# Performance Specification YY: Specifications and Test Procedures for X-Ray Fluorescence Based Multi-Metals Conti nuous Emission Monitoring Systems at Stationary Sources

Prepared by : Cooper Environmenta l Services, LLC 10180 SW Ni m bus Blvd Suite J6 Portland, Oregon 97223

Revision: 1.0 June, 2005

# Performance Specification YY: Specifications and Test Procedures for X-Ray Fluorescence Based Multi-Metals Conti nuous Emission Monitoring Systems at Stationary Sources

Prepared by:___________________________________ Date:_________ Krag A. Petterson, Environmental Scientist Review ed by: ___________________________________ Date:_________ Cay A. Yanca, Environmental Scientist Review ed by: ___________________________________ Date:_________ Bruce E. Johnson, QA Manager Approved by: ___________________________________ Date:________ John A. Cooper, Director

### Executive Summary Perf orm a nce Specif i catio n YY details the perf orm a nce requ ire m ents f o r a multi-m e tals continuous em issions m o nitor that utilizes x-ray fluorescence (XRF) as an analytical techniqu e. Each XRF based m u lti- m e tals CEMS m u st m eet the cr ite ria f o r accuracy , stability, an d instrum e ntal respon se laid out in this docum ent. In addition, every XRF multim e tals CEMS m u st m eet the ins t allation re quirem ents in PS-YY and the on-going quality control and quality assurance proc edures set forth in procedure Z if it is u s ed f o r em issions com p liance purposes.

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### List of Symbols b o = The y inte rc ept of the be st f it line b 1 = The slope of the best fit line

i CA = X-ray fluorescence calib ration accu racy

C i C = Corrected CEMS concentration for the i th elem ent

CEMS i C = The concentration of the i th elem ent as reported by the CEMS

CEM i C = The average reported co ncentration of the CEMS for the i th elem ent

PT i CF = Correction factor for pe rcent transpo r t for the i th elem ent

RB i CF = The relative bias corr ection factor for the i th elem ent

L i C = The em ission lim it of the i th elem ent

S i C = Concentration of the i th elem ent at the stack

sm i C = Concentration of the i th elem ent at the sam p ling module or as reported by the XRF multi- m e tals CEMS.

i d = Difference between two paired m easurem ents d = Arithm e tic m ean of differences FS = Full scale value of your CEMS volum e (or flow) m easurem e n t device

0 i L = The value of the i th element on the zero standard determin ed immediately after calib ration

cem i L = The value of the calibration check standard reported by your CEMS

cemo i L = The m easured CEMS response to the zero standard for the i th elem ent

cemu i L = The m easured CEMS response to the i th elem ent in the ups cale standard

std i L = The known value of the calibration check standard

u i L = The calib rated value of the i th elem ent of the ups cale s t andard
n = Num b er of data points

i PT = The percen t transpo r t of the i th elem ent

i PT = Average percent transpo r t for the i th elem ent PRB i = Relativ e Bia s of the i th elem ent

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- YY ) Page ii of ivRM i R = The average of the reference m e thod m easurem e n ts for the i th m e tal

i PRSD = The relative percen t stan dard deviation for the i th m e tal

r = The correlation coefficient SD i = The standard deviation of differences for the i th elem ent V

cemr = Sa m p le gas volum e (or flow) as m easured by the CEMS volum e check device VD = Volum e drif t V

m = Volum e (or flow) reported by your multi-m e tals CEMS

i UD = The upscale drift of the i th elem ent on your CEMS in percent.

x = Arithm e tic m ean
x i = Value of each data point y i = CEMS reported concentration for the i th elem ent ZD i = The zero drift of the i th elem ent on your CEMS in percent

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### Table of Contents 1.0 Using PS-YY

................................................................................................................ 1 1.1 W h at is the purpose and applicabil ity of Perfor m a nce Specification YY?

.............. 1 1.2 W h at will b e discuss e d in PS-YY?

........................................................................... 1 1.3 W h at are the installation and pre-perfor m a nce specification test requ irem ents ?

..... 2 1.4 W h at special defini tions apply to PS-YY?

............................................................... 3 2.0 Interferences, Safety, and Equipm ent Requirem e nts

.................................................... 5 2.1 Are ther e an y potential interf eren ces f o r m y XRF m u lti-m e tal CEMS?

.................. 5 2.2 W h at do I need to know to ensure the safety of persons using PS-YY?

.................. 5 2.3 W h at equipm ent and supplies do I need?

................................................................. 5 2.4 W h at regents and standards do I need?

..................................................................... 6 3.0 Perform a nce Evaluation Pr ocedures and Reporting

..................................................... 6 3.1 W h at is the purpose of the initial perfo r m ance specification tests and wha t is required to perform the tests?

............................................................................................... 6 3.2 How do I report th e resu lts of the init ial pe rf orm a nce spec if ic ation test?

.............. 12 4.0 Perf orm a nce Crite ria and Calcula tion s ....................................................................... 13 4.1 W h at are the perform a nce criteria for my XR F mul t i -met al s CEMS?

................... 13 4.2 W h at calculations, equations, a nd data analys es are needed ?

................................ 14 5.0 Other Requirem e nts and Inform ation

......................................................................... 20 5.1 W h at quality control m e asures are required?

.......................................................... 20 5.2 W h at calibration and standardiza tion procedures must I perform ?

........................ 20 5.3 W h at pollution prevention procedures m u st I follow? [reserved]

.......................... 20 5.4 W h at waste m a nage m e nt procedures must I use?

................................................... 20 5.5 W h at reference tab l es and fi gures are relevant to PS-YY?

..................................... 20 5.6 W h at references apply to PS-YY?

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Ta ble 1

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### 1.0 Using PS-YY 1.1 What is the purpose and applicabil ity of Performance Specification YY? 1.1.1 Purpose The purpose of Perfor m a nce Specification YY is to establish the perform a nce requirem e nts that m u st be m e t by a multi-m e tals continuous em ission m o nitoring system (CEMS) that utilizes x-ray fluorescen ce (XRF) to determ ine m e tal concentrations in stationary sources. Assu rance of the continuing quality of the CEMS data m a y be achieved by following the procedures defined in Procedure Z – XRF Based Multi-Meta l CEM S

