Metal-metal epitaxy on substrates

Abstract: Metal film and metal superlattice structures with controlled orientations are grown at room temperature using a silicon or germanium substrate (12) coated with an epitaxially grown copper layer (10). The metal films (14) are preferably deposited by electron beam evaporation without external heating of the copper coated substrate (12).

Description: The present invention relates to growing metal-metal epitaxy on substrates at room temperature. Specifically, the invention relates to metal film and metal superlattice structures with controlled orientations grown at room temperature using a silicon or germanium substrate coated with an epitaxially grown copper layer. Recent developments of epitaxial growth of metal layers at room temperatures provide a way of obtaining various metal structures for both scientific study and technological applications. The lack of suitable metallic substrates in thin film form has limited progress in the area. The present invention describes a method which allows growth of metal films and metal-metal alternate structures, or superlattices, with controlled orientations. The method commences with a silicon or germanium substrate coated with an epitaxially grown copper film as the seed layer. The deposition is performed by conventional electron beam evaporation in a vacuum of low 1.33 x 10⁻⁵ Pa (10⁻⁷ torr), without intentional or externally applied heating of the substrate during the deposition process. When a silicon substrate is used, the technique just described is referred to as metal-metal expitaxy on silicon (MMES). The MMES technique described uses silicon as the substrate with epitaxial grown copper film as the seeding layer for the epitaxial growth of other metals. This method differs from the technique of depositing epitaxial metal films on GaAs substrates by means of molecular beam epitaxy (MBE) technique. The latter process is more complicated and costly than the MMES method. The cost involved of the MBE system and GaAs substrates as well as the growth process involved make the MMES method more attractive and practical for large scale applications. The principles of the MMES method is extendible to other growth techniques, including sputtering and other thin film deposition techniques. It is known in the art that metal films of controlled orientation are difficult to grow on each other due to the difficulty of obtaining seed metal layers with the desired orientation. According to the present invention, a novel method is disclosed in which a seed metal layer of controlled orientation, for example Cu, is first deposited on single crystal silicon. The subsequent deposition of other metals on a (100) copper film allows the growth of (100) oriented metal films. Metals such as nickel, cobalt, titanium, palladium, rhodium, iridium, zirconium and hafnium have been so deposited. Certain metals do not exhibit a lattice match with the copper seed layer. Such metals require one or more additional metal seed layers before epitaxial growth is achieved. For example, gold, silver, platinum, iron, vanadium and chromium which do not grow epitaxially on copper will grow epitaxially when palladium is first deposited on the copper film. Tungsten and molybdenum, for instance, do not grow epitaxially on palladium but will grow epitaxially when gold is first deposited on the palladium film. The result is a five layer metal-metal epitaxy on silicon structure. Niobium, which shows no epitaxial growth on palladium or gold, shows a partial epitaxy of (100) growth on (100) Mo. This is an example of six layer epitaxy on silicon. The method is performed using conventional electron beam evaporation in a vacuum of 1.33 x 10⁻⁵ Pa (10⁻⁷ torr), without intentional heating of the substrate during deposition. As a result, the method is readily applicable to a manufacturing line. Following the described method, copper epitaxially deposits on silicon with (100) and (111) Cu films grown using (100) and (111) Si substrates, respectively. Using the deposited copper layer as a seeding layer, further epitaxial growth of other metals is accomplished. Metals which exhibit such an epitaxial relation on the copper layer