Handbook of Frequency

Stability Analysis

W.J. Riley

NIST Special Publication 1065
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T 
NIST Special Publication 1065

Handbook of Frequency 

Stability Analysis 

W.J. Riley 

Under contract with: 

Time and Frequency Division 

Physics Laboratory 

National Institute of Standards and Technology 

325 Broadway 

Boulder, CO 80305 

July 2008 

 U.S. Department of Commerce 

Carlos M. Gutierrez, Secretary 

National Institute of Standards and Technology 

 James M. Turner, Deputy Director 
Certain commercial entities, equipment, or materials may be identified in this document in order to describe an 

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endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the entities, 

materials, or equipment are necessarily the best available for the purpose. 

National Institute of Standards and Technology Special Publication 1065 

Natl. Inst. Stand. Technol. Spec. Publ. 1065, 136 pages (July 2008) 

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Mail: Stop SSOP, Washington, DC 20402-0001 
iii 

Dedication 

This handbook is dedicated to the memory of Dr. James A. Barnes (1933−2002), a pioneer in the statistics of 

frequency standards. 

James A. Barnes was born in 1933 in Denver, Colorado. He received a Bachelor’s degree in engineering physics from 

the University of Colorado, a Masters degree from Stanford University, and in 1966 a Ph.D. in physics from the 

University of Colorado. Jim also received an MBA from the University of Denver. 

After graduating from Stanford, Jim joined the National Institute of Standards, now the National Institute of Standards 

and Technology (NIST). Jim was the first Chief of the Time and Frequency Division when it was created in 1967 and 

set the direction for this division in his 15 years of leadership. During his tenure at NIST Jim made many significant 

contributions to the development of statistical tools for clocks and frequency standards. Also, three primary frequency 

standards (NBS 4, 5, and 6) were developed under his leadership. While he was division chief, closed-captioning was 

developed (which received an Emmy award) and the speed of light was measured. Jim received the NBS Silver Medal 

in 1965 and the Gold Medal in 1975. In 1992, Jim received the I.I. Rabi Award from the IEEE Frequency Control 

Symposium “for contributions and leadership in the development of the statistical theory, simulation and practical 

understanding of clock noise, and the application of this understanding to the characterization of precision oscillators 

and atomic clocks.” In 1995, he received the Distinguished PTTI Service Award. Jim was a Fellow of the IEEE. After 

retiring from NIST in 1982, Jim worked for Austron. 

Jim Barnes died Sunday, January 13, 2002, in Boulder, Colorado after a long struggle with Parkinson’s disease. He 

was survived by a brother, three children, and two grandchildren. 

Note: This biography is published with permission and taken from his memoriam on the UFFC web site at: 

http://www.ieee-uffc.org/fcmain.asp?page=barnes. 
iv 

Preface 

I have had the great privilege of working in the time and frequency field over the span of my career. I have seen 

atomic frequency standards shrink from racks of equipment to chip scale, and be manufactured by the tens of 

thousands, while primary standards and the time dissemination networks that support them have improved by several 

orders of magnitude. During the same period, significant advances have been made in our ability to measure and 

analyze the performance of those devices. This Handbook summarizes the techniques of frequency stability analysis, 

bringing together material that I hope will be useful to the scientists and engineers working in this field. 

______________________ 

I acknowledge the contributions of many colleagues in the Time and Frequency community who have contributed the 

analytical tools that are so vital to this field. In particular, I wish to recognize the seminal work of J.A. Barnes and 

D.W. Allan in establishing the fundamentals at NBS, and D.A. Howe in carrying on that tradition today at NIST. 

Together with such people as M.A. Weiss and C.A. Greenhall, the techniques of frequency stability analysis have 

advanced greatly during the last 45 years, supporting the orders-of-magnitude progress made on frequency standards 

and time dissemination. 

I especially thank David Howe and the other members of the NIST Time and Frequency Division for their support, 

encouragement, and review of this Handbook. 

 
v 

Contents 

1 INTRODUCTION .................................................................................... 1

2 FREQUENCY STABILITY ANALYSIS ................................................ 2

2.1 Background ....................................................................................................................................................................................... 2

3 DEFINITIONS AND TERMINOLOGY .................................................. 5

3.1. Noise Model ......................................................................................................................................................................................... 5

3.2. Power Law Noise ................................................................................................................................................................................. 5

3.3. Stability Measures ................................................................................................................................................................................ 6

3.4. Differenced and Integrated Noise ........................................................................................................................................................ 6

3.5. Glossary ............................................................................................................................................................................................... 7

4 STANDARDS........................................................................................... 8

5 TIME DOMAIN STABILITY .................................................................. 9

5.1. SIGMA-TAU PLOTS .................................................................................................................................................................................... 9

5.2 VARIANCES ............................................................................................................................................................................................. 10

5.2.1. Standard Variance .......................................................................................................................................................................... 13

5.2.2. Allan Variance ............................................................................................................................................................................... 14

5.2.2. Overlapping Samples ...................................................................................................................................................................... 15

5.2.4. Overlapping Allan Variance .......................................................................................................................................................... 16

5.2.5 Modified Allan Variance ................................................................................................................................................................ 17

5.2.6. Time Variance ................................................................................................................................................................................ 18

5.2.7. Time Error Prediction .................................................................................................................................................................... 19

5.2.8. Hadamard Variance ....................................................................................................................................................................... 20

5.2.9. Overlapping Hadamard Variance .................................................................................................................................................. 20

5.2.10. Modified Hadamard Variance ........................................................................................................................................................ 21

5.2.11. Total Variance ................................................................................................................................................................................ 23

5.2.12. Modified Total Variance ................................................................................................................................................................. 25

5.2.13. Time Total Variance ....................................................................................................................................................................... 26

5.2.14. Hadamard Total Variance .............................................................................................................................................................. 26

5.2.15. Thêo1 .............................................................................................................................................................................................. 29

5.2.16. ThêoH ............................................................................................................................................................................................. 31

5.2.17 MTIE ............................................................................................................................................................................................... 33

5.2.18. TIE rms ........................................................................................................................................................................................... 34

5.2.19. Integrated Phase Jitter and Residual FM ....................................................................................................................................... 34

5.2.20. Dynamic Stability ............................................................................................................................................................................ 36

5.3. CONFIDENCE INTERVALS ......................................................................................................................................................................... 37

5.3.1. Simple Confidence Intervals .......................................................................................................................................................... 37

5.3.2 Chi-Squared Confidence Intervals ................................................................................................................................................. 38

5.4. DEGREES OF FREEDOM ............................................................................................................................................................................ 38

5.4.1. AVAR, MVAR, TVAR, and HVAR EDF .......................................................................................................................................... 38

5.4.2. TOTVAR EDF ................................................................................................................................................................................. 41

5.4.3. MTOT EDF ..................................................................................................................................................................................... 41

5.4.4. Thêo1 / ThêoH EDF ........................................................................................................................................................................ 42

5.5. NOISE IDENTIFICATION ............................................................................................................................................................................. 43

5.5.1. Power Law Noise Identification ...................................................................................................................................................... 43

5.5.2. Noise Identification Using B1 and R(n) ........................................................................................................................................... 44

5.5.3. The Autocorrelation Function ......................................................................................................................................................... 44

5.5.4. The Lag 1 Autocorrelation .............................................................................................................................................................. 45

5.5.5. Noise Identification Using r1 ........................................................................................................................................................... 45

5.5.6. Noise ID Algorithm ......................................................................................................................................................................... 46

5.6. BIAS FUNCTIONS ...................................................................................................................................................................................... 48

5.7. B1 BIAS FUNCTION ................................................................................................................................................................................... 48

5.8. B2 BIAS FUNCTION ................................................................................................................................................................................... 48

5.9. B3 BIAS FUNCTION ................................................................................................................................................................................... 49

5.10. R(N) BIAS FUNCTION ........................................................................................................................................................................... 49

5.11. TOTVAR BIAS FUNCTION ................................................................................................................................................................... 49
vi 

5.12. MTOT BIAS FUNCTION ........................................................................................................................................................................ 49

5.13. THÊO1 BIAS ......................................................................................................................................................................................... 50

5.14. THÊOH BIAS ........................................................................................................................................................................................ 50

5.15. DEAD TIME .......................................................................................................................................................................................... 51

5.16. UNEVENLY SPACED DATA .................................................................................................................................................................... 54

5.17. HISTOGRAMS........................................................................................................................................................................................ 55

5.18. FREQUENCY OFFSET ............................................................................................................................................................................. 56

5.19. FREQUENCY DRIFT ............................................................................................................................................................................... 57

5.20. DRIFT ANALYSIS METHODS .................................................................................................................................................................. 57

5.21. PHASE DRIFT ANALYSIS ....................................................................................................................................................................... 57

5.22. FREQUENCY DRIFT ANALYSIS .............................................................................................................................................................. 58

5.23. ALL TAU .............................................................................................................................................................................................. 59

5.25. ENVIRONMENTAL SENSITIVITY ............................................................................................................................................................. 60

5.26. PARSIMONY.......................................................................................................................................................................................... 61

5.27. TRANSFER FUNCTIONS ......................................................................................................................................................................... 64

6 FREQUENCY DOMAIN STABILITY .................................................. 67

6.1. NOISE SPECTRA ........................................................................................................................................................................................ 67

6.2. POWER SPECTRAL DENSITIES ................................................................................................................................................................... 68

6.3. PHASE NOISE PLOT .................................................................................................................................................................................. 69

6.4. SPECTRAL ANALYSIS ................................................................................................................................................................................ 69

6.5. PSD WINDOWING .................................................................................................................................................................................... 70

6.6. PSD AVERAGING ..................................................................................................................................................................................... 70

6.7. MULTITAPER PSD ANALYSIS ................................................................................................................................................................... 70

6.8. PSD NOTES.............................................................................................................................................................................................. 71

7 DOMAIN CONVERSIONS ................................................................... 73

7.1. POWER LAW DOMAIN CONVERSIONS ........................................................................................................................................................ 73

7.2. EXAMPLE OF DOMAIN CONVERSIONS ....................................................................................................................................................... 74

8 NOISE SIMULATION ........................................................................... 77

8.1. WHITE NOISE GENERATION ...................................................................................................................................................................... 78

8.2. FLICKER NOISE GENERATION ................................................................................................................................................................... 78

8.3. FLICKER WALK AND RANDOM RUN NOISE GENERATION .......................................................................................................................... 78

8.4. FREQUENCY OFFSET, DRIFT, AND SINUSOIDAL COMPONENTS ................................................................................................................... 78

9 MEASURING SYSTEMS ...................................................................... 80

9.1. TIME INTERVAL COUNTER METHOD ......................................................................................................................................................... 80

9.2. HETERODYNE METHOD ............................................................................................................................................................................ 80

9.3. DUAL MIXER TIME DIFFERENCE METHOD ................................................................................................................................................ 81

9.4. MEASUREMENT PROBLEMS AND PITFALLS ................................................................................................................................................ 82

9.5. MEASURING SYSTEM SUMMARY............................................................................................................................................................... 82

9.6. DATA FORMAT ......................................................................................................................................................................................... 83

9.7. DATA QUANTIZATION .............................................................................................................................................................................. 83

9.8. TIME TAGS ............................................................................................................................................................................................... 84

9.9. ARCHIVING AND ACCESS .......................................................................................................................................................................... 84

10 ANALYSIS PROCEDURE .................................................................... 86

10.1. DATA PRECISION .................................................................................................................................................................................. 89

10.2. PREPROCESSING ................................................................................................................................................................................... 89

10.3. GAPS, JUMPS, AND OUTLIERS ............................................................................................................................................................... 89

10.4. GAP HANDLING .................................................................................................................................................................................... 90

10.5. UNEVEN SPACING ................................................................................................................................................................................ 90

10.6. ANALYSIS OF DATA WITH GAPS ............................................................................................................................................................ 90

10.7. PHASE-FREQUENCY CONVERSIONS ....................................................................................................................................................... 90

10.8. DRIFT ANALYSIS .................................................................................................................................................................................. 91

10.9. VARIANCE ANALYSIS ........................................................................................................................................................................... 91

10.10. SPECTRAL ANALYSIS ............................................................................................................................................................................ 91

10.11. OUTLIER RECOGNITION ........................................................................................................................................................................ 91

10.12. DATA PLOTTING ................................................................................................................................................................................... 92

10.13. VARIANCE SELECTION .......................................................................................................................................................................... 92

10.14. THREE-CORNERED HAT........................................................................................................................................................................ 92

10.15. REPORTING .......................................................................................................................................................................................... 96
vii 

11 CASE STUDIES ..................................................................................... 97

11.1. FLICKER FLOOR OF A CESIUM FREQUENCY STANDARD ......................................................................................................................... 97

11.2. HADAMARD VARIANCE OF A SOURCE WITH DRIFT ................................................................................................................................ 99

11.3. PHASE NOISE IDENTIFICATION ............................................................................................................................................................ 100

11.4. DETECTION OF PERIODIC COMPONENTS .............................................................................................................................................. 101

11.5. STABILITY UNDER VIBRATIONAL MODULATION ................................................................................................................................. 103

11.6. WHITE FM NOISE OF A FREQUENCY SPIKE ......................................................................................................................................... 104

11.7. COMPOSITE AGING PLOTS .................................................................................................................................................................. 104

12 SOFTWARE ....................................................................................... 106

12.1. SOFTWARE VALIDATION ..................................................................................................................................................................... 106

12.2. TEST SUITES ....................................................................................................................................................................................... 106

12.3. NBS DATA SET .................................................................................................................................................................................. 106

12.4. 1000-POINT TEST SUITE ..................................................................................................................................................................... 107

12.5. IEEE STANDARD 1139-1999 .............................................................................................................................................................. 109

13 GLOSSARY ......................................................................................... 110

14 BIBLIOGRAPHY ................................................................................. 112

1 

1 Introduction 

This handbook describes practical techniques for frequency stability analysis. It covers the definitions of frequency 

stability, measuring systems and data formats, pre-processing steps, analysis tools and methods, post-processing steps, 

and reporting suggestions. Examples are included for many of these techniques. Some of the examples use the 

Stable32 program [1], which is a tool for studying and performing frequency stability analyses. Two general 

references [2,3] for this subject are also given. 

This handbook can be used both as a tutorial and as a reference. If this is your first exposure to this field, you may 

find it helpful to scan the sections to gain some perspective regarding frequency stability analysis. I strongly 

recommend consulting the references as part of your study of this subject matter. The emphasis is on time domain 

stability analysis, where specialized statistical variances have been developed to characterize clock noise as a function 

of averaging time. I present methods to perform those calculations, identify noise types, and determine confidence 

limits. It is often important to separate deterministic factors such as aging and environmental sensitivity from the 

stochastic noise processes. One must always be aware of the possibility of outliers and other measurement problems 

that can contaminate the data. 

Suggested analysis procedures are recommended to gather data, preprocess it, analyze stability, and report results. 

Throughout these analyses, it is worthwhile to remember R.W. Hamming’s axiom that “the purpose of computing is 

insight, not numbers.” Analysts should feel free to use their intuition and experiment with different methods that can 

provide a deeper understanding. 

References for Introduction 

1. The Stable32 Program for Frequency Stability Analysis, Hamilton Technical Services, Beaufort, SC 

29907, http://www.wriley.com. 

2. D.B Sullivan, D.W Allan, D.A Howe, and F.L Walls, eds., “Characterization of clocks and oscillators,” 

Natl. Inst. Stand. Technol. Technical Note 1337, 

http://tf.nist.gov/timefreq/general/pdf/868.pdf (March 1990). 

3. D.A. Howe, D.W. Allan, and J.A. Barnes, “Properties of signal sources and measurement methods,” Proc. 

35th Freq. Cont. Symp., pp. 1-47, 

 http://tf.nist.gov/timefreq/general/pdf/554.pdf (May 1981). 
2 

2 Frequency Stability Analysis 

The time domain stability analysis of a frequency source is concerned with characterizing the variables x(t) and y(t), 

the phase (expressed in units of time error) and the fractional frequency, respectively. It 

is accomplished with an array of phase arrays xi and frequency data arrays yi, where the 

index i refers to data points equally spaced in time. The xi values have units of time in 

seconds, and the yi values are (dimensionless) fractional frequency, Δf/f. The x(t) time 

fluctuations are related to the phase fluctuations by φ (t) = x(t)·2πν0, where ν0 is the 

nominal carrier frequency in hertz. Both are commonly called “phase” to distinguish 

them from the independent time variable, t. The data sampling or measurement 

interval, τ0, has units of seconds. The analysis interval or period, loosely called 

“averaging time”, τ, may be a multiple of τ0 (τ = mτ0, where m is the averaging factor). 

The goal of a time domain stability analysis is a concise, yet complete, quantitative and standardized description of 

the phase and frequency of the source, including their nominal values, the fluctuations of those values, and their 

dependence on time and environmental conditions. 

A frequency stability analysis is normally performed on a single device, not on a population of devices. The output of 

the device is generally assumed to exist indefinitely before and after the particular data set was measured, which is the 

(finite) population under analysis. A stability analysis may be concerned with both the stochastic (noise) and 

deterministic (systematic) properties of the device under test. It is also generally assumed that the stochastic 

characteristics of the device are constant (both stationary over time and ergodic over their population). The analysis 

may show that this is not true, in which case the data record may have to be partitioned to obtain meaningful results. It 

is often best to characterize and remove deterministic factors (e.g., frequency drift and temperature sensitivity) before 

analyzing the noise. Environmental effects are often best handled by eliminating them from the test conditions. It is 

also assumed that the frequency reference instability and instrumental effects are either negligible or removed from 

the data. A common problem for time domain frequency stability analysis is to produce results at the longest possible 

analysis interval in order to minimize test time and cost. Computation time is generally not as much a factor. 

2.1 Background 

The field of modern frequency stability analysis began in the mid 1960’s with the emergence of improved analytical 

and measurement techniques. In particular, new statistics became available that were better suited for common clock 

noises than the classic N-sample variance, and better methods were developed for high resolution measurements (e.g., 

heterodyne period measurements with electronic counters, and low noise phase noise measurements with doublebalanced diode mixers). A seminal conference on short-term stability in 1964 [1], and the introduction of the twosample (Allan) variance in 1966 [2] marked the beginning of this new era, which was summarized in a special issue of 

the Proceedings of the IEEE in 1966 [3]. This period also marked the introduction of commercial atomic frequency 

standards, increased emphasis on low phase noise, and the use of the LORAN radio navigation system for global 

precise time and frequency transfer. The subsequent advances in the performance of frequency sources depended 

largely on the improved ability to measure and analyze their stability. These advances also mean that the field of 

frequency stability analysis has become more complex. It is the goal of this handbook to help the analyst deal with 

this complexity. 

An example of the progress that has been made in frequency stability analysis from the original Allan variance in 

1966 through Thêo1 in 2003 is shown in the plots below. The error bars show the improvement in statistical 

confidence for the same data set, while the extension to longer averaging time provides better long-term clock 

characterization without the time and expense of a longer data record. 

The objective of a 

frequency stability analysis 

is to characterize the phase 

and frequency fluctuations 

of a frequency source in 

the time and frequency 

domains. 
3 

 

 Original Allan (a) Overlapping Allan (b) 

 

 Total (c) Thêo1 (d) 

 Overlapping and Thêo1 (e) 

Figure 1. Progress in frequency stability analysis. (a) Original Allan. (b) Overlapping Allan. (c) Total. (d) Thêo1. (e) 

Overlapping and Thêo1. 
4 

This handbook includes detailed information about these (and other) stability measures. 

References for Frequency Stability Analysis 

1. Proc. of the IEEE-NASA Symposium on the Definition and Measurement of Short-Term Frequency 

Stability, NASA SP-80, (Nov. 1964). 

2. D.W. Allan, "The Statistics of Atomic Frequency Standards,” Proc. IEEE, 54(2): 221-230(Feb. 1966). 

3. Special Issue on Frequency Stability, Proc. IEEE, 54(2)(Feb. 1966). 
5 

3 Definitions and Terminology 

The field of frequency stability analysis, like most others, has its own specialized 

definitions and terminology. The basis of a time domain stability analysis is an array 

of equally spaced phase (really time error) or fractional frequency deviation data 

arrays, xi and yi, respectively, where the index i refers to data points in time. These 

data are equivalent, and conversions between them are possible. The x values have 

units of time in seconds, and the y values are (dimensionless) fractional frequency, Δf/f. The x(t) time fluctuations are 

related to the phase fluctuations by φ(t) = x(t) ⋅ 2πν0 , where ν0 is the carrier frequency in hertz. Both are commonly 

called “phase” to distinguish them from the independent time variable, t. The data sampling or measurement interval, 

τ0, has units of seconds. The analysis or averaging time, τ, may be a multiple of τ0 (τ = mτ0, where m is the averaging 

factor). Phase noise is fundamental to a frequency stability analysis, and the type and magnitude of the noise, along 

with other factors such as aging and environmental sensitivity, determine the stability of the frequency source. 

3.1. Noise Model 

A frequency source has a sine wave output signal given by [1] 

0 0 Vt V t t t ( ) [ ( )]sin[2 ( )] =+ + ε πν φ , (1) 

where V0 = nominal peak output voltage 

ε(t) = amplitude deviation 

ν0 = nominal frequency 

φ(t) = phase deviation. 

For the analysis of frequency stability, we are concerned primarily with the φ(t) term. The instantaneous frequency is 

the derivative of the total phase: 

0

1 ( ) 2d

t

dt

φ ν ν

π

= + . (2) 

For precision oscillators, we define the fractional frequency as 

0

0 0

( ) 1 ( ) 2

f t d dx

y t f dt dt

ν ν φ

ν πν

Δ − == = = , (3) 

where 

0 xt t ( ) ( )/2 = φ πν . (4)

3.2. Power Law Noise 

It has been found that the instability of most frequency sources can be modeled by a combination of power-law noises 

having a spectral density of their fractional frequency fluctuations of the form Sy(f) ∝ f α , where f is the Fourier or 

sideband frequency in hertz, and α is the power law exponent. 

Noise Type α 

White PM (W PM) 2 

Flicker PM (F PM) 1 

White FM (W FM) 0 

Flicker FM (F FM) –1 

Random Walk FM (RW FM) –2 

Specialized definitions and 

terminology are used for 

frequency stability 

analysis. 
6 

Flicker Walk FM (FW FM) –3 

Random Run FM (RR FM) –4 

Examples of the four most common of these noises are shown in Table 1. 

Table 1. Examples of the four most common noise types. 

3.3. Stability Measures 

The standard measures for frequency stability in the time and frequency domains are the overlapped Allan deviation, 

σy(τ), and the SSB phase noise, £(f), as described in more detail later in this handbook. 

3.4. Differenced and Integrated Noise 

Taking the differences between adjacent data points plays an important role in frequency stability analysis for 

performing phase to frequency data conversion, calculating Allan (and related) variances, and doing noise 

identification using the lag 1 autocorrelation method [2]. Phase data x(t) may be converted to fractional frequency 

data y(t) by taking the first differences xi+1 – xi of the phase data and dividing by the sampling interval τ. The Allan 

variance is based on the first differences yi+1 – yi of the fractional frequency data or, equivalently, the second 

differences yi+2 – 2yi+1 + yi of the phase data. Similarly, the Hadamard variance is based on third differences xi+3 –

3xi+2 + 3xi+1 – xi of the phase data. 

Taking the first differences of a data set has the effect of making it less divergent. In terms of its spectral density, the 

α value is increased by 2. For example, flicker FM data (α = –1) is changed into flicker PM data (α = +1). That is 

the reason that the Hadamard variance is able to handle more divergent noise types (α ≥ –4) than the Allan variance 

(α ≥ –2) can. It is also the basis of the lag 1 autocorrelation noise identification method whereby first differences are 

taken until α becomes ≥0.5. The plots below show random run noise differenced first to random walk noise and again 

to white noise. 
7 

0 200 400 600 800 1000 0

5000

10000

15000

Random Run Noise

Point #

Amplitude

0 200 400 600 800 1000 -30

-20

-10

0

10

20

30

40

50

Random Walk Noise

Point #

Amplitude

(a) Original random run (RR) 

noise

(b) Differenced RR noise = 

random walk (RW) noise

0 200 400 600 800 1000 -6

-4

-2

0

2

4

6

White Noise

Point #

Amplitude

(c) Differenced RW noise = 

 white (W) noise 

Figure 2. (a) Random run noise, difference to (b) random walk noise 

and (c) white noise. 

The more divergent noise types are sometimes referred to by their color. White noise has a flat spectral density (by 

analogy to white light). Flicker noise has an f-1 spectral density, and is called pink or red (more energy toward lower 

frequencies). Continuing the analogy, f-2 (random walk) noise is called brown, and f-3 (flicker walk) noise is called 

black, although that terminology is seldom used in the field of frequency stability analysis. 

Integration is the inverse operation of differencing. Numerically integrating frequency data converts it into phase data 

(with an arbitrary initial value). Such integration subtracts 2 from the original α value. For example, the random run 

data in Figure 2(a) was generated by simulating random walk FM data and converting it to phase data by numerical 

integration. 

3.5. Glossary 

See the Glossary chapter at the end of this handbook for brief definitions of many of the important terms used in the 

field of frequency stability analysis. 

References for Definitions and Terminology 

1. “IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time 

Metrology−Random instabilities,” IEEE Std. 1139 (July 1999). 

2. W.J. Riley and C.A. Greenhall, “Power law noise identification using the lag 1 autocorrelation,” Proc. 18th 

European Frequency and Time Forum, University of Surrey, Guildford, U.K. (April 5−7, 2004). 
8 

4 Standards 

 

Standards have been adopted for the measurement and characterization of frequency stability, 

as shown in the references below [1-5]. These standards define terminology, measurement 

methods, means for characterization and specification, etc. In particular, IEEE-Std-1139 

contains definitions, recommendations, and examples for the characterization of frequency 

stability. 

References for Standards 

1. “Characterization of frequency and phase noise, Intl. Consult. Comm. (C.C.I.R.), Report 580,” pp. 142-150 

(1986). 

2. MIL-PRF-55310, “Oscillator, crystal controlled, general specification for (2006).” 

3. R.L. Sydnor, ed., “The selection and use of precise frequency systems,” ITU-R Handbook (1995). 

4. “Guide to the expression of uncertainty in measurement,” Intl. Stand. Org. (ISO), ISBN 92-67-10188-9 

(1995). 

5. “IEEE standard definitions of physical quantities for fundamental frequency and time metrology−Random 

instabilities,” IEEE Std. 1139 (July 1999). 

Several standards 

apply to the field of 

frequency stability 

analysis. 
9 

5 Time Domain Stability 

The stability of a frequency source in the time domain is based on the statistics of its 

phase or frequency fluctuations as a function of time, a form of time series analysis [1]. 

This analysis generally uses some type of variance, a second moment measure of the 

fluctuations. For many divergent noise types commonly associated with frequency 

sources, the standard variance, which is based on the variations around the average 

value, is not convergent, and other variances have been developed that provide a better 

characterization of such devices. A key aspect of such a characterization is the dependence of the variance on the 

averaging time used to make the measurement, which dependence shows the properties of the noise. 

5.1. Sigma-Tau Plots 

The most common way to express the time domain stability of a frequency source is by means of a sigma-tau plot that 

shows some measure of frequency stability versus the time over which the frequency is averaged. Log sigma versus 

log tau plots show the dependence of stability on averaging time, and show both the stability value and the type of 

noise. The power law noises have particular slopes, μ, as shown on the following log s versus log τ plots, and α and μ

are related as shown in the table below: 

Noise α μ

W PM 2 –2 

F PM 1 ~ –2 

W FM 0 –1 

F FM –1 0 

RW FM –2 1 

The log σ versus log τ slopes are the same for the two PM noise types, but are different on a Mod sigma plot, which is 

often used to distinguish between them. 

Time domain stability 

measures are based on 

the statistics of the phase 

or frequency fluctuations 

as a function of time. 
10 

02468

-9

-11

-13

-15

02468

-15

-13

-11

-9

10

Mod Sigma Tau Diagram

Sigma Tau Diagram

White

PM

Flicker

PM

Freq

Drift

τ

-1

τ

-1/2 τ

0

τ

+1

τ

+1/2

Freq

Drift

log τ

τ

+1

τ

-1/2

τ

τ +1/2

0

White PM

or

Flicker PM

Sy(f) ∼ fα

μ′ = -α-1

Sy(f) ∼ fα

μ = -α-1

White

FM

Flicker

FM

RW

FM

White

FM

Flicker

FM

RW

FM

log τ

log

σy(τ)

log

Mod

σy(τ)

σy(τ) ∼ τμ/2

Mod σy(τ) ∼ τμ′/2

τ

-3/2

τ

-1

Figure 3. (a) Sigma tau diagram. (b) Mod sigma tau diagram. 

5.2 Variances 

Variances are used to characterize the fluctuations of a frequency source [2-3]. These are second-moment measures 

of scatter, much as the standard variance is used to quantify the variations in, say, the length of rods around a nominal 

value. The variations from the mean are squared, summed, and divided by one less than the number of measurements; 

this number is called the “degrees of freedom.”

Several statistical variances are available to the frequency stability analyst, and this section provides an overview of 

them, with more details to follow. The Allan variance is the most common time domain measure of frequency 

stability, and there are several versions of it that provide better statistical confidence, can distinguish between white 

and flicker phase noise, and can describe time stability. The Hadamard variance can better handle frequency drift and 

more divergence noise types, and several versions of it are also available. The newer Total and Thêo1 variances can 

provide better confidence at longer averaging factors. 

There are two categories of stability variances: unmodified variances, which use dth differences of phase samples, and 

modified variances, which use dth differences of averaged phase samples. The Allan variances correspond to d = 2, 

and the Hadamard variances to d = 3. The corresponding variances are defined as a scaling factor times the expected 

value of the differences squared. One obtains unbiased estimates of this variance from available phase data by 

computing time averages of the differences squared. The usual choices for the increment between estimates (the time 
11 

step) are the sample period τ0 and the analysis period τ, a multiple of τ0. These give respectively the overlapped 

estimator and non-overlapped estimators of the stability.

Variance Type Characteristics

Standard Non-convergent for some clock noises – don’t use 

Allan Classic – use only if required – relatively poor confidence 

Overlapping Allan General purpose - most widely used – first choice 

Modified Allan Used to distinguish W and F PM 

Time Based on modified Allan variance 

Hadamard Rejects frequency drift, and handles divergent noise 

Overlapping Hadamard Better confidence than normal Hadamard 

Total Better confidence at long averages for Allan 

Modified Total Better confidence at long averages for modified Allan 

Time Total Better confidence at long averages for time 

Hadamard Total Better confidence at long averages for Hadamard 

Thêo1 Provides information over nearly full record length 

ThêoH Hybrid of Allan and ThêoBR (bias-removed Thêo1) variances 

• All are second moment measures of dispersion – scatter or instability of frequency from central value. 

• All are usually expressed as deviations. 

• All are normalized to standard variance for white FM noise. 

• All except standard variance converge for common clock noises. 

• Modified types have additional phase averaging that can distinguish W and F PM noises. 

• Time variances based on modified types. 

• Hadamard types also converge for FW and RR FM noise. 

• Overlapping types provide better confidence than classic Allan variance. 

• Total types provide better confidence than corresponding overlapping types. 

• ThêoH (hybrid-ThêoBR) and Thêo1 (Theoretical Variance #1) provide stability data out to 75 % of record 

length. 

• Some are quite computationally intensive, especially if results are wanted at all (or many) analysis intervals 

(averaging times), τ. Use octave or decade τ intervals. 

The modified Allan deviation (MDEV) can be used to distinguish between white and flicker PM noise. For example, 

the W and F PM noise slopes are both ≈ −1.0 on the Allan Deviation (ADEV) plots in Figure 4, but they can be 

distinguished as –1.5 and –1.0, respectively, on the MDEV plots. 
12 

ADEV MDEV 

W 

PM 

(a) (c)

F 

 PM 

(b) (d) 

Figure 4. (a) Slope of W PM using Adev, (b) slope of F PM using ADEV, (c) slope of W PM using MDEV, and (d) slope of 

F PM using MDEV. 

The Hadamard deviation may be used to reject linear frequency drift when a stability analysis is performed. For 

example, the simulated frequency data for a rubidium frequency standard in Figure 5(a) shows significant drift. Allan 

deviation plots for these data are shown in Figure 5(c) and (d) for the original and drift-removed data. Notice that, 

without drift removal, the Allan deviation plot has a +τ dependence at long τ, a sign of linear frequency drift. 

However, as seen in Figure 5(b), the Hadamard deviation for the original data is nearly the same as the Allan 

deviation after drift removal, but it has lower confidence for a given τ. 
13 

(a) (c) 

(b) (d) 

Figure 5. (a) Simulated frequency data for a rubidium frequency standard, (b) overlapping Hadamard with drift, (c) 

overlapping sigma with drift, and (d) overlapping sigma without drift. 

References for Time Domain Stability 

1. G.E.P. Box and G.M. Jenkins, Time Series Analysis: Forecasting and Control, Holden-Day, San Francisco 

(1970). 

2. J. Rutman, “Characterization of phase and frequency instabilities in precision frequency sources: Fifteen 

years of progress,” Proc. IEEE, 66(9): 1048-1075 (1978) 

3. S.R. Stein, “Frequency and time: Their measurement and characterization,” Precision Frequency Control, 

2, E.A. Gerber and A. Ballato, eds., Academic Press, New York, ISBN 0-12-280602-6 (1985). 

5.2.1. Standard Variance 

The classic N-sample or standard variance is defined as 

s

N y y i

i

N

2 2

1

1

1 = − − =

∑b g , (5) 

where the yi are the N fractional frequency values, and y N yi

i

N

= =

∑1

1

is the average frequency. The standard variance is 

usually expressed as its square root, the standard deviation, s. It is not recommended as a measure of frequency 

stability because it is non- convergent for some types of noise commonly found in frequency sources, as shown in the 

figure below. 

The standard variance should 

not be used for the analysis of 

frequency stability. 
14 

1.0

1.5

2.0

2.5

3.0

10 100 1000

Sample Size (m=1)

Standard or Allan Deviation

 Figure 6. Convergence of standard and Allan deviation for FM noise. 

The standard deviation (upper curve) increases with the number of samples of flicker FM noise used to determine it, 

while the Allan deviation (lower curve and discussed below) is essentially constant. 

The problem with the standard variance stems from its use of the deviations from the average, which is not stationary 

for the more divergence noise types. That problem can be solved by instead using the first differences of the 

fractional frequency values (the second differences of the phase), as described for the Allan variance in Section 5.2.2. 

In the context of frequency stability analysis, the standard variance is used primarily in the calculation of the B1 ratio 

for noise recognition. 

