ELECTRONIC DEVICE HAVING A POWER SUPPLY INPUT CIRCUIT IN WHICH NOISE FROM STATIC ELECTRICITY IS SUPPRESSED

Abstract: A technology for providing electronic apparatus with im­ munity against static electricity, such that the circuits will not be erroneously operated or damaged due to the electric field, electromagnetic waves, or inflow of electric charges. There are provided electronic apparatus in which the capacity be­ tween the active side (2) and the input line (4) is selected to be smaller than the capacity between the pull side (3) and the input line (4) relying upon the contrivance in the pad layout of IC, pattern layout of circuit substrate, or capacitors, the metal housing is not connected to the active side (2), and the grounding is not provided. The electronic apparatus exhibit perfect immunity against all of the phenomena caused by the static electricity such as the inflow of electric charges into the network accompanying the discharge of static electricity, el­ ectromagnetic wave noise having high energy, and electric field under the charged condition not accompanied by dis­ charging.

Description: The present invention relates to an electronic device having a power supply input circuit in which noise from static electricity is suppressed. The invention is particularly applicable to small portable electronic devices and small data devices for preventing them from being erroneously operated or from being broken down by the static electricity. Portable electronic devices such as IC cards, cameras, wristwatches, and those electronic devices that are not grounded, are prone to be erroneously operated or broken down due to the phenomena of static electricity. Such devices have heretofore been prevented from erroneously operating or from breaking down in the same manner as those electronic devices that can be usually grounded. Using a reference potential of a grounding circuit, however, the noise can be suppressed efficiently over a frequency region which is lower than that of the VHF band. Even if one or more points are grounded, the grounding circuit is not quite effective in absorbing the electromagnetic waves of large energy that are generated when the static electricity is discharged. Therefore, the noise must be suppressed from quite a novel point of view. Many examples to cope with this problem have been introduced in, for example, Electronics System, "Materials To Cope With Troubles Caused by Static Electricity" compiled by Norio Murasaki, entitled "Section 6, Countermeasures 5.6.2.3. Against Static Electricity in ECR, Electronic Circuit and Printed Board, pp. 222-224. However, many technicians are empirically aware of the fact that there is no simple method which offers sufficiently desirable effects. Concretely speaking, it has been attempted to absorb noise by extending the pattern of the ground side of the circuit board having the potential of the active side or to increase the width of the pattern, or by a method taught in "Grounding of Housing", p, 84, "Practical Method of Decreasing Noise", Henry W. OTT., Bell Laboratory, U.S.A., translated by Takao Matsui. With the portable electronic devices which are not allowed to be grounded, however, noise is not emitted to the ground, and the concept of grounding cannot be pursued. In the electronic devices that cannot be grounded, a pattern of circuit board of a potential of the active side, that is formed to absorb noise, works as an antenna, and the structure connected to the potential of the active side of the metal housing to accomplish the grounding, works as an antenna. That is, with the pattern of circuit board that is not grounded or with the structure connected to the potential of the active side of the metal housing to accomplish the grounding, the electromagnetic waves are absorbed and are converted into eddy current to produce noise in the circuit network. Furthermore, under the condition where the electric charge is not discharged, the lines assuming the potential of the active side of floated ground work to increase the difference of electric field distribution relative to the pull side. This becomes a cause of erroneous operation for the field effect IC's. Under such circumstances, three lines, i.e. an active side 2, an input line 4, and a pull side 3 as shown in an input circuit illustrated in Figure 7, establish an electrically important relationship. The problems that are not solved by the prior art are described below with reference to Figure 7, which is a circuit diagram schematically illustrating an input circuit. In this circuit, a capacity Ca exists between the active side 2 and the input line 4, and a capacity Cp exists between the pull side 3 and the input line 4. A relationship Ca>Cp is described. It is obvious that electromagnetic waves generated by the static electricity or the like are simultaneously superimposed as an impulse on the active side 2 and on the pull side 3 of the power source voltage. Therefore, the potential appearing on the input line 4 forms a potential on the active side 2 via Ca. With a relationship