OPTICAL TRANSDUCER ELEMENT AND DISPLACEMENT METER COMPRISING SUCH AN ELEMENT

Abstract: A transducer element (1) for converting a displacement of an object connected to the element into an optical signal and a displacement measuring device compri­ sing such an element are described. The transducer element comprises first strips (4) which alternate with second strips (3) in the direction of the displacement to be measured, the first strips comprising phase gratings (4) in which the grating grooves (30) have a width equal to half the grating period (p) and such a depth (d) that the zero-order diffraction beam is suppressed. The device comprises an imaging system (7, 13) having such an aper­ ture that the first and higher-order diffraction beams are not transmitted to a radiation-sensitive detection system (14).

Description: The invention relates to an optical transducer element for converting displacements of an object connected to said element into an optical signal, which element com­ prises a flat body provided with a plurality of dark first strips which in the direction of displacement of the element alternate with bright second strips. The invention also relates to a device for measuring rectilinear or angular displacements of an object provided with such an element. The term "displacements" is to be interpreted in its widest sense. It is to be understood to mean both linear displacements of an object and rotations of an object about a specific object axis. Since the position of an object is the displacement of this object relative to a reference point and the velocity with which an object moves is the derivative of the displacement with respect to time, the transducer element can also be utilized for determining the position or the velocity of an object. European Patent Application no. 0,096,448 describes a device for determining angular displacements of an object, the transducer element being a transparent disc provided with radially extending radiation-­ reflecting strips. This disc is arranged between a radiation source and a radiation-sensitive detection system. This system comprises a large number of detectors arranged in line. The displacement of an object, for example a part of a machine tool, or the movement of a manipulator in an automated production machine or measuring apparatus can be measured by imaging the strip pattern of the transducer element onto the corresponding strip pattern of the detection system. The individual detectors of this system supply electric pulses depending on the dis­ placement or the position of the object relative to the detection system, which pulses can be processed electronically to form a measurement signal. In order to obtain the desired resolution of, for example, 0.005° and the desired reproducibility of, for example, 0.001° of the measuring device the transducer element must comply with very stringent requirements with resp­ pect to the width of the strips, i.e. their dimension trans­ verse to the direction of movement and the position of these strips. In a specific version of a currently used transducer element for measuring angular displacements in a goniometer the width of the strips is approximately 318 µm, the positional accuracy of the strip being of the order of 1 µm. The strips comprise, for example, chromium strips on a glass disc. This disc-shaped transducer element, also referred to as "angular position encoder", must be manufactured with special equip­ ment employing known lithography techniques as used in the fabrication of integrated circuits. The known angular-position encoder discs are comparatively expensive. There is an increasing need for transducer elements for measuring angular displacements as well as rectilinear displacements, which are substantially cheaper and, preferably, also more accurate. In accordance with a first aspect of the present invention both requirements are met and then is provided a novel type of transducer element. This element is characterized in that each of the first strips comprises a phase grating comprising grating strips which are arranged behind each other in the longitudinal direction of the rele­ vant strip and which are disposed at a first level which differs from a second level at which the intermediate grating strips situated between the grating strips are disposed, which grating strips exhibit the same transmittivity or reflectivity as the intermediate grating strips, the difference in level being such that a phase difference of 180° is intro­ duced between the zero-order sub-beam and a first-order sub-­ beam formed when a part of a radiation beam is incident on the grating, the width of the grating strips being sub­ stantially equal to that of the intermediate grating strips, in such a way that strip-shaped gratings introduce dark bands into a radiation beam originating from the transducer element. The phase structure of this transducer element has the great advantage that it can be replicated cheaply and in large numbers from a master element. The master for an angular transducer element can be inscribed with very high accuracy using the equipment also employed in the fabrication of a master disc for an optical record carrier containing an audio program or a video program, which are now generally known by the name of "Compact Disc" or "CD" and "Laser Vision Disc" respectively. The "CD" or "Laser Vision" technology can also be utilized in the fabrication of a linear transducer element, i . e . a transducer element for measuring linear or rectilinear displacements. In this way an angular or linear transducer element can be obtained at a cost of the order of one tenth of the cost of the known transducer element. On account of said choise of the phase-grating parameters it is achieved that the radiation which is incident on the phase structure is diffracted and cannot reach the detection system, so that "viewed" from the detection system the phase gratings behave as black strips and