Reference for Standard Variance 

1. D.W. Allan, “Should the Classical Variance be used as a Basic Measure in Standards Metrology?” IEEE Trans. 

Instrum. Meas., IM-36: 646-654 (1987) 

5.2.2. Allan Variance 

The Allan variance is the most common time domain measure of frequency stability. Similar to the standard variance, 

it is a measure of the fractional frequency fluctuations, but has the advantage of being convergent for most types of 

clock noise. There are several versions of the Allan variance that provide better statistical confidence, can distinguish 

between white and flicker phase noise, and can describe time stability. 

The original non-overlapped Allan, or two-sample variance, AVAR, is the standard 

time domain measure of frequency stability [1, 2]. It is defined as 

It is defined as 

1

2 2

1

1

1 () [ ] 2( 1)

M

y ii

i

y y Mσ τ

−

+

=

= − − ∑ , (6) 

where yi is the ith of M fractional frequency values averaged over the measurement (sampling) interval, τ. Note that 

these y symbols are sometimes shown with a bar over them to denote the averaging. 

The original Allan variance 

has been largely superseded 

by its overlapping version. 
15 

In terms of phase data, the Allan variance may be calculated as

2

2 2

2 2 1

1

1 () [ 2 ] 2( 2)

N

y i ii

i

x x x

N

σ τ

τ

−

+ +

=

= −+ − ∑ , (7) 

where xi is the ith of the N = M+1 phase values spaced by the measurement interval τ. 

The result is usually expressed as the square root, σy(τ), the Allan deviation, ADEV. The Allan variance is the same 

as the ordinary variance for white FM noise, but has the advantage, for more divergent noise types such as flicker 

noise, of converging to a value that is independent on the number of samples. The confidence interval of an Allan 

deviation estimate is also dependent on the noise type, but is often estimated as ±σy(τ)/√N. 

5.2.2. Overlapping Samples 

Some stability calculations can utilize (fully) overlapping samples, whereby the 

calculation is performed by utilizing all possible combinations of the data set, as 

shown in the diagram and formulae below. The use of overlapping samples 

improves the confidence of the resulting stability estimate, but at the expense of 

greater computational time. The overlapping samples are not completely independent, but do increase the effective 

number of degrees of freedom. The choice of overlapping samples applies to the Allan and Hadamard variances. 

Other variances (e.g., total) always use them. 

Overlapping samples don’t apply at the basic measurement interval, which should be as short as practical to support a 

large number of overlaps at longer averaging times.

Non-Overlapped Allan 

Variance: Stride = τ = 

averaging period = 

m⋅τ0 

Overlapped Allan 

Variance: Stride = τ0 = 

sample period

σ τ

σ τ

y ii

i

M

y

j

M m

im i

i j

j m

M y y

mM m y y

2

1

2

1

1

2

2

1

2 1 2 1

1

2 1

1

2 21

b g b g b g

b g b g b g

= − −

= − + −

+

=

−

=

− +

+

=

+ −

∑

∑ ∑

(8) 

(9) 

Figure 7. Comparison of non-overlapping and overlapping sampling. 

The following plots show the significant reduction in variability, hence increased statistical confidence, obtained by 

using overlapping samples in the calculation of the Hadamard deviation. 

Overlapping samples are used 

to improve the confidence of 

a stability estimate. 

1234

Averaging Factor, m =3 Non-Overlapping Samples

Overlapping Samples

1

2

3

4

5
16 

Non-Overlapping Samples Overlapping Samples 

Figure 8. The reduction in variability by using overlapping samples in calculating the Hadamard deviation. 

5.2.4. Overlapping Allan Variance 

The fully overlapping Allan variance, or AVAR, is a form of the normal Allan 

variance, σ2y(τ), that makes maximum use of a data set by forming all possible 

overlapping samples at each averaging time τ. It can be estimated from a set of M 

frequency measurements for averaging time τ = mτ0, where m is the averaging factor 

and τ0 is the basic measurement interval, by the expression 

2 2 1 1

2

2

1

1 () [ ] 2 ( 2 1)

M m j m

y im i

j ij

y y mM mσ τ

− + + −

+

= =

⎧ ⎫ = − ⎨ ⎬

− + ⎩ ⎭ ∑ ∑ . (10)

This formula is seldom used for large data sets because of the computationally intensive inner summation. In terms of 

phase data, the overlapping Allan variance can be estimated from a set of N = M + 1 time measurements as 

2

2 2

2 2

1

1 [2 ] 2( 2 )

N m

y i m im i

i

x x x

N m

σ

τ

−

+ +

=

= −+ − ∑ . (11)

Fractional frequency data, yi, can be first integrated to use this faster formula. The result is usually expressed as the 

square root, σy(τ), the Allan deviation, ADEV. The confidence interval of an overlapping Allan deviation estimate is 

better than that of a normal Allan variance estimation because, even though the additional overlapping differences are 

not all statistically independent, they nevertheless increase the number of degrees of freedom and thus improve the 

confidence in the estimation. Analytical methods are available for calculating the number of degrees of freedom for 

an estimation of overlapping Allan variance, and using that to establish single- or double-sided confidence intervals 

for the estimate with a certain confidence factor, based on Chi-squared statistics. 

Sample variances are distributed according to the expression 

The overlapped Allan 

deviation is the most common 

measure of time-domain 

frequency stability. The term 

AVAR has come to be used 

mainly for this form of the 

Allan variance, and ADEV 

for its square root. 

H

M y yy y i ii

i

M

σ τ 2

2 1

2

1

2 1

6 2 b g 2 b g = b g − + + − + =

−

∑ H

mM m y yy y

j

M m

i m im i

i j

j m

σ τ 2

2

1

3 1

2

2 1 1

6 31 b g 2 b g = b g − +

− + =

− +

+ +

=

+ −

∑ ∑
17 

2

2

2

df s χ

σ

⋅ = , (12)

where χ2 is the Chi-square, s2 is the sample variance, σ2 is the true variance, and df is the number of degrees of 

freedom (not necessarily an integer). For a particular statistic, df is determined by the number of data points and the 

noise type. 

5.2.5 Modified Allan Variance 

The modified Allan variance, Mod σ2y(τ), MVAR, is another common time 

domain measure of frequency stability [1]. It is estimated from a set of M 

frequency measurements for averaging time τ = mτ0, where m is the averaging 

factor and τ0 is the basic measurement interval, by the expression 

2 32 1 1

2

4

1

1 () [ ] 2 ( 3 2)

M m im j m

y km k

j i j ki

Mod y y mM mσ τ

− + +− + −

+

= ==

⎧ ⎫ ⎛ ⎞ = − ⎨ ⎬ ⎜ ⎟ − + ⎩ ⎭ ⎝ ⎠ ∑ ∑∑ . (13) 

In terms of phase data, the modified Allan variance is estimated from a set of N = M + 1 time measurements as 

2 3 1 1

2

2 2 2

1

1 () [ 2 ] 2 ( 3 1)

N m j m

y i m im i

j ij

Mod x x x

m Nm

σ τ

τ

− + + −

+ +

= =

⎧ ⎫

= −+ ⎨ ⎬

− + ⎩ ⎭ ∑ ∑ . (14) 

The result is usually expressed as the square root, Mod σy(τ), the modified Allan deviation. The modified Allan 

variance is the same as the normal Allan variance for m = 1. It includes an additional phase averaging operation, and 

has the advantage of being able to distinguish between white and flicker PM noise. The confidence interval of a 

modified Allan deviation determination is also dependent on the noise type, but is often estimated as ±σy(τ)/√N. 

Use the modified Allan deviation 

to distinguish between white and 

flicker PM noise. 

References for Allan Variance 

1. D.W. Allan, “The statistics of atomic frequency standards,” Proc. IEEE, 54(2): 221-230 (Feb. 1966). 

2. D.W. Allan, “Allan variance,” http://www.allanstime.com [2008]. 

3. “Characterization of frequency stability,” Nat. Bur. Stand. (U.S.) Tech Note 394 (Oct. 1970). 

4. J.A. Barnes, A.R. Chi, L.S. Cutler, D.J. Healey, D.B. Leeson, T.E. McGunigal, J.A. Mullen, Jr., W.L. Smith, 

R.L. Sydnor, R.F.C. Vessot, and G.M.R. Winkler, “Characterization of frequency stability,” IEEE Trans. 

Instrum. Meas., 20(2): 105-120 (May 1971) 

5. J.A. Barnes, “Variances based on data with dead time between the measurements,” Natl. Inst. Stand. 

Technol. Technical Note 1318 (1990). 

6. C.A. Greenhall, “Does Allan variance determine the spectrum?” Proc. 1997 Intl. Freq. Cont. Symp., pp. 

358-365 (June 1997)/ 

7. C.A. Greenhall, “Spectral ambiguity of Allan variance,” IEEE Trans. Instrum. Meas., 47(3): 623-627 (June 

1998). 
18 

References for Modified Allan Variance 

1. D.W. Allan and J.A. Barnes, “A modified Allan variance with increased oscillator characterization ability,” 

Proc. 35th Freq. Cont. Symp. pp. 470-474 (May 1981). 

2. P. Lesage and T. Ayi, “Characterization of frequency stability: Analysis of the modified Allan variance and 

properties of its estimate,” IEEE Trans. Instrum. Meas., 33(4): 332-336 (Dec. 1984). 

3. C.A. Greenhall, “Estimating the modified Allan variance,” Proc. IEEE 1995 Freq. Cont. Symp., pp. 346-353 

(May 1995). 

4. C.A. Greenhall, “The third-difference approach to modified Allan variance,” IEEE Trans. Instrum. Meas., 

46(3): 696-703 (June 1997). 

5.2.6. Time Variance 

The time Allan variance, TVAR, with square root TDEV, is a measure of time 

stability based on the modified Allan variance [1]. It is defined as 

2

2 2 () () 3 x y Mod τ

σ τ στ

⎛ ⎞ = ⋅ ⎜ ⎟ ⎝ ⎠

. (15) 

 

In simple terms, TDEV is MDEV whose slope on a log-log plot is transposed by +1 and normalized by √3. The time 

Allan variance is equal to the standard variance of the time deviations for white PM noise. It is particularly useful for 

measuring the stability of a time distribution network. 

It can be convenient to include TDEV information on a MDEV plot by adding lines of constant TDEV, as shown in 

Figure 9: 

Figure 9. Plot of MDEV with lines of constant TDEV. 

Use the time deviation to 

characterize the time error of 

a time source (clock) or 

distribution system. 
19 

References for Time Variance 

1. D.W. Allan, D.D. Davis, J. Levine, M.A. Weiss, N. Hironaka, and D. Okayama, “New inexpensive frequency 

calibration service from Natl. Inst. Stand. Technol.,” Proc. 44th Freq. Cont. Symp., pp. 107-116 (June 1990). 

2. D.W. Allan, M.A. Weiss, and J.L. Jespersen, “A frequency-domain view of time-domain characterization of 

clocks and time and frequency distribution systems,” Proc. 45th Freq. Cont. Symp., pp. 667-678 (May 

1991). 

5.2.7. Time Error Prediction 

The time error of a clock driven by a frequency source is a relatively simple function 

of the initial time offset, the frequency offset, and the subsequent frequency drift, 

plus the effect of noise, as shown in the following expression: 

ΔT = To + (Δf/f) ⋅ t + 1⁄2 D ⋅ t2

 + σx(t), (16)

where ΔT is the total time error, To is the initial synchronization error, Δf/f is the sum of the initial and average 

environmentally induced frequency offsets, D is the frequency drift (aging rate), and σx(t) is the root-mean-square 

(rms) noise-induced time deviation. For consistency, units of dimensionless fractional frequency and seconds should 

be used throughout. 

Because of the many factors, conditions, and assumptions involved, and their variability, clock error prediction is 

seldom easy or exact, and it is usually necessary to generate a timing error budget. 

• Initial Synchronization 

The effect of an initial time (synchronization) error, To, is a constant time offset due to the time reference, the finite 

measurement resolution, and measurement noise. The measurement resolution and noise depends on the averaging 

time. 

• Initial Syntonization 

The effect of an initial frequency (syntonization) error, Δf/f , is a linear time error. Without occasional 

resyntonization (frequency recalibration), frequency aging can cause this to be the biggest contributor toward clock 

error for many frequency sources (e.g., quartz crystal oscillators and rubidium gas cell standards). Therefore, it can be 

important to have a means for periodic clock syntonization (e.g., GPS or cesium beam standard). In that case, the 

syntonization error is subject to uncertainty due to the frequency reference, the measurement and tuning resolution, 

and noise considerations. The measurement noise can be estimated by the square root of the sum of the Allan 

variances of the clock and reference over the measurement interval. The initial syntonization should be performed, to 

the greatest extent possible, under the same environmental conditions (e.g., temperature) as expected during 

subsequent operation. 

• Environmental Sensitivity 

After initial syntonization, environmental sensitivity is likely to be the largest contributor to time error. 

Environmental frequency sensitivity obviously depends on the properties of the device and its operating conditions. 

When performing a frequency stability analysis, it is important to separate the deterministic environmental 

sensitivities from the stochastic noise. This requires a good understanding of both the device and its environment. 

The time error of a clock can 

be predicted from its time and 

frequency offsets, frequency 

drift, and noise. 
20 

Reference for Time Error Prediction 

D.W. Allan and H. Hellwig, “Time Deviation and Time Prediction Error for Clock Specification, Characterization, 

and Application”, Proceedings of the Position Location and Navigation Symposium (PLANS), 29-36, 1978. 

5.2.8. Hadamard Variance 

The Hadamard [1] variance is based on the Hadamard transform [2], which was 

adapted by Baugh as the basis of a time-domain measure of frequency stability [3]. 

As a spectral estimator, the Hadamard transform has higher resolution than the Allan 

variance, since the equivalent noise bandwidth of the Hadamard and Allan spectral 

windows are 1.2337N-1

τ

-1 and 0.476τ-1, respectively [4]. For the purposes of timedomain frequency stability characterization, the most important advantage of the Hadamard variance is its 

insensitivity to linear frequency drift, making it particularly useful for the analysis of rubidium atomic clocks [5,6]. It 

has also been used as one of the components of a time-domain multivariance analysis [7], and is related to the third 

structure function of phase noise [8]. 

Because the Hadamard variance examines the second difference of the fractional frequencies (the third difference of 

the phase variations), it converges for the Flicker Walk FM (α = −3) and Random Run FM (α = −4) power-law noise 

types. It is also unaffected by linear frequency drift. 

For frequency data, the Hadamard variance is defined as: 

2

2 2

2 1

1

1 () [ 2 ] 6( 2)

M

y i ii

i

H y yy Mσ τ

−

+ +

=

= −+ − ∑ , (17) 

where yi is the ith of M fractional frequency values at averaging time τ. 

For phase data, the Hadamard variance is defined as: 

3

2 2

2 321

1

1 () [ 3 3 ] 6 ( 3)

N

y i i ii

i

H x x xx

N m

σ τ

τ

−

+++

=

= −+− − ∑ , (18) 

where xi is the ith of N = M + 1 phase values at averaging time τ. 

Like the Allan variance, the Hadamard variance is usually expressed as its square-root, the Hadamard deviation, 

HDEV or Hσy(τ). 

5.2.9. Overlapping Hadamard Variance 

In the same way that the overlapping Allan variance makes maximum use of a data 

set by forming all possible fully overlapping 2-sample pairs at each averaging time τ

the overlapping Hadamard variance uses all 3-sample combinations [9]. It can be 

estimated from a set of M frequency measurements for averaging time τ = mτ0 where 

m is the averaging factor and τ0 is the basic measurement interval, by the expression:

Use the Hadamard variance to 

characterize frequency 

sources with divergent noise 

and/or frequency drift. 

The overlapping Hadamard 

variance provides better 

confidence than the nonoverlapping version. 
21 

2 3 1 1

2

2 2 2

1

1 () [ 2 ] 6 ( 3 1)

M m j m

y i m im i

j ij

H y yy mM mσ τ

τ

− + + −

+ +

= =

⎧ ⎫

= −+ ⎨ ⎬

− + ⎩ ⎭ ∑ ∑ , (19) 

where yi is the ith of M fractional frequency values at each measurement time. 

In terms of phase data, the overlapping Hadamard variance can be estimated from a set of N = M + 1 time 

measurements as: 

3

2 2

2 3 2

1

1 () [ 3 3 ] 6( 3 )

N m

y i m i m im i

i

H x x xx

N m

σ τ

τ

−

+++

=

= − +− − ∑ , (20) 

where xi is the ith of N = M + 1 phase values at each measurement time. 

Computation of the overlapping Hadamard variance is more efficient for phase data, where the averaging is 

accomplished by simply choosing the appropriate interval. For frequency data, an inner averaging loop over m

frequency values is necessary. The result is usually expressed as the square root, Hσy(τ), the Hadamard deviation, 

HDEV. The expected value of the overlapping statistic is the same as the normal one described above, but the 

confidence interval of the estimation is better. Even though not all the additional overlapping differences are 

statistically independent, they nevertheless increase the number of degrees of freedom and thus improve the 

confidence in the estimation. Analytical methods are available for calculating the number of degrees of freedom for 

an overlapping Allan variance estimation, and that same theory can be used to establish reasonable single- or doublesided confidence intervals for an overlapping Hadamard variance estimate with a certain confidence factor, based on 

Chi-squared statistics. 

Sample variances are distributed according to the expression: 

2

2

2 (, ) df s χ p df

σ

⋅ = , (21) 

where χ2 is the Chi-square value for probability p and degrees of freedom df, s2 is the sample variance, σ2 is the true 

variance, and df is the number of degrees of freedom (not necessarily an integer). The df is determined by the number 

of data points and the noise type. Given the df, the confidence limits around the measured sample variance are given 

by: 

2 2

2 2

min max 2 2

() () and 

( , ) (1 , )

s df s df

p df p df

σ σ

χ χ

⋅ ⋅ = = − . (22) 

5.2.10. Modified Hadamard Variance 

By similarity to the modified Allan variance, a modified version of the Hadamard variance can be defined [15] that 

employs averaging of the phase data over the m adjacent samples that define the analysis τ = m⋅τ0. In terms of phase 

data, the three-sample modified Hadamard variance is defined as: 

2

4 1 1

2 3

2 1

2 2

[3 3 ]

( ) 6 [ 4 1]

N m j m

i im i m i m

j ij

H

xx x x

Mod

mNm

σ τ

τ

− + + −

+ ++

= =

⎧ ⎫ ⎨ ⎬ −+ −

⎩ ⎭ = − +

∑ ∑

, (23) 
22 

where N is the number of phase data points xi at the sampling interval τ0, and m is the averaging factor, which can 

extend from 1 to ⎣N/4⎦. This is an unbiased estimator of the modified Hadamard variance, MHVAR. Expressions for 

the equivalent number of χ2

 degrees of freedom (edf) required to set MHVAR confidence limits are available in [2]. 

Clock noise (and other noise processes) can be described in terms of power spectral density, which can be modeled as 

a power law function S ∝ f α

, where f is Fourier frequency and α is the power law exponent. When a variance such as 

MHVAR is plotted on log-log axes versus averaging time, the various power law noises correspond to particular 

slopes μ. MHVAR was developed in Reference [15] for determining the power law noise type of Internet traffic 

statistics, where it was found to be slightly better for that purpose than the modified Allan variance, MVAR, when 

there were a sufficient number of data points. MHVAR could also be useful for frequency stability analysis, perhaps 

in cases where it was necessary to distinguish between short-term white and flicker PM noise in the presence of more 

divergent (α= −3 and −4) flicker walk and random run FM noises. The Mod σ

2

H(τ) log-log slope μ is related to the 

power law noise exponent by μ = –3 – α. 

The modified Hadamard variance concept can be generalized to subsume AVAR, HVAR, MVAR, MHVAR, and 

MHVARs using higher-order differences:

Mod

d

k

x

dm N d m

H d

k

i km

k

d

i j

j m

j

Nd m

σ τ

τ

2 0

1 2

1

1 1

2 2

1

1 1 ,

( )

( )

! () b g =

F

H

G I

K

J − R

S

T

U

V

W

−+ +

+

= =

+ −

=

−+ +

∑ ∑ ∑

, (24) 

where d = phase differencing order; d = 2 corresponds to MAVAR, d = 3 to MHVAR; higher-order differencing is not 

commonly used in the field of frequency stability analysis. The unmodified, nonoverlapped AVAR and HVAR 

variances are given by setting m = 1. The allowable power law exponent for convergence of the variance is equal to α

> 1 – 2d, so the second difference Allan variances can be used for α > −3 and the third difference Hadamard 

variances for α > −5. 

Confidence intervals for the modified Hadamard variance can be determined by use of the edf values of reference 

[16]. 
23 

References for Hadamard Variance 

1. Jacques Saloman Hadamard (1865−1963), French mathematician. 

2. W.K. Pratt, J. Kane, and H.C. Andrews, “Hadamard transform image coding,” Proc. IEEE, 57(1): 38-67 

(Jan. 1969). 

3. R.A. Baugh, “Frequency modulation analysis with the Hadamard variance,” Proc. Freq. Cont. Symp., pp. 

222-225 (June 1971). 

4. K. Wan, E. Visr, and J. Roberts, “Extended variances and autoregressive moving average algorithm for the 

measurement and synthesis of oscillator phase noise,” Proc. 43rd Freq. Cont. Symp., pp.331-335 (June 

1989). 

5. S.T. Hutsell, “Relating the Hamamard variance to MCS Kalman filter clock estimation,” Proc. 27th PTTI 

Mtg., pp. 291-302 (Dec. 1995). 

6. S.T. Hutsell, “Operational use of the Hamamard variance in GPS,” Proc. 28th PTTI Mtg., pp. 201-213 (Dec. 

1996). 

7. T. Walter, “A multi-variance analysis in the time domain,” Proc. 24th PTTI Mtg., pp. 413-424 (Dec. 1992). 

8. J. Rutman, “Oscillator specifications: A review of classical and new ideas,” 1977 IEEE Intl. Freq. Cont. 

Symp., pp. 291-301 (June 1977). 

9. This expression for the overlapping Hadamard variance was developed by the author at the suggestion of G. 

Dieter and S.T. Hutsell. 

10. Private communication, C. Greenhall to W. Riley, 5/7/99. 

11. B. Picinbono, « Processus à accroissements stationnaires » Ann. des telecom, 30(7-8): 211-212 (July-Aug. 

1975). 

12. E. Boileau and B. Picinbono, “Statistical study of phase fluctuations and oscillator stability,” IEEE Trans. 

Instrum. Meas., 25(1): 66-75 (March 1976). 

13. D.N. Matsakis and F.J. Josties, “Pulsar-appropriate clock statistics,” Proc. 28th PTTI Mtg., pp. 225-236 (Dec. 

1996). 

14. Chronos Group, Frequency Measurements and Control, Sect. 3.3.3, Chapman & Hall, London, ISBN 0-412-

48270-3 (1994). 

15. S. Bregni and L. Jmoda, “Improved estimation of the Hurst parameter of long-range dependent traffic using 

the modified Hadamard variance,” Proc. IEEE ICC (June 2006). 

16. C.A. Greenhall and W.J. Riley, “Uncertainty of stability variances based on finite differences,” Proc. 35th 

PTTI Mtg. (Dec. 2003). 

5.2.11. Total Variance 

The total variance, TOTVAR, is similar to the two-sample or Allan variance and has 

the same expected value, but offers improved confidence at long averaging times [1-

5]. The work on total variance began with the realization that the Allan variance can 

“collapse” at long averaging factors because of symmetry in the data. An early idea 

was to shift the data by 1/4 of the record length and average the two resulting Allan 

variances. The next step was to wrap the data in a circular fashion and calculate the 

average of all the Allan variances at every basic measurement interval, το. This technique is very effective in 

improving the confidence at long averaging factors but requires end matching of the data. A further improvement of 

the total variance concept was to extend the data by reflection, first at one end of the record and then at both ends. 

This latest technique, called TOTVAR, gives a very significant confidence advantage at long averaging times, exactly 

decomposes the classical standard variance [6], and is an important new general statistical tool. TOTVAR is defined 

for phase data as:

1 2 * **

2

2

1 var( ) 2 2 ( 2)

N

im i im

i

Tot x x x

N

τ

τ

−

− +

=

= −+ ⎡ ⎤ ⎣ ⎦ − ∑ , (25) 

The total variance offers 

improved confidence at large 

averaging factor by extending 

the data set by reflection at 

both ends. 
24 

where τ = mτο, and the N phase values x measured at τ = το are extended by reflection about both endpoints to form a 

virtual sequence x* from i = 3–N to i = 2N–2 of length 3N–4. The original data are in the center of x* with i =1 to N 

and x*=x. The reflected portions added at each end extend from j = 1 to N–2 where x*1-j = 2x1–x1+j and x*N+j = 2xN–

xN-j. 

Totvar can also be defined for frequency data as: 

2 1 * *

1

1

1 var( ) 2( 1)

M

ij ij

i

Tot y y Mτ

−

++ +

=

= − ⎡ ⎤ ⎣ ⎦ − ∑ , (26) 

where the M = N–1 fractional frequency values, y, measured at τ = το (N phase values) are extended by reflection at 

both ends to form a virtual array y*. The original data are in the center, where y*I = yi for i = 1 to M, and the extended 

data for j = 1 to M–1 are equal to y*1-j = yj and y*M+1 = yM+1-j. 

 

The result is usually expressed as the square root, σtotal(τ), the total deviation, TOTDEV. When calculated by use of 

the doubly reflected method described above, the expected value of TOTVAR is the same as AVAR for white and 

flicker PM or white FM noise. Bias corrections of the form 1/[1–a(τ/T)], where T is the record length, need to be 

applied for flicker and random walk FM noise, where a = 0.481 and 0.750, respectively. 

The number of equivalent χ2 degrees of freedom for TOTVAR can be estimated for white FM, flicker FM and 

random walk FM noise by the expression b(T/τ)–c, where b = 1.500, 1.168 and 0.927, and c = 0, 0.222 and 0.358, 

respectively. For white and flicker PM noise, the edf for a total deviation estimate is the same as that for the 

overlapping ADEV with the number of χ2 degrees of freedom increased by 2. 

References for Total Variance 

1. D.A. Howe, “An extension of the Allan variance with increased confidence at long term,” Proc. 1995 IEEE 

Int. Freq. Cont. Symp., pp. 321-329 (June 1995). 

2. D.A. Howe and K.J. Lainson, “Simulation study using a new type of sample variance,” Proc. 1995 PTTI 

Mtg., pp. 279-290 (Dec. 1995). 

3. D.A. Howe and K.J. Lainson, “Effect of drift on TOTALDEV,” Proc. 1996 Intl. Freq. Cont. Symp., pp. 883-

889 (June 1996). 

4. D.A. Howe, “Methods of improving the estimation of long-term frequency variance,” Proc. 1997 European 

Frequency and Time Forum, pp. 91-99 (March 1997). 

5. D.A. Howe and C.A. Greenhall, “Total variance: A progress report on a new frequency stability 

characterization,” Proc. 1997 PTTI Mtg., pp. 39-48 (Dec. 1997). 

6. D.B. Percival and D.A. Howe, “Total variance as an exact analysis of the sample variance,” Proc. 1997 

PTTI Mtg., pp. 97-105 (Dec. 1997). 

7. C.A. Greenhall, D.A. Howe, and D.B. Percival, “Total variance, an estimator of long-term frequency 

stability,” IEEE Trans. Ultrason. Ferroelect. Freq. Cont., 46(5): 1183-1191 (Sept. 1999). 

8. D. Howe and T. Peppler, “Definitions of total estimators of common time-domain variances,” Proc. 2001 

IEEE Intl. Freq. Cont. Symp. 127-132 (June 2001). 
25 

5.2.12. Modified Total Variance 

The modified total variance, MTOT, is another new statistic for the analysis of 

frequency stability. It is similar to the modified Allan variance, MVAR, and has the 

same expected value, but offers improved confidence at long averaging times. It 

uses the same phase averaging technique as MVAR to distinguish between white 

and flicker PM noise processes. 

A calculation of MTOT begins with an array of N phase data points (time deviates, xi) with sampling period το that 

are to be analyzed at averaging time τ = mτ0. MTOT is computed from a set of N – 3m + 1 subsequences of 3m 

points. First, a linear trend (frequency offset) is removed from the subsequence by averaging the first and last halves 

of the subsequence and dividing by half the interval. Then the offset-removed subsequence is extended at both ends 

by uninverted, even reflection. Next the modified Allan variance is computed for these 9m points. Finally, these 

steps are repeated for each of the N – 3m + 1 subsequences, calculating MTOT as their overall average. These steps, 

similar to those for MTOT, but acting on fractional frequency data, are shown in Figure 10. 

3m

N-3m+1 Subsequences:

Linear Trend Removed:

9m

Extended Subsequence:

Uninverted, Even Reflection:

9 m-Point Averages:

6m 2nd Differences:

xi i=n to n+3m-1

0

xi xi = xi - ci ⋅ i, ci = freq offset

0

xi

0 # xn-l#

 = 0xn+l-1

mod σy

2

(τ) = 1/2τ

2

⋅ 〈 zn

2

(m) 〉, where _ _ _

zn(m) = xn(m) - 2xn+m(m) + xn+2m(m)

Calculate Mod σy

2

(τ) for Subsequence:

1 ≤ l ≤ 3m 0

xn+3m+l-1

#

 = 0xn+3m-l

Phase Data xi , i = 1 to N

Figure 10. Steps similar to calculation of MTOT on fractional frequency data. 

Computationally, the MTOT process requires three nested loops: 

• An outer summation over the N − 3m + 1 subsequences. The 3m-point subsequence is formed, its linear trend is 

removed, and it is extended at both ends by uninverted, even reflection to 9m points. 

• An inner summation over the 6m unique groups of m-point averages from which all possible fully overlapping 

second differences are used to calculate MVAR.

• A loop within the inner summation to sum the phase averages for three sets of m points.

The final step is to scale the result according to the sampling period, τ0, averaging factor, m, and number of points, N. 

Overall, this can be expressed as: 

31 31 2 0 #

2

0 1 3

1 1 var( ) ( ) 2( ) ( 3 1) 6

Nm nm

i

n in m

Mod Tot z m

m Nm m

τ

τ

−− +−

= =−

⎧ ⎫ = ⎨ ⎡

⎣ ⎤⎦ ⎬

− + ⎩ ⎭ ∑ ∑ , (27) 

The modified total variance 

combines the features of the 

modified Allan and total 

variances. 
26 

where the 0

zi

#

(m) terms are the phase averages from the triply extended subsequence, and the prefix 0 denotes that the 

linear trend has been removed. At the largest possible averaging factor, m = N/3, the outer summation consists of 

only one term, but the inner summation has 6m terms, thus providing a sizable number of estimates for the variance. 

Reference for Modified Total Variance 

D.A. Howe and F. Vernotte, “Generalization of the Total Variance Approach to the Modified Allan Variance,” Proc. 

31st PTTI Meeting, pp. 267-276, Dec. 1999. 

5.2.13. Time Total Variance 

The time total variance, TTOT, is a similar measure of time stability, based on the 

modified total variance. It is defined as 

3

2 2

( ) ( ) Mod 3 x total τ

τ

στ σ = ⋅ (28) 

5.2.14. Hadamard Total Variance 

The Hadamard total variance, HTOT, is a total version of the Hadamard variance. 

As such, it rejects linear frequency drift while offering improved confidence at large 

averaging factors. 

An HTOT calculation begins with an array of N fractional frequency data points, yi 

with sampling period τ0 that are to be analyzed at averaging time τ =m τ 0. HTOT is 

computed from a set of N − 3m + 1 subsequences of 3m points. First, a linear trend 

(frequency drift) is removed from the subsequence by averaging the first and last 

halves of the subsequence and dividing by half the interval. Then the drift-removed 

subsequence is extended at both ends by uninverted, even reflection. Next the Hadamard variance is computed for 

these 9m points. Finally, these steps are repeated for each of the N − 3m + 1 subsequences, calculating HTOT as their 

overall average. These steps are shown in Figure11. 

The time total variance is a 

measure of time stability 

based on the modified total 

variance. 

The Hadamard total variance 

combines the features of the 

Hadamard and total variances 

by rejecting linear frequency 

drift, handling more divergent 

noise types, and providing 

better confidence at large 

averaging factors. 
27 

3m

N-3m+1 Subsequences:

9m

Extended Subsequence:

Uninverted, Even Reflection:

9 m-Point Averages:

6m 2nd Differences:

i=n to n+3m-1

1 ≤ l ≤ 3m

Fractional Frequency Data yi , i = 1 to N

yi

0

yi yi

 = yi - ci ⋅ i, ci Linear Freq Drift Removed: = freq drift

0

yn-l

#

 = 0yn+l-1

0

yi

# 0yn+3m+l-1#

 = 0yn+3m-l

Calculate Had σy

2

(τ) for Subsequence: _ _ _

zn(m) = yn(m) - 2yn+m(m) + yn+2m(m)

Had σy

2

(τ) = 1/6 ⋅ 〈 zn

2

(m) 〉, where

Then Find HTOT as Average of Subestimates

Figure 11. Steps to calculate Hadamard Total Variance.

Computationally, the HTOT process requires three nested loops: 

• An outer summation over the N − 3m + 1 subsequences. The 3m-point subsequence is formed, its linear trend is 

removed, and it is extended at both ends by uninverted, even reflection to 9m points.

• An inner summation over the 6m unique groups of m-point averages from which all possible fully overlapping 

second differences are used to calculate HVAR.

• A loop within the inner summation to sum the frequency averages for three sets of m points.

The final step is to scale the result according to the sampling period, τ0, averaging factor, m, and number of points, N. 

Overall, this can be expressed as: 

( )

31 31

2 2

0

1 3

1 1 , , ( ( )) 6( 3 1) 6

Nm nm

y i

n in m

TotalH m N H m

Nm m

σ τ

−+ +−

= =−

⎛ ⎞ = ⎜ ⎟ − + ⎝ ⎠ ∑ ∑ , (29) 

where the Hi(m) terms are the zn(m) Hadamard second differences from the triply extended, drift-removed 

subsequences. At the largest possible averaging factor, m = N/3, the outer summation consists of only one term, but 

the inner summation has 6m terms, thus providing a sizable number of estimates for the variance. The Hadamard 

total variance is a biased estimator of the Hadamard variance, so a bias correction is required that is dependent on the 

power law noise type and number of samples.

The following plots shown the improvement in the consistency of the overlapping Hadamard deviation results 

compared with the normal Hadamard deviation, and the extended averaging factor range provided by the Hadamard 

total deviation [10]. 
28 

Figure 12. (a) Hadamard Deviation, (b) Overlapping Hadamard Deviation.

Figure 13. (a) Hadamard Total Deviation, (b) Overlapping & Total Hadamard Deviations 

A comparison of the overlapping and total Hadamard deviations shows the tighter error bars of the latter, allowing an 

additional point to be shown at the longest averaging factor. 

