CONTRAST ENHANCEMENT LAYER

Abstract: Composition and method for enhancing the contrast of images of an underlying photolithographic layer. A photographic element, including a photoresist layer,is applied to a substrate. The photoresist layer contains a contrast-enhancing layer including at least one light-sensitive compound capable of producing acidic photoproducts upon exposure to actinic radiation, at least one indicator dye that changes color on exposure to acidic conditions and at least one polymeric binder soluble in water or weakly alkaline aqueous solutions. The photographic element is exposed to active radiation sufficient to cause photobleaching of the contrast enhancement layer and exposure of the photoresist layer. The photographic element is developed in an aqueous photoresist developer, whereby the contrast enhancement layer is stripped from the photoresist layer by the developer.

Description: CONTRAST ENHANCEMENT LAYER Field of the Invention The present invention is directed to a composition an method for enhancing the contrast of images of objects such masks for photolithography. The invention is particularly useful in the manufacture of semiconductor devices for integrated circuits and components thereof. Background of the Invention This application is a continuation-in-part of copendi application Serial No. 06/740,369 filed June 3, 1985. Photolithography in the production of integrated circuits is predominantly carried out by optical means and i in many ways the key to microelectronic technology. It is involved repeatedly in the processing of any device, at leas once for each layer of the finished structure. An important requirement of the lithographic process is that each circuit pattern be positioned accurately with respect to the layers under it. One technique is to hold the mask (which serves a a template) just off the surface and to visually align the mask with the existing patterns in the wafer. After perfect alignment is achieved, the mask is pressed into contact with the wafer. The mask is then flooded with ultraviolet radia- tion to expose the photoresist. The space between the wafer and the mask is often evacuated to achieve intimate contact. Problems in the masking process arise from the need t print very small circuit features with no defects in the pattern. If the mask were to be positioned very far from th surface, diffraction of the ultraviolet radiation passing through the mask would cause the smaller features to blur suBSTSTuτs st zr together. On the other hand, small particles on the wafer or the mask are abraded into the mask when it is pressed against the wafer. Hence the masks can be used for only a few exposures before the abrasion causes defects to accumulate to an intolerable level. A more recent trend has been toward using the technique known as projection alignment, in which the image of the mask is projected onto the wafer through an optical system. In this case, mask life is virtually unlimited. Projection alignment is now the predominant method used in photolitho- graphic production of semiconductors. However, the image resolution of projection alignment lithographic systems is approaching the physical limits imposed by practical con¬ straints on numerical aperture and wavelength. Although further improvements in lithographic technology are antici- pated, dramatic improvements in inherent lens resolution are not. In order to continue the reduction of minimum feature size achievable by optical techniques, it is necessary to alter some other aspect of the lithographic process for further improvements. The photoresist exposure and develop- ment process is one area in which further improvements are possible. A photoresist is a radiation-sensitive coating that is applied to a substrate, exposed to an image, and developed by a process which selectively removes (or leaves) the resist material that was exposed. For example, a negative photo¬ resist may cross-link and polymerize upon exposure to ultra¬ violet or other types of radiation. Thus, exposure of the negative photoresist through a mask, followed by a development step (which consists of washing away the non-cross-linked material using selective solvents) results in the removal of the photoresist wherever the mask was opaque. High contrast is necessary to produce on photoresists the image patterns used in the integrated circuit art. The minimum required contrast of illumination is referred to as the "contrast threshold" of the resist. Depending on sub¬ strate properties, the required pattern thickness and resist SUBSTITUTE SHEET edge profiles, a conventional positive photoresist has a contrast threshold between about 85% and 90%. Currently, most production is done at 90% contrast, or more. If the contrast threshold of the resist is reduced, the resolution obtainable with a given optical system is improved due to the fact that image contrast is a decreasing function of the spatial frequencies present in the image. Projection lithography generally uses an aerial image of a mask to expose the photoresist. But as the contrast is reduced, discrimination of a darker area from a lighter area becomes increasingly difficult. For an aerial