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# Atom Ruler with Planes of Silicon

## Appears In

                        - NIST Unveils Atom-based Standards for Measuring Chip Features Under 50 Nanometers

The large purple rectangle in this colorized image is a chip feature about 40 by 150 nanometers in size, surrounded by encapsulating material. The magnified section shows the planes of silicon atoms used to calibrate feature measurements.

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March 8, 2005

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