UNITED STATES – JAPAN

WORKSHOP

ON STANDARDS FOR 

EMERGING TECHNOLOGIES

Thursday, February 12, 2015

National Institute of Advanced Industrial Science and Technology

(AIST)

AGENDA

9:30 – 9:35 Opening Remarks Venue: AIST Tokyo Waterfront Annex 11F

Chair: T. Takatsuji (NMIJ, NIST)

- Magdalena Navarro, Senior International Program Manager, IAAO, NIST 

- Toshiyuki Takatsuji, Deputy Director NMIJ, AIST

9:35 – 9:40 Welcome Message

Chair: T. Takatsuji (NMIJ, NIST)

- Yasukazu Fukuda, Director, International Standardization Division, Industrial Science 

and Technology Policy and Environmental Bureau, Ministry of Economy, Trade and 

Industry (METI)

Nanotechnology Standardization (10 minutes each)

Chair: T. Takatsuji (NMIJ, NIST)

9:40-10:00 Thickness

- Yasushi Azuma, Research Scientist, National Metrology Institute of Japan, AIST

Title: “Development of Prototype Reference Material for XRR Measurement and 

Alignment”

- Donald Windover, Project Leader, X-Ray Metrology, Ceramics Division, Material 

Measurement Laboratory, NIST

Title: “The role of AIST/NMIJ Certified Reference Materials in X-ray reflectometry 

metrology”

10:00-10:25 Thermal properties (15 minutes each)

Chair: T. Takatsuji (NMIJ, AIST)

- Takashi Yagi, Senior Research Scientist, NMIJ, AIST

Title: “Development of certified reference material of thin film for thermal 

diffusivity”

10:25-10:55 Nano Form and Nano Size (10 minutes each)

Chair: T. Takatsuji (NMIJ, AIST)
- Hiroshi Itoh, Senior Research Scientist, Research Institute of Instrumentation Frontier, 

AIST

Title: “AFM probe characterization and nano-roughness measurement”

- Ndubuisi Orji, Research Engineer, Semiconductor and Dimensional Metrology 

Division, Physical Measurement Laboratory (PML) 

Title: “Characterization Methods for Shape and Length Nanoscale Metrology”

- Satoshi Gonda, Chief, National Metrology Institute of Japan, AIST, 

Title: “Calibration procedure for height sensitivity of an AFM using atomic steps”

10:55-11:15 Nano carbon

Chair: T. Takatsuji (NMIJ, AIST)

- Toshiya Okazaki, Group Leader, Nano Carbon Research Center, AIST

Title: Evaluation of Aggregated States of CNTs by Differential Centrifuge 

Sedimentation

- Vivek Prabhu, Materials Science and Engineering Division, Material Measurement 

Laboratory, NIST

Title: "Characterization of multi-walled carbon nanotube local structure by

small-angle neutron scattering"

11:15-11:35 3D Imaging Chair: M. Navarro (IAAO, NIST)

- Hiroyasu Ujike, Group Leader, Human Technology Research Institute, AIST, 

Hiroshi Watanabe, Senior Research Scientist, Health Research Institute, AIST

Title: "Effects of 3D display characteristics on visual perception and on Image 

Safety"

- John Penczek, Quantum Electronics and Photonics Division, Physical Measurement 

Laboratory, NIST

Title: “3-D Display Optical Metrology“

11:35-12:30 Lunch at 

Bio measure

12:30-12:50 DNA Chair: M. Navarro (IAAO, NIST)

- Yuji Sekiguchi, Group Leader, Biomedical Research Institute, AIST, 

Title: “Synthetic Spike-in Standards for High-throughput DNA/RNA Measurements”

- Mark Salit, NIST (Dr. Sekiguchi will present on behalf.)

Title: “Metrology for Genome-scale Measurements”
12:50-13:10 Protein Chair: M. Navarro (IAAO, NIST)

- Shinya Honda, Deputy Director, Biomedical Research Institute, AIST, 

Title: “Synthetic protein particles as measurement standards for subvisible

aggregates: Progress 2014”

- Wyatt Vreeland, Biomolecular Measurement Division, Material Measurement 

Laboratory, NIST

Title: “Molar mass and size measurement of proteins via tandem flow field 

fractionation-light scattering”

13:10-14:10 Discussion on the future collaboration

14:10-14:30 Closing Remarks

- Magdalena Navarro, Senior International Program Manager, IAAO, NIST

- Toshiyuki Takatsuji, Deputy Director NMIJ, AIST

14:30 Adjourn

18:00 Meeting in front of the hotel

18:30-20:30 Dinner at BOUZ restaurant in Hamamatsucho, Tokyo