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NIST Technical Note 1295

Initial Graphics Exchange Specification

Hybrid Microcircuit Application Protocol

Curtis Parks, Roger McCollough, Charles Azu,

Larry Savage, Patrick Toomey, and Thomas Makoski

QC—

100

.U5753

//1 295

1995
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fcJO

NIST Technical Note 1295

Initial Graphics Exchange Specification

Hybrid Microcircuit Application Protocol

Curtis Parks

Roger McCollough * Charles Azu * Larry Savage **

Patrick Toomey ** Thomas Makoski ***

Automated Electronics Manufacturing Programs

National Institute of Standards and Technology

Gaithersburg, MD 20899

* Naval Command, Control & Ocean

Surveillance Center, Research

Development Test & Evaluation Division

** Raytheon Company

*** International TechneGroup, Inc.

January 1993

.v^^'^^^^^o.

c \

U.S. Department of Commerce

Ronald H. Brown, Secretary

National Institute of Standards and Technology

John W. Lyons, Director
National Institute of Standards U.S. Government Printing Office For sale by the Superintendent

and Technology Washington: 1993 of Documents

Technical Note 1295 U.S. Government Printing Office

Natl. Inst. Stand. Technol. Washington, DC 20402

Tech. Note 1295

193 pages (Jan. 1993)

CODEN: NTNOEF
9> "Information is neither Matter nor Energy

Norbert Wiener

Initial Graphics Exchange Specification (IGES)

HYBRID MICROCIRCUIT APPLICATION PROTOCOL

(AP)

Version 1.0: This document is the initial release of a complete application

protocolfor hybrid microcircuit technology. Included are refinements to prior

preliminary versions, the missing Application Interpreted Model, comments from

the hybrid design, manufacturing, and IGES communities. This version reflects

thefinal work ofthe Navy Hybrid MicroCIM Team, together with the many people

who have contributed technical material, participated in reviews, and comments.

ABSTRACT

An application protocol is an information systems engineering view of a specific product. The

view represents an agreement on the generic activities needed to design and fabricate the product,

the agreement on the information needed to support those activities, and the specific constructs of

a product data standard for use in transfering some or all of the information required.

This applications protocol describes the data for hybrid microcircuits products in terms of a product description standard called the Initial Graphics Exchange Specification (IGES). More

specifically, the Hybrid Microcircuit IGES Application Protocol (AP) specifies the mechanisms

for defining and exchanging computer-models and their associated data for hybrid microcircuits

in IGES format. The AP defines the appropriateness of the data items for describing the geometry

of the various parts of a hybrid microcircuit (shape and location), the connectivity, and the

processing and material characteristics.

ui
PREFACE

The Electricity Division of the Electronics and Electrical Engineering Laboratory and the

Automated Manufacturing Research Facihty of the Center for Manufacturing Engineering at the

National Institute of Standards and Technology (NIST) have completed a program entitled "A

Data Format Specification for Hybrid Microcircuit Assemblies." This project was sponsored by

the Office of the Assistant Secretary of the Navy for Manufacturing Technology and was managed

by the Naval Command, Control & Ocean Surveillance Center, Research Development Test &

Evaluation Division (NCCOSC, RDT&E), San Diego, Contract No. N0001991IPAKC1R, MOD/

AMEND No. OA-001. The project objective was the development of a specification for a neutral

format to promote the exchange of design and manufacturing data for hybrid microcircuit

products.

The ultimate scope of this AP will include the various aspects of hybrid microcircuits including

the specification control drawings, circuitry and parts layout, and information concerning their

fabrication. The specified hybrid microcircuit model is sufficiently detailed to support the design

release, fabrication, and final assembly of a hybrid system.

IGES is designed to support a broad range of applications and information, and it is recognized

that few implementations will support all of the specification. An application protocol defines a

logical subschema of the IGES specification, the usage of the subschema, and the necessary

benchmarks for testing implementations. The application protocol for hybrid devices builds on

the previous work of the Electrical AppUcations Committee of the IGES/PDES Organization.

Such documents are seen as important for the development of STEP (Standard for the Exchange

of Product Model Data) application protocols.

The title denotes the general class of the product, including hybrid microcircuit assemblies

(HMA) and multichip modules (MCM). The data structures defined in this document are proposed for testing by representatives of the hybrid microcircuits industry, members of the

Navy's MicroCIM Program, and the IGES/PDES Electrical Applications Committee in order to meet a broad user community of hybrid microcircuits applications. This AP will be tested and

refined in developing a revision to MIL-D-28000A Class 3. This revision will define a new MIDD-28000 class for the ti"ansfer of hybrid microcircuit data by use of future versions of IGES.

The members of the program team also note that other data formats may be employed. They

would encourage continuation of work to achieve an industry consensus of the activity and

reference model sections (Appendix A and 3.2 respectively) and additional interpretation (sec. 5)

models as needed for each additional format supported. Comments on this document should be

sent to:

Curtis Parks

Automated Electronics Manufacturing Programs

National Institute of Standards and Technology

Building 220 Room B-344

Gaithersburg, MD 20899

(301) 975-3517 (Parks)

E-Mail: parks@eeel.nist.gov

^ MlL-D-28000 is the Department of Defense specification that identifies the requirements to be met when

prcxluct definition data is delivered in IGES format.

IV
The following computer system developers have participated in the development of this AP, and

may be contacted regarding translator preparation information:

Intergraph-Dazix Scicards

One Madison Industrial Park 7796 Victor Mendon Road

Huntsville, AL 35894 Fishers, NY 14453

(205)730-2000 (716)924-9303

Anthony Prince Diane Elmer

Mentor Graphics Cadence Design Systems, Inc.

1001 Ridder Park Drive Two Omni Way

San Jose, CA 95131 Chelmsford, MA 01824

(408)451-5639 (508)256-2300

Dave Kehmeier Randy Lawson

Prime-ComputerVision

100 Crosby Drive

Bedford, MA 01730

(617)275-1800

Bernard Gilbert

Future Directions

The Application Activity Model (Appendix A) and Application's Information Model (sec. 4.2)

contain sufficient detail to support design release, fabrication, and final assembly of hybrid

system. The IGES models (sec. 5) in this document, however, are not meant to fully support

hybrid microcircuit product testing, analysis, and manufacturing. A full life-cycle data

standard—possibly based on the Standard for the Exchange of Product Model Data (STEP)—will

be necessary to support all phases of hybrid microcircuit processing.

This document does not complete the fabrication definition in terms of the sequence of processing

steps and the parameters used in those steps. These steps and parameters are expected to be

published by NIST in a separate document. Review and comments on this related document are welcome as well. A copy of the draft of the hybrid processing steps and parameters may be

obtained from the address given at the end of the Preface section.

The scope of this AP AIM is currently limited to layered electronic product (LEP) information

contained in electronic computer-aided design (ECAD) systems. These systems are in widespread use. Their ability to translate data between dissimilar systems is a high priority in the user community. IGES serves as the implementation for this information because most ECAD suppliers are familiar with the specification and support it in their software packages.

A broadened scope for this AP that includes manufacturing, test, simulation, behavior, and documentation is desired by users and manufacturers of hybrids. Much of this information is outside

the scope of most ECAD systems and the IGES specification.

About the Document

The style, format, and much of the material for this application protocol was taken from the "3D
Piping IGES Application Protocol." That AP specifies the mechanisms for defining and

exchanging 3D piping system models in IGES format. The "3D Piping IGES Application

Protocol" was the first IGES AP to be delivered to industry and led to the development of STEP

(Standard for the Exchange of Product Model Data) application protocols. The authors of this

document are indebted to Mark Palmer for his work and the guidance that it provides. It is the

authors' belief that if the CAD/CAM industry is to use application protocols consistently, we need

consistent application protocols.

Preparation of this document is a tribute to the ability to move text and graphics between

applications and computer systems.^ The text was originated in WordPerfectTM DOSTM and

filtered into FrameMakerTM 2.1 on a SunTM workstation for the original formatting and some of

the graphics. The AAM model was developed in Design/IDEFTM , and glossary in HyperCard; both on the MacintoshTM . The ARM was drawn in MacDraw IITM . The AIM was developed at International TechneGroup Inc. (ITI) where the text was written in WordTM for DOS and the

graphics drawn in AutoCADTM . The graphics were transmitted to Raytheon in IGES format where

they were edited and translated into FrameMakerTM MIF format. Final document assembly was

done in FrameMakerTM 3.0/Mac and LASER-printed from Frame's PostScriptTM output

ACKNOWLEDGMENTS

The authors thank the following individuals for contributions to the development of this

document:

Thomas Leedy—the author of the first work toward this document—and Robert Pabn, NIST; Mike Bare and David Weins,

Intergraph, Inc.; John Buckley, Raytheon, Inc.; Kim Cannon, Kulicke and Soffa Industries, Inc.; Terry Sampite, NCCOSC; Dave

Mattel, ITI, Inc.; Larry O'Connell (Chairman of the Electrical AppUcatlons Committee, IGES/PDES Organization), Sandla

Laboratories; Robert Unger, Computer Sciences Corporation; Charhe Jordan, Dean Marshall, and Don Slutz, CTS Inc.; and many others to be included in future revisions ....

^ Palmer, M. E. and Reed, K. A., "3D Piping IGES Application Protocol, Version 1.0" NISTIR 4420, Available from the National Technical Information Service (NTIS), Springfield, VA 22161, October 1990, (257

pages).

^' WordPerfect and DOS are trademarked by Microsoft Corp.; Framemaker is trademarked by Frame Technology Corp.; Sun is trademarked by Sun Microsystems, Inc.; Design/IDEF is trademarked by Meta Soft- ware Corp.; HyperCard and Macintosh are trademarked by Apple Computer, Inc.; AutoCAD is trademarked

by Autodesk, Inc.; and PostScript is trademarked by Adobe Systems, Inc. Trademarked products were mentioned in this document as examples of the range of possible products and are not necessarily endorsed by

NIST.

VI
Table of Contents

Abstract iii

Preface iv

Future Directions v

About the Document v

Acknowledgements vi

1. INTRODUCTION 1

1.1. Purpose 1

1.2. Background 1

1 .2. 1

.

