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https://www.nist.gov/pml/nanoscale-device-characterization-division/popular-links/hall-effect/hall-effect-measurements-2

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Physical Measurement Laboratory

## Nanoscale Device Characterization Division

-  Hall Effect Measurements  Expand or Collapse    -  Hall Effect Measurements Introduction 
  -  The Hall Effect 
  -  Resistivity and Hall Measurements  Expand or Collapse      -  Hall Effect Measurements Sources of Error 
  -  Hall Effect Measurements Algorithm 
  -  Sample Hall Worksheet 
  -  Hall Effect Measurements Worksheet with Typical Data 
  -  Hall Effect Measurements References 
  -  Hall Effect Figure 1 
  -  Hall Effect Figure 2 
  -  Hall Effect Figure 3 
  -  Hall Effect Figure 4 
  -  Hall Effect Measurements Comments 

# Hall Effect Measurements Algorithm

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The sheet resistance *R*S can be obtained from the two measured characteristic resistances *R*A and *R*B by numerically solving the van der Pauw equation [Eq. (3) in the text] by iteration

exp(-*π**R*A/*R*S) + exp(-*π**R*B/*R*S) = 1

as outlined in the following routine:

**Notice of Online Archive:** This page is no longer being updated and remains online for informational and historical purposes only.

ElectronicsSemiconductorsElectrical / electromagnetic metrology

## Contacts

                -      PML webmaster    pml-webmaster@nist.gov   

-  **‹** Hall Effect Measurements Sources of Error 
-  Sample Hall Worksheet **›** 

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