Semiconductor device having dielectric isolation region of U-groove structure and process for fabricating the same

Abstract: A dielectric isolation region of a bipolar semiconductor device having a U-groove which is covered over the inner surface thereof with an insulating film, and is filled with polysilicon. The surface of the U-groove polysilicon is covered with a silicon nitride film deposited by CVD technique. This structure permits the earlier steps of forming the dielectric isolation region and also the later steps of forming semiconductor elements to be carried out without causing the surface of the U-groove polysilicon to suffer thermal oxidation.

Description: BACKGROUND OF THE INVENTION Field of the Invention: This invention relates to a semiconductor device and a process for fabricating the same, and more particularly to a bipolar semiconductor device having dielectric isolation region of U-groove structure filled with polycrystalline silicon (referred to as polysilicon hereinafter), and a process for fabricating the same. Description of the Prior Art: In silicon LSIs, a dielectric isolation region is commonly used to isolate electronic elements. There are a number of methods of isolating semiconductor device areas, such as p-n junction isolation, LOCOS method isolation, and U-groove structure isolation which is called as trench isolation. Recently the LOCOS method isolation and the U-groove structure isolation are the main current. It has been known that U-groove structure requires narrow region for dielectric isolation as compared with LOCOS structure. Dielectric isolation region of U-groove structure (referred to as "U-groove dielectric isolation region" hereinafter) was reported firstly in IDEM Tech. Digest, pp. 58-60, 1982. Before this report was already known the dielectric isolation region of V-groove structure formed on the major plane (100) of silicon crystal by mesa-etching. In this structure, dielectric breakdown voltage lowers with smaller V-groove width. In order to overcome disadvantage of dielectric breakdown voltage like this, the aforementioned report proposed a U-groove dielectric isolation region. Formation of a dielectric isolation region of a U-groove structure is carried out generally prior to the formation of semiconductor elements, which is therefore affected seriously by the difference in thermal expansion coefficient between material with which the U-groove is filled and silicon substrate. U-groove structures are divided into two types: one in which the U-groove is covered over the inner surface thereof with insulating films and filled with polysilicon is extensively used for dielectric isolation in bipolar transistors. The other in which the U-groove is filled with dielectric such as BPSG is used mainly for dielectric isolation in MOS transistors. In the first type structure, the surface of the polysilicon inside the U-groove is covered with an insulating film. In the following will be described two recent examples: one is described in a Japanese Patent Laid-Open Application No. Sho. 61-22646; opened on January 31, 1986. This is presented to solve degradation of properties of the semiconductor elements due to the stress at the upper edge of the U-groove. In this laid-open specification, a silicon oxide film deposited by CVD process is used as the insulating film covering the surface of the polysilicon inside the U-groove (referred to as "U-groove polysilicon" hereinafter). Besides are formed two insulating films covering the inner surface of the U-groove: a silicon oxide film formed by thermal oxidation (referred to as "thermal-oxidation silicon oxide film" hereinafter) as the first layer, and a silicon oxide film formed by the CVD process (referred to as "CVD silicon oxide film" hereinafter) as the second film. As the second layer film may be used other insulating films, such as silicon nitride film, deposited by the CVD technique. EP-A-0 166 140 discloses a U-shaped groove isolation structure filled with silicon covered by a polysilicon layer, which is covered with a passivation layer, specifically a thermal oxide layer. The other example of the first structure is disclosed in a U.S. Patent No. 4,635,090; published on Jan. 6, 1987, which likewise provides Y-groove structure for solving the degradation of the characteristics due to stress at the upper edge of the U-groove. This U.S. patent states that a silicon oxide film covering the surface of the polysilicon in the Y-groove is formed by thermal oxidation of the polysilicon. The surface of this silicon oxide film is covered with a silicon nitride film formed by the CVD technique (referred to as "CVD silicon nitride film" hereinafter). Moreover two insulating films: the first is a thermal-oxidation silicon oxide film and the second is a CVD silicon nitride film are formed over the inner surface of the Y-groove. In the aforementioned first example, the surface of the U-groove polysilicon is covered with a CVD silicon oxide film, this structure can cause no such stress in the processing steps of forming the dielectric isolation region. In the subsequent steps of forming semiconductor elements, however, steps of introducing impurities and in addition the a processing step for producing