Quality As surance Pro cedures. 1.1.2 Application PS-YY applies to you if you intend to use an XRF m u lti-m e tals CEMS for purposes of estab lish i ng com p liance with f e deral regula ti ons f o r m e tal em i ssions from stationary sources. 1.1.3 Measurement Capabilities A m u lti-m e tals CEMS must be cap ab le of m easuring total con centr ation s of at leas t two m e tals in the units o f the applic a b le sta ndard or in units that can be converted to units of the applicable standard. 1.1.4 Other Monitoring If your XRF based m u lti-m e tals CEMS is capab le of reporting a m e tal concentration in the units of the existing regulation no a dditional monitoring is necessary. If your CEMS does not report concentrations in the units of the existing standard then other monitoring (e.g., oxygen, tem p erature, and pressu re) are necessary to convert the units reported by your CEMS to th e units of the standard. 1.2 What will be discussed in PS-YY? PS-YY covers two basic topics : (1 ) th e instrum e nt requir e m e nts f o r a XRF based m u ltim e tals CEMS and (2) th e requirem e nts tha t eachXRF multi-m e tals CEMS m u st m eet during the in itial pe rf orm a n ce specification test. 1.2.1 Instrument Requirements A m u lti-m e tals CEMS must be ab le to accura te ly report the co ncentration s of at leas t two m e tals. It m a y do so by extracting a re presentative sam p le (path or point sam p ling m a y be used if the sam p le is representative ) of stack effluent and capturing the m e tal analytes of interest on a m e dium . The CEMS must have a cycle tim e that is less than one third the period of the applicable standa rd. T h e range of the instrum e nt m u st be from 10 percent to at least 400% of the appl icable regulation as determ ined by field or

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- YY )) Page 1 of 30laboratory tests. Finally, the instrum e nt or operator m u st be able to perform daily upscale, blank, and flow quality assurance checks to ensure the accuracy, precision, and stab ilityof the in strum e nt and its data. 1.2.2 Initial Performance Specification Tests The purpose of the initial perf orm a nce spec if ication tes t is to estab lish the stability, accuracy, an d precis i on of your XRF m u lti-m e tals CEMS. The perform a nce specification test can be divi ded into two phases: (1) the stab ility test, and (2) the accuracy tes t

. The stabilitytest consis ts of a seven day check of the zero and upscale calibration drift and is done prior to the accura cy testing. For th e accuracy tests, th ree m e thods of m e tals generation (quantitative spiking, non-quantitative spiking, and stack operation) and two m e t hods of data analysis (percent re lative bias, and linearit y) are available. The sam p ling and XRF modules of your CEMS m a y also be tested separately from your stack sam p ling interface. Som e options m a y be better than others d e pending on your m u lti-m e tals CEMS, or the con d itions exis ting at you r s t ack. 1.3 What are the in stallation and pre-perf ormance specification test requirements? 1.3.1 Installation Requirements The sam p ling location of an XRF m u lti-m et als CEMS should be downstream of all pollution control equipm ent at a position where the m e tals c oncentr ation s are direc t ly representative or can be correct ed so as to be representativ e of tota l em issions f r om the stationary source. It is recommended th at the sam p ling lo catio n be at least two equivalent diam eters downstream of the nearest control devices, point of pollution generation, bend, or other point at w h ich a ch ange in pollutant concentration or flow disturbance m a y occur. The sam p ling location is also recomm ended to be at least two equivalent diam eters upstream from t h e exhaust. The equivalent diam eter is calcula t e d accord ing 4 0 CFR Part 60, Appendix A, Method 1, Section 2

. 1 i

. Either point or path sam p ling m a y be use d. For point sam p ling the m easurem ent point should be no less than 1.0 m e ter from the stack or duct wall or located over the centroidal area of the stack or duct cross section. For a path sam p ling CEMS the effective m e asurem ent path should be (1) totally within the inner area bounded by a line 1.0 m e ter from the stack or duct wall, or (2) have at least 70 percent of the path within the inner 50 percent of the stack di am eter or duct cross section. The sam p le collection and instrum e ntal an alyzer porti ons of your XRF multi-m e tals CEMS m a y be located any distance from the sam p l i ng point provided the transm ission efficiency from the sam p ling point to th e sam p le collecti on point can be determ ined and m eets the criteria outlined later in this perform a nce sp ecification. It is also recommended that the sam p ling probe for your m u lti-m e tal CEMS be located at point wit hout stratification. You m a y test for stratifica tion at the proposed CEMS sa m p ling point by using either PM (as outlined in PS-11), velocity tests as described in Method 2 ii , or m e tals concentratio ns using Method 29 or an acceptable alternative.

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- YY ) Page 2 of 301.3.2 Sampling Requirements Your m u lti-m e tal CEMS should sample from th e source at a flow rate which is within 10 percen t o f true isok in etic. If your m u lti-m e tal CEMS does not m a intain an isokinetic sampling rate you m u st use actual site-specific data or data from a sim ilar installation to prove to us, th e State, and/or local enfor cem ent agency that isokinetic sam p ling is not necess a ry. 1.3.3 Pre-Test Preparation R e quirements and Suggestions Prior to the initial perform a nce specification test you need to ensure th at y our m u ltim e tal CEM S data logger accu rately records em issions lev e ls as well as signals (flags) that indicate both norm a l and abnormal opera tion. Prior to start of the seven day stability test the daily drift m easuremen ts (upscale and zero values) should be monitored to ensure th at the ins t rum e nt is operating in an ap propriate and stable m a nner. W e recomm end that you us e your XRF multi-m e tal CEMS for a sufficient length of tim e to becom e comfortable with its operation pr ior to the s t a r t of the in itial perform a nce specification test. 1.4 What special definitions apply to PS-YY? Calibration Drift: The difference in the CEMS output readings from the established reference v a lue after a stated period of operation during whic h no unscheduled m a intenance or adjustm e nt took place. Cycle Time: The tim e between when the stack g a s f i rst com e s in contact with the concentratin g m e dia and when the co ncentration value for that sam p le is reported. Data Recorder: The portion of the CEMS that provi des a record of analyzer output including metal concentrations, flags which indicate norm al operation, and flags indicating abnorm a l operation. The data recorder m a y record other pertinent data such as effluent flow rates, and various instrum e nt te m p eratures. Diluent mo dule: The part of the C E MS in which a ny diluent is added and m e asured. Drift Calib ration Stan dard: A standard containing a consta nt am ount of m e tal used to establish the drift in the x-ra y fluorescence m odule response. Emission Limit: The e m ission lim it f o r a sing le m e tal is equ a l to the m a xim u m am ount allowed under the applicable regulation for its ca tegory assum i ng all of the other m e tals in its category were not present. Element of Opportunity: An elem ent that is p r esent in the s t ack effluent and can be u s ed to estab lish tra n sport ef f i ciency. Instrument Measurement Range : The range of m e tal concentra tions the instrum e nt can reliably m easure from the lowest con centrati on to the highest. The instrument m easurem ent range m a y be different for different m e tals. If the upper end of the m easurem ent range is

