Quantum interference devices and methods for processing interference current

Abstract: An electron wave is propagated through a plurality of quantum-structure paths of a quantum interference device and is branched into into plural electron waves that are confined in the quantum-structure paths. The electron waves from the quantum-structure paths are combined into a plurality of kinds of different energy level electron waves with varying magnitudes dependent on phase differences between the branched electron waves. The currents of the plurality of kinds of electron waves are detected and a non-fluctuating current is produced from the detected currents. The fluctuation of the electron wave current does not influence the non-fluctuating current and the phase differences among branched electron waves may be modulated by light, an electric field or a magnetic field applied to the branching portion of the device.

Description: This invention relates to interference of electron waves and processing interference current, and, more particularly to a quantum interference device (QID) and a method for converting signals carried by a magnetic field, an electric field, light or the like to electric signals by the Aharonov-Bohm effect (A-B effect), the optical Stark effect or the like. There has been developed a photodetector without photon absorption as shown in Fig. 1A which is a kind of QID. This device is operated as follows. Electrons injected from a source electrode 110 disposed at the left side of Fig. 1A begin to propagate through paths or waveguides 111, 112 and 113 towards a drain electrode 114 formed at the right side with a wave function and an energy E indicated by e ikx s(z)Y(y) E = (ℎ 2 /2m*)k 2 + E S + E Y The paths 111, 112 and 113 are formed with a quantum well structure (QWS), a quantum line structure (QLS) or the like. In the formulae (1) and (2), m* is the effective mass of an electron moving in an x-direction, k is an angular wave number of the motion in the x-direction, E s and  s (z) are respectively the energy and the wave function of a ground state level of electron subbands with respect to a z-direction, and E Y and Y(y) are respectively the energy and the wave functions of a ground state level of electron subbands with respect to a y-direction. As shown in the band structures of Figs. 1B-1D, the wave function of electrons is split in two in a central part, and in the upper QLS 112 (narrow one) the wave function and the energy are as indicated in formulae (3) and (4), respectively, while in the lower QLS 13 (wide one) they are as indicated in formulae (5) and (6), respectively. e ikNx  Na (z)Y(y) E = (ℎ 2 /2m*)k N + E Na + E Y e ikWx  Wa (z)Y(y) E = (ℎ 2 /2m*)k W + E Wa + E Y In the formulae (3) and (5), normalization constants are omitted, and in those formulae (3) - (6), E Na and  Na (z) are respectively the energy and the wave function of a ground state level of electron subbands in the upper QLS 112 with respect to the z-direction, E Wa and  Wa (z) are respectively the energy and the wave function of a ground state level of electron subbands in the lower QLS 113 with respect to the z-direction, and k N and k W are respectively the angular wave numbers of the motion in the x-direction in upper and lower QLS's 112 and 113. Since, in general, a relation E Na ≠ E S is satisfied, k N ≠ k is obtained from the formulae (2) and (4), and likewise k W ≠ k is obtained in the lower QLS 113. In this example, however, k W = k N is established because this device is formed such that E Na = E Wa is established when no light is applied to the central part (i.e., electrons are branched into the upper and lower QLS's 112 and 113 in an equal ratio). Here, if light is passed through the central part of this device, the following optical Stark shift occurs. E Na → E Na - (eµ N ε) 2 / δ N E Wa → E Wa - (eµ W ε) 2 / δ W where ℎω = E Nb - E Na - δ N ( δ N << ℎω) = E Wb - E Wa - δ W ( δ W <<ℎω ) and E Nb and E Wb are respectively energies of the second level in the upper and lower QLS's 112 and 113 with respect to the z-direction and µ N and µ W are respectively magnitudes of dipoles of a transition from the ground state level to the second level in the upper and lower QLS's 112 and 113. It is especially effective when the device is designed such that following relation is satisfied (see the band structure in Fig. 1C). E Wb - E Wa < ℎω < E Nb - E Na Hence, δ N > 0 and δ W < 0, so E Na in the