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https://www.nist.gov/laboratories/tools-instruments/nanofab-tool-first-ten-angstroms-fta125-contact-angle-goniometer

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TOOLS & INSTRUMENTS

# NanoFab Tool:  First Ten Angstroms FTA125 Contact Angle Goniometer

First Ten Angstroms FTA125 Contact Angle Goniometer

The First Ten Angstroms FTA125 is a general purpose goniometer that can measure the contact angle and surface tension of liquid droplets on a substrate's surface. The FTA125 provides automatic video based measurements on substrates ranging from 150 mm diameter wafers down to small pieces.

## Specifications/Capabilities

                    - Droplet volumes: 3 μL to 15 μL.
                    - Contact angles measured: 0° to 180°.
                    - Surface tension measurements using pendant drop shape analysis.

## Usage Information

### Supported Sample Sizes

                      - Maximum wafer diameter: 150 mm (6 in).
                      - Small pieces supported: Yes.
                      - Maximum thickness: 2 mm.

## Typical Applications

                    - Measurement of the contact angle between a liquid droplet and a substrate surface.
                    - Surface tension calculation.
                    - Liquid droplet shape analysis.

## Back to the NanoFab Equipment List

NanotechnologyNanofabrication / manufacturing

## Organizations

                          - NIST Headquarters
                            - Laboratory Programs
                              - Physical Measurement Laboratory
                                - Physical Measurement Laboratory Office
                                  - Center for Nanoscale Science and Technology

## Details

## Hours of Operation

Cleanroom hours

## Tool Reservation Rules

                    - Minimum Reservation Time: 30 minutes.
                    - Maximum Reservation Time: 4 hours.
                    - Adjacent Reservations Permitted: Yes.
                    - Cancelation Policy: Reservations must be canceled at least 12 hours before the scheduled start time.

## Contact

### Primary Engineer

                    -  Lei Chen  lei.chen@nist.gov      (301) 975-2908   

### Backup Engineer

                    -  Gerard Henein  gerard.henein@nist.gov      (301) 975-5645   

### General Contact

                    -      NanoFab Metrology    nanofab_metrology@nist.gov      (301) 975-8672          100 Bureau Drive, Stop 6201   Gaithersburg,  MD 20899-6201   

### HEADQUARTERS

301-975-2000

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