p. 1


# OAR Box 1490 Prepped by Charmelle Mathews



## Document

Number: 

# 1 ) IV-B- 1 Docket Number: 

# A-94-5 2

Printed 8/4/2008 11:51:46

AM Sheet 1 of 273P. 2



### FINA LSIT EVISI T REPOR T NONCONFIDENTIA LBASE D O NPLAN T COMMENT S TO : Projec t

Fil e Reinforce dPlasti c Composite s NESHA P FROM : Melani e Proctor , Pacifi c Environmental Services , Inc
. andKeithBarnett ,

U
. S
. Environmental Protectio nAgenc y DATE : September 2 , 1999 , revise dApri l 11 , 200 2 SUBJECT : Site Visit

—AppalachianPlastics , Inc. , Glad e Spring , V A EP A Contrac t

68-D6-0013 , PE S Projec t N82 3
I
. Purpos e Th e purpos e ofthi s visi t

wa s t o collec t

additional informatio no nth e ope nmoldin g processe s use db y Appalachian Plastics , Inc
. Thes e processe s includ e manual resi napplication , mechanica

l resi n application , filamen t winding , andgel coating
. Th e visi t wa s als o intende dt o provid e additional informatio n abou t AppalachianPlastics ' Clas s 1 smok e an dClas s 1 flame retardan t composit e duc t

systemthat

i s produce dwit

hamethyl methacrylate base dresi n containin g 6 0 percen t

hazardou s ai r

pollutant s (HAP)
. II
.

III
. Plac e andDat e Appalachia

n Plastics , Inc
. 3400 1 Glov e Driv e Pos t Office Bo x 96 8 Glad e Spring , Virgini a2434 0 

# m ?T^ 3
EP AAI R DOCKE T 

### Augus t 4 , 199 9 Participant s Appalachia

n Plastics
. Inc
. Mr
. Davi dDeBusk , General Manage r Ms
. Kelly DeBusk , Regulatory Complianc e Specialis t Ashlan dChemica

l Compan y Mr
. Timothy Pepper , Technical Servic e Manage r - Specialt

y Resin s Grou p Mr
. Davi dHarris , Accoun t Executiv e - Specialt

y Resins/Southeas t~3T P. 3



## %V~ 

# 2 .



# S TXK

& i s W^ c 

# rw^^4

UP. 4



### Site Visit Repor t - Appalachian Plastics , Inc
. Pag e 3 Chuc k Elkin s & Associate s Chuc k Elkin s Composite s Fabricator s Associatio n (CFA ) Mr
. John Schweitze r Mr
. Stev e McNall y Pacifi c Environmental Services
. Inc
. (PES ) Ms
. Melani e Proctor , PE S Projec t Lead Strongwel l Mr
. JohnBarker , Manager o f Environment

Affairs , Safety , an dLos s Preventio n U.S
. EP A Mr
. Keit hBarnett , EP A Projec t

Lea d IV
. Introductio n Afte r general introduction s wer e made , Mr
. Barnett explaine dth e EPA' s confidentia l busines s informatio n (CBI ) procedure s andth e step s involve dinpreparin g th e sit e visi t report . Mr
. Barnett

als o discusse dth e curren t stag e ofth e projec t

an dindicate dtha t

th e projec t

i s i n th e pre-proposa l stag e at

thi s time
. V
. Resi nUs e an dProduc t Discussio n Mr
. DeBus k

explaine dthat

Appalachia

nPlastic s ha s develope dauniqu e Clas s 1 smok e andClas s 1 flam

e retardan t

composit e duc t

systemthat

ha s aflame sprea do f

les s than2 0 an

d smoke generatio n o f

les s tha n 4 0 in accordanc e wit hth e ASTM-E8 4 tunne l test . Accordin g t o Mr
. DeBusk , no n Clas s 1 product s will soo nno t b e allowe di

nth e constructio nindustry
. H e further explaine dtha t

th e resi n use dt o make thi s product , calle dMODA Rresin , i s amethyl methacrylate base dresi n wit haHA Pconten t

o f 6 0 percent . Mr
. DeBus k indicate dthat Appalachia

n Plastic s currentl y meet s th e preliminar y MAC T floors considere dby EPA , bu t wit ha growin g marke t

fo r product s mad e b y th e hig hHA PMODA Rresin , AppalachianPlastic s anticipate s that

i t will b e impossibl e for

the mt o comply wit

hth e MAC T standar db y 2001
. H e provide dacop y o f

a"MAC T feasibilit

y study " t o sho w th e marke t trend s for

hi s company and relate dMAC T poin t

valu e informatio n(Attachmen t 1)
. Accordin g t o Mr
. DeBusk , th e growin gP. 5



## Sit e Visi t Repor t - Appalachia

n Plastics , Inc
. Pag e 4 marke t fo r th e hig hHA PMODA Rresi n product s an

dth e shrinkin

g or constan t market s fo

r othe r lowe r HA Presi n product s wil

l not allo w Appalachia

n Plastic s t o compl

y wit hth e preliminar

y MAC T standar db y using emission s averaging
. Mr
. DeBusk explaine dtha t Appalachia

n Plastic s produce s product s wit

h29 percen

t HA Presi n fo r the coa l minin g industry , whic

hcurrentl y allow s the mt o offset

th e highe r emission s fro

mthe MODA

Rresin
. But

as Mr
. DeBusk

pointedout , th e marke t trendfo r coa l minin g product s i s declinin

g an dtherefor e th e lowe r HA Presin product s ar

e not expectedt o b e able t o of

f se t the hig hHA Presi n product s i

n th e future
. Mr
. DeBusk

als o indicatedtha

t the y cannot produc e drive shaft

s wit hlow HA Presins
. H e statedtha t Appalachia

n Plastic s wouldpotentiall

y us e 800,000 pound s of

4 5 percen t HA Pviny l este r resi n t o produc e drive shaft

s i n the filament

windin g process . Thi s i s anoncorrosion resistan t product , but

wouldb e consideredhig

hstrength
. Mr
. DeBusk

addedthe Appalachia

n Plastic s has take

n ever y allowable reduction method so far , whic hentailedswitchin

g t o flow coaters/pressure-fedroller s an dt o th e lowes t

possible resi n HA Pcontents . H e sai

dtha t wit hal l thes e reduction method s i

n place , Appalachia

n Plastic s wil l stil l not b e able t o compl

y wit hth e MAC

T standar db y the yea r 2001
. Th e Ashlan drepresentative s agree

dwit hMr
. DeBusk' s assessmen

t an dconfirme dtha t Appalachia

n Plastics ' Clas s 1 composit e duct syste mwa s trul y unique i n tha t smok e generation value s wer e les s tha n 50
. Mr
. Peppe

r statedtha t fo r th e MODA

Rresin , smok

e generation value s ar e typicall y les s tha n 200 , bu t Appalachia

n Plastic s wa s abl

e t o achieve muc

hlowe r smok e generation value s b

y using ahig

hamoun t of filler. Mr
. Peppe

r addedtha t smok e an dflame retardan t propertie s ar

e achieve db y eithe r usin g aresi n wit hahig haromatic conten

t or b y using a hig hfiller loading
. He addedtha

t th e MODA

Rresi n has alow aromatic conten t but i t ca n be highl y filled. Th

e MODA Rresi n i s onl y use da t Appalachia

n t o produc e product s wit

hClas s 1 fire an dsmok e ratings
. Mr
. DeBusk

pointedout

tha t i n addition t o th e goo dflame an dsmok e retardan t properties , th e MODA

Rresi n has goo dU

V an dbulle t resistanc e properties
. H e adde dtha t Appalachia

n Plastic s wa s plannin

g th e marke

t thes e excellen

t propertie s i

n futur e products
. Mr
. Barnet

t askedthe Ashlan

drepresentative s i

f ther e wer e othe r customers fo

r th e MODA Rresin
. Mr
. Harri s repliedtha t ther e ar e approximatel

y ahal f millio n pound s o

f MODA R resi n sol deac hyear . H e addedth e othe

r customers us e th e MODA

Rresi n fo r pultrudedpart s an di n th e automotiv e industry
. Mr
. Harri s als o pointedou t tha t th e MODA

Rresi n has aver y fast cur e time , whic

hmake s i t mor e difficul t to wor k with
. Thus , he di

dnot expect tha t thei r customers wouldwan

t t o switc ht o the MODA

Rresi n unles s the

y nee di t fo r aspecifi c application
. Th

e other customers fo

r the MODA

Rresi n purchas e th e resi

n t o achieve smok

e value s of 20 0 or less , but according t o Mr
. Harri s smok e value s of 200 or les s ca n als o b e achieve db y othe r resins , whic

hhave lowe

r HA Pcontent s tha

n MODA Rresin
.P. 6



### Site Visi t Repor t - Appalachia

n Plastics , Inc
. Pag e 5 Mr
. Barnet t

inquire dif

ther e i s aclea

r distinctio nbetwee ncorrosion-resistan t an dno n corrosion-resistan t

applications
. Mr
. Schweitze r replie dthat

ther e i s agre y are abetwee n corrosion-resistan t

andno n corrosion-resistan t applications , whic hmake s it difficul t t o clearl y distinguis hbetwee n th e tw o applications
. Mr
. DeBus k state dthat

th e pric e for

corrosion-resistan t product s i s generall y higher than th e pric e for

no ncorrosion-resistan t

products
. Mr
. Schweitzer

pointe dout

that th e followin g thre e general characteristic s appl y for corrosion-resistan t

products : (1 ) Corrosion-resistan t resin s ar e generall y mor e expensiv e an d bette r than standar dorthophthali c resins , (2 ) corrosion-resistan t product s ar e generall y use dfor some typ e o f

chemica l service , and(3 ) corrosion-resistan t product s generall y hav e goo d temperatur e stability , whic hi s achieve db y th e mor e comple x molecula r structur e ofth e resin
. VI
. Plan t

