IMPROVED MICROWAVE APPARATUS

Abstract: An apparatus (10) with gears (22a, 22b, 22c, 25) for adjusting the position of a plate (13) in a cavity (12) and a rack (51) and gear (53) for moving a probe (15) into and out of the cavity is described. The apparatus includes knobs (34, 55) for controlling the movement of plate and probe. Micrometers (37, 52) measure the precise position of the plate and probe in the cavity. The apparatus allows very precise tuning for selection of a mode of radiofre­ quency wave in the cavity and fine tuning within the mode.

Description: The present invention relates to a radio frequency wave generating apparatus including a metallic radio frequency wave cavity which is excited in one or more of its modes of resonance, in the cavity around a central axis of the cavity, including movable plate means in the cavity mounted perpendicular to the central axis in the cavity and movable along the central axis, movable probe means connected to and extending inside the cavity for coupling the radio frequency wave to the cavity, and control means for controlling the probe means and plate means in order to select and control the mode of the radio frequency wave in the cavity, which comprises: (a) guiding means movably mounting the plate means in the cavity of the apparatus and providing for precise positioning of the plate means along the central axis; (b) support means mounted on the apparatus adjacent an opening in the cavity; (c) sliding means mounting the probe means and mounted on a support means so as to linearly move into and out of the opening in the cavity along a longitudinal axis of the probe means, whereby the motive means moves the sliding means; and (d) motive means for moving the probe means and guiding means. Such an apparatus is known from US-A-4,507,588 which describes the creation of disc plasmas in a chamber wherein the mode and the tuning of the radio frequency wave in a cavity around the chamber is controlled by a movable probe and plate. US-A-2,543,809 discloses an ultra-high frequency electrical apparatus for coupling loops for transferring electromagnetic energy to and from activity resonators. This apparatus discloses a movable plate which is movable along the central axis of a cavity, whereby the position of the plate is measured by a micrometer-type barrel. US-A-2,311,520 describes an electron discharge device comprising an evacuated hollow body resonator which is preferably provided with two coupling means. The coupling means comprises a cup-shaped head with a micrometer-like scale provided at its outside. It is an object of the present invention to provide an improved wave generating apparatus which allows fine, repeatable tuning of the probe and the plate in the cavity so as to control the mode or tuning of the mode in a cavity. Furthermore, the present invention should provide an apparatus which is relatively simple and economical to construct and use. The object is solved by a radio frequency wave generating apparatus which further comprises: (a) first micrometer means mounted between the support means and the sliding means so as to measure the position of the probe means in the cavity; and (b) second micrometer means mounted between a portion of the apparatus and the plate means so as to measure the position of the plate means in the cavity; and whereby (c) the sliding means are provided with gearing means as a motive means for movement of the sliding means and probe means together into and out of the cavity; (d) the guiding means comprises multiple threaded rods mounted on the plate means parallel to and equally spaced from the central axis and projecting from the apparatus, outer gears with threaded openings mounted on each of the rods outside of the apparatus and a central gear on the central axis which rotates each of the outer gears to move the plate means along the central axis in the cavity and wherein the motive means engages the central gear to move the plate means; and (e) the motive means provides precise positioning of the probe means and plate means in the cavity as determined by the first and second micrometer means. The apparatus preferably includes magnets surrounding the chamber and mounted on the sliding short in order to confine the plasma in the chamber to the extent desired. This apparatus is described in U.S. Appl. Ser. No. 849,052, filed April 7, 1986. The apparatus can be used to practice the method of U.S. Application Serial No. 41,291, filed April 22, 1987. The patterns of heating of materials are determined as a function of time. Further, the changing dielectric constants as a function of the heating can be determined. IN THE DRAWINGS