67450 Federal Register / Vol. 70, No. 214 / Monday, November 7, 2005 / Notices 

base box coating, 70 pound/base 

box (0.0077 inch) thickness, and 

32.9375 inch, 33.125 inch, or 

35.1875 inch ordered width. 

– Electrolytically tin coated steel 

having differential coating with 

1.00 pound/base box equivalent on 

the heavy side, with varied coating 

equivalents on the lighter side 

(detailed below), with a continuous 

cast steel chemistry of type MR, 

with a surface finish of type 7B or 

7C, with a surface passivation of 0.5 

mg/square foot of chromium 

applied as a cathodic dichromate 

treatment, with ultra flat scroll cut 

sheet form, with CAT 5 temper with 

1.00/0.10 pound/base box coating, 

with a lithograph logo printed in a 

uniform pattern on the 0.10 pound 

coating side with a clear protective 

coat, with both sides waxed to a 

level of 15–20 mg/216 sq. in., with 

ordered dimension combinations of 

1) 75 pound/base box (0.0082 inch) 

thickness and 34.9375 inch x 

31.748 inch scroll cut dimensions; 

or 2) 75 pound/base box (0.0082 

inch) thickness and 34.1875 inch x 

29.076 inch scroll cut dimensions; 

or 3) 107 pound/base box (0.0118 

inch) thickness and 30.5625 inch x 

34.125 inch scroll cut dimension. 

– Tin–free steel coated with a metallic 

chromium layer between 100–200 

mg/square meter and a chromium 

oxide layer between 5–30 mg/ 

square meter; chemical composition 

of 0.05% maximum carbon, 0.03% 

maximum silicon, 0.60% maximum 

manganese, 0.02% 

maximum phosphorous, and 0.02% 

maximum sulfur; magnetic flux 

density (‘‘Br’’) of 10 kg minimum 

and a coercive force (‘‘Hc’’) of 3.8 

Oe minimum. 

– Tin–free steel laminated on one or 

both sides of the surface with a 

polyester film, consisting of two 

layers (an amorphous layer and an 

outer crystal layer), that contains no 

more than the indicated amounts of 

the following environmental 

hormones: 1 mg/kg BADGE 

(BisPhenol A Di–glycidyl Ether), 1 

mg/kg BFDGE (BisPhenol F Di–

glycidyl Ether), and 3 mg/kg BPA 

(BisPhenol A). 

The merchandise subject to this order 

is classified in the Harmonized Tariff 

Schedule of the United States 

(‘‘HTSUS’’), under HTSUS subheadings 

7210.11.0000, 7210.12.0000, 

7210.50.0000, 7212.10.0000, and 

7212.50.0000 if of non–alloy steel and 

under HTSUS subheadings 

7225.99.0090, and 7226.99.0000 if of 

alloy steel. Although the subheadings 

are provided for convenience and 

customs purposes, our written 

description of the scope of this order is 

dispositive. 

Analysis of Comments Received 

All issues raised in this sunset review 

are addressed in the ‘‘Issues and 

Decision Memorandum’’ from Stephen 

J. Claeys, Deputy Assistant Secretary for 

Import Administration, to Joseph A. 

Spetrini, Acting Assistant Secretary for 

Import Administration, dated October 

31, 2005, (‘‘Decision Memorandum’’), 

which is hereby adopted by this notice. 

The issues discussed in the Decision 

Memorandum include the likelihood of 

continuation or recurrence of dumping 

and the magnitude of the margin likely 

to prevail if the order were revoked. 

Parties can find a complete discussion 

of all issues raised in this sunset review 

and the corresponding 

recommendations in this public 

memorandum, which is on file in room 

B–099 of the main Department building. 

In addition, a complete version of the 

Decision Memorandum can be accessed 

directly on the Web at http:// 

ia.ita.doc.gov/frn, under the heading 

‘‘November 2005.’’ The paper copy and 

electronic version of the Decision 

Memorandum are identical in content. 

Final Results of Review 

We determine that revocation of the 

antidumping duty order on tin mill 

products from Japan would likely lead 

to continuation or recurrence of 

dumping at the following percentage 

weighted–average margins: 

Manufacturers/Exporters/Producers Weighted–Average 

Margin (Percent) 

Nippon Steel Corporation ............................ 95.29 

Kawasaki Steel Corporation ..................... 95.29 

NKK Corporation .......... 95.29 

Toyo Kohan Co., Ltd. ... 95.29 

All Other Japanese 

Manufacturers and 

Exporters ................... 32.52 

This notice also serves as the only 

reminder to parties subject to 

administrative protective orders (APO) 

of their responsibility concerning the 

return or destruction of proprietary 

information disclosed under APO in 

accordance with section 351.305 of the 

Department’s regulations. Timely 

notification of the return or destruction 

of APO materials or conversion to 

judicial protective order is hereby 

requested. Failure to comply with the 

regulations and terms of an APO is a 

violation which is subject to sanction. 

