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 AWARDS

Sir Charles Oatley award - Michael Postek
    
  Sir Charles Oatley Award
Scanning Microscopy 2013 -  a part of the SPIE Defense Security + Sensing 2013
Winner's Name
                                Michael Postek

Awarded
                                April 30, 2013

Awarding Organization
      
                          SPIEIn recognition of his many years of dedication to and work in the field of scanning electron microscopy including research, instruction, publications, and metrology, industrial and nanomanufacturing applications.
  Physics
      
            Sir Charles Oatley Award
Scanning Microscopy 2013 -  a part of the SPIE Defense Security + Sensing 2013
Winner's Name
                                Michael Postek

Awarded
                                April 30, 2013

Awarding Organization
      
                          SPIE
                          Organizations
      
      NIST HeadquartersLaboratory ProgramsPhysical Measurement LaboratoryNanoscale Device Characterization DivisionNanoscale Device Characterization Division - HQ

    
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