ALLOY MAGNETIC RECORDING HEAD

Abstract: An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy magnetic head and a manufacturing method therefor. The magnetic head includes front gap forming surfaces which serve as the magnetic tape transportation surfaces and compri­ se a non-magnetic ceramic films and glass films, and rear gap forming surfaces aiming at junction at the portion reverse to the tape transportation side and comprising either the same ma­ terials at the front gap or silver-copper series alloy films. The manufacturing method forms by means of sputtering non-mag­ netic ceramic films at the front gap forming surfaces of the core pieces and either non-magnetic ceramic films or silver-copper series alloy films at the rear gap forming surfaces, in some cases implanting ion onto the films, and allowing the cores to abut against each other, so that the cores are subjected to heat treatment in a non-oxidizing atmospher less than or more than atmospheric pressure and at a temperature higher than the sof­ tening point of the glass and the liquid phase appearance tem­ perature of the silver-copper series alloy.

Description: Alloy Magnetic Recording Head and a Manufacturing Method therefor BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to an alloy magnetic recording head and a manufacturing method therefor. 2. Description of the Prior Art Recently, the magnetic recording is now in progress toward high densification. It is necessary for achievement of high density recording to restrict a spread of the magnetic field as much as possible from the viewpoint of record demagnetization. For this purpose, a head construction for better contact between the recording medium and the magnetic head, fine machining of a gap, and high saturation magnetic flux density core material difficult to create magnetic saturation near the core gap (because the use of high coercive force magnetic recording medium is required from the selfdemagnetization), have been desired. Now, a magnetic head has been recognized to be optimum which has a narrow gap of high accuracy and uses an iron (Fe), aluminum (Al) and silicon (Si) series magnetic alloy (for example, Sendust) as a core material for the magnetic head of such high performance, so that popularization of such magnetic head has been desired earnestly in the field of magnetic recording. However, it is extremely difficult from the property of the Fe-Al-Si series magnetic alloy used as core material to form at this alloy magnetic head the narrow gap of high accuracy, which has hindered the spread of the aforesaid magnetic head. Next, an example of the conventional method for forming the Fe-Al-Si series magnetic alloy (for example, Sendust) is shown in Fig. 1, in which a quartz (SiO2) film 3 is formed by the spattering at the gap formation surface (the tape transportation surface) of a core 1 of Fe-Al-Si series magnetic alloy at one side in Fig. 1 and then a core 2 of Fe-Al-Si series magnetic alloy at the other side is stuck with the core 1 by use of silver alloy brazing material 4, for example, silver-copper-cadmium-zinc series alloy, of the low melting point. In this method, however, the Fe-Al-Si series magnetic alloy and quartz (SiO2) used at the front gap forming portion at the tape transportation surface are largely different from each other in the coefficient of thermal expansion (the coefficient of thermal expansion of quartz is 1.7 x 10 6/oC and that of Fe-Al-Si alloy, 13.5 x 10-6/OC), so that the quartz film 3 is peeled off from the Fe-Al-Si series magnetic alloy during the tape transportation so as to cause deterioration of the gap accuracy, in other words, cause a break in the gap forming surface. The silver alloy brazing material 4 for a rear gap at the reverse side to the tape transportation surface generally uses silvercopper-cadmium-zinc series alloy of the low melting point in order to increase a bonding strength with the Fe-Al-Si series magnetic alloy. The brazing material is larger in its coefficient of thermal expansion (about 17 to 18 x 10 6/or) and also larger in the counter diffusion with the Fe-Al-Si series magnetic alloy when both the cores 1 and 2 are bonded, thereby having created a problem in that a crack is developed at the Fe-Al-Si series alloy portion when the melting silveralloy brazing material is solidified so that, under the influence of the crack, it becomes difficult to obtain control for a gap width and parallelism of the gap surfaces. SUMMARY OF THE INVENTION An object of the invention is to provide a magnetic head of Fe-Al-Si series magnetic alloy which forms a narrow magnetic gap with high accuracy and enables the formed gap to have high mechanical strength, and a manufacturing method for the magnetic head. The magnetic head of Fe-Al-Si series magnetic alloy has a pair of Fe-Al-Si alloy core pieces, each of which forms a front gap forming surface serving to transport thereon a magnetic tape and comprising a non-ferromagnetic film and a glass film, and a rear gap forming surface for junction of core pieces with each other and apart from the front gap forming surface and comprising either the same materials at the front gap or a silver-copper series alloy film. Also, the manufacturing method for the magnetic head of Fe-Al-Si series magnetic alloy of the invention will be described as follows: The magnetic head of Fe-Al-Si series magnetic alloy is so constructed that at each gap-forming surface (both front and rear gaps) of a pair of Fe-Al-Si series magnetic alloy core pieces to be coupled into the magnetic head is formed a non-magnetic ceramic film (for example, of ZrO2, A1203, MgO, MgO.A1203) of thickness with high accuracy, a glass film of uniform thickness is overlapped onto each ceramic film, and the pair of Fe-Al-Si series magnetic alloy core pieces, while being held in condition of allowing the glass films to abut against each other, are subjected to the pressurization and heat treatment in condition of temperature higher than the softening point of glass material in use, so that the abutting films are subjected to diffused junction to thereby form the magnetic gap. The core pieces abutting at the glass films against each other are subjected to the pressure and heat treatment so as to allow the extremely upper surfaces of ceramic films and glass films to chemicalreact on each other to thereby produce a compound of different composition, but most part of glass film not contributive to the chemical reaction is extruded outwardly from the junction surface of Fe-Al-Si series magnetic alloy core pieces. In other words, the gap is formed by part of nonmagnetic ceramic film layer and an extremely thin compound layer composed of ceramic and glass and produced newly by chemical reaction. The abovementioned films of non-magnetic ceramic and