Tou r Th e first tw o processe s viewe ddurin g th e plant tou r wer e th e manual resi napplicatio n and th e filament

windin g processes . Botho f thes e processe s are use dincombinatio nt o make ductin g material
. Th e produc t

produce da

t th e tim e ofth e site visit

was th e Clas s 1 smoke an dClas s 1 flame retardan t

composit e duc t

system . I n producin g th e duc t

material , acorrosion-resistan t vinyl este r

liner i s applie db y manua

l application
. Fo r

th e main structur e ofth e duc t material , MODA Rresi ni s applie db y usin g th e filamen t windin g process . I n th e manua l resi napplicatio nprocess , th e resi ni s applie db y han dt o th e mandrel , whic hi s covere db y myla r film. Durin g han dapplication , th e resi ni s pouredont o th e rotatin g mandre l androlle dout . Durin g filament winding , th e reinforcement i s pulle dthroug hth e resi n bat handwoun do n th e rotatin g mandrel
. Exces s resi ni s remove dfromth e mandre l and collecte di

n a n ope n containe r

by usin g asqueegee . A portio nofth e exces s resi ntha t i s collecte d i s reapplie dt o th e mandre l i n area s wher e additional resi ni s needed
. Hood s ar e installe dover

th e filamen

t windin g machine s t o reduc e employe e exposure . Afte r th e resi n i s applied , th e part s are move dt o th e curin g area , wher e oven s ar e use dt o reduc e th e curin g tim e for

th e duc t material
. Th e facilit

y use s aceton e for

al l cleanin g operation s a

t th e facility
. Th e facilit

y ha s tw o filamen

t windin g machine s inoperatio nandathirdfilamen t windin g machin e i s bein g added
. Th e tw o existin g filament windin g machine s produc e duc t u p t o eight feet i n diameter

andth e ne w machin e will produc e duc t u p t o 1 2 feet

indiameter
. Th e facilit y ha s 1 0 mixin g vessel s that ar e use dt o supply resi nfor th e filament

windin g andmanual resi n applicatio n processes . Th e resi ni s poure dfrom5 5 gallo ndrum s int o th e mixing vessels , filler

andothe r additive s ar e added , an dth e material s ar e mixe dinth e covere dmixin g vessels
. Afte

r mixing , th e resi n mix i s pumpe dt o adispenser nea r th e filament

windin g machines
.P. 7



## Sit e Visi t Repor t - Appalachia

n Plastics , Inc
. Pag e 6 I n addition t o th e duct

material , Appalachia

n Plastics ' product s als o includ e tank s an d pressur e vessels
. Mr
. DeBusk

pointedout

a5 0 psi pressur

e vesse l tha t wa s produce db

y using a viny l este r resi n wit ha4 5 percen

t HA Pcontent . H e adde

dtha t the y ar e currentl y evaluating a low HA Presin fo r th e production ofthi s product
. Th e mai n par t ofth e vessel wa s producedb y th e filament

windin g proces s an

dth e vesse

l en dcap s wer e producedb

y manua l resin application an db y using flow coaters . I

n addition , ge

l coa t wa s applie

dt o th e outside ofth e pressur e vesse l b y hand
. Mr
. DeBusk

explaine dtha t som e facilitie s us e ge

l coa t o n th e outside of

their vessels , bu t most facilitie s us e pigmentedresi n instead
. Mr
. DeBusk

indicatedtha

t th e pressur

e vesse l was certifie

db y th e Nationa

l Sanitation Foundation
. He addedtha

t the first certification too k

abou t on e yea r an dan y subsequen

t certification s wer

e done withi

n si x t o eigh t months
. Mr
. DeBusk

als o pointedout

th e customers pa y fo r th e certification fees
. Mr
. DeBusk

statedtha t the facilit y purchasedon

e flow coate

r an dconvertedone choppe

r gu n t o aflow coater , indicating tha t th e facilit y has atota

l o f tw o flow coaters . H e sai

dtha t th e flow coater s ar

e externall y mixed
. He adde

dtha t the facilit y als o has tw o choppe

r gun s i n th e fabricatio n are aan dthre e choppe

r gun s i n th e filament

windin g area . Mr
. DeBusk

explaine dtha t hi s facility' s interes t

i n th e flo w coater s wa s du

e t o th e pendin

g MAC T standard
. Mr
. DeBusk

als o pointedout

tha t the y us e som e ofth e sam

e resi n fo r manua l resi n application an

dfilament winding
. H e explaine

dtha t manua l resi n application i s usedt o join differen t part s int o one product
. He addedtha t i t i s importan

t tha t th e materia

l usedfo r th e joint s has th e sam

e physica l propertie s tha

n th e res t ofth e part . Ms
. Procto r

askedMr
. Peppe

r i f ther e ar e technica l problems wit

husin g tw o differen

t resin s o n th e sam e part . Mr
. Peppe

r repliedtha

t usin g tw o differen

t resin s on th e sam

e par t doe s not necessaril y caus e problem s providedtha t th e tw o resi n systems ar

e compatible (e.g. , have the sam e expansio n an dcontractio n properties)
. Mr
. DeBusk

indicatedtha

t ducting mad

e wit hphenolic resin s usedt o b e installedi n th e semiconducto

r industr y becaus e o

f it s goo dfir

e an dflame retardan

t properties , but

due t o product failure s th e industr

y discontinuedth e us e of

phenolic ducting material
. He addedtha t IB M an d Toshib aeliminate

dth e us e o

f reinforcedplastic composite s ducting material
. Mr
. DeBusk explaine dtha t phenolic resin s wil

l not wor k fo r corrosion-resistan

t applications
. H e statedtha t Appalachia

n Plastic s i s hoping to gai

n alarg e portion ofth e semiconducto r ducting marke

t wit h thei r MODA Rresi n duct material
. Mr
. DeBusk

indicatedtha

t duc t materia l usedfo r the minin g industr y i s consideredfir

e retardan t bu t not corrosion-resistant
. H e addedtha t most othe r fire retardant

product s ar

e als o corrosion-resistant
. Mr
. Schweitze r pointedou

t tha t most filament woun dproduct s ar

e i n the corrosion-resistan

t market
. He adde

dtha t th e majorit

y of thes e product s ar

e undergroundstorag e tanks
. Mr
. DeBusk

indicatedtha

t th e playgroun

dequipmen

t producedb

y Appalachia

n Plastic s ma y or ma y not be consideredcorrosion-resistant
. He adde dtha t thei r playgroundequipmen

t i sP. 8



## Sit e Visi t Repor t - Appalachia

n Plastics , Inc
. Pag e 7 expose dt o chlorinatedwate

r a t al l times , whic

hma y mak e i t acorrosion-resistan

t product
. Mr
. Barnet

t inquire dhow muc

hofth e reinforce

dplastic composite s marke t wa s associatedwit

hcorrosion-resistan

t products
. Mr
. Peppe

r replie dtha t abou t 1 3 percen t ofth e resi n sol di n th e reinforce

dplastic composite s marke t was sol dfo r the production of

corrosion

resistan t products
.P. 9



### Attachmen t

1 MAC T Feasibilit

y Study Provide db y AppalachianPlastic s

%P.1 0



# APPALACHIA N PLASTICS , INC . TEL540 429

# 258 1

P.O
. BO X 104 4 FAX : 540-429-263 1 GLAD E SPRING , V

A2434 0



## Propose dMACT Standard Feasibilit y Stud v



# °_p.1 1

•

•

• 

### Tabl e of Content s
Introductio n Summar y o f Table s MAC T Jan 97

- De c 9 7 MAC T Jan98

- De c 9 8 Projecte dIncreas e 199 9 MAC T

### l?? ? (.Al

l vinyiesier s t o 3-3^6 HAFS J 

### MAC T 199 9 (All Atomize dOperation s Change dt o Non-Atomize dOperations ) MAC T 199 9 (All Atomize dOperation s Change dt o Non-Atomize dOperation s & A U vinylester s to 35% ) Expecte dIncreas e for

th e Yea r 200 0 Expecte dIncreas e for

the Yea r 200 0 - Semiconductor

Contrac t Expecte dIncreas e for

th e Yea r 200 1 Expecte dIncreas e fo

r the Yea r 200 1 + Semiconductor

Contrac t Expecte dIncreas e for

th e Yea r 200 2 Expecte dIncreas e for

the Yea r 200 2 * Semiconductor

Contrac t Expecte dIncreas e for

the Yea r 200 3 Expecte dIncreas e for

th e Yea r 200 3 - Semiconductor

Contrac t Expecte dIncreas e fo

r the Yea r 200 4 Expecte dIncreas e fo

r the Yea r 200 4 - Semiconductor

Contrac t Expecte dIncreas e fo

r the Yea r 200 5 Expecte dIncreas e fo

r the Yea r 200 5 - Semiconductor

Contrac t


# lo i 1 3 5 7 9 

### 1 1
1 3 1 5 1 7 1 9 2 1 2 3 2 5 2 7 2 9 3 1

3 5 3 7 -P.1 2



### introductio n Appalachia

n Plastic s ha s develope dauniqu e Clas s I composite duc t systemutilizing a methy l methacrylate base dresin
. Tlii s produc t meet s al l di e requirement s o f

th e unifon n mechanical code 10- 1 for

peopl e occupie dspaces . Thi s i s th e only composit e duc t system inexistenc e tha

t wil l handl e certai ncorrosiv e en\ironment s an dals o comply wit hstringent buildin g codes
. Specifier s anden duser s requir e corrosio nequipment

t o hav e demonstrate dsatisfactor y servic e for

aperio do f

no t les s tha nfive years . Fina

l approval s wer

e obtaine do n thi s composite duc t

systemi n 199 5 making the yea

r 200 0 ou r liv e year benchmark
. Therefore , w e anticipate alarg e increas e indeman dfo r thi s Clas s I duc t

system . Tli e Clas s I systemutilize s the Moda r resi nhighlightedi

nthe tables
. One of

th e primar

y marketin g target s for

thi s systemi s the semiconducto r industry
. Initia

l fa b plant s us e massiv e duc t

system s to contai nthe corrosiv e chemical s use dinthe manufacmrin g o f semiconductors
. Therefore , inan y givenyear , a

nadditiona

l 200,00 0 pound s o f

Modar resi n woul db e processe di nthe event

w e ar e able t o procure on e semiconducto r contract . Th e following table s sho w current statu s o f operatio nanda

nestimate dstatu s o f

operatio n throug hth e year

200 5 base do nanticipate dmarket trend s an dth e propose dMAC T standard
. Not e b

y th e yea r 200 1 our general growt

hwoul dmake i

t impossibl e t o comply wit hth e MAC T standard
. I

n any givenyear , one semiconducto r contrac t woul dals o make i t impossibl e to comply
. Takin g advantag e o f

ever y allowable reductio nmetho dwoul dstil l leave Appalachia

n Plastic s non-compliant
. Th e propose dstandardwouldobliterate the abilit y to manufacture thi s uniqu e andmuc hneede dproduc t andgready hinder

potential growtii for

Appalachia

n Plastics
. Inc
. Some provision s nee dt o b e made to allow Appalachia nPlastic s t o continu e t o manufacture thi s uniqu e product
.



