SBIR

SMALL BUSINESS INNOVATION

RESEARCH PROGRAM

ABSTRACTS OF PHASE I and PHASE II 

AWARDS FOR FISCAL YEAR 2017
INTRODUCTION

Abstracts of Awards for Fiscal Year 2017 SBIR Program

Note: Certain non-ASCII characters may not be represented accurately in this 

document. In cases where there may be doubt, please direct your questions 

to sbir@nist.gov. 
Fiscal Year 2017 List of Awardees

Award Number Company Name Open Topics/Topic Areas Phase

70NANB17H227 Cadre Research Labs, LLC Systems Phase I

70NANB17H255 ColdQuanta, Inc Precision Measurements Phase I

70NANB17H222 En’Urga Inc. Collaboration and Partnership Phase I

70NANB17H221 Infobeyond Technology LLC Systems Phase I

70NANB17H218 Low Thermal Electronics, Inc. Precision Measurements Phase I

70NANB17H224 MBSE Tools, Inc. d.b.a. ModGeno Data and Modeling Phase I

70NANB17H228 MetroSage, LLC Data and Modeling Phase I

70NANB17H219 Nikira Labs, Inc. Systems Phase I

70NANB17H225 SIFT, LLC Systems Phase I

70NANB17H240 Tetremer Technologies, LLC Precision Measurements Phase I

70NANB17H223 X-wave Innovations, Inc. Data and Modeling Phase I

70NANB17H226 XpressRules LLC Systems Phase I

70NANB17H231 AxNano, LLC Lab to Market Phase II

70NANB17H232 Bridger Photonics, Inc. Advanced Sensing for Manufacturing Phase II

70NANB17H233 Innoveering, LLC Advanced Sensing for Manufacturing Phase II

70NANB17H234 MicroXact Inc. Advanced Sensing for Manufacturing Phase II

70NANB17H235 Omega Optics Inc. Advanced Sensing for Manufacturing Phase II

70NANB17H236 OptoFluidics, Inc. Biomanufacturing Phase II

70NANB17H328 Quantum Diamond Technologies, Inc. Advanced Sensing for Manufacturing Phase II

70NANB17H237 Symbio Robotics, Inc. Advanced Sensing for Manufacturing Phase II

70NANB17H239 XCSpec Cyber Physical Systems Phase II

 
FY 2017 PHASE I AWARD

Topic: Systems

Subtopic: An Automated System for Firearm Evidence Identifications

Title: Development, Validation, and Implementation of CMC Algorithm into a Software 

Platform for Firearm Analysis

OU: Laboratory Programs 

Firm: Cadre Research Labs, LLC

363 W Erie St. 

Chicago, IL 60654 

Principal Investigator: Ryan Lilien

Phone: (508) 443-1275 

Email: Ryan.Public@CadreResearch.com

Award Amount: $92,100 

Abstract: The research involves implementation of a comparison algorithm for firearm 

forensics. The Congruent Matching Cells (CMC) algorithm has been developed by NIST yet 

does not appear in any commercially available software. As requested in the call for proposals, 

we will implement the algorithm in the C++ programming language and validate CMC using two 

specified datasets. In addition, we will incorporate the CMC method into our already 

commercially available software for firearm analysis. Our software implements import, 

visualization, masking, database, and search functionality. In addition to the two specified 

datasets we will also evaluate CMC against two additional, larger, real-world datasets. We will 

also explore slight algorithm variants whereby CMC algorithm parameters can be adjusted (e.g., 

number/size of grid cells and the CCF, angle, and translation thresholds). Overall, we will 

advance the CMC method with real-world testing and will incorporate CMC into a fully 

functional software application ready for deployment to crime labs. 

Commercial Applications: The research involves implementation of a comparison algorithm for 

firearm forensics. The Congruent Matching Cells (CMC) algorithm has been developed by NIST 

yet does not appear in any commercially available software. As requested in the call for 

proposals, we will implement and validate CMC. In addition, we will incorporate the CMC 

method into our already commercially available software for firearm analysis. Our software 

implements import, visualization, masking, database, and search functionality. Therefore, the 

CMC method will join a fully functional software application and be ready for 

commercialization as soon as the Phase I award is complete.
Topic: Precision Measurements

Subtopic: Atomic Vapor Cell Technology for Electric-Field Metrology 

Title: Compact Vapor Cell Technology for Rydberg‐Atom RF Metrology

OU: Communications Technology Laboratory 

Firm: ColdQuanta, Inc 

3030 Sterling Circle 

Boulder, CO 80301 

Principal Investigator: Daniel Farkas

Phone: 303‐440‐1284

Email: daniel.farkas@coldquanta.com

Award Amount:

Abstract: ColdQuanta seeks to develop compact vapor cells designed specifically for highaccuracy RF metrology with Rydberg atoms. Sensors utilizing these vapor cells can take 

advantage of Rydberg atoms’ exceptional sensitivity to RF, microwave, and millimeter radiation 

between 1 and 1000 GHz. Featuring resolutions down to the uV/cm level, the accuracy of these 

devices will be at least ten times better than existing technologies (e.g. dipole probes). In 

addition, these sensors will be self-calibrating, allowing their accuracy to be attained in the field 

without relative standards or external calibration sources. 

In Phase I, ColdQuanta will focus on the interaction between the external RF electromagnetic 

field and the dielectric medium of the cell itself. Scattering of the RF field off of the cell (e.g. 

diffraction, reflection, and absorption) is a systematic effect that can change the electric field 

amplitude “seen” by the atoms. To quantify the impact of cell scattering on sensor accuracy, a 

full numerical model is needed. ColdQuanta will develop these tools to help understand which 

cell geometries and physical features minimize scattering and enhance electric field uniformity 

throughout the interior volume of the cell. 

