APPARATUS AND METHOD FOR MEASURING FREQUENCY RESPONSE FUNCTION

Abstract: A plurality of relatively prime excitation waveforms are generated and applied to an object (15) to be measured. Data of the excitation waveforms (X a , X b ) and a response waveform (X c ) from the object are extracted by one frame every n frames and subjected to Fourier transform, thereby computing an input mutual spectral matrix and an input-out­ put mutual spectral matrix. A frequency response function of the object is calculated from averaged spectral matrices obtained by adding and averaging corresponding elements of the corresponding spectral matrices a predetermined number of times. Readout start addresses for multiplex waveforms, each stored in one of a plurality of waveform memories (11, 16) and having continuity at both ends, are shifted rela­ tive to each other every n frames, thereby obtaining the plurality of relatively prime excitation waveforms.

Description: The present invention relates to a frequency response function measuring apparatus and a method for obtaining a frequency response function matrix of a multi-input and multi-output object by applying thereto waveforms from a plurality of waveform generators and multiplying its input-output cross-spectral matrix by an inverse matrix of its input cross-spectral matrix. Multi-point excitation is needed for measuring the frequency response function of a structure which cannot be sufficiently excited by one-point excitation, that is, an excitation applied as a vibrating force to a single point on an object. With one-point excitation, a modal parameter of the characteristic frequency varies with the point of excitation. With multi-point excitation, however, the modal parameter is less dispersive because the entire structure can be excited with a constant exciting force, and measured frequency response functions are less inconsistent among them because a plurality of frequency response functions are measured at the same time. An output spectrum S y (i) at a point i is expressed by a linear combination of a conditional frequency response function L(i, j) between each excitation point j and the output point i with an input spectrum S x (j) at the excitation point j, as follows: S y (i) = L(i, 1)S x (1) + L(i, 2)S x (2) + (1) Accordingly, a multi-input model is essentially a matrix and a frequency response function matrix (L) is a transformation of an input-output cross-spectral matrix [G yx ] from an input cross-spectral matrix [G xx ]; namely, [G yx ] = [L][G xx ] (2) A conditional frequency response function matrix to be obtained is given as follows: [L] = [G yx ][G xx ]⁻¹ (3) This equation holds irrespective of whether exciting forces are correlated to one another or not. The prior art employs, for the multi-point excitation, signals which are not correlated in their exciting force. In the case of using pure random signals for excitation, however, since a Fourier transformation is performed after multiplying the response waveform by a window function, a leakage error occurs, resulting in the gain being measured rather small for a resonant structure with a sharp frequency response function; therefore, the attenuation factor is overestimated. There has been proposed a burst random excitation method in which pure random waves are generated repeatedly in a burst-like manner for a period of time 1/2 to 2/3 of an analysis frame. With this method, in the case of a response with a small attenuation factor, it is necessary to multiply the response waveform by an attenuation term so that an attenuation occurs in the analysis frame, but this may sometimes affect the frequency resolution, the gain and an estimate of the phase of the conditional frequency response function. Conversely, in the case of a response with a large attenuation factor, a free response after the duration of the burst wave is observed in the analysis frame. This causes correlation among output signals or conditional output signals and decreases independent information of the input-output cross-spectral matrix [G yx ] of Eq. (2), introducing the possibility of making it impossible to measure the conditional frequency response function. EP-A-0 107 050 discloses a frequency response function measuring apparatus having a waveform memory in which samples of a composite waveform of a plurality of predetermined spectra are stored. An address counter is clocked by signals generated by an address signal generator which is synchronized with the clock signals of the data input of a FFT analyzer. The input of the address counter can be switched over to the output of a random pulse generator. The addresses are generated by the random pulse generator in case that a transfer function of a nonlinear device is to be analyzed. It is therefore the problem underlying the present invention to provide a frequency response function measuring apparatus and method which are excellent in accuracy of measurement, dynamic range and frequency resolution regardless of the excitation signal waveform used. This problem is solved by the features of claims 1 and 5, respectively. According to the present invention, a multiplex waveform which contains analyzing frequency components is prestored in each of a plurality of waveform generators. Each multiplex waveform has both ends continuous to each other. The multiplex waveforms are read out of these waveform generators and supplied to different points of an object to be measured. Address