LOGIC CIRCUIT

Abstract: A logic circuit which can easily perform a logical function test is enclosed. A first type of the logic circuit comprises a combina­ tional circuit (3) having a plurality of internal nodes (N₁, ...), node data latch circuits (L₁₁, ...) respectively connected to the pre­ selected internal nodes for latching their logical states, and readout means (B) for reading data latched in the latch circuits by using a data transfer clock (DTXCK1). Further, there may be adopted implementation such that the node data latch circuit functions to allow a predetermined node to be placed in the logical state latched in the node data latch circuit. Thus, this first type of the logic circuit makes it possible to monitor even logical states of internal nodes of the combinational circuit. A second type of the logic circuit comprises a combinational circuit (101), a plurality of memory means (102-1, ...), designation means (103-1, ...) e.g. flip-flops provided per each memory means for designating whether an access to the memory means is enabled or not, access means (105, 106) for providing an access to the memory means designated by the designation means, and means (107, 108) for setting designation data to the designation means. Further, there may be provided an address decoder for decoding addresses assigned to the respective designation means. Thus, the second type of the logic circuit can implement a logical function test with less additional circuitry and wiring and in a simplified control mode. In addition, the combination of the first and second types of the logic circuits is also possible.

Description: BACKGROUND OF THE INVENTION The present invention relates to logic circuits which can easily effect a logical function test. The test of a logic integrated circuit is generally classified into a dc characteristic test for testing a dc characteristic of the circuit, an ac characteristic test for testing an ac characteristic thereof, and a logical function test for testing a logical function thereof. Particularly, the logical function test is necessarily carried out not only in a quality decision test in a massproduction line, but also in an acceptance test for a user. It is important how to properly and efficiently perform such a logical function test. Where a test in a massproduction line is carried out, there has been adopted in the art a method of bringing a needle into direct contact with a semiconductor chip on which logic integrated circuits are formed to monitor logical states of required nodes. However, with respect to logical integrated circuits which have been increasingly miniatuarized, it has been extremely difficult to precisely bring a needle into contact with nodes to be monitored with such a method. Further, there are recently many cases where logic integrated circuits are designed using an automatic placement and routing program. As a result, it has been also difficult to precisely specify a desired node. As stated above, there exist many drawbacks with the method of bringing a needle into direct contact with a semiconductor chip to monitor the status of required nodes. For facilitating the logical function test, there has been known a method called the LSSD (Level Sensitive Scan Design) technique. According to this method, flip-flops are added to registers in the logic circuit to connect these flip-flops in series, thus to monitor data of respective registers. However, this method can monitor only the data of registers. Namely, only the data indicative of the result output from a combinational circuit can be monitored. Accordingly, where the data indicative of the result is not correct, there is difficulty in specifying which portion in the combinational circuit is failured on the basis of the data indicative of the result. Particularly, in the case of large scale combinational circuits, such a difficulty is serious. For another system for facilitating the logical function test, the scan pass system and the parallel scan pass system have been known in the art. According to the scan pass system, flip-flops are connected to memory elements e.g. flip-flops or registers etc. connected to a combinational circuit in a logic circuit, respectively, and these flip-flops are connected so as to constitute a shift register. At the time of the logic function test, first is to input initial data into these memory elements in a test mode to perform a required operation with the combinational circuit in an operational mode, thereafter to read data indicative of the result from these memory elements in the test mode for a second time. This scan pass system is an extremely effective method in the case where flip-flops are distributed in the logic circuit. However, this system requires the provision of a flip-flop per each flip-flop in the logic circuit, with the result that an additional circuit becomes large when a logic circuit having a large number of flip-flops is used. On the other hand, the parallel scan system is a system adapted to assign addresses to memory elements e.g. flip-flops or registers etc. to provide an access to these memory elements by making use of the addresses. However, with this system, there is a need to assign addresses to the memory elements from the external or to set addresses to an address register. In addition, for providing an access to the respective memory elements, a circuit for decoding addresses and wiring for delivering an access enable signal to the respective memory elements