GPO 

Contract 

Terms

Quality Assurance 

through Attributes Program 

for Microforms

Prospective suppliers should carefully read this 

publication as the applicable articles stated herein 

become an integral part of microform contracts with 

the U.S. Government Publishing Office. A printed 

copy should be retained for reference.

GPO Publication 310.3

(R 02/2017)
Table of Contents

Note: Previously used names of these attributes are in italic in parentheses.

Foreword

Introduction 1

Definitions 1

Determination of Product Quality 1

Determining Acceptability 2

Modifications to Attribute Tolerances 2

Attribute

Aperture Card 2

Character Fidelity (Character Defects) 3

Cut Mark 3

Density 3

Film Color (Film Color, Diazo/Vesiclular) 5

Film Stability (Film Stability, Diazo and Residual Thiosulfate) 5

Flatness (Curl) 6

Format 6

Grid Alignment (Grid Skewness) 6

Grid Placement (Grid Pattern Position) 7

Heading Area Backing (Heading Backing Color, Thickness and Title Coverage) 7

Image Mark (Document Mark) 7

Image Placement (Index Placement, Upside Down Image) 8

Image Squareness (Image Skewness) 8

Information (Loss of Information) 8

Jacket--New Attribute 9

Leader and Trailer Length 9

Length and Width 9

Margins 10

Microfiche Set 11

Microform Usability (Damaged Microform and Extraneous Marks) 11

Packaging 12

Reduction Ratio (Reduction) 12

Resolving Power (Resolving Power of Microform) 12

Safety Film 13

Splicing (Film Splicing) 13

Thickness (Thickness of Microform) 14

Figure 1. — Margins for Microfiche 0

Figure 2. — Margins for Roll Microfilm 0
U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms 1

Introduction

This document defines the quality requirements of microforms 

through the use of standards, permissible tolerances, and 

measurement methods for quality characteristics which 

describe customer needs and expectations.

The document pertains to all microform types procured by 

the U.S. Government Publishing Office. The end use of these 

microforms is to be any or all of the following:

■ Producing additional microforms; producing hard copy 

blowback (paper prints); and viewing on micrographic 

viewing equipment, including automated retrieval systems.

■ Definitions, procedures, and defect classification tables are 

based upon standards published by the American National 

Standards Institute (ANSI), the Association for Information 

and Image Management (AIIM), and Military Specifications 

and Standards (MIL-STD).

When any of these standards are referenced in this document 

they will be listed by their acronym.

Definitions

Acceptable Quality Level. The AQL for each lot is the 

maximum number of defects per 100 units of product that the 

Government will accept at the contract price.

Critical Defect. A defect that renders a microform unusable 

for its intended end use or affects its longevity.

Extended Term Storage. Storage conditions suitable for the 

preservation of recorded information having permanent value.

Generation. One of the successive stages of photographic 

reproduction of an original or a master. The first generation is 

the camera film. Copies made from this first generation are 

second generation and so on.

Information. A specified item, such as but not limited to, a 

character, word, or image in the header or image area.

Inspection Levels. The means used to determine the 

relationship between the lot size and the sample size. 

Inspection levels will be specified in the contract in accordance 

with MIL-STD-105. Unless otherwise specified, General 

Inspection Level I will be used for nondestructive tests and 

Special Inspection Level S-2 will be used for destructive tests.

Inspection Lot. A collection of units of product, for each 

generation, from which a sample is to be drawn and inspected 

to determine conformance to specifications. The lot for 

microform contracts will normally be all of the microforms 

produced, for that generation, under one order.

LE Designation. A rating for the “life expectancy” of recording 

materials and associated retrieval systems. The number 

following the LE symbol is a prediction of the minimum life 

expectancy expressed in years for which information can be 

retrieved without significant loss when stored under specified 

storage conditions. For example, LE-100 indicates that 

information can be retrieved after at least 100 years of storage.

Life Expectancy. Film stability classified according to an “LE 

rating” specifying the length of time that information is predicted 

to be retrievable in a system when stored under specified 

storage conditions.

Major Defect. A deviation from specifications which could 

result in a customer complaint.

Microfiche. Microfiche measure 148mm in length and 105mm 

in width and contain multiple microimages arranged in a grid 

pattern in the image area. A heading appears at the top of the 

microfiche in a space reserved for this purpose and is large 

enough to be read without magnification.

Quality Attribute. A property or characteristic of a microform 

which affects its quality.

Retrievability. The ready access to information as recorded.

Standard Viewing Conditions. The appraisal of color quality 

and color uniformity as defined in Part 1, ANSI PH2.30.

System. Consists of recording materials, hardware, software, 

and documentation necessary to retrieve information.

Units of Product. The items, for example, frames or 

microfiche, inspected in order to determine their classification 

as defective or nondefective.

Determination of Product Quality

Product quality is evaluated for each attribute by comparing its 

measured value with the tolerance specified for that attribute. 

When each microform is inspected, each applicable attribute 

that deviates from specification is classified as either a critical 

defect or a major defect, in accordance with the tolerance table 

for that attribute.

The AQL for microforms produced from good quality source 

documents or from print image tapes, for major defects, is 

6.5 unless otherwise stated in the contract. The AQL may 

be loosened for poor quality source documents or tightened 

based upon customer requirements. There is no AQL for critical 

defects.

