RF INPUT DRIVE SATURATION CONTROL LOOP

Abstract: A system for optimizing the RF input drive to a TWT amplifier (50) over a frequency band of interest. The system includes a microprocessor-based controller (50), and RF detector (40) for detecting the TWT output, and a variable attenuator (20) for adjusting the input drive to the TWT. The controller (50) comprises an analog-to-digital converter (54) for converting the video detector signals and providing digital RF level signals which are representative of the TWT output power level. Frequency data is also provided to the controller indicating the frequency of the RF exciter signals driving the TWT. The controller (50) is, therefore, provided with frequency and RF level information, and is adapted to control the attenuator (20) to adjust the TWT input drive for optimum TWT output. The system is operable in a calibration mode wherein the controller (50) follows a calibration algorithm to determine the optimum attenuator (20) setting, resulting in the maximum RF output, for each frequency of interest. The optimum attenuator setting is stored in an EEPROM (62) for each drive frequency. The system i s further operable in a normal mode wherein the controller (50) sets the attenuator (20) at the predetermined optimum setting for the present exciter frequency.

Description: RF INPUT DRIVE SATURATION CONTROL LOOP The Government has rights to this invention pursuant to Contract No. DAAK20-81-C-0390 awarded by the Department of the Army. BACKGROUND OF THE INVENTION The present invention relates to control of the input drive level to traveling wave tube (TWT) amplifiers, and more particularly to improved techniques for optimizing TWT efficiency over a range of operating frequencies. TWT amplifiers are in wide use in a variety of appli- cations in which amplification of RF energy is required. Limitations imposed by TWT characteristics and manufacturing techniques result in a frequency-dependent input RF drive characteristic. These limitations can result in significant variations even between tubes of the same manufacturer and within the same manufacturing sequence. An optimum drive level for a given frequency will yield a maximum RF output power. Beyond that optimum drive level, defocusing and marked reduction of. beam current transmission and TWT efficiency occurs. This results in increased power dissipa- tion in the TWT RF structure and a decreased RF output power. Insofar as applicants are aware, in the past, fixed, frequency dependent RF attenuators or gain equalizers tuned for each TWT amplifier have been employed to provide the optimum input RF drive level to the TWT. An alternative is to provide means for flattening the TWT amplifier gain and RF input driver characteristics for the frequencies used. Both alternatives are relatively expensive and are affected by the performance degradation of the amplifier- during its operating life. It would therefore be an advance in the art to provide an automated system for optimizing the RF drive level to a TWT amplifier, which provides-an optimum RF drive for each frequency of concern, and allows for recalibration of the optimum RF drive as desired to compensate for aging of the TWT amplifier or other microwave chain components. SUMMARY OF THE INVENTION A system for optimizing the input RF drive to a TWT RF amplifier is disclosed. The system comprises a programmable attenuator for selectively controlling.the input drive level to the TWT, an RF detector for monitoring the output power level of the TWT, and a controller. The controller receives detector signals representative of the RF detector output and frequency signals representative of the RF exciter frequency to the TWT amplifier, and provides attenuator control signals to the programmable attenuator. The system is operable in a calibration mode, wherein for each exciter frequency of interest, the attenuator setting resulting in the maximum TWT output power is determined. These attenua¬ tor settings are then stored in memory, and are available for recall during the normal operating mode. In the normal mode, the system automatically sets the RF input drive at the optimum level, by setting the programmable attenuator to the predetermined setting corresponding to the present exciter frequency. The calibration mode may be rapidly repeated over the life of the TWT amplifier to accommodate changing characteristics as the elements of the TWT ampli- fier age or change due to other factors. BRIEF DESCRIPTION OF THE DRAWINGS These and other features and advantages of the present invention will become more apparent from the following detailed description of an exemplary embodiment thereof, as illustrated in the accompanying drawings, in which: Figure 1 is a graph representing a typical TWT output power saturation curve. Figure 2 is a simplified block diagram comprising the presently preferred embodiment of the invention. Figure 3 is a flow chart illustrative of the RF calibration operation throughout a range of frequencies. Figure 4 is a flow chart of the calibration operation at an individual frequency. Figure 5 is a plot of the TWT output power as a function of time, in which the digital attenuator employed in the preferred embodiment is progressively programmed to particular settings, illustrating the dynamic calibration process at a particular frequency. Figure 6 is a histogram of the number of samples for each attenuator setting counted during the dynamic cali¬ bration shown in Figure 5. Figure 7 is a composite block diagram of the preferred embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT The present invention comprises a system for optimiz¬ ing the RF input drive to a TWT amplifier. The following description is presented to enable a person skilled in the art to make and use the invention, and is provided