Variable impedance circuit

Abstract: This variable impedance circuit comprises a first differential circuit (1) having an impedance element (3) connected between emitters of a transistor pair (Q₁, Q₂), and a second differential amplifier (2) circuit, in which the output terminal pair of the first differential amplifier circuit is connected to the input terminal pair of the second differential amplifier circuit, and the output terminal pair of the second differential amplifier circuit is connected to the input terminal pair of the first differential amplifier circuit. In this construction, a variable impedance circuit is realized by two differential amplifier circuits, and it is extremely advantageous when fabricating a variable capacity or variable resistance into a semiconductor chip. At the same time, the variable range of the capacity value or resistance value may be widened.

Description: This invention relates to a variable impedance circuit capable of electrically increasing or decreasing the impedance such as resistance and capacitance. Recently, the function of semiconductor integrated circuits has been greatly improved, and the filter circuit has come to be incorporated in a semiconductor chip as an integrated circuit. Generally a filter circuit is composed of resistance element and a capacity element. To change the filtering characteristic of the filter circuit, it is necessary to vary the value of constituent elements, that is, the capacity element or resistance element. Accordingly, hitherto, a variable impedance circuit has been used, which can vary the value of capacity element or resistance element built in a semiconductor chip. FIG. 12 shows a conventional variable capacity circuit used for such purpose, expressed only by an AC circuit. In FIG. 13, the variable capacity circuit in FIG. 12 is expressed by both AC circuit and DC circuit. In FIG. 12 and FIG. 13, a differential amplifier circuit 15 is composed of transistors Q₅, Q₆, and a resistance element 10 connected between their emitters. A differential amplifier circuit 16 is composed of transistors Q₇, Q₈, and a resistance element 11 connected between their emitters. A differential amplifier circuit 17 is composed of transistors Q₁, Q₂, and a resistance element 12 connected between their emitters. A differential amplifier circuit 18 is composed of transistors Q₃, Q₄, and a resistance element 13 connected between their emitters. As clear from FIG. 12 and FIG. 13, the differential amplifier circuits 15, 16 are so connected that the input terminals of one differential amplifier circuit are connected to the output terminals of the other differential amplifier circuit. The differential amplifier circuits 17, 18 are also connected in a similar relation. These differential amplifier circuits 15, 16, 17 and 18 are connected as shown in FIG. 12, FIG. 13, and a capacity element 14 is connected between two output terminals of the differential amplifier circuit 17. The transistors Q₁ to Q₈ for composing the differential amplifier circuits 15, 16, 17 and 18 are supplied with biases from voltage sources V₀, V₁, and constant current source I₀ as shown in FIG. 13. The voltage-current conversion factors of the differential amplifier circuits 15, 16, 17 and 18 are determined respectively by the characteristics of the resistance elements 10, 11, 12 and 13. The operation is explained below. The relation i₂ = g₁ · V₁ is established between voltage V₁ and output current i₂ across input terminals of the differential amplifier circuit 17. In this equation g₁ denotes the voltage-current conversion factor of the differential amplifier circuit 17, and supposing the emitter resistance value of transistors Q₁, Q₂ to be r e1 , and the value of resistance element 12 between emitters to be R₁, it is expressed as follows. g₁ = 1 R₁ + 2r e1 The characteristics of voltage V₂ and current i₂ occurring at both ends of the capacity element 14 of capacity value C₀ are obtained as follows. i₂ = -jωC₀ · V₂ Similarly, the characteristics of voltage V₂ across input terminals and output current i₁ of the differential amplifier circuit 18 composed of transistors Q₃, Q₄ are obtained as follows: i₁ = -g₂ · V₂ where g₂ denotes the voltage-current conversion factor of the differential amplifier circuit 18, and supposing the resistance value of each emitter of transistors Q₃, Q₄ to be r e2 , and the value of the resistance element 13 between the emitters to be R₂, it is expressed as follows. g₂ = 1 R₂ + 2r e2 Solving V₁ and i₁ from equations (1), (3) and (4), it is known