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# Chemical Analysis;Maximum Pixel Software

X-ray data collected with a scanning electron microscope from a nickel-aluminum alloy. Pure aluminum is represented by blue, pure nickel by red and nickel-aluminum alloys by colors in between. The green dot in the upper left shows a contaminant particle of chromium identified with the NIST software that occupied only one pixel of the microscope's scanning area. The sample measures about 160 micrometers across. 

*CSTL, scanning electron microscopy, microanalysis, pure metals, semiconductors, SEM

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December 7, 2004

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