DOUBLE INTEGRAL TYPE A/D CONVERTER

Abstract: Herein disclosed is a double integral type A/D converter for converting an analog signal into a digital signal. The A/D converter comprises, as circuit elements: an integrator having its one terminal made receptive of one of an unknown input voltage and a reference voltage; a comparator con­ nected with the output of the integrator and including a transistor having its collector or drain opened; offset correc­ tion means connected between the output of the comparator and the other terminal of the integrator for negatively feeding back the output of the comparator and including a series circuit having a switch, a resistor R₀ and an auto-zero capacitor C₀; a flip-flop made responsive to the output signal of the comparator for switching the operational mode of the integrator from an integration mode to an offset correction mode; and a counter for counting the inverse integration period of the reference voltage. These circuit elements, as recited, are packaged into a hybrid IC.

Description: Field of the Invention The present invention relates to a double integral type A/D converter for converting an analog signal into a digital signal and, more particularly, to a double integral type A/D converter for use with an electronic weighting system. Description of the Prior Art In the electronic weighting system required to have a high accuracy, the double integral type analong-to-digital converter (which will be shortly referred to as the "A/D converter") has been used as a converter for converting an analog signal into a digital signal. Before entering into detailed description of the present invention, cursory review will be made in the following on the prior art with reference to Figs. 1 and 2 of the accompanying drawings. An A/D converter capable of having its unknown input integration period changed freely by a computer has been proposed to have a structure shown in Fig. 1. In Fig. 1: reference letter A denotes a buffer; letter B an integrator; letter C a comparator; letter D a zero cross detector; letter E a flip-flop; letter F a counter; letter G a CPU (i.e., Central Processing Unit); and letter H an inverter. The operations of the circuit thus composed will be described in the following with reference to the timing chart of Fig. 2. When a start signal for starting the integration is outputted at a time t₁ from the CPU G, the counter F is cleared by the output signal inverted by the inverter H, and a switch S₁ is turned on to input an unknown input voltage V IN through the buffer A to the integrator so that the integration of the unknown input voltage V IN is started [as depicted by a waveform (b)]. Simultaneously with this, the flip-flop E is set to output a signal H (at a High level) from its Q terminal [as depicted by a waveform (c)]. Here, the flip-flop E is so constructed that it is set and reset when the input signal breaks from the H (high) level to an L (low) level. At a time t₂ when the unknown input voltage integration period terminates, the start signal from the CPU G takes the H level [as depicted by a waveform (a)) so that the switch S₁ is turned off whereas a switch S₂ is turned on to input a reference voltage V ref through the buffer A to the integrator B. At this instant, the count is started to generate an output in a reference voltage inverse-integration mode from the integrator B. Here, the double integral type A/D converter is equipped with a correction circuit for correcting the offset of a system including the integrator B. This correction circuit is constructed to negatively feed the output of the comparator C, which is connected with the output of the integrator B, back to the integrator B. If the count is stopped at a time t₃ so that the operation comes into a mode for correcting the offset of the integrator B, the comparator C comes into an oscillation mode in which its output oscillates between the "H" and "L" levels [as depicted by a waveform (e)]. If this oscillatory state is caused, the output of the comparator C cannot be directly inputted to the flip-flop E which is made operative to control the switching of the integration modes - because the flip-flop E may possibly have its reset and set terminals active simultaneously. With this in mind, therefore, there has been connected with the output of the comparator C the zero cross detector D which is composed of a multi-vibrator, a logical operation circuit and so on so that one shot of pulses is outputted at the time t₃ and inputted to the flip-flop E for switching the modes of the integrator B [as depicted by a waveform (g)]. As a result, the flip-flop E is reset to input its output pulses as a zero cross signal from its Q terminal to the CPU G [as depicted by the waveform (g)]. Thus, the double integral type A/D converter of the prior art is accompanied by a problem that it requires the zero cross detector having such a complicated circuitry as to increase the number of its part and raise its fabrication cost. Since, in the offset mode, the input level of the integrator does not correspond to the offset voltage of the buffer connected upstream of the integrator, there arises another problem that an auto-zero capacitor C₀ connected with the other input of the integrator is not accurately charged with the offset voltage of the whole system including the buffer, the integrator and the comparator. In US-A-3,893,103 a double integral analogue to digital converter is described which relies on timing circuits such as those described above to converge the oscillatory output of the comparator in order to be able to input the output of the comparator back to the integrator. DE-A-2 138 324 also describes a double integral analogue to digital converter which employs integration means inserted into the offset correction means for switching into an offset correction mode. Although this circuit can reduce an amplitude level it does