image of low contrast, even those parts of the image that correspond to the dark regions of the masks have significant intensities. Hence, exposure of the photoresist using a mask of insuffi¬ cient contrast, causes even dark areas to be exposed to a significant extent. On development, a blurred, poorly resolved photoresist is obtained. A similar problem occurs in the optical projection of the mask image. The projected radiation has a tendency to scatter due to diffraction around the edge of a light/dark area in the image. The farther the image is from the resist, the greater the amount of radiation scatter under intended dark areas of the resist. To improve contrast, a contrast enhancement layer is used in conjunction with an underlying position or negative photoresist layer. European patent application No. 110,165 filed on October 29, 1983 in the name of Griffing and West discloses a contrast-enhancing layer used in conjunction with a photo¬ resist layer. The contrast-enhancing layer consists of a photobleachable material in a resinous binder. The contrast- enhancing layer is applied to the photoresist layer and forms a second, in situ, mask upon exposure to light. Light travel through the mask and acts on a photobleachable dye contained in the contrast-enhancing layer. Areas of the contrast- enhancing layer corresponding to the mask pattern become transparent, and allow the photoresist layer located below th contrast-enhancing layer to be selectively exposed to light according to the pattern of the mask. Because a certain amount of light is required to render the photobleachable dye transparent, the photoresist layer is exposed only after the photobleachable dye has been made transparent. Dark areas of the mask allow less light trans¬ mission and, therefore, take longer to bleach the photobleach¬ able dye of the contrast-enhancing layer. Correspondingly, less light is allowed through the bleached areas of the contrast-enhancing layer to expose the photoresist layer in the dark areas. Hence, the contrast-enhancing layer effec¬ tively increases contrast and the net result is a resolution improvement over using the positive resist alone. After the photoresist and contrast-enhancing layers have been exposed, the contrast-enhancing layer is stripped from the exposed photoresist with an organic solvent before development of the exposed photoresist. Although the contrast-enhancing layer of Griffing and West is capable of increasing contrast and resolution, use of the layer in photolithography requires several extra steps which increases process time and reduce yield and efficiency. It is an object of the present invention to provide a contrast-enhancing layer (CEL) which can be used in a standard aqueous photoresist development step without requiring a separate contrast-enhancing layer stripping step prior to photoresist development. Another object is to provide a CEL that does not intermix with the photoresist it coats. Another object is to provide a CEL that shows a large decrease in absorbance at 280-450 n when exposed to those wavelengths. Another object is to provide a more improved CEL layer capable of further enhancing contrast and/or requiring shorter exposure times. Summary of the Invention The present invention is directed to a contrast- enhancement composition including at least one light-sensitive SUBSTJTUTE SHEET compound that produces an acidic photo product on exposure to actinic radiation, at least one indicator dye that changes color in the presence of acid, and at least one polymeric binder that is soluble in either water or weakly alkaline aqueous solutions. Another aspect of the present invention relates to a photographic element comprising a photoresist layer, a contrast-enhancement layer incorporating the above composition and a substrate. Another aspect of the invention is directed to a method for producing an image in a photographic element by imagewise exposing this element to actinic radiation, the method comprising providing a contrast-enhancing layer incorporating the above composition between a photoresist material and a source of actinic radiation and exposing the photoresist material by actinic radiation sufficient to photobleach the contrast-enhancement layer and expose the underlying photo¬ resist. Detailed Description of the Invention The contrast enhancement layer (CEL) of the present invention includes compounds having the following character¬ istics: a photosensitive compound that generates an acidi photoproduct on exposure to actinic radiation; an indicator dye that changes color in the presence of acid; and at least one polymeric binder that is soluble in either water or weakl alkaline aqueous solutions (pH about 7 or higher) . The photosensitive compound used in the CEL should be sensitive to radiation at wavelengths of about 280 tα 450 nm. The desired concentration of acidic photo-products produced o exposure to radiation is a function of the sensitivity of the indicator dye to pH change. Generally, it is desirable that the photosensitive compound produce as large a decrease in pH of the layer as possible, so that the indicator changes color fast. Examples of the photosensitive compounds