Federal Register / Vol. 81, No. 26 / Tuesday, February 9, 2016 / Notices 6831 

Dated: February 2, 2016. 

Julie Lenzer, 

Director, Office of Innovation and 

Entrepreneurship. 

[FR Doc. 2016–02427 Filed 2–8–16; 8:45 am] 

BILLING CODE 3510–WH–P 

DEPARTMENT OF COMMERCE 

International Trade Administration 

University of Minnesota, et al.; Notice 

of Decision on Application for DutyFree Entry of Scientific Instruments 

This is a decision pursuant to Section 

6(c) of the Educational, Scientific, and 

Cultural Materials Importation Act of 

1966 (Pub. L. 89–651, as amended by 

Pub. L. 106–36; 80 Stat. 897; 15 CFR 

part 301). Related records can be viewed 

between 8:30 a.m. and 5:00 p.m. in 

Room 3720, U.S. Department of 

Commerce, 14th and Constitution Ave. 

NW., Washington, DC. 

Docket Number: 15–041. Applicant: 

University of Minnesota, Minneapolis, 

MN 55455–0149. Instrument: IVVI 

Measuring System with Modules. 

Manufacturer: Delft University of 

Technology, the Netherlands. Intended 

Use: See notice at 80 FR 65984–85, 

October 28, 2015. Comments: None 

received. Decision: Approved. We know 

of no instruments of equivalent 

scientific value to the foreign 

instruments described below, for such 

purposes as this is intended to be used, 

that was being manufactured in the 

United States at the time of order. 

Reasons: The instrument will be used to 

uncover novel quantum properties of 

certain semiconductors or 

superconductors, such as InAs, GaSb or 

devices combining these with 

superconductors such As Al and Nb, 

using high-sensitivity electronic current 

and voltage measurements. Unique 

properties of this instrument include 

modular integration of pA sensitivity 

ammeter, required to measure very 

small electrical currents down to several 

pA, low-noise transimpedance 

amplifier, required to transform the 

electrical currents into voltage signals of 

a few mV that can be measured with 

conventional laboratory voltmeters, and 

low-noise digital-to-analogue converter 

and signal switchboxes. The entire 

setup is battery-operated and is 

programmable via an opticallydecoupled input to minimize electrical 

noise interference from electrical power 

lines or other instruments. 

Docket Number: 15–042. Applicant: 

Purdue University, West Lafayette, IN 

47907. Instrument: SuperK EXTREME 

EXR–20 20 MHz with SuperK VARIA 

High 50dB with Power Lock. 

Manufacturer: NKT Photonics, 

Denmark. Intended Use: See notice at 80 

FR 65984–85, October 28, 2015. 

Comments: None received. Decision: 

Approved. We know of no instruments 

of equivalent scientific value to the 

foreign instruments described below, for 

such purposes as this is intended to be 

used, that was being manufactured in 

the United States at the time of order. 

Reasons: The instrument will be used to 

image tissue or tissue like materials 

with high optical scatter using Optical 

Diffusion Tomography (ODT), providing 

useful information for the study of 

biological and chemical processes. The 

instrument has a wide turning range, 

which is important for exciting different 

fluorophores of interest, providing 

specificity to chemical processes, a 

short pulse width which is important 

for performing time-gated 

measurements, high laser power which 

is important for obtaining a high SNR 

from laser light traveling through 

centimeters of tissue or related 

scattering medium, and a 20MHz 

repetition rate which is important for 

time-gated measurements given the 

temporal response time of tissue. 

Docket Number: 15–045. Applicant: 

University of Massachusetts Medical 

School, Worchester, MA 01655. 

Instrument: Vitrobot. Manufacturer: FEI 

Electron Optics, B.V., the Netherlands. 

Intended Use: See notice at 80 FR 

65984–85, October 28, 2015. Comments: 

None received. Decision: Approved. We 

know of no instruments of equivalent 

scientific value to the foreign 

instruments described below, for such 

purposes as this is intended to be used, 

that was being manufactured in the 

United States at the time of order. 

Reasons: The instrument will be used to 

understand the three-dimensional 

structure of purified proteins and 

complexes at the atomic level, and how 

this is related to their function, by 

freezing them, then examining them in 

the frozen state in an electron 

microscope. The instrument can 

precisely control the humidity at any 

level, and can also control the 

temperature of the chamber, which is 

essential to freeze the proteins and 

complexes under exactly defined 

conditions, which is a requirement for 

all of the studies. The specimen remains 

in the humidity-controlled environment 

until the instant of freezing, which is 

essential to prevent any evaporation of 

water from the specimen before 

freezing. 

Docket Number: 15–050. Applicant: 

Rutgers University, Brunswick, NJ 

08901. Instrument: Junior 

Micromanipulator unit with remote 

control system, shifting table and 

chamber unit parts. Manufacturer: Luigs 

& Neumann, Germany. Intended Use: 

See notice at 80 FR 79307–08, December 

21, 2015. Comments: None received. 