a silicon oxide film of a few tens to hundreds nm on the surface of a silicon substrate or a silicon epitaxial layer formed by thermal oxidation are needed for protecting the surface of the silicon substrate of epitaxial layer. This thermal oxidation processing step results in forming a new silicon oxide film over the surface of the U-groove polysilicon, irrespective of the previous presence of the CVD silicon oxide film because O₂ gas can pass substantially freely through the CVD silicon oxide film. This, in the processing steps of the first example for forming semiconductor elements, reflects a volume-expansion (about 1.5 times) in the vicinity of the surface of the U-groove dielectric isolation region, and thereby stress will be applied to the upper portion of the U-groove to enlarge it. This stress may induces crystal lattice defect and in turn can be cause of leakage current resulting from breakdown of the p-n junction of semiconductor element. In the second example above-mentioned, the surface of a polysilicon inside the Y-groove is covered with a thermal-oxidation silicon oxide film, and a silicon nitride film formed over the former. Thus in the proceeding steps of forming semiconductor elements, no stress resulting from the volume expansion of the surface of the dielectric isolation region of Y-groove structure occurs. On the other hand, the upper edge portion of the Y-groove structure is formed by isotropic etching, and thus has an average slope of more than 45°C. In this structure, as compared with the U-groove structure in the first example, the stress near the upper edge portion produced when a thermal-oxidation silicon oxide film is formed on the surface of the polysilicon in the Y-groove is somewhat lowered but amounts to more than 70%. As described above, with the U-(and Y-groove) structure in the prior art commonly used in bipolar semiconductor devices, it is considered impossible to greatly reduce stress produced in the processing steps of forming dielectric isolation region of semiconductor elements. For example, bipolar semiconductor devices such as ECL RAM are required for C-E leakage current of it to be up to 1/10 of the hold current. The presence of dislocation to emitter region can cause an increase of C-E leakage current. Similar phenomenon may occur in other bipolar semiconductor devices having different circuitries. General method in the prior art for suppressing the production of C-E leakage current is to take sufficiently great distance from the dielectric isolation region to emitter region, and this is a major impediment against large-scale integration of bipolar semiconductor devices. SUMMARY OF THE INVENTION It is an object of the present invention is to provide a dielectric isolation region of a bipolar semiconductor device and a process for fabricating the same. Another object of the present invention is to provide a dielectric isolation region of a bipolar semiconductor device, which has a U-groove structure, and a process for fabricating the same. A further object of the present invention is to provide a dielectric isolation region of a bipolar semiconductor device, which has a U-groove structure allowing only substantially negligible stress to be produced in the processing steps of forming it, and a process for fabricating the same. A further object of the present invention is to provide a dielectric isolation region of a bipolar semiconductor device, which has a U-groove structure allowing only substantially negligible stress in the processing steps for forming semiconductor elements, which follows the formation of it, and a process for fabricating the same. A further object of the present invention is to provide a dielectric isolation region of a bipolar semiconductor device, which has a U-groove structure generating minimized leakage current, and a process for fabricating the same. A further object of the present invention is to provide a dielectric isolation region of a bipolar semiconductor device, which has a U-groove structure suitable for large-scale integration. According to the invention there is provided a semiconductor device comprising: a semiconductor substrate having a major surface; a U-groove formed in said substrate from said major surface; an insulating film covering the inner surface of said U-groove; a polysilicon layer formed on said insulating film and filling said U-groove; and characterised by a silicon nitride film directly covering the surface of said polysilicon. The invention also provides a process of fabricating a semiconductor device comprising a series of steps for forming a first insulating film on a major surface of a semiconductor substrate; forming a U-groove in said semiconductor substrate using said first insulating film as a mask; forming a second insulating film on the inner surface of said U-groove; forming a third insulating film covering said first and second insulating films; filling with polysilicon said U-groove having said second and third insulating films over the inner surface thereof; removing the exposed portions of said third insulating film using said polysilicon as a mask; and characterised by forming a silicon nitride film directly covering the surface of said polysilicon. In the first