are required. For this reason, where logic circuits of the parallel scan system are integrated, external terminals for delivering addresses to the memory elements are required and an additional internal wiring is increased. US-A-3 961 254 describes an LSI semiconductor device which includes a memory array incorporating address, data and buffer registers and associated combinatorial and/or sequential logic circuitry. To facilitate testing, means which bypass the associated logic circuitry are provided for scanning information directly into the address and data registers. The information so introduced is shifted through the register strings. The information scanned into the registers may be scanned out to determine whether there is a defect or problem in the register strings. Output levels from the array are compared with an expected output. SUMMARY OF THE INVENTION A first object of the present invention. is to provide logic circuits making it possible to monitor even logical states of nodes in a combinational circuit, thus to facilitate a logical function test. A second object of the present invention is to provide logic circuits which require less additional circuits and wiring and are controlled in a simplified manner, thus making it possible to easily carry out a logical function test. In accordance with the invention, the abovementioned objects are solved by the provision of a logic circuit comprising a combinational circuit having a plurality of internal nodes of further combinational circuits; and a plurality of memory means respectively connected to selected ones of said plurality of internal nodes and means for setting data to said memory means, characterized by : control signal lines provided for each of the plurality of memory means for designating whether an output of signals from selected ones of said further combinational circuits to the respective nodes is disabled or not; and access means for determining whether data is read from said selected ones of said plurality of internal nodes to said memory means or data is written thereinto from said memory means. The objects are also solved by a logic circuit including: a combinational circuit, a plurality of memory means respectively connected to said combinational circuit, and access means for reading data from the memory means or writing data thereinto; characterized by; designation means provided for each of said plurality of memory means for designating whether an access to said memorymeans is enabled or not; and means for setting designation data to said designation means. BRIEF DESCRIPTION OF THE DRAWINGS In the accompanying drawings: Fig. 1 is a circuit diagram illustrating a first example of a logic circuit ; Fig. 2 is a circuit diagram illustrating a second example of a logic circuit; Fig. 3 is a circuit diagram illustrating a third example of a logic circuit; Fig. 4 is a circuit diagram illustrating a fourth example of a logic circuit; Fig. 5 is a circuit diagram illustrating a first embodiment of a logic circuit according to the present invention; Fig. 6 is a circuit diagram illustrating a second embodiment of a logic circuit according to the present invention; Fig. 7 is a circuit diagram illustrating a third embodiment of a logic circuit according to the present invention; Fig. 8 is a circuit diagram illustrating a fourth embodiment of a logic circuit according to the present invention; Fig. 9 is a circuit diagram illustrating a fifth embodiment of a logic circuit according to the present innvention; Fig. 10 is a circuit diagram illustrating a sixth embodiment of a logic circuit according to the present invention; and Fig. 11 is a circuit diagram illustrating a seventh embodiment of a logic circuit according to the present invention. DETAILED DESCRIPTION OF THE INVENTION The present invention will be described in detail in connection with preferred embodiments with reference to accompanying drawings. Initially, referring to Fig. 1, there is shown a first example of a logic circuit. This logic circuit essentially functions to effect logical operation of an input data D in from the external to output the result which has undergone the logical operation as an output data D out . To realize this function, the logic circuit comprises a register 1 for storing the input data D in , a large scale combinational circuit 3 for effecting logical operation, and a register 2 for storing the output data D out . The large scale combinational circuit 3 is divided into small scale combinational circuits 4, 5, 6 and 7 according to functions. The combinational circuit 3 is provided therein with an internal node N₁ of the combinational circuits 4 and 6, an internal node N₂ of the combinational circuits 5 and 6, and an internal node N₃ of the combinational circuits 6 and 7. Each wiring drawn from these preselected internal nodes N₁, N₂ and N₃ is connected to data latch circuits L₁₁ to L 1ℓ , L₂₁ to L 2m , and L₃₁ to L 3n . More particularly, the data latch circuits L₁₁ to L 1ℓ are connected to respective bits of the internal node N₁ of ℓ bits. Likewise, the data latch circuits L₂₁ to L 2m are connected to respective bits of the internal node N₂ of m bits. In addition, the data latch circuits L₃₁ to L 3n are connected to respective bits of the internal Node N₃ of n bits. These data latch circuits L₁₁ to L 1ℓ , L₂₁ to L 2m and L₃₁ to L 3n are connected in series so as to constitute a shift register, respectively. To each data latch circuit, a latch signal Φ L and a data