Decision: Approved. We know of no 

instruments of equivalent scientific 

value to the foreign instruments 

described below, for such purposes as 

this is intended to be used, that was 

being manufactured in the United States 

at the time of order. Reasons: The 

instrument will be used to 

simultaneously measure the 

microscopic electric signals generated 

from neurons, specifically the patchclamp whole cell recordings from 

neurons, to identify specific alterations 

in synaptic transmission that leads to 

neuropsychiatric or neurological 

disorders. The instrument is a highly 

flexible, highly precise system, offering 

the highest mechanical resolution and 

smoothest movement because of its 

patented spindle nut system, which 

guarantees a unique and extraordinary 

stability for long term recordings. The 

step motor is decoupled preventing a 

thermal bridge from the motor to the 

machine and also prevents vibration 

during movement. The experiments 

require high precision equipment to 

precisely determine the measurement of 

voltage in the mV range and current in 

the pA range. 

Dated: February 2, 2016. 

Gregory W. Campbell, 

Director, Subsidies Enforcement Office, 

Enforcement and Compliance. 

[FR Doc. 2016–02558 Filed 2–8–16; 8:45 am] 

BILLING CODE 3510–DS–P 

DEPARTMENT OF COMMERCE 

International Trade Administration 

University of Kentucky, et al.; Notice of 

Consolidated Decision on Applications 

for Duty-Free Entry of Electron 

Microscope 

This is a decision consolidated 

pursuant to Section 6(c) of the 

Educational, Scientific, and Cultural 

Materials Importation Act of 1966 (Pub. 

L. 89–651, as amended by Pub. L. 106– 

36; 80 Stat. 897; 15 CFR part 301). 

Related records can be viewed between 

8:30 a.m. and 5:00 p.m. in Room 3720, 

U.S. Department of Commerce, 14th and 

Constitution Avenue NW., Washington, 

DC. 

Docket Number: 15–001. Applicant: 

University of Kentucky, Lexington, KY 

40506–0046. Instrument: Electron 

Microscope. Manufacturer: FEI 

Company, Czech Republic. Intended 

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6832 Federal Register / Vol. 81, No. 26 / Tuesday, February 9, 2016 / Notices 

1See Antidumping and Countervailing Duty 

Proceedings: Electronic Filing Procedures; 

Administrative Protective Order Procedures, 76 FR 

39263 (July 6, 2011). 

Use: See notice at 80 FR 2914–15, 

January 21, 2015. 

Docket Number: 15–029. Applicant: 

University of California, Irvine, Irvine, 

CA 92697–2575. Instrument: Electron 

Microscope. Manufacturer: JEOL Ltd., 

Japan. Intended Use: See notice at 80 FR 

65984, October 28, 2015. 

Docket Number: 15–031. Applicant: 

University of California, Irvine, Irvine, 

CA 92697–2575. Instrument: Electron 

Microscope. Manufacturer: JEOL Ltd., 

Japan. Intended Use: See notice at 80 FR 

65984, October 28, 2015. 

Docket Number: 15–035. Applicant: 

Drexel University, Philadelphia, PA 

19104. Instrument: Electron Microscope. 

Manufacturer: JEOL Ltd., Japan. 

Intended Use: See notice at 80 FR 

65984, October 28, 2015. 

Docket Number: 15–036. Applicant: 

The Trustees of Princeton University, 

Princeton, NJ 08540. Instrument: 

Electron Microscope. Manufacturer: FEI 

Czech Republic s.r.o., Czech Republic. 

Intended Use: See notice at 80 FR 

65984, October 28, 2015. 

Docket Number: 15–037. Applicant: 

The Trustees of Princeton University, 

Princeton, NJ 08540. Instrument: 

Electron Microscope. Manufacturer: FEI 

Electron Optics BV, the Netherlands. 

Intended Use: See notice at 80 FR 

65984, October 28, 2015. 

Docket Number: 15–038. Applicant: 

South Dakota State University, 

Brookings, SD 57007. Instrument: 

Electron Microscope. Manufacturer: 

JEOL Ltd., Japan. Intended Use: See 

notice at 80 FR 65984, October 28, 2015. 

Docket Number: 15–039. Applicant: 

University of Texas Southwestern 

Medical Center, Dallas, TX 75390. 

Instrument: Electron Microscope. 

Manufacturer: FEI Company, the 

Netherlands. Intended Use: See notice at 

80 FR 65984–85, October 28, 2015. 

Docket Number: 15–040. Applicant: 

UT Battelle, Oak Ridge National 

Laboratory, Oak Ridge TN 37831–6138. 

Instrument: Electron Microscope. 

Manufacturer: FEI Company, Czech 

Republic. Intended Use: See notice at 80 

FR 65984–85, October 28, 2015. 