Ca > Cp being maintained, a potential on the pull side 3 also appears on Cp but a potential on the active side 2 appears on Ca. As a result, the potential on the input line 4 appears on Ca of an amount that corresponds to the difference between the potential on the pull side 3 and that on the active side 2. Accordingly, even if the switch SW is not closed, the potential of the input line 4 has some time to produce the potential on the active side 2. Under this condition, the input circuit operates erroneously even when the switch SW is not operated. A resistance Rp constitutes pull means, and a circuit 1 is provided in a stage which succeeds the switch SW. Fig. 8 is a diagram of voltage waveforms that change with the lapse of time, and illustrates erroneous operations of the input circuit of Fig. 7 caused by the static electricity and the like, and wherein V₁ denotes an active potential, V₂ denotes a pull potential, V₃ denotes a potential of the input line which is usually equal to V₂, V T denotes a threshold potential of the circuit 1 under the ordinary condition which is equal to V₂/2, t denotes a time, t₀ denotes a time at a moment when V₀ which is the power source voltage is rapidly changed by the static electricity into V₂(t₀), V₂(t₀) denotes a potential at the time t₀, V₃(t₀) denotes a potential of the input line that is obtained by dividing V₂(t₀) by the capacities Ca and Cp, i.e., V₂(t₀)·Cp/(Ca + Cp) , V T (t₀) denotes a threshold potential of the circuit 1, i.e., V₂(t₀)/2, V₂(t) denotes a power source voltage which is given by a function of the time t, and its time constant is nearly equal to C·r where C denotes a resultant capacity consisting of capacities Ca, Cp, and a capacity of noise source, and r denotes an internal resistance of the power source, V₃(t) denotes a potential of the input line 4 given by a function of the time t, i.e., given by V₃(t) ≃ V₂(t)·Cp/(Ca + Cp)exp[-t/(CapRp)] , and its time constant is nearly equal to Cap·Rp which is a product of the resultant capacity Cap consisting of the capacities Ca, Cp and the resistance Rp of the pull means (usually, Rp is considerably greater than r), and V T (t) denotes a threshold potential V₂(t)/2 of the circuit 1 given by the function of the time t. The device will be concretely described in conjunction with Figs. 7 and 8. A man who is electrically charged may produce a voltage in excess of 10 Kv presenting a serious problem in handling electronic devices or portable electronic devices that are not permitted to be grounded. Here, if the potential V₂ rapidly increases to V₂(t₀) at the time t₀ due to noise of electromagnetic waves produced by the electric discharge, the threshold potential V T = V₂/2 of the circuit 1 changes into V T (t₀) = V₂(t₀)/2 , and the potential V₃ = V₂ of the input line 4 changes into V₂(t₀) = V₂ + [V₂(t₀) - V₂]·Cp/(Ca + Cp) . If the capacities have a relation Ca > Cp, the potential V₃(t₀) of the input line 4 is apt to reach the threshold voltage V T (t₀) = V₂(t₀)/2 depending upon the magnitude of V₂(t₀) is changed by electromagnetic waves noise so that it becomes an erroneous input. For instance, if the capacities have a relation Ca = 1.5Cp , the potential V₂(t₀) becomes more than 6 thimes as great as the potential under the ordinary condition of the potential V₂. If Ca = 4 Cp , V₂(t₀) becomes more than 8/3 as great as V₂, whereby the potential V₃(t₀) of the input line 4 reaches the threshold voltage V T (t₀) = V₂(t₀)/2 to form an erroneous input. The above way of thinking is supported by means for deriving a hypothesis that will be described below, and by the experiment and investigation using practical electronic devices. Described below are the concept related to improve the immunity against the static electricity, means for deriving the hypothesis, and experiment to prove the hypothesis. (i) Concept Fig. 9 is a schematic diagram related to energy of the electromagnetic waves and noise, wherein reference numeral 100 denotes a region which includes all of the electromagnetic waves such as electromagnetic waves (VHF), infrared rays, visible rays, ultraviolet rays, and X-rays. The electric discharge is a phenomenon of an avalanche of electrons in which the electrons having a kinetic energy proportional to the voltage impinge upon an opposing metal electrode. Most of the electric charge migrates. The electric charge flows through paths having small impedances. Here, what is important is to construct the device that the electric charge does not pass through the electronic circuit network. Upon impingement, the kinetic energy E is converted into electromagnetic waves. The kinetic energy E of an electron is given by, E = 1/2 mv² = eV The energy is conserved and is converted into electromagnetic waves, i.e., eV = hν, eV = hc/λ The wavelength λ becomes a minimum at a point where the charged voltage V is a miximum, i.e., λmin = hc/eVmax If are substituted for the above equation, the wavelength λ having a unit in the order of angstroms and the charged voltage having a unit in the order of Kv, there is obtained an equation, λmin [Å] = 12.4/Vmax [Kv] If the charged voltage has been known, therefore, the wavelength λmin can be easily calculated. For example, if the charged voltage Vmax is 24.8 Kv, there are generated electromagnetic waves over a wide range, the mininum wavelength thereof being 0.5 angstrom. However, the energy is not all converted. The conversion efficiency ε is given by, where, K: 1.1 x 10⁻⁹ Z: atomic number of the atoms that received impingement I: discharge current Therefore, part of the sparks of static electricity caused by the avlanche phenomenon of electrons is converted into electromagnetic waves which, however, is related to extranuclear electrons and have wavelengths longer than those of the X-rays. The range is indicated by a region 101 in Fig. 9. With a semiconductor in which silicon forms the base, the electons move freely when they are irradiated with electromagnetic waves or a beam of particles having energy greater than an energy gap Eg (=1.2 eV). In terms of the threshold wavelength, the electrons move freely when they are irradiated with electromagnetic waves having wavelengths shorter than 10331.5 angstroms, since ν= E/h , λ = c/ν . The range is indicated by a region 102 in Fig. 9. Thus, a metal part connected to the potential of the active side 2 serves as an antenna which absorbs electromagnetic waves at the time when the static electricity sparks in compliance with the aforementioned equation λmin = 12.4/Vmax . Therefore, eddy currents flow into the electronic circuit network to produce noise. In the electronic devices, the noise must be suppressed for all of the electromagnetic wave bands (region 104 in Fig. 9). In a grounded circuit, the noise can be suppressed by the single-point grounding for the electromagnetic waves of up to the VHF band that is referred to in a radio communications system, and can be suppressed by the many-point grounding for the electromagnetic waves of the UHF band (region where waveguides are handled), which, however, are not omnipotent. That is, interference to the electronic devices caused by the static electricity must be eliminated by a method which does not rely upon the grounding circuit. The region based upon a new concept is indicated by 105 in Fig. 9. Generally, electrically equivalent constants of a human body consist of a resistance of about one kiloohms and an electrostatic capacity of 200 pF to 500 pF. Fig. 10 shows electrostatic discharge characteristics for the amount of electric charge (Q) when the charged volatage (V) is 20 Kv, resistance (R) is 800 ohms, and electrostatic capacity (C) is 500 pF. The amount of electric charge (Q) is given by, If the side in which the discharge takes place has zero resistance, a discharge time τ given by, is required until the electric charge of 10 µC is discharged to 1/e. In practice, however, the side in which the discharge takes place has resistance to some extent, and a longer period of time is required for the discharge. If the electric charge passes through the CMOS IC in the electronic circuit network, the oxide film is completely destroyed (scattered). If the device is under the electrically charged condition in which the electric discharge does not take place, the potential of the active side 2 is spread throughout the electronic circuit network that is constituted relying upon the idea of forming a grounding circuit. Therefore, erroneous input and erroneous operation caused by the electric charge take place on the pull side 3, in the input line 4 and in the field-effect IC. Harmful influences to the electronic devices caused by the static electricity are summarized below. (a) The patterns and metallic structural parts on the circuit board connected to the active side 2 work as antennas depending upon the magnitude of energy of the static electricity, and absorb the electromagnetic waves to generate eddy currents which produce noise in the electronic circuit network. In particular, since the portable electronic devices cannot be ideally grounded, the energy of noise must be consumed in the electronic circuit network to form a factor of erroneous operation (region indicated by 103 in Fig. 9). (b) The semiconductor in which silicon forms the base operates erroneously when it is irradiated with electromagnetic waves of a wavelength shorter than 10331.5 angstroms. (c) The device operates erroneously if the electric charge flows through the electronic circuit network, and the oxide film is broken (scattered) if the electric charge flows through the semiconductor. (d) The electronic circuit network is affected by the disturbance in the distribution of electric field in which the static electricity exists, when the electronic circuit network is provided with a field-effect IC which, in principle, is susceptible to the electric field. (ii) Means for Deriving Hypotheses A semiconductor integrated circuit (IC) chip has many input/output terminals (hereinafter referred to as IC pads). The layout of IC pads will be discussed below. Here, to simplify the description, the layout contains a minimum number of pads. Fig. 