transfer clock DTXCKl are input. The operation of the logic circuit thus configured will now be described. At the time of a logical function test, the latch signal Φ L is output at a predetermined timing for latching data. Thus, logical states of the respective nodes N₁ to N₃ are latched in the data latch circuits L₁₁ to L 3n . Subsequently, when the data transfer clock DTXCKl is output, data thus latched are sequentially transferred in the data latch circuits L₁₁ to L 3n . Then, they are output bitwise through a common bus B as monitor data D mon . As stated above, the logic circuit according to this example can read the logical states of the internal nodes in the large scale combinational circuit from the external, thus to recognize which portion in the large scale combinational circuit has failed. A second example of a logic circuit will be described with reference to Fig. 2. This example is characterized in that data latch circuit L₁, L₂ and L₃ are constituted with registers of the same bit number as the internal nodes N₁, N₂ and N₃. Namely, the data latch circuit L₁ has ℓ bits, the data circuit L₂, m bits, and the data circuit L₃, n bits. To these data latch circuits L₁, L₂ and L₃, the latch signal Φ L and the data transfer clock DTXCKl are input. Data latched in the data latch circuits L₁, L₂ and L₃ by the latch signal Φ L are transferred in the data latch circuits L₂ to L₃ in synchronism with the data transfer clock DTXCKl. The data thus transferred is read at the same time with plural bits being as a unit through the common bus B as the monitor data D mon . As stated above, the logic circuit according to this example is configured to read a test data at the same time with plural bits being as a unit, thus making it possible to read data within a short time period. A third example of a logic circuit will be described with reference to Fig. 3. In this example, with respect to the data latch circuits L₁₁ to L 1ℓ , L₂₁ to L 2m and L₃₁ to L 3n of one bit configuration, tristate buffers T₁₁ to T 1ℓ , T₂₁ to T 2m and T₃₁ to T 3n functioning as switching gates are provided, respectively. Control signals for these tristate buffers T₁₁ to T 3n are input from a decoder 8. The decoder 8 is operative to decode an address signal AD as input to output a control signal to the tristate buffer coupled to the data latch circuit designated by the address. Thus, data of the data latch circuit designated is output as monitor data D mon through the common bus B. The logic circuit according to this example can directly designate an arbitrary data latch circuit, thus to efficiently read the test data. A fourth example of a logic circuit will be described with reference to Fig. 4. This example is characterized in that data latch circuits L₁, L₂ and L₃ are constituted with registers of ℓ, m and n bits of the internal nodes N₁, N₂ and N₃, respectively, and that tristate buffers T₁, T₂ and T₃ have corresponding ℓ, m and n buffers, respectively. An address signal AD input is decoded in the decoder 8. A decoded signal is input to a corresponding one of tristate buffers T₁, T₂ and T₃. Thus, a stristate buffer coupled to the data latch circuit designated by the decoded signal is placed in condition for connection. The data from the data latch circuit is output as monitor data D mon of plural bits through the common bus B. As stated above, this example can directly designate an arbitrary test data as a group of plural bits, thus to efficiently read the test data with high speed. A preferred first embodiment of a logic circuit according to the present invention will be described with reference to Fig. 5. This embodiment is proposed with a view to improving the above-mentioned second example and is characterized in that not only the registers L₁, L₂ and L₃ latch logical states of the nodes N₁, N₂ and N₃, but also allows logical states of the nodes N₁, N₂ and N₃ to be in conformity with those latched in the registers L₁, L₂ and L₃. Since the registers L₁, L₂ and L₃ are connected in series, an input data is sequentially transferred in the registers L₁, L₂ and L₃ in synchronism with the data transfer clock DTXCKl. The registers L₁, L₂ and L₃ are connected to the combinational circuits 4, 5 and 6 by means of control signal lines C L1 , C L2 and C L3 , respectively. Where a logic signal is written from the registers L₁, L₂ and L₃ into the nodes N₁, N₂ and N₃, an output of signals from the combinational circuits 4, 5 and 6 to the respective nodes N₁, N₂ and N₃ is disabled by control signals delivered through the above-mentioned control signal lines C L1 , C L2 and C L3 . Further, to the registers L₁, L₂ and L₃, flip-flops FF₁, FF₂ and FF₃ are connected, respectively. These flip-flops FF₁, FF₂ and FF₃ are set or reset in response to a set signal ST or a reset signal RST. Whether these registers L₁, L₂ and L₃ read logic signals of the nodes N₁, N₂ and N₃ or write logic signals into the nodes N₁, N₂ and N₃ is determined by the fact that the flip-flops FF₁, FF₂ and FF₃ are set or reset. As stated above, this embodiment makes it possible to read the logical states of the nodes and to allow the nodes to be placed in a desired logical state, thus to realize various logical function tests. A preferred second embodiment of a logic circuit according to the present invention will be described with reference to Fig. 6. In this embodiment, the registers L1, L2 and L3 are not connected in series as in the above-mentioned first embodiment, but the respective registers