Process for forming vertical bipolar transistors and high-voltage CMOS in a single integrated circuit chip

Abstract: A process is used to form in a common substrate (12) a PMOS transistor (200) of the lightly-doped drain (LDD) type, an NMOS transistor (100) of the LDD type and a vertical n-p-n bipolar transistor (300). In particular: the steps used to form an n-type well (214) for the PMOS transistor (200), and an n-type drain extension well (114) for the NMOS transistor (100), are also used to form the n-type collector (314) of the bipolar transistor (300); the steps used to form the p-type extension well (208) for the PMOS transistor (200) are also used to form the p-type base (308) of the bipolar transistor (300), the source/drain implantation step for the NMOS transistor (100) is also used to form the emitter (310) and a contact region (312) for the collector of the bipolar transistor (300); and the source/drain implantation step for the PMOS transistor (200) is used to form a contact region (311) for the base of the bipolar transistor (300).

Description: Field of the Invention This invention relates to the manufacture of semiconductive integrated circuits and, more particularly, to such circuits that include both bipolar junction transistors and metal-oxide-semiconductor (MOS) transistors in a common semiconductive substrate or chip as specified in the preamble of claim 1, for example as disclosed in a paper by Zeitzoff et al in the IEEE Journal of Solid State Circuits referred to hereafter in the specification. Related Patent Applications This application is related to co-pending EP-A- 0 387 999 corresponding to US-A- 5 047 358 and entitled, "Process for Forming High and Low Voltage CMOS Transistors on a Single Integrated Circuit Chip", which is being filed concurrently with this application. Background of the Invention Although bipolar transistors were available before MOS transistors, in recent years the emphasis has been on MOS transistors, particularly complementary MOS (CMOS) transistors. However, bipolar transistors do have some advantages over MOS transistors, including higher transconductance, higher output impedance and faster switching speed, and, in vertical form, the ability generally to sink larger currents per unit device area. For this reason, there are circuit applications where it is desirable to include both bipolar transistors and MOS transistors, particularly CMOS transistors. Moreover, because of the advantages of monolithic integrated circuits, it is desirable in such circuit applications to incorporate both forms of transistors in a common semiconductive substrate or individual chip. Among the circuit applications where such a monolithic integrated circuit is expected to be useful are linear circuits, such as temperature-stable voltage regulators, bandgap reference circuits, low-input offset circuits, and feedback amplifier circuits. Moreover, for ease of manufacture, it is desirable to have a fabrication process in which both bipolar and MOS transistors are essentially formed in parallel with a minimum of processing steps. These factors have been recognized in a paper entitled, "An Isolated Vertical n-p-n Transistor in an n-Well CMOS Process", published in IEEE Journal of Solid State Circuits Vol. SC-20, No. 2, April 1985, pages 489-493. In the process described therein, a vertical n-p-n transistor is formed in a chip along with low-voltage CMOS transistors by modification of a standard process to change both the dosage of the implant used to form the source and drain of the PMOS transistor and the implant anneal conditions. Summary of the Invention A process according to the present invention is characterised by the features specified in the characterising portion of claim 1. The present invention is a process for forming in a common semiconductive substrate, known vertical bipolar transistors and known high-voltage CMOS transistors of the lightly-doped drain (LDD) transistor type in which the vertical n-p-n transistors are formed by the same series of steps used to form the LDD transistors with only mask modifications but no added masking steps. In particular, in an illustrative embodiment of the invention to be described below, vertical n-p-n bipolar transistors are formed in a p-type substrate in common with LDD CMOS transistor pairs by a process in which an implant step used to form the lightly-doped p-type extension wells of the PMOS transistors of each CMOS pair serves also to form a lightly-doped base for each of the bipolar transistors. The implant step used in forming the heavily-doped zones of the sources and drains of the PMOS transistors of each CMOS pair is used also in forming the heavily-doped base contact region of each bipolar transistor. The implant step used in forming the heavily-doped sources and drains of the NMOS transistors is used also in forming the emitter and the heavily-doped collector contact region of each bipolar transistor. For the best results with this process, it is particularly important to tailor properly the p-type implant used for the