# Performance Specification YY: Specifications and Test Procedures for X-Ray Fluorescence Based Multi-Metals Continuous Emission Monitoring Systems at Stationary Sources



# DRAFT

June 8, 2005

Submitted to:
The Environmental Protection Agency Research Triangle Park, NC

Prepared by:
Cooper Environmental Services, LLC 10180 SW Nimbus Blvd Suite J6 Portland, Oregon 97223

# Performance Specification YY: Specifications and Test Procedures for X-Ray Fluorescence Based Multi-Metals Continuous Emission Monitoring Systems at Stationary Sources



# DRAFT

June 8, 2005

Prepared by:
J.A. Cooper, K. Petterson, B.E. Johnsen, C. A. Yanca, M. Nakanishi, D. Barth

Cooper Environmental Services, LLC 10180 SW Nimbus Blvd Suite J6 Portland, Oregon 97223

# Performance Specification YY: Specifications and Test Procedures for X-Ray Fluorescence Based Multi-Metals Continuous Emission Monitoring Systems at Stationary Sources

Prepared by:___________________________________ Date:_________ Krag A. Petterson, Environmental Scientist
Reviewed by: ___________________________________ Date:_________ Cay A. Yanca, Environmental Scientist
Reviewed by: ___________________________________ Date:_________ Bruce E. Johnson, QA Manager
Approved by: ___________________________________ Date:________ John A. Cooper, DirectorSpecifications for XRF-Based Multi-Metals CEMS (PS-YY ) Page i of iv 

### Executive Summary
Performance Specification YY details the performance requirements for a multi-metals continuous emissions monitor that utilizes x-ray fluorescence (XRF) as an analytical technique. Each XRF based multi-metals CEMS must meet the criteria for accuracy, stability, and instrumental response laid out in this document. In addition, every XRF multimetals CEMS must meet the installation re quirements in PS-YY and the on-going quality control and quality assurance proc edures set forth in procedure Z if it is used for emissions compliance purposes.Specifications for XRF Based Multi-Metals CEMS (PS-YY ) Page ii of iv 

### List of Symbols
b o = The y intercept of the best fit line b 1 = The slope of the best fit line

i CA = X-ray fluorescence calibration accuracy

C i C = Corrected CEMS concentration for the i th element

CEMS i C = The concentration of the i th element as reported by the CEMS

CEM i C = The average reported concentration of the CEMS for the i th element

PT i CF = Correction factor for pe rcent transport for the i th element

RB i CF = The relative bias corr ection factor for the i th element

L i C = The emission limit of the i th element

S i C = Concentration of the i th element at the stack

sm i C = Concentration of the i th element at the sampling module or as reported by the XRF multi-metals CEMS.

i d = Difference between two paired measurements

d = Arithmetic mean of differences FS = Full scale value of your CEMS volume (or flow) measurement device

0 i L = The value of the i th element on the zero standard determin ed immediately after
calibration

cem i L = The value of the calibration check standard reported by your CEMS

cemo i L = The measured CEMS response to the zero standard for the i th element

cemu i L = The measured CEMS response to the i th element in the upscale standard

std i L = The known value of the calibration check standard

u i L = The calibrated value of the i th element of the upscale standard

n = Number of data points

i PT = The percent transport of the i th element

i PT = Average percent transport for the i th element
PRB i = Relative Bias of the i th elementSpecifications for XRF Based Multi-Metals CEMS (PS-YY ) Page iii of iv RM i R = The average of the reference method measurements for the i th metal

i PRSD = The relative percent standard deviation for the i th metal

r = The correlation coefficient SD i = The standard deviation of differences for the i th element
V

cemr = Sample gas volume (or flow) as measured by the CEMS volume check device
VD = Volume drift
V

m = Volume (or flow) reported by your multi-metals CEMS

i UD = The upscale drift of the i th element on your CEMS in percent.

x = Arithmetic mean

x i = Value of each data point
y i = CEMS reported concentration for the i th element
ZD i = The zero drift of the i th element on your CEMS in percentSpecifications for XRF Based Multi-Metals CEMS (PS-YY ) Page iv of iv 

### Table of Contents 1.0 Using PS-YY ................................................................................................................ 1 1.1 What is the purpose and applicability of Performance Specification YY? .............. 1 1.2 What will be discussed in PS-YY? ........................................................................... 1 1.3 What are the installation and pre-perfor mance specification test requirements? ..... 2 1.4 What special definiti ons apply to PS-YY? ............................................................... 3 2.0 Interferences, Safety, a nd Equipment Requirements.................................................... 5 2.1 Are there any potential interferen ces for my XRF multi-metal CEMS? .................. 5 2.2 What do I need to know to ensure the safety of persons using PS-YY? .................. 5 2.3 What equipment and supplies do I need? ................................................................. 5 2.4 What regents and standards do I need?..................................................................... 6 3.0 Performance Evaluation Pr ocedures and Reporting ..................................................... 6 3.1 What is the purpose of the initial pe rformance specification tests and what is required to perform the tests? ............................................................................................... 6 3.2 How do I report the results of the init ial performance spec ification test?.............. 12 4.0 Performance Criteria and Calculations ....................................................................... 13 4.1 What are the performance criteria for my XRF multi-metals CEMS? ................... 13 4.2 What calculations, equations, and data analyses are needed? ................................ 14 5.0 Other Requirements and Information ......................................................................... 20 5.1 What quality control measures are required?.......................................................... 20 5.2 What calibration and standardizatio n procedures must I perform? ........................ 20 5.3 What pollution prevention procedures must I follow? [reserved] .......................... 20 5.4 What waste management pr ocedures must I use?................................................... 20 5.5 What reference tables and fi gures are relevant to PS-YY?..................................... 20 5.6 What references apply to PS-YY? .......................................................................... 30

Table 1Specifications for XRF Based Multi-Metals CEMS (PS-YY )) Page 1 of 1 

### 1.0 Using PS-YY

1.1 What is the purpose and applicability of Performance Specification YY?

1.1.1 Purpose The purpose of Performance Specification YY is to establish the performance requirements that must be met by a multi-metals continuous emission monitoring system (CEMS) that utilizes x-ray fluorescence (XRF) to determine metal concentrations in stationary sources. Assu rance of the continuing quality of the CEMS data may be achieved by following the procedures defined in Procedure Z – XRF Based Multi-Metal CEMS Quality Assurance Procedures.