in the context of a particular application and its requirements. Various modifications to the preferred embodiment may be apparent to those skilled in the art, however, and the present invention is not intended to be limited to the embodiment shown, but is intended to be accorded the widest scope consistent with the principles and novel features disclosed herein. Figure 1 represents a typical saturation curve for a TWT amplifier. The output power of the TWT is plotted as a function of the RF input drive power. It is seen that there is one optimum input drive power level which can result in maximum output power. When the TWT is overdriven, the output power is not only reduced, but the TWT operates in a less efficient mode. The preferred embodiment comprises a system for auto¬ matically adjusting the input drive level to a TWT amplifier as a function of the input RF drive frequency. A simplified block diagram is illustrated in Figure 2. The RF exciter signal is applied on line 5 to the RF solid state amplifier 10, whose output establishes an input RF drive level to the TWT 30. The power level of the RF exciter signal is typi- cally in the milliwatt range, insufficient to effectively drive the TWT. Thus, a solid state RF amplifier such as the amplifier 10 is normally employed to provide a first stage of amplification, resulting in an RF input power level to the TWT in the watt range. The output of the solid state amplifier 10 is coupled through variable attenuator 20 to the input of TWT amplifier 30. The output of the TWT 30 is passed through coupler device 40. The coupled output 40 is provided on line 41 to RF detector 42. The detector output is a video signal whose level is representative of the detected power level from coupler 40; this video signal is provided to the controller 50. The controller 50 in turn provides a control signal to the variable attenuator 20, controlling the attenuation setting, dependent on the frequency of the RF input signal. The frequency of the RF exciter signal is provided as a digital frequency code word on line 45 to controller 50. The digital attenuator 20 sets the TWT input drive level. The setting of attenuator 20 is controlled by a six-bit control word, and in the preferred embodiment has an attenuation resolution of 0.25 dB per step with a 15 dB range of control. The system has two modes of operation, the calibration mode and the normal mode. In the calibration mode, the system determines the attenuator setting to obtain an optimum RF input level resulting in the maximum TWT power output. The attenuator setting resulting in the -optimum TWT output power for each frequency is stored in a non-volatile memory. In the normal mode, the controller 50 automatically sets the attenuator 20 to the calibrated setting for the present exciter frequency. A change- in frequency, initiated by the external RF exciter system, is communicated to the controller 50 via the digital frequency code word on line 45. Alternatively, the system may include other means for determining the exciter frequency. The drive control system operates in the calibrate mode as a "closed-loop" controller to- optimize the TWT RF input drive for any frequency applied to its input. This is accomplished by using a calibration algorithm to increase the RF input drive to the TWT from a minimum (underdrive) to the optimum setting resulting in the optimum TWT output power level for each exciter frequency by varying the attenuator 20. The controller 50 continues to vary the drive about this optimum value until a predetermined number of samples of the TWT output power have been taken, and the corresponding attenuator setting resulting in the optimum output power is determined and " stored for use during the normal mode. The resulting calibration values are stored in a nonvolatile memory, such as an electrically erasable pro¬ grammable read only memory (EEPROM) comprising controller 50. In the normal mode, the attenuator 20 is set in accor¬ dance with the stored EEPROM value which corresponds to the present frequency, thus maintaining optimum RF drive across the entire frequency band of interest. The general calibration algorithm is illustrated in the flow chart of Figure 3. After a stablization delay to allow the TWT cathode current controller to stablize to the desired cathode current level, at step 103, the TWT system is checked to determine whether the system is in condition for calibration. For example, high voltage and cathode current must be applied to the TWT and the system TWT "radiate" command selected. If the calibration requirements are not met, the algorithm, branches to return step 140, terminating the calibration process. With the calibration requirements met at step 103, then at step 105, preliminary adjustments are made to the timing of the RF input drive pulses to the TWT as well as the timing of the TWT cathode current pulses. In the application of the preferred embodiment, the TWT amplifier is employed in a pulsed operation. Thus, to obtain TWT output power, the RF drive pulse and cathode current pulse should coincide. The preliminary timing adjustment con¬ ducted at step 105 substantially aligns the timing of the two pulses so that there will be TWT output power during the calibration mode. In steps 110 and 115, the system "radiate" command and the frequency code word provided to the controller 50 are tested. If, at step 110, the radiate command is no longer selected, the calibration mode is terminated; otherwise, RF drive calibration will be performed at each exciter fre¬ quency. Thus, at step 115 the frequency code word is tested to determine if the frequency has already been calibrated. If the frequency code has not changed from the frequency at which the previous calibration was performed, the algorithm branches back to step 110 in