Angle detecting device and optical apparatus, such as exposure apparatus, employing the same

Abstract: Disclosed is a device for determining an angle of incident light or a shift in incident light based on the output value of a detector. In a predetermined angle detection range, a beam of light incident on a detector for detecting the intensity of light incident thereon is restricted such that the amount of light continuously increases or decreases in accordance with the angle between an optical axis of the incident light and a referential axis of an exposure apparatus. Outside of the predetermined angle detection range, the amount of light is restricted depending on the direction in which the optical axis of the light is shifted from the angle detection range. The amount of light incident on the detector continuously increases or decreases in accordance with the angle between the optical axis of the incident light and the referential axis when the light is made incident within the angle detection range by means of the light restriction means. It is therefore possible to determine the angle of the incident light from the output value of the detector. When the light is made incident outside of the angle detection range, and since the amount of incident light is restricted in accordance with the direction in which the light is shifted, it is possible to determine the direction in which the light is shifted.

Description: The present invention relates to an angle detecting device, and to an exposure apparatus which employs the same, e.g., an exposure apparatus in which alignment between a mask and a wafer is performed using positioning light. In exposure apparatuses which are employed in the production of semiconductor chips, a mask on which a geometric pattern is formed and which serves as an original plate and a wafer substrate to be exposed must be aligned with a very high degree of accuracy. Fig. 18 is a schematic view of a conventional exposure apparatus. Such apparatus is disclosed in, for example, Japanese Laid-Open Patent Application No. Hei 2-72611. In Fig. 18, a mask pattern for semiconductor chips is formed on a mask 1501. A resist is applied on a wafer substrate 1502 which may be a silicon wafer. A movable table 1503 is movable with the wafer substrate 1502 held thereon. An alignment optical system 1504 detects a shift in the position between the mask 1501 and the geometric patterns etched on the wafer substrate 1502. The mask 1501, the alignment optical system 1504, the movable table 1503 and other components are mounted on a base 1505. An illumination beam 1506 used in the exposure process may be synchrotron radiation. Fig. 19 is an enlarged view of the essential parts of the exposure apparatus of Fig. 18. When an X-ray source is used as the illumination source, a mask pattern 1601 formed on the mask 1501 may be made of an X-ray absorber, such as gold. A resist 1603 is applied on an existing pattern 1602 previously etched into the wafer substrate 1502. Exposure must be conducted when the pattern 1601 on the mask 1501 is accurately aligned with the existing pattern 1602 on the wafer substrate 1502. To achieve this, the wafer substrate 1502 is registered with the mask 1501 such that a shift δ1 between the mask pattern transfer position defined by the direction of the illumination beam 1506 and the existing pattern on the wafer is zero. Therefore, it is desirable that the referential optical axis for the measurements conducted by the alignment optical system 1504 coincide with the direction of the illumination beam 1506. Even if they do not coincide with each other, the shift determined by the direction of the illumination beam 1506 can be corrected in the following manner. Assuming that  is the angle between a straight line 1605 which is the reference of the measurements conducted by the alignment optical system and a straight line 1604 indicating the direction of the illumination beam 1506 and that G is the distance (the proximity gap) between the wafer substrate 1502 and the mask 1501, a shift δ 2 measured by the alignment optical system is corrected based on a differential δ given by δ =  · G so as to obtain the shift δ 1 determined by the direction of the illumination. δ 1 + δ 2 = δ However, in this case, the proximity gap G must be a known factor. If an error Δg exists in the gap G, the following error ε cannot be corrected. ε =  · Δ g If Δg = 2 µm, | ε | < 0.002 µm can be achieved only when |  | ≦ 1 mrad. Fig. 20 shows a conventional mechanism for detecting whether the optical axis of the radiation used for exposure coincides with the referential axis of the exposure apparatus. In this mechanism, two pin-hole plates 1701 and 1702 each having a pin-hole of a diameter d at the central portion thereof are disposed at an interval of a predetermined distance L in such a manner that the pin-holes are aligned with the referential axis of the exposure apparatus. The light which passes through the pin-hole plates 1701 and 1702 is detected by a detector 1703 which