### Product Name Nanotube Dispersion 

### Description A mixture of functionalized carbon nanotubes and other proprietary components dispersed in water. Product is formulated for us e as an intermediate in the preparation of Nanotube Formulations and for semiconductor spin-coating applications. FOR RESEARCH USE ONLY. 

### Storage Conditions Seal container when not in use. Store between 10 and 35°C. Do not store in direct sunlight. Do not freeze. Do not agitate, sonicate or stir. Store separately, away from volatile organics.

Lot Information: Document Number Date of Manufacture 30 November 2012 Product Code Manufacturer Product Name Location Lot Number Report Issue Date 13 December 2012

Raw Material Used: Material Supplier Lot Numbers

Carbon Nanotubes

Raw material characterizations are not included in this datasheet. Refer to the raw material Lot Characterization using the raw material Supplier Lot Number. 

# ** COMPANY SANITIZED **Parameter Units Pass/Fail
Solution - NA pH-001 NA OD-001 NA FOD-002 NA N-001

Pass TM-001 Pass TM-001 Pass TM-001 Pass TM-001 Pass TM-001 Pass TM-001 Pass TM-001 Pass TM-001 Pass TM-001 Pass TM-001 Pass TM-001 Pass TM-001 Pass TM-001

Pass PT-005

Pass OM-004 NA OM-005

NA TL-001 NA TD-001 Test Specifications Reported Value Test Method

Released By: 

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# SEM Inspection Representative SEM Images of 72 total images examined, midway between center and edge Substrate: 3000A SiO 2 

### # Coats: 1 coat Test Method; Coat: CT-001 SEM: SEM-001 

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# SEM Inspection (cont.) Representative SEM Images of 72 total images examined, midway between center and edge Substrate: 3000A SiO 2 

### # Coats: 3 coat Test Method; Coat: CT-003 SEM: SEM-001 

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# SEM Inspection (cont.) Representative SEM Images of 72 total images examined, midway between center and edge Substrate: 3000A SiO 2 

### # Coats: 3 coat Test Method; Coat: CT-003 SEM: SEM-001 

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# SEM Inspection (cont.) Representative SEM Images of 72 total images examined, midway between center and edge Substrate: TiN # Coats: 5 coat Test Method; Coat: CT-013 SEM: SEM-002 

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# SEM Inspection (cont.) Representative SEM Images of 72 total images examined, midway between center and edge Substrate: TiN # Coats: 5 coat Test Method; Coat: CT-013 SEM: SEM-002 

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# Optical Inspection Representative Optical Microscope Images of 20 total images examined, midway between center and edge Substrate: 3000A SiO 2 

### # Coats: 3 coat Test Method; Coat: CT-001 SEM: OM-001 Bright Field with Nomarski filter at 50x

Bright Field with Nomarski filter at 200x 

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# Optical Inspection (cont.) Representative Optical Microscope Images of 20 total images examined, midway between center and edge Substrate: 3000A SiO 2 

### # Coats: 3 coat Test Method; Coat: CT-001 SEM: OM-001 Dark Field at 50x

Dark Field at 200x 

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# Optical Inspection (cont.) Representative Optical Microscope Images of 20 total images examined, midway between center and edge Substrate: TiN # Coats: 5 coat Test Method; Coat: CT-013 SEM: OM-002 Bright Field with Nomarski filter at 50x

Bright Field with Nomarski filter at 200x 

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# Optical Inspection (cont.) Representative Optical Microscope Images of 20 total images examined, midway between center and edge Substrate: TiN # Coats: 5 coat Test Method; Coat: CT-013 SEM: OM-002 Dark Field at 50x

Dark Field at 200x 

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