glass, when formed, are controlled of a film thickness to facilitate control of gap width and the gap portion can rigidly be joined due to diffusion reaction caused by the pressure and heat treatment. Hence, the magnetic head of Fe-Al-Si series magnetic alloy desired for the high density magnetic recording head is easy to form the gap very narrow and with high accuracy and to enable the formed gap to have high mechanical strength. There is a gap formation method by a silver brazing alloy soldering for forming the gap of more intensive strength. At first, a pair of Fe-Al-Si series magnetic alloy cores constituting, when combined, the magnetic head, form at the front gap forming surface at each core a nonmagnetic ceramic film of uniform thickness and a glass film uniform in thickness and overlapping on the ceramic film; at a rear gap forming surface positioned apart from the front gap forming surface at each core is formed a silver brazing alloy (for example, Ag-Cu-In series alloy, Ag-Cu-Sn series alloy, Ag Cu-Pd series alloy, and Ag-Cu series alloy, etc.) which is of a high melting point, of a coefficient of thermal expansion relatively near that of Fe-Al-Si alloy, and restricted in thickness with high accuracy; and the pair of cores while keeping the same kinds of films abutting against each other are processed in a not-oxidation atmosphere under one atmospheric pressure and at a temperature upper than the softing point of glass and appearance of liquid phase of Ag-Cu series alloy, so that the films abutting against each other are subjected to diffused junction to thereby form the narrow gap. There is a hot isostatic pressing (HIP) processing for forming the gap of further higher accuracy and of more intensive strength. This method bonds by use of the HIP processing the pair of cores of about the same material as that in the former method, thereby forming a further stronger and highly accurate gap. Furthermore, there is an iron implantation method for forming a gap of high accuracy and intensive strength. In this method, the front and rear forming portions are of the same material as the former method, and the gap forming surfaces at the pair of cores are implanted with ions (for example, of nitrogen, argon, neon, helium, etc.) to thereby form the gap of high accuracy and intensive strength as abovementioned. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a sectional view a conventional magnetic head piece of a Fe-Al-Si series magnetic alloy, Figs. 2-(a), -(b) and -(c) are perspective exploded views of embodiments of Fe-Al-Si series magnetic alloy cores of the invention respectively, and Fig. 3 is a perspective view of embodiment of Fe-Al-Si series magnetic alloy magnetic head pieces of the invention. DESCRIPTION OF THE PREFERRED EMBODIMENTS This invention will be detailed in accordance with an embodiment shown in the drawings. Embodiment 1. In the embodiment shown in Fig. 2, a pair of boat-likeshaped cores 5 and 6 each comprise a Fe-Al-Si series magnetic alloy of 3 mm in width, 2 mm in height, and 20 mm in length and of a shape as shown in Fig. 2-(a), and are provided with a groove 7 for receiving windings and of 0.35 mm in width and formed by use of a diamond grindstone. The cores 5 and 6 are prepared and the front gap forming surfaces 8 and rear gap forming surfaces 9 are mirror-polished (the maximum surface roughness R max. is 0.01 Vm or less with accuracy) respectively. Next, at the front and rear gap forming surfaces 8 and 9 are formed by use of the sputtering a film 10 of zirconium oxide, in which yttrium oxide: non-magnetic ceramics, is solid-dissolved by 5 mol %, and a film 11 of glass I shown in Table 1 is formed onto the film 10 by the sputtering, the zirconium oxide film 10 formed being 0.15 in uniform thickness, the glass film 0.05 pm in thickness. Table 1 EMI8.1 <tb> <SEP> Kind <SEP> of <SEP> Glass <SEP> Composition <SEP> (wt. <SEP> %) <SEP> Softening <tb> <SEP> Glass <SEP> Point <tb> <SEP> SiO2 <SEP> B2O3 <SEP> PbO <SEP> Al2O3 <SEP> BaO <SEP> La2O3 <SEP> Na2O <SEP> K2O <SEP> others <SEP> ( C) <tb> 1 <SEP> Glass <SEP> I <SEP> 25 <SEP> 0 <SEP> 60 <SEP> 0 <SEP> 0 <SEP> 0 <SEP> 3 <SEP> 1 <SEP> 11 <SEP> 580 <tb> 2 <SEP> Glass <SEP> z <SEP> 67 <SEP> 10 <SEP> 0 <SEP> 0.5 <SEP> 0 <SEP> 0 <SEP> 10 <SEP> 0 <SEP> 11.5 <SEP> 720 <tb> <SEP> 3 <SEP> Glass <SEP> m <SEP> 30 <SEP> 15 <SEP> 0 <SEP> 1 <SEP> 50 <SEP> 0 <SEP> 0 <SEP> 0 <SEP> 5 <SEP> 750 <tb> <SEP> 4 <SEP> Glass <SEP> IV <SEP> 11 <SEP> 31 <SEP> 0 <SEP> 0 <SEP> 25 <SEP> 20 <SEP> 0 <SEP> 0 <SEP> 13 <SEP> 710 <tb> Thus, the pair of cores 5 and 6 having films in two layers at both the gap forming surfaces in condition of abutting against each other through the glass films 11, are subjected to the heat treatment at a temperature of 9000C in argon gas while being under pressure from both sides of cores 5 and 6 to thereby allow the films to carry out diffused junction, thus coupling the cores 5 and 6 with each other. The coupled core block is cut into a segment of 500 Vm in thickness and subjected to mechanical polishing, thereby having manufactured a leaf-like head piece of 150 pm in thickness as shown in Fig. 3. The head piece was polished at the front gap portion 13 and rear gap portion 14, and an optical microscope was used to measure a gap length (gap width), resulting in that both gap widths were 0.3 pm each and the gap forming surfaces were observed to be parallel to each other. In order to examine mechanical strength at the gap formed, the cores 5 and 6 were given an external force of 1 kg.mm2 for the tensile test, but the junction surface was not peeled and was superior in mechanical strength. A specimen machined to have a head track width of 25 pm was used to transport the magnetic tape (coercive force Hc: 1400 oersteds and saturation magnetic flux density Br: 3000 gausses) at relative speed 3.45 m/sec, in which no break was found at the gap forming portion. When a coil was wound in 25 turns through the groove at the head piece of the specimen, reproducing output voltage of the head in 5 MHz was 250 pV (peak to peak). In addition, in this embodiment, in case that the component of gap forming material is diffused into the core of Fe-Al-Si alloy chip, the magnetic property of the head core is largely affected to be deteriorated. Hence, a X-ray micro analyzer was used to analyze the composition of core material near the gap. As a result, the components, such as Zr, Y or Pb, of non-magnetic ceramics and glass films of the gap forming material were not detected in the core material, the X-ray micro-analyzer being of accuracy of 0.01 vm. In other words, it can be decided that no gap forming material component near the gap is not diffused into the core material and that an optical gap width is equal to a magnetic gap width. The results of the