the strip structure of the transducer element is observed as a black-and-white or amplitude structure. The transducer element in accordance with the invention may be entirely transparent. The difference in level between the grating strips and the intermediate grating strips is then approximately where λ is the wavelength of the radiation with which the transducer element is scanned, n₂ is the refractive index of the substrate of the transducer element, and n₁ is the refractive index of a medium covering the phase gratings. Suitably, the transducer element is radiation-­ reflecting. Such an element is characterized further in that the difference in level between the grating strips and the intermediate grating strips is approximately λ/4.n, where n is the refractive index of a medium covering the phase gratings. Preferably, the grating strips are continuous strips. Preferably, the grating strips are continuous strips. However, alternatively the grating strips may comprise areas situated at another level than the intermediate grating strips, which areas are spaced from each other in the grating track direction by inter­ mediate areas situated at the same level as the interme­ diate grating strips. In accordance with a preferred embodiment of the invention the transducer element is characterized further in that the phase-grating structure is provided with a transparent coating. This coating protects the grating structure against mechanical damage, such as scratches, and dirt. Preferably, a reflecting transducer element having a protective coating is characterized further in that the protective coating is constituted by the transparent substrate of this element. The transducer element is then of very simple construction, whilst the phase gratings are fully protected against mechanical dama­ ge and dirt because the radiation beam traverses the substrate both on its way towards the grating structure and on its way back from this structure. A second aspect of the invention concerns a device for measuring displacements of an object, which device comprises a radiation source and a radiation-­ sensitive detection system. This device is characterized in that a transducer element as defined above is arranged in the radiation path between the radiation source and the detection system and in that a limiting aperture is interposed between the transducer element and the detection system, which aperture transmits readiation issuing from the second strips to the detection system but does not allow the passage of the radiation diffracted by the phase gratings. This aperture, which suitably comprises a lens aperture situated nearest the transducer element of a lens system arranged between the transducer element and the detection system, together with the geometry of the phase gratings, ensures that these gratings are observed as black-and-white strips. The detection system suitably comprises a multi­ ple photocell comprising an array of linear diodes which are connected to an electronic circuit by an electronic switch, which circuit processes the signals generated in the diodes. Such a multiple photocell is described in United States Patent Specification no. 3,973,119. In a device for measuring angular displacements special measures have to be taken in order to match the radial strip pattern of the transducer element and the strip pattern of the detection system to one another. If the detection system comprises a plurality of detectors arranged in line, an optical system, comprising refractive and/or reflecting surfaces may be arranged between the transducer element and the detection system to convert the radial strip pattern of the transducer element into a linear strip pattern. Different versions of such an optical system are described in European Patent Application no. 0,096,448. However, in a preferred embodiment the displacement measuring device is characterized further in that the photodiodes of the multiple photocell are arranged along a curve which coincides with the curvature of the image of the strip pattern of the transducer element formed at the location of the photocell. An angular displacement measuring device in which the transducer element in accordance with the invention is combined with a curved or radial multiple photocell can be manufactured at substantially lower cost than a known device and, moreover, exhibits a higher measurement accuracy. Embodiments of the invention will now be des­ cribed in more detail, by way of example, with reference to the accompanying drawings. In the drawings: Figs. 1a and 1b are respectively a side view and a plan view of an angular displacement measuring device employing a reflecting transducer element in accordance with the invention, Fig. 2 is a block diagram of the electronic processing circuit employed in this device, Fig. 3 is a plan view of a part of an angular transducer element in accordance with the invention, Fig. 4 is a cross-sectional view of a phase grating of this element in a first embodiment, Fig. 5 is a cross-sectional view of a phase grating of this element in a second embodiment, Fig. 6 is an angular displacement measuring device comprising a radiation-transmitting angular trans­ ducer element, Fig. 7 is a plan view of a part of an angular transducer element, in another embodiment, Fig. 8 shows a part of a transducer element in accordance with the invention for measuring rectilinear displacements, and Fig. 9 shows a device for measuring rectilinear displacements comprising such an element. Figs. 1a and 1b show a round disc 1 having a centre M, which disc contitutes the angular transducer element and is connected to an object, not shown, whose rotation is to be measured. This disc may form part of a goniometer, i . e . a manipulator by means of which a specimen of a substance to be analysed is arranged at a specific angle relative to, for example, a beam of measurement radiation. Goniometers are employed, for example, in spectrometers