1.1.2 Application PS-YY applies to you if you intend to use an XRF multi-metals CEMS for purposes of establishing compliance with federal regulati ons for metal emissions from stationary
sources.
1.1.3 Measurement Capabilities A multi-metals CEMS must be capable of measuring total concentrations of at least two metals in the units of the applicable sta ndard or in units that can be converted to units of the applicable standard.

1.1.4 Other Monitoring If your XRF based multi-metals CEMS is capab le of reporting a metal concentration in the units of the existing regulation no a dditional monitoring is necessary. If your CEMS does not report concentrations in the units of the existing standard then other monitoring (e.g., oxygen, temperature, and pressu re) are necessary to convert the units reported by your CEMS to th e units of the standard.

1.2 What will be discussed in PS-YY?PS-YY covers two basic topics: (1) the instrument requirements for a XRF based multimetals CEMS and (2) the requirements that each XRF multi-metals CEMS must meet during the initial performan ce specification test.

1.2.1 Instrument Requirements

A multi-metals CEMS must be able to accurate ly report the concentrations of at least two metals. It may do so by extracting a re presentative sample (path or point sampling may be used if the sample is representative ) of stack effluent and capturing the metal analytes of interest on a medium. The CEMS must have a cycle time that is less than one third the period of the applicable standa rd. The range of the instrument must be from 10 percent to at least 400% of the appl icable regulation as determined by field orSpecifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 2 of 2 laboratory tests. Finally, the instrument or operator must be able to perform daily upscale, blank, and flow quality assurance checks to ensure the accuracy, precision, and stability of the in strument and its data.

1.2.2 Initial Performance Specification Tests The purpose of the initial perf ormance specification test is to establish the stability, accuracy, and precision of your XRF mu lti-metals CEMS. The performance specification test can be divi ded into two phases: (1) the stability test, and (2) the accuracy test. The stability test consists of a seven day check of the zero and upscale calibration drift and is done prior to the accura cy testing. For the accuracy tests, three methods of metals generation (quantitative spiking, non-quantitative spiking, and stack operation) and two methods of data analysis (percent re lative bias, and linearit y) are available. The sampling and XRF modules of your CEMS may also be tested separately from your stack sampling interface. Some options may be better than others depending on your multi-metals CEMS, or the conditions existing at your stack.

1.3 What are the insta llation and pre-performance speci fication test requirements?

1.3.1 Installation Requirements The sampling location of an XRF multi-met als CEMS should be downstream of all pollution control equipment at a position where the metals concentrations are directly representative or can be correct ed so as to be representativ e of total emissions from the stationary source. It is recommended th at the sampling location be at least two equivalent diameters downstream of the nearest control devices, point of pollution generation, bend, or other point at which a ch ange in pollutant concentration or flow disturbance may occur. The sampling location is also recommended to be at least two equivalent diameters upstream from the exhaust. The equivalent diam eter is calculated according 40 CFR Part 60, Appendix A, Method 1, Section 2.1 1

. Either point or path sampling may be use d. For point sampling the measurement point should be no less than 1.0 me ter from the stack or duct wall or located over the centroidal area of the stack or duct cross section. For a path sampling CEMS the effective measurement path should be (1) totally within the inner area bounded by a line 1.0 meter from the stack or duct wall, or (2) have at least 70 percent of the path within the inner 50 percent of the stack di ameter or duct cross section. The sample collection and instrumental analyzer porti ons of your XRF multi-metals CEMS may be located any distance from the sampling point provided the transmission efficiency from the sampling point to the sample collecti on point can be determined and meets the criteria outlined later in this performance sp ecification. It is also recommended that the sampling probe for your multi-metal CEMS be located at point wit hout stratification. You may test for stratifica tion at the proposed CEMS sa mpling point by using either PM (as outlined in PS-11), velocity tests as described in Method 2 2 , or metals concentrations using Method 29 or an acceptable alternative.Specifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 3 of 3 1.3.2 Sampling Requirements Your multi-metal CEMS should sample from th e source at a flow rate which is within 10 percent of true isokinetic. If your multi-metal CEMS does not maintain an isokinetic sampling rate you must use actual site-specific data or data from a similar installation to prove to us, th e State, and/or local enforc ement agency that isokinetic sampling is not necessary.

1.3.3 Pre-Test Preparation Requirements and Suggestions Prior to the initial performa nce specification test you need to ensure that your multimetal CEMS data logger accurately records em issions levels as well as signals (flags) that indicate both normal and abnormal opera tion. Prior to start of the seven day stability test the daily drift measuremen ts (upscale and zero values) should be monitored to ensure that the instrument is operating in an ap propriate and stable manner. We recommend that you use your XRF multi-metal CEMS for a sufficient length of time to become comfortable with its operation prior to the start of the initial performance specification test.

1.4 What special definitions apply to PS-YY?

Calibration Drift: The difference in the CEMS output readings from the established reference value after a stated period of operation during whic h no unscheduled maintenance or adjustment took place. Cycle Time: The time between when the stack gas first comes in contact with the concentrating media and when the concentration value for that sample is reported.

Data Recorder: The portion of the CEMS that provi des a record of analyzer output including metal concentrations, flags which indicate normal operation, and flags indicating abnormal operation. The data recorder may record other pertinent data such as effluent flow rates, and various instrument temperatures.

Diluent module: The part of the CEMS in which a ny diluent is added and measured.

