CHIP-PLACEMENT MACHINE WITH TEST FUNCTION

Abstract: In an electronic chip placement machine (60) with test function, there is provided a suction nozzle (4) for holding a chip (5), a chip-regulation device (7) for regulating the attitude of the chip by clamping the chip at portions having no electrodes (5a, 5b), probes (l4a, l4b, l5a, l5b) for testing electrical characteristics of the chip. The tip portion (4a) of the suction nozzle is made of an insulating material such as a ceramic or a synthetic resin in order to avoid a short-circuit between electrodes of the chip through the nozzle. Therefore, the electrical characteristics of the chip can be tested without the separation between the nozzle and the chip. Furthermore, since one cycle of the operational process come to short, it is possible to provide chip-test and placement machines whose structure is simple. As a result, productivity and durability can also be increased.

Description: The invention relates to an electronic chip placement machine with test function according to the precharacterising part of claim 1. Such a machine is used for supplying and placing electronic chips such as resistors, capacitors, coils, diodes and transistors, and more particularly for placing the electronic chips with test of resistance, capacitance, or polarity thereof. Heretofore, when testing leadless electronic chips immediately before placing the electronic chips at a selected position on a printed circuit (P.C.) board, a particular process for testing the chips is required. Namely, a chip-placement machine of the prior art is required to have a special process in which, for instance, the chip in question is shifted by using another driving means to a check position with the chip beeing held by a suction nozzle, and the chip is shifted back to a placement position after testing. Therefore, there are drawbacks that the structure of the machine is complicated and that the manufacturing cost ist high. Moreover, in the case of testing a small electronic chip, both electrodes of the chip 1 are short-circuited through the portions 3a, 3b of a suction nozzle 2 which is made of a conductive metal as shown in Fig. 6. Therefore, it is required that the suction nozzle 2 has to be separated from the chip 1 when testing the same. Accordingly, as shown in Figs. 7A to 7G, an operational process of the suction nozzle 2 and a pair of probes 20a, 20b for testing are operated as follows: decent of the nozzle 7b, application of the probes 7c, ascent of the nozzle and test 7d, decent of the nozzle and suction 7e, withdrawal of the probes 7f, and ascent of the nozzle 7g. Thus, one cycle ofthe operational process required a long period of time so that there is a further disadvantage that productivity is decreased when the testing function is incorporated into the placement machine. An electronic chip placement machine of the above referenced kind is known from the EP-A-0 065 604. With this known chip placement machine testing means comprises fixed locater arms for engaging and centering the component along a first axis, pivotal locater arms for engaging and centering the component along a second axis, and means for completing an electrical circuit between the component and the controller after the centering to determine the orientation and electronic characteristics of the component. It is an object of the present invention to provide an electronic chip placement machine of the above referenced kind in which the influence of contact resistances between the probes of the respective clamping members and the electrodes of the chip are minimized. According to the invention, this object can be achieved in that the tip of said suction nozzle is nonconductive, in that said second pair of clamping members comprise first and second blocks made of an insulating material, each of said first and second blocks carrying two of said probes and in that the two probes of each block are respectively laid out for contacting the same electrode of the chip. Generally, in the case that a chip is tested using four probes, an error caused by a contact resistance between each electrode and each probe is smaller than that with a chip which is tested by using only two probes. As the suction nozzle is nonconductive the test can be carried out without separating the suction nozzle and the electronic chip. BRIEF DESCRIPTION OF THE DRAWINGS The object and features of the present invention will become more readily apparent from the following detailed description of the preferred embodiment taken in conjunction with the accompanying drawings in which: Fig. 1 is a perspective view of a chip placement machine with test function according to one embodiment of the present invention; Fig. 2 is a schematic view showing operations of a chip placement machine according to the embodiment of the present invention; Fig. 3 is an enlarged top plan view of a chip-regulation device in a chip placement machine according to the embodiment of the present invention; Figs. 4A-4C are top plan views showing operations of a chip-regulation device in a chip placement machine according to the embodiment of the present invention; Fig. 5 is a cross sectional view of a cip-regulating device and a suction nozzle in a chip placement machine according to the embodiment of the present invention; Fig. 6 is a cross sectional view of a