or microscopes operating with X-rays. The disc may also form part of an angular transducer in a machine tool. The disc 1 is provided with a pattern 2 of equidistant reflecting strips 3 which alternate with non-reflecting strips 4. The disc is illuminated by a beam 6 originating from a radiation source 5, for example a light-emitting diode (LED) or a diode laser. The source 5 is arranged in the focal plane of a field lens 7 which ensures that the beam 6 emerges as a parallel beam. The beam which traverses the field lens is reflected to the disc by a reflecting element 9. The radiation which is reflected by the disc 1 is projected to a radiation-sensitive detection system, for example a multiple photocell 14, via the element 9, the field lens 7, a semitransparent mirror 12 and an objective 13. Fig. 2 gives a front view of the multiple photocell 14 and a block diagram of the signal-processing circuit. The photocell 14 comprises a comparatively large number of photosensitive elements, such as photodiodes 15, arranged in a comparatively small number of groups. Consequently, each group comprises a large number of photodiodes. The number of photodiodes per period of a projected track pattern 2 should be as large as possible in order to ensure a most faithful electrical reproduction of the optical signal. On the other hand, the track pattern 2, which comprises for example 720 strips 3 and 720 strips 4 over its entire circumference, should be scanned over an area which is as large as possible. In an example of a multiple photocell 14 the number of photodiodes is 220 and the length of each photodiode is 1.8 mm. The width of each photodiode is approximately 10 µm and the spacing between the photodiodes is also approximately 10 µm. The number of photodiodes per period of the track pattern 2 is ten, so that the field of view covers 22 periods. Corresponding photo­ diodes of each set of 10 succeeding photodiodes are inter­ connected, which means that there are ten groups of 22 photodiodes each. By means of the multiple photocell 14 it is possible to simulate a stationary strip structure having a black-white ratio of 1:1 by activating five successive groups of photodiodes. A travelling strip pattern arises when the set of five groups each time moves one group. In the processing circuit shown in block sche­ matic form in Fig. 2 clock pulses 21 generated in a clock-pulse generator 20 are applied to a divider 22 and a divider 23. The divider 22 supplies pulses 24 which drive a ring counter 25. The multiple photocell 14 is activated by the ring counter 25 and supplies the measurement signal 26. The divider 23 supplies pulses 27 (usually of another repetition rate than the control pulses 24 from the divider 22) to form a reference signal. In the buffer counter 28 the measurement signal 26 and the reference pulses 27 are compared with each other. The output pulses of the buffer counter 28 are applied to, for example, an indicator. The ring counter 25 activates the successive groups of photodiodes of the multiple photocell 14, giving the effect of a strip pattern travelling over the surface of the photocell 14 with a constant velocity. The period of this pattern is equal to that of the projection of the pattern 2 on the photocell 14. When the pattern 2 is stationary relative to the photocell 14 the measurement signal has a constant frequency. If the projection of the pattern 2 moves in the same direction as the apparent strip pattern activated by the ring counter 25, the frequency of the measurement signal 26 decreases, whilst in the case of a movement in the opposite direction the frequency of the measurement signal 26 increases. In this way the direction and magnitude of the displacement of the strip pattern 2 and hence the displacement of the object can be determined. Within a range of one period of the strip pattern 2 the position of the multiple photocell 14 rela­ tive to the pattern 2 can be determined in an absolute manner by measuring the phase difference between the measurement signal 26 and the reset signal of the ring counter 25. Each time that a measurement is started the ring counter 25 must be reset in order to guarantee that the counter 28 starts counting from a well-defined initial state. However, the circuit becomes simpler and more reliable if the ring counter 25 is reset after every period. The reset signal is obtained by dividing the pulses 24 in the counter 29. The frequency of the reset pulses is selected to equal the nominal frequency of the measurement signal 26. In the angular-displacement measuring device in accordance with the present embodiment optical elements are arranged in the radiation path between the disc 1 and the field lens 7 to ensure that the radial strip pattern 2 is imaged on the multiple photocell 14 as a parallel strip pattern. As is shown in Figs. 1a and 1b, these elements may comprise a cylindrical lens 10 and a reflector 9 of conical shape. The operation of these elements is described in European Patent Application no. 0,096,448 which has been laid open to public inspection, which Patent Application al­ so describes alternative optical systems for converting a radial track pattern into a linear track pattern. Instead of a multiple photocell it is also possible to employ a combination of a linear pattern of alternate radiation-transmitting and non radiation transmitting strips behind which a single detector is arranged. In accordance with the invention the strips 4 of the angular transducer element comprises phase gratings. Fig. 3 is a plan view of a part of this transducer and Fig. 4 is a corss-sectional view of the grating taken on the line AA′ in Fig. 3. A phase grating 4 comprises a plurality of grating grooves 30 which in the radial direc­ tion r of the disc alternate with intermediate strips 31. The width b₁ of the grating grooves is equal to the width b₂ of the intermediate strips and is consequently equal to half the grating period p . This period is of