material, and a Tl-Ba-Ca-Cu-O compound oxide superconductor material. The invention has thus been shown and described with reference to the specific embodiments. However, it should be noted that the present invention is in no way limited to the details of the illustrated structures but converts and modifications may be made within the scope of the appended claims.

Claims: A superconducting device comprising a substrate (10), a superconducting channel (20) formed of an oxide superconductor thin film (2) over the substrate (10), a superconducting source electrode (3) and a superconducting drain electrode (4) formed of an oxide superconductor on the oxide superconductor thin film (2) separated from each other but electrically connected by the superconducting channel (20), and a gate electrode (5) formed on a gate insulator (9) over the superconducting channel (20) for controlling the superconducting current flowing through the superconducting channel (20), characterized in that the superconducting device further comprises an oxide layer or oxide layers (6, 16) between the superconducting channel (20) and the gate insulator (9) and/or between the substrate (10) and the superconducting channel (20), the superconducting channel (20) is formed of a c -axis orientated oxide superconductor thin film (2), the superconducting source electrode (3) and the superconducting drain electrode (4) are formed of a -axis orientated oxide superconductor thin films. A superconducting device claimed in Claim 1 characterized in that the superconducting device comprises said oxide layer (6) only between the superconducting channel (20) and the gate insulator (9). A superconducting device claimed in Claim 1 characterized in that the superconducting device comprises said oxide layer (16) only between the superconducting channel (20) and the substrate (10). A superconducting device claimed in Claim 1 characterized in that the superconducting device comprises both of said oxide layers (6, 16) between the superconducting channel (20) and the gate insulator (9) and between the superconducting channel (20) and the substrate (10). A superconducting device claimed in Claim 1, 3 or 4 characterized in that said oxide layer (16) between the superconducting channel (20) and the substrate (10) is formed of a c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film. A superconducting device claimed in Claim 1, 2, or 4 characterized in that said oxide layer (6) between the superconducting channel (20) and the gate insulator (9) is formed of a c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin film, an SrO x thin film, a BaO x thin film, a KO x thin film or a PbO x thin film. A superconducting device claimed in Claim 4 characterized in that both of said oxide layers (6, 16) are formed of c -axis orientated Pr₁Ba₂Cu₃O 7-ε thin films. A superconducting device claimed in Claim 4 characterized in that said oxide layer (16) between the superconducting channel (20) and the substrate (10) is formed of a c- axis orientated Pr₁Ba₂Cu₃O 7-ε thin film and said oxide layer (6) between the superconducting channel (20) and the gate insulator (9) is formed of an SrO x thin film, a BaO x thin film, a KO x thin film or a PbO x thin film. A superconducting device claimed in anyone of Claims 1, 3, 4, 5, 7 and 8 characterized in that the oxide layer (16) between the superconducting channel (20) and the substrate (10) has a thickness which is almost the same as that of the superconducting channel (20). A superconducting device claimed in anyone of Claims 1, 2, 4 and 6 to 8 characterized in that the oxide layer (6) between the superconducting channel (20) and the gate insulator (9) is composed of the oxide crystal layer in which one to five unitcells of crystalline lattices are stacked. A superconducting device claimed in anyone of Claims 1 to 10 characterized in that the oxide superconductor is formed of high-T c (high critical temperature) oxide superconductor, particularly, formed of a high-T c copper-oxide type compound oxide superconductor. A superconducting device claimed in Claim 11 characterized in that the oxide superconductor is formed of oxide superconductor material selected from the group consisting of a Y-Ba-Cu-O compound oxide superconductor material, a Bi-Sr-Ca-Cu-O compound oxide superconductor material, and a Tl-Ba-Ca-Cu-O compound oxide superconductor material. A superconducting device claimed in anyone of Claims 1 to 12 characterized in that the substrate is formed of a material selected from the group consisting of a MgO (100) substrate, a SrTiO₃ (100) substrate and a CdNdAlO₄ (001) substrate, and a semiconductor substrate. A superconducting device claimed in Claim 14 characterized in that the substrate is formed of a silicon substrate and a principal surface of the silicon substrate is coated with an insulating material layer which is formed of a MgAl₂O₄ layer and a BaTiO₃ layer. A method of manufacturing a superconducting device as claimed in any of the preceding claims comprising a substrate (10), a superconducting channel (20) formed of an oxide superconductor thin film (2) over the substrate (10), a superconducting source electrode (3) and a superconducting drain electrode (4) formed of an oxide superconductor on the oxide superconductor thin film (2) separated from each other but electrically connected by the superconducting channel (20), a gate electrode (5) formed on a gate insulator (9) over the superconducting channel (20) for controlling the superconducting current flowing through the superconducting channel (20), and a first oxide layer (6) between the superconducting channel (20) and the gate insulator (9) and/or a second oxide layer (16) between the superconducting channel (20) and the substrate (10), characterized in that the method comprises steps of depositing the first oxide layer (6) and/or the second oxide layer (16) and the oxide superconductor thin film (2) continuously by MBE by switching molecular beam sources so as to prevent degradation of a surface of the second oxide layer (16) and/or the oxide superconductor thin film (2) to form a sharp interface or interfaces between the oxide superconductor thin film (2) and the first oxide layer (6) and/or between the oxide superconductor thin film (2) and the second oxide layer (16).

Inventors: IIYAMA MICHITOMO, TANAKA SO, IIYAMA, MICHITOMO, TANAKA, SO, Iiyama, Michitomo c/o, Tanaka, So c/o
Applicants: SUMITOMO ELECTRIC INDUSTRIES, SUMITOMO ELECTRIC INDUSTRIES, LTD.
Application year: 1992
Main classification: H01L39
IPC codes: H01L39