Surface inspecting apparatus

Abstract: According to the surface inspecting apparatus in the present invention, an inspecting width gate signal is generated in a procedure that when the subject matter is subjected to the scanning via the light beam, the counting means digitizes the detected position of both the front and rear ends of the subject matter, then the operating means calculates values which indicate the positions included within the range between both of the ends, thus generating the inspecting width gate signal. Consequently, it is possible to inspect any subject matter without resetting the effective inspecting range whenever a subject matter changes in its width.

Description: BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to a surface inspecting apparatus, more particularly to a flying spot type surface inspecting apparatus which inspects defects existing on a suface of a subject matter to be inspected such as a film, a paper, iron or the like by using a light beam. 2. Description of the Prior Art A conventional flying spot type surface inspecting apparatus comprises a scanner which includes a laser beam source irradiating a light beam, a lens system, a rotating mirror and the like, a light receiver receiving a transmitted light or a reflected light from a subject matter to be inspected, and a processing circuit which discriminates the presence of a defect by making use of a photoelectric conversion signal obtained from the light receiver. FIG. 1 shows an example of the surface inspecting apparatus above-mentioned. In FIG. 1, a scanning light beam 11 which is irradiated from a scanner 10 traces a scanning line 12a on the surface of a subject matter 12 moving in an X-direction. After being reflected on the surface of the subject matter 12 in the position of the scanning line 12a, the light beam 11 enters a light detector 13 to be photoelectrically converted. The electric signal outputted from the light detector 13 is subjected to the wave-form shaping in a filtering circuit 14 so as to intensify a portion having a defect. The signals are classified by a threshold level in a binarizing circuit 16 into two classifications, for example, the signal over the threshold level is allotted to "1" as a defect signal and the signal under the threshld level is allotted to "0" as a normal signal. On the other hand, a photosensor 17 installed together with the scanner 10 receives the initial light beam 11 of every scanning and electrically convertes the received light beam 11 into an electric signal to be outputted. When the electric signal is given, a counter 18 starts to count the number of reference pulses having a sufficiently-short and a constant cycle formed in a reference pulse generator 19. A comparating circuit 22 outputs "0" until the counting number increases from zero to a predetermined value ( which corresponds to a starting position K 1 preset by means of a starting position preset circuit 21 ) while another comparating circuit 23 outputs "1". When the counting number exceeds the predetermined value corresponding to the starting position K 1 set in advance, the comparating circuit 22 changes its value from "0" to "1" so as to keep on outputting the new value from then on. By this, an AND circuit 24 continues outputting "1". Sequentially, when the counting number of the reference pulse gets over another predetermined value which corresponds to an ending position K 2 preset by means of an ending position preset circuit 26, the comparating circuit 23 changes its output value from "1" to "0". Consequently, the AND circuit 24 keeps on outputting "0" from then on. As described above, an inspecting width gate circuit 27 which is enclosed with a broken line outputs an inspecting width gate signal E as shown in FIG.2E. Therefore, only when the aforementioned binarizing circuit 16 outputs a defect signal "1", all of the signals to be inputted into the AND circuit 27 become "1", and thereby the AND circuit 27 is to output a digital signal "1" which corresponds to a defect detecting signal F as shown in FIG.2F. FIGs.2A to 2F show waveforms of the signals A to F correspnding to their respective portions in the processing circuit shown in FIG.1. In these figures, when an effective inspecting range in the direction of the scanning is defined narrower than the width of the subject matter 12 by determining the values K 1 and K 2 to be preset, it is possible to continuously inspect the subject matter 12 skipping the edge portions thereof. This enables the defect detecting signal F to be detected separately from the noise made by the edges of the subject matter 12 shown in FIG.2C. In the conventional surface inspecting apparatus described above, the starting point and the ending point of the effective inspection need be manually set up by means of switches or the like so that the counter 18 may count up the reference clock in order to define the gate signal between the start setting point K 1 and the end setting point K 2 . Therefore, the conventional method has a disadvantage that the set-up for the starting point and the ending point must be changed whenever the subject matter changes in its width. US-A-3 360 651 discloses a web inspection device which detects the front end of the web, provides a leading edge delay, opens a detection gate for an estimated length of time, provides a trailing edge delay and then checks for coincidence of the end of this summation of sequential signals and the rear end of the web. Any error between this determined rear end position and the detected value is corrected by re-estimation of the interval of time in which the gate is open. SUMMARY OF THE INVENTION This invention has been accomplished in view of what is discussed above. The object of this invention is, therefore to provide a surface inspecting apparatus wherein the effective inspecting range has no need to be set or reset manually by the switches or the like whenever the subject matter changes in its width. This object is achieved according to the apparatus of claim 1 and the method of claim 4. The nature, principle and utility of the invention will become more apparent from the following detailed description when read in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS In the accompanying drawings: FIG.1 shows the conventional surface inspecting apparatus; and FIGs.2A to 2F are charts to show signal waves at the respective outputs of the main sections corresponding to FIG.1; FIG.3 is a schematic view to show an embodinent of the surface inspecting apparatus according to this invention; FIGs.4A to 4H are charts to show signal waves at the respective outputs of the main sections corresponding to FIG.3; FIG.5 is a flow chart to show an operation of the CPU 33; FIG.6 is a schematic view to show preferably features of the surface inspecting apparatus according to this invention. DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred features of this invention will be explained hereinafter according to the attached drawings. FIG.3 shows a block diagram explaining main sections in an embodiment of the surface inspecting apparatus according to this invention. FIGs.4A to 4H show outputs signals of the waveforms corresponding to their respective portions in FIG.3. A scanning light beam which is irradiated from a scanner 10 traces a scanning line 12a on the surface of