The Hadamard variance may also be used to perform a frequency domain (spectral) analysis because it has a transfer 

function that is a close approximation to a narrow rectangle of spectral width 1/(2⋅N⋅τ0), where N is the number of 

samples, and τ0 is the measurement time [3]. This leads to a simple expression for the spectral density of the 

fractional frequency fluctuations Sy(f) ≈ 0.73 ⋅τ0 ⋅Hσ

2

y(τ) / N, where f = 1/ (2⋅τ0), which can be particularly useful at 

low Fourier frequencies.

The Picinbono variance is a similar three-sample statistic. It is identical to the Hadamard variance except for a factor 

of 2/3 [4]. Sigma-z is another statistic that is similar to the Hadamard variance that has been applied to the study of 

pulsars [5]. 
29 

It is necessary to identify the dominant power law noise type as the first step in determining the estimated number of 

chi-squared degrees of freedom for the Hadamard statistics so their confidence limits can be properly set [6]. Because 

the Hadamard variances can handle the divergent flicker walk FM and random run FM power law noises, techniques 

for those noise types must be included. Noise identification is particularly important for applying the bias correction 

to the Hadamard total variance. 

References for Hadamard Total Variance 

1. D.A. Howe, R. Beard, C.A. Greenhall, F. Vernotte, and W.J. Riley, “A total estimator of the Hadamard function 

used for GPS operations,” Proc. 32nd PTTI Mtg., pp. 255-267, Nov. 2000. 

2. D.A. Howe, R. Beard, C.A. Greenhall, F. Vernotte, and W.J. Riley, “Total Hadamard variance: Application to 

clock steering by Kalman filtering,” Proc. 2001 European Freq. and Time Forum, pp. 423-427 (Mar. 2001). 

3. Chronos Group, Frequency measurement and control, Section 3.3.3, Chapman & Hall, London, ISBN 0-412-

48270-3 (1994). 

4. B. Picinbono, « Processus à accroissements stationnaires » Ann. des telecom, 30(7-8): 211-212 (July-Aug. 

1975). 

5. D.N. Matsakis and F.J. Josties, “Pulsar-appropriate clock statistics,” Proc. 28th PTTI Mtg., pp. 225-236 (Dec. 

1996). 

6. D.A. Howe, R.L. Beard, C.A. Greenhall, F. Vernotte, W.J. Riley, and T.K. Peppler, “Enhancements to GPS 

operations and clock evaluations using a total Hadamard deviation,” IEEE Trans. Ultrason. Ferroelect. Freq. 

Cont., 52: 1253-1261 (Aug. 2005).

5.2.15. Thêo1 

Thêo1 is a new class of statistics which mimic the properties of the Allan variance 

(AVAR) while covering a larger range of averaging times, 10 to N−2 for Thêo1 vs.

1 to (N−1)/2 for AVAR [1]. It provides improved confidence and the ability to 

obtain a result for a maximum averaging time equal to 75 % of the record length. 

Thêo1 [1] is defined as follows: 

[ ]

/2 1

2

0 2 /2 /2

0 1 0

1 1 1( , , ) ( ) ( ) ( )( ) / 2

N mm

i i m im i m

i

Theo m N x x x x

N mm m δ δ

δ

τ

τ δ

− −

−+ + ++

= =

= − +− − − ∑ ∑ , (30) 

where m = averaging factor, τ0 = measurement interval, and N = number of phase data points, for m even, and 10 ≤ m 

≤ N − 1. It consists of N - m outer sums over the number of phase data points –1, and m/2 inner sums. Thêo1 is the 

rms of frequency differences averaged over an averaging time τ = 0.75 (m − 1)τ0. 

A schematic for a Thêo1 calculation is shown in Figure 14. This example is for eleven phase samples (N = 11) at the 

largest possible averaging factor (m = 10). 

Thêo1 is a two-sample variance 

with improved confidence and 

extended averaging factor 

range. 
30 

0

4

3

2

1

1 2 3 4 6 7 8 9 10 11 5

Theo1 Schematic for n=11, m=10

i =1 to n-m = 1 , δ = 0 to m/2 -1 = 4

δ

x[ ] index = 

Figure 14. A schematic for Thêo1 calculation.

The single outer summation (i = 1 to 1) at the largest possible averaging factor consists of m/2 = 5 terms, each with 

two phase differences. These terms are scaled by their spans m/2 − δ = 5 thru 1 so that they all have equal weighting. 

A total of 10 terms contribute to the Theo1 statistic at this largest-possible averaging factor. The averaging time, τ, 

associated with a Thêo1 value is τ = 0.75·m·τ0, where τ0 is the measurement interval. Thêo1 has the same expected 

value as the Allan variance for white FM noise, but provides many more samples that provide improved confidence 

and the ability to obtain a result for a maximum τ equal to three-fourths of the record length, T. Thêo1 is a biased 

estimator of the Allan variance, AVAR, for all noise types except white FM noise, and it therefore requires the 

application of a bias correction. Reference [2] contains the preferred expression for determining the Thêo1 bias as a 

function of noise type and averaging factor: 

c

Avar b Thêo1 Bias= a+

Thêo1 m = , (31) 

where m is the averaging factor and the constants a, b and c are given in Table 2. Note that the effective tau for a 

Thêo1 estimation is τ = 0.75·m·τ0, where τ0 is the measurement interval. 

Table 2. Thêo1 bias parameters.

Noise Alpha a b c

RW FM −2 2.70 −1.53 0.85

F FM −1 1.87 −1.05 0.79

W FM 0 1.00 0.00 0.00

F PM 1 0.14 0.82 0.30

W PM 2 0.09 0.74 0.40 

 

Empirical formulae have been developed [1] for the number of equivalent χ2

 degrees of freedom for the Thêo1 

statistic, as shown in Table 3: 
31 

Table 3. Thêo1 EDF Formulae

Noise EDF

RW FM 44 2

2 9

4 4 1 8 6 4 4 1 114

44 3

2 2

2

.

.

. ) . (. ) .

(. )

N

r

N rN r

N

F −

H

G I

K

J − − −+

−

F

H

G I

K

J c h

F FM 2 13 35

2 3

2 3

3

N Nr r

Nr

r

r

F − −

H

G I

K

J +

F

H

G I

K

J . .

.

W FM 41 08 31 6 5

5 2

3 2

3 2

. .. .

.

/

/

N

r

N

N

r

r

+ − L +

N

M O

Q

P +

F

H

G I

K

J

F PM 4 798 6 374 12 387

36 6 0 3

2

1 2

.. .

.( ) . /

N Nr r

r Nr

r

r

− +

+ −

F

H

G I

K

J +

F

H

G I

K

J b g

W PM 0 86 1 4 3

114

. ( )( / )

.

N Nr

N r

r

r

+ −

−

F

H

G I

K

J

+

F

H

G I

K

J

where r = 0.75m, and with the condition τ0 ≤ T/10. 

5.2.16. ThêoH 

Thêo1 has the same expected value as the Allan variance if bias is removed [2]. It is 

useful to combine a bias-removed version of Thêo1, called ThêoBR, with AVAR to 

produce a composite stability plot. The composite is called “ThêoH” which is short 

for “hybrid-ThêoBR” [3]. ThêoH is the best statistic available for estimating the 

stability level and type of noise of a frequency source, particularly at large averaging 

times and with a mixture of noise types [4]. 

The NewThêo1 algorithm of Reference [2] provides a method of automatic bias correction for a Thêo1 estimation 

based on the average ratio of the Allan and Thêo1 variances over a range of averaging factors: 

0

0 0

i=0 0

1 Avar( =9+3i, ,N) NewThêo1( , , )= Thêo1( , , ) n+1 Thêo1( 12 4 , , )

n m mN mN

m iN

τ

τ τ

τ

⎡ ⎤

⎢ ⎥ ⎣ ⎦ = + ∑ , (32) 

where 3 , and 30

N

n

⎢ ⎥ = − ⎢ ⎥ ⎢ ⎥ ⎣ ⎦ ⎣ ⎦ denotes the floor function. 

NewThêo1 was used in Reference [2] to form a composite AVAR/ NewThêo1 result called LONG, which has been 

superseded by ThêoH (see below). 

ThêoBR [3] is an improved bias-removed version of Thêo1 given by 

0

0 0

i=0 0

1 Avar( =9+3i, ,N) ThêoBR( , , )= Thêo1( , , ) n+1 Thêo1( 12 4 , , )

n m mN mN

m iN

τ

τ τ

τ

⎡ ⎤

⎢ ⎥ ⎣ ⎦ = + ∑ , (33) 

where 3 , and 6

N

n

⎢ ⎥ = − ⎢ ⎥ ⎢ ⎥ ⎣ ⎦ ⎣ ⎦ denotes the floor function. 

NewThêo1, ThêoBR , and 

ThêoH are versions of Thêo1 

that provide bias removal and 

combination with the Allan 

variance. 
32 

ThêoBR can determine an unbiased estimate of the Allan variance over the widest possible range of averaging times 

without explicit knowledge of the noise type. ThêoBR in the equation above is computationally intensive for large 

data sets, but computation time is significantly reduced by phase averaging with negligible effect on bias removal [5]. 

ThêoH is a hybrid statistic that combines ThêoBR and AVAR on one plot: 

0

0

0

0

k Avar ( , , ) for 1

0 k ThêoBR ( , , ) for 1, even 0.75

ThêoH( , , )=

mN m

m N mN m

m N τ τ

τ τ

τ ≤ ≤

≤≤−

⎧ ⎫ ⎪ ⎪ ⎨ ⎬ ⎪ ⎪ ⎩ ⎭

, (34) 

where k is the largest available τ ≤ 20% T. 

An example of a ThêoH plot is shown in Figure 15: 

Figure 15. An example plot of ThêoH. 

 

ThêoH is a composite of AVAR and bias-corrected ThêoBR analysis points at a number of averaging times 

sufficiently large to form a quasi-continuous curve. The data are a set of 1001 simulated phase values measured at 

15-minute intervals taken over a period of about 10 days. The AVAR results are able to characterize the stability to 

an averaging time of about two days, while Thêo1 is able to extend the analysis out to nearly a week, thus providing 

significantly more information from the same data set. An example of analysis using ThêoH with data from a Cs 

standard is shown in Section 11. 
33 

References for Thêo1, NewThêo1, ThêoBR and ThêoH 

1. D.A. Howe and T.K. Peppler, “Very Long-Term Frequency Stability: Estimation Using a Special-Purpose 

Statistic,” Proceedings of the 2003 IEEE International Frequency Control Symposium, pp. 233-238, May 2003. 

2. D.A. Howe and T.N. Tasset, “Thêo1: Characterization of Very Long-Term Frequency Stability,” Proc. 2004 

EFTF.

3. D.A. Howe, “ThêoH: A Hybrid, High-Confidence Statistic that Improves on the Allan Deviation,” Metrologia 43

(2006), S322-S331. 

4. J. McGee and D.A. Howe, “ThêoH and Allan Deviation as Power-Law Noise Estimators,” IEEE Trans. 

Ultrasonics, Ferroelectrics and Freq. Contrl., Feb. 2007. 

5. J. McGee and D.A. Howe, “Fast TheoBR: A method for long data set stability analysis,” IEEE Trans. 

Ultrasonics, Ferroelectrics and Freq. Contrl., to be published, 2008. 

5.2.17 MTIE 

The maximum time interval error, MTIE, is a measure of the maximum time error of 

a clock over a particular time interval. This statistic is commonly used in the 

telecommunications industry. It is calculated by moving an n-point (n = τ/τo) window 

through the phase (time error) data and finding the difference between the maximum 

and minimum values (range) at each window position. MTIE is the overall 

maximum of this time interval error over the entire data set: 

1 ( ) { ( ) ( )} MTIE Max Max x Min x kNn kikn i kikn i τ = − ≤ ≤ − ≤≤ + ≤≤ + , (35) 

where n = 1,2,..., N−1 and N = number of phase data points. 

MTIE is a measure of the peak time deviation of a clock and is therefore very sensitive to a single extreme value, 

transient or outlier. The time required for an MTIE calculation increases geometrically with the averaging factor, n, 

and can become very long for large data sets (although faster algorithms are available – see [1] below). 

The relationship between MTIE and Allan variance statistics is not completely defined, but has been the subject of 

recent theoretical work [2,3]. Because of the peak nature of the MTIE statistic, it is necessary to express it in terms of 

a probability level, β, that a certain value is not exceeded. 

For the case of white FM noise (important for passive atomic clocks such as the most common rubidium and cesium 

frequency standards), MTIE can be approximated by the relationship 

MTIE( , )=k h k 2 ( ) β β 0 y τ β τ σττ ⋅ ⋅= ⋅ ⋅ ⋅ , (36) 

where kβ is a constant determined by the probability level, β, as given in Table 4, and ho is the white FM power-law 

noise coefficient. 

Table 4. Constants β and kβ.

β, % kβ

95 1.77

90 1.59

80 1.39 

The maximum time interval error (MTIE) and rms time interval error (TIE rms) are clock stability measures 

commonly used in the telecom industry [4, 5]. MTIE is determined by the extreme time deviations within a sliding 

MTIE is a measure of clock 

error commonly used in the 

tele-communications 

industry. 
34 

window of span τ, and is not as easily related to such clock noise processes as TDEV [2]. MTIE is computationally 

intensive for large data sets [6]. 

References for MTIE 

 

1. S. Bregni, “Measurement of maximum time interval error for telecommunications clock stability 

characterization,” IEEE Trans. Instrum. Meas., 45(5): 900-906 (Oct. 1996). 

2. P. Travella and D. Meo, “The range covered by a clock error in the case of white FM,” Proc. 30th PTTI Mtg., 

pp. 49-60 (Dec. 1998). 

3. P. Travella, A. Dodone, and S. Leschiutta, “The range covered by a random process and the new definition of 

MTIE,” Proc. 28th PTTI Mtg., pp. 119-123 (Dec. 1996). 

4. S. Bregni, “Clock Stability Characterization and Measurement in Telecommunications,” IEEE Trans. Instrum. 

Meas., 46(6): 1284-1294 (Dec. 1997). 

5. G. Zampetti, “Synopsis of timing measurement techniques used in telecommunications,” Proc. 24th PTTI Mtg., 

pp. 313-326 (Dec. 1992). 

6. S. Bregni and S. Maccabruni, “Fast computation of maximum time interval error by binary decomposition,” 

IEEE Trans. Instrum. Meas., 49(6): 1240-1244 (Dec. 2000). 

7. M.J. Ivens, “Simulating the Wander accumulation in a SDH synchronisation network,” Master's Thesis, 

University College, London, U.K. (Nov. 1997). 

5.2.18. TIE rms 

The rms time interval error, TIE rms, is another clock statistic commonly used by the telecommunications industry. 

TIE rms is defined by the expression 

 

TIE

N n

x x rms i n i

i

N n

= − + − =

−

∑ 1 2

1

b g , (37) 

where n = 1,2,..., N−1 and N = # phase data points. 

For no frequency offset, TIE rms is approximately equal to the standard deviation of the fractional frequency 

fluctuations multiplied by the averaging time. It is therefore similar in behavior to TDEV, although the latter properly 

identifies divergent noise types. 

Reference for TIE rms 

 

S. Bregni, “Clock Stability Characterization and Measurement in Telecommunications,” IEEE Trans. Instrum. 

Meas., Vol. 46, No. 6, pp. 1284-1294, Dec. 1997. 

5.2.19. Integrated Phase Jitter and Residual FM 

Integrated phase jitter and residual FM are other ways of expressing the net phase or frequency jitter by integrating it 

over a certain bandwidth. These can be calculated from the amplitudes of the various power law terms. 

The power law model for phase noise spectral density (see section 6.1) can be written as 

S f Kf x

φ( ) = ⋅ , (38) 
35 

where Sφ is the spectral density of the phase fluctuations in rad2/Hz, f is the modulation frequency, K is amplitude in 

rad2

, and x is the power law exponent. It can be represented as a straight line segment on a plot of Sφ(f) in dB relative 

to 1 rad2

/Hz versus log f in hertz. Given two points on the plot (f1, dB1) and f2, dB2), the values of x and K may be 

determined by 

x

dB dB

f f = −

⋅ −

1 2

10 (log log ) 1 2

 , (39)

and 

K

dB x f

= − F

H

G I

K

J

10

1 1 10 log

 . (40) 

The integrated phase jitter can then be found over this frequency interval by 

2 2

1 1

2

2 11

2 1

2

2 1

( )

( ) for 1

1

(log log ) for 1.

f f

f f

x x

S f df K f df

K ff x

x

K f fx

φ φ

φ

φ

+ +

Δ = ⋅ = ⋅⋅

Δ = − ≠−

+

Δ=⋅ − =

∫ ∫

 (41) 

It is usually expressed as Δφ in rms radians. 

Similarly, the spectral density of the frequency fluctuations in Hz2

/Hz is given by 

S f S f f S f Kf y

x

ν φ b g = ⋅ = ⋅ =⋅ ν b g +

0

2 2 2 ( ) Δ , (42)

where ν0 is the carrier frequency in hertz, and Sy(f) is the spectral density of the fractional frequency fluctuations (see 

Section 6.1). 

The integrated frequency jitter or residual FM is therefore 

2 2

1 1

2 2

2 33

2 1

2

2 1

( )

( ) for 3

3

(log log ) for 3.

f f x

f f

x x

f S f df K f df

K f ff x

x

fK f f x

ν

+

+ +

Δ= ⋅ = ⋅ ⋅

Δ= − ≠

+

Δ = ⋅ − =−

∫ ∫

 (43) 

It is usually expressed as Δf in rms hertz. 

The value of Sφ(f) in dB can be found from the more commonly used £(f) measure of SSB phase noise to carrier power 

ratio in dBc/Hz by adding 3 dB. The total integrated phase noise is obtained by summing the Δφ2

 contributions from 

the straight-line approximations for each power law noise type. The ratio of total phase noise to signal power in the 

given integration bandwidth is equal to 10 log Δφ2

. 
36 

References for Integrated Phase Jitter and Residual FM 

 

1. W. J. Riley, “Integrate Phase Noise and Obtain Residual FM,” Microwaves, August 1979, pp. 78-80. 

2. U.L. Rohde, Digital PLL Frequency Synthesizers, pp. 411-418, Prentice-Hall, Englewood Cliffs, 1983. 

3. D.A. Howe and T.N. Tasset, “Clock Jitter Estimation based on PM Noise Measurements,” Proc. 2003 Joint Mtg. 

IEEE Intl. Freq. Cont. Symp. and EFTF Conf., pp. 541-546, May 2003. 

5.2.20. Dynamic Stability 

A dynamic stability analysis uses a sequence of sliding time windows to perform a dynamic Allan (DAVAR) or 

Hadamard (DHVAR) analysis, thereby showing changes (nonstationarity) in clock behavior versus time. It is able to 

detect variations in clock stability (noise bursts, changes in noise level or type, etc.) that would be difficult to see in an 

ordinary overall stability analysis. The results of a dynamic stability analysis are presented as a three-dimensional 

surface plot of log sigma versus log tau or averaging factor as a function of time or window number. 

An example of a DAVAR plot is shown below. This example is similar to the one of Figure 2 in Reference [1], 

showing a source with white PM noise that changes by a factor of 2 at the middle of the record. 

Figure 16. Example of a DAVAR plot. 
37 

References for Dynamic Stability 

 

1. L. Galleani and P. Tavella, “Tracking Nonstationarities in Clock Noises Using the Dynamic Allan Variance,” 

Proc. 2005 Joint FCS/PTTI Meeting. 

2. L. Galleani and P. Tavella, “The Characterization of Clock Behavior with the Dynamic Allan Variance,” Proc. 

2003 Joint FCS/EFTF Meeting, pp. 239-244. 

5.3. Confidence Intervals 

It is wise to include error bars (confidence intervals) on a stability plot to indicate the degree of statistical confidence 

in the numerical results. The confidence limits of a variance estimate depend on the variance type, the number of data 

points and averaging factor, the statistical confidence factor desired, and the type of noise. This section describes the 

use of χ2 statistics for setting the confidence intervals and error bars of a stability analysis. 

It is generally insufficient to simply calculate a stability statistic such as the Allan deviation, thereby finding an 

estimate of its expected value. That determination should be accompanied by an indication of the confidence in its 

value as expressed by the upper and (possibly) lower limits of the statistic with a certain confidence factor. For 

example, if the estimated value of the Allan deviation is 1.0 × 10-11, depending on the noise type and size of the data 

set, we could state with 95 % confidence that the actual value does not exceed (say) 1.2 ×10-11. It is always a good 

idea to include such a confidence limit in reporting a statistical result, which can be shown as an upper numeric limit, 

upper and lower numeric bounds, or (equivalently) error bars on a plot. Even though those confidence limits or error 

bars are themselves inexact, they should be included to indicate the validity of the reported result. 

If you are unfamiliar with the basics of confidence limits, it is recommended that an introductory statistics book be 

consulted for an introduction to this subject. For frequency stability analysis, the emphasis is on various variances, 

whose confidence limits (variances of variances) are treated with chi-squared (χ2) statistics. Strictly speaking, χ2

statistics apply to the classical standard variance, but they have been found applicable to all of the other variances 

(Allan, Hadamard, total, Thêo1, etc.) used for frequency stability analysis. A good introduction to confidence limits 

and error bars for the Allan variance may be found in Reference [1]. The basic idea is to (1) choose an single or 

double-sided confidence limits (upper or upper and lower bounds), (2) choose an appropriate confidence factor (e.g., 

95 %), (3) determine the number of equivalent χ2 degrees of freedom (edf), (4) use the inverse χ2 distribution to find 

the normalized confidence limit(s), and (5) multiply those by the nominal deviation value to find the error bar(s). 

5.3.1. Simple Confidence Intervals 

The simplest confidence interval approximation, with no consideration of the noise type, sets the ±1σ (68 %) error 

bars at ±σy(τ)/√N, where N is the number of frequency data points used to calculate the Allan deviation. 

A more accurate determination of this confidence interval can be made by considering the noise type, which can be 

estimated by the B1 bias function (the ratio of the standard variance to the Allan variance). That noise type is then be 

used to determine a multiplicative factor, Kn, to apply to the confidence interval: 

Noise Type Kn

Random Walk FM 0.75 

Flicker FM 0.77 

White FM 0.87 

Flicker PM 0.99 

White PM 0.99 
38 

5.3.2 Chi-Squared Confidence Intervals 

Chi-squared statistics can be applied to calculate single and double-sided confidence intervals at any desired 

confidence factor. These calculations are based on a determination of the number of degrees of freedom for the 

estimated noise type. Most stability plots show ±1σ error bars for its overlapping Allan deviation plot. 

The error bars for the modified Allan and time variances are also determined by Chi-squared statistics, using the 

number of MVAR degrees of freedom for the particular noise type, averaging factor, and number of data points. 

During the Run function, noise type estimates are made at each averaging factor (except the last, where the noise type 

of the previous averaging factor is used). 

Sample variances are distributed according to the expression 

2

2

2

edf s χ

σ

⋅ = , (44) 

where χ2 is the Chi-square, s2 is the sample variance, σ2 is the true variance, and edf is the equivalent number of 

degrees of freedom (not necessarily an integer). The edf is determined by the number of analysis points and the noise 

type. Procedures exist for establishing single- or double-sided confidence intervals with a selectable confidence 

factor, based on χ2 statistics, for many of its variance functions. The general procedure is to choose a single- or 

double-limited confidence factor, p, calculate the corresponding χ2 value, determine the edf from the variance type, 

noise type and number of analysis points, and thereby set the statistical limit(s) on the variance. For double-sided 

limits, 

22 2 2

min max 2 2 and 

( , ) (1 , )

edf edf s s

p edf p edf

σ σ

χ χ =⋅ =⋅ − . (45) 

5.4. Degrees of Freedom 

The equivalent number of χ2 degrees of freedom (edf) associated with a statistical variance (or deviation) estimate 

depends on the variance type, the number of data points, and the type of noise involved. In general, the progression 

from the original two-sample (Allan) variance to the overlapping, total, and Thêo1 variances has provided larger edfs 

and better confidence. The noise type matters because it determines the extent that the points are correlated. Highly 

correlated data have a smaller edf than does the same number of points of uncorrelated (white) noise. An edf 

determination therefore involves (1) choosing the appropriate algorithm for the particular variance type, (2) 

determining the dominant power law noise type of the data, and (3) using the number of data points to calculate the 

corresponding edf. 

5.4.1. AVAR, MVAR, TVAR, and HVAR EDF 

The equivalent number of χ2 degrees of freedom (edf) for the Allan variance (AVAR), the modified Allan variance 

(MVAR) and the related time variance (TVAR), and the Hadamard variance (HVAR) is found by a combined 

algorithm developed by C.A. Greenhall, based on its generalized autocovariance function [2]. 
39 

1

10

100

1000

1 10 100

Full EDF Algorithm vs m

with N as Parameter

N=

5

10

25

50

100

250

500

Averaging Factor, m

EDF

Figure 17. Overlapping ADEV EDF for W FM Noise. 

1

10

100

1 10 100

α=

-2

-1

0

1

2

Full EDF Algorithm vs m

with α as Parameter

Averaging Factor, m

EDF

Figure 18. Overlapping ADEV EDF for N=100. 
40 

1

10

100

1 10 100

Modified

Hadamard

Allan

Variance Type:

Full EDF Algarithm vs m

with Variance Type as Parameter

Averaging Factor, m

EDF

Figure 19. Overlapping EDF for N-100 and W FM Noise 

This method for estimating the edf for the Allan, modified Allan, and Hadamard variances supersedes the following 

somewhat simpler empirical approximations (which may still be used). 

The equivalent number of χ

2

 degrees of freedom (edf) for the fully overlapping Allan variance (AVAR) can be 

estimated by the following approximation formulae for each power law noise type: 

Table 5. AVAR approximation formulae for each power law noise type. 

Power law 

noise type

AVAR edf, where 

 N = # phase data points, m = averaging factor 

= τ/τ0

W PM

N Nm

N m

+ −

−

1 2

2

b gb g

b g

F PM exp ln ln

/

N

m

F − m N

H

G I

K

J F + −

H

G I

K

J L

N

M O

Q

P 1

2

21 1

4

1 2 b g b gb g

W FM

3 1

2

2 2 4

4 5

2

2

N

m

N

N

m

m

− − L −

N

M O

Q

P +

b gb g

F FM

2 2

23 49

2

N

N

−

−

b g . . For m = 1

5

4 3

2 N

mN m b g +

For m >1

RW FM

N

m

N mN m

N

L −

N

M

M

O

Q

P

P

− − −+

−

L

N

M

M

O

Q

P

P

2 1 3 14

3

2 2

2

b g b g b g

b g
41 

The edf for the modified Allan variance (MVAR) can be estimated by the same expression as the overlapping 

Hadamard variance (see below) with the arguments changed as follows (valid for −2 ≤ α ≤ 2): MVAR and TVAR edf 

for N, m and α = MVAR edf for N + 1, m and α − 2. 

The edf for the fully overlapping Hadamard variance (HVAR) can be found by an earlier algorithm also developed by 

C.A. Greenhall based on its generalized autocovariance function. The HVAR edf is found either as a summation (for 

small m cases with a small number of terms) or from a limiting form for large m, where 1/edf = (1/p)(a0−a1/p), with 

the coefficients as follows: 

 

Table 6. HVAR edf coefficients. 

Power law 

noise type

HVAR edf 

coefficients

a0 a1

W FM 7/9 1/2

F FM 1.00 0.62

RW FM 31/30 17/28

FW FM 1.06 0.53

RR FM 1.30 0.54 

5.4.2. TOTVAR EDF 

The edf for the total variance (TOTVAR) is given by the formula b(T/τ) − c, where T is the length of the data record, τ

is the averaging time, and b and c are coefficients that depend on the noise type, as shown in Table 7: 

Table 7. TOTVAR edf coefficients 

Power law 

noise type

TOTVAR edf 

Coefficients

b c

White FM 1.50 0

Flicker FM 1.17 0.22

Random walk 

FM

0.93 0.36 

5.4.3. MTOT EDF 

The edf for the modified total variance (MTOT) is given by the same formula b(T/τ) − c, where T is the length of the 

data record, τ is the averaging time, and b and c are coefficients that depend on the noise type as shown in Table 8: 

Table 8. MTOT edf coefficients. 

Power law 

noise type

MTOT edf 

Coefficients

b c

White PM 1.90 2.10

Flicker PM 1.20 1.40

White FM 1.10 1.20

Flicker FM 0.85 0.50

Random walk 

FM

0.75 0.31 
42 

5.4.4. Thêo1 / ThêoH EDF 

The equivalent number of χ2 degrees of freedom (edf) for the Thêo1, hence, ThêoBR and ThêoH variances, is 

determined by the following approximation formulae for each power low noise type. 

Table 9. ThêoBR and ThêoH approximation formulae for each power law noise type. 

Power law 

noise type

Thêo1 edf, where 

 N = # phase data points, τ = 0.75m, m = averaging factor = τ/τ0

White PM ( )( ) 4

3 0.86 1

1.14

x x

x

N N

edf N

τ τ

τ τ

⎛ ⎞ + −⋅ ⎛ ⎞ = ⎜ ⎟⎜ ⎟ − + ⎝ ⎠ ⎝ ⎠

Flicker PM

2

1/2

4.798 6.374 12.387

( 36.6) ( ) 0.3

x x

x

N N edf Nτ τ τ

τ ττ

⎛ ⎞ − + ⎛ ⎞ = ⎜ ⎟⎜ ⎟ ⎝ ⎠ +− + ⎝ ⎠

White FM

3/2

3/2

4.1 0.8 3.1 6.5

5.2

x x

x

N N edf N

τ

τ τ

⎡ ⎤ + + ⎛ ⎞ = − ⎢ ⎥⎜ ⎟ ⎣ ⎦⎝ ⎠ +

Flicker FM

2 3

3

2 1.3 3.5

2.3

x x

x

N N edf Nτ τ τ

τ τ

⎛ ⎞ − − ⎛ ⎞ = ⎜ ⎟⎜ ⎟ ⎝ ⎠⎝ ⎠ +

Random walk 

FM

2 2

2

4.4 2 (4.4 1) 8.6 (4.4 1) 11.4

2.9 (4.4 3)

xx x

x

NN N edf Nτ τ

τ

⎛ ⎞ − − − −+ ⎛ ⎞ = ⎜ ⎟⎜ ⎟ ⎝ ⎠⎝ ⎠ −
43 

References for Confidence Intervals and Degrees of Freedom 

1. D.A. Howe, D.W. Allan and J.A. Barnes, “Properties of Signal Sources and Measurement Methods,” Proc. 35th 

Annu. Symp. on Freq. Contrl., pp. 1-47, May 1981. Available on line at 

http://tf.nist.gov/general/publications.htm. 

2. C. Greenhall and W. Riley, “Uncertainty of Stability Variances Based on Finite Differences,” Proc. 2003 PTTI 

Meeting, December 2003. 

3. D.A. Howe and T.K. Peppler, “Estimation of Very Long-Term Frequency Stability Using a Special-Purpose 

Statistic,” Proc. 2003 Joint Meeting of the European Freq. and Time Forum and the IEEE International Freq. 

Contrl. Symp., May 2003. 

4. K. Yoshimura, “Degrees of Freedom of the Estimate of the Two-Sample Variance in the Continuous Sampling 

Method,” IEEE Transactions IM-38, pp. 1044-1049, 1989. 

5. “IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology - Random 

Instabilities,” IEEE Std 1139-1999, July 1999. 

6. C.A. Greenhall, “Estimating the Modified Allan Variance,” Proc. IEEE 1995 Freq. Contrl. Symp., pp. 346-353, 

May 1995. 

7. D.A. Howe & C.A. Greenhall, “Total Variance: A Progress Report on a New Frequency Stability 

Characterization,” Proc. 1997 PTTI Meeting, pp. 39-48, December 1997. 

8. C.A. Greenhall, private communication, May 1999. 

9. D.A. Howe, private communication, March 2000. 

10. D.A. Howe, “Total Variance Explained,” Proc. 1999 Joint Meeting of the European Freq. and Time Forum and 

the IEEE Freq. Contrl. Symp., pp. 1093-1099, April 1999. 

11. D.A. Howe, private communication, March 2000. 

12. C.A. Greenhall, “Recipes for Degrees of Freedom of Frequency Stability Estimators,” IEEE Trans. Instrum. 

Meas., Vol. 40, No. 6, pp. 994-999, December 1991. 

13. D.A. Howe, “Methods of Improving the Estimation of Long-Term Frequency Variance,” Proc. 11th European 

Freq. and Time Forum, pp. 91-99, March 1997. 

14. J.A. Barnes and D.W. Allan, “Variances Based on Data with Dead Time Between the Measurements,” NIST 

Technical Note 1318, 1990. 

15. D.A. Howe, R.L. Beard, C.A. Greenhall, F. Vernotte, W.J. Riley, and T.K. Peppler, “Enhancements to GPS 

Operations and Clock Evaluations Using a Total Hadamard Deviation,” IEEE T. Ultrason. Ferr., 52, pp. 1253-

1261, Aug 2005..

5.5. Noise Identification 

Identification of the dominant power law noise type is often necessary for setting confidence intervals and making 

bias corrections during a frequency stability analysis. The most effective means for power noise identification are 

based on the B1 and R(n) functions and the lag 1 autocorrelation. 

5.5.1. Power Law Noise Identification 

It is often necessary to identify the dominant power law noise process (WPM, FPM, WFM, FFM, RWFM, FWFM or 

RRFM) of the spectral density of the fractional frequency fluctuations, Sy(f) = hαf α

 (α = 2 to –4), to perform a 

frequency stability analysis. For example, knowledge of the noise type is necessary to determine the equivalent 

number of chi-squared degrees of freedom (edf) for setting confidence intervals and error bars, and it is essential to 

know the dominant noise type to correct for bias in the newer Total and Thêo1 variances. While the noise type may 

be known a priori or estimated manually, it is desirable to have an analytic method for power law noise identification 

that can be used automatically as part of a stability analysis algorithm. 
44 

There is little literature on the subject of power-law noise identification. The most common method for power law 

noise identification is simply to observe the slope of a log-log plot of the Allan or modified Allan deviation versus 

averaging time, either manually or by fitting a line to it. This obviously requires at least two stability points. During 

a stability calculation, it is desirable (or necessary) to automatically identify the power law noise type at each point, 

particularly if bias corrections and/or error bars must be applied. 

