TEST METHOD FOR DETECTING FAULTY MEMORY CELLS IN A PROGRAMMABLE SEMICONDUCTOR DEVICE

Abstract: For testing unwritten-in field programmable memory cells, after some specified written-in cells have been previously provided in the semiconductor device, the method comprises: enabling a readout circuit ( READOUT ) which reads datum written in the memory cell; switching addressing-signals selecting the memory cell from a written-in cell (M t ) to an unwritten-in cell (M₀, M₁, ...) to be tested, causing the voltage of the bit line operatively connected to the selected unwritten-in cell to start to rise gradually to that of the unwritten-in cell; and detecting the delay of this rising voltage after the moment of the address-switching by measuring the voltage level at a predetermined time, or by measuring the time necessary for this rising voltage to reach a predetermined threshold level, said delay corresponding to the degradation of the cell by leakage. As a variant, while the readout circuit is disabled, the addressing signals are switched from selecting a written-in cell to selecting an unwritten-in cell to be tested, then the readout circuit is enabled, and the delay of the rising voltage is detected as above, but the time is measured from the moment at which the "enable" signal( ) is applied. The delays can also be detected at the output terminal (O o ) of the readout circuit.

Description: The present invention relates to a method for detecting a faulty memory cell of a programmable semiconductor device. More particularly, the present invention relates to a method for detecting a delayed access time caused by the degraded isolation resistance of an unprogrammed cell. Very many programmable read only memories made by using a semiconductor technology (referred to hereinafter as PROM) have been widely used in the electronic industry. They can be classified by the type of the memory cells, such as a fuse-blown type, a junction-shortening type and an insulator-shortening type. The fuse-blown PROM is that in which the write-in operation is carried out by applying a high current therein to blow the fuse. The junction-shortening PROM, so-called diode type, is that in which the write-in operation is carried out by applying a high current therein to shorten the reverse p-n junction diode. The insulator-shortening PROM, so called condenser type, is that in which the write-in operation is carried out by applying a higher voltage than its break-down voltage to shorten the insulator made of, for example, a silicon dioxide, in place of the above-mentioned p-n junction diode. As a representative prior art which supports the explanation of the present invention, a PROM of the p-n junction type shall hereinafter be described in detail. A general concept of a modern PROM of junction-shortening type is also described by the inventor et al. in a paper "A 40 ns 64 Kbit Junction-Shortening PROM", IEEE JOURNAL OF SOLID-STATE CIRCUITS, Vol sc-19, No.2, Apr. 1984. Fig.1a schematically illustrates a vertically cross sectional view of a memory cell of the junction-shortening type and Fig.1b shows the equivalent circuit of the cell M₀. A diode D, as a programmable element, and a reverse current stopper element Q operatively connected in series are composing the memory cell M₀. The diode D is connected in a direction to block the current flow from the bit line. The reverse-current stopper Q is a p-n-p transistor connected in a direction to allow a current to flow from the bit line therethrough and through the diode D. This stopper element Q can be a diode; however, the description shall be given only for the case using a transistor, because the stopper element is not directly concerned with the present invention. As shown in Fig. 1a, the diode D is composed of n⁺ and p⁺ diffusion layers fabricated by carrying out an ordinary n-p-n transistor technology. The p-n-p transistor Q consists of the p⁺ diffusion layer, which is common to the p-n junction diode, an n-epitaxial layer, and a p⁻ substrate. An aluminium electrode (not shown in Fig.1a) is provided as a bit line B₀ on the n⁺ layer which is the cathode of the diode D. The common base of the transistor Q acts as a word line W₀. The memory cell M₀ is addressed, namely selected, by applying high level (referred to hereinafter as H) on the bit line B₀ as well as low level (referred to hereinafter as L) on the word line W₀. For programming, namely writing-in an addressed cell, current pulses of 125 mA and 11µs are applied to the addressed cell through the bit line. This high current not only breaks down the reversely connected diode but also increases the temperature of the junction to result in its shortening. As for reading-out the cell, when a cell us addressed, and if the diode D has been previously