include Ni, Co, Rh, Ir, Ti, Pd, Zr and Hf. Other metals such as Au, Ag, Pt, Fe, V and Cr, which do not grow epitaxially on copper, grow epitaxially on Pd using Pd/Cu/Si structures. Still other metals such as Mo and W, which do not grow epitaxially on Pd, grow epitaxially on Au using Au/Pd/Cu/Si structures. Still further metals such as Nb, which do not grow epitaxially on palladium or gold, grow epitaxially on Mo using Mo/Au/Pd/Cu/Si structures. The present invention results in a single deposition of metal films with controlled orientation using conventional thin film evaporation techniques in a vacuum chamber without external heat applied to the substrate during deposition thereby minimizing reaction among components. The metal films thus deposited have many applications. The magnetic metals such as Ni, Co and Fe, all as thin individual layers and as superlattices, are of interest to the magnetic community. Studies involving Cu-Ni, Cu-Co and Ni-Co superlattices exhibit magnetic properties which are clearly dependent upon orientation. Rh and Ir layers and superlattices have application in catalytic activity of the metal using single crystals of different orientations. Metals such as Ni, Pd and Fe are also of interest as catalysts. The MMES method provides a simple method for making metal films with controlled orientation at much lower cost and with less complication in sample surface preparation than heretofore known methods. According to the present invention, a seed metal layer of controlled orientation, for example Cu, is first deposited on single crystal germanium. The subsequent deposition of other metals, such as Ni, on a (100) oriented copper film allows the growth of (100) oriented metal film. The results with germanium substrate have been similar to those described above in conjunction with silicon substrates. The use of germanium as the substrate offers the advantage that it is possible to grow metal-metal structure with controlled orientations on GaAs substrate. In an article entitled "Interface morphology of epitaxial growth of Ge on GaAs and GaAs on Ge by molecular beam epitaxy" by Chin-An Chang in the Journal of Applied Physics, volume 53, page 1253 dated February 1982 and in an article entitled "Interface morphology studies of (110) and (111) Ge-GaAs grown by molecular beam epitaxy" by Chin-An Chang in Applied Physics Letters, volume 40, page 1037, dated June 1982 epitaxially grown germanium on GaAs using molecular beam epitaxy techniques is described. Such a germanium layer can be used as the substrate for the epitaxial growth of Cu, followed by other metals. After the Ge layer has been deposited on GaAs, the metallic layers or superlattices can be grown on the Ge/GaAs substrate either in the same molecular beam epitaxy system or in a separate chamber. The result is the simultaneous presence of both the magnetic metal structures and GaAs device structures on the same substrate for a variety of applications. Alternatively, it is possible to deposit Si on the GaAs substrate, followed by the deposition of the metal structures. In this regard, Ge is preferable due to the excellent lattice metal with GaAs; the mismatch is less than 0.1% for Ge-GaAs but more than 4% for Si-GaAs. A principal object of the present invention is therefore, the provision of a method for growing metal films and metal-metal alternate structures or superlattices with controlled orientations. Another object of the invention is the provision of a method for growing metal films and metal-metal alternate structures or superlattices with controlled orientation including the step of depositing an epitaxially grown copper film as a seed layer on a silicon or germanium substrate. Further and still other objects of the present invention will become more clearly apparent when the following description is read in conjunction with the accompanying drawings. Ways of carrying out the invention are described in detail below with reference to drawings showing only specific embodiments in which: Fig. 1A is a side elevation view of a preferred embodiment of a three layer metal-metal epitaxy structure on a substrate; Fig. 1B is a side elevation view of an alternate preferred embodiment of