5.5.2. Noise Identification Using B1 and R(n) 

A noise identification algorithm that has been found effective in actual practice, and that works for a single τ point 

over the full range of –4 ≤ α ≤ 2 is based on the Barnes B1 function, which is the ratio of the N-sample (standard) 

variance to the two-sample (Allan) variance, and the R(n) function [1], which is the ratio of the modified Allan to the 

normal Allan variances. The B1 function has as arguments the number of frequency data points, N, the dead time 

ratio, r (which is set to 1), and the power law t-domain exponent, μ. The B1 dependence on μ is used to determine the 

power law noise type for –2 ≤ μ ≤ 2 (W and F PM to FW FM). For a B1 corresponding to μ = –2, the α = 1 or 2 (F PM 

or W PM noise) ambiguity can be resolved with the R(n) ratio using the modified Allan variance. For the Hadamard 

variance, for which RR FM noise can apply, (m =3, a = –4), the B1 ratio can be applied to frequency (rather than 

phase) data, and adding 2 to the resulting μ. 

The overall noise B1/R(n) noise identification process is therefore: 

1. Calculate the standard and Allan variances for the applicable τ averaging factor. 

2. Calculate B1(N, r=1, μ) = N N

N

( )

( )( )

1

2 11 2

−

− −

μ

μ . 

3. Determine the expected B1 ratios for a = –3 through 1 or 2. 

4. Set boundaries between them and find the best power law noise match. 

5. Resolve an α = 1 or 2 ambiguity with the modified Allan variance and R(n). 

6. Resolve an α = –3 or –4 ambiguity by applying B1 to frequency data. 

The boundaries between the noise types are generally set as the geometric means of their expected values. This 

method cannot distinguish between W and F PM at unity averaging factor. 

5.5.3. The Autocorrelation Function 

The autocorrelation function (ACF) is a fundamental way to describe a time series by multiplying it by a delayed 

version of itself, thereby showing the degree by which its value at one time is similar to its value at a certain later 

time. More specifically, the autocorrelation at lag k is defined as 

ρ μ μ

σ

k

t tk

z

Ez z = − − + [( )( )]

2 , (46) 

where zt is the time series, μ is its mean value, σz

2

 is its variance, and E denotes the expected value. The 

autocorrelation is usually estimated by the expression 

r

N

z zz z

N

z z

k

t tk

t

N k

t

t

N =

− −

−

+

=

−

=

∑

∑

1

1

1

2

1

( )( )

( )

 , (47) 

where z is the mean value of the time series and N is the number of data points [2]. 
45 

5.5.4. The Lag 1 Autocorrelation 

The lag 1 autocorrelation is simply the value of r1 as given by the expression above. For frequency data, the lag 1 

autocorrelation is able to easily identify white and flicker PM noise, and white (uncorrelated) FM noise, for which the 

expected values are –1/2, –1/3 and zero, respectively. The more divergent noises have positive r1 values that depend 

on the number of samples, and tend to be larger (approaching 1). For those more divergent noises, the data are 

differenced until they become stationary, and the same criteria as for WPM, FPM and WFM are then used, corrected 

for the differencing. The results can be rounded to determine the dominant noise type or used directly to estimate the 

noise mixture. 

5.5.5. Noise Identification Using r1 

An effective method for identifying power law noises using the lag 1 autocorrelation [3] is based on the properties of 

discrete-time fractionally integrated noises having spectral densities of the form (2 sin π f )

-2δ

. For δ < 1⁄2, the process 

is stationary and has a lag 1 autocorrelation equal to ρ1 = δ / (1–δ) [4], and the noise type can therefore be estimated 

from δ = r1 / (1+r1). For frequency data, white PM noise has ρ1 = –1/2, flicker PM noise has ρ1 = –1/3, and white FM 

noise has ρ1 = 0. For the more divergent noises, first differences of the data are taken until a stationary process is 

obtained as determined by the criterion δ < 0.25. The noise identification method therefore uses p = –round (2δ) –2d, 

where round (2δ) is 2δ rounded to the nearest integer and d is the number of times that the data is differenced to bring 

δ down to < 0.25. If z is a τ-average of frequency data y(t), then α = p; if z is a τ-sample of phase data x(t), then α = p 

+ 2, where α is the usual power law exponent f α

, thereby determining the noise type at that averaging time. The 

properties of this power law noise identification method are summarized in Table 10. It has excellent discrimination 

for all common power law noises for both phase and frequency data, including difficult cases with mixed noises. 

Noise 

Type 

α Phase Data* 

x(t) 

d=0 ACF of 

Phase Data 

W PM 2 

F PM 1 

W FM 0 

F FM –1 

RW FM –2 

* The differencing operation changes the appearance 

of the phase data to that shown 2 rows higher. 

Figure 20. Lag 1 Autocorrelation for Various Power Law Noises
46 

Table 10. Lag 1 Autocorrelation for Various Power Law Noises and Differences 

Noise 

Type 

α

Lag 1 Autocorrelation, r1

†

d=0 d=1 d=2 

x(t) y(t) x(t) y(t) x(t) y(t) 

2 0 –1/2 –1/2 –2/3 –2/3 –3/4 

1 ≈0.7 –1/3 –1/3 –3/5 –3/5 –5/7 

0 ≈1 0 0 –1/2 –1/2 –2/3 

-1 ≈1 ≈0.7 ≈0.7 –1/3 –1/3 –3/5 

-2 ≈1 ≈1 ≈1 0 0 –1/2 

†

 Shaded values are those used for noise ID for the particular 

noise and data type. 

5.5.6. Noise ID Algorithm 

The basic lag 1 autocorrelation power law noise identification algorithm is quite simple. The inputs are a vector z1,..., 

zN of phase or frequency data, the minimum order of differencing dmin (default = 0), and the maximum order of 

differencing dmax. The output is p, an estimate of the α of the dominant power law noise type, and (optionally) the 

value of d. 

Done = False, d = 0 

While Not Done 

z

N

z

r

z zz z

z z

r

r

i

i

N

i i

i

N

i

i

N

=

=

− −

−

= +

=

+

=

−

=

∑

∑

∑

1

1

1

1

1

1

1

2

1

1

1

( )( )

( )

δ

If d >= dmin And (δ < 0.25 Or d >= dmax) 

p d =− + 2( ) δ

 Done = True 

Else 

 

zzz z z z

N N

d d

1 21 1 1 N NN

1

1

=− = −

= −

= +

− − ,...,

End If 

End While 

Note: May round p to nearest integer 

Figure 21. The basic lag 1 autocorrelation power law noise identification algorithm. 
47 

The input data should be for the particular averaging time, τ, of interest, and it may therefore be necessary to decimate 

the phase data or average the frequency by the appropriate averaging factor before applying the noise identification 

algorithm. The dmax parameter should be set to two or three for an Allan or Hadamard (two or three-sample) 

variance analysis, respectively. The alpha result is equal to p+2 or p for phase or frequency data, respectively, and 

may be rounded to an integer (although the fractional part is useful for estimated mixed noises). The algorithm is fast, 

requiring only the calculation of one autocorrelation value and first differences for several times. It is independent of 

any particular variance. The lag 1 autocorrelation method yields good results, consistently identifying pure power 

noise for α = 2 to –4 for sample sizes of about 30 or more, and generally identifying the dominant type of mixed 

noises when it is at least 10 % larger than the others. For a mixture of adjacent noises, the fractional result provides 

an indication of their ratio. It can handle all averaging factors. 

Before analysis, the data should be preprocessed to remove outliers, discontinuities, and deterministic components. 

Acceptable results can be obtained from the lag 1 autocorrelation noise identification method for N ≥ 32, where N is 

the number of data points. The algorithm tends to produce jumps in the estimated alpha for mixed noises when the 

differencing factor, d, changes (although the alpha value when rounded to an integer is still consistent). This can be 

avoided by using the same d for the entire range of averaging times, at the expense of higher variability when a lower 

d would have been sufficient. The lag 1 autocorrelation method for power law noise identification is a fast and 

effective way to support the setting of confidence intervals and to apply bias corrections during a frequency stability 

analysis, as shown Figure 22: 

10-16

10-15

10-14

10-13

10-12

10-11

100 101 102 103 104 105

-3

-2

-1

0

1

2

α Noise Type

FWFM

RWFM

FFM

WFM

FPM

WPM

Lag 1 ACF Noise ID Extends

to # Analysis Points ≥ 10

Linear Frequency Drift Removed

Stability

Noise Type

Averaging Time,τ, Seconds

Overlapping Allan Deviation, σy

(τ)

SAO VLG11B H-Maser S/N SAO26 vs SAO18

Figure 22. Frequency Stability and Noise Analysis of Two Hydrogen Masers 
48 

References for Noise Identification 

1. D.A. Howe, R.L. Beard, C.A. Greenhall, F. Vernotte, W.J. Riley and T.K. Peppler, “Enhancements to GPS 

Operations and Clock Evaluations Using a “Total” Hadamard Deviation,” IEEE Trans. Ultrasonics, 

Ferrelectrics and Freq. Contrl., Vol. 52, No. 8, pp. 1253-1261, Aug. 2005. 

2. J.A. Barnes, “Tables of Bias Functions, B1 and B2, for Variances Based on Finite Samples of Processes with 

Power Law Spectral Densities,” NBS Technical Note 375, Jan. 1969. 

3. D.B Sullivan, D.W. Allan, D.A. Howe and F.L. Walls (editors), Characterization of Clocks and Oscillators, 

NIST Technical Note 1337, Sec. A-6, 1990. 

4. G. Box and G. Jenkins, Time Series Analysis, Forecasting and Control, Chapter 2, Holden-Day, Oakland, 

California, 1976, ISBN 0-8162-1104-3. 

5. W.J. Riley and C.A. Greenhall, “Power Law Noise Identification Using the Lag 1 Autocorrelation,” Proc. 18th

European Frequency and Time Forum, April 2004. 

6. P. Brockwell and R. Davis, Time Series: Theory and Methods, 2nd Edition, Eq. (13.2.9), Springer-Verlag, New 

York, 1991. 

7. N.J. Kasdin and T. Walter, “Discrete Simulation of Power Law Noise,” Proc. 1992 IEEE Frequency Control 

Symposium, pp. 274-283, May 1992. 

8. J. McGee and D.A. Howe, “ThêoH and Allan Deviation as Power-Law Noise Estimators,” IEEE Trans. 

Ultrasonics, Ferroelectrics and Freq. Contrl., Feb. 2007 

5.6. Bias Functions 

Several bias functions are defined and used in the analysis of frequency stability, as defined below. In particular, B1, 

the ratio of the standard variance to the Allan variance, and R(n), the ratio of the modified Allan variance to the 

normal Allan variance, are used for the identification of power law noise types (see section 5.2.2), and the B2 and B3

bias functions are used to correct for dead time in a frequency stability measurement. 

5.7. B1 Bias Function 

The B1 bias function is the ratio of the N-sample (standard) variance to the two-sample (Allan) variance with dead 

time ratio r = T/τ, where T = time between measurements, τ = averaging time, and μ = exponent of τ in Allan variance 

for a certain power law noise process: 

2

1 2

( , ,) B( , , ) (2, , )

N T N r

T

σ τ

μ

σ τ = . (48) 

The B1 bias function is useful for performing power law noise identification by comparing its actual value to those 

expected for the various noise types (see section 5.2.2). 

5.8. B2 Bias Function 

The B2 bias function is the ratio of the two-sample (Allan) variance with dead time ratio r = T/τ to the two-sample 

(Allan) variance without dead time (r = 1): 

2

2 2

(2, , ) B(, ) (2, , )

T

r

σ τ

μ

σ τ τ = . (49) 
49 

5.9. B3 Bias Function 

The B3 bias function is the ratio of the N-sample (standard) variance with dead time ratio r = T/τ at multiples M = τ/τ0

of the basic averaging time τ0 to the N-sample variance with the same dead time ratio at averaging time τ: 

2

3 2

( , , ,) B( , , , ) ( , ,)

NMT NMr

N T

σ τ

μ

σ τ = . (50) 

The product of the B2 and B3 bias functions is used for dead time correction, as discussed in section 5.7. 

5.10. R(n) Bias Function 

The R(n) function is the ratio of the modified Allan variance to the normal Allan variance for n = number of phase 

data points. Note: R(n) is also a function of α, the exponent of the power law noise type: 

2

2

Mod ( ) R( ) ( )

y

y

n

σ τ

σ τ = . (51) 

The R(n) bias function is useful for performing power law noise identification by comparing its actual value to those 

expected for the various noise types (see Section 5.2.2). 

5.11. TOTVAR Bias Function 

The TOTVAR statistic is an unbiased estimator of the Allan variance for white and flicker PM noise, and for white 

FM noise. For flicker and random walk FM noise, TOTVAR is biased low as τ becomes significant compared with 

the record length. The ratio of the expected value of TOTVAR to AVAR is given by the expression 

B(TOTAL)=1 , 0 2

T

a

T

τ

τ

⎛ ⎞ −⋅ << ⎜ ⎟ ⎝ ⎠ , (52) 

where a = 1/3⋅ln2 = 0.481 for flicker FM noise, a = 3/4 = 0.750 for random walk FM noise, and T is the record length. 

At the maximum allowable value of τ = Τ/2, TOTVAR is biased low by about 24 % for RW FM noise. This bias 

function should be used to correct all reported TOTVAR results. 

5.12. MTOT Bias Function 

The MTOT statistic is a biased estimator of the modified Allan variance. The MTOT bias factor (the ratio of the 

expected value of Mod Totvar to MVAR), as shown in Table 11, depends on the noise type but is essentially 

independent of the averaging factor and number of data points. 

Table 11. MTOT bias factors for each noise type. 

Noise Bias Factor 

W PM 1.06 

F PM 1.17 

W FM 1.27 

F FM 1.30 

RW FM 1.31 
50 

This bias factor should be used to correct all reported MTOT results. 

5.13. Thêo1 Bias 

The Thêo1 statistic is a biased estimator of the Allan variance. The Thêo1 bias factor (the ratio of the expected value 

of Thêo1 to AVAR) depends on both noise type and averaging factor: 

AVAR Thêo1 Bias = 

Thêo1 c

b

a

m

= + , (53) 

where m is the averaging factor and the constants a, b and c are given in Table 12. Note that the effective tau for a 

Thêo1 estimation is t = 0.75·m·t0, where t0 is the measurement interval. 

Table 12. Constants a, b, and c for Thêo1 bias. 

Noise Alpha a b c 

RW FM –2 2.70 –1.53 0.85 

F FM –1 1.87 –1.05 0.79 

W FM 0 1.00 0.00 0.00 

F PM 1 0.14 0.82 0.30 

W PM 2 0.09 0.74 0.40 

5.14. ThêoH Bias 

ThêoH statistic is a bias-removed estimator of the Allan variance. ThêoH is the best statistic for estimating the 

frequency stability and type of noise over the widest possible range of averaging times without explicit knowledge of 

the noise type. 
51 

References for Bias Functions 

1. “IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology - Random 

Instabilities,” IEEE Std 1139-1999, July 1999. 

2. C.A. Greenhall, “Estimating the Modified Allan Variance,” Proc. IEEE 1995 Freq. Contrl. Symp., pp. 346-353, 

May 1995. 

3. D.A. Howe & C.A. Greenhall, “Total Variance: A Progress Report on a New Frequency Stability 

Characterization,” Proc. 1997 PTTI Meeting, pp. 39-48, December 1997. 

4. C.A. Greenhall, private communication, May 1999. 

5. D.A. Howe, private communication, March 2000. 

6. D.A. Howe, “Total Variance Explained,” Proc. 1999 Joint Meeting of the European Freq. and Time Forum and 

the IEEE Freq. Contrl. Symp., pp. 1093-1099, April 1999. 

7. C.A. Greenhall, “Recipes for Degrees of Freedom of Frequency Stability Estimators,” IEEE Trans. Instrum. 

Meas., Vol. 40, No. 6, pp. 994-999, December 1991. 

8. D.A. Howe, “Methods of Improving the Estimation of Long-Term Frequency Variance,” Proc. 11th European 

Freq. and Time Forum, pp. 91-99, March 1997. 

9. J.A. Barnes and D.W. Allan, “Variances Based on Data with Dead Time Between the Measurements,” NIST 

Technical Note 1318, 1990. 

10. C.A Greenhall, private communication, May 2000. 

11. D.A. Howe, R.L. Beard, C.A. Greenhall, F. Vernotte, W.J. Riley and T.K. Peppler, “Enhancements to GPS 

Operations and Clock Evaluations Using a “Total” Hadamard Deviation,” IEEE Trans. Ultrasonics, Ferrelectrics 

and Freq. Contrl., Vol. 52, No. 8, pp. 1253-1261, Aug. 2005. 

5.15. Dead Time 

Dead time can occur in frequency measurements because of 

instrumentation delay between successive measurements, or because of a 

deliberate wait between measurements. It can have a significant effect on 

the results of a stability analysis, especially for the case of large dead time 

(e.g., frequency data taken for 100 seconds, once per hour). 

Figure 23. Illustration of dead time between successive measurements.

Dead time corrections can be applied by dividing the calculated Allan deviation by the square root of the product of 

the Barnes B2 and B3 bias ratios. These corrections are particularly important for non-white FM noise with a large 

dead time ratio. Restricting the dead time corrections to Allan deviations is a conservative approach based on the B2

and B3 definitions. Those bias functions depend critically on the power law noise type. Requiring manual noise 

selection avoids the problem of noise identification for biased data having the wrong sigma-tau slope. Dead time 

Dead time can occur in frequency 

measurements and can significantly 

affect a subsequent stability analysis. 

Methods are available to correct for dead 

time and thus obtain unbiased results. 
52 

correction is problematic for data having multiple noise types. In addition to introducing bias, measurement dead 

time reduces the confidence in the results, lowers the maximum allowable averaging factor, and prevents proper 

conversion of frequency to phase. Moreover, no information is available about the behavior of the device under test 

during the dead time. It is recommended that these issues be avoided by making measurements with zero dead time. 

Dead time that occurs at the end of a measurement can be adjusted for in an Allan deviation determination by using 

the Barnes B2 bias function [1], the ratio of the two-sample variance with dead time ratio r = T/τ to the two-sample 

variance without dead time. Otherwise, without this correction, one can determine only the average frequency and its 

drift. When such data are used to form frequency averages at longer tau, it is necessary to also use the B3 bias 

function [2], the ratio of the variance with distributed dead time to the variance with all the dead time at the end. 

Those bias corrections are made by use of the product of B2 and B3. The power law noise type must be known in 

order to calculate these bias functions. Simulated periodically sampled frequency data with distributed dead time for 

various power law noise processes shows good agreement with the B2 and B3 bias function corrections, as shown in 

Figure 24. 
53 

Figure 24. Frequency stability plots for common power law noises with large measurement dead time (r = T/τ = 36). 

Simulated data sampled for τ = 100 seconds once per hour for 10 days. Nominal 1×10-11 stability at τ = 100 seconds shown 

by lines. Plots show stability of simulated data sets for continuous, sampled and dead time-corrected data. (a) White PM 

(μ = -2) √B2 = 0.82 at AF = 1, (b) Flicker PM (μ = -2), √B2 = 0.82 at AF = 1, (c) White FM (μ = -1), √B2 = 1.00 at AF = 1, (d) 

Flicker FM (μ = 0) √B2 = 1.92 at AF = 1, (e) RW FM (μ = 1) √B2 = 7.31 at AF = 1. 
54 

These simulations show that the B2 and B3 bias corrections are able to support reasonably accurate results for sampled 

frequency stability data having a large dead time, when the power law noise type is known. The slope of the raw 

sampled stability plot does not readily identify the noise type, however, and mixed noise types would make correction 

difficult. The relatively small number of data points reduces the confidence of the results, and limits the allowable 

averaging factor. Moreover, the infrequent measurements provide no information about the behavior of the clock 

during the dead time, and prevent a proper conversion of frequency to phase. Sparsely sampled data are therefore not 

recommended for the purpose of stability analysis. 

References for Dead Time 

1. J.A. Barnes, “Tables of Bias Functions, B1 and B2, for Variances Based on Finite Samples of Processes with 

Power Law Spectral Densities,” NBS Technical Note 375, January 1969. 

2. J.A. Barnes and D.W. Allan, “Variances Based on Data with Dead Time Between the Measurements,” NIST 

Technical Note 1318, 1990.

5.16. Unevenly Spaced Data 

Unevenly spaced phase data can be handled if they have associated timetags by using the individual timetag spacing 

when converting them to frequency data. Then, if the tau differences are reasonably small, the data may be analyzed 

by use of the average timetag spacing as the analysis tau, in effect placing the frequency data on an average uniform 

grid. While completely random data spacing is not amenable to this process, tau variations of ±10 % will yield 

reasonable results as long as the exact interval is used for phase to frequency conversion. 

An example of unevenly spaced data is two-way satellite time and frequency transfer (TWSTFT) measurements made 

on Monday, Wednesday, and Friday of each week, where the data spacing is either one or two days. 

Figure 25. TDEV results for simulated TWSTFT data.

The TWSTFT data are simulated as 256 points of white PM noise with an Allan deviation (ADEV) level of σy(τ) = 1 

×10-11 at 1-day. A composite plot of the TWSTFT TDEV results is shown above. The corresponding TDEV is 5.77 

×10-12 sec at τ = 1 day (TDEV = MDEV divided by √3), as shown in curve A. Note that these time-stability plots 
55 

include points at all possible tau values. The green line shows that the –0.5 slope of the TDEV plot for W PM noise. 

The TWSTFT data are sampled once on Monday, Wednesday, and Friday of each week. These sampled data 

therefore have an average tau of 7/3 = 2.33 days, and their TDEV is shown in curve B. If the missing points are 

replaced by linearly interpolated phase values, the TDEV becomes highly distorted, as shown in curve C. If the 

sampled phase data are converted to frequency data using their timetag differences to determine the individual 

measurement intervals, the average tau, τavg, is close to 2.33 days (depending on the final fractional week that is 

included), and the resulting TDEV is shown in curve D. It is essentially identical to that for the sampled phase data 

shown in curve B. It is interesting that, although the converted frequency results are different depending on whether 

the average or individual (more correct) taus are used, the (integrated) TDEV results are not (at least for a white PM 

noise process). 

None of the results is in good agreement with the nominal simulation. The result with the linearly interpolated phase 

points is particularly bad for τ<τavg, and is similar to that of Tavella and Leonardi, as shown in Figure 1 of Reference 

[1]. As they point out in that paper, because the true sampling interval is τavg, it is not possible to estimate the noise at 

shorter times, especially for an uncorrelated white noise process. They further suggest that the higher level of the 

estimated noise is related to the ratio of the true and interpolated sampling times (≈2.33) and the √τ dependence of 

TDEV. By applying a correction factor of √2.33 ≈ 1.5, the longer-tau TDEV estimates are lowered to the correct 

level. These factors are smaller for other non-white PM and FM noise processes. The adjusted method of using 

frequency data converted from phase data by using individual tau values adjusted for the timetag spacing is 

recommended because it does not use interpolation, does not present results at unrealistically low tau, and uses the 

best frequency estimates. 

Another situation is data that are taken in bursts. In that case, the best approach is probably to analyze the segments 

separately, perhaps averaging those results to obtain better statistical confidence. One could obtain reasonable results 

for the shorter averaging times, but cannot apply standard techniques to analyze the complete data set. 

References for Unevenly Spaced Data 

1. P. Tavella and M. Leonardi, “Noise Characterization of Irregularly Spaced Data,” Proceedings of the 12th

European Frequency and Time Forum, pp. 209-214, March 1998. 

2. C. Hackman and T.E. Parker, “Noise Analysis of Unevenly Spaced Time Series Data,” Metrologia, Vol. 33, pp. 

457-466, 1996. 

5.17. Histograms 

A histogram shows the amplitude distribution of the phase or frequency fluctuations, and can provide insight 

regarding them. We can expect a normal (Gaussian) distribution for a reasonably sized data set, and a different (e.g., 

bimodal) distribution can be a sign of a problem. 

For a normal distribution, the standard deviation is approximately equal to the half-width at half-height (HWHA = 

1.177s) . 
56 

0

0.05

0.10

0.15

0.20

0.25

0.30

0.35

0.40

-3.0 -2.5 -2.0 -1.5 -1.0 -0.5 0 0.5 1.0 1.5 2.0 2.5 3.0

-1.177σ +1.177σ

Half-Amplitude

±1σ

f(x)=(1/√2π)e

-(x

2

/2)

x (In units of σ)

f(x)

Standardized Normal Distribution (μ=0, σ=1)

Figure 26. Half-width at half-height for the standard deviation. 

Figure 27. An example of a histogram for a set of white FM noise.

5.18. Frequency Offset 

It is often necessary to estimate the frequency offset from either phase or frequency data. 

Frequency offset is usually calculated from phase data by either of three methods: 

1. A least squares linear fit to the phase data (optimum for white PM noise): 
57 

 x(t) = a + bt, where slope = y(t) = b. 

2. The average of the first differences of the phase data (optimum for white FM noise): 

 y(t) = slope = [x(t+τ) − x(t)]/τ. 

3. The difference between the first and last points of the phase data: 

 y(t) = slope = [ x(end) – x(start) ] / (M–1), where M = # phase data points. 

 This method is used mainly to match the two endpoints. 

5.19. Frequency Drift 

Most frequency sources have frequency drift, and it is often necessary (and usually advisable) to characterize and 

remove this systematic drift before analyzing the stochastic noise of the source. The term drift refers to the systematic 

change in frequency due to all effects, while aging includes only those effects internal to the device. Frequency drift 

is generally analyzed by fitting the trend of the frequency record to an appropriate mathematical model (e.g., linear, 

log, etc.), often by the method of least squares. The model may be based on some physical basis or simply a 

convenient equation, using either phase or frequency data, and its suitability may be judged by the degree to which it 

produces white (i.e., uncorrelated) residuals. 

Frequency drift is the systematic change in frequency due to all effects, while frequency aging is the change in 

frequency due to effects within the device. Thus, for a quartz crystal oscillator, aging refers to a change in the 

resonant frequency of its quartz crystal resonator, while drift would also include the effects of its external 

environment. Therefore, drift is the quantity that is usually measured, but it is generally done under constant 

environmental conditions to the greatest extent possible so as to approximate the aging of the device. 

5.20. Drift Analysis Methods 

Several drift methods are useful for phase or frequency data as described below. The best method depends on the 

quality of the fit, which can be judged by the randomness of the residuals. 

Table 13. Drift analysis methods for phase or frequency data. 

Data Method Noise Model 

Phase Quadratic Fit W PM 

Phase Avg of 2nd Diffs RW FM 

Phase 3-Point Fit W & RW FM 

Phase Linear Fit Frequency Offset 

Phase Avg of 1st Diffs Frequency Offset 

Phase Endpoints Frequency Offset 

Freq Linear Fit W FM 

Freq Bisection Fit W & RW FM 

Freq Log Fit Stabilization 

Freq Diffusion Fit Diffusion 

5.21. Phase Drift Analysis 

Three methods are commonly used to analyze frequency drift in phase data: 
58 

1. A least squares quadratic fit to the phase data: 

 x(t) = a + bt + ct2, where y(t) = x'(t) = b + 2ct, slope = y'(t) = 2c. 

 This continuous model can be expressed as xn = a + τ0bn + τ02cn2 for n =1, 2, 3..., N, and τ0 is the sampling 

interval for discrete data, where the a, b and c coefficients have units of sec, sec/sec and sec/sec2

, respectively, 

and the frequency drift slope and intercept are 2c and b, respectively . The fit coefficients can be estimated by 

the following expressions [1]: 

2 2

0 0

11 1

2 2

00 0

11 1

22 2

00 0

11 1

ˆ /

ˆ /

ˆ /

NN N

nn n

nn n

NN N

nn n

nn n

NN N

nn n

nn n

a A x B nx C n x G

b B x D nx E n x G

c C x E nx F n x G

τ τ

τ τ τ

τ τ τ

== =

== =

== =

⎛ ⎞

=+ + ⎜ ⎟ ⎝ ⎠

⎛ ⎞

=+ + ⎜ ⎟ ⎝ ⎠

⎛ ⎞

=+ + ⎜ ⎟ ⎝ ⎠

∑∑ ∑

∑∑ ∑

∑∑ ∑

, (54) 

 where the A-F terms are as follows: 

A NN

B N

C

D N N NN

E N

F NN

G NN N

= ++

=− +

=

= + + ++

=− +

= ++

= −−

33 1 2

18 2 1

30

12 2 1 8 11 1 2

180 2

180 1 2

1 2

b g

b g

b gb g b gb g

b g

b gb g

b gb g

/

/

/

 A quadratic fit to the phase data is the optimum model for white PM noise. 

2. The average of the second differences of the phase data: 

 y(t) = [x(t+τ)−x(t)]/τ, slope = [y(t+τ)−y(t) ]/τ = [x(t+2τ)−2x(t+τ)+x(t)]/τ2. 

 This method is optimum for random walk FM noise. 

3. A three-point fit at the start, middle, and end of the phase data: 

 slope = 4[x(end)−2x(mid)+x(start)]/(Mτ)2, where M = the number of data points. 

 It is the equivalent of the bisection method for frequency data. 

5.22. Frequency Drift Analysis 

Four methods are commonly used to analyze frequency drift in frequency data: 

1. A least squares linear regression to the frequency data: 

 y(t) = a + bt, where a = intercept, b = slope = y'(t). 
59 

 Linear frequency drift can be estimated by a linear least squares fit to the frequency data, y(t) = a + bt. That 

continuous model can be expressed as yn = a + τ0bn for n =1, 2, 3..., M where M is the number of frequency 

data points, τ0 is the sampling interval for the discrete data. The frequency drift intercept and slope are a and 

b, and have units of sec and sec/sec, respectively. The fit coefficients can be estimated by equations 55 and 

56: 

1 11

2

1 1

ˆ

M MM

n n

n nn

n M M

n n

M ny n y

b

Mn n

= ==

= =

−

= ⎛ ⎞ −⎜ ⎟ ⎝ ⎠

∑ ∑∑

∑ ∑

 (55) 

 and 

 1 1 ˆ

M M

n

n n

y n

a b

M M

= = = −⋅

∑ ∑

. (56) 

 A linear fit to the frequency data is the optimum model for white FM noise. 

2. The frequency averages over the first and last halves of the data: 

 slope = 2 [ y(2nd half) − y(1st half) ] / (Nτ), where N = number of points. 

 This bisection method is optimum for white and random walk FM noise. 

3. A log model of the form (see MIL-O-55310B) that applies to frequency stabilization: 

 y(t) = a·ln(bt+1), where slope = y'(t) = ab/(bt+1). 

 

 4. A diffusion (√t) model of the form 

 y(t) = a+b(t+c)1/2, where slope = y'(t) = 1⁄2·b(t+c)-1/2. 

References for Frequency Drift 

1. J.A. Barnes, “The Measurement of Linear Frequency Drift in Oscillators,” Proc. 15th Annu. PTTI Meeting, pp. 

551-582, Dec. 1983.

2. J.A. Barnes, “The Analysis of Frequency and Time Data,” Austron, Inc., Dec. 1991.

3. M.A. Weiss and C. Hackman, “Confidence on the Three-Point Estimator of Frequency Drift,” Proc. 24th Annu. 

PTTI Meeting, pp. 451-460, Dec. 1992.

5.23. All Tau 

Stability calculations made at all possible tau values can provide an excellent indication of the variations in the 

results, and are a simple form of spectral analysis. In particular, cyclic variations are often the result of interference 

between the sampling rate and some periodic instability (such as environmental sensitivity). However, an all tau 

analysis is computationally intensive and can therefore be slow. For most purposes, however, it is not necessary to 

calculate values at every tau, but instead to do so at enough points to provide a nearly continuous curve on the display 

device (screen or paper). Such a “many tau” analysis can be orders of magnitude faster and yet provide the same 

information. 
60 

(a) All Tau Stability Plot

(b) Many Tau Stability Plot 

Figure 28. Comparison of all tau and many tau stability.

5.25. Environmental Sensitivity 

Environmental sensitivity should be treated separately from noise when one performs a stability analysis. However, it 

can be very difficult to distinguish between those different mechanisms for phase or frequency variations. It is often 

possible to control the environmental conditions sufficiently well during a stability run so that environmental effects 

such as temperature and supply voltage are negligible. Determining how well those factors have to be controlled 

requires knowledge of the device’s environmental sensitivities. Those factors should be measured individually, if 

possible, over the largest reasonable excursions to minimize the effect of noise. Environmental sensitivity can best be 

determined by considering the physical mechanisms that apply within the unit under test. Useful information about 

the environmental sensitivity of frequency sources can be found in the references below. Some environmental factors 

affect phase and frequency differently, which can cause confusion. For example, temperature affects the phase delay 

through a cable. Dynamically, however, a temperature ramp produces a rate of change of phase that mimics a 

frequency change in the source. Because environmental sensitivity is highly dependent on device and application, it 

does not receive detailed consideration in this handbook. More information will be found in the following references. 
61 

References for Environmental Sensitivity 

1. IEEE Standard 1193, IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency 

Generators. 

2. MIL-0-55310, General Specification for Military Specification, Oscillators, Crystal, Military Specifications 

and Standards. 

3. MIL-STD-810, Environmental Test Methods and Engineering Guidelines. 

4. MIL-STD-202, Test Methods for Electronic and Electrical Component Parts. 

5. C. Audion, N. Dimarcq, V. Giodano, J. Viennet, “Physical Origin of the Frequency Shifts in Cesium Beam 

Frequency Standards: Related Environmental Sensitivity,” Proceedings of the 22nd Annual Precise Time and 

Time Interval (PTTI) Applications and Planning Meeting, pp. 419-440, 1990. 

6. L.A. Breakiron, L.S. Cutler, H.W. Hellwig, J.R. Vig, G.M.R Winkler, “General Considerations in the 

Metrology of the Environmental Sensitivities of Standard Frequency Generators,” Proceedings of the 1992 

IEEE Frequency Control Symposium, pp. 816-830, 1992. 

7. H. Hellwig, “Environmental Sensitivities of Precision Frequency Sources,” IEEE Transactions IM-39, pp. 

301-306, 1990. 

8. E.M. Mattison, “Physics of Systematic Frequency Variations in Hydrogen Masers,” Proceedings of the 22nd

Annual Precise Time and Time Interval (PTTI) Applications and Planning Meeting, pp. 453-464, 1990. 

9. W.J. Riley, “The Physics of Environmental Sensitivity of Rubidium Gas Cell Atomic Frequency Standards,” 

Proceedings of the 22nd Annual Precise Time and Time Interval (PTTI) Applications and Planning Meeting, 

pp. 441-452, 1990. 

10. F.L. Walls and J.J. Gagnepain, “Environmental Sensitivities of Quartz Crystal Oscillators,” IEEE 

Transactions UFFC-39, no. 2, pp. 241-249, 1992. 

11. P.S. Jorgensen, “Special Relativity and Intersatellite Tracking,” Navigation, Vol. 35, No. 4, pp. 429-442, 

Winter 1988-89. 