Hybrid Complexity 2

1 .2.2. Consistent Information for Concurrent Engineering 2

1.3. APPLICATION PROTOCOL CONTENTS 3

2. NORMATIVE REFERENCES 3

3. DEFESflTIONS 5

3.1. IGES Application Protocol Definitions 5

3.2. Hybrid Application Definitions 7

VII
Contents

4. INFORMATION REQUIREMENTS AND APPLICATION REFERENCE MODEL

23

4. 1Units of Functionality (UoF) 23

4. 1 . 1

Unit of Functionality Definitions 24

4.1 .2. UoF and ARM Correspondence 24

4.2. Application Reference Model 25

4.2.1Descriptions of the ARM Data Constructs 25

4.2.1.1. ARM Methods and Language 25

4.2.2. Data Construct Definitions 27

4.2.2.2. Data Construct Assertions 27

4.2.3. ARM Diagrams 28

5. IGES APPLICATION INTERPRETED MODEL 35

5.1. ARM to AIM Mapping 36

5.2. IGES Structure and Syntax of the Application Interpreted Model 36

5.2.1IGES File Structure 36

5.2.2. Global Values and Entities List 37

5.2.3. Basic Syntax used in the AIM 39

5.2.3.1. Object Definition Block 39

5.2.3.2. Object Instance Block 40

5.2.3.3. Object Value Block 41

5.2.3.4. Object Reference Mechanism 42

5.3. AIM Object Models 43

5.3.1Interface Object Models 43

5.3.1.1. LEP Part Library IGES File 43

5.3.1 .2. LEP Physical Layout IGES File 44

5.3.1 .3. LEP Technical Illustration IGES File 45

5.3.2. LEP-Specific Object Models 46

5.3.2.1. Alternate Component Associativity 46

5.3.2.2. Component Placement Associativity 47

5.3.2.3. Part Placement Boundary 48

5.3.2.4. Component Placement Keepin 49

5.3.2.5. Component Placement Keepout 50

5.3.2.6. Part Thermal Outline 51

5.3.2.7. Crossover 52

5.3.2.8. Decoupling Capacitor Associativity 53

5.3.2.9. Drawing Definition 54

5.3.2.10. Drawing Instance 55

5.3.2.11. Electronic Component Definition 56

5.3.2.12. Electronic Function Definition 57

5.3.2.13. Fiducial Associativity 58

5.3.2.14. Fiducial Definition 59

5.3.2.15. Fiducial Instance 60

5.3.2.16. Generic Part Definition 61

5.3.2.17. Generic Part Instance 62

5.3.2.18. Hole 63

5.3.2.19. Join 64

5.3.2.20. Jumper Wire 65

5.3.2.21. Keepln/Keepout 66

5.3.2.22. Land 67

Vlll
Contents

5.3.2.23. Laser Trim Path 68

5.3.2.24. Layer Outline 69

5.3.2.25. LEP Artwork Stackup Property 70

5.3.2.26. LEP Part Placement Boundary Property 71

5.3.2.27. LEP Definition 72

5.3.2.28. LEP Fixed Component Placement Property 74

5.3.2.29. LEP Instance 75

5.3.2.30. LEP Object Type/Sub-Type 76

5.3.2.31LEP Physical Layer Description 77

5.3.2.32. LEP Substrate Hole Property 78

5.3.2.33. Level to LEP Map 79

5.3.2.34. Machined Hole 80

5.3.2.35. Machined Hole Figure Associativity 81

5.3.2.36. Machined Hole Figure Definition 82

5.3.2.37. Machined Hole Figure Instance 83

5.3.2.38. Net 84

5.3.2.39. Net Connection Associativity 86

5.3.2.40. Package Symbol Definition 87

5.3.2.41. Package Symbol Instance 89

5.3.2.42. Padstack Definition 91

5.3.2.43. Padstack Instance 92

5.3.2.44. Panel Definition 93

5.3.2.45. Panel Instance 94

5.3.2.46. Pin 95

5.3.2.47. Pin Out Associativity 97

5.3.2.48. Routing Keepin 98

5.3.2.49. Routing Keepout 99

5.3.2.50. Test Point 100

5.3.2.51Test Point Associativity 101

5.3.2.52. Trace Keepout 102

5.3.2.53. Variable Test 103

5.3.2.54. Via 104

5.3.2.55. Via Keepout 105

5.3.2.56. Wire Bond 106

5.3.3. Display Geometry Object Models 107

5.3.3.1. Arc 107

5.3.3.2. Circle 108

5.3.3.3. Closed Curve 109

5.3.3.4. Composite Curve 110

5.3.3.5. Curve 111

5.3.3.6. Display Geometry 112

5.3.3.7. Ellipse 113

5.3.3.8. Elliptical Arc 114

5.3.3.9. Geometry Figure Definition 115

5.3.3.10. Geometry Figure Instance 116

5.3.3.11. Hyperbolic Arc 117

5.3.3.12. Line 118

5.3.3.13. Modified Geometry Figure Instance 119

5.3.3.14. Multi-Line 120

5.3.3.15. Non-Closed Curve 121

5.3.3.16. Parabolic Arc 122

5.3.3.17. Parametric Spline Curve 123

5.3.3.18. Planar Composite Area 124

5.3.3.19. Polygon 125

5.3.3.20. Point 126

5.3.3.21Predefined Planar Shape 1 27

5.3.3.22. Rational B-Spiine Curve 128

5.3.3.23. Simple Geometry Figure Instance 129

5.3.3.24. Text String 130

IX
Contents

5.3.4. Miscellaneous Object Models 131

5.3.4. 1

.

Attribute Table Definition 1 31

5.3.4.2. Attribute Table Instance 132

5.3.4.3. Definition Extents 133

5.3.4.4. Generic Data Property 134

5.3.4.5. Hierarchy Property 135

5.3.4.6. Instance Level Display Property 136

5.3.4.7. Modified Entities Definition 137

5.3.4.8. Modified Network Subfigure Instance 138

5.3.4.9. Modified Subfigure Instance 139

5.3.4.10. Name 140

5.3.4.11. Network Subfigure Definition 141

5.3.4.12. Networi< Subfigure Instance 142

5.3.4.13. Object Locator 143

5.3.4.14. Part Number Property 144

5.3.4.15. Region Restriction 145

5.3.4.16. Subfigure Definition 146

5.3.4.17. Subfigure Instance 147

5.3.4.18. Text Display Template 148

5.3.5. DE Referenced Object Models 149

5.3.5.1. Color Definition 149

5.3.5.2. Level Definition 150

5.3.5.3. Line Width Definition 151

5.3.5.4. Region Fill Definition 152

5.3.5.5. Transformation Matrix 153

5.3.5.6. Transformation (Mirrored) 154

5.3.5.7. Transformation Matrix (Standard) 155

5.3.6. DE Section Object Models 156

5.3.6.1. Associativity DE 156

5.3.6.2. Color Definition DE 157

5.3.6.3. Definition DE 158

5.3.6.4. Geometry DE 159

5.3.6.5. Instance DE 160

5.3.6.6. Property DE 161

5.3.6.7. Transformation Matrix DE 162

6. Implementation and Conformance Testing Guidelines 163

6.1. PROCESSOR CONFORMANCE REQUIREMENrrS 163

6.2. Test Purposes 164

6.3. Enumerated Application Protocol Test Groups 165

A. ACTIVITY MODEL CONTENTS A 167

B. Technical Discussions 187
Table ofFigures & Diagrams

4. ARM Figures

4. ARM Diagrams

4- 1 . Component Parts of an E)EF Relationship 26

4-2. Cardinality 26

4-3. The Categorization Structure 27

View 4-1 Top-Level Entities 29

View 4-2 Expanded Dependents of Pattern 30

View 4-3 Expanded Dependents of Hybrid Version 3

View 4-4 Expanded Dependents of Hybrid Assembly Occurrence 32

View 4-5 Expanded Component Model 33

View 4-6 Expanded Dependents of Assembly Consumables and Deposition

Component 34

5. AIM Figures

5- 1 . IGES Object and Referencing 40

5-2. References to Previously Defined Object 41

5-3. Object Field Value Restrictions 41

5.-4. Reference Mechanism 42

5-5. Representation Mechanism 42

5. AIM Object Models are listed in the Table of Contents

XI

Introduction

Initial Graphics Exchange Specification (IGES)

HYBRID MICROCIRCUIT ASSEMBLY

APPLICATION PROTOCOL

1. INTRODUCTION

1.1. Purpose

This application protocol (AP) for hybrid microcircuit assemblies uses the Initial Graphics

Exchange Specification (IGES) for the representation of the product definition and for the

exchange of these definitions from one hybrid microcircuit defining application to another. Since

the hybrid microcircuit application protocol makes use of a specific interpretation of entities in the

IGES file, both the sending and receiving sites must support this entire hybrid microcircuit

application protocol, not just the IGES entities listed.

1.2. Background "^

Hybrids are defined to be modules or subcircuits that are incorporated into larger electronic

assemblies, such as printed circuit boards. Typically, a hybrid is connected to the larger assembly

with external leads or pins. A hybrid incorporates an insulating substrate onto which a mix of

integrated circuits and other electronic components (such as thick- and thin-fihn devices) are interconnected.

A neutral data format serves several purposes: It permits the interchange of data between

computer-aided design (CAD) and computer-aided manufacturing (CAM) systems. It allows the

archiving of the hybrid design in a format that can be used in the future, even if the original CAD

or CAM systems or their software are no longer in use. There are a number of motivations for developing a specified representation for hybrids. The most

compelling motive is to reduce the errors created by different interpretations of a format as used

for a particular product. A specified representation for hybrids can also minimize cost and

maximize efficiency in the design and maintenance of translators. These uniform applications can

provide means for coping with the increasing complexity of hybrids. In current practice, there is often the need for manual intervention in order to transfer the data between the CAD workstations

and to the CAM stations that produce the hybrid. Even in automated systems, the problem is compounded by the fact that a data "translator" must be written for each pair of machines that

must exchange data. If there are n machines in the system

potentially n(n-l)—translators are needed.

Data hub concept

A neutral format serves as a data "hub." Each station served must only translate data from its own

"* Harrison, Randy J. and Palmer, Mark E., "Guidelines for the Specification and Validation of IGES Application

Protocols" NISTIR 88-3646, January 1989. (Available from the Nauonal Technical Information Service (NTIS),

Springfield, VA 22161), October 1990, (110 pages).
Introduction

format to the neutral format of the hub to be able to interchange with any other station interfacing

with the hub. For example, data could be exported from a CAD workstation to the hub and be

available there in neutral format for extraction by other CAD workstations and CAM machines. In

this arrangement, for n machines in the system, there are potentially 2n translators needed, a

substantial reduction.

1.2.1. Hybrid Complexity

Hybrid microcircuits have become increasingly complex in nature. One measure of this increased

complexity is the ratio of the area of active elements (usually silicon chips) to the unoccupied area of the substrate. In a single-chip package of a monolithic integrated circuit, the ratio is about 1:20;

in today's typical hybrid, the ratio is from 1:10 to 1:6. Present engineering efforts have the goal of

raising this ratio to 1:1, i.e., 50% of the substrate would be covered by silicon chips. These highdensity hybrids are often referred to as multichip modules, or MCMs. To cope with this expanding

complexity, hybrid manufacturing will increasingly depend on CAD and CAM techniques. For

practical implementation of combined CAD and CAM techniques, it is important to have a single

electronic representation of the CAD data available for interfacing with CAM environments. The

representations described in this AP apply to both MCM and conventional hybrid technology.

Many hybrid manufacturers still use extensive paper documentation, such as prints and drawings,

to document their product during manufacturing. Often, these drawings are produced on CAD

stations that contain information that is not represented on the drawing and yet may be useful

during the design process. As automated manufacturing methods become more available, such

"paper" documentation will impede manufacturing. Further, as the complexity of hybrids

increases, it will become much more necessary to convey this information to manufacturing

machines in computer-comprehensible form.

1.2.2. Consistent Information for Concurrent Engineering

Another benefit from a unified representation of the data describing an hybrid is the ability to achieve concurrent engineering, which in the case of an hybrid permits various automated and

human resources to be applied to the design of the hybrid simultaneously. Since these resources

share common data regarding the design, it is possible for various groups of engineers to refine

the mechanical, electrical, thermal, and testability characteristics of the hybrid in a much shorter

time than would be required otherwise. In addition, concurrent engineering permits different

application specialists to work in parallel with the designer. Thus, for example, those that are responsible for the manufacturing, assembly, quality, and reliability of an hybrid design are able

to provide suggestions concerning the design from its inception.

This method of business is in sharp contrast to the traditional methods where each department

contributed sequentially to the design process of an hybrid. Concurrent engineering methods

promote a combined effort where all information builds on an existing model and changes can be

easily accommodated through the separate functional areas. Since changes in the design are incorporated early in the design cycle, the costs of such changes is decreased. The result of

effective concurrent engineering is a product at lower cost and with a shorter design cycle than

would be realizable with traditional methods. Increased product quality results from accurate data

U-ansfer, as opposed to manual regeneration of CAD data on succeeding systems.

There are several existing neutral file specifications to describe electrical and electronic functions.
Introduction

These include specifications developed by the Institute for Interconnecting and Packaging

Electronic Circuits (IPC), the Electronic Design Interchange Format (EDIF), the Initial Graphics

Exchange Specifications (IGES), and the VHSIC Hardware Description Language (VHDL).

These neutral file specifications may support many of the data elements needed to represent an

hybrid design. Adding these formats is encouraged, and may be accomplished by adding the

appropriate models to section 5 of this AP. During such additions, the remaining sections should

be refined by agreement between the organizations that are responsible for the formats.

Conflicting information requirements (e.g., sections 3 and 4 of this document) among different

formats are not considered appropriate to the goals of product data consistency.

1.3. APPLICATION PROTOCOL CONTENTS

Section 2 of the AP provides a list of documents which are used in the construction of this protocol. Definitions of terms used in the AP are Usted in alphabetical order in section 3. Part 3. 1 of this

section lists terms contained in the text of the AP while part 3.2 are terms contained in the various

models (AAM, ARM, AIM) of the AP. Terms in both sections are listed along with reference to the models in which they appear.

The Application Reference Model (ARM) is explained and presented in section 4. The ARM is constructed in terms used within the electronic design and fabrication community (i.e., an external

schema). For example Part and Component are used, and are given definitions appropriate to those found in engineering as related to the use of CAD systems and supporting libraries. The

concept of units of functionality as they apply to the ARM is described. The IDEFIX modeling

technique is used to develop the ARM and a brief tutorial on how to read the model is included.

The Application Interpretive Model (AIM) is described and presented in section 5. The mapping

of the ARM to AIM is explained. The objects declared in this section are associated to general and

specific CAD data items (i.e., an internal schema). A description of the IGES file structure and

the breakdown of its sections is given. A modeling syntax is used to develop the AIM and a brief

tutorial on how to read the model is included.

Section 6 details implementation and conformance guidelines for this Apphcation Protocol.

Process conformance requirements and testing purposes are given. Appendix A contains the

Activity Model which puts the AP into scope. Appendix B has a parameter listing of typical

hybrid microcircuit processing parameters/variables and their values.

2. NORMATIVE REFERENCES

The following documents constitute a normative part of this document:

IPC-T-50E, "Terms and Definitions for Interconnecting and Packaging Electronic Circuits,"

February, 1991, Institute for Interconnecting and Packaging Electronic Circuits, Lincolnwood, IL

60646.

