[Federal Register Volume 75, Number 180 (Friday, September 17, 2010)]
[Notices]
[Page 56986]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-23347]


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DEPARTMENT OF COMMERCE

International Trade Administration


Argonne National Laboratory, et al.; Notice of Decision on 
Applications for Duty-Free Entry of Scientific Instruments

    This is a decision pursuant to Section 6(c) of the Educational, 
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301). 
Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 
3720, U.S. Department of Commerce, 14th and Constitution Ave., NW., 
Washington, DC.
    Comments: None received. Decision: Approved. We know of no 
instruments of equivalent scientific value to the foreign instruments 
described below, for such purposes as this is intended to be used, that 
was being manufactured in the United States at the time of its order.
    Docket Number: 10-052. Applicant: Argonne National Laboratory, 
University of Chicago Argonne, Lemont, IL 60439. Instrument: Pilatus 2M 
Pixel Detector System. Manufacturer: Dectris Ltd., Switzerland. 
Intended Use: See notice at 75 FR 51239, August 19, 2010. Reasons: The 
instrument will be used to obtain fine structural information for 
materials during chemical reactions, such as catalysis. The instrument 
has gatable data processing as well as high time resolution and high 
spatial resolution, which makes the instrument unique. Other unique 
features include direct detection of x-rays in single-photon-counting 
mode, a radiation-tolerant design, a high dynamic range, a short 
readout time, high frame rates, high counting rates, and shutterless 
operation.
    Docket Number: 10-053. Applicant: Argonne National Laboratory, 
University of Chicago Argonne, Lemont, IL 60439. Instrument: UHV Low-
Temperature Atomic Force Microscope System for Application in High 
Magnetic Fields. Manufacturer: Omicron Nanotechnology, Germany. 
Intended Use: See notice at 75 FR 51239, August 19, 2010. Reasons: The 
instrument will be used to study atomic scale electrical and magnetic 
properties of electrically conduction as well as insulation 
nanostructures prepared by in situ deposition onto clean surfaces. In-
situ capacities allow the preparation of clean and well-defined 
nanostructures on pristine surfaces which would contaminate otherwise. 
Unique features of this instrument include the capability of applying 
large magnetic fields (>3 Tesla), which is necessary to allow the clear 
separation of structural, electronic, and magnetic signals of 
nanostructures and the evaluation of the properties to be studied in 
these experiments. The instrument also has in-situ preparation 
capability and the ability to operate in low temperatures. Further, the 
instrument is capable of performing imaging in two main modes of 
operation, i.e., scanning tunneling microscopy and atomic force 
microscopy.

     Dated: September 10, 2010.
Gregory W. Campbell,
Acting Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2010-23347 Filed 9-16-10; 8:45 am]
BILLING CODE 3510-DS-P