[Federal Register Volume 70, Number 214 (Monday, November 7, 2005)]
[Notices]
[Pages 67450-67451]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 05-22151]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether an 
instrument of equivalent scientific value, for the purposes for which 
the instrument shown below is intended to be used, is being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, D.C. 20230. 
Applications may be examined between 8:30 A.M. and 5:00 P.M. in Suite 
4100W, U.S. Department of Commerce, Franklin Court Building, 1099 14th 
Street, NW, Washington, D.C.
    Docket Number: 05-041. Applicant: Georgia Institute of Technology, 
711 Marietta St., Atlanta, GA 30332. Instrument: Dual Beam SEM/FIB 
Electron Microscope System, Model Quanta 200 3D Nanolab. Manufacturer: 
FEI Company, Czech Republic. Intended Use: The instrument is intended 
to be used to improve understanding of molecular mechanisms and 
functional assemblies, initiate development of new materials, and 
facilitate advances in environmental analysis and detection. New 
research and creative concepts will include: (1) multifunctional 
scanning nanoprobes and quantum cascade laser-based sensing systems,(2) 
stimulated surface chemistry using metal-insulator-metal (MIM) devices 
containing nano-scale field emission arrays,(3) optically gated single 
molecule transistors,(4) shape-preserving chemical conversion of 3-D 
bioclastic structures,(5) impedance mapping AFM cantilever arrays and 
(6) nanobelts as nanobiosensors and nanocantilevers. Application 
accepted by Commissioner of Customs: September 15, 2005.

[[Page 67451]]

    Docket Number: 05-042. Applicant: Georgia Institute of Technology, 
711 Marietta St., Atlanta, GA 30332. Instrument: Dual Beam SEM/FIB 
Electron Microscope System, Model Nova 200 Nanolab. Manufacturer: FEI 
Company, The Netherlands. Intended Use: The instrument is intended to 
be used to improve understanding of molecular mechanisms and functional 
assemblies, initiate development of new materials, and facilitate 
advances in environmental analysis and detection. New research and 
creative concepts will include: (1) multifunctional scanning nanoprobes 
and quantum cascade laser-based sensing systems,(2) stimulated surface 
chemistry using metal-insulator-metal (MIM) devices containing nano-
scale field emission arrays,(3) optically gated single molecule 
transistors,(4) shape-preserving chemical conversion of 3-D bioclastic 
structures,(5) impedance mapping AFM cantilever arrays and (6) 
nanobelts as nanobiosensors, and nanocantilevers. Application accepted 
by Commissioner of Customs: September 15, 2005.
    Docket Number: 05-043. Applicant: Massachusetts General Hospital, 
55 Fruit Street, Boston, MA 02114. Instrument: Electron Microscope, 
Model JEM-1011. Manufacturer: JEOL Ltd., Japan. Intended Use: The 
instrument is intended to be used by the professional laboratory staff 
at Massachusetts General Hospital for the advancement of scientific 
knowledge relating to U.S. government funded medical research projects 
using electron microscopy, electron microtomy and ultracryomicrotomy 
techniques. Application accepted by Commissioner of Customs: September 
12, 2005.

Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. 05-22151 Filed 11-4-05; 8:45 am]
Billing Code: 3510-DS-S