a delay loop, until the exciter frequency is changed to a new frequency not yet calibrated. At step 120, the calibration for the optimum drive level for the selected frequency is performed. This step is described in more detail hereinbelow with respect to the flowchart of Figure 4. At step 125, the frequency code word is tested to determine whether the calibration has been performed at all of the frequencies of interest in the frequency band. This may be done by comparing the number of exciter frequencies at which the calibration has been performed with the predetermined total number of frequencies to be calibrated. If this is not the last frequency, the algorithm branches back to step 110, and the loop is repeated from that point for another exciter frequency. After calibration has been performed at all fre¬ quencies .of interest, final adjustment of timing is per¬ formed at step 130 to align the cathode current and RF input pulses. The specific details by which the final timing adjustment is carried out per se are not considered essen- tial to the practice of the present invention. The results of both drive level and timing calibrations are then trans¬ ferred from the controller buffer memory to the EEPROM for storage at step 135. The calibration algorithm is exited at step 140. Figure 4 is a flowchart illustrating the sequence of operations for performing the input drive calibration at a single RF exciter frequency (step 120 of Figure 3) . The attenuator 20 employed in the preferred embodiment may be set to sixty-four different attenuation settings. The controller 50 is adapted to perform a separate counter function for the number of times each of the sixty-four possible attenuator settings is selected during the indi¬ vidual frequency calibration. These sixty-four "counters" are implemented from processor registers or memory locations which are incremented once for each TWT pulse, i.e., each time the attenuation setting is changed. It is well known to those skilled in the programming art how to program a computer such as a microprocessor to carry out such a counting function, and the details of such a program need not be described in further detail. The contents of these registers or counters may be employed to develop a histogram of the various attenuator settings through the particular calibration cycle. Thus, the controller is adapted to perform a histogram function to generate a histogram of the attenuator settings. At step 155 of the individual frequency calibration cycle, the individual attenuator setting counters are initialized, i.e., set to zero, and the attenuator is set to the maximum attenuation level. Once the histogram and attenuation setting have been initialized, the TWT output power is sampled at step 160. This sampled power value is used to calculate the next attenuator setting, at step 165. - If the power value increased over the power value for the preceding attenuator setting, the attenuator is changed to the next lower impedance setting. Each time a particular attenuator setting is selected, the corresponding histogram counter is incremented. At step 170, a decision .is made as to whether the number of output power samples equals N. N is a number which is experimentally determined to be the smallest ntimber of samples which will result in an accurate calibration. As the number of samples is increased, the height of the peak in the histogram increases, at the expense of lengthening the calibration time. For the application of the preferred embodiment, N is selected to be 255. Thus, at step 170, if the number of samples taken does not equal 255, the algo¬ rithm loops back to step 160. If the number of samples does equal N, the algorithm proceeds to step 175. At step 175, the histogram developed by the counters for each attenuator setting is evaluated to find the counter with the highest value. Figures 5 and 6 illustrate the TWT output power sampling and the resultant histogram of attenuator settings which is evaluated to determine the optimal setting. In Figure 5, the RF output power increased after each sample from times t Q to t.. This corresponds to increases in the RF drive level and the use of attenuator settings 1 through 16. From times t. to t«, increases in drive with settings 17 and 18 (indicated by the parenthet¬ ical numbers (17) , (18) in Figure 5) also result in RF output power increases. The algorithm which is employed in the preferred embodiment is adapted to change the attenuator setting by one bit if the difference between the output power samples (which have been digitized and read by the microprocessor,) before and after the change in attenuator setting is one bit or less. If the difference in power samples is two bits or more, then the attenuator setting is changed by two bits from its previous setting. When the drive is increased by decreasing the atten- uation to attenuator setting 19 at time t«, a decrease in RF output power occurs. Since the RF output power decreased for an increase in drive level, the. next drive level is decreased by the microprocessor by increasing the atten¬ uation to setting 18. The calibration algorithm continues to resample output power levels about setting 18 to optimize the peak output power. At time t,, the power level decreased by two units, resulting in a change in the attenuator setting of two bits, i.e., from setting 19 to 17. Thus, the attenuator setting sequence between times t.. and t . is 17, 18, 19, 18, 17, 18, 19, 17, 18 updates the histogram counters, as illustrated in Figure 6. The sampling and histogram updating continues until the number of power samples reaches N. The algorithm employed in the preferred embodiment to calculate the attenuator setting at step 165 operates by comparing the previous power sample A with the current power sample B before changing