embodiment of the present invention, a dielectric isolation region of a semiconductor device, which has a U-groove structure, comprises a U-groove formed in a semiconductor substrate including a silicon substrate and a silicon epitaxial layer. The U-groove is covered over the inner surface thereof with two insulating layers preferably of a thermal oxidation silicon oxide film and a CVD silicon nitride film and filled with polysilicon of which surface is covered with a silicon nitride film. The process for fabricating a semiconductor device of the first embodiment of the present invention comprises a series of steps for forming a U-groove on the semiconductor substrate including a silicon substrate and a silicon epitaxial layer, covering the inner surface of the U-groove with insulating films, filling the U-groove with polysilicon and forming a silicon nitride film covering the surface of the U-groove polysilicon. In the first embodiment of the present invention, the earlier processing steps of forming a silicon nitride film covering the surface of the polysilicon inside the U-groove dielectric isolation region and also the subsequent steps of forming semiconductor elements can be carried out without causing volume expansion associated with thermal oxidation of polysilicon and thus without leakage current due to the resultant stress. This enables bipolar semiconductor device to be fabricated with a reduced distance between the dielectric isolation region and the emitter region, thus contributing greatly to large-scale integration of semiconductor devices. In the second embodiment of the present invention, the U-groove dielectric isolation region of a semiconductor device has a U-groove formed on a semiconductor substrate comprising a silicon substrate and a silicon epitaxial layer. The U-groove is covered over the inner surface thereof with insulating films and filled with polysilicon to a level lower than the upper edge of the U-groove. The upper edge potion of the U-groove and the surface of the U-groove polysilicon are covered with a silicon nitride film, and the resultant recess defined by the silicon nitride film is filled with a SOG (spin on glass) film. The process for fabricating a semiconductor device to which the second embodiment of the present invention is applied comprises a series of steps for forming a U-groove on a semiconductor substrate including a silicon substrate and a silicon epitaxial layer, covering the inner surface of the U-groove with insulating films, filling the U-groove with polysilicon to a lower level than the upper edge threrof, forming a silicon nitride film covering the upper edge portion of the U-groove and the surface of the U-groove polysilicon, and filling the the resultant recess defined by the silicon nitride film with a SOG film. The second embodiment of the present invention has the same effect as the first embodiment and in addition a superior flatness of the surface, thus being markedly advantageous in wiring in the later processing steps. BRIEF DESCRIPTION OF THE DRAWINGS The above-mentioned and other objects, features and advantages of this invention will become more apparently by reference to the following detailed description of the invention taken in conjunction with the accompanying drawings, wherein: Figs. 1A through 1E are cross-sectional views schematically illustrating a dielectric isolation region of a semiconductor device, which has a U-groove structure of one prior art, and a series of steps for forming it; Figs. 2A and 2B are cross-sectional views schematically illustrating a dielectric isolation region of bipolar semiconductor device, which has a Y-groove structure of another the prior art, and a series of steps for forming it; Figs. 3A through 3G are cross-sectional views schematically illustrating a dielectric isolation region of a semiconductor device, which has a U-groove structure, as the first embodiment of the present invention, and a series of steps for forming it; Fig. 4 is a cross-sectional view schematically illustrating a bipolar semiconductor device to which the first embodiment of the present invention is applied; Fig. 5 is a plan view schematically illustrating the semiconductor device of Fig. 4; Fig. 6 is a circuit diagram illustrating an ECL RAM to which the first embodiment of the present invention is applied; Fig. 7 is a graph of the characteristic of the bipolar semiconductor device to which the first embodiment of the present invention is applied: the relationship of C-E leakage current to distance from U-groove to emitter region; and Figs. 8A through 8C are cross-sectional views schematically illustrating a dielectric isolation region of a semiconductor device, which has a U-groove structure, as the second embodiment of the present invention, and a series of steps for forming it. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Prior to description of the present invention, the prior art will be described with reference to the drawings: Figs. 1A through 1E give cross-sectional views schematically illustrating a U-groove dielectric isolation region of semiconductor device of one prior art (disclosed in Japanese Patent Laid-Open Application No. Sho. 61-22646; opened on January 31, 1986), and a series of steps for forming it. In the first step, a silicon oxide film 111 is formed to a thickness of about 50 nm over the surface of a silicon substrate 101. Further over the silicon oxide film 111 a silicon nitride film 131 is deposited by CVD technique, and its thickness is about 100 nm. A window through these films 111, 131 is opened, and using these films as masks, a U-groove 141 is produced on the silicon substrate 101 by the reactive ion etching (referred to as RIE below). The width and depth of the U-groove 141 are about 2 µm and about 3 µm, respectively. Then a silicon oxide film 112 covering the inner surface of the U-groove 141 is formed by the thermal oxidation process using the silicon nitride as a mask (Fig. 1A). The thickness of the silicon oxide film 112 is 50 nm. The purpose of forming this film is to protect the inner surface of the U-groove 141 from being damaged by etching. Subsequently a silicon oxide film 121 is deposited to a thickness of about 300 to 500 nm over the entire surface including the inner surface of U-groove 141 by CVD process. In stead of this CVD silicon oxide film may be deposited a silicon nitride film by CVD technique, or a tantalum oxide film by the sputtering technique. Subsequently a polysilicon film is deposited over the entire surface, and etched back by RIE technique. The silicon oxide film 121 effects as a stopper against the etching. This etching results in filling U-groove 141 with the polysilicon 151 (Fig. 1B). In the succeeding step by RIE technique, the silicon oxide film 121 is etched back and removed from the top face of the silicon nitride film 131 (Fig. 1C). Again a silicon oxide film 122 is deposited over the entire surface by CVD technique (Fig. 1D). The thickness of the silicon oxide film 122 is about 1 µm. Subsequently, the silicon oxide film is etched back by RIE technique (Fig. 1E), and thus a U-groove dielectric isolation region of the semiconductor device is completed. In the last etching back, the silicon nitride film 131 serves as a stopper. In the prior art shown in Fig. 1, the U-groove dielectric isolation region of semiconductor device can be formed without causing stress associated with volume expansion of the U-groove polysilicon resulting from thermal oxidation of it. As described above, however, in the subsequent processing steps of forming semiconductor elements, in addition to the steps of doping impurities, a step of forming a silicon oxide film of thickness of tens to hundreds nm on the surface of a silicon substrate or a silicon epitaxial layer by thermal oxidation is necessary. This, in the structure of the dielectric isolation region according to the prior art shown in Fig. 1, makes it difficult to carrying out the steps forming semiconductor elements without causing stress. Figs. 2A and 2B are cross-sectional views schematically illustrating the structure of a dielectric isolation region of a bipolar semiconductor device having a Y-groove as another the prior art disclosed in U.S. Patent No. 4,635,090, published on Jan. 6, 1987, and a series of steps of forming it. In the first step, an n⁺ buried layer 261 is formed on a surface of a p-type silicon body 201. Then over the entire surface, an n-type silicon epitaxial layer 202 is grown. Over this layer 202, a silicon oxide film 211 is formed by thermal oxidation and over this film a silicon nitride film (not shown) by CVD technique. After etching away the silicon nitride film and the silicon oxide film 211 in sequence with a photoresist film (not shown) as a mask, the silicon epitaxial layer 202 is subjected to isotropic etching with the silicon nitride film and silicon oxide film 211 as masks to etch away a part of the silicon epitaxial layer 202, thus the upper portion of the Y-groove being formed. Then silicon the epitaxial layer 202, the buried layer 261 and the silicon body 201 are etched with the silicon nitride film and silicon oxide film 211 as masks by RIE technique to form a Y-groove 242. In the following steps, the inner surface of Y-groove 242 is covered with a silicon oxide film 212 using the silicon nitride film as mask by thermal oxidation. Before or after this processing step, a p-type channel stopper 262 region is formed by ion implantation. The silicon nitride film used as mask is etched away. Over the entire surface including the inner surface of the Y-groove 242, a silicon nitride film 232 is again deposited by CVD technique. Thereafter, the Y-groove 242 is filled with polysilicon 251 in the same way as in the prior art shown in Fig. 1. A silicon oxide film 213 is formed on the surface of the U-groove polysilicon 251 by thermal oxidation. Thus a U-groove dielectric isolation region of bipolar semiconductor device is completed. The silicon nitride 232 exposed on the surface is selectively etched away. Again a silicon nitride film 233 is deposited over the entire surface by CVD technique (Fig. 2A). In the subsequent steps, an n⁺ collector region 263, a p-type base region 264, and an n⁺ emitter region 266 are formed by usual photolithography, ion in plantation, or diffusion. A collector electrode 271, a base electrode 272 and an emitter electrode 273 are formed (Fig. 2B). The prior art shown in Fig. 2, which has a Y-groove structure