Commercial Applications: There are a host of commercial applications that would benefit from 

improved RF metrology, including studies and mitigation of passive intermodulation distortion 

in antennas; design, manufacturing, and calibration of smart antennas, phased arrays, and radar 

systems; nearfield measurements for microwave circuit design and testing; biological sensing 

through optically opaque materials; millimeter-wave detection and imaging of concealed 

weapons; and terahertz imaging for navigation during brownouts. 

Topic: Collaboration and Partnership 
Subtopic: NIST Technology Transfer 

Title: Optical Device for Sorting Particles by Size

OU: Technology Partnerships 

Firm: En’Urga Inc.

1201 Cumberland Avenue, Suite R 

West Lafayette, IN 47906 

Principal Investigator: Yudaya Sivathanu 

Phone: (765) 497-3269 

Email: sivathan@enurga.com

Award Amount: $100,000 

Abstract: This Small Business Innovation Research Phase I project will evaluate the feasibility 

of an innovative optical sizer for estimating drop sizes in sprays that have very small drops. The 

technique is based on the NIST provisional patent (application number 62/358,264). The NIST 

invention sorts particles by size over the range of 10nm to 10μm. Drop sizing is achieved in 

these sprays using an intense standing wave optical field created in a laser-pumped resonant 

optical cavity, and sending the spray in a laminar flow through the optical field. 

During the Phase I project, En’Urga Inc. will undertake three tasks. The first task will be to 

configure a laboratory system to evaluate the technical feasibility of the optical drop sizer. The 

second task will be to evaluate the laboratory system using spray experiments. The last task will 

be to design a commercial prototype system for the Phase II work. During the Phase II work, 

En'Urga Inc. will design and develop a prototype drop sizer. The drop sizer will be rigorously 

evaluated before commercialization of the system can commence.

Commercial Applications: The primary commercial application for the proposed drop sizer is 

in the quality audit of spray nozzles and fuel injectors used in automotive and aerospace 

applications. Conventional diffraction based drop sizers and phase Doppler anemometers cannot 

provide accurate drop size estimates in sprays that have very small drops. Many of the newer 

fuel injectors and spray nozzles are producing very small drops since they increase the fuel 

mixing and efficiency of the engines. The proposed sizer will enable injector and nozzle 

manufacturers to evaluate the drop size distribution in their very fine sprays ensuring rapid 

commercialization.

Topic: Systems

Subtopic: Low-Latency High-reliability Wireless Protocol for Advanced Manufacturing 

Applications 
Title: Low‐Latency High‐reliability Wireless Protocol for Advanced Manufacturing 

Applications 

OU: Engineering Laboratory 

Firm: Infobeyond Technology LLC 

320 Whittington Pkwy., Suite 117 

Louisville, KY 40222 

Principal Investigator: Bin Xie

Phone: (502) 371-0907 

Email: Bin.Xie@InfoBeyondtech.com

Award Amount: $100,000 

Abstract: Advanced manufacture requires low-latency and high-reliability wireless 

communications between the sensors/actuators and the central controller. However, the current 

wireless protocols cannot meet such stringent latency and reliability requirements. In this project, 

InfoBeyond advocates L2Wireless (Low-Latency High-reliability Wireless Protocol Using 

Cooperative Relaying and Network Coding) to address this problem. It can simultaneously 

address the stringent requirements on latency (close-loop sense-to-actuation time < 1ms) and 

reliability (transaction error < 10-9) within a factory cell with at least 10 sensor/actuators. For this 

goal, L2Wireless modifies the MAC and PHY layers of IEEE802.11ac, which includes radio 

diversity, scheduling, baseband processing, RF band selection, antenna selection, modulation and 

error coding, etc. The key features are: (i) L2Wireless PHY layer is developed based on the PHY 

techniques of IEEE802.11ac with adjustments to adapt to the latency/reliability requirements and 

radio environments of manufacturing applications; (ii) L2Wireless MAC layer utilizes 

cooperative relay and network coding to ensure successful information exchange between the 

controller and sensors/actuators with constrained latency and reliability; (iii) Our preliminary 

results indicate that L2Wireless protocol is able to support the communications of sufficient 

number of devices within a work cell and simultaneously achieve the desired latency and 

reliability for advanced manufacturing applications. 

Commercial Applications: L2Wireless provides an approach that enables wireless networks 

with close-loop sense-to-actuation time < 1ms and transaction error< 10-9 in the harsh radio 

environments. It can act as a drop-in replacement for wired industrial control networks. This 

brings networking flexibility through wireless connections among the devices in the plant. It 

allows the factory to easily maintain, modify, and update the network according to the dynamic 

manufacturing process. L2Wireless meets the NIST's goal to promote innovation and 

standardization in a way to enhance U.S. economic efficiency and improve the industrial 

competitiveness. L2Wireless will be commercialized into current industrial control systems and 

others. 

Topic: Precision Measurements
Subtopic: Precision 10 kV Programmable Voltage Source 

Title: Precision 10 kV Programmable Voltage Source 

OU: Physical Measurement Laboratory

Firm: Low Thermal Electronics, Inc. 

PO Box 210 

2612 FM 66 

Itasca, TX 76055 

Principal Investigator: David Fitzgerald

Phone: (254) 687-9700 

Email: dave@lowthermal.com

Award Amount: $97,500 

Abstract: Low Thermal Electronics, Inc. proposes to design a stand-alone, programmable 

voltage source capable of supplying precision voltages in the range of zero to 1,000 volts direct 

current (DC), with options for scaling up to 10,000 volts, and with a total expanded uncertainty 

(k=2) of less than 10uV/V for the 10,000 volt version. This instrument will improve state-of-theart measurements in high resistance, high voltage, and potentially other research and metrology 

applications that require precision voltages above 1,000 volts. It will also provide improved 

performance and cost savings when compared to currently available commercial multi-function 

calibrators in the range of zero to 1,000 volts DC. 