not converge the oscillatory output of the comparator, mentioned previously. In another aspect, the A/D converter having the structure thus far described is suitably used with electronic weighting systems of various specifications having coarser to finer accuracies and can find remarkably wide applications. Therefore, it has been tried to assemble the A/D converter into a single package so that the number of steps of assemblage on the production line may be reduced while the quality of the package being improved. In the single package of the prior art, however, there has been used a hybrid IC (i.e., Integrated Circuit), which is prepared, for example, by forming a circuit pattern on a ceramic substrate, by connecting circuit elements such as resistors, capacitors, transistors and/or semiconductor elements with the circuit pattern, and by molding those circuit elements with a silicone resin, an epoxy resin or the like. Despite of this structure, however, the hybrid IC is accompanied by the following problems: (1) Because of a lower heat resistance, the hybrid IC has to be held at a lower temperature in the temperature test of its final product than a monolithic IC so that it cannot be tested to a satisfactory extent. In other words, the hybrid IC cannot be burned in under the same conditions as those for the monolithic IC. (2) The single package using the hydbrid IC cannot be small-sized as small as that using monolithic IC. (3) Since the single package using the hybrid IC is simply coated, its heat resistance becomes liable to be deteriorated by cracks, if any, thereby to produce inferior products. According to a primary aspect of the present invention, there is provided a double integral type A/D converter for converting an analog signal into a digital signal, comprising: an integrator having its one terminal made receptive of one of an unknown input voltage and a reference voltage; a comparator connected with the output of said integrator and including a transistor having its collector or drain opened; offset correction means connected between the output of said comparator and the other terminal of said integrator for negatively feeding back the output of said comparator and including a series circuit having a switch, a resistor R₀ and an auto-zero capacitor C₀; a flip-flop made responsive to the output signal of said comparator for switching the operational mode of said integrator from an integration mode to an offset correction mode; and a counter for counting the inverse integration period of said reference voltage, the converter being characterised by reset means for inverting the output of said comparator at the zero cross instant of the output of said integrator for resetting said flip-flop to stop the operation of said counter; and integration means inserted into said offset correction means and including a resistor R c and a capacitor C c for turning on said switch to shift said integrator to said offset correction mode so that said auto-zero capacitor C₀ may be charged with a voltage corresponding to the offset voltage of the whole system from said integrator to said comparator, wherein said offset correction means is connected to the other terminal of said integrator through said capacitor C c . According to a secondary aspect of the present invention, there is provided a double integral type A/D converter for converting an analog signal into a digital signal comprising, as circuit elements: a group of switches for selectively outputting an input signal; an integrator made receptive of the signal outputted selectively from said grouped switches for integrating the same; a comparator connected with the output of said integrator and including a transistor having its collector or drain opened; offset correction means for correcting the offset voltage of the whole system from said integrator to said comparator; a counter for counting the inverse integration period of a reference voltage; and a flip-flop for controlling said grouped switches, said offset correction circuit and said counter in predetermined manners, wherein the converter being characterised by a lead frame for a semiconductor IC; a wired insulating sheet applied to said lead frame and mounting thereon at least said circuit elements in a chip state; a plurality of wires bonded to said insulating sheet for connecting said circuit elements; and a resin armoring said lead frame, said insulating sheet and said wires together with said circuit elements by a transfer molding into a hybrid integrated circuit. The present invention therefore can enable the above-specified problems concomitant with the prior art to be solved by the advantage that a double integral type A/D converter can have its characteristics improved by replacing the zero cross detector by a simple circuitry such that a capacitor connected with the input of an integrator may be charged with the offset voltage of a whole system. Another advantage of the present invention can enable a double integral type A/D convertor to be constructed of such a single package as can have a heat resistance and a reliability similar to those of the monolithic IC and as can be small-sized more than the prior art. BRIEF DESCRIPTION OF THE DRAWINGS Other objects, features and advantages of the present invention will become apparent from the following description taken in conjunction with the embodiments thereof with reference to the accompanying drawings, in which: Fig. 1 is a circuit diagram showing the example of the prior art; Fig. 2 is a timing chart for explaining the operations of the example of Fig. 1; Fig. 3 is a circuit diagram showing a double integral type A/D converter according to a first embodiment of the present invention; Fig. 4 is a timing chart for explaining the operations of the A/D converter of Fig. 3; Figs. 5(A) to 5(C) are circuit diagrams showing an essential portion of the A/D converter of Fig. 3 for