generating means for generating the waveforms from the waveform generators are driven so that their waveform readout start addresses are shifted (where n is an integer equal to or greater than 1, each frame being a group of generated samples of a predetermined analysis length) relative to each other every n frames. Respective elements of input-output cross-spectral matrices and input cross-spectral matrices obtained before and after the shifting of the readout start addresses are respectively averaged and the averaged elements are used to obtain a frequency response function matrix. It does not matter whether or not the generated waveforms are correlated to one another for the n frames. When it is found out, as a result of the averaging, that there is full coherence, i.e. a causal relationship between the input signals (the generated waveforms), measurement is impossible, but when the coherence function between the input signals is incomplete, that is, when the coherence function is not 1.0, the measurement is significant. In other words, if the coherence function is smaller than 1.0, the measured results are significant. The waveform generation is performed by reading out the waveforms from the one waveform generator in synchronism with a fixed clock and the waveforms from the other waveform generator in synchronism with a fixed clock, but after completion of the generation of the n frames the waveform generation is skipped by a programmed number of data, that is, a random time lag is provided equivalently, and then the next n frames are generated. This time lag is selected without any correlation with the sampling frame. In other words, relatively prime sequences can be produced by controlling the readout timing of the waveform generators or their readout addresses. The waveforms to be produced can be selected freely (which is impossible with the prior art). Even if identical signals are concurrently generated from a plurality of waveform generators, the conditional frequency response function can be measured by making provision so that they become relatively prime (that is, the coherence function is smaller than 1). Furthermore, the waveforms which contain analyzing frequency points over the entire measuring frequency band need not necessarily be prestored in the waveform generators, but it is also possible to write in different areas a plurality of narrow-band waveforms into which the measuring frequency band is split and measure the frequency response function by a relatively prime waveform sequence for each narrow band. Fig. 1 is a block diagram illustrating an embodiment of the frequency response function measuring method of the present invention; Fig. 2 is a block diagram showing a partly modified form of the embodiment depicted in Fig. 1; and Fig. 3 is a block diagram showing another partly modified form of the embodiment depicted in Fig. 1. Fig. 1 illustrates an embodiment of the present invention. A waveform generator 11 is a ROM or RAM, in which a waveform is stored and from which is read out by addresses from an address generator 12. The address of the address generator 12 is updated by a fixed clock. The data read out of the waveform generator 11 is latched in a data latch 13 by a clock, and the output from the data latch 13 is converted by a D/A converter 14 into an analog signal, which is provided to an object to be measured 15. A waveform generator 16 is also a ROM or RAM, which has stored therein a waveform cut out of a continuous waveform. This waveform may be identical with or different from the stored waveform of the waveform generator 11 but is a waveform cut out so that both ends of the waveform are continuous to each other. It is possible, in practice, to employ a multiplexed sine wave which is obtained by multiplexing a number of sine waves spaced a fixed frequency apart in the analyzing frequency range. An address generator 17 generates an address which is updated by a fixed clock, and the address is applied as a readout address to the waveform generator 16 via an adder 18. The data read out of the waveforn generator 16 is latched in a data latch 19 for each clock, and the output from the data latch 19 is converted by a D/A converter 21 into an analog signal, which is provided to the object 15. When the address generation from the address generator 17 has been performed for n frames, this is detected by an n-frame end detector 22 and, upon each detection, an offset pointer 23 is incremented by one. An offset memory 24 is read out in accordance with a value K indicated by the offset pointer 23, and the amount of offset is provided to the adder 18. Accordingly, the address which is applied to the waveform generator 16 is shifted by the amount of offset from the offset memory 24 every n frames. In this way, relatively prime waveform sequences are provided every n frames from the D/A converters 14 and 21. Input waveforms x a and x b to the object 15 and an output waveform x c therefrom aϑe converted by Fourier transform means 25 into signals in the frequency domain, that is, complex spectral signals S a , S b and S c , respectively. The conditional frequency response function matrix of Eq. (3) in the case of two-point excitation is expressed as follows: where an inverse matrix of the input cross-spectral matrix is expressed as follows: The conditional frequency response functions which are desired to be measured in practice are a matrix element L ac which is a conditional