# Patent

## Title
Fluorescent X-ray analysis apparatus

## Abstract

In a fluorescent X-ray analysis apparatus, a diffraction X-ray is removable from a sample even if it is formed of a mixture of fine crystals. A movable collimator mechanism capable of detecting only a collimate component of an X-ray optical flux is provided in a secondary X-ray path extending between a sample and an X-ray detector. Spectrum measurement is conducted on the same sample when the collimator mechanism is inserted and removed from the secondary X-ray path.

## Background
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a fluorescent X-ray analysis apparatus for conducting element analysis by detecting an X-ray secondarily produced from a sample when radiating an X-ray to the sample.
2. Description of the Prior Art
The fluorescent X-ray analysis apparatus is used to conduct qualitative/quantitative analysis of a sample by radiating a primary X-ray emitted from an X-ray source onto a sample and detecting a fluorescent X-ray produced from the sample, thereby obtaining a spectrum as energy intensity information. At this time, a diffraction X-ray is produced besides a fluorescent X-ray from such a material as with a crystallinity or that having been extended. This will appear as an interference peak on a spectrum to impede qualitative/quantitative analysis. As a measure to remove this, a sample rotary mechanism has conventionally been employed.
However, the effect of sample rotation upon removing diffraction X-ray is limited to a case that the sample is comparatively uniform in crystalline orientation. There is a problem that diffraction X-ray is difficult to remove in a case where the sample is random in crystalline surface such as that of a mixture of fine crystals.
SUMMARY OF THE INVENTION
In order to solve the above problem, the present invention provides a movable collimator mechanism capable of detecting only a collimate component of an X-ray optical flux on an X-ray path between a sample and an X-ray detector. A spectrum is measured on the same sample in both cases that a collimator is inserted and not inserted. At this time, if a collimator mechanism is inserted, only a secondary X-ray reaches the detector which is uniform in an angle defined between a line which connects an intersection of a primary X-ray optical flux center line and a sample surface (this is referred to as a primary X-ray radiation center) to a detection region center of the X-ray detector and the sample surface (this is referred to as an extraction angle). Also, where the collimator mechanism is not inserted, detected is a secondary X-ray having an extraction angle with a given width with a result that each spectrum is varied in diffraction X-ray peak width appearing thereon. On the other hand, because the fluorescent X-ray peak width is not affected by the extraction angle, it is possible to discriminate between a peak due to a diffraction X-ray and a peak of a fluorescent X-ray by observing two spectrums obtained. Accordingly, qualitative/quantitative analysis was made feasible free from the effect of interference due to a diffraction X-ray by analyzing a spectrum when the diffraction X-ray peak width is smaller and a collimator mechanism less in disturbance to the fluorescent X-ray peak is inserted, or by removing a diffraction X-ray peak through a simple arithmetic process for the obtained two spectrums.



BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a schematic view showing a structure of a fluorescent X-ray analysis apparatus of the present invention;
FIG. 2 is an explanatory view showing a diffraction X-ray peak producing mechanism;
FIG. 3 is an explanatory view showing a diffraction X-ray removal mechanism;
FIG. 4 is a typical view showing a parallel flat plate collimator;
FIG. 5 is a typical view showing an arrangement in a case of using two parallel flat plate collimators; and
FIG. 6 is a typical view showing a poly-capillary collimator.



DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
An embodiment of the present invention will be described hereinunder with reference to the drawings.
Referring to FIG. 1, there is illustrated one example of an X-ray analysis apparatus to be used in the present invention. An X-ray source 1 emits an X-ray to be incident onto a sample 2. From the sample 2 a secondary X-ray is produced that includes a fluorescent X-ray and diffraction X-ray. Thereupon, a detector detects only a secondary X-ray put uniform in extraction angle by a collimator 4 arranged on an X-ray path between the sample 2 and the detector 3. In this state a spectrum is acquired, and thereafter the collimator 4 is moved out of the X-ray path to acquire a spectrum. In the apparatus with such structure, the condition that a diffraction X-ray reaches from the sample to the detector to cause a peak appearing on the spectrum is known as Bragg's formula

nλ=2d sin θ  (1) 

where θ is the Bragg's angle. Provided that a half of an angle defined by three points of the X-ray source, the primary X-ray radiation center on the sample and detector detection region center point is given 1⁄2 as φ, we obtain

θ=(180°−2φ)/2  (2). 