are independently connected to the bus line B. Whether data is read from which register (L₁, L₂ or L₃) or is written into which register is determined by a signal decoded from the decoder 8, a readout signal TXR and a write signal TXW. The decoder 8 decodes addresses indicative of location of the registers L₁, L₂ and L₃ to output signals thus decoded to the respective registers L₁, L₂ and L₃. As stated above, even in the case where there exist a large number of hards to be monitored, this embodiment can designate a desired hard by making use of address to write data into the register or read it therefrom, thus realizing a high speed logical function test. As seen from the foregoing description, the logic circuits according to the aforementioned first and second embodiments can securely monitor internal nodes of the combinational circuit. Accordingly, where a logic circuit having a large scale combinational circuit is evaluated, by dividing the combinational circuit into suitable unit circuits to monitor nodes of respective unit circuits, it is possible to efficiently perform failure analysis with a less number of test vectors, thus facilitating the logical function test. A preferred third embodiment of a logic circuit according to the present invention will be described with reference to Fig. 7. In this logic circuit, an essential logical operation is performed by a combinational circuit 101. To the combinational circuit 101, registers 102-1 to 102-n of multibits are connected by means of input signal lines 109-1 to 109-n and output signal lines 110-1 to 110-n. Input data to the combinational circuit 101 and output data therefrom etc. are stored in these registers 102-1 to 102-n. To the registers 102-1 to 102-n, a clock PCK for logical operation is input to the registers 102-1 to 102-n. Further, to the registers 102-1 to 102-n, a control signal line 105 and a data bus 106 are connected wherein the control signal line 105 is used for use in input of a write signal TXW for test and a readout signal TXR for test, and the data bus 106 is used for input/output of a data signal DATA. In a test mode, by inputting the write signal TXW for test, the data DATA is written into the registers 102-1 to 102-n, and by inputting the readout signal TXR for test, the data DATA is read out from the registers 102-1 to 102-n. Furthermore, to the registers 102-1 to 102-n, flip-flops (FF) 103-1 to 103-n are connected through signal lines 111-1 to 111-n, respectively. These flip-flops 103-1 to 103-n are provided for designating whether an access to the registers 102-1 to 102-n is enabled or disabled. To the flip-flops 103-1 to 103-n, a reset signal line 107 and a set signal line 108 are connected. By the reset signal RST and the set signal ST, designation data is set to the flip-flops 103-1 to 103-n. The logic circuit is thus configured and an example of the operation thereof in a test mode will now be described wherein the operation is carried out to write data into e.g. the register 102-1 to perform logicala operation in the combinational circuit 101, thereafter to read the data representing the result of the logical operation from the register 102-2. First is to reset all the flip-flops 103-1 to 103-n by the reset signal RST, thereafter to set only the flip-flop 103-1 by the set signal ST. Thus, an access to the register 102-1 is enabled while an access to other registers 102-2 to 102-n is disabled. Next is to input the write signal TXW for test and a predetermined data signal DATA to write a predetermined data into the register 102-1. Subsequently, the test mode is switched to an operational mode to perform logical operation in the combinational circuit 101 by using data of the register 102-1. After the data indicative of the result is output to the register 102-2, the operational mode is again switched to the test mode. Next is to reset the flip-flop 103-1 by the reset signal RST, thereafter to set the flip-flop 103-2 by the set signal ST. Thus, only the register 102-2 is placed in accessible condition. Finally, the readout signal TXR for test is input, thereby to read the data indicative of the result from the register 102-2 through the data bus 106. As stated above, this embodiment can provide an access to an arbitrary register by only adding an extremely less number of flip-flops as compared to the number of whole bits of the register. A preferred fourth embodiment of a logic circuit according to the present invention will be described with reference to Fig. 8. This embodiment differs from the third embodiment in the method of setting deisgnation data to the flip-flops 103-1 to 103-n. In this embodiment, the flip-flops 103-1 to 103-n are connected in series and a set data signal line 112 is connected to the first stage of the flip-flop 103-1. The setting of the designation data to the flip-flops 103-1 to 103-n is made by serially inputting the set data STDT from the set data signal line 112. For instance, in the case where the flip-flop 103-1 is required to be set for enabling only the register 102-1, such a set operation can be effected by sequentially inputting the set data STDT to the set data signal line 112. According to this embodiment, it is possible to set designation data to the flip-flops with an extremely reduced additional wiring. A preferred fifth embodiment of a logic circuit according to the present invention will be described with reference to Fig. 9. In this embodiment, flip-flops 103-1 to 103-n coupled to the registers 