detects the shift of the optical axis of the exposure radiation from its output value. Fig. 21 is a graph showing the relation between the intensity of light detected by the detector 1703 and the angle  between the optical axis of the exposure radiation and the referential axis of the exposure apparatus. The detector 1703 detects the maximum light intensity when the optical axis of the exposure radiation coincides with the referential axis, and the angle  is thereby reduced to zero. When an angle  exists the detected intensity of the light decreases accordingly. The light intensity curve of the detector 1703 is symmetrical to the aforementioned maximum value thereof. The aforementioned conventional angle detecting mechanism for the exposure apparatus detects the maximum value when there is no angle, but detects two values when there is an angle. It is therefore impossible to determine both the shift of the optical axis and the direction of the shift thereof using the output value of the detector alone. This makes adjustment of the positioning of the exposure apparatus difficult. When the angle of incidence is to be obtained from the output of the detector, the angle detection mechanism must be moved over the entire range of angles so as to obtain the angle corresponding to the maximum output value. This is a troublesome task. Furthermore, when it is desired to enhance the detection accuracy, the value d/L (where L is the distance between the pin-hole plates, and d is the diameter of the pin-hole) must be reduced. However, reduction of the ratio d/L narrows the range of detectable angles or makes alignment of the exposure radiation with the reference axis of the exposure apparatus difficult. The present invention aims at providing a technique for easily detecting a shift in the angle and direction of the shift of the optical axis of a beam of light with respect to the reference axis, and a technique for correcting the shift in the angle on the basis of the detected shift in the angle. According to the invention there is provided an angle detecting device for detecting the magnitude and direction of the angle between the axis of an X-ray beam and a reference axis, said device comprising: first and second X-ray restriction members, disposed along the reference axis for restricting the size of the X-ray beam; and a detector for detecting the intensity of the X-ray beam restricted by said restriction members, wherein said first and second X-ray restriction members are arranged and disposed such that the intensity of the restricted X-ray beam detected by the detector increases continuously from a minimum, corresponding to the minimum angular inclination of the axis of the restricted X-ray beam with respect to the reference axis, to a maximum, corresponding to the maximum angular inclination of the axis of the restricted X-ray beam with respect to the reference axis, when the direction of the axis of the restricted X-ray beam, with respect to the reference axis, is scanned from the minimum angular inclination, through the angular inclination parallel to the reference axis, to the maximum angular inclination, or vice versa, the intensity of the restricted X-ray beam detected by the detector decreases continuously from a maximum, corresponding to the minimum angular inclination of the axis of the restricted X-ray beam with respect to the reference axis, to a minimum, corresponding to the maximum angular inclination of the axis of the restricted X-ray beam with respect to the reference axis, when the direction of the axis of the restricted X-ray beam, with respect to the reference axis, is scanned from the minimum angular inclination, through the angular inclination parallel to the reference axis, to the maximum angular inclination. Further according to the invention there is provided a method of detecting the magnitude and direction of the angle between the axis of an X-ray beam and a reference axis, comprising the steps of: disposing first and second X-ray restriction members along the reference axis for restricting the size of the X-ray beam; and detecting the intensity of the X-ray beam restricted by said restriction members by means of a detector, wherein said first and second X-ray restriction members are arranged and disposed such that the intensity of the restricted X-ray beam detected by said detector increases continuously from a minimum to a maximum when the direction of the axis of the restricted X-ray beam, with respect to the reference axis, is scanned from a minimum angular disposition, through the angular disposition parallel to the reference axis, to a maximum angular disposition, or vice versa, the intensity of the restricted X-ray beam decreases continuously from a maximum to a minimum when the direction of the axis of the restricted X-ray beam, with respect to the reference axis, is scanned from a minimum angular disposition parallel to the reference axis, to a maximum angular disposition, so that the magnitude and the direction of the angle between the X-ray