Drift Calibration Standard: A standard containing a consta nt amount of metal used to establish the drift in the x-ra y fluorescence module response.

Emission Limit: The emission limit for a single metal is equal to the maximum amount allowed under the applicable regulation for its ca tegory assuming all of the other metals in its category were not present. Element of Opportunity: An element that is present in the stack effluent and can be used to establish transport efficiency. Instrument Measurement Range : The range of metal concentrations the instrument can reliably measure from the lowest concentrati on to the highest. The instrument measurement range may be different for different metals. If the upper end of the measurement range isSpecifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 4 of 4 more than four times the emission limit, the upper limit does not need to be definitively established. Path Sampling CEMS : A CEMS that samples the source e ffluent along a path greater than 10 percent of the equivalent diameter of the stack or duct cross section. Point Sampling CEMS : A CEMS that samples the sour ce effluent at a single point. Non-Quantitative Spiking: The process of introducing an unknown amount of metal or metals into the effluent or sample stream. Quantitative Spiking: The process of introducing a known am ount metal or metals into the effluent or sample stream.

Percent Relative Bias: The difference between a referenc e value and the CEMS measured value divided by the reference value.

Reference material: A material of known value used to check the calibration drift of your XRF multi-metal CEMS. Sample Interface: The portion of the CEMS used for one or more of the following: sample acquisition, sample transport, sample conditioni ng, or protection of the monitor from the effects of stack gas. Sampling module: The portion of an x-ray fluorescence based multi-metal CEMS that traps the metals and delivers them to the XRF module. Spiking: The process of introducing me tals into the effluent stream or the sampling stream. Transport Efficiency: The percent of metal that is trans ported from the sample probe to a point as close as possibl e to the sampling module. Upscale Drift: The upscale drift is the difference in the reported value for the upscale reference from its value at the la st calibration, divided by the valu e at the last calibration. It is used to monitor the stability of the x-ray fluorescence analysis. X-Ray Fluorescence (XRF) Module: The portion of an XRF based multi-metal CEMS which identifies and measures metal masses or concentrations using x-ray fluorescence.

XRF Multi-Metals Continuous Emissi on Monitoring System (CEMS): All of the equipment required for determining metal con centrations using x-ra y fluorescence as an analytical technique. The system may consist of several major subsystems including but not limited to the following the sample interface, th e x-ray fluorescence module, diluent module, data recorder, sampling module and volume measurement module.

Zero Drift: The zero drift is the difference in the CEMS readings for the zero reference from their values after the most recent calibrati on, divided by the emission limit for each element.Specifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 5 of 5 

### 2.0 Interferences, Safety, and Equipment Requirements

2.1 Are there any potential interfer ences for my XRF multi-metal CEMS? There may be interferences arising from the x -ray fluorescence analysis, the trapping media, or from condensation in the e ffluent gas. Check with your multi-metal CEMS manufacturer to find out more about pot ential interferences.

2.2 What do I need to know to ensure the safety of persons using PS-YY? People using PS-YY may be exposed to haza rdous material, operational hazards, and hazardous site conditions. PS-YY does not address all the safety issues associated with its use. It is your res ponsibility to ensure the safety of persons using PS-YY. Some helpful references may include the CEMS manual, the CEMS manufacturer, other reference methods, and on-site safety regulations.

2.3 What equipment and supplies do I need?

2.3.1 Equipment for the CEMS

1. Sample interface: This portion of the CEMS must present a sample of source effluent to the sampling module that is directly representative or can be corrected so as to be representative of source. To accomplish this, the sample interface may contain, among other things , heaters or heating systems, and dilution air. 2. Sampling module: The sampling module must collect and trap all the analytes of interest from a representative sample of stack effluent without significant loss. The trapped analytes then mu st be presented to the XRF module. 3. XRF module: The XRF module uses x-ray fluorescence to determine the mass or concentration of metal cap tured by the sampling module. 4. Volume measurement module: This portion of the CEMS measures the volume of source effluent from which th e metal analytes were captured in the sampling module. This volume along with the data from the XRF to determine concentration of source effluent. 5. Diluent Module: If your multi-metals CEMS us es a diluent such as air or nitrogen it is added to th e effluent sample and measured using the diluent module.
6. Quality assurance and quality control materials: Your multi-metal CEMS must possess the necessary equipment to perform daily upscale and zero checks. Your multi-metal CEMS must also possess the equipment to perform a daily check of the sample volum e at normal sample flow rates.
7. Data recorder : Your XRF multi-metal CEMS must be able to record metal concentrations and instrument status signals (flags).Specifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 6 of 6 2.3.2 Other Equipment Needed for the Performance Specification Test PS-YY does not specify all the equipment a nd supplies necessary for the performance specification tests. Some of this informa tion is included in the applicable reference methods (e.g., Method 29 or an acceptable alternative)

. 2.4 What regents and standards do I need?

2.4.1 Zero Drift Reference

Your multi-metals CEMS must include a st andard for the measurement of the daily zero drift. This reference should produce a CEMS response indicating the absence of metals. If this is not f easible this standard should produce a value between zero and20% of the emission limit for at least two elements measured by your XRF multimetals CEMS when the instrume nt is operating appropriately.

2.4.2 Upscale Drift Reference The reference for the upscale drift check s hould generate a response for at least one metal from each condition used in the XRF an alysis. This response must be at least 80 percent of the emission limit.

2.4.3 Volume Drift measurement device During the initial performance specificati on test the volume measurement must be compared on a daily basis against an intern al volume or flow measurement device. This volume or flow measurement device mu st be calibrated independently of the sample volume or flow measurement device a nd must be as accurate or more accurate than the sample volume or flow measurement device.

2.4.4 X-ray Fluorescence Calibration Check Standards

Your XRF multi-metals CEMS must in clude a means of checking the x-ray fluorescence calibration against an external standard. NIST traceable thin film standards are an example of a suitable x-ra y fluorescence calibra tion check standard.