Defects will not be assessed for deviations from specifications 

which are caused by the furnished material if the contractor 

notifies the Government prior to production that the furnished 

material is not satisfactory.
2 U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms

The following attributes will not be evaluated when duplicate 

microforms are produced from the furnished microforms: Cut 

Mark; Format; Grid Alignment; Image Layout; Index Placement; 

and Reduction Ratio.

Attributes which are not identified as quality attributes under the 

Microforms Attributes Program will be evaluated in accordance 

with Article 1, Quality, Supplemental Specifications, U.S. 

Government Publishing Office Contract Terms, GPO Pub. 

310.2.

Determining Acceptability

Inspection of all microforms is usually impractical, therefore 

the Government will utilize statistical sampling to determine 

acceptability. For an explanation of acceptance sampling 

reference GPO Technical Report No. 27.

When no instrument is listed in an attribute description, 

randomly selected microfiche and microfiche frames will be 

visually inspected to determine acceptability. The numbers of 

frames to inspect is dependent upon the AQL and the numbers 

of frames present on an individual microfiche. When the 

numbers of frames equal or exceed the reject criteria identified 

in MIL-STD-105, evaluate the microfiche according to the 

attribute’s defect classification table.

Example: An order consists of 151 microfiche. The AQL is 6.5 

and a sample of 13 microfiche were selected from the orderGeneral Inspection Level I, Code Letter E, MIL-STD-105. Of the 

13 selected microfiche, 12 had between 26 and 98 frames and 

the 13th had 11 frames. For each of the 12 microfiche, inspect 

8 randomly selected frames-General Inspection Level I, Code 

Letters C and D, MIL-STD-105. If 2 or more frames for each 

microfiche do not conform to the attribute tolerance, assess 

a defect to each affected microfiche. For the 13th microfiche 

inspect 2 randomly selected frames and if 1 or both frames do 

not conform to the attribute tolerance, assess a defect to that 

microfiche-General Inspection Level I, Code Letter A, MILSTD-105.

An order will be accepted at the contract price when the 

Government determines that either there are no known critical 

defects or the number of major defects for each lot does not 

exceed the specified AQL. MIL-STD-105 will be used to make 

this determination.

The Government may request a 100 percent inspection of an 

order at any time under any conditions. At the discretion of the 

Government, the contractor may be required to inspect every 

microform of each lot for critical defects. The right is reserved 

to inspect every microform submitted by the contractor and to 

reject the order immediately when or if a critical defect is found. 

The right is also reserved to sample every lot of each order 

submitted by the contractor and to reject the order if a sample 

is found to contain one or more critical defects.

The right is reserved to reject any microform found defective 

during inspection whether that microform constitutes part of a 

sample or not, and whether the order as a whole is accepted 

or rejected. With the approval of, and in the manner specified 

by the Government, rejected microforms may be repaired, 

corrected, or replaced, and resubmitted for inspection.

If a critical defect is found, or if the number of major defects for 

an inspection lot exceeds the AQL, the Government will have 

the option of:

■ Rejecting the entire order and having the defective lot(s) 

replaced;

■ Requiring the contractor to inspect the defective lot(s) and 

replace all defective items; or

■ Accepting the rejected order with an equitable reduction in 

the contract price.

Failure to agree to the amount of such reduction of price will 

be a dispute concerning a question of fact within the meaning 

of Article 5, Disputes, Contract Clauses, U.S. Government 

Publishing Office Contract Terms, GPO Pub. 310.2.

All transportation costs related to replacing rejected items or 

the rejected order(s) will be borne by the contractor.

Modifications to Attribute Tolerances

Attribute tolerances may be modified for an individual contract 

provided that there is justification for the change. Such changes 

must be stated in the body of the contract. For example, 

source documents containing halftones, colored paper, 

poor quality microforms, duplicates to be produced from 

nonsilver microforms, or poor quality text will normally require 

modification to the density requirements. Modifications should 

be the result of data obtained from preliminary tests.

Aperture Card

Definitions

A card with one or more rectangular openings specifically 

prepared for the mounting or insertion of microfilm. Provides a 

combination of key punched data and access information with 

microfilm.

Sources ANSI/AIIM MS9, MS10, MS41; ANSI X3.11; MILSTD-804, MIL-C-9877, and MIL-M-38761.

Instruments

■ Ruler with a scale graduated in increments of 0.1 mm or 

0.005 inch.

■ Optical comparator with a scale graduated in increments of 

0.1 mm or 0.005 inch.

■ A gauge with a 0.0025 mm or 0.0001 inch measuring 

capability.
U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms 3

Procedure

■ Reference the methods described in the standards listed 

under Sources.

■ Assess a defect or defects in accordance with the Defect 

Classification Table.

Defect Classification Table for Aperture Card

Defect Classification

Card dimensions not as specified Critical

Card stock not as specified Critical

Information not as specified Critical

Location of information not as specified Critical

Aperture position not as specified Critical

Aperture dimensions not as specified Critical

Color stripe missing Critical

Physical damage to a master aperture card Critical

Corner cut missing or improperly located Critical

Corner cut measurement not as specified Critical

Buildup area thickness greater than 0.01 mm Critical

Microfilm carrier is on wrong side of card Critical

Corners of card not as specified Major

Color of card not as specified Major

Color stripe not as specified Major

Document image orientation not as specified Major

Physical damage to a duplicate aperture card Major

Character Fidelity 

Definitions

Individual alpha and numeric characters, special characters or 

symbols that are capable of being read or deciphered.