axis and the reference axis are detected in accordance with the variation of the output of said detector. The apparatus of the present invention may be used in an optical apparatus, such as an exposure apparatus for making a semiconductor device. The optical apparatus may comprise an optical device provided with angle detection means. The device comprises light generation means for generating a beam of light, angle detection means for detecting an angle of an optical axis of the beam of light relative to a referential axis of the optical device, and correction means for performing correction in accordance with the detected angle. The angle detection means includes a detector for detecting the intensity of the beam of light incident thereon, and a light restricting member for restricting the beam of light incident on the detector such that the intensity of the light beam increases or decreases in accordance with the angle between the optical axis of the beam of light and the referential axis. The optical device also can include holding means for holding an original and a substrate. In which case, the light generation means generates one of a beam of light for aligning the original plate with a substrate and a beam of light for exposure of the substrate. Also, in which case, the detector can include a pin-hole plate having a hole at a substantially central portion thereof and a position detector disposed at a position at which the light, which has passed through the pin-hole plate, is made incident for detecting an incident position of the light which differs in accordance with the angle of the beam of light, the pin-hole plate and the position detector being disposed in that order with the pin-hole plate being located on the incident side of the beam of light. The present invention can be utilized in an exposure method including an angle detection operation. The method includes the steps of generating one of a beam of light for aligning an original plate with a substrate and a beam of light for illuminating the substrate for exposure, detecting an angle of an optical axis of the beam of light relative to a referential plate, the angle being detected from an output of a detector which detects intensity of light incident on the detector which is obtained when the incident beam of light is restricted by a light restricting member such that the amount of light increases or decreases in accordance with the angle between the optical axis of the beam of light and the referential plane, adjusting the angle detected in the detecting step such that the detected angle is reduced to zero and illuminating the light for exposure of the substrate after the adjusting step to expose the substrate in a pattern of the original plate. The present invention also can be utilized in a method of manufacturing semiconductor devices by a manufacturing process, in which case the method also includes a step of preparing a substrate and an original plate on which an original pattern of the semiconductor device is formed. Then, the illuminating step includes illuminating the light for exposure of the substrate after the adjusting step to expose the substrate in a pattern of the original plate. In the accompanying drawings: Fig. 1 shows the essential parts of a first embodiment of the present invention; Fig. 2 is a graph showing the relation between the angle of incidence  and the output value of a detector 3, obtained in the first embodiment of the present invention; Figs. 3 through 5 respectively show examples of exposure apparatuses which incorporate the first embodiment of the present invention; Fig. 6 shows the essential parts of a second embodiment of the present invention; Fig. 7 is a graph showing the relation between the angle of incidence  and the output value of a detector 63, obtained in the second embodiment of the present invention; Figs. 8(a) and 8(b) respectively show modifications of a wedge-shaped slit 62 shown in Fig. 6 which are wedge-shaped slits 81 and 82; Figs. 9(a) and 9(b) are graphs showing the relations between the angle of incidence  and the output value of the detector 63, respectively obtained when the wedge-shaped slits 81 and 82 of Figs. 8(a) and 8(b) are used; Fig. 10 shows the essential parts of a third embodiment of the present invention; Fig. 11 is a graph showing the relation between the angle of incidence  and a shifting value, obtained in the third embodiment of the present invention; Fig. 12 shows the essential parts of a fourth embodiment of the present invention; Fig. 13 is a graph showing the relation between the angle of incidence  and a shifting value, obtained in the fourth embodiment of the present invention; Fig. 14 shows for reference an angle detection mechanism; Fig. 15 shows an exposure apparatus according to the present invention; Fig. 16 shows the steps in the manufacturing processes of semiconductor chips; Fig. 17 shows the flow of the lithographic process in the manufacturing process of the semiconductor chips; Fig. 18 schematically shows a