Semiconductor integrated circuit with improved I/O structure

Abstract: A semiconductor integrated circuit includes a bias voltage generating circuit (43) and first- and second-­ level signal generating circuits. The bias voltage generating circuit (43) includes a bandgap reference circuit (59) for generating a first fixed voltage as a first bias voltage and a second fixed voltage. A second bias voltage is generated on the basis of the second fixed voltage. The second-level signal generating cir­ cuit receives a predetermined first-level signal and generates a predetermined second-level signal on the basis of the first and second bias voltages generated by the bias voltage generating circuit (43). The first-level signal generating circuit receives the pre­ determined second-level signal and generates the prede­ termined first-level signal on the basis of the first and second bias voltages generated by the bias voltage generating circuit (43).

Description: The present invention relates to a semiconductor integrated circuit and, more particularly, to a semiconductor integrated circuit including an input/output circuit for receiving and processing signals having different levels. Fig. 1 shows a conventional input circuit for use in an LSI operated at a CMOS level (0 to 5 V), and designed to receive an external ECL level (-0.8 to -1.7 V) signal. More specifically, when the ECL level of an input terminal 1 is high, a differential bipolar transistor 2 is turned on, and a current is not supplied to a resistor 3. Therefore, the potential of the emitter of a bipolar transistor 4 goes to high level, and a high signal set at the CMOS level appears at an output terminal 5. On the other hand, when the ECL level of the input terminal 1 is low, a differential bipolar transistor 6 is turned on, and a current is supplied to the resistor 3. Therefore, the emitter potential of the bipolar transistor 4 goes to low level, and a low signal set at the CMOS level appears at the output terminal 5. Note that a voltage of 5 V is applied to a terminal 7, and a voltage of -5.2 V is applied to a terminal 8. Fig. 2 shows a conventional output circuit for outputting an ECL level signal in an LSI operated at the CMOS level. More specifically, the CMOS level signal at a terminal 11 is lowered through the base - emitter paths (0.7 V x 3) of bipolar transistors 12, 13, and 14, and an ECL level signal can be obtained at an output terminal 15. Note that a voltage of 5 V is applied to a terminal 16. The output circuit shown in Fig. 2 is disclosed in "Fabrication and Evaluation of the ECL/TTL compatible BI-CMOS Gate Array",T. IEE Japan, Vol. 108-C, No. 12, 1988, Y. Sugimoto, H. Hara et al. In the above-mentioned input circuit shown in Fig. 1, an ECL negative power source (-5.2 V) must be arranged inside the LSI operated at the CMOS level. In addition, a maximum voltage of about 10 V is applied to the collector - emitter path of the differential bipolar transistor 6. The withstand voltage of the circuit may be a bar to the development of a high-speed and micropatterned device. In addition, in the output circuit shown in Fig. 2, temperature compensation is not performed. Therefore, the ECL level signal output from the output terminal is changed in accordance with changes in temperature. This poses a problem when an interface with a temperature-compensated circuit such as an ECL 100K series is used. EP-A-0 175 522 shows a temperature compensated hysteresis type line receiver circuit. However the output ECL level is a positive pseudo ECL level. In EP-A-0 239 939 an input circuit is disclosed which can be driven by a single power supply and which can convert an ECL-level input signal falling to a negative voltage into a CMOS-level signal rising to a positive voltage, and can then supply this CMOS-level signal to an inner circuit. The input circuit comprises the transistor, a bias circuit, and a current-to-voltage converter. The emitter of the transistor is coupled to an input terminal for receiving a signal of a negative potential. The bias circuit applies a negative bias voltage to the base of the transistor. The current-to-voltage converter is connected to the collector of the transistor. The converter outputs a signal first falling to a positive level and then rising to another positive level. That is, the input circuit can convert an input signal of a negative level to a signal of a positive level. In EP-A-0 305 098 an improved CMOS to ECL output buffer is disclosed. In this circuit, a pair of FETs, arranged as a conventional CMOS inverter, responds to the CMOS logic input signals and drives a bipolar transistor operating as a voltage follower. The emitter of the bipolar transistor serves as the output of the buffer providing the ECL output signals. A resistor having a predetermined resistance couples