ELECTRON BEAM TESTING OF INTEGRATED CIRCUITS

Abstract: An apparatus and a method for monitoring the functioning of an integrated circuit (1) in operation using an electron beam directed to a particular node of the circuit which is of interest and measuring the energy of the secondary electrons (2) emitted, in which the energy measurement is made using a filter grid (3), the bias (18) on which is set by comparing a voltage representing the rate of receipt of secondary electrons (2) past the filter grid (3) with a reference voltage and adjusting the bias (18) in response to the comparison so as to reduce the number of electrons received. A current is produced proportional to the difference between the two voltages and applied to charge a capacitor, the voltage on which is used to set the voltage on the filter grid (3). The electron beam may be pulsed and the comparison gated in synchronism with the pulsing but delayed relative to it so that the control of the a filter grid bias is effected only when the signal due to the secondary electrons emitted in response to the beam pulse is received by the comparator. A second but similar channel using different reference and filter bias voltages may be provided and the voltage on the filter grid taken alternately from the two channels to eliminate certain errors in the setting of the filter grid voltage. The different voltages may alternatively be switched into a single channel alternately with the first voltages.

Description: This invention relates to the testing of integrated circuits using an electron beam. A difficulty encountered in testing an integrated circuit is that the only outputs which can be monitored by conventional means such as meters and oscilloscopes are those on the output conductors of the circuit because the internal conductors are very small and are also inaccessible under insulating coatings and the currents flowing may be extremely small. It has been found that when an electron beam is directed at a node of an integrated circuit in operation the energies of secondary electrons emitted from the integrated circuit are dependent on the potential of the node of the circuit being bombarded and such bombardment does not impose loads on the circuit sufficient to interfere with its operation. Use has been made of this property to derive indications of the potentials at various places on the circuit to assess its performance. A critical factor in the accurate measurement of the electron energies and therefore of the circuit potentials is the setting of the potential on a filter grid in the secondary electron detector, which determines the minimum energy level of the electrons detected and to achieve this the potential is set by means of a feedback loop from the number of electrons passing the filter grid. In practice the accuracy with which the filter grid potential is set is limited by the maximum open loop gain. Another problem which arises with the control loops which have been used hitherto is their restricted bandwidth which results from the box car averaging of the secondary electron signal and its subsequent comparison with a reference level. It will be evident that the control produced by such a loop is strongly dependent on the frequency of the signal at the node under examination, and in practice it is necessary to reset the adjustment of the apparatus to accommodate a change in the signal frequency. It follows that tests on an integrated circuit producing variable frequency signals cannot be performed using a system of this type. Where the frequency of the voltage at the node of the integrated circuit under test is too high to be measured in real time because of the bandwidth limitation of the loop which may be below 1 MHz, it is possible to follow the voltage at the node by gating the electron beam or output produced by the secondary electrons in short pulses from each of which a single point of the voltage waveform is derived. This is repeated with the time of the gating varied relative to the cycle of voltage changes in the integrated circuit to produce a series of points defining the voltage waveform in the circuit after the manner of operation of a sampling oscilloscope. This is known as the stroboscopic mode. A known circuit for controlling the voltage on the filter grid of an electron beam tester for integrated circuits is described in GB-A-2,021,789. The prior art circuit uses a voltage amplifier and is for measuring steady or slowly varying voltages on conductors of an integrated circuit. It is an object of the present invention to improve the performance of an electron beam testing system for integrated circuits. According to one aspect of the present invention there is provided a method of monitoring the voltage at a node of an integrated circuit, using an electron beam to bombard a selected part of the integrated circuit under test to generate secondary electrons having energies dependent on the electrical potential at the selected part and collecting the secondary electrons resulting from the bombardment using a detector having a biased filter grid which allows to pass electrons having energies above a predetermined value set by the bias potential on the filter grid, the bias potential on the filter grid being controlled in response to the electrons passing the filter grid so that the bias potential is dependent on the potential at the selected part, characterised in that the method includes the