U.S. flagAn official website of the United States government
                    Here's how you know **Official websites use .gov**
                            
                            A **.gov** website belongs to an official government organization in the United States.
 **Secure .gov websites use HTTPS**
                            
                            A **lock** (                            
                              A locked padlock                                                      
                            
                            ) or **https://** means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.


Menu Agricultural Research Service
						
                    U.S. DEPARTMENT OF AGRICULTURE
 Crop Production and Pest Control Research: West Lafayette, IN
 close



    Research

                    Research Projects
                                    Publications
                                    Collaborations
                                    News
                People

                    Staff Listing
                                    CareersSearch small
                    Search
            
            ARS Home
                                About ARS
                                Contact Us




ARS Home Midwest Area West Lafayette, Indiana Crop Production and Pest Control Research Research Publications at this Location





- ARS National Programs
- Search for a scientific manuscript
- Search for a research project
- ARS Software
- Programs and Projects
- Collaborations
- Subjects of Investigation
- Publications
- Small Grains Viral Disease Laboratory
- Corn and Sorghum Fungal Disease Laboratory
- Host Plant Resistance to Insects Laboratory
- Wheat/Hessian fly Interactions Laboratory
- Small Grains Fungal Disease Laboratory
- Soybean Quality Improvement Laboratory
- Uniform Soybean Tests, Northern Region

Title:   Author  item
                                            Goodwin, Stephen

                                                         - *Steve*item
                                            Adhikari, Tika
  Submitted to: Wheat Genetics International Symposium Proceedings
                                    Publication Type: Proceedings
                                    Publication Acceptance Date: 9/2/2003
                                    Publication  Date: 9/2/2003
                                    Citation: Goodwin, S.B., Adhikari, T. 2003. Molecular markers linked to genes for resistance to septoria tritici leaf blotch in wheat. In: Proceedings of the Tenth International Wheat Genetics Symposium, September 1-6, 2003, Paestum, Italy. 3:1142-1144.Interpretive Summary: Septoria tritici leaf blotch (STB), caused by the fungus Mycosphaerella graminicola (asexual stage: Septoria tritici), is one of the most important diseases of wheat worldwide.  Although at least seven major genes for resistance are known, breeding for resistance against STB is complicated by the long latent period of the disease and lack of defined tester isolates needed to transfer multiple resistance genes into a single wheat cultivar.  These problems could be overcome by molecular markers linked to the resistance genes, but these are only recently available for three of the resistance genes.  The map locations of the four remaining resistance genes are not known and no molecular markers are available which greatly limits their utility for plant breeding programs.  To identify linkages, segregating populations of wheat were developed and screened for disease resistance and a variety of molecular markers.  These analyses allowed mapping of the four previously identified resistance genes Stb1-Stb4 and a new gene, Stb8.  Another potentially new gene was identified but not yet mapped.  Each of the mapped resistance genes is located on a different wheat chromosome except for Stb4 and Stb5, which are both near the center of chromosome 7D.  This information will be of great interest to plant pathologists, geneticists and wheat breeders.  Identification of their map locations and closely linked molecular markers solves a long-standing problem and should facilitate the incorporation of these resistance genes into improved wheat cultivars worldwide.
                                Technical Abstract: Septoria tritici leaf blotch (STB), caused by the ascomycete fungus Mycosphaerella graminicola (asexual stage: Septoria tritici), is one of the most important diseases of wheat worldwide.  Although several major genes for resistance are known, breeding for resistance against STB is complicated by the long latent period of the disease and lack of defined tester isolates needed to construct gene pyramids.  These problems could be overcome by molecular markers linked to the resistance genes.  To identify linked loci, segregating populations were developed and screened for polymorphism by bulked segregant analysis of amplified fragment length polymorphism and microsatellite markers.  These analyses allowed mapping of the four previously identified resistance genes Stb1-Stb4 and a new gene, Stb8.  Another potentially new gene was identified but not yet mapped.  Three other genes were mapped in other laboratories.  Each of the mapped resistance genes is located on a different wheat chromosome except for Stb4 and Stb5, which are both near the centromere on chromosome 7DS.  Identification of their map locations and closely linked molecular markers solves a long-standing problem and should facilitate the incorporation of these resistance genes into improved cultivars and the construction of gene pyramids for effective control of this disease in the future.


Return to top


Connect with ARS Sign up


ARS Home
                            USDA.gov
                            Plain Writing
                            Policies & Links
                            Civil Rights Statements
                            FOIA
                            Accessibility Statement
                            Privacy Policy
                            Non-Discrimination Statement
                            Quality of Information
                            USA.gov
                            WhiteHouse.gov