D/A converter

Abstract: A D/A converter, especially a cyclic type D/A converter, having an error detection and correction system including: a code conversion circuit (101) for converting a binary code (C) to a multi-states code; a digital-to-analog conversion circuit (102) connected to the code conversion circuit (101) for converting the multi-states code to an analog value; a detection circuit (103) operatively connected to the digital-to-analog conversion circuit for converting the analog value to a digital code; and a control circuit (104) operatively connected to the code conversion circuit (101), digital-to analog conversion circuit (102) and detection circuit (103) for calculating a voltage difference between the analog value at a predetermined code value and another analog value adjacent to the predetermined code value, and for calculating a differential non-linearity error from the voltage difference based on the digital code, in order to obtain error and correction values of capacitors forming the digital-to-analog conversion circuit.

Description: The present invention relates to a cyclic-type digital-to-analog (D/A) converter, and to a method of detecting errors upon digital-to-analog conversion in such a D/A converter. The conversion of a digital code to an analog value is common in the field of information processing systems and, in general, a D/A converter must be capable of a high conversion speed, high resolution, satisfactory differential linearity, and low power consumption. D/A converters employing, for example, an R-2R ladder-type conversion method or a 2 n weighting-type conversion method are known, and in these types of converters, the conversion circuit comprises many resistors or capacitors having weighted values. Accordingly, the requirements referred to the above are considerably affected by the precision of the resistance and capacitance values forming the D/A converter, and errors in these values must be quickly detected and quickly corrected to realize the desired high speed and precise D/A conversion. A paper in IEEE Int. Automatic Testing Conference 1978 (Automation), 25th-30th November 1978, pp 268-274, N.Y., U.S.A., by L. F. Pau entitled "Fast Testing and Trimming of A/D and D/A converters in Automatic Test Systems", discloses a D/A converter according to the preamble of accompanying claim 1, and a method of detecting and correcting errors according to the preamble of accompanying claim 6. This paper deals with full-scale and offset errors, not with differential non-linearity error. The total offset error is decomposed into a set of Walsh-basis functions and the coefficients thus yielded are used to calculate resistance changes for trimming resistors in a conventional ladder-type D/A converter acting on a weighted-binary code. According to a first aspect of the present invention, there is provided a D/A converter having an error detection and correction system, comprising:- a digital-to-analog conversion means for converting a first digital code to an analog value; a detection means operatively connected to said digital-to-analog conversion means for converting said analog value to a second digital code; and a control means operatively connected to said digital-to-analog conversion means and to said detection means, for calculating a correction value using at least said second digital code and correcting values of elements employed in the D/A converter based on said correction value; characterised in that:- code conversion means are provided for converting a binary code into a three-states code as said first digital code; said digital-to-analog conversion means is a cyclic-type D/A converter which is operable to convert said three-states code to an analog value; and in that said control means is operatively connected to said code conversion means and operable to calculate a voltage difference between said analog value at a predetermined code value and another analog value at another code value adjacent to said predetermined code value based on said second digital code, to calculate a differential non-linearity error from said voltage difference using an approximation formula, and to obtain said correction value based on said differential non-linearity error. According to a second aspect of the present invention, there is provided a method for detecting errors upon digital-to-analog conversion in a cyclic-type D/A converter, comprising steps of:- [i] converting a first digital code to an analog value; [ii] detecting said analog value and converting said analog value to a second digital code; [iii] calculating a correction value using at least said second digital code; and [iv] correcting values of elements employed