chip-regulation device and a suction nozzle in a conventional chip-placement machine; Figs. 7A-7G show operational processes for testing electrical characteristics of an electronic chip according to the prior art; and Figs. 8A-8E show operational processes for testing electrical characteristics of an electronic chip according to the embodiment of the present invention. The same or corresponding elements and parts are designated at like reference numerals throughout the drawings. DETAILED DESCRIPTION OF THE INVENTION Fig. 1 is a perspective view of a chip placement machine 60 with test function according to one embodiment of the present invention. Numeral 4 denotes a suction nozzle for holding a chip by using vacuum, and this nozzle can be shifted along a predetermined locus. Numeral 6 is a chip supply portion, and numeral 7 denotes a chip-regulation device for regulating the chip. Numeral 8 denotes a P.C. board on which chips will be placed after the chips are brought from the chip supply portion 6. Numeral 9 denotes an X-Y table carrying the P.C. board 8. This X-Y table has means for arbitrarily adjusting the position of the P.C. board in the direction of references X and Y as shown in Fig. 2, so that a chip will be placed at a desired position. The chip placement machine 60 comprises a control unit 62 which controls various operating portions of the machine as will be described in detail hereinlater. Fig. 2 is a schematic view showing the operations of the chip placement machine according to the embodiment of the present invention. Electronic chips 5 are arranged and set on the chip supply portion 6 having means for arbitrarily shifting in the direction of Z. One of the chips 5 is held by the suction nozzle 4 at a holding or suction position A. This chip held at the tip of the suction nozzle is shifted along a circle including positions A-B-C-....-H-A by a nozzle driving means 30 as shown in Fig. 3. The chip-regulation device 7 is provided at the test position C, so that the regulation of the attitude of the chip 5 and a test of the electrical characteristics of the chip 5 are performed at this position C. Then, the chip 5 is placed on the P.C. board at the position E with the X-Y table carrying the P.C. board being shifted to a desired position. If the chip 5 is determined to be unacceptable as a result of testing, the chip 5 held by the suction nozzle 4 is shifted to an ejecting position G for ejection the same without placing the same on the P.C. board. In order that each chip is held by the suction nozzle 4, attitude-regulated, tested, and placed or ejected to form one cycle of operation, the above-mentioned various driving or shifting mechanisms are controlled by a controller 40 which is installed in the control unit 62. Fig. 3 is an enlarged top plan view of the chip regulation device 7 in the chip placement machine according to the embodiment of the present invention. Two pairs of slidable blocks 10a, 10b and 11a, 11b are provided so as to respectively freely slide in the directions of U and V which are perpendicular to each other. The slidable blocks 10a and 10b are respectively pressed by compression springs 12a and 12b, and the slidable blocks 11a and 11b are respectively pressed by compression springs 13a and 13b in the direction of the chip 5. The slideable blocks 10a, 10b, 11a, 11b and the nozzle 4 are made of an insulating material. The slidable block 10a comprises a fixed probe 14a and a slidable probe 15a which is biased by a compression spring 16a in the derection of the chip 5. The slidable block 10b comprises a fixed probe 14b and a slidable probe 15b which is biased by a compression spring 16b in the direction of the chip 5. The probes 14a and 15a respectively face the probes 14b and 15b as shown in Fig. 3. Figs. 4A-4C illustrate how the attitude of the chip 5 is regulated for testing the same. In Fig. 4A, the two pairs of the slidable blocks 10a, 10b and 11a, 11b are moved apart from each other and locked to wait for the chip 5 carried by the nozzle 4. After the chip 5 is positioned at a predetermined position, the chip 5 is clamped at portions having no electrodes 5a by the pair of slidable blocks 11a, 11b so that the attitude of the chip 5 is regulated as shown in Fig. 4B. Then, the electrodes 5a and 5b of the chip 5 are clamped by the probes 14a, 14b, 15a, 15b of the pair of slidable blocks 10a, 10b which have been released from the locked state thereof as shown in Fig. 4C. At this time, the electrical characteristics of the chip 5 are tested by a measuring circuit 41 included in the control unit 62 of Fig. 1. After the chip 5 is tested, the two pairs of slidable blocks 10a, 10b, and 11a, 11b are moved apart from each other again as shown in Fig. 4A. Turning back to Fig. 3, the tip end of the slidable probes 15a, 15b are respectively protruded by the force of the compression springs 16a, 16b relative to the fixed probe 14a, 14b, so that the chip 5 can securely be clamped by supporting four points thereof even if the configuration of the electrodes 5a is irregular. Generally, in the case that a chip is tested using four probes, an error caused by a contact resistance between each electrode and each probe is smaller than that resulted when the chip is tested using only two probes. According to the above-described preferred embodiment of the present invention, the chip 5 can be