Schmitt integrated circuit with selectable thresholds.

Abstract: A Schmitt circuit for semiconductor integrated circuit has resistances of predetermined resistors of the Schmitt circuit respectively selected from a plurality of resistances so as to obtain desired threshold voltages by selecting electrodes to which wiring is to connect when producing the semiconduc­ tor integrated circuit according to the master slice method, so that Schmitt circuits having different threshold voltages can be produced depending on the selection of the electrodes to which the wiring is to connect.

Description: The present invention generally relates to Schmitt circuits for semiconductor integrated circuits, and more particularly to a Schmitt circuit for a semiconductor integrated circuit in which threshold voltages of the Schmitt circuit are set arbitrarily when producing the semiconductor integrated circuit by the master slice method. A Schmitt circuit is used for various purposes such as for comparing amplitudes of signals and for converting a sinusoidal wave into a rectangular wave. An example of a Schmitt circuit is a bistable multivibrator comprising first and second Schottky clamped transistors and resistors, where a collector of the first transistor is coupled to a base of the second transistor and an emitter of the first transistor is coupled to an emitter of the second transistor. An input voltage to the Schmitt circuit is applied to a base of the first transistor, and an output signal of the Schmitt circuit is obtained from a collector of the second transistor. Usually, a third PNP transistor is provided as an input buffer, and the input voltage to the Schmitt circuit is supplied to the base of the first transistor via the third transistor. A first resistor is coupled between a power source terminal supplied with a power source voltage and a connection between an emitter of the third transistor and the base of the first transistor, and a collector of the third transistor is grounded. A second resistor is coupled between the power source terminal and the connection between the collector of the first transistor and the base of the second transistor. A third resistor is coupled between the power source terminal and the collector of the second transistor, and a fourth resistor is coupled between ground and the connection between the emitters of the first and second transistors. A pair of threshold voltages of the Schmitt circuit can be varied by varying the resistances of the first through fourth resistors. Conventionally, when providing a Schmitt circuit on a semiconductor integrated circuit such as a large scale integrated circuit (LSI), appropriate resistances for the first through fourth resistors are calculated beforehand when designing the Schmitt circuit having a desired pair of threshold voltages. For this reason, the resistances for the first through fourth resistors must be calculated for each different pair of threshold voltages. Hence, there are problems in that the pair of threshold voltages of one Schmitt circuit for the semiconductor integrated circuit are fixed, and Schmitt circuits having different pairs of threshold voltages must be designed independently according to the needs. As a result, the production cost of the conventional Schmitt circuit for the semiconductor integrated circuit is high. US-A-4 549 131 discloses an integrated semiconductor device with resistor elements formed by a gate array system. Wiring cells are formed, each with p-type impurity diffusion layers as resistive conductors. Each wiring cell has electrodes connected to its resistive conductors. By connecting to different electrodes of wiring cells, resistor elements of different resistance values can be formed. According to the present invention there is provided a Schmitt circuit for a semiconductor integrated circuit comprising: an input terminal for receiving an input voltage; a power source terminal for receiving a power source voltage; a first transistor having a base coupled to the input terminal and a collector coupled to ground; a second transistor having a base coupled to an emitter of said first transistor; a third transistor having a base coupled to a collector of said second transistor; an output terminal coupled to a collector of said third transistor; a first resistor coupled between the power source terminal and the emitter of said first transistor; a second resistor having terminals connected respectively to the power source terminal and to the collector of said second transistor; a third resistor having terminals connected respectively to the power source terminal and to the collector of said third transistor; a fourth resistor coupled between the ground and emitters of said second and third transistors; and