that generate acidic photoproducts and are useful in the present invention TE SHEET include naphthoquinone - l,2(diazide-2)-5-sodium sulfonate and naphthoquinone-l,2-(diazide-2)-4-sodium sulfonate, which are especially preferred. Other compounds that may be em¬ ployed include the BF 4 ~ or PFg~ salts of: 4-diazo-N-ethyl-N-hydroxyethylaniline; 4-diazo-N-methyl-N-hydroxyethylaniline; 4-diazo-2-chloro-N-N'-diethylaniline; 4-diazo-2-methyl-l-pyrrolidine benzene; 4-diazo-2,5-dibutoxy-N-benzoylaniline; 4-diazo-l-morpholinobenzene; 4-diazo-N-ethyl-2-toluidine; 4-diazodiethylaniline; 4-diazodimethylaniline; 4-diazodiphenylamine sulfate; and 4-diazo-2,5-diethoxyphenylmorpholilne The especially preferred photosensitive acid generating compounds of the present invention are water soluble aromatic diazo oxides including by way of example naphthoquinone-1, 2(diazide-2)-4-sodium sulfonate. CEL compositions prepared with these compounds have superior shelf life that is at least an order of magnitude better than can be obtained by using diazoniu salts as the photosensitive CEL agent. The materials can be obtained from Fairmount Chemical Co., Inc., Newark, New Jersey. During exposure, the naphthoquinone diazide sulfonate (or other compound listed above) is converted to the corre¬ sponding indene carboxylic .acid. For example: The indicator dyes used should be highly absorbent at wavelengths between 280 and 450 nm until the CEL is exposed. But in the presence of the acid photodecomposition products of the photosensitive compound the indicator dye should change ^ color so as to become transparent (i.e. exhibit substantially no absorbance) to at least the wavelength (spectrum) of the actinic radiation employed to expose the CEL and the underly¬ ing photoresist. For the particular application of the pre- 5 sent invention, the absorbance of the indicator dye within the wavelength range of 280-450 nm should disappear. It is to be understood, however, that the absorbance of the dye may disap- . pear for a greater wavelength range without detriment to the present invention. Moreover, if the actinic radiation used to 10expose the photosensitive compound is of a narrower wavelength than 280-450 nm, the absorbance of the dye need only disappear for that narrower wavelength range. One advantageous feature of the CEL composition of this invention is that the rate of photo-bleaching of the colored 1Slayer will increase during exposure. This increases the ef¬ fectiveness of the contrast enhancement layer. Two distinct, sequential, color-destructive reactions are believed to occur when the present compositions are used in contrast-enhancing layers. The first is believed to be the 20photoconversion of the naphthoquinone diazide to the ketene intermediate (Wolff rearrangement reaction) . For example: This reaction is believed to cause disappearance of absorbance in the region of 280 to 450 nm to the extent that such absor¬ bance is due to the nanphthoquinone diazide. 30 The second is believed to be the reaction of the ketene with water to form an indene carboxylic acid, as follows: 35 UTE SHEET The acid will cause the indicator dye which is highly absorp¬ tive in the range of about 280 to 450 nm to become transparent to this wavelengt . A time lag exists between the decomposition of the naphthoquinone diazide and the change in color of the indi¬ cator dye. Thus, during the initial light exposure, only the color from the naphthoquinone diazide will disappear. But on continued exposure, (further) color bleaching will result from the combined effects of the naphthoquinone diazide photo-reac¬ tion and the indicator dye color change due to the presence of acidic photo-products. Thus, the rate of color disappearance increases as exposure continues. The rate of color disappearance increases even faster (as exposure continues) for yet another reason: at the begin¬ ning of exposure, the rate of photobleaching of the naphtho¬ quinone diazide is slowed down by the indicator dye which absorbs some of the incident light that would otherwise be available to bleach the naphthoquinone diazide. Later during exposure, the color of the indicator dye starts to disappear (in response to the formation of the acidic product) . As a result, more light is available to bleach the naphthoquinone diazide. This also causes the overall color disappearance to progress at a faster rate. Under the conditions described above, the exposure latitude is increased and contrast is further enhanced. Examples of useful indicator dyes include 2,4-dinitro- phenol, 3-nitrosalicylaldehyde, metaniline yellow, methyl orange, ethyl orange, propyl red, ethyl red, methyl red, o- nitrophenol, m-nitrophenol, Na-p-nitrophenoxide, and pyridine- 2-azo-dimethylaniline. Water soluble forms of the indicator dye are preferred. These dyes may be used alone or in combi¬ nation. The dyes that are useful in the invention are color¬ less at a slightly acidic pH, e.g. a pH between 6.0 or 5.0. It is advantageous to employ a dye that becomes colorless (stops absorbing strongly) at a mildly acidic pH. The Na-p- nitrophenoxide is particularly preferred because it normally absorbs strongly at certain wavelengths (e.g. in