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https://www.nist.gov/laboratories/tools-instruments/topic/249106

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Metrology

## Optical / photometry / laser metrology

# Tools and Instruments

### Advanced infrared radiometry and imaging (AIRI)

### Aluminum Oxide EUV Photodetector Transfer Standard

### Aperture area measurement facility

### Beamline 10: Quantitative Hyperspectral Infrared Microscopy

### Beamline 1: Degradation of EUV filters and mirrors

### Beamline 2: Absolute Source-Based Radiometry

### Beamline 3: Extended Range Monochromator for Ultraviolet and Extreme-Ultraviolet Optical Properties and Calibrations

### Beamline 4: Ultraviolet Optical Properties and Calibrations

### Beamline 5: New electron beam imaging system

### Beamline 7:  EUV reflectometry

### Beamline 8: Surface chemistry & durability of EUV optics

### Bidirectional optical scattering facility

### BMDO transfer radiometer (BXR)

### Center for High Accuracy Retroreflection Measurements (CHARM)

### Color and appearance metrology facility

### Complete hemispherical infrared laser-based reflectometer (CHILR)

### Continuous-wave terahertz spectrometer

### Facility for spectroradiometric calibrations (FASCAL)

### Facility for spectroradiometric calibrations (FASCAL 2)

### Fourier transform infrared spectrophotometry (FTIS) facility

### Infrared reference integrating sphere (IRIS)

### Low background infrared (LBIR) facility

### Lunar spectro-radiometer

### Missile defense transfer radiometer (MDXR)

### NIST Gonio-spectroradiometer

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