above measurement are shown in Specimen No. 1 in Table 2. Similarly to the above, a head piece changed in composition of non-magnetic ceramics and glass films at the gap forming portion was produced and inspected as the same as the above, the results of inspection are shown in Specimen Nos. 2 to 4 in Table 2. Also, for the purpose of comparison, a head piece having a gap formed by the conventional method was produced. A hard quartz film is formed at the front gap portion and Ag-Ca-Zn-Cd series silver brazing foil of 3 pm in thickness was used to deposit the head pieces to produce a Fe-Al-Si alloy head of the same construction as that shown in Fig. 3, the gap portions of the head pieces being subjected to the same inspection as the embodiment. As a result, the tensile test by the external force of 1 kg/mm2 caused no peeling, but the parallelism at the gap forming surfaces was remarkably deteriorated, a width of front gap being 0.53 vm and that of rear gap 0.24 pm. When the front of head was subjected to machining and the tape was transported, peeling was created at the gap forming portions. Also, reproducing output voltage of the head of 5 Hz when the groove at the head was wound with a coil in 25 turns. From the aforesaid results, zirconium oxide (ZrO2), magnesium Oxide (MgO), aluminum oxide (Al2O3), and spinel (MgO-A1203) are suitable for the non-magnetic ceramic film, because these elements are about equal in the coefficient of thermal expansion to Fe-Al-Si alloy (for example, 10 x 10 6/oC for ZrO2, 12 x 10 / C for MgO, and 10 x 10-6/ C for A1203 and 10 x 10-6/ C for MgO.A12O3) and they are ceramics of high hardness, thereby having a merit that when the tape is transported, deformation or a break of gap caused by partial wear of gap forming portion is difficult to occur. TABLE 2 EMI12.1 <SEP> Gap <SEP> Portion <SEP> Junction <SEP> Optical <SEP> Parallel- <SEP> Condition <SEP> Condition <SEP> Reproduc <SEP> Heat <SEP> Gap <SEP> ism <SEP> at <SEP> of <SEP> Junc- <SEP> of <SEP> Gap <SEP> ing <SEP> Output <tb> Specimen <SEP> Treatment <SEP> Length <SEP> Junction <SEP> tion <SEP> during <SEP> Voltage <SEP> in <tb> No. <SEP> Material <SEP> Film <SEP> Tempera- <SEP> Portion <SEP> Surface <SEP> Tape <SEP> 5 <SEP> MHz <tb> <SEP> Thickness <SEP> ture <SEP> ( m) <SEP> at <SEP> Core <SEP> Transpor- <SEP> ( V <SEP> p-p) <tb> <SEP> ( m) <SEP> ( C) <SEP> Piece <SEP> tation <tb> <SEP> Zirconium <SEP> 0.15 <tb> <SEP> 1 <SEP> Oxide <SEP> 900 <SEP> 0.31 <SEP> good <SEP> good <SEP> not <SEP> 250 <tb> <SEP> Glass <SEP> I <SEP> 0.05 <SEP> broken <tb> <SEP> Aluminium <SEP> 0.25 <tb> <SEP> 2 <SEP> Oxide <SEP> 950 <SEP> 0.51 <SEP> good <SEP> good <SEP> not <SEP> 173 <tb> <SEP> Glass <SEP> II <SEP> 0.10 <SEP> broken <tb> <SEP> Magnesium <SEP> 0.20 <tb> <SEP> 3 <SEP> Oxide <SEP> 900 <SEP> 0.41 <SEP> good <SEP> good <SEP> not <SEP> 206 <tb> <SEP> Glass <SEP> III <SEP> 0.05 <SEP> broken <tb> <SEP> Spinel <SEP> 0.25 <tb> <SEP> 4 <SEP> Glass <SEP> IV <SEP> 0.10 <SEP> 850 <SEP> 0.51 <SEP> good <SEP> good <SEP> not <SEP> 170 <tb> <SEP> Quartz <SEP> 0.53 <SEP> broken <tb> <SEP> 5 <SEP> (SiO2) <SEP> 0.15 <SEP> 900 <SEP> (Front <SEP> poo4 <SEP> cracking <SEP> brocken <SEP> 50 <tb> <SEP> (Front <SEP> Gap) <SEP> Gap) <tb> <SEP> Ag-Cu-Zn-Cd <SEP> Foil <tb> <SEP> Alloy <SEP> Foil <SEP> Thickness: <tb> <SEP> (Rear <SEP> gap) <SEP> 3.0 <SEP> m <tb> Embodiment 2 The Fe-Al-Si series magnetic alloy was processed by the same method as the embodiment 1 to manufacture chips of a pair of boat-like shaped head pieces. A zirconium oxide (ZrO2) film 10 is formed by means of sputtering, onto both the junction surfaces corresponding to the front gap as shown in Fig. 2-(c). On the film 10 is overlapped a glass film 11 (Glass of PbO of 75 wt.%, SiO2 of 20 wt.% and Na2O of 5 wt.%) by sputtering. In this case, the rear gap forming surfaces were masked to be free from ZrO2 or glass, the zirconium oxide film being 0.15 pm in uniform thickness, the glass film 0.05 pm in uniform thickness. An Ag-Cu-In series alloy film 12 is formed at each junction surface at the rear gap forming portion by means of sputtering. In this case, the front gap forming surfaces are masked to be free from the Ag-Cu-In series alloy, the Ag-Cu-In film being 0.15 vm in uniform thickness and comprising Ag of 60 wt.%, Cu of 27 wt.% and In of 13 wt.%. The ZrO2 films and glass films at the front gap side and the Ag-Cu-In film at the rear gap side are allowed to abut at the same kind of films against each other so that the opposite chips at the pair of head pieces of Fe-Al-Si alloy were subjected to the heat treatment in a N2 atmosphere at one air pressure and a temperature of 9000C and the films to be stuck were processed by the diffused junction. The coupled core block is cut into a segment of 500 pm in thickness and subjected to mechanical polishing, thereby having manufactured a leaf-like head piece of 150 pm in thickness as shown in Fig. 3. The head piece of Fe-Al-Si series magnetic alloy film was polished at the front gap and rear gap portions and measured inside by an optical microscope. As a result, it was observed that front and rear gaps each were 0.30pom in width and parallel to each other in the gap surfaces, and also since the coefficient of thermal expansion of material for forming booth the front and rear gaps was about equal to that of Fe-Al-Si series magnetic alloy, no crack has not been created at the junction surfaces. Furthermore, in order to examine mechanical strength of the gap formed portions, the Fe-Al-Si series magnetic alloy at both sides of the gap was subjected to the tensile test by stress of 3 kg/mm2, but the junction surfaces were not separated to thereby have found that the cores are superior also in mechanical strength. Furthermore, when the front head was machined to be 25 vm in track width and a magnetic tape (of coercive force Hc; 1400 oersted and saturation magnetic flux density Bs 3000 gauss) was transported through the magnetic head at relative speed of 3.45 m/sec, no break was not found at the gap. In addition, when a coil was wound in 25 turns into the groove at the head, reproducing output voltage of the head at 5 MHz was 249 pV (peak to peak). The results of the above measurement are shown by the specimen No. 7 in Table 3. The specimen Nos. 6 and 8 to 15 in Table 3 show the results after various tests of specimens changed in material of the non-magnetic film at the front gap portions and in composition of SiO2-PbO-Na2O series glass. The specimen Nos. 16 and 17 in Table 3 show the results after various tests of the specimens treated in vacuum (1 x 10-5 Torr). In addition, in this embodiment, as to composition of Fe-Al-Si series magnetic core piece having influence on the magnetic property, an analysis using a X-ray microanalyzer could confirm that the composition was not at all changed before and after the heat treatment. As a result, the saturation magnetic flux density Bs of Fe-Al-Si series magnetic alloy is 8650 gauss; coercive force Hc, 0.03 oersted; and A.C. initial magnetic permeability , 61 (where for 200 mm thickness); and no change of magnetic property by the heat treatment was seen. Also, it could be confirmed that ion of Mg, Al or Zr was not diffused more than 0.01 pm in depth within the Sendust alloy. As seen from Table 3, the SiO2-PbO-Na2O series glass, when in composition of SiO2 of 20 to 80 wt.