11 is a model diagram of the layout of IC pads that are mounted on a circuit board and are susceptible to the static electricity. Fig. 13 is is also a model diagram of the layout of IC pads that are mounted on a circuit board and are susceptible to the static electricity. Fig. 12 is a matrix diagram for comparing the positional relations related to the IC pad layout of Fig. 11, and Fig. 14 is a matrix diagram for comparing the positional relations related to the IC pad layout of Fig. 13. Names of coordinates of matrix are names of functions of IC pads. In Fig. 11, for example X IN and X OUT denote IC pads that constitute an oscillation circuit, and Ø₁ and Ø₂ denote IC pads that constitute a booster circuit. Symbol V DD denotes an IC pad which receives a potential of the active side 2, and V SS denotes an IC pad which receives a potential of the pull side 3. Symbol SW denotes an IC pad of the circuit 1 which is connected to an end of a switch in the input line 4. As for the frames of X OUT and V SS on side of X IN in the matrix diagram of Fig. 12, symbol ○ is put to the frames of X OUT and V SS in the row of X IN and V SS . Next, as for X IN and SW on side of X OUT , symbol ○ is put to the frames of X IN and SW in the row of X OUT . Symbols ○ are put to the frames in the same manner as for Ø₁, and then as for Ø₂, SW, V DD and V SS , successively. Similarly, Fig. 14 is described based upon Fig. 13. Next, a diagram of Fig. 15 for comparing matrixes is described by combining the upper right portion of the diagonal line of the matrix diagram of Fig. 12 which shows the pads that are mounted on the circuit board and are susceptible to the static electricity with the lower left portion of the diagonal line of the matrix diagram of Fig. 14. In Fig. 15, symbols ○ that are located at symmetrical positions relative to the diagonal line are replaced by symbols  . The matrix of symbols  indicates that the layouts of IC pads of Figs. 11 and 13 are in a neighborhood relationship to each other. That is, X IN and X OUT , ø₁ and Ø₂, and V DD and SW indicate similar layouts having neighborhood relationship in Figs. 11 and 13. A diagram of Fig. 20 for comparing matrixes is described by combining the upper right portion of the diagonal line of the matrix diagram of Fig. 17 corresponding to Fig. 16 which shows the layout of IC pads that are mounted on the circuit board and are confirmed to be little affected by the static electricity, with the lower left portion of the diagonal line of a matrix diagram of Fig. 19 corresponding to Fig. 18 which shows the layout of IC pads that are confirmed to be little affected by the static electricity after they have been mounted. In Fig. 20, symbols ○ that are located at symmetrical positions relative to the diagonal line are replaced by symboles  . The matrix of symbols  indicates that the layouts of IC pads of Figs. 16 and 18 are in a neighborhood relationship to each other. That is, X IN and X OUT , Ø₁ and Ø₂, and V SS and SW indicate similar layouts having a neighborhood relationship in Figs. 15 and 17. The IC that is easily affected by the static electricity after it has been mounted on the circuit board is compared below with the IC that is little affected, in regard to their similar points. If similar points common to the easily affected IC and the little affected IC are eliminated, since they are irrelevant to whether they are little affected or easily affected, the following fact becomes obvious. The results are discussed below. After mounted on the circuit board, the IC tends to be easily affected or little affected by the static electricity because of the reason that V DD (active side 2) has more patterns that stretch on the circuit board than V SS (pull side 3), since the circuit is designed based upon the idea of employing a grounding circuit. This fact is quite important to derive the following hypotheses. Hypothesis 1: The IC which is easily affected has V DD and SW (active side 2 and input line 4) that are adjacent to each other. That is, there exists a large stray capacity Ca between the active side 2 and the input line 4. Hypothesis 2: The IC which is little affected has V SS and SW (pull side 3 and input line 4) that are adjacent to each other. That is, a stray capacity Cp between the pull side 3 and the input line 4 is smaller than the above-mentioned stray capacity Ca. (iii) Experiment to Confirm the Hypotheses: The following two examples will be described to prove the hypotheses 1 and 2. Fig. 21 is a solid diagram of the circuit of a digital wristwatch, in which reference numeral 4a denotes a switch pattern which forms an end of the input line 4, and 2b denotes a switch spring which assumes the potential of the active side 2. On the switch pattern 4a is disposed the switch spring 2b in an opposed manner over an area 9 of 10mm² maintaining a distance of 0.3 mm, to thereby form an air capacitor. Under this condition, the device is easily affected by the static electricity and operates erroneously for various control operations. If the shape of the switch spring 2b is so changed