between a voltage source and the base of the bipolar transistor. First one of the pair of FETs couples a constant current source to the resistor and the base of the bipolar transistor when the buffer is supplying an ELC logical "zero" logic signal. The current from the current source passing through the resistor establishes the ECL logical "zero" output voltage. Second one of the pair of FETs shunts the resistor when the buffer is supplying an ECL logical "one" output, allowing faster transitioning of the output of the buffer from an ECL logical "zero" to a logical "one". Further, the current from the current source compensated for variations in the resistance of the resistor to assure a substantially constant difference between the ECL logical "one" and the ECL logical "zero" output voltages with variations in the resistance of the resistor from the manufacture thereof. It is an object of the present invention to provide a semiconductor integrated ciruit for inputting/outputting an external ECL level signal to/from a semiconductor integrated circuit operated at a CMOS level without an internal ECL negative power source. It is another object of the present invention to provide a semiconductor integrated circuit including an input/output circuit in which any change in input/output level due to temperature change is compensated for. This object is solved according to claim 1. Preferred embodiments are listed in the dependent claims. This invention can be more fully understood from the following detailed description when taken in conjunction with the accompanying drawings, in which: Fig. 1 is a circuit diagram showing an input circuit of a conventional CMOS level operating chip; Fig. 2 is a circuit diagram showing an output circuit of a conventional CMOS level operating chip; Fig. 3 is a circuit diagram showing an embodiment of the present invention; Fig. 4 is a circuit diagram showing in detail the arrangement of the bias circuit shown in Fig. 3; and Fig. 5 is a graph showing temperature dependency of the output level of an output circuit according to the present invention. An embodiment of the present invention will now be described in detail, with reference to the drawings. Fig. 3 shows an embodiment of the present invention. A +5 V power source 22 of a CMOS level operating chip 21 is externally connected to a power source terminal VDD, and a terminal GND is grounded. An ECL level operating chip 24 is connected to an ECL level input terminal 23 of the chip 21, and an ECL level operating chip 26 is connected to an ECL level output terminal 25 thereof. In each of the ECL level operating chips 24 and 26, a power source terminal VEE is connected to a power source 27 of -5.2 V, and a terminal GND is grounded. The ECL level input terminal 23 and the ECL level output terminal 25 of the CMOS level operating chip 21 are connected to a power source 30 of -2 V through 50 Ω resistors 28 and 29, respectively. Input and output circuits of the CMOS level operating chip 21 will now be described. The ECL level input terminal 23 is connected to the emitter of a bipolar transistor 32 through a resistor 31, the emitter of the transistor 32 is connected to the emitter of a bipolar transistor 34 through a resistor 33, and is also connected to the emitter of a bipolar transistor 36 through a resistor 35. The collector of the transistor 32 is connected to the input terminal of a CMOS level internal logic, and is also connected to the terminal VDD through a resistor 37. The collector of the transistor 34 is connected to the terminal VDD through a resistor 38, and the collector of the transistor 36 is connected to the terminal VDD through a resistor 39. The base of the transistor 36 is connected to the collector of a bipolar transistor 40, and is also connected to the emitter of a bipolar transistor 42 through a resistor 41 having a resistance of R/2. The collector of the transistor 42 is connected to the terminal VDD, and the base thereof is connected to the second output terminal of a bias circuit 43. The emitter of the transistor 40 is grounded through a MOS transistor 44, and the base thereof is connected to the first output terminal of the bias circuit 43. Also connected to the terminal VDD are the gate of the transistor 44 and the bias circuit 43. The ECL level output terminal 25 is connected to the emitter of a bipolar transistor 45, which itself is connected to the emitter of a bipolar transistor 47 through a resistor 46, and also to the emitter of a bipolar transistor 49, through a resistor 48. The collector of the transistor 45 is grounded, and that of the transistor 47 is connecteu to the terminal VDD through a resistor 50. In addition the collector of the transistor 49 is connected to the terminal VDD through a resistor 51, and its base is connected to the collector of a bipolar