29346 Federal Register / Vol. 61, No. 112 / Monday, June 10, 1996 / Notices

People’s Republic of China (59 FR

22585, May 2, 1994)).

The Department issued its

preliminary results for the third

administrative review of TRB’s from the

PRC on October 4, 1991 (Preliminary

Results of Antidumping Duty

Administrative Review: Tapered Roller

Bearings and Parts Thereof From the

People’s Republic of China (56 FR

50309, Oct. 4, 1991)). The Department

preliminarily issued separate rates to all

reviewed companies. Id. at 50310.

On December 31, 1991, the

Department issued its final results

(Final Results of Antidumping Duty

Administrative Review: Tapered Roller

Bearings and Parts Thereof From the

People’s Republic of China (56 FR

67590, Dec. 31, 1991)). The Department

issued separate rates for all companies

participating in the review. For nonreviewed companies, the Department

issued ‘‘an ‘all others’ rate equal to the

highest rate for any company in this

administrative review.’’ Id. at 67597.

Interested parties challenged the

results of the third administrative

review. On December 5, 1994, the CIT

issued its opinion in UCF America v.

United States, 870 F. Supp. 1120 (CIT

1994), remanding the results to the

Department. The CIT instructed the

Department to: (1) Reinstate the ‘‘all

others’’ cash deposit rate to unreviewed

companies which was applicable prior

to the final results for entries which

have not become subject to assessment

pursuant to a subsequent administrative

review; and (2) eliminate the arithmetic

error with regard to Jilin’s foreign inland

freight costs.

The Department filed its remand

results on March 6, 1995. In the remand

results, the Department: 1) reinstated

the PRC rate for the third review at 2.96

percent and 2) corrected the error in the

foreign inland freight calculation for

Jilin. However, the Department stated

that while it agreed that it incorrectly

established an ‘‘all others’’ rate of 8.83

percent in the final results of the review,

its reasoning differed from that of the

Court.

On February 27, 1996, the Court

sustained the Department’s remand

results (see UCF America Inc. and

Universal Automotive Co., Ltd. v.

United States and the Timken

Company, Cons. Ct. No. 92–01–00049,

Slip Op. 96–42). The Court stated that

it ‘‘sees no basis for a ‘PRC rate’ but

finds that Commerce properly (1)

reinstated the ‘all others’ cash deposit

rate of 2.96% to unreviewed companies

for entries which have not become

subject to assessment pursuant to a

subsequent administrative review; and

(2) corrected the arithmetic error related

to foreign inland freight costs for Jilin

Machinery Import and Export

Corporation.’’ Thus, the Court sustained

the rate applied by the Department but

rejected the ‘‘PRC rate’’ terminology.

On March 29, 1996, the Department

published a notice of court decision

pursuant to 19 U.S.C. 1516a(e). Court

Decision and Suspension of Liquidation:

1989–1990 Administrative Review of

Tapered Roller Bearings and Parts

Thereof from the People’s Republic of

China (61 FR 14075). In that notice, we

stated that we would suspend

liquidation until there was a

‘‘conclusive’’ decision in the action.

Since publication of that notice, the

period to appeal has expired and no

appeal was filed. Therefore, as there is

now a final and conclusive court

decision in this action, we are amending

our final results.

Although the Department respectfully

disagrees with the Court’s reasoning on

the issue of the applicability of an ‘‘all

others’’ rate to non-market economy

cases, this issue could not be appealed

in this case. The Department will appeal

this issue in the first action where it

amounts to a case or controversy.

Amendment to Final Determination

Pursuant to 19 U.S.C. 1516a(e), we are

now amending the final results in the

1989–90 administrative review of

tapered roller bearings and parts thereof

from the People’s Republic of China.

The recalculated margins are as

follows:

Manufacturer/Producer/Exporter

WeightedAverage

Margin Percentage

Jilin ............................................ 7.07

All Others Rate ......................... 2.96

The Department shall instruct the

U.S. Customs Service to change the cash

deposit and assessment rates in

accordance with the above rates.

Dated: June 4, 1996.

Paul L. Joffe,

Acting Assistant Secretary for Import

Administration.

[FR Doc. 96–14604 Filed 6–7–96; 8:45 am]

BILLING CODE 3510–DS–M

University of California, et al.; Notice of

Consolidated Decision on Applications

for Duty-Free Entry of Electron

Microscopes

This is a decision consolidated

pursuant to Section 6(c) of the

Educational, Scientific, and Cultural

Materials Importation Act of 1966 (Pub.

L. 89–651, 80 Stat. 897; 15 CFR part

301). Related records can be viewed

between 8:30 A.M. and 5:00 P.M. in

Room 4211, U.S. Department of

Commerce, 14th and Constitution

Avenue, N.W., Washington, D.C.

Docket Number: 95–124. Applicant:

University of California, Berkeley, CA

94720. Instrument: Electron Microscope,

Model EM 300. Manufacturer: Philips,

The Netherlands. Intended Use: See

notice at 61 FR 6629, February 21, 1996.

