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https://www.nist.gov/image/integrated-circuit-illustration

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# integrated circuit illustration

## Appears In

                        - NIST Scientists Develop Novel CT Scan Device for Integrated Circuits

Top: Incoming electrons are converted by the target material into x-ray photons. A photon passing through the integrated circuit has its energy modified. The photon is then absorbed by a transition edge sensor, heating it slightly. This change in temperature provides a measurement of the photon energy, which is converted into a voxel (pixel in 3D space). Bottom: The NIST detector uses an array of many transition edge sensors, producing a 3D image of the integrated circuit.

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