shortened, namely programmed (referred to hereinafter as written-in), a current flows from B₀ through D and Q to the ground. If the diode D is non-conductive, namely not programmed (referred to hereinafter as unwritten-in), the above-mentioned current does not flow. Thus, the memorized datum in the cell, "1" or "0", can be read-out by sensing the existence of this current flow. In Fig. 1c, there is shown the voltage-current characteristic between B₀ and W₀ of an addressed unwritten-in memory cell. This characteristic is dominantly affected by the degradation of the reverse diode D by its leakage, because the transistor Q is conductive. The ideal characteristic of a memory cell is shown by the curve (a), where the current is almost zero as far as the applied voltage is below the breakdown voltage of normal 6 to 7 volt, and sharply increases when the applied voltage exceeds the breakdown voltage. This breakdown is caused by the Zener-breakdown of the reverse diode D. The curve (b) and (c) show the characteristics of degraded memory cells each having so-called soft breakdown. The leakage is normally caused by lattice defects at the surface or abnormal diffusion. When this current leakage is large or the breakdown voltage is low, it is difficult to distinguish this leaky cell from a written-in cell and, in the worst case, this results in an error of reading-out. Therefore, the leakage below a specified voltage of the reverse diodes must be tested and rejected at the production stage of the PROM. Another problem caused by this leakage of the unwritten-in diode is concerned with the access time, the delay time for reading-out. A leaky unwritten-in cell has a longer access time than that of the normal cell. The mechanism of this delay, the longer access time, is as follows. Before a bit line is addressed, the voltage level of the bit line B₀ is L. At the moment at which the bit line is addressed, the bit line voltage starts to rise up to the H level, receiving a current from a power voltage source V cc through a fixed resistor R₁ as shown in Fig.2. However, each bit line is destined to have a stray capacity C₀ parallel to the cell, and, because of the time constant of the charging resistor R₁ and the stray capacity C₀, the voltage rise on the bit line is gradual as shown by the curve C₁ in Fig. 3. Then, if the cell has a leakage, the charging current into the capacity is reduced by the amount of the leakage and also the charge in the capacity is lost through this leakage. Accordingly, not only the voltage at a steady state is lower than that of a normal cell, but also the speed of the voltage rise is slower as shown by the curve C₂ compared with the curve C₁ relative to a normal cell. The access operation of a memory cell is completed when the bit line reaches the threshold level, and the output level of the output buffer is changed. Thus, a leaky cell results in more delay of completion of access operation than that of the normal cell. When the integration of PROMs was not so large and the access time was not so severely required as today, the access delay caused by a small leakage as above-mentioned was not so serious. However, as PROMs become larger in memory capacity, the variation of characteristics of cells becomes larger, and the probability to produce cells having a small leakage as shown by the curve (b) of Fig. 1c is also increasing. Therefore, a method to effectively detect a faulty cell, exhibiting a small leakage must be imperatively established. In general, in order to discriminate a leaky cell, a DC (direct current) test may be used, where a limiting current level as shown by TL in Fig. 1c is specified. However, the value of TL cannot be reduced as much as required, because the possible lowest value of TL is limited by the peripheral circuit in use. The reason why the detectable lowest leakage current is limited is as follows. The constitution of a typical PROM is shown by the block diagram in Fig. 4. The output terminal O₀ is used in three ways, namely for reading-out, writing-in and testing. Testing of a cell is done by applying a voltage on the output terminal O₀ in order to inject a current from an external tester, and sensing the current flowing thereinto. There are provided as many output terminals as there are read-out bit lines, but only one terminal O₀ is referred to, this being enough to explain the principle of the cell test. PROG shown in Fig. 4 denotes a programming circuit, a circuit for writing-in a cell. A circuit diagram relating to one memory cell of the programming circuit PROG is schematically illustrated in Fig. 5 in detail. Further in Fig. 4, XADD denotes an X-address buffer, and D/D denotes a decoder/driver all of which are equivalent to the word driver WD in Fig.5. YADD denotes a Y-address