Sources None.

Instruments Microform reader.

Procedure

■ Place the microform in the reader and view it at a 

magnification of 100 percent of the effective reduction.

■ Glide the microform through the reader.

■ Stop at a specific frame, all frames, or the required number 

of randomly selected frames as determined by MILSTD-105. Defects may include, but are not limited to: filledin, broken, blurred, dark, weak or faded characters.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Character Fidelity

Defect Classification

Character defects in frames, not present in Major

the supplied material, that equal or exceed 

the reject criteria of MIL-STD-105 or exceed 

the AQL times the number of frames on the 

microform

More than 5 character defects in the heading Major

area that were not present in the supplied 

material

Cut Mark

Definitions

A square optical mark, located on the bottom edge of a 

microfiche at the lower left (reference) corner. Added to film 

at the time of exposure to permit the automatic cutting of 

processed roll film into microfiche. Not applicable to distribution 

copies.

Sources ANSI/AIIM MS5.

Instruments

Optical comparator with a scale graduated in increments of 

0.1 mm or 0.005 inch. Procedure

■ Measure the distance from the reference corner of the 

microfiche to the left edge of the cut mark.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Cut Mark

Defect Classification

Position of cut mark less than 30.3 mm Major

(1.19 inch)

Position of cut mark greater than 30.7 mm Major

(1.21 inch)

Density

Definitions

Density. The light-absorbing or light-reflecting quality 

characterstics of a photographic image usually expressed as 

the logarithm of the opacity.

Background Density. The opacity of the noninformation area 

of a microform.

Minimum Density (Dmin). The lowest transmission or 

projection density obtainable in a processed film, base-plusfog.
4 U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms

Base-Plus-Fog. The transmission density of a film which has 

not been exposed but which has been developed and fixed.

Sources ANSI/AIIM MS1, MS23, and MS43; ANSI PH2.18 

and ANSI PH2.19.

Instruments Transmission densitometer.

Procedure

■ Background Density. Measure three areas of the microform 

that are free of information.

■ Dmin Density (Base-Plus-Fog). Measure three unexposed 

processed areas on the microform.

■ Average the three readings for background density and 

Dmin.

■ Assess a defect in accordance with the Defect Classification 

Table.

NOTE 1. Density of silver-gelatin and diazo microfiche will be 

measured on a densitometer with a 1 mm aperture and a visual 

filter.

NOTE 2. Density of vesicular microfiche will be measured on 

a densitometer using the F/4.5 projection glass with a 1 mm 

aperture and a visual filter.

NOTE 3. All densities must be measured from an area large 

enough to completely fill the aperture of the densitometer.

Defect Classification Table for Density

Negative Silver-Gelatin 

Camera Masters Produced from Source Documents

Defect Classification

Background density less than 0.95 Major

or greater than 1.25

Dmin greater than 0.10 Major

Second Generation, Negative Silver-Gelatin 

Direct-Duplicate Intermediate Microforms 

Produced from First Generation, Negative 

Silver-Gelatin or Supplied Microforms

Defect Classification

Background density less than 1.10 

or greater than 1.70 Major

Dmin less than 0.00 or greater than 0.20 Major

Third Generation, Negative Silver-Gelatin 

Direct-Duplicate Intermediate Microforms 

Produced from Second Generation, Negative 

Silver-Gelatin or Supplied Microforms

Defect Classification

Background density less than 1.15 Major

or greater than 1.55

Dmin less than 0.10 or greater than 0.20 Major

Positive Silver-Gelatin

Second Generation, Positive Silver-Gelatin Print 

Intermediate Microforms Produced from First 

Generation, Negative Silver-Gelatin or Supplied 

Microforms

Defect Classification

Line density less than 1.20 or greater than 1.50 Major

Dmin less than 0.10 or greater than 0.20 Major

Third Generation, Negative Silver-Gelatin Print 

Intermediate Microforms Produced from Second 

Generation, Positive Silver-Gelatin or Supplied 

Microforms

Defect Classification

Line density less than 1.10 or greater than 1.40 Major

Dmin less than 0.10 or greater than 0.20 Major

Diazo

Diazo Duplicate Microforms, Second Generation 

or Higher, Negative (Background)/Positive (Line) 

produced from a silver microform

Defect Classification

Background/line density less than 1.30 Major

Dmin greater than 0.10 maximum Major

Vesicular

Vesicular Duplicate Microforms, Second Generation 

or Higher, Negative (Background)/Positive (Line) 

produced from a silver microform

Defect Classification

Background/line density less than 1.60 Major

Dmin less than 0.10 or greater than 0.20 Major

These density values are for Computer Output 

Microfilm (COM) Negative Silver-Gelatin First 

Generation, Negative Silver-Gelatin Camera 

Masters

Defect Classification

Background density less than 1.50 Major

Dmin greater than 0.20 plus base Major
U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms 5