drain extension and vertical base so that the heating step used for forming field oxidation regions can be used to drive-in this implant appropriately. Moreover, the process may be used without any additional steps but simply by a mask change also to form in the common substrate low-voltage CMOS transistor pairs that do not include lightly-doped drain extensions. The details of such a process are set forth in the above-identified related European patent application. The invention will be better understood from the following more detailed description taken in conjunction with the accompanying drawings and claims. Brief Description of the Drawings Figure 1 shows in cross-section a semiconductive chip that includes a PMOS transistor of the LDD type, an NMOS transistor of the LDD type, and a vertical n-p-n bipolar (i.e., junction) transistor; and Figures 2A, 2B, 2C, 2D, 2E, 2F and 2G show at selected stages a semiconductive substrate being processed to form a chip of the kind shown in Figure 1 in accordance with an illustrative embodiment of the invention. It should be noted that the drawing is not to scale. Moreover, in the drawing, as is customary in the art, lightly-doped semiconductive regions are denoted by a minus (-) sign (e.g., n-) while heavily-doped semiconductive regions are denoted by a plus (+) sign (e.g., p+). Lightly-doped regions are generally those that have a doping concentration of no more than about 5 x 10¹⁶ impurities/cm³ and heavily-doped regions are generally those that have a doping concentration of at least 1 x 10¹⁹ impurities/cm³. Detailed Description Referring now to Figure 1, there is shown a monocrystalline silicon chip 10 which comprises a bulk substrate portion 12 that is lightly-doped p-type. At a top surface 12a of the substrate 12 there are formed a NMOS transistor 100, a PMOS transistor 200 and a vertical n-p-n bipolar transistor 300. Each of the MOS transistors 100 and 200 is of the lightly-doped drain type so as to be able to withstand without avalanche breakdown field-induced voltages between source and drain of at least about 30 volts. The NMOS transistor 100 includes a heavily-doped n-type source 110 and the heavily-doped n-type drain 112. The latter is nested within a lightly-doped n-type drain extension 114. A relatively thin (65 nanometres) gate oxide layer 116 overlies the p-type surface 12a region between the source 110 and the extension well 114. A polysilicon gate electrode 118 overlies gate oxide layer 116 and also overlaps a portion of a relatively thick (typically 800 nanometres thick) field oxide region 120 to serve as a quasi-field plate to increase the effective induced-field avalanche breakdown voltage of the region between the drain 112 and the source 110. The PMOS transistor 200 is formed in a lightly-doped n-type well 214 and includes a heavily-doped p-type source 211 and a heavily-doped p-type drain 213. The latter is formed in a lightly-doped p-type extension well 208 acting as a lightly-doped drain region. A relatively thin oxide layer 216 (typically about 65 nanometres) overlies the n-type surface region that extends between source 211 and the drain extension well 208. A polysilicon gate electrode 218 overlies a gate oxide 216 and overlaps relatively thick (typically about 800 nanometres) field oxide region 220 that serves as a quasi-field plate to enhance the avalanche breakdown voltage of the region between the source and drain. The vertical n-p-n bipolar transistor 300 includes a lightly-doped n-type well 314 that serves as its collector and within which is nested a lightly-doped p-type well 308 that serves as its base and within which, in turn, is nested a heavily-doped n-type region 310 that serves as its emitter. The top surface 12a of the substrate 12 also includes in the base region 308 a heavily-doped p-type region 311 that serves as a contact region of the base, and in the collector region 314 a heavily-doped n-type region 312 that serves as the contact region of the collector. Thick field oxide regions 50 are also used at the top surface 12a of the substrate 12 to isolate the various transistors from one another in the horizontal direction in known fashion. Layers 50, 116, 216, 120, 220, 320 and 322, although termed oxide or silicon oxide layers, as is customary in the art, are, in fact, layers formed predominantly of silicon dioxide. It is characteristic of the transistors described that they are formed in parallel by common processing steps, in accordance with the invention. In particular, the lightly-doped n-type wells 114, 214 and 314 are formed together by common steps, the lightly-doped p-type wells 208 and 308 are formed together by common steps, the heavily-doped n-type surface regions 110, 112, 310 and 312 are formed together by common steps, and the heavily-doped p-type surface regions 211, 213 and 311 are formed together by common steps. In an illustrative embodiment: the lightly-doped n-type wells have an average impurity concentration of 1 x 10¹⁶ impurities/cm³ and a depth of about 4.0 micrometres; the lightly-doped p-type wells