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 Physical Measurement Laboratory /                  Applied Physics Division
      Quantitative Nanostructure Characterization Group


      
      Tools and Instruments
  
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          Displaying 1 - 6 of 6
              Aberration-Corrected Transmission Electron Microscope (TEM)Probe corrected 200kV analytic electron microscope Resolves single atoms Chemical analytic capability (EELS, EDS) Highest resolution in electron optics (<0.1 nm
  Dual Beam Focused Ion Beam / Scanning Electron Microscope (FIB/SEM)Dual beam focused ion beam/scanning electron microscope (FESEM). Focused ion beam using Ga atoms allows the patterning of objects at ~10 nm level (milling and
  Local Electrode Atom Probe Tomography (LEAP)Field evaporates (with a voltage and laser pulse) a sharp tip-shaped specimen. Collects the ionization products in a position-sensitive, time-of-flight mass
  Molecular Beam Epitaxy (MBE) FacilityThe Applied Physics Division utilizes a fully automated, dual-chamber molecular beam epitaxy (MBE) system for the growth of advanced, compound semiconductor
  Precision Imaging FacilityThe Precision Imaging Facility (PIF) is a cooperative research facility at the National Institute of Standards and Technology (NIST) dedicated to the
  Sample Preparation and Metrology ToolsRead about our sample preparation and metrology tools.
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