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- YY ) Page 3 of 30more than four tim es the em ission lim it, the upper lim it does not need to be definitively estab lished. Path Sampling CEMS : A CEMS that sam p les the source e ffluent along a path greater than 10 percent of the equivalent diam eter of the stack or duct cross section. Point Sampling CEMS : A CEMS that sam p les the sour ce effluent at a single point. Non-Quantitative Spiking: The process of introducing an unknown a m ount of m e tal or m e tals into the effluent or sam p le stream

. Quantita tiv e Spiking : The process of introducing a known am ount m e t a l or m e tals into the effluent or sam p le stream. Percent Relative Bias : The difference between a referenc e value and th e CEMS m e asured value divided by the reference value. Reference material: A m a terial of known value used to check the calibration drift of your XRF multi- m e tal CEMS. Sample Interface: The portion of the CEMS used for one or more of the following: sam p le acquisition, sam p le transport, sam p le conditioni ng, or protection of the monitor from the effects of stack gas. Sampling module: Th e portion of an x-ray f l u o rescen ce b a sed m u lti- m e tal CEMS that traps the m e tals and delivers them to the XRF module. Spiking: The process of introducing m e tals into the effluent stream or the sam p ling stream

. Transport Effic i ency: The percen t of m e tal that is tr ans ported from the sam p le probe to a point as close as possibl e to the sam p ling m odule. Upscale Drift: The ups cale d r ift is the difference in the reported value for the upscale reference from its value at the la st calibration, divided by the valu e at the last calibration. It is used to m onitor the s t ability of the x-ray fluorescence analysis. X-Ray Fluorescence (XRF) Module: The portion of an XRF based m u l ti-m e tal CEMS which identif ies and m e asures m e tal m a sses or concentrations using x-ray fluorescence. XRF Multi- Metals Con t inuous Emissi on Monitoring System (CEMS): All of the equipm ent required for determ ining m e tal con centrations using x-ra y flu o rescen ce as an analytical technique. The system m a y consist of several m a jor subsystems including but not lim ited to th e following the sam p le interface, th e x-ray fluorescence m odule, diluent module, data recorder, sam p ling module and volum e m e a s urem ent module. Z ero Drift: The zero drift is the d i fference in the CE MS readings for the zero referen ce from their values after the m o st recent calibrati on, divided by the em ission lim i t for each elem ent.

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### 2.0 Interferences, Safety, and Equipment Requirements 2.1 Are there an y potential interf erences for my XRF multi-metal CEMS? There m a y be interferences arising from the x -rayfluorescence analys is, the trapp i ng m e dia, or from condensation in the e ffluent gas. Check with your multi-m etal CEMS m a nufacturer to find out more about pot ential interferences. 2.2 What do I need to know to ensure th e safe ty of p e rsons using PS-YY? People using PS-YY m a y be exposed to haza rdous m a terial, operational hazards, and hazardous site condition s . PS-YY does not address all the safety issues associated with its use. It is your res ponsibility to ensure the safety of persons using PS-YY. Som e helpful references m a y include the CEMS m a nual, the CEMS m a nufacturer, o t her reference m e thods, and on-site safety regulations. 2.3 What equipment and supplies do I need? 2.3.1 Equipment for the CEMS 1. Sample interface: This portion of the CEMS m u st present a sam p le of source effluent to the sam p ling module that is directly representative or can be corrected so as to be representative of source. To accom p lish this, the s a mple interface m a y contain, among other things , heaters or heating system s, and dilution air. 2. Sampling module: The sam p ling module m u s t collect and trap all the analytes of interest from a representative sam p le of stack effluent without significant loss. The trapped analytes then m u st be presented to the XRF m odule. 3. XRF modul e: The XRF m odule uses x-ray fluorescence to determ ine the m a ss or concentration of m e tal cap tured by the sam p ling m odule. 4. Volume me asurement module: This portion of the CEMS m easures the volum e of s ource effluent from which th e m e tal analytes were cap tured in the sam p ling module. This volum e along with the data from the XRF to determ ine concentration of source effluent. 5. Diluent Mo dule: If your m u lti-m e tals CEMS us es a diluent such as air o r nitrog en it is added to th e effluent sample and measured using the diluent module. 6. Quality a s s u rance and quality control materia l s: Your m u lti-m e tal CEMS must possess the necessary equipm ent to perform daily upscale and zero checks. Your m u lti-m e tal CEMS must also po ss ess the equ i pm ent to per f o rm a daily check of the sam p l e volum e at norm a l sa mple flow rates. 7. Data recorder : Your XRF m u lti-metal CEMS must be able to reco rd metal concentrations and instrum e nt status signals (flags).

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- YY ) Page 5 of 302.3.2 Other Equipment Needed for the Performance Specification T e st PS-YY does not specify all the equip m ent a nd supplies n eces sary for the perform a nce specif i ca tion tests. Som e of this inf o r

m ation is in cluded in th e applicable ref e rence m e thods (e.g., Method 29 or an acceptable alternative)

. 2.4 What regents and standards do I need? 2.4.1 Zero Drift R e feren ce Your m u lti- m e tals CEMS m u st inclu d e a st and a r d f

o r the m e asurem ent of the daily zero drift. This reference should produce a CEMS response indicating the absence of m e tals. If this is not f easible this standard should produce a value between zero and 20% of the em ission lim i t for at least two elem ents m easured by your XRF m u ltim e tals CEMS when the instrum e nt is operating appropriately. 2.4.2 Upscale Drift Reference The reference for the upscale drift check s hould generate a response for at least one m e tal from e ach condition used in the XRF an alysis. This response m u st be at least 80 percen t of the em ission lim it. 2.4.3 Volume Drift measurement device During the initial pe rf orm a nce specif icati on test the volum e m easure m ent m u st be com p ared on a daily b a s i s against an intern al volum e or flow m easurem e n t device. This volum e or flow m easurem ent device m u st be calibrated independently of the sam p le volum e or flow m easurem ent device a nd must be as accurate or m o re accu rate than the sample volum e or flow m easurem ent device. 2.4.4 X-ray Fluorescence Calibration Check Standards Your XRF multi-m e tals CEMS m u st in c l ude a m eans of checking th e x -ray fluorescence calib ration agains t an external standard. NIST tr aceable thin film standard s are an exam ple of a suitab l e x-ra y fluo rescen ce calibra tion check standard. 

### 3.0 Performance Evaluation Procedures and Reporting 3.1 What is the purpose of the initial perfor mance specification tests and what is required to perform the tests? The purpose of the initial perform a nce specification tests is to determ ine the bias, precision, stability, an d cycle tim e of your m u lti-m e tal CEMS.

