PATTERN CONFIGURATION MEASURING APPARATUS

Abstract: A pattern configuration measuring method of and apparatus for measuring a cross sectional profile of a pattern (10) formed on a flat plane with a concave or convex structure having a taper portion (10a, 10b) on both sides thereof, by scanning a beam in a predetermined direction with a scanning electron microscope (1), detecting a secondary electron to acquire an image signal of the pattern, and processing the image signal. The column (1a) of the scanning electron microscope is set at an optional inclination angle relative to the flat plane formed with the pattern, a beam is scanned onto the pattern with the scanning electron microscope in the direction perpendicular to the longitudinal direction of the concave or convex structure, an output signal is acquired from the scanning electron microscope and image-­ processed to detect both the taper portions of the pattern and calculate the dimension of the pattern, a beam is scanned onto the pattern with the scanning electron microscope in the direction parallel to the longitudinal direction of the concave or convex structure, and an output signal is acquired from the scanning electron microscope and image-processed to calculate the cross sectional profile of the pattern. The column of the scanning electron microscope may be set perpendicular to the flat plane, and the pattern to be measured is set at an optional inclination angle relative to the column axis of the scanning electron microscope.

Description: BACKGROUND OF THE INVENTION The present invention relates to a pattern configuration measuring apparatus for measuring a three dimensional configuration, of an LSI fine pattern, such as a pattern taper angle, film thickness (depth), cross sectional profile, pattern dimension and the like. As a technique for measuring a three dimensional configuration of a fine pattern by using a scanning electron microscope (hereinafter called a SEM), there is known a cross section observing method heretofore widely used whereby a specimen is cut away to observe its cross sectional profile. There is also known a system wherein images are taken with an SEM at different stage tilting angles, and manual matching of corresponding positions of the images is carried out for calculation of a three dimensional configuration (refer to Y. Kato et al.: "Stereoscopic Observation and Three Dimensional Measurement for Scanning Electron Microscopy" IITRI/SEM/1977, pp. 41 to 48, and Hama et al.: "Determination of Three dimensional Image Information Based on A Stereoscopic Photograph Taken with Ultra High Voltage Electron Microscope" Electron Microscopy, Vol. 20, No. 2, 1985, pp. 134 to 142). A similar technique is shown in US-A-4725730: the results of a scan in a particular direction while the beam or pattern are mounted at an angle, are fed to image processing means to calculate a profile. There is also reported a system wherein signals detected with two detectors disposed symmetrically relative to the center of a beam radiated position are processed and integrated for calculation of a three dimensional configuration (refer to T. Suganuma: "Measurement of Surface Topography Using SEM with Two Secondary Electron Detectors" J. Electron Microscopy., Vol. 34, No. 4, pp. 328 to 337, 1985). Although the cross section observing method is widely used, the specimen once cut-away cannot be used again. In addition, the pattern to be measured is limited to the cross sectional pattern at the cut-away plane. There is also associated with a problem that the cross sectional pattern of a fine hole having a diameter of, e.g., 2 microns or smaller, becomes difficult to have a correct image of an actual pattern unless the cut-away plane is made perpendicular to the substrate surface. The method whereby a stereoscopic configuration is calculated by obtaining corresponding points of images taken with an SEM at different stage tilting angles, has been widely used in the field of remote sensing. With this method, obtaining the corresponding points, i.e., manually performing a so-called pattern matching, takes a considerably long time. On the other hand, automatically performing the pattern matching may cause not negligible matching errors depending upon the configuration of a fine pattern, resulting in a large measurement error. For processing signals from two detectors disposed symmetrically relative to the center of a beam radiated position, it is necessary to balance beforehand the signals from both the detectors. In addition, it is necessary to vapor-deposit Au beforehand on a specimen because a high S/N ratio is required. Furthermore, if a pattern to be measured is isolated from other patterns, a stereoscopic configuration of a good nature can be obtained, however if adjacent patterns are spaced by 2 microns or less, the resultant stereoscopic configuration is influenced by the adjacent patterns and becomes different from an actual configuration. SUMMARY OF THE INVENTION The present invention has been made in consideration of the above problems. It is an object of the present invention to provide a pattern configuration measuring method and apparatus capable of measuring a pattern configuration correctly at high speed in a non-destructive and non-contact manner. In order to achieve the above object, the present invention provides: A pattern configuration measuring method comprising the steps of: setting a pattern to be measured at a predetermined position, said pattern being formed on a flat plane having a concave or convex structure with taper portions symmetrical to each other on both sides of said structure ; setting a scanning electron microscope so as to scan a beam onto said pattern in a predetermined direction and detect a secondary electron; setting the column of said scanning electron microscope at an optional inclination angle relative to said flat plane formed with said pattern; scanning a beam onto said pattern with said scanning electron microscope in the direction perpendicular to the longitudinal direction of said concave or convex structure; and acquiring a first output signal from said scanning electron microscope and processing said first output signal to detect both said taper portions of said pattern and calculate the distance between opposite sides of the bottom of said pattern; characterized by: scanning a beam onto said pattern with said