Federal Register / Vol. 75, No. 15 / Monday, January 25, 2010 / Notices 3895 

DEPARTMENT OF COMMERCE 

International Trade Administration 

Application(s) for Duty-Free Entry of 

Scientific Instruments 

Pursuant to Section 6(c) of the 

Educational, Scientific and Cultural 

Materials Importation Act of 1966 (Pub. 

L. 89–651, as amended by Pub. L. 106– 

36; 80 Stat. 897; 15 CFR part 301), we 

invite comments on the question of 

whether instruments of equivalent 

scientific value, for the purposes for 

which the instruments shown below are 

intended to be used, are being 

manufactured in the United States. 

Comments must comply with 15 CFR 

301.5(a)(3) and (4) of the regulations and 

be postmarked on or before February 16, 

2010. Address written comments to 

Statutory Import Programs Staff, Room 

3720, U.S. Department of Commerce, 

Washington, DC 20230. Applications 

may be examined between 8:30 a.m. and 

5 p.m. at the U.S. Department of 

Commerce in Room 3720. 

Docket Number: 09–068. Applicant: 

University of Arkansas, 321 

Administration Building, Fayetteville, 

Arkansas 72701. 

Instrument: Fluorescence Lifetime 

Imaging Microscope. 

Manufacturer: PicoQuant Photonics, 

Germany. Intended Use: The instrument 

will be used to measure both 

fluorescence lifetime and fluorescence 

intensity of single nanoparticles and 

biomolecules. The instrument must be 

able to perform using lasers with both 

continuous wave (CW) and pulsed 

mode. The use of picoseconds pulsed 

lasers is necessary to measure 

fluorescence lifetime. The use of CW 

lasers, so that the fluorophores will be 

continuously excited, is necessary to 

measure fluorescence intensity. The 

driver that controls the laser head 

provides user-selectable pulsed 

repetition rates. This instrument is 

unique in that it is capable of pulsed 

interleaved excitation (PIE)— 

Fluorescence Resonance Energy 

Transfer (FRET) and of allowing 

repetition rates to be continuously 

varied down to the 200 kHz range. 

Furthermore, the instrument is 

compatible with atomic force 

microscopy by using objective scanning 

mode rather than sample scanning mode 

so that the sample-scanning Atomic 

Force Microscope (AFM) can be added 

to the microscope in a future upgrade. 

Justification for Duty-Free Entry: No 

instruments of same general category are 

manufactured in the United States. 

Application accepted by 

Commissioner of Customs: December 

28, 2009. 

Dated January 19, 2010. 

Christopher Cassel, 

Director, IA Subsidies Enforcement Office. 

[FR Doc. 2010–1337 Filed 1–22–10; 8:45 am] 

BILLING CODE 3510–DS–P 

DEPARTMENT OF COMMERCE 

International Trade Administration 

Application(s) for Duty-Free Entry of 

Scientific Instruments 

Pursuant to Section 6(c) of the 

Educational, Scientific and Cultural 

Materials Importation Act of 1966 (Pub. 

L. 89–651, as amended by Pub. L. 106– 

36; 80 Stat. 897; 15 CFR part 301), we 

invite comments on the question of 

whether instruments of equivalent 

scientific value, for the purposes for 

which the instruments shown below are 

intended to be used, are being 

manufactured in the United States. 

Comments must comply with 15 CFR 

301.5(a)(3) and (4) of the regulations and 

be postmarked on or before February 16, 

2010. Address written comments to 

Statutory Import Programs Staff, Room 

3720, U.S. Department of Commerce, 

Washington, DC 20230. Applications 

may be examined between 8:30 a.m. and 

5 p.m. at the U.S. Department of 

Commerce in Room 3720. 

Docket Number: 09–069. Applicant: 

University of Pittsburgh, 4200 Fifth 

Ave., Pittsburgh, PA 15260. Instrument: 

Electron Microscope. Manufacturer: 

JEOL, Ltd., Japan. Intended Use: This 

instrument will be used to conduct 

research, focusing on analyzing 

ultrastructurally the plasticity of the 

brain and auditory pathway, in 

particular, different models of hearing 

loss. This instrument provides the 

required resolution for such analysis. 

Justification for Duty-Free Entry: No 

instruments of same general category are 

manufactured in the United States. 

Application accepted by Commissioner 

of Customs: December 28, 2009. 

Docket Number: 09–070. Applicant: 

Haverford College, 370 Lancaster Ave., 

Haverford, PA 19041. Instrument: JEM– 

1400 Electron Microscope. 

Manufacturer: JEOL Ltd., Japan. 

Intended Use: The instrument will be 

used for the ultrastructural study of 

prokaryotic and eukaryotic cell 

structure, the assembly of peptides and 

proteins into filaments and other 

geometries, the analysis of porphyrin 

and other chemical polymers, and other 

applications in cell biology, materials 

science and nanotechnology. 

Justification for Duty-Free Entry: There 

are no domestic manufacturers of this 

type of electron microscope. 

Application accepted by Commissioner 

of Customs: December 30, 2009. 

Dated: January 19, 2010. 

Christopher Cassel, 

Director, IA Subsidies Enforcement Office. 

[FR Doc. 2010–1339 Filed 1–22–10; 8:45 am] 

BILLING CODE 3510–DS–P 

DEPARTMENT OF COMMERCE 

International Trade Administration 

Yale University, et al.; Notice of 

Consolidated Decision on Applications 

for Duty-Free Entry of Electron 

Microscopes 

This is a decision consolidated 

pursuant to Section 6(c) of the 

Educational, Scientific, and Cultural 

Materials Importation Act of 1966 (Pub. 

L. 89–651, as amended by Pub. L. 106– 

36; 80 Stat. 897; 15 CFR part 301). 

Related records can be viewed between 

8:30 a.m. and 5 p.m. in Room 3705, U.S. 

Department of Commerce, 14th and 

Constitution Avenue, NW., Washington, 

DC. 

Docket Number: 09–064. Applicant: 

Yale University, New Haven, CT 06520– 

8284. Instrument: Electron Microscope, 

Quanta 3D Dual-Beam Focused IonBeam Tool. Manufacturer: FEI 

Company, Czech Republic. Intended 

Use: See notice at 74 FR 67851, 

December 21, 2009. 

Docket Number: 09–065. Applicant: 

U.S. Department of Homeland Security, 

Science and Technology Directorate, 

Frederick, MD 21702. Instrument: 

Scanning Electron Microscope, Quanta 

200 FEG. Manufacturer: FEI Company, 

Czech Republic. Intended Use: See 

notice at 74 FR 67851, December 21, 

2009. 

Comments: None received. Decision: 

Approved. No instrument of equivalent 

scientific value to the foreign 

instrument, for such purposes as these 

instruments are intended to be used, 

was being manufactured in the United 

States at the time the instruments were 

ordered. Reasons: Each foreign 

instrument is an electron microscope 

and is intended for research or scientific 

educational uses requiring an electron 

microscope. We know of no electron 

microscope, or any other instrument 

suited to these purposes, which was 

being manufactured in the United States 

at the time of order of each instrument. 

Dated: January 19, 2010. 

Christopher Cassel, 

Director, Subsidies Enforcement Office, 

Import Administration. 

[FR Doc. 2010–1338 Filed 1–22–10; 8:45 am] 

BILLING CODE 3510–DS–P 


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