frequency response function between an excitation point a and a receiving point c and a matrix element L bc which is a conditional frequency response function between an excitation point b and the receiving point c. These matrix elements are given by the following equations, respectively: In the above, G ac.b and G aa.b indicate spectra obtained after eliminating the influence of excitation at the excitation point b from the input-output cross-spectrum G ac and the input cross-spectrum G aa , respectively. Similarly, G bc·a and G bb·a indicate spectra obtained after eliminating the influence of excitation at the excitation point a front the input-output cross-spectrum G bc and the input cross-spectrum G bb , respectively. The coherence function between the excitation waveforms x a and X b applied to the two excitation points a and b is given by the following equation: Further, matrix elements in Eq. (4) are given by the following equation: In the above, S a * and S b * are conjugate complex numbers of S a and S b . The respective matrix elements calculated by Eq. (9) are stored in an element memory 26. These matrix elements are calculated, by Eq. (9), from complex spectrum data S a , S b and S c obtained by fast Fourier transform of the input waveforms x a and x b and the output waveform x c of one frame each time the readout address for the waveform generator 16 is shifted (i.e. every n frames), and the corresponding matrix elements of the matrix thus obtained every n frames are sequentially added and averaged by averaging means 27 a predetermined number of times. The thus averaged matrix elements are used to compute the frequency response functions L ac and L bc of Eqs. (6) and (7) by computing means 28. In concrete terms, the waveform generator 11 successively outputs multiplex sine waves in a free running state and the waveform generator 16 generates multiplex sine waves while shifting the waveform readout address by the amount of offset K (where K is a random variable) every n frames. As mentioned above, according to the present invention, the spectral matrix every n frames is added and averaged at least twice. In the coherence function shown in Eq. (8), the matrix elements G aa and G bb are always positive real numbers as will be evident from Eq. (9). However, since the matrix element G ab is a complex number and since the waveform readout addresses for the waveform generator 16 are sequentially shifted every n frames (i.e. delayed), the phase angle of the matrix element G ab on complex plane coordinates is shifted. As a result of this, both the real and the imaginary part of the complex number G ab can take any positive and negative values. By adding and averaging such complex numbers every n frames, the absolute values of the real and imaginary parts of the averaged value G ab of the complex numbers G ab will both gradually decrease. Consequently, |G ab | > | G ab | always holds and this guarantees that the coherence function shown in Eq. (8) becomes smaller than 1, ensuring the existence of the inverse matrix of Eq. (5). For instance, when the addition and the averaging are not performed, the coherence function always becomes 1 and the inverse matrix of Eq. (5) is indefinite. Calculating the coherence function, by Eq. (8), from respective elements of the averaged spectral matrix in the case of sequentially delaying by the amount of offset K the waveforms which are generated every n successive frames, the coherence function presents a so-called "comb-type" characteristic which has certain periodicity on the frequency axis. The period of the comb teeth is 1/(an integer) times the following frequency: f c = P K where P is an analyzing frame period. If f c agrees with the frequency resolution of the signal processor, then the frequency at which the coherence function takes a value close to 1.0 will occur in the lower frequency band, making it impossible to measure the frequency response function at this frequency. Accordingly, it is practical to select the amount of offset K incoherent to the sampling frame so as not to limit the measuring frequency range. Figs. 2 and 3 illustrate partly modified forms of the embodiment depicted in Fig. 1. In the modified form of Fig. 2 the address generator 17 is omitted and the address generator 12 is used for both of the waveform generators 11 and 16. In Fig. 3, when the address generation from the address generator 12 has been performed for n frames, it is detected by the n-frame end detector 22 and, upon each detection, a start address pointer 31 is incremented by one. On the basis of the indicated value of the start address pointer 31 a start address memory 32 is read out and a start address A(j) thus read out is set in the address generator 17. The address generated from the address generator 17 is provided directly to the waveform generator 16. As described above, according to the present invention, the problems of restrictions regarding (1) the selection of a pattern and (2) the accuracy of measurement, the dynamic range and the frequency resolution in the conventional measuring method utilizing random patterns are radically removed by the method of generating relatively prime sequences. Accordingly, the present invention enlarges the range and field of application of the multi-point excitation. It will be apparent that many modifications and variations may be effected without departing from the scope of the novel concepts of the present invention.

