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# Projects/Programs

### Atom Probe Tomography: Nanostructured Semiconductor Materials, Interfaces, and Devices

### Atom-based Silicon Quantum Electronics

### Atomic Spectroscopy Data Center

### Atomic Standard for Pressure

### Atomic-force microscopy

### Basic Metrology: Advancing Triple-to-Double Coincidence Ratio Liquid Scintillation Counting

### Basic Metrology: Alpha-Gamma Counting for High Accuracy Neutron Fluence Measurement

### Basic Metrology: Applications of Diagnostic X-ray Spectrometers

### Basic Metrology (Archive): Blind Measurement Comparisons of the USA and UK Pb-210 National Standards

### Basic Metrology (Archive): New Standardization of Ra-228

### Basic Metrology (Archive): New Statistical Analysis Tools

### Basic Metrology (Archive): Primary Radioactivity Standardization of Ni-63

### Basic Metrology (Archive): Radon Binding to Water-Soluble Cryptophane

### Basic Metrology (Archive): Standardization of Am-243

### Basic Metrology: Comparison of NIST-1 and NIST-3 Standard Ampoules

### Basic Metrology: Design and Construction of a New Cs-137 Gamma-ray Calibration Facility

### Basic Metrology: Dose/Dose-Rate Effects in Alanine Dosimetry

### Basic Metrology: Fit-for-purpose liquid scintillators

### Basic Metrology: High-Dose Dosimetry Uncertainty Tables

### Basic Metrology: High-Resolution X-Ray Spectroscopy

### Basic Metrology: Neutron Cross Section Standards

### Basic Metrology: NIST-3 Standard Ampoules and Automatic Tip Sealing

### Basic Metrology: Primary Standards for Radionuclides

### Basic Metrology: Recent Primary SRM Standardizations

### Basic Metrology: Remote Sensing Methods for Imaging Dose to Water

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