from equations (1), (3) that V₂ = - g₁ · V₁ jωC₀ and from equations (4), (6) that i₁ = g₁ · g₂ · V₁ jωC₀ That is, V₁ = jω ( C₀ g₁ · g₂ ) i₁ Here, the inductance L is given as follows. L = C₀ g₁ · g₂ Furthermore, from equations (2), (5), it follows that L = (R₁ + 2r e1 ) (R₂ + 2r e2 ) C₀ Usually, the resistance values can be set so as to establish the relation of R₁ >> r e1 , R₂ >> r e2 , and hence the inductance L can be approximated as L = R₁ · R₂ · C₀ Likewise, the characteristics of input terminal voltage V₃ and output current i₄ of the differential amplifier circuit 15 composed of transistors Q₅, Q₆ may be expressed as follows, supposing the voltage-current conversion factor of the differential amplifier circuit 15 to be g₃: i₄ = g₃ · V₃ Supposing the voltage-current conversion factor of the differential amplifier circuit 16 to be g₄, the characteristics of input terminal voltage V₄ and output current i₃ of the differential amplifier 16 composed of transistors Q₇, Q₈ are as follows. i₃ = -g₄ · V₄ The circuit systems respectively composed of the differential amplifier circuits 15, 16, and the differential amplifier circuits 17, 18 represent the conventionally used phase conversion circuits. The circuit system composed of the differential amplifiers 17, 18 is designed to apply from capacity characteristics to inductance characteristics, in terms of circuitry. In FIG. 12 and FIG. 13, the relations V₄ = V₁ i₄ = -i₁ are established between the voltages V₁, V₄, and currents i₄, i₁, respectively. Hence, equation (8) is rewritten as V₄ = jω · C₀ g₁ · g₂ (-i₄) and further by eliminating i₄ from equation (11), it results in V₄ = jω · C₀ g₁ · g₂ (-g₃·V₃) and from equations (16) and (12), it follows that i₃ = jω · g₃ · g₄ g₁ · g₂ C₀·V₃ The capacity value C applied between the voltage V₃ and current i₃ is given as C = g₃ · g₄ g₁ · g₂ C₀ That is, by properly selecting the values for the voltage-current conversion factors g₁, g₂, g₃ and g₄, the capacity value C is newly created electrically. However, in the conventional variable capacity circuit shown in FIG. 12, FIG. 13, at least four differential amplifier circuits are needed in order to obtain a new capacity value by electrically increasing or decreasing the capacity. Accordingly, the circuit composition is complicated, and the number of required elements increases, and the chip area increases. A conventional variable resistance circuit incorporated in a semiconductor chip is explained below while referring to FIG. 14. In FIG. 14, transistors 41, 42 are connected between a constant voltage source 40 and the grounding potential. A constant voltage source 43 is connected to the base of the transistor 41. A variable voltage source 44 is connected to the base of the transistor 42. An output terminal 45 is connected to the connecting points of the transistors 41, 42. In the structure in FIG. 14, the resistance value as seen from the output terminal 45 is equal to the differential emitter resistance of the transistor 41 (that is, the impedanace of the transistor 41 seen from its emitter), and it is given in the following formula. kT/q I₀ where k is Boltzmann constant, T is absolute temperature, q is electric charge quantity of an electron, and I₀ is emitter current flowing in the transistor 41. When the voltage of the variable voltage source 44 is varied, the current I₀ changes, and hence the reistance value as seen from the output terminal 45 varies. Therefore, by controlling the voltage of the variable voltage source 44, a variable resistance may be obtained. However, in the conventional variable resistance circuit shown in FIG. 14, since the differential emitter resistance itself of the transistor 41 is used as a variable resistance component, the variable range of the resistance value is narrow. The article "Integration of analog filters in a bipolar process" (J.O. Voorman et al, IEEE Journal of Solid-State Circuits, vol. SC-17, no. 4, August 1982. pp 713-722, New York, US) discloses various transconductor circuits incorporating resistive elements between the emitters of two pairs of transistors, arranged to have the transresistances of a positive or a negative resistor, a gyrator, or a positive or negative inductor, which are suitable as filters of relatively low frequencies without the need for large chip areas. The article "The TCA 580 Integrated Gyrator" (Electron. Applic. Bull., vol 34, no. 4, August 1977, pp 148-161, Eindhoven, NL) discloses manners in which oscillators and filters of a conventional design can be modified to incorporate TCA 