the attenuator. If the value of A is less than B, the attenuator setting is reduced to reduce the attenuation, either by one bit or two, as discussed above. Once the peak of the saturation curve is passed, then power sample A will be greater than power sample B. At that point, the attenuator setting is increased to increase the attenuation level. These steps are repeated until the number of samples equals the predetermined number N. Once the predetermined number of samples is determined to have been taken at step 170, the histogram is evaluated at step 175 to ' find the counter with the highest number. At step 180 this counter setting is evaluated to determine whether the highest counter value corresponds to one of the limits of the- variable attenuator, i.e., the highest or lowest attenuation. If so, this triggers a fault indicating the attenuation range is not capable of optimizing the RF drive and the calibration mode is exited. At step 185, the frequency code is tested to verify that the same frequency was used throughout the calibration cycle. If the frequency did change, a fault is also declared. . At step 190, the attenuator setting determined in step 175 to be optimum is stored in the buffer memory associated with the microprocessor. In the illustration of Figures 5 and 6, evaluation of the histogram will locate the highest counter setting as 18. This setting results in maximum RF output power from the TWT. At step 195, the frequency counter, which keeps track of the number of frequencies for which the calibration has been performed, is incremented. While the flowcharts illustrated in Figures 3 and 4 may be implemented in different ways, an exemplary listing of source code which has been employed with the preferred embodiment to carry out the invention is set forth in Appendix A. Referring now to Figure 7, the system comprising the preferred embodiment is illustrated in block diagram form. The RF exciter signal is provided on line 5 to RF solid state amplifier 10. The output of the amplifier 10 is passed through attenuator 20, and the attenuator output comprises the RF drive to the TWT 30. In the preferred embodiment, the attenuator 20 comprises a 6-bit digital attenuator such as -hat marketed by Hylectronics Corpo¬ ration, Newton Road, Littleton, Massachusetts, model PX8, having a 15 db range and a resolution of .25 db per step. 11 RF coupler 40 is connected to the TWT 30 Output, and its coupled output 41 provides a small part of the RF energy from the TWT 30 to RF detector 42. The detector 42 provides a video signal on line 43 whose amplitude is representative of the relative power output of the TWT 30. The detector signal is passed to signal conditioner 60, which performs amplification and peak detection functions. The signal conditioner 60 comprises video amplifier 60a; in the preferred embodiment, a Fairchild differential video amplifier, model yA733, is advantageously employed as the video amplifier. The amplified signal is provided to a peak sampler circuit, comprising operational amplifiers 60b and 60c, diode 60d, resistor 60e and capa¬ citor 60f. These elements represent a simplified schematic of the peak sampler circuit. Such circuits are well-known, and are discussed, for example, in the book "Electronic Circuits and Applications," by Steven D. Senturia and Bruce D. Wedlock, (John Wiley, 1975), at pages 208-210. The function of the peak sampler is to charge the capacitor 60f to the peak voltage level, and then to hold the voltage for a predetermined time interval determined by the R-C time constant of resistor 60e and capacitor 60f. Because the TWT amplifier of the preferred embodiment is operated in a pulsed mode, the detected video signal pulses on line 43 are very short. The signal conditioning circuit 60 provides a useful output signal level which may be provided to track-and-hold module 56 through multiplexer 58. Multiplexer 58 provides the capability of selectively switching one analog signal from several possible input signals; only the analog signal from circuit 60 is shown. This allows one of several signals to be provided to the analog-to-digital converter (ADC) 54 for conversion to a digital signal, which is provided as an input to micropro- cessor 52. In the preferred embodiment, a Datel-Intersil analog multiplexer, model MV-1606M is employed as multi¬ plexer 58. The track-and-hold module 56 comprises a hybrid video track and hold device such as that marketed by the Data Device Corporation as model ADH-50. The module 56 is adapted to rapidly track and hold the peak video signal level, enabling the ADC 54 to properly carry out the conversion. The ADC marketed by Datel-Intersil, Inc., 11 Cabot Boulevard, Mansfield, Massachusetts, as the model ADC-815 and the Intel Corporation microprocessor, model 8085, are employed in the preferred embodiment as ADC 54 and microprocessor 52, respectively. An eight bit bus 55 allows digital signal commu¬ nication among the output of ADC 54, the microprocessor 52, the non-volatile memory comprising EEPROM 62 and flip/flop devices 63 and 64, and input/output peripheral devices 53 and 66. In the preferred embodiment, the flip-flop devices 63 and 64 are 54LS174-type hex D flip-flops; the EEPROM 62 is a model X2212 device, marketed by XICOR, Inc., 851 Buckeye Court, Milpitas, California. The peripheral devices 53 and 66 comprise Intel model 8155 devices. The microprocessor is adapted to read/write data over bus 55 to/from EEPROM 62. The flip-flops 63 and 64 inter¬ face between the microprocessor 52 and EEPROM 62 via busses 55a, 55b and 55c and are employed to verify that data was correctly programmed into the EEPROM 62. The 5-bit frequency word is provided on bus 45 to differential line receivers 46 and 47, which may be 26LS31 type devices, employed for noise isolation. The line