12744 Federal Register / Vol. 60, No. 45 / Wednesday, March 8, 1995 / Notices

applications is corrected to read March

24, 1995.

FOR FURTHER INFORMATION, CONTACT:

Demetrice Jenkins at (214) 767–8001.

11.801 Native American Program

(Catalog of Federal Domestic Assistance)

Dated: March 3, 1995.

Donald L. Powers,

Federal Register Liaison Officer, Minority

Business Development Agency.

[FR Doc. 95–5679 Filed 3–7–95; 8:45 am]

BILLING CODE 3510–21–P

Native American Business

Development Center Applications: New

Mexico

AGENCY: Minority Business

Development Agency, Commerce.

ACTION: Correction.

SUMMARY: On page 9665, in the issue

dated February 21, 1995, third column,

second paragraph, the closing date for

applications is corrected to read March

24, 1995.

FOR FURTHER INFORMATION, CONTACT:

Demetrice Jenkins at (214) 767–8001.

11.801 Native American Program

(Catalog of Federal Domestic Assistance)

Dated: March 3, 1995.

Donald L. Powers,

Federal Register Liaison Officer, Minority

Business Development Agency.

[FR Doc. 95–5678 Filed 3–7–95; 8:45 am]

BILLING CODE 3510–21–P

Native American Business

Development Center Applications:

Oklahoma

AGENCY: Minority Business

Development Agency, Commerce.

ACTION: Correction.

SUMMARY: On page 9668, second

column, first paragraph, the closing date

for applications is corrected to read

March 24, 1995.

FOR FURTHER INFORMATION, CONTACT:

Demetrice Jenkins at (214) 767–8001.

11.801 Native American Program

(Catalog of Federal Domestic Assistance)

Dated: March 3, 1995.

Donald L. Powers,

Federal Register Liaison Officer; Minority

Business Development Agency.

[FR Doc. 95–5680 Filed 3–7–95; 8:45 am]

BILLING CODE 3510–21–P

National Institute of Standards and

Technology

Announcement of an Opportunity To

Join a Cooperative Research and

Development Consortium for

Alternative Approaches to NanometerLevel Overlay and CD Metrology for IC

Manufacturing

AGENCY: National Institute of Standards

and Technology, Commerce.

ACTION: Notice of public meeting and

notice of Government owned invention

available for licensing.

SUMMARY: The National Institute of

Standards and Technology (NIST)

invites interested parties to attend a

meeting on April 26, 1995 to discuss the

possibility of setting up a cooperative

research consortium to develop

innovative approaches to overlay and

CD metrology consistent with SIAprojected requirements. Parties

interested in participating in the

consortium should be prepared to invest

adequate resources in the collaboration

and be firmly committed to the goal of

developing innovative approaches.

The program will be within the scope

and confines of The Federal Technology

Transfer Act of 1986 (Public Law 99–

502, 15 U.S.C. 3710a), which provides

Federal laboratories including NIST,

with the authority to enter into

cooperative research agreements with

qualified parties. Under this law, NIST

may contribute personnel, equipment

and facilities—but no funds—to the

cooperative research program.

Members will be expected to make a

contribution to the consortium’s efforts

in the form of materials, equipment,

personnel, and/or funds. The program is

expected to last 18 months. This is not

a grant program.

DATES: Interested parties should contact

NIST to confirm their interest at the

address, telephone number or FAX

number shown below no later than

April 7, 1995.

ADDRESSES: Technology Building, Room

B360, National Institute of Standards

and Technology, Gaithersburg, MD

20899.

FOR FURTHER INFORMATION CONTACT:

Michael W. Cresswell, Telephone: 301–

975–2072; FAX: 301–948–4081.

SUPPLEMENTARY INFORMATION: The

National Institute of Standards and

Technology (NIST) invites interested

parties to participate in a cooperative

research consortium to conduct

modeling of overlay detection by

electrostatic/magnetic sensors

interacting with optical metrology target

architectures commonly used in

advanced IC manufacturing, examine

enhancements deriving from targetgeometry modifications and sensor-head

innovations, design and evaluate a test

implementation using Maxwellequation-based simulation software and,

formulate specifications of a candidate

design for selected applications.

In conjunction with the opportunity

to join this Cooperative Research and

Development Consortium, the following

invention is available for licensing:

NIST Docket No. 94–040CIP

Title: Method and Reference

Standards for Measuring Overlay in

Multilayer Structures, and for

Calibrating Imaging Equipment as Used

in Semiconductor Manufacture.

Description: Imaging instruments for

overlay-measurement extraction from

partially-processed semiconductor

wafers, are calibrated by providing a

reference test structure having features

which can be located by electrical

measurements not subject to toolinduced shift and water-induced shift

experienced by the imaging instrument.

The reference test structure is first

qualified using electrical measurements,

and is then used to provided the effect

of the said shifts on the imaginginstrument measurements.

Dated: March 1, 1995.

Samuel Kramer,

Associate Director.

[FR Doc. 95–5662 Filed 3–7–95; 8:45 am]

BILLING CODE 3510–13–M

Patent and Trademark Office

National Information Infrastructure

(NII) Copyright Awareness Campaign

AGENCY: Patent and Trademark Office,

Commerce.

ACTION: Notice of meeting.

SUMMARY: The Working Group on

Intellectual Property Rights of the White

House Information Infrastructure Task

Force (IITF) issued a preliminary draft

of its report, ‘‘Intellectual Property and

the National Information

Infrastructure,’’ on July 7, 1994. One of

the Working Group’s findings

announced in the preliminary draft is

that effective education of the public

about intellectual property rights is

crucial to the successful development of

the NII. The Working Group recognizes

that the public’s awareness of their own

intellectual property rights, as well as

those of others, will lead to increased

respect for those rights.

In order to effectuate public

awareness of copyright, the preliminary

draft, on page 140, stated that the