as described above, fails to completely dissolve the stress resulting from the volume expansion by about 1.5 times associated with the formation of the silicon oxide film 213 on the surface of polysilicon 251. In the following, the present invention will be described with reference to the drawings: Figs. 3A through 3G are cross-section views schematically illustrating a U-groove dielectric isolation region of a semiconductor device as the first embodiment of the present invention, and a series of processing steps of forming it. In the first step, a silicon oxide film 311 is formed on a silicon substrate 301 by thermal oxidation at 900°C under steam atmosphere for 20 minutes. The thickness of the silicon oxide film 311 is about 50 nm. Over the surface of the silicon oxide film 311, a photoresist film 381 having a window of about 1 µm in width is applied. With the photoresist film 381 as mask, the silicon oxide film 311 is etched away by RIE technique using a gas mixture of CF₄ and CHF₃. Then the silicon substrate 301 is etched to about 5 µm in depth using the photoresist film 381 and the silicon oxide film 311 as masks, and a gas mixture, of SF₆ and CCl₂F₂ by RIE technique, thereby a U-groove 341 being formed (Fig. 3A). In the following steps, the photoresist film 381 is removed by O₂ plasma, and the inner surface of the U-groove 341 is covered with a silicon oxide film 312 by thermal oxidation at 900°C under steam atmosphere for 20 minutes. The thickness of the silicon oxide film 312 is about 50 nm. Simultaneously the silicon oxide film 311 becomes thicker and is redesignated with 311a. The purpose of forming the silicon oxide 312 is to protect the inner surface of the U-groove 341 from being damaged by etching. Over the entire surface including the inner surface of the U-groove 341, a silicon nitride film 332 is deposited by a low pressure CVD (LPCVD) technique (Fig. 3B). The thickness of the silicon nitride film 332 is about 100 nm. Then a polysilicon 351 is deposited by LPCVD technique over the entire surface (Fig. 3C), and the thickness of it is about 1.0 µm. In the following steps, the U-groove 341 is filled with a polysilicon 351a by etching polysilicon 351 on the silicon nitride film 332 formed on silicon oxide film 311a using a mixed solution of HF, HNO₃, CH₃COOH. Then the exposed silicon nitride film 332 is etched away to leave silicon nitride film 332a only over the inner surface of the U-groove 341 by RIE technique, or by the wet etching technique with hot phosphoric acid (Fig. 3D). Besides etching of the polysilicon 351 may be used by RIE technique. Etching of the exposed portions of the silicon nitride film 332 may be carried out at the same time as the etching process of a silicon nitride film deposited in a latter processing step. This, however, is not preferable for the following reasons: In the subsequent steps of forming semiconductor elements, a silicon oxide film great in thickness to become a field insulating film by LOCOS technique. More thermal stress may be produced with increasing thickness of the silicon nitride film used as a mask for thermal oxidation. In the next step, a silicon nitride film 333 is deposited over the entire surface including the inner surface of the polysilicon 351 a by LPCVD technique so that the silicon nitride film 333 is directly contacted to the upper surface of the polysilicon 351 in the U-groove 341 (Fig. 3E). The thickness of the silicon nitride film 333 is about 100 nm. In the next step, a photoresist film 382 is formed which covers about 0.5 µm more in width than the U-groove 341 (Fig. 3F). In the following steps, the silicon nitride film 333 is etched away, using the photoresist film 382 as a mask and a gas mixture of CHF₃ and O₂, by RIE technique. Then photoresist film 382 is removed by means of O₂ plasma. Thus silicon nitride film 333a covering the polysilicon 351a is formed (Fig. 3G). Figs. 4 and 5 are schematic diagrams in cross-sectional and plan-views illustrating a bipolar semiconductor device to which the first embodiment of the present invention is applied. This bipolar semiconductor device will be described below: In the first steps, an n⁺ buried layer 361 is formed on a surface of a p-type silicon body 301. Over the entire surface of this buried layer, an n-type silicon epitaxial layer 302 is grown so that a silicon substrate is constituted by the silicon body 301, the buried layer 361 and the epitaxial layer 302. Over the epitaxial layer 302, a silicon oxide film is formed by thermal oxidation. Then sequential silicon etching of the silicon epitaxial layer 302, the n⁺ buried layer 361 and the silicon substrate 301 is carried out to form a U-groove 341a. A p-type channel stopper 362 is formed underneath the U-groove 341a. This U-groove is covered over the surface thereof with an insulating film and filled with polysilicon. Besides a silicon nitride film 333a covering and directly contacted to the U-groove polysilicon is formed. Over the surface of the silicon epitaxial layer 302 is formed a thick silicon oxide film 314 to be a field insulating film using silicon nitride film 333a as a mask by the LOCOS technique. In the following steps, an n⁺ collector region 363, a p-type base region 364, a p⁺ graft-base