receiver outputs are coupled to peripheral device 66, so as to be available to the microprocessor over data bus 55. The peripheral device 53 is coupled to the digital attenuator 20 through line drivers 22,23, which comprise 26LS33 type drivers in the preferred embodiment, to provide 6 differential bit pairs to the attenuator 20. The 13 attenuator 20 further comprises a pair of corresponding line receivers (not shown) of the 26LS31 type. The line receivers and line drivers are employed in the preferred embodiment for noise isolation purposes, as the pulsed TWT amplifier is a high noise environment. The analog output of device 56 is converted to a digital signal by ADC 54 and provided to an input port of microprocessor 52. Thus, the microprocessor 52 is able to monitor digital signals representative of the sampled RF output power level of the TWT. The microprocessor 52 is coupled to EEPROM 62 to store and retrieve data, as described above. The output of the microprocessor 52 controls the attenuator setting through peripheral device 53 and line drivers 22, 23. There has been described a novel system for optimizing the input drive to a TWT amplifier, which provides the capability for recalibration of the drive as the elements of the amplifier age. Another advantage of the system is that it is not dependent on measuring the actual RF input power level. In the disclosed embodiment of the invention, the input level is not monitored at all, and only relative changes in the output power are monitored by the system, which result from changes in the attenuation setting. Moreover, the actual attenuation introduced by the variable attenuator is not measured. Thus, the disclosed system does not depend on the accuracy of absolute attenuation or measured power levels. In a broad sense, the calibration mode may be viewed as an iterative process wherein an input drive parameter is varied to determine a calibrated drive parameter value which results in the optimum RF output power level for each frequency of interest. While the invention has been described in the context of a TWT amplifier, it is believed that the invention can be employed to optimize the input RF drive to any pass-through microwave amplifier. 14 It is understood that the above-described embodiment is merely illustrative of the present invention. Numerous and varied other arrangements may be devised in accordance with the principles of the invention by those skilled in the art without departing from the scope of the invention. 15 APPENDIX A ASM0O JF4S CALSUB. S MODBS PAGEWIDTH(βO) PRINT (:F4s CALSUB. PRN ) DEBUG XKEt riH--ι:ur-l LE ISIS-II S0S0/B085 MACRO ASSEMBLER, V3.0 CALSUB PAGE 1. LOC OBJ LINE SOURCE STATEMENT 1 t**t****t***t*****t****tt*t*** **t>t*-t**t**t******* 2 j RF FREQUENCY CALIBRATION SUBROUTINE 3 ; < CALSUB ) 4 J 5 ;ttttttttt**t*t**t**ttttt*1.*tt.t**tt**i.**t*tt*t***ttt 6 : 7 ; REVISED 10/3/83 V.B B ; 9 itt*tt*tt**t*tt***ttt*tt*t*t*tttttt*t*.*t**t**f!.*ttt* 10 ; 11 NAME CALSUB 12 PUBLIC CALSUB 13 EXTRN SEQSUB,RPLLED,LDSUB 14 EXTRN ENDF,RECLED,RESLED 15 EXTRN SKPAD1,EEPROM,TRBSUB.TRCSUB.FRQCTR 16 EXTRN TCULED,ATTLED,FITLED,TWTLED,FREQ 17 EXTRN . DEKLED,RF1LED.ATTTAB,ATTMAX,NFREQ 18 EXTRN CH LEDjRPRLED 19 ; 20 ;t**t*t*tt***tt.**t.*1t***tt***********1. ************** 21 CSEG 22 f t************************************************** 23 * 24 ; CALSUB SUBROUTINE CALIBRATES THE TRANSMITTER RF SAT. 25 ; LOOP FOR N FREQUENCIES. CALSUB ALSO CALIBRATES THE 26 ; TRANSMITTER RF. TIMING. CALIBRATION IS ENABLED BY 27 ; THE CALIBRATE PB.SWITCH BEFORE CALIBRATION OF EACH 2B ; FREQ. CALSUB WAITS FOR A FREQ CHANGE TO OCCUR 29 ; BEFORE PROCEEDING. THIS ENSURES 30 ; THAT MAXIMUM TIME REMAINS TO CALIBRATE THE NEW FREQ. 31 : THE TWT RF INPUT IS INCREASED (BY CONTROLLING 32 ; ATTENUAATOR SETTING) UNTIL THE TWT RF OUTPUT SATURATES 33 : THE ABOVE PROCEDURE IS REPEATED FOR N FREQUENCIES, 34 ; WITH THE FINAL ATTENUATOR SETTING SAVED IN 35 ; ATTENUATOR TABLE ATTTAB THIS TABLE IS 36 ; STORED IN A NON-VOLATILE EEPROM 37 ; ALONG WITH AN UPDATED COUNT OF CALIB./STORES 38 ; (CUMULATIVE OVER THE LIFE OF THE EEPROM) . 39 ; CALIBRATION CAN ONLY BE DONE WITH MAINTANCE AID 40 ; PROGRAM. WHICH THE OPERATOR SHOULD HAVE SET UP BEFORE 41 s ENABLING CALIBRATION. 42 j 43 ; ATTAB BIT-O, 1.2,3,4,5 ARE ATTENUATOR SETINGS 44 ; BIT-6 IS USED DURING CAL. AS A FAIL 1 FLAG 45 ; • BIT-7 IS USED AS A UNCAL. FLAG 46 ; 47 x **************************************************** 48 ; 0000 210289 49 CALSUB: LXI H.B902H jIS TRANSMITTER 0003 7E 50 MOV A,M ; IN TEST 0004 E680 51 ANI 10000000B ; NO-GO TO EXIT 0006 CA9601 C 52 JZ CAEXIT ; YES-CONTINUE I S-I 1 8080/8085 MACRO AstJEMBLEK, V . ϋ CALfaUB PAGE LOC OBJ LINE SOURCE STATEMENT 0009 0600 54 M I B.OD SELECT TWT Iw OOOB 16FF 55 MVI D.OFFH SET UP COUNTER OOOD CDOOOO E 56 CALAA: CALL 5EQSUB TO COUNT Iw PULSES 0010 15 57 DCR D IS I STABLE 0011 C20D00 C 58 JMZ CALAA NO-GO TO CALAA 59 YES-CONTINUE 60 - 0014 210289 61 LXI H.8902H 0017 7E 62 MOV A,M 0018 E604 63 ANI 0000 100B IS CAL SW PUSHED 0 1A CA9601 c 64 JZ CAEXIT NO-GO TO EXIT 65 YES-CONTINUE 66 • 00ID 210385 67 LXI H.B503H TURN ON CALIBRATE 0020 7E 68 MOV A,M LED 0021 F620 69 ORI 0 100000B 0023 77 70 MOV M.A 0024 CD9E01 c 71 CALL CALA 72 . 0027 CD0C02 c 73 CALL PCAL 002A CDB301 c 74 CALL TIMING 75 . 002D 3E00 76 MVI A.OD RESET FREOUENCY 002F 320000 E 77 STA FRQCTR • COUNTER 78 . 79 -********** START FRED. CHANGE TEST *************** 80 « 0032 3E80 81 CALD: MVI A, 10000000B INITIALIZE ATTTAB 0034 E20 82 MVI C.32D 0036 210000 E 83 LXI H.ATTTAB 0039 CDOOOO E 84 CALL LDSUB 85 003C 210389 86 LXI H.B903H READ FREOUENCY CODE 003F 7E 87 MOV A,M AND SAVE IN TEMFOFA' 0040 E61F 88 ANI 0001111 IB STORAGE 0042 4F 89 MOV CA 90 β 0043 210389 91 CALG: LXI H.B903H READ FREQUENCY CODE 0046 7E 92 MOV A,M AND COMPARE WITH 0047 E61F 93 ANI 0001HUB TEMPORARY STORAGE 0049 B9 94 CMP C DID IT CHANGE 004A C25900 C 95 JMZ CALI YES-GO TO CALI 96 NO-CONTINUE 97 004D 210289 98 CALH: LXI H.B902H IS TX CMD. RADIATE 0050 7E 99 MOV A,M 0051 E610 100 ANI 0001OOOOB YES-GO TO CALG 0053 C24300 C 101 JNZ CALG NO-GO TO EXIT 0056 C39601 c 102 JMP CAEXIT 103 . 