upper path 112 shifts to the lower value and E Wa in the lower path 113 shifts to the upper value as is seen in the formulae (7) and (8) (see the hatched arrows in the band structure of Fig. 1C). Then, k N of the upper path 112 increases while k W of the lower path 13 decreases, as is known from the formulae (4) and (6). Thus, if the wave numbers in the upper and lower QLS's 112 and 113 are different, a phase difference between electrons travelling in the upper QLS 112 and electrons travelling in the lower QLS 113 occurs after they have traveled in each path QLS 112 and 113 the same distance in the x-direction. As the part where the light is applied is 0 ≦ x ≦ L, the phase difference Δ  is given by For instance, if the phase difference Δ  is π, the form of a combined wave function will become  A that corresponds to the second state, but not  S that corresponds to the first state, of the combined wave, when the wave function of electrons is over again combined at the right side path 111 in Fig. 1A. However, the combined wave has only an energy corresponding to  S but not  A , so this is reflected backward. Hence, electrons cannot reach the drain electrode 114 on the right side, so that current would not flow between the source electrode 110 and the drain electrode 114. In fact, as is seen from the formulae (7), (8), (11) and so forth, the phase difference Δ  varies in accordance with the intensity I (associated with ε 2 ) of the light, and the transmittance or transmission coefficient of current to the drain electrode 114 on the right side varies in proportion to cos 2 (Δ /2). Thus, the current J is given by J = J O cos 2 (Δ /2) where J O is a constant. Therefore, Δ  is obtained from a measured value of J by using the formula (11), and the intensity I of the light is known from the relationship between Δ  and the intensity I, for example, Δ = gI + Δ O where g and Δ  O are constants, respectively. The above technology is disclosed in the Japanese patent application No.2-45085 corresponding to the Japanese laid-open publication No. JP-A-3 248 478 filed by the same assignee. However, according to the above technology, there may be a problem that an error occurs when the intensity I of light is derived from the current value J. In other words, the measured value of J would fluctuate for the same intensity I of light, each time its value is measured. This is because the flow of current would fluctuate even if it were highly controlled, due to the collision of electrons at a microscopic level, the capture of electrons to a certain energy level, etc., and because J O in the formula (12) would waver depending on time. Further, where no current is detected at the side of the drain electrode 114, confirmation could not be made if there really exists no current or no current is detected because electrons have been reflected backward. In such manner, errors would occur where the phase difference Δ  is estimated from the measured current value J, owing to an uncertainty of J O . JP-A-63 93 161 discloses a semiconductor switching element wherein the conductive channel is constituted by two GaAs quantum well layers. A phase difference in response to an applied electric or magnetic field is caused between the two branched electron waves present in the two GaAs quantum well layers. JP-A- 1 129 477 discloses a semiconductor photodetector utilizing the light induced Aharonov-Bohm effect. In this device, the incident light is absorbed by GaAs, i.e. the channel material. Accordingly, the number of carriers generated and hence the Fermi energy depend on the amount of incident light. Thereby a phase difference is caused between the electrons travelling along two different paths. This phase difference is used for obtaining a photodetector signal. An object of the present invention is to provide a quantum interference device which is capable of minimizing the above mentioned errors. Another object of the present invention is to provide a method for minimizing the above mentioned errors when a quantum interference current is measured or detected. According to one aspect of the present invention, there is provided a quantum interference device comprising a semiconductor quantum interference device having a source region, a first drain region, a second drain region, a first quantum structure path, and a second quantum structure path, each of said quantum structure paths being for propagating an electron wave therethrough