in the D/A converter based on said correction value; characterised in that:- step [i] comprises converting a binary code into a three-states code as said first digital code, and then converting said three-states code to an analog value; and in that step [iii] comprises calculating a voltage difference between said analog value at a predetermined code value and another analog value at another code value adjacent to said predetermined code value based on said second digital code, calculating a differential non-linearity error from said voltage difference using an approximation formula, and obtaining said correction value based on said differential non-linearity error. An embodiment of the present invention may provide a cyclic-type D/A converter having an error detection and correction system which enables a high speed and precise error detection and correction. Reference will now be made, by way of example, to the accompanying drawings in which: Fig. 1 is a schematic circuit diagram of one example of a known D/A converter; Fig. 2 is an explanation of a differential non-linearity error; Fig. 3 is a schematic block diagram of one example of a cyclic type D/A converter; Fig. 4 is a timing chart for the circuit shown in Fig. 3; Fig. 5 is a schematic block diagram of another example of the cyclic type D/A converter; Fig. 6 is a timing chart for the circuit shown in Fig. 6; Fig. 7 is a detailed diagram of the circuits shown in Fig. 3 and 5; Fig. 8 is an explanation of the circuit shown in Fig. 7; Fig. 9 is an explanation of change patterns of digital codes between code values; Fig. 10 is a schematic block diagram of a cyclic type D/A converter according to an embodiment of the present invention; Fig. 11 is a schematic block diagram of a cyclic type D/A conversion system embodying the present invention. Fig. 12 is a circuit diagram of a D/A conversion unit according to an embodiment of the present invention; Fig. 13 is a circuit diagram of an error correction circuit according to an embodiment of the present invention; and Fig. 14 is a timing chart for the circuit shown in Fig. 13. Before describing the preferred embodiments, an explanation will be given of a previously proposed error detection and correction method for a D/A converter. In Fig. 1, reference numbers 1 to 4 denote current sources each supplying a weighted current value. Namely, when the current value supplied from the current source 4 is "I₀", each of the current values supplied from the other current sources is expressed by "⅛ I₀", "¼ I₀", and "½ I₀". Δ₀ to Δ₃ are error values of the current caused by the dispersion of electrical characteristic of the elements in the current source. A linear coupling of these error values is also known as a "differential non-linearity error". Therefore, each current is expressed by ⅛ I₀ + Δ₀, ¼ I₀ + Δ₁, ½ I₀ + Δ₂ and I₀ + Δ₃. Digits D₀, D₁, D₂, and D₃ are applied to a corresponding switch and the current source is connected to either the "1" or the "0" side of the switch corresponding to each of the digits D₀ to D₃. For example, when D₀ to D₂ = "1" and D₃ = "0", an output current I out becomes ⅞ I₀; when D₀ to D₃ = "0", I out becomes 0; and when D₀ to D₂ = "0" and D₃ = 1, I out becomes -I₀. This output current I out flows in a load R L and an analog voltage is obtained from across the load R L . In Fig. 2, (1) denotes the differential non-linearity error at a code value of a centre position; (2) that at a code value of a half of a full scale (FS/2); and (3), that at a code value of a quarter of the full scale (FS/4). In each case, the differential non-linearity error is expressed by a theoretical value Δ and a detection value d . In the case of (1), the value Δ between the digital code "0 0 0 0" and "1 1 1 1" is expressed by Δ₃-Δ₂-Δ₁-Δ₀ , and the value d is expressed by "d₃". In the case of (2), the value Δ is expressed by Δ₂-Δ₁-Δ₀ , and the value d is expressed by "d₂". In the case of (3), the value Δ is expressed by Δ₁-Δ₀ , and the value d is expressed by "d₁". When the current source of the least significant bit (LSB, i.e., D₀) is set to a reference current value, the error value Δ₀ is set to "0". Therefore, since the error value Δ₁ of the digit D₁ becomes d₁, a value to be corrected (i.e., a correction value) is expressed by -d₁. Since the error value Δ₂ of the digit D₂ becomes d₂ + Δ₁ (= d₂ + d₁) , the correction value is expressed by -(d₂ + d₁). Further, since the error value Δ₃ of the most significant bit (MSB, i.e., D₃) becomes d₃ + Δ₂ + Δ₁ (= d₃ + d₂ + 2d₁) , the correction value is expressed by -(d₃ + d₂ + 2d₁). Consequently, when the above correction values are added to each current source, the error at each weighted current can be eliminated