12. T.E. Parker, “Environmental Factors and Hydrogen Maser Frequency Sensitivity,” IEEE Trans. UFFC-46, 

No. 3, pp.745-751, 1999. 

5.26. Parsimony 

In any measurement or analysis, it is desirable to minimize the number of extraneous parameters. This is not just a 

matter of elegance; the additional parameters may be implicit or arbitrary and thereby cause confusion or error if they 

are ignored or misunderstood. For example, the Allan deviation has the important advantage that, because of its 

convergence characteristics for all common clock noises, its expected value is independent of the number of data 

points. Many of the techniques used in the analysis of frequency stability, however, do require that certain parameters 

be chosen before they can be performed. For example, drift removal requires the choice of a model to which the data 

will be fit (perhaps using the criterion of white residuals). Outlier removal is an especially difficult case, where 

judgment often enters into the decision as to whether or not a datum is anomalous. A listing of some of these 

nonparsimonious parameters is given in Table 14: 
62 

Table 14. Non-Parsimonious Parameters in Frequency Stability Analysis 

Type Process Parameter Criterion Remarks 

PreprocessingOutlier 

removal

Number of 

sigmas

Apply best 

judgment

Use of MAD-based 

robust statistics is 

recommended.

Drift 

removal

Remove or 

not

Is drift 

deterministic? 

Is its cause 

known?

It is generally wise 

to remove 

deterministic drift 

before noise 

analysis

Model White 

residuals are 

sign that model 

is appropriate.

Model may have 

physical basis (e.g., 

diffusion process)

Convergence 

limit

For iterative 

fit.

Generally uncritical 

– can hide deeply in 

algorithm

Remove 

average 

frequency

Model Noise type Not necessarily 

simple arithmetic 

mean of frequency.

Phase to 

frequency 

conversion

Tau Accuracy Is measurement 

interval known 

exactly? Is it the 

same for each point?

Frequency 

to phase 

conversion

Tau See above

Initial phase Set to zero. Generally arbitrary. 

Doesn’t affect 

subsequent stability 

analysis.

Normalize 

frequency

Use to 

emphasize 

noise rather 

than frequency 

offset

See “Remove 

average frequency 

above”

Analysis Drift 

estimation

Model Smallest 

residuals

Can be critical, 

especially for 

predictions. Known 

physics can help 

choose.

Convergence 

limit

For iterative fit Generally uncritical 

– can hide deeply in 

algorithm

Frequency 

estimation

Noise model Lowest 

residuals for 

known noise 

type

Generally uncritical

Gaps Skip, fill, 

omit, or 

exclude

Number, 

distribu-tion, 

noise type

Process choice 

affects results
63 

Allan 

deviation

Number of 

data points

Time available 

for 

measurement. 

Must remove 

outliers.

As many as possible

Dead time Property of 

measuring 

system

Avoid

Maximum AF Confidence 

degrades

As large as 

confidence allows

Noise ID 

method to 

support error 

bars

Noise type 

significant 

affect on 

results

Generally 

unambiguous 

Hadamard 

deviation

All Allan 

deviation 

parameters

See above

To use rather 

than Allan 

deviation or 

separate drift 

removal

Easier handling 

of clock with 

drift or 

divergent noise

Commonly used in 

GPS control 

operations.

Total 

deviation 

Thêo1

All Allan 

deviation 

parameters

See above

To use rather 

than Allan 

deviation

Better 

confidence at 

long tau.

Less commonly 

used

Noise ID 

method to 

support bias 

removal

Critical for 

these biased 

estimators

Generally 

unambiguous

Dynamic 

stability

Window and 

step size

Resolution, 

number of 

windows

Affects calc time

Variance type Data 

properties: 

noise, drift

AVAR or HVAR

Viewpoint, 

mesh, color

Visibility Personal preference

Spectral 

analysis

Type – 

Parametric or 

nonparametric, 

Convention Analysis tools 

available 

Knowledge of 

analyst 

Windowing – 

Bias 

reduction

Clarity Uncritical

Smoothing – 

variance 

reduction

Clarity Tradeoff vs 

resolution

Presentation – 

plot or fit

Insight Use both
64 

PresentationForm Table vs. Plot Clarity Use both

Domain Time or 

frequency

Clarity, 

correspondence 

with 

requirements

Use best

Error bars Include or not Clarity Error bars 

recommended

Reference 

noise 

subtraction

Remove or 

not

If affects 

results

Only if similar to 

unknown

Nominal 

vs. 

maximum 

at some 

confidence 

level

Cost/risk 

tradeoff

May be 

specified

Usually nominal at 

1-sigma confidence

Notation State outlier 

& drift 

removal, 

environmental 

conditions, 

etc.

Judgment of 

analyst

Disclose choices 

5.27. Transfer Functions 

Variances can be related to the spectral density of the fractional frequency fluctuations by their transfer functions. For 

example, for the Hadamard variance, this relationship is 

2 2

0 () ( ) ( ) hf

H yH σ τ = ⋅ S f H f df ∫ , (57) 

where σ2Η(τ) is the three-sample, zero dead-time, binominally weighted Hadamard variance, Sy(f) is the spectral 

density of the fractional frequency fluctuations, HH(f) is its transfer function, and fh is the upper cutoff frequency 

(determined by hardware factors). The transfer function is determined by the statistic’s time-domain sampling 

pattern. 

 

The transfer functions for the most common variances used in frequency stability analysis are shown in Table 15: 

Table 15. Transfer functions for the most common variances. 

Variance Magnitude Squared Transfer Function |H(f)|2 

Allan

2

2

sin 2 sin πτ

πτ

πτ f

f f F

H

G I

K

J

Hadamard

24

2

sin 4 sin πτ

πτ

πτ f

f f F

H

G I

K

J
65 

For πτf << 1, the transfer function of the Allan variance behaves as (πτf)

2

, indicating that it is convergent for power 

law processes Sy

α

 down to as low as α = −2 (Random Walk FM), while the transfer function of the Hadamard variance 

behaves as (πτf)

4

, indicating that it is convergent for power law processes as low as α = −4 (Random Run FM). 

The squared magnitudes of these transfer functions are shown in the plots below: 

0

0.2

0.4

0.6

0.8

1.0

1.2

0 1 2 3 4 5 6 7 8 9 10

⏐HA(f)⏐

2

=2(sin(πτf)/πτf)

2

(sin

2

(πτf)

x=πτf

|HA(f)|2

Transfer Function of Allan Variance

2-Sample (N=2), Zero Dead-Time (T=τ)

(a) Allan Variance

0

2

4

6

8

0 1 2 3 4 5 6 7 8 9 10

|HH(f)|

2

=2

4

(sin(πτf)/πτf)

2

(sin

4

(πτf)

x=πτf

|HH(f)|2

Transfer Function of Hadamard Variance

3-Sample (N=3), Zero Dead-Time (T=τ), Binomially Weighted Coefficients (1,2,1)

(b) Hadamard Variance 

Figure 29. Squared magnitudes of transfer functions for (a) Allan Variance and (b) Hadamard Variance. 

These responses have their peaks where the frequency is one-half the sampling rate, and nulls where it is a multiple of 

the sampling rate (i.e., at f = n/τ, where n is an integer). As a spectral estimator, the Hadamard variance has slightly 

higher resolution than the Allan variance, since the equivalent noise bandwidths of the Hadamard and Allan spectral 

windows are 0.411 τ

-1 and 0.476 τ-1, respectively [5]. 

Similar transfer functions exist for the modified, total, and Thêo1 variances. 
66 

References for Transfer Functions 

1. J. Rutman, “Oscillator Specifications: A Review of Classical and New Ideas,” 1977 IEEE International Freq. 

Contrl. Symp., pp. 291-301, June 1977. 

2. J. Rutman, “Characterization of Phase and Frequency Instabilities in Precision Frequency Sources,” Proc. IEEE, 

Vol. 66, No. 9, September1978. 

3. R.G. Wiley, “A Direct Time-Domain Measure of Frequency Stability: The Modified Allan Variance,” IEEE 

Trans. Instrum. Meas., IM-26, pp. 38-41. 

4. D.A. Howe and C.A. Greenhall, “Total Variance: A Progress Report on a New Frequency Stability 

Characterization,” Proc. 29th Annual Precise Time and Time Interval (PTTI) Meeting, December 1977, pp. 39-

48. 

5. D.A. Howe, “ThêoH: A Hybrid, High-Confidence Statistic that Improves on the Allan Deviation,” Metrologia 43

(2006), S322-S331. 

6. K. Wan, E. Visr and J. Roberts, “Extended Variances and Autoregressive Moving Average Algorithm for the 

Measurement and Synthesis of Oscillator Phase Noise,” Proc. 43rd Annu. Freq. Contrl. Symp., June 1989, pp. 

331-335. 
67 

6 Frequency Domain Stability 

Frequency stability can also be characterized in the frequency domain in terms 

of a power spectral density (PSD) that describes the intensity of the phase or 

frequency fluctuations as a function of Fourier frequency. Spectral stability 

measures are directly related to the underlying noise processes, and are 

particularly appropriate when the phase noise of the source is of interest. 

6.1. Noise Spectra 

The random phase and frequency fluctuations of a frequency source can be modeled by power law spectral densities 

of the form 

 Sy(f) = h(α)f α

 ,

where: Sy(f) = one-sided power spectral density of y, the 

fractional frequency fluctuations, 1/Hz 

 f = Fourier or sideband frequency, hertz, 

 h(α) = intensity coefficient, and 

 α = exponent of the power law noise process. 

The most commonly encountered noise spectra are 

White (f 0

) 

Flicker (f −1

) 

Random Walk (f −2

) 

Flicker Walk (f −3

) . 

 

Examples of these noise types are shown in the figure below. 

Figure 30. Examples of noise types.

Power law spectral models can be applied to both phase and frequency power spectral densities. Phase is the time 

integral of frequency, so the relationship between them varies as 1/f2: 

Frequency domain stability 

measures are based on power 

spectral densities that characterize 

the intensity of the phase or 

frequency fluctuations as a 

function of Fourier frequency. 
68 

y

x 2

S (f) S (f)= (2 f) π

, (59) 

where Sx(f) = PSD of the time fluctuations, sec2/Hz. (60) 

Two other quantities are also commonly used to measure phase noise: 

Sφ(f) = PSD of the phase fluctuations, rad2/Hz and its 

logarithmic equivalent £(f), dBc/Hz. 

The relationship between these is 

2

2 0 S ( )=(2 ) S ( )= S ( ) 0x y f f f f φ

ν

πν

⎛ ⎞ ⋅ ⋅ ⎜ ⎟ ⎝ ⎠ , (61) 

and 

1 ( ) 10 log S ( ) 2 y f f ⎡ ⎤ =⋅ ⋅ ⎢ ⎥ ⎣ ⎦ L , (62) 

where ν0 is the carrier frequency, hertz. 

The power law exponent of the phase noise power spectral densities is β = α−2. These frequency-domain power law 

exponents are also related to the slopes of the following time domain stability measures: 

Allan variance σ2y(τ) μ = − (α+1), α<2 

Modified Allan variance Mod σ2y(τ) μ' = − (α+1, α<3 

Time variance σ2x(τ) η = − (α−1), α<3 . 

The spectral characteristics of the power law noise processes commonly used to describe the performance of 

frequency sources are shown in the following table: 

Table 16. Spectral characteristics of power law noise processes 

Noise Type α β μ μ' η

White PM 2 0 −2 −3 −1 

Flicker PM 1 −1 −2 −2 0 

White FM 0 −2 −1 −1 1 

Flicker FM −1 −3 0 0 2 

Random walk FM −2 −4 1 1 3 

6.2. Power Spectral Densities 

Four types of power spectral density are commonly used to describe the stability of a frequency source: 

PSD of Frequency Fluctuations Sy(f)

The power spectral density of the fractional frequency fluctuations y(t) in units of 1/Hz is given by Sy(f) = h(α) · f α

, 

where f = sideband frequency, Hz. 

PSD of Phase Fluctuations Sφ(f)
69 

The power spectral density of the phase fluctuations in units of rad2/Hz is given by Sφ(f) = (2πν0)2 · Sx(f), where ν0 = 

carrier frequency, Hz. 

PSD of Time Fluctuations Sx(f)

The power spectral density of the time fluctuations x(t) in units of sec2/Hz is given by Sx(f) = h(β) · f β

 = Sy(f)/(2πf)2, 

where: β = α−2. The time fluctuations are related to the phase fluctuations by x(t) = φ(t)/2πν0. Both are commonly 

called “phase” to distinguish them from the independent time variable, t. 

 

SSB Phase Noise £(f)

The SSB phase noise in units of dBc/Hz is given by £(f) = 10 · log [1⁄2 · Sφ(f)]. This is the most common function used 

to specify phase noise. 

6.3. Phase Noise Plot 

The following diagram shows the slope of the SSB phase noise, £(f), dBc/Hz versus log f, Fourier frequency, Hz for 

various power law noise processes. 

024 135

-60

-80

-100

-120

-140

-160

RW

FM

Flicker

FM

White

FM

SSB Phase Noise Diagram

α = -2

α = -1

dBc/Hz α = 0

£(f),

log f, Hz

-30

-20

-40

Sy(f) ∼ fα

£(f) = 10·log10 [1⁄2· Sφ(f)]

Sφ

(f) ∼ fβ β = α -2

-10

0

Flicker PM α = 1

White PM α = 2

Slopes in

dB/decade

α = -1 -μ

Figure 31. SSB Phase Noise Plot.

6.4. Spectral Analysis 

Spectral analysis is the process of characterizing the properties of a signal in the frequency domain, either as a power 

spectral density for noise, or as the amplitude and phase at discrete frequencies. Spectral analysis can thus be applied 

to both noise and discrete components for frequency stability analysis. For the former, spectral analysis complements 

statistical analysis in the time domain. For the latter, spectral analysis can aid in the identification of periodic 

components such as interference and environmental sensitivity. Time domain data can be used to perform spectral 

analysis via the Fast Fourier Transform (FFT), and there is much technical literature on that subject [2,3]. While, in 

principle, time and frequency domain analyses provide equivalent information, in practice, one or the other is usually 
70 

preferred, either because of measurement and/or analysis convenience, or because the results are more applicable to a 

particular application. Spectral analysis is most often used to characterize the short-term (< 1 s) fluctuations of a 

frequency source as a plot of phase noise power spectral density versus sideband frequency, while a time domain 

analysis is most often used to provide information about the statistics of its instability over longer intervals (> 1 s). 

Modern instrumentation is tending to merge these approaches by digitizing the signal waveform at high sampling 

rates, thereby allowing FFT analysis at relatively high Fourier frequencies. Nevertheless, there are many pitfalls and 

subtleties associated with spectral analysis that must be considered if meaningful results are to be obtained. 

6.5. PSD Windowing 

Data windowing is the process of applying a weighting function that falls off smoothly at the beginning and end to 

avoid spectral leakage in an FFT analysis. Without windowing, bias will be introduced that can severely restrict the 

dynamic range of the PSD result. The most common windowing types are Hanning, Hamming, and Multitaper. The 

classic Hanning and Hamming windows can be applied more than one time. 

6.6. PSD Averaging 

Without filtering or averaging, the variances of the PSD results are always equal to their values regardless of the size 

of the time domain data set. More data provide finer frequency resolution, not lower noise (while the data sampling 

time determines the highest Fourier frequency). Without averaging, for white noise, each spectral result has only two 

degrees of freedom. Some sort of filtering or averaging is usually necessary to provide less noise in the PSD results. 

This can be accomplished by dividing the data into sections, performing an FFT analysis on each section separately, 

and then averaging those values to obtain the final PSD result. The averaging factor improves the PSD standard 

deviation by the square root of the averaging factor. The tradeoff in this averaging process is that each section of the 

data is shorter, yielding a result with coarser frequency resolution that does not extend to as low a Fourier frequency. 

6.7. Multitaper PSD Analysis 

The multitaper PSD analysis method offers a better compromise among bias, variance and spectral resolution. 

Averaging is accomplished by applying a set of orthogonal windowing (tapering) functions called discrete prolate 

spheroidal sequences (DPSS) or Slepian functions to the entire data array. An example of seven of these functions for 

order J=4 is shown in Figure 32. 

Figure 32. Slepian SPSS taper functions, J=4, #=7.
71 

The first function resembles a classic window function, while the others sample other portions of the data. The higher 

windows have larger amplitude at the ends that compensates for the denser sampling at the center. These multiple 

tapering functions are defined by two parameters, the order of the function, J, which affects the resolution bandwidth, 

and the number of windows, which affects the variance. A higher J permits the use of more windows without 

introducing bias, which provides more averaging (lower variance) at the expense of lower spectral resolution, as 

shown Table 14: 

Table 17. The two parameters of the tapering function. 

Order J # Windows 

2.0 1-3 

2.5 1-4 

3.0 1-5 

3.5 1-6 

4.0 1-7 

4.5 1-8 

5.0 1-9 

The resolution BW is given by 2J/Nt, where N is the number of data points sampled at time interval t. An adaptive 

algorithm can be used to weight the contributions of the individual tapers for lowest bias. The multitaper PSD has a 

flat-topped response for discrete spectral components that is nevertheless narrower than an averaged periodogram 

with the same variance. It is therefore particularly useful for examining discrete components along with noise. 

6.8. PSD Notes 

A carrier frequency parameter applies to the Sφ(f) and £(f) PSD types. The number of Fourier frequency points is 

always the power of 2 greater than or equal to one-half of the number of time domain data points, n. The spacing 

between Fourier frequency points is 1/nt, and the highest Fourier frequency is 1/2t. If averaging is done, the value of 

n is reduced by the averaging factor. The PSD fit is a least-squares power law line through octave-band PSD averages 

[6]. 

For characterizing frequency stability, a spectral analysis is used primarily for the analysis of noise (not discrete 

components), and should include the quantitative display of power law noise in common PSD units, perhaps with fits 

to integer power law noise processes. Amplitude corrections need to be made for the noise response of the 

windowing functions. The amplitude of discrete components should be increased by the log of the BW (Fourier 

frequency spacing in hertz), which is a negative number for typical sub-hertz bandwidths. 
72 

References for Spectral Analysis 

1. W.H. Press, B.P. Flannery, S.A. Teukolsky and W.T. Vetterling, Numerical Recipes in C, Cambridge 

University Press, 1988, ISBN 0-521-35465-X, Chapter 12.

2. D.J. Thomson, “Spectrum Estimation and Harmonic Analysis,” Proc. IEEE , Vol. 70, No. 9, Sept. 1982, pp. 

1055-1096. 

3. D.B. Percival and A.T. Walden, Spectral Analysis for Physical Applications, Cambridge University Press, 1993, 

ISBN 0-521-43541-2. 

4. J. M. Lees and J. Park, “A C-Subroutine for Computing Multi-Taper Spectral Analysis,” Computers in 

Geosciences , Vol. 21, 1995, pp. 195-236. 

5. Help File for the AutoSignal program for spectral analysis, AISN Software, Inc., 1999. 

6. J. McGee and D.A. Howe, “ThêoH and Allan Deviation as Power-Law Noise Estimators,” IEEE Trans. 

Ultrasonics, Ferroelectrics and Freq. Contrl., Feb. 2007. 
73 

7 Domain Conversions 

The stability of a frequency source can be specified and measured in either the 

time or the frequency domain. Examples of these stability measures are the 

Allan variance, σ2y(τ), in the time domain, and the spectral density of the 

fractional frequency fluctuations, Sy(f), in the frequency domain. Conversions 

between these domains may be made by numerical integration of their 

fundamental relationship, or by an approximation method based on a power law 

spectral model for the noise processes involved. The latter method can be 

applied only when the dominant noise process decreases toward higher 

sideband frequencies. Otherwise, the more fundamental method based on 

numerical integration must be used. The general conversion from time to 

frequency domain is not unique because white and flicker phase noise have the 

same Allan variance dependence on τ. When performing any of these 

conversions, it is necessary to choose a reasonable range for σ and τ in the 

domain being converted to. The main lobe of the σy(τ) and Mod σy(τ) responses 

occur at the Fourier frequency f = 1/2τ.

Time domain frequency stability is related to the spectral density of the fractional frequency fluctuations by the 

relationship 

2 2

0 ( ,,) () () σ τ M T S f H f df y

∞

= ⋅⋅ ∫ , (63) 

where |H(f)|2

 is the transfer function of the time domain sampling function. 

The transfer function of the Allan (two-sample) time domain stability is given by 

4

2

2

sin ( ) () 2 ( )f H f fπτ

πτ

⎡ ⎤ = ⎢ ⎥ ⎣ ⎦

, (64) 

and therefore the Allan variance can be found from the frequency domain by the expression 

4

2

2 0

sin ( ) () 2 ( ) ( )

hf

y y

f S f df fπτ

σ τ

πτ = ∫ , (65) 

The equivalent expression for the modified Allan variance is 

6

2

42 2 2 2 0

0 0

2 ( )sin ( ) ( ) sin ( )

hf y

y

Sf f Mod df N ffπτ

σ τ

π τ πτ = ∫ . (66) 

7.1. Power Law Domain Conversions 

Domain conversions may be made for power law noise models by using the following equation and conversion 

formulae: 

2

2

2 1 01 2 22 2 2

(2 ) 1 1.038 3log 2 3 ( ) 2log 2 6 2 2 (2 )

eh h

y e

f f h h hh h π π τ

στ τ

τ πτ π τ − −

+

= + ++ + , (67) 

The stability of a frequency source 

can be specified and measured in 

either the time or the frequency 

domain. One domain is often 

preferred to specify the stability 

because it is most closely related 

to the particular application. 

Similarly, stability measurements 

may be easier to perform in one 

domain than the other. 

Conversions are possible between 

these generally equivalent 

measures of frequency stability. 
74 

where the hα terms define the level of the various power law noises. 

Noise Type σ2y(τ) Sy(f)

RW FM A · f 2 · Sy(f) · τ 1

 A−1 · τ −1 · σ2y(τ) · f −2

F FM B · f 1

 · Sy(f) · τ 0 B−1 · τ 0 · σ2y(τ) · f −1

W FM C · f 0

 · Sy(f) · τ −1 C−1 · τ 1 · σ2y(τ) · f 0

F PM D · f −1

 · Sy(f) · τ −2 D−1 · τ 2 · σ2y(τ) · f 1

W PM E · f −2

 · Sy(f) · τ −2 E−1 · τ 2 · σ2y(τ) · f 2 

where 

 A = 4π2/6 

 B = 2·ln2 

 C = 1/2 

 D = 1.038 + 3·ln(2πfhτ0)/4π2

 E = 3fh /4π2 

and fh is the upper cutoff frequency of the measuring system in hertz, and τ0 is the basic measurement time. This 

factor applies only to white and flicker PM noise. The above conversion formulae apply to the ThêoH hybrid statistic 

as well as to the Allan variance. 

7.2. Example of Domain Conversions 

This section shows an example of time and frequency domain conversions. First, a set of simulated power law noise 

data is generated, and the time domain properties of this noise are analyzed by use of the overlapping Allan deviation. 

Next, the same data are analyzed in the frequency domain with an £(f) PSD. Then, a power law domain conversion is 

done, and those results are compared with those of the spectral analysis. Finally, the other power spectral density 

types are examined. 

For this example, we generate 4097 phase data points of simulated white FM noise with a one-second Allan deviation 

value σ y(1) = 1 × 10-11 and a sampling interval τ = 1 ms. The number of points is chosen as an even power of 2 for 

the frequency data. The generated set of simulated white FM noise is shown as frequency data in Figure 33a, and their 

overlapping Allan deviation is shown in Figure 33b. The σ y(1)white FM noise fit parameter is 1.08e−11, close to the 

desired value. 
75 

(a) (b) 

(c) (d) 

(e) (f) 

Figure 33. (a) Simulated W FM Noise Data. (b) Overlapping Allan Deviation. (c) £(f) Power Spectral Density, (d) Sφ(f) 

Power Spectral Density. (e) Sx(f) Power Spectral Density. (f) Sy(f) Power Spectral Density

The power spectrum for the phase data is calculated by use of a 10 MHz carrier frequency and a £(f) power spectral 

density type, the SSB phase noise to signal ratio in a 1 Hz BW as a function of sideband frequency, f, as shown in 

Figure 33c. The fit parameters show an £(1) value of −79.2 dBc/Hz and a slope of –19.6 dB/decade, in close 

agreement with the expected values of –80 dBc/Hz and –20 dB/decade. 
76 

The expected PSD values that correspond to the time domain noise parameters used to generate the simulated powerlaw noise can be determined by the power law domain conversion formulae of Section 7.1, as shown in Table18. 

Table 18. Domain calculation results 

Frequency Domain: PSD Type: L(f), dBc/Hz 

SB Freq (Hz): 1.00000e+00 

Carrier(MHz): 1.00000e+01 

Time Domain: Sigma Type: Normal 

Tau (Sec): 1.00000e-03 

Avg Factor: 1000 

Power Law Noise: 

Type dB/dec PSD Type Mu Sigma 

RWFM -40 None RWFM +1 0.00000e+00 

FFM -30 None FFM 0 0.00000e+00 

WFM -20 -80.0 WFM -1 1.00000e-11 

FPM -10 None FPM -2 0.00000e+00 

WPM 0 None WPM -2 0.00000e+00 

All -80.0 All 1.00000e-11

The other types of PSD that are commonly used for the analysis of frequency domain stability analysis are Sφ(f), the 

spectral density of the phase fluctuations in rad2

/Hz; Sx(f), the spectral density of the time fluctuations in sec2/Hz; and 

Sy(f), the spectral density of the fractional frequency fluctuations in units of 1/Hz. The expected value of all these 

quantities for the simulated white FM noise parameters with σy(1) = 1.00e–11, τ = 1.00e–3, and fo = 10 MHz are 

shown in the following table. 

Table 19. Expected value of PSD types for the simulated white FM noise parameters. 

References for Domain Conversion 

1. A.R. Chi, “The Mechanics of Translation of Frequency Stability Measures Between Frequency and Time 

Domain Measurements,” Proc. 9th PTTI Meeting, pp. 523-548, Dec.1977. 

2. J. Rutman, “Relations Between Spectral Purity and Frequency Stability,” Proc. 28th Freq. Contrl. Symp., pp. 

160-165., May 1974. 

3. R. Burgoon and M.C. Fisher, “Conversion Between Time and Frequency Domain of Intersection Points of 

Slopes of Various Noise Processes,” 32th Freq. Contrl. Symp., pp.514-519, June 1978. 

4. W.F. Egan, “An Efficient Algorithm to Compute Allan Variance from Spectral Density,” IEEE Trans. Instrum. 

Meas., Vol. 37, No. 2, pp. 240-244, June 1988. 

5. F. Vernotte, J. Groslambert and J.J. Gagnepain, “Practical Calculation Methods of Spectral Density of 

Instantaneous Normalized Frequency Deviation from Instantaneous Time Error Samples,” Proc. 5th European 

Freq. and Time Forum, pp. 449-455, March 1991. 

6. C.A. Greenhall, “Does Allan Variance Determine the Spectrum?” Proc. 1997 Intl. Freq. Cont. Symp., pp. 358-

365, June 1997. 

7. F. Thomson, S. Asmar and K. Oudrhiri, “Limitations on the Use of the Power-Law Form of Sy(f) to Compute 

Allan Variance,” IEEE Trans. UFFC, Vol. 52, No. 9, pp. 1468-1472, Sept. 2005. 

Parameter PSD Type 

£(f), dBc/Hz Sφ(f), rad2

/Hz Sx(f), sec2

/Hz Sy(f), 1/Hz

Data Type Phase Phase Phase Frequency

Simulated Value –80 2e–8 5.066e–24 2e–22

Log Value same –7.70 –23.3 –21.7

Slope, dB/decade –20 –20 –20 0

Fit Value –79.2 1.19e–8 3.03e–24 1.40e–22

Fit Exponent –1.96 –1.96 –1.96 –0.04
77 

8 Noise Simulation 

It is valuable to have a means of generating simulated power law clock noise having the desired noise type (white 

phase, flicker phase, white frequency, flicker frequency, and random walk frequency noise), Allan deviation, 

frequency offset, frequency drift, and perhaps a sinusoidal component. This can serve as both a simulation tool and as 

a way to validate stability analysis software, particularly for checking numerical precision, noise recognition, and 

modeling. A good method for power-law noise generation is described in Reference 8. The noise type and time 

series of a set of simulated phase data are shown in Table 20: 

Table 20. Noise type and time series for a set of simulated phase data. 

Noise Type Phase Data Plot 

Random walk FM 

α = –2 

Random run noise 

Flicker FM 

 α = –1 

Flicker walk noise 

White FM 

α = 0 

Random walk noise

Flicker PM 

α = 1 

Flicker noise

White PM 

α = 2 

White noise 
78 

8.1. White Noise Generation 

White noise generation is straightforward. One popular technique is to first generate two independent uniformly 

distributed random sequences [1], and combine them using the Box-Muller transform [2,3] to produce a white 

spectrum with Gaussian deviates. Another method is to generate 12 independent random sequences uniformly 

distributed between 0 and 1, add them, and subtract 6 [4]. This will, via the central limit theorem, produce a Gaussian 

distribution having zero mean and unit variance. White noise can be numerically integrated and differenced to 

transform it by 1/f2

 and f2, respectively, to produce simulated noise having any even power law exponent. 

8.2. Flicker Noise Generation 

Flicker noise is more difficult to generate because it cannot be described exactly by a rational transfer function, and 

much effort has been devoted to generating it [5-9]. The most common methods involve linear filtering by RC ladder 

networks [5], or by FFT transformation [7,9]. The FFT method can produce noise having any integer power law 

exponent from α = –2 (RW FM) to α = +2 (W PM) [7, 8]. 

8.3. Flicker Walk and Random Run Noise Generation 

 

The more divergent flicker walk FM (a = –3) and random run FM (a = –4) power law noise types may be generated 

by using the 1/f2 spectral property of a frequency to phase conversion. For example, to generate RR FM noise, first 

generate a set of RW FM phase data. Then treat this RW FM phase data as frequency data, and convert it to a new set 

of RR FM phase data. 

8.4. Frequency Offset, Drift, and Sinusoidal Components 

Beside the generation of the desired power law noise, it is desirable to include selectable amounts of frequency offset, 

frequency drift, and a sinusoidal component in the simulated clock data. 
79 

References for Noise Simulation 

1. S.K. Park and K.W. Miller, “Random Number Generators: Good Ones are Hard to Find,” Comm. ACM, Vol. 

31, No. 10, pp. 1192-1201. 

2. G.E.P Box and M.E. Muller, “A Note on the Generation of Random Normal Deviates,” Annals Math. Stat, V. 

29, pp. 610-611,1958. 

3. W.H. Press, B.P. Flannery, S.A. Teukolsky and W.T. Vetterling, Numerical Recipes in C, Cambridge Univ. 

Press, Cambridge, U.K., 1988. 

4. J.A. Barnes, “The Analysis of Frequency and Time Data,” Austron, Inc., Dec. 1991. 

5. J.A. Barnes and D.W. Allan, “A Statistical Model of Flicker Noise,” Proceedings of the IEEE, Vol. 54, No. 2, 

pp. 176-178, February 1966. 

6. J.A. Barnes, “The Generation and Recognition of Flicker Noise,” NBS Report 9284, U.S Department of 

Commerce, National Bureau of Standards, June 1967. 

7. C.A. Greenhall and J.A. Barnes, “Large Sample Simulation of Flicker Noise,” Proc. 19th Annu. PTTI Meeting, 

pp. 203-217, Dec. 1987 and Proc. 24th Annu. PTTI Meeting, p. 461, Dec. 1992. 

8. N.J. Kasdin and T. Walter, “Discrete Simulation of Power Law Noise,” Proc. 1992 IEEE Freq. Contrl. Symp., 

pp. 274-283, May 1992. 

9. S. Bregni, L. Valtriani, F. Veghini, “Simulation of Clock Noise and AU-4 Pointer Action in SDH Equipment,” 

Proc. of IEEE GLOBECOM '95, pp. 56-60, Nov. 1995. 

10. S. Bregni, “Generation of Pseudo-Random Power-Law Noise Sequences by Spectral Shaping,” 

Communications World, Editor: N. Mastorakis, WSES Press, 2001.

11. C.A. Greenhall, “FFT-Based Methods for Simulating Flicker FM,” Proceedings of the 34th Annual Precise 

Time and Time Interval (PTTI) Systems and Applications Meeting, 2002.
80 

9 Measuring Systems

Frequency measuring systems are instruments that accept two or more inputs, one 

of which may be considered to be the reference, and compare their relative phase or 

frequencies. These systems can take many forms, from the direct use of a 

frequency counter to elaborate low-noise, high-resolution multichannel clock 

measuring systems with associated archival databases. They can be custom built or 

bought from several organizations specializing in such systems. The most 

important attribute of a frequency measuring system is its resolution, which, for high performance devices, requires 1 

ps/s (pp1012) or better resolution, and more elaborate hardware than a counter. The resolution of a digital frequency, 

period, or time interval counter is determined mainly by its speed (clock rate) and the performance of its analog 

interpolator (if any). That resolution generally improves linearly with the averaging time of the measurement, and it 

can be enhanced by preceding it with a mixer that improves the resolution by the heterodyne factor, the ratio of the RF 

input to the IF beat frequencies. Noise is another important consideration for a high-performance measuring system 

whose useful resolution may be limited by its noise floor, the scatter in the data when the two inputs are driven 

coherently by the same source. The performance of the measuring system also depends on the stability of its 

reference source. A low noise ovenized quartz crystal oscillator may be the best choice for a reference in the short 

term (1 to 100 s), while a active hydrogen maser generally provides excellent stability at averaging times out to 

several days, and cesium beam tube devices at longer averaging times. 

Three methods are commonly used for making precise time and frequency measurements, as described below. 

9.1. Time Interval Counter Method 

The time interval counter method divides the two sources being compared down to a much lower frequency (typically 

1 pulse/second) and measures their time difference with a high resolution time interval counter: 

Figure 34. Block diagram of a time interval counter measuring system. 

This measurement method is made practical by modern high-resolution interpolating time interval counters that offer 

10 digit/s resolution. The resolution is not affected by the division ratio, which sets the minimum measurement time, 

and determines how long data can be taken before a phase spillover occurs (which can be hard to remove from a data 

set). A source having a frequency offset of 1 × 10-6 can, for example, be measured for only about 5.8 days before a 1 

pps phase spillover occurs after being initially set at the center. Drift in the trigger point of the counter can be a 

limitation to this measurement method. 

9.2. Heterodyne Method 

The heterodyne method mixes (subtracts) the two sources being compared, and measures the period of the resulting 

audio-frequency beat note. The measurement resolution is increased by the heterodyne factor (the ratio of the carrier 

to the beat frequency). 

A frequency measuring system 

with adequate resolution and a 

low noise floor is necessary to 

make precision clock 

measurements. 
81 

Figure 35. Block diagram of a heterodyne measuring system. 