%, reacted on the ceramic film to form a strong front gap. In a case where an amount of SiO2 is small and that of PbO is extremely larger (Specimen No. 14 in Table 2), glass itself is very small in strength so as to cause a breakdown in the gap forming surfaces when the magnetic tape is transported. In a case of a large amount of SiO2 (Specimen No. 19 in Table 2), since sufficient roftening was not created under the processing condition at a temperature of 9000C, the glass film did not react on the ceramic film, in which the breakdown also occurred when the tape was transported. From the above, it is proper to take SiO2 of 20 to 80 wt.%. Table 3 EMI17.1 <SEP> Front <SEP> Gap <SEP> Optical <SEP> Parallelism <SEP> Gap <SEP> Condi- <SEP> Reproducing <tb> <SEP> Front <SEP> and <SEP> Sendust <SEP> tion <SEP> when <SEP> OPutput <tb> Specimen <SEP> Material <SEP> Film <SEP> Glass <SEP> Film <SEP> Gap <SEP> Junction <SEP> Tape <SEP> is <SEP> Voltage <SEP> in <tb> No. <SEP> thickness <SEP> (wt.%) <SEP> thickness <SEP> Surface <SEP> transported <SEP> 5 <SEP> MHz <tb> <SEP> ( m) <SEP> ( m) <SEP> ( m) <SEP> Condition <SEP> V(p-p) <tb> 6* <SEP> Zirconium <SEP> 0.10 <SEP> SiO2-Pb-Na2O <SEP> 0.05 <SEP> 0.30 <SEP> Good <SEP> Broken <SEP> 205 <tb> <SEP> oxide <SEP> (10) <SEP> (85) <SEP> (5) <tb> 7 <SEP> " <SEP> " <SEP> (20) <SEP> (75) <SEP> (5) <SEP> " <SEP> " <SEP> " <SEP> Good <SEP> 249 <tb> 8 <SEP> " <SEP> " <SEP> (40) <SEP> (50) <SEP> (5) <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 246 <tb> 9 <SEP> " <SEP> " <SEP> (60) <SEP> (35) <SEP> (5) <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 251 <tb> 10 <SEP> " <SEP> " <SEP> (80) <SEP> (15) <SEP> (5) <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 249 <tb> 11* <SEP> " <SEP> " <SEP> (90) <SEP> (5) <SEP> (5) <SEP> " <SEP> " <SEP> " <SEP> Broken <SEP> 200 <tb> 12 <SEP> Magnesium <SEP> " <SEP> (50) <SEP> (49) <SEP> (1) <SEP> " <SEP> " <SEP> " <SEP> Good <SEP> 245 <tb> <SEP> oxide <tb> 13 <SEP> " <SEP> " <SEP> (50) <SEP> (45) <SEP> (5) <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 251 <tb> 14 <SEP> Spinel <SEP> " <SEP> (50) <SEP> (40)(10) <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 249 <tb> 15 <SEP> " <SEP> " <SEP> (50) <SEP> (35)(15) <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 250 <tb> 16** <SEP> " <SEP> " <SEP> (50) <SEP> (40)(10) <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 245 <tb> 17** <SEP> " <SEP> " <SEP> (50) <SEP> (35)(15) <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 248 <tb> *:Comparison Example **:Subjected to heat treatment in vacuum (1 x 10-4 Torr). As seen from the above description and Table 3, the Fe Al-Si alloy magnetic recording head of the invention forms the non-magnetic ceramic film and glass film, of thickness with high accuracy, at the front gap forming surfaces (magnetic tape transportation surfaces) of pair of Fe-Al-Si alloy chips to be coupled into a form of magnetic head, and forms the silver brazing (Ag-Cu-In series) film at the rear gap forming surfaces, so that while the same kinds of gap forming surfaces are abutting against each other and the pair of Fe-Al-Si core pieces are being held, the core pieces are heat-treated at a temperature higher than that of melting the silver brazing material and glass and in a non-oxidizing atmosphere less than one atmosphiric pressure, so that the silver brazing films in abutting against each other and the glass films in abutting against each other, are subjected to diffused junction, thereby enabling strong junction of the Fe-Al-Si series magnetic alloy with each other. Hence, the non-magnetic film and glass film, when formed, are controlled of thickness to facilitate control of gap width, whereby the formation of gap at the Fe-Al-Si series magnetic alloy magnetic head, which has hitherto been considered difficult, has become easy to thereby have facilitated formation of the gap of intensive mechanical strength and high accuracy. Therefore, it becomes easy to manufacture the Fe-Al-Si series magnetic alloy magnetic head having the gap suitable for a high density magnetic recording head. At a rear gap portion containing thin film of silver alloy brazing material with high melting temperature, component elements of said brazing material is diffused in the Fe-Al-Si series magnetic alloy core pieces and therefor pair of said Fe-Al-Si series magnetic alloy cores are joined with high intensive strength each other. On the other hand, it becomes possible that a bonding at the rear gap has high intensive strength against mechanical stress and the bonding portion of said Fe-Al-Si series magnetic alloy cores (at the rear gap portion) has not any crack after heat treatment for abutting a pair of the cores owing to lack of cadmium (Cd) and zinc (Zn) in said brazing material, which component elements make a melting temperature of the brazing material down and the coefficient of thermal expansion of the brazing material up. In addition, when the non-magnetic ceramic film is defined to the zirconium oxide, magnesium oxide, and spinel films, these films each have the coefficient of thermal expansion relatively near that of Fe-Al-Si series magnetic alloy (as ZrO2: 10 x 10 / C, MgO: 12 x 10 /OC, and MgO.A1203: 10 x 10 6/or) and hardness is larger, whereby the gap is difficult to cause a break during the tape transportation. Also, when the composition of glass is defined to the SiO2-PbO-Na2O series, since the coefficient of thermal expansion (about 11 x 10 6/or) of the glass coincides well with that of Fe-Al-Si series magnetic alloy, ZrO2, MgO, MgO or MgO-A1203, the magnetic head is difficult to be subjected to thermal distortion, thereby obtaining intensive sticking strength. Although the glass is herewith defined to the SiO2-PbO Na2O series, glass even other than the above, when its coefficient of thermal expansion coincided with that of Fe-Al-Si alloy, ZrO2, MgO or MgO-A1203, was conformed to obtain a considerably intensive sticking force. For the heat treatment for welding of Fe-Al-Si series magnetic alloy in the embodiment, the atmosphere may not be defined to N2 or vacuum, but may be effective in all the non-magnetic atmospheres, which has been confirmed. Embodiment 3 A Fe-Al-Si series magnetic alloy head piece similar to that in Fig. 1 was produced by the following method the same as the embodiments 1 and 2 and then examined. This head piece was 3 mm wide and 2 mm high as shown in Fig. 2- (a). Next, silver brazing alloy films were stucked onto both sides of the rear gap by means of the sputtering (wherein the front gap forming portions were masked to be free from the silver brazing material). The silver brazing film was 0.20 vm in uniform thickness and composed of silver of 72 wt.