in the D/A conversion. As can be understood, in the above D/A converter, since four elements (four current sources) to be weighted are provided, the detection must be made for six digital codes, and three differential non-linearity errors obtained. The correction values can be obtained from the above differential non-linearity errors. In general, in an N-bits D/A converter, (N - 1) differential non-linearity errors can be calculated from the detection values for 2(N - 1) digital codes. Such an analog-to-digital converter has been disclosed in U.S. application No. 902,870 (filed on September 2, 1986). However, in this proposed method, since the correction value must be calculated from the value detected at every digit, the process is complex and time-consuming, and as a result, it is difficult to achieve a high speed D/A conversion. The present invention can be applied to error detection and correction in a cyclic type D/A converter. The detection process for obtaining the differential non-linearity error is carried out without regard for the number of digits in the cyclic type D/A converter, and therefore, the number of values to be detected can be reduced when detecting error values. That is, the number of values to be detected can be considerably reduced by the error detection and correction method according to the present invention, and thus it is possible to obtain a high speed and extremely precise D/A conversion. In Fig. 3, reference letter A denotes a calculation circuit, S/H₁ a first sample and hold circuit, and S/H₂ a second sample and hold circuit. S i is a switch, and G and R are terminals for the switch S i . In this case, the terminal G is connected to the ground and the terminal R is connected to the first sample and hold circuit S/H₁. The switch S i operates only when the initial value is set to "0". That is, when the switch S i is connected to the terminal G, the initial value is set to "0" and, thereafter, the switch S i is always connected to the terminal R. The calculation circuit A cyclically calculates each output voltage V₀ based on the formula V₀ = ½(V in + a V ref ) , where V in is an input voltage and V ref is a reference voltage. "a i " is a digit of the digital code to be converted to an analog value. The digital code is generally shown by a n-1 , a n-2 ... a₁ , a₀ and each digit can take three states of 1, 0, -1. Therefore, a converted analog voltage corresponding to the digital code can be expressed as follows. The timing chart in Fig. 4, shows an operation of the cyclic type D/A converter shown in Fig. 3. In the Figure, T is a conversion cycle in which, for example, the digital code "a₄ , a₃ , a₂ , a₁ , a₀" is converted to the analog voltage V₄. The switch S i is first connected to the terminal G, and then connected to the terminal R when a sampling pulse is input. V A denotes input voltages V₀ to V₄ which are input to the calculation circuit A, and V B denotes output voltages V₀ to V₄ which are output from the calculation circuit A. The first sample and hold circuit S/H repeatedly samples and holds the input voltage V B corresponding to each digit. In this case, S denotes the sampling state and H the holding state. The second sample and hold circuit S/H₂ samples and holds input voltage V B when one conversion cycle is finished, and therefore, the analog voltage V₄ is obtained when the output of the circuit S/H₂ is input. The cyclic type D/A converter shown in Fig. 5 comprises two calculation circuits A and B. Namely, the calculation circuit B is provided instead of the sample and hold circuit S/H₁. In this case, an even number digit a i is input to the circuit A and an odd number digit a j is input to the circuit B. Therefore, it is possible to double the conversion speed in comparison with the circuit shown in Fig. 3. The timing chart in Fig. 6 shows the operation of the D/A converter shown in Fig. 5. The sampling and holding states (S and H) are alternately set between the calculation circuits A and B. Therefore, for example, when the voltage V₀ is output from the circuit B to the circuit A, the voltage V₁ is output from the circuit A to the circuit B after the predetermined calculation is performed based on the formula; ½(V in + a V ref ) . Figure 7 shows a detailed circuit diagram of the calculation circuit shown in Figs. 3 and 5. In the Figure, OP is an operational amplifier, C₀ to C₂ are capacitors each having an equivalent capacitance value. A charging/discharging unit is constituted by at least one of the capacitors C₀ and C₂. The calculation in this circuit is based on the formula; ½(V in + a V ref ) , where digit a can take three states 1, 0, -1. The operation of this circuit is explained with reference