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# Gheorghe Stan

## Appears In

                        - Gheorghe Stan

Left: CR-AFM measurements on bilayer structures. Center: Probing the elastic modulus of AlN nanotubes by CR-AFM. Right: Combined mechanical (Intermittent Contact Resonance AFM) and chemical (AFM Infrared) measurements on high-aspect ratio organosilicate patterns for Cu/low-k dielectric interconnects.

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