Metallized circuit substrate comprising nitride type ceramics

Abstract: Disclosed is: i) a ceramic substrate comprising: a nitride ceramic substrate (1); and a conductive metallized layer (2) mainly comprised of at least one of Mo and W, a group IVb active metal element and at least one metal selected from the group consisting of Co, Ni, Fe, Mn, Cr and V, formed on said substrate. ii) a ceramic substrate comprising: a nitride ceramic (1) substrate; an intermediate reactive layer mainly comprised of a compound containing a grain boundary constituent phase component of said ceramic substrate, and a compound of a group IVb active metal; and a conductive metallized layer (2) mainly comprised of at least one of molybdenum and tungsten, a nitride of a group IVb active metal and a composite compound comprising an oxide of a group IVb active metal and an oxide of Co, Ni, Fe, Mn, Cr or V, formed on said substrate with the interposition of said intermediate reactive layer. Disclosed is also a method for preparing these substrates and metallizing composition used therefor. According to this invention, a circuit substrate having a conductive metallized layer formed thereon with a high joint strength can be obtained.

Description: BACKGROUND OF THE INVENTION This invention relates to a ceramic substrate comprising nitride type ceramics, and it is concerned with an AlN substrate comprising a metallized conductive layer formed on its surface with a high joint strength. Ceramic substrates are widely used in circuit substrates, and recently used in circuit substrates for use in hybrid integrated circuits are substrates comprising a sintered body of nitride type ceramics, as exemplified by a sintered body of aluminum nitride (AlN), having a high thermal conductivity, an excellent heat dissipation property and an electric insulating property.. The nitride type ceramics are prepared generally in the following manner: A given amount of a sintering aid such as Y 2 O 3 , Sm 2 NO 3 and CaO is blended in nitride type ceramic powder with optionally further addition of an acrylic resin binder to thoroughly mix the whole, and the resulting mixture is, for example, pressure-molded to make a sintering precursor (a formed product) having a given shape, followed by sintering at a given temperature in, for example, a nitrogen atmosphere. Incidentally, in instances in which nitride type ceramic sintered sheets are used as substrates for semiconductors, it is necessary to form a conductive layer on the face on which a semiconductor is mounted. Hitherto, this layer comprises a metallized conductive layer of copper (Cu), gold (Au) or silver-palladium (Ag-Pd) formed on the surface of a nitride type ceramic sintered sheet by applying a DBC process (direct bond copper process) or a thick film process. However, this conventional substrate has the following problems. A first problem is that the joint strength between the above metallized layer thus formed and the surface of the nitride type ceramic sintered sheet is so low that a peeling phenomenon may often occur. A second problem is the problem that may be caused when a certain semiconductor device or wire is brazed on the metallized layer thus formed thereon. More specifically, in the instance of the brazing for example, it is carried out at a temperature of about 800 o C or so in a hydrogen-nitrogen mixed gas. Since, however, the temperature used at the time of the baking treatment for the above metallized layer is usually a lower temperature of about 600 to 1,000 o C, the joint strength between the metallized layer and the surface of the nitride type ceramic sintered sheet is extremely lowered at the time of this brazing to make it virtually impossible to carry out the brazing. A third problem is the problem based on the difference in thermal expansion coefficient between the nitride type ceramic sintered sheet and the metallized layer. More specifically, like the instances of the brazing and the high-temperature soldering, the substrate mounted with a semiconductor device such as a silicon wafer experiences a severe heat cycle of heating/cooling when used. As a result, thermal stresses based on the difference in thermal expansion coefficient between layers are produced at the respective joint areas between the nitride type ceramic sintered body/metallized layer/brazed layer (or soldered layer)/semiconductor device, causing the action of peeling them. In the case of the above metallized layer, the thermal expansion coefficient is greater as much as about 2 to 4 times than that value of the nitride type ceramic sintered sheet (thermal expansion coefficient: about 4.6 x 10 -6 / o C) and is of a value of about a half of the value equivalent to the brazed layer (or soldered layer), showing a great difference from that of the nitride type ceramics. Accordingly, at the time of the heat cycle, fine cracks are liable to be produced at the interface between the metallized layer or brazed layer and the nitride type ceramics. Such fine cracks may gradually grow with repetition of heat cycles, finally