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- YY ) Page 6 of 303.1.1 Pretest Preparation Prior to the start of your in itial perform a nce specification tests you m u st be sure that your CEMS is installed according to the specifi cations laid out in th is docum e nt. After installing yo ur XRF m u lti-m e tals CEMS we reco mmend that you use the CEMS for a period of tim e to fa m ili ariz e yourself with its operation. W e also recomm end that you conduct daily checks of the zero and upscale dr ift to verify that the instrum e nt is functioning properly. W h en you are confiden t that the instrum e nt is perform i ng satisf a c t or ily it is tim e to prepar e f o r th e initial perf orm a nce specif i ca tio n tests. 3.1.2 X-ray Fluor escence Calibration Check If your CEMS m easures m o re m e tals for com p liance purposes than will be evaluated during th e CEMS accuracy testi ng described later in this do cu m e nt you must perform a calibration check of the x-ray fluorescence m odule for these additional m e tals. During the calibration check you m u st challenge the x-ray fluorescence m odule with a standard or standards for each m e tal m easured by your XRF m u lti-m e tal CEMS. Each m e tal must be m e asured at leas t three tim e s and the erro r is calcu l ated accord ing to

Equation 13 for each m e asurem ent. The av erage error of th e three m e asurem ents must be less than 10% o f the calib ration stand a rd ’s value for each m e tal, if not your CEMS m a y not be properly calibrated. The x-ray fluor escen ce calibra tio n check m a y occur a t any tim e during the in itial perform a nce specification test. . 3.1.3 Stability – T h e 7-day Calibration Dr ift Tes t s Prior to the start of the a ccuracy test you m u st perform a calibration drift test for a period of at least seven days. The purpose of th is test is to v e r i f y that th e instrum e nt operation is stable. During the calibration drift test period you m u st determ ine the m a gnitude of the zero calibration drif t (a s calculated in Section 4.2.9), the upscale calibration drift (as calculated in Section 4.2.8), a nd the volum e (or flow) drift (calculated using Equation 14) at least once each day. During the stability tests no adjustm e nts or calibrations m a y be made to the CEMS. The re sults of th e stability tes t must be reported along with the results of the accuracy tests. 3.1.4 CEMS Accuracy The accuracy of your XRF m u lti-metal CEMS m a y be determ ined using one of the following four options. 1. Option A: Linearity test of the entire CEMS 2. Option B: Linearity test of the XRF a nd sam p ling m odules separately from the sam p le interface. 3. Option C: Relative bias test of the entire CEMS. 4. Option D: Relative bias test of th e XRF and sampling m o dules separately from the sample interface.

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- YY ) Page 7 of 30There are also several o p tions for generati ng the m e tals that will be an alyzed by your multi-m e tal CEMS inclu d ing, m e tals that are gen e rated as a b y -product of norm a l stack operation, quantitative spiking, and non-quant itative spiking. Re gardless of the generation option you choose you m u st be able to produce concentrations for som e of the analytes of interest at 80 to 120 percent of the em ission lim it. All of the CEMS and reference m e thod m easurem ents m u st be conducted while sampling flue gas. You do not need to test every m e tal th at your CEMS m easures, however, you m u st generate at least one m e tal from each categ o r y of m e tals m easured by your CEMS for the accu racytests. Fo r instance, if your XRF m u lti-m etals CEMS m e asures sem i

volatile, low volatile, and high volatile m e tals you m u st test at least one m e tal from each of thos e catego r ies. (Low volatile m e tals m a y also be us ed to verify the cap t ure efficiency and detection of non-enum erated m e tals). You must also prove that the XRF module is properly calibrated to m eas ure the elem ents that are not being m easured during the accuracy test by follo wing the procedures described in Section 3.1.2. The test requ irements for eachoption are explained b e low and summ arized in Table 1.

• Linearity T e st Requireme nts (Options A and B): The bias and precision of your XRF multi-m etals CEMS m a y be dete rm ined by checking the linearity of the instrum e nt response over a series of concentrations . If quantitative spiking is used, then the concentration of the aerosol is paired with a reported CEMS concentration acquired at the sam e tim e. Each data point is then plotted with the spik ed c oncentr ation on the X axis and the reported CEMS concentration on the Y axis. If eithe r non -quantita tive sp iking or stack by product is used, then the repo rted CEMS concentration is plotted on the Y axis versus the concentration reported by m e thod 29 or a suitable alternative. Linear least squares regression analysis is then us ed to f it the data points to a line. If you challenge only the XRF module and the sam p ling m odule the slope of this lin e, which is an indication of the accu racyof your XRF m u lti-m e tal CEMS, is required to be between 0.8 5 a nd 1.15 for each m e tal. The coefficien t of correlation m u st be greater than 0.90 and is an indi cation of the precision of your m u lti-m e tal CEMS. Finally, the in terc ept of this best fit line m u st be less than 20% of the applicable em ission lim it. If you challenge the entire CEMS system and do not m eet the slope or intercept criteria you m u st apply a correction factor according to the pr ocedures in Section 4.2.12. You are, however, still required to have a correl ation co efficient of 0.90 or greater. To perform t h e linearity test you m u st be able to genera te at least three concentratio n levels for one m e tal from each class of m e tals (high volatile, low volatile and sem i -volatile) m easured by your CEMS. The three levels m u st incorporate at least a two fold concen tration change and one level m u st be between 80 and 120 percent of the em i ssion lim i t . You m a y acquire a blank sam p le if you wish, either by sam p ling am bient air, or by operating the source in such a way that m e tals are not prod uced (e.g., burning only natural gas). At

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- YY ) Page 8 of 30leas t three measurem ents are required at each con centration le vel and a total of 15 m easurem ents are required overa ll. You m a y m a ke additional m easure m ents, however, you m u st report a ll the results. If you are not using quantitative spiking you must m a ke 15 corresponding m easurem ents using m e thod 29 or a suitable alternative. We recommend using duel trains for the reference m e thod m easurem ent to identify and screen the reference m e thod data for im precision and bias. Additional requirem e nts for each of the two linearity tes t options are outlined below. You m a y also want to refer to figures 1 through 8 for guidance on which option to choose. Option A: Total CEMS Linearity In option A the entire C E MS system is challenged during the linea rity tes t s. Any one of the three m e thods of m e tals generation m a y be used during the test. Som e of the testing requ irem ents associated withm e tals gene ration are ou tlin ed below 1. Metals generated as a result of stack operation If m e tals for the test are generated as a result of stack operation you m u st m easure the concentration of the m e t a ls in the stack using m e thod 29 or a suitable alternative and com p are the values with those reported by your CEMS. W e recomm end using dual refe rence m e thod trains to screen the reference m e thod for precision and bias. 2. Non-quantitative spiking You m a y either spike non-qua ntita tiv ely in to the stack or du ct itse l f or into the transport system as close as possi ble to the sample probe. If you spike into the source you m u st m easure the concentration in the source using m e thod 29 or a suitable alternative. Th is m easurem ent is then com p ared to the result of your CEMS. If you choose to spike into the transport line you must m easure the concen tration immedi ately do wnstream of the spik e po int with a m e thod 29 or a suitable altern ative and com p are that m easure m ent with the con centr ation reported by your CEMS. 3. Quantita tive Spiking You m a y spike a quantitative a e roso l direc tly into the sourc e o r into the transport line as close as possible to sam p le probe. Either way the known spiked concentration is com p ared with that m easured by the CEMS. Option B: Linearity for Sa mpling and XRF Modules Only In option B only the s a mpling and X R F m odules of your m u lti m e tals CEMS are challeng ed with a lin earity test. You m u st also com p lete a transpo r t efficiency test along with the linearity test. The procedures for perform i ng a transport efficiency test are described in secti on 3.1.5. The procedures for option B ass o ciated witheach m e tals generation option are listed below. 1. Metals generated as a result of stack operation