# 1 1P.1 3



### Summar v of

Table s
I
. MAC T Jan
. 9 7 - Dec
. 9 7 Thi s table depict s the rate o f emission s fo

r the calenda

r yea r 199 7 base do nthe current propose dMAC T Standardan dcurrent processe s bein g utilized
. H
. MAC T Jan
. 9 8 - Dec
. 9 8 Thi s tabl e depict s th e rate o f emission s fo

r th e calenda

r year 199 8 base do nth e current propose dMAC T Standardandcurrent processe s bein g utilized
. HI
. Projecte dIncreas e 199 9 Th e table entitle d"Projecte dIncreas e 1999 " demonstrate s th e estimate dincreas e fo r the calenda

r yea r 199 9 base do ncurrent

processe s an dth e propose dMAC T standard
. TV
. MAC T 199 9 (All Vinylester s t o 35%HAPs ) Thi s tabl e demonstrate s the estimate dstatu s o f operatio nfor

the 199 9 calenda

r yea r i f all vinylester

resin s were reduce dt o 35 % HAPs
. V
. MAC T 199 9 (All Atomize dOperation s Chang e t o Non-Atomize dOperations ) Thi s tabl e demonstrate s the estimate dstatu s o f operatio nfor

the calenda

r yea r 199 9 i f al l atomize doperation s were change dto non-atomize doperations
. Thi s exclude s gelcoats
. VI
. MAC T 199 9 (.Al

l Atomize dOperation s Change dt o Non-Atomize dOperation s & Vinylester s to 35% ) Thi s tabl e demonstrate s th e estimate dstatu s o f operatio nfo r

th e 199 9 calenda

r year i f al l reductio n method s provide dar e pu t into effect
. Thi s include s reducin g the HA Pcontent

o f al l vinylester

resin s t o 35 % an dchangin g al l atomize doperation s t o non-atomize doperations
. Thi s doe s no t include gelcoats
. VII. Expecte dIncreas e for th e Year 200 0 Thi s i s aprojectio n o f

increas e o f

emission s for

the calenda

r year 200 0 base don the cuiren t

propose dMAC T standardandall allowabl e method s o f reduction
. VUl
. Expecte dIncreas e fo r the Yea r 200 0 - Semiconducto r

Contrac t Thi s tabl e illustrate s th e projecte dincreas e of emission s for

th e yea r 2000
. plu s a

n additiona l 200.00 0 poun dincreas e inModa r resin
. Th e 200.00 0 pound s o f Moda r woul db e typica

l fo r asemiconducto r

contract . LX
. Expecte dIncreas e fo

r the Yea r 200 1 Thi s tabl e i s aprojectio no f increas e o f

emission s for

th e calenda

r yea r 200 1 base d o n the current

propose dMAC T standardan dal l allowabl e method s o f

reduction
. 1 

# I - 

# *-*P. M



### X
. Expecte dIncreas e for

the Yea r 200 1 - Semiconductor

Contrac t Thi s tabl e illustrate s the projecte dincreas e o f emission s for

th e year 200 1 plu s a semiconducto r

contract . XI
. Expecte dIncreas e fo

r the Yea r 200 2 Thi s tabl e i s aprojectio nof increas e o f

emission s for

th e calenda

r yea r 200 2 base d o n the current

propose dMAC T standardandal l allowabl e method s o f

reduction
. XII
. Expecte dIncreas e for the Yea r 200 2 - Semiconductor

Contrac t Thi s table illustrate s the projecte dincreas e o f emission s for

the yea r 200 2 plu s a semiconducto r

contract . XHI
. Expecte dIncreas e fo r the Yea r 200 3 Thi s tabl e i s aprojectio nof increas e o f

emission s for

th e calenda

r vea r 200 3 base d o n the current

propose dMAC T standardandal l allowabl e method s o f

reduction
. XIV
. Expecte dIncreas e for the Yea r 200 3 •+ • Semiconducto r

Contrac t Tlii s tabl e illustrate s the projecte dincreas e o f emission s for

th e year 200 3 plu s a semiconducto r

contract . XV
. Expecte dIncreas e for th e Yea r 200 4 Thi s tabl e i s aprojectio no f increas e o f

emission s for

th e calenda

r yea r 2004 base d o n di e current

propose dMAC T standardandal l allowabl e method s o f

reduction
. XV LExpecte dIncreas e fo

r the Yea r 200 4 - Semiconductor

Contrac t Thi s tabl e illustrate s the projecte dincreas e o f emission s fo

r the yea r 200 4 plu s a semiconducto r

contract . XVII
. Expecte dIncreas e fo r the Yea r 200 5 Thi s tabl e i s aprojectio no f increas e o f

emission s for

th e calenda

r yea r 200 5 base d o n the current

propose dMAC T standardan dal l allowabl e method s of

reduction
. XVll l Expecte dIncreas e fo r the Yea r 200 5 - Semiconductor

Contrac t Thi s tabl e illustrate s di e projecte dincreas e o f emission s for

th e yea r 200 5 plu s a semiconducto r

contract .

2 

# 1 3Mact Ja n 9 7 - De c9 7

Resi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 99 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Proces s

Vlech
. non-atomized/Corrosio n PMCorrosio n Mech
. non-atomized/Corrosio n Mech
. Atomized/Corrosio n Vlech
. non-Atomized/Corrosio r Mech
. Atomized/Corrosio n Vlech
. Non-Atomized/Corrosio r Hetro n Q636 2 "Mech
. Atomized/Fille d Hetro n Q636 2 * FW/Non-Corrosion/Fille d Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 v/lech
. Non-Atomized/Corrosio r

V— b FW/HSS-Corrosio n Mech
. Atomized/Unfille d FW/Non-Corrosio n FW/Non-Corrosio n FW/Corrcsio n Mech
. Non-Atomized/Fille d Mech
. Atomized/Corrosio n Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Quantit y

215 0 1976 4 3513 6 154 0 2926 0 192 5 3657 5 1219 8 19110 2 6364.1 6 3579.8 4 486 0 714 0 23388.7 5 23388.7 5 472. 5 0 0 0 1002. 8 1504. 2 0 0 0 0 % HA P

4 1 4 3 4 3 3 6 3 6 3 9 3 9 2 9 2 9

~ 3 5 3 5 4 0 4 0 6 0 6 0 6 0 4 9 4 5 4 5 3 7 3 7 3 4 3 4 3 5 3 5 Poin t 

### Valu e 12 1 16 9 13 5 17 3 9 0 21 3 10 8 9 8 10 2 8 5 13 0 22 7 15 4 27 0 27 0 15 5 38 7 54 1 14 9 37 5 9 6 32 0 7 9 33 8 8 5 Poin t Valu e X

Quantit y 260150 334011 5 474336 0 266420 263340 0 41002 5 395010 0 119540 4 1948240 4 540953. 6 465379. 2 110322 0 109956 0 6314962. 5 6314962. 5 73237. 5 0 0 0 37605 0 144403. 2 0 0 0 0 Maxiumu m

Poin t Valu e 34400 0 232507 2 562176 0 24640 0 468160 0 30300 0 585200 0 195168 0 2464326 0 1018265. 6 465379. 2 43740 0 92820 0 3040537. 5 346153 5 7560 0 0 0 0 274767. 2 106798. 2 0 0 

## o 0 

# I HP.1 6

Mac t Ja n 9 7 - De c9 7
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-653 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # " s of Resin : Quantit y

0 0 0 0 0 0 0 0 342 1 3421 0 0 40819 3 % HA P oin t Val u

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 3 5 33 8 8 5 33 8 8 5 11 4 7 4

•10 8 7 0 Poin t Valu e X

Quantity 0 0 0 0 0 0 0 0 38999 4 25315 4 0 0 130.740251 5 Maximu m

Poin t Valu e 0 0 0 0 0 0 0 0 24289 1 24289 1 0 0 139.80650 5

A 

# i sMact Ja n 9 8 - De c9 8 P.1 7

Resi n Hetro n 13 7 Hetro n 92 2 Hetro n 32 2 Hetro n 99 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s Quantity % HA P

Mech
. non-atomized/Corrosio n 760 0 FW/Corrosio n 4260 6 Mech
. non-atomized/Corrosio r7574 4 Mech
. Atomized/Corrosio n 70 4 Vlech
. non-Atomized/Corrosio r1337 6 Mech
. Atomized/Corrosio n 280 0 vlech
. Non-Atomized/Corrosio r5320 0 Mech
. Atomized/Fille d 14852. 7 FW/Non-Corrosion/Fille d 

### 232692. 3 

# C vlech
. Non-Atomized/Corrosio r27738.8 8 ~TP*.\1 ke***.<

b ?on
. Sv^-vxvw.. , (?v»b -coaeo*5i^

• o FW/Ne-n-Corrosio n 15603.1 2 Mech
. Atomized/Unfille d 30909. 6 FW/Non-Corrosio n 45410. 4 FW/Non-Corrosio n 4455 0 

### FW/Corrosio n 4455 0 Mech
. Non-Atomized/Fiile d 90 0 Mech
. Atomized/Corrosio n 1440 0 Mech
. Atomize d 0 Manua l 0 Mech
. Atomize d 118 6 Manua l 177 9 Mech
. Atomize d 0 Manua l 0 Mech . Atomized 0 Manua l 0 4 1 4 3 4 3 3 6 3 6 3 3 3 9 2 9 2 9 3 5 3 5 4 0 4 0 6 0 6 0 6 0 4 9 4 5 4 5 3 7 3 7 3 4 3 4 3 5 3 5 Poin

t Valu e 12 1 16 9 13 5 17 3 9 0 21 3 10 8 9 8 10 2 8 5 13 0 22 7 15 4 27 0 27 0 15 5 38 7 54 1 14 9 37 5 9 6 32 0 7 9 33 8 8 5 Poin

t Valu e X Quantity / 91960 0 720041 4 1022544 0 12179 2 120384 0 59640 0 574560 0 1455564. 5 23734614. 6 2357804. 8 2028405. 6 7016479. 2 6993201. 6 1202350 0 1202850 0 13950 0 557280 0 0 0 44475 0 17078 4 0 0 0 0 Maxiumum

Poin t Valu e 121600 0 630568 8 1211904 0 11264 0 214016 0 44800 0 851200 0 237643 2 3024999 9 4438220. 8 2028405. 6 278186 4 590335 2 579150 0 659340 0 14400 0 230400 0 0 0 32496 4 12630 9 0 0 0 0


# 11 *P.1 8

Mac t Ja n 9 8 - De c9 8
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # " s o f Resin : Quantity

0 0 0 0 0 0 0 0 517 0 517 0 0 0 68094 2 % HAF

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 1 oin t Val u
37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Poin t Valu e X

Quantit y 0 0 0 0 0 0 0 0 58938 0 38258 0
. 0 0 148.259250 3 Maximu m

Poin t Valu e 0 0 0 0 0 0 0 0 367070 36707 0 0 0 138.998790 5



# \ 7P.1 9

Projecte d Increas e 199 9
Resi n
Hetro n 19 7 Hetro n 32 2 Hetro n 92 2 Hetro n 99 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s Quantit y % HA P

Mech
. non-atomized/Corrosio n 786 3 4 1 FW/Corrosio n 5572 8 4 3 Mech
. non-atomized/Corrosio n 9907 2 4 3 Mech
. Atomized/Corrosio n 1243.962 5 3 6 Vlech
. non-Atomized/Corrosio r23635.287 5 3 6 Mech
. Atomized/Corrosio n 3124.698 5 3 9 Vlech
. Non-Atomized/Corrosio r59369.271 5 3 9 Mech
. Atomized/Fille d 14110.06 5 2 9 FW/Non-Corrosion/Fille d 221057.68 5 2 9 Vlech
. Non-Atomized/Corrosio r26900.4 3 3 5 FW«a-Corrosio n 15131.5 2 3 5 Mech
. Atomized/Unfille d 2438 1 4 0 FW/Non-Corrosio n 3581 9 4 0 FW/Non-Corrosio n 53905. 5 6 0 FW/Corrosio n 53905. 5 6 0 Mech
. Non-Atomized/Fille d 108 9 6 0 Mech
. Atomized/Corrosio n 1440 0 4 9 Mech
. Atomize d 8 7 4 5 Manua l 130. 5 4 5 Mech
. Atomize d 146 8 3 7 Manua l 220 2 3 7 Mech
. Atomize d 22 3 3 4 Manua l 34 2 3 4 Mech
. Atomize d 158. 8 3 5 Manua l 238. 2 3 5 Poin t Valu e 

### 12 1 16 9 13 5 17 3 9 0 

### 21 3 10 8 9 8 10 2 8 5 

### 13 0 22 7 15 4 27 0 27 0 15 5 38 7 54 1 14 9 37 5 9 6 32 0 7 9 33 8 8 5 Poin t Valu e X

Quantit y 

### 95142 3 941803 2 1337472 0 215205.512 5 2127175.87 5 665560.780 5 6411881.32 2 1382786.3 7 22547883.8 7 2286540. 3 1967097. 6 553448 7 551612 6 1455443 5 1455448 5 16879 5 557280 0 4706 7 19444. 5 55050 0 21139 2 7296 0 2701 8 53674. 4 2024 7 Maxiumu m