explaining the operations of the same; Fig. 6 is similar to Figs. 5(A) to 5(C) but explains the operations of a second embodiment of the present invention; Fig. 7 is a timing chart for explaining the operations of the second embodiment of Fig. 6; Figs. 8 to 11 are similar to Figs. 5(A) to 5(C) but explain the operations of other embodiments of the present invention; Fig. 12 is a block diagram showing such a portion of the double integral type A/D converter as is constructed of a hybrid IC according to the present invention; Fig. 13 is a section showing the hybrid IC of Fig. 12; and Fig. 14 is a schematic block diagram showing an electronic weighing system to be used with the double integral type A/D converter according to the present invention. DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in the following in connection with the embodiments thereof with reference to Figs. 3 to 14 of the accompanying drawings. Fig. 3 is a circuit diagram showing an embodiment in which the double integral type A/D converter of the present invention is used with an electronic weighing system. In this embodiment, a weight signal detected by a load cell J is outputted through a pre-amplifier K to a low-pass filter L and is used as the unknown input voltage of the double integral type A/D converter. This double integral type A/D converter of the present invention is different from the example of the prior art shown in Figs. 1 and 2 in the points, as will be itemized in the following: (1) The comparator C used is equipped with a transistor having its collector or drain opened so that its output voltage changes within a range from + V₁ to - V₂. (2) To the offset correction circuit, there is added an integration circuit (or a low-pass filter) which is composed of a resistor R c (or R c ) and a capacitor C c , the constants of which elements R c and C c are so set that a pulse may be outputted in the offset collection mode from the comparator C. (3) In this offset correction mode, the input level of the integrator B is set at either the offset voltage level of the buffer A located upstream of the integrator B or the ground level so that the auto-zero capacitor C₀ connected with the input of the integrator B may be charged with the offset voltage of the whole system from the buffer A to the comparator C. Incidentally, the capacitances of the capacitors are set such that C₀»C c . The operations of the double integral type A/D converter in the offset correction mode according to the present invention will be described in the following with reference to the timing chart of Fig. 4. Here, the description of the operations shared with the example of the prior art of Figs. 1 and 2 will be omitted. In case the unknown input voltage to be inputted to the integrator B has a positive (+) polarity, the output of the comparator C in the integration mode is held at + V₁. At the zero cross instant of the output of the integrator B, moreover, the comparator C is inverted to take an output generally at - V₂. As a result, the flip-flop E is reset at the breakage of the pulse (e) to output a pulse (g) from its Q terminal. As a result, the counter F has its operation stopped, and the offset correction circuit has its switch S₃ turned off so that the operation shifts to the offset correction mode. In this offset correction mode, the output of the comparator C is generally at - V₂, and the an integration circuit of R₀C₀ is formed so that the voltage at the non-inverter terminal of the integrator B begins to gradually drop. If that voltage then drops to even a lower level than the potential of the inverter terminal of the integrator B, i.e., the potential corresponding to the offset voltage of the buffer A, the output of the integrator B gradually reduces so that the operational amplifier of the comparator C is inverted to have its output-step transistor T r turned off. Then, the current flows from the side of + V₁ through the R c C c circuit to the integration circuit R₀C₀. Because of the setting of R₀C₀»R c C c , however, the potential of the non-inverter terminal of the integrator B is not allowed to rise but gradually. If, moreover, that potential exceeds the potential of the inverter terminal of the integrator B even slightly, the integrator output increases again gradually so that the transistor T r at the output step of the comparator C is instantly turned on to hold the output of the comparator C generally at - V₂. From now on, the output of the comparator is held at an intermediate level between + V₁ and - V₂ while the operations described above being repeated, the inter-terminal voltage of the capacitor C₀ is held at a level corresponding to the offset voltage of the whole system leading from the buffer A to the comparator C [as depicted by a waveform (e)]. Figs. 5(A) to 5(C) are circuit diagrams for explaining the switching operations of the embodiment thus far described. For the integration period of the unknown input voltage, as shown in Fig. 5(A), switches S₁ and S₅ are turned on whereas switches S₂, S₃, S₄ and S₆ are turned off. Next, for the integration period of the reference voltage, as shown in Fig. 5(B), the switch S₁ is turned off, but the switch S₂ is turned on, whereas all the remaining switches S₃ to S₆ are left as they in Fig. 5(A). For the correction period of the offset voltage, as shown in Fig. 5(C), the switches S₁ and S₂ are turned off, but the switch S₄ is turned on to hole the input of the buffer A at the ground level. At the same time: the switch S₅ is turned off; the switch S₆ is turned on; and the switch S₃ is turned on to operate the offset correction circuit. Fig. 6 is a circuit diagram showing a second embodiment of the present invention, in which the unknown input voltage is set at a negative (-) polarity. Since, in this embodiment, the output of the comparator C in the integration mode is set at the "L" level, an inverter H₃ is additionally