Second Generation, Negative Silver-Gelatin 

Direct-Duplicate Intermediate Microforms

Defect Classification

Background density less than 1.50 Major

Dmin less than 0.14 or greater than 0.18 Major

Second Generation, Negative Silver-Gelatin Print 

Intermediate Microforms

Defect Classification

Background density less than 1.50 Major

Dmin greater than 0.10 Major

Positive Silver-Gelatin

First Generation, Positive Silver-Gelatin Camera 

Masters

Defect Classification

Dmin greater than 0.10 plus base Major

First Generation, Positive Thermally Processed 

Silver Camera Masters

Defect Classification

Dmin greater than 0.40 plus baseDmin less than 0.10 or greater 

than 0.20 Major

Second Generation, Positive Silver-Gelatin DirectDuplicate Intermediate Microforms

Defect Classification

Dmin less than 0.14 or greater than 0.18 Major

Second Generation, Positive Silver-Gelatin Print 

Intermediate Microforms

Defect Classification

Dmin greater than 0.10 Major

Diazo

Second Generation or Higher, Negative 

(Background)/Positive (Line) produced from a silver 

microform

Defect Classification

Background/line density less than 1.30 Major

Dmin greater than 0.15 plus base Major

Vesicular

Second Generation or Higher, Negative 

(Background)/Positive (Line) produced from a silver 

microform

Defect Classification

Background/line density less than 1.80 Major

Dmin greater than 0.15 plus base Major

Film Color

Definitions

The spectral response resulting from the reflection and 

transmission of light.

Sources None.

Instruments None.

Procedure

■ Visually inspect the microform for its film color at standard 

viewing conditions.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table For Film Color

Defect Classification

Film color not as specified Critical

Film Stability

Definitions

A measure of the ability of photographic film images to resist 

change in density under specified storage conditions.

LE-10 Film. A photographic film that is suitable for the 

preservation of records for a minimum of 10 years when stored 

under medium term storage conditions.

LE-100 Film. A photographic film that is suitable for the 

preservation of records for a minimum of 100 years when 

stored under extended term storage conditions.

Sources 

ANSI/ASC PH 4.8, PH1.43, ANSI IT9.1 and ANSI IT9.5.

Instruments

Reference the standards listed under Sources.

Procedure

■ For Silver-Gelatin reference the methods described in IT9.1 

and for Diazo IT9.5.

■ Assess a defect in accordance with the Defect Classification 

Table.
6 U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms

Defect Classification Table for Film Stability

Defect Classification

Noncompliance for specified LE rating Critical

NOTE 1. This attribute applies only to LE-10 and LE-100 

storage copies-not user distribution copies.

NOTE 2. Reference ANSI PH1.43 storage requirements for 

medium term (LE-10 film) and extended term (LE-100 or greater 

film).

NOTE 3. Medium term film is now LE-10 film and extended 

term film is now LE-100 film.

NOTE 4. Archival and long term storage are now defined as 

extended term storage.

NOTE 5. Thiosulfate ion concentrations must not be greater 

than 0.014 grams per square meter.

Flatness

Definitions

Microfiche or microfilm that maintains a continuous horizontal 

surface.

Sources ANSI/ASC PH1.29.

Instruments 

■ Comparator with a scale graduated in increments of 0.1 mm 

or 0.005 inch.

■ Hygrometer or comparable humidity gauge.

■ Celsius thermometer with 1 degree Celsius divisions 

capable of reading temperatures in the 23 degree Celsius 

range.

Procedure

■ Place a randomly selected microfiche or a 148.00 mm (5.83 

inch) length of microfilm concave side upward on a flat 

surface for a minimum of 6 hours in an environment of 23 

degrees Celsius (plus or minus 2 degrees) and 50 percent 

relative humidity (plus or minus 5 percent).

■ Measure the curl at its greatest point above the flat surface.

■ Measure microfilm curl, only in the transverse direction, at its 

greatest point above the flat surface.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Flatness

Defect Classification

Microfiche curl greater than 6.35 mm Major

(0.25 inch)

Microfilm curl for 16 mm greater than Major

1.00 mm (0.04 inch)r

Microfilm curl for 35 mm greater than Major

2.10 mm (0.08 inch)

Format

Definitions

The number of rows of images, columns or apertures of a 

microform.

Sources ANSI/AIIM MS5, MS14, and ANSI Z39.32.

Instruments None.

Procedure

■ Visually count the number of rows, columns or apertures.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Format

Defect Classification

Format not as specified Critical

Grid Alignment

Definitions

The placement of a grid in relation to the edges of a microfiche.

Sources ANSI/AIIM MS5.

Instruments

Optical comparator with a scale graduated in increments of 0.1 

mm or 0.005 inch.

Procedure

■ Measure the distance between the left edge of the 

microfiche and the left edges of the upper left and lower left 

frames of the microfiche.

■ Measure the distance between the bottom edge of the 

microfiche and the bottom edges of the lower left and lower 

right frames of the microfiche.

■ Compute the difference between the two measurements 

made from the left edge of the microfiche and the difference 

between the two measurements made from the bottom 

edge of the microfiche. Whichever number is greater is the 

grid skewness.

■ Assess a defect in accordance with the Defect Classification 

Table.
U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms 7

Defect Classification Table for Grid Alignment

Defect Classification

Grid skewness greater than 1.0 mm Major

Grid skewness greater than 1.0 mm deviation Major

from supplied microfiche

Grid Placement

Definitions

The placement of frames on a microform in conformance with 

AIIM or user defined formats.