580 inductors instead of conventional would inductors. In particular, a low-frequency oscillator circuit is described incorporating a transconductor circuit similar to that described in the previous paragraph, incorporating resistive elements between the emitters of two pairs of transistors. According to the present invention, there is provided a variable impedance circuit comprising: first and second differential amplifier circuits each having a pair of input terminals and a pair of output terminals, each differential amplifier circuit consisting of a pair of active devices, wherein impedance elements are connected between said pairs of active devices, said active devices being transistors or operational amplifiers; means for connecting the input terminal pair of said first differential amplifier circuit to the output terminal pair of said second differential amplifier circuit; and means for connecting the input terminal pair of said second differential amplifier circuit to the output terminal of said first differential amplifier circuit; wherein the input terminals of the impedance circuit are connected between the input terminals to the active elements of said first differential amplifier circuit; characterised in that the impedance elements are either: a capacitative element in the first differential amplifier circuit and a first resistive element of selectable resistance R in the second differential amplifier circuit; or a first resistive element of selectable resistance R in the first differential amplifier circuit and a capacitative element in the second differential amplifier circuit; and characterised in that a second resistive element of selectable resistance R3 is connected between the input terminals to the active elements of said second differential amplifier circuit; whereby the impedance of said input terminals is capacitative and is defined by the ratio R3/R of resistance values of said first and second resistive elements. A second embodiment of the invention is set out in Claim 8. It is hence a first object of the invention to present a variable impedance circuit capable of varying the impedance, such as capacity value and resistance value, by using two differential amplifier circuits. It is a second object of the invention to present a variable impedance circuit capable of widening the variable range of impedance such as capacity value and resistance value. The invention as set out in Claims 1 and 8 is, in short, intended to obtain a new impedance from the voltage and current characteristics caused between the pair of input terminals of a first differential amplifier circuit, by connecting the output terminal pair of the first differential amplifier circuit to the input terminal pair of a second differential amplifier circuit, connecting the output terminal pair of the second differential amplifier cirucuit to the input terminal pair of the first differential amplifier circuit, and connecting an impedance element such as capacity element or resistance element between the emitters of the transistor pair composing the first differential amplifier circuit. In this way, the variable impedance circuit is composed of two differential amplifier circuits, and the circuit composition may be simplified, and the number of required elements is smaller. Therefore, when this variable impedance circuit is incorporated in a semiconductor chip, the required chip area may be come small. Moreover, as compared with the prior art in which differential emitter resistance is directly used as variable resistance component, the variable range of the impedance may be come wider. FIG. 1 is a circuit diagram expressing a variable impedance circuit in a first embodiment of the invention only by an AC circuit, FIG. 2 is a circuit diagram expressing the first embodiment by both AC circuit and DC circuit, FIG. 3 is a circuit diagram expressing a variable impedance circuit in a second embodiment of the invention only by an AC circuit, FIG. 4 is a circuit diagram expressing the second embodiment by both AC circuit and DC circuit, FIG. 5 is a circuit diagram expressing a variable impedance circuit in a third embodiment of the invention only by an AC circuit, FIG. 6 is a circuit diagram expressing the third embodiment by both AC circuit and DC circuit, FIG. 7 is a circuit diagram expressing a variable impedance circuit in a fourth embodiment of the invention only by an AC circuit, FIG. 8 is a circuit diagram expressing the fifth embodiment by both AC circuit and DC circuit, FIG. 9 is a circuit diagram of a