102-1 to 102-n are connected in a ring-shaped manner. Namely, the flip-flops 103-1 to 103-n are connected in series, and the final stage of the flip-flop 103-n is connected to the first stage of the flip-flop 103-1. Further, to these flip-flops 103-1 to 103-n, a shift clock SCK is input through a signal line 113. In addition, a set signal SS for designation data is input to the respective flip-flops 103-1 to 103-n through the signal line 114. This signal line 114 is connected to e.g. a set input terminal S of the flip-flop 103-1 and reset input terminals R of the flip-flops 103-2 to 103-n. Accordingly, when the set signal SS is input, only the flip-flop 103-1 is set to represent logical "1" while other flip-flops 103-2 to 103-n are all reset to represent logical "0". When other flip-flops are required to be set, a predetermined number of pulses are input as the shift clock SCK to transfer the designation data by turns. For instance, in the case where it is required to set the fourth flip-flop 103-4 to provide an access to the register 102-4, first is to input the set signal SS to set the flip-flop 103-1 to a logical "1", thereafter to input the shift clock SCK of three pulses to transfer the designation data by three srtages. Thus, this embodiment can set data to an arbitrary flip-flop with less signal lines and simple control signals. A preferred sixth embodiment of a logic circuit according to the present invention will be described with reference to Fig. 10. In this embodiment, there is provided a decoder 116 for setting designation data to the flip-flops 103-1 to 103-n. This decoder 116 is operative to decode an address ADRS input through a signal line 115 to output a set signal to the flip-flop assigned to the address. For an address for designating a flip-flop, high-order bits of addresses successively attached to the registers 102-1 to 102-n may be used, or addresses individually determined with respect to the flip-flops 103-1 to 103-n may be used. To the set input terminals S of the flip-flops 103-1 to 103-n, signal lines 117-1 to 117-n from the decoder 116 are connected, respectively. Further, to the reset input terminals R thereof, a reset signal line 107 is commonly connected. First is to reset all the flip-flops 103-1 to 103-n by the reset signal RST, thereafter to input an address ADRS of the flip-flop to be set to the decoder 116. The decoder 116 decodes the address ADRS thus input to output a set signal to a predetrermined flip-flop. As stated above, this embodiment is configured to input an address to the flip-flop to be set, thereby making it possible to directly set a desired flip-flop, thus to quickly carry out the logical function test. As seen from the foregoing description, the logic circuits according to the third to sixth embodiments can provide an access to only an arbitrary memory means with less additional circuits and additional wiring, thus easily and promptly implementing the logical function test. A preferred seventh embodiment of a logic circuit according to the present invention will be described with reference to Fig. 11. This embodiment is configured by combining the first example with the third embodiment of the present invention. Similarly to the first example, the combinational circuit 3' includes small scale combinational circuits 4', 5', 6' and 7'. Each wiring is drawn from the internal node N₁ of the combinational circuits 4' and 6', the internal node N₂ of the combinational circuits 5' and 6' and the internal node N₃ of the combinational circuits 6' and 7', and is connected to the data latch circuits L₁₁ to L 1ℓ , L₂₁ to L 2m , and L₃₁ to L 3n . More particularly, the data latch circuits L₁₁ to L 1ℓ are connected to respective bits of the internal node N₁ of ℓ bits. Likewise, the data latch circuits L₂₁ to L 2m are connected to respective bits of the internal node N₂ of m bits. In addition, the data latch circuits L₃₁ to L 3n are connected to respective bits of the internal node N₃ of n bits. These data latch circuits L₁₁ to L 1ℓ , L₂₁ to L 2m and L₃₁ to L 3n are connected in series so as to constitute a shift register, respectively. To each data latch circuit, a latch signal Φ L and a data transfer clock DTXCKl are input. Further, to the registers 1' and 2', the control signal line 105 and the data bus 106 are connected wherein the control signal line 105 is used for use in input of a write signal TXW for test and the readout signal TXR for test, and the data bus 106 is used for input/output of the data signal DATA. In a test mode, by inputting the write ingnal TXW for test, the data DATA is written into the registers 1' and 2', and by inputting the readout signal TXR for test, the data DATA is read out from the registers 1' and 2'. Furthermore, to the registers 1' and 2', flip-flops (FF) 103-1 to 103-2 are connected through signal lines 111-1 and 111-2, respectively. These flip-flops 103-1 and 103-2 are provided for designating whether an access to the registers 1' to 2' is enabled or disabled. To the flip-flops 103-1 and 103-2, the reset signal line 107 and the set signal line 108 are connected. By the reset signal RST and the set signal ST, designation data is set to the flip-flops 103-1 to 103-2. Since the operation of this embodiment is the same as that of the third embodiment, its explanation will be omitted. The logic circuit according to this embodiment makes it possible to monitor internal nodes in the combinational circuit and to provide an access to the registers.