% and copper 28 wt.%. The ZrO2 glass films at the front gap side were allowed to abut against each other and the silver copper alloy brazed films at the rear gap side were allowed to do so, thereby forming a pair of Sendust chips. The chips were processed under the hot isostatic pressing (HIP) method, such as at a temperature of 9000C, under pressure of 1000 2 kg/cm , and for one hour. Hence, the films at the junction surfaces of pair of Fe-Al-Si series magnetic alloy cores were subjected to diffused junction. The coupled core block was cut into a segment of 500 pm in thickness and subjected to mechanical polishing, thereby having manufactured a leaflike head piece of 150 um in thickness as shown in Fig. 3. The thin leaf of Fe-Al-Si series magnetic alloy head piece was polished at the front gap forming and rear gap forming portions and a width of each gap was measured by use of the optical microscope to obtain 0.31 pm each, and the gap surfaces were found to be parallel to each other. Moreover, there was found no crack on the junction surfaces because the coefficient of thermal expansion of the front and rear gap forming material is about equal to that of Al-Si series magnetic alloy. Also, the Fe-Al-Si series magnetic alloy materials at both sides of the gap were subjected to the tensile test by stress of 5 kg-mm in order to examine mechanical strength of the gap forming portions, in which it was seen that the junction surfaces were not peeled off, but superior in mechanical strength. Also, a "break" at the gap forming portions was not found when track width of front head was machined to be 25 pm and the magnetic tape (of coercive force Hc: 1400 and saturation magnetic flux density Bs: 3000 gauss) was transported through the magnetic head at relative speed of 3.45 m/sec. In addition, reproducing output voltage of the head in 5 MHz when a coil is wound by 25 turns within the groove was 250 pV (peak to peak). The results of the above measurement are shown in Specimen No. 18 in Table 4. The-Specimen Nos. 19 to 29 show materials of non-magnetic film alloy of front gap forming portion and a change in material and composition of silver brazing alloy at the rear gap forming portion. Incidentally, it was confirmed by analyzing by use of a X-ray microanalyzer no change before and after the HIP treatment in the composition of Fe-Al-Si series magnetic alloy chips having influence on the magnetic property. As a result, the Fe-Al-Si series magnetic alloy had the saturation magnetic flux density Bs of 8650 gauss, coercive force Hc of 0.03 oersted and AC initial permeability p of 61 (where for 200 vm thickness). Also no change was found in magnetic property caused by HIP process, ion of Mg, Al, or Zr constituting the non-magnetic ceramic being confirmed of no diffusion into the Fe-Al-Si series magnetic alloy by 0.01 Vm or more in depth. As seen from the above description and Table 4, the Fe-Al-Si alloy magnetic recording head of the invention forms the non-magnetic ceramic film with high accuracy onto the front gap forming surfaces (magnetic tape transportation surfaces) of pair of Fe-Al-Si series magnetic alloy cores to be coupled into the magnetic head, forms the glass film of uniform thickness overlapped onto the ceramic film and comprising PbO of 60 wt.%, Na2O of 15 wt.% and SiO2 of 25 wt.%, and the silver brazing alloy (for example, silver-copper, silver-copper-indium, silver-copper-zinc, and silver-copperpalladium series, etc.) film is formed on the rear gap forming surfaces. Thereafter, the pair of chips while keeping the glass films abutting against each other and the silver brazing films abutting with each other, are subjected to the hot isostatic pressing (HIP) process in condition of a temperature higher than the glass softening point and than a melting temperature of the silver brazing material so that the films abutting against each other are subjected to the diffused junction, thereby forming the narrow gap. In this case, since glass not added to the junction by the Hprocess is almost extruded out of the gap, a thickness of non-magnetic ceramic film specifies a width of the gap. At the rear gap forming portions, the silver brazing component is diffused by the HIP process into the Fe-Al-Si series magnetic alloy to cause strong junction between the Sendust layers. Hence, the film thickness when the non-magnetic film is formed, is controlled to facilitate restriction of the gap width and the diffused junction of silver brazing alloy at the rear gap forming surfaces by HIP process enables strong junction at the rear gap forming portions, whereby the gap formation as to the Fe-Al-Si series magnetic alloy magnetic head, which has hitherto been considered difficult, has been made easy to produce a narrow gap of high mechanical strength and high accuracy. Thus, it is possible to facilitate manufacture of Fe-Al-Si series magnetic alloy magnetic head having the gap suitable for the high density magnetic recording head. Table 4 EMI25.1 <SEP> Front <SEP> Gap <SEP> Optical <SEP> Parallelism <SEP> Gap <SEP> Reproduc <SEP> Front <SEP> and <SEP> Sendust <SEP> Condition <SEP> ingOutput <tb> Speci- <SEP> Material <SEP> Film <SEP> Material <SEP> Film <SEP> Gap <SEP> Junction <SEP> during <SEP> Voltage <SEP> in <tb> men <SEP> thickness <SEP> (weight <SEP> %) <SEP> thickness <SEP> Surface <SEP> Tape <SEP> 5 <SEP> MHz <tb> No. <SEP> (One <SEP> Side) <SEP> (One <SEP> Side) <SEP> ( m) <SEP> Condition <SEP> Transpor- <SEP> V(p-p) <tb> <SEP> tation <tb> 18 <SEP> Zirconium <SEP> Oxide <SEP> 0.15 <SEP> m <SEP> Ag(72)-Cu(28) <SEP> 0.2 <SEP> m <SEP> 0.31 <SEP> Good <SEP> Not <SEP> 250 <SEP> V <tb> <SEP> Glass <SEP> 0.15 <SEP> m <SEP> Broken <tb> 19 <SEP> Magnesium <SEP> Oxide <SEP> 0.15 <SEP> m <SEP> " <SEP> " <SEP> 0.30 <SEP> " <SEP> " <SEP> 251 <SEP> V <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 20 <SEP> Spinel <SEP> (MgO#Al2O3) <SEP> 0.15 <SEP> m <SEP> " <SEP> " <SEP> 0.30 <SEP> " <SEP> " <SEP> 252 <SEP> V <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 21 <SEP> Zirconium <SEP> Oxide <SEP> 0.15 <SEP> m <SEP> Ag(60)-Cu(27)-In(13) <SEP> " <SEP> 0.31 <SEP> " <SEP> " <SEP> 249 <SEP> V <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 22 <SEP> Magnesium <SEP> Oxide <SEP> 0.15 <SEP> m <SEP> " <SEP> " <SEP> 0.31 <SEP> " <SEP> " <SEP> 248 <SEP> V <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 23 <SEP> Spinel <SEP> 0.15 <SEP> m <SEP> " <SEP> " <SEP> 0.31 <SEP> " <SEP> " <SEP> 248 <SEP> V <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 24 <SEP> Zirconium <SEP> Oxide <SEP> 0.15 <SEP> m <SEP> Ag(60)-Cu(27)-Sn(13) <SEP> " <SEP> 0.30 <SEP> " <SEP> " <SEP> 252 <SEP> V <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 25 <SEP> Magnesium <SEP> Oxide <SEP> 0.15 <SEP> m <SEP> " <SEP> " <SEP> 0.30 <SEP> " <SEP> " <SEP> 252 <SEP> V <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 26 <SEP> Spinel <SEP> 0.15 <SEP> m <SEP> " <SEP> " <SEP> 0.30 <SEP> " <SEP> " <SEP> 252 <SEP> V <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 27 <SEP> Zirconium <SEP> Oxide <SEP> 0.15 <SEP> m <SEP> Ag(60)-Cu(27)-Pd(5) <SEP> " <SEP> 0.31 <SEP> " <SEP> " <SEP> 249 <SEP> V <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 28 <SEP> Magnesium <SEP> Oxide <SEP> 0.15 <SEP> m <SEP> " <SEP> " <SEP> 0.31 <SEP> " <SEP> " <SEP> 248 <SEP> V <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 29 <SEP> Spinel <SEP> 0.15 <SEP> m <SEP> " <SEP> " <SEP> 0.31 <SEP> " <SEP> " <SEP> 248 <SEP> V <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 30* <SEP> Quartz <SEP> (SiO2) <SEP> 0.15 <SEP> m <SEP> Ag(30)-Cu(27)- <SEP> Foil <SEP> Foor <SEP> Crack <SEP> Broken <SEP> 50 <SEP> V <tb> <SEP> Zn(21)-Cd(22)Foil <SEP> Thickness <SEP> 0.53 <tb> <SEP> 3.0 <SEP> m <tb> *Comparison Example In addition, when the non-magnetic ceramic film is defined to the zirconium oxide, magnesium oxide, and spinel films, these films each have the coefficient of thermal expansion relatively near that of Fe-Al-Si series magnetic alloy (as ZrO2: 10 x 10 6/or, MgO: 12 x 10 6/oC, and MgO.A1203: 10 x 10 6/oC and hardness is larger, whereby the gap is difficult to cause a break during the magnetic tape transportation. When the composition of silver-copper series alloy is defined to silver of 72 wt.% and copper of 28 wt.%; that of silver-copper-indium series alloy to silver of 60 wt.%, copper of 27 wt.% and indium of 13 wt.%; that of silver-copper-zinc series alloy, to silver of 60 wt.%, coppertof 7 wt.%, and zinc of 13 wt.%, and that of silver-copper-palladium series alloy, to silver of 68 wt.%, copper of 27 wt.%, and palladium of 5 wt.%; the above 2nd and 3rd alloys each adopt the lowest liquid phase appearance temperature, whereby the mutual diffusion with the Fe-Al-Si alloy is each to carry out and the strongest coupling is obtained. Hence, even when the above compositions each shift somewhat, fair strength may of course be obtainable. When the composition of glass is defined to PbO of 60 wt.%, Na2O of 15 wt.% and SiO2 of 25 wt.%, since the composition coincides in a coefficient of thermal expansion with the Fe-Al-Si alloy, heat distortion is shut out and intensive sticking strength is obtained. Although, glass was defined in the PbO-Na2O-SiO2 series, any glass coincident in the coefficient of thermal expansion with the Fe-Al-Si alloy, even other than the above composition, was confirmed to have a considerably intensive adhesive strength. Embodiment 4 Next, explanation will be given on a manufacturing method for the magnetic head of alloy by use of ion implantation. Referring to Fig. 2-(a), a pair of boat-like-shaped cores 5 and 6 each comprising a rod-like block of Fe-Al-Si series magnetic alloy of 3 mm in width, 2 mm in height and 20 mm in length, and providing a groove of 0.35 mm in width formed by a diamond grindstone and for containing a coil, are prepared. The cores 5 and 6 are mirror-polished to the maximum surface roughness Rmax. of 0.01 pm at the front gap forming surfaces and the rear gap forming surfaces. Next, a zirconium oxide (ZrO2) film 10, as shown in Fig. 2-(c), was formed on each front gap forming surface by use of the sputtering and a glass film 11 was formed on each film 10 by use of the same. In this case, the rear gap forming surfaces were masked to be free from ZrO2 or glass, the formed zirconium oxide film 10 being 0.15 pm in uniform thickness, the glass film 11 being 0.05 vm in uniform thickness and lead series glass in composition of SiO2 of 20 wt.%, PbO of 65 wt.% and Na2O of 15 wt.% and having the softening point at a temperature of about 5000C. Next, a silver brazing film 12 is formed on each rear gap forming surface by the sputtering so as to be 0.16 pm in uniform thickness and composed of silver of 72 wt.% and copper of 28 wt.%. Then, the glass film 11 on each front gap forming surface and the silver brazing film 12 on each rear gap forming surface are implanted with nitrogen ion at a rate of 1013 ion/cm2 at accelerating voltage of 10 kV. The pair of cores 5 and 6, after ion implantation into the films on the front and rear gap forming surfaces 8 and 9, are opposite to each other and subjected to the heat treatment for 30 minutes, at a temperature of 8000C and in vacuum condition so that diffused junction between the films at the gap forming portions couples the cores with each other. Such coupled core blocks were cut in required thickness and subjected to mechanical polishing, thereby obtaining a thinleaf-like headpiece of 150 pm in thickness. The front gap forming surfaces 8 and rear gap forming surfaces 9 are polished and measured of width of the gap by use of an optical microscope, resulting in that each gap is 0.31 Vm in width and the gap surfaces are parallel to each other. In order to examine the mechanical strength of the formed gap forming portion, both the cores 5 and 6 at both sides of the gap were subjected to the external force of 10 kg/rnrn2 for the tensile test, in which the junction surfaces and front gap forming surfaces were not peeled. Also, a break or an escape of gap forming portion was not found when the head was machined to be 25 pm in track-width and the magnetic tape (of a magnetic tape having the coercive force Hc of 1400 oersted and saturation magnetic flux density Bs of 3000 gauss) was transported through the head at relative speed of 5.80 m/sec. Incidentally, reproducing output voltage of the head in 5 MHz, when a coil was wound in 25 turns within the groove, was 500 pV. The results of the above measurement will be shown in Specimen No. 31 in Table 5. Then, the head piece is produced by the same method as the former embodiment, which is changed in the non-magnetic film at the front gap forming surfaces, silver brazing film at the rear gap forming surfaces, acceleration voltage for ion, and an amount of ion implantation, so that the same inspection as the above was carried to obtain the results shown in Specimen Nos. 32 to 39 in Table 5. In addition, in the above embodiment, it has been confirmed by analysis using a X-ray microanalyzer that the composition of Fe-Al-Si series magnetic alloy having influence on the magnetic