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TOOLS & INSTRUMENTS

# X-Ray Reflectometer

The NCNR x-ray diffractometer is configured to allow both θ/2θ diffraction and reflectometry. Typically Cu radiation is used with minimum resolution of Δλ=0.004Å and Δθ=0.0003 radians or ΔQ=0.0025Å-1. Reflectivities as low as ~10-8 have been measured. There is direct computer control using the standard ICP program. The five motions that are controlled are θ, 2θ, sample translation along an axis located 90°+θ from the incident beam, sample tilt about an axis perpendicular to the translation (all in the scattering plane), and an automated attenuator changer.

## Usage Information

### Access Information

**Use of the instrument is restricted to NCNR staff**, however, outside users can gain access to the x-ray reflectometer through their instrument contact or NCNR staff collaborator. This x-ray instrument is self-scheduled, via a sign up calendar located at the instrument.

## Organizations

                          - NIST Headquarters
                            - Laboratory Programs
                              - NIST Center for Neutron Research

## Details

## Contact

                    -  Sushil K Satija  sushil.satija@nist.gov      (301) 975-5250   
                    -  Yamali Hernandez  yamali.hernandez@nist.gov      (301) 975-5295   

### HEADQUARTERS

301-975-2000

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