MIL-H-38534, "Hybrid Microcircuits, General Specification for," 31 March 1989.

Reed, Kent; ed. The Initial Graphics Exchange Specification (IGES) Version 5. 1. September.

1991, National Computer Graphics Association, Fairfax, VA 22031.

Definitions

3. DEFINITIONS

3.1. IGES Application Protocol Definitions

Application: An enterprise process that puts product data to use. The scope of an application is defined by the class of product, the supported stages in the life cycle of the product, the uses of the

product data, and the disciplines that participate in that use.

Application Activity Model (AAM) - A structured decomposition of the tasks which are followed

to achieve the particular product defined by the AP. The AAM identifies the scope of the AP as well as the activities which create and use the information being defined. The AAM is constructed

to be generally representative of the industry, and includes processes which are, or could be,

largely automated.

Application Interpreted Model (AIM) - An information model that identifies the information

structures of a particular data format specification. The AIM is defined to accomplish a physical

implementation of an associated application reference model (ARM). This AEM is prepared at a

level of abstraction that is sufficient for selecting the necessary entities for an application.

Application Protocol (AP): Defines the scope and information domain of an application and

specifies the rules for using IGES, or some other standard, to enable unambiguous transfer of the

application information, and the testing of those transfer implementations.

Application Reference Model (ARM) - An information model that describes the information

structures and constraints for an application area. The ARM is defined in terms of Entities,

Attributes, and Relationships. The information model uses application specific terminology and

rules familiar to an expert from the application area. The model is independent of any physical

implementation and can be validated by an expert from the application area.

Application Subset - An unambiguous set of entities which span the data requirements of the

specified application. The set of entities is determined on the basis of the Application Reference

Model.

Assembly - In general (e.g., from Websters): Parts fitted together to make a whole. The assembly

referred to in this AP is taken to mean parts placed on, and/or connected to, an interconnecting

part generally in the form of a flat substrate on which has been deposited alternate layers of

metalized patterns and insulation material; the whole of which has been defined as to provide a

specified part of the function of a system. An assembly may be used as a part on another assembly.

Attribute - A property or element of information associated with an Entity. An instance of the

attribute must exist for any instance of the Entity to which it belongs.

Entity - The basic unit of data classes in the ARM. Also the basic data types identified in the AIM.

The term applies to single units which may be individual elements of geometry, individual

elements of annotation, or collections of geometry or annotation elements that are combined to form more complex data structures. IGES Postprocessor - A software unit that transfers CAD information from the IGES format to the CAD database format of a particular system. The software is usually developed and

maintained by a commercial CAD system vendor.

IGES Preprocessor - A software unit that translates CAD information from the CAD database

format of a particular CAD system to the IGES format. The software unit is usually developed
Definitions

and maintained by a commercial CAD system vendor.

Information Configuration Control - An approach that consists of specifying, documenting, and

controlling both the creation and modification of information and the subsequent translation and

exchange of the information between different systems and formats. The approach requires

substantial documentation for both the syntax (the format) and the semantics (the meaning)

attached to an item of information.

Instance - In general (e.g., from Websters): A detail or circumstance. In this AP an instance

indicates that a specific member of an object class is being referenced. An example of an object

class may be the assembly as identified by a drawing number. An example of an instance may be

a completed assembly identified by a serial number.

Layered Electrical Product (LEP) - A broad category of electronic product types which are characterized by a two or more laminar strata stacked in sequential order. The completed structure serves to conduct electrical signals and may contain passive or active electrical functional

elements. The structure is usually designed using two-dimension (2-D) graphics which result in

photo-process tooling. Additional components or other LEPs may be added to complete the

assembly. Descriptions within this document which apply additionally to products such as integrated circuits, printed circuit boards, flex harnesses are labeled with this term.

Occurrence - In general (e.g., from Websters): Anything that happens or takes place. In this AP the

term is sometimes used to label an object class which exists as a result of a sepcific grouping of

two or more other object classes.

Product - A result produced by specified activities or used for specified activities.

Product Data - The set of data elements that is necessary to fully support a product over its expected life cycle. The set of data elements includes all of the product definition data plus other

data pertaining to the operation and maintenance of the product until it is removed from service.

Product Definition Data - The set of data elements that completely define a product for a certain

discipline; a subset of product data. This set of data elements includes the geometry, topology,

features, tolerances, and relationships necessary to completely define a component product or an assembly of products and is structured such that it can be used by one or more applications.

Relationship - The identified association of two entities to each other. The two entities and their

relationship taken together constitute a natural language role expressed in the data model.

Example: Assuming the entities "Car" and "Person" are associated with relationship "Owned" in a data model Then the role may be expressed in natural language as: "A Car is owned by a person." The exact role stated depends on the modeling language's interpretation specifications.

Semantics - The meaning that is given or assigned to an item of information. The meaning is assigned to an item of information on the basis of its application area. Syntax - The structure of expressions in a language. [3] This structure is described in a

specification such as IGES.

Unit of Functionality - A collection of entities, attributes and relationships that conveys one or more well-defined concepts (within the scope of the AP) such that removal of any component

would render the concept(s) incomplete or ambiguous. (See "Current Issues on STEP APs,"

10/9/91.)
Definitions

3.2. Hybrid Application Definitions

The bracketed character following the term indicates that the definition applies primarily to the

AAM [A], AIM [I], or the ARM [R].

Note: definitions preceded by (T50) are from IPC-T-50E, December 1991.

ANNOTATION - [R] Text or legend pertinent to a design; text may appear as data related to legend on a multilayer substrate, lettering on a drawing, or other types of symbols.

APERTURE CODE - [R] Code representing aperture number used in plot file intended for a

plotter such as a Gerber Plotter.

APERTURE NUMBER - The number for a photoplotter aperture setting, number used in pin and

pad tables, and formatter table corresponding to a position on the aperture wheel.

APERTURE SHAPE - [R] Shape of aperture, such as one of the following: round, square, donut.

APERTURE SIZE - [R] The x,y dimensions of the aperture such as width or diameter where

appropriate.

ART WORK (T50) - [R] An accurately-scaled configuration that is used to produce the artwork

master used for production.

ART WORK GEOMETRY (target) (outside circuit) - [R] A collection of primitive shapes such

as arcs, areas, and lines.

ART WORK TEXT - [R] Identifying text which calls out the hybrid product number and

configuration number as well as program configuration for the hybrid art work. It identifies layer,

revision, hybrid number.

ASPECT RATIO (of Deposition Resistor) - [R] The ratio of the length of a thick or thin fihn

resistor to its width, or the ratio between the resistance of the resistor and the sheet resistivity of

the ink. This is also the number of effective "squares" in the design of a resistor.

ASSEMBLY CONSUMABLES - [R] A type of consumable that becomes part of the finished

product. See also Consumable.

ASSEMBLY ID - [R] All information needed to uniquely identify a particular assembly,

manufactured in-house or purchased. The identification may include, but is not Umited to, the

Drawing Number, Revision, Revision Status, Dash Number, Cage Number, case style, and other

product notation.

ASSEMBLY OCCURRENCE - [R] Either a single product which is defined to become part of an

assembly, or two products which are identified as items to be assembled into the next higher

assembly. The occurrence identified may be noted in a bill of materials, or may be in-process

work which must be identified for manufacturing tracking.

ASSEMBLY OCCURRENCE ID - [R] AU information required to uniquely identify (ID) a product and the assembly it is assembled to. The identification may include, but is not Hmited to, the Drawing Number, Revision, Revision Status, Dash Number, Cage Number, case style, and

other product notation.

ASSEMBLY TYPE - [R] The name of the class of assembly which indicated the general stage of

completion of the electronic product. Examples are screened substrate, subassembly, component

assembly, and final assembly.
Definitions

ATTACHMENT - [R] Method used to describe how a component can be held on to the substrate

such as solder, or epoxy.

ATTACH MATERIAL PATTERN - [R] Pattern associated with a component for the purpose of

specifying the location and shape of an attachment medium or material.

BACK PAD POLARIZATION - [R] Description of which pin is electrically connected to the back

pad of a component such as a diode or IC chip.

BACK PAD POLARIZATION NAME - [R] Name associated with the back pad such as anode.

BILL OF MATERIALS - [R] A formatted list of products (instances of Hybrid Assembly

Components) used for a particular assembly.

BLIND VIA - A via that is visible from only one side or the other of a design. (Derived from Via

attributes.)

BONDING PADS - IR] Areas of metallization on the component and the hybrid substrate that

permits connection of the wire or circuit elements.

BURIED VIA - A via hole not extending to the surface. A buried via is completely contained

within the inner layers of a design and therefore is not visible from the outside layers. May be

referred to as an interstitial via hole. (Derived from Via attributes.)

CAD LAYER - [R] A method of separating information in a CAD system for the purpose of display

or processing. Some CAD layers correspond to artwork layers.

CAGE NUMBER - [R] The military-assigned identification of the manufacturer responsible for

the product definition.

CAPACITOR COMPONENT - [R] A kind of component used to add capacitance to a hybrid

circuit.

CAPACITOR MATERIAL - [R] The type-name for a capacitor derived from the dielectric

material of the capacitor

CATCH PAD - [R] Metallization patterns on a conductive layer associated with a via which aid in

the interconnection of a via with its associated traces. CHECKPLOT SCALE (T50) - [R] Drawing scale used on interim drawing for graphical data

verification, (called a check plot.)

COMPONENT ATTACH - lA] The placing of a component (chip) on a substrate or header in a manner which causes it to mechanically bond.

COMPONENT LOCATION PLACEMENT TOLERANCE - IR] The amount of displacement

form the specified location which is acceptable.

COMPONENT LOCATION X Y - [Rl The coordinates specified for the location of a component

within an assembly.

COMPONENT ORIENTATION (T50) - [R] The direction in which the components on a printed

board or other assembly are lined up electrically with respect to the polarity of polarized

components, with respect to one another, and with respect to the board outline.

COMPONENT PLACEMENT RESTRICTION - [R] An area on substrate where components can

not be placed.
Definitions

not be placed.

COMPONENT POSITION - [R] The location at which a component is placed.

COMPONENT SELECTION - [R] A set one or more alternate chips to be specified in the design

of a hybrid, one of which is selected at the time of manufacture of a particular hybrid.

COMPONENT TOLERANCE - [R] The range of acceptable component values; usually specified

as a percentage of the nominal specified value.

COMPONENT VALUE - [R] The parameter associated with some component types which may

be used in the fabrication of the components.

COMPONENT VALUE TOLERANCE - [R] A range of permissible product's values.

COMPONENT VOLTAGE RATING - [R] Maximum voltage specified that can be placed across

a component.

CONDUCTIVE PATTERN - [R] The configuration or design of the conductive material on the

substrate. For a hybrid, the pattern includes conductors, lands, and through connections (vias)

when these connections are an integral part of the manufacturing process.

CONDUCTIVITY, ELECTRICAL - [R] The capability of a material to carry an electrical current. The reciprocal of resistivity.

CONSUMABLE - [R] An in-process or an end item material supplied in bulk form.

CONSUMABLE ID - [R] All information needed to uniquely identify a particular consumable,

manufactured in-house or purchased. The identification may include, but is not limited to, the

Drawing Number, Revision, Revision Status, Dash Number, Cage Number, and other material

notation.

CONSUMABLE NAME - [R] The name given to bulk-purchase materials used in the assembly

process, such as solder, flux, etc. CONSUMABLE PROPERTY - [R] Properties of a consumable such as shelf life, expiration date.

CONSUMABLE PROPERTY NAME - [R] The name of a Consumable Property.

CONSUMABLE PROPERTY VALUE - [R] The measurement value associated with a Consumable Property.

CONSUMABLE TYPE - [R] The generic classification given to consumables, such as epoxy.

CROSSOVER - The transverse crossing of metallization paths without mutual electrical contact

achieved by the deposition of an insulating layer between the conducting paths at the area of

crossing. Dielectrics can be used with crossover conductive patterns, acting as a bridge over

previously screened conductive material, (derived from trace geometry.)

DEFAULT DESIGN RULE - [R] The specifications which are followed during layout of the

patterns on the layers of an electronic assembly. Examples are the maximum trace width, or the

minimum conductor spacing.

DEFAULT DESIGN RULE DESCRIPTION - [R] The description of a Design Rule that is employed when no other rule is specified.

DEFAULT DESIGN RULE NAME - [R] The name associated with a Design Rule.

DEPOSITION COMPONENT - [R] Components which are fabricated coincidentally with the
Definitions

interconnects as opposed to components which are attached to the substrate after the interconnect

network is complete.