a subject matter 12 moving in an X-direction. After being reflected in the position of the scanning line 12a, the light beam 11 enter a light detector 13, to be photoelectrically converted. The electric signal A as shown in FIG.4A outputed from the light detector 13 is subjected to the waveform shaping in a filtering circuit 14 so as to clearly show a portion having a defect. The filtered signal B is classified into what exceed a threshold level THLD1 and otherwise by means of a binarizing circuit 16, for example as shown in FIG.4B, the signal B over the threshold level THLD1 is allotted to "1" as a defect signal and the signal B under the threshold level THLD1 is allotted to "0" as a normal signal. The process described up to here is similar to the conventional method. Now, the signal C as shown in FIG.4C outputted from the binarizing circuit 16 is inputted into an AND circuit 27 together with a signal E as shown in FIG.4H transmitted from an inspecting width gate circuit 34. As a result as long as the signal E is effective, the signal C is outputted from the AND circuit 27 as a defect signal F. Here, the signal E obtained from the inspecting width gate circuit 34 is generated as explained hereinafter. First, the electric signal A from the light detector 13 is inputted also into another filtering circuit 28, to an output signal G as shown in FIG.4E. The output signal G then is inputted into a binarizing circuit 29 on the starting side as well as another binarizing circuit 30 on the ending side. The binarizing circuit 29 has a positively polarized threshold THLD2 and binarizes the inputted signal G to output a signal H as shown in FIG.4F, while the binarizing circuit 30 has a negatively polarized threshold THLD3 and then binarizes the same inputted signal G to output a signal I as shown in FIG.4G. A counting circuit 31 on the starting side is caused to count the number of the reference pulses sent from a reference pulse generator 19 ( for example 10 MHz clock ) as soon as a laser scanning timing detection signal D is inputted and keeps on counting until a pulse signal shows up in the signal H being inputted. A CPU ( Central Processing Unit ) 33 acquires the information as to the reference pulse number a counted, as explained above, by the counting circuit 31 on the starting side during the interval between the detecting pulse signal on the signal D and the pulse signal on the signal H. In the same manner, the counting circuit 32 on the ending side counts the number of the reference pulse generated by the reference pulse generator 19 from the detecting pulse signal on the signal D to the pulse signal on the signal I, then the information on the reference pulse number b is read by the CPU 33. After the above process, a value c being a little bit larger than the reference pulse number a is prepared therefrom to be set in a comparating circuit 22 as well as a value d being a little bit smaller than the reference pulse number b is prepared therefrom to be set in another comparating circuit 23. On the other hand, a counter 18 counts the number of the reference pulse transmitted from the reference pulse generator 19 by taking the detecting pulse signal on the signal D as the starting point, and provides the information one after another to the comparating circuits 22 and 23. In this situation, the comparating circuit 22 operates in such a manner that the signal outputted therefrom is kept at low level as long as the number of the reference pulse from the counter 18 is smaller than the set value c , and then changes over from low level to high level when the number of the reference pulse becomes larger than the set value c . In a similar manner, the signal outputted from the comparating circuit 23 is kept at high level while the number of the reference pulse from the counter 18 is inferior to the set value d and changes over from high level to low level when the number of the reference pulse exceeds the set value d . The outputs thus operated are inputted into the AND circuit 24, which alternatively outputs such as shown in a signal E of FIG.4H. It is only when a width change instruction from without is inputted that the CPU 33 reads the count numbers a and b to reset the values c and d . That is, the signal indicating that the width change of the subject matter has been performed must be given, for example by a host computer. On this occasion, the CPU 33 is adapted to detect the starting position as well as the ending position, as above-described, by automatically detecting the edge by use of the light receiver 13. FIG.5 shows an operational flow chart of the CPU 33, in which first the system is initialized (Step S1) and the judgement of whether the width change instruction is on or not (Step S2). When the width change instruction is on, the sampling of the reference pulse numbers a and b are repeatedly effected up to the designated sampling frequency n and at designated intervals (Step S3) . Then, in accordance with n-value of the reference pulse number a obtained in the n times sampling, the average of the values with the minimum value and the maximum value being rejected among them is found out in order to calculate the value c being a little bit larger than the average. Again in the similar way, the average of the values with the minimum value and the maximum value being rejected in accordance with n-value of the reference pulse number b , is found out to calculate the value d which is a little bit smaller than the average (Step S4). Thus obtained values c and d are set into the comparating circuits 22 and 23 respectively (Step S5). It is noted that the sampling frequency and the sampling interval are adapted to set by means of a sampling frequency preset circuit 35 and a sampling interval preset circuit 36, respectively. FIG.6 is a schematic view for explaining preferred features of the surface inspecting apparatus according to this invention. When an inspection is carried out by a transmission type or a reflection type on a roll, it may disadvantageously happens that the rise signal and the fall signal are not detected clearly. The preferred features as shown in FIG.6 are provided to compensate the defect by shading the light at both ends by means of shading plates 39,39, which are adapted to automatically follow up the respective edges of the subject matter 12. Consequently, the distance between the plates is adapted to change in accordance with the change of the width, thus automatically following up the inspecting width. According to the surface inspecting apparatus of this invention, since even in a case that the width of the subject matter is changed, the effective inspecting width can be automatically set by merely inputting some signals from without or the like, it is no need to manually reset whenever a subject matter replaced by another, and it is also possible to prevent from the mistake in setting, thus making it possible to perform inspecting exactly. In addition, since the effective inspecting width is determined in such a manner of taking the average of a plurality of sampling values from which the minimum value and the maximum value are rejected, it is possible to prevent against the mistake in measuring the width which is liable to be made by the real defect and the like, thus making it possible to set the effective inspecting width more reliably.