Meanwhile, d is a lattice constant of a crystal forming the sample, λ is a wavelength of the diffraction X-ray, and n is an order. Accordingly, if Equation (2) is substituted into Equation (1), we obtain

nλ=2d cos φ  (3). 

In the structure of the invention, the insertion of the collimator 4 onto the X-ray path results in narrowing the extraction angle of the secondary X-ray reaching the detector to a certain range. This is nothing more than change in the range of φ. Consequently, the diffraction X-ray will change in range of wavelength (or energy). On the other hand, the fluorescent X-ray to be produced from the sample will not be affected in energy by the range φ.
For example, FIG. 2 is a sectional view that a geometrical arrangement a secondary X-ray reaches a detector is projected onto a plane including three planes, i.e. an X-ray source, a primary X-ray radiation center on a sample and a detector detection region center point. Using this figure, explanation is made on change of the range φ. It is herein assumed for the sake of simplifying explanation that the primary X-ray is a collimate light flux. In an actual apparatus, however, the effect of spread in the primary X-ray is in a negligible extent as compared to change in range of extraction. No effect thereof will be greatly lost in the below explanation.
FIG. 2A is a typical view for the case that the collimator lens is not inserted. The region of a sample 2 radiated by a primary X-ray is shown by hatching, from which a secondary X-ray is being produced. In the figure, the angle defined by three points, i.e. an X-ray source, a primary X-ray radiation center on the sample, a detector detection region center point, becomes a maximum for a secondary X-ray taken along a line segment AD connecting between a farthest point A from the detector in the region on the sample that the secondary X-ray is being produced and a farthest point D from the sample in a detector detection range, wherein in this case is assumed taken as φ1. Conversely, this angle becomes a minimum for a secondary X-ray taken along a line segment BC connecting between a closest point B to the detector in the region on the sample that the secondary X-ray is being produced and a closest point C to the sample in the detector detection range, wherein φ in this case is assumed taken as φ2. Accordingly, where the collimator is not inserted, then a half of the angle defined by the three point of the X-ray source, the primary X-ray radiation center on the sample and the detector detection region center point takes a range of φ2<φ<+1.
FIG. 2B is a typical view in the case that the collimator is inserted. It is herein considered on a range of φ concerning on one hollow tube including a line connecting between a primary X-ray radiation center on the sample and a detector detection region center point. In an actual apparatus, however, it may be considered that hollow tubes with the same length exist in parallel around this hollow tube 5 wherein the respective hollow tubes clearly take the same angular range. In this figure, the angle defined by three points, i.e. an X-ray source, a primary X-ray radiation center on the sample, a detector detection region center point, becomes a maximum for a secondary X-ray taken along a line segment EG connecting between a point E and a point G of the hollow tube, wherein φ in this case is assumed taken as φ3. Conversely, this angle becomes a minimum for a secondary X-ray taken along an extension of a line segment FH connecting between a point F and a point H of the hollow tube, wherein φ in this case is taken as φ4. Accordingly, where a collimator is inserted, then a half of the angle defined by the three point of the X-ray source, the primary X-ray radiation center on the sample and the detector detection region center point takes a range of φ4<φ<φ3.
In the meanwhile, provided that D is assumed taken for a lattice constant of a crystalline structure of a sample being considered that a diffraction X-ray peak is caused, when the collimator is not inserted, a primary X-ray having a wavelength lying in a range of from λ1 =2D (cos θ1)/n to λ2 =2D (cos θ2)/n satisfies the Bragg's condition, which diffracts and reaches the detector where it is to be confirmed as a broad diffraction peak including a system wavelength resolving power on the spectrum. On the other hand, when the collimator is inserted, the wavelength range satisfying the Bragg's condition lies in a range of from λ3 =2D (cos θ3)/n to λ4 =2D (cos θ4)/n. This is clearly narrow in wavelength range as compared to the case that the collimator is not inserted. FIG. 3A shows an example of a spectrum acquired in the case no collimator is inserted. Herein, peaks A, B and C are observed. Next, FIG. 3B shows a spectrum when measuring on the same sample with the collimator is inserted. It can be discriminated among the peaks A, B and C observed that the peak A narrowed in peak width is due to a diffraction X-ray while the peaks B and C without width change are due to a fluorescent X-ray. In such a case, a qualitative/quantitative analysis is made possible without encountering impediment due to a diffraction X-ray, by performing an analysis using the spectrum acquired by inserting the collimator (FIG. 3B) instead of using the spectrum having interference of the fluorescent X-ray peak B with the diffraction X-ray peak A (FIG. 3A).
Meanwhile, in also a case that a diffraction X-ray peak interferes with other fluorescent X-ray peaks despite a collimator is inserted, it is similarly possible to conduct a qualitative/quantitative analysis free from impediment due to a diffraction X-ray by using a simple peak separation technique to extract and remove only a diffraction X-ray peak.
The collimator can use, as shown in FIG. 4, one parallel flat plate having metal foils arranged parallel at a constant interval. Alternatively, if as shown in FIG. 5 this is used two in the number for arrangement on a secondary X-ray path in a continuous and perpendicular relation to each other, there will be increase in change of diffraction X-ray peak width, thus facilitating diffraction X-ray peak detection. Furthermore, it is possible to use a poly-capillary bundled with metal or glass hollow tubes, as shown in FIG. 6.
As described above, in a fluorescent X-ray analysis apparatus for conducting element analysis by detecting an X-ray secondarily produced from a sample upon radiating an X-ray, a movable collimator mechanism capable of detecting only a collimate component of an X-ray optical flux on an X-ray path between a sample and an X-ray detector. A spectrum is measured on the same sample in both cases the collimator is inserted and not inserted. Accordingly, it is possible to remove a diffraction X-ray even where the sample is made up of a mixture of fine crystals. Thus, qualitative/quantitative analysis is feasible without encountering interfering rays.