DEPOSITION RESISTOR - [R] The deposition of resistor material which is formed as part of the

conductive circuitry on a substrate layer. The resistor is a component in the sense of the electrical

function of the circuit, but not in the sense of a separate product to be assembled to the completed

substrate.

DEPOSITION SEQUENCE NUMBER - [R] A particular layer's position on the hybrid substrate

with respect to the first layer.

DEPOSITION TYPE - [R] A category used to describe the technology used (THICK or THIN

fihn) to create the component.

DERATING - [R] A factor which is applied to a product parameter to insure that reliability

requirements are met; such as derate resistor power rating by 50%.

DESIGN RULE - [R] A guideline that determines behavior with respect to specified design

parameters. Becomes a constraint on the functional and physical layout. An example is a rule that ensures that minimum distance between elements in a design file is maintained.

DESIGN RULE CHECK (DRC) - [R] A process to enforce the design rules.

DESIGN RULE VALUE - [R] The measurement assigned to a particular restriction for a product's

design.

DEVICE PIN ASSOCIATIVITY- [R] Functional relationships among pins that are needed to allow operations such as gate swapping or pin swapping to improve trace routing

DIE - [A] The uncased and normally leadless form of an electronic component that is either active or passive, discrete active device or integrated circuit.

DIE BONDING - [A] The attachment of an integrated circuit chip to a substrate or header.

DIELECTRIC - [R] An insulating material used to separate conductors.

DIELECTRIC CONSTANT - The ratio of the capacitance, Cx, of a given configuration of

electrodes with a specified dielectric, to the capacitance Cv, of the same electrode configuration

having a vacuum as a dielectric.

DIELECTRIC LOSS ANGLE - [R] The difference between 90 degrees and the dielectric phase

angle given a set of operating conditions. May be referred to as the dielectric phase difference.

DIELECTRIC OUTLINE - [R] The boundary of an insulating layer.

DIELECTRIC STRENGTH - The maximum voltage that a dielectric can withstand, under

specified conditions, without resulting in a voltage breakdown. Usually expressed as volts per unit

length.

DISSIPATION - [R] The tendency for fluids or energy to distribute evenly within a medium. This

tendency is usually associated with the ability of a material shape to remove heat or power from

physical devices and circuits.

DISSIPATION FACTOR - [R] A measure of insulating or dielectric materials to absorb some of

the energy in an alternating current signal.

DOCUMENTATION TEXT - [R] Words (strings) which exists on documentation.

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Definitions

operation.

EQUIPMENT - [R] The identification name of machine types that are used as the means to complete a process step during manufacture of a device. Examples are a pick-and-place machine

or a solder-joint inspection machine.

ELECTRONIC PACKAGE - [R] (See Package.)

FILE ID - [R] The unique identification of a data file stored in or intended for a computer system.

For files containing product information, the identification may include, but is not Umited to, the

Drawing Number, Revision, Revision Status, Dash Number, Cage Number, and other product

notation.

FILM - (See Thick Film or Thin Film.)

FILM MATERIAL - [R] Material used in thin and thick film processes to fabricate components

and circuitry.

FUNCTION TYPE - [R] The category describing the use of a particular artwork geometry such as Pad, Registration Mark, Conductor, Dielectric Edge, Text. GENERIC NAME - [R] A commonly accepted product identification, such as 54LS04 or 2N2222.

GEOMETRY - [R] The constructs which are used to describe shapes of objects to be presented, or

to which a product is to be fabricated. The description is usually in terms of a set of spatial coordinates and the identification of the curve-type to be constructed from the coordinates.

GEOMETRY ELEMENT - [R] A feature used to identify the meaning of, or use for, a collection

of geometries. Examples from assemblies are countersink, keyway or threads. Examples from electrical planar designs are line, circle, area, etc. GEOMETRY LINE WIDTH - [R] A measurement of the distance across a line (i.e., normal to the

line). This value is often specified for circuitry artwork lines to regulate or check the actual or the

artwork image produced from a computer plot or other image master.

GEOMETRY TYPE - [R] A classification of the basic geometry such as Line, Arc, and Polygon.

GLAZE - [R] An insulating film material used to protect underlying circuitry.

HYBRID ASSEMBLY COMPONENT - [R] A product or an assembly which has been identified

and located within a hybrid assembly.

HYBRID CAD PRESENTATION - [R] The design file that contains the electronically coded data

available on a particular hybrid design.

HYBRID ID - [R] All information needed to uniquely identify a particular product, manufactured

in-house or purchased. The identification may include, but is not limited to, the Drawing Number,

Revision, Revision Status, Dash Number, Cage Number, case style, and other product notation.

HYBRID MICROCIRCUIT ASSEMBLY (HMA) - In general an integrated circuit that is not

monolithic. The term hybrid denotes that the circuit elements are made by two or more different

technologies. A typical hybrid may consist of semiconductor chips and capacitors attached to a ceramic substrate with printed resistors and interconnections which are screen printed and fired.

HYBRID NAME - [R] A descriptive name given to a hybrid that usually describes its function.

HYBRID NUMBER - [R] The product number of a particular hybrid type.

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Definitions

HYBRID SUBSTITUTE PART NUMBER - [R] Other organizations identification (i.e., the

customer may have alternate product number for the same hybrid).

HYBRID VERSION - [R] The revision level of a hybrid; each change to the hybrid design results

in a new hybrid Version.

LAND - [R] A portion of a conductive pattern usually used for electrical connection, component

attachment, or both.

LAYER - A strata of material such as conductor, dielectric, or resistor material which forms part

of the hybrid structure. LAYER DISPLAY COLOR - [R] The display color of a layer on a color drawing or on a CAD

machine.

LAYER NAME - [R] The name of a particular layer (dielectric or conductive) such as Glaze or

top conductor.

LAYER SEQUENCE NUMBER - [R] A particular layer of material (conductor or dielectric) position on the hybrid substrate with respect to the first layer. Usually begins with the first material

placed on a substrate. These layers relate to process layers as contrasted with e.g., CAD layer.

LAYER TYPE - [R] A category used to describe the function performed by a deposited layer such

as Conductor, Dielectric, Fill, Glaze, Resistor, Epoxy, Solder.

LAYER RESTRICTION - [R] A design restriction which is imposed on a particular layer of the

product,

LEAD FRAME - [R] The metallic portion of the device package that completes the electrical

connection path from the die or substrate conductors to the external circuitry.

LEAKAGE CURRENT - [R] The flow of electrons through the dielectric of a capacitor, usually

expressed as a maximum which will be acceptable for the component.

LEVEL OF PREFERENCE - [R] A relative rating assigned to a product in a collection of

functionally similar products which indicates its ranking of desirability for use in a product to be

produced for the rating organization.

LIBRARY NAME - [R] The name of part in CAD system files of part information.

LINE RESISTANCE - The resistance of a conductor line on a substrate measured in total trace re- sistance.

LINE WIDTH - [R] (See Geometry Line Width.)

LOG REQUIREMENTS - [R] Indicates what information about the process step must be recorded

and retained such as Machine ID, Component Lot Identification, Start Time, Stop Time.

LOSS FACTOR - [R] A property of an insulating material that is equal to the product of its dissipation and dielectric constant.

MANUFACTURER NAME - [R] The name a company is registered to do business under; may

also include a company division name. MAX SUBSTRATE SIZE - [R] The largest size of substrate which can be accommodated.

MIL - [R] A unit equal to 0.0254 millimeter (mm), (or 0.001 in).

MOUNTING PAD - [R] Metallization pattern on the substrate associated with a component for

12
Definitions

the purpose of indicating the region for physical attachment of the component to the substrate. See

Attach Material Pattern. MULTICHIP MODULE -[A] A complex multilayer circuit containing components (integrated cir- cuit chips) which cover at least half of the available circuit area. Note that this term is not present

in the CAD information.

MULTI-UP E) - [R] The unique identification of data which indicates the placement of an array of

images nested together on a single photo tool artwork. For files containing product information, the

identification may include, but is not limited to, the Drawing Number, Revision, Revision Status,

Dash Number, Cage Number, and other product notation.

NET - An entire sequence of electrical connections from the first source point to the last target

point, including lands and vias. The Net is identified by a Net Name which is unique within the

product, and may also have a signal name. NET DESIGN RULE - [R] Specified constraints on parameters related to the connectivity.

Examples are maximum distributed inductance, or maximum circuit length.

NET DESIGN RULE NAME - [R] The assigned identification of a specification for some

parameter of all conductive elements associated with an individual signal.

NET DESIGN RULE VALUE - [R] The measurement allocated to some parameter of all conductive elements associated with an individual signal.

NETLIST - A to-from listing of all the interconnections in the design. The netlist should

correspond to the to-from listing of all the wires in the schematic. (Model; set of Net.)

NET NAME - A character stiring used to identify and distinguish nets; the name of the logical

connection realized by the trace. OBSTRUCTION - A physical entity which restricts where a component or a trace can be placed.

See also Component Placement Restriction.

ORIENTATION - [R] The angle of rotation of a component relative to a predetermined direction.

PACKAGE - An integrated circuit, or a hybrid circuit. It provides hermetic or nonhermetic

protection, determines the form factor, and serves as the first-level interconnection externally for

the device by means of package terminals.

PACKAGE DIMENSION - The physical measurements of the package. See Part Outline.

PACKAGE ID - [R] The unique identification of a component enclosure. For files containing product information. The identification may include, but is not limited to, the Drawing Number, Revision, Revision Status, Dash Number, Cage Number, case style, and other product notation (e.g.,

TO- 18; a JEDIC Standard number for a metal transistor package).

PACKAGE OUTLINE - [R] The 3-dimensional curve and surface geometry of a component package.

PACKAGE PIN LOCATION - [R] The geomefi-ic position of a lead in a part package of an electrical product with respect to the part origin and reference axis.

PACKAGE PIN NAME - [R] A referencing word that describes a use for the lead of a component package; such as "Outputl".

PACKAGE PEN NUMBER - [R] The identifying number assigned to the lead of a package for

13
Definitions

electronic components.

PACKAGE PIN TYPE - [R] The name given to the lead of a component package which indicates

how the lead is to be attached to the assembly.

PAD - The metallized area on a substrate or on the face of an integrated circuit used for making

electrical connections. Also see land.

PAD END FEATURE - [R] The type of joint formed on a wirebond wire at the place where the

wire attaches to the circuitry of an assembly.

PAD TYPE - [R] The descriptive name that implies the function of a pad.

PADSTACK [I] - An ECAD construct for all of the pieces of information (features) about a component pin needed to establish the interconnection /layer geometry on the hybrid.

PAD WIREBOND END FEATURE - [Rl The method of attaching a wirebond to a pad as denoted by the appearance of the joint such as wedge, ball. PANEL MULTI-UP - [R] Multiple of the same image on one piece of material that will be separated after processing into multiple substrates

PART - [A, R, I] An individual functional element in a physically independent body that cannot

be reduced or divided without destroying its stated function. When assembled onto the completed

film network will form part of the circuit assembly. In a CAD system, represented as a graphic

symbol with attached annotations. Parts are manufactured items; the information about which is usually stored in a library or listed in a catalogue.

PART GRAPHIC- [R] The graphic presentation of a component.

PART ID - [R] AU information needed to uniquely identify a particular item, manufactured inhouse or purchased. The identification may include, but is not Hmited to, the Drawing Number,

Revision, Revision Status, Dash Number, Cage Number, case style, and other product notation.

PART KIND - [R] A category of component describing how it is used electrically such as mechanical, passive, active.

PART MANUFACTURERS NAME - [R] The corporate name used by the manufacturer of

components.

PART NAME - [R] Description of the function of the component such as Coil, Cover, IC Chip,

Transistor, Resistor Header, Substrate.

PART OUTLINE - [R] The boundary of component on the top assembly drawing or the CAD

equivalent.

PART PROPERTY - [R] A pair of terms, one indicating the property name (see Component

Property Name), the other the value of the property (see Component Property Value).

PART PROPERTY NAME - [R] The name of a measured parameter associated with a device

used in an assembly. Examples are capacitance, inductance, gain, resistance, and temperature

range.

PART PROPERTY VALUE - [R] The value associated with a Component Property. Examples

would be 1 OK as a value for the resistance property, or 50 as a value for the low frequency gain

property of a semiconductor.

14
Definitions

PASSIVE COMPONENT - [R] A component which does not exhibit signal gain but does affect one or more other parameters of a signal. Examples are resistor, inductor, and capacitor.

PATH VERTEX - The X, Y location which specifies one end point of the linear segment of a

trace. PATTERN [R]- The configuration of materials on a panel or printed board layer. Pattern also denotes the circuit configuration on related tools, drawings, and artwork masters.

PATTERN ID - [R] The unique identification for the artwork for a specified layer of a laminated

product.

