[Federal Register Volume 73, Number 161 (Tuesday, August 19, 2008)]
[Notices]
[Page 48374]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E8-19172]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Maryland, et al.
�MDBU�*ERR01*�MDNM�
Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Scientific Instruments

This is a decision pursuant to Section 6(c) of the Educational, 
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, as amended by Pub. .106-36; 80 Stat. 897; 15 CFR part 301). 
Related records can be viewed between 8:30 A.M. and 5:00 P.M. in Room 
2104, U.S. Department of Commerce, 14th and Constitution Ave, NW, 
Washington, D.C.
Comments: None received. Decision: Approved. We know of no instruments 
of equivalent scientific value to the foreign instruments described 
below, for such purposes as each is intended to be used, that was being 
manufactured in the United States at the time of its order.
Docket Number: 08-032. Applicant: University of Maryland, Institute for 
Research in Electronics and Applied Physics, College Park, MD 20742. 
Instrument: Atomic Layer Deposition System. Manufacturer: Beneq Oy, 
Finland. Intended Use: See notice at 73 FR 45209, August 4, 2008. 
Reasons: This instrument is able to accommodate a variety of substrates 
of dissimilar sizes and shapes, including medical implants and flexible 
integrated circuits. The instrument also is able to accommodate 3-D 
samples and has a minimum of six sources per reactor. These features 
are required for the research.
Docket Number: 08-036. Applicant: University of Maryland, College Park, 
MD 20742. Instrument: Low Temperature Near Field Confocal Optical 
Microscope. Manufacturer: Nanonics Imaging Ltd, Israel. Intended Use: 
See notice at 73 FR 45209, August 4, 2008. Reasons: The instrument has 
the following features which are essential in performing the research: 
simultaneous NSOM/AFM/Confocal imaging, normal force sensing open 
system architecture (transmission, reflection and collection modes), 
temperature continuously adjustable from 8K to 300K, 5x10[hzbar][bds8] 
Torr high vacuum capability, large scanning range (50[micro]m in the Z 
direction), fine NSOM spatial resolution (~50nm), multi-probe 
capability for independent pump probe measurement control, fast 
temporal resolution (~300fs).
Docket Number: 08-038. Applicant: Washington State University, Pullman, 
Washington 99164-7040. Instrument: Piezoelectric Microarray Spotter. 
Manufacturer: Scienion AG, Germany. Intended Use: See notice at 73 FR 
45209, August 4, 2008. Reasons: The instrument has a unique feature 
which is a non-contact spotter to avoid interference from dust and 
sensitivity to shifts in relative humidity. Another essential feature 
is that the instrument is able to be used as a liquid handling robot.
Docket Number: 08-039. Applicant: University of Michigan-Dearborn, 
Dearborn, MI 48128. Instrument: X-Ray Computer Tomography System. 
Manufacturer: Phoenix X-Ray Inc., Germany. Intended Use: See notice at 
73 FR 45209, August 4, 2008. Reasons: The instrument has an X-ray tube 
power high enough to penetrate metal alloy specimens which is required 
for the research. It also has a relatively high resolution which is 
also essential to the research.

    Dated: August 13, 2008.
Faye Robinson,
Director, Statutory Import Programs Staff, Import Administration.
[FR Doc. E8-19172 Filed 8-18-08; 8:45 am]
BILLING CODE 3510-DS-S