have an average impurity concentration of about 4.0 x 10¹⁶ impurities/cm³ and a depth of about 1.0 micrometre; the heavily-doped p-type surface regions have an average impurity concentration of about 1 x 10¹⁹ impurities/cm³ and a depth of about 0.3 micrometres; and the heavily doped n-type regions have an average impurity concentration of about 1 x 10²⁰ impurities/cm³ and a depth of about 0.3 micrometres. The p-type substrate has an average impurity concentration of about 5 x 10¹⁵ impurities/cm³. It is customary in the art to process a silicon wafer of relatively large surface area, currently typically at least 12.77cm or 15.24cm in diameter, and thereafter to dice the wafer into a large number of individual chips of smaller area. In an illustrative embodiment of the process of the present invention, each of the chips includes at least one of each of the three types of transistors, as in the chip 10 of Figure 1. The wafer generally is of a thickness sufficient to facilitate convenient handling and typically the thickness is between 584 and 660 micrometres (23 and 26 mils). Additionally, the wafer is generally sliced so that its top surface corresponds to a <100> crystal plane. In the subsequent Figures, for the sake of simplicity, there is shown only a portion of a wafer corresponding to a single chip including only one of each of the three types as shown in Figure 1. Referring now to Figure 2A, the silicon substrate 12 provided by the silicon wafer 12 has its top surface 12a treated to include thereover a mask that includes silicon oxide portions 20a that are relatively thick, e.g., about 550 nanometres, interspersed with silicon oxide portions 20b that are relatively thin, e.g., about 50 nanometres. This is conveniently accomplished by first providing a uniform silicon oxide layer of about 550 nanometres thickness, selectively removing portions of the layer to bare the substrate 12 where the thin portions are to be formed, and then re-growing the oxide over the bared substrate 12 to the desired thickness of the thin layer. Such thin portions of the mask correspond to regions where-lightly doped n-type wells are to be formed in the substrate. The oxide portions 20b at such regions are designed to be of a thickness that protects the underlying surface, whilst the substrate 12 is being implanted with donor ions to form the n-type wells, but only slightly impedes the implantation. The oxide portions 20a are of a thickness adequate to mask the underlying substrate 12 against such implantation. Once masked, the substrate 12 is implanted with donor ions, as indicated by the arrows 29, to form the donor-implanted regions 24a, 24b and 24c. In an illustrative embodiment, the dosage is 4.5 x 10¹² phosphorus ions per square centimetre at an accelerating voltage of about 125 KeV and the substrate 12 is later heated to 1200°C. for about 4 hours to drive-in the implanted ions and form the n-type wells desired. The resultant substrate, after drive-in and with the oxide layer 20 removed, is shown in Figure 2B. The substrate 12 now includes lightly-doped n-type wells 114, 214 and 314. Next, acceptor-implanted regions that, after drive-in, will define the desired p-type wells are formed at the top surface of the substrate 12. To this end, a uniform thin oxide layer 28 (e.g., about 50 nanometres thick) is formed over the top surface 12a of the substrate 12. This is then covered with a photoresist layer of a thickness adequate to mask the subsequent acceptor implantation. The photoresist is then patterned to form openings therein where the implanted acceptor ions are to be introduced into the substrate 12. This is followed by irradiation of the top surface of the substrate with boron ions to a dosage of about 1.5 x 10¹³ impurities-cm⁻² at an accelerating voltage of about 120 KeV. Drive-in of the implanted acceptors advantageously is postponed to a later heating state in the process when the thick field oxide regions are formed. The resultant substrate, after the remains of the photoresist layer is removed, is shown in Figure 2C where acceptor implanted regions 202 and 302 are in n-type wells 214 and 314, respectively. Region 202 will eventually be used to form the p-type extension well of the PMOS transistor and region 302 to form the p-type base of the bipolar n-p-n transistor. The uniform thin oxide layer 28 advantageously is kept over the surface 12a to serve subsequently as a protective layer in the subsequent conventional field implant step. Next, there are formed the various thick field oxide regions desired, seen in Figure 1. To this end, as seen in Figure 2D, a layer of silicon nitride 30 of a thickness adequate to serve as an oxidation mask, e.g., 200 nanometres, is provided over the top surface 12a of the substrate 12, patterned to be left in place only where it overlies substrate regions where active regions are to be formed. In place, it will block the oxidation of the underlying substrate region. However, before formation of the thick field oxide region, it is usually advantageous first to introduce acceptor ions at