the region of 405-436 nm) but its absorbance at these wavelengths disappears in acidic media. Na-p-Nitrophenoxide has a functional pH of 6.0 (i.e. it does not absorb strongly at pH 6.0 or lower). The indicator dye and the photobleachable compound (e.g. the naphthoquinone-diazide sulfonate) are held together in a polymeric matrix transparent to radiation at 280-450 nm. The polymer should be soluble in water or mixtures of water and water-miscible organic solvents, and it should also be soluble in weak alkali. More particularly, the polymer should be soluble in developing solutions used to develop photoresist materials. Examples of preferred polymers include poly(vinyl alcohol)', poly(vinyl-pyrrolidone) and vinyl-pyrrolidone/ vinyl-acetate copolymers. Poly(vinylpyrollidone) is especial¬ ly preferred as the matrix material because it does not tend to gel, and thus yields a CEL with a long shelf life. The polymer, indicator dye, and photosensitive acid- producing compound are dissolved in a solvent such as water, or a mixture of water and a water-miscible organic solvents include methanol, ethanol, isopropanol, 2-methoxy ethanol, dimethyl formamide and propylene glycol methyl ether. The solvent mixture should not attach the resist layer. The for¬ mation of pinholes or interfacial layers is evidence of inter¬ mixing. Therefore, the coated resist should be checked to confirm the absence of pinholes. The amount of the photosensitive acid-producing com¬ pound used in the CEL composition is preferably in the range of about 5 to 90% by weight. The amount of indicator dye used should be adjusted according to the acid produced by photo- bleaching of the acid-producing compound, so that all of the indicator dye changes color. The indicator/photosensitive compound ratio should be at least slightly less than 1:1. Preferably, the indicator will be present in the range of about 20 - 80% by weight based on the amount of the photo¬ sensitive compound, more preferably in the range of about 20- 60%. The solid components, photosensitive compound, indi¬ cator dye, and polymer are dissolved in the solvent or solvent mixture in an amount of about 3 to 30 parts by weight, based on 100 parts by weight of the solvent. The percent solids of Q the final CEL solution will depend on the coating thickness desired and the spin speed used. A small amount of one or more nonionic surfactants such as FC-431, Zonyl FSN, or Sur ynol 485 (obtained from 3M, St. Paul, MN; E.I. DuPont De Nemours & Co., Wilmington, DE; and Air-products Co., Allentown, Pa., respectively) may be added to the CEL in the amount of about 0.01 to 1.0% by weight to improve the surface properties of the solution. The shelf-life of the CEL of the present invention is greater than about one year stored at room temperature. The prepared CEL is spin-coated on top of a conven¬ tional photoresist-coated silicon wafer. The solvent is re¬ moved from the CEL by evaporation preferably in a convection oven at about 603C-903C for about 5-15 mins. When exposed to light by projection through a mask at 280 to 450 nm (mono¬ chromatic projection: G-Line — 436 nm; H-Line — 405 nm; I- . . Line — 367 nm) , the CEL becomes selectively relatively transparent in a pattern corresponding to the light areas of the mask. The resist layer is exposed for a period of time long enough to render the CEL transparent in light mask areas only (time exposure would be source-dependent but is generally about twice that required for an uncoated resist) ; the dark areas of the mask remain dark on the corresponding CEL area. Following exposure, the wafer having the photoresist and CEL is developed by standard developing procedures as explained in more detail below. During development, the CEL is completely stripped from the photoresi.st layer and a posi.ti.ve resi.st image of high resolution is obtained. A negative resist image can be obtained in the same way if an appropriate negative photoresist is used, as is well-known in the art. CEL compositions which do not include the dye indicator component are also suitable for the purposes of the present invention. The dye component is preferably eliminated when the CEL in which it is to be incorporated is designed for exposure to actinic light in the mid-UV range. That is to say, it is difficult to find a dye that does not absorb in the mid UV wavelengths (300-340 nm) . In absence of such a dye, it is best to eliminate the dye constituent from the CEL compo¬ sition. Use of a dye that absorbs in the mid-UV region can result in reduced contrast enhancement. When a dye-indicator component is not included in the composition, it is preferred that a mixture of naphthoquinone 1,2(diazide-2)-4 sodium sul¬ fonate and naphthoquinone 1,2(diazide-2)-5 sodium sulfonate light sensitive compounds be used. The exposure of photo-r products having a CEL without dye indicators, is maximized in the UV region of 280-360 nm. The amount of the light-sensi¬ tive acid-producing compound should be in the range of 20-90% by weight based on the amount of the polymer ' used and the amount of solids in this embodiment of the Contrast Enhance¬ ment Layer is preferably about 5-30 parts by weight based on 100 parts by