This heterodyne technique is a classic way to obtain high resolution with an ordinary period counter. It is based on the 

principle that phase information is preserved in a mixing process. For example, mixing a 10 MHz source against a 

9.9999 MHz Hz offset reference will produce a 100 Hz beat signal whose period variations are enhanced by a factor 

of 10 MHz/100 Hz = 105

. Thus a period counter with 100 ns resolution (10 MHz clock) can resolve clock phase 

changes of 1 ps. A disadvantage of this approach is that a stable offset reference is required at exactly the right 

frequency. Even worse, it can measure only frequency, requires a priori knowledge of the sense of the frequency 

difference, and often has dead time between measurements. 

9.3. Dual Mixer Time Difference Method 

The third method, in effect, combines the best features of the first two, using a time interval counter to measure the 

relative phase of the beat signals from a pair of mixers driven from a common offset reference: 

Figure 36. Block diagram of a dual mixer time difference measuring system. 

This dual mixer time difference (DMTD) setup is arguably the most precise way of measuring an ensemble of clocks 

all having the same nominal frequency. When expanded to multiple channels by adding additional buffer amplifiers 

and mixers, and time tagging the zero-crossings of the beat notes for each channel, this arrangement allows any two of 

the clocks to be intercompared. The offset reference need not be coherent, nor must it have particularly low noise or 

high accuracy, because its effect cancels out in the overall measurement process. For best cancellation, the zerocrossings should be coincident or interpolated to a common epoch. Additional counters can be used to count the 

whole beat note cycles to eliminate their ambiguity, or the zero-crossings can simply be time tagged. The measuring 

system resolution is determined by the time interval counter or time-tagging hardware, and the mixer heterodyne 
82 

factor. For example, if two 5 MHz sources are mixed against a common 5 MHz to 10 Hz offset oscillator (providing a 

5 × 106

/10 = 5 × 105 heterodyne factor), and the beat note is time tagged with a resolution of 100 ns(10 MHz clock), 

the measuring overall system resolution is 10-7 /5 × 105

 = 0.2 ps. 

Multichannel DMTD clock measuring systems have been utilized by leading national and commercial metrology 

laboratories for a number of years [1-5]. An early commercial version is described in Reference [3], and a newer 

technique is described in Reference [8]. A direct digital synthesizer (DDS) can be used as the offset reference to 

allow measurements to be made at any nominal frequency within its range. Cross-correlation methods can be used to 

reduce the DDS noise. Instruments using those techniques are available that automatically make both time and 

frequency domain measurements. 

9.4. Measurement Problems and Pitfalls 

It can be difficult to distinguish between a bad unit under test and a bad measurement. When problems occur in timedomain frequency stability measurements, they usually cause results that are worse than expected. It is nearly 

impossible for a measurement problem to give better than correct results, and there is considerable justification in 

saying that the best results are the correct ones. Two possible exceptions to this are (1) misinterpretation of the scale 

factor, and (2) inadvertent coherency (e.g., injection locking of one source to another due to inadequate isolation. 

Lack of stationarity (changes in the source itself), while not a measurement problem per se, must also be considered. 

In general, the more devices available and the more measurements being made, the easier it is to sort things out. 

One common problem is hum that contaminates the measurements due to ground loops. Because the measurement 

interval is usually much longer than the period of the power line frequency, and not necessarily coherent with it, 

aliased “beats” occur in the frequency record. Inspection of the raw data can show this, and the best cure is often 

isolation transformers in the signal leads. In fact, this is a wise precaution to take in all cases. 

All sorts of other mechanisms (electrical, electromagnetic, magnetic, thermal, barometric, vibrational, acoustic, etc.) 

exist that can interfere with time domain frequency measurements. Think about all the environmental sensitivities of 

the unit under test, and control as many of them as possible. Be alert to day-night and weekly cycles that indicate 

human interference. Stories abound about correlations between elevators moving and cars coming and going (“autocorrelations”) that have affected clock measurements. Think about what can have changed in the overall test setup. 

Slow periodic fluctuations will show up more distinctly in an all tau (rather than an octave tau) stability plot. 

In high-precision measurements, where picoseconds matter (e.g. 1 × 10-15 = 1 ps/1000 seconds), it is important to 

consider the mechanical rigidity of the test setup (e.g. 1 ps = 0.3 mm). This includes the electrical length (phase 

stability) of the connecting cables. Teflon dielectric is an especially bad choice for temperature stability, while 

foamed polyethylene is much better. Even a few degrees of temperature variation will cause the phase of a highstability source to “breathe” as it passes through 100 ft of coaxial cable. 

Phase jumps are a problem that should never be ignored. Examination of the raw phase record is critical because a 

phase jump (frequency impulse) appears strangely in a frequency record as a white FM noise characteristic [10]. 

Some large phase jumps are related to the carrier period (e.g., a malfunctioning digital frequency divider). 

It is difficult to maintain the integrity of a measuring system over a long period, but, as long as the operating 

conditions of the unit under test and the reference are undisturbed, gaps in the data record may be acceptable. An 

uninterruptible power system is indispensable to maintain the continuity of a long run. 

9.5. Measuring System Summary 

A comparison of the relative advantages and disadvantages of these methods is shown in the following table: 
83 

Table 21. Comparison of time and frequency measurement methods. 

Method Advantages Disadvantages

Divider & time interval 

counter

Provides phase data Modest resolution Covers wide range of carrier 

frequencies

Easily expandable at low cost Not suitable for short 

tau

Mixer and period 

counter

Resolution enhanced by 

heterodyne factor No phase data

Provides direct frequency data No frequency sense

Usable for short tau Requires offset 

reference

Expandable at reasonable cost Single carrier 

frequency

Dual mixer time 

difference

High resolution, low noise Single carrier 

Provides phase data frequency

Offset reference noise & 

inaccuracy cancels Relatively complex

No fixed reference channel

It is preferable to make continuous zero-dead-time phase measurements at regular intervals, and a system using a 

dual-mixer time interval measurement is recommended. An automated high-resolution multi-channel clock (phase) 

measuring system with a high-performance (e.g., hydrogen maser) reference is a major investment, but one that can 

pay off in better productivity. It is desirable that the measurement control, data storage, and analysis functions be 

separated to provide robustness and networked access to the data. A low-noise reference not only supports better 

measurement precision but also allows measurements to be made faster (with less averaging). 

9.6. Data Format 

A one-column vector is all that is required for a phase or frequency data array. Because the data points are equally 

spaced, no time tags are necessary. Nevertheless, the use of time tags is recommended (see section 9.4 below), 

particularly to identify anomalies or to compare several sources. Time tagging is generally required for archival 

storage of clock measurements, but a single vector of extracted gap-filled data is sufficient for analysis. The 

recommended unit for phase data is seconds, while frequency data should be in the form of dimensionless fractional 

frequency. Double-precision exponential ASCII numeric format is recommended for ease of reading into most 

analysis software, with comma or space-delimited fields and one data point per line. The inclusion of comments and 

headers can pose problems, but most software will reject lines that start with a “#” or some other non-numeric 

character. 

9.7. Data Quantization 

The phase or frequency data must be gathered with sufficient resolution to show the variations of interest, and it must 

be represented with sufficient precision to convey those variations after removal of fixed offsets (see section 10.1 

below). Nevertheless, highly quantized data can still contain useful information, especially after they are combined 

into longer averaging times. An example of highly quantized frequency data is the random telegraph signal shown 

below. Although these data have a non-Gaussian amplitude distribution (their histogram consists of two spikes), the 

random occurrences of the two levels produce a white FM noise characteristic. 
84 

Figure 37. Random telegraph signal as an example of highly quantized frequency data.

9.8. Time tags 

Time tags are often associated with phase or frequency data, and can be usefully applied to the analysis of these data. 

Time tags are highly desirable for frequency stability measurements, particularly for identifying the exact time of 

some anomaly. The preferred time tag is the Modified Julian Date (MJD) expressed as a decimal fraction and 

referenced to UTC. Based on the astronomical Julian Date, the number of days since noon on January 1, 4713 BC, 

the MJD is the Julian Date – 2 4000 000.5. It is widely used, purely numeric, can have any required resolution, is 

easily converted to other formats, is non-ambiguous over a two-century (1900 to 2099) range, and is free from 

seasonal (daylight saving time) discontinuities 

Analysis software can easily convert the MJD into other formats such as year, month, day, hour, minute, and second. 

The MJD (including the fractional day) can be obtained from the C language time() function by dividing its return 

value by 86 400 and adding 40 587. 

9.9. Archiving and Access 

There is no standard way to archive and access clock data. For some purposes, it is sufficient to simply save the raw 

phase or frequency data to a file, identifying it only by the file name. At the other extreme, multichannel clock 

measuring systems may require an elaborate database to store a large collection of data, keep track of the clock 

identities and transactions, provide security and robust data integrity, and serve the archived data via a network. It 

may also be necessary to integrate the clock data with other information (e.g., temperature) from a data acquisition 

system. 
85 

References for Measuring Systems 

1. D.W. Allan, “Picosecond Time Difference Measurement System,” Proc. 29th Annu. Symp. on Freq. Contrl., 

pp. 404-411, May 1975. 

2. D.A. Howe, D.W. Allan and J.A. Barnes, “Properties of Signal Sources and Measurement Methods,” Proc. 

35th Annu. Symp. on Freq. Contrl., May 1981, pp. 1-47. 

3. S.R. Stein, “Frequency and Time - Their Measurement and Characterization,” Chapter 12, pp.191-416, 

Precision Frequency Control, Vol. 2, Edited by E.A. Gerber and A. Ballato, Academic Press, New York, 1985, 

ISBN 0-12-280602-6. 

4. S. Stein, D.Glaze, J. Levine, J. Gray, D. Hilliard, D. Howe and L Erb, “Performance of an Automated High 

Accuracy Phase Measurement System,” Proc. 36th Annu. Freq. Contrl. Symp., June 1982, pp. 314-320. 

5. S.R. Stein and G.A. Gifford, “Software for Two Automated Time Measurement Systems,” Proc. 38th Annu. 

Freq. Contrl. Symp, June 1984, pp. 483-486. 

6. Data Sheet, Model 5110A Time Interval Analyzer, Symmetricom, Inc. (formerly Timing Solutions Corp.), 

Boulder, CO 80301 USA. 

7. Data Sheet, A7 Frequency & Phase Comparator Measurment System, Quartzlock (UK) Ltd., Gothic, Plymouth 

Road, Totnes, Devon, TQ9 5LH England. 

8. C.A. Greenhall, “Oscillator-Stability Analyzer Based on a Time-Tag Counter,” NASA Tech Briefs, NPO-20749, 

May 2001, p. 48. 

9. Gernot M.R. Winkler, “Introduction to Robust Statistics and Data Filtering,” Tutorial at 1993 IEEE Freq. 

Contrl. Symp., Sessions 3D and 4D, June 1, 1993. 

10. C.A. Greenhall, “Frequency Stability Review,” Telecommunications and Data Acquisition Progress Report 42-

88, Oct-Dec 1986, Jet Propulsion Laboratory, Pasadena, CA, pp. 200-212, Feb. 1987.

11. Data Sheet, Model 5120A Phase Noise Test Set, Symmetricom, Inc. (formerly Timing Solutions Corp.), 

Boulder, CO 80301 USA.
86 

10 Analysis Procedure 

A frequency stability analysis can proceed along several paths, as the circumstances dictate. Nevertheless, the 

following example shows a typical analysis flow. Using simulated data for a high-stability rubidium frequency 

standard, the purpose of the analysis is to characterize the noise in the presence of an outlier, large frequency offset 

and significant drift. 

Table 22. An example of a typical analysis flow. 

Step Description Plot 

1 Open and examine a 

phase data file. The 

phase data is just a 

ramp with slope 

corresponding to 

frequency offset. 

0.000000000000000e+00 

8.999873025741449e-07 

1.799890526185009e-06 

2.699869215098003e-06 

3.599873851209537e-06 

4.499887627663997e-06 

5.399836191440859e-06 

6.299833612216789e-06 

7.199836723454638e-06 

8.099785679257264e-06 

8.999774896024524e-06 

9.899732698242008e-06 

etc.

2 Convert the phase data 

to frequency data and 

examine it. An 

obvious outlier exists 

that must be removed 

to continue the 

analysis. 

Visual inspection of 

data is an important 

preprocessing step! 

Analyst judgment may 

be needed for less 

obvious outliers.
87 

3 In an actual analysis, 

one should try to 

determine the cause of 

the outlier. The 

frequency spike of 

1×10-9 corresponds to a 

phase step of 900 ns 

over a single 900-s 

measurement interval, 

nine 10 MHz carrier 

cycles. Data taken at a 

higher rate would help 

to determine whether 

the anomaly happened 

instantaneously or over 

some finite period. 

Timetags can help to 

relate the outlier to 

other external events.

3 Remove the outlier. 

The noise and drift are 

now visible. A line 

shows a linear fit to the 

frequency data, which 

appears to be quite 

appropriate.

4 Remove the frequency 

offset from the phase 

data. The resulting 

quadratic shape is due 

to the frequency drift. 

One can just begin to 

see phase fluctuations

around the quadratic fit 

to the phase data. 
88 

5 Remove the frequency 

drift, leaving the phase 

residuals for noise 

analysis, which is now 

clearly visible. 

Some experience is 

needed to interpret 

phase data like these. 

Remember that 

frequency corresponds 

to the slope of the 

phase, so the frequency 

is lowest near the end 

of the record, where the 

phase slope is the most 

negative.

6 Convert the phase 

residuals to frequency 

residuals. 

Alternatively, remove 

the frequency drift 

from the frequency 

data of Step #3. There 

are subtle differences 

in removing the linear 

frequency drift as a 

quadratic fit to the 

phase data compared 

with removing it as a 

linear fit to the 

frequency data 

(different noise models 

apply). Other drift 

models may be more 

appropriate. Analyst 

judgment is needed to 

make the best choices.

7 Perform a stability 

analysis using the 

overlapping Allan 

deviation. The results 

show white FM noise 

at short averaging 

times (τ

-0.5 slope) , and 

flicker FM noise at 

longer tau (t0 slope), 

both at the simulated 

levels shown in the 

annotations of the first 

plot.
89 

10.1. Data Precision 

There are relatively few numerical precision issues relating to the analysis of frequency stability data. One exception, 

however, is phase data for a highly stable frequency source having a relatively large frequency offset. The raw phase 

data will be essentially a straight line (representing the frequency offset), and the instability information is contained 

in the small deviations from the line. A large number of digits must be used unless the frequency offset is removed by 

subtracting a linear term from the raw phase data. Similar considerations apply to the quadratic phase term (linear 

frequency drift). Many frequency stability measures involve averages of first or second differences. Thus, while their 

numerical precision obviously depends upon the variable digits of the data set, there is little error propagation in 

forming the summary statistics. 

10.2. Preprocessing 

Preprocessing of the measurement data is often necessary before the actual analysis is performed, which may require 

data averaging, or removal of outliers, frequency offset, and drift. 

Phase data may be converted to frequency data, and vice versa. Phase and frequency data can be combined for a 

longer averaging time. Frequency offset may be removed from phase data by subtracting a line determined by the 

average of the first differences, or by a least squares linear fit. An offset may be removed from frequency data by 

normalizing it to have an average value of zero. Frequency drift may be removed from phase data by a least squares 

or three-point quadratic fit, or by subtracting the average of the second differences. Frequency drift may be removed 

from frequency data by subtracting a least-squares linear fit, by subtracting a line determined by the first differences 

or by calculating the drift from the difference between the two halves of the data. The latter, called the bisection drift, 

is equivalent to the three-point fit for phase data. Other more specialized log and diffusion models may also be used. 

The latter are particularly useful to describe the stabilization of a frequency source. In general, the objective is to 

remove as much of the deterministic behavior as possible, obtaining random residuals for subsequent noise analysis. 

 

10.3. Gaps, Jumps, and Outliers 

It is common to have gaps and outliers in a set of raw frequency stability data. 

Missing or erroneous data may occur due to power outages, equipment 

malfunctions, and interference. For long-term tests, it may not be possible or 

practical to repeat the run, or otherwise avoid such bad data points. Usually the 

reason for the gap or outlier is known, and it is particularly important to explain all 

phase discontinuities. Plotting the data will often show the bad points, which may 

have to be removed before doing an analysis to obtain meaningful results. 

Frequency outliers are found by comparing each data point with the median value of 

the data set plus or minus some multiple of the absolute median deviation. These median statistics are more robust 

because they are insensitive to the size of the outliers. Outliers can be replaced by gaps or filled with interpolated 

values. 

Frequency jumps can also be a problem for stability analysis. Their occurrence indicates that the statistics are not 

stationary, and it may be necessary to divide the data into portions and analyze them separately. 

Gaps and outliers can occur in clock data due to problems with the measuring system or the frequency source itself. 

Like death and taxes, gaps and outliers can be avoided but not eliminated. 

Gaps, jumps and outliers can 

occur in frequency 

measurements and they must 

be handled before performing 

a stability analysis. Methods 

are available to fill gaps and 

to correct for outliers in a 

consistent manner. 
90 

10.4. Gap Handling 

Gaps should be included to maintain the proper implied time interval between measurements, and a value of zero (0) 

is often used to denote a gap. For phase data, zero should be treated as valid data if it is the first or last point. For 

fractional frequency data, valid data having a value of zero can be replaced by some very small value (e.g., 1e−99). 

Many analysis functions can produce meaningful results for data having gaps by simply skipping those points that 

involve a gap. For example, in the calculation of the Allan variance for frequency data, if either of the two points 

involved in the first difference is a gap, that Allan variance pair is skipped in the summation. 

Gaps may be filled in phase or frequency data by replacing them with interpolated values, by first removing any 

leading and trailing gaps, and then using the two values immediately before and after any interior gaps to determine 

linearly interpolated values within the gap. 

A zero value in fractional frequency data can also occur as the result of the conversion of two equal adjacent phase 

data points (perhaps because of limited measurement resolution), and the value should be adjusted to, say, 1e−99 to 

distinguish it from a gap. 

10.5. Uneven Spacing 

Unevenly spaced phase data can be handled if they have associated time tags by using the individual time tag spacing 

when converting it to frequency data. Then, if the tau differences are reasonably small, the data may be analyzed by 

using the average time tag spacing as the analysis tau, in effect placing the frequency data on an average uniform grid. 

While completely random data spacing is not amenable to this process, tau variations of ±10 % will yield reasonable 

results as long as the exact intervals are used for the phase to frequency conversion. 

10.6. Analysis of Data with Gaps 

 

Care must be taken when analyzing the stability of data with missing points and/or gaps. Missing points can be found 

by examining the time tags associated with the data, and gaps can then be inserted as placeholders to maintain equally 

spaced data. Similarly, outliers can be replaced with gaps for the same reason. These gaps can span multiple points. 

Some analysis processes can be performed with data having gaps by skipping over them, perhaps at some speed 

penalty, but other calculations cannot be. It is therefore often necessary to replace the gaps with interpolated values. 

Those points are not real data, however, and, if there are many of them, the results will be suspect. In these cases, 

judgment is needed to assure a credible result. It may be more prudent to simply analyze a gap-free portion of the 

data. 

10.7. Phase-Frequency Conversions 

Phase to frequency conversion is straightforward for data having gaps. Because two phase points are needed to 

determine each frequency point (as the difference between the phase values divided by their tau), a single phase gap 

will cause two frequency gaps, and a gap of N phase points causes N + 1 frequency gaps. 

Conversion from frequency to phase is more problematic because of the need to integrate the frequency data. The 

average frequency value is used to calculate the phase during the gap, which can cause a discontinuity in the phase 

record. Analysis of phase data resulting from the conversion of frequency data having a large gap is not 

recommended. 
91 

10.8. Drift Analysis 

Drift analysis functions generally perform well for data having gaps, provided that missing data are represented by 

gaps to maintain a regular time sequence. 

10.9. Variance Analysis 

Variance analysis functions can include provisions for handling gaps. Some of these functions yield satisfactory 

results in all cases, while others have speed limitations, or provide unsatisfactory results for data having large gaps. 

The latter is most apparent at longer averaging times where the averaging factor is comparable to the size of the gap. 

The speed limitations are caused by more complex gap checking and frequency averaging algorithms, while the poor 

results are associated with the total variances for which conversion to phase data is required. In all cases, the results 

will depend on coding details included in addition to the basic variance algorithm. Filling gaps can often help for the 

total variances. Two general rules apply for the variance analysis of data having large gaps: (1) use unconverted 

phase data, and (2) check the results against the normal Allan deviation (which has the simplest, fastest gap handling 

ability). 

10.10. Spectral Analysis 

Gap filling in spectral analysis functions can affect the low frequency portion of the spectrum. 

10.11. Outlier Recognition 

The median absolute deviation (MAD) is recommended as its means of outlier recognition. The MAD is a robust 

statistic based on the median of the data. It is the median of the scaled absolute deviations of the data points from 

their median value, defined as MAD = Median { | y(i) − m | / 0.6745 }, where m = Median { y(i) }, and the factor 

0.6745 makes the MAD equal to the standard deviation for normally distributed data. Each frequency data point, y(i), 

is compared with the median value of the data set, m, plus or minus the desired multiple of the MAD. 

While the definition of an outlier is somewhat a matter of judgment, it is important to find and remove such points in 

order to use the rest of the data, based on their deviation from the median of the data, using a deviation limit in terms 

of the median absolute deviation (a 5-sigma limit is common). This is a robust way to determine an outlier, which is 

then replaced by a gap. An automatic outlier removal algorithm can iteratively apply this method to remove all 

outliers, which should be an adjunct to, and not a substitute for, visual inspection of the data. 

It is important to explain all outliers, thereby determining whether they are due to the measurement process or the 

device under test. An important first step is to correlate the bad point with any external events (e.g., power outages, 

equipment failures, etc.) that could account for the problem. Failures of the measurement system, frequency 

reference, or environmental control are often easier to identify if multiple devices are under test. Obviously, a 

common gap in all measurement channels points to a failure of the measurement system, while a common change in 

all measurement readings points to a reference problem. Auxiliary information such as monitor data can be a big help 

in determining the cause of outliers. A log of all measurement system events should be kept to facilitate outlier 

identification. Discrete phase jumps are a particular concern, and, if they are related to the RF carrier frequency, may 

indicate a missing cycle or a problem with a digital divider. A phase jump will correspond to a frequency spike with a 

magnitude equal to the phase change divided by the measurement interval. Such a frequency spike will produce a 

stability record that appears to have a (large magnitude) white FM noise characteristic, which can be a source of 

confusion. 
92 

References for Gaps, Jumps, and Outliers 

1. D.B. Percival, “Use of Robust Statistical Techniques in Time Scale Formation,” Preliminary Report, U.S. Naval 

Observatory Contract No. N70092-82-M-0579, 1982. 

2. Gernot M.R. Winkler, “Introduction to Robust Statistics and Data Filtering,” Tutorial at 1993 IEEE Freq. Contrl. 

Symp., Sessions 3D and 4D, June 1, 1993. 

3. V. Barnett and T. Lewis, Outliers in Statistical Data, 3rd Edition, John Wiley & Sons, Chichester, 1994, ISBN 0-

471-93094-6. 

10.12. Data Plotting 

 

Data plotting is often the most important step in the analysis of frequency stability. Visual inspection can provide vital 

insight into the results, and is an important preprocessor before numerical analysis. A plot also shows much about the 

validity of a curve fit. 

Phase data are plotted as line segments connecting the data points. This presentation properly conveys the integral 

nature of the phase data. Frequency data are plotted as horizontal lines between the frequency data points. This shows 

the averaging time associated with the frequency measurement, and mimics the analog record from a frequency 

counter. As the density of the data points increases, there is essentially no difference between the two plotting 

methods. Missing data points are shown as gaps without lines connecting the adjacent points. 

10.13. Variance Selection 

It is the user's responsibility to select an appropriate variance for the stability analysis. The overlapping Allan 

variance is recommended in most cases, especially where the frequency drift is small or has been removed. The Allan 

variance is the most widely used time-domain stability measure, and the overlapping form provides better confidence 

than the original “normal” version. The total and ThêoH variance can be used for even better confidence at large 

averaging factors (but at the expense of longer computation time). The modified Allan variance is recommended to 

distinguish between white and flicker PM noise, and, again, a total form of it is available for better confidence at long 

tau. The time variance provides a good measure of the time dispersion of a clock due to noise, while MTIE measures 

the peak time deviations. TIE rms can also be used to assess clock performance, but TVAR is generally preferred. 

Finally, the overlapping Hadamard variance is recommended over its normal form for analyzing stability in the 

presence of divergent noise or frequency drift. In all cases, the results are reported in terms of the deviations. 

The choice of tau interval depends mainly on whether interference mechanisms are suspected that cause the stability 

to vary periodically. Normally, octave or decade spacing is used (the former has even spacing on a log-log plot, while 

the latter provides tau multiples of ten). The all tau option can be useful as a form of spectral analysis to detect cyclic 

disturbances (such as temperature cycling). 

10.14. Three-Cornered Hat 

Any frequency stability measurement includes noise contributions from both the 

device under test and the reference. Ideally, the reference noise would be low 

enough that its contribution to the measurement is negligible. Or, if the noise of the 

reference is known, it can be removed by subtracting its variance. A special case is 

that of two identical units where half of the measured variance comes from each, 

and the measured deviation can be corrected for one unit by dividing it by √2. 

Otherwise, it may be useful to employ the so-called “three-cornered hat” method for 

determining the variance of an individual source. Given a set of three pairs of 

measurements for three independent frequency sources a, b, and c whose variances 

It is sometimes necessary to 

determine the individual 

noise contributions of the two 

sources that contribute to a 

variance measurement. 

Methods exist for doing so by 

using the results of multiple 

measurements to estimate the 

variance of each source. 
93 

add 

2 22

2 22

2 22

ab a b

ac a c

bc b c

σ σ σ

σ σ σ

σ σ σ

= +

= +

= +

, (68)

The individual variances may be determined by the expressions 

2 222

2 222

2 222

1

2

1

2

1

2

a ab ac bc

b ab bc ac

c ac bc ab

σ σσσ

σ σσσ

σ σσσ

= +− ⎡ ⎤ ⎣ ⎦

= +− ⎡ ⎤ ⎣ ⎦

= +− ⎡ ⎤ ⎣ ⎦

, (69) 

Although useful for determining the individual stabilities of units having similar performance, the method may fail by 

producing negative variances for units that have widely differing stabilities, if the units are correlated, or for which 

there are insufficient data. The three sets of stability data should be measured simultaneously. The three-cornered hat 

method should be used with discretion, and it is not a substitute for a low noise reference. It is best used for units 

having similar stability (e.g., to determine which unit is best). Negative variances are a sign that the method is failing 

(because it was based on insufficient measurement data, or because the units under test have disparate or correlated 

stability). This problem is most likely to arise at long tau. 

The three-cornered hat function may be used to correct a stability measurement for the noise contribution of the 

reference, as shown in Figure 38. 

Figure 38. Three-cornered hat function. 

The Unit Under Test (UUT), denoted as source A, is measured against the reference, denoted by B and C, by identical 

stability data files A-B and A-C. The reference is measured against itself by stability data file B-C, which contains the 

a priori reference stability values multiplied by √2. 

An example of the use of the three-cornered hat function to correct stability data for reference noise is shown below. 

Simulated overlapping Allan deviation stability data for the unit under test versus the reference were created by 

generating and analyzing 512 points of frequency data with tau = 1 s and σy(1 s) = 1e−11. The resulting stability data 

are shown in the following table. 
94 

Table 23. Stability data for unit under test versus reference. 

Tau # Sigma Min Sigma Max Sigma

 1.000e+00 511 9.448e-12 9.108e-12 9.830e-12

 2.000e+00 509 7.203e-12 6.923e-12 7.520e-12

 4.000e+00 505 5.075e-12 4.826e-12 5.367e-12

 8.000e+00 497 3.275e-12 3.058e-12 3.546e-12

 1.600e+01 481 2.370e-12 2.157e-12 2.663e-12

 3.200e+01 449 1.854e-12 1.720e-12 2.025e-12

 6.400e+01 385 1.269e-12 1.147e-12 1.441e-12

 1.280e+02 257 5.625e-13 4.820e-13 7.039e-13

A similar stability file is used for the reference. Since it represents a measurement of the reference against itself, the 

Allan deviations of the reference source are multiplied by √2. Simulated overlapping Allan deviation stability data for 

the reference versus the reference was created by generating 512 points of frequency data with tau = 1 second and 

σy(1) = 1.414e−12. 

Table 24. Stability data for unit under test versus reference. 

Tau # Sigma Min Sigma Max Sigma

 1.000e+00 511 1.490e-12 1.436e-12 1.550e-12

 2.000e+00 509 1.025e-12 9.854e-13 1.070e-12

 4.000e+00 505 7.631e-13 7.257e-13 8.070e-13

 8.000e+00 497 5.846e-13 5.458e-13 6.329e-13

 1.600e+01 481 3.681e-13 3.349e-13 4.135e-13

 3.200e+01 449 2.451e-13 2.152e-13 2.924e-13

 6.400e+01 385 1.637e-13 1.368e-13 2.173e-13

 1.280e+02 257 1.360e-13 1.058e-13 2.285e-13
95 

Figure 39. Corrected UUT and reference stabilities.

Here the reference stability is about 1 × 10-12τ1/2, and the corrected UUT instability is slightly less than the 

uncorrected values. Note that the B and C columns of corrected stability values both represent the reference source. 

Appropriate use of the three-cornered hat method to correct stability measurements for reference noise applies where 

the reference stability is between three to 10 times better than that of the unit under test. The correction is negligible 

for more the latter (see above), and has questionable confidence for less than the former (and a better reference should 

be used). 

The error bars of the individual variances may be set using χ2 statistics by first determining the reduced number of 

degrees of freedom associated with the three-cornered hat process [11, 12]. The fraction of remaining degrees of 

freedom for unit i as a result of performing a three-cornered hat instead of measuring against a perfect reference is 

given by: 

4

4 22 22 22

2

2

i

i ab ac bc

σ

σ σσ σσ σσ

⋅ Γ =

⋅+⋅+⋅+⋅

. (70) 

The ratio of the number of degrees of freedom is 0.4 for three units having the same stability, independent of the 

averaging time and noise type. 

The three-cornered hat technique can be extended to M clocks (subject to the same restriction against negative 

variances) by using the expression 

2 2

1

1

2

M

i ij

j

B

M

σ σ=

⎡ ⎤ = − ⎢ ⎥ − ⎣ ⎦ ∑ , (71) 

where 
96 

2

1 1

1

2( 1)

M M

kj

k j

B

M

σ = =

⎡ ⎤ = ⎢ ⎥ − ⎣ ⎦ ∑ ∑ , (72) 

and the σ2ij are the measured Allan variances for clock i versus j at averaging time τ. Using σ2

ii = 0 and σ2ij = σ2ji, we can 

easily write closed-form expressions for the separated variances from measurements of M clocks. 

References for Three-Cornered Hat 

1. The term “Three-cornered hat” was coined by J.E. Gray of NIST. 

2. J.E. Gray and D.W. Allan, “A Method for Estimating the Frequency Stability of an Individual Oscillator,” 

Proceedings of the 28th Annual Symposium on Frequency Control, May 1974, pp. 243-246. 

3. S.R. Stein, “Frequency and Time - Their Measurement and Characterization,” Chapter 12, Section 12.1.9, 

Separating the Variances of the Oscillator and the Reference, pp. 216-217, Precision Frequency Control , Vol. 2, 

Edited by E.A. Gerber and A. Ballato, Academic Press, New York, 1985, ISBN 0-12-280602-6. 

4. J. Groslambert, D. Fest, M. Oliver and J.J. Gagnepain, “Characterization of Frequency Fluctuations by 

Crosscorrelations and by Using Three or More Oscillators,” Proceedings of the 35th Annual Frequency Control 

Symposium, May 1981, pp. 458-462. 

5. P. Tavella and A. Premoli, “A Revisited Tree-Cornered Hat Method for Estimating Frequency Standard 

Instability,” IEEE Transactions on Instrumentation and Measurement, IM-42, February 1993, pp. 7-13. 

6. P. Tavella and A. Premoli, “Characterization of Frequency Standard Instability by Estimation of their 

Covariance Matrix,” Proceedings of the 23rd Annual Precise Time and Time Interval (PTTI) Applications and 

Planning Meeting, December 1991, pp. 265-276. 

7. P. Tavella and A. Premoli, “Estimation of Instabilities of N Clocks by Measuring Differences of their Readings,” 

Metrologia, Vol. 30, No. 5, 1993, pp. 479-486. 

8. F. Torcaso, C.R. Ekstrom, E.A. Burt and D.N. Matsakis, “Estimating Frequency Stability and CrossCorrelations,” Proceedings of the 30th Annual Precise Time and Time Interval (PTTI) Systems and Applications 

Meeting, December 1998, pp. 69-82. 

9. F. Torcaso, C. Ekstrom, E. Burt and D. Matsakis, “Estimating the stability of N clocks with correlations,” IEEE 

Trans. Instrum. Meas. 47(5), 1183, 2000. 

10. C. Audoin and B. Guinot, The Measurement of Time, Cambridge University Press, ISBN 0-521-00397-0, 2001, 

Section 5.2.8.

11. C. Ekstrom and P. Koppang, “Three-Cornered Hats and Degrees of Freedom,” Proceedings of the 33rd Annual 

Precise Time and Time Interval (PTTI) Systems and Applications Meeting, November 2001, pp. 425-430.

12. C.R. Ekstrom and P.A. Koppang, “Error Bars for Three-Cornered Hats,” IEEE Trans. UFFC, Vol. 53, No. 5, pp. 

876-879, May 2006. 

13. J.A. Barnes, The Analysis of Frequency and Time Data, Austron, Inc. May 1992.

10.15. Reporting 

The results of a stability analysis are usually presented as a combination of textual, tabular, and graphic forms. The 

text describes the device under test, the test setup, and the methodology of the data preprocessing and analysis, and 

summarizes the results. The assumptions and analysis choices should be documented so that the results could be 

reproduced. The report often includes a table of the stability statistics. Graphical presentation of the data at each 

stage of the analysis is generally the most important aspect of presenting the results. For example, these are often a 

series of plots showing the phase and frequency data with an aging fit, phase and frequency residuals with the aging 

removed, and stability plots with noise fits and error bars. Plot titles, subtitles, annotations and inserts can be used to 

clarify and emphasize the data presentation. The results of several stability runs can be combined, possibly along with 

specification limits, into a single composite plot. The various elements can be combined into a single electronic 

document for easy printing and transmittal. 
97 

11 Case Studies 

This section contains several case studies to further illustrate methodologies of frequency stability analysis. 