Commercial Applications: A stand-alone, programmable 1,000 volt DC voltage source with 

uncertainties in the single digit ppm range is not commercially available today. A stand-alone, 

programmable 10,000 volt source of sufficiently low uncertainty to advance state-of-the-art 

measurement is also not commercially available. A cost effective, single instrument that can 

satisfy both of these requirements is needed to improve measurements and high voltage sourcing 

in the areas of precision high voltage and high resistance measurements. Low Thermal 

Electronics intends to manufacture a commercially available instrument in the United States that 

satisfies these requirements.

Topic: Data and Modeling 

Subtopic: Modeling and Simulation Analysis for Manufacturing Systems 

Title: A Model-Based Solution to Improve the Accessibility and Affordability of Manufacturing 

System Simulations

OU: Engineering Laboratory 
Firm: MBSE Tools, Inc. d.b.a. ModGeno 

5120 Oakwood Circle 

Cumming, GA 30028 

Principal Investigator: George Thiers

Phone: (770) 312-7812 

Email: george.thiers@modgeno.com

Award Amount: $100,000 

Abstract: The vision is to provide decision-makers with effective, fast, and inexpensive analysis 

tools to answer "What-If" and "What-Should" questions about manufacturing systems. Value 

Stream Mapping (VSM) is a modeling methodology with widespread contemporary use in 

manufacturing, and our strategy is to start with VSM as a deployment beachhead for the eventual 

deployment of a more generic manufacturing system modeling and analysis tool. In Phase I, we 

propose to add modeling rigor and computational analysis to VSM; our goal is to demonstrate 

the feasibility of using Value Stream Maps to answer routine value stream questions about 

throughput, capacity, cycle time, and inventory using automated generation of discrete-event 

simulation models. A Phase I demonstration will start from the VSM tool environments of 

Microsoft Visio and Excel, and automatically generate discrete-event simulation models in a 

COTS language and tool. 

Commercial Applications: A potential commercial application of Phase I research results is to 

significantly enhance the utility of a popular manufacturing process improvement tool, Value 

Stream Mapping (VSM). If successful, Phase I research results will enable complementing 

VSM’s usage as an ad-hoc modeling and intuitive analysis tool with a rigorous underlying 

modeling foundation, enabling a suite of standardized analyses for answering routine questions 

about throughput, capacity, cycle time, and work-in-process inventories. The value proposition 

of this innovation is greatly improved analytic capabilities which are easily accessible to VSM 

users.

Topic: Data and Modeling 

Subtopic: Interactive Software Tools for Processing QIF-formatted Part Models to Generate 

Realistic and Accurate Measurement Plans and Programs in Standard Digital Languages

Title: Interactive Software Tools for Processing QIF-formatted Part Models to Generate 

Realistic and Accurate Measurement Plans and Programs in Standard Digital Languages 

OU: Engineering Laboratory 

Firm: MetroSage, LLC

26896 Shake Ridge Road 

Volcano, CA 95689 
Principal Investigator: Jon M. Baldwin 

Phone: (415) 336-2244 

Email: jmbaldwin@metrosage.com

Award Amount: $99,500 

Abstract: The QIF standard shows the promise of offering an environment where best-in-class 

metrology applications can be linked to yield solutions that are automated, optimized, adaptive, 

and traceable, maintaining the agility required to ensure U. S. global competitiveness. While the 

QIF standard has reached a substantial level of comprehensiveness and maturity, the 

embodiment of the standard in actual, commercial-grade software applications remains in its 

beginning stage because many developers of metrology applications software are waiting to see 

whether the QIF standard is sufficiently mature to warrant adoption. We propose a project to 

demonstrate QIF maturity and to facilitate future development of commercial applications of QIF 

by means of a three-faceted program: (1) Development and commercialization of a QIFbased 

software application that will enable the automated generation of optimized CMM inspection 

plans and programs. (2) Development and dissemination to the user and developer communities 

of free, open source tools for QIF instance file generation and maintenance. (3) Production of a 

report of recommendation of extension of the QIF Rules schema in future additions. 

Commercial Applications: The research proposed herein will find valuable commercial 

application in the manufacturing industries primarily by promoting the application of the QIF 

standard to provide a means for automated production of known-good, economically optimum 

measurement plans for CMM based measurement, thereby improving the profitability and 

competitive posture of U.S. manufacturing companies. Additionally, it will promote the further 

use and development of QIF-based software tools by providing end users and developers with a 

suite of free, open source tools for creating, maintaining and validation of QIF instance files.

Topic: Systems

Subtopic: High Speed Large Field-of-View Optical Microscope

Title: Large Field of View Microscope for Rapid, High-Resolution Imaging 

OU: Information Technology Laboratory 

Firm: Nikira Labs, Inc. 

1931 Old Middlefield Way

Mountain View, CA 94043 

Principal Investigator: Manish Gupta 

Phone: (650) 906-0274 

Email: manish.gupta@nikiralabs.com

Award Amount: $100,000 
Abstract: In this SBIR effort, Nikira Labs Inc. proposes to develop a high-resolution (< 1 

micron) microscope that can rapidly (< 30 seconds) image a large field of view (> 1 cm2). The 

technology will provide both bright-field and fluorescence imaging and be capable of retrofitting 

into a wide variety of existing microscopes at a low retail price. This work will complement the 

microscopy efforts that are ongoing at the National Institute of Standard and Technology (NIST). 