wiring means connecting the respective terminals of said second resistor to the power source terminal and to the collector of said second transistor, and connecting the respective terminals of said third resistor to the power source terminal and the collector of said third transistor, characterised in that said second resistor comprises a first resistor layer and a plurality of electrodes arranged along a longitudinal direction of the first resistor layer to constitute a plurality of resistor regions in said second resistor, two selected electrodes on the first resistor layer being used as said respective terminals of said second resistor, and in that said third resistor comprises a second resistor layer and a plurality of electrodes arranged along a longitudinal direction of the second resistor layer to constitute a plurality of resistor regions in said third resistor, two selected electrodes on the second resistor layer being used as said respective terminals of said third resistor, whereby, in dependence upon the electrodes on the first and second resistor layers selected for use as said terminals of the first and second resistors, the threshold voltages of the Schmitt circuit are selected. Accordingly, an embodiment of the present invention can provide a novel and useful Schmitt circuit for semiconductor integrated circuit in which the problems described heretofore are eliminated. An embodiment of the present invention can provide a Schmitt circuit for a semiconductor integrated circuit in which resistances of predetermined resistors of the Schmitt circuit are respectively selected from a plurality of resistances so as to obtain a desired pair of threshold voltages by selecting electrodes to which the wiring is to connect when producing the semiconductor integrated circuit according to the master slice method. According to the Schmitt circuit of the present invention, Schmitt circuits having different pairs of threshold voltages can be produced depending on the selection of the electrodes to which the wiring is to connect. For this reason, the production cost of the Schmitt circuit for the semiconductor integrated circuit can be reduced. Reference is made, by way of example, to the accompanying drawings, in which :- FIG.1 is a circuit diagram showing a known Schmitt circuit; FIG.2 is a hysteresis curve showing an input voltage versus output voltage characteristic of the Schmitt circuit shown in FIG.1; FIGS.3A and 3B are a plan view and a cross sectional view respectively showing an essential part of an embodiment of the Schmitt circuit for semiconductor integrated circuit according to the present invention; FIG.4 is a circuit diagram for explaining the selection of resistances of resistors of the Schmitt circuit; FIG.5 are hysteresis curves showing input voltage versus output voltage characteristics of the Schmitt circuit for semiconductor integrated circuit according to the present invention; FIGS.6 and 7 are plan views respectively showing different examples of the wiring in the embodiment shown in FIGS.3A and 3B; and FIG.8 is a circuit diagram showing a modification of the embodiment. FIG.1 shows the circuit construction of a known Schmitt circuit. The Schmitt circuit comprises a PNP transistor Q₁ which is used as an input buffer, Schottky clamped transistors Q₂ and Q₃, and resistors R A , R B , R C and R D . An input voltage Vi to the Schmitt circuit is applied to a base of the transistor Q₁ via an input terminal 11. An emitter of the transistor Q₁ is coupled to a base of the transistor Q₂ and to one terminal of the resistor R A , and a collector of the transistor Q₁ is grounded. A collector of the transistor Q₂ is coupled to a base of the transistor Q₃ and to one terminal of the resistor R B , and an emitter of the transistor Q₂ is coupled to an emitter of the transistor Q₃ and to one terminal of the resistor R D . A collector of the transistor Q₃ is coupled to an output terminal 12 and to one terminal of the resistor R C . The resistors R A , R B and R C have the other terminals thereof coupled to a power source terminal 13 supplied with a power source voltage Vcc, and the other terminal of the resistor R D is grounded. FIG.2 is a hysteresis curve showing the input voltage Vi versus output voltage Vo characteristic of the Schmitt circuit shown in FIG.1. When the input voltage Vi is small, the transistor Q₁ is ON, the transistor Q₂ is OFF and the transistor Q3 is ON, the output voltage Vo from the output terminal 12 has a low level. As the input voltage Vi rises over a threshold voltage V TH2 , the transistor Q₂ is turned ON and the transistor Q₃ is turned OFF, the level of the output voltage Vo becomes high. Thereafter, as the input voltage Vi falls under a threshold voltage V TH1 , where V TH1 < V TH2 , the transistor Q₂ is turned OFF and the transistor Q₃ is turned ON, the level of the output voltage Vo becomes low. As is well known, the threshold voltages V TH1 and V TH2 can be varied arbitrarily by varying the resistances of the resistors R A , R B , R C and R D . Conventionally, when providing a Schmitt circuit on a semiconductor integrated circuit such as a large scale integrated circuit (LSI), appropriate resistances for the resistors R A , R B , R C and R D are calculated beforehand when designing the Schmitt circuit having a desired pair of threshold voltages V TH1 and V TH2 . For this reason, the resistances for the resistors R A , R B , R C and R D must be calculated for each different pair of threshold voltage. Hence, there are problems in that the pair of threshold voltages of one Schmitt circuit for the semiconductor integrated circuit are fixed, and Schmitt circuits having different pairs of threshold voltages must be designed independently according to the needs. As a result, the production cost of the conventional Schmitt circuit for the semiconductor integrated circuit is high. The present invention eliminates the problems of the conventional Schmitt circuit for semiconductor integrated circuit by making it possible to set the pair of threshold voltages of the Schmitt circuit by selecting the resistances of predetermined resistors when producing the semiconductor integrated circuit according to the master slice method. FIGS.3A and 3B are a plan view and a cross sectional view respectively showing an embodiment of the Schmitt circuit for semiconductor integrated circuit according to the present invention. The circuit construction of the Schmitt circuit itself is known, and in the present embodiment, it will be assumed for convenience' sake that the Schmitt circuit has the circuit construction shown in FIG.1. In FIG.3A, a device forming region 20 is indicated by a one-dot chain line. As shown in FIG.3B which shows a cross section along a line IIIB-IIIB in FIG.3A, the device forming region 20 is formed by growing epitaxially an N-type layer 20a on a P-type substrate 21. The device forming region 20 is isolated from other device forming regions by a P-type device isolation region 22. A P-type region 23 is formed in the N-type layer 20a, and this P-type region 23 has an approximate L-shape in the plan view as indicated by a phantom line in FIG.3A. An arm portion 23a of the P-type region 23 constitutes the resistor R B shown in FIG.1, and an arm portion 23b of the P-type region 23 constitutes the resistor R C shown in FIG.1. FIG.3B shows the cross section of the arm portion 23b. The cross section of the arm portion 23a along a line IIIB'-IIIB' in FIG.3A is similar to the cross section of the arm portion 23b shown in FIG.3B, and the illustration and description thereof will be omitted. Electrodes 24a, 24b and 24c are provided on the arm portion 23b, and an insulator layer 25 covers remaining surface portions of the arm portion 23b. Similarly, electrodes 24a, 24d and 24e are provided on the arm portion 23a, and the insulator layer 25 covers remaining surface portions of the arm portion 23a. The electrode 24a is used in common between the two arm portions 23a and 23b. For example, P-type silicon is used for the P-type substrate 21, the P-type device isolation region 22 and the P-type region 23, N-type silicon is used for the N-type layer 20a, aluminum is used for the electrodes 24a through 24e, and silicon dioxide is used for the insulator layer 25. The electrode 24a is coupled to the power source terminal 13 shown in FIG.1. Either the electrode 24b or 24c is coupled to the collector of the transistor Q₃. The resistance of the resistor R C is small when the electrode 24b is selected and coupled to the collector of the transistor Q₃, and is large when the electrode 24c is coupled to the collector of the transistor Q₃, because of the distance between the two selected electrodes. Similarly, either the electrode 24d or 24e is coupled to the collector of the transistor Q₂. The resistance of the resistor R B is small when the electrode 24d is selected and coupled to the collector of the transistor Q₂, and is large when the electrode 24e is selected and coupled to the collector of the transistor Q₂. When producing the semiconductor integrated circuit according to the master slice method, the wiring is formed after basic cells are formed on the substrate 21. Hence, the coupling of the electrode 24b or 24c to the collector of the transistor Q₃ and the coupling of the electrode 24d or 24e to the collector of the transistor Q₂ can be carried out selectively when the wiring is formed. In other words, the threshold voltages V TH1 and V TH2 of the Schmitt circuit can be set to desired voltages by