Point Valu e 125808 0 824774 4 1585152 0 19903 4 378164 6 499951.7 6 9499083.4 4 2257610. 4 28737499.0 5 4304076. 3 196709 7 6 219429 0 465647 0 700771 5 797301 4 17424 0 230400 0 2383 8 9265. 5 40223 2 15634 2 6247 2 2428 2 43511. 2 16912. 2 

# \tP.2 0

Projecte d Increas e 199 9
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # " s of Resin : Quantity

145. 2 217. 3 26 2 39 3 107. 6 161. 4 2 0 3 0 183 5 183 5 195 0 195 0 724497.4 7 % HA P

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 oin t Val u
37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Poin t Valu e X

Quantit y 5445 0 20908. 8 8855 6 3340 5 36368. 8 1371 9 676 0 255 0 209190 13579 0 210600 13650 0 150.725972 3 Maximu m



### Poin t Value . 39784. 8 15463. 8 7178 8 2790 3 29482. 4 11459. 4 548 0 213 0 13028 5 13028 5 13845 0 13845 0 141.336433 3



# l lP.2 1

MAC T199 9 (Ai i vinyiester s t o 35 % HAPs )
Kesi n Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 99 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s Quantity % HA P

Mech
. non-atomized/Corrosio r786 3 4 1 FW/Corrosio n 5572 8 3 5 Mech
. non-atomized/Corrosio r9907 2 3 5 Mech
. Atomized/Corrosio n 1243.962 5 3 6 Mech
. non-Atomized/Corrosio r23635.287 5 3 6 Mech
. Atomized/Corrosio n 3124.698 5 3 5 Vlech
. Non-Atomized/Corrosio r59369.271 5 3 5 Mech
. Atomized/Fille d 14110.06 5 2 9 FW/Non-Corrosion/Fille d 221057.68 5 2 9 Vlech
. Non-Atomized/Corrosio r26900.4 8 3 5 FW/lSBi-Corrosio n 15131.5 2 3 5 Mech
. Atomized/Unfille d 2438 1 4 0 FW/Non-Corrosio n 3581 9 4 0 FW/Non-Corrosio n 53905. 5 6 0 FW/Corrosio n 53905. 5 6 0 Mech
. Non-Atomized/Fiile d 108 9 6 0 Mech
. Atomized/Corrosio n 1440 0 4 9 Mech
. Atomize d 8 7 4 5 Manua l 130. 5 4 5 Mech
. Atomize d 146 8 3 7 Manua l 220 2 3 7 Mech
. Atomize d 22 8 3 4 Manua l 34 2 3 4 Mech
. Atomize d 158. 8 3 5 Manua l 238. 2 3 5 Poin t Valu e 

### 12 1 13 0 8 5 17 3 9 0 16 0 8 5 9 8 

### 10 2 8 5 13 0 22 7 15 4 27 0 27 0 15 5 38 7 54 1 

### 14 9 37 5 9 6 32 0 7 9 33 8 8 5 Poin t Valu e X Quantit y 95142 3 724464 0 842112 0 215205.512 5 2127175.87 5 499351.7 6 

### 5046388.07 8 1382786.3 7 22547883.8 7 2286540. 8 1967097. 6 553443 7 551612 6 1455448 5 1455448 5 16873 5 • 557280 0 4706 7 19444. 5 55050 0 21139 2 7296 0 2701 8 53674. 4 2024 7 

### Maxiumu m

Poin t Valu e 125808 0 824774 4 1585152 0 19903 4 378164 6 499351.7 6 9499083.4 4 2257610. 4 28737499.0 5 4304076. 3 1967097. 6 219423 0 465647 0 700771 5 797801 4 17424 0 230400 0 2383 3 9265. 5 40223 2 15634 2 6247 2 2428 2 43511. 2 16912. 2


# loP.2 2

MAC T199 9 (Al l vinylester s t o 35 % HAPs )
Resi n MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # " s o f Resin : Quantity

145. 2 217. 8 26 2 39 3 107. 6 161. 4 2 0 3 0 183 5 183 5 195 0 195 0 724497.4 7 % HA P oin t Val u Poin t Valu e X

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Quantity

5445 0 20903. 3 8855 6 3340 5 36363. 8 1371 9 676 0 255 0 209190 13579 0 21060 0 13650 0 138.775489 9 Maximu m

Poin t Valu e 39784. 8 15463. S 7178 8 2790 3 29482. 4 11459. 4 548 0 213 0 13028 5 13028 5 13845 0 13845 0 141.336433 3



### 1 0 

# MP.2 3



### MACTi99 9 (Ai i Atomize d Operation s change d t o Non-Atomize d Operations )
Resi n
Hetro n 19 7 Hetro n 32 2 Hetro n 32 2 Hetro n 39 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s

Mech
. non-atomized/Corrosio r FW/Corrosio n Mech
. non-atomized/Corrosio r Mech
. non-atomized/Corrosio n Mech
. non-Atomized/Corrosio r Mee
. Non-Atomized/Corrosio n Quantit y
786 3 5572 8 9907 2 1243.962 5 23635.287 5 3124.698 5 Vlech
. Non-Atomized/Corrosio r59369.271 5 Mech
. Non-Atomized/Fille d FW/Non-Corrosion/Fille d vlech
. Non-Atomized/Corrosio r FW/tt»-Corrosio n Mech
. Non-Atomized/Unfille d FW/Non-Corrosio n FW/Non-Corrosio n FW/Ccrrosio n Mech
. Non-Atomized/Fille d Mech
. Atomized/Corrosio n Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 14110.06 5

221057.68 5 26900.4 8 15131.5 2 2438 1 3581 9 53905. 5 53905. 5 108 9 1440 0 8 7 130. 5 146 8 220 2 22 8 34 2 158. 3 238. 2 % HA P

4 1 4 3 4 3 3 6 3 6 3 9 3 9 2 9 2 9 3 5 3 5 4 0 4 0 6 0 6 0 6 0 4 9 4 5 4 5 3 7 3 7 3 4 3 4 3 5 3 5 Poin t 

### valu e 12 1 16 9 13 5 9 0 9 0 10 8 10 8 5 5 10 2 8 5 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 32 0 7 9 33 8 8 5 

### Poin t Valu e X Quantity 95142 3 341803 2 1337472 0 111356.62 5 2127175.87 5 337467.43 8 6411881.32 2
. 776053.57 5 22547883.8 7 2286540. 8 1967097. 6 277943 4 551612 6 1455443 5 1455448 5 16879 5 260640 0 4706 7 19444. 5 550500 21139 2 7296 0 2701 8 53674. 4 2024 7 Maxiumu m

Poin t Valu e 125808 0 824774 4 1585152 0 199034 378164 6 499951.7 6 9499083.4 4 2257610. 4 28737499.0 5 4304076. 8 1967097. 6 219429 0 465647 0 700771 5 797801 4 17424 0 230400 0 23338 9265. 5 40223 2 15634 2 6247 2 2428 2 43511. 2 16912. 2



### 1 1 ^ ^ -P.2 4

MACT199 9 (Al l Atomize d Operation s change d t o Non-Atomize d Operations )
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6
. MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # s of Resin : Quantit y
145. 2 217. 8 26 2 39 3 107. 6 161. 4 2 0 3 0 183 5 183 5 195 0 195 0 724497.4 7 % HA F

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 oin t Val u
37 5 9 6 33 8 3 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Poin t Valu e X

Quantit y 5445 0 20908. 8 8855 6 3340 5 36368. 8 1371 9 676 0 255 0 209190 13579 0 21060 0 13650 0 141.396018 4 Maximu m

Poin t Valu e 39784. 8 15463. 3 7178 8 2790 3 29482. 4 11459. 4 548 0 213 0 13028 5 13028 5 13845 0 13845 0 141.336433 3



### 1 2 

# 2 3P.2 5

MAC T199 9 (Al l Atomize d Operation s change d t o Non-Atomize d Operation s & Al l vinylester s t o 35% )
Resi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 93 P Hetro n 33 P Hetro n 33 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s

Mech
. non-atomized/Corrosio n FW/Corrosio n Mech
. non-atomized/Corrosio r Mech
. non-atomized/Corrosior
. Quantity
786 3 5572 8 9907 2 1243.962 5 Vlech
. non-Atomized/Corrosio r23635.287 5 Me o Non-Atomized/Corrosio n 3124.698 5 vlech
. Non-Atomized/Corrosio r59369.271 5 Mech
. Non-Atomized/Fille d FW/Non-Corrosion/Fille d Vlech
. Non-Atomized/Corrosio r FW/N*«w-Corrosio n Mech
. Non-Atomized/Unfille d FW/Ncn-Corrosio n FW/Non-Corrosio n FW/Corrosio n Mech
. Non-Atomized/Fille d Mech
. Atomized/Corrosio n Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 14110.06 5

221057.68 5 26900.4 8 15131.5 2 2438 1 3581 9 53305. 5 53905. 5 108 9 1440 0 8 7 130. 5 146 3 220 2 22 8 34 2 153. 8 238. 2 % HA P

4 1 3 5 3 5 3 6 3 6 3 5 3 5 2 9 2 9 3 5 3 5 4 0 4 0 6 0 6 0 6 0 4 9 4 5 4 5 3 7 3 7 3 4 3 4 3 5 3 5 Poin t 

### Valu e 12 1 13 0 8 5 9 0 9 0 8 5 8 5 5 5 10 2 8 5 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 32 0 7 9 ooo 8 5 Poin t Valu e X

Quantit y 95142 3 724464 0 842112 0 111956.62 5 2127175.87 5 265599.372 5 5046388.07 8 776053.57 5 22547883.8 7 2286540. 8 1967097. 6 277943 4 551612 6 1455448 5 1455448 5 16873 5 260640 0 4706 7 19444. 5 55050 0 21139 2 7296 0 2701 8 53674. 4 2024 7 Maxiumu m

Poin t Valu e 125808 0 824774 4 1585152 0 19303 4 378164 6 433351.7 6 9499083.4 4 2257610. 4 28737499.0 5 4304076. 8 1967097. 6 219429 0 465647 0 700771 5 797801 4 17424 0 230400 0 2383 8 9265. 5 40223 2 15634 2 6247 2 2428 2 43511. 2 16912. 2


### 1 3 

# * fP.2 6

MAC T199 9 (Al l Atomize d Operation s change d t o Non-Atomize d Operation s & Al l vinylester s t o 35% )


### Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # " s of Resin : Quantit y
145. 2 217. 3 26 2 39 3 107. 6 161. 4 2 0 3 0 183 5 183 5 195 0 195 0 724497.4 7 % HA P oin t Val u Poin t Valu e X

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Quantit y

5445 0 20903. 8 8855 6 3340 5 36368. 8 1371 9 676 0 255 0 20919 0 13579 0 21060 0 13650 0 129.574923 6 Maximu m

Poin t Valu e 39784. 8 15463. 8 71788 2790 3 29482. 4 11459. 4 548 0 213 0 13028 5 13028 5 13845 0 13845 0 141.336433 3