In Phase I, we will demonstrate technical feasibility by fabricating two optical microscopes that 

utilize Fourier Ptychographic Imaging (FPI) via highly controlled, inhomogeneous illumination 

sources. The first imaging system will target high-performance applications, whereas the second 

system will be more cost-effective for educational applications. In both cases, the illumination 

source will be improved to increase the imaging speed, and the camera will be optimized for 

lower noise and cost. Image analysis and reconstruction software will be developed in a 

platform-portable language to allow for retrofitting on existing systems. The Phase I prototypes 

will be characterized to determine their resolution, field of view (FOV), imaging speed, and 

depth-of-focus. Finally, Phase II instruments will be designed to include fluorescence and phase 

imaging. 

Commercial Applications: In Phase III, Nikira Labs Inc. will commercialize the FPI 

microscope for numerous markets including educational institutions, biomedical diagnostics, and 

industrial applications. A preliminary market estimate suggests 5-year global revenues of $8 – 

$16M, $15 – $30M, and $2 – $4M respectively for these market segments. Moreover, these 

attractive markets are expected to continue to grow with a predicted compound annual growth 

rate (CAGR) of 7.5% from 2016 to 2021. Contingent upon the SBIR funding, Nikira Labs Inc. is 

poised to take advantage of this growth. 

Topic: Systems

Subtopic: Sources of and Triggers for Cybersecurity Failures 

Title: ISABEL - Integrated Secure Automated Bug Extraction List 

OU: Information Technology Laboratory 

Firm: SIFT, LLC

319 1st Ave N., Suite 400 

Minneapolis, MN 55401 

Principal Investigator: David J. Musliner 

Phone: (612) 325-9314 

Email: musliner@sift.net

Award Amount: $99,322.27 

Abstract: The ISABEL program will create symbolic execution signatures to classify bugs in 

the NIST Bugs Framework. Using the symbolic execution signature ISABEL will find a program 
input to trigger the bug using fuzz testing. ISABEL will integrate its bug categorization and bug 

triggering capability with a software development environment using a flexible framework that 

will allow both open source and commercial software to use ISABEL features. One of the key 

ISABEL outputs summarizes the bug categories, when they were created and when they were 

eliminated against the organizations software

development timeline. This will allow organizations to see which of their processes are most 

effective for catching various categories of bugs. ISABEL gives the software development 

organization actionable intelligence on how to improve their software development process. 

ISABEL will provide better insight into the science of software development for the entire 

industry. 

Commercial Applications: The ISABEL technology will create an open source framework that 

allows organizations to use the NIST Bug Framework to improve their software development 

process. The flexible framework will support both an open source and a commercial set of 

products for the symbolic execution and fuzz testing components. ISABEL components will be 

integrated into premier software development systems for additional license fees. Supporting 

both an open source solution and commercial version will increase market penetration and 

ensure an economic engine to support and improve the ISABEL technology. 

Topic: Precision Measurements

Subtopic: Innovative Manufacturing of Nanoscale Calibration Spheres 

Title: Rational Design of sub-100 nm Polystyrene Particles with a Low Coefficient of Variation 

in Size

OU: Physical Measurement Laboratory

Firm: Tetremer Technologies, LLC

657 S. Mechanic St. 

Pendleton, SC 29670 

Principal Investigator: Michael Schreuder

Phone: (864) 646-6282 

Email: Michael.schreuder@tetramertechnologies.com

Award Amount: $99,952.70 

Abstract: In this Phase I SBIR program, Tetramer Technologies will develop new, 

commercially attractive, highly monodisperse polystyrene latex standards in a variety of sizes 

(i.e. 30 nm to 100 nm) via emulsion polymerization processes that employ a surfactant and that 

are surfactant-free. Surfactant free emulsions will be stabilized through the use of ionic 

comonomers in the emulsion polymerization. The focus of the study will be to elucidate the 

inter-relation of processing parameters on the resulting particle size and coefficient of variation 
of the size. Specifically, once 100 nm particles with a coefficient of variation of 2% has been 

achieved (duplicating NIST SRM 1963a), the ratios of reagents, stirring time, and rate of reagent 

addition will be translated to generating particles with a size of 30 nm with a coefficient of 

variation 2% or less. Sizing measurements will be performed with a variety of tools including, 

both scanning electron microscopy and transmission electron microscopy, dynamic light 

scattering, and atomic force microscopy (AFM) to assess the products of the research. In 

addition, the cross-referencing of the techniques with one another will used to establish effective 

metrological practices for sizing the particles.

Commercial Applications: The products of this research will be utilized as size calibration 

standards in the 20 – 100 nm range. The need for calibration standards at this size range are 

experiencing an ever increasing growth with the expansion of nanotechnology into commercial 

products. Specifically, optical sizing equipment, semiconducting measurement tools, and 

electron microscopy are just a few of the measurement tools that require a NIST traceable 20 – 

100 nm standard to calibrate them. 

Topic: Data and Modeling 

Subtopic: Non-Destructive Testing Qualification of Complex Parts with Digital Image 

Correlation and Digital Signatures 

Title: 3-D Digital Image Correlation Based Non-Destructive Testing System for Qualification of 

Additive Manufacturing Parts 

OU: Engineering Laboratory 

Firm: X-wave Innovations, Inc. 

555 Quince Orchard Road 

Gaithersburg, MD 20878 

Principal Investigator: Dan Xiang

Phone: (301) 200-8128 

Email: dxiang@x-waveinnovations.com

Award Amount: $100,000 

Abstract: NIST's seeks a high resolution DIC technology for qualification of complex AM parts. 

