APPARATUS PROVIDING IMPROVED DIAGNOSABILITY

Abstract: An apparatus for storing information contained in a selected digital data signal comprises a selector. A first input terminal receives an operational digital data signal when the apparatus is operating in a normal mode, a second input terminal receives a shifted test data signal when the apparatus is operating in a maintenance mode,and a third input terminal is operatively connected to a signal having a constant reset state. The selector operatively connects one of the first, second, and third input terminals to the output terminal of the selector in response to a first and second control signal. A storage element, having a clock terminal adapted to receive a clock signal and having a reset terminal adapted to receive a reset signal, stores the state present at the selected input terminal of the selector coincident with the clock signal. A switching element couples the second control signal to the reset terminal of the storage element when the apparatus is in the normal mode thereby causing the apparatus to be placed in a reset state immediately upon the occurrence of the second control signal asynchronously to the clock signal, and couples the second control signal to the selector in the maintenance mode thereby causing the third input terminal of the selector to be operatively connected to the output terminal of the selector causing the apparatus to be placed in the reset state coincident with the clock signal, the second control signal having priority over the first control signal in the selection of the input terminals of the selector.

Description: BACKGROUND OF THE INVENTION This invention relates to a storage element within digital equipment or within data processing systems for implementing shift path maintenance techniques, and more particularly, to an improved bistable device, which can be used singularly as an indicator or in combination forming registers and the like, which is included in the maintenance shift path having essentially no restrictions to interfere with the operation of the shift path maintenance techniques. A method used to test a large group of digital logic elements within digital equipment or data processing systems uses a technique commonly known as shift path maintenance techniques. (Various manufacturers of computer equipment have utilized these techniques which have been given a variety of names such as Scan Path, Native Fault Test, LSSD (level sensitive scan design), ...(These shift path maintenance techniques will not be discussed further herein since they are well known in the art.) Generally, there are some implementation restrictions in the shift path maintenance technique test environment which include: l. all of the bistable devices (i.e., devices that store information) must not be allowed to change state until a specific point in time (i.e., clock time), and 2. all the bistable devices must be clocked simultaneously. The first restriction implies that asynchronous set and reset inputs to a bistable device are not to be used, and the second restriction implies that multiphase clocks are not allowed. If these resitrictions are followed then test patterns can be automatically generated. These two restrictions are well known in the industry. Hence, these restrictions limit the use of scan path maintenance techniques in asynchronous systems since such systems widely use multiphase clock and asynchronous inputs to the bistable devices. These resitrictions limit the flexibility of the logic system being designed because these resitrictions imply that if the shift path maintenance test method is to be used, there must not be any asynchronous setting or resetting of any of the bistables in the design. Furthermore, the clock that clocks one group of bistable devices must also be used to clock the other bistables in the system (i.e., the system must be a single clock system). Thus, in order to produce scan path maintenance tests automatically, there is a need to provide an apparatus that would allow the restrictions of a shift path maintenance test environment to coexist with a design which uses multiple clocks and many asynchronous signals to change the state of the bistables in the digital equipment or data processing systems. From the document EP-A-0 136 461 an apparatus for selectively storing binary information is known to which a normal operation data signal and a test operation data signal are applied. The use of flip-flop memory means within such an apparatus is known from this document in that it discloses a LSSD testable latch circuit apparatus which is interchangeably operable as a D-type edge-triggered latch during systems operation and as a three stage shift register during LSSD testing operations. It is further known from the cited document to allow asynchronous control capabilities to the flip-flop of such an apparatus in that the disclosed