### 3.0 Performance Evaluation Pr ocedures and Reporting

3.1 What is the purpose of the initial perform ance specification tests and what is required to perform the tests? The purpose of the initial perfor mance specification tests is to determine the bias, precision, stability, and cycle time of your multi-metal CEMS.Specifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 7 of 7 3.1.1 Pretest Preparation Prior to the start of your in itial performance specification tests you must be sure that your CEMS is installed according to the specifi cations laid out in th is document. After installing your XRF multi-metals CEMS we recommend that you use the CEMS for a period of time to familiariz e yourself with its operation. We also recommend that you conduct daily checks of the zero and upscale dr ift to verify that the instrument is functioning properly. When you are confiden t that the instrume nt is performing satisfactorily it is time to prepare for th e initial performance specification tests.

3.1.2 X-ray Fluorescence Calibration Check If your CEMS measures more metals for compliance purposes than will be evaluated during the CEMS accuracy testi ng described later in this document you must perform a calibration check of the x-ray fluorescence m odule for these additional metals. During the calibration check you must challenge the x-ray fluorescence module with a standard or standards for each metal measured by your XRF multi-metal CEMS. Each metal must be measured at least three times and the error is calculated according to Equation 13 for each measurement. The av erage error of the three measurements must be less than 10% of the calibration standard’s value for each metal, if not your CEMS may not be properly calibrated. The x-ray fluor escence calibration check may occur at anytime during the initial performance specification test. .

3.1.3 Stability – The 7-day Calibration Drift Tests

Prior to the start of the a ccuracy test you must perform a calibration drift test for a period of at least seven days. The purpose of th is test is to verify that the instrument operation is stable. During the calibration drift test period you must determine the magnitude of the zero calibration drift (a s calculated in Section 4.2.9), the upscale calibration drift (as calculated in Section 4.2.8), a nd the volume (or flow) drift (calculated using Equation 14) at least once each day. During the stability tests no adjustments or calibrations may be made to the CEMS. The re sults of the stability test must be reported along with the results of the accuracy tests.

3.1.4 CEMS Accuracy The accuracy of your XRF multi-metal CEMS may be determined using one of the following four options.

1. Option A: Linearity test of the entire CEMS

2. Option B: Linearity test of the XRF a nd sampling modules separately from the sample interface.

3. Option C: Relative bias te st of the entire CEMS.

4. Option D: Relative bias test of th e XRF and sampling modules separately from the sample interface.Specifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 8 of 8 There are also several options for generati ng the metals that will be analyzed by your multi-metal CEMS including, metals that are generated as a by-product of normal stack operation, quantitative spiking, and non-quant itative spiking. Re gardless of the generation option you choose you must be able to produce concentrations for some of the analytes of interest at 80 to 120 percent of the emission limit. All of the CEMS and reference method measurements must be conducted while sampling flue gas. You do not need to test every metal th at your CEMS measures, however, you must generate at least one metal from each categ ory of metals measured by your CEMS for the accuracy tests. For instance, if yourXRF multi-metals CEMS measures semivolatile, low volatile, and high volatile metals you must test at least one metal from each of those categories. (Low volatile metals may also be used to verify the capture efficiency and detection of non-enumerated metals). You must also prove that the XRF module is properly calibrated to meas ure the elements that are not being measured during the accuracy test by follo wing the procedures described in Section 3.1.2. The test requirements for each option are explained below and summarized in Table 1.

• Linearity Test Requireme nts (Options A and B): The bias and precision of your XRF multi-metals CEMS may be dete rmined by checking the linearity of the instrument response over a series of concentrations . If quantitative spiking is used, then the concentration of the aerosol is paired with a reported CEMS concentration acquired at the same time. Each data point is then plotted with the spiked concentration on the X axis and the reported CEMS concentration on the Y axis. If either non-quantitative sp iking or stack by product is used, then the reported CEMS concentration is plotted on the Y axis versus the concentration reported by method 29 or a suitable alternative. Linear least squares regression analysis is then used to fit the data points to a line. If you challenge only the XRF module and the sampling module the slope of this line, which is an indication of the accuracy of your XRF multi-metal CEMS, is required to be between 0.85 a nd 1.15 for each metal. The coefficient of correlation must be greater than 0.90 and is an indi cation of the precision of your multi-metal CEMS. Finally, the interc ept of this best fit line must be less than 20% of the applicable emission lim it. If you challenge the entire CEMS system and do not meet the slope or intercept criteria you must apply a correction factor according to the pr ocedures in Section 4.2.12. You are, however, still required to have a correl ation coefficient of 0.90 or greater. To perform the linearity test you must be able to genera te at least three concentration levels for one metal from each class of metals (high volatile, low volatile and semi-volatile) measured by your CEMS. The three levels must incorporate at least a two fold concen tration change and one level must be between 80 and 120 percent of the emi ssion limit. You may acquire a blank sample if you wish, either by sampling ambient air, or by operating the source in such a way that metals are not prod uced (e.g., burning only natural gas). AtSpecifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 9 of 9 least three measurements are required at each concentration le vel and a total of 15 measurements are required overa ll. You may make additional measurements, however, you must report a ll the results. If you are not using quantitative spiking you must make 15 corresponding measurements using method 29 or a suitable alternative. We recommend using duel trains for the reference method measurement to identify and screen the reference method data for imprecision and bias. Additional requirements for each of the two linearity test options are outlined below. You may also want to refer to figures 1 through 8 for guidance on which option to choose. Option A: Total CEMS Linearity In option A the entire CEMS system is challenged during the linearity tests. Any one of the three methods of metals generation may be used during the test. Some of the testing requirements associated with metals generation are outlined below

1. Metals generated as a result of stack operation If metals for the test are generated as a result of stack operation you must measure the concentration of the metals in the stack using method 29 or a suitable alternative and compare the values with those reported by your CEMS. We recommend using dual refe rence method trains to screen the reference method for precision and bias.