the order of 1 µm and in a specific example it is equal to 1.2 µm. In this example the width b₁ is consequently 0.6 µm. The beam 6 which is incident on the disc 1 may be thought of as comprising beam components or primary beams having a width equal to the width of one grating 4. Since the wavelength of the beam 6 is of the order of the width b₁ of a grating groove a grating 4 will split an incident primary beam into a non-diffracted zero-order beam and a plurality of diffracted first and higher-order sub-beams. The angle at which the first-­ order beams are diffracted is given by sin β = λ/p, so that for the wavelength value considered here, for example 900 nm, the angle β is some tens of degrees. In Fig. 1a the field lens 7 has a specific numerical aperture, such that the first-order sub-beams and also the higher-order sub-beams which are diffracted at larger angles cannot pass the field lens and consequently cannot reach the detection system 14. The zero-order sub-beam, which in the case of perpendicular incidence of the primary beam on a phase grating 4 is reflected in the direction of this primary beam, can traverse the objective. Since the widths b₁ and b₂ are equal the zero order sub-beam contains equal amounts of radiation originating from the grating grooves 30 and from a the intermediate strips 31. Moreover, as the optical path lengths for the radiation components origina­ ting from the grating grooves 30 differ by half a wave­ length from the optical pathlength for the radiation components originating from the intermediate strips 31, in other words there is a phase difference of 180° between these two radiation components, these radiation components will cancel each other. This means that the detection system 4 receives no radiation from the phase gratings 4, or that the phase gratings are observed as absorbing strips. The primary beams incident on the reflecting strips 3 are not diffracted, so that these strips reflect radiation towards the detection system. Thus, an angular transducer element in the accordance with the invention operates in the same way as the known trans­ ducer comprising radiation-reflecting strips on a glass plate. However, the transducer element in accordance with the invention can be manufactured substantially cheaper and with a higher accuracy than the known disc. Said optical pathlength difference of half a wavelength can be obtained by giving the grating grooves 30 a depth of a quarter wavelength in the case of a reflecting transducer element in which the phase gratings 4 and the intermediate strips 3 adjoin air. Preferably, the transducer element is coated with a transparent coating, 33 in Fig. 4, which protects the grating structure from mechanical damage. If this protective coating has a refractive index n , the depth of the grating grooves should be approximately λ/4.n. In a very suitable embodiment a reflecting trans­ ducer element comprises a transparent substrate, 34 in Fig. 4, which acts as the protective coating. Fig. 5 schemati­ cally shows this embodiment in a sectional view similar to that in Fig. 4. In Fig. 5 the incident radiation is indicated by the arrows 6 and the reflected radiation by the arrows 6′. In addition, the back of the transducer element shown in Fig. 5 may be provided with a thin layer 36 to prevent the phase structure from being damaged via the back. As the layer 36 is not traversed by the measure ment radiation this layer need not comply with special optical requirements. The layer 6 may be a foil attached to the transducer element or a lacquer coating. The advantage of the use of a reflecting transducer element is that the displacement measuring device can be compact and that all the elements, except for the transducer element and, if applicable, the elements 9 and 10, can be accommodated in one housing, which bears the reference numberal 16 in Fig. 1a. Alternatively, the transducer element in accordance with the invention may be radiation-transmitting. In order to obtain the desired phase difference of 180° between the radiation components originating from the grating grooves 30 and the radiation components originating from the inter­ mediate strips 31, the depth d of the grating grooves should be substantially equal to λ /2.(n₁-1) in the case that the grating structure borders on air. Here, n₁ is the refractive index of the substrate. If the grating structure is covered with a transparent protective layer having a refractive index n₂, the groove depth is equal to d = λ /2.(n₁-n₂). Fig. 6 shows an angular-displacement measuring device comprising a radiation-transmitting transducer element. The radiation source 5 and the field lens 7 are arranged at one side, for example, the lower side of the element 1 and the reflecting conical surface 9, the cylindrical lens 10, a second field lens 37, the objective 13 and the radiation-sensitive detection system are arranged at the other side. In order to simplify the explanation of the operation of the angular transducer element it is assumed that the grating grooves 30 have straight walls. However, in practive the walls are generally inclined. The optimum depth d of the bottom of the grating grooves will then be larger than the values of specified above for a reflecting element and for a radiation of transmitting element. For the calculation of the effect of such grooves use is made of a strictly vectorial diffraction theory as disclosed in United States Patent Specification no. 4,230,915, which describes the information pits or hills of an optical record carrier containing an audio program (Compact Disc) or a video program. In accordance with the vectional diffraction theory as stated in said United States Patent Specifica­ tion an optimum read signal is obtained if the depth of the pits or the height of the hills is such that a phase difference of 180° is introduced between the zero-order sub-beam and the first-order sub-beam. The same requirement holds for an optimum cancellation