To meet this critical need, X-wave Innovations Inc. proposes to develop a 3-Dimentional Digital 

Image Correlation (3-D DIC) based NDT system. The proposed effort builds upon the success of 

XII in developing a variety of NDT technologies (including DIC system) for advanced materials 

evaluation. The success of the proposed effort will result in not only a novel 3-D DIC NDT 

technology, but also a system that is accurate, fast, and easy to use. This system should be 

suitable for field applications to qualify AM parts and inspect defect type, size, and location in 

those parts. 
Commercial Applications: The 3-D DIC based NDT system has many market applications in 

different industries, such as air and space vehicles, replacement parts in naval fleets, oil and gas 

industry, and power generation. In the commercial sector, we anticipate that the resulting 

technology may have immediate applications in the growing bank of commercially available AM 

machines, as many of these suffer from a lack of quality assurance and characterization of final 

AM components resulting from these systems. Academic institutes and universities for advanced 

mechanical, aerospace and structural research and development should also benefit from this 

new technology. 

Topic: Systems

Subtopic: Policy Machine/Next Generation Access Control Implementation

Title: XpressRules-PM: Commercial Implementation of PM/NGAC

OU: Information Technology Laboratory 

Firm: XpressRules LLC

9515 North Wieber Dr. 

Spokane, WA 99208 

Principal Investigator: Ronald C. Turner 

Phone: (509) 467-0668 

Email: Ron.Turner@XpressRules.com

Award Amount: $100,000 

Abstract: This proposal represents a response by XpressRules to a two-fold demand from the 

information security marketplace. The business requirement (for true policy governance) is that 

asset owners and steward themselves-and not IT—become directly accountable for the life cycles 

of their rules and policies. The technical requirement (for an adequate data model) is that the 

policies themselves embody sufficient semantic content so as to enable effective “pre-emptive 

analytics”—the ability for policy analysts to discover logical leaks and gaps before a policy is 

deployed. For attribute based access control (ABAC) NIST center-staged the human manager by 

defining and demonstrating natural language policy (NLP) in its Guide to ABAC (SP 800-162). 

In addition, the NIST standardization and current implementation of Policy Machine/New 

Generation Access Control (PM/NGAC) provides the semantics-rich graph-based data model 

required for robust policy analytics. The goal of this proposal is to exploit and commercialize 

both of these NIST initiatives with XpressRules-PM, a product with (1) an adaptive NL humancomputer interface (HCI) that empowers business users—in their own words—to manage 

policies and the policy authoring environment and (2) a dynamic graph-based policy 

representation that allows for effective policy analytics.

Commercial Applications: XpressRules-PM fills an immediate need in the company’s existing 

market of pharma (protection of clinical trials artifacts), healthcare (granular access control of 
patient data in the electronic health record), credit cards (safe automation of customer-controlled 

card management), accounting (automated audits), banking (enforcement of separation of duty), 

government (privacy and compliance), and insurance (reliable privacy throughout the payments 

work flow). Strategically, the core business rules (BR) engine in XpressRules-PM will enable the 

company to compete effectively in massive cybersecurity and to collaborate with global BR 

players.

FY 2017 PHASE II AWARD

Topic: Lab to Market

Subtopic: NIST Technology Transfer 

Title: Bimetallic Zero Valent Iron Composites for In Situ Remediation

OU: Technology Partnerships 

Firm: AxNano, LLC 

527 Bridge Street 

Danville, VA 24541 

Principal Investigator: Alexis Wells Carpenter

Phone: (336) 217-5171 

Email: alexis.carpenter@triadgrowthpartners.com

Award Amount: $299,994 

Abstract: The EPA estimates that one out of every four Americans lives within three miles of a 

hazardous waste site. Recent advanced materials developments have driven increased use of In 

Situ Chemical Reduction (ISCR) remediation in the US and globally. Nanoscale Zero Valent 

Iron (NZVI) holds great potential for ISCR due to its low cost and high capacity for degrading 

halogenated compounds. However, two major technical challenges prevent wide-spread NZVI 

adoption: 1) agglomeration, which prevents transport in the subsurface; and 2) passivation, 

which decreases reactivity to contaminants. During a NIST Phase I program, AxNano, in 

collaboration with University of Arkansas, proved the feasibility of a novel, three-component 

composite composed of bimetallic NZVI on a carbon-based substrate (RemRxTM CSI) for in 

situ remediation of trichloroethylene. RemRxTM CSI achieved 10x greater transport than NZVI 

particles alone, and 4x greater transport than NZVI particles on activated carbon. Removal of 

TCE by the RemRxTM CSI was 30% greater than by the NZVI particles alone. Having proven 

feasibility in a laboratory setting, Phase II will focus on prototyping, scale-up manufacturing and 

pilot scale field testing of RemRxTM CSI. This SBIR program will produce a novel, low-cost 

remediation with broad-spectrum efficacy to meet market and society needs.

Commercial Applications: The global environmental remediation technology market is 

forecasted to be $80.5B by 2019. In situ methods are the fastest growing areas in the remediation 

space. While Nanoscale Zero Valent Iron (NZVI) has widely recognized potential for In Situ 

Chemical Reduction, current products have yet to perform as desired. AxNano is developing 

RemRxTM CSI, a NZVI-based composite that exhibits longer shelf-life, larger sphere of 
influence, and greater efficacy to target and destroy contaminants. Initially, we will target the 

$34B chlorinated solvent-contaminated groundwater remediation market. RemRxTM CSI can 

also remediate other contaminants to capture additional segments of the $60B remediation 

market.

Topic: Advanced Sensing for Manufacturing 

Subtopic: Absolute Interferometry with Nanometer Precision

Title: Absolute Distance Interferometer for Manufacturing Metrology Applications 

OU: Physical Measurement Laboratory

Firm: Bridger Photonics, Inc. 