104 -********* END FREQUENCY CHANGE TEST ************** 105 ; START TWT SATURATION 106 0059 320000 E 1 7 CA I: STA FREQ FREQ CAL. TEST 005C 4F 108 MOV CA ΪSIS-II B0B0/B0B5 MACRO ASSEMBLER, V3.0 CALSUB PAGE LOC OBJ LINE SOURCE STATEMENT 005D 0600 109 MVI B.OD 005F 210000 110 LXI H.ATTTAB 0062 09 111 DAD B 0063 3E3F 112 MVI A.OOUllllB 5 IS FREOUENCY Clp65 BE 113 CMP M ; ALREADY CALIBRATED 0066 D24300 114 JNC CALG 5 YES-GO TO CALG 115 ; NO-CONTINUE 116 0069 3AO0O 117 LDA ATTMAX ;SET ATTENUATOR TO MAX. 006C 320381 118 STA 8103H 119 006F 3E00 120 MVI A.OOH • jZERO RAM 0071 0E41 121 MVI C41H 0073 210084 122 LXI H,8400H 0076 CDOOOO 123 CALL LDSUB 124 0079 3E01 125 MVI A,01H :DIRECTION'"UP" 007B 320000 126 STA SKPAD1 127 <O07E 16FF 128 MVI D.OFFH ■ jINIT COUNTER 0080 1EFF 129 MVI E,CFFH ;OLD»MAX 130 0082 210289 131 CALM: LXI H.8902H READ P0RT-4-B 0085 7E 132 MOV A.M 0086 E610 133 ANI 00010000B :IS TX IN RADIATE? O088 CA9601 134 JZ CAEXIT NO! GO TO CALX 135 : YES! CONTINUE ON 136 00BB 0602 137 CAL : MVI B,2D ■ jREAD RFA 2 008D CDOOOO 138 CALL SEQSUB 0090 4B 139 MOV CE 0091 5F 140 MOV E,A 0 2 79 141 MOV A.C 0093 93 142 SUB E 0094 4F 143 MOV CA ;STORE ERROR 0095 CAD500 144 JZ CAL E 145 0098 3A0000 146 LDA SKPAD1 ;READ DIRECTION 009B FEOO 147 CPI OOH 009D CABBOO 148 JZ CALJA :IS DIRECTION DOWN 149 • YES-GO TO CALJA 150 ; NO-CONTINUE 151 OOAO 79 152 MOV A.C ;READ ERROR 00AI FECO 153 CPI HOOOOOOB 00A3 DAABOO 154 JC CALJB :ERROR IS < ZERO 155 ;YES-GO TO CALJB 156 ; O-CONTINUE 00A6 2F 157. CMA 00A7 3C 158 INR A 00A8 C3C600 159 JMP CAL C OOAB FE03 160 CALJB: CPI 03H OOAD DAB200 161 JC CAL D 5ERROR IS > 2 162 ; NO-GO TO CALD 163 ; YES-CONTINUE ISIS-II 8080/8085 MACRO ASSEMBLER, V3.0 CALSUB PAGE LOC OBJ LINE SOURCE STATEMENT 164 ~ OOBO 3E02 165 MVI A.02H :ERR0R=»2 00B2 4F 166 CALJD: MOV C,A !STORE DELTA 00B3 3E01 167 MVI A.01H O B5 320000 E 168 STA SI'PADl :DIRECTION=>"LIP" OOBB C3D500 C 169 JMP CALJE 170 » OOBB 79 171 CALJA: MOV A.C ;READ ERROR OOBC FECO 172 CPI 11000000B OOBE DAC600 c 173 JC CALJC ; IS ERROR < ZERO 174 ; NO-GO TO CALJC 175 ; YES-CONTINUE OC1 2F 176 CMA 00C2 3C 177 INR A 00C3 C3AB00 c 178 JMP CALJB 179 . 00C6 FE03 180 CALJC: CPI 03H 00C8 DACDOO c 181 JC CALJF : IS ERROR • : 2 182 : NO-GO TO CALJF 183 ; YES-CONTINUE OOCB 3E02 184 MVI A.02H ;ERROR = 2 185 * OOCD 2F 186 CALJF: CMA OOCE 3C 187 INR A OOCF 4F 188 MOV CA :STORE DELTA OODO 3E00 189 MVI A.OOH 00D2 320000 E 190 STA SKPAD1 ;DIRECTION=DOWN 191 . 00D5 210381 192 CALJE: LXI H.8103H :READ ATTENUATOR 00D8 7E 193 MOV A,M 00D9 E63F 1 ~ . ANI 0 111111B OODB 81 195 ADD C ;ADD DELTA OODC FE80 196 CPI 80H OODE DAE300 c 197 JC CALJG : IS ATTEN 5 MAX 198 : NO-GO TO CALJG 199 ; YES-CONTINUE 00E1 3E20 200 MVI A.0 100000B :ATTENUATOR = 1/2 201 00E3 FE 202 CALJG: CPI 40H 00E5 DAEFOO c 203 JC CALJH ! IS ATTENUATOR < M 204 ; NO-GO TO CALJH 205 : YES-CONTINUE OOEB 0E40 206 MVI C. H :POINTER = FAULT OOEA 3E3F 207 MVI A.3FH ;ATTENUATOR = MIN OOEC C3F000 c 208 JMP CAL I 209 * OOEF 4F 210 CALJH: MOV CA :POINTER = ATTENUA 211 OOFO 77 212 CAL I: MOV M,A ;WRITE ATTENUATOR OOF1 0600 213 MVI B.OOH 00F3 210084 214 LXI H.8400H 00F6 09 215 DAD 00F7 34 216 INR M 00F8 15 217 DCR D 5BUMP DOWN COUNTER OOF9 C28B00 c 218 JNZ CALJ ;IS TEST COMPLETE ISIS-II 8080/8085 MACRO ASSEMBLER, V3.0 CALSUB PAGE LOC OBJ LINE SOURCE STATEMENT 219 j NO! GO TO CALJ 220 ; YES! CONTINUE ON 221 222 ;*#***************** FIND VALUE******************** OOFC 210084 223 CALO: LXI H.8400H ? INITIALIZE OOFF 110000 224 LXI D.OOOOH 225 0102 7E 226 CALOA: M MOOVV A A,,MM ;READ MEW VALUE 0103 BA 227 CMP D :IS NEW LESS THAN C 0104 DA0C01 C 228 JC CALOB ; YES-GO TO CALOB 0107 CA0C01 C 229 JZ CALOB 010A 5D 230 MOV E.L ; NO-CONTINUE 010B 57 231 MOV D,A 10C 23 5 CALOB: INX H 010D 7D 234 MOV A.L ;IS TEST COMPLETE 010E FE41 235 CPI 41H • NO-GO TO CALOA 0110 C20201 236 JNZ CALOA ; YES-CONTINUE 237 0113 210381 238 LXI H.B103H 0116 73 239 MOV M,E 0117 7B 240 MOV A,E DOES ATTEM = FAULT 0118 FE40 241 CPI 40H NO-RETURN TO FPOt OilA C22F01 242 JNZ CALPA YES-CONTINUE 243 OllD 3E1E 244 MVI A,00 11 :DEFINE INTRFTS 01IF 30 245 SIM ; ENABLE RST. 5.5 246 0120 CDOOOO E 247 CALL TWTLED LITE TWT LED 0123 CDOOOO E 248 CALL ATTLED LITE ATTEN. LED 0126 CDOOOO E 249 CALL CHKLED LITE CHECK LED 0129 CDOOOO E 250 CALL RPRLED LITE REPARE LED 251 (CALL D.5.) 012C CDOOOO 252 CALL ENDF 253 012F 210389 254 CALPA: L LXXII H H,,BB990033HH ;READ P0RT-4-C 0132 7E 255 MOV A.M 0133 E61F 256 ANI 0001111IB ; ISOLATE FREQUENCE 0135 210000 E 257 L I H.FREQ 01 8 BE 258 CMP M 139 C2A701 C 259 JNZ CALZ ;DID FREQUENCY CH. 260 5 DURING CA IBRAT 261 : YES! GO TO CALZ -C * . : NO! CONTINUE ON 263 264 ********** END TWT SATURATION ******************* 265 START DATA SAVING 266 013C 210381 ' 267 CALPB: LXI H. 8103H PORT REG PC 013F 7E 268 MOV A . M ATTEN. >> A 0140 E63F 269 ANI 001 1 1 1 U B SELECT 6 LSB'S 0142 57 270 MOV D, A ATTEN. » D 0143 210000 271 LXI H. FREQ FREQ ADDR >> HL 0146 4E • 272 MOV C M 0147 0600 273 M I B. OD ISIS-II 8080/8085 MACRO ASSEMBLER. V3.0 CALSUB PAGE LOC OBJ INE SOURCE STATEMENT 0149 210000 E 274 LXI H,ATTTAB ; ATTTAB ADDR >> HL 014C 09 275 DAD B 014D 72 276 MOV M.D ; ATTEN. » ATTTAB. 277 ; WITH FREQ AS POINT 278 014E 3A0000 E 279 CALPD: LDA FROCTR I CREMENT 0151 3C 280 INR A ; FREQUENCY COUNTER 0152 320000 E 281 STA FRQCTR ; AND SAVE IN STORAP 0155 4F 282 MOV C,A 0156 3A0000 E 283 LDA NFREQ 0159 B9 284 CMP C 015A C24300 C 285 JNZ CALG ; IS CALIBRATION FINI 286 • j NO-GO TO CALG 287 ; YES-CONTI Uε 288 ϊ 015D CDB301 C 289 CALL TIMING SDO FINAL RF. TIMING 290 ; ADJUSTMENT. 