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[Federal Register Volume 74, Number 76 (Wednesday, April 22, 2009)]
[Notices]
[Page 18350]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-9286]

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DEPARTMENT OF COMMERCE

International Trade Administration

Application(s) for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. 
L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the 
question of whether instruments of equivalent scientific value, for the 
purposes for which the instruments shown below are intended to be used, 
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be postmarked on or before May 12, 2009. Address written comments 
to Statutory Import Programs Staff, Room 3720, U.S. Department of 
Commerce, Washington, D.C. 20230. Applications may be examined between 
8:30 A.M. and 5:00 P.M. at the U.S. Department of Commerce in Room 
3720.
Docket Number: 09-009. Applicant: University of North Carolina at 
Charlotte, 9201 University City Blvd., Charlotte, NC 28223. Instrument: 
Electron Microscope. Manufacturer: JEOL, Japan. Intended Use: The 
instrument will be used to study materials such as metals, 
semiconductors, polymers, composites, ceramic, biological material and 
nanostructured materials. Justification for Duty-Free Entry: No U.S.-
made instruments of same general category. Application accepted by 
Commissioner of Customs: March 30, 2009.
Docket Number: 09-010. Applicant: Indiana University, 400 East Seventh 
St., Room 403, Bloomington, IN 47408. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used to visualize materials that have been 
fabricated or synthesized and have feature sizes that cannot be seen by 
eye or an optical microscope. Justification for Duty-Free Entry: No 
U.S.-made instruments of same general category. Application accepted by 
Commissioner of Customs: March 30, 2009.
Docket Number: 09-011. Applicant: Carnegie Mellon University, 5000 
Forbes Ave., Pittsburgh, PA 15213. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used study atomic spacing on orientations in 
crystalline materials, which requires a microscope capable of 
resolution below .1nm. Justification for Duty-Free Entry: No comparable 
instrument manufactured domestically. Application accepted by 
Commissioner of Customs: March 30, 2009.
Docket Number: 09-012. Applicant: Ohio State University Medical Center, 
M018 Starling Loving Hall, 320 W. 10th Ave., Columbus, OH 43210. 
Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan. 
Intended Use: The instrument will be used study biological materials 
such as tissue cultures, animal organs and human biopsy specimens. 
Experiments may include routine ultrastructual examination, immune-gold 
immunocytochemistry and negative staining of particulate matter. 
Justification for Duty-Free Entry: No comparable instrument 
manufactured domestically. Application accepted by Commissioner of 
Customs: April 7, 2009.

    Dated: April 16, 2009.
Christopher Cassel,
Acting Director, IA Subsidies Enforcement Office.
[FR Doc. E9-9286 Filed 4-21-09; 8:45 am]
BILLING CODE 3510-DS-S
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