2310 University Way 

Bozeman, MT 59715 

Principal Investigator: Michael J. Thorpe 

Phone: (406) 585-2774 

Email: thorpe@bridgerphotonics.com

Award Amount: $299,926 

Abstract: Bridger Photonics, Inc. proposes to develop an absolute length metrology sensor that 

will simultaneously provide >1,000 measurements per second, <10 nm precision, and >0.5 m 

maximum measurement distance. Bridger’s solution is will fill a gap in precision measurement 

technology for applications that require rapid monitoring of macroscopic distances such as 

positioning and calibration of surface metrology systems (CMM, AFM, SEM), aspheric and 

freeform optics manufacturing, wafer positioning and optic alignment for the semiconductor 

industry, and part mapping and positioning for laser materials processing applications. Bridger’s 

solution will enable several measurement scenarios that are not possible using traditional 

interferometry such as resolving reflections from multiple surfaces, performing thickness 

measurements, tracking discontinuous steps, and measuring high-relief or rough surfaces.

Commercial Applications: The proposed distance measurement technology has several 

commercial applications in precision manufacturing. Bridger anticipates the initial applications 

will be surface characterization for improved manufacturing of aspheric and freeform optics, and 

closed-loop process control and rapid part mapping for the laser materials processing industry. 

Other applications include alignment, and calibration of advanced optical assemblies for the 

semiconductor manufacturers and manufacturers of imaging interferometers. Other potential 

applications involve providing calibrated and traceable positioning for advanced manufacturing 

and research activities that use coordinate measurement machines, atomic force microscopes, 

and scanning electron microscopes. 
Topic: Advanced Sensing for Manufacturing 

Subtopic: High Temperature In Situ Pressure Sensor 

Title: High Temperature High Resolution in-situ Differential Pressure Sensor

OU: Material Measurement Laboratory

Firm: Innoveering, LLC 

100 Remington Boulevard 

Ronkonkoma, NY 11779 

Principal Investigator: Nicholas Tiliakos

Phone: (631) 219-3483 

Email: nick.tiliakos@innoveering.net

Award Amount: $299,867.43 

Abstract: Chemical manufacturers require high accuracy/high sensitivity pressure sensors to 

efficiently monitor the various manufacturing systems and processes in the chemical plant, to 

ensure any changes proceed in a safe and reliable manner, adhering to expected standards and 

practices. NIST also has a need for highly accurate pressure measurements, especially 

determining the thermo-physical properties of fluids. Such measurements must be made at the 

highest standard possible since they affect the development of theoretical models utilized by 

industry. Since the market is currently limited in the availability of such pressure sensors, i.e. 

possessing a combination of high accuracy/high temperature capability with excellent accuracy, 

NIST is seeking a high temperature, in situ, pressure sensor that can achieve better performance 

than the current state-of-the-art. The Innoveering team will build upon it’s Phase I work, which 

showed promising results for its an innovative, compact High Temperature High Resolution 

(HTHR) in-situ differential pressure (DP) sensor utilizing piezo-resistive elements to sense 

differential pressure as well as an over-pressure protection feature to ensure reliable and safe 

operation. Our team brings together experts in the design/fabrication/testing and application of 

harsh environment pressure sensors, MEMS microfabrication techniques as well as 

packaging/welding techniques for these types of high pressure high temperature sensors. 

Commercial Applications: Potential commercial applications for our HTHR DP sensor range 

from machinery health monitoring, smart process plan control/monitoring, monitoring of 

processes in chemical plants, oil refineries/petrochemical sector, to power plant monitoring. Our 

HTHR DP sensor will be at the cutting edge of CSOTA pressure sensing capabilities, providing a 

need not currently available, meeting all NIST’s requirements while also accomplishing this in a 

very small factor and in a cost effective product. Our HTHR sensor also has the ability to behave 

like a smart transmitter by not requiring pressure compensation with extraneous electronics. 

Topic: Advanced Sensing for Manufacturing 
Subtopic: High-Density Cryogenic Probe Station 

Title: High Density Semi-Auto Closed Cycle Cryoprober II 

OU: Physical Measurement Laboratory 

Firm: MicroXact Inc.

6580 Valley Center Dr. 

Radford, VA 24141 

Principal Investigator: Vladimir Kochergin

Phone: (614) 917-7202 

Email: vkochergin@microxact.com

Award Amount: $299,959.37 

Abstract: High density wafer scale cryogenic probing solution for testing at 4.5K temperatures 

or below is needed for testing and characterization of devices and circuits employing 

superconducting electronic components (such as used for quantum processing, high speed 

classical processing, magnetic field sensors, etc.) as well as for testing of various particle and 

light detectors for astronomy, aerospace, defense and homeland security applications. MicroXact 

Inc. is proposing to continue the development of a semi-automated, closed cycle, wafer scale 

high density cryogenic probe station for testing at below 4.5K to 300K. In Phase I MicroXact 

finalized the performance specifications, developed mechanical model and design, and verified 

system performance via simulations. Detailed commercialization and transition to marketing 

strategy was also developed. In Phase II MicroXact will fabricate, assemble and test the 

prototype high density closed cycle semi-automated cryogenic probe station first in-house and 

then will deliver and install the prototype at the NIST facility for verification and evaluation. 

Upon completion of Phase II, a prototype closed cycle refrigerated high density cryogenic probe 

station will be delivered to NIST for testing and verification. The solution developed on this 

SBIR project will be commercialized immediately after Phase II completion.