a four layer metal-metal epitaxy structure on a substrate; Fig. 2 is a graphical representation of an X-ray diffraction pattern of (100)Ni/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 3 is a graphical representation of an X-ray diffraction pattern of (100)Co/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 4 is a graphical representation of an X-ray diffraction pattern of (100)Co/(100)Cu/(100)Si structure manufactured in accordance with the present invention. The structure is heated to 300°C to consume the Cu present, allowing the Co(200) peak to be seen; Fig. 5 is a graphical representation of an X-ray diffraction pattern of a Ni/Co/Ni/Cu/Si (100) structure manufactured in accordance with the present invention; Fig. 6 is a graphical representation of an X-ray diffraction pattern of a Co/Ni/Co/Cu/Si (100) structure manufactured in accordance with the present invention; Fig. 7 is a graphical representation of an X-ray diffraction pattern of a Cu-Ni superlattice manufactured in accordance with the present invention; Fig. 8 is a graphical representation of an X-ray diffraction pattern of a Cu-Co superlattice manufactured in accordance with the present invention; Fig. 9 is a graphical representation of an X-ray diffraction pattern of a Ni-Co superlattice manufactured in accordance with the present invention; Fig. 10 is a graphical representation of an X-ray diffraction pattern of a Pd(100)/Cu(100)/Si(100) structure manufactured in accordance with the present invention; Fig. 11 is a graphical representation of an X-ray diffraction pattern of a Ti(001)/Cu(100)/Si(100) structure manufactured in accordance with the present invention; Fig. 12 is a graphical representation of an X-ray diffraction pattern of a Rh(100)/Cu(100)/Si(100) structure manufactured in accordance with the present invention; Fig. 13 is a graphical representation of an X-ray diffraction pattern of (100)Ir/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 14 is a graphical representation of an X-ray diffraction pattern of (100)Au/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 15 is a graphical representation of an X-ray diffraction pattern of (100)Ag/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 16 is a graphical representation of an X-ray diffraction pattern of a (100)Pt/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 17 is a graphical representation of an X-ray diffraction pattern of (100)Fe/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 18 is a graphical representation of an X-ray diffraction pattern of (100)V/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 19 is a graphical representation of an X-ray diffraction pattern of (100)Cr/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 20 is a graphical representation of an X-ray diffraction pattern of a (100)Mo/(100)Au/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 21 is a graphical representation of an X-ray diffraction pattern of (100)W/(100)Au/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 22 is a graphical representation of an X-ray diffraction pattern of (100)Fe/(100)Au/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 23 is a graphical representation of an X-ray diffraction pattern of (100)Fe/(100)Ag/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 24 is a graphical representation of an X-ray diffraction pattern of a (100)Fe/(100)Pt/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 25 is a graphical representation of an X-ray diffraction pattern of (100)Fe/(100)Au/(100)Fe/(100)Au/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 26 is a graphical representation of an X-ray diffraction pattern of (100)Fe/(100)Ag/(100)Fe/(100)Ag/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 27 is a graphical representation of an X-ray diffraction pattern of (100)Fe/(100)Pt/(100)Fe/(100)Pt/(100)Pd/(100)Cu/(100)Si structure manufactured in accordance with the present invention; Fig. 28 is a graphical representation of an x-ray diffraction pattern of Cu/(100)Ge structure manufactured in accordance with the present invention; and Fig. 29 is a graphical representation of an x-ray diffraction pattern of Ni/Cu/(100)Ge structure manufactured in accordance with the present