PATTERN VALUE - [R] The measurement value assigned to a deposited or etched component at some specified stage in the fabrication cycle. An example is 2300 ohms prior to trimming.

PATTERN VALUE MIN & MAX - [R] The tolerance associated to the deposited or etched component.

PHOTOLITHOGRAPHY [A]- The use of light or ultraviolet rays through a mask to define circuit

conductor patterns. (Model; intractable taxonomy.)

PHOTOPLOT APERTURE- Mechanism which allow a certain amount and incidence of light to expose fihn, thereby making a "photograph" of design being plotted. See Aperture Size.

PHOTORESIST [A]- A photosensitive coating that is applied to a laminate and subsequently

exposed through a photo tool (film) and developed to create a pattern that can be either plated or

etched.

PHYSICAL LAYER (1 top) - A conductor, dielectric, or fill for each layer.

PIN - The identification of a possible connection to a component providing a reference point for

creating a netlist. PIN ASSIGNMENT - [R] The name of the characteristic or electronic function assigned to the lead

of a component package in a circuit.

PIN END FEATURE - [R] The type of joint formed on a wirebond wire at the place where the

wire attaches to a component.

PIN LOCATION - The physical location of pins on a component package with reference to its assembly origin.

PIN NAME - [R] The general functional notation for the signal role at the lead of a component

package such as E, B, C on a transistor.

PIN NUMBER - A number used to disfinguish pins on a component or package.

PIN TYPE - The name of a characteristic on a pin, such as input, output, tri-state analog.

PIN WIREBOND END FEATURE - [R] The characteristic of the wire at a joint with the material

to which the wire is attached. The usual characteristics given are wedge or ball. PLACEMENT NAME/PHYSICAL NAME - The name of component in CAD library.

PLACEMENT TOLERANCE - [R] The permitted positional variation of a component on an

assembly.

PLATING - (1) The metallic deposit on a surface, formed either chemically or electrochemically.

(2) the process of the chemical or electrochemical deposition of metal on a surface. (Model;

15
Definitions

Deposition taxonomy.)

POINT - [R] A singular location in a given coordinate system.

POINT X VALUE - [R] The numeric value in one (usually horizontal when viewed from a

reference coordinate system) direction from a single point spatial reference.

POINT Y VALUE - [R] The numeric value of a single point reference, in a direction orthogonal

to the X vector direction.

POWER DENSITY - [R] A measure of the concentration of energy, such as 1 watt per square

inch.

POWER DISSIPATION - (T50) [R] In watts/meter^ (heat flux density), the energy used by an

electronic device in the performance of its function.

PREFORM - [R] For soldering or adhesion functions, a form which is punched out of thin sheets

of solder, epoxy, or eutectic alloy. The form is placed on the spot of attachment by soldering or by

bonding prior to placing the object there to be heated, (a type of Part Name)

PRIMmVE TYPE - [R] The category of simple geometric element that makes up artwork such as geometry or text. PROBE PAD - A connection point for an external probe used to test some aspect of the hybrid

circuit function. For example, a probe pad may be used to make connections to a screened resistor

during the trimming process.

PROCEDURE - [R] A step-by-step description of the activities needed to complete a given

operation.

PROCESS ID - [R] The unique identification of the parameters used on one process step during

manufacturing. The identification may include, but is not Umited to, the Drawing Number,

Revision, Revision Status, Dash Number, Cage Number, and other product notation.

PROCESSING CONSUMABLE - [R] Material or chemicals which are used in manufacturing

processes which do not remain as part of the product being manufactured. Examples include

cleaning fluids, flux, and photoresists.

PROCESS DESCRIPTION - [R] The narrafive explanation of an identified step in the fabrication

of a product or assembly.

PROCESS OPERATION - [R] The procedures sequentially described by a document identified

by the Process ID.

PROCESS STEP - [R] A single operation used to manufacture an Assembly Occurrence. Each

step corresponds to one block on a flow chart.

PROCESS STEP NUMBER - [R] A sequential number assigned to a process step.

PROCESS VARIABLE NAME - [R] The identifier assigned to a particular fabrication step.

PROCESSING CONSUMABLE NAME - [R] The generic identification of a substance used

during the fabrication of a product or assembly, but which does not remain as part of the product.

Examples are flux, solvent, or resist. PRODUCT CONSUMABLE - [R] Material or chemicals which are used in manufacturing

processes and which remain as part of the product being manufactured. Examples include solder,

epoxy, and plated metals.

16
Definitions

PRODUCT CONSUMABLE NAME - [R] The generic name of material or chemicals which is used in manufacturing processes and which remain as part of the product being manufactured.

PRODUCT TOLERANCE - [R] The allowable deviation from the specified location of a product

feature.

PRODUCTION TOLERANCE - [R] The allowable deviation from the specified location of a product feature.

PROGRAM - [R] A text string indicating the system a hybrid was designed for or intended to be

used in. QUALIFIED VENDOR - [R] A company from which components are purchased and which has

been identified as meeting specified requirements for certification and/or inspection of the

components being sold.

REFERENCE DESIGNATOR - [R] A character string which defines an instance of an assembly

component; unique within the hybrid. The guidelines generally followed are found in ANSI

Y32.16-1975 (e.g., Rl=Resistor 1, U7=Microcircuit 7, A10= Assembly 10; thus A10R6 is the 6th

Resistor in Assembly 10).

REGISTRATION - The proper alignment of layers with respect to other layers or to the substrate.

The accuracy of registration is measured as the concentricity or relative position to a datum.

REGISTRATION MARK - [A, R] The marks on a wafer or substrate that are used for aligning

successive processing masks. Also known as alignment marks or fiducial marks.

REGISTRATION MARK NAME - [R] The term assigned to a locating orientation feature related

to a particular use. RESISTIVITY - The ability of a material to resist the passage of electric current. See also

Resistor, Sheet Resistance or Line Resistance.

RESISTOR - A device that offers resistance to the flow of electric current in accordance with

Ohm's law: R = E/I, where R is resistance, E is voltage, and I is current. RESISTOR GEOMETRY - The film resistor outline. The four system generated geometries for

many CAD systems are as follows: rectangle, tophat, u - shaped, serpentine.

RESISTOR MAX ASPECT RATIO - A greatest-value factor obtained by dividing the specified

width by the length and multiplying the numerator and denominator by a constant such that the re- sulting factor is a simple number, such as 4:1. Such a design rule may constrain the automated design system, and is transferred with the design. The rule is not necessarily intended to be applied

to the finished product.

RESISTOR MIN ASPECT RATIO - A least- value factor obtained by dividing the specified width

by the length and multiplying the numerator and denominator by a constant such that the resulting

factor is a simple number, such as 1:6. Such a design rule may constrain the automated design system, and is transferred with the design. The rule is not necessarily intended to be applied to the

finished product.

RESISTOR MIN LENGTH - A design rule—or metric—which establishes the least acceptable dimension a resistance trace length, such as 40 mil. Such a design rule may constrain the automated

design system, and is transferred with the design. The rule is not necessarily intended to be applied

17
Definitions

to the finished product.

RESISTOR MEN WIDTH - A design rule—or metric—which establishes the least acceptable dimension across a resistance trace, such as 20 mil. Such a design rule may constrain the automated

design system, and is transferred with the design. The rule is not necessarily intended to be applied

to the finished product.

RESISTOR OVERLAP - A thick-film conductor pad that overlaps and makes contact with a

thick-film resistor area. RESISTOR PASTE VALUE - [R] Material used to create thick film resistors rated with a nominal ohm per square value.

RESISTOR SHAPE - [R] The term which is characteristic of the topology used for a deposited or etched resistor component.

RESISTOR TERMINATION - The contact area between a thick- or thin-film resistor and an

adjacent conductor layer.

REVISION - [R] Number(s) and/or character(s) that uniquely identify a version of documentation

and the products built to that documentation.

ROUTE REGION - (T50) Region where routing paths can automatically be placed between

points to be interconnected.

SCHEMATIC - (T50) A drawing that shows, by means of graphic symbols, the electrical

connections, components, and functions of a specific circuit arrangement.

SCHEMATIC ED - [R] AU information needed to uniquely identify a particular circuit functional

diagram, manufactured in-house or purchased. The identification may include, but is not limited

to, the Drawing Number, Revision, Revision Status, Dash Number, Cage Number, case style, and

other product notation.

SCREEN ID - [R] All information needed to uniquely identify a particular screen, manufactured

in-house or purchased. The identification may include, but is not limited to, the Drawing Number,

Revision, Revision Status, Dash Number, Cage Number, and other product notation.

SCREEN PRINTENG - [A] A process for depositing material in a pre-defined pattern by forcing

material through a stencil screen with a squeegee.

SCREEN STENCIL - [A] A network of metal or fabric strands, mounted snugly on a frame, and

upon which the film circuit pattern and configurations are superimposed by photographic means,

(from ISHM Industry Guide, 1990)

SHEET RESISTIVITY - [R] Electrical resistance of a thin sheet of a material with a uniform thick- ness as measured across opposite sides of a unit square pattern expressed in ohms per square, (from

ISHM Industry Guide, 1990)

SIGNAL CONDUCTIVE PATTERN - [R] The association of geometry and the electrical characteristic that is intended to be carried on the material finished to that geometric shape.

SIGNAL NAME - [R] The user defined functional name, usually referring to an electrical

impulse of predetermined voltage, current, polarity, and pulse width. See also Net Name.

SOLDERING [A]- A process of joining metallic surfaces by melting solder.

SPECIFIED TOLERANCE - [Rl The amount of (usually) dimensional deviation which has been

18
Definitions

called for in the product specification.

START LAYER - [R] The first of one or more layers through which a via or passage will pass.

STATION - [R] The place or the equipment which is identified (in planning) as the location of a processing or an assembly step during the manufacturing of a product.

STEP X COUNT - [R] The number of patterns in X direction in panel multi-up.

STEP X DISTANCE - [R] The X step distance between patterns in panel multi-up.

STEP Y COUNT - [R] Number of patterns in Y direction in panel multi-up.

STEP Y DISTANCE - [R] The Y step distance between patterns in panel multi-up.

STOP LAYER - [R] The last layer through which a via or passage will pass.

SUBSTRATE [R]- The supporting structural material into and/or upon which the passivation, metallization and circuit elements are placed. MIL-STD-883C (Usually aluminum oxide (alumina)).

SUBSTRATE OUTLINE [R]- The graphical representation of the substrate shape.

SUBSTRATE MATERIAL - [R] The name of the substance from which the base layer is formed.

SUBSTRATE THICKNESS - [R] The nominal material cross section of the base material of a laminated product.

SURFACE RESISTIVITY - [R] (See Sheet Resistivity.)

SWAPPING - [A] The process that exchanges connections from one pin to another pin to improve routing, provided the pins are in the same gate and in the same swap group.

TEMPERATURE COEFFICIENT OF CAPACITANCE - [R] A multiplier which represents the

linear change of a capacitance value per degree change in temperature. It may be positive, negative,

or zero and is usually expressed in parts per million per degree Celsius, or 10"^.

TEMPERATURE COEFFICIENT OF RESISTANCE - [R] A multiplier which represents the lin- ear change of a resistance value per degree change in temperature. It may be positive, negative, or zero and is usually expressed in parts per million per degree Celsius, or 10"^.

TERMINATOR MOUNTING - [A] Metallization pattern on the substrate associated with a film

component. The purpose of the pattern is to indicate the region for electrical connection of the

film component to its connecting traces. TEST - [R] [A] The examination of a product during or after fabrication for conformance to specified criteria for that product.

TEST CONDITION - [R] The specification of the setup needed to carry out a specific test of a

product. Examples include supply voltage, temperature, and initializing signals.

TEST DESCRIPTION - [R] The narrative which is followed in performing the specified test. TEST MAXIMUM - [R] Value of the upper limit of a range of test values.

TEST MINIMUM - [R] Value of the lower limit of a range of test values.

TEST SEQUENCE NUMBER - [R] A number assigned to a test in a series of tests. TEST SYMBOL - [R] Short character sequence that allows easy reference to test such as Vin.

TEST TOLERANCE - [R] The acceptable deviation from the specified test results parameter.

19
Definitions

TEST TYPE - [R] Category of test being performed such as Final, Pre-bum, Qual, Sample.

TEST UNITS - [R] Measurement units of the Test Minimum and Test Maximum values for the

test. TEXT - [R] An ordered sequence of characters (glyphs) to which a meaning is ascribed.

TEXT ATTRIBUTE - [R] The characteristics that describe the appearance of text such as size,

font, slant, layer.

