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# schematics-and-diffraction-patterns.png

## Appears In

                        - Aberration-corrected scanning transmission electron microscopy

Figure 1. Schematics and diffraction patterns (DP). The asymmetric DP produced in the image plane with the beam focused in the object plane and the sample shifted above the object plane corresponds to the true orientation of the DP relative to the sample image. The 180 ° between this DP and that taken in diffraction mode in the diffraction plane is the instrument introduced rotation angle. If not accounted for any CBED polarity determination will be incorrect.

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