selecting the electrodes and accordingly selecting the resistances of the resistors R B and R C when forming the wiring. It is possible to provide electrodes on a P-type region constituting the resistors R A and R D , similarly as in the case of the electrodes 24a through 24e of the resistors R B and R C , and set the resistances of the resistors R A and R D by selecting predetermined electrodes. The threshold voltages V TH1 and V TH2 of the Schmitt circuit can also be varied by varying the resistances of the resistors R A and R D , since the threshold voltages V TH1 and V TH2 are dependent on the resistances of the resistors R A , R B , R C and R D as described before. However, because the resistor R A is coupled between the power source terminal 13 and the emitter of the transistor Q₁, the input characteristic at the input terminal 11 changes when the resistance of the resistor R A is varied. The input characteristic is for example an input current flowing from the power source terminal 13 to the resistor R A , the emitter-base of the transistor Q₁ and the input terminal 11 when the input level is low, which should be absorbed by an external circuit (not shown) connected to the input terminal 11. For this reason, it is preferable that the resistance of the resistor R A is not varied, that is, kept constant. In addition, when the resistance of the resistor R D is varied, it is difficult to set ranges in which the threshold voltages V TH1 and V TH2 of the Schmitt circuit vary because the first threshold voltage V TH1 is determined by the resistances of the resistors R A , R B and R D and the second threshold voltage V TH2 is determined by the resistances of the resistors R B , R C and R D . Thus, it is preferable that the resistance of the resistor R D is also not varied, that is, kept constant. Therefore, in the present embodiment, the resistances of the resistors R A and R D are kept constant, and only the resistances of the resistors R B and R C are varied in order to vary the threshold voltages V TH1 and V TH2 of the Schmitt circuit. When it is assumed that the input voltage Vi is large and the transistor Q₁ is OFF in a first state, a current flowing through the resistor R A is applied to the base of the transistor Q₂. Hence, the transistor Q₂ is turned ON, a current flowing through the resistor R B flows through the transistor Q₂, and the transistor Q₃ is turned OFF. It will be assumed that the level of the output voltage Vo is high in the first state. In this first state, the Schmitt circuit shown in FIG.1 can be illustrated by an equivalent circuit shown in FIG.4. In this initial state, resistors R₁, R₂ and R₃ respectively correspond to the resistors R A , R B and R D , and a Schottky clamped transistor Tr corresponds to the transistor Q₂. The following set of equations (1) stand in FIG.4, where R₁ through R₃ respectively denote resistances of the resistors R₁ through R₃, I₁ and I₂ respectively denote currents flowing through the resistors R₁ and R₂, V BE denotes a base-emitter voltage of the transistor Tr, V F denotes a voltage across a Schottky barrier diode (not shown) of the transistor Tr, and Vs denotes a voltage at the connection between the resistor R₃ and the emitter of the transistor Tr. R₁·I₁ + V BE + R₃·(I₁ + I₂) = Vcc R₂·I₂ - V F + V BE + R₃·(I₁ + I₂) = Vcc Vs = R₃·(I₁ + I₂) (1) The above set of equations (1) can be solved for Vs as the following equation (2). Vs = R₃·(R₁+R₂)(Vcc-V BE +(R₁+R₃)·V F /R₁)/(R₁·R₂+R₁·R₃+R₂·R₃) - R₃·V F /R₁ (2) As the large input voltage Vi falls to the threshold voltage V TH1 (= Vs + V BE (Q₂) - V BE (Q₁) ≃ Vs , where Vs is determined by R A , R B and R D ), the transistor Q₁ is turned ON and the current flowing through the resistor R A flows through the transistor Q₁. Hence, the transistor Q₂ is turned OFF, and the current flowing through the resistor R B is applied to the base of the transistor Q₃ thereby turning ON the transistor Q₃. As a result, the output voltage Vo falls from the high level to a low level. It can thus be seen that the threshold voltage V TH1 (≃ Vs) of the Schmitt circuit is dependent on the resistances of the resistors R A , R B and R D . When the resistances of the resistors R A and R D are kept constant for the reasons described before, only R₃·(R₁+R₂)/(R₁·R₂+R₁·R₃+R₂·R₃) in the first term on the right hand side of the equation (2) contains a variable. The term R₃·(R₁+R₂)/(R₁·R₂+R₁·R₃+R₂·R₃) can be rewritten as follows. When the resistance of the resistor R B (R₂ in this case) is increased, the term 1/[R₁/(R₃·R₁/R₂+R₃)+1] decreases thereby decreasing Vs. In other words, the threshold voltage V TH1 (≃ Vs) decreases as the resistance of R B is increased. On the other hand, when it is assumed that the input voltage Vi is small and the transistor