THERMOCOMPRESSION BONDING - [R] The process involving the use of temperature and

pressure to join two materials by interdiffusion across a boundary, (from ISHM Industry Guide,

1990)

THERMOSONIC BONDING - [R] The process involving the use of temperature, pressure and

applied ultrasonic energy to join two materials by interdiffusion across a boundary, (from ISHM

Industry Guide, 1990)

THICK-FILM CIRCUIT - [R] A circuit that is fabricated by the deposition of paste materials

such as screen-printed ceramic material (cermet) pastes on a ceramic substrate, which are fired in a kiln to create permanent circuit patterns.

TOOL - [R] (See Tool Type.)

TOOL DESCRIPTION - [R] A narrative which indicates the use of the implement,

TOOL ID - [R] All information needed to identify uniquely a particular manufacturing

implement—manufactured in-house or purchased. The identification may include, but is not

limited to, the Drawing Number, Revision, Revision Status, Dash Number, Cage Number, and

other product notation.

TOOL TYPE - [R] The name given to a device used, as part of product manufacturing, to accomplish an operation. Examples include the product traveler, a cutting device, or a machine.

THIN-FILM CIRCUIT - [R] Conductive, resistive, or dielectric material, usually less than 50,000

angstroms in thickness, that is deposited onto a substrate by vacuum evaporation, sputtering, or other means, (from MIL-STD-883C, Notice 12)

TRACE KEEPOUT - [R] Symbolic representation of a region (layer-specific) associated with

component which may not be used for trace routing,

TRACE LAYER - [R] The physical layer on which the given trace exists.

TRACE WIDTH - [R] The physical width of the trace segment. The width data is typically used

to control the photoplotter aperture or the pattern generator setting.

TRACE WIDTH TOLERANCE - [R] The allowable range of the dimension across a conductive

hne.

TRIM PATH - [Rl The path made by trimming (using an abrasive or a laser) a component to obtain the design value.

UNITS (e.g., Volt, Meter) - [R] A definite amount or quantity used as a standard of measurement.

USER DEFINED PROPERTIES - [I] Suijctured data describing information that is not

previously defined. This property is often used for information not yet defined for the data

structure.

20
Definitions

USER INFORMATION - [R] Unstructured text information inserted as user comments, such as drawing notes. VACUUM DEPOSITION - The deposition of a metal film onto a substrate in a vacuum by metal

evaporation techniques.

VARIABLE VALUE - [Rl Quantitative data that is associated to a particular named data element.

VENDOR ADDRESS - [R] The postal location of the organization from which items are procured.

VENDOR NAME - [R] The identifying text of the company, which may include the company

division, that supplied materials, equipment, or service.

VIA HOLE - [R] A hole (i.e., a void or passage) through insulating layer (s) used to make a connection (electrical or thermal), but for which there is no intention to insert a component lead or other reinforcing material. The hole may be any shape as defined by a Via Shape.

VIA KEEP OUT - [R] The symbolic representation of a region (layer-specific) associated with a

via where traces cannot exist.

VIA LAYER - [Rl A layer which is used principally (in a CAD system) for placing vias holes.

VL\ LOCATION - [R] The X, Y position on which a via is positioned.

VL\ SHAPE - [Rl The shape of the top view of a via.

VIA SIZE - [Rl The width and length or the diameter of a via.

VOLTAGE ALLOWANCE - [R] A design rule that requires extra spacing between specified

traces (e.g., to allow higher voltages to be carried).

VOLUME RESISTIVITY - [R] The volume resistance between two electrodes (of unit area and

unit distance apart) that are in contact with or embedded in a specimen. The value is the ratio of

the direct voltage applied to the electrodes in proportion to the current between them that is distributed through the volume of the specimen. Usually expressed in ohms per centimeter.

WIRE BOND - [A, Rl A completed wire connection that provides electrical continuity. Bonding

wires are used to connect between component pads, or package pin, or conductive pads on the

hybrid substrate.

WIRE BOND MAX LENGTH - [Rl A design rule—or metric—to limit total length of a wirebond wire, such as 140 mils maximum.

WIRE BOND MIN LENGTH - [R] A design rule—or metric—to limit the least-length parameter

of a wirebond wire, such as 10 mils minimum.

WIRE BONDING - [A] The method used to attach very fine wire to make electrical connections.

WIREBOND SEQUENCE NUMBER - [Rl The number assigned to a wirebond that specifies the

order in which wirebond is to be made.

WIRE SIZE - [R] The diameter of wire, such as 0.8, 1, 5 mils.

21

Information Requirennents

4. INFORMATION REQUIREMENTS AND APPLICATION REFERENCE

MODEL

In this section, hybrid product information needed for the documentation and manufacture of the

end item is described in the Application Reference Model (ARM). In addition, the task of identifying collections (or groupings) of information, termed "units of functionality" or UoFs, are as- sembled into categories and described in section 4.1. In section 4.2.1, the methodology used to convey information and the method's implied constraints, are described. Lastly, in section 4.3, the

results of utilizing the method to capture all of the data entities (i.e., information primitives) as they relate to each other are diagrammed.

It should be noted that information that describes the logical information structures required for

accomplishing the physical implementation of an associated Application Reference Model is called an Application Interpreted Model (AIM) and is found in section 5. The indication of when

the information is used during the overall design and manufacturing process is documented in the

Application Activity Model (AAM) in Appendix A.

4.1. Units of Functionality (UoF)

A single hybrid design file can be used as the source for several different kinds of processes. For

hybrid microcircuit applications, these processes can be functionally grouped within three general

categories. Each category recognizes a different end use for the hybrid design, and each category can be further divided into units of information. These units of information within each of the cat- egories are called Units of Functionally (UoF). Each independent entity in the ARM constitutes a UoF. Further, the child entities of these entities may, together with their existence-dependent entities, be used in a UoF structure. For a view of the relationships between categories. Units of Functionally, and entities, see table 1. The symbol "+" indicates that all child entities apply as well.

Although it is possible to establish a wide variety of categories, each oriented differently and each

perhaps varying in detail, for the purposes of this version of the AP, three functionality categories

are defined:

1. Documenting Drawing; used for the control of hybrid procurement. The drawing contains information and graphics defining the desired package size and shape, the netlist or pin-signal information, the testing waveforms and test conditions, and the environment range over which the hybrid must function. Additional text supplies quality and

procurement information.

2. Photolithography; the information which results in masks or artwork

used for layer depositions or etching.

3. Machine Control; the information which guides the tools into position

and controls the actions at that location. Examples are wirebonders and

component placement machines.

The information for all three categories can originate in a computer aided design (CAD) system.

Or part of the information for any category may be created by manual—non-CAD— means. The

units of functionality defined herein are to be considered semantically constrained by this AP, and

only the CAD information is (syntactically) constrained in the ICES form by the constructs in the

23
Information Requirements

application interpretation model.

All functionality categories which have been originated in a CAD system are capable of being

transmitted to another, or an intermediate CAD system. In this event, much of the information

may be "exchanged" without distinction. For example, a design exchanged between CAD systems may adopt a level of information content that is greater than the Drawing. The receiving

CAD system would benefit by "knowing" the properties and rules defined in the source system in

addition to the product as a drawing graphic.

4.1.1. Unit of Functionality Definitions

The definitions for general terms used in this section are found in section 3.1, and the glossary of

data items of the ARM are found in section 3.2.

4.1.2 UoF and ARM Correspondence

The hybrid product is defined in this AP by a combination of documents (called presentation) and

CAD data (called representation) . The CAD data consists of the screen display data and the product model itself. The ARM reflects the data distinction, where the three categories of functionality

do not. For example, in Category 1 the hybrid product is defined through a drawing, such as a

Specification Conu*ol Drawing. CAD systems may need only to produce a "paper document" intended for human interpretation. Information such as the hybrid schematic and waveforms are presently treated as such drawing data. Category 2 includes the CAD display information such as

the color which a particular CAD-layer used. Category 3 is usually extracted from the CAD model of the product.

Each independent entity in the ARM constitutes a unit of functionality. Further, the child entities

of these entities may, together with their existence-dependent entities, be used in a UoF structure. For purposes of this AP, the following table indicates appropriate units and the entities in the

ARM which are related. The symbol "+" indicates that all child entities apply as well.

Table 1: UoF to ARM Entity Correspondence

UoF Cat. ARM Entities

Bill of Materials 1 Component, Assembly Consumables, Substrate

Package 1 Device Package

Schematic 1 Hybrid Documentation +

Artwork 2 Artwork Geometry +

Padstack Definition 2 Area+, Flashed Geometry, Via Hole, Probe Pad

Panel 3 Panel MultiUp, Hybrid Microelectronic Assembly

Component 3 Hybrid Assembly Component

Wirebond 3 Pin +

24
Information Requirements

4.2 Application Reference Model

The Application Reference Model was created to define the semantics (data and relationships) of

all information needed for the manufacture and documentation of the end item hybrid. The model

may relate to information which is not typically captured during design. Examples are the test en- vironment (text) supplied in a procurement drawing, or the signatures per se found in the drawing

title block. The model does not include data related to enterprise management or to the use of the

hybrid.

4.2.1 Descriptions of the ARM Data Constructs

The following sub-sections define the methods and interpretation of the model to follow and are not intended to provide a tutorial on the subject. For further explanation of the syntax and methods the reader is directed to manuals, information, and tools references available from the IDEFUsers Group, 1900 Founders Drive, Kettering, OH 45420; telephone (513) 259-4702

4.2.1.1 ARM Methods and Language

The ARM is presented in the IDEFjX language. E)EF derives its name from the activity that developed the methodology, the Air Force Computer Aided Manufacturing (ICAM) Definition Program. The program developed several languages. IDEFiX, was developed to model data—the

semantics of information. A data model may be considered as a connecting link between the user's view of the data(referred to as the external schema) and the manner in which the data is stored

in a computer, or database (the internal schema). Common to these two views of the data is a conceptual schema and the data model is the visual presentation of the conceptual schema. In general,

the data model is presented as a series of drawings that contain diagrams and accompanying text. The text forms a glossary that defines the terms used in the diagrams and more fully explains their

relationships and context.

The component parts of an IDEE data model are the entities, their attributes and their relationships

as illustrated in figure 4-1. An entity is an item (an object or an event) about which we wish to keep data. In general rectangles are used to graphically represent entities. If the entity is not

within the scope of the present model, the outline of the entity is dashed, notifying the reader to look elsewhere for the definition of the entity. Each entity box has a name (the entity-class label)

that is given above the rectangle and which is defined in the model glossary.

Attributes of an entity are shown inside the entity rectangle. An attribute will have one value

(instance) for each instance of its entity. Some attributes that uniquely define the instance of an

entity, called keys, are located above a line at the top of the entity rectangle. Keys are of several

types and the general concepts of key migration follow those concepts as used to develop

relational database structures. For example: the key attribute set from the parent entity is propagated downward through the model structure and such instances are called foreign keys.

Attributes that are not keys are located below the horizontal line of the entity rectangle.

The relationships between entities is shown by the lines drawn between them in the model

diagram. The relationship consists of the role and the cardinality. Text associated with the

interconnecting lines provides a clear meaning (the role or predicate) of the relationship between

the entities. One end of the line is connected to the entity rectangle denoting that this entity is the

independent entity. At the other end of the line, the dependent entity end, a terminator symbol (a

25
Information Requirements

DEFINED FUNCTIONAL UN T

DEFINED FUNCTIONAL PORT

Functional Unit ID (FK)

Port ID

PARENT ENTITY

The entity box may

be "square-cornered",

indicating the entity

is identificationindependent in the

model (see 4.2.2.2.).

ROLE: a verb that

describes the relationship of the parent

to the child

CHILD ENTITY

Figure 4-1. Component Parts of an IDEF Relationship.

"big dot") may carry cardinality information on how to read the model as in figure 4.2. If there is no letter adjacent to the terminator symbol, there may be "zero, one or many" entities associated

with the relationship. Likewise, the letter Z designates "exactly zero or one," P designates "one or many," and the letter n designates some exact integer number of occurrences.

i t 4 z , Pi

n

Figure 4-2. Cardinality.

Lastly, models may contain information that denote the "categorization" or types-of entities as diagramed in figure 4-3. Each instance of the generalization parent must be one of the types. A

double horizontal bar indicates that all types of dependent entities are present (for example, all people are either male or female). If all of the various types of entities are not listed (the model

equivalent to a written ellipsis (...)), then a single horizontal bar is used to show that there may be

relationships not shown and the categorization is assumed to not be complete.

A related pair of entities are read, that is, retrieved as an English sentence, in the form of an

assertion. The pair may be read in both directions. From the top down (i.e., toward the entity at the

big dot end of the relation line), the set is read as the independent entity, the relation label, and

26
Information Requirements

then the dependent entity. From the bottom up, the usual relation is "always has exactly one."

Figure 4-3. The Categorization Structure.