invention. Referring now to the figures and to Fig. 1 in particular, there is shown a thin film layer of copper 10 expitaxially deposited on a silicon substrate 12 by means of electron beam evaporation without any intentional or external heating of the substrate. Both (100) and (111) oriented copper films can be epitaxially deposited on (100) and (111) silicon, respectively. The (100) orientation of Cu persists up to a thickness of 2 µm. The resultant copper film deposited on the silicon substrate is used as a substrate for further expitaxial growth of a third material 14. For instance, epitaxial growth of Ni and Co on the epitaxial Cu/Si layers result in metal-metal epitaxy on silicon. Further growth of Cu layers on the Ni and Co films retains the epitaxial relation making possible the growth of periodic epitaxial metal structures using the MMES method. The method used to achieve epitaxial deposition is as follows. The (100) and (111) silicon wafers are degreased, etched in buffered hydrofluoric acid and dried before being placed into the evaporator. The base pressure of the evaporator is low 1,33 · 10⁻⁵ Pa(10⁻⁷ torr) and a deposition rate of 1 nm/s is used for the metals. The layer thickness of the Cu, Ni and Co films are 100 nm. A single layer of Ni or Co is deposited on the (100)Cu/(100)Si structure, with the same orientation obtained. Films of (100)Ni and (100)Co are generally difficult to grow with conventional thin film deposition processes. Ni tends to grow in the (111) orientation, which is the preferred orientation for the face-centered cubic metals such as Ni and Cu. Co, on the other hand, grows in either the hexagonal form or the face-centered cubic form. The preferred orientation of the hexagonal form is (001). Fig. 2 is a graphical representation of the X-ray diffraction pattern of (100)Ni/(100)Cu/(100)Si structure. Only the (200) peaks are seen for both Ni and Cu, with no sign of the (111) peak of Ni. Fig. 3 is a graphical representation of the X-ray diffraction pattern of (100)Co/(100)Cu/(100)Si structure. The Co layer shows only the (200) peak, which is overlapping with the Cu (200) peak. To show the Co peak clearly, the sample is heated to 300°C to completely consume the Cu reaction with Si. Fig. 4 is a graphical representation of the X-ray diffraction of the sample after heating, showing only the (200) peak of Co, with all the Cu present reacted to form Cu silicides. Ni-Co alternate structures with controlled orientations are easily fabricated using the metal-metal epitaxy on silicon method. Specifically, Ni/Co/Ni/Cu/Si (100) and Co/Ni/Co/Cu/Si (100) structures have been manufactured and tested. Each metal layer is 100 nm. thick. As shown in Figs. 5 and 6, the X-ray diffraction analysis of the formed structure indicates (200) diffraction peaks of Cu, Ni and Co, without the detection of any (111) peaks. That is, there is complete epitaxy among all the deposited metal layers, each with (100) orientation. The success of depositing the Ni/Co/Ni alternate layers with controlled orientation allows fabrication of Ni/Co superlattices of the same orientation. Epitaxial growth of ultra thin layer superlattices have also been made. Figs. 7, 8 and 9 are graphical representations of Cu-Ni, Cu-Co and Ni-Co superlattices, respectively. Fig. 7 shows an X-ray diffraction pattern of the Cu-Ni superlattice [Cu(5 nm)-Ni(2,5 nm)] ₂₀/Cu(100 nm)/Si(100) as deposited. Fig. 8 shows an X-ray diffraction pattern of the Cu-Co superlattice [Cu(5 nm)-Co(2,5 nm)]₂₀/Cu(100 nm)/Si(100) as deposited. Fig. 9 shows an X-ray diffraction pattern of the Ni-Co superlattice [Ni(5 nm)-Co(5 nm)]₂₀/Cu(100 nm)/Si(100) as deposited. The graphs show well resolved satellite peaks due to the periodic structures present. Since the deposition is performed at room temperature, there is no reaction observed by the X-ray diffraction analysis. The resultant metal film structures have a wide variety of applications. The magnetic metals such as Ni and Co, have application for both the thin individual layer and superlattice in magnetic application. The Cu-Ni, Cu-Co and Ni-Co superlattices have shown magnetic properties which are clearly dependent upon orientation. The deposition method is not