variable impedance circuit in a sixth embodiment of the invention modified from the embodiment in FIG. 2, expressed by both AC circuit and DC circuit, FIG. 10 is a circuit diagram expressing a variable impedance circuit in a seventh embodiment of the invention by both AC circuit and DC circuit, FIG. 11 is a circuit diagram expressing a variable impedance circuit in an eighth embodiment of the invention by both AC circuit and DC circuit, FIG. 12 is a circuit diagram expressing a conventional variable capacity circuit only by an AC circuit, FIG. 13 is a circuit diagram expressing the conventional variable capacity circuit shown in FIG. 12 by both AC circuit and DC circuit, and FIG. 14 is a circuit diagram showing a conventional variable resistance circuit. Referring now to FIG. 1 and FIG. 2, a first embodiment of the invention is described in detail below. In FIG. 1, FIG. 2, a differential amplifier 1 is composed of transistors Q₁, Q₂, and a capacity element 3 connected between their emitters. A differential amplifier circuit 2 is composed of transistors Q₃, Q₄, and a resistance element 5 connected between their emitters. The output terminal pair of the differential amplifier circuit 1 is connected to the input terminal pair of the differential amplifier circuit 2. The output terminal pair of the differential amplifier circuit 2 is connected to the input terminal pair of the differential amplifier circuit 1. A resistance element 6 is connected between the input terminals of the differential amplifier circuit 2. Biases are supplied to the transistors Q₁ to Q₄ from voltage source V₁, and constant current sources I₀, I₁. The operation is explained below. Supposing the input terminal AC voltage of the differential amplifier circuit 1 to be V₁, and the voltage-current conversion factor of the differential amplifier circuit 1 to be g m1 , the output AC current i₂ is given as i₂ = g m1 · V₁ The voltage V₂ produced between the both ends of the resistance element 6 of which resistance value is R₃ is given as V₂ = -i₂ · R₃ Supposing the voltage-current conversion factor of the differential amplifier circuit 2 to be g m2 , the output current i₁ flowing due to the voltage V₂ applied between the input terminals of the differential amplifier circuit 2 is given as i₁ = -g m2 · V₂ From equations (19), (20), it follows that V₂ = -g m1 · R₃ · V₁ From equations (22), (21), it follows that i₁ = g m1 · g m2 · R₃ · V₁ Here, the voltage-current conversion factor g m2 of the differential amplifier circuit 2 is given by the resistance characteristic. In other words, the voltage-current conversion factor g m2 is determined by the emitter resistance value r e2 of transistors Q₃, Q₄ and the resistance value R₂ of the resistance element 5, and is obtained as follows. g m2 = 1 R₂ + 2r e2 Supposing here r e2 << R₂, it follows that g m2 = 1 R₂ Next, the voltage-current conversion factor g m1 of the differential amplifier circuit 1 is given by the characteristics of the capacity element 3. Here, the voltage-current conversion factor g m1 is given by the impedance of the capacity element 3 Z = 1 jωC₁ and the emitter resistance value r e1 of the transistors Q₁, Q₂, and it becomes g m1 = 1 Z + 2r e1 Here, if selecting as 2r e1 << |Z| , it follows that g m1 = 1 Z = jωC₁ Putting equations (24), (26) into equation (23) yields i₁ = jωC₁ · R₃ R₂ · V₁ As a result, between the voltage V₁ and current i₁, a new capacity value C is given as C = R₃ R₂ · C₁ By selecting the ratio of the resistance value R₃ and R₂, another new capacity value C may be obtained from the original capacity value C₁. Besides, as seen from equation (23), it is enough when the capacity characteristic is given to either one of the voltage-current conversion factor g m1 or g m2 . FIG. 3 and FIG. 4 relate to a second embodiment of the invention. The variable impedance circuit shown in FIG. 3, FIG. 4 comprises differential amplifier circuits 8, 9, and a resistance element 7 is connected between the emitters of transistors Q₁, Q₂ for composing the differential amplifier circuit 8, and a capacity element 4 is connected between the emitters of transistors Q₃, Q₄ for composing the differential amplifier circuit 9. The other composition is same as in the first embodiment shown in FIG. 1, FIG. 2. Now, assuming the capacity value of the capacity element 4 to be C₂ and the resistance value of the reistance element 7 to be R₁, equations (26), (24) in the first embodiment are respectively rewritten as g m2 = jωC₂ g m1 = 1 R₁ and the current i₁ becomes i₁ = jωC₂ · R₃ R₁ · V₁ That is, same as in the first embodiment, a new capacity value C is applied between the voltage V₁ and current i₁ as C = R₃ R₁ · C₂ Therefore, by selecting the ratio of the resistance value R₃ and R₁, a new capacity value C may be obtained from the initial capacity value C₂. FIG. 5 and FIG. 6 relate to a third embodiment of the invention. In this embodiment, as clearly seen from FIG. 5, the output terminal pair of the differential amplifier circuit 2 is connected to the input terminal pair of the differential amplifier circuit 1 by way of a current-current conversion circuit 20. The current-current conversion circuit 20 may be realized, for example as shown in FIG. 6, by a known Gilbert multiplication circuit composed of transistors Q₅ to Q₈, and current source 2I₂. Meanwhile, to the transistors Q₇, Q₈ of the current-current conversion circuit 20, a base bias is applied from a voltage source V₂. The other composition is substantially same as in FIG. 2, FIG. 4. When such current-current conversion circuit 20 is used, the current value of the differential amplifier circuit 2 may be varied independently of the composition of the differential amplifier circuit 2. In other words, supposing there is a coefficient K for converting current i₁ into other current i₁′, the relation is i₁′ = K · i₁ Putting equation (32) into equation (27), the converted current i₁′ is expressed as i₁′ = K · jωC₁ R₃ R₂ · v₁ Therefore, the capacity value C′ after conversion is C′ = K R₃ R₂ C₁ As known from equation (34), the new capacity value C′ may be increased or decreased by the quantity given as the product of K and R₃/R₂. Since K is determined by I₂/I₀, equation (34) is finally rewritten as C′ = I₂ I₀ · R₃ R₂ · C₁ That is, according to the embodiment in FIG. 6, the capacity value can be changed not only by the ratio of resistance components (R₃/R₂), but also by the ratio of current components (I₂/I₀). Therefore, a greater capacity value may be obtained. FIG. 7 shows a fourth embodiment of the invention, having a current-current conversion circuit 20 added to the embodiment in FIG. 3. In FIG. 7, too, the current value of the differential amplifier circuit 9 may be varied independently of the composition of the differential amplifier circuit 9. In FIG. 7, the capacity value C′ after conversion is given as C′ = K R₃ R₁ C₂ When the current-current conversion circuit 20 is used as shown in the embodiments in FIG. 5 to FIG. 7, the following advantages are brought about. Since the resistance element and capacity element of the variable impedance circuit of the invention are formed in a semiconductor chip, their values are fixed. But when actually composing a filter circuit by using this variable impedance circuit, it may be sometimes desired to vary the frequency characteristics of the filter only very slightly. In such a case, by using the current-current conversion circuit 20, the filter circuit may be furnished with a kind of a variable resistor function, so that a desired frequency characteristic may be realized guite easily. FIG. 8 shows a fifth embodiment of the invention modifying the embodiment in FIG. 6. That is, instead of the linear resistance elements 6, 6 in FIG. 6, nonlinear characteristic resistances 21, 21 composed of transistors Q₉, Q₁₀ are used, and a base bias is applied to these transistors Q₉, Q₁₀ from a voltage source V₂. Meanwhile, in the composition in FIG. 8, resistance element is not connected between the emitters of the transistors Q₃, Q₄ for composing a differential amplifier circuit 22. In the embodiment in FIG. 8, the transistors Q₉, Q₁₀, the transistors Q₃, Q₄ for composing the differential amplifier circuit 22, and the current source 2I₀ fulfill substantially an equivalent current-current converting function as the Gilbert multiplication circuit 20 shown in FIG. 6. Accordingly, the current-current converting function is realized in a simple circuit structure. What is more, when composed as shown in FIG. 8, since the base potentials of the transistors Q₉, Q₁₀ are fixed by the potential of the voltage source V₂, the emitter potentials of the transistors Q₃, Q₄ for composing the differential amplifier circuit 22 are also fixed nearly at specific potentials. Therefore, particularly when the supply voltage is small, the circuit design becomes quite easy, and the dynamic range of the transistors Q₁, Q₂ for composing the differential amplifier circuit 1 may be widened. FIG. 9 shows a sixth embodiment of the invention, improving the embodiment in FIG. 2. Instead of the transistor Q₁ in FIG. 2, an