Additional details may be obtained that will enable those who are interested in working with

IDEF to become more proficient at reading the models. Several good references are available. ^' ^

4.2.2 Data Construct Definitions

The definitions of entities for the Hybrid Microcircuit ARM are found in section 3.2.

4.2.2.2 Data Construct Assertions

The method and language (IDEFiX) used for this AP ARM carries several assertions important to the interpretation and application of the ARM.

Attributes: All attributes which appear within the entity box exist whenever an

instance of the entity occurs, unless designated by the (null OK) notation.

Relationships: The ARM is intended to be interpreted independently of any computer database structure. Thus the entities may be considered as representing objects in an Object Oriented (00) system, or as tuples in a Relational system. As such, the keys have not been migrated as re- quired by relational notation. The relationships (connecting lines)

^' Parks, Curtis H., "Tutorial: Reading and Reviewing the Common Schema for Electrical Design and Analysis,"

presented at the 24* Design Automation Conference.

^- Loomis, Mary E. S., "Data Modeling - The IDEFIX Technique," Proceedings of the IEEE. 1976 Phoenix

Conference on Computers and Communications, Phoenix, AZ, (March 26-28, 1986) pp. 146-149.

27
Information Requirements

may be used to define 00 methods, or to migrate relational foreign

keys. The entity at the attached end of a relationship line is considered the parent of the two entities. The following dependencies apply to the parent-child relation.

Existence Dependencies: The existence of a relationship (line) indicates that, should an instance of the child entity exist (at the "cardinality" end), the related

parent must exist. An example of this dependency from the ARM is that: A Layer instance cannot exist unless a Hybrid Microcircuit

Assembly Version exists.

Identification Dependencies: In addition to the existance dependency above, if the relationship is a solid line, the unique identification of the child requires the key of

the parent in addition to the key declared in the child. An example is the Layer instance can only be uniquely identified by knowing the

hybrid it "belongs" to. Round comers are used on an entity-box to indicate that there exists a parent entity which provides some of the key for identification.

For entity-boxs with square corners, all of the entity's key is owned

by the entity; the entity exists independently within the given domain of the model.

4.2.3 ARM Diagrams

The ARM is intended to be an enterprise- view of the information about the hybrid as a product.

The ARM serves as a reference-point for the data implementation as captured in drawings, in the

CAD system, and specified for IGES exchange in the next section.The ARM diagrams (views)

constitute an information model that documents the information structures needed to support the

activities in the Application Activity Model (AAM) and to develop the corresponding IGES

Application Interpreted Model (AIM).

28
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34
Application Interpreted Model

5. IGES APPLICATION INTERPRETED MODEL

The Application Interpreted Model (AIM) is an information model that describes the logical

information structures required for accomplishing a physical implementation of an associated

application reference model. The AIM is prepared at a level of abstraction that is sufficient for

selecting the necessary IGES^ entities for an appUcation protocol.

The scope of this AIM is currently limited to LEP information contained in electronic computeraided design (ECAD) design systems. These systems are in widespread use and translation

between dissimilar systems is a high priority in the user community. IGES serves as the implementation for this information because most ECAD suppliers are familiar with the specification

and support it in their software packages.

A broader scope for this AP that includes manufacturing, test, simulation, behavior and documentation is desired by users and manufacturers of LEPs. Much of this information is outside the

scope (see also Abstract) of most ECAD systems and the IGES specification.

The graphical constructs of the AIM are presented in section 5.2 followed by the AIM diagrams in

section 5.3. The AIM diagrams are divided into subsections as follows:

5.3.1 Interface Interface object models are defined in this section. Each interface

object model represents a "view" or "perspective" of an LEP in which

one can exchange data. They describe the set of independent entities

(DE Attribute - Subordination Status equals 0) that are in an IGES file which describe some aspect of an LEP. There are currently three interface objects; LEP Part Library IGES File, LEP Physical Layout IGES

File and LEP Technical Illustration IGES File. Future interface objects

might be LEP Schematic IGES File or LEP Manufacturing IGES File.

5.3.2 LEP Specific This section defines objects that are unique and specific to LEPs.

5.3.3 Display Geometry This section defines object that are common to any CAD/CAM system

that utilizes 2-dimensional geometry.

5.3 4 Miscellaneous This section defines subordinate objects which when used in combination represent an LEP specific object.

5.3.5 DE Referenced This section defines objects that are only referenced from the DE section of another object.

5.3.6 DE Section This section defines value objects that represent pre-defined DE section

values.

In order to conform to this AIM an ECAD system must be capable of reading and writing files that

conform to the entire LEP Physical Layout IGES File interface model. It is appropriate to support

all interface models, but it is not necessary in terms of conformance.

n This section depends on the IGES document cited in section 2 for definitions and explanations of the for- mat structure and the entities cited.

35
Application Interpreted Model

5.1 ARM to AIM Mapping

The ARM is an information model that documents the information structures of the subject application and provides the baseline from which candidate interpreted models are developed. For an IGES AP, the ARM is then used to develop the corresponding IGES Application Interpreted Model (AIM). The AIM shows how the information content from the ARM is to be expressed by a subset of IGES entities. Annotated outside the AIM object boxes are the ARM entities which provided the requirement. (Note: The reader should not infer a one-to-one mapping.)

The IGES entities selected for use in the AP specification should be selected to minimize the size

of files. The options for the use of the entities within this subset must be restricted so that only one method is available for carrying each element of information from the ARM. The set of IGES entities and the necessary restrictions on the Global, Directory Entry, and Parameter Data Section

field values are developed by using the ARM and the AIM.

5.2 IGES Structure and Syntax of the Application Interpreted Model

5.2.1 IGES File Structure

The following is the brief review of the IGES file structure from a predecessor^ to this document:

"IGES provides format guidance for data transfer/archive. It defines several data structures or entities, whose pre-defined purpose may be geometry, annotation, or structure. The individual vendor can then map information contained in his proprietary database

into this neutral format, then transfer that information to other vendor's applications, or archive the file for future use. IGES is fully three dimensional, and includes finite element, graphics, documentation/annotation, manufacturing and electrical entities.

The transfer medium is typically a nine-track magnetic tape. The transfer mode will commonly be character (ASCII) although binary is supported. The logical record length is 80

characters (block to 800 on tape) and is formatted for human readability and interaction.

The advantage of the ASCII format are at the sacrifice of file size. However, there are stan- dard file compression algorithms which may be used to achieve great reductions in file size, but the compressed files must be decompressed prior to translation. Also see ANSI

X3.27-1978 labeled variable block.

The IGES data file structure consists of five sections. The start section, contains 72 columns of user comments which are not to be processed by the program other than listing to screen or printer. Next is the global section, a free format area specifying certain file at- tributes such as creation date, time, location, designer, units, display resolution, etc. The

third section is the Directory Entry (DE) section containing fixed format attribute data

(level, pen, translation, view, etc.) for each entity. The Parameter Data (PD) section fol- lows and contains actual parameters for each of the entities in the DE section. Finally, the

lerminate section contains a single record containing the count of the records in each secL. O'Connell, ed.,"Guide to the IGES Electrical Entities," unpublished, available from the IPO Office,

Hldg 220, Rm A 127, Gaithersburg, MD 20899, EACP-2.3 June 24, 1989; Appendix E.

36
Application Interpreted Model

tion. The entities come in two classes, those that are pre-defined and documented by the

IGES committee (numbers 0001 to 5000), and those that are implementor definable (5001

to 9999). The constructs for a vahd IGES file must conform to those specified in the current version of the IGES Specification."

5.2.2 Global Values and Entities List

The following are IGES constructs that are used to fulfill the requirements of the AIM (View 4)

for hybrid microelectronics technology. The IGES entities have been selected to ensure the constructs uniquely attributable to a hybrid product will be correctly transferred when they are postprocessed. Other entities defined in the IGES Specification may be used for other purposes,

however, these other entities should not be used for the purposes stated in the AIM. Parenthetical

statements that follow the entities guide the reader to the relationships defined in the AIM. The

IGES Specification should be consulted for the details of the syntactical constructs needed to produce valid IGES files.

Globals: (these are used to identify general product-file attributes)

Global No. Description

3 Product identification from sending system

4 File name

5 System identification

12 Product identification for the receiving system

13 Model space scale

14 Unit flag

15 Units

21 Name of author

22 Author's organization

25 Date and time the model was created or last modified

IGES Entities used in the AIM:

The following categories for IGES documented entities are utilized within this AIM. Individual

object definition models in the AIM contain usage restrictions (i.e., usage constraints) appropriate

to the application. Please refer to the IGES document (version 5.1 or later) for detailed information regarding these entities. The Status field specifies the current status of the entity. Apphcable

values are; Standard The entity currently exists and does not need to be modified to be used within this

AIM.

Gray The entity currently exists and does not need to be modified to be used within this

AIM. However, the entity is currently in the grey pages (approved, but untested) of

the IGES document.

RFC The entity is either new or it needs to be modified, however, an existing RFC which

37
Application Interpreted Model

describes the changes has akeady been submitted and is in the ballot process.

Description

Circular Arc

Composite Curve

Conic Arc

Copious Data - Planar Piecewise Linear Curve

Copious Data - Simple Closed Planar Curve

Line

Parametric Spline Curve

Point

Transformation Matrix

Predefined Planar Shape

Rational B-Spline Curve

Connect Point

General Note

Subfigure Definition

Text Display Template

Color Definition

Network Subfigure Definition

Attribute Table Definition

Group - Unordered With Back Pointers

Group - Ordered With Back Pointers

Flow Associativity

Net Connection Associativity

Property - Definition Levels

Property - Region Restriction

Property - Line Widening

Property - Part Number

Property - Name

Property - Hierarchy

Property - Level to LEP Layer Map

Property - LEP Substrate Hole Property

Property - Generic Data

Property - LEP Object Type/Sub-Type

Property - Region Fill Property - LEP Component Placement Boundary

Property - Definition Extents

Property - LEP Fixed Component Placement

New The entity is new £ Modified The entity exists, h $mtus typ^ Fprm

Standard 100

Standard 102

Standard 104 1-3

Standard 106 11

Standard 106 63

Standard 110

Standard 112

Standard 116

Standard 124 0-1

Modified 125 AU

Standard 126 0-5

Standard 132

Standard 212 0,1,6,7&8

Standard 308

Standard 312 1 Standard 314

Standard 320

Modified 322 0-2

Standard 402 1 Standard 402 14

Modified 402 18

New 402 5xxx

Standard 406 1 Modified 406 2

Modified 406 5

Standard 406 9

Standard 406 15

Standard 406 10

Modified 406 24

Modified 406 26

Grey 406 27

Modified 406 5xxx

New 406 5xxx

New 406 5xxx

RFC 406 5xxx

New 406 5xxx

38
Application Interpreted Model

New 406 5xxx

New 406 5xxx

Standard 408

RFC 408 1 Standard 420

RFC 420 1 Standard 422 0-1

New 5xxx

New 5xxx

New 5xxx

New 5xxx

RFC 5xxx

Property - LEP Physical Layer Description

Property - Instance Level Display

Subfigure Instance

Modified Subfigure Instance

Network Subfigure Instance

Modified Network Subfigure Instance

Attribute Table Instance

Object Locator

Planar Composite Area

Electronic Component Definition

Electronic Function Definition

Modified Entities Definition

A some of the AIM entities are specific to a particular product type. These are listed below.

Hybrid Microcircuit Entities

Laser Trim Path

LEP Definition - Electrical Attributes

Package Symbol Definition - Electrical Attributes

Package Symbol Instance - Electrical Attributes

Wirebond

Printed Circuit Board Entities

Machined Hole

Machined Hole Figure Associativity

Machined Hole Figure Definition

Machined Hole Figure Instance

5.2.3 Basic Syntax used in the AIM

A graphic notation has been adopted to describe the IGES data structures.The objective of these

diagrams is the ease of developing unambiguous IGES translators and proof-reading files. The

notation is not intended for use as a conceptual modeling language. The brief descriptions which

follow explain the use of principal elements of the notation; the Object Definition Block, the

Object Instance Block, the Object Value Block, and the Cardinality code.

5.2.3.1 Object Definition Block

The Object Definition Block is used to define an IGES entity type, form, directory entry values,

parameter data values, and relationships to other IGES entities. There are several forms of the

39
Application Interpreted Model

Object Definition Block depending upon how the object is being used within the model.

Each Object must be defined at least once using the Object Definition Block.

The graphic in Figure 5-1 is used to define data, and relationships to other objects, for a particular

object (usually a UoF). The graphic specifies the field name and required value(s)—if appropriate—for a particular field within the definition or instance of an object. This corresponds to the

IGES Parameter Data Section. A Value Block can be referenced by either a Object Definition

Block or a Object Instance block.

