Specifications Evolution 201 UV-Visible Evolution 220 UV-Visible 

Spectrophotometer Spectrophotometer

Optical Design Double-beam with sample and Double-beam with sample and 

reference cuvette positions; reference cuvette positions;

Czerny-Turner Monochromator Application Focused Beam Geometry;

Czerny-Turner Monochromator

Spectral Bandwidth(s) 1.0 nm Variable: 1 nm; 2 nm; 

AFBG Microcell optimized; 

AFBG Fiber optic optimized; 

AFBG Materials optimized

Light Source Xenon flash lamp, 3-year warranty (5 years typical lifetime)

Detector Dual Silicon Photodiodes

Scan Ordinate Modes Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, 

log (1/R), log (Abs), Abs*Factor, Intensity

Resolution >1.6 (peak-to-valley ratio; toluene in hexane)

Wavelength 

Range 190–1100 nm

Accuracy ±0.8 nm (full range 190 to 1100 nm)

±0.5 nm (546.11 nm mercury line)

Repeatability ≤0.1 nm (546.11 nm mercury line, SD of 10 measurements)

Scanning Speed <1 to 6000 nm/min; variable

Data Intervals 10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm

Photometric 

Range >3.5 A

Display Range -0.3 to 4.0 A

Accuracy – Instrument 0.5 A: ±0.004 A

1A: ±0.006 A

2A: ±0.010 A

Measured at 440 nm using neutral density filters traceable to NIST/NPL

Accuracy – Sealed Solutions ±0.010 A (60 mg/L K2Cr2O7)

(EP/BP/TGA)

Noise 0A: ≤0.00015 A

1A: ≤0.00050 A

2A: ≤0.00080 A

260 nm, 1.0 nm SBW, RMS

Drift (Stability) <0.0005 A/hr

500 nm, 1.0 nm SBW, 1 hour warm-up

Stray Light KCl, 198 nm: ≤1% T

NaI, 220 nm: ≤0.05% T

NaNO2,340 nm: <0.05% T

Baseline Flatness ±0.0010 A

200–800 nm, 1.0 nm SBW, smoothing

Keypad Sealed Membrane

Local Control Option 

Display Touchscreen LCD panel; 800 × 480; 17.8 cm (7 in) diagonal

Operating System Microsoft Windows XP embedded

Dimensions 62.2 cm L × 48.6 cm W × 27.9 cm H (24" L × 19" W × 11" H)

Weight 14.4 kg (32 lb)

Electrical Supply 100–240 V, 50–60 Hz, selected automatically

150 W maximum

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