11.1. Flicker Floor of a Cesium Frequency Standard 

The purpose of this analysis is to examine the flicker floor of a commercial cesium beam tube frequency standard. An 

instrument of this kind can be expected to display a white FM noise characteristic out to long averaging times. At 

some point, however, the unit will typically “flicker out”, with its stability plot flattening out to a flicker FM noise 

characteristic, beyond which its stability will no longer improve. Determining this point requires a lengthy and 

expensive run, and it is worthwhile to use an analytical method that provides the best information at long averaging 

factors. The effort of a more elaborate analysis is far easier than extending the measurement time by weeks or 

months. 

Table 25. Flicker floor of a cesium frequency standard. 

This is the five-month 

frequency record for the 

unit under test. It has 

already been “cleaned 

up” for any missing 

points, putting in gaps as 

required to provide a 

time-continuous data set. 

The data look very 

“white” (see Section 6.1), 

the frequency offset is 

very small (+7.2 × 10-14), 

and there is no apparent 

drift (+1.4 × 10-16/day). 

Overall, this appears to 

be a very good record.

An overlapping Allan 

deviation plot shows a 

white FM noise level of 

about 8.2 × 10-12τ

-1/2 out 

to about 5 days, where 

the stability levels off at 

about 1.2 × 10-14. While 

this is very respectable 

behavior, one wonders 

what the stability actually 

is at the longer averaging 

times. But to gain 

meaningful confidence 

using ADEV there, the 

run would have to be 

extended by several 

months.
98 

The total deviation can 

provide better confidence 

at the longer averaging 

times. It seems to 

indicate that the stability 

continues to improve past 

10 days, where is drops 

below 1 × 10-14, but the 

results are not 

conclusive.

Thêo1 can provide even 

better long-term 

information, at the 

expense of a longer 

calculation time. This 

Thêo1 plot seems to 

show even more clearly 

that the stability 

continues to improve at 

longer averaging times, 

well into the pp1015

range. It assumes white 

FM noise (no Thêo1 bias 

removal).

A ThêoH analysis with 

automatic bias removal 

combines AVAR in short 

and mid-term averaging 

times and ThêoBR in 

long term. ThêoH does 

not require any explicit 

knowledge of the type of 

noise. It appears that one 

noise prevails in this data 

run, in which case Thêo1 

(shown above) bias is 

detected as 1.676, 

intermediate between 

white and flicker FM 

noises for medium to 

large averaging times. 

Thus, Thêo1 results are 

essentially the same as 

ThêoH.

We can conclude that this cesium beam frequency standard reaches a 

stability slightly better than 1 × 10-14 at an averaging time on the order of 1 

month. 
99 

11.2. Hadamard Variance of a Source with Drift 

Table 26. Hadamard variance of a source with drift. 

These frequency data 

simulate a typical rubidium 

frequency standard (RFS) 

with a combination of white 

and flicker FM noise, plus 

significant frequency drift. 

If an Allan variance analysis 

is performed directly on 

these data without drift 

removal, the stability at the 

longer averaging times is 

degraded. In particular, the 

stability plot has a τ

+1 slope 

beyond 105

 seconds that 

corresponds to the drift (i.e., 

about 1 × 10-12 at 5 days). 

If the linear frequency drift 

is removed before 

performing the AVAR 

stability analysis, the 

stability plot shows a white 

FM noise (τ

-1/2) 

characteristic changing to 

flicker FM noise (t0

) at 

longer averaging times. It is 

usually best to use a stability 

plot only to show the noise, 

and analyzing and removing 

the drift separately. 
100 

The Hadamard variance is 

insensitive to linear 

frequency drift. It can 

therefore be used to perform 

a stability analysis on the 

original data without first 

having to remove the drift. 

The HDEV results are 

essentially identical to those 

of the drift-removed ADEV. 

This can be more 

convenient, especially when 

analyzing a combination of 

sources having differing 

amounts of drift (e.g., 

cesium and rubidium units). 

11.3. Phase Noise Identification 

Consider the problem of identifying the dominant type of phase noise in a frequency distribution amplifier. Assume 

that time domain stability measurements have been made comparing the amplifier’s input and output signals. How 

should these data be analyzed to best determine the noise type? Simulated white and flicker PM noise at equal levels 

are analyzed below in several ways to demonstrate their ability to perform this noise identification. 

Table 27. Phase noise identification 

White PM Flicker PM 

Examination of the phase data is a good first step. An experienced analyst 

will immediately notice the difference between the white and flicker noise 

plots, but will find it harder to quantify them.

In contrast, the frequency data show little noise type discrimination, 

because the differencing process whitens both. Examination of the 

frequency data would be appropriate to distinguish between white and 

flicker FM noise, however.
101 

The Allan deviation is not able to distinguish between white and flicker 

PM noise. Both have slopes of about 1, as shown by the superimposed 

noise fit lines.

The modified Allan deviation, by virtue of its additional phase averaging, 

is able to distinguish between white and flicker PM noise, for which the 

slopes are –1.5 and –1.0, respectively.

Even better discrimination is possible with the autocorrelation function. 

The lag 1 ACF is 0.006 and 0.780 for these white and flicker PM noise 

data, and is able to quantitatively estimate the power law noise exponents 

as +1.99 and +0.93, respectively. That ID method is quite effective even 

for mixed noise types.

11.4. Detection of Periodic Components 

Frequency stability data can contain periodic fluctuations due to external interference, environmental effects, or the 

source itself, and it can therefore be necessary to detect discrete spectral components when performing a stability 

analysis. This example uses a set of 50 000 points of τ = 1 second simulated white FM noise at a level of 1 ×10-11τ

-1/2 

that contains sinusoidal interference with a period of 500 s at a peak level of 1 × 10-12. The latter simulates 

interference that might occur as the result of air conditioner cycling. Several analytical methods are used to detect this 

periodic component. 
102 

Table 28. Detection of periodic components. 

The interference level is 

too low to be visible in the 

full frequency data plot.

By zooming in, one can see 

just a hint of the 

interference (10 cycles 

over 5000 data points).

The interference is quite 

visible in an “all tau” 

stability plot as a null that 

occurs first at an averaging 

time of 500 s (the period of 

the interference). Here the 

stability is equal to the 

underlying white FM noise 

level.
103 

The interference is clearly 

visible in the power 

spectral density (PSD), 

which has a bright 

component at 2 mHz, 

correspond-ing to the 500 s 

period of the interference.

The interference is less 

visible in an 

autocorrelation plot, where 

cyclic behavior is barely 

noticeable with a 500-lag 

period. The PSD has 

equivalent information, but 

its log scale makes lowlevel components more 

apparent.

It is a good analysis policy to examine the power spectral density when periodic fluctuations are visible on a stability 

plot and periodic interference is suspected. 

11.5. Stability Under Vibrational Modulation 

This plot shows the stability 

of an oscillator with a 

combination of white PM 

noise and a sinusoidal component simulating 

vibrational modula-tion. 

Nulls in the Allan deviation 

occur at averaging times 

equal to the multiples of the 

20 Hz sinusoidal modulation period, where the 

stability is determined by 

the white PM noise. Peaks 

in the Allan deviation occur 

at the modulation half 

cycles, and have a τ

-1

envelope set by the 

vibrational phase 

modulation. 
104 

11.6. White FM Noise of a Frequency Spike 

The Allan deviation of a 

frequency record having a 

large spike (a phase step) has 

a τ

-1/2 characteristic [1]. Thus 

adding a single large (say 

106

) central outlier to the 

1000-point test suite of 

section 12.4 will give a data 

set with σy(τ) = 

[(106

)⋅2/(1000−1)]1/2 = 

3.16386e4, as shown in this 

stability plot. 

Reference: C.A. Greenhall, “Frequency Stability Review,” Telecommunications 

and Data Acquisition Progress Report 42-88, Jet Propulsion Laboratory, Pasadena, 

CA, Feb. 1987. 

11.7. Composite Aging Plots

A composite plot showing the aging of a population of frequency sources can be an effective way to present this 

information visually, providing a quick comparison of their behaviors. The following figure shows the stabilization 

period of a production lot of rubidium clocks. 

Plots for 40 units are shown with their serial numbers, all plotted with the same scales. In particular, these plots all 

have a full x-scale time range of nine weeks (1 week/div) and a full y-scale frequency range of 1.5 × 10-11 (1 × 10-

12/div). A diagonal slope downward across the plot corresponds to an aging of about –2.4 × 10-13/day. All the data 

have τ = 900 seconds (15 min). A figure like this immediately shows that (a) all the units have negative frequency 

aging of about the same magnitude that stabilizes in about the same way, (b) there are occasional gaps in some of the 

records, (c) all of the units have about the same short-term noise, but some of the records are quieter than others in the 

longer term, (d) some of the units take longer than others to reach a certain aging slope. 

The plots, although small, still contain enough detail to allow subtle comparisons very quickly, far better than a set of 

numbers or bar graphs would do. The eye can easily see the similarities and differences, and can immediately select 

units based on some criterion, which would be harder to do using a set of larger plots on separate pages. Closer 

inspection of even these small plots can reveal a lot of quantitative information if one knows the scale factors. Color 

coding, although not used here, could be used to provide additional information. 

These plots are inspired by Edward Tufte’s book The Visual Display of Quantitative Information, ISBN 978-

0961392109, Graphic Press, 1983. 

.
105 

001 002 003 004 005

006 007 008 009 010

011 012 013 014 015

016 017 018 019 020

021 022 023 024 025

026 027 028 029 030

031 032 033 034 035

036 037 038 039 040

Figure 40. Composite aging plots showing the stabilization period of a production lot of rubidium clocks.
106 

12 Software 

Software is necessary to perform a frequency stability analysis, because those 

calculations generally involve complex specialized algorithms and large data sets 

needed to interactively perform and document a complete stability analysis. It is 

convenient to use an integrated software package that combines all of the required 

analytical tools, operates on current computer hardware and operating systems, includes the latest analytical 

techniques, and has been validated to produce the correct results. 

12.1. Software Validation 

Considerable effort is needed to ensure that the results obtained from frequency stability analysis software are correct. 

Several suggested validation methods are shown. Mature commercially available software should be used whenever 

possible instead of developing custom software. User feedback and peer review are important. There is a continuing 

need to validate the custom software used to analyze time domain frequency stability, and the methods listed below 

can help ensure that correct results are obtained. 

Several methods are available to validate frequency stability analysis software: 

1. Manual Analysis: The results obtained by manual analysis of small data sets (such as in NBS Monograph 140

Annex 8.E) can be compared with the new program output. This is always good to do to get a “feel” for the 

process. 

2. Published Results: The results of a published analysis can be compared with the new program output. One 

important validation method is comparison of the program results against a test suite such as the one in 

References [1] and [2]. Copies of those test data are available on-line [3]. 

3. Other Programs: The results obtained from other specialized stability analysis programs (such as that from a 

previous generation computer or operating system) can be compared with the new program output. 

4. General Purpose Programs: The results obtained from industry standard, general purpose mathematical and 

spreadsheet programs such as MathCAD, Matlab, and Excel can be compared with the new program output. 

5. Consistency Checks: The new program should be verified for internal consistency, such as producing the same 

stability results from phase and frequency data. The standard and normal Allan variances should be 

approximately equal for white FM noise. The normal and modified Allan variances should be identical for an 

averaging factor of 1. For other averaging factors, the modified Allan variance should be approximately one-half 

the normal Allan variance for white FM noise, and the normal and overlapping Allan variances should be 

approximately equal. The overlapping method provides better confidence of the stability estimates. The various 

methods of drift removal should yield similar results. 

6. Simulated Data: Simulated clock data can also serve as a useful cross check. Known values of frequency offset 

and drift can be inserted, analyzed, and removed. Known values of power-law noise can be generated, analyzed, 

plotted, and modeled. 

12.2. Test Suites 

Tables 29 and 30 summarize the values for several common frequency stability measures for both the classic NBS 

data set and a 1000-point portable test suite. 

12.3. NBS Data Set 

A “classic” suite of frequency stability test data is the set of nine 3-digit numbers from Annex 8.E of NBS Monograph 

140 shown in Table 29. Those numbers were used as an early example of an Allan variance calculation. These 

frequency data is also normalized to zero mean by subtracting the average value, and then integrated to obtain phase 

values. A listing of the properties of this data set is shown in Table II. While nine data points are not sufficient to 

calculate large frequency averages, they are, nevertheless, a very useful starting point to verify frequency stability 

Specialized software is 

needed to perform a 

frequency stability analysis. 
107 

calculations, since a small data set can easily be entered and analyzed manually. A small data set is also an advantage 

for finding “off-by-one” errors where an array index or some other integer variable is slightly wrong and hard to 

detect in a larger data set. 

Table 29. NBS Monograph 140, Annex 8.E Test Data 

# Frequency Normalized frequency Phase (τ=1)

1 892 103.1111 0.00000 

2 809 20.11111 103.11111 

3 823 34.11111 123.22222 

4 798 9.11111 157.33333 

5 671 −117.88889 166.44444 

6 644 −144.88889 48.55555 

7 883 94.11111 −96.33333 

8 903 114.11111 −2.22222 

9 677 −111.88889 111.88889 

10 0.0000 

 

Table 30. NBS Monograph 140, Annex 8.E Test Data Statistics 

Averaging Factor 1 2 

# Data Points 9 4 

Maximum 903 893.0 

Minimum 644 657.5 

Average 788.8889 802.875 

Median 809 830.5 

Linear Slope −10.20000 −2.55 

Intercept 839.8889 809.25 

Standard Deviation[a] 100.9770 102.6039 

Normal Allan Deviation 91.22945 115.8082 

Overlapping Allan Dev 91.22945 85.95287 

Modified Allan Dev 91.22945 74.78849 

Time Deviation 52.67135 86.35831 

Hadamard Deviation 70.80607 116.7980 

Overlap Hadamard Dev 70.80607 85.61487 

Hadamard Total Dev 70.80607 91.16396 

Total Deviation 91.22945 93.90379 

Modified Total Dev 75.50203 75.83606 

Time Total Deviation 43.59112 87.56794 

Note: [a] Sample (not population) standard deviation. 

12.4. 1000-Point Test Suite 

The larger frequency data test suite used here consists of 1000 pseudo-random frequency data points. It is produced 

by the following prime modulus linear congruential random number generator: 

1 16807 Mod 2147483647 i i n n + = . (73) 
108 

This expression produces a series of pseudo-random integers ranging in value from 0 to 2 147 483 646 (the prime 

modulus, 231−1, avoids a collapse to zero). When started with the seed n0 = 1 234 567 890, it produces the sequence n1

= 395 529 916, n2 = 1 209 410 747, n3 = 633 705 974, etc. These numbers may be divided by 2 147 483 647 to obtain 

a set of normalized floating-point test data ranging from 0 to 1. Thus the normalized value of n0 is 0.5748904732. A 

spreadsheet program is a convenient and reasonably universal way to generate these data. The frequency data may be 

converted to phase data by assuming an averaging time of 1, yielding a set of 1001 phase data points. Similarly, 

frequency offset and/or drift terms may be added to the data. These conversions can also be done by a spreadsheet 

program. 

The values of this data set will be uniformly distributed between 0 and 1. While a data set with a normal (Gaussian) 

distribution would be more realistic, and could be produced by summing a number of independent uniformly 

distributed data sets, or by the Box-Muller method [5], this simpler data set is adequate for software validation. 

Table 31. 1000-point frequency data set. 

Averaging factor 1 10 100 

# Data Points 1000 100 10 

Maximum 9.957453e-01 7.003371e-01 5.489368e-01

Minimum 1.371760e-03 2.545924e-01 4.533354e-01

Average[a] 4.897745e-01 4.897745e-01 4.897745e-01

Median 4.798849e-01 5.047888e-01 4.807261e-01

Linear Slope[b,c] 6.490910e-06 5.979804e-05 1.056376e-03

Intercept[c] 4.865258e-01 4.867547e-01 4.839644e-01

Bisection Slope[b] −6.104214e-06 −6.104214e-05 −6.104214e-04

1st Diff Slope[b] 1.517561e-04 9.648320e-04 1.011791e-03

Log Fit[b,d], a= 5.577220e-03 5.248477e-03 7.138988e-03

y(t)=a·ln (bt+1)+c, b= 9.737500e-01 4.594973e+00 1.420429e+02

y'(t)=ab/(bt+1), c= 4.570469e-01 4.631172e-01 4.442759e-01

Slope at end 5.571498e-06 5.237080e-05 7.133666e-04

Standard Dev[e] 2.884664e-01 9.296352e-02 3.206656e-02

Normal Allan Dev[f] 2.922319e-01 9.965736e-02 3.897804e-02

Overlap Allan Dev[h] 2.922319e-01 9.159953e-02 3.241343e-02

Mod Allan Dev[g,h] 2.922319e-01 6.172376e-02 2.170921e-02

Time Deviation[h] 1.687202e-01 3.563623e-01 1.253382e-00

Hadamard Deviation 2.943883e-01 1.052754e-01 3.910861e-02

Overlap Had Dev 2.943883e-01 9.581083e-02 3.237638e-02

Hadamard Total Dev 2.943883e-01 9.614787e-02 3.058103e-02

Total Deviation 2.922319e-01 9.134743e-02 3.406530e-02

Modified Total Dev 2.418528e-01 6.499161e-02 2.287774e-02

Time Total Deviation 1.396338e-01 3.752293e-01 1.320847e-00

Notes: 

[a] Expected value = 0.5. 

[b] All slopes are per interval. 

[c] Least squares linear fit. 

[d] Exact results will depend on iterative algorithm used. Data not suited to log fit. 

[e] Sample (not population) standard deviation. Expected value = 1/√12 = 

0.2886751. 

[f] Expected value equal to standard deviation for white FM noise. 

[g] Equal to normal Allan deviation for averaging factor = 1. 

[h] Calculated with listed averaging factors from the basic τ = 1 data set. 
109 

 

Table 32. Error bars for n=1000 point =1 data set with avg. factor=10. 

Allan Dev Type

#Pts

Sigma Value

Noise Type & Ratio

Conf Interval

Remarks

χ2 for

95% CF

Normal 

99 

9.965736e-02 

W FM[a], B1=0.870

CI= 8.713870e-03[b,c]

±1σ CI[f].

Overlapping 

981 

9.159953e-02 

W FM 

# χ2 df = 146.177

Max σy(τ)=1.014923e-01[g]

Max σy(τ)= 1.035201e-01[h] 

Min σy(τ)= 8.223942e-02[h] 

119.07 

114.45 

181.34

Modified[d]

972 

6.172376e-02 

W FM[e], R(n)=0.384 

# χ2 df = 94.620

Max σy(τ)=7.044412e-02[g]

Max σy(τ)= 7.224944e-02[h]

Min σy(τ)= 5.419961e-02[h]

72.64 

69.06 

122.71

Notes: 

[a] Theoretical B1=1.000 for W FM noise and 0.667 for F and W PM noise. 

[b] Simple, noise-independent CI estimate =σy(τ)/√N=1.001594e-02. 

[c] This CI includes κ(α) factor that depends on noise type: 

 Noise α κ(α)

 W PM 2 0.99 

 F PM 1 0.99 

 W FM 0 0.87 

 F FM -1 0.77 

 RW FM -2 0.75 

[d] BW factor 2πfhτ0 = 10. Applies only to F PM noise. 

[e] Theoretical R(n) for W FM noise = 0.500 and 0.262 for F PM noise. 

[f] Double-sided 68 % confidence interval: p = 0.158 and 0.842. 

[g] Single-sided 95 % confidence interval: p = 0.950. 

[h] Double-sided 95 % confidence interval: p = 0.025 and 0.975. 

12.5. IEEE Standard 1139-1999 

IEEE Standard 1139-1999, IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time 

Metrology – Random Instabilities contains several examples of stability calculations. Annex C.2 contains an example 

of an Allan deviation calculation, Annex C.3 has an example of a modified Allan deviation calculation, Annex C.4 

has an example of a total deviation calculation, and Annex D contains examples of confidence interval calculations. 

References for Software 

1. W.J. Riley, “A Test Suite for the Calculation of Time Domain Frequency Stability,” Proc. 1995 IEEE Freq. 

Contrl. Symp., pp. 360-366, June 1995. 

2. W.J. Riley, “Addendum to a Test Suite for the Calculation of Time Domain Frequency Stability,” Proc. 1996 

IEEE Freq. Contrl. Symp., pp. 880-882, June 1996. 

3. Stable32 Software for Frequency Stability Analysis, Hamilton Technical Services, Beaufort, SC 29907 USA, 

www.wriley.com. 

4. “IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology - Random 

Instabilities,” IEEE Std 1139-1999, July 1999. 

5. W.H. Press, B.P. Flannery, S.A. Teukolsky and W.T. Vetterling, Numerical Recipes in C, ISBN 0-521-35465-X, 

Cambridge Univ. Press, Cambridge, U.K., 1988. 
110 

13 Glossary 

The following terms are used in the field of frequency stability analysis 

Aging The change in frequency with time due to internal effects within the device. 

Allan variance The two-sample variance σ2y(τ) commonly used to measure frequency stability. 

Averaging The process of combining phase or frequency data into samples at a longer averaging time.

Averaging time See Tau.

BW Bandwidth, hertz. 

Confidence limit The uncertainty associated with a measurement. Often a 68 % confidence level or error 

bar. 

Drift The change in frequency with time due to all effects (including aging and environmental 

sensitivity). 

Frequency data A set of fractional frequency values, y[i], where i denotes equally-spaced time samples. 

Hadamard variance A three-sample variance, HVAR, that is similar to the two-sample Allan variance. It uses 

the second differences of the fractional frequencies, and is unaffected by linear frequency 

drift. 

£(f) £(f) = 10·log[1⁄2 · Sφ(f)], the ratio of the SSB phase noise power in a 1 Hz BW to the total 

carrier power, dBc/Hz. Valid when noise power is much smaller than the carrier power. 

MJD The Modified Julian Date is based on the astronomical Julian Date, the number of days 

since noon on January 1, 4713 BC. The MJD is the Julian Date – 2 4000 000.5. 

Modified sigma A modified version of the Allan or total variance that uses phase averaging to distinguish 

between white and flicker PM noise processes. 

MTIE The maximum time interval error of a clock. 

Normalize To remove the average value from phase or frequency data. 

Phase data A set of time deviates, x[i] with units of seconds, where i denotes equally-spaced time 

samples. Called “phase” data to distinguish them from the independent time variable. 

Phase noise The spectral density of the phase deviations. 

Sampling time See Tau. 

Sigma The square root or deviation of a variance, often the two-sample or Allan deviation, σy(τ). 

Slope The change in frequency per tau interval. 

SSB Single sideband. 

Sf(f) The one-sided spectral density of the phase deviations, rad2/Hz. 
111 

Sx(f) The one-sided spectral density of the time deviations, sec2/Hz. 

Sy(f) The one-sided spectral density of the fractional frequency deviations, 1/Hz. 

Tau The interval between phase measurements or the averaging time used for a frequency 

measurement. 

Total A variance using an extended data set that provides better confidence at long averaging 

times. 

Thêo1 Theoretical variance #1, a variance providing stability data out to 75 % of the record 

length. 

ThêoBR A biased-removed version of Thêo1. 

ThêoH A hybrid combination of ThêoBR and the Allan variance. 

TIE The time interval error of a clock. Can be expressed as the rms time interval error TIE rms 

or the maximum time interval error MTIE. 

Total variance A two-sample variance similar to the Allan variance with improved confidence at large 

averaging factors. 

x(t) The instantaneous time deviation from a nominal time, x(t) = φ(t)/2πν0, s, where ν0 is the 

nominal frequency, hertz. This dependent time variable is often called “phase” to 

distinguish it from the independent time variable t. 

y(t) The instantaneous fractional frequency deviation from a nominal frequency, y(t) = 

[ν(t)−ν0]/ν0] = x'(t), where ν0 is the nominal frequency. 

References for Glossary 

1. “IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology - 

Random Instabilities,” IEEE Std 1139-1999, July 1999. 

2. Glossary of Time and Frequency Terms issued by Comite Consultatif International de Radio 

Communication – International Telecommunications (CCITT) Union, Geneva, Switzerland. 
112 

14 Bibliography 

• Notes 

A. These references are arranged by topic and sorted by date. 

B. All of the FCS and UFFC references are available on-line for IEEE UFFC members. 

C. Only the 1990 and later PTTI proceedings are now available on-line. 

D. None of the EFTF or older IEEE I&M proceedings are available on-line. 

E. NIST papers are available on-line at http://tf.nist.gov/general/publications.htm. 

F. Hamilton Technical Services papers available on-line at http://www.wriley.com. 

• General 

1. Special Issue on Frequency Stability, Proc. IEEE, Vol. 54, Feb. 1966. 

2. Proc. IEEE, Vol. 55, June 1967. 

3. J.A. Barnes, “Atomic Timekeeping and the Statistics of Precision Signal Generators,” IEEE 

Proceedings, vol. 54, pp. 207-219, 1966. 

4. J.A. Barnes, et. al., “Characterization of Frequency Stability,” IEEE Trans. Instrum. Meas., Vol. IM20, No. 2, pp. 105-120, May 1971. 

5. B.E. Blair (Editor), “Time and Frequency: Theory and Fundamentals,” NBS Monograph 140, U.S. 

Department of Commerce, National Bureau of Standards, May 1974. 

6. G. Winkler, “A Brief Review of Frequency Stability Measures,” Proc. 8th PTTI Meeting, pp. 489-

527, Dec. 1976. 

7. J. Rutman, “Oscillator Specifications: A Review of Classical and New Ideas,” Proc. 31th Annu. 

Symp. on Freq. Contrl., pp.291-310, June 1977. 

8. J. Vanier and M. Tetu, “Time Domain Measurement of Frequency Stability,” Proc. 10th PTTI 

Meeting, pp. 247-291, Nov. 1978. 

9. P.Lesage and C. Audoin, “Characterization and Measurement of Time and Frequency Stability”, 

Radio Science, Vol. 14, No. 4, pp. 521-539, 1979. 

10. D.A. Howe, D.W. Allan and J.A. Barnes, “Properties of Signal Sources and Measurement Methods,” 

Proc. 35th Annu. Symp. on Freq. Contrl., pp. 1-47, May 1981. Also available on line at NIST web 

site. 

11. V.F. Kroupa (Editor), Frequency Stability: Fundamentals and Measurement, IEEE Press, Institute of 

Electrical and Electronic Engineers, New York, 1983, ISBN 0-87942-171-1. 

12. S.R. Stein, “Frequency and Time - Their Measurement and Characterization,” Chapter 12, pp.191-

416, Precision Frequency Control, Vol. 2, Edited by E.A. Gerber and A. Ballato, Academic Press, 

New York, 1985, ISBN 0-12-280602-6. 

13. Proc. IEEE, Vol. 74, Jan. 1986. 

14. C.A. Greenhall, “Frequency Stability Review,” Telecommunications and Data Acquisition Progress 

Report 42-88, Oct-Dec 1986, Jet Propulsion Laboratory, Pasadena, CA, Feb. 1987. 

15. D.W. Allan, “Time and Frequency (Time-Domain) Characterization, Estimation, and Prediction of 

Precision Clocks and Oscillators”, IEEE Trans. Ultrasonics, Ferroelectrics and Freq. Contrl., Vol. 

UFFC-34, No. 6, pp. 647-654, Nov. 1987. 

16. D.W. Allan, et al., “Standard Terminology for Fundamental Frequency and Time Metrology,” Proc. 

42nd Annu. Freq. Control Symp., pp. 419-425, June, 1988. 

17. D.B Sullivan, D.W Allan, D.A. Howe and F.L.Walls (Editors), “Characterization of Clocks and 

Oscillators,” NIST Technical Note 1337, U.S. Department of Commerce, National Institute of 

Standards and Technology, March 1990. 

18. D.W. Allan, “Characterization of Precision Clocks and Oscillators,” Class Notes, NRL Workshop, 

Nov. 1990. 

19. D.W. Allan, “Time and Frequency Metrology: Current Status and Future Considerations,” Proc. 5th 

European Freq. and Time Forum, pp. 1-9, March 1991. 

20. Special Issue on Time and Frequency, Proc. IEEE, Vol. 79, July 1991. 

21. J. Rutman and F. L. Walls, “Characterization of Frequency Stability in Precision Frequency Sources,”

Proc. IEEE, Vol. 79, July 1991. 
113 

22. J.A. Barnes, “The Analysis of Frequency and Time Data,” Austron, Inc., Dec. 1991. 

23. C.A. Greenhall, “The Generalized Autocovariance: A Tool for Clock Statistics,” Telecommunications 

and Mission Operations Progress Report, Vol. 42-137, Jet Propulsion Laboratory, Pasadena, CA, 

May 1999. 

24. C. Audoin and B. Guinot, The Measurement of Time, Cambridge University Press, 2001 

25. G.E.P. Box and G.M. Jenkins, Time Series Analysis: Forecasting and Control, San Francisco: 

Holden-Day, 1970. 

26. W.J. Riley, “The Basics of Frequency Stability Analysis,” Hamilton Technical Services. 

27. W.J. Riley, “The Calculation of Time Domain Frequency Stability,” Hamilton Technical Services. 

28. W.J. Riley, “Techniques for Frequency Stability Analysis,” Tutorial at the 2003 Intl. Freq. Cont. 

Symp., May 2003. 

• Standards and Specifications

29. “Characterization of Frequency and Phase Noise,” Report 580, International Radio Consultative 

Committee (C.C.I.R.), pp. 142-150, 1986. 

30. MIL-PRF-55310, Oscillators, Crystal, General Specification For. 

31. R.L. Sydnor (Editor), “The Selection and Use of Precise Frequency Systems,” ITU-R Handbook, 

1995. 

32. Guide to the Expression of Uncertainty in Measurement, International Standards Organization, 1995, 

ISBN 92-67-10188-9. 

33. “IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology - 

Random Instabilities,” IEEE Std 1139-1999, July 1999. 

• Classic (Pre-Allan variance)

34. Proc. IEEE-NASA Symp. on the Definition and Measurement of Short-Term Frequency Stability, 

NASA SP-80, Nov. 1964. 

• Allan Variance 

35. D.W. Allan, “Allan Variance,” Allan's TIME, http://www.allanstime.com. 

36. D.W. Allan, “The Statistics of Atomic Frequency Standards,” Proc. IEEE, Vol. 54, No. 2, pp. 221-

230, Feb. 1966. 

37. “Characterization of Frequency Stability,” NBS Technical Note 394, U.S Department of Commerce, 

National Bureau of Standards, Oct. 1970. 

38. J.A. Barnes, et al, “Characterization of Frequency Stability,” IEEE Trans. Instrum. Meas., Vol. IM20, No. 2, pp. 105-120, May 1971. 

39. J.A. Barnes, “Variances Based on Data with Dead Time Between the Measurements,” NIST Technical 

Note 1318, U.S. Department of Commerce, National Institute of Standards and Technology, 1990. 

40. C.A. Greenhall, “Does Allan Variance Determine the Spectrum?” Proc. 1997 Intl. Freq. Cont. Symp., 

pp. 358-365, June 1997. 

41. C.A. Greenhall, “Spectral Ambiguity of Allan Variance,” IEEE Trans. Instrum. Meas., Vol. IM-47, 

No. 3, pp. 623-627, June 1998. 

42. D.A. Howe, “Interpreting Oscillatory Frequency Stability Plots,” Proc. 2000 IEEE Freq. Contrl. 

Symp., pp. 725-732, May 2002 

• Modified Allan Variance 

43. D.W. Allan and J.A. Barnes, “A Modified Allan Variance with Increased Oscillator Characterization 

Ability,” Proc. 35th Annu. Symp. on Freq. Contrl., pp. 470-474, May 1981. 
114 

44. P. Lesage and T. Ayi, “Characterization of Frequency Stability: Analysis of the Modified Allan 

Variance and Properties of Its Estimate,” IEEE Trans. Instrum. Meas., Vol. IM-33, No. 4, pp. 332-

336, Dec. 1984. 

45. C.A. Greenhall, “Estimating the Modified Allan Variance,” Proc. 1995 IEEE Freq. Contrl. Symp., pp. 

346-353, May 1995. 

46. C.A. Greenhall, “The Third-Difference Approach to Modified Allan Variance,” IEEE Trans. Instrum. 

Meas., Vol. IM-46, No. 3, pp. 696-703, June 1997. 

47. C.A. Greenhall, “A Shortcut for Computing the Modified Allan Variance,” Proc. 1992 IEEE Freq. 

Contrl. Symp., pp. 262-264, May 1992. 

• Time Variance and Time Error Prediction 

48. D.W. Allan and H. Hellwig, “Time Deviation and Time Prediction Error for Clock Specification, 

Characterization, and Application,” Proceedings of the Position Location and Navigation Symposium 

(PLANS), 29-36, 1978. 

49. D.W. Allan, D.D. Davis, J. Levine, M.A. Weiss, N. Hironaka, and D. Okayama, “New Inexpensive 

Frequency Calibration Service From NIST,” Proc. 44th Annu. Symp. on Freq. Contrl., pp. 107-116, 

June 1990. 

50. D.W. Allan, M.A. Weiss and J.L. Jespersen, “A Frequency-Domain View of Time-Domain 

Characterization of Clocks and Time and Frequency Distribution Systems,” Proc. 45th Annu. Symp. 

on Freq. Contrl., pp. 667-678, May 1991. 

• Hadamard Variance 

51. Jacques Saloman Hadamard (1865-1963), French mathematician. 

52. W.K. Pratt, J. Kane and H.C. Andrews, “Hadamard Transform Image Coding,” Proc. IEEE, Vol. 57, 

No. 1, pp.38-67, Jan. 1969. 

53. R.A. Baugh, “Frequency Modulation Analysis with the Hadamard Variance,” Proc. 25th Annu. Symp. 

on Freq. Contrl., pp. 222-225, April 1971. 

54. B. Picinbono, “Processus a Accroissements Stationnaires,” Ann. des telecom, Tome 30, No. 7-8, pp. 

211-212, July-Aug, 1975. 

55. K. Wan, E. Visr and J. Roberts, “Extended Variances and Autoregressive Moving Average Algorithm 

for the Measurement and Synthesis of Oscillator Phase Noise,” 43rd Annu. Symp. on Freq. Contrl., 

pp.331-335, June 1989. 

56. S.T. Hutsell, “Relating the Hadamard Variance to MCS Kalman Filter Clock Estimation,” Proc. 27th 

PTTI Meeting, pp. 291-302, Dec. 1995. 

57. S.T. Hutsell, “Operational Use of the Hadamard Variance in GPS,” Proc. 28th PTTI Meeting, pp. 

201-213, Dec. 1996. 

58. D.N. Matsakis and F.J. Josties, “Pulsar-Appropriate Clock Statistics,” Proc. 28th PTTI Meeting, pp. 

225-236, Dec. 1996. 

