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# Teachers

Teachers being shown how to examine common objects with a table-top scanning electron microscope as part of NIST's STEM (science, technology, engineering and math) education outreach at the recent Scanning Microscopies 2012 conference in Baltimore, Md. Based on an idea by Robert Gordon of Hitachi HTA (standing man pointing to computer), this hands-on experience was included in the session, Microscopy for STEM Educators, organized by NIST researchers Michael Postek and Mary Satterfield to encourage educators to use microscopy in the classroom to foster student interest and excitement in STEM areas.

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May 7, 2012

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