2. Non-quantitative spiking You may either spike non-qua ntitatively into the stack or duct itself or into the transport system as close as possi ble to the sample probe. If you spike into the source you must measure the concentration in the source using method 29 or a suitable alternative. Th is measurement is then compared to the result of your CEMS. If you choose to spike into the transport line you must measure the concentration immedi ately downstream of the spike point with a method 29 or a suitable altern ative and compare that measurement with the concentration reported by your CEMS.

3. Quantitative Spiking You may spike a quantitative aerosol directly into the source or into the transport line as close as possible to sample probe. Either way the known spiked concentration is compared with that measured by the CEMS. Option B: Linearity for Sa mpling and XRF Modules Only In option B only the sampling and XRF modules of your multi metals CEMS are challenged with a linearity test. You must also complete a transport efficiency test along with the linearity test. The procedures for performing a transport efficiency test are described in secti on 3.1.5. The procedures for option B associated with each metals generation option are listed below.

1. Metals generated as a result of stack operationSpecifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 10 of 10 If metals concentrations for the accuracy test are generated as a result of stack operation you must measure the concen tration of the metals as close as possible to the sampling module using method 29 or a suitable alternative and compare the values with those re ported by your CEMS. We recommend using dual reference method trains to screen the reference method for precision and bias.

2. Non-quantitative spiking You may either spike non-qua ntitatively into the stack or duct itself or into the transport system. Either way you mu st measure the concentrations of the analytes as close as possible to th e sampling module and compare that concentration with that reported by your multi metal CEMS.

3. Quantitative Spiking You must spike at a location as close as possible to the sampling module and compare the known spiked concentrati on with that reported by your CEMS.

• Relative Bias Test Requirem ents (Options C and D): There are two relative bias options available: one that challenges the entire CEMS and one that challenges the sampling and XRF modul es separately from the sample interface. Either option requires at leas t 12 CEMS measurements be made at a concentration level 80 to 120 percent of the emission limit for a metal from each category of metals analyzed by your XRF multi metal CEMS. If you are not using quantitative spiking you must al so have at least 12 corresponding runs of method 29 or a suitable alternative at this concentrati on level. We recommend using dual trains for the refe rence method to screen the data for imprecision and bias. Additionally, for at least one metal meas ured at the emission limit or for a surrogate metal that can be measured by your CEMS (such as iron) you must test the CEMS at three different concentr ation levels. These three levels must incorporate at least a two- fold change in concentration and one of the levels must be between 80 and 120 percent of the emission limit (the concentration of the emission limit for the surrogate metal is equal to that for the metal measured by your CEMS with the highest emission li mit). You are required to obtain at least three measurements at each concentr ation level and are required to have a total of at least 12 measurements. You must report th e results of all measurements. The relative bias is an indicator of accuracy and should be calculated using equation 5 for each element. Also, the percent relative standard deviation, which is an indicato r of precision, shoul d be calculated for each metal If you challenge the entire CEMS system and you do not meet the test criteria you may apply a correction factor to your CEMS data. Calculate a correction factor for each metal in the relative bias test according to the equation found in section 4.2.13. If you challenge the sa mpling and XRF modules separately from the sample interface you may not a pply a correction factor to the dataSpecifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 11 of 11 from the relative bias test, you may, how ever, apply a correction factor to the results of the transport efficiency test. For the metal that was spiked over several concentrations you must perform linear least squares regression analysis on the data. The correlation coefficient fo r this fit must be better than 0.90. This is to demonstrate that the instrument response is valid over its applicable range. If the criteria for this test is met then the correction factors are assumed to be valid over the range of the instrument.

Option C In accuracy test option C the entire CEMS is subjected to a relative bias test. The options for metals generation and the associated spiking and reference method requirements are the same as those for Option A under the linearity tests. Option D In accuracy test option D only the XRF and sampling modules are subjected to a relative bias test. The options for metals generation and their associated spiking and reference method requirements are the same as those for Option B. You are also required to perfor m a transport efficiency test.

3.1.5 Transport Efficiency Test You must perform a transport efficiency te st if you have only challenged the sampling and XRF modules during the accuracy tests (o ptions B and D). Any one of the four methods described below are valid ways of determining percent transport for your multi-metals CEMS.

• Particulate Matter (PM): In this approach partic ulate matter is measured concurrently in two locations, (1) in th e stack effluent stream as close as possible to your multi-metals CEMS sample interface, and (2) at a point in the transport system as close as possible to the sampling module. You may use any standard reference method to measure PM including Method 5, Method 5i, or Method 17 (40 CFR 60, Appendix A) 3,4,5 . Particulate matter must be generated by operating the source. You must acqui re at least 12 paired concentration measurements (each pair consists of th e measurement made as close as possible to the sample interface and the measurem ent made as close as possible to the sampling module. The percent transmissi on is calculated for each pair using equation 6 and the overall pe rcent transmission is determined by calculating the average of all twelve runs.

• Element of opportunity: Alternatively, transport effi ciency can be determined using a surrogate metal such as iron or zinc that is commonly present in stack effluent. Method 29 (40 CFR 60, Appendix A) 6 or a suitable alternative can be used to measure the metal concentration in the stack effluent stream as close as possible to the sample probe and at a point in the transport system as close as possible to the sampling module. Als o, if your XRF multi-metals CEMS isSpecifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 12 of 12 capable of measuring the element of interest, you may compare the measured concentration on the CEMS with that measured in the stationary source using the reference method. Transport efficiency is calculated using equation 6. You are required to make at least twelve paired concentration measurements to determine the mean transport efficiency.