Claims: A logic circuit comprising: a combinational circuit (3) having a plurality of internal nodes (N₁,...) of further combinational circuits (4,5,6,7); and a plurality of memory means (L₁, ...) respectively connected to selected ones of said plurality of internal nodes (N₁, ...) and means (DATA) for setting data in said memory means (L₁, ...), characterized by : control signal lines (CL₁, ...) provided for each of the plurality of memory means (L₁, ...) for designating whether an output of signals from selected ones (4, 5, 6) of said further combinational circuits (4, 5, 6, 7) to the respective nodes (N₁, ...) is disabled or not; and access means (FF₁, ...) for determining whether data is read from said selected ones of said plurality of internal nodes (N₁, ...) to said memory means (L₁, ...) or data is written thereinto from said memory means (L₁, ...). A logic circuit according to claim 1, characterized in that said plurality of memory means (L₁, ...) are connected in series so that data may be serially inputted thereto or outputted therefrom. A logic circuit according to claim 1, characterized in that , said setting means (DATA) further comprises an address decoder (8) for decoding addresses indicative of location of said memory means (L₁, ...), data being inputted into the memory means (L₁, ...) selected by a signal decoded by said address decoder (8) or being outputted therefrom. A logic circuit including: a combinational circuit (101; 3') a plurality of memory means (102-1, ...;1',2') respectively connected to said combination circuit (101; 3'), and access means (105, 106) for reading data from the memory means (102, ...;1',2') or writing data thereinto; characterized by ; designation means (103-1, ...) provided for each of said plurality of memory means (102-1, ...;1',2') for designating whether an access to said memory means (102-1, ...;1',2') is enabled or not; and means (107, 108; 112; 113; 116) for setting designation data to said designation means (103-1, ...). A logic circuit according to claim 4, characterized by , latch circuits (L₁₁, ...) respectively connected to preselected ones of internal nodes (N₁, ...) of said combinational circuit 3' for latching logical states of said internal nodes (N₁, ...); and read-out means (B) for reading the data latched in said latch circuits (L₁₁, ...). A logic circuit according to claim 5, characterized in that said latch circuits (L₁₁, ...) are connected in series, said read-out means (B) sequentially transferring data latched in said latch circuits (L₁₁, ...) in synchronism with a data transfer clock (DTXCKl) to read the data transferred. A logic circuit according to claim 5, characterized in that said read-out means (B) comprises a bus line (B) for reading said data in said latch circuits (L₁₁, ...), an address decoder (8) for decoding addresses indicative of location of said latch circuits (L₁₁, ...), and gates (T₁₁, ...,T₁, ...) interconnected between said latch circuits (L₁₁, ...) and said bus line (B) for effecting switching operation in response to signals decoded from said address decoder (8), thereby said read-out means (B) reading data in the latch circuits (L₁₁, ...) designated by said address from said bus line (B). A logic circuit according to claim 4 or 5, characterized in that said plurality of designation means (103-1, ...) are connected in series, said setting means (107, 108; 112; 113; 116) serially inputting designated data in sequence to said plurality of designation means (103-1, ...) connected in series. A logic circuit according to claim 4 or 5, characterized in that said plurality of designation means (103-1, ...) are connected in a ring-shaped manner, said setting means (107, 108; 112; 113; 116) sequentially transferring designation data set in said plurality of designation means (103-1, ...). A logic circuit according to claim 4 or 5, characterized in that said setting means (107, 108; 112; 113; 116) has means (116) for decoding addresses of said plurality of designation means (103-1, ...), designation data being set to designation means (103-1, ...) assigned to an address decoded by said decoding means (116).

Inventors: KANUMA, AKIRA, YAGUCHI, TOSHIYUKI
Applicants: KABUSHIKI KAISHA TOSHIBA
Application year: 1986
Main classification: G01R31
IPC codes: G01R31