transistor 52, and also to the emitter of a bipolar transistor 54, through a resistor 53 having a resistance of R. The collector of the transistor 54 is connected to the terminal VDD, and the base thereof is connected to the second output terminal of the bias circuit 43. The emitter of the transistor 52 is grounded through a MOS transistor 55, and also through a diode 56, and is connected to the terminal VDD through a resistor 57 and a MOS transistor 58. The base of the transistor 52 is connected to the first output terminal of the bias circuit 43, and the gates of the transistors 55 and 58 are connected to the output terminal of the CMOS level internal logic. The bias circuit 43 shown in Fig. 4 includes a bandgap reference circuit 59, this circuit generating permanent potentials V i and V c which are free from temperature dependency. The potential V i is applied to the inverting input terminal of a negative feedback amplifier 60 through a resistor 61, and a potential of 2V F (V F × 2) of diodes 62 and 63 is applied to the noninverting input terminal. As a result, a potential of 4V F - V i is obtained at the second output terminal of the negative feedback amplifier 60, and a potential of V c at the first output terminal thereof. A resistor 64 is connected between the output terminal and the non-inverting input terminal of the negative feedback amplifier 60 and is set to have a resistance equal to that of the resistor 61. The non-inverting input terminal of the amplifier 60 is connected, through a resistor 65, to the terminal VDD. Referring to the input circuit shown in Fig. 3, the ECL level signal from the ECL level operating chip 24 is supplied to the emitter of the bipolar transistor 32 through the resistor 31, the emitter of the transistor 32 being fixed at a potential of -V i - (R/2)·I lower than the second output of 4V F - V i from the bias circuit 43 by 4V F of the bipolar transistors 32, 34, 36, and 42, and (R/2)·I which corresponds to a voltage drop across the resistor 41. When this potential is set at -1.32 V, which is an intermediate value between voltages -0.95 V and -1.72 V of the ECL level signal, the bipolar transistor 32 is turned on when the ECL level signal is high, and off when this signal is low. When a current supplied to the resistor 37 is turned on/off, a CMOS level signal can be supplied to the internal logic. Referring now to the output circuit shown in Fig. 3, the bipolar transistor 52 thereof is turned on/off in response to the CMOS level signal from the internal logic, and a constant current I supplied to the resistor 53 is turned on/off. As a result, a potential of -V i lower than the second output of 4V F - V i from the bias circuit 43 by 4V F of the bipolar transistors 45, 47, 49, and 54 is output as a high level potential. In addition, a potential of -V i - R·I lower than the potential of -V i by R·I, which corresponds to a voltage drop across the resistor 53, is output as a low level potential. When the fixed potentials V i and V c of the bandgap reference circuit 59 shown in Fig. 4 are set such that the potential V i is at the high level of the ECL level signal, i.e., -0.95 V, and the potential V c is at a level which allows supply of the constant current I for producing the amplitude of the ECL level signal, the ECL level signal of -0.95 V to -1.72 V can be output from the output terminal 25. As described above, in the LSI operated at the CMOS level, the ECL level signal can be input/output without the need to arrange an ECL negative power source inside the CMOS level operating chip 21. Fig. 5 shows simulated temperature dependencies of an output level of the output circuit. As is apparent from Fig. 5, the temperature dependency ΔV OH in a high output state (-0.95 V) at -20 to 125°C is 6 mV, and the temperature dependency ΔV OL in a low output state (-1.72 V) is 8 mV. These dependencies are very small, and the output ECL level is temperature-compensated. The temperature dependency of the threshold potential of the input circuit is also as small as 60 mV, and an interface with a temperature-compensated ECL 100 K series can be performed. In addition, the bias circuit in the above embodiment is commonly used to provide a bias to a plurality of input/output circuits. Therefore, the scale of the circuit is not much larger than that of the conventional circuit. As has been described above, according to the present invention, there is provided a semiconductor integrated circuit including input/output circuits which can input/output an external ECL level signal to/from a semiconductor integrated circuit operated at a CMOS level without an internal ECL negative power source, and in which an input/output level is temperature-compensated. Reference signs in the claims are intended for better understanding and shall not limit the scope.