steps of: producing an electrical signal representing the number of electrons passing the filter grid, applying the electrical signal to an amplifying loop including a transconductance amplifier receiving the electrical signal and a reference signal as inputs and generating an electric current proportional to the difference between the electrical signal and the reference signal, applying the electric current to a substantially wholly capacitive load to produce an integrated amplified difference signal and addiing the amplified difference signal to a filter bias signal to provide a feedback signal which is applied as the bias potential to the filter grid, the amplifying loop having an open loop voltage gain to frequency characteristic with a rolloff substantially equal to 6 dB/octave over substantially its whole unity gain bandwidth, and using the amplified difference signal to produce an output signal representing the potential at the selected part, whereby the output signal can monitor high frequency variation in the potential at the selected part of the integrated circuit under test so that the functioning of the integrated circuit in operation can be monitored. According to a second aspect of the present invention there is provided apparatus for monitoring the voltage at a node of an integrated circuit, in which a selected part of an integrated circuit under test is bombarded by an electron beam to create secondary electrons having energies dependent on the potential at the selected part, and those of the secondary electrons having energies sufficient to pass a biassed filter grid means are collected by a detector which produces an output electrical signal used by a control loop to set the bias potential on the filter grid means, so that the bias potential on the filter grid means is dependent on the potential at the selected part, characterised in that the electron detector produces an output electrical signal representing the number of electrons passing the filter grid means, and the control loop includes transconductance amplifier means responsive to the output electrical signal of the electron detector to produce an output electric current proportional to the difference between the output electrical signal and a reference signal, integrating capacitor means connected to be substantially the only load on the transconductance amplifier means and charged by the output electric current of the transconductance amplifier means to produce an integrated amplified difference signal, and adding means for adding a filter bias signal to the amplified difference signal to provide a feedback signal which is applied over a feedback path as a bias potential to the filter grid means, the control loop being such that it has an open loop gain to frequency characteristic having a rolloff substantially equal to 6 dB/octave over substantially its whole unity gain bandwidth, means being provided for producing from the amplified difference signal an output signal representing the potential at the selected part of the integrated circuit under test, whereby the output signal can monitor high frequency variation in the potential at the selected part of the integrated circuit under test so that the functioning of the integrated circuit in operation can be monitored. In order that the invention may be fully understood and readily carried into effect it will now be described with reference to a specific example and a modification of that example shown in the accompanying drawings of which:- FIGURE 1 shows in diagrammatic form the example of the invention; FIGURE 2 shows the spectrum of secondary electron energies emitted by a target under electron bombardment; FIGURE 3 is a normalised graph of the number of secondary electrons having energy greater than a given value emitted from the target under electron bombardment; this graph is referred to herein as the S-curve; FIGURE 4 shows the open loop voltage gain of the example of the invention plotted against frequency compared with the equivalent characteristic of the prior art; and FIGURE 5 is the circuit diagram of a transconductance amplifier suitable for use in the example of the invention. In the apparatus shown in Figure 1 an integrated circuit under test is placed at 1 and a selected part of it is bombarded by a beam of electrons whilst the circuit is in operation. The electron gun, the deflection system and the evacuated envelope containing them and the integrated circuit 1 are not shown since these could be of conventional construction for a system of this kind. Secondary electrons indicated by the dotted lines 2 are emitted by the integrated circuit 1 and pass upwards through an energy analyser 3 having a filter grid 4. The energy analyser 3 may have a construction as described in copending European Patent Application No. 84307068.1 (0138610). The retarding field due to the voltage on the filter grid 4 allows only secondary electrons having energies greater than that corresponding to the filter grid voltage to pass. The secondary electrons passing the filter grid 4 impinge on a scintillator 5 to produce a light output represented as the photons 6. The energy analyser 3 and the scintillator 5 are also located in the evacuated envelope. A photomultiplier tube 7 receives the photons from the scintillator 5 and produces an electrical signal on conductor 8 which after amplification by a head preamplifier 9 is applied to the signal input of a