0160 21028B 291 LXI H.8B02H READ FINAL DAC. 0163 7E 292 MOV A.M 5 VALUE 0164 322200 ε 293 STA ATTTAB+34D ;SAVE VALUE IN 294 ; ATTTAB TABLE 295 5 0167 2A2000 ε 296 CALPG: LHLD ATTTAB+32D !UPDATE AND STORE COL 016A 23 297 INX H 5 OF EEPROM WRITES 016B 222000 E 298 SHLD ATTTAB+32D 299 a 300 : NOTE: FUTURE STORE TEST 301 5 016E 210189 302 LXI H.8901H .•ENABLE EEPROM 0171 7E 303 MOV A,M 0172 F6C0 304 ORI 11000000B 0174 77 305 MOV M.A 306 . 175 0623 307 CALPE: MVI B,35D 0177 210000 E 308 LXI H.ATTTAB DYNAMIC POINTER # 017A 110000 ε 309 LXI D.EEPROM DYNAMIC POINTER # 017D CDOOOO E 310 CALL TRBSUB TRANSFER 33 BYTES 311 TABLE 1 TO 66 312 NIBBLES TABLE 313 2 VIA POINTERS 314 # 2 AND # 1 315 0180 210189 316 CALPH: LXI H.89 1H PORT 4 REG PA 0183 7E 317 MOV A,M 0184 E6BF 318 ANI 1011111IB 0186 77 319 MOV M.A 0187 3EFF 320 MVI A.OFFH 0189 2100C1 321 LXI H.0C100H ;STORE EEPROM 018C 77 ~ \2~ ~ - MOV M.A 018D 210189 323 LXI H.8901H ; INHIBIT EEPROM 190 7E 324 MOV A.M 0191 E67F 325 ANI 011111UB 0193 F640 326 ORI 01000000B 0195 77 327 MOV M.A 328 . LOC OBJ LINE SOURCε STATSMεNT 0196 210385 329 CAεXIT: LXI H.8503H jREAD P0RT-2-C 01 9 7E 330 MOV A.M 019A E6DF •331 AMI 110U111B t ISOLATE CAL LED BIT 019C 77 332 MOV M,A ;TURN OFF CALIBRATE L ~ 333 019D C9 334 CALY: RET :RETURN TO PROGRAM 335 019E 061C 336 CALA: MVI B.28D ;READ WORD-B 01AO CDOOOO 337 CALL SEQSUB 01A3 47 338 MOV B.A 01A4 ε610 339 ANI OOOIOOOOB :IS0L.TRIGGεR5 01A6 CO 340 RNZ :ARε TX TRIGG.ON 341 -, YES-RETURN TO PROG 342 : NO-CONTINUE 343 oiA7 3ειε 344 CALZ: MVI A,00011HOB :DEFI E INTRPTS 01A9 30 345 SIM ; RST. 5.5 01AA CDOOOO ε 346 CALL FITLSD :LITE TRAILεR F. I.T. 01AD CDOOOO ε 347 CALL R CLεD ;LITε RεCALIBRATε LED 01BO CDOOOO E 348 CALL ENDF 349 350 351 ; ******* *****************************.**************** 353 : TIMING ADJUST SUBROUTINE 354 ; (TIMING) 355 356 ;***************************************************** 357 01B3 2103BB 358 TIMING: LXI H.8B03H 01B6 3601 359 MVI M.01H ;50 NSEC DELAY ON 01B8 2B 360 DCX H 01B9 36FF 361 MVI M.OFFH 01BB CDD901 362 CALL NIBBLE 01BF 3600 364 MVI M.OOH 01C1 F600 365 ORI OOH 01C3 CO 366 RNZ 01C4 C3C701 c 367 JMP TFLT 01C7 CDOOOO E 368 TFLT: CALL RF1LED 01CA CDOOOO E 369 CALL ATTLED 01CD CDOOOO ε 370 CALL TCULED 01D0 CDOOOO E 371 CALL RESLSD 01D3 CDOOOO E 372 CALL RPLLεD 01D6 CDOOOO E 373 CALL ENDF 374 375 376 *************************************************** 377 378 NIBBLE ADJUST SUBROUTINE 379 (NIBBLE) 380 381 *************************************************** 382 01D9 CDF801 383 NIBBLE: CALL XOVER ISIS-II BOB0/80B5 MACRO ASSEMBLER. V3.0 CALSUB PAGE LOC OBJ LINE SOURCE STATEMENT OIDC 7E 384 MOV A.M E OIFO CDF801 c 395 CALL XOVER 01F3 7E 396 MOV A.M 01F4 DO 397 RNC 01F5 C3E901 c 398 JMP NIBA 399 ! 01F8 210289 400 KOVER: LXI H.8902H OIFB 7E 401 XOVA: MOV A.M OIFC IF 402 RAR OIFD D2FB01 c 403 JNC XOVA ςEOS'' 404 0200 7E 405 KOVB: MOV A.M 0201 IF 406 RAR 0202 DA 002 c 407 JC XOVB ; tEOC 0205 2101BB 408 LXI H.BB01H ;READ CROSSOVER 0208 7E 409 MOV A,M 0209 23 10 INX H 020A IF 411 RAR 020B C9 412 RET 413 ; ISOLATE XOVER 414 415 416 ********************************************** 417 418 PCAL 419 420 ********************************************** 421 020C 21028B 422 f S CAL: LXI H.8B02H 020F 36FF 423 MVI M.OFFH :MIN DELAY 0211 2103B1 424 LXI H.8103H 0214 3600 425 MVI M.OOH ;ATTEN=MAX 426 0216 CDF801 c 427 1 =>CALA: CALL XOVER 0219 210381 428 LXI H.8103H 021C 7E 429 MOV A.M 02ID CA2902 c 430 JZ PCALB 0220 E63F 431 ANI 3FH 0222 C604 432 ADI 04H 0224 FE38 433 CPI 38H 0226 CA1602 c 434 JZ PCALA 435 0229 E63F 436 F » CALB: ANI 3FH 022B C608 437 ADI 08H 022D FE40 438 CPI 40H LOC OBJ LINE SOURCE STATEMENT 022F C23402 439 JNZ PCALC 02323E3F 440 MVI A,3FH 441 ; 0234 77 442 PCALC: MOV M.A 443 : 0235 C9 444 RET 445 ; ΛΔA - 447 END PUBLIC SYMBOLS CALSUB C 0000 EXTERNAL SYMBOLS ATTLED E 0000 ATTMAX ε 0000 ATTTAB E 0000 CHKLεD E 0000 DEKLED E 0000 εεpROM ε 0000 εNDF ε 0000 FITLED E 0000 FREQ ε 0000 FROCTR E 0000 LDSUB ε 0000 NFREQ ε 0000 RECLED ε 0000 RεSLED E 0000 RF1LED ε 0000 RPLLED E 0000 RPRLED ε 0000 SEQSUB E 0000 S PAD1 E 0000 TCULεD E 0000 TRBSUB ε 0000 TRCSUB E 0000 TWTLED ε 0000 USER SYMBOLS ATTLED ε ooo ATTMAX E 0000 ATTTAB ε 0000 CAεXIT c 0196 CALA c 019E CALAA C OOOD CALG C 0043 ' CALH c 004D CALI c 0059 CALJ c 008B CALJA c OOBB CALJB c OOAB CALJC c 00C6 CALJD c 00B2 CALJE c 00D5 CALJF c OOCD CALJG c 00E3 CALJH c OOEF CALJI c OOFO CALM c 0082 CALO c OOFC CALOA c 0102 CALOB c 010C CALPA c 012F CALPB c 013C CALPD c 01 E CALFE c 0175 CALPG c 0167 CALPH c 0180 CALQ c 0032 CALSUB c 0000 CALY c 019D CALZ c 01A7 CHKLED ε 0000 DEKLED E 0000 εEPROM E 0000 ENDF E 0000 FITLεD ε 0000 FREQ E 0000 FRQCTR ε 0000 LDSUB ε 0000 NFREQ ε 0000 NIBA C 01E9 NIBBLE c 01D9 PCAL c 020C PCALA c 0216 PCALB c 0229 PCALC c 0234 RECLED ε 0000 RESLED ε 0000 RF1LED E 0000 RPLLED ε 0000 RPRLED E 0000 SEQSUB E 0000 SKPAD1 E 0000 TCULED ε 0000 TFLT c 01C7 TIMING c 01B3 TRBSUB E 0000 TRCSUB E 0000 TWTLED ε 0000 XOVA c 01FB XOVB C 0200 XOVER c 1F8 ASSEMBLY COMPLETE, NO ERRORS I S IS-I I -ASSEMBLER SYMBOL CROSS REFERENCε, V2. 1 PAGε ATTLED 16 248 369 ATTMAX 17 117 ATTTAB 17 83 110 274 293 296 298 308 CAEXIT 52 64 102 134 329* CALA 71 336* CALAA 56* 58 CALΘ 91# 101 114 285 CALH 98# CALI 95 107* CALJ 137# 218 CALJA 148 171* CALJB 154 160# 17B CALJC 159 173 ISO* CAL D 161 166# CALJE 144 169 192* CALJF 181 186# CALJB 197 202* CALJH 203 210* CALJI 20B 212# CALM 131* CALO 223# CALOA 226# 236 CALOB 228 229 233* CALPA 242 254# CALPB 267* CALPD 279* CALPE 307* CALPΘ 296* CALPH 316* CALSUB 11 12 49* CALY 334* CALZ 259 344# CHKLED IB 249 DEKLεD 17 εEPROM 15 309 ENDF 14 252 348 373 FITLED 16 346 FRED 16 107 257 271 FRQCTR 15 77 279 2S1 LDSUB 13 84 123 NFREQ 17 283 NIBA 385 387 391* 39B NIBBLE 362 383* 3B9 PCAL 73 422* PCALA 427* 434 FCALB 430 436# PCALC 439 442* RECLED 14 347 RESLED 14 371 RF1LED 17 368 RPLLED 13 372 RPRLED IB 250 SEQSUB 13 56 138 337 SKPAD1 15 126 146 168 190 TCULED 16 370 TFLT 367 368* 393 ISIS-I I ASSEMBLER SYMBOL CROSS REFERENCE, V2. 1 PAGE TIMING 74 289 358* TRBSUB 15 310 TRCSUB 15 TWTLED 16 247 XOVA 401* 403 XOVB 405* 407 XOVER 383 395 400* 427 CROSS REFERENCε COMPLETE