• Non-quantitative spiking: An aerosol containing a surrogate metal or a metal analyte can be spiked non- quantitatively into the stack or duct gas stream or into the transport system as close as possible to the sampling probe. The concentration of the spiked metal is measured by method 29 (40 CFR 60, Appendix A) 5 or a suitable alternative as clos e as possible to the CEMS’ sample probe and by another Method 29 or a suitab le alternative as close as possible to the sampling module. If you spike directly into the transport line you must make your upstream concentration meas urement as close as possible to the spike location and your downstream meas urement as close as possible to the sampling module. If your XRF multi-metals CEMS is capable of measuring the spiked metal, you may compare its repor ted concentration w ith the in source metals measurement or with the upstream in transport line measurement to calculate transport efficiency according to equation 6. You are required to make at least twelve paired concentra tion measurements to determine the mean transport efficiency.

• Quantitative Spiking : An aerosol containing a surrogate metal or a metal analyte can be spiked quantitatively into the stack or duct gas stream or into the transport system as close as possible to the sampling probe. The concentration may be measured on the CEMS or by us ing method 29 or a suitable alternative as close as possible to the sampling module. This measurement is then compared with the known concentration of the spiked aeroso l to determine the percent transport.
3.1.6 Dual Train Requirements If you use a reference method (eg., method 29 or 5i) during the linearity, relative bias, or transport efficiency tests it is recommended that you use dual trains to screen the reference method for bias and imprecision.

3.1.7 Cycle Time Requirements The cycle time for your XRF multi-metals CE MS should be no greater than one-third of the averaging period for the applicab le standard. During all phases of the performance specification test including the CEMS must use the same cycle time as will be used during day to day operation.

3.2 How do I report the results of the in itial performance specification test?

Summarize the results of the calibration drift a nd accuracy tests in tabular form. Include all data sheets, calculations, and records of CEMS measurements necessary to substantiate the performance of the CEMS and any other devi ces or methods (e.g., method 29). The CEMSSpecifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 13 of 13 measurements shall be reported to the agency in units of μg/m3 on a dry basis, corrected to 20°C.



### 4.0 Performance Criteria and Calculations

4.1 What are the performance criter ia for my XRF multi-metals CEMS? You must demonstrate that your XRF multi-meta l CEMS has adequate stability, precision, accuracy, cycle time and data reporting capabili ties to determine if your facility is in compliance with metal emission standards or operating permit limits as specified in applicable regulations or permits. You will demonstrate this capacity by showing that your XRF multi-metal CEMS meets the following performance criteria.

4.1.1 7-day Drift Check Criteria – Stability Upscale Drift: The upscale drift as calculated in s ection 4.2.8 must be less than 15% of the original calibration value of the upscal e reference each day for seven consecutive days. Zero Drift: The zero drift as calculated in Sect ion 4.2.9 must be less than 20% of the emission limit each day for seven consecutive days.

Volume or Flow Drift: The volume or flow drift as calculated in Section 4.2.11 must be less then 20% of the full sc ale value of the flow or volume measurement device each day for seven consecutive days.

4.1.2 X-Ray Fluorescence Calibration Drift CriteriaFor each metal measured by your multi-metal CEMS for compliance purposes the xray fluorescence calibration drift must be less than 10% of the value of the standard. (Note: you are not required to calculate the XRF calibration drift for those metals used during the bias and precision testing).

4.1.3 Relative Bias Criteria – Accuracy and Precision

The relative bias of the instrument must be less than 15% and the relative percent standard deviation (RSD) must be 10% or less if you challenge the XRF and sampling modules of your CEMS separately from your transport system. If you challenge your entire CEMS and it does not meet the above relative bias criteria you must apply a correction factor to the re sults reported by your CEMS. The correction factor is calculated using the equation in section 14.2.13. Also, the correlation coefficient for a least squares linear regression fit of the metal that was spiked at three different concentration levels must be greater than 0.90. This is to help assure that the correction factor is applicable over the range of the instrument.Specifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 14 of 14 4.1.4 Linearity Test Criteria – Accuracy and Precision If you choose to do linearity tests to determ ine the accuracy and precision of your XRF multi-metals CEMS the slope of the least s quares linear fit should be between 0.85 and 1.15. The correlation coefficient must be 0.90 or better and the inte rcept should be less than 20% of the applicable emission limit. If you challenge only the XRF module and the sampling module of your CEMS you must meet the above criteria. If you challenge your entire CEMS and you do not meet the slope or in tercept criteria you must adjust the results reported by your CEMS, you must however, still meet the correlation coefficient criteria. The correcti on factor is calculated according to the procedures in section 4.2.12.

4.1.5 Transport efficiency – Accuracy If the average transport effi ciency is between 90 and 110 pe rcent, then no correction for transport efficiency needs to be app lied to concentrations reported by your XRF multi-metals CEMS. If, however, your averag e transport efficiency is less than 90 percent or more than 110 percent then you must use a correction factor. You may use your transmission efficiency test data to esta blish a correction factor that would change the reported CEMS concentrations for each metal to a value that would reflect 100% transmission efficiency.

4.1.6 Cycle time – Appropriate Reporting The cycle time for your XRF mu lti-metals CEMS must be no greater than one-third of the averaging period for th e applicable standard.

4.2 What calculations, equations, and data analyses are needed?

4.2.1 Arithmetic Mean

Calculate the arithmetic mean of a data set as follows. 

# ∑ = i x n 1 x Equation 1

Where :

x = Arithmetic mean

n = Number of data points

x i = Value of each data pointSpecifications for XRF Based Multi-Metals CEMS (PS-YY ) Page 15 of 2 4.2.2 Arithmetic Mean of Difference

To calculate the arithmetic mean of differe nce use the above equation substitute d for x

. Where

RM i CEMS i i R C d

− = Equation 2

Where:

CEMS i C = The concentration of the i th element as reported by the CEMS

RM i R = The concentration of the i th element as reported by the reference method or aresol

4.2.3 Standard Deviation (of differences)

1 1 2 2

− ∑ ∑

−

= ⎟ ⎠ ⎞ ⎜ ⎝ ⎛

n d

n d SD i i

i Equation 3

Where: SD i = The standard deviation of differences for the i th element

n = The number of data points d i = The difference between the concentration measured by the reference method or the concentratio n of the reference aerosol and the concentration reported by the CEMS.