conventional exposure apparatus; Fig. 19 illustrates the principle of a conventional angle detection; Fig. 20 shows a conventional angle detection mechanism; and Fig. 21 is a graph showing the relation between the angle of incidence  and the output value of a detector 1703, obtained in the conventional technique. Embodiments of the present invention will now be described in detail with reference to the accompanying drawings. Fig. 1 shows the configuration of the essential parts of a first embodiment of the present invention. Incident light limiting means includes a knife edge 1, and a slit 2 having a rectangular opening 2a substantially at the central portion thereof. The height of the opening 2a is W. Reference numeral 3 denotes a detector. The knife edge 1 is provided such that the edge portion thereof is located on a referential axis 4 of an exposure apparatus. The slit 2 is disposed such that it is separated from the knife edge 1 by an interval L and such that the center of the opening 2a thereof is located on the referential axis 4. Hence, the intensity of the light of the detector 3 obtained when incident light 5 coincides with the referential axis 4 is one half of the intensity of the light I 0 obtained when no knife edge 1 is provided. Fig. 2 is a graph showing the relationship between the angle of incidence  between the referential axis 4 and the incident light 5 and the output value of the detector 3. Assuming that the beam diameter of the incident light 5 is sufficiently larger than the height W of the opening 2a and that the upward deviation of the beam as viewed in Fig. 1 is positive, the output value of the detector 3 linearly increases from zero to I 0 when the angle of incidence  is between -W/2L and W/2L. When the angle of incidence  is -W/2L or less, the output value of the detector 3 remains zero. At an angle of incidence  of W/2L or above, the output value of the detector is I 0 . Hence, when the angle of incidence  is between ±W/2L which is the angle detection range, the angle of incidence  can be obtained from the output value of the detector 3. Also, at an angle of incidence  which is outside of the angle detection range, it is possible to determine the direction in which the incident light deviates, i.e., whether the incident light deviates in a positive or negative direction. The detection range of the above-described angle detection operation is ± 10 mrad, when the height W is 1 mm and if the internal L is 100 mm. The detection accuracy is dependent on the precision of the detector 3. Consequently, an angle detection accuracy of ± 0.1 mrad is obtained when the precision of the detector 3 is ± 1%. In this embodiment, the knife edge 1 and the slit 2 are disposed in that order with the knife edge 1 being located closer to the light incident side. However, the knife edge 1 and the slit 2 may be exchanged in terms of the position. In this embodiment, angle detection is performed only in one direction. However, two-dimensional reduction in the shift in the pattern transfer angle requires two-dimensional detection of the angle of incidence of the incident light. In this case, angle detection can be performed in two directions by providing two sets of mechanisms shown in Fig. 1 perpendicular to each other. Figs. 3 through 5 show an example of an X-ray exposure apparatus for performing exposure using synchrotron radiation into which the angle detection mechanism 33 shown in Fig. 1 is incorporated. In either of the exposure apparatuses shown in Figs. 3 through 5, exposure is conducted using synchrotron radiation 31 generated by a synchrotron radiation device. Since the operation associated with exposure is the same throughout the apparatus shown in Figs. 1 through 3, it will be described below with the major components being indicated by the same reference numerals. Synchrotron radiation 31 passes through an X-ray transmitting window 32 and is then made incident on an exposure chamber 39. In the synchrotron radiation 32 incident area in the exposure chamber 39, a mask 35 which is an original pattern and a wafer substrate 36 are respectively held by a mask chuck 34 and a wafer chuck 40. The mask and wafer chucks 34 and 40 are movably provided on mask and wafer stages 37 and 38, respectively. In the exposure apparatus shown in Fig. 3, the angle detection mechanism 33 is provided on the outer peripheral portion of the mask chuck 34 parallel to the referential axis of the exposure chamber 39. Since exposure is conducted by the radiation which passes through the central portion of the mask 35, the configuration shown in Fig. 3 allows shifts in the angle and direction of the incident light, such as the synchrotron radiation 31, with respect to the referential axis to be detected during the exposure operation. The X-ray transmission window 32 shown in Fig. 3 is made larger than the typical ones in terms of area so as to allow the synchrotron radiation 31 to be illuminated on the angle detection mechanism 33. In the exposure apparatus shown in Fig. 4, the angle