Claims: 27 What is claimed is: 1. A method for optimizing the input RF drive level to a microwave amplifier (30) over an input frequency bandwidth, comprising the steps of: providing a controllable means (20) of varying the input drive level to the amplifier (30) in response to control signals; providing a central controller (50) for providing said control signals to said controllable means (20) , the controller (50) adapted for operation in a calibration mode and a normal amplifier operational mode; in said calibration mode, for each frequency of interest, determining through an iterative process of varying an input drive parameter, the calibrated value of the input drive parameter with results in the maximum power output; and in said normal amplifier operational mode, setting said input drive parameter value at the calibrated value corresponding to the present frequency. 2. The method of Claim 1 wherein said calibration mode further comprises the step of storing in a memory device (62) data representative of said calibrated value for each frequency of interest. 3. The method of Claim 1 wherein said step of determining said calibrated parameter values conrorises iteratively changing the attenuation level of a programmable attenuator (20) adapted to selectively attenuate the input drive to the amplifier (30), and wherein said inout drive parameter comprises the programmable attenuator setting. 28 4. The method of Claim 3 wherein said iterative process comprises the steps of: (i) programming said attenuator (20) to an initial setting; (ii) sampling the output; (iii) determining a new attenuator setting and programming the attenuator (20) to the new setting; and (iv) repeating steps (ii) and (iii) until a predetermined number of samples have been taken. 5. The method of Claim 4 wherein the step of determining a new attenuator setting comprises: (i) determining whether the previous change in the attenuator setting resulted in increased output power; and (ii) if so, decreasing the attenuator setting in the same direction as the previous attenuator setting change; or (iii) if not, increasing the attenuator setting in the opposite direction from the previous change. 6. The method of Claim 5 wherein the step of determining the calibrated value of the attenuator setting comprises the step of counting the number of times each attenuator setting is used during said iterative process, and determining the calibrated value as that attenuator settinq which received the maximum usage during said iterative process. 7. A system for optimizing the RF input drive to a microwave amplifier (30), comprising; 29 a programmable attenuator means (20) for selectively attenuating the RF input drive to the amplifier (30); detector means (40) for detecting the RF power output of the amplifier (30) and provid.inα a detector signal indicative of the output power level; means for providing frequency siαnals indicative of the frequency of the RF input drive to the amplifier (30); and controller means (50) operable in a calibration mode and in a normal operating mode, said controller (50) being responsive to said detector (40) signals and said frequency signals uring said calibration mode to determine a calibration attenuator setting for each frequency of interest, said controller (50) being responsive to said frequency signal in said normal operating mode to program said attenuator (30) to said calibrated attenuator setting corresponding to the value of said frequency signal. 8. The system of Claim 7 further comprising memory means (62) for storing data representative of said calibrated attenuator settings, and wherein said controller means (50) is adapted to enter said data in said memory means (62) during the calibration mode, and to retrieve data in dependence on the present frequency signal during the normal ooerating mode. 9. The system of Claim 8 wherein said controller means (50) determines the calibration attenuator setting through an iterative process " of programming the attenuator means (20) to selected settings to vary the RF inout drive to the amplifier (30), and comparing the detector siαnal from the detector means (40) at each programmed setting of the attenuator means (20) against 30 prior settings of the attenuator means (20), and selecting the attenuator setting which results in the maximum power output of the amplifier (30). 10. The system of Claim 9 wherein the iterative process comprises the steps of: (i) programming said attenuator (20) to an initial setting; (ii) receiving the detector (40) signal indicative of the output power level; (iii) programming said attenuator (20) to a different setting; (iv) where the the detector (40) signal indicates an increased output power level at the different setting, increasing the attenuator (20) setting in the same direction as the previous attenuator setting; (v) where the detector (40) signal indicates a decreased output power level at the different settinσ, decreasing the attenuator (20) setting in the opposite direction as the previous attenuator setting; (vi) repeating steps (iii) through (v) until a selected number of samples have been taken; and (vii) determining the calibration attenuator setting by counting the number of times each attenuator setting is used during said iterative process, and selecting that attenuator setting which received the highest usage.

Inventors: GOCZALK ROBERT W, MOLLETT LARRY R, GOCZALK, ROBERT, W., MOLLETT, LARRY, R.
Applicants: HUGHES AIRCRAFT CO, HUGHES AIRCRAFT COMPANY
Application year: 1986
Main classification: H03G3
IPC codes: H03F3, H03G3