Specif i cations f o r XRF Based Multi

- M etals C E MS (PS

- YY ) Page 9 of 30If m e tals co ncentration s for the accu racy test are generated as a result of stack operation you m u st m easure the concen tration of the m e tals as close as possible to the sam p ling module using m e thod 29 or a suitable alternative and com p are the values with those re ported by your CEMS. We recommend using dual reference m e thod trains to screen the reference m e thod for precision and bias. 2. Non-quantitative spiking You m a y either spike non-qua ntita tiv ely in to the stack or du ct itse l f or into the transport system . Either way you m u st m easure the concentrations of the analytes as close as pos sible to th e sampling m o dule and com p are th at concentratio n with tha t r e ported by y our m u lti metal CEMS. 3. Quantita tive Spiking You m u st spike at a location as close as possible to the sam p ling m odule and com p are the known spiked concentrati on with that reported by your CEMS.

• Relative Bias Test Requirem ents (Options C and D): There are two relative bias options available: o n e that challenges the en tire CEMS and one that challenges the sam p ling and XRF modul es separately from the sam p le interface. Either option requires at leas t 12 CE MS m easurem ents be m a de at a concentration level 80 to 120 percent of the em ission lim it for a m e tal from each category of m e tals analyzed by your XRF multi m e tal C E MS. If you are not using quantitative spiking you must al so have at least 12 corresponding runs of m e thod 29 or a suitable alternative at this concentrati on level. W e recomm end using dual trains for the refe rence m e thod to screen the data for im precision and bias. Additiona lly , f o r at lea s t one m e tal meas ured at th e em ission lim it or for a surrogate metal that can be m easured by your CEMS (such as iron) you m u st test the CEMS at three different co ncentr ation levels. These three levels m u st incorporate at least a two- fold chang e in concen tration and o n e of the lev e ls must be between 80 and 120 percent of the em ission lim it (the concentration of the em ission lim it f o r the surroga te metal is equa l to tha t f o r th e m e tal m e asured by your CEMS with the highest em i ssion li m it). You are required to obtain at leas t three measurem ents at each con centr ation level and are required to h a ve a tota l of at le ast 12 m easurem ents. You m u st report th e resu lts of all m easure m ents. The relative bias is an indicator o f accuracy and should be calcu lated u s ing equatio n 5 for each elem ent. Also, the percent relative standard deviation, which is an indicato r of precision, shoul d be calculated for each m e tal If you challenge the entire CEMS system and you do not m eet the test criteria you m a y apply a correction factor to your CEMS data. Calculate a correction factor for each m e tal in the relativ e b i as test according to the equation found in section 4.2.13. If you challenge the sa m p ling and XRF modules separately from the sample interface you m a y not a pply a correction factor to the d a ta

Specif i cations f o r XRF Based Multi

- M etals C E MS (PS

- YY ) Page 10 of 30from the relative bias test, you m a y, how ever, apply a correction factor to the results of th e transpo r t e f f i ciency tes t . For the m e tal that was spiked over several concentrations you m u st perform linear least squares regression analysis on the data. The correlation coefficient fo r this fit m u st be better than 0.90. This is to demonstrate that the instrum e nt response is valid over its applicable range. If the criter ia f o r this tes t is m e t then the c o rrec tion f a c t ors a r e assu m e d to be valid over the range of the instrum e nt. Option C In accu racy test op tion C the entire C E MS is subjected to a relative bias test. The options for m e tals generation and the associated spiking and reference m e thod requirem e nts are the sam e as those for Option A under the linearity tests. Option D In accu racy test op tion D only the XRF and sampling m o dules are subjected to a relative bias test. The options for m e tals generation and their associated spiking and reference m e thod requirem ents are the sam e as those for Option B. You are also required to perfor m a transport efficiency test. 3.1.5 Transport E fficiency Test You m u st perform a transport efficiency te st if you have only challenged the sam p ling and XRF modules durin g the accu racy tests (o p t ions B and D). Any one of the four m e thods described below are valid ways of determ ining percent transport for your multi-m e tals CEMS.

• Particula t e Matter (P M): In this approach partic ulate m a tter is m e asured concurrently in two locations, (1) in th e stack effluent stream as close as possible to y our m u lti-metals CEMS sam p le interface, and (2) at a poin t in the transport system as close as possible to the sam p l i ng m odule. You m a y us e any standard ref e rence m e thod to m easure PM including Method 5, Method 5i, or Method 17 (40 CFR 60, Appendix A) iii , , iv v . Particulate m a tter m u st be generated by operating the source. Y ou m u st acquire at least 12 paired concentratio n m easurements (each p a ir cons is ts of the m easurem ent m a de as close as po s s ible to the s a m p le interf ace and th e m easurem ent m a de as close as possible to the sam p ling module. The percent transm ission is calculated f o r each pair using equation 6 and the ov erall percent transm issio n is determ ined by calculating the average of all twelve runs.

