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# Electronics; Semiconductors; Strained Silicon Devices

X-ray topographs of three different strata of a strained-silicon wafer show close correspondence in defects from the base silicon layer (top) through the final strained-silicon layer (bottom). Color has been added for contrast, one particular defect area is highlighted.

 MSEL, X-ray tomography, semiconductor defects, lattice, monochromatic X-rays

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July 6, 2006

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