operational amplifier 24 is used, and instead of transistor Q₂ in FIG. 2, an operational amplifier 25 is used. The operational amplifier 24 is composed of transistors Q₁₁ to Q₁₄, Q₁₉, and a current source I₃, while the operational amplifier 25 is composed of transistors Q₁₅ to Q₁₈, Q₂₀, and a current source I₃. By thus composing, the emitter resistances of the transistors Q₁₉, Q₂₀ become smaller in reverse proportion to the open gain of the operational amplifiers 24, 25. As a result, the resistance component added serially to the capacity element 3 is decreased. FIG. 10 shows an embodiment of the invention applied to a variable resistance circuit. The embodiment in FIG. 10 is a modified version of the composition of FIG. 8, and the same parts are identified with the same reference numbers and repeated explanations are omitted. A transistor Q₂₁ and a variable voltage source V₃ make up a current source, and an electric current I x is supplied into the differential amplifier circuit 2. On the other hand, resistance element 26, 27 are connected in series between the emitters of the transistors Q₁, Q₂ for composing the differential amplifier circuit 1, and a constant current source 28 is connected between their connecting point and the reference potential. Supposing the current flowing in the constant current source 28 to be I₀, the differential emitter resistance r eN of the transistros Q₁, Q₂, Q₉ and Q₁₀ is expressed as follows: r eN = (KT/q) / (I₀/2) where K is Boltzmann's constant, T is absolute temperature, and q is electric charge quantity of an electron. The potentials applied to input terminals 29 and 30 are supposed to be V₄ and V₅. When the potentials V₄ and V₅ are changed, the emitter current flowing in the transistors Q₁ and Q₂ varies. At the same time, the emitter current flowing in the transistors Q₉ and Q₁₀ varies, and accordingly the potentials V₆ and V₇ of the emitters of the transistors Q₉ and Q₁₀ are also changed. At this time, the rate of change of voltage (V₇-V₆) to the voltge (V₄-V₅), that is, the voltage amplification factor G N is given in the following equation: G N = d(V₆ - V₇) / d(V₄ - V₅) = r eN / (r eN + R) where R is the resistance value of resistance elements 26 and 27, and it functions to increase the emitter series resistance of the transistors Q₉ and Q₁₀. supposing the collector current of the transistor Q₂₁ to be I x , each emitter current and collector current of the transistors Q₃ and Q₄ are I x /2. Therefore, the differential emitter resistance r ep of the transistors Q₃ and Q₄ is given as follows: r er = (KT/q) / (I x /2) At this time, when the current value flowing in the constant current sources 31 and 32 is set at I x /2, the current flowing in from the input terminals 29 and 30 becomes zero, which is very convenient. The rate of change of collector currents of the transistors Q₃ and Q₄ by the change of the voltage (V₇-V₆) generated between the bases of the transistors Q₃ and Q₄, that is, the voltage-current conversion factor (mutual conductance) g mp is given as follows. g mp = 1 / r ep The change of the collector current of transistors Q₃ and Q₄ is equal to the change of the currents I₁ and I₂ flowing in from the input terminals 29 and 30. Therefore, the rate of change of currents I₁ and I₂ by the changes of the potentials V₄ and V₅, d(I₁-I₂) / d(V₄-V₅), is given as follows. d(I₁-I₂)/d(V₄-V₅) = g mp · G N = r eN / {(r eN +R) · r ep } Futhermore, since the change of current I₁ and change of current i₂ are equal to each other, the resistance value seen from the input terminals 29 and 30, d(V₄-V₅)/dI₁ is expressed as follows. d(V₄-V₅)/dI₁ = d(V₄-V₅)/ 1 2 d(I₁-I₂) = {2(r eN +R)/r eN }r ep As known from the equation (41), the value of the resistance is equal to the product of the differential emitter resistance r ep of transistors Q₃ and Q₄ multiplied by the coefficient {2(r eN +R) / r eN }. Here, since, the resistance value R of the resistances 26 and 27 is a positive value, the coefficient {2(r eN +R) / r eN } is greater than 2. To change the resistance value seen from the input terminals 29 and 30, meanwhile, the voltage value of the variable voltage source V₃ is changed and the collector current I x of the transistor Q₂₁ is changed, thereby causing to vary the differential emitter resistance r ep . According to the embodiment in FIG. 10, as compared with the variation width of the differential emitter resistance r ep , the resistance value can be varied in a width of more than twice as much. In the embodiment shown in FIG. 10, meanwhile, the collector of