Semiconductor device manufacturing apparatus

Abstract: In a semiconductor double-chamber etching apparatus, this etching apparatus can be manually operated in a maintenance area by connecting the movable manual operation panel, with a communication means, to anyone of a plurality of relay stations provided to the etching apparatus installed facing to the maintenance area, without using the manual operation panel of the etching apparatus provided to a face of the etching apparatus facing to the clean room adjacent to the maintenance area, being separated by a partition wall.

Description: BACKGROUND OF THE INVENTION (1) Field of the Invention The present invention relates to a semiconductor device manufacturing apparatus for manufacturing a semiconductor device such as a semiconductor integrated circuit. With remarkable development in ultra-miniaturization and high packing density of semiconductor device such as LSI and VLSI, the dust-free and vibration-proof working environment is a very important factor for improvement in the manufacturing yield of semiconductor devices. Recently, a variety of measures have been taken for attaining the dust-free and vibration-proof working environment. However, it is not easy to always maintain the semiconductor device manufacturing apparatus at the optimum condition under such specially designed working environment because maintenance of semiconductor manufacturing apparatus is always accompanied by a variety of difficulties. (2) Description of the Prior Art Fig. 1 schematically shows an etching apparatus and working environment thereof as an example of the conventional semiconductor device manufacturing apparatus. An etching apparatus is constituted by a wafer processing region consisting of a working area 1 including the etching chamber, a vacuum pump 2 for evacuating gas within the working area 1, and a DC power supply 3 and a high frequency power supply 4 to supply the DC power and high frequency power to the working area 1, which are independently installed. Moreover, as shown in Fig. 1, the working area 1 is provided externally with partition walls 7a and 7b to provide separated two chambers of a maintenance region 8 and wafer preparation region 9. The operation panel 5 and the wafer loading and unloading area 6 are provided in the wafer preparation region 9, while the other accessory apparatus of etching apparatus are provided in the maintenance region 8. The wafer preparation region 9 is a chamber called a clean room used for loading or unloading and transferring wafers. Therefore, the degree of cleanliness is kept higher than that of the maintenance region 8. In this example, a vacuum pump 2, a DC power supply 3 and a high frequency power supply 4 considered as the source of dust and vibration are separated from the working area 1 and are installed in the maintenance region 8. Accordingly, a degree of cleanliness of the wafer preparation region 9 is kept high. In some cases, the vacuum pump 2, DC power supply 3 and high frequency power supply 4 are installed separately in the other room. As described previously, the water preparation region 9 is never contaminated by dust generated in the maintenance region 8 during operation of the etching apparatus. However, maintenance or repair of such etching apparatus as installed in the special environment as explained above results in the following several problems. When the operation panel 5 is operated in the wafer preparation region 9 or when it is requested to watch the inside of working area 1 and condition of vacuum pump 2, DC power supply 3 or high frequency power supply 4 in the process of semiconductor device, a maintenance engineer 11 who is operating the operation panel 5 must request cooperation of the maintenance engineer 10 watching the respective apparatus in the maintenance region 8 and therefore at least two persons are required. In case the vacuum pump 2, DC power supply 3 or high frequency power supply 4 are installed in the room other than that wherein the working area 1 is provided, the maintenance engineers 10 and 11 are requested to make conversation through the telephone or transceiver. In the case of watching the transitional stages in each process to be sequentially conducted by the semiconductor device manufacturing apparatus, fine adjustment of operation such as start and stop of the semiconductor device fabrication apparatus is sometimes conducted. In this case, a maintenance engineer 10 conducts such adjustments while issuing instructions to another maintenance engineer 11. However, difference is generated between instruction for operation and actual operation timing and deviation in operations are inevitable and thereby it becomes difficult to conduct the maintenance work considered. If a maintenance engineer conducts the maintenance work only by himself, the partition walls 7a, 7b are partially opened and he must go and come back between the wafer preparation region 9 wherein the operation panel 5 is installed and the maintenance area 8 wherein the each apparatus is installed. As a result, the wafer preparation region 9 is naturally contaminated by dust. In the case of a semiconductor manufacturing apparatus such as a stepper, the working area 1 of apparatus constant temperature chamber in order to prevent expansion and contraction of an apparatus due to temperature change. The operation panel is separated from the working area so that the temperature controlling condition is never broken, even when the chamber is opened for operation. Moreover, the