weight of solvent. The following examples illustrate the present invention but are not intended to limit its scope. Many modifications, additions, or deletions may be made within the scope of the invention and the invention includes all such modifications. EXAMPLE I A mixture of 2.4 parts by weight of poly(vinylpyrroli- done) (NP-K-30 GAF Corp.), 2 -0 parts of naphthoqu-inone-1,2- (diazide-2)-5-sodium sulfonate (Fairmount Chem. Co.) 0.4 parts Na-p-nitro-phenoxide and 0.2 parts Zonyl FSN (DuPont) was dis¬ solved in a mixture of 61.2 parts deionized water and 33.8 parts propyleneglycol methyl ether (from Dow Chemical Co., Midland, MI) , to obtain a CEL solution. The solution was filtered through a 0.2 micron membrane filter (from Milli- pore) . The CEL solution was spini-coated on top of a conven¬ tion positive resist (such as positive resist 119 from Fairmount) which was previously coated on an oxidized silicon wafer. The solvent was removed from the CEL following coating by baking the wafer for 10 minutes at 90 β C. The wafer was next immersed into a bath of 3.5% aqueous solution of sodium metasilicate for 30 seconds at 22°C, rinsed with water and dried. The CEL layer was completely removed during develop¬ ment in the alkaline solution and no evidence of intermixing (for example pinholes or interfacial layers) was observed on the positive resist layer. EXAMPLE II The CEL solution from Example I was coated onto a sheet of 0.3 gauge Melinex 516, polyester film (from ICI, Wilming¬ ton, Delaware) . The solvent was removed by evaporation. A portion of the film was exposed for 5 seconds using a 200 watt high-pressure mercury lamp. The absorbance of the exposed vs. the unexposed coating was measured at 405 and 436 nm. The ratio of: (unexposed absorbance)/(exposed absorbance) was determined for each wave-length. At 436 nm the ratio was 13.5 and at 405 nm the ratio was 29.5. These values indicate that the CEL upon exposure to light had undergone an absorb¬ ance change with absorbance disappearance at both 405 and 436 nm. EXAMPLE III The CEL solution of Example I was coated on top of a conventional positive resist (Positive Resist 119) coated wafer for 30 seconds at 3000 rpm. A second positive resist- coated wafer was used as a control left uncoated. The CEL coated wafer and the control were placed in an over for 10 minutes at 90°C. The two wafers were exposed for 2 and 4 seconds using a 200 watt high pressure Hg lamp and a 21 step sensitivity guide. The developing conditions were 30 seconds in a 3.5%.aqueous solution of sodium metasilicate followed by a water rinse. The results are summarized in Table I. The steps of a 21-step sensitivity guide are gradu- ^ ated in increments of increasing density (from zero to +4) . The first open step achieved indicates that complete light exposure had occurred at this density. The first solid, step indicates that this density was opaque to light. On this basis, at approximately two times the exposure of the control the contrast-enhanced sample reproduces the same exposure (that is an open step 3) . At exposures in lower intensity than that sufficient to expose a step 4, the light has been absorbed by the CEL. This is evidence that contrast is enhan- 10 ced* TABLE I Exposure Time in Seconds 2 Seconds 4 Seconds CONTROL Open 3, Solid 7 Open 4-5, Solid 9 CONTRAST ENHANCED not done Open 3-4, Solid 5 EXAMPLE IV An oxidized silicon wafer, 4 inches in diameter was placed on an SVG 8032 CTD spinner (from Silicon Valley Group) . Approximately 2 to 3 ml of hexamethyldisilazane is placed in the center of the wafer. The wafer was then first spun at 500 0 . . rpm for 20 seconds followed by spinning at 5000 rpm for 30 seconds. Hexamethyldisilazane is used to promote adhesion between the oxidized silicon wafer and the positive photo¬ resist which is to be subsequently applied. Selectilux R P- ZLI-2692 which is a positive resist (from E M Chemicals, 5 Hawthorne, New York) was then coated on top of the hexamethyl¬ disilazane layer at a spin speed of 5000 rpm for 30 seconds. After softbaking on a vacuum hot plate for 1 minute at 100°C, the coating thickness was found to be 1.2 microns. The coated wafer was imaged through a chromium mask in a projection scan¬ ning system available from Perkin Elmer (Norwalk, Conn.) under the name Micralign R 300 HT. Aperture 1 was used and had equal lines and spaces from 5 micron lines and spaces to 1.5 micron lines and spaces. The scan setting was 520. After exposure the resist was developed for 60 seconds in a 2.1% solution of J tetramethylammonium hydroxide at 22°C. Scanning electron microscope examination of the images showed that the 2.25 1 micron images were rounded on the top and that the side wall angles were approximately 603C. EXAMPLE V The experiment of Example IV was repeated except that c the contrast enhancement layer designated CEL-1 was coated on top of the photo-resist coating at a spin speed of 3000 rpm. The coating was then softbaked at 100 β C for 1 minute on a vacuum hot plate. After exposure on the Micralign R as pre¬ viously described (except that the scan setting was 440) the ιn coating was developed according to Example IV. During application of the contrast