buffer, which, in case of reading-out, controls the multiplexer MPX to select the bit line of the cell to be read-out, as well as in case of writing-in, controls the programming circuit PROG to select the bit line of the cell to be written-in. CE denotes a circuit for enabling, namely activating, the output buffer OUT , at chip-enable state. TW and TB denote respectively a test word line and a test bit line, by each of which test cells are operatively connected to be addressed. These test cells are written-in cells which have been provided in addition to the ordinary memory cells for testing purposes. The function of the programming circuit PROG, used for testing a cell, is described hereinafter. As shown in Fig. 5, the circuit PROG is composed of transistors Q₁, Q₂ mutually in Darlington connection, a resistor R, a diode D₁ both of which are for pulling up the collectors of these transistors to a power source V cc , and a constant-current power source CS. (If the collectors are floated without being pulled-up, a parasitic capacity of the collectors may cause a malfunction of the circuit). The output terminal is operatively connected to the collectors of the Darlington circuit through a diode D₂, which prevents a current from flowing towards the outside. In this circuit, when the word line W₀ is addressed by the word decoder WD and the bit line B₀ is addressed by gate NAND₁ which is controlled by the combination of signals in Y-address buffer YADD, the transistors become conductive by a current I₁(0.3mA) supplied from the current source CS, thus a current I₂ from the power source V cc through the resistor R and the diode D₁, together with the current I₁, are ready to flow into the bit line B₀. The resistor R is of approximately 1 Kohm, for example, so the current I₂ is of approximately 2 mA. At this stage, if the addressed cell M₀ is conductive, namely previously written-in or having a defectively large leakage, the current I₁+I₂ flows into the bit line B₀. If the addressed cell M₀ is unwritten-in, this current does not flow thereinto. As previously described, the test of the cell is done by sensing a current flowing into the terminal O₀ while injecting a current into this terminal from an external tester. However, if the leakage current of the cell under test is as low as I₁+I₂, no current can flow into the terminal O₀, because the current I₁+I₂ is already supplied from other sources. Thus, at the terminal O₀ the external tester can only detect a current of more than I₁+I₂. This means that the lowest detectable level of the leakage current of the cell is TL=I₁+I₂. Therefore, if the leakage current is lower than I₁+I₂ the above-described DC method cannot detect a faulty cell whose access time is so long as cannot be disregarded. It is an object of the present invention to provide a method for detecting and rejecting a faulty unwritten-in PROM cell having an access delay caused by a leakage current which cannot be effectively detected by a DC method. The method according to the invention is specified in claim 1. In order to embody the present invention, some specified memory cells of a PROM under test have been previously written-in. While a readout circuit is enabled, input signals to address a written-in cell are switched so as to address an unwritten-in cell, then a delay of a voltage produced on the bit line of the addressed unwritten-in cell is detected in comparison with the applied addressing pulse. Or while the readout circuit is disabled, input signals to address a written-in cell are switched so as to address an unwritten-in cell, and successively the readout circuit is enabled, and then a delay of a voltage produced on the bit line of the addressed unwritten-in cell is detected in comparison with the application of the enabling signal. A faulty cell is discriminated by the degree of above-mentioned delay, an access delay. The above-mentioned features and advantages of the present invention, will become more readily apparent from the following description. Figs.1a, 1b, 1c schematically illustrate a memory cell of a junction-shortening type (as an example of a programmable cell type), an equivalent circuit thereof, and the voltage-current characteristics between bit line and word line of an addressed unwritten-in memory cell. Fig. 2 shows a readout circuit and the related cells of a PROM on which the present invention can be carried out. Fig. 3 shows a transient voltage characteristic of an unwritten-in memory cell. Fig. 4 shows a block diagram of a PROM. Fig. 5 shows a circuit diagram of a programming circuit for the PROM of Fig. 4. Fig. 6 shows timing charts for explaining the test method using address-switching according to one embodiment of the present invention. Fig. 7 shows timing charts for explaining