D-type edge triggered latch has asynchronous overriding set and/or reset control capability during the system operation mode. The present invention provides a device which eliminates the two hardware design constraints mentioned above. The apparatus of the present invention provides for the coexistence of asynchronous state changes of the bistable devices and multiphase functional clocks along with the implementation of the scan path maintenance techniques. SUMMARY OF THE INVENTION Therefore, there is provide by the present invention as claimed in claim 1, an apparatus for storing information contained in a selected digital data signal coupled to the apparatus, the digital data signal having at least two states, wherein a first state is defined as a set state and a second state is defined as a reset state. The apparatus comprises a selector having a first, a second, and a third input terminal and an output terminal. The first input terminal receives an operational digital data signal when the apparatus is operating in a normal mode, the second input terminal receives a shifted test data signal when the apparatus is operating in a maintenance mode, and the third input terminal is operatively connected to a signal having a constant reset state, the first and second input terminals being the data input terminal of the apparatus. The selector operatively connects one of the first, second, and third input terminals to the output terminal in response to a first, second, third and fourth control signals. A storage element having a clock input terminal adapted to receive a clock signal and having a reset terminal adapted to receive a reset signal, stores the state present at the selected input terminal of the selector element coincident with the clock signal. A switching element, having an input terminal adapted to receive the third control signal, selectively connected to the reset terminal of the storage element, couples the third control signal (ASYNR) to the storage element when the apparatus is in the normal mode thereby causing the apparatus to be placed in the second state immediately upon the occurrence of the third control signal (ASYNR) asynchronously to the clock signal. In the maintenance mode, the switching element couples the third control signal (ASYNR) to the selector, thereby causing the third input terminal of the selector to be selectively connected to the output terminal of the selector causing the apparatus to be placed in the second state coincident with the clock signal, the second control signal (NFTS) having priority over the first control signal (NFTR) and third control signal (ASYNR) in the selection of the input terminals of the selector. The purpose of all forms of the Shift Path Maintenance technique is to correct the difficult problem of testing Sequential logic to that of testing Combinatorial logic where the "D" algorithm may be used to automatically generate test vectors. The conversion of the ASYNR signal from an asynchronous action in the normal mode (NFTM=O) to a synchronous action in the test mode (NFTM = l, NFTR = 0, NFTS = 0) allows asynchronous logic not normally testable to be evaluated by the "D" algorithm. Accordingly, it is an object of the present invention to provide a device for use in digital equipment which utilizes shift path maintenance techniques. It is another object of the present invention to provide a device for use in asynchronous digital equipment which utilizes shift path maintenance techniques. It is still another object of the present invention to provide a device for use in asynchronous digital equipment which utilizes shift path maintenance techniques which overcome restrictions requiring the devices only change state synchronously. These and other objects of the present invention will become more apparent when taken in conjunction with the following description and attached drawings, wherein like characters indicate like parts, and which drawings form a part of the present application. BRIEF DESCRIPTION OF THE DRAWINGS Figure l shows a functional block diagram of a one-bit register of the present invention; Figure 2 shows a functional block diagram of the present invention coupling together a plurality of the one-bit registers to form a three-bit register, sharing common control logic; and Figures 3A and 3B, taken together to form Figure 3 shows a logic circuit diagram of the one-bit D-type register of the preferred embodiment of the present invention as implemented in CML technology. DETAILED DESCRIPTION Referring to Figure l, there is shown a functional block diagram of a one-bit register of the present invention. The device of the present invention is a bistable device utilized in equipment or data processing systems with some asynchronous attributes which also utilized a shift path maintenance scheme. The device can be clocked by a maintenance (or test) clock, TCLK, or by a