enhancement layer no intermixing had taken place between the photoresist and con¬ trast enhancement layers. The contrast enhancement layer appeared to be a very uniform coating. The CEL was also ea¬ sily removed in the developer. Scanning electron microscope evaluation of the images shows that the contrast enhancement layer improves resolution. The 2.0 micron images made with contrast enhancement are flat on the top surface and the side wall angles are approximately 70-75°. The resolution with the contrast enhancement layer within the 2.0 to 2.25 micron range 0 . is improved by at least 0.25 microns. EXAMPLE VI A mixture of 7.0 parts by weight of polyvinylpyrro- lidone (NP-K-30 gaf Corp.), 3.0 parts of naphthoquinone-1,2- (diazide-2-)-5-sodium sulfonate, 3.0 parts of naphthoquinone- 5 l,2-(dιazιde-2)-4-sodιum sulfonate and 0.188 parts Zonyl FSN was dissolved in a mixture of 90.6 parts deionized water and 3.0 parts propylene glycol methyl ether, to obtain a CEL solu¬ tion. An oxidized silicon wafer precoated with hexamethyl 0 . . disilazane was coated with a positive photoresist, F-305 (Fairmount Chemical Co., Inc.) at a spin speed of 5000 rpm's for 30 seconds. After softbaking on a vacuum hot plate for 1 minute at 100°C, the coating thickness was measured to be 1.0 micron. The coated wafer was imaged through a cromium mask in 5 . . . o . a Perkm-Elmer Mιcralιgn Λ 500 proj ection scanning system, at 280 to 360 nm. Aperture 1 was used and the exposure energy was 200 mj/cm 2 . After exposure the resist was developed for 120 seconds in a 0.25 N NaOH solution. The images were exami¬ ned using a scanning electron microscope; the 1.0 micron line and spaces were of unequal size. The 0.75 micron lines and spaces were not resolved. The experiment of Example III was repeated except the contrast enhancement layer solution of this example was coated on top of the photoresist coating at a spin speed of 3000 rpm. The coating was not soft baked. The exposure on the Micralign 500 was for 600 mj/cm 2 . The coating was developed according to Example II. The CEL was entirely removed in the developer. Scanning electron microscope evaluation of the images showed that the one micron lines and spaces were of equal size and the 0.75 micron lines and spaces were resolved. The resolu¬ tion the CEL is improved by at least 0.25 microns. WHAT IS CLAIMED IS

Claims: WHAT IS CLAIMED IS 1. A composition for use in enhancing the contrast of an underlying photolithographic layer, said composition comprising: at least one water-soluble light-sensitive compound capable of producing acidic photoproducts upon exposure to actinic radiation; at least one water-soluble indicator dye that changes color on exposure to acidic conditions at a pH 6 or below and becomes transparent to the wavelength of said actinic radiation; and at least one polymeric binder soluble in a member of the group consisting of water and weakly alkaline aqueous solutions, said indicator dye being present in the range of between about 20% to 80% by weight based on the weight of said photosensitive compound. 2. The composition of claim 1, wherein said light sensitive compound is a substituted aromatic diazo oxide. 3. The composition of claim 1, wherein the absorbance at 280-450 nm of said light-sensitive compound substantially disappears upon exposure to light and that of said indicator substantially disappears upon exposure to acidic conditions at or below pH 6.0. 4. The composition of claim 3, wherein said light- sensitive compound is a member selected from the group consisting of naphthoquinone-l,2-(diazide-2)-5-sodium sulfon¬ ate and naphthoquinone-l,2-(diazide-2)-4-sodium sulfonate. 5. The composition of claim 3, wherein said indicator dye is selected from the group consisting of 2,4-dinitro- phenol, 3-nitrosalicylaldehyde, metaniline yellow, methyl orange, ethyl orange, propyl red, ethyl red, methyl red, o- nitrophenol, n-nitrophenol, sodium-p-nitrophenoxide and pyridine -2-azo-dimethylaniline. 6. The composition of claim 3, wherein said polymeric binder is selected from the group consisting of poly(vinyl alcohol), poly(vinyl pyrrolidone) and vinyl pyrrolidone/vinyl acetate copolymers. 7. The composition of claim 4, wherein said indicator dye is sodium-p-nitrophenoxide. 8. The composition of claim 7, wherein said polymeric binder is poly(vinyl pyrrolidone) . 9. The composition of claim 89 further comprising a solvent selected from the group consisting of water, water- miscible organic solvents and mixtures thereof. 10. The composition of claim 8, wherein said light- sensitive compound is selected from the group consisting of naphthoquinone diazide sulfonates. 11. A photographic element comprising: a photoresist layer applied to a substrate; and a contrast enhancement layer applied to said photoresist layer, said contrast enhancement layer including at least one water soluble light-sensitive compound capable of producing acidic photoproducts upon exposure to actinic radiation; at least one water-soluble indicator dye that changes color at or below pH 6.0 and thus becomes transparent to the wavelength of said active radiation; and at least one polymeric binder soluble in a member of the group consisting of water and weakly alkaline aqueous solutions. 