• Element of opportunity : Altern ative l y, tr ansport ef f i ciency can be determ ined using a surrogate m e tal such as iron or zinc that is commonly present in stack effluent. Method 29 (40 CFR 60, Appendix A) vi or a suitable alternative can be used to m easure the m e tal concen tration in the s t ack effluent stream as close as possible to the sam p le probe and at a point in the transport system as close as possible to the sam p ling module. Als o, if your XRF m u lti-metals CEMS is

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- YY ) Page 11 of 30capable of m easuring the elem ent of interes t , yo u m a y com p are th e m easured concentration on the CEMS with that m easured in the stationary source using the reference m e thod. Transport efficiency is calculated using equation 6. You are required to m a ke at least twelve paired concentration m easurem ents to determ ine th e m ean transport efficien cy.
• Non-quantitative spiking: An aerosol containing a surrogate m e tal or a m e tal analyte can be spiked no n- quantita tiv ely in to the stack or duct gas stream or into th e tran sport sys t em as close as possible to the sam p ling probe. The concentration of the spiked m e tal is m easured by m e thod 29 (40 CFR 60, Appendix A) 5 or a suitab le altern ativ e as clos e as possible to the CEMS’ sam p le probe and by another Method 29 or a suitab le alternative as close as possible to the sam p ling m odule. If you spike directly into the transport line you m u st m a ke your upstream concentration m eas urem ent as close as possible to the spike location and your downstream m eas ure m ent as close as possible to the sam p ling module. If your XRF m u lti-m e tals CEMS is capab le of m easuring the spiked m e tal, you m a y com p are its reporte d concentration w ith the in source m e tals m easurem ent or with the ups tream in tran sport line m e asurem ent to calcu late transport efficiency acco rding to equation 6. You are requ ired to m a ke at leas t twelve p a ired concentra tion m easurem ents to determ ine the m ean transpo r t efficien cy.

• Quantita tiv e Spiking : An aerosol containing a surrogate m e tal or a m e tal analyte can be spiked qu antitatively into the stack or duct gas stream or into the transpo r t sys t em as close as possib l e to the sam p l i ng probe. The concentration m a y be m e a s ured on the CEMS or by us ing m e thod 29 or a suitable alternative as close as possible to the sam p ling module. This m e asurement is then com p ared with the known concentration of the spiked aeroso l to determ ine the percen t tr an sport. 3.1.6 Dual Train Requirements If you use a reference m e thod (eg., m e thod 29 or 5i) during the linearity, relative bias, or transport efficiency tests it is recommended that you use dual trains to screen the reference m e thod for bias and im precision. 3.1.7 Cycle Time Requirements The cycle tim e for your XRF multi-m e tals CE MS should be no greater th an one-th i rd of the averaging period for the applicab le standard. During all phases of the perform a nce specificatio n test includ ing the CE MS m u st use the sam e cycle tim e as will be us ed during day to day operation. 3.2 How do I report the results of the initial per f

ormance spec ific a tion test? Summ arize the results of the calibration drift a nd accuracy tes t s in tabular for m . Include all data sheets, calculations, and records of CEMS measurem ents necessary to substantiate the perform a nce of the CEMS and any other devi ces or m e thods (e.g., m e thod 29). The CEMS

Specif i cations f o r XRF Based Multi

- M etals C E MS (PS

- YY ) Page 12 of 30m easure m ents shall be reported to the agency in units of μg/m3 on a dry basis, corrected to 20°C.



### 4.0 Performance Criteria and Calculations 4.1 What are th e performan ce crit eria for my XRF multi-metals CEMS? You m u st demonstrate th at your XRF m u lti-m e ta l CEMS has adequate stability, precis ion, accuracy, cy cle tim e and data reporting capabili ties to determ ine if your facility is in com p liance with m e tal em ission stan dards or ope rating perm it lim its as sp ecif i ed in applicable regulations o r perm its. You will dem onstrate th is capacity by showing that your XRF multi- m e tal CEMS m eets the f o llowing pe rf orm a nce criteria. 4.1.1 7-day Drift Check Criteria – Stab ility Upscale Drift: The upscale drift as calculated in s ection 4.2.8 m u st be less than 15% of the or igina l calib ration v a lue of the u p scal e reference each day for seven consecutive days. Z ero Drift: The zero drift as calculated in Sect ion 4.2.9 m u st be less than 20% of the em ission lim it each day for seven consecutive d a ys. Volume or Flow Drift: The volum e or flow drift as calculated in S ection 4.2.11 m u st be less then 20% of the full sc ale value of the flow or volum e m easurem e n t device each day for seven consecutive days. 4.1.2 X-Ray Fluorescence Calibration Drift Criteria For each m e tal m easured by your m u lti-m etal CEMS for compliance purp o ses the x

ray fluorescence calibration drift m u st be less than 10% of the value of the standard. (Note: you are not required to calculate the XRF calibration drift for those m e tals used during the bias and precision testing). 4.1.3 Relative Bias Criteria – Accuracy an d Precis i on The relative bias of the instrum e nt must be less than 15% and the relative percent standard deviation (RSD) m u st be 10% or less if you challenge the XRF and sam p ling modules of your CEMS separately from your transport system. If you c h allenge your entire CEMS and it does not m eet the above relative bias criteria you m u st apply a correction factor to the re sults reported by your CEMS. The correction factor is calculated using the equation in section 14.2.13. Also, the correlation coefficient for a leas t squar e s linea r reg r e ssion f it of the m e tal tha t was spiked at th ree dif f e rent concentration levels m u s t be greater than 0.90. This is to help assure that the correction factor is applicable over the range of the instrum e nt.

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- M etals C E MS (PS

- YY ) Page 13 of 304.1.4 Linearity Test Criteria

– Accuracy a nd Precis i on If you choose to do linearity tests to determ ine th e accuracy and precision of your XRF multi-m e tals CEMS the slope of the least s quares linear fit sho u ld be between 0.85 and 1.15. The correlation coefficient m u st be 0.90 or better and the inte rcept should be less than 20% of the applicable em ission lim it. If you challenge only the XRF module and the sam p ling m odule of your CEMS you m u st meet the above criteria. If you challenge your entire CE MS and you do not m eet the slope or in tercept criteria you must adjust the results reported by your CEMS, you m u st however, still m eet the correlation coefficient criteria. The correcti on f a c t or is calcula ted acco rdin g to the procedures in section 4.2.12. 4.1.5 Transport efficiency – A ccuracy If the average transport effi ciency is between 90 and 110 pe rcent, then no correction for transport efficiency needs to be app lied to concentrations reported by your XRF multi-m e tals CEMS. If, however, your averag e transport efficiency is les s than 90 percent or more than 110 percent then you m u st use a correction factor. You m a y us e your transm ission efficiency test data to esta blish a correction factor that would change the repo rted CEMS concentrations fo r each m e tal to a valu e that would reflect 100% transm ission efficiency.

4.1.6 Cycle time – Appropriate Reporting The cycle tim e for your XRF mu lti-m e tals CEMS m u st be no greater th an one-th i rd of the averaging period for th e applicable standard. 4.2 What calculations, equations , and data analyses are needed? 4.2.1 Arithmetic Mean Calculate th e arithm etic m ean of a data set as follows. 