functional (or normal) clock, NCLK, in response to a mode control signal (NFTM, native fault test mode). (The functional operation of the device of Figure l will be discussed hereinunder utilizing positive logic, however it will be understood by those skilled in the art that the device may be implemented utilizing negative logic, ....) When the mode control signal (NFTM) is a logic zero (i.e., low or inactive), the bistable device of Figure l operates in a normal configuration or mode. A demux l0 of the device of the present invention, includes an input terminal which is configured to receive an asynchronous reset signal, ASYNR, from a predetermined circuit of the digital equipment (or data processing system). In the normal mode of operation, the demux l0 is configured by the mode control signal, NFTM, such that the asynchronous reset signal is coupled directly to the reset terminal (R) of a D-type flip-flop (F/F) 70. A 2 × l mux 30 has two input terminals, one for receiving the maintenance clock signal (TCLK) and one for receiving the normal clock signal (NCLK). The output of the 2 × l mux 30 is selectively connected to the clock input (c) of the F/F 70. In the normal mode of operation the 2 × l mux 30 is configured to transfer the normal clock signal to the clock input of F/F 70 in response to the mode control signal NFTM. Thus, in the normal mode of operation, the F/F 70 is clocked by the normal clock signal, NCLK, and can be reset immediately upon the activation of the asynchronous signal, ASYNR, i.e, F/F 70 is reset asynchronously by the ASYNR signal. A 4 × l data selector 60 having four input terminals and one output terminal is provided, the output terminal of the 4 × l data selector 60 being operatively connected to the data input (D terminal) of F/F 70. One of the four input terminals, D₁ through D₄, is operatively connected to the output terminal of the 4 × l data selector 60 in response to a select control signal which activates the corresponding select terminals, S₁ through S₄. When S₁ is active, input terminal Dl is selectively connected to the output terminal, when S₂ is active input terminal D2 is selectively connected to the output terminal ..., and when S₄ is active input terminal D₄ is selectively connected to the output terminal. The first terminal, D₁ of the 4 × l data selector 60, is selectively connected to the Q output of F/F 70, thereby providing a HOLD condition. The second input terminal D₂ of the 4 × l data selector 60 is selectively connected to an input terminal, DIN, for receiving a data input signal. The third input terminal, D₃ is connected to an input terminal, NFTIN, for receiving a data input signal from a predetermined bistable device forming part of the shift path of the shift path maintenance environment. The fourth input terminal, D₄, of the 4 × l data selector 60 is tied to a logic zero thereby providing a 0 input to the D terminal of the F/F 70 when the D₄ input terminal is selected. Select control signals DHOLD, DLOAD, DSHIFT, and DRESET, are selectively coupled to the respective select terminals S₁ through S₄ of the 4 × l data selector 60. The select control signals are generated by the logic of a decoder 20, a driver 40, and a selector 50 in response to input control signals. The input control signals include a first control signal corresponding to the reset control signal in the test mode, NFTR, a second control signal corresponding to a shift control signal in the test mode, NFTS, a third control signal corresponding to an asynchronous reset signal ASYNR, and a fourth control signal corresponding to a load control signal, LOAD. Thus, in the normal mode NFTM is a logic zero, causing the ASYNR terminal to be directly connected to the reset termial of F/F 70 via DMUX l0, and the normal clock signal, NCLK, is directly coupled to the clock terminal of F/F 70 through 2 × l MUX 30. The first and second control signals NFTR and NFTS are both a logic zero causing the select control signal DRESET and DSHIFT to be a logic zero. The fourth input control signal LOAD causes the selection of the D₁ or D₂ input terminal of the 4 × l data selector 60. When LOAD is a logic one, DLOAD is active thereby causing the data in signal DIN to be selectively coupled to the D terminal of F/F 70 via the 4 × l data selector 60. When the fourth input control signal LOAD is a logic zero, or low, the selected control signal DHOLD is active thereby selecting the D₁ input terminal of the 4 × l data selector 60 causing the hold condition to be present, i.e., the output of the F/F 70 is coupled to the D terminal of F/F 70. (The logic symbols utilized in the decoder 20, driver 40, and selector 50, are the standard AND, OR, and inverter functions defined by mil-std 806 which is readily recognizable to those skilled in the art.) The operation of the device of Figure l is shown in the truth table of Table l and is consistent with the