scanning electron microscope in the direction parallel to the longitudinal direction of said a concave or convex structure; and acquiring a second output signal from said scanning electron microscope and processing said second output signal to calculate the cross sectional profile of said pattern. According to a further aspect of the invention, there is provided a pattern measuring apparatus for measuring a cross sectional profile of a pattern, comprising: a scanning electron microscope including a rotative stage for mounting said pattern to be measured, said pattern being formed on a flat plane having a concave or convex structure with taper portions symmetrical to each other on both sides of said structure, a column mountable on said stage at an optional inclination angle relative to said stage for scanning a beam on said pattern, and a detector for detecting a secondary electron emitted upon scanning a beam onto said pattern to form an output signal; image processing means for processing said output signal from said scanning electron microscope upon scanning a beam with said scanning electron microscope to obtain a processed signal; and means for calculating the distance between opposite sides of the bottom of said pattern in accordance with said processed signal from said image processing means in the case where the beam scan direction of said scanning electron microscope is perpendicular to the longitudinal direction of said pattern, characterized by: means for calculating the cross sectional profile of said pattern in accordance with said processed signal from said image processing means in the case where the beam scan direction of said scanning electron microscope is parallel to the longitudinal direction of said pattern. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic diagram showing an embodiment of a Pattern configuration measuring apparatus according to the present invention; Fig. 2 shows an example of observation of a pattern measured under the condition that the column inclination plane is made parallel with the taper portion of the pattern to be measured; Fig. 3 shows an example of observation of a pattern measured under the condition that the column inclination plane is made perpendicular to the taper portion of the pattern to be measured; Fig. 4 is a view used for explaining the principle of the pattern configuration measuring apparatus of this invention; Fig. 5 is a line profile obtained through the observation method shown in Fig. 2; Fig. 6 is a line profile obtained through the observation method shown in Fig. 3; Fig. 7 is a graph showing a pattern profile measured with the pattern configuration measuring apparatus of this invention; and Fig. 8 is a schematic diagram showing a part of another embodiment according to the present invention. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT An embodiment of the pattern configuration measuring apparatus of this invention is shown in Fig. 1. The embodimnent apparatus comprises a scanning electron microscope (SEM) 1, image processing means 2, computer 3, and display terminal 4. SEM 1 comprises a column 1a, deflector 1b, detector 1c, and stage 1d. Image processing means 2 has an image processing function as described, for example, in USSN 257,557 and EP No. 88117110.2, and the computer 3 has a pattern measuring function as described, for example, USSN 257,862 and EP No. 88117111.0. The structure and operation of the apparatus will be described next with reference to Figs. 2 and 7. First, the column 1a of SEM 1 is set at a preset inclination angle ϑ. The set value of inclination angle ϑ greatly influences the precision in obtaining fundamental parameters of a three dimensional configuration to be described later, so that the precision of 0.1 degree or more of the set value is required. Next, a specimen 10 is placed on the stage 1d, and the longitudinal direction of taper portions 10a and 10b of the pattern to be measured is made in parallel with the column inclination plane by rotating the stage 1d (refer to Fig. 2). In such a condition, the taper portions 10a and 10b on opposite sides of the pattern to be measured are observed as the same width as shown in Fig. 2. After setting a measuring magnification, deflection control signals for SEM 1 are sent from image processing means 2 to the deflector 1b to scan a beam. The deflection control signals include a Horizontal Scan (HS) signal, Vertical Scan (VS) signal, Horizontal Blank (HB) signal, Vertical Blank (VB) and control (CONT) signal. The scanned beam is bombarded upon the specimen placed on the stage so that secondary electrons are emitted therefrom. The secondary electrons are detected with the detector 1c and sent as a detection output (secondary electron signal) to image processing means 2 whereat the detection output is subjected to A/D conversion and stored in a frame memory having 256 gray levels. VS signal may use a constant value waveform or a saw-toothed waveform so that the line scan mode or area scan mode is selected. A line profile waveform obtained by scanning a beam is subjected to image processing such as smoothing. Thereafter, the number of pixels between opposite ends of the pattern bottom is obtained and the pattern dimension is calculated with the computer 3. Such a dimension calculating method may be carried out automatically by using a conventionally and widely used threshold method or linear approximation method. Next, while holding the specimen in position on the stage 1d, the stage 1d is rotated by 90 degrees from the previous set position. The direction of rotating the stage 1d may be optional. The column inclination angle is maintained the same as the previous one. Under such setting conditions, different from the previous observation, the taper portions 10a and 10b of the pattern 10 to be measured are observed to have different widths (refer to Fig. 3). The larger width is dependent on the pattern configuration of a concave or convex structure. After setting a measuring magnification, the deflection control signals for SEM 1 are sent from image processing means 2 to the deflector 1b to scan a beam onto the pattern 10 to be measured. Then, secondary electrons emitted from the pattern 10 to be measured are detected with the detector 1c, and sent to image processing means 2 as a detection output (secondary electron signal). In the former case (where the longitudinal