Figure 1 is a front partial sectional view of the preferred apparatus 10 of the present invention particularly showing a mechanism 20 for moving the plate 13 in the cavity 12 and a micrometer 37 for measuring changes of the position of the plate 13. Figure 2 is a plan view of the apparatus 10 of Figure 1 showing the mechanism 40 for moving the probe 15 in the cavity 12. Figure 3 is a front cross-sectional view of the apparatus of Figure 1 showing the mechanism 20. Figure 4 is a plan cross-sectional view of the mechanism 40 for moving the probe 15, particularly showing a micromoter 52 for measuring the changes of position of the probe 15 in the cavity 12. SPECIFIC DESCRIPTION Figures 1 to 3 show the preferred radiofrequency wave generating apparatus 10 of the present invention. Figure 4 shows a portion of the apparatus 10. A circularly cross-sectioned, electrically conductive housing 11 defines a cavity 12 around longitudinal axis a-a for the radiofrequency wave along with a moveable plate 13 and a fixed plate 14 which are also electrically conductive. Conductive fingers (preferably metallic) 13a and 14a engage an inside wall 11a of the housing 11. A probe 15 (Figure 4) is moveable into and out of the cavity 12 and couples the radiofrequency wave to the cavity 12. A conductive grid or screen 16 is mounted on fixed plate 14 and mounts the fingers 14a. The plate 14 can mount the fingers 14a (not shown). The fixed plate 14 has an opening 14a adjacent the cavity 12 and around the axis a-a to allow plasma formed in the cavity 12 to be removed. The cavity 12 could be closed. Preferably a non-conductive cup shaped member 17 (preferably quartz) sealingly covers the opening 14a of plate 14. A quartz tube for confining the plasma (not shown) can be inserted through the apparatus along axis a-a in place of cup shaped member 17. The apparatus can also be used for radiofrequency wave processing in chamber 12. The fixed plate 14 is secured to a vacuum source (not shown) by means of bolts 11f. The cup shaped member 17 and plate 14 define a plasma chamber 18 which is filled with a gas to create the plasma by a gas supply lines 19 and 19a. The basic system is described in U.S Patent Nos. 4,507,588; 4,585,668 and 4,630,566. The improvement in the present invention relates to the mechanisms 20 and 40 for moving the probe 15 and moveable plate 13 in the cavity 12. The mechanism 20 includes three externally threaded posts 21a, 21b and 21c attached to the plate 13 and mounted through a top portion 11b of the housing 11. As shown in Figure 3, planetary gears 22a, 22b and 22c are rotatably mounted on the top portion 11b of the housing 11 on internal cover 11c by means of support members 23a, 23b and 23c and screws 24. The support member 23a includes a bearing 23d and spindle 23d supporting gear 22a. Support members 23b and 23c are constructed in the same manner. Central gear 25 is rotatably mounted around the axis a-a on bracket 26 on top portion 11b by means of screws 27. Bracket 26 includes a bearing 26a and spindle 26b which mounts central gear 25 so as to engage each of the planetary gears 22a, 22b and 22c. A side gear 28 engages the central gear and is mounted on a shaft 29. The shaft 29 is mounted in a C-shaped member 30. First bevel gear 31 is mounted on shaft 29 and is engaged by second bevel gear 32 mounted on shaft 33 and rotatably supported at right angles to shaft 29 on C-shaped member 30. A rotatable knob 34 is secured to shaft 33 and includes indicia 35 (Figure 2) for determining increments of position of the knob 34 relative to the C-shaped member 30. Stop 36 is in threaded engagement with shaft 21a to prevent movement of the plate 13 beyond a particular point in the cavity 12. As can be seen from Figures 1 to 3, the plate 13 is moved along axis a-a by turning knob 34 which rotates shaft 33, first and second bevel gears 31 and 32, shaft 29 side gear 28, central gear 25 and then planetary gears 22a, 22b and 22c which move posts 21a, 21b and 21c vertically and plate 13. The knob 34 can be controlled manually or it can be controlled by a motor (not shown). The central gear 25 spindle 26b has an opening 26c along the axis a-a which can be used for inserting a quartz tube (not shown) for a confining plasma or an object to be treated with the radiofrequency waves in cavity 12. The top portions 11b and internal cover 11c have a central opening 11d and the plate 13 optionally has an internal opening 13c to provide access to cavity 12. A micrometer 37 with a fixed stem 32a is secured to top portion 11b and a moveable stem 37b engages the plate 14. Openings 11e are provided for sensors (not shown) to determine the electrical