4.2.4 Percent relative standard deviation

100 × = RM i i i R SD PRSD Equation 4

Where:

RM i R = The average of the reference method data set or the reference aerosol concentration for the i th element

i PRSD = The relative percent standard deviation for the i th metal

4.2.5 Relative Bias

100 × = RM i i i R d PRB Equation 5Specifications for XRF Multi-Metals CEMS (PS-YY ) Page 16 of 30 Where i d is the mean difference, RM i R is the average of the reference method data set or the average aerosol concentration for the i th element, and PRB i is the relative bias for the i th element

4.2.6 Percent Transmission

100 × = S i sm i i C C PT Equation 6

Where:

S i C = Concentration of the i th element at the stack

sm i C = Concentration of the i th element at the sampling module or as reported by the XRF multi-metals CEMS.

i PT = The percent transport of the i th element Report the average percent transport ( P T ) of all measurements for each element that was tested (only one el ement is required though more can be tested).

4.2.7 Best Fit Line for Linearity Test

Calculate the linear correlat ion equation given below.

x b b y o 1 ˆ +

= Equation 7

Where: b o = The y intercept b 1 = The slope The intercept is calculated according to the following equation.

x b y b
o 1 − = Equation 8

Where: 

# ∑

= = n

i i x n x
1 1


# ∑

= = n

i i y n y
1 1

The slope of the line is calcul ated according to equation below.Specifications for XRF Multi-Metals CEMS (PS-YY ) Page 17 of 30 

## ∑ ∑

= =

− − −

= n

1 i 2 i n

1 i i i

1 ) x x ( ) y y )( x x ( b Equation 9

The linear correlation coefficient is calcul ated according to the following equation.



## ∑ ∑

∑

= = =

− − −

−

=
n

i i n

i i n

i i i

y y x x y y x x

r

1 2

1 2

1 ) ( ) ( ) )( ( Equation 10

4.2.8 Upscale Drift

100 × −

= u i u i cemu i i L L L UD Equation 11

Where:

i UD = The upscale drift of the i th element on your CEMS in percent.

cemu i L = The measured CEMS response to the i th element in the upscale standard

u i L = The calibrated value of the i th element of the upscale standard

4.2.9 Zero Drift

100 0
× −

= L i i cemo i i C L L ZD Equation 12

ZD i = The zero drift of the i th element on your CEMS in percent

cemo i L = The measured CEMS response to the zero standard for the i th element

0 i L = The calibrated value of the i th element on the zero standard

L i C = The emission limit of the i th element

4.2.10 X-Ray Fluorescence Calibration AccuracySpecifications for XRF Multi-Metals CEMS (PS-YY ) Page 18 of 30 100 × −

= std i std i cem i i L L L CA Equation 13

Where:

i CA = X-ray fluorescence calibration accuracy

cem i L = The value of the standard reported by your CEMS

std i L = The known value of the standard

4.2.11 Daily Sample Volume Check

100 × −
= FS V V VD m cemr Equation 14

Where: VD = Volume drift
V

cemr = Sample gas volume (or flow) measured by the CEMS volume check measurement device
V

m = Sample gas volume (or flow) re ported by your multi-metal CEMS FS = Full scale value of the CEMS volume (or flow) measurement device

4.2.12 Linearity Test Correction Factors (Applic able only when the linearity test challenges the entire CEMS)

1. Correction equation if CEMS does not meet either the slope or the intercept criteria.

1 0 b b y C i

C i − = Equation 15

Where:

C i C = corrected CEMS concentration for the i th element

y i = CEMS reported concentration for the i th element b 0 = the intercept of the least squares linear regression line b 1 = the slope of the least squares linear regression line

2. Correction factor if CEMS meets intercept criteria, but does not meet the slope criteria.Specifications for XRF Multi-Metals CEMS (PS-YY ) Page 19 of 30 0 b y C i

C i − = Equation 16

3. Correction factor if CEMS meets slope criteria but does not meet intercept criteria.

1 b y C i

C i = Equation 17

4.2.13 Relative Bias Correction Factors

CEM i RM i

RM i i RB i C R

R

d CF =
+ = 1 1 Equation 18

Where:

RB i CF = The relative bias correction factor for the i th element

CEM i C = The average reported concentration of the CEMS for the i th element

RM i R = The average of the reference method measurements for the i th metal

4.2.14 Percent transport correction factor

i PT i PT CF 1

= Equation 19

Where

PT i CF = Correction factor for percent transport for the i th element

i PT = Average percent transport for the i th elementSpecifications for XRF Multi-Metals CEMS (PS-YY ) Page 20 of 20 

### 5.0 Other Requirements and Information

5.1 What quality control measures are required? Quality control measures for an XRF multi- metal CEMS are addressed in procedure Z “Quality Assurance Requirements for X-Ray Fluorescence Based Multi-Metals Continuous Emission Monitors.”

5.2 What calibration and standardization procedures must I perform? Refer to your CEMS owner’s manual and manuf acturer to determine what calibration and standardization procedures are re quired for your multi-metal CEMS.

5.3 What pollution prevention procedures must I follow? [reserved]

5.4 What waste management pro cedures must I use? All chemicals used to produce a reference aeroso l or in performing standard methods need to be disposed of properly.