from said source region to a different one of said drain regions, wherein said quantum structure paths are coupled in a first region adjacent to the source region whereby in operation a first electron wave having a first wave function is emitted in the quantum structure paths in said first region from the source region, wherein said quantum structure paths are uncoupled in a second region between the first region and the drain regions, whereby the first wave function is split into two second wave functions by means branching the first electron wave into a pair of second electron waves having said second wave functions, each of said second electron waves being confined in a different one of said quantum structure paths, and wherein said quantum structure paths are coupled in a third region between the second region and the drain regions, whereby the two second wave functions are combined by means combining the second electron waves, and the quantum structure paths are uncoupled in a fourth region between the third region and the drain regions, whereby said combining means generate in the third region a pair of third electron waves having different energy levels and varying in magnitude depending on a phase difference between the second electron waves, each of said third electron waves being confined in the fourth region in a different one of said quantum structure paths; means to vary a phase difference between said second electron waves; means to apply a constant current to the source region of the semiconductor device or means to apply a constant voltage across the source region and the drain regions; means to detect respective currents of each of said pair of third electron waves, which flow across the source region and a respective drain region; and operation means to form a non-fluctuating current from the detected currents, the non-fluctuating current not being influenced by fluctuations of the current of the electron waves. According to a second aspect of the present invention, there is provided a method for processing an interference current in a quantum interference device as defined above, comprising the steps of branching a first electron wave propagating through first and second quantum-structure paths into a pair of second electron waves, each of which being confined in a different one of said quantum-structure paths; varying a phase difference between said second electron waves; combining said second electron waves and generating a pair of third electron waves having different energy levels and varying in magnitude depending on a phase difference between said second electron waves; detecting currents of each of said third electron waves; and forming a non-fluctuating current from the detected current, the non-fluctuating current not being influenced by fluctuations of the current of the electron wave. These advantages and others will be more readily understood in connection with the following detailed description, claims and drawings. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1A is a view showing the structure of a related quantum interference device. Figs. 1B - 1D are views illustrating band structures and wave functions of respective parts of the device of Fig. 1A. Fig. 2 is a view showing the structure of a first embodiment. Fig. 3A is a view showing the structure of deposited layers of the first embodiment. Fig. 3B is a view illustrating the band structure of the first embodiment. Fig. 4A is a schematic perspective view of the first embodiment. Fig. 4B is a cross-sectional view of Fig. 4A taken along a line A - A'. Fig. 5 is a perspective view of a second embodiment of this invention. Fig. 6 is a view illustrating wave functions under the gate electrode 30 of the second embodiment. Fig. 7 is a view illustrating a part of the second embodiment. Fig. 8A is a view illustrating the band structure, wave functions and subbands of the hatched portion of Fig. 7. Figs. 8B and 8C are respectively views illustrating band structures under gate electrodes 31 and 32. Fig. 9 is a perspective view showing a third embodiment of this invention. Fig. 10 is a block diagram showing an example in which the quantum interference device of this invention is used as an optical gate transistor. Fig. 11 is a block diagram showing an example of optical communication systems in which the quantum interference device of this invention is used as a photodetector. DESCRIPTION OF THE