transconductance amplifier 10. A reference voltage is applied via a conductor 11 to a second input of the amplifier 10. The amplifier 10 has provision for being gated by sampling pulses applied to its gate signal input 12. The output current of the amplifier 10 is applied directly to a shunt connected integrating capacitor 13 and to the input of a buffer voltage amplifier 14 having d.c. negative feedback. The output voltage of the amplifier 14 is connected to a waveform buffer amplifier 15 having resistors connected so that it acts as an inverting amplifier of fixed gain to produce a linearly amplified output on terminal 16. The amplifier 14 is also connected to a filter grid drive amplifier 17 arranged as a summing amplifier to combine the output of the amplifier 14 with a filter bias voltage applied to a terminal 18. The output of the amplifier 17 is connected to the filter grid 4 by a conductor 19. In the operation of the apparatus shown in Figure 1 the rate at which secondary electrons strike the scintillator 5 is maintained substantially constant by adjustment of the voltage on the filter grid 4, and a voltage corresponding to that applied to the filter grid, though differing from it by a constant (related to the filter bias applied to the terminal 18) and a factor, is produced at the terminal 16. It has been found that the voltage change required to be made to the filter grid to keep the secondary electron rate constant is substantially equal to the voltage change at the selected part of the integrated circuit under test, and therefore the output voltage on the terminal 16 can be arranged to follow quite closely the voltage on the integrated circuit. This is the real time mode of operation of the apparatus. Figure 2 is a normalised graph of the rates of emission of secondary electrons plotted against their energies emitted from an integrated circuit as a result of bombardment by a primary electron beam; the position of the entire graph on the energy scale moves with the voltage at the part of the integrated circuit being bombarded, the shape of the graph being substantially unaffected. Figure 3 is derived from Figure 2 and shows the numbers per unit time of secondary electrons having energies above a predetermined level, and therefore passing the filter grid, for different values of filter grid voltage. This graph is termed the S-curve after its shape, and determines the effectiveness of the loop in controlling the filter grid voltage so that the number of secondary electrons passing the filter grid is kept substantially constant. In the stroboscopic mode, the focussed beam of electrons which is directed to the part of the integrated circuit of interest is pulsed (typically each pulse is between 0.1 and 100 ns) so that a series of samples of the voltage at that part is obtained. The sample pulses applied to the gate input 12 of transconductance amplifier 10 are produced at the same rate as the pulsing of the electron beam but are delayed relative to these pulses by the time period taken for the voltage pulse to be produced at the signal input of the amplifier 10 in response to an electron beam pulse so that the amplifier 10 is switched off when the signal input is largely noise and is switched on when a meaningful signal input is expected. The output produced consists of many samples and the waveform of the signal at the part of the integrated circuit is built up as in a sampling oscilloscope by shifting the timing of the electron beam pulses relative to the waveform. In the stroboscopic mode the bandwidth of the loop is increased in the same proportion as the duty cycle of the beam operation is reduced because of the pulsing. It is important that the pulses should be shorter than the inverse of the bandwidth. The value of the integrating capacitance can be reduced in the same proportion as the duty cycle. The apparatus shown in Figure 1 uses a transconductance amplifier 10; this produces a current output signal proportional to a voltage input signal which is applied to an integrating capacitor 13. This circuit configuration produces a gain/frequency characteristic for the open control loop for the filter grid voltage having a 6 dB per octave rolloff extending over the entire frequency range of signals in the loop which is the ideal for a stable, fast settling closed loop. In the prior art where voltage amplifiers are used the rolloff extends only upwards from an intermediate frequency as a result of the inherent gain limitation of the amplifier. This is shown in Figure 4. The unity gain bandwidth of the system shown in Figure 1 is much higher than in the previously proposed system and can be 10 MHz or even higher due to the formation of the difference between the secondary electron signal and the reference signal before its application to the integrating capacitor. The gain of the other system components is independent of frequency to above the unity gain bandwidth of the closed loop. The integrating capacitor 13 may be of switchable value to enable the closed loop bandwidth to be reduced as necessary to optimise the filtering of shot noise in the signal derived from the secondary electrons. Figure 5 shows the circuit diagram of one example of the transconductance amplifier 10 suitable for construction in integrated circuit form. The amplifier is connected to a negative voltage rail 50 maintained at -15 volts and a positive voltage rail 51 maintained at +15 volts and produces