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                            Library & Multimedia
 Metal–Semiconductor Contacts Induce the Charge-Transfer Mechanism of Surface-Enhanced Raman Scattering
NCJ Number
              304214
Journal

*Journal of Physical Chemistry C* Volume: 115 Issue: 37 Dated: 2011 Pages: 18378-18383
Author(s)
          Zhu Mao;
                        et al
Date Published

2011
Length
              6 pages
Annotation
              Using a model metal–semiconductor–molecule–metal assembly  designed for probing the charge-transfer (CT) mechanism of surface-enhanced Raman scattering (SERS), the current project measured the SERS of ZnO–PATP–Ag, Au–ZnO–PATP–Ag, and Cu–ZnO–PATP–Ag assemblies at excitation wavelengths of 514.5, 785, and 1064 nm.
Abstract
              The results demonstrate that the metal–semiconductor contact can alter the charge distribution through p-aminothiophenol (PATP) molecules. This is attributed to the chemical SERS enhancement mechanism with additional electrical transport properties within these assemblies. These inhibit the CT from the metal to the molecule, resulting in the different degrees to which CT contributes to the overall SERS enhancement of PATP. (publisher abstract modified)
      
  
          Additional Details
Grant Number(s)
        2006-DN-BX-K034


  
  
        
  Agencies
        NIJ-Sponsored


  
  
        
  Award
        Development of Advanced Raman Spectroscopy Methods and Databases for the Evaluation of Trace Evidence and the Examination of Questioned Documents
    
  
  
Date Published: January 1, 2011
    
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