surface regions where the field oxide regions are to be formed, except where such regions overlie the n-type wells. This implant serves to protect the surface, where implanted, against undesired surface inversion in operation. To this end, it is desirable to deposit a photoresist layer over the substrate and to remove said photoresist layer except over n-type well regions. It will serve to mask the subsequent field implant into the substrate. The resultant substrate is shown in Figure 2D where the top surface 12a of the substrate 12 includes the uniform thin oxide layer 28, the patterned silicon nitride layer 30 and the patterned photoresist layer 32. The field implant involves irradiation typically with boron at a dosage of about 1.4 x 10¹³ ions/cm² at an accelerating voltage of 35 KeV. Since this is a shallow implant that does not change the conductivity type of the surface but only increases the acceptor concentration, the result of the implant is not reflected in the drawing. After the field implant, the photoresist mask 32 is removed and the field oxidation step is then carried out. Because the field oxidation step tends to leach boron from the substrate 12, good control of the earlier boron implantation used to form regions 202 and 302 is important. In an illustrative embodiment, field oxide regions about 800 nanometres thick were formed by heating the substrate to 1050°C. for 4 hours, thereby also driving-in the boron implanted in regions 208 and 308 to form lightly-doped p-type wells about 1 micrometre deep with an average concentration of 4 X 10¹⁶ impurities/cm³. After the photoresist mask 32, the patterned silicon nitride 30 and the uniform thin oxide 28 are removed, the structure shown in Figure 2E results. It includes the p-type substrate 12 with lightly-doped n-type wells 114, 214 and 314, with lightly-doped p-type well 208 formed in n-type well 214 and with lightly-doped p-type well 308 in n-type well 314. Moreover, field oxide regions 50 are localized to define the active surface regions of the various transistors to be formed. Field oxide regions 120 and 220 are localized to define the quasi-field plate regions of the NMOS and PMOS transistors to be formed. Field oxide regions 320 and 322 are localized to isolate the yet-to-be formed emitter, base contact region and collector contact region of the bipolar transistor. At this point, it is usually advantageous to provide an implantation of acceptor ions to set the potential of the surface of the substrate to better control the threshold voltage of the NMOS and PMOS transistors for operation in the desired enhancement mode. However, before irradiation of the surface 12a with acceptor ions, a thin oxide layer, typically 40 nanometres thick, is advantageously formed over the surface to protect the surface from damage. Irradiation of the surface 12a with boron ions at a dosage of 1.35 x 10¹² ions-cm⁻² at an accelerating voltage of 35 KeV is typical for threshold control. Since this implant is too weak to change the conductivity type but serves only to affect the surface concentration, its impact is not reflected in the drawing. If no low-voltage transistors requiring smaller thicknesses of gate oxide than the high-voltage CMOS transistors are being formed in the substrate 12, the thin oxide layer now contaminated with boron is best stripped off and a new thin oxide layer re-grown, illustratively about 50 nanometres thick, shown as layers 116, 216 and 316 in Figure 2F. However, if low-voltage MOS transistors are to be formed in addition to the high-voltage MOS transistors, as in the earlier-identified related European patent application, there may instead then be masked the regions of high-voltage MOS transistors to permit the thin boron-rich oxide layer to be removed selectively only where the low-voltage MOS transistors are to be formed. Then, after removal of the mask used, a fresh thin oxide layer is grown where the low-voltage MOS transistors are to be formed, and the previously formed thin oxide layer remaining where the high-voltage MOS transistor are to be formed is simultaneously thickened. Alternatively, even where both thick and thin gate oxide regions are desired, the boron-rich oxide layer may be completely stripped from the substrate and a fresh thin oxide layer regrown. This fresh layer may then be selectively removed where thin oxide layers are desired. This is followed by another oxidation step to grow a new oxide layer where thin oxide layers are desired and to thicken the earlier formed oxide layer where thick gate oxide layers are desired. After formation of the oxide layers 116, 216 and 316, the polysilicon gate electrodes of the CMOS transistors are formed, as shown in Figure 2F. To this end, a uniform layer of polysilicon, illustratively 350 nanometres thick deposited by low-pressure chemical vapor deposition, is formed over the top surface of the substrate. Before patterning the polysilicon, it is usual to dope the polysilicon layer with phosphorus to increase its conductivity. The polysilicon layer is then patterned in the