of radiation by the grating structure of the present transducer element. Instead of grooves the grating strips 30 of the phase gratings 4 may comprise ribs on the surface of the disc. A large number of angular transducer elements in accordance with the invention can be manufactureed comparatively cheaply by one time scanning a photosensitive layer deposited on a round disc by means of a tiny light spot. This spot is moved over the disc in concentric circles, the radiation of the spot being switched on and off periodically to form a pattern of concentric tracks in which exposed annular segments alternate with non-­ exposed annular segments and corresponding segments of consecutive tracks have the same radial positions. After the entire disc has been scanned, the exposure pattern is converted into a depth or height profile in known manner. From the disc or master thus manufactured a large number of copies can be made using known replica techniques. When the mastering and replica techniques known from the "Compact Disc" or "Laser Vision" technology are used the desired patterns can be formed with very high accuracy. The grating strips 30 of the transducer element in accordance with the invention need not comprise continuous grooves or ribs but may alternatively comprise a sequence of pits, or hills 37 which alternate with inter­ mediate areas 38 in the direction of the grating strips 30, i . e . in the tangential direction t of the disc, as is shown in Fig. 7. This Figure shows a part of such a transducer disc in plan view. The depth of the pits, or the height of the hills 37 should comply with the same requirements as specified hereinbefore for the depth or height of the grating strips or grating ribs 30. The length of the areas 36 in the tangential direction t is equal to that of the intermediate areas 38. As a result of the division of the grating grooves or ribs into pits or hills 37 a beam which is incident on a grating 4 is not only diffracted in the radial direction but also in the tangential direction out­ side the first pupil of the imaging system (7, 13), so that the radiation of this beam cannot reach the detec­ tion system 14. The transducer element shown in Fig. 7 is manufac­ tured in a way similar to that described for the transducer element comprising continuous grating grooves or ribs, the only difference being that during inscription of the grating strips themselves the radiation spot is switched on and off with a high frequency. An embodiment of the angular transducer element in accordance with the invention comprises 742 gratings 4 and 742 intermediate strips 3. The period of the track structure in the tangential direction is 635 µm, the strips 3 and 4 having the same width. The gratings 4 have a length ( 1 in Fig. 3) of 10 mm and these gratings are centred on a radius of approximately 50 mm. Within the gratings the grating period p is 1.2 µm and the width of the grating strips and that of the intermediate grating strips is 600 nm. The depth d of the grooves 30 is approximately 150 nm for a refractive index n = 1.5 of the protective coating formed by the substrate 35, which is made of polymethyl methacrylate (PMMA) or polycarbonate (PC). This transducer is used in conjunction with a light-emitting diode with a wavelength of 900 nm. The positional accuracy of the phase gratings 4 in the tangen­ tial direction is approximately 100 n.m. When this trans­ ducer is used in an angular-displacement measuring device comprising a multiple fotocell as the detection system, a measurement accuracy of approximately 0.3 seconds of arc or 0.0001° can be obtained. The present invention not only provides the angular transducer element described above but also an elongate transducer element for measuring rectilinear displacements. The latter element differs from the angular transducer element only in that the phase gratings comprise straight strips on a rectangular plate instead of segments on a circular disc, which strips extend transversely of the longitudinal direction of the plate. The linear trans­ ducer element can also be manufactured cheaply with a high accuracy and in large numbers by means of Compact-Disc mastering and replica techniques, in which case the equipment requires some adaptation in view of the elongate shape of the transducer element. Fig. 8 is a plan view of a part of the transducer element 40. The phase gratings bear the reference numeral 41 and the reflecting or transparent in­ termediate strips 42. 43 are the grating grooves or ribs and the intermediate grating strips bear the numeral 44. The linear transducer element may be constructed in the same way as described for the angular transducer element with reference to Figs. 4, 5 and 7. Fig. 9 shows schematically a device for measuring rectilinear displacements, comprising said transducer element. In this Figure the numeral 45 indicates a radiation source arranged in the focal plane of the field lens 46, so that the illumination beam is a parallel beam 6. The radiation reflection by this transducer element 40 is projected via the objective 48 by a semi-transparent mirror 47 onto a radiation sensitive detection system for example a multiple photocell 14. The grating grooves or ribs 43 may again comrpise pits or hills. An angular displacement measuring device which is very suitable in respect of its accuracy and cost is that in which the angular transducer element in accordance with the invention is combined with a multiple photocell invented by the Applicant and comprising photodiodes arranged along a curve adapted to the curve passing through the centres of the phase gratings on the transducer element. The use of the elements 9 and 10, which have to be aligned accurately, can then be avoided. Fig. 10 shows schematical­ ly the angular displacement measuring device. This Figure, in which the reference numerals correspond to those in the Fig. 1a, requires no further explanation after the description of Fig. 1a.