5.5 What reference tables and figur es are relevant to PS-YY?Specifications for XRF Multi-Metals CEMS (PS-YY ) Page 21 of 21 Table 1. Initial Performance Specification Tests and Criteria Test Category Test Test Requirements Test Criteria

Zero Drift Monitor zero standard for 7 consecutive days under normal operating conditions < 20% drift every day for seven consecutive days Upscale Drift Monitor upscale standard for 7 consecutive days under normal operating conditions < 15% drift every day for seven consecutive days Seven Day

Stability Flow Drift Monitor flow drift for 7 consecutive days under normal operating conditions < 20% drift every day for seven consecutive days

Calibration X-Ray Fluorescence Calibration Drift Check Test a standard for each element measured for compliance by your CEMS 3 times < 10% drift for every element measured for compliance by your CEMS Option A
Perform a linearity test on entire CEMS • At least one metal from each category

• Need at least 3 concentration levels which include a 2 fold conc. change and the emission limit

• If spiking, spike into source, or spike into transport line as close as possible to the probe • Slope = 0.85 to 1.15

• r > 0.90

• intercept < 20% of emission limit

• if the above criteria are met then no correction

• if not met apply a correction (correlation criteria must be met) Option B

• Perform a linearity test on sampling module and XRF module only

• Determine transport efficiency separately • At least one metal from each category

• Need at least 3 concentration levels which include a 2 fold conc. change and the emission limit

• Spike or measure concentrations with reference method as close as possible to the sampling module Linearity Criteria

• Slope = 0.85 to 1.15

• r > 0.90

• intercept < 20% of emission limit

• the linearity criteria must be met Percent Transport Criteria

• 90< PT< 110

• If percent transport criteria are not met apply a correction factor Option C

Perform a relative bias test on entire CEMS • At least one metal from each category at 80 to 120 percent of emission limit

• One other metal at 3 conc. levels which include a 2 fold conc. change and the emission limit

• If spiking, spike into source or spike into transport line as close as possible to the probe Percent relative Bias RB< 15% %RSD < 10%

r > 0.90 for metal with three fold conc. change

• If Criteria not met apply a correction factor (correlation coefficient criteria must be met) Accuracy

Option D

• Perform a relative bias test on sampling module and XRF module only

• Determine transport efficiency separately • At least one metal from each category at 80 to 120 percent of emission limit

• One other metal at 3 conc. levels which include a 2 fold conc. change and the emission limit

• Spike or measure concentrations with reference method as close as possible to the sampling module Percent Relative Bias Criteria RB< 15% %RSD < 10%

r > 0.90 for metal with three fold conc. change Percent Transport Criteria

• 90< PT< 110

• If percent transport criteria are not met apply a correction factorSpecifications for XRF Multi-Metals CEMS (PS-YY ) Page 22 of 22 Figure 1: Types of metals generati on available for accuracy tests.Specifications for XRF Multi-Metals CEMS (PS-YY ) Page 23 of 23 Figure 2: Flow chart for using quantitat ive spiking during the accuracy tests.Specifications for XRF Multi-Metals CEMS (PS-YY ) Page 24 of 24 Figure 3: Flow chart for using non-quantit ative spiking during the accuracy tests.Specifications for XRF Multi-Metals CEMS (PS-YY ) Page 25 of 25 Figure 4: Flow chart for using stack operati on to generate metals concentrations.Specifications for XRF Multi-Metals CEMS (PS-YY ) Page 26 of 26 Figure 5: Species available for transport testsSpecifications for XRF Multi-Metals CEMS (PS-YY ) Page 27 of 27 Figure 6: Procedure for percent transport using PM

.Specifications for XRF Multi-Metals CEMS (PS-YY ) Page 28 of 28 Figure 7: Procedure for percent transpor t determination using an element of opportunity.Specifications for XRF Multi-Metals CEMS (PS-YY ) Page 29 of 29 Figure 8: Procedure of percent transp ort determination using spiking.Specifications for XRF Multi-Metals CEMS (PS-YY ) Page 30 of 30 5.6 What references apply to PS-YY?

1. United States. Environmental Prot ection Agency [EPA]. Technology Transfer Network. Emission Measurement Center. Pr omulgated Methods. Method 1: Sample and Velocity Traverses for Stationary Sources. Washington, DC: EPA; 2004. Available: http://www.epa.gov/ttn/emc/prom gate/m-01.pdf via th e Internet. Accessed May 8, 2005.

2 United States. Environmental Protecti on Agency [EPA}. Technology Transfer Network. Emission Measurement Center . Promulgated Methods. Method 2: Determination of Stack Gas Velocity and Vo lumetric Flow Rate. Washington, D.C: EPA; 2004. Available: http://www.epa. gov/ttn/emc/promgate/m-02.pdf via the Internet Accessed May 10, 2005.

3. United States. Environmental Prot ection Agency [EPA]. Technology Transfer Network. Emission Measurement Center. Promulgated Methods. Method 5: Determination of Particulate Matter Emissi ons from Stationary Sources. Washington, DC: EPA; 2004. Available: http://www.epa.gov/ttn/emc/promgate/m-05.pdf via the Internet. Accessed May 10, 2005.

4. United States. Environmental Prot ection Agency [EPA]. Technology Transfer Network. Emission Measurement Center. Promulgated Methods. Method 5i: Determination of Low Level Particulate Ma tter Emissions from Stationary Sources. Washington, DC: EPA; 2004. Available: http://www.epa.gov/hwcmact/frhwc5.pdf via the Internet. Accessed May 10, 2005.

5. United States. Environmental Protec tion Agency [EPA]. Technology Transfer Network. Emission Measurement Center. Promulgated Methods. Method 17: Determination of Particulate Matter Emissi ons from Stationary Sources. Washington, DC: EPA; 2004. Available: http://www.epa.gov/ttn/emc/promgate/m-17.pdf via the Internet. Accessed May 10, 2005.

6. United States. Environmental Protec tion Agency [EPA]. Technology Transfer Network. Emission Measurement Center . Promulgated Methods. Method 29. Determination of Metals Emissions from St ationary Sources. Washington, DC: EPA; 2004. Available: http://www.epa.gov/ttn/e mc/promgate/m-29.pdf via the Internet. Accessed May 18, 2005.