Sources ANSI/AIIM MS5.

Instruments

■ Approved AIIM 98-frame grid gauge, X302 (1:24 reduction).

■ Approved AIIM 270-frame grid gauge, X108 (1:48 

reduction).

■ User defined grids.

Procedure

■ Place the microfiche on top of the appropriate grid gauge, 

aligning the lower left reference corners.

■ Observe if any microimages are outside the grid gauge 

boundary lines.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Grid Alignment

Defect Classification

Any microimages outside the grid lines Major

Heading Area Backing

Definitions

A colored stripe applied to the heading area and the degree to 

which it covers the heading area. The difference between the 

thickness of the heading area and the grid area.

Sources ANSI/AIIM MS5.

Instruments

A gauge with a 0.0025 mm or 0.0001 inch measuring 

capability.

Procedure

■ Inspect to determine if there is any information in the 

heading area that is not completely covered by the heading 

backing.

■ Examine the top row of the grid area to see if any part of the 

heading backing infringes on the grid area.

■ Visually inspect the heading area for color of stripe.

■ Inspect for thickness of backing. 

■ Use the gauge to measure at least two places of the 

heading area and of the grid area.

■ Compute the average of these measurements.

■ Subtract the average thickness of the grid area from the 

average thickness of the heading area. The result is the 

heading area backing thickness.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Heading Area Backing

Defect Classification

Color not as specified Major

Information in the heading area not completely 

covered by the heading backing Major

Heading area backing infringes on grid area 

with no loss of information Major

Heading area backing thickness greater than 

0.01 mm (0.0004 inch) Major

Heading area backing infringes on grid area 

with loss of information Critical

NOTE 1. The original should not have a backing.

NOTE 2. Silvers may occasionally have a 1mm stripe at the top 

edge to facilitate filing when specified in a contract.

Image Mark

Definitions

An optical mark, usually rectangular, within the recording area 

and located in the image mark channel, below and/or above 

the image area on a roll of microfilm. Used in image mark 

retrieval systems for automatically counting or locating image 

frames.

NOTE. Formerly known as a document mark or blip mark.

Sources ANSI/AIIM MS8.

Instruments Microform reader with an automatic retrieval 

function.

Procedure

■ Load roll of microfilm into the reader.

■ Execute the automatic retrieval function for at least three 

randomly selected film frames.

■ Assess a defect in accordance with the Defect Classification 

Table.
8 U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms

Defect Classification Table for Image Mark

Defect Classification

Failure to automatically retrieve any film frame Critical

Image Placement

Definitions

Placement of images on a microform.

Sources ANSI/AIIM MS-5.

Instruments Microform reader.

Procedure

■ Place the microform in the reader and view it at a 

magnification of 100 percent of the effective reduction.

■ Glide the microform through the reader.

■ Stop at a specific frame, all frames, or the required number 

of randomly selected frames as determined by MILSTD-105.

■ Compare the selected frames against the original source 

document for, but not limited to, pagination (horizontal or 

vertical), index and target placement, right reading, upside 

down images, and large document handling.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Image Placement

Defect Classification

Any nonspecified image placement Critical

Image Squareness

Definitions

Image squareness is either parallel or perpendicular to the top 

edge or bottom edge of the microform.

Sources ANSI/AIIM MS5.

Instruments

■ Approved AIIM 98-frame grid gauge, X302 (1:24 reduction).

■ Approved AIIM 270-frame grid gauge, X108 (1:48 

reduction).

■ Optical comparator with a protractor reticule with 1 degree 

divisions.

Procedure

■ Place the appropriate grid gauge over the microfiche with 

either the left or bottom edge of the microfiche being aligned 

with the appropriate line on the gauge.

■ Glide the microfiche along either the horizontal or vertical 

axis of the gauge so that the corner of the frame selected is 

aligned with a corner on the grid gauge.

■ Stop at a specific frame, all frames, or the required number 

of randomly selected frames as determined by MILSTD-105.

■ Measure the skew angle formed by the grid boundary line 

and the edge of the frame.

■ Measure the angle of skew formed between the baseline of 

the protractor (which is parallel to the edge of the film) and 

the edge of the frame.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Image Squareness

Defect Classification

The number of frames that have a skew angle Major

greater than 10 degrees that equal or exceed 

the reject criteria of MIL-STD-105 or exceed 

the AQL times the number of frames on the 

microfiche

Information

Definitions

A specified item such as, but not limited to, characters, special 

characters, symbols, words, or images in the header or image 

areas.

Sources None.

Instruments Microform reader.

Procedure

■ Place the microform in the reader and view it at a 

magnification of 100 percent of the effective reduction.

■ Glide the microform through the reader.

■ Stop at a specific frame, all frames, or the required number 

of frames as determined by MIL-STD-105.

■ Compare the selected frames against the furnished material.

■ Assess a defect in accordance with the Defect Classification 

Table.
U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms 9

Defect Classification Table for Information

Defect Classification

Wrong or nonspecified information Critical

Loss of information Critical

NOTE 1. Information may include, but is not limited to: 

specified items, characters, special characters, symbols, 

words, or images in the information areas.