PREFERRED EMBODIMENT First, the basic principle of the invention will be explained by use of an example. By use of the above-mentioned composing or combining means comprising, e.g., a mode converter for electron wave and the measuring means, two kinds of currents J + and J - given by the following formulae are measured in place of J of the formula (12), J + = J O cos 2 ( Δ /2) J - = J O sin 2 ( Δ /2) Next, from these measured values J + and J - , the following "normalized current M" is obtained by the calculation or operation in the operating means, such as an operational amplifier, M ≡ (J + - J - )/(J + + J - ) Then, from the formulae (14a), (14b) and (15), the following formula (16) is obtained. M = cos(Δ ) Therefore, even if J O fluctuates, this fluctuation of J O would not influence such a serial estimation process of measured values of J + and J 1 value of M value of Δ  value of I (see the above formula (13)). As a result, the S/N ratio of this device is extremely improved. Fig. 2 shows a schematic structure of the first embodiment. In Fig. 2, there are provided paths 1, 2 and 3 as electron travelling paths, a barrier layer 4, a source region 5, two drain regions 6 and 6', a mode converter 7, a constant current source 8, ammeters 9 and 9 ' and an arithmetic device 10. Differences from the structure of Fig. 1A include that the mode converter 7 is added at a portion on the right side of Fig. 2 and that, accompanied therewith, there are provided two ammeters 9 and 9' for respective J + and J - . In Fig. 2, the driving is done by the constant current source 8, but there is no essential difference even if a constant voltage driving is used as shown in Fig. 1A. However, in the structure of Fig. 2, the resistance to the electron current will be greatly changed depending upon the light irradiation situation of a central zone, so that constant voltage driving is not preferred since the current will vary greatly. The mode converter 7 is achieved, for example, by a structure in which the QLS's 2 and 3 intersect each other through the thin barrier layer 4 as shown in Fig. 2. Transmittance or a transmission coefficient 50 % can be easily attained by adjusting the thickness and composition of the barrier layer 4. In this connection, such technology is described, for example, "Principles of Electron Tunneling Spectroscopy" by E.L. Wolf, Oxford University Press, 1985. The two ammeters 9 and 9' can be replaced by an operational amplifier. Fig. 3A shows the layered structure of the above embodiment and Fig. 3B illustrates the band structure thereof. In Fig. 3A, on a GaAs substrate 11, an i (intrinsic) - GaAs buffer layer 12 having a thickness of 5000Å, an i-GaAs layer 13 having a thickness of ∼100nm (∼1000Å) , an i-AlAs layer 14 having a thickness of ∼2nm (∼20Å), an i-AlGaAs layer 15 having a thickness of ∼5nm (∼50Å), an n-AlGaAs layer 16 having a thickness of ∼100nm (∼1000Å) (dopant concentration: 1 x 10 18 ) and an n-GaAs layer 17 having a thickness of ∼20nm (∼200 Å) (dopant concentration: 1 x 10 18 ) may be formed in that order. As is shown in Fig. 3B, a two-dimensional electron gas 2DEG is formed between the i-GaAs layer 13 and the i-AlAs layer 14, and thereby electrons are confined in a direction perpendicular to planes defined by the layers 12 - 17. In Fig. 3B, E f indicates the Fermi energy. Further, in Fig. 3A, the i-GaAs layer 13 constitutes a single hetero-structure, but this may be replaced by a quantum well structure and in this case the width of the well is about 10nm (100Å). The i-AlAs layer 14 may be replaced by an i-AlGaAs whose Al fraction is 0.3 - 0.4, e.g., i-Al 0.3 Ga 0.7 As. The transverse confinement for forming the QLS or electron path is achieved, for example, by a ridge structure formed by, e.g., RIBE (reactive ion beam etching) which is illustrated in Fig. 4B that is an A - A' cross-sectional view of Fig. 4A. Fig. 4A is a schematic perspective view of the device, and as is seen from Fig.4A, the confinement in the z-direction is attained by the double hetero-structure or quantum well structure while that in the x-direction is attained by the ridge structure of Fig. 4B. In Fig. 4B, the width of depletion due to the etching is about 100nm (1000 Å), though it depends on the amount of dopant. Therefore, when the width D 1 of a wider ridge is assumed to be ∼0.21µm, the electron confinement in the x-direction becomes 10nm (∼100 Å). Here, the widths D 1 and D 2 of the two ridges are