Article Ref: G-010 

Weights and Measures Connection, Vol. 6, Issue 1 Page 1

January 1, 2015

Scheduled and Requested Metrology Training and 

Laboratory Auditing Program Problems

Byline: Georgia Harris

NIST Office of Weights and Measures Laboratory Metrology Program offers a systematic program of 

metrology training seminars important to your Metrology Laboratory operations. As laboratory 

manager or as a metrologist, you should be aware of the changes that have been made in the courses 

offered and the requirements that accompany the changes. 

Did you know that there are no more Basic and Intermediate Metrology Seminars? That’s right. These 

courses have not been taught since 2011 and 2012 respectively! So, if your performance plans and job 

announcements indicate that successful completion of these seminars is a requirement, they need to be 

updated.

Does this mean individuals that completed Basic and Intermediate Seminars (and the associated 

Laboratory Auditing Program [LAP] problems for states) need to attend refresher training and complete 

the new seminars? In general, the answer is no. However, if someone attended the older seminars and 

has not been working in the laboratory for the last three years, refresher training is essential for several 

reasons – least of which is the need for demonstrating hands-on proficiency. In addition, there have 

been many procedure changes and updates that have occurred in the past few years, and people that 

have not been a part of the laboratory program will need updated training on the new procedures to be 

successful. In fact, if an individual attended training but has not been working in the laboratory, and has 

not completed the appropriate LAP problems, refresher training is required. The NIST Handbook 143, 

Program Handbook Table 2 (as published in 2007) and the updated version of Table 2 will be combined 

to reflect the acceptance of prior training and completion of LAP problems as well as the new series of 

courses (available on the OWM website: http://www.nist.gov/pml/wmd/labmetrology/labresources.cfm).

The core metrology seminars now include: Fundamentals of Metrology (1 week) with a pre-requisite 

that includes successfully passing a mathematics pre-test; Mass Metrology (2 weeks); and the Volume 

Metrology (1 week). 

There are now only two sets of LAP problems – the Fundamentals of Metrology and the Advanced Mass. 

The new Fundamentals of Metrology LAP problems rely on students completing proficiency tests in both 

mass and volume, plus a series of technical audits that reinforce training, support internal technical 

audits, and provide additional support and evidence for measurement traceability. The LAP problems 

are required prior to metrologists being recognized as Approved Signatories at designated levels, which 

includes the authority and responsibility for approving the technical content of calibration certificates. 

OWM is adding a time limit requirement on the Fundamentals of Metrology LAP problems; the 
Article Ref: G-010 

Weights and Measures Connection, Vol. 6, Issue 1 Page 2

problems are required to be completed within one year of completion of the training. For those who 

have not yet completed the Basic and Intermediate LAP problems, they have until December 31, 2015, 

to turn them in, at which time they will no longer be accepted. 

For those laboratories wishing to expand their Scope to include mass calibrations via dissemination 

techniques and Mass Echelon I Recognition (OIML Class E1 and E2 for example), the Advanced Mass 

Metrology Seminar (9 days) is required. The Advanced Mass Metrology seminar is the last of the core 

courses to undergo a complete redesign based on our OWM International Association for Continuing 

Education and Training (IACET) accredited processes and system. It now incorporates the Advanced 

Hands-on seminar, which has been eliminated. An updated description of the new course is available on 

our website and the first redesigned Advanced Mass Seminar is scheduled for June 1 to 11, 2015, and is 

already FULL. This course was first taught in 1993 and has only been offered in alternating years; 

however, it has not been offered since 2011 to allow for the redesign of the course. People who 

attended earlier versions of the Advanced Mass Metrology seminar and have not yet completed the 

Advanced LAP problems also have only until December 31, 2015, to submit problems. For those 

attending the new Advanced Mass Metrology Seminar, there will be a two-year time limit for 

completing the Advanced Mass LAP problems. 

Seminars are scheduled several months or years in advance and posted on the OWM Training Calendar 

and the Laboratory Metrology Training Schedule. But, you don’t have to wait for OWM to schedule a 

training event. In fact, by logging into the OWM Contacts System, anyone can request additional 

courses that are not currently scheduled. In this way, OWM staff will have a better idea of what the 

current metrology training needs are and can regularly add courses throughout the year.

In addition to the core metrology seminars, OWM also has a number of webinars scheduled throughout 

the year with many additional webinars that can be scheduled based on need (see the accompanying 

list). The majority of the webinars are based on laboratory quality management systems and some are 

designated for “State Laboratories only.”

The schedule and course lists have been sent to State Directors and laboratory staff along with their 

annual recognition feedback letters and certificates. But, you can still take a look at the list of courses 

and log-in to request your next seminar or webinar! If you think another course subject would be valueadded, please send an e-mail in with your suggestions!

Georgia Harris, Laboratory Metrology Program: gharris@nist.gov

Link to OWM Contacts System: https://tsapps.nist.gov/WMD/default.aspx

Instructions on How to Request Training & Transcripts Using the Contacts System: 

http://www.nist.gov/pml/wmd/upload/InstructionsHowToRequestTrainingTranscripts.pdf