the test method using enable-switching according to another embodiment of the present invention. Referring now to Fig. 2, there are shown a readout circuit and the related circuits for carrying out the method embodying the present invention. Q₅, Q₆ denote transistors of an output stage. Q₇ denotes a driver transistor. Q₈, Q₉ denote transistors of the input stage. These five transistors compose an output buffer OUT , which also acts as an inverter. The multiplexer MPX is composed of NAND gate NAND₀, a Schottky barrier diode D i , a resistor R₁ and a transistor Q₈. Each set of multiplexer is provided for each bit line respectively. A multiplexer and the output buffer compose a readout circuit READOUT . While there are many word lines and bit lines in a PROM, only word lines W₀, W₁, W t , bit line B₀ and their related memory cells are shown, as it will be sufficient to illustrate the present invention. When the PROM chip is selected, namely the readout circuit is enabled, the chip-enable signal CE applied to inverter INV is of an L level. Thus, the output of the inverter INV is of an H level, resulting in turning off the p-n-p transistor Q₉ connected at the output of inverter INV. In addition to this condition, if the NAND gate NAND₀ delivers H level to select the bit line B₀, the output signal O₀ of the output buffer OUT , an inverter, falls to L corresponding to the signal H of the bit line B₀. In other words, if the addressed cell is non-conductive, thus the voltage V b at the common point between NAND₀ and diode D i , which voltage is always of the same logic level as the voltage V a on the bit line B₀, is H. The transistors Q₈, Q₇ and Q₆ are conductive and the transistor Q₅ is non-conductive resulting in delivering L on the output terminal O₀. If the addressed cell is conductive, thus V b is L, the transistors Q₈, Q₇ and Q₆ are non-conductive and the transistor Q₅ is conductive resulting to delivering H on O₀. At the fabrication stage of the PROM, the memory cells which are programmable by a PROM-user at field, are of course non-conductive, while the test cells which are used for testing the programmable unwritten-in cells are made conductive according to a predetermined layout scheme. These test cells have been provided in addition to the field programmable cells, originally for testing the peripheral circuits installed in the chip of PROM. Details of testing the peripheral circuits in a PROM by using written-in test cells were disclosed by the inventors et al. in the US Patent No.4320507, "FIELD PROGRAMMABLE DEVICE HAVING TEST PROVISIONS FOR FAULT DETECTION", filed Nov. 19, 1979 and the US Patent No. 4429388, "FIELD PROGRAMMABLE DEVICE WITH INTERNAL DYNAMIC TEST CIRCUIT", filed Dec. 8, 1980. In Fig. 2, M t denotes a written-in, conductive, test cell. W t denotes a word line operatively connecting bases of stopper transistors of the test cells. As a simple example of the layout scheme of the written-in test cells, all the cells connected to the single word line W t may be written-in. When the written-in memory cell M t is addressed, the voltage V a of the bit line B₀ becomes L level (the value denoted as V L ), namely approximately 1.2V, which is the voltage drop across the conductive transistor of the written-in cell. The value 1.2V is the sum of approximately O.5V, an addressing level, delivered by the decoder/driver D/D and approximately O.7V, the base-emitter voltage drop V BE of the stopper transistor. The voltage V a is produced by the current flowing from the power source V cc through the resistor R₁ and the diode D i . Then, the voltage V b is 1.6V which is O.4V (the forward drop V F of the diode D i ) higher than that of V a . However, this 1.6V of V b is not high enough to make the transistors Q₈, Q₇ and Q₆ conductive, because the threshold voltage to trigger the transistor Q₈ is approximately 1.9V which is the sum of each base-emitter voltage necessary to begin to make each of these three transistors conductive. At this state, the output O₀ is H. When the unwritten-in cell M₀ is addressed, no current flows into the bit line B₀, resulting in reduced current flowing through the resistor R₁. Then, this reduced current produces a reduced voltage drop across the resistor R₁, thus the voltage V b rises up as high as approximately 2.1V, which is the sum of the three base-emitter voltage drops receiving the current from the resistor R₁, and is clamped at this voltage. So, the voltage V a is 1.7V, an H level (the value denoted as V H ), which is V b less 0.4V (=V F ), and the transistors Q₈, Q₇ and Q₆ are conductive, resulting in L on the output terminal 0₀. Variation of the voltage V a of the bit line B₀ by time, a transient voltage against time, is illustrated in Fig. 3. If the written-in test cell M t has been