property was not changed before and after the ion implantation or heat treatment. As a result, the saturation magnetic flux density Bs was 9010 gauss and coercive force Hc, 0.03 oersted and any change in the magnetic property was not caused by ion implantation. In this case, when the accelerating voltage for ion implantation is 10 kV or less, since the kinetic energy is small and ions of Zr, O, Si, etc. of the component elements of the non-magnetic ceramic film are difficult to diffuse into the Fe-Al-Si series magnetic alloy, thereby lowering junction strength between the Fe-Al-Si series magnetic alloy and the non-magnetic ceramic film. When the voltage becomes 200 kV or more, the kinetic energy of ion becomes too large and Zr or Si enters excessively into the Fe-Al-Si alloy to spread the magnetic gap, thereby causing deterioration of reproducing output. On the other hand, when the rate of ion implantation is 1013 ion/cm2 or less, since an amount of diffusion of Zr, O or Si, of the component element of the non-magnetic ceramic film into the Fe-Al-Si series magnetic alloy is small, the junction strength between the Fe-Al-Si and the nonmagnetic ceramic film lowers. When the rate of ion implantation is 1017 ion/cm2 or more, ion of Zr, O or Si is implanted too much, whereby the magnetic property of the Fe-Al-Si alloy lowers and the coercive force Hc increase to lower the reproducing output. Also, the comparison examples of changing the amount of ion implantation and the accelerating voltage are shown in Specimen Nos. 40 to 43 and the result of measurement as to the head piece having the gap produced by the conventional thermal diffusion method is shown in Specimen No. 44 in Table 5. Table 5 EMI32.1 <SEP> Front <SEP> Gap <SEP> Rear <SEP> Gap <SEP> Ion <SEP> Implantation <SEP> Condition <tb> <SEP> of <SEP> Gap <SEP> Reproduc Speci- <SEP> Material <SEP> Film <SEP> Material <SEP> Film <SEP> Kind <SEP> Accelerat- <SEP> Implanta- <SEP> Size <SEP> during <SEP> ing <SEP> Output <tb> men <SEP> thickness <SEP> (wt <SEP> %) <SEP> Thickness <SEP> of <SEP> ing <SEP> tion <SEP> of <SEP> Tape <SEP> Voltage <tb> No. <SEP> (One <SEP> Side) <SEP> Ion <SEP> Voltage <SEP> Amount <SEP> Front <SEP> Transpor- <SEP> in <SEP> 5 <SEP> MHz <tb> <SEP> (kV) <SEP> (ion/cmê) <SEP> Gap <SEP> tation <SEP> V(p-p) <tb> 31 <SEP> ZrO2 <SEP> 0.15 <SEP> m <SEP> Ag(72) <SEP> 0.16 <SEP> m <SEP> Nitrogen <SEP> 10 <SEP> 1013 <SEP> 0.31 <SEP> No <SEP> Break <SEP> 500 <tb> <SEP> Glass <SEP> 0.05 <SEP> m <SEP> -Cu(28) <SEP> and <SEP> Escape <tb> 32 <SEP> " <SEP> " <SEP> " <SEP> " <SEP> Argon <SEP> 50 <SEP> 1014 <SEP> 0.30 <SEP> " <SEP> 510 <tb> 33 <SEP> " <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 100 <SEP> 1015 <SEP> 0.31 <SEP> " <SEP> 520 <tb> 34 <SEP> " <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 200 <SEP> 1017 <SEP> 0.32 <SEP> " <SEP> 490 <tb> 35 <SEP> SiO2 <SEP> 0.15 <SEP> m <SEP> " <SEP> " <SEP> Nitrogen <SEP> 100 <SEP> 1016 <SEP> 0.31 <SEP> " <SEP> 510 <tb> <SEP> Glass <SEP> 0.05 <SEP> m <SEP> and <SEP> Escape <tb> 36 <SEP> " <SEP> " <SEP> " <SEP> " <SEP> Argon <SEP> " <SEP> " <SEP> 0.31 <SEP> " <SEP> 520 <tb> 37 <SEP> " <SEP> " <SEP> Ag(60)-Cu <SEP> " <SEP> " <SEP> " <SEP> " <SEP> " <SEP> " <SEP> " <tb> <SEP> (27)-In(13) <tb> 38 <SEP> " <SEP> " <SEP> " <SEP> " <SEP> Nitrogen <SEP> " <SEP> " <SEP> 0.30 <SEP> " <SEP> 510 <tb> 39 <SEP> ZrO2 <SEP> 0.15 <SEP> m <SEP> " <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 0.31 <SEP> " <SEP> 500 <tb> <SEP> Glass <SEP> 0.05 <SEP> m <tb> 40* <SEP> " <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 8 <SEP> " <SEP> 0.32 <SEP> Broken <SEP> 450 <tb> 41* <SEP> " <SEP> " <SEP> " <SEP> " <SEP> Argon <SEP> 210 <SEP> " <SEP> 0.35 <SEP> No <SEP> Break <SEP> 460 <tb> <SEP> and <SEP> Escape <tb> 42* <SEP> " <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 100 <SEP> 1012 <SEP> 0.32 <SEP> " <SEP> 390 <tb> 43* <SEP> " <SEP> " <SEP> " <SEP> " <SEP> " <SEP> 100 <SEP> 1018 <SEP> 0.39 <SEP> " <SEP> 350 <tb> 44* <SEP> " <SEP> " <SEP> " <SEP> " <SEP> Conven- <SEP> No <SEP> ion <SEP> 0.33 <SEP> Broken <SEP> 300 <tb> <SEP> tional <SEP> implantation <SEP> and <SEP> Escaped <tb> <SEP> Example <SEP> Heat <SEP> Treat <SEP> ment <SEP> only <tb> * Comparison Example In addition, zirconium oxide (ZrO2) and silicon oxide (SiO2) are suitable for the non-magnetic ceramic film because larger hardness of them presents the gap from being broken during the magnetic tape transportation. The silver brazing alloy in composition of silver of 72 wt.% and copper of 28 wt.%, and silver of 60 wt.%, copper of 27 wt.% and indium of 13 wt.%, whose liquid phase appearance temperatures are relatively high to make diffult the mutual diffusion between the silver brazing alloy and the Fe-Al-Si series magnetic alloy. Hence, a break in the alloy during the junction is hard to occur, thereby obtaining the head having at highly accurate gap (the junction strength is ensured by ion implantation). Furthermore, the composition of glass of PbO of 60 wt.%, Na2O 15 wt.% and SiO2 25 wt.%, is proper because this composition coincide in the coefficient of thermal expansion with the Fe-Al-Si series magnetic alloy, whereby thermal distortion is hard to enter and intensive adhesive strength is obtained. In addition, any glass, when coincident in the coefficient of thermal expansion with the Fe-Al-Si series magnetic alloy, was confirmed to have a considerably intensive adhesive strength even as to the composition other than the above. As seen from the above description, the magnetic head of the invention comprising the pair of opposite cores of Fe-Al-Si series magnetic alloy forms at the front gap forming surface of the core the non-magnetic ceramic films with high accuracy, forms onto the ceramic films the glass films of uniform thickness and composed of PbO of 60 wt.%, Na2O of 15 wt.% and SiO2 of 25 wt.%, forms the silver-copper series silver-copper-indium serves films at the rear gap forming surfaces, implants nitrogen ion or argon ion into each glass film surface and silver brazing film surface, and thereafter allows the cores to abut against each other so that the film surfaces contact with each other, so that the cores, while being held, are subjected to heat treatment at a temperature higher than the glass softening point and the melting temperature of silver brazing alloy and the films opposite to each other form the narrow gap through diffused junction with each other. Furthermore, the ion implantation largely improves junction strength between the Fe-Al-Si series magnetic alloy and ZrO2, or same and SiO2 of weak adhesive strength is normal, and between the Fe-Al-Si alloy and the silver brazing alloy, thereby enabling materialization of the Fe-Al-Si series magnetic alloy magnetic head suitable for the high density magnetic recording.

