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Electric force microscopy; AFM; EFM
    
  Electric force microscopy can be used to detail structures well below the surface. Left, AFM height image showing the surface of a polyimide/carbon nanotube composite. Right, EFM image revealing the curved lines of subsurface nanotubes.
*BFRL

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June 23, 2010

Reference Number
                                10BFRL003

Credit
                                Credit: NIST

Image Type
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