field strength within the cavity 12 at various positions and spacings from the axis a-a. As the plate 13 moves, the micrometer 37 measures the change in position. The mechanism 40 controls the probe 15. The probe 15 is mounted perpendicular to the axis a-a on axis b-b and is moveable into and out of the cavity 10. The probe 15 includes three (3) segments 15a, 15b and 15c which are secured together by threaded extensions 15d and 15e. Locating members 41 are mounted around the extensions 15d and 15e and mount the probe 15 inside a tube 42, thereby rigidly mounting the probe 15. The tube 42 has fingers 42a for electrical connection to a tubular receiver 43 for the tube 42 mounted on the housing 11 by means of block 44 so that the tube 43 slides into and out of the receiver 43. The tube 42 includes an electrical connector 45 with a projection 46 perpendicular to the axis b-b. Posts 47 and 48 are mounted parallel to the axis b-b. A holder 49 is mounted on the posts 47 and 48 and slideably supports the tube 42. A sleeve 50 mounts a rack 51 on the tube 42. The holder 49 supports a micrometer 52 with a fixed stem 52a and a moveable stem 52b which engages the projection 46. The position of the moveable stem 52b can be adjusted by means of adjuster 52c on support 52d of the micrometer 52. Gear 53 is mounted on shaft 54 (Figure 4) to engage the rack 50. The shaft 54 mounts a knob 55 which is used to rotate the gear 53 and thus move the probe 15 into and out of the cavity 12. In operation the knob 55 can be controlled manually or by a motor (not shown). Receiver 60 provides an additional post for another probe (not shown) or for changing the position of the probe 15. The receiver 60 is mounted on block 61. As can be seen from Figures 1 to 4, the control of the probe 15 and plate 13 is by means of knobs 34 and 55. The result is a very simple and precise means for making micrometer adjustments of the probe 15 and plate 13 in the cavity 12. This allows the selection of the mode of the radiofrequency wave as well as adjustments to provide fine tuning within a mode. Micrometers with a digital readout (not shown) can be used. Motors (not shown) can be used to move the plate 13 and probe 15. The result is a very useful and commercially acceptable microwave cavity. It is intended that the foregoing description be only illustrative of the present invention and that this invention be limited only by the hereinafter appended claims.

Claims: A radio frequency wave generating apparatus (10) including a metallic radio frequency wave cavity (12) which is excited in one or more of its modes of resonance in the cavity (12) around a central axis (a-a) of the cavity (12) including movable plate means (13) in the cavity (12) mounted perpendicular to the central axis (a-a) in the cavity (12) and movable along the central axis (a-a), movable probe means (15) connected to and extending inside the cavity (12) for coupling the radio frequency wave to the cavity (12) and control means for controlling the probe means (15) and plate means (13) in order to select and control the mode of the radio frequency wave in the cavity (12), the control means comprising: (a) guiding means (21,22,25) movably mounting the plate means (13) in the cavity (12) of the apparatus (10) and providing for precise positioning of the plate means (13) along the central axis (a-a); (b) support means (47,48) mounted on the apparatus (10) adjacent an opening in the cavity (12); (c) sliding means (41,42,43) mounting the probe means (15) and mounted on said support means for bringing about a linear movement; (d) first and second motive means for moving the probe means (15) and guiding means, characterized in that the control means further comprises: (e) first micrometer means (52) mounted between the support means and the sliding means so as to measure the position of the probe means (15) in the cavity (12); and (f) second micrometer means (37) mounted between a portion of the apparatus and the plate means (13) so as to measure the position of the plate means (13) in the cavity (12); and whereby (g) the sliding means (41,42,43) are provided with first gearing means (51,53) as a first motive means for movement of the sliding means and probe means (15) together into and out of the cavity (12); (h) the guiding means comprises multiple threaded rods (21a,21b,21c) mounted on the plate means (13) parallel to and equally spaced from the central axis (a-a) and projecting from the apparatus (10), second gear means (20) including outer gears (22a,22b,22c) with threaded openings mounted on each of the rods (21a,21b,21c) outside of the apparatus (10) and a central gear (25) on the