to Fig. 8. In the sampling mode, the switch S₁ is closed, the capacitor C₂ is connected to the ground GND, and the capacitor C₁ is connected to the input V in . The capacitor C₀ is connected to the reference V ref when the digit a = 1, and connected to the ground G when the digit a = 0 and -1. In the conversion mode, the switch S i is opened, and the switch S₃ and the switch S₄ are connected to the terminal O, and thus the capacitors C₁ and C₂ are connected in parallel to the switch S₁. Accordingly, the elements which affect the precision of the D/A conversion are the capacitors C₀ , C₁ , and C₂ , and therefore, the capacitance values of these capacitors must be corrected. In this case, for example, a code value "3" can be expressed by "1 0 (-1)" (4 - 1) and "0 1 1" (2 + 1) as the three states binary code. However, since the weighted value of the digital code "1 0 (-1)" and "0 1 1 " is different upon conversion, the resultant analog value from these conversions is also different. Therefore, the capacitance values of these capacitors must be corrected, to eliminate the above conversion error. Figure 9 shows the code change patterns of digital codes, between code values shown by dotted lines or solid lines. For example, the change pattern between the code value 15 and the code value 14 is shown as "type 1". Similarly, the change pattern between 14 and 13 as "type 2", the change pattern between 13 and 12 as "type 3", and the change pattern between 11 and 10 as "type 4", as shown in the lower digit side (LSB). Therefore, the change pattern of the digital code in the LSB side is denoted by these four types as shown in the "LOWER" column. Further, in the middle and upper digit sides (MSB), the change pattern between the code value 10 and the code value 9 is shown as "type a " and the change pattern between 6 and 5 is shown as "type b ". In the middle and the upper digit sides, only two types a and b are shown as typical change patterns. Since the error values at the change patterns of types 1 to 4 are small, these types 1 to 4 are not utilized in the inventive error detection and correction method, and only the types a and b are utilized in the present invention. In type a , the digit is changed between patterns "1 -1" and "0 1", and in type b , the digit is changed between patterns "0 -1" and "-1 1". Accordingly, type b becomes similar to type a when the pattern of the type a is inverted and a symbol (+ -) of the resultant pattern inverted Therefore, assuming that the error value for type a can be set to zero, the error value for type b also can be set to zero. As can be understood, the error first reaches a largest value at the FS/4 position and then at the FS/8 position. Therefore, in the cyclic type D/A converter shown in Fig. 3, the error is detected at only one point, i.e., FS/4. In the converter shown in Fig. 5, the error is detected at two points, FS/4 and FS/8, because the calculation circuit A carries the even digit and the circuit B carries the odd digit as shown in Fig. 6. Therefore, when the error values are detected at these points and corrected and made zero, it is possible to make all differential non-linearity errors to zero. An explanation will now be given of the method for obtaining the error values and the correction values according to the present invention with respect to the cyclic type D/A converter shown in Figs. 3 and 5. Where there are two calculation circuits as shown in Fig. 5, when the input voltage at number M calculation step is given by V i (M), V i (M) is equal to V₀(M - 1) because V₀(M - 1) denotes the output at the number (M - 1) calculation step. That is, V i (M) = V₀(M - 1) . Further, when the voltage applied to the capacitor C₀ is expressed by V P (when a = 1, V P = V ref ; when a = 0 or -1, V P = 0) in the sampling mode and by V N (when a = 0 or 1, V N = 0; when a = -1, V N = V ref ) in the conversion mode, the following formula is expressed based on "the principle of conservation of the charge" between the sampling and conversion modes. That is, Therefore, when a = 1, since V P = V ref and V N = 0, the following result is obtained from (1). when a = 0, since V P = 0 and V N = 0, the following result is obtained from (1). and when a = -1, since V P = 0 and V N = V ref , the following result is obtained from (1). In this case, when C₀ = 1 + ΔC₀ , C₁ = 1 + ΔC₁ , C₂ = 1 and V ref = 1, V₀(M) is obtained from (1) as follows. Since the error value ΔC₀ occurs in the calculation circuits A and B, ΔC₀A is used in the circuit A and ΔC₀B is used in the circuit B. Similarly, for the error value ΔC₁ , ΔC₁A is used in the circuit A and ΔC₁B is used in the circuit B. The following analysis is performed to obtain the correction