# ∑ = i x n x 1 Equation 1

Where :

x = Arithm e tic m ean
n = Num b er of data points
x i = Value of each data point

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- M etals C E MS (PS

- YY ) Page 14 of 304.2.2 Arithmetic Mean of Difference To calculate the arithm e tic m ean of differe nce us e the above equation sub s titu te d for x . Where

RM CEMS

CEMS

RM i i i R C d

− = Equation 2 Where:

= The concentration of the i i C th elem ent as reported by the CEMS

i R = The concentration of the i th elem ent as reported by the reference m e thod or aresol 4.2.3 Standard Deviation (of differences)

1 1 2 2

− ∑ ∑

−

= ⎟ ⎠ ⎞ ⎜ ⎝ ⎛

n d

n d SD i i
i Equation 3

W h ere: SD i = The standard deviation of differences for the i th elem ent
n = The num ber of data points d

i = The difference between the concentration m easured by the reference m e thod or the concentratio n of the reference aerosol and the concentration reported by the CEMS. 4.2.4 Percent relative standard deviation
100 × = RM i i i R PRSD SD Equation 4

W h ere:
RM i R = The average of the reference m e thod data set or the reference aerosol concentration for the i th elem ent

i PRSD = The relative percen t stan dard deviation for the i th m e tal 4.2.5 Relative Bias

100 × = RM i i i R d PRB Equation 5

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- M etals C E MS (PS

- YY ) Page 15 of 30W h ere i d is th e m ean difference, is the average of the reference m e thod data set or the averag e aerosol con c entration for the i RM i R th elem ent, and PRB i is the re lative bias f o r the i th elem ent 4.2.6 Percent Transmission
100 × = S i i i C C PT sm Equation 6 W h ere: S i C = Concentration of the i th elem ent at the stack

sm i C = Concentration of the i th elem ent at the sam p ling module or as reported by the XRF m u l ti-m e tals CE MS.

i PT = The percen t transpo r t of the i th elem ent Report the average percent transport ( P T ) of all m easurem ents for each elem ent that was tested (only one el em ent is required though more can be tested). 4.2.7 Best Fit L i ne for Linearity Test Calculate th e linear co rrelat ion equation given below.

x b b y ˆ +

= o 1 Equation 7
W h ere: b o = The y inte rc ept b 1 = The slope The intercep t is calcu l ated accord ing to the follow i ng equation

.
x b y b

− = o 1 Equation 8
W h ere: 

# ∑

= = n

i i x n x 1 1 

# ∑

= = n

i i y n y 1 1
The slope of the line is calcul ated according to equation below.

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 16 of 30

## ∑ ∑

= =

− − −

= n

1 i 2 i 1 i i i 1 ) x x ( ) y y )( x x ( b n Equation 9

The linear correlation co efficient is calcul ated according to the following equation.


## ∑ ∑

∑

= = =

− − −

−

= n

i i n

i i

i i i
y y x x y y x x r

1 2 1 2

1 ) ( ) ( ) )( ( n Equation 10

4.2.8 Upscale Drift

100 × − = u i i i i L L L UD u cemu Equation 11

W h ere:

i UD = The upscale drift of the i th elem ent on your CEMS in percent.

cemu i L = The m easured CEMS response to the i th elem ent in the ups cale standard

u i L = The calib rated value of the i th elem ent of the ups cale s t andard

4.2.9 Zero Drift

100 × − = L i i i i C L L ZD 0 cemo Equation 12

ZD i = The zero drift of the i th elem ent on your CEMS in percent

cemo i L = The m easured CEMS response to the zero standard for the i th elem ent

0 i L = The calib rated value of the i th elem ent on the zero standard

L i C = The em ission lim it of the i th elem ent 4.2.10 X-Ray Fluorescence Calibration Accuracy

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 17 of 30100 × − = std i std i cem i i L L L CA Equation 13

W h ere:

i CA = X-ray fluorescence calib ration accu racy

= The value of the standard reported by your CEMS cem i L

std i L = The known value of the standard 4.2.11 Daily Sample Volume Check
100 × − = FS V V VD m cemr Equation 14

W h ere: VD = Volum e drif t V

cemr = Sa m p le gas volum e (or flow) m easured by the C E MS volume check m easurem ent device V

m = Sa m p le gas volum e (or flow) re ported by your multi-m etal CEMS FS = Full sca l e va lue of the CEMS volume (or flow) m easure m ent device 4.2.12 Linearity Test Correction Factors (A pplicable only when the linearity test challeng es the entire CEMS) 1. Correction equation if CEMS does not m eet eith er the s l ope or the inte rc ept criteria.

1 0 b b y C i

C i − = Equation 15

W h ere:
= corrected C E MS concentration for the i C i C th elem ent y i = CEMS reported concentration for the i th elem ent b 0 = the in terc ept of the leas t squares line a r reg r ess i o n line b 1 = the slope of the least squares linear regression line
2. Correction factor if CEMS m eets in terc ept c r iter ia, but doe s not m eet the slope criteria.

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 18 of 301 b y C i

C i = Equation 16

3. Correction factor if CEMS m eets slope criteria but does not m eet inte rc ept criteria.

0 b y C i

C i − = Equation 17
4.2.13 Relative Bias Correction Factors

CEM i RM i

RM i i RB i C R

R

d CF = + = 1 1 Equation 18

W h ere:
RB i CF = The relative bias correction factor for the i th elem ent

CEM i C = The average reported co ncentration of the CEMS for the i th elem ent
RM i R = The average of the reference m e thod m easurem e n ts for the i th
m e tal

4.2.14 Percent trans port correction factor

i PT i PT CF 1
= Equation 19

W h ere
PT i CF = Correction factor for percent transpo r t for the i th elem ent

i PT = Average percent transpo r t for the i th elem ent

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 19 of 30

### 5.0 Other Requiremen ts and Information 5.1 What quality control measures are required? Quality con t rol m easures f o r an XRF m u lti- m e tal CEMS are addressed in procedur e Z “Quality As surance Req u irem ents for X-Ray Fluorescen ce Based Multi-Metals Continuous Em ission Monitors.” 5.2 What calibration and standardization procedures must I perform? Refer to your CEMS owner’s m a nual and m a nuf acturer to determ ine what calibration and standard ization procedures are re quired for your multi-m e tal CEMS. 5.3 What pollution preventio n procedures must I fo llow? [ r eserved ] 5.4 What waste management pr ocedures must I use? All chem icals used to produce a reference aeroso l or in perform i ng standard m e thods need to be disposed of properly. 5.5 What reference tables and fi gures are relevant to PS-YY?