connected with the output of the comparator C so that the operational level for the reset terminal of the flip-flop E may be equal to that of the foregoing first embodiment. Incidentally, the switches S₁ to S₆ are exemplified by electronic switches. This second embodiment has operations substantially similar to those of the first embodiment. Since the second embodiment has its input polarity reversed and its integrator output inverted, however, the waveforms (e) and (f) appearing in the timing chart of Fig. 4 are modified into those of Fig. 7. The operations of the second embodiment will be described in the following. When the unknown input voltage takes the negative (-) polarity, the output of the comparator C in the integration mode is substantially at the level of - V₂. When the inverse integration by the reference voltage then terminates, the operational amplifier forming a component of the comparator C is reversed to turn off the transistor T r at its output step. Then, the current flows from the side of + V₁ through the R c C c C₀ so that the level of the output of the comparator C gradually rises. At the instant when that output exceeds a predetermined value, the output of the inverter H₃ is reversed from the "H" level to the "L" level. At this breakage, the flip-flop E is reset, and the counter F is stopped so that the operation shifts to the offset correction mode. In this offset correction mode, the integration circuit R₀ and C₀ is newly provided so that the potential at the non-inverter terminal of the integrator B is gradually raised by the output of the comparactor C, which is held at the "H" level. If that potential slightly exceeds the potential of the inverter terminal of the integrator B, moreover, the output of the integrator B gradually increases so that the comparator C is reversed to take substantially the level of - V₂ at its output. From now on, the operations similar to those of the case of the first embodiment are repeated until the comparator output is held substantially at an intermediate level between + V₁ and - V₂ and until the inter-terminal voltage of the auto-zero capacitor C₀ is held at a level corresponding to the offset voltage of the whole system. Figs. 8 to 11 are circuit diagrams according to other embodiments of the present invention, respectively. Although the connection of the input of the integrator B is modified, the polarity of the comparator and the construction of the offset correction circuit are made similar to those of the second embodiment shown in Figs. 6 and 7. Fig. 12 is a block diagram showing such a circuit portion of an electronic weighing system as is constructed of a hybrid IC in accordance with a further embodiment of the present invention. In this embodiment, the circuit portion enclosed by broken lines in Fig. 12 is assembled into the hybrid IC. In Fig. 12: reference letter A denotes a group of switches; letter B an integrator; letter C a zero cross detector; letter D an offset correction circuit; letter E a control circuit; letter F a counter; and letter G a microcomputer. This hybrid IC is formed by the following process. An insulating sheet having wired conductors is applied to a lead frame for a semiconductor IC. The individual circuit elements appearing within the aforementioned broken lines are mounted in a chip state on the insulating sheet. Those circuit elements are then connected by a wire bonding and sealed with a resin by a transfer molding, as shown in section in Fig. 13. Incidentally, the electronic weighing system is constructed of a load cell, a pre-amplifier, a low-pass filter, an A/D converter, a microcomputer and so on, as shown in a schematic block diagram in Fig. 14, of which the circuit elements to be assembled into the hybrid IC can be selected from the following groups: (1) the A/D converter; (2) the low-pass filter and the A/D converter; (3) the pre-amplifier, the low-pass filter and the A/D converter; and (4) the pre-amplifier, the low-pass filter, the A/D converter and the microcomputer. As has been described hereinbefore, according to the primary feature of the present invention, the complicated zero cross detector may be dispensed with, and the offset correction is conducted merely by connecting the comparator having the open-collector or -drain transistor with the output of the integrator and by adding the integration circuit (i.e., the low-pass filter) to the offset correction circuit. As a result, the circuit structure can be simplified to reduce the number of parts and to drop the production cost. In the offset mode, moreover, the auto-zero capacitor C₀ is charged with the offset voltage of the whole system leading from the buffer upstream of the integrator to the comparator downstream of the same by setting the input level of the intervening integrator at either the offset voltage level of the buffer or the ground level. As a result, the offset correction can be accurately achieved. According to the secondary feature of the present invention, the following effects can be achieved: (1) The A/D converter can be packaged into the hybrid IC having a heat resistance and a reliability similar to those of the monolithic IC. (2) If the hybrid IC of the present invention is used, the circuitry can be small-sized more than the hybrid IC of the prior art, and the present hybrid IC can have its strength improved to reduce the production ratio of inferior products which might otherwise be made by the careless handling. (3) If the hybrid IC of the present invention is used with the electronic weighing system, most of the circuit elements such as the load cell, the pre-amplifier, the low-pass filter and/or the A/D converter can be integrated to have a shape similar to that of the monolithic IC. As a result, the number of parts to be mounted on the substrate can be minimized while the number of assembling steps being reduced with rationalization of production.