Cardinality for

reference

Logical reference

Logical reference

required backpointers

Physical reference

IGES Entity

Type number"

PHY LOG LOG WBP

Object

DE

References to Directory Entry

values

PD

FORM

#

AP PP

IGES Entity Form

number

•References to property and/or

attribute entities

References to Parameter Data

values

References to associated entities

Figure 5-1. IGES Object and Referencing.

5.2.3.2 Object Instance Block

The graphic in Figure 5-2 defines a particular reference to a previously defined object. The long

form is available if the particular instance needs to reference property, attributes, and/or associa40
Application Interpreted Model

tivity entities.

PHY LOG LOG WBP

Object

The object's source in the ARM

Short Form

X X X

PHY LOG LOG WBP

Object

DE PD AP PP

''^

ARM entity/attribute

(ARM entity/attribute)

The object is derived from

this ARM source

Long Form

References to Property and/or

attribute entities

References to associated entities

Figure 5-2. References to Previously Defined Object.

5.2.3.3 Object Value Block

The graphic in Figure 5-3 specifies the field name and required value(s), if appropriate, for a particular field within the definition or instance of an object. This corresponds to the IGES parameter

data section.

The Value Definition Block is used to define a set of either directory entry values or parameter

data values, which are used for a number of different objects.

A Value Block can be referenced by either a Object Definition Block or a Object Instance Block.

Value

Field value is appropriate

Any acceptable value

Pointer to a predefined Instance Block

Value or pointer to a predefined Object Instance Block

Value will be ignored

Index Name Value

1 namel Value

2 name2 *

3 name3 => 4 name4 value |=>

5 name5 N/A

... name... ...

Figure 5-3. Object Field Value Restrictions.

41
Application Interpreted Model

5.2.3.4 Object Reference Mechanism

The Object Definition Block and Object Instance Block can both reference subordinate/child

objects. Each object can reference a subordinate object through either the directory entry, parameter data, associativity backpointer or property pointer fields as shown in Figure 5-4. The subordinate objects can be referenced by either a physical, logical, or logical with backpointer, pointer

mechanism. The representation cardinality indicators are shown in Figure 5-5.

Directory Entry Values Parameter Data Values

Associativity Backpointer Values

Property Pointer Values

DE PD AP PP

1 The pointer field that is referencing the object must be

identified unless a Value Definition Block is being used.

1 DE Values

*c

1 •c

Physical -ogical LogW/BP

PD Values

Logically subordinate objects which require

a backpointer from a referenced object.

For brevity and clarity, this is not explicit.

NAME VALUE

•

N/A

=> Logically Subordinate Objects

Physica liyi5ubordinate Objects3

Figure 5-4. Reference Mechanism.

OBJECT NAME

Any one of

the branches

OBJECT NAME

Cardinality

applies to

all of the branches T

<>

OBJECT NAME

All of the branches

OBJECT A

is represented

by exactly one

Parameter Data Values: VALUE - exactly the value specified

* - any acceptable value N/A - value will be ignored =* - Pointer to another entity

*C = Cardinality:

null - Zero, 1, or many

Z - Zero <x One P - Positive Number

n - exactly n times

OBJECT B

note: Object A represents an "object-type"

entity or otype. Object B represents an "object

sub-type entity or stype.

Figure 5-5. Representation Mechanism.

42
Interface Object Models

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6. IMPLEMENTATION AND CONFORMANCE TESTING

GUIDELINES

The successful exchange of information using an IGES AP requires the participating organizations to establish information configuration control and software configuration control procedures

for their product data creation and exchange systems It must be understood that the use of IGES

AP's will in many cases require organizations to revise their policies and procedures for the creation, exchange, and archival storage of product data. The successful use of an IGES appHcation

protocol also requires that the participating IGES processors conform to the AP specification. The

purpose of conformance testing is to increase the confidence that different implementations of the

AP will be able to exchange information successfully. This AP requires that the functionality of

the hybrid constructs of the ARM be preserved in the translation into and out of the IGES format.

Therefore, the CAD system for which the processors are being tested must provide this minimum

level of functionality for modeling hybrid systems. In addition, the processors must completely

support the functionality defined in the AIM section.

Due to the complexity of this AP, it is not feasible to conduct exhaustive testing of processors for

all possible combinations of AP constructs. The conformance testing requirements described in

this section cover all constructs of the ARM. The enumerated test groups (sec 6.3) are not

exhaustive (i.e., they do not cover all possible combinations of ARM and AIM constructs)

although the commonly encountered information required for transfer is present.

6.1 PROCESSOR CONFORMANCE REQUIREMENTS

The conformance requirements for implementations of this AP are enumerated as follows: 1 .) All

IGES files created by an AP compliant preprocessor shall conform to the IGES specification. Version 5. 1 and to the constructs specified in this AP. An AP compliant preprocessor shall convert

hybrid information of the ARM into the IGES constructs specified in the AIM, with all the

required attributes and values. The functionality defined for each construct of the ARM shall be

preserved. 2.) An AP compliant postprocessor shall interpret files that conform to the IGES constructs specified in this AP. It shall also convert each construct of the AIM into native consfiiicts

which match the geometry, attributes, and relationships of the hybrid constructs specified in the

ARM. The functionality of the hybrid constructs shall be preserved.

Development and use of the IGES AP Absfi-act Test Suite is divided into several Test Groups

(TG). Each test group contains discrete Test Purposes (TP). ATP defines the objective of an

abstract test case. For a preprocessor, the TP begins with "to test the generation of a(n)...". For a

post processor the TP begins with "to test the interpretation of a(n)...". An abstract test case is required for the preprocessor and postprocessor. An abstract test case is derived from a TP and is written in a formal language. When parameter values are provided for the constructs in the

abstract case, it can be used to generate an executable test case. An abstract test case contains:

TP; test case identifier; reference to specific parts of the AP; definition of constructs required to exercise the TP; statements indicating the consti*uction sequence; and verdict criteria. Abstract

test cases are documented in non-system specific procedures and are used to produce comparable

results from the conformance testing of multiple implementations.

An executable test case is derived from an abstract test case and is in a form which allows it to be

163
Implementation

An executable test case is derived from an abstract test case and is in a form which allows it to be

run on the implementation under test. An executable test case contains some or all of the following; TP; test case indentifier, reference to specific parts of the AP; constructs required to exercise

the TP together with their associated parameter values; a test script defining the construct

sequence; verdict criteria; an IGES file for postprocessor conformance testing; and a pictorial representation of the populated constructs.

6.2 Test Purposes

The Test Groups in this section each have unique test purposes. The purposes indicated below are general, and are not intended to constrain testing to other possible purposes.

Test Group 1 : Product Drawing

Purposes for this test are to assure that IGES files containing 2-Dimensional drawings can be

transfered and both systems participating in the testing produce printed documentation which:

1. contains the identical text, and similar text font, spacing, and text characteristics;

2. contains the same graphics, similar in shapes and appearance, with identical dimensioning

numerics, notes text, and waveform and other charted notation labeling;

3. and in general, can be considered equivalent in ability to communicate man-readable product definition for purposes of specification drawings.

Test Group 2: Photolithography; consisting of numerically-expressed geometry

Purposes for this test are to assure that IGES files containing 2-Dimensional geometry can be

transfered and both systems participating in the testing produce photographic artwork which:

1. contains tooling marks (fiducials) which can be superimposed to a visual (unaided) accu- racy acceptable for the product type;

2. contains computer-generated feature patterns which match in shape and placement to a

visual (unaided) accuracy acceptable for the product type;

3. contains traces which match in width and placement to a visual (unaided) accuracy acceptable for the product type;

4. contains solid-filled areas which match in shape and placement to a visual (unaided) accu- racy acceptable for the product type;

5. contains text characters (usually used for part identification/labeling) which are identical in

text, and similar in character size and placement acceptable for the product type.

Test Group 3: Machine Control; parametric data used for numeric control of machine operations

Purposes for this test are to assure that IGES files containing product models can be transfered

and both systems participating in the test, which are capable of post-processing information

for the same numerically controlled machines, will produce control data that results in the

same set of machine actions.

Test Group 4: CAD System to CAD System Transfer

Purposes for this test is to assure that IGES files can by read by another CAD system with the

originating CAD system's non-product attributes retained in the receiving system. All of the

contents of Test Groups 1 through 3 are not to be considered in this Test Group. CAD

164
Implementation

6.3 Enumerated Application Protocol Test Groups

Complete testing to this AP shall consist of testing for each of the test purposes in each of the test groups except for the Technical Illustrations IGES file which will only require Test Group one.

Test Group 1 : Product Drawing

Requirements for this test are equivalent to the requirements specified for 2-Dimensional

drafting application protocols. All entities listed in Display Geometry of section 5 are included

for this test case. In the event of conflict in general requirements, such drafting specifications

shall take precedence. In addition to general drafting test requirements, the following test subgroups shall be specifically included.

TG 1.1 Schematic: The details of gate symbols, lines (including bus-lines), signal

labels, and miscellaneous symbols found on a schematic graphic.

TG 1.2 Bill of Materials; Tabular information needed for assembly of parts.

TG 1.3 Top Assembly View; includes substrate and component outlines.

Test Group 2: Photolithography; consisting of numerically expressed geometry including

TG 2.1 Rashed Pads; location, apermre code, size needed by photoplotter systems

TG 2.2 Trace lines; Inflection point coordinates and width information

TG2.3 Polygon-Bound Area; corner point coordinates and fill information

TG 2.4 Tooling Marks; Shape and centering datum coordinates

TG 2.5 Artwork Text; stroking data for text and line weight

Test Group 3: Machine Control; parametric data used for numeric control of machine operations

TG 3.1 Wirebond; end type and location coordinates, assigned net (signal) identification

TG 3.2 Component Pick-and-Place; component centering coordinate, orientation, force

and depth

TG3.3 Machine Metrics; machine operational behavior

Test Group 4: CAD to CAD Design Presentation Attributes

TG 4. 1 CAD Layer assignments; including unrouted signals layer

TG 4.2 CAD Object Display Colors;

TG 4.3 Correspondence Tables;

165

APPENDIX A. HYBRID APPLICATION ACTIVITY

MODEL

A. ACTIVITY MODEL CONTENTS

A-0 Model Context

AO Manage and Manufacture Hybrids

AO Text Text: Manage and Manufacture Hybrids

A2 Perform Engineering

A2 Text Text: Perform Engineering

A3 Assure Product Quality

A3 Text Text: Assure Product Quality

A32 Perform Quality Appraisal

A32 Text Text: Perform Quality Appraisal

A4 Produce Hybrids

A4 Text Text: Produce Hybrids

A41 Build Networks

A41 Text Text: Build Networks

A42 Assemble Devices

A42 Text Text: Assemble Devices

A43 Test Hybrid

A43 Text Text: Test Hybrid

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B: Technical Discussions

APPENDIX B

TECHNICAL DISCUSSIONS

B.l. A Primary Parent for the ARM

View 4-1 contains seven independent entities, as opposed to most models which have a single in- dependent entity. The multiple independent entity situation was recognized in the early STEP

modeling, with one of these models proposing the Enterprise as the single independent parent.

The MicroCIM team has discussed adding such an entity, however did not do so because the

scope defined for the model does not require such a model refinement. It was recognized that each

ARM independent entity employs "ID" in the key. ID is defined in the section 3 Glossary to include data which uniquely identifies the source or owning enterprise. Thus an Enterprise parent is implied.

B.2. Netlist Information

The Net entity on ARM View 4-3 has been recognized as derived information. Typically the Net

consists of a Signal Name with the Reference Designators and Pin Numbers to be associated (i.e., connected) with that signal. The source of Net information is the functional design of the circuitry as presented by a schematic. The Schematic in any particular product design may have been

"back-annotated" with net list information from the package design. The Schematic entity itself

has not been decomposed into its fundamental entities in this version of the ARM.

B.3. Multiple Planning for a Product

The association of Process information with the Product model presents a problem when "re-planning" takes place. This would occur if the product is not completely processed to a single process

definition (e.g., second sourcing or reprocurement). The team view is that the model provides a place for a particular user to record his planning information. Should the Product data be relocated, the site-specific planning would not be populated, and may be re-defined at the next cite.

B.4. Producibility Feedback

The use of "producibility" data in a concurrent engineering situation requires much more attention. As yet the team has discovered no commonly agreed to model of how things like "cost penalties for non-standard designs" or "more easily manufactured trade-offs" are to be placed into a database which engineering could access during layout. These sorts of dispositions seem to take

place during "producibility reviews" which requires the knowledge of experienced operations

people. As a starting point for capturing such information, several kinds of Rules have been included in the ARM.

B.5. Quality

Much of the AppHcation Activity Model (AAM) has been reworded and modified to reflect the use of Total Quality Management (TQM) and Quality Funcdon Deployment (QFD) being practiced. The team expects new attributes will be required for some of the ARM entities.

187

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