Order Date: January 31, 1995.

Docket Number: 95–127. Applicant:

Armstrong Laboratory, Brooks AFB, TX

78235–5118. Instrument: Electron

Microscope, Model CM 120.

Manufacturer: Philips, The Netherlands.

Intended Use: See notice at 61 FR 6630,

February 21, 1996. Order Date: April 28,

1995.

Docket Number: 96–003. Applicant:

Mount Holyoke College, South Hadley,

MA 01075. Instrument: Electron

Microscope, Model CM100.

Manufacturer: Philips, The Netherlands.

Intended Use: See notice at 61 FR 8041,

March 1, 1996. Order Date: July 18,

1995.

Docket Number: 96–005. Applicant:

Scripps Research Institute, La Jolla, CA

92037. Instrument: Electron Microscope,

Model CM120. Manufacturer: Philips,

The Netherlands. Intended Use: See

notice at 61 FR 8042, March 1, 1996.

Order Date: August 29, 1995.

Docket Number: 96–006. Applicant:

The Scripps Research Institute, La Jolla,

CA 92037. Instrument: Electron

Microscope, Model CM 200.

Manufacturer: Philips, The Netherlands.

Intended Use: See notice at 61 FR

11613, March 21, 1996. Order Date:

August 29, 1995.

Docket Number: 96–009. Applicant:

New York University Medical Center,

New York, NY 10016. Instrument:

Electron Microscope, Model CM 200.

Manufacturer: Philips, The Netherlands.

Intended Use: See notice at 61 FR

11613, March 21, 1996. Order Date: July

27, 1995.

Comments: None received. Decision:

Approved. No instrument of equivalent

scientific value to the foreign

instrument, for such purposes as these

instruments are intended to be used,

was being manufactured in the United

States at the time the instruments were

ordered. Reasons: Each foreign

instrument is a conventional

transmission electron microscope

(CTEM) and is intended for research or

scientific educational uses requiring a

CTEM. We know of no CTEM, or any

other instrument suited to these

purposes, which was being

manufactured in the United States

either at the time of order of each

instrument or at the time of receipt of
Federal Register / Vol. 61, No. 112 / Monday, June 10, 1996 / Notices 29347

application by the U.S. Customs

Service.

Frank W. Creel,

Director, Statutory Import Programs Staff.

[FR Doc. 96–14620 Filed 6–7–96; 8:45 am]

BILLING CODE 3510–DS–F

University of South Florida, et al.;

Notice of Consolidated Decision on

Applications for Duty-Free Entry of

Scientific Instruments

This is a decision consolidated

pursuant to Section 6(c) of the

Educational, Scientific, and Cultural

Materials Importation Act of 1966 (Pub.

L. 89–651, 80 Stat. 897; 15 CFR part

301). Related records can be viewed

between 8:30 A.M. and 5:00 P.M. in

Room 4211, U.S. Department of

Commerce, 14th and Constitution

Avenue, N.W., Washington, D.C.

Comments: None received. Decision:

Approved. No instrument of equivalent

scientific value to the foreign

instruments described below, for such

purposes as each is intended to be used,

is being manufactured in the United

States.

Docket Number: 95–041R. Applicant:

University of South Florida, St.

Petersburg, FL 33701. Instrument: ICP

Mass Spectrometer, Model PlasmaQuad.

Manufacturer: Fisons Instruments,

United Kingdom. Intended Use: See

notice at 60 FR 31144, June 13, 1995.

Reasons: The foreign instrument

provides: (1) sensitivity of 20×107

counts sec¥1 ppm¥1 at mass 115, (2) an

abundance sensitivity adjustable

between 5×10¥7 and 1×10¥7 at mass 23,

and (3) a detection limit of 2 ppt for Be.

Advice Received From: The National

Institutes of Health, March 21, 1996.

Docket Number: 95–113. Applicant:

Albert Einstein College of Medicine,

Bronx, NY 10461. Instrument: Xenon

Flash Lamp. Manufacturer: Hi-Tech

Ltd., United Kingdom. Intended Use:

See notice at 60 FR 64157, December 14,

1995. Reasons: The foreign instrument

provides: (1) high-precision quartz

optics to permit transmission rates of

97–99% in the UV range, (2)

optocoupled isolation and shielded

electronics for low-noise, and (3)

integrated lamphouse with optics and

changeable filters. Advice Received

From: The National Institutes of Health,

March 28, 1996.

Docket Number: 95–120. Applicant:

Albert Einstein College of Medicine,

Bronx, NY 10461. Instrument: StoppedFlow Spectrophotometer, Model

SX.17MV. Manufacturer: Applied

Photophysics Ltd., United Kingdom.

Intended Use: See notice at 61 FR 4768,

February 8, 1996. Reasons: The foreign

instrument provides: (1) an optical

diode array for collecting time

dependent absorption spectra from

single drive experiments, (2) full

anaerobic capability, and (3) multitasking software with numerical

integration capabilities. Advice

Received From: The National Institutes

of Health, March 20, 1996.