Jacket

Definitions

A flat transparent plastic carrier with various sizes of single or 

multiple film channels made to hold single or multiple microfilm 

images. The channels are designed to permit insertion of 

processed photographic strips of cut roll microfilm.

Sources AIIM TR-11 and ANSI/AIIM MS11.

Instruments

■ Ruler with a scale graduated in increments of 0.1 mm or 

0.005 inch.

■ Optical comparator with a scale graduated in increments of 

0.1 mm or 0.005 inch.

Procedure

■ Visually inspect the jacket for, but not limited to: number of 

channels, insertion openings, locating holes, stripe color, 

notches, and physical damage.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Jacket

Defect Classification

Jacket size not as specified Critical

Format not as specified Critical

Number of channels not as specified Critical

Channel width not as specified Critical

Insertion openings not as specified Critical

Locating holes not as specified Critical

Parallelism not as specified Critical

Squareness not as specified Critical

Identification cut not as specified Critical

Notch or notches not as specified Critical

Color stripe missing Critical

Any physical damage to a master jacket Critical

Any physical damage to a duplicate jacket Major

Color stripe not as specified Major

Leader and Trailer Length

Definitions

Leader. A length of film at the beginning of a microfilm roll 

used for protection and for threading into equipment such as 

cameras, processors, and readers.

Trailer. A length of film following the last frame on a roll of 

microfilm.

Sources ANSI/AIIM MS14.

Instruments

Ruler with a scale graduated in increments of 0.1 mm or 

0.005 inch.

Procedure

■ Measure the leader and trailer portions of the microfilm.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Leader and Trailer 

Length

Defect Classification

Deviates from specified leader or trailer length 

by minus 20 percent Major

NOTE 1. Unless otherwise specified the minimum leader/trailer 

length for 35 mm film is 500 mm (19.7 inch) and for 16 mm film 

it is 700 mm (27.6 inch).

Length and Width

Definitions

Length. The direction of the film parallel to its forward 

movement in the film manufacturing equipment.

Width. The direction of the film at right angles to the forward 

movement in the film manufacturing equipment.

Sources ANSI PH1.51 and ANSI/AIIM MS14.

Instruments

Optical comparator with a scale graduated in increments of 0.1 

mm or 0.005 inch.

Procedure

■ Measure the length of the microfiche from the top and 

bottom corners and the width from the left and right 

corners at least 1 day after processing. Measure the width 

dimension only for roll microfilm.

■ Use the measurement that gives the greatest difference in 

assessing a defect classification.
10 U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms

Microfiche Length

Defect Classification

Less than 147.25 mm (5.797 inch) Major

Greater than 148.00 mm (5.827 inch) Major

Microfiche Width

Defect Classification

Less than 104.25 mm (4.104 inch) Critical

Greater than 105.00 mm (4.134 inch) Critical

Roll Microfilm, 16 mm Width

Defect Classification

Less than 15.92 mm (0.627 inch) Critical

Greater than 15.98 mm (0.629 inch) Critical

Roll Microfilm, 35 mm Width

Defect Classification

Less than 34.95 mm (1.376 inch) Critical

Greater than 35.00 mm (1.378 inch) Critical

Margins

Definitions

Microfiche. The space between the left side and bottom and 

the equivalent edges of the grid area. See Figure 1.

Roll Microfilm. The area between the edge of the information 

area and the edge of the roll microfilm. See Figure 2.

Sources ANSI/AIIM MS5, MS8, and MS14.

Instruments

■ Approved AIIM 98-frame grid gauge, X302 (1:24 reduction).

■ Approved AIIM 270-frame grid gauge, X108 (1:48 reduction).

■ Optical comparator with a scale graduated in increments of 

0.1 mm or 0.005 inch.

Procedure

Microfiche

■ Place the microfiche on top of the appropriate grid gauge, 

aligning the lower left reference corners.

■ Left Margin. Use the comparator to measure the distance 

from the lower left corner of the grid area to the left edge of 

the microfiche and the distance from the upper left corner of 

the grid area to the left edge of the microfiche.

■ Bottom Margin. Measure the distance from the lower left 

corner of the grid area to the bottom edge of the microfiche 

and the distance from the lower right corner of the grid area 

to the bottom edge of the microfiche.

■ Compare each of the four measurements with the values 

given in the Defect Classification Table.

■ Use the value with the largest variance to assess the defect 

classification.

Roll Microfilm

■ Measure the A, B, and C dimensions as shown in Figure 2 

for 16 mm and 35 mm roll microfilm.

■ Assess a defect in accordance with the Defect Classification 

Table.

Microfiche Produced From Furnished Microfiche

■ Place the duplicate microfiche on top of the furnished 

microfiche, aligning their lower left reference corners.

■ Measure any up and down or left and right image 

deviations.

■ Use the greater deviation in assessing the defect 

classification. Do not measure the bottom margin when the 

bottom row of the microfiche does not contain microimages.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Margins

Microfiche

Defect Classification

Less than 3.5 mm (0.138 inch) Major

Greater than 4.5 mm (0.177 inch) Major

Deviations greater than 0.5 mm from the Major

margins of furnished microfiche

Roll Microfilm, 16 mm, Unperforated

Defect Classification

“A” dimension less than 0.510 mm (0.020 inch) Major

“B” dimension less than 0.510 mm (0.020 inch Major

“C” dimension greater than 14.900 mm Major

(0.587 inch)

Roll Microfilm, 16 mm, Perforated-One Edge*

* For film perforated on one edge, dimension “A” applies to the 

perforated edge.