made different from each other (D 1 ≠ D 2 ) so as to create the phase difference Δ  by the optical Stark effect or optical QCSE (quantum confinement Stark effect) when the light whose electric field vector E oscillates in the x-direction is applied to both of the paths 2 and 3 . In this structure, the barriers at the path 1 and the mode converter 7 are also formed by the depletion due to the etching. As regards the fabrication of the device, technologies are described, e.g., in "Semiconductors and Semimetals", Vol. 24, Academic Press. Inc. 1987. The operation of the mode converter 7 of this embodiment is performed in the following manner. As is shown in Fig. 2, when an electron wave having a wave function of exp (i N )  N is injected from the upper QLS 2 and that of exp (i  W )  W , from the lower QLS 3, they are combined or composed and wave functions of 1/√2·( exp (i  N ) + exp (i  W ))  + and 1/√2 · ( exp (i  N )- exp (i  W ))  - are emitted. This is the same as a case where light is incident on both sides of a half mirror and emitted therefrom. From the above, J + ∝ exp (i N )+ exp (i W ) 2 ∝cos 2 ( Δ /2) and J - ∝ exp (i N )- exp (i W ) 2 ∝ sin 2 (Δ/2) are obtained, and they are identical with the above formulae (14a) and (14b). Here, it should be noted that Δ  =  N -  W . In the embodiment shown in Figs. 3A, 3B, 4A and 4B, an electron wave branching part and a combining part of the electron paths or waveguides are formed by the etching, but they may be formed by the deposition of a linearly-formed double quantum well structure and a plurality of gate electrodes. In this second embodiment, as shown in Fig. 5, the linearly-formed double quantum well structure (DQWS) including two wells 21 and 22 are formed on a substrate 20. While the electron confinement in the z-direction is achieved by the wells 21 and 22, that in the x-direction is performed by a ridge 23 formed by etching. The ridge 23 is formed in a y-shape between a source 24 and a pair of drains 25 and 26, as shown in Fig.5. Further, there are formed a plurality of gate electrodes 28, 29, 30, 31 and 32. The first gate 28 operates to branch an electron wave propagated from the source 24 into two electron waves by applying a forward bias voltage. This branching operation is due to the location of the Fermi level above first and second subbands of the DQWS. The second and third gate 29 and 30 also act to maintain the branched state of the electron waves by locating the first and second subbands below the Fermi level. Under the gate electrode 30,however, the first and second subbands approach the Fermi level so as to combine or compose the wave functions of the branched waves. Light whose electric field E oscillates in a direction normal to a plane defined by the layers is directed to this part where the electron is branched into two. With respect to the thicknesses of the quantum wells 21 and 22, that of the upper well 21 is relatively wide while that of the lower well 22 is relatively narrow to branch the electron wave in an equal ratio by gate electrodes 28 and 29. Under the last gate 30, the electron wave occupies a bonding state 1 ○ with a lower energy or an antibonding state 2 ○ with a higher energy depending on the phase difference Δ, as shown in Fig. 6. The offset situations of the wave functions of 1 ○ and 2 ○ differ depending on the magnitude of the phase difference 2π m and (2m + 1)π caused by the light applied to the central part (the optical QCSE). At the gate 31, a voltage is applied to locate the first state of the wider quantum well 21 lower than that of the narrower quantum well 22, while at the gate 32, a voltage is applied to locate the first state of the narrower quantum well 22 lower than that of the wider quantum well 21. As a result, the drain 25 can detect a component of the phase difference 2mπ and the drain 26 can detect a component of the phase difference (2m + 1)π, because the former electron wave component is re-coupled under the gate 30 and transmitted through the part under the gate 31, while the latter electron wave component is re-coupled under the gate 30 and transmitted through the gate 32. In other words, at a part hatched as shown in Fig. 7, the Fermi energy is located above the level of the antibonding state 2 ○ as illustrated in Fig. 8A showing the band structure. And, at the part under the gate 31, a forward bias voltage is applied so that the first state of the wider quantum well 21 becomes