the transistor Q₃ is connected to the base of the transistor Q₂, and the collector of the transistor Q₄ is connected to the base of the transistor Q₁, but instead the collectors of the transistors Q₃ and Q₄ may be mutually exchnaged. In this case, as the resistance value seen from the input terminals 29 and 30, a negative resistance may be realized. Moreover, in the embodiment in FIG. 10, the transistors Q₉ and Q₁₀ are used as the resistive load of the transistors Q₁ and Q₂, but it is also possible, needless to say, to use an ordinary resistance element as shown in FIG. 2. Thus, according to the embodiment in FIG. 10, the resistance value can be changed in a broader width than the variation of the differential emitter resistance of a transistor, and the variable width of the resistance value can be freely changed by changing the current value of the current source connected to the transistor pair of the differential amplifier circuit. FIG. 11 relates to an eighth embodiment of the invention. In FIG. 11, variable capacity circuits 100, 101 substantially equivalent to the composition shown in FIG. 2 are connected in cascade. A capacity element 33 is connected between the emitters of the transistors Q₁, Q₂ for composing the differential amplifier circuit 1 of the variable capacity circuit 101. The capacity value of this capacity element 33 is supposed to be C₂. The resistance value of the resistance element 34 connected to the base of the transistor Q₁ of the variable capacity circuit 100 is supposed to be R₃₄, and the resistance value of the resistance element 35 connected between the reference potential and the base of the transistor Q₂ of the variable capacity circuit 100 is supposed to be R₃₅. The rest of the composition is same as in FIG. 2. This embodiment is intended to obtain a large (infinite, theoretically) capacity on the basis of the following principle. Supposing the capacity values of two capacity elements to be -C A , C B , and the synthetic capacity value by connecting them in series to be C, the following relation is obtained. 1 jωC = - 1 jωCA + 1 jωC B = 1 jω C A . C B C A - C B Therefore, it follows that C = C A · C B C A - C B and when C A = C B , C is infinite. Generally, in a semiconductor integrated circuit, since the relative precision of elements is extremely high, when the circuit is designed so that, for example, C A = 1.01 C B , C is C = 1.01 C B ² 0.01 C B = 101 C B and a capacity value of over 100 times will be easily obtained. By the same principle, a negative capacity may be realized. Next, according to the composition in FIG. 11, its operation is explained below. Supposing the base AC voltage of the transistor Q₁ of the variable capacity circuit 100 to be V o , and the base AC voltage of the transistor Q₂ to be V b , they are V o =V i - jωC₁R₃₄ · R₃ 2 + R₃ 2 R₂ (V o - V b ) V b = jωC₁R₃₅ · R₃ 2 + R₃ 2 R₂ (V o - V b ) + jωC₂R₃₅ · R₃ 2 + R₃ 2 R₂ · V b Here, assuming the two variable capacity circuits 100, 101 to be symmetrical, and R₂ = R₃, from equations (45), (46), it follows that V b = jωC₁R₃₅ 1 + jω(C₁-C₂)R₃₅ V o Putting equation (47) into equation (45) yields V o = 1+jω(C₁-C₂)R₃₅ 1+jω(C₁-C₂)R₃₅-ω²C₁C₂R₃₄R₃₅ V i From equation (48), it is found that f o = 1 2Π C₁C₂R₃₄R₃₅ Q = 1 1 C₁C₂ · R₃₅ R₃₄ · (C₁ - C₂) Therefore, when C₁ = C₂, Q is infinite, and a secondary low pass filter with an extremely high selectivity will be realized. On the other hand, when the resistance value R₃₅ is an extremely large value, it results in V o = 1 R₃₅ + jω (C₁-C₂) 1 R₃₅ + jω(C₁-C₂) + (jω)²C₁C₂R₃₄ V i = 1 1 + jω C₁·C₂ C₁-C₂ R₃₄ V i Hence, when C₁ = C₂, a primary low pass filter having equivalently an extremly large capacity value C = C₁·C₂ C₁-C₂ may be realized. Along with the advancement in the degree of integration of semiconductor integrated circuit, it is demanded to incorporate external parts, in particular, capacity elements with large capacity into a semiconductor chip. Generally, in a semiconductor integrated circuit, the relative precision of elements such as capacities, resistance and transistors is extremely high, and therefore it is quite easy to set the capacity values C₁, C₂ of the two capacity elements 3 and 33 in FIG. 11 nearly equal to each other (for example, C₁ = 1.01 C₂). Therefore, hitherto, within the semiconductor chip, it was bound to realize a capacity value of only about 100 pF from economical point of view, while, by contrast, in the composition as shown in FIG. 11, an extremely large capacity value may be realized in a semiconductor integrated circuit.