region 365 and an n⁺ emitter region 366 are formed by usual photolighography, ion implantation and/or diffusion. The collector region 363 is connected to buried layer 361. Besides a collector electrode 371, a base electrode 372 and an emitter electrode 373 are formed by usual photolithography and metal wiring. Thus a bipolar transistor shown in Figs. 4 and 5 is obtained. The bipolar transistor illustrated in Figs. 4 and 5 may be a component as of ECL RAM. Fig. 6 shows a circuit diagram of a memory cell of such a RAM. As Tr₃ and Tr₄ of the circuit are used the bipolar transistor illustrated in Figs. 4 and 5. In Fig. 6, Tr₁ and Tr₂ are lateral type pnp transistors, and Tr₃ and Tr₄ are vertical type npn transistors. E r/w is an emitter for "read/write" and E is an emitter for "hold". W+ and W₋ are higher and lower potential side word lines, respectively. B₀ and B₁ are bit lines to which inverse electric signals are applied. In the case where the first embodiment of the present invention is applied and thus "hold" current is set to 1.0 µA per memory cell, it is necessary to limit the leakage current to up to 0.1 µA. Leakage current per transistor must be limited to up to 0.05 µA. Unless this condition can be met, problem is encountered, for example, in operation speed and reliability of RAM. With the bipolar transistor illustrated in Figs. 4 and 5, assuming that emitter region 366 of it has an area of 1 µm x 1 µm, variation of leakage current with minimum distance from U-groove 341a to emitter region was studied and the measured results were plotted as a graph designated with A in Fig. 7. The results by similar measurement with the prior art shown in Fig. 2 were plotted as another graph designated with B. As apparent from these results, application of the present invention permits the minimum distance from U-groove to emitter region to be about 2 µm-reduced compardd with the prior art, and thus enables memory size in ECL RAM to be about 150 µm² while that in the prior art is about 300 µm². Figs. 8A through 8C are cross-sectional views schematically illustrating a U-groove dielectric isolation region of the first semiconductor device as the second embodiment of the present invention, and a series of step of forming it. In the first steps, a silicon oxide film is formed over the surface of a silicon substrate 401 by thermal oxidation. With the silicon oxide film and a photoresist film as masks, a U-groove 441 is formed by RIE technique. Over the inner surface of the U-groove 441, a silicon oxide film 412 is formed by thermal oxidation. At the same time the silicon oxide film on the surface of silicon substrate 401 becomes thicker (411a). Over the entire surface including the inner surface of the U-groove 441, a silicon nitride film, followed by polysilicon thereover, are deposited by LPCVD technique. Then etching is carried out to fill the U-groove 441 with polysilicon 451a to a level lower by about 0.1 to 0.3 µm than the upper edge of U-groove 441. The following steps are carried out in the same way as in the first embodiment: the exposed silicon nitride film is etched away, leaving the silicon nitride film 432a only on the inner surface of the U-groove 441. Over the whole surface including the surface of U-groove polysilicon 451a, a silicon nitride film 433 is directly deposited by LPCVD technique (Fig. 8A). In the following steps, the entire surface is coated as with a SOG (spin on glass) film 491 including PSG by spincoating. Then thermal processing is carried out in a gas mixture of N₂ and O₂ at 300°C, followed by at 900°C, thereby the SOG film 491 being sintered (Fig. 8B). In the next step, the SOG film 491 and the silicon nitride film 433 are etched using a photoresist film (not shown) as a mask to form a silicon nitride film 433a and a SOG film 491a covering only the surface of the polysilicon 451a (Fig. 8C). This embodiment has, in addition to the same effects as the first embodiment, advantage of good surface flatness over the first embodiment, contributing in particular to effective wiring of semiconductor elements. When a wiring is formed above the U-groove, the U-groove polysilicon may function as a floating gate between wire and semiconductor. In this embodiment, compared with the first embodiment, the U-groove polysilicon has a lowered function as the floating gate because the thickness of the insulating film separating the wiring passing above the U-groove from the U-groove polysilicon is great compared with that in the first embodiment. Moreover in the second embodiment an alternative process may be applied which comprises in advance forming a silicon nitride film 433a, coating with SOG by spincoating and sintering it, and etching the SOG film back. Although the present invention has been described with reference to specific embodiments, this description is not meant to be construed in a limiting sense. Various modifications of the disclosed embodiment, as well as other embodiments of the present invention, will become apparent to persons skilled in the art upon reference to the description of the present invention. It is therefore contemplated that the appended claims will cover any modifications or embodiments as fall within the scope of the present invention.