Docket Number: 15–043. Applicant: 

New York Structural Biology Center, 

New York, NY 10027. Instrument: 

Electron Microscope. Manufacturer: FEI 

Co., the Netherlands. Intended Use: See 

notice at 80 FR 65984–85, October 28, 

2015. 

Docket Number: 15–046. Applicant: 

National Institute for Occupational 

Safety & Health, Morgantown, WV 

26505. Instrument: Electron Microscope. 

Manufacturer: JEOL Ltd., Japan. 

Intended Use: See notice at 80 FR 

65984–85, October 28, 2015. 

Docket Number: 15–048. Applicant: 

Battelle/Pacific Northwest National 

Laboratory, Richland, WA 99352. 

Instrument: Electron Microscope. 

Manufacturer: FEI Co., Czech Republic. 

Intended Use: See notice at 80 FR 

79307, December 21, 2015. 

Docket Number: 15–053. Applicant: 

University of California at San Diego, La 

Jolla, CA 92093–0651. Instrument: 

Electron Microscope. Manufacturer: FEI 

Company, the Netherlands. Intended 

Use: See notice at 80 FR 79307–08, 

December 21, 2015. 

Comments: None received. Decision: 

Approved. No instrument of equivalent 

scientific value to the foreign 

instrument, for such purposes as this 

instrument is intended to be used, is 

being manufactured in the United States 

at the time the instrument was ordered. 

Reasons: Each foreign instrument is an 

electron microscope and is intended for 

research or scientific educational uses 

requiring an electron microscope. We 

know of no electron microscope, or any 

other instrument suited to these 

purposes, which was being 

manufactured in the United States at the 

time of order of each instrument. 

Dated: February 3, 2016. 

Gregory W. Campbell, 

Director, Subsidies Enforcement Office, 

Enforcement and Compliance. 

[FR Doc. 2016–02552 Filed 2–8–16; 8:45 am] 

BILLING CODE 3510–DS–P 

DEPARTMENT OF COMMERCE 

International Trade Administration 

Initiation of Antidumping and 

Countervailing Duty Administrative 

Reviews 

AGENCY: Enforcement and Compliance, 

International Trade Administration, 

Department of Commerce. 

SUMMARY: The Department of Commerce 

(‘‘the Department’’) has received 

requests to conduct administrative 

reviews of various antidumping and 

countervailing duty orders and findings 

with December anniversary dates. In 

accordance with the Department’s 

regulations, we are initiating those 

administrative reviews. 

DATES: Effective date: February 9, 2016. 

FOR FURTHER INFORMATION CONTACT: 

Brenda E. Waters, Office of AD/CVD 

Operations, Customs Liaison Unit, 

Enforcement and Compliance, 

International Trade Administration, 

U.S. Department of Commerce, 14th 

Street and Constitution Avenue NW, 

Washington, DC 20230, telephone: (202) 

482–4735. 

SUPPLEMENTARY INFORMATION: 

Background 

The Department has received timely 

requests, in accordance with 19 CFR 

351.213(b), for administrative reviews of 

various antidumping and countervailing 

duty orders and findings with December 

anniversary dates. 

All deadlines for the submission of 

various types of information, 

certifications, or comments or actions by 

the Department discussed below refer to 

the number of calendar days from the 

applicable starting time. 

Notice of No Sales 

If a producer or exporter named in 

this notice of initiation had no exports, 

sales, or entries during the period of 

review (‘‘POR’’), it must notify the 

Department within 30 days of 

publication of this notice in the Federal 

Register. All submissions must be filed 

electronically at http://access.trade.gov 

in accordance with 19 CFR 351.303.1

Such submissions are subject to 

verification in accordance with section 

782(i) of the Tariff Act of 1930, as 

amended (‘‘the Act’’). Further, in 

accordance with 19 CFR 351.303(f)(1)(i), 

a copy must be served on every party on 

the Department’s service list. 

Respondent Selection 

In the event the Department limits the 

number of respondents for individual 

examination for administrative reviews 

initiated pursuant to requests made for 

the orders identified below, the 

Department intends to select 

respondents based on U.S. Customs and 

Border Protection (‘‘CBP’’) data for U.S. 

imports during the period of review. We 

intend to place the CBP data on the 

record within five days of publication of 

the initiation notice and to make our 

decision regarding respondent selection 

within 30 days of publication of the 

initiation Federal Register notice. 

Comments regarding the CBP data and 

respondent selection should be 

submitted seven days after the 

placement of the CBP data on the record 

of this review. Parties wishing to submit 

rebuttal comments should submit those 

comments five days after the deadline 

for the initial comments. 

In the event the Department decides 

it is necessary to limit individual 

examination of respondents and 

conduct respondent selection under 

section 777A(c)(2) of the Act: 

In general, the Department has found 

that determinations concerning whether 

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