tested using four probes. More specifically, a Kelvin bridge can be formed if one pair of the probes are used for applying current to first and second electrodes and the other pair of the probes are used for detecting a voltage across third and fourth electrodes. As a result, it is possible to test not only low impedance chips but also high impedance chips with high precision. Fig. 5 is a cross-sectional view of the chip-regulation device 7 and the suction nozzle 4 in the chip placement machine according to the embodiment of the present invention. The chip 5 being held by the suction nozzle 4 is clamped by the probes 14a, 14b, 15a, and 15b for the testing of the electrical characteristics thereof. A tip end portion 4a of the nozzle 4 is made of an insulating material, and is fixed to a shank portion 4b. Therefore, the electrodes 5a and 5b are never short-circuited via the suction nozzle 4 when testing the electrical characteristics of the chip 5. As a result, it is unnecessary that the suction nozzle 4 be separated from the chip 5 during testing. As will be seen from the above results, only the operations, i.e. decent of the nozzle, application of the probes and chip test, withdrawal of the probes, and ascent of the nozzle, are required as shown in Figs. 8A-8E exhibiting operational processes according to the embodiment of the present invention. Thus, one cycle of the operational process come to short because the electrical characteristics of the chip 5 can be tested without the separation between the nozzle 4 and the chip 5. As a result, it is possible to provide chip test and placement machines whose structure is simple, so that productivity and durability can also be increased. In this embodiment of the present invention, although the tip end of the nozzle 4 is made of an insulating material, a metallic nozzle being coated with a ceramic or with a synthetic resin having desired durability and strength may also be applied.

Claims: An electronic chip placement machine with test function, comprising: first means (6) for forwarding an electronic chip (5) to a holding position; suction means (4) for holding an electronic chip (5) using vacuum, said suction means including a suction nozzle (4) arranged to be reciprocally moved; driving means for shifting said suction nozzle (4) so that said suction nozzle (4) is placed at positions including said holding position, a test position, a placement position, and an ejecting position; second means (11a, 11b, 10a, 10b) for clamping and ejecting said chip (5), said second means (11a, 11b, 10a, 10b) having, a first pair of clamping members (11a, 11b) for clamping said chip (5) at portions having no electrode (5a, 5b) thereby regulating the attitude of said chip (5), and a second pair of clamping members (10a, 10b) for clamping said chip (5) at said electrodes (5a, 5b), said second pair of clamping members (10a, 10b) having probes (14a, 15a, 14b, 15b) for establishing electrical connection with said electrodes (5a, 5b); third means (62, 41) connected to said probes (14a, 15a, 14b, 15b) for testing electrical characteristics of said chip (5) and for determining whether a tested chip (5) is acceptable or not at said test position; fourth means (9) for shifting a member (8) on which said chip (5) is to be placed so that said chip (5) is placed at a desired position on said member (8) when said chip (5) is at said placement position; and fifth means (62) for controlling said driving means, said first to fourth means (6; 11a, 11b, 10a, 10b; 62, 41; 9) so that said chip (5) is placed at a given position on said member (8) or ejected after testing, characterized in that, the tip (4a) of said suction nozzle (4) is nonconductive, in that said second pair of clamping members comprise first and second blocks (10a, 10b) made of an insulating material, each of said first and second blocks (10a, 10b) carrying two of said probes (14a, 15a, 14b, 15b) and in that the two probes (14a, 15a, 14b, 15b) of each block (10a, 10b) are respectively laid out for contacting the same electrode (5a, 5b) of the chip (5). An electronic chip placement machine with test function as claimed in Claim 1, characterized in that one (15a, 15b) of said two probes (14a, 15a, 14b, 15b) carried by each of said first and second blocks (10a, 10b) is slidablly movable and the other (14a, 14b) of said two probes (14a, 15a, 14b, 15b) is fixed to said block (10a, 10b). An electronic chip placement machine with test function as claimed in Claim 1, characterized in that a distance between said first pair of probes (15a, 15b) is shorter than that of said second pair of probes (14a, 14b). An electronic chip placement machine with test function as claimed in Claim 1, characterized in that said tip (4a) of said suction nozzle (4) is made of a ceramic. An electronic chip placement machine with test function as claimed in Claim 1, characterized in that said tip (4a) of said suction nozzle (4) is made of a synthetic resin. An electronic chip placement machine with test function as claimed in Claim 1, characterized in that said tip (4a) of said suction nozzle (4) is coated with a ceramic.

Inventors: FUJIWARA, MUNEYOSHI, MISAWA, YOSHIHIKO, MORITA, KOICHI, SENO, MAKITO, TAKAICHI, SUSUMU
Applicants: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Application year: 1987
Main classification: H05K13
IPC codes: H05K13