limited to electron beam evaporation, but other evaporation techniques as is known in the art are also useful in practicing the current invention. Such techniques include sputtering and low temeprature chemical vapor deposition. As described above, the present invention permits deposition of oriented titanium and palladium using the same electron beam evaporation at low vacuum without applying external heating. A 100 nm thick layer of Cu is deposited on a single crystalline silicon wafer. The (100)Cu film deposited on (100)Si allows for the deposition of (100)Pd in cubic form or (001)Ti in hexagonal form. Using deposition methods other than the present invention normally results in the deposition of Pd film in a (111) preferred orientation on (100) Si and Ti is usually in hexagonal form with the much less preferred (001) orientation. Figs. 10 and 11 are graphical representations of the (100)Pd and (001)Ti films deposited according to the present invention. Fig. 10 shows an X-ray diffraction pattern of Pd(100) film as deposited on Cu(100)/Si(100), showing only the (200) diffraction peak of Pd. Fig. 11 shows an X-ray diffraction pattern of Ti film as deposited on Cu(100)/Si(100), showing only the (002) diffraction peak of Ti. The deposition of Ti and Pd films at room temperature with controlled orientation in a conventional chamber is particularly advantageous for manufacturing. The deposition of alternating Ti and Cu layers, alternating Pd and Cu layers, and layers of Ti, Pd, Cu and other metal layers such as Ni and Co expitaxially grown on Cu, all with controlled orientation, are particularly useful for the fabrication of magnetic storage devices. In the field of catalysis, metal such as rhodium and iridium are of particular interest. Single crystals are used to control the requisite orientation. Thin layers of Rh and Ir, approximately 100 nm thick, were deposited on Cu film which had previously been epitaxially deposited on single crystal Si wafers. The entire deposition process of the Cu layer and Rh layer, as well as the Cu layer and Ir layer, were performed without removing the vacuum. No intentional heating is applied to the substrates during the deposition process. Using (100)Si wafers resulted in the deposition of (100)Rh and (100)Ir films. Fig. 12 is an X-ray diffraction pattern of Rh(100)/Cu(100)/Si(100) structure which shows only (200) diffraction peaks of the Rh and Cu. Fig. 13 is an X-ray diffraction pattern of a Ir(100)/Cu(100)/Si(100) structure which shows only the (200) diffraction peaks of the Ir and Cu. When (111) Si wafer is used as the substrate, (111) metal films are deposited. The growing of Rh and Ir films with controlled orientations has many advantages in catalysis application. The present invention results in metal films which are smooth and shiny eliminating tedious in situ cleaning and annealing of the substrate surface. The film deposition process is lower cost than the use of single crystal Rh and Ir. It is possible to grow other alternate film layers as needed without changing the substrate and without removing the vacuum. Certain other metals do not exhibit an epitaxial relation with copper due to a lack of a lattice match. Among these metals are gold, silver, platinum, iron, vanadium and chromium. When depositing layers of these metals, as shown in Fig. 1B, instead of using epitaxial Cu 10 as the seeding layer on the silicon wafer 12, an epitaxial Pd layer 16 is grown onto the Cu layer 10 to provide a suitable lattice match of adjoining metal layers before depositing the other metal layer 14. The Pd layer 16 provides a seed having a better lattice match with the other metals of interest. Fig. 14 shows an X-ray diffraction pattern of Au(100)/Pd(100)/Cu(100)/Si(100) which shows only the (200) diffraction peaks of the metals. Fig. 15 shows an X-ray diffraction pattern of Ag(100)/Pd/(100)/Cu(100)/Si(100) which shows only the (200) diffraction peaks of the metals. Similar epitaxial growth (100) oriented Pt films has been obtained, as shown in Fig. 16. However, due to the overlap of the (200) diffraction peaks of Pt with that of Pd, the (200) peaks are not resolvable with the instrumentation used. The diffraction patterns for