sometimes bringing about the peel of the mounted semiconductor device. Such problems are inconvenient as there may be lowered the reliability of an apparatus actually provided with the substrate mounted with a semiconductor device. A fourth problem is that the joint strength between the above metallized layer and the nitride type ceramic sintered sheet is so small as to make low the reliability, like the second problem, when used at high temperatures. For the reasons as above, it is recently practiced, in order to form the conductive layer, to form the metallized layer by coating on the surface of a ceramic substrate a paste chiefly comprised of molybdenum (Mo) or tungsten (W) and also titanium (Ti), zirconium (Zr) or hafnium (Hf) added thereto as an activation metal, followed by firing. In the resulting metallized layer, molybdenum and tungsten are thermoresistant metals that may not be oxidized by heat at the time of the firing, and titanium, zirconium and hafnium may act as the activation metal and adhere the thermoresistant metal on the surface of the ceramic substrate through the reaction with the ceramic. Accordingly, also in the circuit substrates employing the nitride type ceramic substrate, there has been taken a method in which a paste for the metallized layer, chiefly comprised of the above molybdenum or tungsten and also an oxide or nitride of titanium, zirconium or hafnium added thereto as an activation metal is coated, followed by firing and reduction to form a conductive layer, or a method in which this paste is coated on the ceramic substrate, followed by firing to adhere the metallized layer thereon by the action of the activation metal, or the like method. In the instance in which the metallized conductive layer comprises the above W layer, Mo layer or TiN layer, the above problems becomes less serious than the instance in which it comprises the Cu layer, Au layer or Ag-Pd layer previously mentioned, and it can be achieved to improve the joint strength to the nitride type ceramic sintered body and the reliability in a practical use. However, the problems as follows have arisen in the circuit substrate on which the metallized layer is formed like this by coating, on the surface of the ceramic substrate comprised of the nitride type ceramic sintered body, a paste chiefly comprised of molybdenum or tungsten and also titanium, zirconium or hafnium added thereto as an activation metal, followed by firing to form the metallized layer. That is to say, there may arise scattering in the joint strength of the metallized layer to the nitride type ceramic substrate, resulting in non-uniformity in the joint strength of the metallized layer. Also, the surface of the metallized layer is applied with plating in order to mount a semiconductor device on the metallized layer. In this occasion, however, it is sometimes impossible to surely form a coating on the surface of the metallized layer, because grain boundary phases of the AlN substrate exude to the surface of the metallized layer. Thus, an anxiety is accompanied when a semiconductor device is firmly fitted on the metallized layer. In addition, in the method employing the metallizing paste obtained by adding and mixing a nitride of the above activation metal in the high-melting metal such as Mo and W, no sufficient joint strength can be attained unless the firing temperature is raised to higher temperatures as much as 1,700 o C to 1,800 o C, so that warpage of the substrate may occur. Also, no metallized layer can be formed unless the activation metal is added in a large amount as much as 70 % by weight or more, and therefore, because the amount of the high-melting metal to be blended becomes small, the electric resistance becomes greater and moreover the difference in thermal expansion coefficient from that of the ceramic substrate becomes greater. Thus, there have been involved the problem that cracking is liable to occur by the application of cold and heat cycles. Another problem is also caused such that the scattering in the joint strength also occurs in regard to the AlN ceramic substrates of about 150 W/m·k having many grain boundary phases. In the method in which the metallizing paste employing the compound such as Mo and W, there have also been involved the problem that bleeding occurs at the time of the coating or firing to make it difficult to retain the shape of circuit patterns, or no sufficient surface properties. SUMMARY OF THE INVENTION It is the object of this invention to provide a surface conductive ceramic substrate having a metallized layer that can achieve small electric resistance, large joint strength and good pattern form retension even by firing at relatively low temperatures. The use of a metallizing composition for forming a metallized conductive layer on said substrate is also herein disclosed. In regard to a nitride type ceramic substrates wherein the metallized layer comprises a W, Mo or W-Mo layer, the present inventors made studies on the relationship between the state of the interface between the nitride type ceramic