12. The element of claim 11, wherein said binder is soluble in the developing solutions used for the development of said photoresist layer. 13. The element of claim 11, wherein the absorbance at 280-450 nm of said light-sensitive compound substantially disappears upon exposure to light and that of said indicator substantially disappears upon exposure to conditions at or below pH 6.0. 14. The element of claim 13, wherein said light- sensitive compound is selected from the group consisting of naphthoquinone-l,2-(diazide-2)-5-sodium sulfonate, naphtho- quinone-l,2-(diazide-2)-4-sodium sulfonate, 4-diazo-N-ethyl- N-hydroxyethylaniline; 4-diazo-N-methyl-N-hydroxyethylani- line; 4-diazo-2-chloro-N-N -diethylaniline; 4-diazo-2-methyl- l-pyrrolidine benzene; 4-diazo-2,5-dibutoxy-N-benzoylaniline; 4-diazo-l-morpholinobenzene; 4-diazo-N-ethyl-2-toluidine; 4- diazodiethylaniline; 4-diazodimethylaniline; 4-diazodiphenyla- mine sulfate; and 4-diazo-2,5-diethόxyphenylmorpholine. 15. The element of claim 13, wherein said indicator dye is selected from the group consisting of 2,4-dinitrophenol, 3- nitrosalicylaldehyde, metaniline yellow, methyl orange, ethyl orange, propyl red, ethyl red, methyl red, o-nitrophenol, n- nitrophenol, sodium-p-nitrophenoxide and pyridine-2-azo- dimethylaniline. 16. The element of claim 13, wherein said polymeric binder is selected from the group consisting of poly(vinyl alcohol) , poly(vinyl pyrrolidone) and vinyl pyrrolidone/vinyl 5 acetate copolymers. 17. The element of claim 14, wherein said indicator dye is selected from the group consisting of 2,4-dinitrophenol, 3- nitrosalicylaldehyde, metaniline yellow, methyl orange, ethyl Q orange, propyl red, ethyl red, methyl red, o-nitrophenol, n- nitrophenol, sodium-p-nitrophenoxide and pyridine-2-azo- dimethylaniline. 18. The element of claim 17, wherein said polymeric 5 binder is selected from the group consisting of poly(vinyl alcohol), poly(vinyl pyrrolidone) and vinyl pyrrolidone/vinyl acetate copolymers. 19. A method of producing an image in a photographic element by imagewise exposing said element to a source of actinic radiation, said method comprising the steps of: providing a photographic element including a photoresist layer applied to a substrate; applying to the photoresist layer a contrast- enhancing layer including at least one light-sensitive compound capable of producing acidic photoproducts upon exposure to actinic radiation; at least one indicator dye that changes color on exposure to acidic conditions; and at least one polymeric binder soluble in water or weakly alkaline aqueous solution; exposing said photographic element having said contrast enhancing layer applied thereon to actinic radiation sufficient to cause photo-bleaching of said contrast enhance¬ ment layer and exposure of said photoresist layer; and developing said photographic element in an aqueous photoresist developer, whereby said contrast enhancement layer is stripped from said photoresist layer by said developer. 20. The method of claim 19, wherein said binder is soluble in the developing solutions used for the development of said photoresist layer. 21. The method of claim 19, wherein the absorbance at 280-450 nm of said light-sensitive compound substantially disappears upon exposure to light and that of said indicator substantially disappears upon exposure to acidic conditions. 22. The method of claim 21, wherein said light- sensitive compound is selected from the group consisting of naphthoquinone-l,2-(diazide-2-)-5-sodium sulfonate, naphtho- quinone-l,2-(diazide-2)-4-sodium sulfonate, 4-diazo-N-ethyl-N hydroxyethylaniline; 4-diazo-N-methyl-N-hydroxyethylaniline; UTE SHEET 4-diazo-2-chloro-N-N , -diethylaniline; 4-diazo-2-methyl-l- pyrrolidine benzene; 4-diazo-2,5-dibutoxy-N-benzolyaniline; 4- diazo-1-morpholinobenzene; 4-diazo-N-ethyl-2-toluidine; 4- diazodiethylaniline; 4-diazodimethylaniline; 4-diazodiphenyla- mine sulfate; and 4-diazo-2,5-diethoxyphenylmorpholine. 23. The method of claim 21, wherein said indicator dye is selected from the group consisting of 2,4-dinitrophenol,3- nitrosalicylaldehyde, metaniline yellow, methyl orange, ethyl orange, propyl red, ethyl red, methyl red, o-nitrophenol, n- nitrophenol, sodium-p-nitrophenoxide and pyridine-2-azo- dimethylaniline. 24. The method of claim 21, wherein said polymeric binder is selected from the group consisting of poly(vinyl alcohol), poly(vinyl pyrrolidone) and vinyl pyrrolidone/vinyl acetate copolymers. 25. The method of claim 22, wherein said indicator dye is selected from the group consisting of 2,4-dinitrophenol, 3- nitrosalicylaldehyde, metaniline yellow, methyl orange, ethyl orange, propyl red, ethyl red, methyl red, o-nitrophenol, n- nitrophenol, sodium-p-nitrophenoxide and pyridine-2-arzo- dimethylaniline. 26. The method of claim 25, wherein said polymeric binder is selected from the group consisting of poly(vinyl alcohol) , poly(vinyl pyrrolidone) and vinyl pyrrolidone/vinyl acetate copolymers.1 27. The method of claim 26 wherein said actinic radiation ranges between about 280 and about 450 nm. 28. The method of claim 27, wherein said exposure lasts about twice the time of exposure of an uncoated photoresist material. 