UNITED STATES – JAPAN 

SYMPOSIUM 

ON STANDARDS FOR EMERGING 

TECHNOLOGIES

Monday, March 7, 2011 

National Institute of Standards and Technology (NIST) 

Department of Commerce 

AGENDA 

 

9:00 – 9:20 Opening Venue: Bldg. 101/Portrait Gallery Room 

Chair: M. Navarro (IAAO, NIST) 

- Dr. Patrick Gallagher, NIST Director 

- Dr. Toshiyuki Fujimoto, Deputy Director (NMIJ/AIST, Japan) 

9:20-10:30 Session I [Nanotechnology Standardization] (10 minutes each)

Chair: M. Navarro (IAAO, NIST) 

S1-1 Thickness 

- Yasushi Azuma, Research Scientist, Materials Characterization Division, National Metrology 

Institute of Japan, AIST, Title: “Collaborative Work between NIST and NMIJ/AIST for 

thickness evaluation by X-ray Reflectometry” 

- Donald Windover, Ceramics Division, Material Measurement Laboratory (MML), NIST, Title:

“NIST SI-traceable X-Ray Reflectometry (XRR) Measurement Capabilities for Thin Films: 

Instrumentation and Data Analysis” 

S1-2 Thermal and Physical Properties 

- Takashi Yagi, Researcher, Material Properties and Metrological Statistics Division, National 

Metrology Institute of Japan, AIST, Title: “Thermal diffusivity measurement on thin films”, 

 Collaborators: Takashi Yagi, Naoyuki Taketoshi and Tetsuya Baba 

- Joshua Martin, Physicist, Ceramics Division, Material Measurement Laboratory (MML), NIST,

Title: "Development of Thermoelectric Measurement Standards and Protocols"

S1-3 Nano indentation 

- Hattori Koichiro, Senior Research Scientist, Vibration and Hardness Section, Inorganic 

Analytical Chemistry Division, NMIJ, Title: “Nanoindentation standard and uncertainty 

evaluation at NMIJ” 

-Robert Cook, Leader, Nanomechanical Properties Group and Deputy Chief, Ceramics Division, 

Material Measurement Laboratory (MML), NIST, Title: “Measuring and Mapping Mechanical 

Properties with Nano-Scale Resolution”

10:30-10:50 Coffee Break 

10:50-12:30 Cont.- Session I [Nanotechnology Standardization] (15 minutes each)

 Chair: T. Fujimoto (NMIJ/AIST) 

S1-4 Form and Dimension 

- Hiroshi Ito, Senior Research Scientist, Research Institute of Instrumentation Frontier, AIST, 

Title: “Influence of effective AFM probe shape for accurate morphology”
- Ndubuisi Orji, Research Engineer, Mechanical Metrology Division, Physical Measurement 

Laboratory (PML), NIST, Title: “SI Traceable Critical Dimension Metrology with Atomic 

Force Microscopes” 

- Satoshi Gonda, Chief, Length and Dimensions Division, National Metrology Institute of Japan, 

AIST, Title: “Improvement of metrological AFMs for nanometer-scale dimensional standards”

S1-5 Nano-Carbon Materials, Carbon Nanotubes and Fullerenes 

- Said Kazaoui, Assistant Director International Relations Office and Nanotube Research Center, 

AIST, Title: “Aggregation/Agglomeration of carbon nanotubes: problems and solutions to 

measure their sizes by DLS” , collaborators: S. Kazaoui and T. Okazaki

- Kalman Migler, Physicist and Leader, Complex Fluids Group, Polymers Division, Materials 

Measurement Laboratory (MML), NIST, Title: “ International Comparison of Chirality 

Distribution Measurement in a Single-Wall Carbon Nanotube Sample”

- Angela Hight-Walker, Chemist, Optical Technology Division, Physical Measurement 

Laboratory (PML), NIST, Title: “Reference Materials and Documentary Standards for SingleWall Carbon Nanotubes (SWCNTs)” 

12:30-1:30 Lunch Location: Heritage Room 

1:30-3:10 Session II [Environment and Energy Standardization] (15 min each)

Chair: Jerry Fraser (PML, NIST) 

S2-1 Solid State Lighting 

- Kenji Godo, Researcher in Optical Radiation Section, Photometry and Radiometry Division, 

National Metrology Institute of Japan, AIST, Title: “Investigation of photometric measurement 

for Solid State Lighting”

- Yoshi Ohno, Group Leader, Optical Sensor Group, Optical Technology Division, Physical 

Measurement Laboratory (PML), NIST, Title: “Progress in Standardization of Solid State 

Lighting in USA and NIST Research Work". 

S2-2 3D Imaging 

- Hiroyasu Ujike, Group Leader, Human Technology Research Institute, AIST, Title: “Visual 

fatigue and motion sickness in 3D images” 

- Paul Boynton- Physical Scientist, Quantum Electrical Metrology Division, Physical 

Measurement Laboratory (PML), Title: “Multiple dimensional (nD) Medical Display 

Metrology” 

S2-3 Information Security 

- Hirofumi Sakane, Research Center for Information Security, AIST, Title: “Research Center for 

Information Security, AIST "FIPS 140-3 Non-Invasive Attack Testing”

- Matthew Scholl, Group Manager, Security Management and Assurance, 

Computer Security Division, Information Technology Laboratory, NIST, Title: The NIST 

Information Technology Lab, Computer Security Division Overview" 

3:10-3:30 Coffee/Tea Break 

3:30-4:50 Session III Biometrology & Lab Accreditation (15 min each)

Chair: M. Navarro (IAAO, NIST) 

S3-1 Biometrology 

- Yuji Sekiguchi, Group Leader, Biomedical Research Institute, AIST, Title: “DNA purity on 

biologically synthesized artificial DNAs used as standards for nucleic acid measurement”
- Michael Tarlov, Deputy Chief, Biochemical Science Division, Material Measurement 

Laboratory (MML), NIST, Title: “Overview of the Biomanufacturing Metrology Program at 

NIST” 

-Shinya Honda, Group Leader, Biomedical Research Institute, AIST, Title: “Synthesis of protein 

particles as measurement standards for submicron aggregates of pharmaceutical proteins”

S3-2 Lab Accreditation 

- Katuo Seta, Deputy Director of NMIJ, AIST, Title: “Role of AIST for standardization and 

conformity assessment activities”

- Sally Bruce, Chief, National Voluntary Laboratory Accreditation Program (NVLAP), Physical 

Measurement Laboratory (PML), NIST, Title: "NVLAP accreditation and linkage to NIST 

measurement capabilities" 

4:50-5:00 Closing 

-Magdalena Navarro, Senior International Program Manager, International and Academic Affairs 

Office, Office of the Director, NIST

5:30-7:00 Reception Location: Heritage Room