Defect Classification

“A” dimension less than 2.790 mm (0.110 inch) Major

“B” dimension less than 0.510 mm (0.020 inch) Major

“C” dimension greater than 12.620 mm Major

(0.497 inch)
U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms 11

Roll Microfilm, 16 mm, Perforated-Two Edges

Defect Classification

“A” dimension less than 2.790 mm (0.110 inch) Major

“B” dimension less than 2.790 mm (0.110 inch) Major

“C” dimension greater than 10.340 mm Major

(0.407 inch)

Roll Microfilm, 35 mm, Unperforated

Defect Classification

“A” dimension less than 0.970 mm (0.038 inch) Major

“B” dimension less than 0.970 mm (0.038 inch) Major

“C” dimension greater than 33.020 mm Major

(1.300 inch)

Roll Microfilm, 35 mm, Perforated-Two Edges

Defect Classification

“A” dimension less than 5.480 mm (0.216 inch) Major

“B” dimension less than 5.480 mm (0.216 inch<)Major

“C” dimension greater than 24.000 mm Major

(0.944 inch)

Microfiche Set

Definition

A specific collection of microfiche satisfying contractual 

requirements.

Sources None.

Instruments None.

Procedure

■ Visually inspect the set for completeness and proper 

collation.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Microfiche Set

Defect Classification

Improper collation Major

Set contains one or more additional or Major

duplicate microfiche

Set missing one or more microfiche Critical

Microform Usability

Definitions

A microform capable of being used for its intended purpose.

Sources ANSI/AIIM MS23 and MS43.

Instruments Microform reader.

Procedure

■ Microforms Produced From Source Material. 

■ Place the microform in the reader and view it at a 

magnification of 100 percent of the effective reduction.

■ Glide the microform through the reader.

■ Stop at a specific frame, all frames, or the required 

number of randomly selected frames as determined by 

MIL-STD-105.

■ Visually inspect for any physical or photographic defects. 

Defects are not limited to those included in MS23 or 

MS43, for example, staples or staple holes.

■ Microforms Produced From Supplied Microforms. 

■ Inspect for any physical or photographic defects that 

were not present in the supplied microform.

■ For Class A Film. 

■ Place the microform in the reader and view it at a 

magnification of 100 percent of the effective reduction.

■ Stop at a specific frame, all frames, or the required 

number of randomly selected frames as determined by 

MIL-STD-105.

■ Produce a blowback of each selected frame or frames.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Microform Usability

Defect Classification

Any photographic defect to a nonsilver Major

microform in the information areas

Any photographic defect to a silver master Critical

microform

Any physical damage to a microform Critical

Microform or blowback unreadable Critical

NOTE 1. If physical or photographic defects on a microform 

obliterate information, GPO will refer to the Quality Attribute for 

Information.
12 U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms

Packaging

Definitions

The materials and methods used for protection and 

identification of microforms during handling, filing, display, 

shipment and storage. The materials must contain no adhesive 

or chemical that might produce a degenerative effect upon the 

film or enclosure-envelopes, cartridges, packages, etc. They 

must also be free from particulate matter and have a pH value 

of no less than 7.0.

Sources ANSI IT9.2

Instruments None.

Procedure

■ Inspect all packing materials and procedures to insure 

compliance with contractual requirements.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Packaging

Defect Classification

Noncompliance with contractual requirements Critical

Reduction Ratio

Definitions

The quotient of a linear dimension of an object and the 

corresponding linear dimension of the image of the same object 

expressed, for example, as 1:24 or 1:48.

Sources ANSI/AIIM MS23.

Instruments

Optical comparator with a scale graduated in increments of 0.1 

mm or 0.005 inch.

Procedure

■ Measure the length of the scale on the film image of the test 

target.

■ Divide this measurement into the confirmed length of the 

original scale. The value obtained is the actual reduction of 

the microimage.

■ If there is no scale present, obtain the reduction by 

measuring the image of an object whose full size 

dimensions are known. For example, if it is known that 

the width of a page which was microfilmed is 8.5 inch and 

the width of the microimage of the page on the microfiche 

is 0.355 inch then the reduction may be obtained by 

dividing 0.355 inch into 8.5 inch giving a value of 24, thus a 

reduction of 1:24.

■ Divide an equivalent full-size page dimension by its 

corresponding frame dimension to determine the effective 

reduction for computer output microfilm.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Reduction Ratio

Defect Classification

For 1:24. Values less than 1:24 Major

or greater than 1:25

For 1:42. Values less than 1:42 Major

or greater than 1:44

For 1:48. Values less than 1:48 Major

or greater than 1:50

For other reduction ratios less than the reduction ratio specified 

or greater than 1.04 times the specified reduction ratioMajor

NOTE 1. If the contract permits, small source documents could 

be filmed at a reduction less than specified to fill the frame.

Resolving Power 

Definitions

Numeric expression of the ability of an optical or photographic 

system to distinguish or separate two entities spaced closely 

together. In micrographics, it is the product of the number of 

the pattern resolved in the ISO Test Chart No. 2 multiplied by 

the reduction and is expressed in line pairs per millimeter.