usual fashion to form the polysilicon electrodes. As seen in Figure 2F, doped polysilicon gate electrode 118 overlaps the field oxide region 120 and extends over a portion of the thin gate oxide layer 116 and doped polysilicon gate electrode 218 overlaps the field oxide region 220 and extends over a portion of the thin gate oxide layer 216. There remain to be formed the heavily-doped n-type regions 110, 112, 310, 312 (see Figure 1) that will serve as the source and drain of the NMOS transistor and as the emitter and collector contact regions of the n-p-n transistor, respectively, and the heavily-doped p-type regions 211, 213, 311 (see Figure 1) that will serve as the source and drain of the PMOS transistor and as the base contact region of the NPN transistor, respectively. It is often advantageous, before forming such heavily-doped regions, to oxidize lightly the surface of the polysilicon electrodes to buffer the polysilicon and to minimize the effect of the photoresist mask with which it is coated during the formation of such heavily-doped regions. Heating in an oxidizing ambient atmosphere at 900°C. to form an oxide layer of about 22.5 nanometres over the polysilicon is sufficient. It is advantageous to form the heavily-doped n-type regions first. To this end, a layer of photoresist is deposited over the top surface of the substrate and then the layer is opened where the heavily-doped n-type regions are to be formed. Advantageously, in the illustrative embodiment, these regions are formed by a double donor implantation. First, there is implanted arsenic at a dosage of about 6.5 x 10¹⁵ impurities-cm⁻² at an accelerating voltage of about 100 KeV, followed by an implant of phosphorus at a dosage of about 1 x 10¹⁴ impurities-cm⁻² at an accelerating voltage of about 70 KeV. It is also advantageous to follow this with an anneal at 900°C. for about 15 minutes. Then this photoresist mask is removed and replaced by a new photoresist mask apertured to localize the implantation of boron ions that form the desired heavily-doped p-type regions that will serve as the source and drain of the PMOS transistor and the base contact region of the n-p-n transistor. Illustratively, the boron is introduced by way of BF₂ at a dosage of 3 x 10¹⁵ impurities-cm⁻² at an accelerating voltage of 70 KeV. The resultant substrate is shown in Figure 2G, which is essentially the same as Figure 1. The substrate 12 now includes the heavily-doped n-type source 110 and drain 112 of the NMOS transistor 100, heavily-doped p-type source 211 and drain 213 of the PMOS transistor 200, and the heavily-doped n-type emitter 310, collector contact 312 and heavily-doped p-type base contact 311 of the n-p-n bipolar transistor 300. As seen, the field oxide regions 320 and 322 separate from one another the collector and base contact regions, 312, 311 and the emitter 310, advantageously to reduce surface leakage currents. There remains the need to provide metal contacts to the various transistor elements to permit their interconnection to one another and to the outside world. Various techniques are available for this purpose, and the present invention is not dependent on any particular technique used. In an illustrative embodiment, there is employed the technique described in detail in the earlier-mentioned related European patent application to which reference is made for the particulars. Basically, this technique involves: depositing a first coating of phosphosilicate glass; levelling the first coating with a second coating of spin-on-glass (sog); forming contact openings in the two coatings for the first level metal, illustratively an alloy of aluminium, silicon and copper; depositing and patterning the first level metal to form the various source, drain, gate electrode contacts of the MOS transistors and the emitter, base and collector contacts of the n-p-n transistor; forming a dielectric layer to separate the first metal layer from the subsequently deposited second metal layer by depositing in turn a plasma-deposited oxide layer, and a sog followed by an etch-back levelling step; followed by a re-deposition of plasma oxide to a desired thickness, then forming access apertures in the dielectric layer to the various first level metal regions to be contacted by the second level metal; depositing the second level metal, illustratively the same alloy as the first level metal; patterning the second level metal as needed; depositing a passivating layer over the substrate; and patterning the passivating layer to expose pads by which the individual chips into which the wafer is diced can be connected to an operating system. Moreover, it should be feasible if desired to substitute a vertical p-n-p bipolar transistor by starting with an n-type substrate and making the related appropriate changes in the processing. Additionally, as pointed out earlier, if desired, the process can readily be adapted also to include low-voltage CMOS transistors that are free of lightly-doped drain extensions, as described in the previously-discussed related European patent application.