addressed, the voltage V a of the bit line B₀ is V L . Then, at this state, if the addressed cell is switched to the programmable unwritten-in cell M₀, the V a starts to rise uo to V H . If the addressed cell is a normal cell having sufficiently little leakage, the rising up of the V a is as fast as shown by the curve C₁. However, if the cell is faulty, showing a leakage, the rising-up is slow, or delayed, as shown by the curve C₂, which means a long access time. (If the leakage is very large there is no voltage rising up and the faulty cell is not distinguished from a written-in cell.) Therefore, a faulty cell having a long access time caused by its leakage can be discriminated by checking the voltage level of V a in comparison with a predetermined threshold level, for example V₀ in Fig.3, measured at a predetermined moment T s , for example 50 ns after the signal to switch the cell-addressing is applied. In Fig.3, the curve C₁ passing beyond V₀ at T s means "normal", and the curve C₂ passing below V₀ at the same moment means "faulty". Practical ways of checking the delay are hereinafter described using timing charts in some detail. Referring to Fig. 6, the functions of the testing method are described in more detail. Fig. 6a illustrates timing charts of address-switching from a written-in cell to an unwritten-in cell according to the present invention. Fig. 6b illustrates timing charts of address-switching from an unwritten-in cell to another unwritten-in cell, i.e. not according to the present invention. As for Fig. 6a, application of the signal VIM inhibits all the field programmable unwritten-in cells while addressing a word line or a bit line which accesses written-in test cells. The signal VIM has three levels L, H and HH. The HH is 10V, for example. Function of the signal VIM will not be discussed further in detail because it is not essential to describe the present invention, but the details are disclosed by the inventors et al. in the Japanese Patent No. 1217316, "Logic Circuit for Test Bit Selection" registered July 17, 1984, (the examined patent publication No. Toku-58-053440, Nov. 29, 1983). A written-in test cell has been addressed until a moment (defined as t=0), (referred to hereinafter as a first moment) shown by a chain line, at which moment the addressing is switched so as to access an unwritten-in cell. When a written-in cell is addressed, the signal V a on its bit line B₀ is V L , the signal V b is V L +V F , and the output signal O₀ is H. At the steady state after an unwritten-in cell is addressed, the signal V a on the bit line is V H , the signal V b is V H +V F and the output signal O₀ is L. When the diode of the addressed unwritten-in cell has a leakage, the signal V a rises as shown by a dotted line more slowly than that of the normal cell shown by a solid line. When the signal V b , having a same trend as V a , reaches the threshold level V t , the output signal O₀ falls from H to L. Thus, the moment, denoted as the second moment, at which the output signal falls to L is detected and measured by the external tester. The delay of this second moment with regard to the first moment at which the address pulse is applied to the written-in cell is called the access time, or t PHL . In Fig.6a, the normal access time is defined by the moment at which the solid line of a normal cell reaches V t , the time t AA . The access time of a leaky cell is defined by the moment at which the dotted line reaches V t , the time t AA '. Thus, the access time is easily detected and measured by an external tester, so that the access time can be specified in the test terms in order to discriminate a faulty cell. There is another way to specify the delay of the access time as an alternative to the above-mentioned method. In this alternative, logic level H or L of the signal V b at a specified moment T s is specified, in comparison with the threshold level V t (=1.9V) at which the transistor Q₈ turns from "non-conductive" to "conductive" as mentioned before. The logic level L or H of signal V b is correspondingly converted to the logic level H or L of the output terminal O₀ and can accordingly also be detected by an external tester. Namely, the buffer OUT acts also as a comparator. Therefore, the logic level of the output terminal O₀ at a predetermined time T s in Fig. 6a can be specified in the test terms in order to discriminate a faulty cell. The smaller the value of T s , the smaller the checked delay time of the cell. On the other hand, all the user-programmable cells are, of course, unwritten-in until they are eventually written-in by a user. Therefore, without using a written-in cell, if the address switching is done from an unwritten-in cell M₀ to another unwritten-in cell M₁, the voltage V a of the bit line