Claims: 1. An optical transducer element for converting dis­ placements of an object connected to said element into an optical signal, which element comprises a flat body pro­ vided with a plurality of dark first strips which in the direction of displacement of the element alternate with bright second strips, characterized in that each of the first strips comprises a phase grating comprising grating strips which are arranged behind each other in the longitudinal direction of the relevant strip and which are disposed at a first level which differs from a second level at which the intermediate grating strips situated between the grating strips are disposed, which grating strips exhibit the same transmittivity or reflectivity as the intermediate grating strips the difference in level being such that a phase difference of 180° is introduced between the zero-order sub-beam and a first-order sub-beam formed when a part of a radiation beam is incident on the grating, the width of the grating strips being substantially equal to that of the intermediate grating strips, in such a way that strip-shaped gratings introduce dark bands into a radiation beam originating from the transducer element. 2. An optical transducer element as claimed in Claim 1, which element is radiation-reflecting, characterized in that the difference in level between the grating strips and the intermediate grating strips is substantially λ/4.n, λ being the wavelength of the radiation used andn being the refractive index of a medium covering the phase gratings. 3. A transducer element as claimed in Claim 1 or 2, characterized in that the grating strips are continuous strips. 4. A transducer element as claimed in Claim 1 or 2, characterized in that the grating strips comprise areas situated at another level than the intermediate grating strips, which areas are spaced from each other in the grating-strip direction by intermediate areas which are situated at the same level as the intermediate grating strips. 5. An optical transducer element as claimed in Claim 1, 2, 3 or 4, characterized in that the phase grating structure is provided with a transparent coating. 6. An optical transducer element as claimed in Claim 5, having a radiation-reflecting phase-grating structure, characterized in that the protective coating is constituted by the transparent substrate of the transducer element. 7. An optical transducer element as claimed in any one of the preceding Claims, characterized by a round disc-­ shaped substrate in which the phase gratings are formed in sectors of equal width, which sectors in the tangential direction alternate with intermediate sectors of the same width. 8. A device for measuring displacements of an object, which device comprises a radiation source and a radiation-­ sensitive detection system, characterized in that a trans­ ducer element as claimed in any one of the preceding Claims is arranged in the radiation path between the radiation source and the detection system and in that a limiting aper­ ture is interposed between the transducer element and the detection system, which aperture transmits radiation issuing from the second strips to the detection system but does not allow the passage of the radiation diffracted by the phase gratings. 9. A device as claimed in Claim 8, for measuring angular displacements of an object, in which the detection system comprises an array of linear diodes which are consecutively connected to an electronic circuit by an electronic switch, which circuit processes the signals generated in the diodes, characterized that the photo­ diodes of the multiple photocell are arranged along a curve which coincides with the curvature of the image of the strip pattern of the transducer element formed at the location of the photocell.

Inventors: DIL, JAN GERARD C/O INT. OCTROOIBUREAU B.V.
Applicants: N.V. PHILIPS' GLOEILAMPENFABRIEKEN
Application year: 1986
Main classification: G01D5
IPC codes: H03M1, G01D5, G01B11