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                            Events
 Statistical Error Estimation for an Objective Measure of Similarity to a Latent Image
        

                          2018 Impression, Pattern, and Trace Evidence Symposium Event Dates
              January 25, 2018, 12:00 am
Location
              Online

Register

The Impression, Pattern, and Trace Evidence Symposium brought together practitioners and researchers to enhance information-sharing and promote collaboration among the impression, pattern and trace evidence, law enforcement and legal communities.

Recordings of the presentations are available, including this presentation by: Donald Gantz, Ph.D., George Mason University
View Course Page
  
  
          Details
Series
                  Impression, Pattern, and Trace Evidence Symposium

  Event Type
              Symposium
    Event Option(s)
          Online,
                        On demand

Sponsor(s) / Host(s)

National Institute of Justice (NIJ), U.S. Department of Justice
    Contact
          NIJ Forensic Technology Center of Excellence

  Link
              If you have questions about this course, contact the FTCoE

  Registration Status
              Open

  Eligibility
              Free and open to all.
    
  
Read more about
    
            Impression, Pattern and Trace Evidence Symposium (IPTES)
        Pattern evidence
        Law Enforcement Community
        Law enforcement
        Trace evidence
        Research and development
        Latent fingerprints
        Forensic sciences
        Evidence analysis and processing
        Forensic Technology Center of Excellence
  
Date Created: February 20, 2018
    
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                      DEIA: What I learned from the AAFS Diversity Outreach Committee
                  FBI Laboratory Decision Analysis Studies in Pattern Evidence Examinations
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