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 20 of 30Table 1. Initia l Perfo r mance Specification Tests and Criteria Test Category Test Test Requirements Test Criteria
Zero Drift Monitor zero standard for 7 consecutive d a y s under no rmal operating con d itions < 20% d r ift ev er y day fo r sev e n consecutive d a y s Upsc ale Drift Monitor upscale standard for 7 consecutive d a y s under no rmal operating con d itions < 15% d r ift ev er y day fo r sev e n consecutive d a y s Seven Day

Stability Flo w Drift Monitor flow dr ift for 7 consecutive day s under normal op erating conditions < 20% d r ift ev er y day fo r sev e n consecutive d a y s Calibration X-Ray Fl uores cence Calib ratio n Drift Ch eck Tes t a s t andard f

o r ea ch el em ent m eas ured for co m p liance b y your CEMS 3 tim es < 10% d r ift for e v er y e l em ent m eas ured for co m p liance b y y our CEMS Op tion A Pe rform a li ne a r ity te st on entir e CEM S • At le as t on e m e t a l from each cat egor y • Need a t leas t 3 c oncentr ation leve ls which inc l ude a 2 fo ld conc. ch ange an d the emission lim it • If spiking, spike into sourc e , or spike in to tr ansport l i ne as c l ose as possible to th e probe • Slope = 0.85 to 1.15 • r > 0.90 • inter cept < 20% of emission lim it

• if th e above criteria are met then no corr ect io n • if not met apply a corr ection (correlation cr iteria must b e me t ) Op tion B

• Pe rform a li ne a r ity te st on sampling module and XRF module only • Determ ine trans port e ffi ci e n cy se pa rat e ly • At le as t on e m e t a l from each cat egor y • Need a t leas t 3 c oncentr ation leve ls which inc l ude a 2 fo ld conc. ch ange an d the emission lim it • S p ike or m e as ure con cen trat ions with ref e ren c e method as close as possible to the s a mpling module Line arity Crit eri a • Slope = 0.85 to 1.15 • r > 0.90 • inter cept < 20% of emission lim it • the line a rity cr it eria m u st be me t P e rcent Tr ans port Cri t eri a • 90< PT < 110 • If per cent tr ans port cr iter i a are no t m e t app l y a correction factor Op tion C Perform a relativ e bias test on entire CEMS • At le as t on e m e t a l from each categor y at 80 to 120 per cen t of em ission lim it • One other m e ta l at 3 con c . lev e ls which in clude a 2 fold conc. change and the e m ission lim it • If spiking, spike into sourc e or spike in to tr ansport l i ne as c l ose as possible to th e probe P e rcent re lat i ve Bias RB< 15% %RSD < 10%
r > 0

. 90 for m e t a l with thre e fold con c . ch ang e • If Crit eria not m e t appl y a correction factor (corr e lation coeffi cien t crit er ia m u s t be me t ) Accuracy

Op tion D

• Perform a relativ e bias test on sampling module and XRF module only • Determ ine trans port e ffi ci e n cy se pa rat e ly • At le as t on e m e t a l from each categor y at 80 to 120 per cen t of em ission lim it • One other m e ta l at 3 con c . lev e ls which in clude a 2 fold conc. change and the e m ission lim it • S p ike or m e as ure con cen trat ions with ref e ren c e method as close as possible to the s a mpling module Pe rc e n t Re la ti ve Bi a s Cri t e ri a RB< 15% %RSD < 10%
r > 0

. 90 for m e t a l with thre e fold con c . ch ang e P e rcent Tr ans port Cri t eri a • 90< PT < 110 • If per cent tr ans port cr iter i a are no t m e t app l y a correction factor

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 21 of 30Figure 1: T y pes of metals generati on available for accura cy tests.

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 22 of 30Figure 2: Flow chart for using quantitat ive spiking during the accura cy tests.

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 23 of 30Figure 3: Flow chart for using non-quantit ativ e spiking during the accuracy tes t s .

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 24 of 30Figure 4: Flow chart for using stack operati on to generate metals con c entrations.

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 25 of 30Figure 5: S p ecies available for transport tests

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 26 of 30Figure 6: P r ocedure fo r percent transport using PM
.

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 27 of 30Figure 7: P r ocedure fo r percent transpor t determination using an element of opportunity.

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 28 of 30Figure 8: P r ocedure of percent tra n sp ort determination using spiking .

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 29 of 305.6 What references apply to PS-YY? i

. United States. Environm ental Protec tion Agency [EPA]. Te chnology Transfer Network. Em ission Measurem ent Center. Pr om ulgated Methods. Method 1: Sam p l e and Velocity Traverses for Stationary Sources. Washington, DC: EPA; 2004. Available: http://www.epa.gov/ttn/em c/pro m gate/m -01.pdf via the Internet. Access e d May 8, 2005. ii United States. Environm ental Protecti on Agency [EPA}. Technology T r ansfer Network. Em ission Measurem ent Center . Prom ulgated Methods. Method 2: Determ ination of Stack Gas Velocity and Vo lum e tric Flow Rate. W a shington, D.C: EPA; 2004. Available: http://www.epa.gov/ttn/em c/pro m ga te/m -02.pdf via the Internet Accessed May 10, 2005. iii

. United States. Environm ental Protec tion Agency [EPA]. Te chnology Transfer Network. Em ission Measurem ent Center. Prom ulgated Methods. Method 5: Determ ination of Particulate Matter Em issi ons from Stationary Sources. Washington, DC: EPA; 2004. Available: http://w ww.epa.gov/ttn/em c /prom g ate/m

- 05.pdf via the Internet. Accessed May 10, 2005. iv

. United States. Environm ental Protec tion Agency [EPA]. Te chnology Transfer Network. Em ission Measurem ent Center. Prom ulgated Methods. Method 5i: Determ ination of Low Level Particu l ate Ma tter E m issions from Stationary Sources. Washington, DC: EPA; 2004. Available: http://w ww.epa.gov/hwc m act/frhwc5.pdf via the In ternet. Accessed May 10, 2005.

v . United States. Environm ental Protec tion Agency [EPA]. Te chnology Transfer Network. Em ission Measurem ent Center. Prom ulgated Methods. Method 17: Determ ination of Particulate Matter Em issi ons from Stationary Sources. Washington, DC: EPA; 2004. Available: http://w ww.epa.gov/ttn/em c /prom g ate/m

- 17.pdf via the Internet. Accessed May 10, 2005. vi

. United States. Environm ental Protec tion Agency [EPA]. Te chnology Transfer Network. Em ission Measurem ent Center . Prom ulgated Methods. Method 29. Determ ination of Metals Em issions from St ationary Sources. W a shington, DC: EPA; 2004. Available: http://www.epa.go v/ttn/em c /pro m g ate/m

- 29.pdf via th e Internet. Accessed May 18, 2005.

Specifications for XRF Multi-Metals CEMS (PS

- YY ) Page 30 of 30