sintered sheet and the W, Mo or W-Mo layer, and the joint strength. As a result, they found the fact that a layer of compounds containing yttria (Y 2 O 3 ) and alumina (Al 2 O 3 ) was formed at the interface part and in the vicinity thereof in regard to the substrates having a high joint strength, and such compounds were not present in a concentrated form at this interface part and in the vicinity thereof on the contrary in regard to the substrates having a low joint strength. This phenomenon was also seen in the instances of the substrates wherein the metallized layer comprises a Mo layer or TiN layer. Based on these findings, the present inventors had an idea that the joint strength of the substrate could be improved if the compounds containing yttria and alumina are made present in a concentrated form to form a layer, at the present in in concentrated form to form a layer, at the interface between the nitride type ceramic substrate and the metallized layer and at the portion being from the interface to the metallized layer, and, having confirmed the correctness of that idea through an experimental route, developed a nitride type ceramic substrate comprising: a nitride type ceramic sintered sheet; a conductive metallized layer formed on said nitride type ceramic sintered sheet; and a layer of a compound containing yttria and alumina, present in the vicinity of the interface between said nitride type ceramic sintered sheet and said metallized layer. The present inventors further progressed their searches about the above nitride type ceramic substrate on the bases of the aspect that the object of the present invention is achieved by firmly joining a nitride type ceramic substrate and a metallized layer without making present the above compounds. A sintering to be carried out at high temperatures can not be said to be appropriate in an industrial viewpoint when taking account of the cost or the like. More specifically, following is the means that can achieve the object of this invention without using high temperatures and without using the above compounds containing yttrium and aluminum. The surface conductive ceramic substrate according to the present invention is characterized by comprising; a nitride type ceramic substrate; and a conductive metallized layer chiefly comprised of at least one of Mo and W, compound of a group IVA active metal element and at least one compound of an element or elements selected from Co, Ni, Fe, Mn, Cr and V formed on said substrate; and a second invention is characterized by comprising; a nitride type ceramic substrate; an intermediate reactive layer chiefly comprised of a compound containing a grain boundary constituent phase component of said ceramic substrate, and a compound of a group IVA active metal; and a conductive metallized layer chiefly comprised of at least one of Mo and W, a nitride of a group IVA active metal and a composite compound comprising an oxide of a group IVA active metal and an oxide of Co, Ni, Fe, Mn, Cr or V formed on said substrate with the interposition of said intermediate reactive layer. A method for preparing the surface conductive ceramic substrate of the present invention is characterized by comprising; coating on a nitride type ceramic substrate a paste containing a) a metallizing composition chiefly comprised of at least one of Mo and W, an oxide of a group IVA active metal and at least one selected from compounds of Co, Ni, Fe, Mn, Cr or V and b) a binder; followed by firing at 1,700°C or less in an inert atmosphere to form a conductive metallized layer on said substrate; alternatively it is characterized by comprising; coating on a nitride type ceramic substrate a liquid material containing a) a metallizing composition chiefly comprised of at least one of Mo and W, an oxide of a group IVA active metal, at least one selected from compounds of Co, Ni, Fe, Mn, Cr or V and a Ni or Ca compound, and b) a binder; carrying out firing at 1,700°C or less in an inert atmosphere to form a conductive metallized layer on said substrate. Further, in the metallizing composition for use in the nitride type ceramic substrate of this invention, a first invention is characterized by comprising from 26 to 90 % by weight of Mo or W, from 5 to 70 % by weight of an oxide of a group IVa active metal, and from 2 to 20 % by weight of at least one selected from compounds of Co, Ni, Fe, Mn, Cr and V; and a second invention thereof is characterized by comprising from 26 to 90 % by weight of Mo or W, from 5 to 70 % by weight of an oxide of a group IVa active metal and from 2 to 20 % by weight of at least one selected from compounds of Co, Ni, Fe, Mn, Cr and V and from 2 to 15 % by weight of a Ni or Ca compound. BRIEF DESCRIPTION OF THE DRAWING Fig. 1 is a graph showing a measurement result of a joining force of a metallized layer to a substrate. DESCRIPTION OF THE PREFERRED EMBODIMENTS The ceramic substrate of this invention will be described below. In the circuit substrate of this invention, preferred as the nitride type ceramic sintered sheet as exemplified by the AlN