## Claims

1. A fluorescent X-ray analysis apparatus comprising:
an X-ray source for generating a primary X-ray; 
a sample table for fixing a sample to be radiated by the primary X-ray; 
a detector for detecting a secondary X-ray produced by the sample in response to irradiation by the primary X-ray; and 
a collimator mechanism removably insertable in an X-ray path between the sample and the detector for passing a secondary X-ray component having a uniform extraction angle and reducing a secondary X-ray component having a non-uniform extraction angle, the extraction angle being defined between a first line connecting an intersection of a center line of an x-ray optical flux radiated by the X-ray source with a plane of the sample table and a second line connecting a center point of a detection region of the detector with a plane of the sample table.

2. A fluorescent X-ray analysis apparatus according to claim 1; wherein the collimator mechanism comprises a parallel plate collimator having a plurality of metal thin sheets arranged in parallel and spaced apart by a small interval.

3. A fluorescent X-ray analysis apparatus according to claim 1; wherein the collimator mechanism comprises a poly-capillary bundled with metal or glass hollow tubes.

4. A fluorescent X-ray analysis apparatus according to claim 1; wherein the collimator mechanism comprises two parallel plate collimators arranged perpendicularly to each other along a path of the secondary X-ray, each plate collimator having a plurality of metal thin sheets arranged in parallel and spaced apart by a small interval.

5. A method of performing X-ray analysis comprising the steps of:
irradiating a sample with a primary X-ray; 
obtaining a first spectrum by measuring a secondary X-ray emanating from the sample in response to irradiation of the sample by the primary X-ray; 
inserting a collimator in a path of the secondary X-ray to allow a collimate component of the secondary X-ray to pass therethrough; 
obtaining a second spectrum by measuring the secondary X-ray emanating from the sample in response to irradiation of the sample by the primary X-ray while the collimator is interposed in the path of the secondary X-ray; and 
performing an arithmetic process on the first and second spectrums to remove a diffraction X-ray peak.