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 AWARDS

2014 Woodington Award - James Olthoff
    
  Woodington Award For Professionalism in Metrology
This award, sponsored as a memorial to the late Andrew J. Woodington, is the measurement community’s recognition of an individual who represents the highest level of professionalism, and dedication to the Metrology profession.
Winner's Name
                                James Olthoff

Awarded
                                March 14, 2014

Awarding Organization
      
                          Measurement Science ConferenceNominees for the Woodington Award are to have exhibited noteworthy professional achievement in the Metrology field. Nominees are to have warranted national or international recognition and acceptance as Metrology professionals who consistently perform and conduct themselves with dedication, competence, and commitment, and also inspire and enhance the professional status of others working in Metrology. The areas of achievement and expertise to be demonstrated by the nominees need not be restricted to technical, as managerial and administrative contributions are equally important. All in all, the winner of the Woodington Award must represent the highest level of professionalism and dedication to the Metrology community.
  Metrology
      
            Woodington Award For Professionalism in Metrology
This award, sponsored as a memorial to the late Andrew J. Woodington, is the measurement community’s recognition of an individual who represents the highest level of professionalism, and dedication to the Metrology profession.
Winner's Name
                                James Olthoff

Awarded
                                March 14, 2014

Awarding Organization
      
                          Measurement Science Conference
                          Organizations
      
      NIST HeadquartersLaboratory ProgramsPhysical Measurement Laboratory

    
    Created September 11, 2017
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