value, and as a result, the differential non-linearity error becomes zero. For example, in case of 12 bits resolution, the analyses for the differential non-linearity error between the code value "1024" and "1023", and between the code value "512" and "511" are as follows. The digital code converted from the value "1024" is expressed by " 1 -1 0 0 0 0 0 0 0 0 0 0", and the digital code converted from the value "1023" is expressed by "0 1 0 0 0 0 0 0 0 0 0 -1". Each digit is alternately supplied to the calculation circuits A and B as shown by the following Table 1. From the above condition, V₀(1) = 0, V₀(2) = 0, ..., V₀(9) = 0 and V₀ (10) = 0. Therefore, the output voltage from the calculation circuit A is expressed by the formula (4) as follows. Accordingly, the output voltage of the value "1024" is expressed by the formula (2) as follows. Next, the output voltage of the value "1023" is calculated as follows. Therefore, the differential non-linearity error is expressed as follows. The above formula is resolved by using the following approximation formula. Accordingly, the differential non-linearity error ΔE₁₀₂₄ between the values "1024" and "1023" is expressed as follows. The same procedure as above is used for the differential non-linearity error ΔE₅₁₂ between the values "512" and "511". The output voltage V₅₁₂ of the value "512" is expressed as follows. The output voltage V₅₁₁ of the value "511" is expressed as follows. The differential non-linearity error ΔE₅₁₂ is obtained by using the following approximation formula. Therefore, the correction values dC₁B and dC₁A are expressed as follows. Since there are four unknown parameters in the above formulae, the solution cannot be given unconditionally. Therefore, as one explample, when ΔC₀A = ΔC₀B = 0 , the above formulae are replaced as follows. In this case, since ΔC₀A = ΔC₀B = 0 , the capacitances C₀A and C₀B are not corrected, and the values dC₁A and dC₁B are given to the capacitors C₁A and C₁B as the correction values. Therefore, ΔC₁A is replaced by dC₁A and ΔC₁B is replaced by dC₁B, the above formulae are replaced as follows. from (5) + (6) Therefore, the correction values are expressed as follows. This means that only the capacitance C₁A in the circuit A is corrected to the capacitance ( C₁A + dC₁A · C₂A) and the capacitance C₁B in the circuit B is corrected to the capacitance (C₁B + dC₁B · C₂B) . Further corrections of the capacitances are not necessary in the present invention, and as a result, the differential non-linearity error is made zero by the above correction. The following is an explanation of the calculation in the single circuit shown in Fig. 3. Since the calculation steps are the same as for the two calculation circuits shown in Fig. 5, a detailed explanation thereof is omitted. The conversion steps are shown by the following Table 3. The output voltage of the value "1024" is expressed as follows. The output voltage of the value "1023" is expressed as follows. The formulae (1)'', (2)'' and (3)'' are expressed as follows, by using the approximation formula. Therefore, the differential non-linearity error ΔE₁₀₂₄ between the values "1024" and "1023 is expressed as follows. The differential non-linearity error between the value "512" and "511" is expressed as follows. The conversion steps are shown by the following Table 4. The output voltage of the value "512" is expressed as follows. The output voltage of the value "511" is expressed as follows. Therefore, the differential non-linearity error ΔE₅₁₂ is expressed as follows. The correction value dC₁A is expressed as follows. This means that the capacitance C₁A in the calculation circuit A is correct to the capacitance value (C₁A + dC₁A · C₂A) . Consequently, the differential non-linearity errors at all code values can be made zero based on the correction of the above error. In the case of the four digits D₀ to D₃ shown in Fig. 9, the differential non-linearity errors ΔE₄ and ΔE₈ at FS/4 and FS/8 are expressed as follows. In Fig. 3, ΔE₄ = - ¼ ΔC₁ In Fig. 5, Therefore, the error ΔE₄ in Fig. 3 is made zero by adding the correction value 4 x ΔE₄ to the capacitor C₁. Further, in Fig. 5, when the capacitor C₀ is not corrected (i.e., ΔC₀A = ΔC₀B = 0 ), the above formulae are replaced as follows. Therefore, the differential non-linearity error in Fig. 5 is made zero by adding the correction value 4 3 (ΔE₄ + 4 x ΔE₈) to the capacitor C₁A and by adding the correction value 8 3 (ΔE₄ + ΔE₈) to the capacitor C₁B. As can be understood from the above explanation, in this embodiment, the error detection is carried out at only one point (in the case of one calculation circuit as shown in Fig. 3) and one of three capacitors is corrected. Further, the