detection mechanism 33 is fixed to a mounting plate 41. In this apparatus, angle detection is performed using the angle detection mechanism 33 chucked by the mask or wafer chuck 34 or 40 in place of the mask 35 or wafer 36 when the exposure chamber 39 is installed. Fig. 4 shows the state in which the angle detection mechanism 33 is chucked by the mask chuck 34. The angle detection mechanism 33 is removed when the exposure operation is conducted after detection of the angle. In this case, it is not necessary for the exposure chamber 39 to be provided with a special means (for example, an X-ray transmission window 32 having a normal size can be used). In the exposure apparatus shown in Fig. 5, angle detection mechanisms 33 1 and 33 2 are provided in a beam line 51 for connecting the synchrotron radiation device to the exposure chamber parallel to the referential axis of the exposure chamber 39. The angle detection mechanism 33 1 is provided between the X-ray transmission window 32 and the synchrotron radiation device, while the angle detection mechanism 33 2 is disposed between the X-ray transmission window 32 and the exposure chamber 39. An angle detection operation requires only one of the angle detection mechanisms 33 1 and 33 2 . In either case, it is possible to detect the angle of the synchrotron radiation 31 regardless of the state of the exposure apparatus. In a case wherein the angle detection mechanism is provided between the synchrotron radiation device and the X-ray transmission window 32, like the angle detection mechanism 32 1 , an X-ray transmission window 32 having a normal size can be used, as in the case shown in Fig. 4. It is not necessary for the angle detection mechanism to be provided parallel to the referential axis of the exposure apparatus. When the angle detection mechanism is provided at an angle with respect to the referential axis, the output value of the detector may be corrected in accordance with the angle. Fig. 6 shows the essential parts of a second embodiment of the present invention. In this example, an angle detection mechanism for detecting the angle of incident light 65 includes a slit 61, a wedge-shaped slit 62, the slits 61 and 62 constituting the incident light limiting means, and a detector 63. These components are disposed in that order along a referential axis 64 with the slit 61 located closest to the radiation source. The slit 61 has an elongated opening for limiting the amount of incident light 65 in the vertical direction, and the wedge-shaped slit 62 has an inverted triangular opening having a height of h which is the widest at the upper side thereof. The inverted triangular opening is provided to obtain the output value of the detector 63 corresponding to the angle of incidence  of the incident light 65. The slit 61 and the wedge-shaped slit 62 are disposed apart from each other by an interval L in such a manner that the referential axis 64 passes the center of the individual openings. Fig. 7 is a graph showing the relationship between the angle of incidence  of the incident light 65 and the output value of the detector 63. When the angle of incidence  is between -h/2L and h/2L which is the angle detection range, the output value of the detector 63 linearly decreases from I 0 to 0. When the angle of incidence  is -h/2L or less, the output value of the detector 63 is I 0 . At an angle of incidence of h/2L or above, the output value of the detector 63 is zero. Hence, it is possible to determine the angle of incidence  from the output value of the detector 63, as in the case of the aforementioned first embodiment. In the embodiment shown in Fig. 6, the wedge-shaped slit 62 has an inverted triangular opening. The output characteristics of the detector 63 with respect to the angle of incidence  can be changed by changing the shape of this opening. In the embodiment shown in Fig. 6, the slit 61 and the wedge-shaped slit 62 are disposed in that order with the slit 61 located closest to the light incident side. The order at which these slits are disposed may be changed. This also applies to modifications of the second embodiment which will be described below with reference to Figs. 8(a) and 8(b). Fig. 8(a) shows a wedge-shaped slit 81 having a V-shaped notch, and Fig. 8(b) shows a wedge-shaped slit 82 having a V-shaped notch whose sides are curved. Figs. 9(a) and 9(b) are graphs respectively showing the output characteristics of the detector 63 with respect to the angle of incidence  obtained when the wedge-shaped slits 81 and 82 shown in Figs. 8(a) and 8(b) are used in place of the wedge-shaped slit 62 shown in Fig. 6. Assuming that the height of the notch of the wedge-shaped slits 81 and 82 is W1, in the case of using the wedge-shaped slit 81, when the angle of incidence  is between -W1/2L and W1/2L, the output value of the detector 63 linearly decreases from I 0 to zero, as shown in Fig. 9(a). In the case of the wedge-shaped slit 82, when the angle of incidence  is between -W1/2L and W1/2L, the output value of the detector 63 