direction of the taper portions of the pattern to be measured is in parallel with the column inclination plane), dimension measurement is achieved by obtaining a line profile in the beam scan direction. However, in the latter case (where the longitudinal direction of the taper portions is perpendicular to the column inclination plane), it is necessary to derive a line profile perpendicular to the beam scan direction so that area scanning is performed. The derived line profile perpendicular to the beam scan direction is subjected to image processing similar to the former case and thereafter, the widths P₁ and P₂ of the taper portions 10a and 10b are obtained. As seen from the relationship shown in Fig. 4, the taper angle Φ and film thickness (depth) h are given by: P₁ = ℓcos(Φ+ϑ) (1) P₂ = ℓcos(Φ-ϑ) (2) h = ℓsinΦ (3) where ℓ represents an actual width of the taper portion, and ϑ = the angle of incidence of the incident beam as shown in Fig. 4. From the equations (1) and (2), the following equation is derived: From the equations (1) and (3), the film thickness h is given by: The taper angle Φ is calculated from the equation (4) using the computer 3, whereas the film thickness (depth) h is calculated from the equation (5) using the calculated taper angle Φ. Since an input signal changes with the taper angle Φ, the cross sectional profile A(xi) of the taper portion is approximated by the following equation: where S(xi) means the returned signal strength. The line profile for the case where the column inclination plane is in parallel with the longitudinal direction of the taper portions 10a and 10b is shown in Fig. 5, whereas the line profile for the case where the column inclination plane is perpendicular to the longitudinal direction of the taper portions 10a and 10b is shown in Fig. 6. The pattern profile measured with the pattern configuration measuring apparatus of this embodiment is shown in Fig. 7. The measuring apparatus of this invention is realized on the assumption that the taper portions 10a and 10b on the opposite sides are symmetrical to each other. As described so far, according to the present embodiment, a pattern configuration can be measured correctly at high speed in a non-destructive and non-contact manner. In the above embodiment, the column 1a has been inclined relative to the stage. However, the invention is not limited thereto, and the specimen stage 1d may be inclined while the column 1a is set upright as conventional as shown in Fig. 8. Further, although the convex pattern has been described in the measurement, the invention is also applicable to a concave pattern. According to the present invention, a pattern configuration can be measured correctly at high speed in a non-destructive and non-contact manner.

Claims: A pattern configuration measuring method comprising the steps of: setting a pattern (10) to be measured at a predetermined position, said pattern being formed on a flat plane and having a concave or convex structure with taper portions symmetrical to each other on both sides of said structure; setting a scanning electron microscope (1) so as to scan a beam onto said pattern in a predetermined direction and detect a secondary electron; setting the column of said scanning electron microscope at an optional inclination angle (ϑ) relative to said flat plane formed with said pattern; scanning a beam onto said pattern with said scanning electron microscope in the direction perpendicular to the longitudinal direction of said concave or convex structure; and acquiring a first output signal from said scanning electron microscope and processing said first output signal to detect both said taper portions of said pattern and calculate the distance between opposite sides of the bottom of said pattern; characterized by: scanning a beam onto said pattern with said scanning electron microscope in the direction parallel to the longitudinal direction of said a concave or convex structure; and acquiring a second output signal from said scanning electron microscope and processing said second output signal to calculate the cross sectional profile of said pattern. A pattern configuration measuring method according to claim 1, wherein the column of said scanning electron microscope is set perpendicular to said flat plane, and said pattern to be measured is set at an optional inclination angle relative to the column axis of said scanning electron microscope. A pattern measuring apparatus for measuring a cross sectional profile of a pattern (10), comprising: a scanning electron microscope (1) including a rotative stage (1d) for mounting said pattern (10) to be measured, said pattern (10) being formed on a flat plane and having a concave or convex structure with taper portions (10a,10b) symmetrical to each other on both sides of said structure, a column (1a) mountable on said stage (1d) at an optional inclination angle relative to said stage (1d) for scanning a beam on said pattern (10), and a detector (1c) for detecting a secondary electron emitted upon scanning a beam onto said pattern (10) to form an output signal; image processing means (2) for processing said output signal from said scanning electron microscope (1) upon scanning a beam with said scanning electron microscope (1)to obtain a processed signal;and means (3) for calculating the distance between opposite sides of the bottom of said pattern (10) in accordance with said processed signal from said image processing means (2) in the case where the beam scan direction of said scanning electron microscope (1) is perpendicular to the longitudinal direction of said pattern (10), characterized by: means for calculating the cross sectional profile of said pattern (10) in accordance with said processed signal from said image processing means (2) in the case where the beam scan direction of said scanning electron microscope (1) is parallel to the longitudinal direction of said pattern (10). A pattern configuration measuring apparatus according to claim 3, wherein the column (1a) of said scanning electron microscope (1) is set perpendicular to said flat plane, and said pattern (10) to be measured is set at an optional inclination angle relative to the column axis of said scanning electron microscope (1).

Inventors: KOMATSU, FUMIO, MIYOSHI, MOTOSUKE
Applicants: KABUSHIKI KAISHA TOSHIBA
Application year: 1989
Main classification: G01B15
IPC codes: H01J37, G01B15