error detection is carried out at two points (in the case of two calculation circuits as shown in Fig. 5) and two of six capacitors are corrected, thus making it is possible to bring the differential non-linearity error at all code value to zero. In Fig. 10, reference number 1 denotes a two states binary code C having, for example 8 bits; 2 denotes a code conversion block for converting the two states binary code (0, 1) to the three states binary code (-1, 0, 1); and 3 and 4 denote conversion blocks. These conversion blocks A and B correspond to the calculation circuits A and B in Fig. 5. In this structure, the conversion steps are as follows. That is, the digit 1 ○ of the three states code (-1, 0, 1) at the LSB is applied to block A, the output V₀ is then applied from the block A to block B, and the digit 2 ○ is next applied to block B. The output of block B is then applied to block A, and digit 3 ○ is then applied to block A. The above steps are repeated and a D/A conversion output is obtained after the digit 7 ○ is applied to block A. In this case, the D/A conversion output after (M - 1) steps is expressed by V₀(M - 1), as previously explained. Therefore, the input voltage V i (M) at number M step is equal to the output voltage V₀(M - 1) at number (M - 1) step, and thus when M = 1, the digit is LSB and V i (1) is "0". Further, when M = N , the output voltage V₀(N) is expressed as follows. The above formula corresponds to the formula explained with reference to Fig. 3. In Fig. 11, a system embodying the present invention comprises a cyclic type D/A converter 100 having a code conversion block 101 and a D/A conversion block 102, a voltage detection block for detecting an analog output voltage through a line 102-1 and for converting an analog value to a digital code, and a control unit 104 constituted by a microcomputer for controlling all sequences of the system. A control program for performing the method of the invention is stored in the control unit 104. An error correction means shown in Fig.12 is provided in the D/A conversion block 102. The correction value is sent from the control unit 104 through a bus line 104-2, and a timing signal for the D/A conversion is sent from the control unit 104 through a line 104-3. The resultant detection data obtained in the voltage detection block 103 is sent to the control unit 104 through a bus line 103-1, and a timing signal for the detection is sent from the control unit 104 to the voltage detection block 103 through a line 104-5. In the correction by the D/A converter, the code value to be converted from digital to analog is applied from the control unit 104 to the D/A converter 100 through a bus line 104-1, this code value is converted to the three states code, the three states code is sent to the conversion block 102, and the analog output from the conversion block 102 is detected by the voltage detection block 103. The operations for correcting by the D/A converter are now explained. (1) In an initial step, all correction values are set to zero, and the following sequences are then performed. (2) First, the code at the +FS/4 position is applied from the control unit 104 to the D/A converter 100. The above code is converted to the three state code and further converted to the analog value as the D/A conversion output voltage. (3)The analog output voltage is sent to the voltage detection block 103 through the line 102-1, and again converted to the digital code. This digital code is sent to the control unit through the bus 103-1. (4) A code value at the (FS/4 - 1 LSB) position is then applied to the D/A converter 100. (5) The analog output voltage is converted to the digital code in the detection block 103 by the same steps as described above, and this digital code is sent to the control unit 104. (6) The other code value at the position of +FS/8 is then applied to the D/A converter 100. (7) The analog output voltage is converted to the digital code and the digital code is sent to the control unit 104. (8) The code value at the (FS/8 - 1 LSB) position is then applied to the D/A converter 100. (9) The analog output voltage is converted to the digital code and the digital code is sent to the control unit 104. (10) In the control unit 104, the correction value is calculated based on the above data obtained by the steps (3), (5), (7) and (9) and the above explained formulae. (11) The correction value obtained by the control unit 104 is sent to the D/A converter 100 through the bus 104-2. (12) In step (11), when the correction value is relatively small, the operation of the D/A converter appears to be correct and the correction step is finished, but when the correction value is relatively large, the