We are issuing and publishing the 

results and notice in accordance with 

sections 751(c), 752, and 777(i)(1) of the 

Act. 

Dated: October 31, 2005. 

Joseph A. Spetrini, 

Acting Assistant Secretary for Import 

Administration. 

[FR Doc. 05–22141 Filed 11–4–05; 8:45 am] 

BILLING CODE 3510–DS–S 

DEPARTMENT OF COMMERCE 

International Trade Administration 

Applications for Duty–Free Entry of 

Scientific Instruments 

Pursuant to Section 6(c) of the 

Educational, Scientific and Cultural 

Materials Importation Act of 1966 (Pub. 

L. 89–651; 80 Stat. 897; 15 CFR part 

301), we invite comments on the 

question of whether an instrument of 

equivalent scientific value, for the 

purposes for which the instrument 

shown below is intended to be used, is 

being manufactured in the United 

States. 

Comments must comply with 15 CFR 

301.5(a)(3) and (4) of the regulations and 

be filed within 20 days with the 

Statutory Import Programs Staff, U.S. 

Department of Commerce, Washington, 

D.C. 20230. Applications may be 

examined between 8:30 A.M. and 5:00 

P.M. in Suite 4100W, U.S. Department 

of Commerce, Franklin Court Building, 

1099 14th Street, NW, Washington, D.C. 

Docket Number: 05–041. Applicant: 

Georgia Institute of Technology, 711 

Marietta St., Atlanta, GA 30332. 

Instrument: Dual Beam SEM/FIB 

Electron Microscope System, Model 

Quanta 200 3D Nanolab. Manufacturer: 

FEI Company, Czech Republic. Intended 

Use: The instrument is intended to be 

used to improve understanding of 

molecular mechanisms and functional 

assemblies, initiate development of new 

materials, and facilitate advances in 

environmental analysis and detection. 

New research and creative concepts will 

include: (1) multifunctional scanning 

nanoprobes and quantum cascade laser–

based sensing systems,(2) stimulated 

surface chemistry using metal–

insulator-metal (MIM) devices 

containing nano–scale field emission 

arrays,(3) optically gated single 

molecule transistors,(4) shape–

preserving chemical conversion of 3–D 

bioclastic structures,(5) impedance 

mapping AFM cantilever arrays and (6) 

nanobelts as nanobiosensors and 

nanocantilevers. Application accepted 

by Commissioner of Customs: 

September 15, 2005. 

Federal Register / Vol. 70, No. 214 / Monday, November 7, 2005 / Notices 67451 

Docket Number: 05–042. Applicant: 

Georgia Institute of Technology, 711 

Marietta St., Atlanta, GA 30332. 

Instrument: Dual Beam SEM/FIB 

Electron Microscope System, Model 

Nova 200 Nanolab. Manufacturer: FEI 

Company, The Netherlands. Intended 

Use: The instrument is intended to be 

used to improve understanding of 

molecular mechanisms and functional 

assemblies, initiate development of new 

materials, and facilitate advances in 

environmental analysis and detection. 

New research and creative concepts will 

include: (1) multifunctional scanning 

nanoprobes and quantum cascade laser–

based sensing systems,(2) stimulated 

surface chemistry using metal–

insulator-metal (MIM) devices 

containing nano–scale field emission 

arrays,(3) optically gated single 

molecule transistors,(4) shape–

preserving chemical conversion of 3–D 

bioclastic structures,(5) impedance 

mapping AFM cantilever arrays and (6) 

nanobelts as nanobiosensors, and 

nanocantilevers. Application accepted 

by Commissioner of Customs: 

September 15, 2005. 

Docket Number: 05–043. Applicant: 

Massachusetts General Hospital, 55 

Fruit Street, Boston, MA 02114. 

Instrument: Electron Microscope, Model 

JEM–1011. Manufacturer: JEOL Ltd., 

Japan. Intended Use: The instrument is 

intended to be used by the professional 

laboratory staff at Massachusetts 

General Hospital for the advancement of 

scientific knowledge relating to U.S. 

government funded medical research 

projects using electron microscopy, 

electron microtomy and 

ultracryomicrotomy techniques. 

Application accepted by Commissioner 

of Customs: September 12, 2005. 

Gerald A. Zerdy, 

Program Manager, Statutory Import Programs 

Staff. 

[FR Doc. 05–22151 Filed 11–4–05; 8:45 am] 

Billing Code: 3510–DS–S 

DEPARTMENT OF COMMERCE 

International Trade Administration 

University of California, San Diego, et 

al., Notice of Consolidated Decision on 

Applications for Duty–Free Entry of 

Scientific Instruments 

This is a decision consolidated 

pursuant to Section 6(c) of the 

Educational, Scientific, and Cultural 

Materials Importation Act of 1966 (Pub. 

L. 89–651, 80 Stat. 897; 15 CFR part 

301). Related records can be viewed 

between 8:30 A.M. and 5:00 P.M. in 

Suite 4100W, Franklin Court Building, 

U.S. Department of Commerce, 1099 

14th Street, NW, Washington, D.C. 