sintered sheet is a material having a thermal conductivity of 50 W/m·K or more. Such an AlN sintered sheet is prepared, for example, by mixing AlN powder having a given grain size, a sintering aid such as Y 2 O 3 , YF 3 , Sm 2 O 3 and CaCo 3 and a binder component of wax type or plastic type in a given weight ratio, forming the resulting mixture into a sheet at room temperature by pressure forming or by a doctor blade to make a formed body, and thereafter sintering the resulting formed body. At this time, the conditions such as the grain size of the AlN powder or sintering aid powder, mixing ratio of the both, forming pressure, sintering temperature and sintering time in the respective steps may be appropriately selected to determine the properties of the resulting AlN sintered sheet. Also, the conductive metallized layer formed on the surface of this AlN sintered sheet is a conductive layer containing at least one of W, Mo and a compound of a a group IVA element and at least one compound of an element or elements selected from Co, Ni, Fe, Mn, Cr and V. The nitride type ceramic substrate of this invention can be prepared in the following manner: First, prepared according to a conventional method is a nitride type ceramic sintered sheet having given properties, in particular, a thermal conductivity of 50 W/m·k or more. Next, on the surface of this nitride type ceramic sintered sheet, a paste containing the components for forming the intended metallized layer is coated. As the coating method, there may be applied known methods as exemplified by screen process printing, brushing, spin roller coating, etc. The paste is constituted of the components for forming the metallized layer and a medium for dispersing them. The medium to be used may include, for example, ethyl cellulose, nitrocellulose, and a mixture of these with turpineol, tetralin or butyl carbitol serving as a solvent. The dispersion amount of the above components in the medium may be appropriately determined according to the relation with the viscosity of the resulting paste. An excessively large amount of the former may result in a highly viscous paste, making difficult the uniform coating on the nitride type ceramic sintered sheet. In an instance adverse thereto, the paste may have so lower viscosity that the coated paste may flow down from the surface of the nitride type ceramic sintered sheet. In usual instances, the former may be dispersed in the latter so as to give 1.0 x 10 5 to 2.5 x 10 5 poise. After coating of the paste, the whole is heated to form the metallized layer. The nitride type ceramic substrate used in the present invention may include those comprising ceramic sintered bodies chiefly comprised of AlN, Si 3 N 4 or SiAlON, etc. In the present embodiment, the metallizing composition used for forming the conductive layer on the nitride type ceramic substrate is chiefly comprised of Mo and/or W, an oxide of a IVA group active metal and a compound of an element or elements selected from Co, Ni, Fe, Mn, Cr and V and optionally blended with a Ni or Ca compound as a fourth component. The respective components in this metallizing composition may preferably be blended so as to be in the blending proportion of from 26 to 90 % by weight for the high-melting metal, from 2 to 70 % by weight for the group IVA active metal, and from 2 to 20 % by weight for the compound of Co, Ni, Fe, Mn, Cr and V. In this metallizing composition, Mo and W are high-melting metals that may not be oxidized even at high temperatures and serve as a main conductive material in the conductive metallized layer. In particular, W has a thermal expansion coefficient more approximate to that of the nitride type ceramic substrate than Mo, also having good electrical conductivity and thermal conductivity, and therefore may preferably be used. The blending proportion of less than 26 % by weight for this high-melting metal may result in an increase in the electrical resistance of the conductive metallized layer, and that more than 90 % by weight may result in a lowering of the joining force to the ceramic substrate. The oxide of a group IVA active metal is a compound that can be activated at baking temperatures, reacts with the nitride type ceramic substrate serving as a mother material to turn into a nitride, contributes to the joining of the conductive metallized layer, and also serves as the constituent components of the intermediate reactive layer. The oxide of the group IVA active metal may include oxides of Ti, Zr or Hf, and particularly preferred is to use oxides of Ti such as TiO, TiO 2 , etc. The blending proportion less than 5 % by weight for this oxide of a group IVA active metal may result in a lowering of the joint strength or no sufficient lowered-temperature effect of the firing temperature, and that more than 70 % by weight may not only bring about any more effect than that but also may result in a lower blending proportion of the high-melting metal to increase the electrical resistance of the conductive metallized layer. Moreover, a sintering property of this