that it is opposed to the switch pattern over an area 10 instead of the area 9, then the device becomes little affected by the static electricity. This fact verifies the aforementioned hypothesis 1. As a follow-up experiment, a capacitor was inserted between the switch pattern 4a and the potential V SS of the pull side 3 under the condition of the opposed area 9, in order to examine the immunity of the device against the static electricity. It was found that the device exhibited immunity if the capacitor had a capacity greater than a given value. Fig. 22 is a solid diagram showing another circuit of the electronic wristwatch. The device is little affected by the static electricity when a temporarily formed V DD pattern 11 is not provided on the V DD pattern 2b adjacent to the switch pattern 4a, the V DD pattern 2b assuming the potential of the active side 2. On the other hand, if the temporarily formed V DD pattern is located adjacent to the switch pattern 4a as shown in the drawing, the device becomes susceptible to the static electricity and operates erroneously such as displaying incorrect indication. This is one of the verifications related to the aforementioned hypothesis 2. The idea to lengthen the pattern of the active side 2 on the circuit board or to increase the area conforms to the way of thinking which is based upon the grounding circuit, but is not quite effective to suppress the noise that stems from the static electricity and rather makes the situation worse. Even if the existing grounding circuit is employed in an attempt to cope with the static electricity, a discharge current of static electricity flows from the metal housing into the electronic circuit network, and the IC is broken down or electrical data in the circuit network are disturbed. Further, electromagnetic waves of large energy generated by lightning or the discharge of static electricity are absorbed by the metal housing and by the pattern of the active side 2 to form eddy currents which then generate noise to disturb the electrical data in the electronic circuit network. Moreover, when the electronic device is placed under a condition where the static electricity is not discharged, the active side 2 (ground side) that spreads throughout the circuit board works more effectively to receive the static electricity than the pullside 3. Therefore, the electric field acts more greatly upon the active side 2 than upon the pull side 3, and the device operates erroneously. The present invention seeks to remove the above-mentioned defects and to provide an electronic device that has immunity against the phenomena of static electricity. According to the present invention, there is provided an electronic device having a power supply input circuit arranged for suppressing noise from static electricity, the input circuit comprising a first supply line arranged to be at a first source potential, a second supply line arranged to be at a second source potential, and an input line connected by way of a switch to the first supply line and by way of a resistance to the second supply line, said supply lines supplying power to a circuit of the device, characterised in that the first and second supply lines and the input line have a pattern layout of pads of an IC or leads on a circuit board for the input circuit such that a capacitance C a between the first supply line and the input line and a capacitance C p between the input line and the second supply line maintain a relation C a < C p . In a preferred embodiment of the present invention a metal housing of the device contains an input circuit which maintains an ordinary potential on the input line by inducing a pull potential on the input line in order to eliminate the induction of an active potential other than that for operating the device, thereby to prevent any erroneous input. Advantageously, furthermore, neither the active side (ground side) of the electronic circuit nor the electronic circuit network is permitted to be electrically connected to the housing in order to interrupt the flow of elecric charge and eddy currents produced by electro-magnetic waves of large energy. If the housing is made of an insulating material, this helps prevent the distribution of electric field from being disturbed in the electronic circuit, and makes it possible to achieve the desired object. The invention is described further by way of example, with reference to the accompanying drawings, in which:- Figure 1 is a diagram of a fundamental input circuit in an electronic circuit network according to the present invention; Figures 2 and 3 are diagrams of model layouts of IC pads according to the present invention; Figures 4 and 5 are diagrams illustrating portions of layouts of circuit board patterns according to the present invention; Figure 6 is a diagram illustrating an electronic circuit network and a metal housing according to the present invention; Figure 7 is a diagram which schematically illustrates the input circuit; Figure 8 is a diagram showing voltage waveforms of Figure 7; Figure 9 is a diagram