Claims: A surface inspecting apparatus wherein a subject-matter (12) is inspected for detecting defects on a surface thereof by means of a scanner (10) scanning and irradiating a light beam (11) on said subject-matter being conveyed, which comprises a light detecting means (17) for detecting said light beam once before the starting of every scanning; a light receiving means (13) receiving a reflected light of said light beam irradiated on said subject-matter; a gate signal generating means (18, 22, 23, 24) which generates a gate signal in order to select an effective portion out of the reflected light signal obtained via said light receiving means, with a first counting means (18) and a first comparating circuit (22), which effects the start of the gate signal when a first set value is reached by the first counting means and a second comparating circuit (23) which effects the end of the gate signal when a second set value is reached by the first counting means, a second counting means (31) making a count (a) during the interval from when said light detecting means detects said light beam until said light receiving means (13) detects the front end of said subject-matter; a third counting means (32) making a count (b) in the interval from when said light detecting means detects said light beam until said light receiving means detects the rear end of said subject-matter; an operating means (33) calculating a first value (c) which is larger than the value (a) counted via said second counting means (31) by a predetermined amount, as well as a second value (d) which is smaller than the value (b) counted via said third counting means (32) by a predetermined amount and setting the first set value to the said first value (c) and the second set value to the said second value (d) before the inspection process, and wherein said second counting means (31) is adapted to make a plurality of first counts and said third counting means (32) is adapted to make a plurality of second counts, and wherein said operating means (33) produces the first and second values (c,d) by respectively averaging the plurality of the first and second counts with minimum and maximum counts being excluded, and wherein the said first and second set values are kept konstant until a width change instruction is input from outside. A surface inspecting apparatus as claimed in claim 1, further comprising a reference pulse generating circuit (19) for generating reference pulses, and wherein said second and third counting means (31,32) count the reference pulses. A surface inspecting apparatus as claimed in claim 1, wherein said apparatus further comprises shading means (39) shading the light beam at both ends of said subject matter, and controlling means for allowing said shading means to control the extent of shading based on the effective portion selected. A method for inspecting a surface of a subject matter for defects, the subject matter having a front end and a rear end in a scanning direction, said method comprising: a) scanning the subject matter by irradiating a light beam on the subject matter being conveyed; b) receiving reflected light from said light beam irradiated on said subject matter; c) transforming the reflected light into electrical signals, d) gating the electrical signals received in each scan by generating a gating signal (E) for allowing an effecting inspecting portion of the reflected light obtained to be selected wherein the start of the gating signal is defined by reaching a predetermined first set count value and the end of the gating signal is defined by reaching a predetermined second set count value, and wherein the setting of the first and second set count values is performed before the inspecting process by e) counting a first count value (a) from a fixed scanning position to the front end of the subject matter, f) calculating from the first count value (a) the first set count value (c) by increasing the first count value (a) by a predetermined amount, g) counting a second count value (b) from the fixed scanning position to the rear end of the subject matter, h) calculating from the second count value (b) the second set count value (d) by decreasing the second count value (b) by a predetermined amount. i) keeping the first and second count value constant until a width change instruction is input from outside. j) wherein said operating means (33) produces the first and second values (c,d) by respectively averaging a plurality of the first and second counts with minimum and maximum counts being excluded.

Inventors: TAKAHASHI IPPEI, TAKAHASHI, IPPEI
Applicants: FUJI PHOTO FILM CO LTD, FUJI PHOTO FILM CO., LTD.
Application year: 1990
Main classification: G01N21
IPC codes: G01N21