substance is not enhanced, the strength inside of the metallized layer is whereby decreased. The compound of Co, Ni, Fe, Mn, Cr or V is a compound that reacts with the oxide of a group IVa active metal to form a composite compound, which composite compound forms a liquid phase at a relatively low temperature of from about 1,300°C to about 1,450°C, thus contributing to the lowered temperatures of the firing temperature. The above compound may include oxides or chlorides of Co, Ni, Fe, Mn, Cr, V or Sc, and particularly preferred is to use oxides of Co such as CO 2 O 3 . The blending proportion less than 2 % by weight for this compound may result in no sufficient lowered-temperature effect of the firing temperature, and that more than 20 % by weight may result in a lower blending proportion of the high-melting metal like the oxide of a group IVA active metal, thus making it difficult to attain a sufficient conductivity of the metallized layer. In the metallizing composition of this invention, it is possible to blend, in addition to the above respective components, a Ni compound or a Ca compound such as CaO and CaCO 3 , for the purpose of improving the sinterability of the high-melting metal and improving the wettability with carbonates. When Ni is employed, it is preferable to use metallic powder thereof. This fourth component also has the effect of preventing agglomeration of the metallizing composition at the time of the firing, whereby there can also obtain the advantage that the strict controlling of the firing atmosphere may become less necessary. This Ni or Ca compound may preferably be blended in an amount of from 2 to 15 % by weight. The amount less than 2 % by weight may make it difficult to sufficiently obtain the above effect, and that more than 15 % by weight may bring about no more effect than that. To describe below the method for preparing the surface conductive ceramic substrate of this invention, the metallizing composition comprising the above components is first mixed optionally together with a dispersing medium to prepare a metallizing paste with a desired viscosity. This metallizing paste is then coated on the surface of the nitride type ceramic substrate to give a form of desired pattern by, for example, screen process printing, and, after dried, heated to a temperature of 1,700 o C or less, preferably 1,600 o C or less, more preferably from 1,450 to 1,550 o C, in an inert atmosphere such as nitrogen gas to effect the firing, thus forming a conductive metallized layer. In regard to the firing temperature in this invention, it becomes possible to form the metallized layer of strong joining force even by use of the relatively low temperature of 1,600 o C or less, by virtue of the action attributable to the oxide of a group IVA active metal and the oxide of Co, Ni, Fe, Mn, Cr or V contained in the metallizing composition. More specifically, considering an instance in which an AlN substrate employing Y 2 O 3 as a sintering aid is used as the ceramic substrate, an oxide of Ti as the oxide of a group IVA active metal, and an oxide of Co , the oxide of Ti reacts with the oxide of Co at the stage of firing the metallizing paste, to produce a composite compound as exemplified by xCoO·yTiO (for example, 2CoOTiO, CoO·TiO, etc.) or the like. Such a composite compound has so a low-melting point that it forms a liquid phase in the course of the firing to promote the diffusion of the metallized layer side to the grain boundary phase components of AlN, whereby the intermediate reactive layer is formed. This intermediate reactive layer is a layer formed by solidification of the liquid phase that is formed by a compound of Ti such as TiN formed by the reaction of a part of the oxide of Ti with nitrogen of AlN at the time of firing and a compound such as YAG, YAM or YAL produced by the reaction of Y 2 O 3 which is the grain boundary constituent phase component with Al 2 O 3 formed simultaneously with the formation of TiN. Thus, because of the formation of the liquid phase between the metallized layer and the ceramic substrate at the time of firing, an excellent joining force can be attained even at the relatively low temperature of 1,700°C or less. At the same time, the respective components forming this intermediate reactive layer little penetrate into the metallized layer under the firing temperature of this invention, and form the intermediate reactive layer at the interface between the metallized layer and ceramic substrate, so that there is also no possibility of the electric resistance being lowered. Also, as previously mentioned, the liquid phase formed by the composite compound of the oxide of Ti and oxide of Co promotes the diffusion of the grain boundary phase components of AlN to the metallized layer side, so that the firm joining is made possible even on a ceramic substrate containing less grain boundary phases, in other words, a ceramic substrate having a high purity and high thermal conductivity. Moreover, the oxide of Ti, which reacts with AlN to form a nitride of Ti, also contributes to