Claims: A process for forming in a common semiconductive substrate (12) a PMOS transistor, an NMOS transistor, and a vertical n-p-n bipolar transistor (300), characterised in that the PMOS transistor is a PMOS transistor (200) of the lightly-doped drain type, the NMOS transistor is an NMOS transistor (100) of the lightly-doped drain type, and in that the process comprises the steps of: forming simultaneously in a p-type semiconductive substrate (12) a first set of at least three relatively lightly-doped n-type wells (114,214,314); forming simultaneously in the first (214) and the second (314) well of said first set of n-type wells a first (208) and a second (308) relatively lightly-doped p-type well, respectively, for serving as a lightly-doped drain extension of the PMOS transistor (200) and as the base of the n-p-n transistor (300), respectively; forming simultaneously a relatively heavily-doped n-type surface region (112) in the third well (114) of said first set of n-type wells for serving as the drain of said NMOS transistor (100) and a relatively heavily-doped n-type surface region (110) in the p-type substrate (12) for serving as the source of said NMOS transistor (100), a relatively heavily-doped n-type surface region (310) in the second p-type well (308) for serving as the emitter of the n-p-n bipolar transistor (300) and a relatively heavily-doped n-type surface region (312) in the second n-type well (314) for serving as the collector contact region of the n-p-n bipolar transistor (300); forming simultaneously a relatively heavily-doped p-type region (213) in the first lightly-doped p-type well (208) for serving as the drain of the PMOS transistor (200), a relatively heavily-doped p-type surface region (211) in the first n-type well (214) for serving as the source of the PMOS transistor (200), and a relatively heavily-doped p-type surface region (311) in the second lightly-doped p-type well (308) for serving as the base contact region of the n-p-n bipolar transistor; and providing polysilicon gate electrodes (118,218) to the PMOS and NMOS transistors (100,200). A process according to claim 1, in which the semiconductive substrate (12) is monocrystalline silicon. A process according to claim 1 or 2, characterised in that the process includes forming field oxide regions (50,120,220,320,322) on the substrate (12), whilst driving-in acceptor-implanted ions for forming the first and second lightly-doped p-type wells (208,308). A process according to claim 3, characterised in that the forming of the first set of the relatively lightly-doped n-type wells (114,214,314) in the substrate (12) utilizes a common donor ion implantation step through a mask (20) apertured to define the three wells (114,214,314). A process according to claim 4, characterised in that the forming, in the first (214) and second (314) well of the first set, of the first and second relatively lightly-doped p-type wells (208,308) utilizes a common acceptor ion implantation step through a mask apertured to define said first and second p-type wells (208,308). A process according to claim 5, characterised in that the common donor ion implantation to form the first set of n-type wells (114,214,314) is a phosphorus implantation and the common acceptor ion implantation to form the first and second p-type wells (208,308) is a boron implantation. A process according to claim 5, characterised in that the forming of the relatively heavily-doped n-type surface regions (110,112,310,312) utilizes a common pair of donor ion implantation steps through a mask apertured to define the source (110) and drain (112) of the NMOS transistor (100), the emitter (310) of the n-p-n transistor (300) and the collector contact region (312) of the n-p-n transistor (300). A process according to claim 7, characterised in that the forming of the relatively heavily-doped p-type regions (211,213,311) utilizes a common acceptor ion implantation through a mask apertured to define the source (211) and drain (213) of the PMOS transistor (200) and the base contact region (311) of the n-p-n transistor (300). A process according to claim 7, characterised in that a common pair of donor ion implantation steps include common arsenic and phosphorus implantation steps. A process according to claim 9, characterised in that the forming of the relatively heavily-doped p-type regions (211,213,311) utilizes a common boron ion implantation step through a mask apertured to define the source (211) and drain (213) of the PMOS transistor (200) and the base contact region (311) of the n-p-n transistor (300).

Inventors: KOSIAK WALTER KIRK, MANN JONATHAN DOUGLAS, PARRISH JACK DUANA, ROWLANDS PAUL RUSSELL III, SCHNABEL DOUGLAS ROBERT, KOSIAK, WALTER KIRK, MANN, JONATHAN DOUGLAS, PARRISH, JACK DUANA, ROWLANDS, PAUL RUSSELL, III, SCHNABEL, DOUGLAS ROBERT
Applicants: DELCO ELECTRONICS CORP, DELCO ELECTRONICS CORPORATION
Application year: 1990
Main classification: H01L21
IPC codes: H01L27, H01L21, H01L29