### 1 4 

# ISExpecte d increas e fo rth e Yea r200 0 P.2 7

Kesi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 99 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 

### Kroces s Quantit y% HA P

Mech
. non-atomized/Corrosio n 786 3 4 1 FW/Corrosio n 61300. 3 3 5 Mech
. non-atomized/Corrosio n 108979. 2 3 5 Mech
. non-atomized/Corrosio n 1243.962 5 3 6 Vlech
. non-.Atomized/Corrosic r23635.287 5 3 6 Mee
. Non-Atomized/Corrosio n 3537.1683 5 3 5 vlech
. Non-Atomized/Corrosior68156.1986 5 3 5 Mech
. Non-Atomized/Fille d 17933.55 1 2 9 FW/Non-Corrosion/Fille d 281037.29 9 2 9 Vlech
. Non-Atomized/Corrosio r29590.52 3 3 5 FW#tee-Corrosio n 16644.67 2 3 5 Mech
. Non-Atomized/Unfille d 26819. 1 4 0 FW/Non-Corrosio n 39400. 9 4 0 FW/Non-Corrosio n 84456.791 1 6 0 FW/Corrosio n 84456.791 1 6 0 Mech
. Non-Atomized/Fille d 1706.197 8 6 0 Mech
. Atomized/Corrosio n 1440 0 4 9 Mech
. Atomize d 95. 7 4 5 Manua l 143.5 5 4 5 Mech
. Atomize d 1211.7 5 3 7 Manua l 1817.6 4 3 7 Mech
. Atomize d 250. 3 3 4 Manua l 376. 2 3 4 Mech
. Atomize d 174.6 8 3 5 Manua l 262.0 2 3 5 Poin t Valu e 

### 12 1 13 0 8 5 9 0 9 0 8 5 8 5 5 5 10 2 8 5 13 0 

### 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 

### 9 6 32 0 7 9 33 3 8 5 Poin t Valu e X Quantit y 95142 3 736310 4 926323 2 

### 111956.62 5 2127175.87 5 304909.309 8 5793276.88 5 986620.30 5 28665804. 5 

### 2515194.3 8 2163807.3 6 3057377. 4 6067738. 6 22803333. 6 22803333. 6 264460.65 9 260640 0 51773. 7 

### 21388.9 5 45441 0 

### 174493.4 4 8025 6 29719. 8 59041.8 4 22271. 7 Maxiumu m

Poin t Valu e 

### 125808 0 9072518. 4 1743667 2 19303 4 378164 6 573346.93 6 10904991.7 8 

### 2870168.1 6 36534848.8 7 4734484.4 8 2163807.3 6 241371 9 512211 7 10979382.8 4 12499605.0 8 272991.64 8 230400 0 26221. 8 10192.0 5 332022.2 4 129052.4 4 68719. 2 25710. 2 47862.3 2 18603.^ 2


## 15 

# V*

### Expecte d Increas e fo rth e Yea r200 0 P.2 8



### Resi n Proces s Quantity% HA P oin t Val u Poin t Vaiu e X Maximu m
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # s of Resin : 159.7 2

239.5 8 288. 2 432. 3 118.3 6 177.5 4 2 2 3 3 2018. 5 2018. 5 214 5 214 5 885346.49 7 3 7

3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Quantif y

5989 5 22333.6 8 37411. 6 36745. 5 40005.6 8 15090. 9 743 6 280 5 23010 9 14936 9 231660 15015 0 135.983122 8 

### Poin t Valu e

43763.2 8 17010.1 3 78966. 8 30693. 3 32430.6 4 12605.3 4 602 8 234 3 143313. 5 143313. 5 15229 5 15229 5 140.731854 9



### 1 6 

# TJExpecte d Increas e fo rth e Yea r200 0 + Semiconducto rContrac t P.2 9

Resi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 99 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 S Proces s Quantit y% HA P

Mech
. non-atomized/Corrosio n 786 3 4 1 FW/Corrosio n 61300. 3 3 5 Mech
. non-atcmized/Corrosio n 108979. 2 3 5 Mech
. non-atomized/Corrosio n 1243.962 5 3 6 Mech
. non-Atomized/Corrosio r23635.287 5 3 6 Me o Non-Atomized/Corrosio n 3587.1683 5 3 5 Vlech
. Non-Atomized/Corrosior68156.1986 5 3 5 Mech
. Non-Atomized/Fille d 17938.55 1 2 9 FW/Non-Corrosion/Fille d 281037.29 9 2 9 Vlech
. Non-Atomized/Corrosio r29590.52 8 3 5 FW/MwfcCorrosio n 16644.67 2 3 5 Mech
. Non-Atomized/Unfille d 26319. 1 4 0 FW/Non-Corrosio n 39400. 9 4 0 FW/Non-Corrosio n 183456.791 1 6 0 FW/Corrosio n 183456.791 1 6 0 Mech
. Non-Atomized/Fille d 3706.197 8 6 0 Mech
. Atomized/Corrosio n 1440 0 4 9 Mech
. Atomize d 95. 7 4 5 Manua l 143.5 5 4 5 Mech
. Atomize d 1211.7 6 3 7 Manua l 1817.6 4 3 7 Mech
. Atomize d 250. 8 3 4 Manua l 376. 2 3 4 Mech
. Atomize d 174.5 8 3 5 Manua l 262.0 2 3 5 Poin t y_ajy£ 

### 12 1 13 0 8 5 9 0 9 0 8 5 8 5 5 5 10 2 3 5 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 32 0 7 9 33 8 8 5 Poin t Valu e X Quantit y 95142 3 796310 4 326323 2 111356.62 5 2127175.87 5 

### 304903.303 3 5793276.88 5 986620.30 5 28665304. 5 2515194.8 8 

### 2163807.3 6 3057377. 4 6067738. 6 

### 49533333. 6 49533333. 6 574460.65 9 260640 0 

### 51773. 7 21388.9 5 45441 0 174493.4 4 8025 6 

### 29719. 8 59041.8 4 22271. 7 Maxiumu m

Poin t Valu e 125808 0 9072518. 4 1743667 2 19903 4 

### 378164 6 573946.93 6 10904991.7 8 

### 2870168.1 6 36534848.8 7 47344S4.4 8 2163807.3 6 241371 9 512211 7 2384'9332.8 4 27151605.0 8 592991.64 3 230400 0 26221. 8 10192.0 5 332022.2 4 129052.4 4 68719. 2 26710. 2 47862.3 2 1860 3 4 2



### 1 7 ^%

### Expected Increas e fo rth e Yea r200 0 + Semiconducto rContrac t P.3 0



### Resi n Proces s Quantity% HA P oin t Val u Point Valu e X Maximu m
MGH-659 1 MGH-653 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d 159.7 2 239.5 8 288. 2 432. 3 118.3 6 177.5 4 2 2 3 3 2018. 5 2018. 5 214 5 214 5 Tota l # " s of Resin : 1085346.49 7 3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Quantit y

5989 5 22933.6 8 37411. 6 36745. 5 40005.6 8 15090. 9 743 6 2805 23010 9 14936 9 23166 0 15015 0 160.466894 1 

### Poin t Valu e

43763.2 8 17010.1 3 78966. 8 30693. 3 32430.6 4 12605.3 4 602 8 234 3 143313. 5 143313. 5 15229 5 15229 5 140.451418 2



### 1 8 

# 24P.3 1

Expecte d Increas e fo rth e Yea r200 1
Resi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 99 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s

Mech
. non-atomized/Corrosio n FW/Corrosio n Mech
. non-atomized/Corrosio n Mech
. non-atomized/Corrosio n Quantit y
736 3 67430.3 8 119877.1 2 1243.962 5 Vlech
. non-Atomized/Corrosio r23635.287 5 Mee
. Non-Atomized/Corrosio n 3945.88518 5 Vlech
. Non-Atomized/Corrosior74971.8185 2 Mech
. Non-Atomized/Fille d FW/Non-Corrosion/Fille d 17400.3944 7 272606.1 8 Vlech
. Non-Atomized/Corrosio r32549.580 8 FW/4SS8-Corrosio n Mech
. Non-Atomized/Unfille d FW/Non-Corrosio n FW/Non-Corrosio n FW/Corrosio n Mech
. Non-Atomized/Fille d Mech
. Atomized/Corrosio n Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 18309.139 2

29501.0 1 43340.9 9 105570.988 9 105570.863 9 2132.74725 1 1440 0 105.2 7 157.90 5 1332.93 6 1999.40 4 275.8 8 413.8 2 192.14 3 288.22 2 % HA P

4 1 3 5 3 5 3 6 3 6 3 5 3 5 2 3 2 3 3 5 3 5 4 0 4 0 6 0 6 0 6 0 4 9 4 5 4 5 3 7 3 7 3 4 3 4 3 5 3 5 Poin t Yalu e 12 1 13 0 8 5 9 0 3 0 8 5 8 5 5 5 10 2 8 5 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 32 0 7 9 33 8 8 5 PointValue X Quantity . 95142 3 8766014. 4 10189555. 2 111956.62 5 2127175.87 5 335400.240 7 6372604.57 4 957021.695 9 27805830.3 6 2766714.36 3 2380188.09 6 3363115.1 4 6674512.4 6 2850416 7 28504133.2 5 330575.323 8 260640 0 56951.0 7 23527.84 5 49985 1 191942.78 4 83281. 6 32691.7 8 64946.02 4 24498.8 7 Maxiumu m

Poin t Valu e 125808 0 9373770.2 4 19180339. 2 199034 378164 5 631341.629 6 11995490.9 6 2784063.11 5 35438803. 4 5207932.92 8 2380188.09 6 2655090. 9 5634328.7 13724228.5 6 15624487.8 6 341239.560 1 230400 0 28843.9 8 11211.25 5 365224.46 4 141957.68 4 .75591.1 2 29331.2 2 52348.55 2 20463.76 2



### 1 9 

# 3 oExpecte d Increas e fo rth e Yea r200 1 P.3 2

Resi n Proces s Quantit y % HA P oin t Val u Poin t Valu e X Maximu m
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l If s o f Resi n 175.69 2

263.53 8 317.0 2 475.5 3 130.19 6 195.29 4 24. 2 36. 3 2220.3 5 2220.3 5 2359. 5 2359. 5 955892.903 2 3 7

3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 338 ' 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Quantit y

65884. 5 25299.64 8 107152.7 6 40420.0 5 44006.24 8 16599.9 9 8179. 6 3085. 5 253119. 9 164305. 9 25482 6 16516 5 141.101083 3 Poin t Valu e

48139.60 8 18711.19 8 86863.4 8 33762.6 3 35673.70 4 13865!87 4 6630. 8 2577. 3 157644.8 5 157644.8 5 167524. 5 167524. 5 140.959253 9



### 2 0 •> l

### Expecte d increas e fo rth e Yea r200 1 + Semiconducto rContrac t P.3 3



### Resi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 99 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 3 MGH-457 8 Proces s