continuously decreases from I 0 to zero. However, the degree of that decrease differs depending on the range of the angle of incidence, as shown in Fig. 9(b), because of a non-linear change in the lateral length of the notch caused by the curved sides of the notch of the wedge-shaped slit 82. In the angle detection conducted using the wedge-shaped slit 82, the output value of the detector obtained when the angle between the incident light 65 and the referential axis 64 is in the vicinity of zero changes rapidly, and the angle detection accuracy is thus improved. Fig. 10 shows the essential parts of a third embodiment of the present invention. The embodiments shown in Figs. 1 through 6 are designed to detect the angle of the optical axis of radiation from the output value of the detector. Therefore, in these methods, variations in the intensity of incident light generate detection errors. This may cause a problem in the X-ray exposure apparatuses of the type which use synchrotron radiation as the exposure radiation, shown in Figs. 3 through 5, because variations in the intensity of incident light readily occur in such apparatuses. This third embodiment is directed to detection of the angle from the rate of the detected value of the detector to a monitored intensity of incident light. In Fig. 10, a knife edge 101, a slit 102 1 , a detector 103 1 and a referential axis 104 1 have the same configurations as the knife edge 1, the slit 2, the detector 3 and the referential axis 4 shown in Fig. 1, and are disposed in the same manner as those components. In addition to these components, the third embodiment further includes a slit 102 2 and a detector 103 2 which form a second detector and which are respectively similar to the slit 102 1 and the detector 103 1 . The slit 102 2 and the detector 103 2 are disposed such that a referential axis 104 2 which is parallel to the referential axis 1041 passes through the center of the opening of the slit 102 2 . The detector 103 1 detects the angle in the same manner as that shown in Fig. 1. The detector 103 2 detects the intensity of incident light (not shown) independently of the detection of the angle of incidence  thereof. In this embodiment, the angle is detected from the value obtained by dividing the output of the detector 103 1 by the output of the detector 103 2 (hereinafter referred to as a shifting value). Fig. 11 is a graph showing the relation between the shifting value and the angle of incidence . In the third embodiment, angle detection accuracy remains the same even when the intensity of incident light varies. This allows a highly accurate angle detection to be conducted all the time. In the third embodiment, a detector is used to detect the intensity of incident light. However, the intensity of incident light may indirectly be detected (by monitoring the acceleration voltage or current in the case of X-rays generated from a ring gun). Fig. 12 shows the essential parts of a fourth embodiment of the present invention. This embodiment is designed to eliminate angle detection errors caused by variations in the intensity of incident light by using a combination of two detectors whose dependencies of the output values on the angle of incidence differ from each other in a complementary fashion, unlike the third embodiment in which the angle detection errors are eliminated by monitoring the intensity of incident light. The angle detection mechanism according to this embodiment includes a slit 121 1 , a wedge-shaped slit 122 1 , a detector 123 1 , the slit 121 1 , the wedge-shaped slit 122 1 and the detector 123 1 being disposed in that order with respect to a referential axis 124 1 , and a slit 121 2 , a wedge-shaped slit 122 2 and a detector 123 2 , the slit 121 2 , the wedge-shaped slit 122 2 and the detector 123 2 being disposed in that order with respect to a referential axis 124 2 which is parallel to the referential axis 124 1 . The slits 121 1 and 121 2 and the corresponding wedge-shaped slits 122 1 and 122 2 are respectively separated by a distance L, as in the case of the second embodiment shown in Fig. 6. The wedge-shaped slit 122 1 has an inverted triangular opening which has a height of h and which is widest at the upper side. The wedge-shaped slit 1222 has a triangular opening which has a height of h which is the widest at the lower side thereof. Since the individual openings are formed in the wedge-shaped slits 122 1 and 122 2 such that the sum of the lateral lengths thereof are constant at positions in the vertical direction, the sum of the intensities of incident light (not shown) detected by the detectors 123 1 and 123 2 is also constant regardless of the angle of incidence . In this embodiment, angle detection is performed using the shifting value obtained by dividing the intensity of light detected by the detector 123 2 (or by the detector 123 1 ) by the sum of the intensities of light detected by the detectors 123 1 and 123 2 . Fig. 13 is a graph showing the relationship between the shifting value and the