### Hammond, Rocky From: Moore, Autumn Sent: Thursday, March 31, 2011 10:43 AM To: Hammond, Rocky Subject: FW : Response to Commissioner Nord's question Attachments: XOS HDXRF Paint Screen Shot.pdf; XOS reply to Commissioner Nord Questions - 100ppm limit hearing (2)
. ppt He re' s the resp on se to the question to XOS. From: Dodd, Quin [mailto:QDodd@mintz
.com] 

### Sent: Wednesday, March 02, 2011 5:22 PM To: Moore, Autumn Cc: '5atbir Nayar' 

### Subject: Response to Commissioner Nord's question
... (I'd be happy to discuss before making it "final" jf Nancy would like more explanation/detail/data)
. Thanks! Question from Commissioner Nord relating to February 

### 16 CPSC hearing on pending 

### 100 ppm lead substrate limit for children's products : Question: Can HOXRF be used to test/or lead in both paint and substrate materials? Are the results equally reliable? Answer: Yes and yes . XOS HDXRF instruments precisely quantify lead in both paint and substrates and the results are, generally speaking, equivalent with regard to precision and reliability. (This varies somewhat depending on the substrate involved, but the precision and repeatability of measuring both paint and substrates, regardless of the substrate involved, makes HDXRF, via the F-2853 method, suitable to support testing and certification to both the current and pending CPSC standards for lead in the paint and substrates of children's products). For a painted product, HDXRF measures both the paint as well as the substrate underneath the paint during the same analysis, and the instrument then reports a concentration of lead for each separately. (A "screen shot" showing an exemplar XOS HDXRF instrument reading is attached)
. For an unpainted substrate, HDXRF of course reports a single measurement for the substrate only. It should also be noted that ICP--the only CPSC recognized method to date -- requires that the paint be destructively scrapped off of samples (sometimes several dozen or even hundreds for one measurement), and then the paint and the substrate (if also tested) are dissolved in acid and tested separately. Unlike HDXRF, each of these steps in the ICP process can introduce variability that can affect testing outcomes. HDXRF, by contrast, is a non-destructive, uniform, easily operated and minimally human-interactive testing technology. The precision of HDXRF for quantifying lead in paint on plastic and metal substrates is equivalent to the precision for quantifying lead in (uncoated) metal, which is below current and anticipated future regulatory limits. The precision of HDXRF for quantifying lead in (uncoated) plastic substrate is slightly better than that for paints (coatings) and metals. (When one factors in the inherent variability from sample preparation using ICP then, precision of HDXRF is similar to that of ICP at the regulatory levels).Please find attached two Power Point slides that further illustrate the precision and reliability of HDXRF for both paints and substrate materials
. Thank you for the question. We would be happy to answer any further questions you may have or to provide more detailed data if desired that demonstrate the precision and reliability of HDXRF for both paints and substrates
. Quin Dodd 1 Member Mintz , Levin, Cohn, Ferris, Glovsky and Popeo , P.C
. 701 Pennsylvania Ave., NW, Suite 900 1Washington, DC 20004 Direct: (202) 434-74351 Fax: (202) 434-7400 E- mail : QDodd@mintz
.com Web : www . mintz
.com 

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# - HDXRF - Pb in Paint & Substrate Q ! uantification
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# ASTM F2853-10 Precision- H ' DXRF

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• Precision for quantifying Lead in Paint on plastic and metal substrates is equivalent to the precision for quantifying lead in (uncoated) metal. Precision for quantifying Lead in (uncoated) plastic is slightly better than for coatings and metals. Repeatability (r) at 100ppm Uncoated Uncoated Coated

Plastic/ Metal and Metal Glass Plastic 9ppm 33ppm 27ppm 

## Reproducibility (R) at 100ppm Uncoated Uncoated Coated

Plastic/ Metal and Metal Glass Plastic 23ppm 46ppm 38ppm



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