Test Chart. Consists of an arrangement of test patterns 

of increasing spatial frequency expressed in line pairs per 

millimeter containing patterns numbered from 1.0 to 18.

Test Pattern. Made up of two sets of five parallel line 

rectangular groups that are perpendicular to each other.

Resolved Pattern. A pattern is resolved when the two groups 

of lines constituting this pattern can be visually distinguished in 

both directions.

Sources

ANSI/AIIM MS1, MS17, MS23 and MS28; and ANSI/ISO 3334.

Instruments

Microscope with a magnification between 0.5 and 1.0 times 

the anticipated resolving power of the system expressed in line 

pairs per millimeter.
U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms 13

Procedure

■ View the test chart at the appropriate magnification.

■ Determine from the test chart the pattern number 

associated with the smallest test pattern that can be 

resolved.

■ Use the test chart with the lowest pattern number to 

determine the defect classification if a frame contains more 

than one test chart.

■ Assess a defect in accordance with the Defect Classification 

Table.

Example. — A contract specified the 6.3 pattern to be 

resolvable for the first generation microform. The test target 

is composed of five ISO Test Charts No. 2. The center test 

chart resolved the 5.0 pattern while the other four test charts 

resolved the 6.3 pattern. The 5.0 pattern is used in determining 

the defect classification.

Defect Classification Table for Reduction Ratio

Defect Classification

A deviation of more than one test pattern below Major

that of the specified pattern to be resolved

For one generation from the supplied master Major

microform a deviation of more than one test 

pattern below the master’s resolved pattern

For two generations from the supplied master Major

microform a deviation of more than two test 

patterns below the master’s resolved pattern

For three generations from the supplied master Major

microform a deviation of more than three test 

patterns below the master’s resolved pattern Major

NOTE 1. The form slide, as described in MS1 and MS28, 

does not give any indication of the resolution of the character 

generator for alphanumeric COM. However, it does help in 

obtaining information concerning overall photographic system 

quality such as the optical system of the COM recorder, 

duplicator, or processor.

NOTE 2. Graphic COM is addressed in ANSI/AIIM MS39.

Safety Film

Definitions

Film that meets flammability specifications defined by ANSI 

standards.

Sources ANSI/ASC PH1.25 and ANSI IT9.1.

Instruments

Reference the standards listed under Sources.

Procedure

■ Reference the methods described in the standards listed 

under Sources.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Safety Film

Defect Classification

Noncompliance with referenced standards Critical

Splicing

Definitions

The joining of two ends of film into a continuous piece.

Sources ANSI/AIIM MS18.

Instruments

■ Optical comparator with a scale graduated in increments of 

0.1 mm or 0.005 inch.

■ Optical comparator with a protractor reticule with 1 degree 

divisions.

■ A thickness gauge with a 0.0025 mm (0.0001 inch) 

measuring capability.

Procedure

■ Measure the width of the gap and the alignment of the 

edge.

■ Use the comparator to determine if there is any angular 

misalignment between the two joined ends.

■ Use the thickness gauge to obtain at least three readings 

along the splice and preceding the splice.

■ Compute the average thickness value and subtract the 

appropriate number of film thicknesses from this average 

and record this difference as the splice thickness build-up.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Splicing

Defect Classification

Number of splices greater than specified Major

Gap width greater than 1.0 mm (0.040 inch) Major

Edge alignment greater than 0.05 mm Major

(0.002 inch)

Angular misalignment greater than 1 degree Major

Splice thickness buildup greater than 0.15 mm Major

(0.006 inch)
14 U.S. GOVERNMENT PUBLISHING OFFICE | Quality Attributes for Microforms

NOTE 1. Ultrasonic splicing is recommended for polyester 

base film with an LE-100 rating or greater.

Thickness

Definitions

The distance between the planes formed by the front and back 

surfaces of a microform.

Sources ANSI/AIIM MS5 and ANSI PH1.51.

Instruments

A thickness gauge with a 0.0025 mm (0.0001 inch) measuring 

capability.

Procedure

■ Use the gauge to obtain at least four readings at different 

places on the microform.

■ Compute the average value and record this as the 

thickness.

■ Assess a defect in accordance with the Defect Classification 

Table.

Defect Classification Table for Thickness

Defect Classification

Thickness less than specified or 0.025 mm 

(0.001 inch) greater than specified Major

NOTE 1. The thickness of all microfiche shall be 0.10 mm to 

0.23 mm (0.004 inch to 0.009 inch) for polyester base films.

Figure 1. — Margins for Microfiche Figure 2. — Margins for Roll Microfilm

Note: The Corner Cut and Notch represent even generations.

All dimensions are given in millimeters.

A Margin

B Margin

C Information Area

Heading Area

148 +0.00, -0.75

105

+0.00,

-0.75

Notch

4.0

1.0

Corner Cut

Reference Cut

32.0 +/-0.2 Cut Mark (3.0 x 3.0 nominal)

Grid Area

A Margin

B Margin

C Information Area

Heading Area

148 +0.00, -0.75

105

+0.00,

-0.75

Notch

4.0

1.0

Corner Cut

Reference Cut

32.0 +/-0.2 Cut Mark (3.0 x 3.0 nominal)

Grid Area