to illustrate the concept related to the energy of electromagnetic waves and noise; Figure 10 is a diagram of waveforms which represent discharge characteristics of static electricity; Figures 11, 13, 16 and 18 are diagrams of layouts of IC pads for confirming the present invention; Figures 12, 14, 15, 17, 19 and 20 are matrix diagrams of IC pads for confirming the present invention; and Figures 21 and 22 are diagrams of circuit patterns for confirming the present invention. Figure 1 is a diagram of an input circuit according to an embodiment of the present invention, wherein Figure 1(a) is a diagram in which the active side 2 assumes the higher potential of the power source voltage, and Figure 1(b) is a diagram in which the active side 2 assumes the lower potential of the power source voltage. Reference numeral 1 denotes a circuit, 3 denotes a pull side, and 4 denotes an input line. An end of the input line is connected to a switch SW and the other end thereof is connected to the circuit. If the switch SW is turned on, the input line assumes the potential of the active side 2 and if the switch SW is turned off, the input line assumes the potential of the pull side 3 via a pull resistance Rp. An electrostatic capacity between the active side 2 and the input line 4 is denoted by Ca and an electrostatic capacity between the input line 4 and the pull side 3 is denoted by Cp, the electrostatic capacities having a relationship Ca < Cp. With the circuit being constructed as described above, even if an impulse is simultaneously superposed on the active side 2 and on the pull side 3 that are power source lines, the potential of the pull side 3 appears on the input line 4 via Cp due to the relationship Ca < Cp. Accordingly, the impulse noise is not induced on the input line 4, and the circuit is prevented from operating erroneously. Fig. 2 is a diagram of a model layout of IC pads illustrating important portions only according to a particular embodiment of the present invention, wherein Fig. 2(a) is a diagram of a layout of IC pads in a circuit structure in which the active side assumes the higher potential of the power source voltage, and Fig. 2(b) is a diagram of a layout of IC pads in a circuit structure in which the active side 2 assumes the lower potential of the power source voltage. In Fig. 2(a), a terminal (for example, X IN in Figure) other than the pad of V DD , other than the pad of SW and other than the input pad for testing, is provided between the pad of V DD (active side 2) and the pad of SW (input line 4). That is, the device is so designed that the stray capacity is relatively decreased between the active side 2 and the input line 4. Namely, the capacity Ca is inevitably decreased in the pattern layout on the circuit board. In Fig. 2(b), a pad (for example, Ø₂ in Figure) other than the pad V SS or SW, and other than the input pad for testing is provided between the pad V SS (active side 2) and the pad SW (input line 4). That is, the device is so designed that the stray capacity is relatively decreased between the active side 2 and the input line 4. Namely, the capacity Ca is inevitably decreased in the pattern layout on the circuit board. Fig. 3 is a diagram of a model layout of IC pads showing important portions only according to a further embodiment of the present invention, wherein Fig. 3(a) is a diagram of a layout of IC pads in a circuit structure in which the active side 2 assumes the higher potential of the power source voltage, and Fig. 3(b) is a diagram of a layout of IC pads in a circuit structure in which the active side 2 assumes the lower potential of the power source voltage. In Fig. 3(a), the pad SW (input line 4) is located adjacent to the pad V SS (pull side 3). That is, the device is so designed that the stray capacity is made as great as possible between the pull side 3 and the input line 4. Namely, the capacity Cp is inevitably increased in the pattern layout on the circuit board. Fig. 4 is a diagram showing a portion of the layout of circuit board patterns according to a still further embodiment of the present invention, wherein reference numeral 2c denotes active pattern lines, 5 denotes a pattern other than the active pattern lines, other than the SW pattern lines and other than the pattern lines for testing. Symbols SW₁, SW₂ and SW₃ denote switch patterns, and reference numeral 6 denotes an IC chip. The pattern 5 is formed between the active pattern lines 2ca and the pattern SW₃, so that the electrostatic capacity Ca is relatively decreased between the active side 2 and the switch pattern SW₃ so as to realize the relationship Ca < Cp mentioned in Fig. 1. Fig. 5 is a diagram showing a portion of the layout of circuit board patterns according to a yet further embodiment of the present invention, wherein reference numeral 3a denotes pull pattern lines formed adjacent to SW₁ and SW₃ pattern lines. The electrostatic capacity Cp is relatively increased between the pull side 2 and the SW to achieve the relationship Ca < Cp mentioned with reference to Fig. 1. In any case, the layout