Claims: A variable impedance circuit comprising: first and second differential amplifier circuits (1,2,8,9) each having a pair of input terminals and a pair of output terminals, each differential amplifier circuit consisting of a pair of active devices (Q1, Q2; Q3, Q4; 24, 25), wherein impedance elements (3, 4, 5, 7) are connected between said pairs of active devices, said active devices being transistors or operational amplifiers; means for connecting the input terminal pair of said first differential amplifier circuit (1, 8) to the output terminal pair of said second differential amplifier circuit (2, 9); and means for connecting the input terminal pair of said second differential amplifier circuit (2, 9) to the output terminal of said first differential amplifier circuit (1, 8); wherein the input terminals (A,A′) of the impedance circuit are connected between the input terminals to the active elements of said first differential amplifier circuit (1, 8); characterised in that the impedance elements are either: a capacitative element (3) in the first differential amplifier circuit (1, 8)) and a first resistive element (5) of selectable resistance R in the second differential amplifier circuit (2, 9); or a first resistive element (7) of selectable resistance R in the first differential amplifier circuit (1, 8) and a capacitative element (4) in the second differential amplifier circuit (2, 9); and characterised in that a second resistive element (6) of selectable resistance R3 is connected between the input terminals to the active elements of said second differential amplifier circuit (2, 9); whereby the impedance of said input terminals is capacitative and is defined by the ratio R3/R of resistance values of said first and second resistive elements. A variable impedance circuit according to claim 1 wherein said active devices of said first differential amplifier circuit are operational amplifiers. A variable impedance circuit according to claim 1 wherein said pairs of devices of said first and second differential amplifier circuits are pairs of transistors (Q1, Q2; Q3, Q4). A variable impedance circuit according to claim 3 wherein said impedance elements (3, 4, 5, 7) are connected between the emitters of said pairs of transistors (Q1, Q2; Q3, Q4). A variable impedance circuit according to any of the previous claims wherein a first constant current source for supplying selectable current I0 is connected between the pair of active devices of said second differential amplifier circuit. A variable circuit according to claim 5, wherein a current-current conversion circuit (20) is connected between the first and second differential amplifier circuits (1,2), said current-current conversion circuit comprising a third differential amplifier circuit consisting of a pair of transistors (Q5, Q6) and a second constant current source for supplying selectable current I2 connected to the common emitter of said pair of transistors (Q5, Q6) of said third differential amplifier circuit, the bases of the transistors of the third differential amplifier circuit being connected to the output terminal pair of the second differential amplifier circuit (2), and the collectors of the transistors of the third differential amplifier circuit being connected to the input terminal pair of the first differential amplifier circuit (1); whereby the impedance of the input terminal of the impedance circuit is defined by the ratio of resistance values (R3/R) of said first and second resistive elements and by the ratio of the current values (I2/IO) of said first and second constant current sources. A variable impedance arrangement comprising first and second variable impedance circuit (100, 101) each according to any of the preceding claims, further comprising means for connecting the input terminal of one of the active devices (Q1, Q2) of the first differential amplifier circuit (1) of said first variable impedance circuit (100) to the input terminal of one of the active devices (Q1, Q2) of the first differential amplifier circuit (1) of said second variable impedance circuit (101). A variable impedance circuit comprising: first and second differential amplifier circuits (1; 2, 22) each consisting of a pair of transistors (Q1, Q2; Q3, Q4) and having a pair of input terminals and a pair of output terminals; means for connecting the input terminal pair of said first differential amplifier circuit (1) to the output terminal pair of said second differential amplifier circuit (2, 22); and means for connecting the input terminal pair of said second differential amplifier circuit (2, 22) to the output terminal pair of said first differential amplifier (1); wherein the input terminals of the impedance circuit are connected between the base terminals of the transistors (Q1, Q2) of the first differential amplifier circuit; characterised in that said circuit further comprises an impedance element (3, 33; 26, 27) connected between the emitters of the transistors of said first differential amplifier circuit (1); a first constant current source (Io, Ix) for supplying a selectable current, connected between a common emitter for the transistors of said second differential amplifier circuit (2, 22) and a first voltage source (V1) a transistor (Q9, Q10) connected between each input terminal of said second differential amplifier circuit (2) and the first voltage source (V1), wherein a base bias is supplied to each of said transistors (Q9, Q10) from a second voltage source (V2, V3). A variable impedance circuit according to claim 8, wherein: said impedance element is a capacitative element (3); said first constant current source is adapted to supply selectable current Io to the common emitter of the transistors of said second differential amplifier circuit (22); and a second constant current source is adapted to supply selectable current I1 between the emitters of the transistors of said first differential amplifier circuit (1); whereby the impedance of said input terminal of the impedance circuit can be changed in proportion to the ratio of the current values Io and I1 of the first and second constant current sources. A variable impedance circuit according to claim 8, wherein: said impedance element is a resistive element (26, 27); said first constant current source is adapted to supply selectable current Ix to the common emitter of the transistors of said second differential amplifier circuit (2); and a second constant current source is adapted to supply selectable current Io between the emitters of the transistors of the first differential amplifiers circuit (1); whereby the impedance of the input terminal of the impedance circuit can be changed in proportion to the ratio of the current values Ix and Io of the first and second constant current sources.

Inventors: KOMORI HIROSHI, MORITA YOICHI, YOKOYAMA AKIO, KOMORI, HIROSHI, MORITA, YOICHI, YOKOYAMA, AKIO
Applicants: MATSUSHITA ELECTRIC IND CO LTD, MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Application year: 1989
Main classification: H03H11
IPC codes: H03H11