at terminal 52 an output current proportional to the difference in voltage between the signal applied to the signal input 53 and the reference applied to the reference input 54. Two gate input terminals 55 and 56 are provided for a push-pull gating signal to turn the amplifier off and on. Two controlled current sources sharing a common resistor loaded current path 70 are provided respectively formed by transistors 57 and 58 and transistors 59 and 60 which feed accurately related opposite currents of 10 mA and 20 mA via conductors 61 and 62 to the transistor pairs 63 and 64 and 65 and 66. A further transistor pair 67 and 68 is connected to the collector of transistor 66. The output terminal 52 is connected to the collectors of transistors 63 and 68, and a current path exists between conductors 61 and 62 through transistors 63, 68 and 66 in series. The collectors of transistors 64, 65 and 67 are connected to ground. Transistors 57, 58 and 59 each have a 390 ohm emitter resistor, but transistor 60 has two 390 ohm resistors in parallel in its emitter circuit so that the collector current of the transistor 60 is twice that of the transistor 58. The bases of transistors 65 and 66 are respectively connected to the signal and reference inputs 53 and 54 through identical resistance-capacitance networks. They also receive bias currents from transistors 71 and 72 controlled by the transistor 59. The gate input terminal 55 is connected through transistors 73 and 74 arranged as inverting buffer amplifiers to the bases of transistors 64 and 68 respectively. The gate input terminal 56 is connected through transistors 75 and 76 arranged as inverting buffer amplifiers to the bases of transistors 63 and 67 respectively. Disregarding for the moment the function of the transistors 63, 64, 67, 68 and 73 to 76, the amplifier operates by feeding to the output terminal 52 a current equal to the difference between the current along the conductor 61 (10 mA) and that coming from the collector of transistor 66. If the signal input voltage (at terminal 53) were equal to the reference input voltage (at terminal 54) then the emitter current fed to these transistors (20 mA) via conductor would be divided equally between the collectors of the transistors 65 and 66. This would mean that the current from the collector of transistor 66 would be 10 mA and therefore equal to the current (10 mA) along the conductor 61, and no output current would flow to terminal 52. Changes in the signal input voltage at terminal 53, the reference input voltage being assumed to be kept constant, would change the proportion of current passing to the collector of the transistor 66 causing an imbalance of the currents at the output terminal 52 so that a resultant output current would flow. The transistors 63, 64, 67 and 68 act as a two pole changeover switch controlled by the gating signal applied to the terminals 55 and 56. When the terminal 55 is sufficiently positive relative to the terminal 56 the transistors 74 and 75 are conducting and the transistors 73 and 76 are non-conducting. This means that the collector of transistor 66 and the conductor 61 are connected to the terminal 52 so that an output current depending on the signal and reference voltages is produced and the transistors 64 and 67 are non-conducting. On the other hand, if the terminal 55 were to be sufficiently negative to the terminal 56 the transistors 63 and 68 would be non-conducting so that no output current would be fed to the terminal 52 and it could adopt any voltage the external circuitry imposed on it. The currents through the conducting transistors 64 and 67 are sunk to ground. To sum up the operation of the circuit of Figure 5, the transistors 65 and 66 serve to steer the controlled currents from the transistor 60 so that a proportion of it dependent on the input voltage is fed to the output terminal where the difference between the proportion and the current from transistor 58 appears as the output current of the amplifier. The transistors 63, 64, 67 and 68 under the control of a push-pull gating signal applied to the terminals 55 and 56 also steer the currents either to the output terminal 52 so that an output current is produced or to ground, the output terminal 52 being allowed to float. Although in the system shown in Figure 1 there is a control loop setting the voltage on the filter grid in response to the number of secondary electrons passing it, the actual measurement of the waveform in the integrated circuit 1 under test as represented by the output at terminal 16 is not a closed loop measurement. Variation in the secondary electron emission coefficient of the integrated circuit 1 is just one of several factors which can influence the number of secondary electrons impinging on the scintillator 5 which can appear spuriously as changes in the waveform output at the teminal 16. Another factor which affects the system gain, that is to say the relationship between the output waveform and the waveform in the integrated circuit, is the gain of the scintillator-photomultiplier-head amplifier combination despite the fact that these components are within the filter grid voltage control loop. The changes in the system gain affect the height of the S-curve (Figure 3) and therefore its slope at the working point, and this provides a way of detecting which changes in the output waveform are spurious and which reflect voltage changes in the integrated circuit.