manual operation panel of the operating panel 5 is sometimes provided independently for the centralized control of the conditions of semiconductor device manufacturing apparatus. In any case, however, the apparatus is connected to the manual operating panel at the predetermined one area. Therefore, the maintenance work for the semiconductor device manufacturing apparatus has always been accompanied by difficulties as mentioned above. Namely, the maintenance work for semiconductor device manufacturing apparatus installed in the specially designed environment has usually resulted in the various problems that working flexibility is bad, work efficiency is also bad and the wafer treating area is contaminated by dust. SUMMARY OF THE INVENTION It is an object of the present invention to provide a semiconductor device manufacturing apparatus which ensures high working flexibility and efficiency of the maintenance work. It is another object of the present invention to provide a semiconductor device manufacturing apparatus which ensures high quality maintenance work. Such objects may be achieved by a semiconductor device manufacturing apparatus according to claim 1 which can be manually operated by maintenance engineers. Namely, the manual operation panel for operating manually the semiconductor device manufacturing apparatus is provided independently and movably from the semiconductor device manufacturing apparatus. On the other hand, the semiconductor device manufacturing apparatus is provided with a plurality of relay stations for communication with the manual operation panel. A maintenance engineer is capable of conducting the maintenance work by manual operation of the semiconductor device manufacturing apparatus through wired communication between the relay station nearest the maintenance field and the manual operation panel. Thereby, it can be avoided that a longer communication cable results in interference on the maintenance room. Accordingly, a single maintenance engineer is capable of monitoring the conditions of semiconductor device manufacturing apparatus and conducting the maintenance work while he is operating such semiconductor device manufacturing apparatus. As a result, deviation in the operation timing which may be often generated in the maintenance work conducted by two or more persons can be eliminated and the fine adjustment can also be realized. As explained previously, the present invention has improved the maintenance work efficiency and quality and simultaneously solved a problem of contamination by dust of the wafer treating region. As a result, a semiconductor device manufacturing apparatus which can always maintain the best condition can be realized. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic diagram indicating an etching apparatus and its working environment as an example of the conventional semiconductor device manufacturing apparatus; Fig. 2 is a schematic plan view for explaining the basic principle of an embodiment of the present invention; and Fig. 3 is a schematic plan view for explaining the 2-chamber system etching apparatus as an embodiment of the semiconductor device manufacturing apparatus of the present invention. DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present a invention will be explained hereunder with reference to Figs. 2 and 3. The like reference numerals and symbols indicate the like element or apparatus in these figures. Fig. 2 is a schematic diagram for explaining the basic principle of the embodiment of the present invention. The semiconductor device manufacturing apparatus of the present invention is characterized in that a maintenance engineer can operate the fabrication apparatus in the maintenance region 8 by his own hands. Namely, the manual operation panel 13 for manually operating the working area 12 is installed independently and movably from the working area 12. Meanwhile, the working area 12 is provided with a plurality of relay stations 14a, 14b, 14c, 14d, 14e, 14f,.......for communication with the manual operation panel 13. The maintenance engineer is capable of manually operating the working area 12 through the wired-communication between at least any one of the relay stations 14a, 14b, 14c, 14d, 14e, 1 4f,......and the manual operation panel 13. It is of course unnecessary to limit the communication between the relay station and manual operation panel 13 to the wired-communication and a radio communication can also be employed. Moreover, the working area 12 is associated by a plurality of accessory devices 12a, 12b, 13c,....(only 12a is illustrated) and in case such accessory devices are separately installed, each accessory device is respectively provided with a relay station for making communication with the manual operation panel 13 (for instance; a relay station 14f). When the automatic operation panel 15 for automatically operating the working area 12 is provided to the working area 12, it is convenient that the relay station 14a is provided in the same plane as providing the automatic operation panel 15. For the wired-communication between the manual operation panel and relay station, both devices are electrically connected by a wire cable and connector. Moreover, in case an optical fiber cable is used in place of the wire cable, the manual operation panel and relay station are optically coupled with an optical connector. When the radio communication is carried out between the manual operation panel and relay station, a receiver or transceiver tuned to the predetermined