[Federal Register Volume 65, Number 188 (Wednesday, September 27, 2000)]
[Notices]
[Page 58046]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 00-24850]


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DEPARTMENT OF COMMERCE

International Trade Administration


Applications for Duty-Free Entry of Scientific Instruments

    Pursuant to section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651; 80 Stat. 
897; 15 CFR part 301), we invite comments on the question of whether 
instruments of equivalent scientific value, for the purposes for which 
the instruments shown below are intended to be used, are being 
manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be filed within 20 days with the Statutory Import 
Programs Staff, U.S. Department of Commerce, Washington, DC 20230. 
Applications may be examined between 8:30 A.M. and 5:00 P.M. in Room 
4211, U.S. Department of Commerce, 14th Street and Constitution Avenue, 
NW, Washington, DC.
    Docket Number: 00-021. Applicant: University of Florida, Materials 
Science and Engineering, Post Office Box 116400, Gainesville, FL 32611-
6400. Instrument: Electron Microscope, Model JEM-2010F. Manufacturer: 
JEOL Ltd., Japan. Intended Use: The instrument is intended to be used 
to study the microstructure of metals, metal alloys, ceramics, high-
temperature superconductors, semiconductors, polymers, clays, dental 
implants and soot emissions while conducting the following 
representative experiments:
    1. Structure-property relationships in semiconducting materials.
    2. Interface phenomena in oxides.
    3. Analysis of interfaces in advanced polymers and photonic 
devices.
    4. The structure of high-temperature materials.
    5. Mechanical properties of dental implants.
    6. Polymer-protein and polymer-cell interactions.
    7. Nanoscale properties of porous silicon.
    8. Structure and chemistry of oxide minerals.
    9. Structure-property relationships in opto-electronic materials.
    10. Strength/hardness enhancement in superlattices.
    In addition, the instrument will be used on a one-to-one basis for 
training of faculty, staff and graduate students. Application accepted 
by Commissioner of Customs: June 9, 2000.

    Docket Number: 00-027. Applicant: Emory University, Department of 
Biology, 2006 Rollins Research Center, 1510 Clifton Road, Atlanta, GA 
30322. Instrument: Slice Physiology Setup. Manufacturer: Luigs and 
Neumann, Germany. Intended Use: The instrument is intended to be used 
to do electrophysiological studies using rat brain slices. The 
experiments consist of preparing slices of rat brain, putting them 
under the microscope and inserting microeletrodes into single nerve 
cells. Once the microelectrode is inserted, a fluorescent dye will be 
injected into the cell body to visualize fine dendritic processes. The 
microscope will then be moved to focus on one of the visualized fine 
processes, and a second electrode can be inserted into the same cell. 
The main objective of this research is to understand neuronal activity 
and information processing in the mammalian brain. In particular, nerve 
cells in brain structures involved in a motor control will be studied. 
In addition, the instrument will be used for educational purposes in 
the course Bio. 498 Guided Research for Senior Undergraduate Students. 
Application accepted by Commissioner of Customs: September 5, 2000.

    Docket Number: 00-028. Applicant: Ernest Orlando Lawrence Berkeley 
National Laboratory, One Cyclotron Road, Berkeley, CA 94720. 
Instrument: Electron Microscope, Model JEM-3010. Manufacturer: JEOL 
Ltd., Japan. Intended Use: The instrument is intended to be used for 
studies of the microstructure and microstructural evolution of metals, 
metal alloys, ceramics, electronic and opto-electronic materials and 
nanocomposites. The experiments will include:
    1. In-situ microscopy--real time evolutions of structure/property/
processing relationships.
    2. Real time high-resolution electron microscopy.
    3. Dislocation and defect studies in materials.
    4. Identification of phases and crystal structure by electron 
diffraction and convergent beam electron diffraction.
    In addition, the instrument will be used for significant one-to-one 
educational use between the staff and users on how to exploit 
transmission electron microscopy to solve materials problems. 
Application accepted by Commissioner of Customs: September 5, 2000.

Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 00-24850 Filed 9-26-00; 8:45 am]
BILLING CODE 3510-DS-P