correction step is returned to the step (2) and the same step is repeated. When the correction value becomes sufficiently small, the correction step is finished. In the above embodiment, the explanation is made with respect to three capacitors C₀ to C₂. Further, the present invention can be applied to a D/A converter having a plurality of conversion elements n ( n > 1), example, capacitors. Moreover, in the present invention, although the explanation is made with respect to the three states code, a multi-states binary code can be applied. In this case, the different multi-states binary code expressing the same code value are converted to the analog value, the differential non-linearity error is calculated, and then the correction value is obtained by the same steps as explained above. In Fig. 12, capacitors C₀₁ to C₀₄ and C₂₁ to C₂₄ are supplementary capacitors for correcting each capacitance of the capacitors C₀ and C₂. Switches S₀₁ to S₀₄ and S₂₁ to S₂₄ are provided for switching between the capacitor side and the ground side, and when a switch is connected to the capacitor side, the supplementary capacitance is added and the capacitance value is corrected. These switches are switched by signals S a and S b , which are sent from the control unit 104 through the line 104-3. In Fig. 13, C a and C b are capacitors to be corrected and CS a and CS b are supplementary capacitors for correcting the capacitors C a and C b . Reference number 131 denotes a multiplication type D/A converter, 132 a comparator, and 133 an up-down counter. In this circuit, the capacitors C a and C b correspond to the capacitors C₀ and C₂ shown in Fig. 12, and the supplementary capacitors CS a and CS b correspond to the supplementary capacitors C₀₁ to C₀₄ and C₂₁ to C₂₄. This error correction circuit is used during periods when the D/A converter 100 does not operate. Therefore, since a high speed correction is required, a "follow-up comparison method" using an up-down counter is employed in the circuit. The operations of this circuit are now explained with reference to Fig. 14. First, the switch SZ is closed so that the potential of the node N1 becomes zero. Next, the switch SW1 is connected to the terminal R and the switch SW2 is connected to the terminal G, and accordingly, the capacitors C a and CS a are charged by the reference voltage VR and the capacitor C b is connected to the ground. Next, the switch SZ is opened, the switch SW1 is connected to the terminal G, and the switch SW2 is connected to the terminal R. After the above steps, a potential difference caused by the capacitance difference between C a + CS a and C b + CS b occurs at the node N1. This potential is compared by the comparator 132, and the resultant data is input to the up-down counter 133. Accordingly, either a count-up or count-down operation is performed in the up-down counter 133 in response to an up-down signal (U/P) from the comparator 132. A clock signal CLK is input to the up-down counter 133 and the D/A converter 131 is controlled by an output of the up-down counter 133. For example, when the capacitance C b + CS b > C a + CS a , a plus voltage occurs in the node N1. In this case, the signal U/D indicating the count-down is sent from the comparator 132 to the up-down counter 133. In the count-down, since the analog voltage from the D/A converter 131 is pulled down, the analog voltage supplied to the capacitor CS b is also pulled down, so that the capacitance of the capacitor CS b becomes small. Conversely, in the count-up, since the analog voltage from the D/A converter 131 is pulled up, the analog voltage supplied to the capacitor CS b is also pulled up so that the capacitance of the capacitor CS b becomes large. In the previously proposed error correction circuit, a successive approximation register is used instead of the up-down counter. However, in the previous proposal about 6 µs to 60 µs is needed, to carry out a correction, hindering the high speed operation of the cyclic D/A conversion. In the present invention, since the follow-up comparison method using the up-down counter is employed, only about 1 to 2 µs needed for a correction. This is because the correction of the capacitor is performed in such a way that the next correction value is corrected based on the previous correction value carried by the up-down counter 133. As previously explained, the correction values ΔC₀ to ΔC₂ are expressed as a plus or minus value. Therefore, when these plus or minus values are applied to the up-down counter 133, the correction value can be easily adjusted. This error correction circuit can be utilized in a circuit other than the cyclic D/A converter only by changing the element to be corrected.