Claims: A frequency response function measuring apparatus comprising: a) first address generating means (12) for repeatedly generating a sequence of addresses in synchronism with a clock (CK); b) first waveform generating means (11) which has written therein samples of a first multipiex waveform containing desired analyzing frequency components and having both ends continuous to each other and from which samples of the first multiplex waveform are read out by the addresses from the first address generating means (12) to generate a first excitation signal (Xa) to be applied to an object (15) to be measured; c) Fourier transform means (25), and d) computing means (28); characterized by e) second address generating means (17) for generating a sequence of addresses in synchronism with the clock (CK) while arbitrarily shifting them every fixed period; f) second waveform generating means (16) which has written therein samples of a second multiplex waveform, which contains desired analyzing frequency components and which has both ends continuous to each other and from which the second multiplex waveform is read out by the addresses from the second address generating means (17) to generate a second excitation signal (Xb) which is relatively prime with respect to the first excitation signal (Xa), the second excitation signal being applied to the multi-input and multi-output-object (15); g) said Fourier transform means (25) for extracting at least once a predetermined number of samples from each of the first and second excitation signals (Xa, Xb) and a response signal (Xc) from the object (15) every said fixed period and subjecting the extracted samples of the first and second excitation signals and the response signal to Fourier transform to thereby calculate an input cross-spectral matrix and an input-output cross-spectral matrix every said fixed period; h) averaging means (27) whereby corresponding elements of the corresponding spectral matrices are sequentially added and averaged a predetermined number of times to thereby obtain an averaged input cross-spectral matrix and an averaged input-output cross-spectral matrix; and i) said computing means (28) computing a desired frequency response function from desired elements of the averaged input cross-spectral matrix and the averaged input-output cross-spectral matrix calculated by the averaging means. The measuring apparatus of claim 1, wherein the second address generating means includes an address generator (17) for repeatedly generating a sequence of addresses in synchronism with the clock (CK), and offset address adding means (18) which, upon each generation of addresses for n frames each of a predetermined number of samples of the second multiplex waveform from the address generator, adds a different offset address to the sequence of addresses to generate addresses for reading out the second multiplex waveform. The measuring apparatus of claim 2, wherein the first address generating means (12) is used also as the address generator for the second address generating means. The measuring apparatus of claim 1, wherein the second address generating means includes start address generating means (31, 32) for generating a different start address upon each repeated generation of addresses for n frames each of a predetermined number of samples of the second multiplex waveform, and an address generator (17) which responds to the start address from the start address generating means to start the sequence of addresses at the start address. A frequency response function measuring method for obtaining a frequency response function matrix of a multi-input and multi-output object (15) by applying thereto stored waveforms from a plurality of waveform generators (11, 16) and multiplying its input-output cross-spectral matrix by an inverse matrix of its input cross-spectral matrix, comprising: a step where address generating means (12, 17) for generating addresses for reading out samples of the waveforms from the waveform generators (11, 16) are driven so that their waveform readout addresses are shifted relative to each other every n frames of addresses, where n is an integer equal to or greater than 1, each frame of addresses corresponding to a predetermined number of generated samples; a step where respective elements of input-output cross-spectral matrices and input cross-spectral matrices obtained before and after the shifting of the readout start addresses are respectively averaged; and a step where the averaged elements are used to obtain the frequency response function matrix.

Inventors: KASAHARA, TOSHIHARU, KOSAWA, HIROMI, YAMAGUCHI, TAKAHIRO
Applicants: ADVANTEST CORPORATION
Application year: 1988
Main classification: G01R23
IPC codes: G01H17, G01M7, G01R23, G01R27