description above. Although various states have been omitted, only the operational states have been shown. It is assumed that the other states will not occur and the design does not include the logic to prohibit these states although such logic, not forming a part of the present invention may be included. ASYN NFTM NFTR NFTS LOAD ACTIVE SELECT CONTROL 0 0 0 0 0 DHOLD 0 0 0 0 1 DLOAD 1 0 X X X F/F IS UNCONDITIONALLY RESET X = Don't Care. In the test mode, NFTM is a logic one causing the maintenance (or test) clock, TCLK, to be coupled to the clock terminal of F/F 70 and the ASYNR input terminal is selectively connected to the decoder 20. In test mode operation, NFTR and NFTS are initially a logic Zero. It is anticipated that the test operation proceeds such that NFTR is set to a logic one resulting in the select control signal DRESET being active selecting the D4 input terminal thereby resetting the F/F 70 coincident with the clock signal, TCLK (synchronous reset). NFTR is then returned to a logic zero, and NFTS is set to a logic one causing select control signal DSHIFT to be active thereby selecting input terminal D3 of 4 x 1 data selector 60 such that predetermined data at the NFTIN terminal is shifted into F/F 70. NFTS is then returned to a logic zero. The digital equipment or data processing system is then allowed to execute normally (i.e., in a totally synchronous fashion). If the reset signal, ASYNR becomes active during the execution, ASYNR is coupled through the decoder 20 and driver 40 such that DRESET becomes active. (The implementation is such that the DRESET select control signal overrides any of the other select control signals except DSHIFT.) However, the reset of the F/F 70 can only occur synchronously with the TCLK signal since the ASYNR signal is effectively coupled to the F/F 70 through the D input of F/F 70, thereby causing the asynchronous reset signal to reset the F/F 70 synchronously with the (TCLK) clock signal. The device of the present invention can then be utilized in asynchronous digital equipment having a shift path maintenance environment. The operation of the device 70 in the test mode is depicted in the truth table of Table 2. ASYNR NFTM NFTR NFTS LOAD ACTIVE 0 1 0 0 0 DHOLD 0 1 0 0 1 DLOAD 0 1 X 1 X DSHIFT 0 1 1 0 X DRESET 1 1 X 0 X DRESET X = Don't Care. Referring to Figure 2 there is shown a functional block diagram of the present invention implemented as a three-bit register. The control elements are utilized to drive a plurality of flip-flops, F/F0, F/Fl, and F/F2, and their associated 4 × l data selectors 60. The control elements, comprise the decoder 20, driver 40, DEMUX l0. selector 50, and 2 × l MUX 30. Each data selector 60 has a corresponding data input D₀, D₁, and D₂. The NFTIN input, that is the input of test data in the shift path is selectively connected to the least significant bit position F/F2 of the three-bit register. In the embodiment as shown in Figure 2 the Q output of F/F2 is operatively connected to the D₃ input terminal of the 4 × l data selector 60 associated with F/Fl, the D₃ terminal being the NFTIN input for the F/Fl stage or the shift input for this stage. Thus, in the test mode when data is being shifted into the register the output of the flip-flop 2 is coupled to the input of flip-flop l, an inversion occurring between each bit. Likewise, the Q output of flip-flop l is selectively connected to the D₃ terminal of the 4 × l data selector 60 associated with flip-flop 0. The output of the three-bit register of figure 2 for the shift data in the test mode is the Q output of flip-flop 0. It is a matter of design choice to choose the Q output of a stage as the input for the next stage, the Q input could have been chosen as well. The operation of the decoder 20, driver 40, DEMUX l0, selector 50, and 2 × l MUX 30 are the same as described above in connection with the one-bit register of Figure l. Although Figure 2 only shows a three-bit register, it will be understood that a five-bit register, eight-bit register, ... n-bit register can be implemented using the concept as described above in connection with the one-bit flip-flop, the size of the register being dictated by the technology utilized, real estate of the I/C available, power requirements, .... Figures 3A and 3B, taken together from figure 3, shows a logic circuit diagram of the one-bit D type register utilizing a CML technology. In this implementation it can be more readily seen how the DC reset input ASYNR′ overrides all inputs except NFFS' and sets the Q outputs of the flip-flop to a logic zero without a clock input in the normal mode. Although the specific implementation described herein is addressed to a D-type register device, it will be understood by those skilled in the art that the implementation can be readily applied to other logic devices, including J-K flip flops, counters, transparent latches, shift register, ....