Claims: A double integral type A/D converter for converting an analog signal into a digital signal, comprising: an integrator (A,B) having one of its input terminals made receptive of an unknown input voltage (IN) and a reference voltage (REF); a comparator (C) having one input connected with the output of said integrator and its other input connected to a reference potential and including a transistor having its collector or drain opened; offset correction means connected between the output of said comparator and the other terminal of said integrator for negatively feeding back the output of said comparator and including a series circuit having a switch (S3), a resistor (R₀) and an auto-zero capacitor (C₀); a flip-flop (E) made responsive to the output signal of said comparator for switching the operational mode of said integrator from an integration mode to an offset correction mode; and a counter (G) for counting the inverse integration period of said reference voltage, characterised by; reset means for inverting the output of said comparator at the zero cross instant of the output of said integrator for resetting said flip-flop (E) to stop the operation of said counter; and integration means inserted into said offset correction means and including a resistor (R c ) and a capacitor (C c ) for turning on said switch (S₃) to shift said integrator to said offset correction mode so that said auto-zero capacitor (C₀) may be charged with a voltage corresponding to the offset voltage of the whole system from said integrator to said comparator, wherein said offset correction means is connected to the other terminal of said integrator through said capacitor (C c .) A double integral type A/D converter according to Claim 1, wherein said unknown input voltage and said reference voltage to be inputted to said integrator have their polarities set at positive and negative values, respectively. A double integral type A/D converter according to Claim 1, wherein said unknown input voltage and said reference voltage to be inputted to said integrator have their polarities set at negative and positive values, respectively. A double integral type A/D converter for converting an analog signal into a digital signal, comprising, as circuit elements: a group of switches for selectively outputting an input signal; an integrator made receptive of the signal outputted selectively from said grouped switches for integrating the same; a comparator connected with the output of said integrator and including a transistor having its collector or drain opened; offset correction means for correcting the offset voltage of the whole system from said integrator to said comparator; a counter for counting the inverse integration period of a reference voltage; and a flip-flop for controlling said grouped switches, said offset correction circuit and said counter in predetermined manners, is characterised by; a lead frame for a semiconductor IC; a wired insulating sheet applied to said lead frame and mounting thereon at least said circuit elements in a chip state; a plurality of wires bonded to said insulating sheet for connecting said circuit elements; and a resin armoring said lead frame, said insulating sheet and said wires together with said circuit elements by a transfer molding into a hydbrid integrated circuit. A double integral type A/D converter according to Claim 1, wherein said A/D converter is packaged into a hybrid IC which is to be used with an electronic weighing system including a load cell, a pre-amplifier, a low-pass filter and a microcomputer in addition to said A/D converter. A double integral type A/D converter according to Claim 5, wherein said A/D converter is packaged together with said low-pass filter into said hybrid IC. A double integral type A/D converter according to Claim 5, wherein said A/D converter is packaged together with said low-pass filter and said pre-amplifier into said hybrid IC. A double integral type A/D converter according to Claim 5, wherein said A/D converter is packaged together with said low-pass filter, said pre-amplifier and said microcomputer into said hybrid IC.

Inventors: NAITO, KAZUFUMI
Applicants: ISHIDA SCALES MFG. CO., LTD.
Application year: 1986
Main classification: H03M1
IPC codes: H03M1