Claims: A D/A converter having an error detection and correction system, comprising:- a digital-to-analog conversion means (102) for converting a first digital code to an analog value; a detection means (103) operatively connected to said digital-to-analog conversion means for converting said analog value to a second digital code; and a control means (104) operatively connected to said digital-to-analog conversion means and to said detection means, for calculating a correction value using at least said second digital code and correcting values of elements employed in the D/A converter based on said correction value; characterised in that:- code conversion means (101) are provided for converting a binary code into a three-states code as said first digital code; said digital-to-analog conversion means (102) is a cyclic-type D/A converter which is operable to convert said three-states code to an analog value; and in that said control means (104) is operatively connected to said code conversion means (101) and operable to calculate a voltage difference between said analog value at a predetermined code value and another analog value at another code value adjacent to said predetermined code value based on said second digital code, to calculate a differential non-linearity error from said voltage difference using an approximation formula, and to obtain said correction value based on said differential non-linearity error. A D/A converter as claimed in claim 1, wherein said elements employed in said digital-to-analog conversion means (102) are capacitors, and wherein said digital-to-analog conversion means (102) further comprises:- an operational amplifier (OP) having a non-inverting input terminal, an inverting input terminal and an output terminal; a first switching means (S₁) provided between said inverting input terminal and said output terminal; a first capacitor (C₁) connected to said inverting input terminal at one end thereof and connected to a second switching means (S₃) for changing between an input terminal (I) and an output terminal (O) of said converter; a charging/discharging unit constituted by at least one capacitor (C₀, C₂) and a third switching means (S₂, S₄), each of said capacitors being connected to said inverting input terminal at one end thereof and having approximately an equivalent capacitance value to that of said first capacitor (C₁), said third switching means being selectively connected to said output terminal (O) or a reference voltage terminal (V ref ) or a ground terminal (G) in correspondence with a sampling mode or a conversion mode; and correction means comprising a plurality of supplementary capacitors (C₀₁ to C₀₄, C₂₁ to C₂₄) and corresponding switches (S₀₁ to S₀₄, S₂₁ to S₂₄), each supplementary capacitor and its corresponding switch being connected in series, said correction means being connected in parallel to each of said capacitors forming said charging/discharging unit (Figure 12). A D/A converter as claimed in claim 1 or 2, wherein said control means (104) comprises a microcomputer. A D/A converter as claimed in any preceding claim, wherein said control means (104) includes an error correction circuit. A D/A converter as claimed in claim 4, when appended to claim 2, wherein said error correction circuit comprises a comparator (132) for comparing a potential of said capacitors to be corrected with a reference voltage, an up-down counter (133) for counting up or down based on resultant data from said comparator, and a multiplication type D/A converter (131) for dividing an analog voltage supplied to said supplementary capacitors (CS a , CS b )(Figure 13). A method for detecting errors upon digital-to-analog conversion in a cyclic-type D/A converter, comprising steps of:- [i] converting a first digital code to an analog value; [ii] detecting said analog value and converting said analog value to a second digital code; [iii] calculating a correction value using at least said second digital code; and [iv] correcting values of elements employed in the D/A converter based on said correction value; characterised in that:- step [i] comprises converting a binary code into a three-states code as said first digital code, and then converting said three-states code to an analog value; and in that step [iii] comprises calculating a voltage difference between said analog value at a predetermined code value and another analog value at another code value adjacent to said predetermined code value based on said second digital code, calculating a differential non-linearity error from said voltage difference using an approximation formula, and obtaining said correction value based on said differential non-linearity error. A method as claimed in claim 6, applied to a cyclic-type D/A converter in which said elements are capacitors and said values are capacitances, wherein said predetermined code value is set to a position of 1/4 full-scale and said another code value adjacent to said predetermined code value is set to a position of 1/4 full-scale - 1 least significant bit, and wherein the D/A converter comprises one calculation circuit for repeatedly calculating said analog value. A method as claimed in claim 6, wherein said predetermined code value is set to the positions of 1/4 full-scale and 1/8 full-scale, and said another code value is set to the position of 1/4 full-scale - 1 least significant bit and 1/8 full-scale - 1 least significant bit, and wherein the D/A converter comprises two calculation circuits for repeatedly calculating said analog value.

Inventors: GOTOH KUNIHIKO, KOBAYASHI OSAMU, SHIMIZU YOSHIAKI, GOTOH, KUNIHIKO, KOBAYASHI, OSAMU, SHIMIZU, YOSHIAKI
Applicants: FUJITSU LTD, FUJITSU LIMITED
Application year: 1987
Main classification: H03M1
IPC codes: H03M1