frequency is provided to the relay station and on the other hand, the manual operation panel is provided with a transmitter or transceiver tuned to the frequency mentioned above. Therefore, a maintenance engineer is capable of manually operating the semiconductor device manufacturing apparatus 12 by sending the operation signal of manual operation panel to the relay station. Moreover, in case transceivers are provided both in the manual operation panel and relay station, the condition signal of the semiconductor device manufacturing apparatus can be transmitted to the manual operation panel 13. The same function as that described above can also be attained by providing only the antenna to the relay station and on the other hand a receiver or transceiver to the semiconductor device manufacturing apparatus. In addition, such communication can also be realized with an infrared transceiver. Fig. 3 is a schematic plan view for explaining an embodiment of the semiconductor device manufacturing apparatus of the present invention. The present semiconductor device manufacturing apparatus is of the two-chamber system etching apparatus comprising the RIE (Reactive Ion Etching) chamber 23 and a down-flow chamber 17. The etching process by the apparatus of the present invention can be outlined as follows. A carrier accommodating a plurality of wafers is loaded to the carrier stations 16a, 16b and is then carried to a load lock chamber 20. Next, the load lock chamber 20 is evacuated to the vacuum condition by a vacuum pump 22 and thereafter the wafers are carried to the carrying chamber 21 which is previously evacuated to the vacuum condition. Then, the wafers are respectively carried, as designated, to the down-flow chamber 17 and RIE chamber 23 which are already evacuated to the vacuum condition. Since the reaction gas is supplied to the down-flow chamber 17 through a gas piping system 18 and to the RIE chamber 23 through a gas piping system 24, wafer etching work can be done. Upon completion of the etching work, the wafers are accommodated again in the carrier in the carrier stations 16a and 16b through the load lock chamber 20, thus completing total process. In this etching apparatus, in addition to the working area 1a to conduct the etching work, the four kinds of accessory devices of (1) a vacuum pump 19 for down-flow chamber 17 to evacuate the down-flow chamber to the vacuum condition, (2) a vacuum pump 22 for transfer chamber and load lock to evacuate the transfer chamber 21 and load lock chamber 20 to the vacuum condition, (3) a vacuum pump 25 for RIE chamber to evacuate the RIE chamber 23 to the vacuum condition, (4) a power supply rack 26 accommodating the DC power supply and high frequency power supply for conducting the etching work and the power supply for supplying the power to the working area 1a are independently provided in separation from the working area 1a. Meanwhile, the etching apparatus is controlled by a microcomputer system (not illustrated) provided in the working area 1a and running operations are carried out by operations at the operation panel and display area 27. In this etching apparatus, the relay station (1) 14g is provided at the front surface wherein the operation panel and display area 27 are provided; the relay station (2) 14h, to the left side surface where the down-flow chamber 17 is provided; the relay station (3) 14i, to the rear surface where the transfer chamber 21 is provided; the relay station (4) 14j, to the right side surface where the RIE chamber 23 is provided; and the relay station (5) 14k, to the power supply rack 26, respectively. The relay stations are connected to the manual operation panel 13 and microcomputer system for control with a wire cable. Namely the manual operations of etching apparatus can be realized by sending the operation signal of manual operation panel 13 to the microcomputer system for control by the relay stations. Therefore, if trouble occurs, for example, in the down-flow chamber 17, transfer system in the periphery thereof and a gas system, the maintenance work is carried out by connecting the manual operation panel 13 to the nearest relay station (2) 14h. In addition, if a failure occurs in the display area 27, the manual operation panel 13 is connected to the nearest relay station (1) 14g in order to confirm correspondence between the operation and and display. Moreover, in the same way for other relay station (3) 14i, relay station (4) 14j, relay station (5) 14k, the manual operation panel 13 is connected to the nearest relay station to the maintenance work field for the maintenance work. Of course, operation by the operation panel in the clean room side 9 automatically becomes impossible, when the manual operation is carried out by the manual operation panel in the maintenance region 8. The manual operation panel 13 provides the operation commands for automatic operation in addition to the operation commands for manual operation and realizes both manual and automatic operations even in any maintenance field. As a result, the maintenance period has been curtailed by 15% or more in the case of the embodiment of the present invention. Moreover, the maintenance work can be conducted by only one maintenance engineer. In this embodiment, a semiconductor etching apparatus has been described as the semiconductor device manufacturing apparatus. However, the present invention can also be applied to such a semiconductor device fabrication apparatus as MOCVD (Metal Organic Chemical Vapor Deposition).