is so designed that the relationship Ca < Cp is maintained in any portion of the pattern lines inclusive of, for example, through-holes. Fig. 6 is a diagram showing the structure of an electronic device in which the electronic circuit network 8 of the present invention illustrated in Figs. 1, 2, 3, 4 and 5 is contained in the metal housing 7 according to another embodiment of the present invention. Here, if the electrostatic discharge takes place with using the metal housing 7 as an electrode, the electric charge migrates by electric quantity stored in the metal housing due to the avlanche of electrons at the time of electric discharge. Here, however, the metal housing 7 is not electrically conducted to the electronic circuit network 8, so that the electric charge will not flow into the electronic circuit network 8. Simultaneously with the electric discharge, furthermore, the kinetic energy of electrons that have impinged upon the metal housing 7 is converted into electromagnetic waves of large energy, and whereby the metal housing 7 works as an antenna to absorb the electromagnetic waves that turn into eddy currents. According to this embodiment, however, the eddy currents are transformed into heat in the metal housing 7 and do not flow into the electronic circuit network 8. In practice, there are quite a few electronic devices that have the metal housing 7 of the sealed structure. In most cases, therefore, the electromagnetic waves produced by the static electricity impinge directly onto the electronic circuit network 8. According to the present invention, however, the electronic device is not adversely affected by the phenomena of static electricity owing to the relationship Ca < Cp which is the basis of the present invention. Namely, the embodiments of the present invention completely preclude advsese effects (a), (b), (c) and (d) caused by the static electricity from acting upon the electronic devices. Industrial Applicability The present invention can be effectively adapted to electronic devices for medical uses and electronic devices to be mounted on aircraft that must not be affected by the phenomena of static electricity, lightning or the external electric field, as well as to electronic devices to be mounted on artificial satellites, for meteorological observations and for atomic utilization that are subject to be exposed to ionizing radiation, corpuscular radiation and charged particles. In the field of civil uses, the invention can be very effectively adapted to robots, IC cards, electronic computers, electronic measuring instruments, electronic cameras, electronic wristwatches and the like.

Claims: An electronic device having a power supply input circuit arranged for suppressing noise from static electricity, the input circuit comprising a first supply line (2) arranged to be at a first source potential, a second supply line (3) arranged to be at a second source potential, and an input line (4) connected by way of a switch (SW) to the first supply line and by way of a resistance (Rp) to the second supply line, said supply lines supplying power to a circuit (1) of the device, characterised in that the first and second supply lines and the input line have a pattern layout of pads of an IC or leads on a circuit board for the input circuit such that a capacitance C a between the first supply line and the input line and a capacitance C p between the input line and the second supply line maintain a relation C a < C p . An electronic device according to claim 1 characterised in that the relation C a < C p is maintained by the pattern layout of pads of an IC by providing between a pad for the first supply line (2) and a pad for the input line (4) a further pad other than the one for the first supply line (2), the one for the input line (4), and one for a test input. An electronic device according to claim 1 characterised in that the relation C a < C p is maintained by the pattern layout of pads of an IC by locating a pad for the second supply line (3) and a pad for the input line (4) adjacent to each other. An electronic device according to claim 1 characterised in that the relationship C a < C p is maintained by the pattern layout of leads on a circuit board by providing between a lead for the first supply line (2) and a lead for the input line (4) a lead other than the one for the first supply line (2), the one for the input line (4) and one for a test input line. An electronic device according to claim 1 characterised in that the relation C a < C p is maintained by the pattern layout of leads on a circuit board by locating a lead for the input line (4) adjacent to a lead for the second supply line (3). An electronic device according to any preceding claim characterised in that the input circuit is arranged in a metal housing (7), and in that the input circuit and the metal housing (7) are not electrically connected to each other.

Inventors: OCHIAI, HITOSHI, TAKAHASHI, AKIO
Applicants: SEIKO INSTRUMENTS INC.
Application year: 1985
Main classification: H03K17
IPC codes: H03K19, H01L27, H01L21, H03K17