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Physical Measurement LaboratoryNanoscale Device Characterization Division

## Nanoscale Processes and Measurements Group

# Awards

### 2020 - Bronze Medal Award---Arvind Balijepalli, Curt Richter

### 2017 - Bronze Medal Award---Emily G. Bittle, David J. Gundlach

### 2018 Joseph F. Keithley Award for Advances in Measurement Science - Joseph A. Stroscio

### 2017 Grand Heinrich Rohrer Medal - Joseph A. Stroscio

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