B₀ remains essentially the same, or changes much less than in the case of the test performed according to the present invention. Namely, if the cells are not leaky at all, the voltage is kept at the same value V H , and if the newly addressed cells are leaky, the voltage drop determined by the value of the leakage is observed as shown by the dotted lines in Fig. 6b. However, the voltage drop affected on V b is not large enough to trigger the output circuit OUT . So, discriminating of a faulty cell is difficult. However, in contrast with this difficulty in discriminating faulty cells, the use of a written-in cell according to the method of the present invention, enables the production of evident changes in the voltages V a and V b , as above-described. Therefore, when the addressing of the written-in cell and unwritten-in cell is switched, reliable discriminating of the faulty cells can be achieved. There is another way of performing address switching. Namely, at first, the readout circuit READOUT , composed of the multiplexer MPX and the output buffer OUT , is disabled; at second, the addressing is switched from a written-in cell to an unwritten-in cell to be tested; at third, the readout circuit is enabled; at fourth, the delay of output signal from the moment of applying the address switching pulse is measured. Comparison to this embodiment of the method according to the invention with the above described first embodiment is shown in the following table for easier understanding Referring to Fig.2, the function of the chip-enable signal is explained first. When the chip-enable signal CE is H, meaning chip-disabling, the output of the inverter INV is L, so that the transistor Q₉ is conductive, the transistor Q₅ is non-conductive and the emitter of the transistor Q₈ is clamped to the L level of the inverter INV through the diode D j . Accordingly, the transistors Q₇ and Q₆ are non-conductive, and, therefore, the state of the output terminal O₀ is high-Z (a high impedance). In other words, the transistors Q₅, Q₆ operatively connected to the output terminal O₀ are both non-conductive, keeping the output terminal floating. (The output level is determined only by external circuits operatively connected to this terminal O₀.) This type of circuit is called a tri-state structure, delivering H, L and high-Z. At the high-Z state, the voltage V b is 1.6V, which is the sum of 0.5V (L level of INV out), 0.4V (forward drop V F of the diode D j ) and 0.7V (V BE of transistor Q₈). Further, at this state, if a written-in cell M t is addressed, its bit line voltage is 1.2V, which is equivalent 1.6V (V b ) less O.4V (V F ). While the readout circuit is disabled, if an unwritten-in normal cell is addressed, its bit line B₀ becomes floating, because the voltage V b is kept pulled down to 1.6V by L of the INV output through D j and V BE of transistor Q₈, letting the diode D i be non-conductive. However, if the unwritten-in normal cell is addressed successively after addressing a written-in cell, the bit line B₀ holds the voltage 1.2V of the previous state, that is addressing the written-in cell, because the voltage is held by the charge of the stray capacity C₀ of the bit line. At this state when an unwritten-in cell has been addressed, if the readout circuit is switched so as to be enabled by applying a chip-enable signal CE at level L, the H output of the INV turns off the transistor Q₉ as well as pushes the voltage V b up to 2.1V through diode D j and transistor Q₈. Thus the voltage V a rises up to V H , 1.7V, which is V b less V F . However, if the cell is leaky, the voltages V a and V b rise slowly, as shown by the dotted lines in Fig. 7a and Fig.3, and, accordingly, the falling of the output O₀ from H to L is delayed as shown also by a dotted line. Using an external tester, this moment of the falling of the output signal can be measured as an access delay time from the moment of applying the enable signal pulse CE . This delay time is called chip-enable access time, t AC or delay from high Z to L, t PZL , and specified in the test specification. This access delay can also be checked by reading signal level H or L of the output terminal O₀ at a predetermined time T s . The shorter T s corresponds to the smaller leakage. Accordingly, T s is a test condition in a specification to check a faulty cell caused by its degraded isolation. In a case not according to the present invention, where addressing is at first switched from an unwritten-in cell to another unwritten-in cell and successively the readout circuit is switched from "disable" to "enable", the voltage V b is 1.6V, and the voltage V a is also approximately 1.6V, because this value was 1.7V in the previous enabled state and now the voltage drop D F of the diode D i is nearly zero or