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# Statistical Metrology Short Courses

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This page is not currently being maintained and is for archival information only.

Please see our most recent work at our Statistical Engineering Division home page, where **ITL’s Purpose IS Cultivating Trust in IT and Metrology**

Staff members of the Statistical Engineering Division regularly offer short courses on uncertainty analysis, design of experiments, and other topics in statistical metrology at NIST, at conferences open to the public, and at other government agencies. Prospective attendees of short courses at NIST include NIST scientists, engineers and technicians, industrial metrologists, staff members of other national laboratories, and metrologists from other national metrology institutes. The courses consist of lecture, discussion, and hands-on exercises designed to give users practical experience with the featured statistical methods and software tools.

Currently scheduled short courses include:

**Hands-On Bayesian Data Analysis Using WinBUGS**, November 1, 2010 in Austin, TX

This short course is designed to provide statisticians, scientists, or engineers with the tools necessary to begin to use Bayesian inference in applied problems. Participants in the course will learn the basics of Bayesian modeling and inference using Markov chain Monte Carlo simulation with the open-source software package WinBUGS. This short course is being given as part of the 2010 ISMI Manufacturing Week.

**Fundamentals of Uncertainty Analysis**, March 29-31, 2011 in Gaithersburg, MD

The course covers many aspects of the propagation of uncertainty using the methods outlined in the JCGM *Guide to the Expression of Uncertainty in Measurement*. Exercises and hands-on applications will use functions for uncertainty analysis from the free software package, metRology, written for the open-source R statistical computing environment. The functions will be accessed via an Excel graphical user interface that is available as a free Excel add-in.

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## Contacts

                -  William F Guthrie  william.guthrie@nist.gov      (301) 975-2854   

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