the epitaxial growth of (100) Fe, V and Cr on the (100)Pd/(100)Cu/(100)Si structures are shown in Figs. 17-19. Fig. 17 shows the (100)Fe/(100)Pd/(100)Cu/(100)Si structure; Fig. 18 shows the (100)V/(100)Pd/(100)Cu/(100)Si structure; and Fig. 19 shows the (100)Cr/(100)Pd/(100)Cu/(100)Si structure. Only the (200) peaks are detected for Fe, V and Cr in these structures. This is especially significant in that these metals are all body-centered cubic, where the preferred orientation is the (110) orientation. Tungsten and molybdenum have been found not to epitaxially grow on the palladium layer. However, the interposition of an epitaxially grown gold layer on the palladium layer permits subsequent epitaxial growth of tungsten and molybdenum on the gold layer. Fig. 20 shows the defraction pattern of the (100)Mo/(100)Au/(100)Pd/(100)Cu/(100)Si structure, with only the (200) peaks seen for all the metal layers. Fig. 21 shows the diffraction pattern of the (100)W/(100)Au/(100)Pd/(100)Cu/(100)Si structure, with a strongly (100) orientation for W. Both Mo and W are body-centered cubic metals, where the preferred orientation is (110). The observation of a small (110) peak of W indicates an incomplete (100) epitaxial growth of W in such a structure. Iron also grows epitaxially on the (100) Au, Ag and Pt layers using the MMES technique. Shown in Figs. 22-24 are the diffraction patterns of the (100)Fe/(100)Au/(100)Pd/(100)Cu/(100)Si, (100)Fe/(100)Ag/(100)Pd/(100)Cu/(100)Si, and (100)Fe/(100)Pt/(100)Pd/(100)Cu/(100)Si, structures, respectively. Only the (200) peaks are seen for all the metal layers deposited. When additional Au, Ag and Pt layers, followed by another Fe layer, are deposited on the structures shown in Figs. 22-24, the epitaxial growth is retained. The diffraction patterns are shown in Figs. 25-27 for the (100)Fe/(100)Au/(100)Fe/(100)Au/(100)Pd/(100)Cu/(100)Si, (100)Fe/(100)Ag/(100)Fe/(100)Ag/(100)Pd/(100)Cu/(100)Si, and (100)Fe/(100)Pt/(100)Fe/(100)Pt/(100)Pd/(100)Cu/(100)Si, structures, respectively. All the layers deposited show only the (200) peaks. The successful growth of repeated Fe/Au, Fe/Ag and Fe/Pt layers in the (100) orientation allows the growth of superlattices of these stuctures with the same (100) orientation. Practicing the present invention, Cu is found to epitaxially deposit on Si with (100) and (111) Cu films grown using (100) and (111) Si substrates, respectively. Metals which have been epitaxially grown on the Cu seed layers include Ni, Co, Rh, Ir, Ti, Pd, Zr and Hf. Other metals such as Au, Ag, Pt, Fe, V and Cr which do not grow epitaxially on Cu, will grow epitaxially on Pd when using a Pd/Cu/Si structure. Still other metals such as Mo and W which do not grow on Pd, will grow epitaxially on Au when using a Au/Pd/Cu/Si structure. Still further metals, such as Nb which do not grow on Pd or Au, will grow epitaxially on Mo when using a Mo/Au/Pd/Cu/Si structure. Without the epitaxial growth obtained by practicing the present invention, the face-centered cubic metals, such as Ni, Rh, Ir, Pd, Au, Ag, Pt, and sometimes Co, will tend to grow in the (111) orientation. The body-centered cubic metals, such as Fe, V, Cr, Mo and W, will tend to grow in the (110) orientation. The growth of (100) oriented films for the metals is therefore significant using the technique described here. The above description is primarily concerned with the epitaxial deposition of metal films onto a silicon substrate. It has been demonstrated that similar epitaxial deposition of metal films onto a germanium substrate using the same method as that used in conjunction with a silicon substrate is possible. Fig. 28 shows the x-ray diffraction pattern of a (100) Cu/100(Ge) structure. Only the (200) peak for Cu and a Ge peak are shown. Fig. 29 shows the x-ray diffraction pattern of a (100)Ni/(100)Cu/ (100)Ge structure. Only the (200) peaks for the Cu and Ni metals and a Ge peak are shown. Having demonstrated the ability to deposit epitaxially grown metals of predetermined orientation on a germanium substrate, the further deposition of metal layers to form superlattices the same as those achieved with a silicon substrate is now possible when practicing the present invention.