reversely biased. The voltage V a is determined by the amount of the leak, as shown by the dotted line in Fig. 7b. At this stage, if the readout circuit is enabled, the voltage V b can rise up to 2.1V quickly, whereas the voltage V a rises up from 1.6V to only 1.7V. Accordingly, it is very difficult to detect a faulty cell by detecting the difference in the rising voltage. An advantage of the above-described second embodiment using "enabling" of the readout circuit over the first embodiment using only address-switching is that the applied voltage difference upon the unwritten cell is certainly obtained by "enabling" the readout circuit after address switching is completed. In the first embodiment, the voltage V a on the written-in cell may rise for some degree while the addressing is passing other cells before reaching an unwritten-in cell of destination. This unexpected voltage rise of V a causes less voltage difference applied on the unwritten-in cell to be tested, resulting in a less sensitive detection of a faulty cell. However, in the second embodiment, the address switching is carried out, without voltage being supplied to the bit line during the "disabling" period. Thus, the voltage difference is always secured. The specified test condition is very equivalent to the practical application. Access time of the normal cells are distributing below 50 ns, however, faulty cells having small leakage are distributed near 70 ns in group, which proves that the sorting of the faulty cell is achieved easily and reliably. The written-in cells have been previously provided in the PROM cells for testing the peripheral circuits therein as cited above. Therefore, no additional provision of written-in cell or of circuit is required in the chip or in the external test equipment for the test according to the present invention, but only some addition of test programming is required. Accordingly, the cost increase for embodying the present invention is almost nothing. However, according to the present invention, a leaky cell which causes access delay but could not be detected by the prior art is quite easily and quite reliably detected, resulting in an improvement of quality control in the factory and also an improvement of writing-in ratio at field. Although the above description has been made with reference to a junction-shortening type PROM, it is apparent that the invention can be carried out on PROMs of other types, such as of fuse-blown type, insulator-shortening type and others. Other modifications can be made to the above described embodiments without departing from the scope of protection. For example, instead of performing the address switching from a written-in cell to an unwritten-in cell, the address-switching from an unwritten-in cell to a written-in cell is also possible according to the present invention, when a different kind of peripheral readout circuit, such as for reading-out the word lines, is used. In addition, although the address switching is described hereinabove on a single bit line, it may be performed, according to the present invention, between different bit lines. It is because the memory cells on a single word line can be all written-in cells, as on the test word line shown in Fig. 2 and 4, that the voltage V a on all the bit lines can be simultaneously pulled down to 1.2V. The same applies in the case of a single bit line with all the memory cells operatively connected thereto being written-in, as shown in Fig. 4. Further, although in the above description the address-switching and enable-switching are both initiated by external signals, it is apparent that, according to the present invention, these switching operations can be initiated automatically by using a built-in circuit or built-in program on the chip, respectively. Still further, instead of having a readout circuit in the form of a buffer acting also as a comparator/inverter, it is apparent that at least one of or a combination of a comparator, an inverter, an amplifier or a flip-flop can be used for forming the readout circuit. Still further, instead of carrying out the detection of the variation of the bit line at the output terminal of the readout circuit, said detection can be carried out by measuring the voltage of inner circuits by means of probes. In this case, the threshold level can be specified independently from the threshold level of the readout circuit. Finally, it may be noted that the detection of variation of voltage in the testing method according to the invention can be carried out at an output terminal of the device through at least one of the comparators which convert said varying voltage of an analogue signal to a digital output signal, whereby said variation of voltage is measured digitally by an external testing means.

