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https://www.nist.gov/laboratories/tools-instruments/topic/248971

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MaterialsMaterials characterization

## Composition & structure

# Tools and Instruments

### Analytical Electron Microscope

### Atom Probe Tomography (LEAP 4000X Si/HR – Local Electrode Atom Probe)

### Differential Scanning Calorimeter

### Focused Ion Beam

### Fourier Transform Infrared Spectroscopy

### Hysitron PI-85 Picoindentor

### Material Analysis Using Neutron Depth Profiling

### Polarized Resonant Soft X-ray Scattering (P-RSoXS)

### Positron Annihilation Lifetime Spectrometer

### Rubber Process Analyzer

### Synchrotron X-ray Diffraction (XRD)

### TESCAN MIRA3 for automated electron microscopy

### Thermogravimetric Analyzer

### Vector Potential Photoelectron Microscope (VPPEM)

### X-ray Absorption Fine Structure (XAFS)

### X-ray Photoelectron Spectroscopy

### HEADQUARTERS

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