Claims: A method of monitoring the voltage at a node of an integrated circuit (1), using an electron beam to bombard a selected part of the integrated circuit under test to generate secondary electrons having energies dependent on the electrical potential at the selected part and collecting the secondary electrons resulting from the bombardment using a detector having a biased filter grid (4) which allows to pass electrons having energies above a predetermined value set by the bias potential on the filter grid, the bias potential on the filter grid being controlled in response to the electrons passing the filter grid so that the bias potential is dependent on the potential at the selected part, characterised in that the method includes the steps of: producing an electrical signal representing the number of electrons passing the filter grid, applying the electrical signal to an amplifying loop including a transconductance amplifier (10) receiving the electrical signal and a reference signal as inputs and generating an electric current proportional to the difference between the electrical signal and the reference signal, applying the electric current to a substantially wholly capacitive load (13) to produce an integrated amplified difference signal and adding the amplified difference signal to a filter bias signal to provide a feedback signal which is applied as the bias potential to the filter grid, the amplifying loop having an open loop voltage gain to frequency characteristic with a rolloff substantially equal to 6 dB/octave over substantially its whole unity gain bandwidth, and using the amplified difference signal to produce an output signal representing the potential at the selected part, whereby the output signal can monitor high frequency variation in the potential at the selected part of the integrated circuit under test so that the functioning of the integrated circuit in operation can be monitored. A method according to claim 1 using an electron beam pulsed at a selected duty cycle to bombard the selected part of the integrated circuit so that the electrical signal representing the number of electrons passing the filter grid appears in pulses in response to the electron beam pulses, characterised in that the electric current is only generated when a pulse of the electrical signal is expected. A method according to claim 2, characterised in that the pulsing of the beam has a repetition frequency related to the frequency of a recurrent waveform at a selected part of the integrated circuit under test so that the pulses of the beam are stepped progressively through the waveform at successive occurrences of the waveform and the output signal is processed so as to describe a single occurrence of the waveform. Apparatus for monitoring the voltage at a node of an integrated circuit, in which a selected part of an integrated circuit (1) under test is bombarded by an electron beam to create secondary electrons (2) having energies dependent on the potential at the selected part, and those of the secondary electrons having energies sufficient to pass a biassed filter grid means (4) are collected by a detector (5,7) which produces an output electrical signal used by a control loop to set the bias potential on the filter grid means (4), so that the bias potential on the filter grid means is dependent on the potential at the selected part, characterised in that the electron detector produces an output electrical signal representing the number of electrons passing the filter grid means, and the control loop includes transconductance amplifier means (10) responsive to the output electrical signal of the electron detector to produce an output electric current proportional to the difference between the output electrical signal and a reference signal, integrating capacitor means (13) connected to be substantially the only load on the transconductance amplifier means and charged by the output electric current of the transconductance amplifier means to produce an integrated amplified difference signal, and adding means (17) for adding a filter bias signal to the amplified difference signal to provide a feedback signal which is applied over a feedback path as a bias potential to the filter grid means, the control loop being such that it has an open loop gain to frequency characteristic having a rolloff substantially equal to 6 dB/octave over substantially its whole unity gain bandwidth, means (15) being provided for producing from the amplified difference signal an output signal representing the potential at the selected part of the integrated circuit under test, whereby the output signal can monitor high frequency variation in the potential at the selected part of the integrated circuit under test so that the functioning of the integrated circuit in operation can be monitored. Apparatus according to claim 4, using an electron beam pulsed at a selected duty cycle to bombard the selected part of the integrated circuit so that the output electrical signal produced by the electron detector appears in pulses in response to the electron beam pulses, characterised in that the amplifier means (10) is arranged to produce an output electric current only during pulses of the output electrical signal. Apparatus according to claim 5, characterised in that the repetition frequency of the pulses of the beam is related to the frequency of a recurrent waveform at a selected part of the integrated circuit under test so that the pulses of the beam are stepped progressively through the waveform at successive occurrences of the waveform and the output signal representing the potential at the selected part is processed to describe a single occurrence of the waveform. Apparatus according to claim 5 or 6, characterised in that the transconductance amplifier means (10) has a first current steering circuit (60,65,66) responsive to the difference between the output electrical signal and the reference signal and a second current steering circuit (58,63,64,67,68) responsive to gating signals.

Inventors: SPICER, DENIS
Applicants: TEXAS INSTRUMENTS INCORPORATED, TEXAS INSTRUMENTS LIMITED
Application year: 1986
Main classification: G01R31
IPC codes: G01R31, H01L21, H01J37, G01Q20