Claims: An apparatus for manufacturing semiconductor de vices comprising: a wafer processing region (1a, 19, 22, 25, 26; 12, 12a); a first region (9) and a second region (8) exterior to said wafer processing region and separated from one another by a partition wall (7a, 7b); a first control means (15; 27) provided in said first region (9) and having an operation panel fixed to said wafer processing region for providing automatic operation of said wafer processing region; characterized in that the apparatus further comprises: a second control means capable of overriding said first control means and comprising: a manual operation panel (13) independent from said wafer processing region and movable within said first and second regions; a plurality of relay stations (14a-f) provided on the periphery of said wafer processing region; said manual operation panel (13) being selectively connectable to any one of said plurality of relay stations to provide manual operation of said wafer processing region. An apparatus for manufacturing semiconductor devices according to claim 1, wherein said apparatus further comprises a means for evacuation (19, 22, 25) attached to said second region of said semiconductor device manufacturing apparatus. An apparatus for manufacturing semiconductor devices according to claim 1 or 2, wherein the degree of cleanliness of said first region is higher than that of said second region. An apparatus for manufacturing semiconductor devices according to claims 1 to 3, wherein communication means employed to communicate between said relay stations (14a-f) and said manual operation panel (13) is selected from the group consisting of the wired-communication means, radio communication means and optical communication means. An apparatus for manufacturing semiconductor devices according to any of claims 1 to 4, wherein said semiconductor device manufacturing apparatus is an etching apparatus. An apparatus for manufacturing semiconductor devices according to any of claims 1 to 5, wherein said semiconductor device manufacturing apparatus is a CVD (Chemical Vapor Deposition) apparatus. An apparatus for manufacturing semiconductor devices according to claims 1 to 6, said wafer processing region comprising: a first processing chamber (23); a second processing chamber (17) for conducting a process different from that conducted in said first processing chamber; a load lock chamber (20) required for loading or unloading a substrate to be processed to said first and second processing chamber; a vacuum pump (19, 22, 25) for independently evacuating said first and/or second processing and/or load lock chambers to a vacuum condition; a gas supplying means for independently supplying the reactant gas to said first and/or second processing chamber; a power supply (26) for supplying the power required for processing in said first and/or second processing chamber and/or for evacuating said chambers to the vacuum condition; and a processing control unit provided in said semiconductor device manufacturing apparatus to control the processings in said first and/or second processing chambers. An apparatus for manufacturing semiconductor devices according to claim 7, wherein said first processing chamber is an RIE (Reactive Ion Etching) chamber (23) and said second processing chamber is a chamber (17) where down stream etching is performed. An apparatus for manufacturing semiconductor devices according to claim 7, wherein said first processing chamber is an RIE (Reactive Ion Etching) chamber (23) or plasma etching chamber and said second processing chamber is a CVD (Chemical Vapor Deposition) chamber.

Inventors: FUJIMURA SHUZO, FUJIMURA, SHUZO
Applicants: FUJITSU LTD, FUJITSU LIMITED
Application year: 1990
Main classification: H01L21
IPC codes: G03F7, H01L21