the joining of the metallized layer and to the suppression of a shrinkage of Mo. The surface conductive ceramic substrate is obtained in this manner, thereby obtaining the surface conductive ceramic substrate in which, although there are contained the nitride of a group IVA active metal and the composite compound of the oxide of a group IVA active metal and the compound of a fourth period transition metal, the conductive metallized layer rich in W or Mo content is firmaly joined to the nitride type ceramic substrate through the intermediate reactive layer. In the present invention since the oxide of a IVA active metal and the compound of a fourth period transition metal except for Ti are blended in the metallizing composition, these produce the low-melting composite compound, and this forms the liquid phase, making it possible to form the metallized layer on the ceramic substrate at lower temperatures, and also making it possible to far more increase the blending amount for W or Mo as compared with conventional cases. The liquid phase formed by this composite compound also promotes the diffusion of the metallized layer side to the grain boundary phase components of the nitride type ceramic substrate, so that the intermediate reactive layer playing a role as an adhesive for the ceramic substrate and metallized layer can be sufficiently formed even on the ceramic substrate containing less grain boundary phases, in other words, the ceramic substrate having a high purity and high thermal conductivity, thus providing the surface conductive ceramic substrate having a superior joint strength between the ceramic substrate and metallized layer. Further, the grain boundary phase components diffused into the metallized layer side from the nitride type ceramic substrate become substantially components constituting the intermediate reactive layer and hardly exude to the surface of the matallized layer to make the formation of the plating layer easy. Example 1 First, Co 2 O 3 powder was added to a mixed powder of Mo and TiO 2 to form a paste. In this instance, the mixing ratio in the mixed powder of Mo and TiO 2 and the ratio of Co 2 O 3 powder to this mixed powder were varied as shown below to prepare three kinds of pastes having different compositional ratios. The compositional ratios are as follows: (Mo : TiO 2 ) : Co 2 O 3 = (75 : 25) : 5, (90 : 10) : 5, and (95 : 5) : 5. Then, the prepared pastes were coated with a thickness of about 10 um each on the aluminum nitride substrates. Subsequently, the pastes coated on the aluminum nitride substrates were fired. Here, the firing was carried out at firing temperatures varied to 1,700 o C, 1,650 o C, 1,600 o C, 1,550 o C and 1,500 o C, respectively. The firing atmosphere was N 2 gas. In the circuit substrates thus prepared, tests were carried out to measure the joint strength of metallized layers formed on the aluminum nitride substrates. The test method is a method in which a Ni coating is formed by plating with a thickness of from 5 to 7 µm on the surface of the metallized layer, a pin made of a solder plated soft copper wire of 60 mm in length and 0.8 mm in diameter was soldered on this Ni coating, and a pulling force measured when a pulling force is applied to this pin until the pin is taken off is regarded as the joint strength. As a result, the joint strength of the metallized layer of each circuit substrate was found to be 3.8 to 4.8 kgf/mm 2 in regard to the samples fired at temperatures of 1,550 o C and 1,500 o C. Also, there was seen no scattering in the joint strength of the metallized layer for each circuit substrate. Example 2 First, Co 2 O 3 powder was added to a mixed powder of Mo and TiO 2 to form a paste. In this instance, the mixing ratio in the mixed powder of Mo and TiO 2 and the ratio of Co 2 O 3 powder to this mixed powder were varied as shown below to prepare three kinds of pastes having different compositional ratios. The compositional ratios are as follows: (Mo : TiO 2 ) : Co 2 O 3 = (75 : 25) : 5, (90 : 10) : 5, and (95 : 5) : 5. Also prepared were aluminum nitride substrates with use of a powder comprising aluminum nitride powder and 3 % in weight ratio, of Y 2 O 3 added thereto. Then, the prepared pastes were coated with a thickness of about 10 µm each on the aluminum nitride substrates. Subsequently, the pastes coated on the aluminum nitride substrates were fired. Here, the firing was carried out at firing temperatures varied to 1,700°C, 1,650°C, 1,600°C, 1,550°C and 1,500°C, respectively. The firing atmosphere was N 2 gas. In the circuit substrates thus prepared, tests were carried out to measure the joint strength of metallized layers formed on the aluminum nitride substrates. The test method is a method in which a Ni coating is formed by plating with a thickness of from 5 to 7 µm on the surface of the metallized layer, a pin made of a solder plated soft copper wire of 60 mm in length and 0.8 mm in diameter was soldered on this Ni coating, and a pulling force measured when a pulling force is applied to this pin until the pin is taken off is