lower as shown in Fig. 8B, while at the part under the gate 32, a reverse bias voltage is applied so that the first state of the narrower quantum well 22 becomes lower as shown in Fig. 8C. The other operation of the second embodiment is the same as that of the first embodiment. Thus, from two measured currents a combination is calculated, which is not influenced by the fluctuation of electron current (fluctuation of J O ), and the intensity of light to be detected is detected with a high S/N ratio. In the above embodiments, photodetectors without photon absorption are adopted as the QID, but devices may be formed as other types of QID. Also in this case, a part where two electron waves with a phase difference are combined is replaced by the mode converter, and downstream thereof, two ammeters are provided. Further, in the above embodiments, the sum and the difference of the two kinds of currents and a proper combination without any fluctuation is produced, but other processing methods of the two kinds of currents are possible. For instance, such method can be adopted in which the "OR" operation of the two kinds of currents is performed and the "AND" operation of an output of the "OR" operation and one of the two kinds of currents is performed to obtain a combination without any fluctuation. In the above embodiments, the optical Stark effect is utilized, but other effects can be used, such as the magnetostatic A - B effect and electrostatic A - B effect. In these cases, an input directed to the part where the electron is split into two is not light, but a magnetic flux and an electrostatic potential or gate voltage. While the voltages applied by the gate electrodes 28 and 29 are kept unchanged in the second embodiment, in the case where the input is the gate voltage, at least one voltage thereof is modulated to modulate the phase difference. Fig.9 shows an embodiment in which the gate voltage is kept unchanged and the magnetic field H is varied to modulate the interference current. In this case, the phase difference between the two electron waves is controlled by applying the magnetic field H across the layers 21 and 22 of a device 43 described above in a direction of an arrow in Fig. 9 by an electomagnet 42. This phase difference Δ  is represented by Δ  = 2π e/ch · Φ where Φ is a magnetic flux passing through a portion of the layers 21 and 22 were the electron wave is branched into two, e is the charge of an electron , c is the velocity of light and h is the Planck constant. The operation is substantially the same as the above embodiment. The above quantum interference devices can be used as high-speed current modulators, and, as an example, Fig.10 shows a block diagram illustrating an optical gate transistor in which the embodiment of Fig. 2 or Fig. 5 is employed. In Fig. 10, reference numeral 58 is such a device. Between the electrodes of the device 58, a voltage is applied by a power source 59. A gate light L G is applied from a laser light source 61 such as a semiconductor laser to the device 58. The processed drain current i D of the device 58 is modulated by modulating the light L G by a current i G supplied to the light source 61 from a laser driver 60. When the gate light L G is a pulse light whose pulse width is below 1 ps, the drain current i D can be modulated at this rate. Fig. 11 shows a block diagram illustrating an optical communication system in which the embodiment of Fig. 2 or Fig. 5 is used as a photodetector. In Fig. 11, reference numeral 66 is an optical fiber for transmitting light signals. A plurality of end offices 68 1 , 68 2 , ···, 68 n are connected to the optical fiber 66 through optical nodes 67 1 , 67 2 , ···, 67 n , respectively. Terminals 69 1 , 69 2 , ···, 69 n are connected to the respective end offices. Each terminal includes a keyboard, a display device, etc. In each end office, there are provided a light signal transmitter consisting of a laser light source 62 and a modulator 63 and a light signal receiver consisting of a photodetector 80 and a demodulator 81. The transmitter and receiver are controlled by a controller 64 according to instructions from the terminal 69 1 . While there has been shown and described what are considered preferred embodiments of the present inventions, it will be obvious to those skilled in the art that various changes and modifications may be made therein without departing from the inventions as defined by the claims.