Claims: A semiconductor device comprising: a semiconductor substrate (301,401) having a major surface; a U-groove (341,441) formed in said substrate from said major surface; an insulating film (312,412) covering the inner surface of said U-groove; a polysilicon layer (351,451) formed on said insulating film and filling said U-groove; and characterised by a silicon nitride film (333,433) directly covering the surface of said polysilicon. A semiconductor device defined in Claim 1, wherein said semiconductor substrate includes a p-type silicon body (301), an n⁺ buried layer (361) over the surface of said silicon body and an n-type silicon epitaxial layer (302) formed over the surface of said buried layer; and said U-groove (341) extends through said epitaxial layer and said buried layer. A semiconductor device defined in Claim 2, wherein said insulating film is composed of a silicon oxide film (312) and a silicon nitride film (332) formed on said silicon oxide film (312). A semiconductor device defined in Claim 1, wherein the surface of said U-groove polysilicon (451a) is at a level lower than the upper edge of said U-groove, and a spin an glass film (491) is contained in the recess defined by said silicon nitride film (433) directly covering the surface of said U-groove polysilicon. A semiconductor device defined in Claim 4, wherein said semiconductor substrate (401) includes a p-type silicon substrate, an n⁺ buried layer over the surface of said silicon substrate, and an n-type silicon epitaxial layer over the surface of said buried layer; and said U-groove (451) extends through said silicon epitaxial layer and said buried layer. A semiconductor device defined in Claim 5, wherein said insulating film is composed of a silicon oxide film (412) and a silicon nitride film (432a) formed on said silicon oxide film. A process of fabricating a semiconductor device comprising a series of steps for forming a first insulating film (311) on a major surface of a semiconductor substrate (301); forming a U-groove (341) in said semiconductor substrate using said first insulating film (311) as a mask; forming a second insulating film (312) on the inner surface of said U-groove; forming a third insulating film (332) covering said first and second insulating films; filling with polysilicon (351a) said U-groove (341) having said second and third insulating films over the inner surface thereof; removing the exposed portions of said third insulating film (332) using said polysilicon as a mask; and characterised by forming a silicon nitride (333) film directly covering the surface of said polysilicon. A process of fabricating semiconductor device defined in Claim 7, wherein said first insulating film is a silicon oxide film (311) formed by thermal oxidation of a major surface of said silicon substrate; said second insulating film is a silicon oxide film (312) formed by thermal oxidation of the inner surface of said U-groove; and said third insulating film is a silicon nitride film (332) formed by a vapour phase growth process. A process of fabricating a semiconductor device defined in Claim 8, wherein said U-groove (441) is filled with polysilicon (451a) to a level lower than the upper edge of said U-groove; a spin on glass film (491) is coated over the surface of said silicon nitride film (433) covering the surface of said U-groove polysilicon and sintered; and the recess defined by said silicon film covering the surface of the U-groove polysilicon (451a) is filled with said spin on glass film.

Inventors: KISHI SHUJI, KISHI, SHUJI
Applicants: NIPPON ELECTRIC CO, NEC CORPORATION
Application year: 1990
Main classification: H01L21
IPC codes: H01L21