Claims: A method for testing a programmable semiconductor device having unwritten-in cells (M₀,M₁) for field-programming as well as previously written-in cells (M t ) for test, said method being characterized in that it includes the steps of: (a) switching the state of one of the written-in cells (M t ) and the state of one of the unwritten-in cells (M₀,M₁) to be tested for a line (B₀); (b) detecting variation of voltage (V a ) associated with said switching (a) on that line (B₀); and (c) comparing said detected value (V a ) with a predetermined specification value (V o ), whereby the unwritten-in cell is determined to be normal or faulty. A method according to claim 1, characterized in that said switching cited in said step (a) is carried out by firstly selecting the written-in cell and secondly selecting the unwritten-in cell. A method according to claim 1, characterized in that said switching cited in said step (a) is carried out by firstly selecting the unwritten-in cell and secondly selecting the written-in cell. A method according to claim 1, wherein the programmable semiconductor device comprises a readout circuit which is provided for sensing a state of a selected cell, characterized in that said variation of voltage cited in said step (b) is made available by said cell switching cited in said step (a) while enabling said readout circuit. A method according to any one of claims 2 and 3, characterized in that said switching is carried out by changing address input signals for addressing a cell. A method according to claim 1, characterized in that said voltage cited in said step (b) is a voltage on a bit line of a cell selected by said step (a). A method according to claim 1, characterized in that said voltage cited in said step (b) is a voltage on a word line of a cell selected by said step (a). A method according to claim 1, wherein the programmable semiconductor device comprises a readout circuit which is provided for sensing a state of a selected cell, characterized in that said variation of voltage cited in said step (b) is unavailable while said readout circuit is disabled, and is made available by enabling said readout circuit. A method according to claim 8, characterized in that the enabling of the readout circuit is carried out by a chip-enable signal which enables as well as disables the output of the device. A method according to claim 1, characterized in that said detection of variation of voltage cited in said step (b) is carried out by measuring said voltage level a predetermined time after said variation of voltage starts. A method according to claim 1, characterized in that said detection of variation of voltage cited in said step (b) is carried out by measuring a delay time at which said voltage reaches a predetermined threshold voltage, said delay time being measured after a moment at which said voltage variation starts. A method according to any one of claims 10 and 11, characterized in that a moment at which said variation of voltage starts is defined by a moment at which said switching cited in said step (a) is initiated. A method according to claims 4 and 10, or 8 and 10, or 4 and 11, or 8 and 11, characterized in that said moment at which said variation of voltage starts is defined by a moment at which said "enabling said readout circuit" is initiated. A method according to any one of claims 10 to 13, characterized in that the detection of variation of voltage is carried out at an output terminal of the device through at least one of comparators which convert said varying voltage of an analogue signal to a digital output signal, whereby said variation of voltage is measured digitally by an external testing means.

Inventors: FUKUSHIMA, TOSHITAKA
Applicants: FUJITSU LIMITED
Application year: 1986
Main classification: G11C29
IPC codes: G11C29, G11C17