Claims: A quantum interference device comprising: a semiconductor quantum interference device having a source region (5, 24), a first drain region (6, 25), a second drain region (6', 26), a first quantum structure path (2, 21), and a second quantum structure path (3, 22), each of said quantum structure paths (1, 2, 3, 21, 22) being for propagating an electron wave therethrough from said source region (5, 24) to a different one of said drain regions (6, 6', 25, 26), wherein said quantum structure paths (1, 21, 22) are coupled in a first region adjacent to the source region (5, 24) whereby in operation a first electron wave having a first wave function is emitted in the quantum structure paths (1, 21, 22) in said first region from the source region, wherein said quantum structure paths (2, 3, 21, 22) are uncoupled in a second region between the first region and the drain regions (6, 6', 25, 26) whereby the first wave function is split into two second wave functions by means (4, 28, 29) branching the first electron wave into a pair of second electron waves having said second wave functions, each of said second electron waves being confined in a different one of said quantum structure paths (2, 3, 21, 22), and wherein said quantum structure paths (2, 3, 21, 22) are coupled in a third region between the second region and the drain regions (6, 6', 25, 26) whereby the two second wave functions are combined by means (7, 30) combining the second electron waves, and the quantum structure paths (2, 3, 21, 22) are uncoupled in a fourth region between the third region and the drain regions (6, 6', 25, 26) whereby said combining means generate in the third region a pair of third electron waves having different energy levels and varying in magnitude depending on a phase difference between the second electron waves, each of said third electron waves being confined in the fourth region in a different one of said quantum structure paths (2, 3, 21, 22), means (42) to vary a phase difference between said second electron waves; means (8) to apply a constant current to the source region of the semiconductor device or means to apply a constant voltage across the source region (5, 24) and the drain regions (6, 6', 25, 26); means (9, 9') to detect respective currents of each of said pair of third electron waves, which flow across the source region (5, 24) and a respective drain region (6, 6', 25, 26); and operation means (10) to form a non-fluctuating current from the detected currents, the non-fluctuating current not being influenced by fluctuations of the current of the electron waves. A quantum interference device according to Claim 1, wherein said means to vary directs light to said second region. A quantum interference device according to Claim 1, wherein said means (42) to vary applies a magnetic field to said second region. A quantum interference device according to Claim 1, wherein said means to vary applies an electric field to said second region. A quantum interference device according to Claim 1, wherein a distance between said paths (2, 3) is larger in said second region than in said first region, whereby the first electron wave is branched into said pair of second electron waves. A quantum interference device according to Claim 1, wherein said paths (21, 22) are linear and said branching means (28, 29) branches the first electron wave into said pair of second electron waves by locating first and second subbands of said paths (21, 22) below the Fermi level in said second region. A quantum interference device according to Claim 1, wherein said two third electron waves have wave functions being respectively a sum and a difference of the second wave functions and said operation means (10) obtains the non-fluctuating current from said sum and said difference. A quantum interference device according to Claim 7, wherein said operation means (10) obtains a quotient between said sum and said difference to obtain the non-fluctuating current. A quantum interference device according to Claim 1, wherein said combining means (30) generates a pair of third electron waves occupying a bonding state and an antibonding state, respectively, and said operation means (10) obtains the non-fluctuating current from the corresponding bonding and antibonding state currents. A quantum interference device according to Claim 1, wherein said operation means (10) perform an "OR" operation on the third electron waves and an "AND" operation on an output of the "OR" operation and one of the third electron waves to obtain the non-fluctuating current. A method for processing an interference current in a quantum interference device as claimed in any one of claims 1 to 10, comprising the steps of: branching a first electron wave propagating through first and second quantum-structure paths (1, 2, 3, 21, 22) into a pair of second electron waves, each of which being confined in a different one of said quantum-structure paths (1, 2, 3, 21, 22); varying a phase difference between said second electron waves; combining said second electron waves and generating a pair of third electron waves having different energy levels and varying in magnitude depending on a phase difference between said second electron waves; detecting currents of each of said third electron waves; and forming a non-fluctuating current from the detected current, the non-fluctuating current not being influenced by fluctuations of the current of the electron wave.

Inventors: FUJII KAZUHITO, OKUDA MASAHIRO, SHIMIZU AKIRA, FUJII, KAZUHITO, OKUDA, MASAHIRO, SHIMIZU, AKIRA, FUJII, KAZUHITO, C/O CANON KABUSHIKI KAISHA, OKUDA, MASAHIRO, C/O CANON KABUSHIKI KAISHA, SHIMIZU, AKIRA, C/O CANON KABUSHIKI KAISHA
Applicants: CANON KK, CANON KABUSHIKI KAISHA
Application year: 1991
Main classification: H01L29
IPC codes: H01L29