59. W.J. Riley, “The Hadamard Variance,” Hamilton Technical Services, 2006. 

60. D. Howe, et al., “A Total Estimator of the Hadamard Function Used For GPS Operations,” Proc. 32nd

PTTI Meeting, Nov. 2000. 

61. D.A. Howe, R.L. Beard, C.A. Greenhall, F. Vernotte, W.J. Riley and T.K. Peppler, “Enhancements to 

GPS Operations and Clock Evaluations Using a “Total” Hadamard Deviation,” IEEE Trans. 

Ultrasonics, Ferrelectrics and Freq. Contrl., Vol. 52, No. 8, pp. 1253-1261, Aug. 2005.

• Modified Hadamard Variance 

62. S. Bregni and L. Jmoda, “Improved Estimation of the Hurst Parameter of Long-Range Dependent 

Traffic Using the Modified Hadamard Variance,” Proceedings of the IEEE ICC, June 2006. 
115 

63. C.A. Greenhall and W.J. Riley, “Uncertainty of Stability Variances Based on Finite Differences,” 

Proceedings of the 35th Annual Precise Time and Time Interval (PTTI) Systems and Applications 

Meeting, December 2003. 

• Total Variance 

64. D.A. Howe, “An Extension of the Allan Variance with Increased Confidence at Long Term,” Proc. 

1995 IEEE Int. Freq. Cont. Symp., pp. 321-329, June 1995. 

65. D.A. Howe and K.J. Lainson, “Simulation Study Using a New Type of Sample Variance,” Proc. 1995 

PTTI Meeting, pp. 279-290, Dec. 1995. 

66. D.A. Howe and K.J. Lainson, “Effect of Drift on TOTALDEV,” Proc. 1996 Intl. Freq. Cont. Symp. , 

pp. 883-889, June 1996 

67. D.A. Howe, “Methods of Improving the Estimation of Long-term Frequency Variance,” Proc. 1997 

European Frequency and Time Forum, pp. 91-99, March 1997. 

68. D.A. Howe & C.A. Greenhall, “Total Variance: A Progress Report on a New Frequency Stability 

Characterization,” pp. 39-48, Proc. 1997 PTTI Meeting, Dec. 1997. 

69. D.B. Percival and D.A. Howe, “Total Variance as an Exact Analysis of the Sample Variance,” Proc. 

1997 PTTI Meeting, Dec. 1997. 

70. C.A. Greenhall, D.A. Howe and D.B Percival, “Total Variance, an Estimator of Long-Term 

Frequency Stability,” IEEE Trans. Ultrasonics, Ferroelectrics and Freq. Contrl., Vol. UFFC-46, No. 

5, pp. 1183-1191, Sept. 1999. 

71. D.A. Howe, “Total Variance Explained,” Proc. 1999 Joint Meeting of the European Freq. and Time 

Forum and the IEEE Freq. Contrl. Symp., pp. 1093-1099, April 1999. 

72. D.A. Howe, “The Total Deviation Approach to Long-Term Characterization of Frequency Stability,” 

IEEE Trans. Ultrasonics, Ferroelectrics and Freq. Contrl., Vol. UFFC-47, No. 5, pp. 1102-1110, 

Sept. 2000. 

73. D.A. Howe and T.K. Peppler, “Definitions of Total Estimators of Common Time-Domain 

Variances,” Proc. 2001 Intl. Freq. Cont. Symp. , pp. 127-132, June 2001. 

• Modified Total Variance 

74. D.A. Howe and F. Vernotte, “Generalization of the Total Variance Approach to the Modified Allan 

Variance,” Proc. 31st PTTI Meeting, pp.267-276, Dec. 1999. 

• Time Total Variance 

75. M.A. Weiss and D.A. Howe, “Total TDEV,” Proc. 1998 IEEE Int. Freq. Cont. Symp., pp. 192-198, 

June 1998. Note: An old definition of TDEV. 

76. D.A. Howe and T.K. Peppler, “Definitions of Total Estimators of Common Time-Domain 

Variances,” Proc. 2001 Intl. Freq. Cont. Symp. , pp. 127-132, June 2001. 

• Thêo1, ThêoBR, and ThêoH 

77. D.A. Howe and T.K. Peppler, “Very Long-Term Frequency Stability: Estimation Using a SpecialPurpose Statistic,” Proceedings of the 2003 IEEE International Frequency Control Symposium, pp. 

233-238, May 2003. 

78. D.A. Howe and T.N. Tasset, “Thêo1: Characterization of Very Long-Term Frequency Stability,” 

Proc. 2004 EFTF . 

79. D.A. Howe, “ThêoH: A Hybrid, High-Confidence Statistic that Improves on the Allan Deviation,” 

Metrologia 43 (2006), S322-S331. 

80. D.A. Howe, J. McGee-Taylor and T. Tasset, “ThêoH Bias-Removal Method,” Proc. 2006 IEEE Freq. 

Contrl. Symp., pp. 788-792, June 2006. 
116 

81. J. McGee and D.A. Howe, “ThêoH and Allan Deviation as Power-Law Noise Estimators,” IEEE 

Trans. Ultrasonics, Ferroelectrics and Freq. Contrl., Feb. 2007. 

82. J. McGee and D.A. Howe, “Fast TheoBR: A method for long data set stability analysis,” IEEE Trans. 

Ultrasonics, Ferroelectrics and Freq. Contrl., to be published, 2008. 

• MTIE 

83. P. Travella and D. Meo, “The Range Covered by a Clock Error in the Case of White FM,” Proc. 30th 

Annu. PTTI Meeting, pp. 49-60, Dec. 1998. 

84. P. Travella, A. Dodone and S. Leschiutta, “The Range Covered by a Random Process and the New 

Definition of MTIE,” Proc. 28th Annu. PTTI Meeting, pp. 119-123, Dec. 1996. 

85. S. Bregni, “Clock Stability Characterization and Measurement in Tele-communications,” IEEE 

Trans. Instrum. Meas., Vol. IM-46, No. 6, pp. 1284-1294, Dec. 1997. 

86. S. Bregni, “Measurement of Maximum Time Interval Error for Telecommunications Clock Stability 

Characterization,” IEEE Trans. Instrum. Meas., Vol. IM-45, No. 5, pp. 900-906, Oct. 1996. 

87. G. Zampetti, “Synopsis of Timing Measurement Techniques Used in Telecommunucations,” Proc. 

24th PTTI Meeting, pp. 313-326, Dec. 1992. 

88. M.J. Ivens, “Simulating the Wander Accumulation in a SDH Synchronisation Network,” Master's 

Thesis, University College, London, UK, November 1997. 

89. S. Bregni and S. Maccabruni, “Fast Computation of Maximum Time Interval Error by Binary 

Decomposition,” IEEE Trans. I&M, Vol. 49, No. 6, pp. 1240-1244, Dec. 2000. 

• Multi-Variance Analysis 

90. F. Vernotte, E. Lantz, “Time Stability: An Improvement of the Multi-Variance Method for the 

Oscillator Noise Analysis,” Proc. 6th European Frequency and Time Forum, pp. 343-347, March 

1992. 

91. F. Vernotte, E. Lantz, J. Groslambert and J.J. Gagnepain, “A New Multi-Variance Method for the 

Oscillator Noise Analysis,” Proc. 46th Annu. Symp. on Freq. Contrl., pp. 284-289, May 1992. 

92. F. Vernotte, E. Lantz, J. Groslambert and J.J. Gagnepain, “Oscillator Noise Analysis: Multivariance 

Measurement,” IEEE Trans. Instrum. Meas., Vol. IM-42, No. 2, pp. 342-350, April 1993. 

93. F. Vernotte, E. Lantz, F. Meyer and F. Naraghi, “Simultaneneous Measurement of Drifts and Noise 

Coefficients of Oscillators: Application to the Analysis of the Time Stability of the Millisecond 

Pulsars,” Proc. 1997 European Frequency and Time Forum, pp. 91-99, March 1997. 

94. T. Walter, “A Multi-Variance Analysis in the Time Domain,” Proc. 24th PTTI Meeting, pp. 413-424, 

Dec. 1992. 

• Dynamic Stability 

95. L. Galleani and P. Tavella, “The Characterization of Clock Behavior with the Dynamic 

AllanVariance,” Proc. 2003 Joint FCS/EFTF Meeting, pp. 239-244. 

96. L. Galleani and P. Tavella, “Tracking Nonstationarities in Clock Noises Using the Dynamic Allan 

Variance,” Proc. 2005 Joint FCS/PTTI Meeting. 

• Confidence Intervals 

97. J.A. Barnes and D.W. Allan, “Variances Based on Data with Dead Time Between the 

Measurements,” NIST Technical Note 1318, U.S. Department of Commerce, National Institute of 

Standards and Technology, 1990. 

98. C.A. Greenhall, “Recipes for Degrees of Freedom of Frequency Stability Estimators,” IEEE Trans. 

Instrum. Meas., Vol. 40, No. 6, pp. 994-999, Dec. 1991. 

99. M.A. Weiss and C. Hackman, “Confidence on the Three-Point Estimator of Frequency Drift,” Proc. 

24th Annu. PTTI Meeting, pp. 451-460, Dec. 1992. 
117 

100. M.A.Weiss and C.A. Greenhall, “A Simple Algorithm for Approximating Confidence on the 

Modified Allan Variance and the Time Variance,” Proc. 28th Annu. PTTI Meeting, pp. 215-224, Dec. 

1996. 

101. D.A. Howe, “Methods of Improving the Estimation of Long-Term Frequency Variance,” 

Proc. 11th European Freq. and Time Forum, pp. 91-99, March 1997. 

102. W.J. Riley, “Confidence Intervals and Bias Corrections for the Stable32 Variance Functions,” 

Hamilton Technical Services, 2000. 

103. F. Vernotte and M. Vincent, “Estimation of the Uncertainty of a Mean Frequency 

Measurement,” Proc. 11th European Freq. and Time Forum, pp. 553-556, March 1997. 

104. P. Lesage and C. Audoin, “Estimation of the Two-Sample Variance with a Limited Number 

of Data,” pp. 311-318. 

105. P. Lesage and C. Audoin, “Characterization of Frequency Stability: Uncertainty due to the 

Finite Number of Measurements,” IEEE Trans. Instrum. Meas., Vol. 22, No. 2, pp.157-161, June 

1973. 

106. K. Yoshimura, “Degrees of Freedom of the Estimate of the Two-Sample Variance in the 

Continuous Sampling Method,” IEEE Trans. Instrum. Meas., Vol. 38, No. 6, pp. 1044-1049, Dec. 

1989. 

107. C.R. Ekstrom and P.A. Koppang, “Error Bars for Three-Cornered Hats,” IEEE Trans. 

Ultrasonics, Ferroelectrics and Freq. Contrl., Vol. 53, No. 5, pp. 876-879, May 2006. 

108. C. Greenhall and W. Riley, “Uncertainty of Stability Variances Based on Finite Differences,” 

Proc. 35th PTTI Meeting, Dec. 2003. 

109. T.N. Tasset, D.A. Howe and D.B. Percival, “Thêo1 Confidence Intervals,” Proc. 2004 Joint 

FCS/UFFC Meeting, pp. 725-728, Aug. 2004. 

• Drift Estimation and Removal 

110. C.A. Greenhall, “Removal of Drift from Frequency Stability Measurements,” 

Telecommunications and Data Acquisition Progress Report 42-65, July-Aug 1981, Jet Propulsion 

Laboratory, Pasadena, CA, pp. 127-132, 1981. 

111. J.A. Barnes, “The Measurement of Linear Frequency Drift in Oscillators,” Proc. 15th Annu. 

PTTI Meeting, pp. 551-582, Dec. 1983. 

112. M.A. Weiss and C. Hackman, “Confidence on the Three-Point Estimator of Frequency Drift,” 

Proc. 24th Annu. PTTI Meeting, pp. 451-460, Dec. 1992. 

113. M.A. Weiss, D.W. Allan and D.A. Howe, “Confidence on the Second Difference Estimation 

of Frequency Drift,” Proc. 1992 IEEE Freq. Contrl. Symp., pp. 300-305, June 1992. 

114. “Long Term Quartz Oscillator Aging - A New Approach,” The Standard, Hewlett-Packard 

Co., pp. 4-5, Jan. 1994. 

115. L.A. Breakiron, “A Comparative Study of Clock Rate and Drift Estimation.” 

116. G.Wei, “Estimations of Frequency and its Drift Rate,” IEEE Trans. Instrum. Meas., Vol. 46, 

No. 1, pp. 79-82, Feb. 1997. 

117. C.A. Greenhall, “A Frequency-Drift Estimator and Its Removal from Modified Allan 

Variance,” Proc. 1997 IEEE Freq. Contrl. Symp., pp. 428-432, June 1997. 

118. F. Vernotte and M. Vincent, “Estimation of the Measurement Uncertainty of Drift 

Coefficients Versus the Noise Levels,” Proc. 12th European Freq. and Time Forum, pp. 222-227, 

March 1998. 

• Bias Functions 

119. J.A. Barnes, “Tables of Bias Functions, B1 and B2, for Variances Based on Finite Samples of 

Processes with Power Law Spectral Densities,” NBS Technical Note 375, Jan. 1969. 

120. J.A. Barnes, “The Analysis of Frequency and Time Data,” Austron, Inc., Dec. 1991. 

121. W.J. Riley, “Confidence Intervals and Bias Corrections for the Stable32 Variance Functions,” 

Hamilton Technical Services 
118 

• Noise Identification 

122. J.A. Barnes, “The Generation and Recognition of Flicker Noise,” NBS Report 9284, U.S 

Department of Commerce, National Bureau of Standards, June 1967. 

123. J.A. Barnes, “Effective Stationarity and Power Law Spectral Densities,” NBS FrequencyTime Seminar Preprint, Feb. 1968. 

124. J.A. Barnes and D.W. Allan, “Recognition and Classification of LF Divergent Noise 

Processes,” NBS Division 253 Class Notes, circa 1970. 

125. J.A. Barnes, “Models for the Interpretation of Frequency Stability Measurements,” NBS 

Technical Note 683, U.S Department of Commerce, National Bureau of Standards, Aug. 1976. 

126. C.A. Greenhall and J.A. Barnes, “Large Sample Simulation of Flicker Noise,” Proc. 19th 

Annu. PTTI Meeting, pp. 203-217, Dec. 1987 and Proc. 24th Annu. PTTI Meeting, p. 461, Dec. 1992. 

127. D. Howe, R. Beard, C. Greenhall, F. Vernotte and W. Riley, “A Total Estimator of the 

Hadamard Function Used for GPS Operations,” Proc. 32nd PTTI Meeting, pp. 255-268, Nov. 2000. 

128. W.J. Riley and C.A. Greenhall, “Power Law Noise Identification Using the Lag 1 

Autocorrelation,” Proc. 18th European Freq. and Time Forum, April 2004. 

129. W.J. Riley, “Confidence Intervals and Bias Corrections for the Stable32 Variance Functions,” 

Hamilton Technical Services. 

• Simulation 

130. J.A Barnes and D.W. Allan, “A Statistical Model of Flicker Noise,” Proc. IEEE, Vol. 54, No. 

2, pp. 176-178, Feb. 1966. 

131. J.A. Barnes, “The Generation and Recognition of Flicker Noise,” NBS Report 9284, U.S 

Department of Commerce, National Bureau of Standards, June 1967. 

132. N.J. Kasdin and T. Walter, “Discrete Simulation of Power Law Noise,” Proc. 1992 IEEE 

Freq. Contrl. Symp., pp. 274-283, May 1992. 

133. T. Walter, “Characterizing Frequency Stability: A Continuous Power-Law Model with 

Discrete Sampling,” IEEE Trans. Instrum. Meas., Vol. 43, No. 1, pp. 69-79, Feb. 1994. 

134. S.K. Park and K.W. Miller, “Random Number Generators: Good Ones are Hard to Find,” 

Comm. ACM, Vol. 31, No. 10, pp. 1192-1201. 

135. S. Bregni, L. Valtriani, F. Veghini, “Simulation of Clock Noise and AU-4 Pointer Action in 

SDH Equipment,” Proc. of IEEE GLOBECOM '95, pp. 56-60, Nov. 1995. 

136. S. Bregni, “Generation of Pseudo-Random Power-Law Noise Sequences by Spectral 

Shaping” in Communications World. Editor: N. Mastorakis. WSES Press, 2001. 

• Dead Time 

137. J.A. Barnes and D.W. Allan, “Variances Based on Data with Dead Time Between the 

Measurements,” NIST Technical Note 1318, U.S. Department of Commerce, National Institute of 

Standards and Technology, 1990. 

138. D.B Sullivan, D.W Allan, D.A. Howe and F.L. Walls (Editors), “Characterization of Clocks 

and Oscillators,” NIST Technical Note 1337, U.S. Department of Commerce, National Institute of 

Standards and Technology, TN-296-335, March 1990. 

139. J.A. Barnes, “The Analysis of Frequency and Time Data,” Austron, Inc., Dec. 1991. 

140. D.A. Howe and E.E. Hagn, “Limited Live-Time Measurements of Frequency Stability,” 

Proc. Joint FCS/EFTF, pp. 1113-1116, April 1999. 

141. W.J. Riley, “Gaps, Outliers, Dead Time, and Uneven Spacing in Frequency Stability Data,” 

Hamilton Technical Services. 

• 3-Cornered Hat 
119 

142. J.E. Gray and D.W. Allan, “A Method for Estimating the Frequency Stability of an Individual 

Oscillator,” Proc. 28th Freq. Contrl. Symp., pp. 243-246, May 1974. 

143. J. Groslambert, D. Fest, M. Oliver and J.J. Gagnepain, “Characterization of Frequency 

Fluctuations by Crosscorrelations and by Using Three or More Oscillators,” Proc..35th Freq. Contrl. 

Symp., pp. 458-462, May 1981. 

144. S.R. Stein, “Frequency and Time - Their Measurement and Characterization”, Chapter 12, 

Section 12.1.9, Separating the Variances of the Oscillator and the Reference, pp. 216-217, Precision 

Frequency Control , Vol. 2, Edited by E.A. Gerber and A. Ballato, Academic Press, New York, 1985, 

ISBN 0-12-280602-6. 

145. P. Tavella and A. Premoli, “"Characterization of Frequency Standard Instability by 

Estimation of their Covariance Matrix,” Proc. 23rd PTTI Meeting, pp. 265-276. Dec. 1991. 

146. P. Tavella and A. Premoli, “A Revisited Tree-Cornered Hat Method for Estimating 

Frequency Standard Instability,” IEEE Trans. Instrum. Meas., IM-42, pp. 7-13, Feb. 1993. 

147. C.R. Ekstrom and P.A. Koppang, “Error Bars for Three-Cornered Hats,” IEEE Trans. UFFC, 

Vol. 53, No. 5, pp. 876-879, May 2006. 

148. W.J. Riley, “Application of the 3-Cornered Hat Method to the Analysis of Frequency 

Stability,” Hamilton Technical Services. 

• Domain Conversions 

149. A.R. Chi, “The Mechanics of Translation of Frequency Stability Measures Between 

Frequency and Time Domain Measurements,” Proc. 9th Annu. PTTI Meeting, pp. 523-548, Dec.1977. 

150. J. Rutman, “Relations Between Spectral Purity and Frequency Stability,” pp. 160-165. 

151. R. Burgoon and M.C. Fisher, “Conversion between Time and Frequency Domain of 

Intersection Points of Slopes of Various Noise Processes,” 32th Annu. Symp. on Freq. Contrl., pp. 

514-519, June 1978. 

152. W.F. Egan, “An Efficient Algorithm to Compute Allan Variance from Spectral Density,” 

IEEE Trans. Instrum. Meas., Vol. 37, No. 2, pp. 240-244, June 1988. 

153. F. Vernotte, J. Groslambert and J.J. Gagnepain, “Practical Calculation Methods of Spectral 

Density of Instantaneous Normalized Frequency Deviation from Instantaneous Time Error Samples,” 

Proc. 5th European Freq. and Time Forum, pp. 449-455, March 1991. 

154. F. Thomson, S. Asmar and K. Oudrhiri, “Limitations on the Use of the Power-Law Form of 

Sy(f) to Compute Allan Variance,” IEEE Trans. Ultrasonics, Ferroelectrics and Freq. Contrl., Vol. 

52, No. 9, pp. 1468-1472, Sept. 2005. 

155. W.J. Riley, “Stable32 Frequency Domain Functions,” Hamilton Technical Services. 

• Robust Statistics 

156. D.B. Percival, “Use of Robust Statistical Techniques in Time Scale Formation,” Preliminary 

Report, U.S. Naval Observatory Contract No. N70092-82-M-0579, 1982. 

157. Gernot M.R. Winkler, “Introduction to Robust Statistics and Data Filtering,” Tutorial at 1993 

IEEE Freq. Contrl. Symp., Sessions 3D and 4D, June 1, 1993. 

158. V. Barnett and T. Lewis, Outliers in Statistical Data, 3rd Edition, John Wiley & Sons, 

Chichester, 1994, ISBN 0-471-93094-6. 

• Computation and Algorithms 

159. W.H. Press, B.P. Flannery, S.A. Teukolsky and W.T. Vetterling, Numerical Recipes in C, 

Cambridge Univ. Press, Cambridge, U.K., 1988, pp.216-217. 

160. C.A. Greenhall, “A Shortcut for Computing the Modified Allan Variance,” Proc. 1992 IEEE 

Freq. Contrl. Symp., pp. 262-264, May 1992. 

161. W.J. Riley, “A Test Suite for the Calculation of Time Domain Frequency Stability,” Proc. 

1995 IEEE Freq. Contrl. Symp., pp. 360-366, June 1995. 
120 

162. W.J. Riley, “Addendum to a Test Suite for the Calculation of Time Domain Frequency 

Stability,” Proc. 1996 IEEE Freq. Contrl. Symp., pp. 880-882, June 1996. 

163. M. Kasznia, “Some Approach to Computation of ADEV, TDEV and MTIE,” Proc. 11th 

European Freq. and Time Forum, pp. 544-548, March 1997. 

• Measurements 

164. D.W. Allan, “Picosecond Time Difference Measurement System,” Proc. 29th Annu. Symp. on 

Freq. Contrl., pp. 404-411, May 1975. 

165. D.A. Howe, D.W. Allan and J.A. Barnes, “Properties of Signal Sources and Measurement 

Methods”, Proc. 35th Annu. Symp. on Freq. Contrl., May 1981, pp. 1-47. 

166. S.R. Stein, “Frequency and Time - Their Measurement and Characterization,” Chapter 12, 

pp.191-416, Precision Frequency Control, Vol. 2, Edited by E.A. Gerber and A. Ballato, Academic 

Press, New York, 1985, ISBN 0-12-280602-6. 

167. S. Stein, D. Glaze, J. Levine, J. Gray, D. Hilliard, D. Howe and L Erb, “Performance of an 

Automated High Accuracy Phase Measurement System,” Proc. 36th Annu. Freq. Contrl. Symp., June 

1982, pp. 314-320. 

168. S.R. Stein and G.A. Gifford, “Software for Two Automated Time Measurement Systems,”

Proc. 38th Annu. Freq. Contrl. Symp, June 1984, pp. 483-486. 

169. Data Sheet, Model 5110A Time Interval Analyzer, Symmetricom, Inc. (formerly Timing 

Solutions Corp.), Boulder, CO 80301 USA. 

170. Data Sheet, A7 Frequency & Phase Comparator Measurement System, Quartzlock (UK) Ltd., 

Gothic, Plymouth Road, Totnes, Devon, TQ9 5LH England. 

171. C.A. Greenhall, “Oscillator-Stability Analyzer Based on a Time-Tag Counter,” NASA Tech 

Briefs, NPO-20749, May 2001, p. 48. 

172. C.A. Greenhall, “Frequency Stability Review,” Telecommunications and Data Acquisition 

Progress Report 42-88, Oct-Dec 1986, Jet Propulsion Laboratory, Pasadena, CA, pp. 200-212, Feb. 

1987. 

 
121 

Index 

3 

3-Cornered Hat 110, 111, 113, 114 

A 

Aging ...................................... 131 

All Tau .............................. 70, 110 

Allan Deviation (ADEV)15, 16, 18, 19, 21, 22, 30, 45, 

46, 53, 61, 64, 72, 74, 91, 108, 111, 112, 123, 128, 

132 

Allan Variance (AVAR)4, 9, 14, 15, 18, 19, 21, 22, 23, 

24, 25, 26, 27, 29, 30, 31, 37, 38, 39, 40, 41, 46, 47, 

49, 50, 53, 58, 59, 80, 85, 107, 109, 113, 125, 126, 

131, 132 

Analysis Procedure ............. 1, 103 

Autocorrelation ....... 10, 53, 55, 57 

Autocorrelation Function (ACF)53, 55 

Averaging Time (tau)1, 3, 4, 13, 15, 19, 21, 22, 24, 25, 

26, 29, 31, 33, 37, 38, 39, 40, 41, 43, 50, 53, 54, 56, 

57, 58, 95, 99, 106, 108, 109, 113, 127, 131, 132 

B 

Bias Function .......... 46, 58, 59, 61 

Bibliography ........................... 135 

Bisection ........................... 69, 106 

C 

Chi Square (2

) ............ 37, 46, 53 

Confidence Interval19, 21, 22, 26, 45, 46, 47, 52, 53, 

57, 128 

D 

Data Array ............................ 3, 99 

Data Arrays ................................. 7 

Database ................................. 100 

Dead Time53, 58, 60, 61, 63, 96, 99 

Diffusion ..................... 70, 73, 106 

Domain Conversion .................. 85 

Drift ........................ 67, 68, 69, 70 

Dual Mixer Time Interval (DTMF) 97 

Dynamic Stability ..................... 44 

E 

E-Mail ......................................... ii 

Equivalent Degrees of Freedom (edf) 30, 46, 47, 

49, 50, 51, 53 

Error Bars4, 36, 45, 46, 53, 74, 113, 131 

F 

Feedback ................................. 125 

First Difference9, 18, 54, 56, 67, 106, 107 

Frequency Drift3, 14, 15, 16, 24, 25, 33, 67, 68, 69, 

91, 106, 109, 131 

Frequency Offset24, 31, 43, 67, 73, 91, 96, 105, 106, 

125, 127 

G 

Gaps ................. 106, 107, 108, 109 

Glossary .................................. 131 

H 

Hadamard Deviation16, 20, 26, 35, 36 

Hadamard Total Variance .. 33, 34 

Hadamard Variance9, 14, 15, 19, 25, 26, 29, 33, 34, 

36, 37, 47, 49, 50, 53, 110, 131 

Heterodyne .......... 3, 95, 96, 97, 99 

Histogram ..................... 65, 66, 99 

I 

IEEE-Standard-1139 ................ 11 

J 

Jumps .............................. 106, 109 

L 

Lag 1 Autocorrelation10, 54, 55, 57 

Log Model ................................ 70 

M 

Many Tau ................................. 70 

Maximum Time Interval Error (MTIE) 41, 42, 110, 

131, 132 

Measuring System1, 74, 86, 95, 97, 99, 100, 107 

Median ............................ 106, 108 

Median Absolute Deviation (MAD) 73, 108 

MIL-O-55310B ........................ 70 

Modified Allan Deviation (MDEV) 15, 16, 22, 

23, 53, 65, 128 

Modified Allan Variance (MVAR) 15, 22, 23, 

31, 32, 46, 47, 50, 53, 58, 59, 85, 110, 125 

Modified Total Variance (MTOT)31, 32, 33, 50, 51, 

59 

MTIE ........... 41, 42, 110, 131, 132 

N 

NewThêo1 .......................... 39, 41 

Noise Identification8, 9, 52, 53, 54, 56, 57, 61 

Noise Spectra ............................ 79 
122 

O 

Outlier . 41, 75, 106, 108, 109, 123 

Overlapping Allan Deviation21, 46, 111, 112 

Overlapping Allan Variance21, 26, 27, 49, 109, 125 

P 

Phase Noise Diagram ............... 81 

Power Law Noise34, 37, 47, 52, 53, 54, 56, 57, 58, 61, 

63, 79, 80, 81, 86, 92 

Power Spectral Density (PSD)79, 80, 81 

Q 

Quadratic .................................. 68 

R 

Regression ................................ 69 

S 

Second Difference9, 18, 25, 32, 34, 69, 106, 131 

Software . iii, 91, 99, 100, 125, 127 

Stable32 ...................... 1, 129, 131 

Standard Variance13, 14, 15, 17, 18, 23, 46, 58 

Stride ........................................ 15 

Synchronization ........................ 24 

Syntonization ...................... 24, 25 

T 

Test Suite ......... 123, 125, 126, 127 

Thêo14, 14, 15, 37, 38, 39, 41, 46, 47, 51, 53, 74, 132 

ThêoBR .................39, 40, 41, 132 

ThêoH .............. 15, 39, 40, 41, 132 

Three-Point Fit ................. 69, 106 

Time Deviation (TDEV)23, 24, 41, 42, 43, 64, 65, 

110, 132 

Time Deviation (TVAR) .... 23, 33 

Time Interval Counter (TIC)95, 96, 97 

Time Interval Error (TIE)42, 43, 44, 45, 110, 132 

Time Total Variance (TTOT)33, 50 

Time Variance (TVAR)23, 47, 50, 110 

Timetags ..................... 64, 99, 107 

Total Deviation (TOTDEV)30, 35, 128 

Total Variance (TOTVAR)25, 29, 30, 31, 33, 34, 37, 

50, 59, 108, 109, 131 

Transfer Function ..................... 75 

Two-Way Satellite Time Frequency Transfer 

(TWSTFT) ............................ 64 

V 

Validation ....................... 125, 127 

X 

x (Phase Data) ............................ 7 

Y 

y (Frequency Data) ..................... 7 
123 

About the Author 

Mr. Riley has worked in the area of frequency control his entire professional career. He is currently the Proprietor of 

Hamilton Technical Services, where he provides software and consulting services in that field, including the Stable 

program for the analysis of frequency stability. Bill collaborates with other experts in the time and frequency 

community to provide an up-to-date and practical tool for frequency stability analysis that has received wide 

acceptance within that community. From 1999 to 2004, he was Manager of Rubidium Technology at Symmetricom, 

Inc. (previously Datum), applying his extensive experience with atomic frequency standards to those products within 

that organization, including the early development of a chip-scale atomic clock (CSAC). From 1980-1998, Mr. Riley 

was the Engineering Manager of the Rubidium Department at EG&G (now PerkinElmer), where his major 

responsibility was to direct the design of rubidium frequency standards, including high-performance rubidium clocks 

for the GPS navigational satellite program. Other activities there included the development of several tactical military 

and commercial rubidium frequency standards. As a Principal Engineer at Harris Corporation, RF Communications 

Division in 1978-1979, he designed communications frequency synthesizers. From 1962-1978, as a Senior 

Development Engineer at GenRad, Inc. (previously General Radio), Mr. Riley was responsible for the design of 

electronic instruments, primarily in the area of frequency control. He has a 1962 BSEE degree from Cornell 

University and a 1966 MSEE degree from Northeastern University. Mr. Riley holds six patents in the area of 

frequency control, and has published a number of papers and tutorials in that field. He is a Fellow of the IEEE, and a 

member of Eta Kappa Nu, the IEEE UFFC Society, and served on the PTTI Advisory Board. He received the 2000 

IEEE International Frequency Control Symposium I.I. Rabi Award for his work on atomic frequency standards and 

frequency stability analysis. 

William J. Riley, Jr. 

Proprietor 

Hamilton Technical Services 

650 Distant Island Drive 

Beaufort, SC 29907 

Phone: 843-525-6495 

Fax: 843-525-0251 

E-Mail: bill@wriley.com 

Web: www.wriley.com 

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Periodical

Journal of Research of the National Institute of Standards and Technology–Reports NIST research and development in 

metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, and information 

technology. Papers cover a broad range of subjects, with major emphasis on measurement methodology and the basic technology 

underlying standardization. Also included from time to time are survey articles on topics closely related to the Institute's technical 

and scientific programs. Issued six times a year. 

Nonperiodicals

Monographs–Major contributions to the technical literature on various subjects related to the Institute's scientific and technical 

activities. 

Handbooks–Recommended codes of engineering and industrial practice (including safety codes) developed in cooperation with 

interested industries, professional organizations, and regulatory bodies. 

Special Publications–Include proceedings of conferences sponsored by NIST, NIST annual reports, and other special 

publications appropriate to this grouping such as wall charts, pocket cards, and bibliographies. 

National Standard Reference Data Series–Provides quantitative data on the physical and chemical properties of materials, 

compiled from the world's literature and critically evaluated. Developed under a worldwide program coordinated by NIST under 

the authority of the National Standard Data Act (Public Law 90-396). NOTE: The Journal of Physical and Chemical Reference 

Data (JPCRD) is published bimonthly for NIST by the American Institute of Physics (AlP). Subscription orders and renewals are 

available from AIP, P.O. Box 503284, St. Louis, MO 63150-3284. 

Building Science Series–Disseminates technical information developed at the Institute on building materials, components, 

systems, and whole structures. The series presents research results, test methods, and performance criteria related to the structural 

and environmental functions and the durability and safety characteristics of building elements and systems. 

Technical Notes–Studies or reports which are complete in themselves but restrictive in their treatment of a subject. Analogous to 

monographs but not so comprehensive in scope or definitive in treatment of the subject area. Often serve as a vehicle for final

reports of work performed at NIST under the sponsorship of other government agencies. 

Voluntary Product Standards–Developed under procedures published by the Department of Commerce in Part 10, Title 15, of 

the Code of Federal Regulations. The standards establish nationally recognized requirements for products, and provide all 

concerned interests with a basis for common understanding of the characteristics of the products. NIST administers this program

in support of the efforts of private-sector standardizing organizations. 

Order the following NIST publications–FIPS and NISTIRs–from the National Technical Information Service, Springfield, VA 

22161. 

Federal Information Processing Standards Publications (FIPS PUB)–Publications in this series collectively constitute the 

Federal Information Processing Standards Register. The Register serves as the official source of information in the Federal 

Government regarding standards issued by NIST pursuant to the Federal Property and Administrative Services Act of 1949 as 

amended, Public Law 89-306 (79 Stat. 1127), and as implemented by Executive Order 11717 (38 FR 12315, dated May 11,1973) 

and Part 6 of Title 15 CFR (Code of Federal Regulations). 

NIST Interagency or Internal Reports (NISTIR)–The series includes interim or final reports on work performed by NIST for 

outside sponsors (both government and nongovernment). In general, initial distribution is handled by the sponsor; public 

distribution is handled by sales through the National Technical Information Service, Springfield, VA 22161, in hard copy, 

electronic media, or microfiche form. NISTIR's may also report results of NIST projects of transitory or limited interest, including 

those that will be published subsequently in more comprehensive form. 
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