regarded as the joint strength. As a result, the joint strength of the metallized layer of each circuit substrate was found to be 4 to 5 kgf/mm 2 in regard to the samples fired at temperatures of 1,550°C and 1,500°C. Also, there was seen no scattering in the joint strength of the metallized layer for each circuit substrate. AlN substrates showing particularly high joint strength were subjected to EPMA line analysis in the vicinity of the interface of the metallized layer and AlN sintered sheet of the AlN substrates. As a result, there were observed presence of a compound of yttrium and aluminum. Comparative Example 1 On the surface of an aluminum nitride substrate prepared under the same conditions as in Example 5, a paste comprising Mo : TiO 2 = 1 : 1 was coated with a thickness of 10 µm, followed by firing to form a metallized layer. The joint strength of the metallized layer was measured to find that the strength was low at every portion in the range of from 0.5 to 1.5 kgf/mm 2 . Example 3 First, using a mixed powder comprising AlN powder and 3 % by weight of Y 2 O 3 added thereto as a sintering aid, prepared were AlN ceramic substrate A having a thickness of 0.4 mm and a thermal conductivity of 200 W/m·k and AlN ceramic substrate B having a thickness of 0.5 mm and a thermal conductivity of 260 W/m·k. On the other hand, using Mo powder, TiO 2 powder and Co 2 O 3 powder, these were mixed so as to comprise 81.8 % by weight of Mo, 9.1 % by weight of TiO 2 and 9.1 % by weight of Co 2 O 3 to prepare a metallizing composition having an average grain size of 0.8 µm. Thereafter, an organic binder and a dispersing medium were added to this metallizing composition, followed by thorough mixing to prepare metallizing paste a . Next, this metallizing paste a was coated on the above ceramic substrates A and B, respectively, by 0,044 mm (#325 mesh) screen process coating in a prescribed pattern form so as to have a thickness of 20 µm after dried, and, after dried, heated and fired for 180 minutes at 1,500°C in respect of ceramic substrate A and 1550°C in respect of ceramic substrate B in a nitrogen gas atmosphere, thus preparing ceramic substrates having conductive metallized layers. In respect of the ceramic substrates thus obtained, analyses by EDX (energy disperse type X-ray microanalyzer) and SEM (scanning electron microscope) was carried out to find that there were observed at a depth of 10 to 12 µm from the surface a metallized layer chiefly comprised of Mo and containing a trace amount of TiN and compounds of TiO with CoO, and, at the interface between this metallized layer and ceramic substrate, an intermediate reactive layer containing compounds of Al with Y and TiN. The joint strength of the metallized layers thus obtained was also found to be as high as 4 to 5 kgf/mm 2 and 2.5 to 3 kgf/mm 2 each, when a soft copper wire of 1.0 mm in diameter was joined to a pad of 4 mm 2 by soldering with a tin-lead alloy and pulled. The resistivity of of these metallized layers was also found to be as good as 102 mΩ/□ and 105 mΩ/□ each. On the other hand, for comparison with this invention, the ceramic substrates A and B used in Examples 2 were coated with a metallizing paste obtained by mixing Mo powder and TiN powder in the compositional ratio of 1 : 2 (weight ratio) and adding a binder (Comparative Example 2) and a metallizing paste obtained by mixing Mo powder and TiO 2 powder in the compositional ratio of 68 : 32 (weight ratio) and adding a binder (Comparative Example 3), respectively, and these were fired at temperatures raised up to 1,700°C. However, the joint strength of any metallized layers were found to be as small as 0.8 kgf/mm 2 . The electrical resistivity was also found to be about 200 Ω·cm. Examples 4 to 23 Prepared were metallizing compositions with the blending proportions as shown in Table 1, followed by the same procedures as in Example 3 to prepare metallizing pastes. Next, using these metallizing pastes, they were coated in the same manner as in Example 3 on the ceramic substrates A and B used in Example 3, followed by heating at firing temperatures as shown in Table 2 to form metallized layers. The joint strength of the resulting metallized layers was shown to be of great value in every case as shown in Table 2. There was also seen excellent electrical resistance. In regard to the ceramic substrates having the metallized layers according to Examples 16 to 19, 1,000 heat cycle tests were also carried out taking temperatures of from -55 o C to room temperature to 150 o C as one cycle, and thereafter the joint strength was similarly measured to find that there was seen little lowering of the joint strength as shown in Table 2. Metallizing composition; blending ratio (wt.