29. A contrast enhancement composition consisting essentially of: at least one water soluble light-sensitive compound capable of producing acidic photoproducts upon exposure to actinic radiation; and at least one polymeric binder soluble in a member of the group consisting of water and weakly alkaline aqueous solutions. 30. The composition of claim 29, wherein said binder is soluble in the developing solutions used for the development of photoresist material. 31. The composition of claim 29, wherein the absorbance at 280-360 nm of said light-sensitive compound substantially disappears upon exposure to light. 32. The composition of claim 31, wherein said light- sensitive compound is. selected from the group consisting of naphthoquinone-l,2-(diazide-2)-5-sodium sulfonate, naphthoqui- none-l,2-(diazide-2)-4-sodium sulfbnate, 4-diazo-N-ethyl-N-. hydroxyethylaniline; 4-diazo-N-methyl-N-hydroxyethylaniline; 4-diazo-2-chloro-N-N / -diethylaniline; 4-diazo-2-methyl-l- pyrrolidine benzene; 4-diazo-2,5-dibutoxy-N-benzoylaniline; 4- diazo-1-morpholinobenzene; 4-diazo-N-ethyl-2-toluidine; 4- diazodiethylaniline; 4-diazodimethylaniline; 4-diazodiphenyl- amine sulfate; and 4-diazo-2,5-diethoxyphenylmorpholine and mixture thereof. 33. The composition of claim 31, wherein said polymeri binder is selected from the group consisting of poly(vinyl alcohol) , poly(vinyl pyrrolidone) and vinyl pyrrolidone/vinyl acetate copolymers. 34. The composition of claim 33 further comprising a solvent selected from the group consisting of water, water- miscible organic solvents and mixtures thereof. 35. The composition of claim 34, wherein said light- sensitive compound is selected from the group consisting of naphthoquinone diazide sulfonates. 36. A photographic element comprising: a photoresist layer applied to a substrate; and a contrast enhancement layer applied to said photoresist .layer, said contrast enhancement layer including at least one light-sensitive compound capable of producing acidic photoproducts upon exposure to actinic radiation; and at least one polymeric binder soluble in a member of the group consisting of water and weakly alkaline aqueous solutions. 37. The element of claim 36, wherein said binder is soluble in the developing solutions used for the development of said photoresist layer. 38. The element of claim 36, wherein the absorbance at 280-=-360 nm of said light-sensitive compound substantially disappears upon exposure to light. 39. The element of claim 38, wherein said light- sensitive compound is selected from the group consisting of naphthoquinone-l,2-(diazide-2)-5-sodium sulfonate, naphthoqui- none-l,2-(diazide-2)-4-sodium sulfonate, 4-diazo-N-ethyl-N- hydroxyethylaniline; 4-diazo-N-methyl-N-hydroxyethylaniline; 4-diazo-2-chloro-N-N -diethylaniline; 4-diazo-2-methyl-l- pyrrolidine benzene; 4-diazo-2,5-dibutoxy-N-benzoylaniline; 4- diazo-1-morpholinobenzene; 4-diazo-N-ethyl-2-toluidine; 4- diazodiethylaniline; 4-diazodimethylaniline; 4-diazodiphenyl- amine sulfate; and 4-diazo-2,5-diethoxyphenylmorphαline and mixture thereof. 40. A method of producing an image in a photographic element by imagewise exposing said element to a source of actinic radiation, said method comprising the steps of: providing a photographic element including a photoresist layer applied to a substrate; applying to the photoresist layer a contrast- enhancing layer including at least one light-sensitive compound capable of producing acidic photoproducts upon exposure to actinic radiation; and at least one polymeric binder soluble in water or weakly alkaline aqueous solution; exposing said photographic element having said contrast enhancing layer applied thereon to actinic radiation sufficient to cause photo-bleaching of said contrast enhance- ment layer and exposure of said photoresist layer; and developing said photographic element in an aqueou photoresist developer, whereby said contrast enhancement laye is stripped from said photoresist layer by said developer. 41. The method of claim 40, wherein said binder is soluble in the developing solutions used for the development of said photoresist layer. 42. The method of claim 40,- wherein the absorbance at 280-360 nm of said light-sensitive compound substantially disappears upon exposure to light. 43. The element of claim 42, wherein said light- sensitive compound is selected from the group consisting of naphthoquinone-l,2-(diazide-2)-5-sodium sulfonate, naphthoqui none-l,2-(diazide-2)-4-sodium sulfonate, 4-diazo-N-ethyl-N- hydroxyethylaniline; 4-diazo-N-methyl-N-hydroxyethylaniline; 4-diazo-2-chloro-N-N / -diethylaniline; 4-diazo-2-methyl-l- pyrrolidine benzene; 4-diazo-2,5-dibutoxy-N-benzoylaniline; 4 diazo-1-morpholinobenzene; 4-diazo-N-ethyl-2-toluidine; 4- diazodiethylaniline; 4-diazodimethylaniline; 4-diazodiphenyl- amine sulfate; and 4-diazo-2,5-diethoxyphenylmorpholine and mixture thereof. SUBSTITUTE SMEET

Inventors: BLUMEL DAVID B, DEUTSCH ALBERT S, BLUMEL, DAVID, B., DEUTSCH, ALBERT, S.
Applicants: FAIRMOUNT CHEM, FAIRMOUNT CHEMICAL CO., INC.
Application year: 1986
Main classification: G03C1
IPC codes: G03C1, G03F7, H01L21