Comments: None received. Decision: 

Approved. No instrument of equivalent 

scientific value to the foreign 

instruments described below, for such 

purposes as each is intended to be used, 

is being manufactured in the United 

States. 

Docket Number: 05–038. Applicant: 

University of California, San Diego. 

Instrument: Low–Temperature Ultra–

High Vacuum Scanning Tunneling 

Microscope. Manufacturer: Omicron 

NanoTechnology, GmbH, Germany. 

Intended Use: See notice at 70 FR 

54366, September 14, 2005. Reasons: 

The foreign instrument provides: (1) a 

scanning tunneling microscope (STM) 

mounted inside a 4K liquid helium 

reservoir (8-hour time between liquid 

He refills), (2) operation at an 

equilibrium temperature of 4 K 

(including both tip and sample), (3) in–

situ sample manipulation and tip 

transfer capabilities, (4) low drift rates 

of 1.0 angstrom/hour (5) RMS vibration 

amplitudes of <0.005 angstrom in a 300 

Hz bandwidth and (6) sample surface 

facing downwards during STM imaging 

for easy dosing. Advice received from: 

A university research laboratory for 

advanced microstructures and devices. 

Docket Number: 05–039. Applicant: 

University of Wisconsin, Eau Claire. 

Instrument: Automatic Fusion Machine, 

Model Autofluxer 4. Manufacturer: 

Breitlander, GmbH, Germany. Intended 

Use: See notice at 70 FR . Reasons: The 

foreign instrument provides dissolution 

of whole rock powder by a combination 

fusion/acid digestion for trace element 

analysis by ICP mass spectrometry. No 

apparatus of equivalent scientific value 

to the foreign apparatus, for such 

purposes as it is intended to be used, is 

being manufactured in the United 

States. This is a compatible accessory 

for an existing instrument purchased for 

the use of the applicant. The accessory 

is pertinent to the intended uses and we 

know of no domestic accessory which 

can be readily adapted for use with the 

existing instrument. 

Docket Number: 05–040. Applicant: 

National Renewable Energy Laboratory, 

Golden, CO, 80401. Instrument: Dual 

Beam Focused Ion Beam Electron 

Microscope, Model Nova 200 NanoLab. 

Manufacturer: FEI Company, The 

Netherlands. Intended Use: See notice at 

70 FR 54366, September 14, 2005. 

Reasons: The foreign instrument is an 

electron microscope and is intended for 

research or scientific educational uses 

requiring it. We know of no instrument 

suited to these purposes, which was 

being manufactured in the United States 

at the time of order of the instrument. 

We know of no other instrument or 

apparatus being manufactured in the 

United States which is of equivalent 

scientific value to any of the foreign 

instruments. 

Gerald A. Zerdy, 

Program Manager, Statutory Import Programs 

Staff. 

[FR Doc. 05–22150 Filed 11–4–05; 8:45 am] 

BILLING CODE 3510–DS–S 

DEPARTMENT OF COMMERCE 

International Trade Administration 

(A–570–803) 

Heavy Forged Hand Tools (i.e., Axes & 

Adzes, Bars & Wedges, Hammers & 

Sledges, and Picks & Mattocks) from 

the People’s Republic of China: Final 

Results of the Expedited Sunset 

Review of the Antidumping Duty 

Orders 

AGENCY: Import Administration, 

International Trade Administration, 

Department of Commerce. 

SUMMARY: On July 1, 2005, the 

Department of Commerce (‘‘the 

Department’’) initiated a sunset review 

of the antidumping duty (‘‘AD’’) orders 

on Heavy Forged Hand Tools (i.e., Axes 

& Adzes, Bars & Wedges, Hammers & 

Sledges, and Picks & Mattocks) 

(‘‘HFHTs’’) from the People’s Republic 

of China pursuant to section 751(c) of 

the Tariff Act of 1930, as amended (‘‘the 

Act’’). On the basis of notices of intent 

to participate and adequate substantive 

responses filed on behalf of the 

domestic interested parties and lack of 

response from respondent interested 

parties, the Department conducted an 

expedited sunset review of the AD 

orders pursuant to section 751(c)(3)(B) 

of the Act and section 

351.218(e)(1)(ii)(C)(2) of the 

Department’s regulations. As a result of 

this sunset review, the Department finds 

that revocation of the AD orders would 

likely lead to continuation or recurrence 

of dumping at the levels indicated in the 

‘‘Final Results of Review’’ section of this 

notice. 

EFFECTIVE DATE: November 7, 2005. 

FOR FURTHER INFORMATION CONTACT: 

Maureen Flannery, AD/CVD Operations, 

Import Administration, International 

Trade Administration, U.S. Department 

of Commerce, 14th Street and 

Constitution Avenue, NW, Washington, 

DC 20230; telephone: (202) 482–3020. 

SUPPLEMENTARY INFORMATION: 

Background 

On July 1, 2005, the Department 

initiated a sunset review of the AD