Mech
. non-atomized/Corrosio n FW/Corrosio n Mech
. non-atomized/Corrosio n Mech
. non-atomized/Corrosio n Mech
. non-Atomized/Corrosio r Mee
. Non-Atomized/Corrosio n Quantit y
786 3 67430.3 3 119877.1 2 1243.962 5 23635.287 5 3945.88518 5 Vlech
. Non-Atomized/Corrosior74971.8185 2 Mech
. Non-Atomized/Fille d FW/Non-Corrosion/Fille d Vlech
. Non-Atomized/Corrosio r FW/Wwu-Corrosio n Mech
. Non-Atomized/Unfille d FW/Non-Corrosio n FW/Non-Corrosio n FW/Corrcsio n Mech
. Non-Atomized/Fille d Mech
. Atomized/Corrosio n Mech
. Atomize d Manua l Mech
. Atomize d ' Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 17400.3944 7

272606.1 8 32549.580 8 18309.139 2 29501.0 1 43340.9 9 204570.988 9 204570.988 9 4132.7472 5 1440 0 105.2 7 157.90 5 1332.93 6 1999.40 4 275.8 8 413.8 2 192.14 8 288.22 2 % HA P

4 1 3 5 3 5 3 6 3 6 3 5 3 5 2 9 2 9 3 5 3 5 4 0 4 0 6 0 6 0 6 0 4 9 4 5 4 5 3 7 3 7 3 4 3 4 3 5 3 5 Poin t Valu e 12 1 13 0 8 5 9 0 9 0 8 5 3 5 5 5 10 2 8 5 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 32 0 7 9 33 3 8 5 Poin t Valu e X

Quantit y 95142 3 8766014. 4 10189555. 2 111356.62 5 2127175.37 5 335400.240 7 6372604.57 4 357021.635 3 27805830.3 6 2766714.36 8 2380188.09 6 3363115.1 4 6674512.4 6 5523416 7 5523416 7 640575.323 3 260640 0 56951.0 7 2352 7 84 5 49985 1 191942.78 4 88231. 6 32691.7 8 64946.02 4 24498.8 7 Maxiumu m

Poin t Valu e 125808 0 9979770.2 4 19180339. 2 193034 378164 6 631341.623 6 11395490.9 6 2784063.11 5 35438803. 4 5207932.92 8 2380188.09 6 2655090. 9 5634328.7 26594228.5 5 30276506.3 5 661239.5 6 230400 0 28843.9 8 11211.25 5 365224.46 4 141957.68 4 75591.1 2 29381.2 2 52643.55 2 20463.76 2


### 2 1 

# 3 ^P.3 4

Expecte d Increas e fo rth e Yea r200 1 + Semiconducto rContract
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 ' MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # " s of Resin Quantity

175.69 2 263.53 8 317.0 2 475.5 3 130.19 6 195.29 4 24. 2 36. 3 2220.3 5 2220.3 5 2359. 5 2359. 5 1155893.02 8 % HA F

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 oin t Val u
37 5 9 6 33 8 3 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Poin t Valu e X

Quantit y 65884. 5 25299.64 8 107152.7 6 40420.0 5 44006.24 8 16599.9 9 8179. 6 3085. 5 253119. 9 164305. 9 25482 6 16516 5 163.205031 4 Maximu m

Poin t Valu e 48139.60 8 18711.19 8 86863.4 8 33762.6 3 35673.70 4 13865.37 4 6630. 8 2577. 3 157644.8 5 157644.8 5 167524. 5 167524. 5 140.656587 6



### 2 2 

# 3 3Expecte d increas e fo rth e Yea r200 2 P.3 5

Res m
Hetro n 19 7 Hetro n 92 2 Hetro n 32 2 Hetro n 39 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s

Mech
. non-atomized/Corrosio n FW/Corrosio n Quantity
786 3 74173.96 8 Mech
. non-atomized/Corrosio n 131864.33 2 Mech
. non-atomized/Corrosio n 1243.962 5 Mech
. non-Atomized/Corrosio r23635.287 5 Me o Non-Atomized/Corrosion4340.47370 4 Vlech
. Non-Atomized/Corrosio r Mech
. Non-Atomized/Fille d FW/Non-Corrosion/Fille d Vlech
. Non-Ato m ized/Corrosio i FW/4fe»irCorrosio n Mech
. Non-Atomized/Unfille d FW/Non-Corrosio n FW/Non-Corrosio n FW/Corrosio n Mech
. Non-Atomized/Fille d Mech
. Atomized/Corrosio n Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 82469.0003 7

16878.3826 4 264427.994 6 35804.1 6 20140.0531 2 32451.11 1 47675.08 9 131963.736 1 131963.736 1 2665.93406 3 1440 0 115.79 7 173.695 5 1466.229 6 2199.344 4 303.46 8 455.20 2 211.362 8 317.044 2 '/ , HA P

4 1 3 5 3 5 3 6 3 6 3 5 3 5 2 9 2 9 3 5 3 5 4 0 4 0 6 0 6 0 ' 6 0 4 9 4 5 4 5 3 7 3 7 3 4 3 4 3 5 3 5 Poin t 

### Valu e 12 1 13 0 8 5 9 0 9 0 8 5 8 5 5 5 10 2 8 5 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 32 0 7 9 33 8 8 5 Poin t Valu e X Quantity 95142 3 9642615.3 4 11208510.7 2 111956.62 5 2127175.87 5 368940.264 3 7009865.03 1 928311.04 5 26971655.4 5 3043353. 6 2618206.90 6 3699426.65 4 7341963.70 6 35630208.7 5 35630208.7 5 413219.779 7 260640 0 62646.17 7 25880.629 5 543336. 1 211137.062 4 97109.7 6 35960.95 8 71440.626 4 26948.75 7 Maxiumu m



### Poin t Valu e 125808 0 10977747.2 6 21098373.1 2 193034 378164 6 634475.732 6 13195040.0 6 2700541.22 2 34375639. 3 5728665. 6 2618206.90 6 2920593.9 3 6197761.5 7 17155285.6 9 19530632.9 4 426549.4 5 230400 0 31728.37 3 12332.380 5 401746.910 4 156153.452 4 83150.23 2 32319.34 2 57913.407 2 22510.138 2


### 2 3 

# 3-jP.3 6

Expecte d Increas e forth e Yea r200 2
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 3 MG-658 3 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Quantity
133.261 2 283.831 8 348.72 2 523.08 3 143.215 6 214.823 4 26.6 2 33.3 3 2442.38 5 2442.38 5 2595.4 5 2595.4 5 Tota l Ht s o f Resin : 1041058.08 1 % HA P oin t Vai u Poin t Valu e X
3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Quantity 72472.9 5 27829.612 3 117868.03 6 44462.05 5 48406.872 8 18259.98 9 8997.5 6 3394.0 5 278431.8 9 180736.4 9 280308. 6 181631. 5 146.627027 3 Maximu m

Poin t Valu e 52953.568 8 20582.317 8 95549.82 8 37138.39 3 39241.074 4 15252.461 4 7293.8 8 2835.0 3 173409.33 5 173409.33 5 184276.9 5 184276.9 5 141.15096 5



### 2 4 

# 3 5Expecte d increas e fo rth e Yea r200 2 + Semiconducto rContrac t P.3 7

Resi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 99 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s

Mech
. non-atomized/Corrcsio n FW/Corrosio n Quantit y
786 3 74173.36 3 Mech
. non-atomized/Corrosio n 131864.83 2 Mech
. non-atomized/Corrosio n 1243.362 5 Mech
. non-Atomized/Corrosio r23635.287 5 Me o Non-Atomized/Corrosio n 4340.47370 4 Vlech
. Non-Atomized/Corrosior82469.0003 7 Mech
. Non-Atomized/Fille d FW/Non-Corrosion/Fille d vlech
. Non-Atomized/Corrosi o FW/Nan-Corrosio n Mech
. Non-Atomized/Unfille d FW/Non-Corrosio n FW/Non-Corrosio n FW/Ccrrosio n Mech
. Non-Atomized/Fille d Mech
. Atomized/Corrosio n

• Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 16878.3826 4

264427.994 6 35804.1 6 20140.0531 2 32451.11 1 47675.08 9 230963.736 1 230963.736 1 4665.93406 3 1440 0 115.79 7 173.695 5 1466.229 6 2199.344 4 303.46 8 455.20 2 211.362 8 317.044 2 % HA P

4 1 3 5 3 5 3 6 3 6 3 5 3 5 2 9 2 9 3 5 3 5 4 0 4 0 6 0 6 0 6 0 4 9 4 5 4 5

"* * T ol 3 7 3 4 3 4 3 5 3 5 Poin t 

### Value 12 1 13 0 8 5 9 0 9 0 8 5 8 5 5 5 10 2 8 5 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 32 0 7 9 33 6 8 5 Poin t Valu e X Quantit y 95142 3

. 9642615.8 4 11208510.7 2 111956.62 5 2127175.87 5 368940.264 8 7009865.03 1 928311.04 5 26971655.4 5 3043353. 6 2618206.90 6 3699426.65 4 7341963.70 6 62360208.7 5 62360208.7 5 723213.773 7 260640 0 62646.17 7 25880.629 5 543836. 1 211137.062 4 37103.7 6 35960.95 8 71440.626 4 26948.75 7 Maxiumu m

Poin t Valu e 125808 0 10977747.2 6 21098373.1 2 19303 4 378164 6 634475.732 6 13195040.0 6 2700541.22 2 34375639. 3 5728665. 6 2618206.90 6 2920599.9 9 6197761.5 7 3002'5285.6 9 34182632.9 4 746549.4 5 230400 0 31728.37 8 12332.380 5 401746.910 4 156153.452 4 83150.23 2 32319.34 2 57913.407 2 22510.138 2


## 2 5 

# 3 GP.3 8



### Expecte dIncreas e fo

r th e Yea r 200 2 + Semiconducto r

Contrac t
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l If s of Resin : Quantit y

193.261 2 289.891 8 348.72 2 523.08 3 143.215 6 214.323 4 26.6 2 39.9 3 2442.38 5 2442.38 5 2595.4 5 2595.4 5 1241058.08 1 % HA P oin t Val u

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Poin t Valu e X

Quantit y 72472.9 5 27829.612 8 117868.03 6 44462.05 5 48406.872 8 18259.98 9 8997.5 6 3394.0 5 278431.8 9 180736.4 9 280308. 6 181631. 5 166.323603 1 Maximu m

Poin t Valu e 52953.568 8 20582.317 8 95549.82 8 37138.89 3 39241.074 4 15252.461 4 7293.8 8 2835.0 3 173409.33 5 173409.33 5 184276.9 5 184276.9 5 140.83817 3



## 2 6 

# 5 7P.3 9

Expecte d increas e fo rth e Yea r200 3


### Resi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n SS P Hetro n SS P Hetro n 33 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s

Mech
. non-atomized/Corrosio n FW/Corrosio n Quantit y
786 3 31591.364 8 Mech
. non-atomized/Corrosio n 145051.315 2 Mech
. non-atomized/Corrosio n 1243.962 5 Mech
. non-Atomized/Corrosio r23635.287 5 Mee
. Non-Atomized/Corrosio n 4774.52107 4 Vlech
. Non-Atomized/Corrosio r Mech
. Non-Atomized/Fille d FW/Non-Corrosion/Fille d Vlech
. Non-Atomized/Corrosi o FW/fedao-Corrosio n Mech
. Non-Atomized/Unfille d FW/Non-Corrosio n FW/Non-Corrosio n FW/Corrosio n Mech
. Non-Atomized/Fille d Mech
. Atomized/Corrosio n Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 90715.900 4