Claims: Apparatus for selectively storing binary information represented by a normal operation data signal (DIN) and by a test operation data signal (NFTIN) applied to said apparatus, wherein said apparatus includes a flip-flop (70), said flip-flop having a first input terminal (D) for receiving a signal representing binary data, a second input terminal (C) for receiving a clock signal, a third input terminal (R) for receiving a signal for placing said flip-flop in a predetermined binary state and an output terminal (Q) for delivering an output signal representing the state of operation of said flip-flop, said flip-flop (70) being operational to switch to the binary state represented by the signal received at said first input terminal only when a clock signal is received at said second input terminal (C); said apparatus being characterized by further comprising: a signal selector (60) having first (D2), second (D3) and third (D4) input terminals and an output terminal, said first input terminal (D2) being coupled to receive said normal operation data signal (DIN), said second input terminal (D3) being coupled to receive said test operation data signal (NFTIN), and said third input terminal (D4) being coupled to receive a signal (ZEROS SYNC RESET) for placing said flip-flop (70) in said predetermined state, said selector (60) being responsive (at terminals S1-S4) to first (NFTR), second (NFTS) and third (ASYNR) control signals for selectively coupling said output terminal of said selector (60) to one of said first (D2), second (D3) or third (D4) input terminals of said selector (60); and a signal switch (10) having an input terminal and first (0) and second (1) output terminals, said input terminal being coupled to receive said third control signal (ASYNR), said first output terminal (0) being coupled to said third input terminal (R) of said flip-flop (70), said second output terminal (1) being coupled (via 20 and 40) to said signal selector (60), said switch (10) being controlled by a mode control signal (NFTM) to couple said input terminal (ASYNR) thereof to said first output terminal (0) when said apparatus is in the normal operational mode (NFTM=0), thereby causing the flip-flop (70) of said apparatus to be resetted immediately upon the occurrence of said third control signal (ASYNR) asynchronously to said clock signal and to couple said input terminal (ASYNR) thereof to said second output terminal (1), the signal thereof (DASYNR) being coupled to the same one of the terminals (S1-S4) of the signal selector (60) as is the first (NFTR) control signal, when said apparatus is in the test operational mode (NFTM=1), said second control signal (NFTS) having priority over said first (NFTR) and third (ASYNR) control signals in controlling said selector (60). Apparatus for selectively storing binary information according to claim 1, further characterized by a multiplexer (30) having an output terminal connected to the second input terminal (C) of said flip-flop (70), and having a first input terminal (1) adapted to receive a test clock signal (TCLK) and a second input terminal (0) adapted to receive a normal clock signal (NCLK), for coupling said test clock signal (TCLK) to said second input terminal (C) of said flip-flop (70) when said apparatus is in the test operational mode, and for coupling said normal clock signal (NCLK) to said second input terminal (C) of said flip-flop (70) when said apparatus is in the normal operational mode. Apparatus for selectively storing binary information according to claim 1 or 2, characterized in that said signal selector (60) further includes a fourth input terminal (D1) which is connected to the output terminal (Q) of said flip-flop (70), said fourth input terminal (D1) being selectively connected to the output terminal of said selector (60) in response to signal (S1) applied to its control terminals. Apparatus for selectively storing binary information according to claim 1, 2 or 3, further characterized by logic means (20, 40, 50) having a plurality of input terminals adapted to receive input control signals (NFTR, NFTS, LOAD, ASYNR) and being selectively connected to said signal selector (60) for providing a predetermined one of said input control signals to said selector (60), thereby selecting a predetermined input terminal of said selector (60) to be selectively connected to the input terminal (D) of said flip-flop (70). Apparatus for selectively storing binary information according to claim 1, characterized by a plurality of signal selector means (Fig. 2; 60) each having input terminals (D1-D4) and control signal terminals (S1-S4), and by a plurality of flip-flops (Fig. 2; 70) each having first, second and third input terminals (D, C, R) and an output terminal (Q), each flip-flop (70) having the first input terminal (D) connected to the output terminal of a corresponding selector (60), and having the second input terminal (C) adapted to receive a clock signal (TCLK or NCLK), and having the third input terminal (R) adapted to receive a reset signal, said plurality of flip-flops (70) being provided for storing the state present at the selected input terminal of each of said selector means (60) coincident with said clock signal, the plurality of flip-flops (70) and selector means (60) being connected such that the shifted test data signal is coupled from the output ( Q ) of one flip-flop (70) to the second input terminal (D3) of the next adjacent selector means (60).

Inventors: CRAIN, STEVEN L., MILLER, HOMER W.
Applicants: BULL HN INFORMATION SYSTEMS INC.
Application year: 1986
Main classification: G06F11
IPC codes: G01R31