%) Mo W TiO TiO 2 Co 2 O 3 Ni CaF 2 CaCO 3 a 81.8 - - 9.1 9.1 - - - b 68.2 - - 22.7 9.1 - - - c 87.4 - - 9.7 2.9 - - - d 87.8 - - 9.3 2.9 - - - e 72.8 - - 9.3 2.9 - - - f 80.0 - 9.0 - 4.0 7.0 - - g 80.0 - - 9.0 4.0 7.0 - - h - 80.0 9.0 - 4.0 7.0 - - i - 80.0 - 9.0 4.0 7.0 - - j 80.0 - 10.0 - 5.0 - - 5.0 k 80.0 - - 10.0 5.0 - - 5.0 l - 80.0 10.0 - 5.0 - - 5.0 m - 80.0 - 10.0 5.0 - - 5.0 n 90.0 - - 6.0 2.0 - - 2.0 o 90.0 - 6.0 - 2.0 - - 2.0 p 90.0 - - 6.0 2.0 - 2.0 - q 90.0 - 6.0 - 2.0 - 2.0 - r 90.0 - - 6.0 2.0 - - 2.0 s 90.0 - 6.0 - 2.0 - - 2.0 t 90.0 - - 6.0 2.0 - 2.0 - u 90.0 - 6.0 - 2.0 - 2.0 - v 80.0 - - 10.0 5.0 - - 5.0 w 80.0 - 10.0 - 5.0 - - 5.0 x 80.0 - - 9.0 4.0 7.0 - - Example 24 Metallizing pastes having the following compositions were prepared. Mo TiO 2 Mn 3 O 4 Ni MTM - 1 80 13 7 - MTM - 2 80 17 3 - MNTH - 1 80 7 7 6 These pastes were coated on the circuit substrates respectively, followed by firing at temperarures of 1,400, 1,450, 1,500, 1,550 and 1,600, respectively. In regard to the circuit substrates having metallized layer were subjected to the joint strength test. The results are shown in a graph of Fig. 1. In the figure, a solid line denotes the metallized layer of the composition of MTM - 1, an alternate long and short dash line MTM - 2, a broken line MNTM - 1. Also, in this figure, * represents that deconstruction of a substrate occured. Also, deconstruction mode represented by o, □ and Δ show the condition of the deconstruction as a result of the joint strength test as follows. o ... deconstruction in an interface between the metallized layer and the ceramic. □ ... deconstruction in the ceramic. Δ ... peeling occurs between the metallized layer and the Ni plating. According to present invention, the joint strength of the conductive metallized layer can be great and also free of scattering, and moreover it is possible to increase the high-melting metal to about 90 % by weight of the metallized layer. Thus, the electrical properties are greatly improved, and further the difference in thermal expansion coefficient between the ceramic substrate and metallized layer is made small to lower the residual stress, so that there can be provide surface conductive ceramic substrates improved in the reliability. It also becomes possible to form the metallized layer with use of sintering temperatures far lower than the conventional cases, and therefore there can be also obtained the advantages that the warpage of the substrate can be prevented, the production cost can be reduced, and the production processes can be made continuous. It further becomes possible to form the conductive metallized layer with a sufficient strength even in the high purity ceramic substrate containing less grain boundary phase components, in other words, the ceramic substrate having a high thermal conductivity, so that it becomes possible to mount chips of large output on a module of small size.

Claims: A ceramic substrate comprising: a nitride ceramic substrate; and a conductive metallized layer mainly comprised of Mo and/or W, a compound of a group IVA element and at least one compound of an element or elements selected from Co, Ni, Fe, Mn, Cr and V, formed on said substrate. A ceramic substrate comprising: a nitride ceramic substrate; an intermediate reactive layer mainly comprised of a compound containing a grain boundary constituent phase component of said ceramic substrate, and a compound of a group IVA element; and a conductive metallized layer mainly comprised of molybdenum and/or tungsten, a nitride of a group IVA element A and a composite compound comprising an oxide of a group IVA element and an oxide of Co, Ni, Fe, Mn, Cr or V, formed on said substrate with the interposition of said intermediate reactive layer. A ceramic substrate according to claim 2, wherein said conductive metallized layer further comprises a nickel compound and/or a calcium compound. A ceramic substrate according to claim 2, wherein the group IVA element is titanium. A ceramic substrate according to claim 2, wherein said composite compound comprises an oxide of a group IVA element and an oxide of cobalt. A ceramic substrate according to claim 2, wherein the nitride ceramic substrate comprises an aluminium nitride ceramic substrate. The use of a metallizing composition for forming a metallized conductive layer on a nitride ceramic comprising (i) from 26 to 90% by weight of molybdenum and/or tungsten, (ii) from 5 to 70% by weight of an oxide of a group IVA element, and (iii) from 2 to 20% by weight of at least one compound of an element selected from Co, Ni, Fe, Mn, Cr and V. The use of a metallizing composition according to claim 7, wherein the metallizing composition further comprises from 2 to 15% by weight of a nickel or calcium compound. The use of a metallizing composition according to claim 7, wherein said group IVA element is titanium. The use of a metallizing composition according to claim 7, wherein the compound (iii) is a cobalt compound. The use of a metallizing composition according to claim 7, wherein said nitride ceramic is a nitride ceramic substrate.

Inventors: ANZAI KAZUNO, ASAI HIRONORI, HATANO TSUYOSHI, MIZUNOYA NOBUYUKI, SATO HIDEKI, ANZAI, KAZUNO, ASAI, HIRONORI, HATANO, TSUYOSHI, MIZUNOYA, NOBUYUKI, SATO, HIDEKI
Applicants: TOSHIBA KK, KABUSHIKI KAISHA TOSHIBA
Application year: 1988
Main classification: C04B41
IPC codes: H01L23, H05K1, C04B41, H05K3