angle of incidence . In this embodiment, a highly accurate angle detection can be performed independently of variations in the intensity of incident light. In this embodiment, the slits 121 1 and 121 2 and the wedge-shaped slits 122 1 and 122 2 are disposed in that order with the slits 121 1 and 121 2 being disposed on the light incident side. However, the wedge-shaped slits 122 1 and 122 2 and the slits 121 1 and 121 2 may be disposed in that order. In the aforementioned embodiments, a photodiode or a photomultiplier can be used as a detector for detecting visible or ultraviolet radiation, and a proportional counter, a semiconductor detector, a photomultiplier or a microchannel plate may be used as a detector for detecting X-rays. These allow angle determination to be conducted in various types of exposure apparatuses. Fig. 14 shows angle detection performed by an angle detection mechanism which is made up of a pin-hole plate 141 having a small opening at the central portion thereof and a two-dimensional position detector 142. The pin-hole plate 141 and the two-dimensional position detector 142 are disposed in that order in the direction of propagation of incident light 143. The pin-hole plate 141 and the two-dimensional position detector 142 are disposed at an interval parallel to a referential axis (not shown) of the exposure apparatus. At that time, if both the diameter of the small hole formed in the pin-hole plate 141 and the angle resolution of the detector 142 are 10 µm, and if the interval L is 100 mm, it is possible to detect the angle of incidence associated with the two directions of the incident light 143 with an accuracy of 0.1 mrad. In this arrangement, since the angle detection can be conducted using the two components, the size of the angle detection mechanism can be reduced and the structure thereof can be simplified. Furthermore, a CCD, a position sensitive detector or a multianode proportional counter may be used as the position detector. Fig. 15 shows an exposure apparatus which incorporates any of the aforementioned angle detectors. The exposure apparatus is used in the lithographic process during the manufacture of semiconductor devices (semiconductor IC or LSI chips, liquid crystal panels or CCDs). The same reference numerals are used to denote components which are the same as those of Fig. 18. The angle detector 1507 has the configuration as that shown in any of the aforementioned embodiments. The angle detector may also be disposed at a position shown in any of Figs. 3, 4 and 5. An angle operating circuit 1508 operates a shift using the output of the angle detector 1507. An exposure apparatus posture control circuit 1509 drives a posture control actuator 1510 in accordance with the shift to cancel the shift. Since the angle detection method according to the present invention is capable of detecting the amount and direction of shift, control is facilitated. The shift may be cancelled by moving an illumination optical system while fixing the exposure apparatus. Alternatively, a shift in the position of the transferred pattern may be calculated from the shift in the angle of the optical axis, and the wafer substrate 1502 may be moved such that the shift in the position of the transferred pattern can be cancelled so as to align the mask 1501 and wafer substrate 1502 with the illumination beam 1506. In either case, a shift of the mask 1501 and wafer 1502 relative to the illumination beam 1506 can be cancelled on the basis of the output of angle detector 1507. Figs. 16 and 17 illustrate semiconductor chip manufacturing processes utilizing the exposure process which uses the aforementioned exposure apparatus. Fig. 16 shows the steps in major semiconductor chip manufacturing processes, and Fig. 17 shows the steps in a lithographic process conducted in the wafer process shown in Fig. 16. In the wafer process in which ICs are fabricated on a silicon wafer, the processes shown in Fig. 17 are conducted repetitively (for example, twenty times). The use of the exposure apparatus according to the present invention improves the exposure accuracy, such as the transfer position accuracy, and thereby enables highly integrated semiconductor chips to be manufactured. The angle detection technique and the exposure apparatus which uses this technique have been described. However, the angle detection technique according to the present invention can also be utilized in an alignment method conducted in various types of optical apparatuses, such as microscopes, X-ray diffraction meters or telescopes. While the present invention has been described with respect to what is presently considered to be the preferred embodiments, it is to be understood that the invention is not limited to the disclosed embodiments. To the contrary, the invention is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the appended claims. The scope of the following claims is to be accorded the broadest interpretation so as to encompass all such modifications and equivalent structures and function.