Commercial Applications: Due to the unique technical advantages over competing 

technologies, the high density cryogenic probe station under development will find a number of 

applications in NIST testing sensors and electronic components for industrial materials analysis, 

nuclear security, concealed weapons detection, astrophysics as well as for testing classical and 

quantum processors employing superconducting elements. A similar need for such a solution 

exists at DoD, where a number of DoD laboratories and OEMs are using various sensors 

operating at cold temperatures as well as developing signal processing hardware employing 

superconducting elements. 

Topic: Advanced Sensing for Manufacturing 

Subtopic: Design of Fiber-coupled Waveguide Difference Frequency Generation Devices
Title: Fiber Pigtailed On-Chip Mid-infrared Difference Frequency Generation in Silicon

OU: Material Measurement Laboratory

Firm: Omega Optics Inc. 

8500 Shoal Creek Blvd. 

Austin, TX 78757 

Principal Investigator: Swapnajit Chakravarty

Phone: (512) 996-8833 

Email: Swapnajit.chakravarty@omegaoptics.com

Award Amount: $299,240 

Abstract: We propose a fiber-pigtailed strained silicon platform for tunable difference frequency 

generation (DFG) in mid-infrared (MIR) with tunable continuous wave near-infrared (NIR) 

sources. Stress exerted by silicon nitride induces second-order nonlinear susceptibility c(2) on 

underlying centro-symmetric silicon. NIR light is coupled into silicon and MIR light is coupled 

out of silicon using sub-wavelength grating couplers respectively. Phase I research showed 

feasibility of low fiber insertion loss and low propagation loss silicon waveguides on the siliconon-insulator platform at NIR pump and signal and MIR idler wavelengths. Quasi phase matching 

(QPM) will be employed with periodically patterned strained silicon nitride induced c(2) to 

generate efficient DFG. Preliminary QPM designs indicates potential to achieve conversion 

efficiency 11.67%W-1 in periodic tensile strained and 47.15%W-1 in periodic tensile and 

compressive strained silicon nitride with c(2) ~ 40pm/V in a silicon waveguide of effective 

length 1.3cm. Periodic DC electric field induced c(2) effects will also be studied. Two-photon 

absorption (TPA) and particularly TPA induced MIR free carrier absorption will be controlled by 

experimentally demonstrated p-i-n geometries that reduce silicon free carrier lifetime from nanoseconds to picoseconds. The DFG source will be integrated with previously demonstrated silicon 

based slotted slow light absorbance sensor for commercialization success.

Commercial Applications: Frequency-mixed MIR can be generated over a much wider 

wavelength range than that possible from a single quantum cascade (QCL) or interband cascade 

laser (ICL). Tunable silicon chip integrated MIR sources are very desirable for Omega Optics’ 

MIR silicon based on-chip absorption spectroscopy applications by slow light enhanced 

chemical sensing and biosensing. The generalized design of the proposed versatile technology 

implies possible implementation in multiple areas and markets such as food, air and water 

quality, health, environment and national security via integration with demonstrated silicon 

passive sensors. Research will enable a CMOS compatible tunable MIR source for diverse 

applications. 

Topic: Biomanufacturing 

Subtopic: Measurement Tools to Advance the Development and Manufacturing of Biologic 

Medicines
Title: Horizon: Validation of an Improved Method for Rapid Characterization of Protein 

Aggregates in Biologic Drugs for Increased Quality and Safety 

OU: Material Measurement Laboratory

Firm: OptoFluidics, Inc.

3711 Market Street 

Philadelphia, PA 19104 

Principal Investigator: Robert Hart

Phone: (215) 253-5777 

Email: hart@opfluid.com

Award Amount: $299,987.45 

Abstract: Optofluidics proposes to complete the development of the Horizon technology and 

carry out validation via a comprehensive multi-site study. The technology is a subvisible particle 

analyzer pioneered during Phase I. The technology is designed to fill two critical gaps in 

biopharmaceutical product development: (1) Scientists can count and image particles with 

current tools, but they cannot easily identify them which hampers their ability to minimize or 

eliminate them. (2) Early on in product development where sample volumes are extremely 

limited, particle analysis is rarely carried out, despite the desire to do so. This is because of the 

large volume requirements and the slow nature of current techniques. The Horizon technology 

addresses these problems with a new imaging technique that can differentiate between important 

classes of particles. The analysis uses a tenth the volume of current techniques, is at least 10 

times faster and is fully automated. The proposed research will involve internal validation 

followed by a multi-site study to show robustness and demonstrate the utility of the technique on 

real pharmaceutical samples at GSK. Horizon will speed up biopharma product development 

time and improve the quality and safety of biotherapeutics by enabling routine particle 

identification.

Commercial Applications: The proposed Horizon instrument will revolutionize the bioprocess 

analytical market by allowing researchers to conduct high throughput sub-visible particle 

screening studies at the earliest of formulation stages, a much-needed capability for the rapidly 

growing $160B biopharm industry. Targeted customers are biopharmaceutical formulation labs 

who are frustrated with their current sample hungry particle analysis tools, since they prohibit 

early stage particle research and do not enable the specific detection of protein aggregates, the 

most common and important particulate in bioformulation. After it is validated in the 

biopharmaceutical analytical vertical, we will expand to other niche markets including spray 

dried pharmaceutical analysis.

Topic: Advanced Sensing for Manufacturing 

Subtopic: Quantitative Magnetometry of Single Nanoparticles with High Throughput 
Title: High-Throughput Single-Nanoparticle Magnetic Analysis Platform Using Diamond 

Magnetic Imaging

OU: Center for Nanoscale Science and Technology

Firm: Quantum Diamond Technologies, Inc. 