central axis (a-a) which rotates each of the outer gears (22a,22b,22c) to move the plate means (13) along the central axis (a-a) in the cavity (12) and wherein the second motive means engages the central gear (25) to move the plate means (13); and (i) the first and second motive means provides precise positioning of the probe means (15) and plate means (13) in the cavity (12) as determined by the first and second micrometer means (37,52). The apparatus of claim 1 wherein the support means is two spaced apart posts (48,47) mounted on the apparatus (10) with the sliding means mounted between the posts (48,47) and a holder (49) mounted on the posts (48,47) with an opening for the sliding means and wherein the first micrometer means (52) is mounted on the holder (49) between the sliding means and the holder (49). The apparatus of claim 1 wherein the first micrometer means (52) includes a movable stem (52b) on the micrometer means (52) which engages a portion of the sliding means so that the change of position of the sliding means and probe means (15) in the opening in the support means is measured by a change of position of the stem (52b). The apparatus of claim 1 wherein the second micrometer means (37) is mounted on a portion of the apparatus (10) so that a movable stem (37b) of the micrometer means (37) engages the plate means (13) to thereby measure the change of position of the plate means (13) by a change of position of the movable stem (37b). The apparatus of claim 1 wherein the sliding means and guiding means are each controlled by a rotatable knob (55,34) as part of the motive means so that one knob (34) manually moves the plate means (13) and the other knob (55) manually moves the sliding means and probe means (15) together in the cavity. The apparatus of claim 5 wherein the knobs (34,55) rotate on a horizontal axis. The apparatus of claim 1 wherein the first and second micrometer means (52,37) have dial gauges which measure fine increments of change of position. The apparatus of claim 7 wherein in addition the second micrometer means (37) is provided with a linear scale measuring means for gross measurements of the position of the plate means (13) in the cavity (12). The apparatus of one of claims 2 to 8 wherein the sliding means are provided with: (a) spaced apart locating members (41) mounted along and around the longitudinal axis (B-B) of the probe means (15), (b) a tube (42) mounted on the locating members (41) along the longitudinal axis (b-b)so that the probe means (15) extends from one end of the tube (42), and (c) a tubular receiver (43) defining an opening into the cavity (12) wherein the tube (42) is slidably mounted in the opening with probe means (15) extending at the one end of the tube (42) into the cavity (12), and wherein the first motive means are provided with: (d) rack means (51) mounted on the tube (42) parallel to the longitudinal axis (b-b) of the probe means (15), and whereby (e) electrical connector means (45) mounted on the tube (42) at an end opposite the one end including a projection (46) away from the longitudinal axis (b-b) of the probe means (15), (f) the holder (49) mounted on the posts (48,47) with an opening slidably supporting the tube (42) between the posts (48,47) and positioning the tube (42) in the opening of the tubular receiver (43), (g) the movable stem (52b) of the first micrometer means (52) engages the projection (46) on the connector means (45), (h) the rotatable first gear means (53) is supported on the holder (49) and engages the rack means (51) to move the tube (42) and probe means (15) into and out of the cavity (12), and (i) the second micrometer means (37) measures the position of the plate means (13) along the central axis (A-A) in the cavity (12). The apparatus of claim 9 wherein said other knob (55) is mounted on the holder (49) and connected to the first gear means (53) and wherein said one knob (34) is mounted on the outside of the apparatus (10) and connected to the second gear means (20). The apparatus of claim 10 wherein said one knob (34) is connected by shafts (33) and angle gears (31,32) to the second gear means (20). The apparatus of claim 10 wherein said other knob (55) rotates on a rotatable shaft (54) mounted on the holder (49) which supports the first gear means (53) engaging the rack means (51). The apparatus of claim 9 wherein the opening in the holder (49) is spaced from the opening in the receiver means (43) along the longitudinal axis (B-B) of the probe (15).

Inventors: ASMUSSEN JES, ASMUSSEN, JES
Applicants: UNIV MICHIGAN STATE, MICHIGAN STATE UNIVERSITY
Application year: 1988
Main classification: H01P7
IPC codes: H01P7, H05H7