16372.0311 6 256495.154 8 39384.9927 7 22154.0584 3 35696.222 1 52442.597 9 164954.670 1 164954.670 1 3332.41757 8 1440 0 127.376 7 191.0650 5 1612.8525 6 2419.2788 4 333.814 8 500.722 2 232.4990 8 348.7486 2 % HA P

4 1 3 5 3 5 3 6 3 6 3 5 3 5 2 9 2 9 3 5 3 5 4 0 4 0 6 0 6 0 6 0 4 9 4 5 4 5 3 7 3 7 3 4 3 4 3 5 3 5 Poin t Valu e 12 1 13 0 8 5 9 0 9 0 8 5 8 5 5 5 10 2 8 5 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 32 0 7 9 33 8 8 5 

### Poin t Valu e X Quantity 95142 3 10606877.4 2 12329361.7 9 111956.62 5 2127175.87 5 405334.291 3 7710851.53 4 900461.713 6 26162505.7 9 3347724.33 5 2880027.59 6 4069369.31 9 8076160.07 7 44537760.9 3 44537760.9 3 516524.724 6 260640 0 68910.794 7 28468.6924 5 604619.7 1 232250.768 6 106820.73 6 39557.053 8 78534.6890 4 29643.632 7 Maxiumu m

Poin t Valu e 125808 0 12075521.S 9 23208210.4 3 19903 4 378164 6 763923.371 8 14514544.0 6 2619524.38 5 33344370.1 2 6301538.84 3 2880027.59 6 3212659.98 9 6817537.72 7 21444107.1 2 24413291.1 8 533186.312 5 230400 0 34901.215 5 13565.6185 5 441921.601 4 171768.797 6 91465.255 2 .35551.278 2 63704.7479 2 24761.1520 2



### 2 7 

# 3 &P.4 0



### Expected Increas e forth e Yea r200 3
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l #" s of Resi n Quantity

212.5873 2 313.8809 8 383.594 2 575.391 3 157.5371 6 236.3057 4 29.28 2 43.92 3 2686.623 5 2686.623 5 2854.99 5 2854.99 5 1143869.26 3 % HA P oin t Val u

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Poin t Valu e X

Quantity 79720.24 5 30612.5740 8 129654.839 6 48903.260 5 53247.5600 8 20085.987 9 9897.31 6 3733.45 5 306275.07 9 198810.13 9 308339.4 6 199849.6 5 152.514253 4 Maximu m

Poin t Valu e 58248.9256 8 22640.5495 8 105104.810 8 40852.782 3 43165.1818 4 16777.7075 4 8023.26 8 3118.53 3 190750.268 5 190750.268 5 202704.64 5 202704.64 5 141.304387 4



### 2 8 

# 1°,Expecte d Increas e fo rth e Yea r200 3 + Semiconducto rContract P.4 1

Resi n
Hetro n 19 7 Hetro n 32 2 Hetro n 32 2 Hetro n SS P Hetro n 33 P Hetro n 33 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s

Mech
. non-atomized/Corrosio n FW/Corrosio n Quantit y
786 3 81591.364 8 Mech
. non-atomized/Corrosion145051.315 2 Mech
. non-atomized/Corrosio n Vlech
. non-Atomized/Corrosio r 1243.962 5 23635.287 5 Mee
. Non-Atomized/Corrosio n 4774.52107 4 vlech
. Non-Atomized/Corrosio r90715.900 4 Mech
. Non-Atomized/Fille d FW/Non-Corrosion/Fille d 16372.0311 6 256495.154 8 Vlech
. Non-Atomized/Corrosior39384.9927 7 FW/JSi P Corrosio n Mech
. Non-Atomized/Unfille d FW/Non-Corrosio n FW/Non-Corrosio n PA/ZCorrosio n Mech
. Non-Atomized/Fille d Mech
. Atomized/Corrosio n Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 22154.0584 3

35696.222 1 52442.597 9 263954.670 1 263954.670 1 5332.41757 8 1440 0 '127.376 7 191.0650 5 1612.8525 6 2419.2788 4 333.314 8 500.722 2 232.4990 S 348.7486 2 % HA P

4 1 3 5 3 5 3 6 3 6 3 5 3 5 2 9 2 9 3 5 3 5 4 0 4 0 6 0 6 0 6 0 4 9 4 5 4 5 3 7 3 7 3 4 3 4 3 5 3 5 Poin t 

### Valu e 12 1 13 0 8 5 9 0 3 0 8 5 8 5 5 5 10 2 8 5 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 32 0 7 9 33 8 8 5 

### Poin t Valu e X Quantity
. 95142 3 10606877.4 2 12329361.7 9 111956.62 5 2127175.87 5 405834.291 3 7710851.53 4 900461.713 6 26162505.7 9 3347724.38 5 2880027.59 6 4069369.31 9 8076160.07 7 71267760.9 3 71267760.9 3 826524.724 6 260640 0 68910.794 7 28468.6924 5 604819.7 1 232250.768 6 106820.73 6 39557.053 8 73584.6890 4 29643.632 7 Maxiumu m

Poin t Valu e 125808 0 12075521.3 3 23208210.4 3 13903 4 378164 6 763923.371 8 14514544.0 6 2613524.38 5 33344370.1 2 6301598.84 3 2880027.59 6 3212659.98 9 6817537.72 7 34314107.1 2 39065291.1 8 853186.812 5 230400 0 34301.215 8 13565.6135 5 441321.601 4 171768.797 6 91465.255 2 35551.275 2 63704.7479 2 24761.1520 2 

## 2 9 

# H-oP.4 2

Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Expecte d Increas e fo rth e Yea r200 3
Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # " s of Resi n Quantit y

212.5873 2 318.3809 3 383.594 2 575.391 3 157.5371 6 236.3057 4 29.28 2 43.92 3 2686.623 5 2686.623 5 2854.99 5 2854.99 5 1343869.26 3 + Semiconducto rContract

% HA P oin t Val u
3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 3 5 33 8 8 5 11 4 7 4 10 8 7 0 Poin t Valu e X

Quantity 79720.24 5 30612.5740 8 129654.839 6 48908.260 5 53247.5600 8 20085.987 9 9897.31 6 3733.45 5 306275.07 9 198310.13 9 308339.4 6 199849.6 5 169.827804 6 Maximu m

Poin t Valu e 58248.9256 8 22640.5495 8 105104.810 8 40352.782 3 43165.1818 4 16777.7075 4 8023.26 8 3118.53 3 190750.268 5 190750.268 5 202704.64 5 202704.64 5 140.992692 3

3 0 

# H- lExpecte d increas e fo rth e Yea r200 4 P.4 3

Resi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 9S P Hetro n SS P Hetro n 33 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 

## Proces s Quantity % HA P

Mech
. non-atomized/Corrosio n 786 3 4 1 FW/Corrosio n 89750.5012 8 3 5 Mech
. non-atomized/Corrosio n 159556.446 7 3 5 Mech
. non-atomized/Corrosic n 1243.962 5 3 6 Vlech
. non-Atomized/Corrosio r23635.287 5 3 6 Mee
. Non-Atomized/Corrosio n 5251.97318 1 3 5 Vlech
. Non-Atomized/Corrosior99787.4904 4 3 5 Mech
. Non-Atomized/Fille d 15880.3702 2 2 9 FW/Non-Corrosion/Fille d 248800.300 1 2 9 Vlech
. Non-Atomized/Corrosior43323.4920 4 3 5 FW/JB**Corrosio n 24369.4642 8 3 5 Mech
. Non-Atomized/Unfille d 39265.8443 1 4 0 FW/Non-Corrosio n 57686.8576 9 4 0 FW/Non-Corrosio n 206193.337 6 6 0 FW/Corrosio n 206193.337 6 6 0 Mech
. Non-Atomized/Fille d 4165.52197 3 6 0 Mech
. Atomized/Corrosio n 1440 0 4 9 Mech
. Atomize d 140.1143 7 4 5 Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 210.17155 5 4 5

1774.13781 6 3 7 2661.20672 4 3 7 367.1962 8 3 4 550.7944 2 3 4 255.74898 8 3 5 383.62348 2 3 5 Poin t Valu e 

### 121 13 0 8 5 9 0 9 0 8 5 8 5 5 5 

### 10 2 8 5 

### 13 0 11 4 15 4 27 0 27 0 15 5 18 1 541 14 9 37 5 9 6 

### 32 0 7 9 

### 33 8 8 5 Poin

t Valu e X Quantit y 95142 3 11667565.1 7 13562297.9 7 111956.62 5 2127175.87 5 446417.720 4 8481936.68 8 873447.862 2 25377630.6 2 3682496.32 4 3168030.35 6 4476306.25 1 8883776.08 4 55672201.1 6 55672201.1 6 645655.905 8 260640 0 75801.8741 7 31315.561 7 665301.33 1 255475.845 5 117502.809 6 43512.7591 8 86443.1579 4 32607.9959 7 Maxiumu m

Point Valu e 125808 0 13233074.1 9 25529031.4 8 19903 4 378164 6 840315.70 9 15965998.4 7 2540939.23 6 32344039.0 2 6931758.72 7

. 3168030.35 6 3533925.96 3 7499291. 5 26805133.8 3 30516613.9 7 666483.515 5 230400 0 38331.3373 8 14922.1304 1 436113.761 3 188945.877 4 100611.780 7 39106.4033 2 70075.2227 1 27237.2672 2


### 3 1 

# Y2 -P.4 4
Expecte d Increas e fo rth e Yea r200 4
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # " s of Resi n Quantity

233.84605 2 350.76907 8 421.9536 2 632.9304 3 173.29087 6 259.93631 4 32.210 2 48.315 3 2955.2858 5 2955.2858 5 3140.494 5 3140.494 5
: 1268055.49 4 % HA P oin t Val u

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Poin t Valu e X

Quantit y 87692.269 5 33673.8314 9 142620.323 6 53799.0365 5 58572.3160 9 22094.5866 9 10887.047 6 4106.800 5 336902.586 9 218691.152 9 339173.40 6 219834.61 5 158.70198 9 Maximu m

Poin t Valu e 64073.8182 5 24904.6045 4 115615.291 9 44933.0605 3 47481.7000 2 18455.4782 9 8825.594 8 3430.386 3 209825.295 4 209825.295 4 222975.109 5 222975.109 5 141.418 2



### 3 2 

# <- bP.4 5

Expecte d increas e fo rth e Yea r200 4 + Semiconducto rContrac t
Resi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 99 P Hetro n 99 P Hetro n 93 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s

Mech
. non-atomized/Corrosio r FW/Corrosio n Mech
. non-atomized/Corrosio r Mech
. non-atomized/Corrosio r Mech
. non-Atomized/Corrosio r Quantit y% HA P
786 3 89750.5012 8 159556.446 7 1243.962 5

• 23635.287 5 Me o Non-Atomized/Corrosio n 5251.97318 1 Vlech
. Non-Atomized/Corrosi o Mech
. Non-Atomized/Fille d FW/Non-Corrosion/Fille d r99787.4904 4 15380.8702 2 248800.300 1 Vlech
. Non-Atomized/Corrosior43323.4920 4 FW/TWBI-Corrosio n 24369.4642 8 Mech
. Non-Atomized/Unfille d 39265.8443 1 FW/Non-Corrosio n FW/Non-Corrosio n FW/Corrosio n Mech
. Non-Atomized/Fille d Mech
. Atomized/Corrosio n Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 57686.8576 9