Q₁ is ON in a second state, the current flowing through the resistor R A flows through the transistor Q₁. Hence, the transistor Q₂ is turned OFF, the current flowing through the resistor R B is applied to the base of the transistor Q₃, and the transistor Q₃ is turned ON. It will be assumed that the level of the output voltage Vo is low in the second state. In this second state, the Schmitt circuit shown in FIG.1 can also be illustrated by the equivalent circuit shown in FIG.4. But in this second state, the resistors R₁, R₂ and R₃ respectively correspond to the resistors R B , R C and R D , and the transistor Tr corresponds to the transistor Q₃. As the small input voltage Vi rises to the threshold voltage V TH2 (= Vs + V BE (Q₂) - V BE (Q₁) ≃ Vs , where Vs is determined by R B , R C and R D ), the transistor Q₁ is turned OFF and the current flowing through the resistor R A is applied to the base of the transistor Q₂. Hence, the transistor Q₂ is turned ON, and the current flowing through the resistor R B flows through the transistor Q₂ thereby turning OFF the transistor Q₃. As a result, the output voltage Vo rises from the low level to a high level. It can thus be seen that the threshold voltage V TH2 (≃ Vs) of the Schmitt circuit is dependent on the resistances of the resistors R B , R C and R D . When the resistance of the resistor R D is kept constant for the reason described before and the resistance of the resistor R B is set to obtain the desired threshold voltage V TH1 only R₃·(R₁+R₂)/(R₁·R₂+R₁·R₃+R₂·R₃) in the first term on the right hand side of the equation (2) contains a variable, as in the case described before. Hence, when the resistance of the resistor R C is increases, the voltage Vs decreases and the threshold voltage V TH2 decreases. The difficulty in setting the ranges in which the threshold voltages V TH1 and V TH2 of the Schmitt circuit vary when the resistance of the resistor R D is made variable may also be understood from the equation (2) since R₃ appears in each term. FIG.5 shows hysteresis curves of the Schmitt circuit for the combination of the resistances of the resistors R B and R C . Threshold voltages V TH1A and V TH2A are obtained when the resistances of the resistors R B and R C respectively are small and large by selecting the electrodes 24d and 24c. Threshold voltages V TH1B and V TH2A are obtained when the resistances of the resistors R B and R C respectively are small by selecting the electrodes 24d and 24b. Threshold voltages V TH1A and V TH2B are obtained when the resistances of the resistors R B and R C respectively are large and small by selecting the electrodes 24e and 24b. FIG.6 is a plan view showing an essential part of an example of the wiring formed on the embodiment shown in FIGS.3A and 3B. In FIG.6, those parts which are the same as those corresponding parts in FIGS.3A and 3B are designated by the same reference numerals, and the wiring which is made of aluminum, for example, is shown by hatchings. Further, C, E and B respectively denote the collector, emitter and base of the transistors. FIG.6 shows the case where the resistances of both the resistors R B and R C are selected to the small values by selecting the electrodes 24d and 24b, and the threshold voltages V TH1B and V TH2A are obtained. FIG.7 is a plan view showing an essential part of another example of the wiring formed on the embodiment shown in FIGS.3A and 3B. In FIG.7, those parts which are the same as those corresponding parts in FIG.6 are designated by the same reference numerals, and description thereof will be omitted. FIG.7 shows the case where the resistances of both the resistors R B and R C are selected to the large values by selecting the electrodes 24e and 24c. FIG.8 shows a modification of the embodiment described heretofore. In FIG.8, those parts which are the same as those corresponding parts in FIG.1 are designated by the same reference numerals, and description thereof will be omitted. In this modification, an inverter 30 is coupled to the output terminal 12, and an inverted output voltage is obtained via a terminal 31. In the embodiment described heretofore, the resistor R B , for example, comprises three electrodes 24a, 24d and 24e on the P-type region 23 which is used as a resistor layer. However, the number of electrodes on the resistor layer is not limited to three. Moreover, in FIGS.3A and 3B, a plurality of resistor regions are formed for each of the resistors R B and R C by providing a plurality of electrodes along the longitudinal direction of the resistor layer. However, it is also possible to provide a plurality of independent resistor layers and obtain the desired resistance by selectively connecting the plurality of independent resistor layers in series or parallel.