Claims: A method of epitaxially growing a predetermined metal on a substrate at room temperature comprising the steps of: coating a substrate (12) of predetermined crystal orientation with an epitaxially grown layer of copper (10), and if the predetermined metal epitaxially grows on copper, then depositing a layer of the predetermined metal (14) onto the layer of copper (10) at room temperature without applying external heat to the coated substrate (12), if the predetermined metal does not epitaxially grow on copper, then sequentially depositing at least one intermediate layer of metal (16) onto the layer of copper for providing lattice matching between said predetermined metal and the last sequentially deposited intermediate layer (16), between sequentially deposited intermediate layers and between the first deposited intermediate layer and the layer of copper, and depositing a layer of the predetermined metal (14) on the last of said sequentially deposited intermediate layer (16), each layer being deposited at room temperature without applying external heat to the coated substrate. The method as set forth in claim 1 wherein said substrate (12) comprises silicon or germanium. The method as set forth in claim 1 or 2 wherein said depositing comprises electron beam evaporation in a vacuum of low 1,33 10⁻⁵ Pa (10⁻⁷ torr), sputtering or low temperature chemical vapor deposition. The method as set forth in one or more of the preceding claims 1 to 3 wherein said predetermined metal is selected from the group consisting of Ni, Co, Pd, Hf, Ir, Zr, Ti and Rh which grow on copper (10). The method as set forth in one or more of the preceding claims 1 to 3 wherein said predetermined metal is selected from the group consisting of Au, Ag, Pt, Fe, V and Cr and said at least one intermediate layer of metal (16) is Pd. The method as set forth in one or more of the preceding claims 1 to 3 wherein said predetermined metal is selected from the group consisting of Mo, W and Fe and said sequentially depositing at least one intermediate layer of metal (16) comprises depositing a first layer of Pd and depositing a subsequent layer of Au or Ar or Pt on said first layer of Pd. The method as set forth in one or more of the preceding claims 1 to 3 wherein said predetermined metal is Mo and said sequentially depositing at least one intermediate layer of metal (16) comprises depositing a first layer of Pd and depositing a subsequent layer of Au on said first layer of Pd, further comprising depositing a layer of Nb on said Mo layer (14). A metal-metal epitaxially grown structure comprising: a substrate (12) of predetermined crystalline orientation; a coating layer of epitaxially grown copper (10) deposited on said substrate (12); and a layer of a lattice matched predetermined metal (14) capable of growing on copper, deposited on said copper coating at room temperature without external heat applied to the copper coated substrate. A metal-metal epitaxially grown structure comprising: a substrate (12) of predetermined crystalline orientation; a coating layer of epitaxially grown copper (10) deposited on said substrate (12); an intermediate layer of a metal (16) lattice matched to said copper coating (10) and said predetermined metal capable of growing on copper, deposited on said copper at room temperature without external heat applied to the copper coated substrate (12); and a layer of a lattice matched predetermined metal (14) capable of growing on intermediate layer (16), deposited on said intermediate layer (16) at room temperature without external heat applied to the intermediate layer and copper coated substrate (12). A metal-metal epitaxially grown structure comprising: a substrate (12) of predetermined crystalline orientation; a coating layer of epitaxially grown copper (10) deposited on said substrate (12); a first intermediate layer (16) of a metal lattice matched to said copper coating (10) and capable of growing on said copper, deposited on said copper coating (10) at room temperature without external heat applied to the copper coated substrate (12); a second intermediate layer of a metal lattice matched to said first intermediate layer (16) and capable of growing on said first intermediate layer (16), deposited on said first intermediate layer (16) at room temperature without external heat applied to the first intermediate layer (16) and copper coated substrate (12); and a layer of a lattice matched predetermined metal (14) capable of growing on said second intermediate layer deposited on said second intermediate layer at room temperature without external heat applied to the second intermediate layer, first intermediate layer and copper coated substrate (12).

Inventors: CHANG CHIN-AN, CHANG, CHIN-AN
Applicants: IBM, INTERNATIONAL BUSINESS MACHINES CORPORATION
Application year: 1991
Main classification: C30B23
IPC codes: C30B25, H01L21, C23C14, C30B29, C30B23