305193.337 6 305193.337 6 6165.52197 3 1440 0 140.1143 7 210.17155 5 1774.13781 6 2661.20672 4 367.1962 3 550.7944 2 255.74398 3 383.62348 2 4 1

3 5 3 5 3 6 3 6 3 5 3 5 2 9 2 9 3 5 3 5 4 0 4 0 6 0 6 0 6 0 4 9 4 5 4 5 3 7 3 7 3 4 3 4 3 5 3 5 Poin t Valu e 12 1 13 0 8 5 9 0 9 0 8 5 8 5 5 5 10 2 8 5 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 32 0 7 9 33 8 8 5 Poin t Valu e X Quantit y 95142 3 11667555.1 7 13562297.9 7 111956.62 5 2127175.87 5 446417.720 4 8481936.68 8 873447.862 2 25377630.6 2 3682496.32 4 3168030.35 6 4476306.25 1 8883776.08 4 82402201.1 6 82402201.1 6 , 955655.905 8 260640 0 75801.3741 7 31315.561 7 665301.58 1 255475.345 5 117502.809 6 43512.7591 8 86443.1579 4 32607.9959 7 Maxiumu m

Poin t Valu e 125808 0 13233074.1 9 25529031.4 8 19903 4 378164 6 340315.70 S 15965998.4 7 2540939.23 6 32344039.0 2 6931758.72 7 3168030.35 6 3533925.93 3 7499291. 5 39675133.3 9 45168613.9 7 986483.515 5 230400 0 33391.3373 8 14922.1804 1 466113.761 6 188945.6~7 4 100611.780 7 39106.4033 2 70075.2227 1 27237.2672 2
3 3 

# 44 *P.4 6

Expecte d Increas e fo rth e Yea r200 4 + Semiconducto rContrac t
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # " s o f Resi n Quantity
233.84605 2 350.76907 8 421.9536 2 632.9304 3 173.29087 6 259.93631 4 32.210 2 48.315 3 2955.2858 5 2955.2858 5 3140.494 5 3140.494 5
: 1468055.49 4 % HA P oin t Val u Poin t Valu e X

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Quajiiiiy . 87692.269 5 33673.8314 9 142620.323 6 53799.0865 5 58572.3160 9 22094.5866 9 10887.047 6 4106.800 5 336902.586 9 218691.152 9 339173.40 6 219834.61 5 173.707962 7 Maximu m

Poin t Valu e 64073.8182 5 24904.6045 4 115615.291 9 44938.0605 3 47481.7000 2 18455.4782 9 8825.594 8 3430.386 3 209825.295 4 209825.295 4

, 222975.109 5 222975.109 5 141.117366 7



### 3 4 ^Expecte d increas e fo rth e Yea r200 5 P.4 7



### Resi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 99 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 3 MGH-457 8 Proces s Quantit y % HA P

Mech
. non-atomized/Corrosio n 786 3 4 1 FW/Corrosio n 98725.5514 1 3 5 Mech
. non-atomized/Corrosio n 175512.091 4 3 5 Mech
. non-atomized/Corrosio n 1243.962 5 3 6 Mech
. non-Atomized/Corrosio r23635.287 5 3 6 Mee
. Non-Atomized/Corrosio n 5777.17049 9 3 5 vlech
. Non-Atomized/Corrosio r109766.239 5 3 5 Mech
. Non-Atomized/Fille d 15404.4441 2 2 9 FW/Non-Corrosion/Fille d 241336.291 1 2 9 Vlech
. Non-Atomized/Corrosior47655.8412 5 3 5 FW/«W»-Corrosio n 26806.410 7 3 5 Mech
. Non-Atomized/Unfille d 43192.4287 4 4 0 FW/Non-Corrosio n 63455.5434 6 4 0 FW/Non-Corrosio n 257741.672 1 6 0 FW/Corrosio n 257741.672 1 6 0 Mech
. Non-Atomized/Fille d 5206.90246 6 6 0 Mech
. Atomized/Corrosio n 1440 0 4 9 Mech
. Atomize d 154.12580 7 4 5 Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 231.188710 5 4 5

1951.55159 8 3 7 2927.32739 6 3 7 403.91590 3 3 4 605.87386 2 3 4 281.323386 8 3 5 421.985830 2 3 5 3 oin t /a|y e 

### 12 1 13 0 8 5 9 0 9 0 8 5 8 5 5 5 

### 10 2 8 5 

### 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 

### 32 0 7 9 

### 33 8 8 5 Poin t Valu e X Quantit y 95142 3 12834321.6 3 14918527.7 7 111956.62 5 2127175.87 5 491059.492 4 9330130.35 6 847244.426 4 24616301. 7 4050746.50 6 3484833.39 1 4923936.37 6 9772153.69 3 69590251.4 6 69590251.4 6 807069.382 2 260640 0 83382.0615 9 34447.1178 6 731331.349 1 281023.430 1 129253.090 6 47864.035 1 95087.4737 4 35868.7955 7 Maxiumu m

Poin t Valu e 125808 0 14611331.6 1 28081934.6 2 19903 4 378164 6 924347.279 9 17562598.3 2 2464711.05 8 31373717.8 5 7624934. 6 3484833.39 1 3887318.58 7 8249220.6 5 33506417.3 7 38145767.4 6 833104.394 5 230400 0 42230.4711 2 16414.3984 5 534725.137 7 207840.245 1 110672.958 8 43017.044 2 77082.7449 8 29960.9939 4


### 3 5 

# tyP.4 8



### Expecte d Increas e fo rth e Yea r200 5
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Tota l # " s o f Resi r Quantity
257.230657 2 385.845985 8 464.14898 2 696.22347 3 190.619963 6 285.929945 4 35.4312 2 53.1468 3 3250.81443 5 3250.81443 5 3455.0439 5 3455.0439 5 1:1418222.09 6 % HA P oin t Val u

3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Poin t Valu e X

Quantity 96461.4964 5 37041.2146 4 156882.355 9 59178.9952 1 64429.547 7 24304.0453 6 11975.7523 6 4517.4805 5 370592.845 6 240560.268 2 373144.746 6 241853.076 5 165.117638 9 Maximu m

Poin t Valu e 70481.2000 7 27395.0649 9 127176.821 1 49431.8665 8 52229.8700 3 20301.0261 2 9708.1542 8 3773.4249 3 230807.824 9 230807.824 9 245308.120 5 245308.120 5 141.492451 1



### 3 6 

# 47Expecte d increas e fo rth e Yea r2005 + Semiconducto rContrac t P.4 9

Resi n
Hetro n 19 7 Hetro n 92 2 Hetro n 92 2 Hetro n 99 P Hetro n 99 P Hetro n 99 2 Hetro n 99 2 Hetro n Q636 2 Hetro n Q636 2 Derakan e Derakan e FR P 22 0 FR P 22 0 Moda r Moda r Moda r RC I IS O MGH-549 5 MGH-549 5 MGH-658 9 MGH-658 9 MGH-457 9 MGH-457 9 MGH-457 8 MGH-457 8 Proces s Quantit y% HA P

Mech
. non-atomized/Corrosio n 786 3 4 1 FW/Corrosio n 98725.5514 1 3 5 Mech
. non-atomized/Corrosio n 175512.091 4 3 5 Mech
. non-atomized/Corrosio n 1243.962 5 3 6 Mech
. non-Atomized/Corrosio r23635.287 5 3 6 Mee
. Non-Atomized/Corrosio n 5777.17049 9 3 5 Vlech
. Non-Atomized/Corrosio r109766.239 5 3 5 Mech
. Non-Atomized/Fille d 15404.4441 2 2 9 FW/Non-Corrosion/Fille d 241336.291 1 2 9 Vlech
. Non-Atomized/Corrosior47655.8412 5 3 5 FW/teton-Corrosio n 26806.410 7 3 5 Mech
. Non-Atomized/Unfille d 43192.4287 4 4 0 FW/Non-Corrosio n 63455.5434 6 4 0 FW/Non-Corrosio n 356741.672 1 6 0 FW/Corrosio n 356741.672 1 6 0 Mech
. Non-Atomized/Fille d 7206.90246 6 6 0 Mech
. Atomized/Corrosio n 1440 0 4 9 Mech
. Atomize d 154.12580 7 4 5 Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l 231.188710 5 4 5

1951.55159 8 3 7 2927.32739 6 3 7 403.91590 8 3 4 605.87386 2 3 4 281.323886 8 3 5 421.985830 2 3 5 Poin t Valu e 

### 12 1 13 0 8 5 9 0 9 0 8 5 8 5 5 5 

### 10 2 8 5 

### 13 0 11 4 15 4 27 0 27 0 15 5 18 1 54 1 14 9 37 5 9 6 

### 32 0 7 9 

### 33 8 8 5 Poin

t Valu e X 

## Quantit y 95142 3 12834321.6 8 14918527.7 7 111956.62 5 2127175.87 5 491059.492 4 9330130.35 6 847244.426 4 24616301. 7 4050746.50 6 3484833.39 1 4923936.87 6 9772153.69 3 96320251.4 6 96320251.4 6 1117069.88 2 260640 0 83382.0615 9 34447.1178 6 731831.849 1 281023.430 1 129253.090 6 47864.035 1 95087.4737 4 35868.7955 7 Maxiumum

Poin t Valu e 125803 0 146113816 1 28081934.6 2 19903 4 378164 6 324347.27S S 17562598.3 2 2464711.05 8 31373717.8 5 7624934. 6 3484833.39 1 3887318.58 7 8249220.6 5 46376417.3 7 52797767.4 6 1153104.39 5 230400 0 42230.4711 2 16414.3984 5 534725.137 7 207840.245 1 110672.953 8 43017.044 2 77082.7449 8 29960.9939 4


## 3 7 

# WP.5 0

Expecte d Increas e fo rth e Yea r200 5 + Semiconducto rContrac t
Resi n
MGH-659 1 MGH-659 1 MGH-721 3 MGH-721 3 MGH-549 6 MGH-549 6 MGH-246 0 MGH-246 0 MG-658 9 MG-658 9 MG-290 4 MG-290 4 Proces s
Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Mech
. Atomize d Manua l Manual/Non-Suppresse d Manual/Suppresse d Manual/Non-Suppresse d Manual/Suppresse d Quantit y
257.230657 2 385.845985 8 464.14898 2 696.22347 3 190.619963 6 285.929945 4 35.4312 2 53.1463 3 3250.81443 5 3250.81443 5 3455.0439 5 3455.0439 5 Tota l if s of Resin : 1618222.09 6 % HA P oin t Val u Poin t Valu e X
3 7 3 7 3 5 3 5 3 5 3 5 3 5 3 5 4 0 4 0 3 9 3 9 37 5 9 6 33 8 8 5 33 8 8 5 33 8 8 5 11 4 7 4 10 8 7 0 Quantit y 96461.4964 5 37041.2146 4 156882.355 9 59178.9952 1 64429.547 7 24304.0453 6 11975.7523 6 4517.4805 5 370592.845 6 240560.268 2 373144.746 6 241853.076 5 177.938173 4 Maximu m

Poin t Valu e 70481.2000 7 27395.0649 9 127176.821 1 49431.8665 3 52229.8700 3 20301.0261 2 9708.1542 8 3773.4249 3 230807.824 9 230807.824 9 245308.120 5 245308.120 5 141..
. 210357 4



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