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                            Library & Multimedia
 Theory of Surface-Enhanced Raman Scattering in Semiconductors
NCJ Number
              304220
Journal

*Journal of Physical Chemistry C* Volume: 118 Issue: 20 Dated: 2014 Pages: 11120–11130
Author(s)
          John R. Lombardi;
                        Ronald L. Birke
Date Published

2014
Length
              11 pages
Annotation
              This article reports on a project that developed an analytical expression for the lowest order non-zero contribution to the surface-enhanced Raman spectrum from a system composed of a molecule adsorbed on a semiconductor nanoparticle.
Abstract
              Researchers considered a combined molecule-semiconductor system and included Herzberg–Teller vibronic coupling of the zero-order Born–Oppenheimer states. This followed a previous derivation for metallic SERS, but instead of a Fermi level, the semiconductor system involved a band gap, and researchers found that the SERS enhancement was maximized at either the conduction or valence band edge. The resulting expression may be regarded as an extension of the Albrecht A-, B-, and C-terms and shows that the SERS enhancement is caused by several resonances in the combined system, namely, surface plasmon, exciton, charge-transfer, and molecular resonances. These resonances are coupled by terms in the numerator, which provide strict selection rules that enabled researchers to test the theory and predict the relative intensities of the Raman lines. Furthermore, by considering interactions of the various contributions to the SERS enhancement, researchers were able to develop ways to optimize the enhancement factor by tailoring the semiconductor nanostructure, thereby adjusting the location of the various contributing resonances. (publisher abstract modified)
      
  
          Additional Details
Grant Number(s)
        2009-DN-BX-K185


  
  
        
  Agencies
        NIJ-Sponsored


  
  
        
  Award
        Development Of Advanced Raman Spectroscopy Methods And Databases For The Evaluation Of Trace Evidence And The Examination Of Questioned Documents-Phase II
    
  
  
Date Published: January 1, 2014
    
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