Docket Number: 95–121. Applicant:

University of California, Santa Barbara,

Santa Barbara, CA 93106. Instrument:

RF Reactive Atom Source.

Manufacturer: Oxford Applied

Research, United Kingdom. Intended

Use: See notice at 61 FR 6629, February

21, 1996. Reasons: The foreign

instrument provides an ion beam with:

(1) less kinetic energy to minimize

damage to nitride thin-film substrates,

and (2) less electromagnetic interference

with associated instruments than

electron cyclotron resonance ion

sources. Advice Received From: The

Naval Research Laboratory and a

domestic manufacturer of related

instruments, March 28, 1996.

Docket Number: 95–125. Applicant:

Pennsylvania State University,

University Park, PA 16802. Instrument:

Dilution Refrigerator/Gradient Magnet

System, Model KelvinOx100.

Manufacturer: Oxford Instruments, Inc.,

United Kingdom. Intended Use: See

notice at 61 FR 6629, February 21, 1996.

Reasons: The foreign instrument

provides: (1) a superconducting magnet

yielding up to 30T/m magnetic field

gradient in a 8T homogeneous field, (2)

13mm access port for top-loading

samples, and (3) IEEE interface for

computer controlled operation. Advice

Received From: The National Institutes

of Health, March 20, 1996.

Docket Number: 95–126. Applicant:

University of Florida, Gainesville, FL

32611–7200. Instrument: Electron

Paramagnetic Resonance Spectrometer,

Model ESP 300E–10/2.7. Manufacturer:

Bruker Analytische Messtechnik GmbH,

Germany. Intended Use: See notice at 61

FR 6630, February 21, 1996. Reasons:

The foreign instrument provides: (1) the

ability to perform time-resolved EPR

experiments at 10 ns time-resolution, (2)

preamplifier bandwith up to 200 MHz,

and (3) a microwave source with signal/

noise of 300:1 and wide dynamic range

to 60 dB. Advice Received From: The

National Institutes of Health, March 21,

1996.

Docket Number: 96–002. Applicant:

DHHS/Food and Drug Administration,

Jefferson, AR 72079. Instrument: ICP

Mass Spectrometer, Model PlasmaQuad

XR. Manufacturer: Fisons Instruments,

United Kingdom. Intended Use: See

notice at 61 FR 8041, March 1, 1996.

Reasons: The foreign instrument

provides a time resolved data

acquisition and analysis system and

software permitting capture of mass

spectra in time slices. Advice Received

From: The National Institutes of Health,

March 25, 1996.

Docket Number: 96–004. Applicant:

University of California at Berkeley,

Berkeley, CA 94720. Instrument: Mass/

Energy Spectrometer. Manufacturer:

Hiden Analytical Ltd., United Kingdom.

Intended Use: See notice at 61 FR 8042,

March 1, 1996. Reasons: The foreign

instrument provides a specialized mass

spectrometer for diagnostic analysis of

low energy (0–30 eV kinetic energy) and

high purity (>99.9999%) activated

nitrogen sources for the growth of GaN

thin films. Advice Received From: The

Naval Research Laboratory, March 28,

1996.

Docket Number: 96–007. Applicant:

U. S. Department of Commerce, NOAA,

Boulder, CO 80303. Instrument: Stable

Isotope Mass Spectrometer, Model

OPTIMA. Manufacturer: Fisons

Instruments, United Kingdom. Intended

Use: See notice at 61 FR 8042, March 1,

1996. Reasons: The foreign instrument

provides: (1) a dual viscous inlet to

permit analysis of up to 56 samples

without the need for operator

intervention, (2) absolute sensitivity for

CO2 of one mass-44 ion per 1000

molecules, and (3) instrument

resolution (M/δM) equal to or greater

than 100 utilizing 10% valley

definition. Advice Received From: The

National Institutes of Health, March 27,

1996.

Docket Number: 96–010. Applicant:

University of New Mexico,

Albuquerque, NM 87131. Instrument:

Mass Spectrometer, Model VG Sector

54. Manufacturer: Fisons Instruments,

United Kingdom. Intended Use: See

notice at 61 FR 11613, March 21, 1996.

Reasons: The foreign instrument

provides: (1) a wide aperture retarding

potential filter with a sensitivity of 20

ppb, (2) a Daly multiplier ion-counting

detector with additional analog mode

capability, and (3) gain stability of better

than 0.1%/hr. Advice Received From:

The National Institutes of Health, March

27, 1996.

Docket Number: 96–011. Applicant:

National Institute of Standards and

Technology, Gaithersburg, MD 20899–

0001. Instrument: Laser Tracker, Model

SMART 310. Manufacturer: Leica Inc.,

Switzerland. Intended Use: See notice at

61 FR 11614, March 21, 1996. Reasons:

The foreign instrument provides an offthe-shelf servo-controlled tracking,

laser-based interferometric coordinate

measuring system of proprietary design

for remotely measuring the dimensional

accuracy of large objects. Advice