Claims: A Schmitt circuit for a semiconductor integrated circuit comprising: an input terminal (11) for receiving an input voltage; a power source terminal (Vcc) for receiving a power source voltage; a first transistor (Q1) having a base coupled to the input terminal (11) and a collector coupled to ground (GND); a second transistor (Q2) having a base coupled to an emitter of said first transistor (Q1); a third transistor (Q3) having a base coupled to a collector of said second transistor (Q2); an output terminal (12) coupled to a collector of said third transistor (Q3); a first resistor (R A ) coupled between the power source terminal (Vcc) and the emitter of said first transistor (Q1); a second resistor (R B ) having terminals connected respectively to the power source terminal (Vcc) and to the collector of said second transistor (Q2); a third resistor (R C ) having terminals connected respectively to the power source terminal (Vcc) and to the collector of said third transistor (Q3); a fourth resistor (R D ) coupled between the ground (GND) and emitters of said second (Q2) and third (Q3) transistors; and wiring means connecting the respective terminals of said second resistor (R B ) to the power source terminal (Vcc) and to the collector of said second transistor (Q2), and connecting the respective terminals of said third resistor (R C ) to the power source terminal (Vcc) and the collector of said third transistor (Q3), characterised in that said second resistor (R B ) comprises a first resistor layer (23a) and a plurality of electrodes (24a, 24d, 24e) arranged along a longitudinal direction of the first resistor layer (23a) to constitute a plurality of resistor regions in said second resistor (R B ), two selected electrodes on the first resistor layer (23a) being used as said respective terminals of said second resistor (R B ), and in that said third resistor (R C ) comprises a second resistor layer (23b) and a plurality of electrodes (24a, 24b, 24c) arranged along a longitudinal direction of the second resistor layer (23b) to constitute a plurality of resistor regions in said third resistor (R C ), two selected electrodes on the second resistor layer (23b) being used as said respective terminals of said third resistor (R C ), whereby, in dependence upon the electrodes on the first (23a) and second (23b) resistor layers selected for use as said terminals of the first (R B ) and second (R C ) resistors, the threshold voltages of the Schmitt circuit are selected. A Schmitt circuit for a semiconductor integrated circuit as claimed in claim 1, in which a single resistor layer (23) is used in common as the first (23a) and second (23b) resistor layers, and a predetermined electrode (24a) on said single resistor layer (23) is used in common as that one of the two selected electrodes on the first resistor layer (23a) and that one of the two selected electrodes on the second resistor layer (23b) connected to the power source terminal (Vcc) by said wiring means. A Schmitt circuit for a semiconductor integrated circuit as claimed in claim 2, in which said single resistor layer (23) has an approximate L-shape, and said predetermined electrode (24a) is located at a position where two arm portions of the L-shape meet. A Schmitt circuit for a semiconductor integrated circuit as claimed in claim 1, in which said first transistor (Q1) is a PNP transistor, and said second (Q2) and third (Q3) transistors are Schottky clamped transistors.

Inventors: HIROCHI, KATSUJI FUJITSU LIMITED, KATO, TAKAHIRO FUJITSU LIMITED, SUGIHARA, TAKANORI FUJITSU LIMITED
Applicants: FUJITSU LIMITED
Application year: 1987
Main classification: H01L27
IPC codes: H01L27, H01L21, H03K3, H03K5