Claims: An angle detecting device for detecting the magnitude and direction of the angle between the axis of an X-ray beam and a reference axis, said device comprising: first and second X-ray restriction members (1;2, 61;62, 101;102, 121;122), disposed along the reference axis for restricting the size of the X-ray beam; and a detector (3, 63, 103 1 , 123) for detecting the intensity of the X-ray beam restricted by said restriction members, characterised in that said first and second X-ray restriction members are arranged and disposed such that the intensity of the restricted X-ray beam detected by the detector (3) increases continuously from a minimum (O), corresponding to the minimum angular inclination (-W/2L) of the axis of the restricted X-ray beam with respect to the reference axis (4), to a maximum (Io), corresponding to the maximum angular inclination (W/2L)of the axis of the restricted X-ray beam with respect to the reference axis, when the direction of the axis of the restricted X-ray beam, with respect to the reference axis, is scanned from the minimum angular inclination, through the angular inclination parallel to the reference axis, to the maximum angular inclination, or vice versa, the intensity of the restricted X-ray beam detected by the detector (63) decreases continuously from a maximum (Io), corresponding to the minimum angular inclination (-h/2L) of the axis of the restricted X-ray beam with respect to the reference axis (64), to a minimum (O), corresponding to the maximum angular inclination (h/2L) of the axis of the restricted X-ray beam with respect to the reference axis, when the direction of the axis of the restricted X-ray beam, with respect to the reference axis, is scanned from the minimum angular inclination, through the angular inclination parallel to the reference axis, to the maximum angular inclination. An angle detecting device as claimed in claim 1, characterised in that said first X-ray restriction member comprises a knife edge (1, 101) and said second X-ray restriction member comprises a slit (2, 102) having an opening (2a) for restricting the X-ray beam in one direction perpendicular to the X-ray beam. An angle detecting device as claimed in claim 1, characterised in that said first X-ray restriction member comprises a slit (61, 121) having an opening for restricting the X-ray beam in a predetermined direction, and said second X-ray restriction member comprises a wedge-shaped slit (62, 81, 82, 122) having an opening whose dimension increases or decreases perpendicularly to said predetermined direction. An angle detecting device as claimed in claim 1, 2 or 3, characterised in that correcting means (102 2 , 103 2 ) are provided for providing angle correction without being affected by variations in the intensity of the source of the X-ray beam. An angle detecting device as claimed in claim 4, characterised in that said correcting means comprises a detector (103 2 ) for detecting variations in the intensity of the incident X-ray beam independently of the angle of incidence. An angle detecting device as claimed in any one of claims 1-5, characterised in that adjusting means (1510) are provided for adjusting the angle between the X-ray beam axis and the reference axis in accordance with the detected magnitude and direction of the angle. An exposure apparatus comprising an angle detecting device (33, 1507) as claimed in any one of claims 1-6 for detecting an angle of an X-ray beam (31, 1506) relative to the reference axis of the exposure apparatus, and means for exposing a substrate (36, 1502) with the X-ray beam. An exposure apparatus as claimed in claim 7, characterised in that adjusting means (1510) are provided for adjusting a position of the exposure apparatus relative to the X-ray beam (31, 1506) on the basis of the angle detection performed by the angle detecting device claimed in any one of the claims 1-6. A method of detecting the magnitude and direction of the angle between the axis of an X-ray beam and a reference axis, comprising the steps of: disposing first and second X-ray restriction members (1;2, 61;62, 101;102, 121;122), along the reference axis for restricting the size of the X-ray beam; and detecting the intensity of the X-ray beam restricted by said restriction members by means of a detector (3, 63, 103, 123), characterised in that said first and second X-ray restriction members are arranged and disposed such that the intensity of the restricted X-ray beam detected by said detector increases continuously from a minimum (O) to a maximum (Io) when the direction of the axis of the restricted X-ray beam, with respect to the reference axis, is scanned from a minimum angular disposition (-W/2L), through the angular disposition parallel to the reference axis (O), to a maximum angular disposition (+W/2L), or vice versa, the intensity of the restricted X-ray beam decreases continuously from a maximum (Io) to a minimum (O) when the direction of the axis of the restricted X-ray beam, with respect to the reference axis, is scanned from a minimum angular disposition parallel to the reference axis (O), to a maximum angular disposition, so that the magnitude and the direction of the angle between the X-ray axis and the reference axis are detected in accordance with the variation of the output of said detector. A method of manufacturing a semiconductor device comprising the steps of: preparing a substrate (36) and an original plate (35) on which an original pattern of the semiconductor device is formed; generating an X-ray beam (31); exposing the substrate (36) to the X-ray beam (31) by passing it through the original pattern (35) to expose the substrate (36) to the original pattern; and fabricating a semiconductor device from the substrate (36); characterised by the steps of, after generating the X-ray beam (31) and before exposing the substrate (36); detecting the angle between the axis of the X-ray beam (31) and a reference axis using the method of claim 9, wherein the reference axis is the desired direction of incidence of the X-ray beams (31) on the original plate (35); and adjusting the angle between the X-ray beam axis and the reference axis to reduce the angle.

Inventors: AMEMIYA MITSUAKI, MIYAKE AKIRA, AMEMIYA, MITSUAKI, MIYAKE, AKIRA
Applicants: CANON KK, CANON KABUSHIKI KAISHA
Application year: 1991
Main classification: G03B41
IPC codes: G01B11, H01L21, G03F7, G03F9