Claims: CLAIMS: 1. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head having narrow gaps of a laterally joining type through gap formating materials and formed of an iron (Fe) Aluminum (Al)-Silicon (Si) alloy core material and having a front gap including a magnetic gap at a side of the surface on which a tape is transported, and having a rear gap aiming at junction and provided width reversely to said tape transportation surface. 2. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 1, characterized in that said front gap is formed by a ceramic layer and a glass layer. 3. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 2, characterized in that said ceramic layer for said front gap comprises one of zirconium oxide (ZrO2), magnesium oxide (MgO) and spinel (MgO A1203). 4. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 2, characterized in that glass used as said glass films contains more than 10 per cent quartz (SiO2). 5. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 1, characterized in that said rear gap is formed by a ceramic layer and a glass layer. 6. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 5, characterized in that said ceramic layer for said rear gap comprises one of zirconium oxide (ZrO2), magnesium oxide (MgO) and spinel (MgO A1203). 7. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 5, characterized in that glass used as said glass films contains more than 10 per cent quartz (SiO2). 8. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 1, characterized in that said rear gap is formed by one of alloys of silver-copper (Ag-Cu), silver-copper-indium (Ag-Cu-In), silver-copper-tin (Ag-Cu-Sn) and silver-copper-palladium (Ag-Cu-Pd). 9. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 8, characterized in that said silver-copper (Ag-Cu) alloy for said rear gap is composed of Ag of 72 wt.% and Cu of 28 wt.%. 10. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 8, characterized in that said Ag-Cu series alloy is composed of silver (Ag) of 60 wt.%, copper (Cu) of 27 wt.% and indium (In) of 13 wt.%. 11. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 8, characterized in that said silver-copper (Ag-Cu) alloy for said rear gap is composed of silver (Ag) of 60 wt.%, copper (Cu) of 27 wt.% and tin (Sn) of 13 wt.%. 12. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 8, characterized in that said silver-copper (Ag-Cu) series alloy for said rear gap is composed of silver (Ag) of 68 wt.%, copper (Cu) of 27 wt.% and palladium (Pd) of 5 wt.%. 13. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 4, characterized in that said glass layer for said front gap comprises an alloy of lead oxide-sodium oxide-silicon oxide (PbO-Na2O-SiO2). 14. An iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy head according to claim 13, characterized in that said lead oxide-sodium oxide-silicon oxide (PbO-Na2 0- SiO2) series glass for said front gap is composed of SiO2 of 20 to 80 wt.%. 15. A manufacturing method for an iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy magnetic head of a laterally abutting type and comprising an non-aluminum-silicon alloy core material and having a front gap with a magnetic gap at a side of the surface on which a magnetic tape is transported and a rear gap aiming at junction and positioned widthwise reversely to said tape transportation surface, said method characterized in that a magnetic gap is formed by providing non-magnetic ceramic films on gap forming surfaces at a pair of iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy core pieces respectively and glass films on said ceramic films respectively, so that thereafter said pair of the magnetic alloy core pieces are subjected to the pressurization and heat treatment in condition of keeping said glass films abutting against each other and at a temperature higher than the softening point of said glass in use and said abutting films are applied with diffused junction. 16. A manufacturing method for an iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy magnetic head of a laterally abutting type and comprising an iron-aluminum-silicon series magnetic core material and having a front gap as a magnetic gap at a side of the surface on which a magnetic tape is transported and a rear gap aiming at junction and provided widthwise reversely to said tape transportation surface, said method characterized in that a non-magnetic ceramic film is formed at the front gap forming surface of each of said lateral iron-aluminum-silicon alloy cores by means of sputtering, glass films are formed onto said ceramic films respectively, silver-copper series alloy films are formed at said rear gap surfaces at said lateral iron-aluminumsilicon alloy cores, and thereafter said lateral ironaluminum-silicon series magnetic cores are subjected to heat treatment in condition of abutting at the same kinds of said gap forming surfaces against each other and in a non-oxidizing atmosphere under one atmospheric pressure and at a temperature exceeding that of appearance of liquid phase of said silver-copper-indium series alloy, so that said lateral core blocks are subjected to diffused junction to thereby form said magnetic gap. 17. A manufacturing method for an iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy magnetic head of a laterally abutting type and comprising an iron-aluminum-silicon series magnetic core material and having a front gap as a magnetic gap at a side of the surface on which a magnetic tape is transported and a rear gap aiming at junction and provided widthwise reversely to said tape transportation surfaces, said method characterized in that a non-magnetic ceramic film is formed at the front gap forming surface of each of said lateral iron-aluminum-silicon alloy cores by means of sputtering, glass films are formed onto said ceramic films respectively, silver-copper series alloy films are formed at said rear gap surfaces at said lateral iron-aluminumsilicon alloy cores, and thereafter said lateral cores are subjected to hot isostatic pressing (HIP) in condition of abutting at the same kinds of gap forming surfaces against each other and at a temperature higher than the softening point of glass and then a liquid phase appearance temperature of said silver-copper series alloy, so that lateral core blocks are subjected to diffused junction to thereby form said magnetic gap. 18. A manufacturing method for an iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy magnetic head of a laterally abutting type and comprising cores of iron-aluminum-silicon magnetic alloy material and having a front gap with a magnetic gap at a side of the surface on which a magnetic tape is transported and a rear gap aiming at junction of said head and provided widthwise reversely to said tape transportation surface, said method characterized in that non-magnetic ceramic films are formed at said gap forming surfaces (front gap portion) of said cores respectively, glass films are formed on said ceramic films respectively, silver brazing films comprising silver-copper series alloys are formed at said junction surfaces (rear gap portion) respectively, thereafter ion comprising one of nitrogen and argon is implanted into said gap forming surfaces and junction surfaces, a pair of said cores abut against each other so that said gap forming surfaces and junction surfaces are opposite to each other, said pair or cores are subjected to heat treatment in condition of temperature higher than the softening point of glass and than a temperature of liquid phase appearance of said silver brazing material and then are fixed, thereby forming said magnetic gap. 19. A manufacturing method for an iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy magnetic head according to claim 18, characterized in that accelerating voltage for ion when said nitrogen ion is implanted into said films is 10 to 200 kV and an amount of ion implantation is 1013 to 1017 ion/cm2. 20. A manufacturing method for an iron-aluminum-silicon (Fe-Al-Si) series magnetic alloy magnetic head according to claim 18, characterized in that accelerating voltage for ion when said argon ion is implanted into said films is 15 to 200 kV and an amount of ion implantation is 1013 to 1017 ion/cm2.

Inventors: AOKI, MASAKI, HIROTA, HOZUMI, OKINAKA, HIDEYUKI, SAKAI, MASAYUKI, TORII, HIDEO
Applicants: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Application year: 1984
Main classification: G11B5
IPC codes: G11B5