Claims: A semiconductor integrated circuit comprising: a) bias voltage generating means (43) for generating a first bias voltage (V c ) and a second bias voltage (4V F - V i ) b) second-level signal generating means (31-42), coupled to the first and second bias voltages, for receiving a predetermined first voltage level signal and generating therefrom a corresponding second voltage level signal using the first and second bias voltages; and c) first-level signal generating means (45-58), coupled to the first and second bias voltages, for receiving a predetermined second voltage level signal and generating therefrom a corresponding first voltage level signal using the first and second bias voltages wherein: d) said second-level signal generating means (31-42) comprises a plurality of emitter-cascaded bipolar transistors and a first current source (40, 44) arranged to generate a first-level reference voltage (-1.32 V) by subtracting from the second bias voltage (4V F - V i ) the base-emitter voltages (V F ) of said emitter-cascaded bipolar transistors and a first voltage drop across a resistor (41); said first bias voltage (V c ) controlling said first current source for providing said first voltage drop (R/2 * I); e) said first-level signal generating means (45-58) comprises an equal number of emitter-cascaded bipolar transistors as in said second-level signal generating means and a second current source (52-56) arranged to generate said corresponding first voltage level signal by subtracting from the second bias voltage (4V F - V i ) the base-emitter voltages (V F ) of said equal number of emitter-cascaded bipolar transistors and a second voltage drop across a resistor (59); said first bias voltage (V c ) controlling said second current source for providing said second voltage drop (R*I) depending on said predetermined second voltage level signal; and f) said bias voltage generating means (43) comprises a first means (59) for generating the first bias voltage (V c ) as a temperature independent voltage and a second temperature independent voltage (V i ); and a second means (60-65) for generating said second bias voltage (4V F - V i ) from said second temperature independent voltage (V i ) and from a reference voltage (2*V F ), said reference voltage (2*V F ) being derived from forwardly biassed diode means (62, 63) and corresponding to the base-emitter voltage of the transistors of the second and first level signal generating means (31-42; 45-58). A semiconductor integrated circuit according to claim 1, wherein said bias voltage generating means (43) includes a bandgap reference circuit (59) constituting said first means (59); and a negative feedback amplifier (60) for receiving said reference voltage (2V F ) at a non-inverting input terminal and said second temperature-independent voltage (V i ) at an inverting input terminal, and including a feedback means (61, 64) for causing said negative feedback amplifier to output said second bias voltage (4V F - V i ), constituting said second means (60-65). A semiconductor integrated circuit according to claim 1 or 2, characterized in that said second-level signal generating means (31-42) includes a first bipolar transistor (42) having a base for receiving the second bias voltage (4V F - V i ) from said bias voltage generating means (43), a collector connected to a first power source terminal (VDD), and an emitter connected to said first current source (40, 44) through said resistor (41), a second bipolar transistor (36), having an emitter and a base connected to said emitter of said first bipolar transistor (42) through said resistor (41), a third bipolar transistor (34), having an emitter and a base connected to said emitter of said second bipolar transistor (36), and a fourth bipolar transistor (32), having a base connected to said emitter of said third biplar transistor (34), an emitter connected to said emitters of said second and third biplar transistors (36, 34) through second and third resistors (33, 35), respectively, and also connected to an input terminal (23) through a fourth resistor (31), and a collector serving as an output terminal for outputting said second voltage level signal and connected to said first power source terminal (VDD) through a fifth resistor (37). A semiconductor integrated circuit according to one of the preceding claims, characterized in that said first-level signal generating means (45-58) includes a fifth bipolar transistor (54), having a base for receiving said second bias voltage (4V F - V i ) from said bias voltage generating means (43), a collector connected to a first power source terminal (VDD), and an emitter connected to said second current source, a sixth bipolar transistor (49), having an emitter and a base connected to said emitter of said fifth bipolar transistor (54) through a sixth resistor (53), a seventh bipolar transistor (47), having an emitter and a base connected to said emitter of said sixth bipolar transistor (49), and an eighth bipolar transistor (45), having a base connected to said emitter of said seventh bipolar transistor (47), and an emitter serving as an output terminal for outputting said first voltage level signal and connected to said emitters of said sixth and seventh bipolar transistors (49, 47) through seventh and eighth resistors (48, 46), respectively. A semiconductor integrated circuit according to one of the preceding claims, wherein said second-level signal generating means (31-42) is a CMOS level generating means. A semiconductor integrated circuit according to one of the preceding claims, wherein said first-level signal generating means (45-58) is an ECL level signal generating means.

Inventors: HARA HIROYUKI C O INTELLECTUAL, SUGIMOTO YASUHIRO C O INTELLEC, HARA, HIROYUKI, C/O INTELLECTUAL PROPERTY DIV., SUGIMOTO, YASUHIRO, C/O INTELLECTUAL PROPERTY DIV.
Applicants: TOSHIBA KK, KABUSHIKI KAISHA TOSHIBA
Application year: 1990
Main classification: H03K19
IPC codes: H03K19, H01L27, H01L21