28 Dane Street

Somerville, MA 02143 

Principal Investigator: Colin Connolly 

Phone: 617-440-4484 

Email: cconnolly@quantumdiamondtech.com

Award Amount: $300,000 

Abstract: Magnetic nanoparticles are widely-used tools over a range of industries, but have 

particularly powerful biomedical applications for clinical and research diagnostics, clinical 

therapy, and basic life science research. Many of these applications require consistent sources for 

magnetic nanoparticles with narrow distributions of magnetic properties, but no technology is 

now commercially available for manufacturers or users to quantify single-particle magnetic 

properties with sufficient throughput to provide cost-effective, efficient quality control.

Quantum Diamond Technologies has developed a high-throughput magnetic nanoparticle 

analysis platform using magnetic imaging with quantum defects in diamond. Our system can 

quantitatively analyze, with high sensitivity and precision, thousands of magnetic nanoparticles 

in parallel in a matter of minutes with a simple benchtop system. Following our Phase I 

feasibility study, in this work we will construct an automated prototype for rapid measurements 

of single-particle magnetization curve data, including magnetic susceptibility, magnetic 

remanence, and coercivity, key parameters for magnetic particle analysis. We will validate our 

prototype through comparisons to high-resolution micrographs and conventional bulk magnetic 

particle measurements. QDTI’s high-throughput, single-particle analytical capability will fill a 

major gap in current instrumentation, with a low-cost, small-footprint device.

Commercial Applications: Magnetic particle products for immunoassays comprise a $1 billion 

market. A lack of cost-effective commercial technology for high-throughput single-particle 

analysis impedes robust quality control, which hinders reproducibility and stymies novel 

innovative uses for magnetic particles. A benchtop particle analysis system with low cost and 

high throughput will enable particle manufacturers to perform needed testing and reporting of 

magnetic particle uniformity and monitor lot-to-lot variation, adding value to their particle 

product offerings and providing a means for competitive differentiation and industry 

standardization. Particle users will benefit from a low-cost means to directly probe distributions 

of particle parameters critical to application performance.

Topic: Advanced Sensing for Manufacturing 
Subtopic: Object Identification and Localization via Non-Contact Sensing for Enhancing 

Robotic Systems in Manufacturing Operations 

Title: Visual Part Identification, Localization, and Manipulation with Deep Networks 

OU: Engineering Laboratory 

Firm: Symbio Robotics, Inc. 

1368 Park Ave. 

Emeryville, CA 94608 

Principal Investigator: Jonathan L Long 

Phone: (301) 437-9638 

Email: jon@symb.io

Award Amount: $299,587.16 

Abstract: During Phase I, Symbio Robotics conducted initial development of a robust, real-time, 

high-performance, low-cost perception engine made possible by recent advances in deep 

learning. This system identifies parts in 2D or 3D images and determines their six degree-offreedom poses, producing a full description of a scene in a fraction of a second. For this 

technology to be practically useful in manufacturing, thresholds of accuracy and reliability must 

be met, and perceptual inferences must be integrated with robust manipulator actions. In Phase 

II, Symbio will develop our system into a practical, complete sensory picking solution. The keys 

to executing this plan will be integration of information across multiple sensors and multiple 

images, learned grasp and motion planning, and new methods of robotic data collection. Building 

a multi-robot testbed will enable rapid iteration and real-world image and haptic data acquisition. 

Commercial Applications: Rising global labor costs have spurred a new wave of interest in 

industrial automation. The future generation of industrial automation systems must be highly 

flexible and adaptable to greater variability and faster product cycles. To meet these demands, 

manufacturers and systems integrators will require robust, fast, and low-cost perception systems 

which will serve as a core part of factory automation. Recent advances in perception have 

opened a new regime of accurate and robust performance, with the as yet unfulfilled potential to 

transform all sensory-driven parts of manufacturing. 

Topic: Cyber Physical Systems 

Subtopic: Novel Methods for Determining Commercial Building Envelope Airtightness 

Title: Air Movement Efficiency Monitor 

OU: Engineering Laboratory 
Firm: XCSpec

300 Riviera Circle 

Larkspur, CA 9439 

Principal Investigator: Peter Peterson

Phone: (415) 203-4341 

Email: pop@xcspec.com

Award Amount: $298,975 

Abstract: The Air Movement Efficiency Monitor is composed of small, inexpensive 

Microelectromechanical system (MEMS) sensors, connected wirelessly to the Internet, and 

distributed through a building to measure pressure readings at key points. We consider this a 

“FitBit” for a building’s air-movement efficiency, employing many of the sensors used by a fitbit 

– temperature, humidity, acceleration. We expand on that concept and incorporate new emerging 

sensors from the drone and wearables industries, allowing our system to capture high-resolution 

absolute and differential pressure data, along with information from the fan shaft speed. These 

various sensors are deployed on a multi-sensor module and connected wirelessly to the system – 

exposing this previously hidden information at an affordable cost, with a small form factor and 

low power profile. This information is continuously monitored and can be used for a number of 

applications including: duct leakage, air balancing and fan efficiency measurement. The 

aggregated data is curated using flow network model simulations to calculate envelope leakage 

and duct leakage for the building, along with alerts or alarms to maintenance, building occupants 

or building managers. This “Performance” based approach to building efficiency provides a 

EM&V basis for more sustainable energy savings. 

Commercial Applications: Commercial buildings are plagued by uncontrolled air movement 

and leakage through the buildings shell and air distribution ducts. Uncontrolled airflow leads to 

major increases in energy and operating costs. Existing methods to determine duct leakage are 

expensive and disruptive to the occupants. The Air Movement Efficiency Monitor is an in-situ 

monitor that can be installed with minimal disruption to the building occupants and left to collect 

continuous time-series data on building and duct leakage. This information is used to determine 

the ROI for energy upgrades to existing buildings, leading to improve energy performance and 

lower operating costs.